WO2008153036A1 - オープン型磁気共鳴イメージング装置 - Google Patents

オープン型磁気共鳴イメージング装置 Download PDF

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Publication number
WO2008153036A1
WO2008153036A1 PCT/JP2008/060643 JP2008060643W WO2008153036A1 WO 2008153036 A1 WO2008153036 A1 WO 2008153036A1 JP 2008060643 W JP2008060643 W JP 2008060643W WO 2008153036 A1 WO2008153036 A1 WO 2008153036A1
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WO
WIPO (PCT)
Prior art keywords
magnetic field
frequency
shield
imaging device
magnetic resonance
Prior art date
Application number
PCT/JP2008/060643
Other languages
English (en)
French (fr)
Inventor
Munetaka Tsuda
Original Assignee
Hitachi Medical Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Medical Corporation filed Critical Hitachi Medical Corporation
Priority to JP2009519266A priority Critical patent/JP5427604B2/ja
Priority to US12/602,528 priority patent/US8212564B2/en
Publication of WO2008153036A1 publication Critical patent/WO2008153036A1/ja

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/38Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
    • G01R33/3806Open magnet assemblies for improved access to the sample, e.g. C-type or U-type magnets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/38Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
    • G01R33/381Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/42Screening
    • G01R33/422Screening of the radio frequency field
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/05Detecting, measuring or recording for diagnosis by means of electric currents or magnetic fields; Measuring using microwaves or radio waves 
    • A61B5/055Detecting, measuring or recording for diagnosis by means of electric currents or magnetic fields; Measuring using microwaves or radio waves  involving electronic [EMR] or nuclear [NMR] magnetic resonance, e.g. magnetic resonance imaging

Abstract

 オープン構造のMRI装置において、傾斜磁場コイルと高周波コイルとの間に配置される高周波シールドの磁場遮蔽能力を維持しながら、渦電流に起因する振動を低減することにある。  高周波シールドは、互いに異なる位置で複数に分割された2枚の導体シート501,503と、その間に挟まれた誘電体シート502とを含む。これにより、高周波シールドは、高周波磁場に対する電気的抵抗率が、傾斜磁場のスイッチング周波数に対する電気的抵抗率よりも低くなる。これにより、高周波磁場に対しては一様な導体として作用することができ、高周波磁場の遮蔽能力を発揮できるとともに、傾斜磁場の通過により生じる渦電流を低減でき、振動を抑制できる。
PCT/JP2008/060643 2007-06-14 2008-06-11 オープン型磁気共鳴イメージング装置 WO2008153036A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009519266A JP5427604B2 (ja) 2007-06-14 2008-06-11 オープン型磁気共鳴イメージング装置
US12/602,528 US8212564B2 (en) 2007-06-14 2008-06-11 Open magnetic resonance imaging apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007157309 2007-06-14
JP2007-157309 2007-06-14

Publications (1)

Publication Number Publication Date
WO2008153036A1 true WO2008153036A1 (ja) 2008-12-18

Family

ID=40129641

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/060643 WO2008153036A1 (ja) 2007-06-14 2008-06-11 オープン型磁気共鳴イメージング装置

Country Status (3)

Country Link
US (1) US8212564B2 (ja)
JP (1) JP5427604B2 (ja)
WO (1) WO2008153036A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
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JP4950363B1 (ja) * 2011-03-22 2012-06-13 三菱電機株式会社 超電導マグネット
CN103654787A (zh) * 2012-09-24 2014-03-26 三星电子株式会社 磁共振成像装置及其制造方法
JPWO2016114198A1 (ja) * 2015-01-13 2017-09-28 株式会社日立製作所 磁気共鳴イメージング装置

