WO2008126895A1 - 超伝導磁石装置、磁気共鳴撮像装置、及び、磁場不均一補償方法 - Google Patents

超伝導磁石装置、磁気共鳴撮像装置、及び、磁場不均一補償方法 Download PDF

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Publication number
WO2008126895A1
WO2008126895A1 PCT/JP2008/057075 JP2008057075W WO2008126895A1 WO 2008126895 A1 WO2008126895 A1 WO 2008126895A1 JP 2008057075 W JP2008057075 W JP 2008057075W WO 2008126895 A1 WO2008126895 A1 WO 2008126895A1
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WO
WIPO (PCT)
Prior art keywords
magnetic field
magnet apparatus
superconducting magnet
imaging device
resonance imaging
Prior art date
Application number
PCT/JP2008/057075
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English (en)
French (fr)
Inventor
Ryuya Ando
Kenji Sakakibara
Original Assignee
Hitachi Medical Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Medical Corporation filed Critical Hitachi Medical Corporation
Priority to US12/593,426 priority Critical patent/US8198897B2/en
Publication of WO2008126895A1 publication Critical patent/WO2008126895A1/ja

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Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/05—Detecting, measuring or recording for diagnosis by means of electric currents or magnetic fields; Measuring using microwaves or radio waves 
    • A61B5/055—Detecting, measuring or recording for diagnosis by means of electric currents or magnetic fields; Measuring using microwaves or radio waves  involving electronic [EMR] or nuclear [NMR] magnetic resonance, e.g. magnetic resonance imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
    • G01R33/3806—Open magnet assemblies for improved access to the sample, e.g. C-type or U-type magnets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
    • G01R33/381—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets
    • G01R33/3815—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets with superconducting coils, e.g. power supply therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
    • G01R33/387—Compensation of inhomogeneities
    • G01R33/3873—Compensation of inhomogeneities using ferromagnetic bodies ; Passive shimming
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
    • G01R33/389—Field stabilisation, e.g. by field measurements and control means or indirectly by current stabilisation

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Biophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Radiology & Medical Imaging (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)

Abstract

　超伝導コイルの励磁電流の誤差に起因する不均一磁場を安価に効率良く補償して均一磁場を得ることのできる超伝導磁石装置、及び、磁気共鳴撮像装置を得る。 　磁場均一度調整装置２０は、少なくとも一対の超伝導コイル２Ａ，３Ａと少なくとも一対の強磁性体とからなる磁場発生源が対向して配置され、これらの間に挟まれる領域に略均一な磁場空間を形成してなる超伝導磁石装置１のためのものであって、磁場空間における磁場分布を測定する磁場分布測定装置２１と、磁場分布測定装置２１により測定された磁場分布に基づき、磁場空間の均一性を向上させるために必要な強磁性体の温度変化量を算出する温度変化量算出装置２２と、温度変化量算出装置２２により算出された温度変化量に基づいて、強磁性体の温度制御値を設定する温度制御装置１２と、を具備したことを特徴とする。
PCT/JP2008/057075 2007-04-10 2008-04-10 超伝導磁石装置、磁気共鳴撮像装置、及び、磁場不均一補償方法 WO2008126895A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/593,426 US8198897B2 (en) 2007-04-10 2008-04-10 Superconductive magnetic device, magnetic resonance imaging apparatus and magnetic field inhomogeneity compensation method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007102560A JP5060151B2 (ja) 2007-04-10 2007-04-10 磁場均一度調整装置、およびこれを用いた超伝導磁石装置、並びに磁気共鳴撮像装置
JP2007-102560 2007-04-10

Publications (1)

Publication Number Publication Date
WO2008126895A1 true WO2008126895A1 (ja) 2008-10-23

Family

ID=39863990

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/057075 WO2008126895A1 (ja) 2007-04-10 2008-04-10 超伝導磁石装置、磁気共鳴撮像装置、及び、磁場不均一補償方法

Country Status (3)

Country Link
US (1) US8198897B2 (ja)
JP (1) JP5060151B2 (ja)
WO (1) WO2008126895A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7480026B2 (ja) 2020-11-09 2024-05-09 キヤノンメディカルシステムズ株式会社 磁気共鳴イメージング装置、温度測定装置および温度測定方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4934067B2 (ja) * 2008-01-24 2012-05-16 株式会社日立製作所 超伝導磁石装置および磁気共鳴イメージング装置
JP2011217913A (ja) * 2010-04-08 2011-11-04 Mr Technology:Kk 温度制御方法及び装置
KR101372822B1 (ko) * 2012-12-24 2014-03-12 주식회사 포스코 초전도 풍력 터빈 냉각 장치 및 그 냉각 방법
EP3193184A1 (en) 2016-01-17 2017-07-19 Eidgenössische Technische Hochschule (ETH) B0 shimming device for mri

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08215168A (ja) * 1995-02-17 1996-08-27 Ge Yokogawa Medical Syst Ltd 磁場均一度調整方法および装置
JP2003513436A (ja) * 1999-10-29 2003-04-08 オックスフォード マグネット テクノロジー リミテッド 改良型磁石
JP2004351207A (ja) * 2003-05-28 2004-12-16 Ge Medical Systems Global Technology Co Llc 均一な磁場を用いたイメージング・システム
JP2006305146A (ja) * 2005-04-28 2006-11-09 Hitachi Ltd 磁気共鳴イメージング装置

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JPH09190913A (ja) * 1996-01-10 1997-07-22 Hitachi Medical Corp 超電導磁石装置及びそれを用いた磁気共鳴イメージング装置
JP3585141B2 (ja) * 1996-04-05 2004-11-04 株式会社日立メディコ 超電導磁石装置
US5786695A (en) * 1997-03-21 1998-07-28 Picker International, Inc. Shim tray with reduced heat conduction and forced cooling
JP4105808B2 (ja) * 1998-08-11 2008-06-25 株式会社神戸製鋼所 超電導磁石装置
JP3781166B2 (ja) * 1999-03-26 2006-05-31 株式会社日立メディコ 磁気共鳴イメージング装置および静磁場均一度維持方法
US6252405B1 (en) * 1999-11-15 2001-06-26 General Electric Company Temperature compensated NMR magnet and method of operation therefor
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JP3983984B2 (ja) * 2001-02-15 2007-09-26 株式会社日立製作所 磁石装置とそれを用いた核磁気共鳴イメージング装置及びその磁場均一度調整方法
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Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08215168A (ja) * 1995-02-17 1996-08-27 Ge Yokogawa Medical Syst Ltd 磁場均一度調整方法および装置
JP2003513436A (ja) * 1999-10-29 2003-04-08 オックスフォード マグネット テクノロジー リミテッド 改良型磁石
JP2004351207A (ja) * 2003-05-28 2004-12-16 Ge Medical Systems Global Technology Co Llc 均一な磁場を用いたイメージング・システム
JP2006305146A (ja) * 2005-04-28 2006-11-09 Hitachi Ltd 磁気共鳴イメージング装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7480026B2 (ja) 2020-11-09 2024-05-09 キヤノンメディカルシステムズ株式会社 磁気共鳴イメージング装置、温度測定装置および温度測定方法

Also Published As

Publication number Publication date
US20100045293A1 (en) 2010-02-25
US8198897B2 (en) 2012-06-12
JP2008259558A (ja) 2008-10-30
JP5060151B2 (ja) 2012-10-31

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