Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/02—Details
  • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
  • H01J49/0495—Vacuum locks; Valves
• • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
  • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
  • F16K—VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
  • F16K51/00—Other details not peculiar to particular types of valves or cut-off apparatus
  • F16K51/02—Other details not peculiar to particular types of valves or cut-off apparatus specially adapted for high-vacuum installations
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T137/00—Fluid handling
  • Y10T137/8593—Systems
  • Y10T137/86928—Sequentially progressive opening or closing of plural valves
  • Y10T137/86936—Pressure equalizing or auxiliary shunt flow
  • Y10T137/86944—One valve seats against other valve [e.g., concentric valves]
  • Y10T137/8696—Gate

Definitions

• This invention relates to vacuum systems and, more particularly, to shutter and gate valve assemblies for use in vacuum systems.
• Many processing systems and instruments include one or more vacuum chambers.
• One example is a Fourier Transform Mass Spectrometer (FTMS) system which includes two vacuum chambers connected through an orifice.
• One vacuum chamber operates at relatively high vacuum, e.g. 10 "10 Torr, and the other vacuum chamber operates at relatively low vacuum, e.g. 10 "4 Torr.
• the orifice is provided with a shutter that separates the low vacuum region from the high vacuum region.
• the shutter is opened for brief periods, typically a fraction of a second, to allow transport of ions from the low vacuum chamber to the high vacuum chamber for analysis.
• the shutter may operate at frequent intervals, e.g. once every half second.
• a shutter may be used to provide brief access to the high vacuum chamber.
• Typical shutters are designed to open and close quickly and to operate reliably over extended periods.
• shutters which meet these requirements are not equipped with high vacuum seals.
• vacuum apparatus comprises a high vacuum chamber, a low vacuum chamber and a shutter and gate valve assembly disposed between the high vacuum chamber and the low vacuum chamber.
• the shutter and gate valve assembly includes a valve housing that defines a passage between the high vacuum chamber and the low vacuum chamber, a valve member having a valve aperture, the valve member movable between a non-operating position that seals the passage and an operating position that aligns the valve aperture with the passage, and a shutter member movable between a closed position that blocks the valve aperture and an open position that unblocks the valve aperture.
• the method comprises mounting a shutter and gate valve assembly between the high vacuum chamber and the low vacuum chamber, the shutter and gate valve assembly including a valve housing that defines a passage between the high vacuum chamber and the low vacuum chamber, a valve member having a valve aperture, and a shutter member, moving the valve member between a non- operating position that seals the passage and an operating position that aligns the valve aperture with the passage, and moving the shutter member between a closed position that blocks the valve aperture and an open position that unblocks the valve aperture.
• a shutter and gate valve assembly comprises a valve housing that defines a passage therethrough, a valve member having a valve aperture, the valve member movable between a non-operating position that seals the passage and an operating position that aligns the valve aperture with the passage, and a shutter member movable between a closed position that blocks the valve aperture and an open position that unblocks the valve aperture.
• FIG. 1 is a schematic diagram of a vacuum system incorporating a shutter and gate valve assembly in accordance with an embodiment of the invention
• Fig. 2A is a schematic diagram of a shutter and gate valve assembly, with the gate valve in the operating position and the shutter in the closed position;
• Fig. 2B is a schematic diagram of the shutter and gate valve assembly, with the gate valve in the operating position and the shutter in the open position
• Fig. 2C is a schematic diagram of the shutter and gate valve assembly, with the gate valve in the non-operating position
• FIG. 3 is a perspective view of a shutter and gate valve assembly in accordance with an embodiment of the invention.
• Fig. 4A is a front view of the shutter and gate valve assembly, with the gate valve in the operating position and the shutter in the closed position;
• Fig. 4B is a cross-sectional view of the shutter and gate valve assembly, taken along the line 4B-4B of Fig. 4A;
• Fig. 4C is an enlarged, partial cross-sectional view of the shutter and gate valve assembly
