WO2008126164A1 - 電子部品試験装置及び電子部品の移載方法 - Google Patents

電子部品試験装置及び電子部品の移載方法 Download PDF

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Publication number
WO2008126164A1
WO2008126164A1 PCT/JP2007/054667 JP2007054667W WO2008126164A1 WO 2008126164 A1 WO2008126164 A1 WO 2008126164A1 JP 2007054667 W JP2007054667 W JP 2007054667W WO 2008126164 A1 WO2008126164 A1 WO 2008126164A1
Authority
WO
WIPO (PCT)
Prior art keywords
electronic component
testing apparatus
storing
transferring
pairs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/054667
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Yoshiyuki Masuo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to PCT/JP2007/054667 priority Critical patent/WO2008126164A1/ja
Priority to TW097105700A priority patent/TW200907369A/zh
Publication of WO2008126164A1 publication Critical patent/WO2008126164A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
PCT/JP2007/054667 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法 Ceased WO2008126164A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/054667 WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法
TW097105700A TW200907369A (en) 2007-03-09 2008-02-19 Electronic component testing apparatus and method for transferring electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/054667 WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法

Publications (1)

Publication Number Publication Date
WO2008126164A1 true WO2008126164A1 (ja) 2008-10-23

Family

ID=39863348

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/054667 Ceased WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法

Country Status (2)

Country Link
TW (1) TW200907369A (enExample)
WO (1) WO2008126164A1 (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08292233A (ja) * 1995-04-25 1996-11-05 Hitachi Ltd Ｉｃハンドラ
JPH08334548A (ja) * 1995-06-07 1996-12-17 Tokyo Electron Ltd 検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08292233A (ja) * 1995-04-25 1996-11-05 Hitachi Ltd Ｉｃハンドラ
JPH08334548A (ja) * 1995-06-07 1996-12-17 Tokyo Electron Ltd 検査装置

Also Published As

Publication number Publication date
TWI354800B (enExample) 2011-12-21
TW200907369A (en) 2009-02-16

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