WO2009019743A1 - リングオシレータ、遅延測定装置及び遅延測定方法並びに遅延測定プログラム - Google Patents

リングオシレータ、遅延測定装置及び遅延測定方法並びに遅延測定プログラム Download PDF

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Publication number
WO2009019743A1
WO2009019743A1 PCT/JP2007/065233 JP2007065233W WO2009019743A1 WO 2009019743 A1 WO2009019743 A1 WO 2009019743A1 JP 2007065233 W JP2007065233 W JP 2007065233W WO 2009019743 A1 WO2009019743 A1 WO 2009019743A1
Authority
WO
WIPO (PCT)
Prior art keywords
delay measuring
input
inversion selection
ring oscillator
selection circuit
Prior art date
Application number
PCT/JP2007/065233
Other languages
English (en)
French (fr)
Inventor
Makoto Mori
Original Assignee
Fujitsu Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Limited filed Critical Fujitsu Limited
Priority to PCT/JP2007/065233 priority Critical patent/WO2009019743A1/ja
Publication of WO2009019743A1 publication Critical patent/WO2009019743A1/ja

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0315—Ring oscillators

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  • Pulse Circuits (AREA)

Abstract

　環状に接続された奇数の反転選択回路を有するリングオシレータであって、それぞれの反転選択回路が、前段の反転選択回路からの出力が接続される第１入力と、前記前段の反転選択回路を除く奇数段前の反転選択回路からの出力が接続される第２入力とを有し、前記第１又は第２の入力のいずれかの入力を選択する選択部と、前記第１入力と前記第２入力のうち、選択された入力を反転して後段の反転選択回路に出力する反転部とを備えた。
PCT/JP2007/065233 2007-08-03 2007-08-03 リングオシレータ、遅延測定装置及び遅延測定方法並びに遅延測定プログラム WO2009019743A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/065233 WO2009019743A1 (ja) 2007-08-03 2007-08-03 リングオシレータ、遅延測定装置及び遅延測定方法並びに遅延測定プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/065233 WO2009019743A1 (ja) 2007-08-03 2007-08-03 リングオシレータ、遅延測定装置及び遅延測定方法並びに遅延測定プログラム

Publications (1)

Publication Number Publication Date
WO2009019743A1 true WO2009019743A1 (ja) 2009-02-12

Family

ID=40340991

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/065233 WO2009019743A1 (ja) 2007-08-03 2007-08-03 リングオシレータ、遅延測定装置及び遅延測定方法並びに遅延測定プログラム

Country Status (1)

Country Link
WO (1) WO2009019743A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011047861A1 (en) * 2009-10-21 2011-04-28 Stmicroelectronics S.R.L. Ring oscillator, time-digital converter circuit and relating method of time-digital measure
JP2012100161A (ja) * 2010-11-04 2012-05-24 Olympus Corp Ａ／ｄ変換装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63260218A (ja) * 1987-04-16 1988-10-27 Nec Corp 制御発振器
JPH04165809A (ja) * 1990-10-30 1992-06-11 Nec Corp リングオシレータ
JPH10261943A (ja) * 1997-03-17 1998-09-29 Sony Corp 遅延回路およびそれを用いた発振回路
JPH11166960A (ja) * 1997-12-04 1999-06-22 Nec Corp 半導体集積回路の良品選別方式および半導体集積回路
JP2001264397A (ja) * 2000-03-15 2001-09-26 Matsushita Electric Ind Co Ltd 遅延時間測定装置、遅延時間測定方法および半導体集積回路
JP2003177159A (ja) * 2001-08-28 2003-06-27 Koninkl Philips Electronics Nv 能動回路素子の高周波動作を決定するための回路配置およびその方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63260218A (ja) * 1987-04-16 1988-10-27 Nec Corp 制御発振器
JPH04165809A (ja) * 1990-10-30 1992-06-11 Nec Corp リングオシレータ
JPH10261943A (ja) * 1997-03-17 1998-09-29 Sony Corp 遅延回路およびそれを用いた発振回路
JPH11166960A (ja) * 1997-12-04 1999-06-22 Nec Corp 半導体集積回路の良品選別方式および半導体集積回路
JP2001264397A (ja) * 2000-03-15 2001-09-26 Matsushita Electric Ind Co Ltd 遅延時間測定装置、遅延時間測定方法および半導体集積回路
JP2003177159A (ja) * 2001-08-28 2003-06-27 Koninkl Philips Electronics Nv 能動回路素子の高周波動作を決定するための回路配置およびその方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011047861A1 (en) * 2009-10-21 2011-04-28 Stmicroelectronics S.R.L. Ring oscillator, time-digital converter circuit and relating method of time-digital measure
US9007133B2 (en) 2009-10-21 2015-04-14 Stmicroelectronics S.R.L. Oscillator, time-digital converter circuit and relating method of time-digital measure
JP2012100161A (ja) * 2010-11-04 2012-05-24 Olympus Corp Ａ／ｄ変換装置

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