• Fig. 5A is a front view of the shutter and gate valve assembly, with the gate valve in the non-operating position
• Fig. 5B is a cross-sectional view of the shutter and gate valve assembly, taken along the line 5B-5B of Fig. 5A.
• a vacuum system 10 includes a relatively low vacuum chamber 12 and a relatively high vacuum chamber 14.
• the phrase "high vacuum” corresponds to relatively low pressure and the phrase “low vacuum” corresponds to relatively high pressure.
• the pressure in high vacuum chamber 14 is one or more orders of magnitude lower than the pressure in low vacuum chamber 12.
• Low vacuum chamber 12 defines a low vacuum region 16, and high vacuum chamber 14 defines a high vacuum region 18.
• high vacuum chamber 14 may be maintained at a pressure of about 10 "10 Torr and low vacuum chamber 12 may be maintained during operation at a pressure of about 10 "4 Torr.
• Vacuum system 10 further includes a shutter and gate valve assembly 20 between low vacuum chamber 12 and high vacuum chamber 14. As described in detail below, shutter and gate valve assembly 20 defines a passage 22 between low vacuum chamber 12 and high vacuum chamber 14. Passage 22 may be opened and closed in an operating state of vacuum system 10 and may be sealed in a non-operating state of vacuum system 10. The shutter and gate valve assembly 20 thus provides a controllable interconnection between low vacuum chamber 12 and high vacuum chamber 14.
• vacuum system 10 may be a Fourier Transform Mass Spectrometer System which includes an ion source 30 in low vacuum chamber 12 and an ion analyzer 32 in high vacuum chamber 14. Ions generated by ion source 30 may be transported along a path 34 through passage 22 to ion analyzer 32 for analysis.
• FTMS systems are known to those skilled in the art.
• Shutter and gate valve assembly 20 may include a valve housing 50 that defines passage 22 between low vacuum chamber 12 and high vacuum chamber 14. Valve housing 50 may be sealed vacuum tight to vacuum chamber 12, to vacuum chamber 14, or to both. Shutter and gate valve assembly 20 further includes a valve member 54, a shutter member 60 and an elastomer ring 70. Valve member 54 includes a valve aperture 56 and a solid, non-apertured seal area 58 (Fig. 2C). Shutter member 60 includes a shutter aperture 62. Elastomer ring 70 is mounted in a groove in valve housing 50 that surrounds passage 22.
• Valve member 54 is movable between an operating position, shown in Figs. 2A and 2B, and a non-operating position, shown in Fig. 2C. In the operating position, valve aperture 56 is aligned with passage 22. In the non-operating position of Fig. 2C, valve aperture 56 is moved out of alignment with passage 22 and seal area 58 of valve member 54 is positioned over passage 22. The seal area 58 of valve member 54 compresses elastomer ring 70 and produces a vacuum tight seal of passage 22. [0026] Shutter member 60 is movable between a closed position that blocks valve aperture 56, as shown in Fig.
• ions can pass from ion source 30 in low vacuum region 16 along path 34 to ion analyzer 32 in high vacuum region 18.
• shutter member 60 is designed to operate at high speed between the closed position shown in Fig. 2 A and the open position shown in Fig. 2B.
• shutter member 60 may be in the open position of Fig. 2B for a fraction of a second.
• Shutter member 60 may be in the open position of Fig. 2B for as brief a time as possible, consistent with the operation of the system.
• shutter member 60 is not sealed to valve member 54. Thus, gas may leak between shutter member 60 and valve member 54 from the low vacuum chamber 12 to the high vacuum chamber 14 when the shutter member 60 is in the closed position.
• valve member 54 is moved to the non-operating position shown in Fig. 2C. In the non-operating position, seal area 58 of valve member 54 covers passage 22 and, with elastomer ring 70, provides a vacuum-tight seal of passage 22.
• low vacuum chamber 12 can be vented to atmosphere without significant leakage into high vacuum chamber 14.
• FIG. 3 An implementation of shutter and gate valve assembly 20 is shown in Figs. 3, 4A, 4B, 4C, 5A and 5B. Like elements in Figs. 1-5B have the same reference numerals. It will be understood that the implementation of Figs. 3-5B is given by way of example only and is not limiting as to the scope of the present invention.
• Valve member 54 is configured for vertical movement between the operating position, shown in Figs. 4A and 4B, and the non-operating position, shown in Figs. 3, 5A and 5B. Valve member 54 is retained in position and is guided between the operating and non- operating positions by valve guides 100 and 102.
• Valve guides 100 and 102 may be mounted to valve housing 50 or may be an integral part of valve housing 50.
