WO2009025096A1 - 磁気センサ回路 - Google Patents

磁気センサ回路 Download PDF

Info

Publication number
WO2009025096A1
WO2009025096A1 PCT/JP2008/054544 JP2008054544W WO2009025096A1 WO 2009025096 A1 WO2009025096 A1 WO 2009025096A1 JP 2008054544 W JP2008054544 W JP 2008054544W WO 2009025096 A1 WO2009025096 A1 WO 2009025096A1
Authority
WO
WIPO (PCT)
Prior art keywords
circuit
threshold voltage
magnetic sensor
output
determining
Prior art date
Application number
PCT/JP2008/054544
Other languages
English (en)
French (fr)
Inventor
Masakazu Sugiura
Original Assignee
Seiko Instruments Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc. filed Critical Seiko Instruments Inc.
Priority to AT08721960T priority Critical patent/ATE527550T1/de
Priority to EP08721960A priority patent/EP2093583B1/en
Priority to KR1020097016401A priority patent/KR101161595B1/ko
Priority to CN2008801035458A priority patent/CN101779137B/zh
Priority to US12/596,374 priority patent/US8212555B2/en
Publication of WO2009025096A1 publication Critical patent/WO2009025096A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/038—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices
    • G01R33/0385—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices in relation with magnetic force measurements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/022—Measuring gradient
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G01R33/072—Constructional adaptation of the sensor to specific applications

Abstract

　ホール素子と、ホール素子を貫く磁束に応じたホール電圧としきい値電圧とを比較するコンパレータ回路と、コンパレータ回路の出力信号から磁気センサ回路の出力論理を決定する出力論理決定回路と、出力論理決定回路の出力するデータ信号によって、しきい値電圧を決定するしきい値電圧制御回路と、しきい値電圧制御回路の出力するデータ信号によって、コンパレータ回路のしきい値電圧を出力するしきい値電圧出力回路と、を備えた磁気センサ回路であり、回路規模が小さく、消費電流の増加やコストアップを抑えた磁気センサ回路を提供することが出来る。
PCT/JP2008/054544 2007-08-21 2008-03-13 磁気センサ回路 WO2009025096A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
AT08721960T ATE527550T1 (de) 2007-08-21 2008-03-13 Magnetsensorschaltung
EP08721960A EP2093583B1 (en) 2007-08-21 2008-03-13 Magnetic sensor circuit
KR1020097016401A KR101161595B1 (ko) 2007-08-21 2008-03-13 자기 센서 회로
CN2008801035458A CN101779137B (zh) 2007-08-21 2008-03-13 磁性传感器电路
US12/596,374 US8212555B2 (en) 2007-08-21 2008-03-13 Magnetic sensor circuit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-214737 2007-08-21
JP2007214737A JP4965387B2 (ja) 2007-08-21 2007-08-21 磁気センサ回路

Publications (1)

Publication Number Publication Date
WO2009025096A1 true WO2009025096A1 (ja) 2009-02-26

Family

ID=40378005

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054544 WO2009025096A1 (ja) 2007-08-21 2008-03-13 磁気センサ回路

Country Status (8)

Country Link
US (1) US8212555B2 (ja)
EP (1) EP2093583B1 (ja)
JP (1) JP4965387B2 (ja)
KR (1) KR101161595B1 (ja)
CN (1) CN101779137B (ja)
AT (1) ATE527550T1 (ja)
TW (1) TWI444642B (ja)
WO (1) WO2009025096A1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5634041B2 (ja) * 2009-02-17 2014-12-03 ローム株式会社 磁気センサ、およびこれを備えた電子機器
JP5636991B2 (ja) 2011-01-28 2014-12-10 株式会社村田製作所 磁気センサ、磁気センサの駆動方法およびコンピュータプログラム
US8957676B2 (en) * 2011-05-06 2015-02-17 Allegro Microsystems, Llc Magnetic field sensor having a control node to receive a control signal to adjust a threshold
US9638548B2 (en) 2012-05-07 2017-05-02 Infineon Technologies Ag Output switching systems and methods for magnetic field sensors
US9625534B2 (en) * 2012-11-21 2017-04-18 Allegro Microsystems, Llc Systems and methods for detection of magnetic fields
JP6158682B2 (ja) * 2013-10-25 2017-07-05 エスアイアイ・セミコンダクタ株式会社 磁気センサ回路
US10102992B2 (en) 2014-02-25 2018-10-16 Infineon Technologies Ag Switching apparatus, switching system and switching method
US10101410B2 (en) 2015-10-21 2018-10-16 Allegro Microsystems, Llc Methods and apparatus for sensor having fault trip level setting
US10338642B2 (en) * 2016-05-20 2019-07-02 Honeywell International Inc. Hall switch with adaptive threshold
WO2023102937A1 (zh) * 2021-12-10 2023-06-15 上海艾为电子技术股份有限公司 全极性霍尔传感器件及其控制方法、电子设备

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05327421A (ja) * 1992-05-15 1993-12-10 Nec Corp シュミット回路
JP2004020289A (ja) * 2002-06-13 2004-01-22 Asahi Kasei Electronics Co Ltd 折畳み式携帯情報端末装置、および、磁気センサ

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619137A (en) * 1996-02-12 1997-04-08 Allegro Microsystems, Inc. Chopped low power magnetic-field detector with hysteresis memory
CN100443913C (zh) * 2002-11-13 2008-12-17 松下电器产业株式会社 磁场传感器和磁场检测装置及磁场检测方法
JP4049757B2 (ja) 2004-03-12 2008-02-20 東光株式会社 磁気センサ回路
ITTO20050759A1 (it) * 2005-10-26 2007-04-27 Fiat Ricerche Rete magnetoresistiva nanostrutturata e relativo procedimento di rilevazione di campo magnetico
US7362094B2 (en) * 2006-01-17 2008-04-22 Allegro Microsystems, Inc. Methods and apparatus for magnetic article detection
US8058864B2 (en) * 2009-04-17 2011-11-15 Allegro Microsystems, Inc. Circuits and methods for providing a magnetic field sensor with an adaptable threshold

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05327421A (ja) * 1992-05-15 1993-12-10 Nec Corp シュミット回路
JP2004020289A (ja) * 2002-06-13 2004-01-22 Asahi Kasei Electronics Co Ltd 折畳み式携帯情報端末装置、および、磁気センサ

Also Published As

Publication number Publication date
TW200909837A (en) 2009-03-01
JP2009047585A (ja) 2009-03-05
KR101161595B1 (ko) 2012-07-03
ATE527550T1 (de) 2011-10-15
US8212555B2 (en) 2012-07-03
EP2093583A4 (en) 2010-09-15
TWI444642B (zh) 2014-07-11
US20100127700A1 (en) 2010-05-27
KR20100053479A (ko) 2010-05-20
EP2093583B1 (en) 2011-10-05
CN101779137A (zh) 2010-07-14
CN101779137B (zh) 2013-04-24
JP4965387B2 (ja) 2012-07-04
EP2093583A1 (en) 2009-08-26

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