WO2009001896A1 - 成膜方法および処理システム - Google Patents

成膜方法および処理システム Download PDF

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Publication number
WO2009001896A1
WO2009001896A1 PCT/JP2008/061645 JP2008061645W WO2009001896A1 WO 2009001896 A1 WO2009001896 A1 WO 2009001896A1 JP 2008061645 W JP2008061645 W JP 2008061645W WO 2009001896 A1 WO2009001896 A1 WO 2009001896A1
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WIPO (PCT)
Prior art keywords
forming
seed layer
recess
over
filming method
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PCT/JP2008/061645
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English (en)
French (fr)
Inventor
Taro Ikeda
Satoshi Wakabayashi
Kensaku Narushima
Tatsuo Hatano
Yasushi Mizusawa
Osamu Yokoyama
Takashi Sakuma
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Tokyo Electron Limited
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Publication date
Application filed by Tokyo Electron Limited filed Critical Tokyo Electron Limited
Priority to KR1020097026131A priority Critical patent/KR101396624B1/ko
Priority to CN2008800224861A priority patent/CN101689490B/zh
Publication of WO2009001896A1 publication Critical patent/WO2009001896A1/ja

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/53204—Conductive materials
    • H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
    • H01L23/53228—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being copper
    • H01L23/53238—Additional layers associated with copper layers, e.g. adhesion, barrier, cladding layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14—Metallic material, boron or silicon
    • C23C14/18—Metallic material, boron or silicon on other inorganic substrates
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04—Coating on selected surface areas, e.g. using masks
    • C23C16/045—Coating cavities or hollow spaces, e.g. interior of tubes; Infiltration of porous substrates
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76841—Barrier, adhesion or liner layers
    • H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
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    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76841—Barrier, adhesion or liner layers
    • H01L21/76871—Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers
    • H01L21/76873—Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers for electroplating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic System
    • H01L21/28556—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic System by chemical means, e.g. CVD, LPCVD, PECVD, laser CVD
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/10—Applying interconnections to be used for carrying current between separate components within a device
    • H01L2221/1068—Formation and after-treatment of conductors
    • H01L2221/1073—Barrier, adhesion or liner layers
    • H01L2221/1084—Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers
    • H01L2221/1089—Stacks of seed layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097—Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701—Low temperature co-fired ceramic [LTCC]

Abstract

　凹部（６）を有する絶縁層（４）が表面に形成された被処理体（Ｗ）に対して薄膜を形成する成膜方法が開示される。凹部内の表面を含む被処理体の表面にＴｉ含有バリヤ層（１２）を形成するバリヤ層形成工程と、バリヤ層上にＲｕを含有シード層（１６）をＣＶＤにより形成するシード層形成工程と、シード層上にＣｕ含有補助シード層（１６４）をスパッタリングにより形成する補助シード層形成工程とを順次実行する。これにより、被処理体全面にわたって、線幅またはホール径が小さな凹部あるいは高アスペクト比の凹部に対して十分な埋め込みを行うことが可能となる。
PCT/JP2008/061645 2007-06-28 2008-06-26 成膜方法および処理システム WO2009001896A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020097026131A KR101396624B1 (ko) 2007-06-28 2008-06-26 성막 방법 및 처리 시스템
CN2008800224861A CN101689490B (zh) 2007-06-28 2008-06-26 成膜方法和处理系统

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-170656 2007-06-28
JP2007170656A JP2010192467A (ja) 2007-06-28 2007-06-28 被処理体の成膜方法及び処理システム

Publications (1)

Publication Number Publication Date
WO2009001896A1 true WO2009001896A1 (ja) 2008-12-31

Family

ID=40185709

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/061645 WO2009001896A1 (ja) 2007-06-28 2008-06-26 成膜方法および処理システム