• Each of valve guides 100 and 102 is provided with a groove (not shown) which engages ribs 104 and 106 (Fig. 5A) along opposite side edges of valve member 54. Ribs 104 and 106 slide in the respective grooves of valve guides 100 and 102 as valve member 54 is moved to and between the operating position and the non-operating position.
• Valve member 54 may have the form of a generally flat plate provided with ribs 104 and 106, valve aperture 56 and seal area 58.
• valve actuator 108 (Fig. 3) is connected to valve member 54 and causes valve member 54 to move between the operating and non-operating positions in response to a control signal.
• valve actuator 108 may be a pneumatic cylinder.
• Valve actuator 108 is mounted to a fixed part of vacuum system 10.
• shutter member 60 is horizontally slidable between the closed position, shown in Figs. 4A and 5A, and the open position in which shutter aperture 62 is aligned with valve aperture 56 (Fig. 2B).
• Shutter member 60 is retained on valve member 54 and is guided between the open and closed positions by shutter guides 110 and 112.
• Shutter guides 110 and 112 may be mounted to valve member 54 or may be an integral part of valve member 54.
• Shutter member 60 is provided with ribs 114 and 116 along opposite side edges which engage grooves 118 (Fig. 4C) in the respective shutter guides 110 and 112.
• Shutter member 60 is further provided with an elongated aperture 120 that engages a stop 122 affixed to valve member 54.
• shutter actuator 130 is mounted to valve member 54 by an actuator support 132.
• a movable element 134 of shutter actuator 130 is attached to shutter member 60 and causes shutter member 60 to move between the open and closed positions in response to a control signal applied to shutter actuator 130.
• shutter actuator 130 may be a solenoid. As shown, shutter member 60 and shutter actuator 130 are affixed to valve member 54 and move with the valve actuator 54 between the operating and non-operating positions.
• valve member 54 The operating position of valve member 54 is shown in Figs. 4A and 4B.
• valve aperture 56 is aligned with passage 22 in valve housing 50.
• Shutter member 60 is normally closed and blocks valve aperture 56.
• the shutter may be opened by energizing shutter actuator 130, causing shutter member 60 to move to the right in Fig. 4A, so that shutter aperture 62 is aligned with valve aperture 56.
• shutter member 60 is configured for sliding, in-line movement between the open and closed positions.
• the shutter may leak because shutter member 60 is not sealed to valve member 54.
• valve member 54 When sealing of passage 22 is required, valve member 54 is moved to the non-operating position as shown in Figs. 5A and 5B. Valve member 54 is moved vertically from the operating position to the non-operating position by operation of valve actuator 108. In the non-operating position, valve aperture 56 is no longer in alignment with passage 22. Instead, the seal area 58 of valve member 54 covers passage 22. Valve member 54 partially compresses elastomer ring 70, thereby sealing passage 22 and preventing leakage of gas from the low vacuum chamber into the high vacuum chamber. With the valve member 54 in the non- operating position, the low vacuum chamber can be vented to atmosphere for maintenance and other operations which require access to the low vacuum chamber, without degrading the vacuum in the high vacuum chamber.
• the shutter and gate valve assembly has been described as interconnecting a low vacuum chamber and a high vacuum chamber, but is not limited to this application.
• the shutter and gate valve assembly can be used to provide access to any vacuum chamber from another vacuum chamber or from atmospheric pressure.
• the shutter and gate valve assembly can have various configurations.
• the shutter is not limited to sliding movement between the open position and the closed position.

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• Engineering & Computer Science (AREA)
• General Engineering & Computer Science (AREA)
• Mechanical Engineering (AREA)
• Chemical & Material Sciences (AREA)
• Analytical Chemistry (AREA)
• Details Of Valves (AREA)
• Sliding Valves (AREA)
• Electron Tubes For Measurement (AREA)

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Publications (1)

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• 2008
  • 2008-02-20 US US12/070,584 patent/US7743790B2/en not_active Expired - Fee Related
• 2009
  • 2009-02-13 EP EP09712782.3A patent/EP2248146A4/en not_active Withdrawn
  • 2009-02-13 WO PCT/US2009/034099 patent/WO2009105389A1/en not_active Ceased
  • 2009-02-13 JP JP2010547702A patent/JP5081986B2/ja not_active Expired - Fee Related

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