WO2009028034A1 - 電子デバイスおよび診断装置 - Google Patents

電子デバイスおよび診断装置 Download PDF

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Publication number
WO2009028034A1
WO2009028034A1 PCT/JP2007/066534 JP2007066534W WO2009028034A1 WO 2009028034 A1 WO2009028034 A1 WO 2009028034A1 JP 2007066534 W JP2007066534 W JP 2007066534W WO 2009028034 A1 WO2009028034 A1 WO 2009028034A1
Authority
WO
WIPO (PCT)
Prior art keywords
flops
flip
data values
circuits
clock signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/066534
Other languages
English (en)
French (fr)
Inventor
Masahiko Hata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to PCT/JP2007/066534 priority Critical patent/WO2009028034A1/ja
Priority to JP2009529884A priority patent/JP5148615B2/ja
Priority to KR1020107004780A priority patent/KR101194336B1/ko
Priority to TW097132779A priority patent/TWI379091B/zh
Publication of WO2009028034A1 publication Critical patent/WO2009028034A1/ja
Priority to US12/712,172 priority patent/US8150647B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

　電子デバイスであって、クロック信号に同期して動作する複数の回路と、複数の回路から出力された信号のデータ値をクロック信号に同期して取得して次のクロック信号が入力されるまで保持し、ディセーブル端子に信号が与えられた場合には取得したデータ値を保持し続けるクロックディセーブル状態となる複数のフリップフロップと、複数のフリップフロップのそれぞれのディセーブル端子に対して、回路を診断すべきタイミングにおいてホールド信号を出力するタイミング制御部と、複数のフリップフロップのそれぞれに対応して設けられ、対応するフリップフロップが保持しているデータ値を診断用データとして出力する複数の診断用配線とを備える電子デバイスを提供する。
PCT/JP2007/066534 2007-08-27 2007-08-27 電子デバイスおよび診断装置 Ceased WO2009028034A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
PCT/JP2007/066534 WO2009028034A1 (ja) 2007-08-27 2007-08-27 電子デバイスおよび診断装置
JP2009529884A JP5148615B2 (ja) 2007-08-27 2007-08-27 電子デバイスおよび診断装置
KR1020107004780A KR101194336B1 (ko) 2007-08-27 2007-08-27 전자 디바이스 및 진단 장치
TW097132779A TWI379091B (en) 2007-08-27 2008-08-27 Electronic device and diagnosis apparatus
US12/712,172 US8150647B2 (en) 2007-08-27 2010-02-24 Electric device and diagnostic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/066534 WO2009028034A1 (ja) 2007-08-27 2007-08-27 電子デバイスおよび診断装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/712,172 Continuation US8150647B2 (en) 2007-08-27 2010-02-24 Electric device and diagnostic apparatus

Publications (1)

Publication Number Publication Date
WO2009028034A1 true WO2009028034A1 (ja) 2009-03-05

Family

ID=40386778

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/066534 Ceased WO2009028034A1 (ja) 2007-08-27 2007-08-27 電子デバイスおよび診断装置

Country Status (5)

Country Link
US (1) US8150647B2 (ja)
JP (1) JP5148615B2 (ja)
KR (1) KR101194336B1 (ja)
TW (1) TWI379091B (ja)
WO (1) WO2009028034A1 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5172465B2 (ja) 2008-05-20 2013-03-27 三菱電機株式会社 放電表面処理用電極の製造方法および放電表面処理用電極
JP2012247318A (ja) * 2011-05-27 2012-12-13 Advantest Corp 試験装置および試験方法
TWI555856B (zh) 2012-12-05 2016-11-01 財團法人工業技術研究院 多元合金塊材及其製作方法
JP7280703B2 (ja) * 2019-01-31 2023-05-24 住友重機械工業株式会社 診断システム
CN115267304B (zh) * 2021-04-30 2025-09-02 脸萌有限公司 供电电压检测器、供电电压检测装置、系统和介质
US12158495B2 (en) * 2021-11-24 2024-12-03 Samsung Electronics Co., Ltd. Method and apparatus for diagnosing electronic apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02201275A (ja) * 1989-01-31 1990-08-09 Toshiba Corp 論理回路装置
JPH11142483A (ja) * 1997-11-13 1999-05-28 Toshiba Corp Ｌｓｉとｌｓｉの内部観測方法
JP2001264389A (ja) * 2000-03-17 2001-09-26 Oki Electric Ind Co Ltd 半導体集積回路

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0389178A (ja) * 1989-08-31 1991-04-15 Toshiba Corp 半導体集積回路
JPH1096758A (ja) 1996-09-24 1998-04-14 Advantest Corp 自己診断機能を有する電子回路基板
KR101090573B1 (ko) 2003-07-31 2011-12-08 주식회사 아도반테스토 클록 환승 장치 및 시험 장치
US7426708B2 (en) * 2005-01-31 2008-09-16 Nanotech Corporation ASICs having programmable bypass of design faults
US7487378B2 (en) * 2005-09-19 2009-02-03 Ati Technologies, Inc. Asymmetrical IO method and system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02201275A (ja) * 1989-01-31 1990-08-09 Toshiba Corp 論理回路装置
JPH11142483A (ja) * 1997-11-13 1999-05-28 Toshiba Corp Ｌｓｉとｌｓｉの内部観測方法
JP2001264389A (ja) * 2000-03-17 2001-09-26 Oki Electric Ind Co Ltd 半導体集積回路

Also Published As

Publication number Publication date
KR101194336B1 (ko) 2012-10-24
KR20100044879A (ko) 2010-04-30
US20100235125A1 (en) 2010-09-16
US8150647B2 (en) 2012-04-03
JPWO2009028034A1 (ja) 2010-11-25
JP5148615B2 (ja) 2013-02-20
TW200921125A (en) 2009-05-16
TWI379091B (en) 2012-12-11

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