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JP (1) JP2010192467A (ja)
KR (1) KR101396624B1 (ja)
CN (1) CN101689490B (ja)
TW (1) TWI445130B (ja)
WO (1) WO2009001896A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011033920A1 (ja) * 2009-09-18 2011-03-24 東京エレクトロン株式会社 Ｃｕ配線の形成方法
WO2011142193A1 (ja) * 2010-05-12 2011-11-17 東京エレクトロン株式会社 金属膜形成システム、金属膜形成方法及びコンピュータ記憶媒体
WO2011142192A1 (ja) * 2010-05-12 2011-11-17 東京エレクトロン株式会社 金属膜形成システム、金属膜形成方法及びコンピュータ記憶媒体
CN105336670A (zh) * 2014-07-14 2016-02-17 中芯国际集成电路制造(上海)有限公司 半导体结构及其形成方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8357599B2 (en) * 2011-02-10 2013-01-22 Applied Materials, Inc. Seed layer passivation
JP5823359B2 (ja) 2012-08-23 2015-11-25 株式会社東芝 半導体装置の製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11317455A (ja) * 1998-02-23 1999-11-16 Hitachi Ltd 半導体装置およびその製造方法
JP2005213610A (ja) * 2004-01-30 2005-08-11 Ebara Corp めっき装置及びめっき方法
JP2006019325A (ja) * 2004-06-30 2006-01-19 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法
JP2007528932A (ja) * 2003-07-08 2007-10-18 アプライド　マテリアルズ　インコーポレイテッド バリヤ金属上に直接銅めっきするマルチステップ電着法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100367461C (zh) * 1993-11-05 2008-02-06 株式会社半导体能源研究所 一种制造薄膜晶体管和电子器件的方法
KR20030090872A (ko) * 2002-05-22 2003-12-01 삼성전자주식회사 반도체 소자의 콘택 형성 방법
CN1327506C (zh) * 2002-06-17 2007-07-18 台湾积体电路制造股份有限公司 无阻挡层且具有多层种子层的内连线工艺与结构

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11317455A (ja) * 1998-02-23 1999-11-16 Hitachi Ltd 半導体装置およびその製造方法
JP2007528932A (ja) * 2003-07-08 2007-10-18 アプライド　マテリアルズ　インコーポレイテッド バリヤ金属上に直接銅めっきするマルチステップ電着法
JP2005213610A (ja) * 2004-01-30 2005-08-11 Ebara Corp めっき装置及びめっき方法
JP2006019325A (ja) * 2004-06-30 2006-01-19 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011033920A1 (ja) * 2009-09-18 2011-03-24 東京エレクトロン株式会社 Ｃｕ配線の形成方法
JP2011066274A (ja) * 2009-09-18 2011-03-31 Tokyo Electron Ltd Ｃｕ配線の形成方法
WO2011142193A1 (ja) * 2010-05-12 2011-11-17 東京エレクトロン株式会社 金属膜形成システム、金属膜形成方法及びコンピュータ記憶媒体
WO2011142192A1 (ja) * 2010-05-12 2011-11-17 東京エレクトロン株式会社 金属膜形成システム、金属膜形成方法及びコンピュータ記憶媒体
JP2011236478A (ja) * 2010-05-12 2011-11-24 Tokyo Electron Ltd 金属膜形成システム、金属膜形成方法、プログラム及びコンピュータ記憶媒体
JP2011236479A (ja) * 2010-05-12 2011-11-24 Tokyo Electron Ltd 金属膜形成システム、金属膜形成方法、プログラム及びコンピュータ記憶媒体
CN105336670A (zh) * 2014-07-14 2016-02-17 中芯国际集成电路制造(上海)有限公司 半导体结构及其形成方法
CN105336670B (zh) * 2014-07-14 2018-07-10 中芯国际集成电路制造(上海)有限公司 半导体结构及其形成方法

Also Published As

Publication number Publication date
TWI445130B (zh) 2014-07-11
JP2010192467A (ja) 2010-09-02
TW200915484A (en) 2009-04-01
CN101689490B (zh) 2011-12-21
KR20100024416A (ko) 2010-03-05
KR101396624B1 (ko) 2014-05-16
CN101689490A (zh) 2010-03-31

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