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WO2008007574A1 (fr) * 2006-07-12 2008-01-17 Hitachi Medical Corporation Aimant supraconducteur, unité d'imagerie par résonance magnétique, et procédé de détermination de la capacité de refroidissement d'un refroidisseur cryogénique
CN102665543B (zh) * 2009-11-27 2015-08-26 株式会社日立医疗器械 倾斜磁场线圈、核磁共振成像装置以及线圈图形的设计方法
CN102412048A (zh) * 2011-11-16 2012-04-11 宁波鑫高益磁材有限公司 一种开放式超导mri磁体系统
DE102011089445B4 (de) * 2011-12-21 2015-11-05 Siemens Aktiengesellschaft Verfahren und Gradientensystem zur Reduzierung von mechanischen Schwingungen in einem Magnetresonanzbildgebungssystem
DE102013226226A1 (de) * 2012-12-21 2014-06-26 Robert Bosch Gmbh Induktivladespulenvorrichtung
DE102013206555B4 (de) * 2013-04-12 2018-03-01 Siemens Healthcare Gmbh Magnetresonanzscanner mit Antennensystem
KR102145001B1 (ko) * 2014-01-03 2020-08-14 삼성전자주식회사 알에프 코일 구조물
MX2017002939A (es) * 2014-09-05 2017-12-07 Hyperfine Res Inc Configuracion automatica de un sistema de formacion de imagenes por resonancia magnetica de campo bajo.
JP2017011236A (ja) * 2015-06-26 2017-01-12 株式会社神戸製鋼所 多層磁気シールド
US10527694B2 (en) * 2015-11-12 2020-01-07 General Electric Company Magnetic resonance imaging system and an associated method thereof
CN114668987A (zh) * 2018-11-14 2022-06-28 上海联影医疗科技股份有限公司 放射治疗系统
CN111913144B (zh) * 2020-06-01 2023-06-23 上海联影医疗科技股份有限公司 用于磁共振系统的壳体结构、电子部件和磁共振系统

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JPH02143509A (ja) * 1988-10-03 1990-06-01 Philips Gloeilampenfab:Nv 磁気共鳴装置の磁石の検査空間における騒音低減装置
JPH10192254A (ja) * 1996-08-16 1998-07-28 General Electric Co <Ge> Rf磁場から勾配コイルを遮蔽する装置
JP2001198104A (ja) * 2000-01-24 2001-07-24 Toshiba Corp Mri装置のコイル構造
JP2002200055A (ja) * 2000-12-28 2002-07-16 Toshiba Medical System Co Ltd 磁気共鳴イメージング装置
JP2003144409A (ja) * 2001-11-08 2003-05-20 Ge Medical Systems Global Technology Co Llc 磁気共鳴撮像装置
JP2004019585A (ja) * 2002-06-18 2004-01-22 Hitachi Ltd スクロール圧縮機
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US6567685B2 (en) * 2000-01-21 2003-05-20 Kabushiki Kaisha Toshiba Magnetic resonance imaging apparatus
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DE10007679C2 (de) * 2000-02-19 2002-06-20 Bruker Ag Faellanden Frequenzgenerator für NMR-Anwendungen mit direkter digitaler Frequenzsynthese (DDS), Verfahren zum Betrieb eines solchen DDS-Generators sowie Verfahren zum Betrieb eines NMR-Spektrometers mit DDS-Generator
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Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02143509A (ja) * 1988-10-03 1990-06-01 Philips Gloeilampenfab:Nv 磁気共鳴装置の磁石の検査空間における騒音低減装置
JPH10192254A (ja) * 1996-08-16 1998-07-28 General Electric Co <Ge> Rf磁場から勾配コイルを遮蔽する装置
JP2001198104A (ja) * 2000-01-24 2001-07-24 Toshiba Corp Mri装置のコイル構造
JP2002200055A (ja) * 2000-12-28 2002-07-16 Toshiba Medical System Co Ltd 磁気共鳴イメージング装置
JP2003144409A (ja) * 2001-11-08 2003-05-20 Ge Medical Systems Global Technology Co Llc 磁気共鳴撮像装置
JP2004019585A (ja) * 2002-06-18 2004-01-22 Hitachi Ltd スクロール圧縮機
JP2005065752A (ja) * 2003-08-28 2005-03-17 Shin Etsu Chem Co Ltd Mri用磁場発生装置
JP2005185318A (ja) * 2003-12-24 2005-07-14 Mitsubishi Electric Corp 磁石装置及び磁気共鳴イメ−ジング装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4950363B1 (ja) * 2011-03-22 2012-06-13 三菱電機株式会社 超電導マグネット
US8989827B2 (en) 2011-03-22 2015-03-24 Mitsubishi Electric Corporation Superconducting magnet
CN103654787A (zh) * 2012-09-24 2014-03-26 三星电子株式会社 磁共振成像装置及其制造方法
JPWO2016114198A1 (ja) * 2015-01-13 2017-09-28 株式会社日立製作所 磁気共鳴イメージング装置

Also Published As

Publication number Publication date
US8212564B2 (en) 2012-07-03
JP5427604B2 (ja) 2014-02-26
US20100176811A1 (en) 2010-07-15
JPWO2008153036A1 (ja) 2010-08-26

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