WO2008136395A1 - プローブカード - Google Patents
プローブカード Download PDFInfo
- Publication number
- WO2008136395A1 WO2008136395A1 PCT/JP2008/058043 JP2008058043W WO2008136395A1 WO 2008136395 A1 WO2008136395 A1 WO 2008136395A1 JP 2008058043 W JP2008058043 W JP 2008058043W WO 2008136395 A1 WO2008136395 A1 WO 2008136395A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- probe
- probes
- thickness direction
- board thickness
- inspecting object
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
Abstract
長手方向が検査対象の表面に対してその表面と略直交する方向から接触するプローブを用いる場合であっても、プローブと検査対象との位置合わせを容易にかつ適確に行うため、各々が導電性材料からなり、長手方向の一端が検査対象の表面に対して当該表面と略直交する方向から接触する複数のプローブと、各々が板厚方向に貫通して複数のプローブのいずれかを収容する複数の孔部を有するとともに、板厚方向に貫通する第1開口部を有するプローブホルダと、プローブホルダに固着され、複数のプローブおよび回路構造と電気的に接続される配線部を有するとともに、板厚方向に貫通して第1開口部と連通する第2開口部を有する配線基板と、前記第1および第2開口部を前記プローブホルダおよび前記配線基板の板厚方向に延長した3次元領域の内部に位置する先端部をそれぞれ有する複数のマーク部材と、を備える。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009512969A JP5145332B2 (ja) | 2007-04-27 | 2008-04-25 | プローブカード |
TW097115639A TWI417550B (zh) | 2007-04-27 | 2008-04-25 | 探針卡 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007119059 | 2007-04-27 | ||
JP2007-119059 | 2007-04-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008136395A1 true WO2008136395A1 (ja) | 2008-11-13 |
Family
ID=39943502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/058043 WO2008136395A1 (ja) | 2007-04-27 | 2008-04-25 | プローブカード |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5145332B2 (ja) |
TW (1) | TWI417550B (ja) |
WO (1) | WO2008136395A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015033744A1 (ja) * | 2013-09-06 | 2015-03-12 | ヤマハファインテック株式会社 | 電気検査装置 |
CN110501538A (zh) * | 2018-05-16 | 2019-11-26 | 日本电产理德股份有限公司 | 探针、检查夹具、检查装置、以及探针的制造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0662381U (ja) * | 1993-01-29 | 1994-09-02 | 安藤電気株式会社 | スプリングピン式プローブカードとtab |
WO2004074858A1 (ja) * | 2003-02-21 | 2004-09-02 | Nhk Spring Co., Ltd. | チップ実装用テープの検査方法及び検査に用いるプローブユニット |
JP2006266893A (ja) * | 2005-03-24 | 2006-10-05 | Yamaha Corp | プローブユニット |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62136844A (ja) * | 1985-12-11 | 1987-06-19 | Mitsubishi Electric Corp | プロ−ビング装置 |
JP2001185588A (ja) * | 1999-12-22 | 2001-07-06 | Ando Electric Co Ltd | Tab、プローブカード、tabハンドラ、及びicチップ測定方法 |
-
2008
- 2008-04-25 WO PCT/JP2008/058043 patent/WO2008136395A1/ja active Application Filing
- 2008-04-25 TW TW097115639A patent/TWI417550B/zh not_active IP Right Cessation
- 2008-04-25 JP JP2009512969A patent/JP5145332B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0662381U (ja) * | 1993-01-29 | 1994-09-02 | 安藤電気株式会社 | スプリングピン式プローブカードとtab |
WO2004074858A1 (ja) * | 2003-02-21 | 2004-09-02 | Nhk Spring Co., Ltd. | チップ実装用テープの検査方法及び検査に用いるプローブユニット |
JP2006266893A (ja) * | 2005-03-24 | 2006-10-05 | Yamaha Corp | プローブユニット |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015033744A1 (ja) * | 2013-09-06 | 2015-03-12 | ヤマハファインテック株式会社 | 電気検査装置 |
CN110501538A (zh) * | 2018-05-16 | 2019-11-26 | 日本电产理德股份有限公司 | 探针、检查夹具、检查装置、以及探针的制造方法 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2008136395A1 (ja) | 2010-07-29 |
JP5145332B2 (ja) | 2013-02-13 |
TWI417550B (zh) | 2013-12-01 |
TW200902982A (en) | 2009-01-16 |
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