WO2009145144A3 - 太陽電池出力特性評価装置および太陽電池出力特性評価方法 - Google Patents

太陽電池出力特性評価装置および太陽電池出力特性評価方法 Download PDF

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Publication number
WO2009145144A3
WO2009145144A3 PCT/JP2009/059528 JP2009059528W WO2009145144A3 WO 2009145144 A3 WO2009145144 A3 WO 2009145144A3 JP 2009059528 W JP2009059528 W JP 2009059528W WO 2009145144 A3 WO2009145144 A3 WO 2009145144A3
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WO
WIPO (PCT)
Prior art keywords
solar battery
evaluating
output characteristic
measures
current
Prior art date
Application number
PCT/JP2009/059528
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English (en)
French (fr)
Other versions
WO2009145144A2 (ja
Inventor
橋本　徹
佳正 十川
伊藤　智章
裕治 中西
Original Assignee
株式会社エヌ・ピー・シー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社エヌ・ピー・シー filed Critical 株式会社エヌ・ピー・シー
Priority to EP09754652A priority Critical patent/EP2287918A2/en
Priority to CN2009801291209A priority patent/CN102105994A/zh
Priority to US12/736,943 priority patent/US20110068817A1/en
Publication of WO2009145144A2 publication Critical patent/WO2009145144A2/ja
Publication of WO2009145144A3 publication Critical patent/WO2009145144A3/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02021—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Sustainable Energy (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

【課題】高コスト化の要因となる大電流を吐き出すバイポーラ電源を必要とせず、最小限の消費電力で順バイアス電流を印加することで開放電圧Ｖｏｃを正確に測定することができる太陽電池出力特性評価装置およびその方法を提供する。 【解決手段】太陽電池の出力特性を測定する太陽電池出力特性評価装置であって、太陽電池と、前記太陽電池の電圧を測定する電圧計と、前記太陽電池に流れる電流値を測定する電流計と、前記太陽電池に接続される可変抵抗部と、前記太陽電池に接続される順バイアス回路と、前記太陽電池に接続される逆バイアス回路とを備えることを特徴とする、太陽電池出力特性評価装置が提供される。
PCT/JP2009/059528 2008-05-26 2009-05-25 太陽電池出力特性評価装置および太陽電池出力特性評価方法 WO2009145144A2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP09754652A EP2287918A2 (en) 2008-05-26 2009-05-25 Apparatus for evaluating the output characteristic of a solar battery and method for evaluating the output characteristic of a solar battery
CN2009801291209A CN102105994A (zh) 2008-05-26 2009-05-25 太阳电池输出特性评价装置及太阳电池输出特性评价方法
US12/736,943 US20110068817A1 (en) 2008-05-26 2009-05-25 Solar cell output characteristic evaluation apparatus and solar cell output characteristic evaluation method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008136771A JP2009283845A (ja) 2008-05-26 2008-05-26 太陽電池出力特性評価装置および太陽電池出力特性評価方法
JP2008-136771 2008-05-26

Publications (2)

Publication Number Publication Date
WO2009145144A2 WO2009145144A2 (ja) 2009-12-03
WO2009145144A3 true WO2009145144A3 (ja) 2010-01-28

Family

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PCT/JP2009/059528 WO2009145144A2 (ja) 2008-05-26 2009-05-25 太陽電池出力特性評価装置および太陽電池出力特性評価方法

Country Status (7)

Country Link
US (1) US20110068817A1 (ja)
EP (1) EP2287918A2 (ja)
JP (1) JP2009283845A (ja)
KR (1) KR20110030454A (ja)
CN (1) CN102105994A (ja)
TW (1) TW201009371A (ja)
WO (1) WO2009145144A2 (ja)

