WO2009004874A1 - 撮像装置および方法 - Google Patents

撮像装置および方法 Download PDF

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Publication number
WO2009004874A1
WO2009004874A1 PCT/JP2008/059888 JP2008059888W WO2009004874A1 WO 2009004874 A1 WO2009004874 A1 WO 2009004874A1 JP 2008059888 W JP2008059888 W JP 2008059888W WO 2009004874 A1 WO2009004874 A1 WO 2009004874A1
Authority
WO
WIPO (PCT)
Prior art keywords
imaging
control means
imaging device
evaluation value
condition
Prior art date
Application number
PCT/JP2008/059888
Other languages
English (en)
French (fr)
Inventor
Masafumi Takimoto
Yusuke Mitarai
Original Assignee
Canon Kabushiki Kaisha
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kabushiki Kaisha filed Critical Canon Kabushiki Kaisha
Priority to EP08764857.2A priority Critical patent/EP2173087B1/en
Priority to CN200880022754XA priority patent/CN101803364B/zh
Priority to KR1020107001413A priority patent/KR101141811B1/ko
Publication of WO2009004874A1 publication Critical patent/WO2009004874A1/ja
Priority to US12/649,079 priority patent/US8237848B2/en
Priority to US13/545,689 priority patent/US8610770B2/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/77—Retouching; Inpainting; Scratch removal
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/0035—User-machine interface; Control console
    • H04N1/00405—Output means
    • H04N1/00408—Display of information to the user, e.g. menus
    • H04N1/00411—Display of information to the user, e.g. menus the display also being used for user input, e.g. touch screen
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00795—Reading arrangements
    • H04N1/00798—Circuits or arrangements for the control thereof, e.g. using a programmed control device or according to a measured quantity
    • H04N1/00816—Determining the reading area, e.g. eliminating reading of margins
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00795—Reading arrangements
    • H04N1/00827—Arrangements for reading an image from an unusual original, e.g. 3-dimensional objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00795—Reading arrangements
    • H04N1/00798—Circuits or arrangements for the control thereof, e.g. using a programmed control device or according to a measured quantity
    • H04N1/00824—Circuits or arrangements for the control thereof, e.g. using a programmed control device or according to a measured quantity for displaying or indicating, e.g. a condition or state

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Quality & Reliability (AREA)
  • Human Computer Interaction (AREA)
  • Studio Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

本発明は、撮像装置の撮像条件の設定を容易にすることを目的とする。撮像条件を変更させ、第一の時間間隔ごとに撮像手段に撮像対象を撮像させ、撮像画像の評価値を算出させる第一の制御手段と、前記第一の制御手段で得られた評価値が増加から減少に変わる範囲で撮像条件を変更させ、前記第一の時間間隔よりも狭い第二の時間間隔ごとに前記撮像手段に撮像対象を撮像させ、撮像画像の評価値を算出させる第二の制御手段を備える。
PCT/JP2008/059888 2007-06-29 2008-05-29 撮像装置および方法 WO2009004874A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP08764857.2A EP2173087B1 (en) 2007-06-29 2008-05-29 Improved setting of image sensing conditions for defect detection
CN200880022754XA CN101803364B (zh) 2007-06-29 2008-05-29 摄像设备和方法
KR1020107001413A KR101141811B1 (ko) 2007-06-29 2008-05-29 촬상 장치 및 방법
US12/649,079 US8237848B2 (en) 2007-06-29 2009-12-29 Image sensing apparatus and method for sensing target that has a defective portion region
US13/545,689 US8610770B2 (en) 2007-06-29 2012-07-10 Image sensing apparatus and method for sensing target that has defective portion region

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-172749 2007-06-29
JP2007172749A JP4906609B2 (ja) 2007-06-29 2007-06-29 撮像装置および方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/649,079 Continuation US8237848B2 (en) 2007-06-29 2009-12-29 Image sensing apparatus and method for sensing target that has a defective portion region

Publications (1)

Publication Number Publication Date
WO2009004874A1 true WO2009004874A1 (ja) 2009-01-08

Family

ID=40225930

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/059888 WO2009004874A1 (ja) 2007-06-29 2008-05-29 撮像装置および方法

Country Status (6)

Country Link
US (2) US8237848B2 (ja)
EP (1) EP2173087B1 (ja)
JP (1) JP4906609B2 (ja)
KR (1) KR101141811B1 (ja)
CN (1) CN101803364B (ja)
WO (1) WO2009004874A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014208077A1 (en) * 2013-06-26 2014-12-31 Canon Kabushiki Kaisha Information processing device to process spectral information, and information processing method