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US8519729B2 (en) * 2010-02-10 2013-08-27 Sunpower Corporation Chucks for supporting solar cell in hot spot testing
TWI400459B (zh) * 2010-06-23 2013-07-01 Nat Univ Tsing Hua 一種太陽能電池參數之萃取方法
JP5618134B2 (ja) * 2010-06-29 2014-11-05 ソニー株式会社 制御装置および方法、並びに、太陽電池
TWI499886B (zh) * 2010-07-15 2015-09-11 Univ Nat Taiwan 估算電路的最大功率點功率的方法
US8471583B1 (en) * 2010-08-06 2013-06-25 The Boeing Company Switchable detector array
KR101151265B1 (ko) * 2011-01-24 2012-06-15 한국에너지기술연구원 태양전지모듈의 노화 및 성능 측정을 위한 제어장치 및 이의 제어방법
DE102011011602A1 (de) * 2011-02-17 2012-08-23 Texas Instruments Deutschland Gmbh Elektonische Vorrichtung zur Optimierung der Ausgangsleistung einer Solarzelle und Verfahren zum Betreiben der elektronischen Vorrichtung
KR101213059B1 (ko) 2011-02-23 2012-12-18 광운대학교 산학협력단 태양전지 측정시스템과 그 제어방법
TWI418829B (zh) * 2011-03-04 2013-12-11 Ritek Corp 太陽能電池片測試方法
JP5691816B2 (ja) * 2011-05-11 2015-04-01 日立金属株式会社 太陽電池パネルの異常検知装置
KR101254008B1 (ko) * 2011-07-13 2013-04-15 (주)온테스트 신재생 에너지 모듈을 위한 성능 검증 장치 및 그 방법
JP5015341B1 (ja) 2011-07-15 2012-08-29 株式会社エヌ・ピー・シー 太陽電池の欠陥検査装置及び検査方法
CN102749497B (zh) * 2012-07-13 2015-08-19 北京空间飞行器总体设计部 卫星太阳电池阵电流输出预测及故障诊断方法
CN102759696A (zh) * 2012-07-24 2012-10-31 江苏省无线电科学研究所有限公司 太阳能电池i-v特性调节和取样装置
CN102944828B (zh) * 2012-11-26 2015-02-18 河海大学常州校区 一种智能太阳能电池组件户外测试平台及其测试方法
US9271239B2 (en) * 2014-02-14 2016-02-23 Qualcomm Incorporated Current-efficient low noise amplifier (LNA)
JP6240634B2 (ja) * 2015-04-20 2017-11-29 日本カーネルシステム株式会社 バイパスダイオードの故障検査装置
CN105352597B (zh) * 2015-10-22 2018-06-05 河海大学常州校区 一种辐照传感器用太阳电池最优外接串联电阻的选择方法
CN108169702B (zh) * 2018-03-07 2024-02-13 国网浙江省电力有限公司电力科学研究院 水内冷发电机专用绝缘电阻表检定平台及检定方法
FR3088455B1 (fr) * 2018-11-14 2021-10-08 Commissariat Energie Atomique Procede de determination d'un modele electrique d'une chaine de modules photovoltaique, procede de diagnostic et dispositif associes
TWI723851B (zh) * 2020-04-21 2021-04-01 友達光電股份有限公司 太陽能電池檢測系統
CN114123969A (zh) * 2020-08-31 2022-03-01 中国科学院苏州纳米技术与纳米仿生研究所 多结叠层光伏电池子电池电流及匹配度的检测方法
CN113030581B (zh) * 2021-03-19 2024-07-26 陕西众森电能科技有限公司 一种太阳电池组件及组件外接电路阻抗的测试方法

Citations (4)

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JPS52135683A (en) * 1976-05-10 1977-11-12 Nec Corp Solar battery element characteristics measuring apparatus
JPH02159588A (ja) * 1988-12-13 1990-06-19 Agency Of Ind Science & Technol コンデンサー負荷方式太陽電池ｉ・ｖカーブトレーサー
JP2001174530A (ja) * 1999-12-15 2001-06-29 Maki Mfg Co Ltd 太陽電池の特性測定装置
JP2004134748A (ja) * 2002-07-26 2004-04-30 Canon Inc 光電変換素子の測定方法および装置、光電変換素子の製造方法及び製造装置

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JP3571860B2 (ja) * 1996-08-23 2004-09-29 キヤノン株式会社 非安定電源を電源とする電動機運転装置
JP2000243995A (ja) * 1998-12-25 2000-09-08 Canon Inc 太陽電池モジュールの検査方法及び製造方法
US6876187B2 (en) * 2000-07-04 2005-04-05 Canon Kabushiki Kaisha Method and apparatus for measuring photoelectric conversion characteristics

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52135683A (en) * 1976-05-10 1977-11-12 Nec Corp Solar battery element characteristics measuring apparatus
JPH02159588A (ja) * 1988-12-13 1990-06-19 Agency Of Ind Science & Technol コンデンサー負荷方式太陽電池ｉ・ｖカーブトレーサー
JP2001174530A (ja) * 1999-12-15 2001-06-29 Maki Mfg Co Ltd 太陽電池の特性測定装置
JP2004134748A (ja) * 2002-07-26 2004-04-30 Canon Inc 光電変換素子の測定方法および装置、光電変換素子の製造方法及び製造装置

Also Published As

Publication number Publication date
WO2009145144A2 (ja) 2009-12-03
US20110068817A1 (en) 2011-03-24
KR20110030454A (ko) 2011-03-23
CN102105994A (zh) 2011-06-22
JP2009283845A (ja) 2009-12-03
TW201009371A (en) 2010-03-01
EP2287918A2 (en) 2011-02-23

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