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5875186B2 (ja) * 2012-04-27 2016-03-02 シブヤ精機株式会社 農産物検査装置及び農産物検査方法
JP6736270B2 (ja) * 2015-07-13 2020-08-05 キヤノン株式会社 画像処理装置及び画像処理装置の作動方法
CN106487915B (zh) * 2016-10-31 2019-08-20 维沃移动通信有限公司 一种图片处理方法及服务器
JP6917761B2 (ja) * 2017-05-09 2021-08-11 株式会社キーエンス 画像検査装置
JP7077807B2 (ja) * 2018-06-12 2022-05-31 オムロン株式会社 画像検査システム及びその制御方法
KR20210102458A (ko) * 2020-03-11 2021-08-19 베이징 바이두 넷컴 사이언스 앤 테크놀로지 코., 엘티디. 정보를 취득하는 방법 및 장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11281585A (ja) * 1998-03-26 1999-10-15 Nikon Corp 検査方法及び装置
JP2001185591A (ja) * 1999-12-27 2001-07-06 Hitachi Ltd 欠陥の詳細検査方法および装置
JP2001202496A (ja) * 2000-01-18 2001-07-27 Dainippon Printing Co Ltd 画像入力装置
JP3601031B2 (ja) 2002-03-06 2004-12-15 有限会社テクノドリーム二十一 画像データ計測装置及び画像データを用いた対象物体の自由変形を含む任意視点画像作成方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975972A (en) * 1988-10-18 1990-12-04 At&T Bell Laboratories Method and apparatus for surface inspection
EP0475454A3 (en) * 1990-09-14 1992-10-14 Fuji Photo Film Co., Ltd. Defect inspection system
US5353357A (en) * 1992-12-04 1994-10-04 Philip Morris Incorporated Methods and apparatus for inspecting the appearance of substantially circular objects
US5845002A (en) * 1994-11-03 1998-12-01 Sunkist Growers, Inc. Method and apparatus for detecting surface features of translucent objects
JP3201217B2 (ja) * 1995-04-17 2001-08-20 日産自動車株式会社 表面欠陥検査装置
US6259827B1 (en) * 1996-03-21 2001-07-10 Cognex Corporation Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images
US6788411B1 (en) * 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
TW500920B (en) * 2000-03-24 2002-09-01 Olympus Optical Co Defect detecting apparatus
JP2003032542A (ja) * 2001-07-19 2003-01-31 Mitsubishi Electric Corp 撮像装置
EP1255224A1 (en) * 2001-05-02 2002-11-06 STMicroelectronics S.r.l. A system and process for analysing surface defects
US6944331B2 (en) * 2001-10-26 2005-09-13 National Instruments Corporation Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching
JP4251312B2 (ja) * 2002-03-08 2009-04-08 日本電気株式会社 画像入力装置
JP2003270163A (ja) * 2002-03-15 2003-09-25 Dainippon Printing Co Ltd 検査方法および装置
US6950546B2 (en) * 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
JP2005003476A (ja) * 2003-06-11 2005-01-06 Nikon Corp 表面検査装置
JP2005157268A (ja) * 2003-11-06 2005-06-16 Canon Inc 撮像装置及びその制御方法及びプログラム及び記憶媒体
JP4539964B2 (ja) * 2004-07-21 2010-09-08 大日本スクリーン製造株式会社 画像の領域分割
JP4562126B2 (ja) * 2004-09-29 2010-10-13 大日本スクリーン製造株式会社 欠陥検出装置および欠陥検出方法
JP4591325B2 (ja) * 2005-01-28 2010-12-01 カシオ計算機株式会社 撮像装置及びプログラム
US7679758B2 (en) * 2005-04-29 2010-03-16 Microview Technologies Pte Ltd. Fastener inspection system and method
JP4625716B2 (ja) * 2005-05-23 2011-02-02 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
JP4723362B2 (ja) * 2005-11-29 2011-07-13 株式会社日立ハイテクノロジーズ 光学式検査装置及びその方法
TW200742923A (en) * 2006-05-11 2007-11-16 Asia Optical Co Inc Method of auto focus
US8008641B2 (en) * 2007-08-27 2011-08-30 Acushnet Company Method and apparatus for inspecting objects using multiple images having varying optical properties
JP2010271600A (ja) * 2009-05-22 2010-12-02 Sanyo Electric Co Ltd 電子カメラ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11281585A (ja) * 1998-03-26 1999-10-15 Nikon Corp 検査方法及び装置
JP2001185591A (ja) * 1999-12-27 2001-07-06 Hitachi Ltd 欠陥の詳細検査方法および装置
JP2001202496A (ja) * 2000-01-18 2001-07-27 Dainippon Printing Co Ltd 画像入力装置
JP3601031B2 (ja) 2002-03-06 2004-12-15 有限会社テクノドリーム二十一 画像データ計測装置及び画像データを用いた対象物体の自由変形を含む任意視点画像作成方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2173087A4

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014208077A1 (en) * 2013-06-26 2014-12-31 Canon Kabushiki Kaisha Information processing device to process spectral information, and information processing method
US10184885B2 (en) 2013-06-26 2019-01-22 Canon Kabushiki Kaisha Information processing device to process spectral information, and information processing method

Also Published As

Publication number Publication date
US20120274794A1 (en) 2012-11-01
US20100171852A1 (en) 2010-07-08
JP2009010890A (ja) 2009-01-15
CN101803364A (zh) 2010-08-11
CN101803364B (zh) 2013-05-01
EP2173087A4 (en) 2017-10-11
JP4906609B2 (ja) 2012-03-28
KR101141811B1 (ko) 2012-05-14
US8610770B2 (en) 2013-12-17
EP2173087A1 (en) 2010-04-07
US8237848B2 (en) 2012-08-07
EP2173087B1 (en) 2019-07-31
KR20100025001A (ko) 2010-03-08

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