WO2008123434A1 - 回転マグネットスパッタ装置 - Google Patents
回転マグネットスパッタ装置 Download PDFInfo
- Publication number
- WO2008123434A1 WO2008123434A1 PCT/JP2008/056139 JP2008056139W WO2008123434A1 WO 2008123434 A1 WO2008123434 A1 WO 2008123434A1 JP 2008056139 W JP2008056139 W JP 2008056139W WO 2008123434 A1 WO2008123434 A1 WO 2008123434A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- target
- magnetron sputtering
- sputtering apparatus
- consumption
- rotating magnetron
- Prior art date
Links
- 238000001755 magnetron sputter deposition Methods 0.000 title abstract 2
- 238000006073 displacement reaction Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3464—Operating strategies
- H01J37/347—Thickness uniformity of coated layers or desired profile of target erosion
Abstract
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008800094162A CN101641458B (zh) | 2007-03-30 | 2008-03-28 | 旋转磁铁溅射装置 |
KR1020127006088A KR101231261B1 (ko) | 2007-03-30 | 2008-03-28 | 회전 마그넷 스퍼터 장치 |
US12/593,660 US8496792B2 (en) | 2007-03-30 | 2008-03-28 | Rotary magnet sputtering apparatus |
DE112008000765T DE112008000765T5 (de) | 2007-03-30 | 2008-03-28 | Drehmagnet-Sputter-Vorrichtung |
KR1020097021033A KR101166396B1 (ko) | 2007-03-30 | 2008-03-28 | 회전 마그넷 스퍼터 장치 |
JP2009509225A JP5147083B2 (ja) | 2007-03-30 | 2008-03-28 | 回転マグネットスパッタ装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007092058 | 2007-03-30 | ||
JP2007-092058 | 2007-03-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008123434A1 true WO2008123434A1 (ja) | 2008-10-16 |
Family
ID=39830919
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/056139 WO2008123434A1 (ja) | 2007-03-30 | 2008-03-28 | 回転マグネットスパッタ装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8496792B2 (ja) |
JP (1) | JP5147083B2 (ja) |
KR (2) | KR101231261B1 (ja) |
CN (1) | CN101641458B (ja) |
DE (1) | DE112008000765T5 (ja) |
TW (1) | TWI391508B (ja) |
WO (1) | WO2008123434A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009054060A1 (de) * | 2009-11-20 | 2011-05-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und Verfahren zum Beschichten eines Substrates |
JP2016514207A (ja) * | 2013-03-01 | 2016-05-19 | スパッタリング・コンポーネンツ・インコーポレーテッド | スパッタリング装置 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI410511B (zh) * | 2007-03-16 | 2013-10-01 | Univ Tohoku Nat Univ Corp | 磁控管濺鍍裝置 |
JP5283084B2 (ja) * | 2007-04-06 | 2013-09-04 | 国立大学法人東北大学 | マグネトロンスパッタ装置 |
TWI391514B (zh) * | 2009-07-16 | 2013-04-01 | Univ Nat Sun Yat Sen | 磁控濺鍍機 |
JP5319021B2 (ja) * | 2010-12-06 | 2013-10-16 | シャープ株式会社 | 薄膜形成装置及び薄膜形成方法 |
US9093251B2 (en) | 2011-02-18 | 2015-07-28 | Toyota Motor Europe Nv/Sa | Sputtering magnetron assembly |
KR101275672B1 (ko) * | 2011-03-15 | 2013-06-17 | (주)울텍 | 스퍼터링 마그네트론 |
JP5424518B1 (ja) * | 2012-10-26 | 2014-02-26 | 国立大学法人東北大学 | マグネトロンスパッタ装置およびマグネトロンスパッタ方法 |
US10804083B2 (en) * | 2014-07-09 | 2020-10-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Cathode assembly, physical vapor deposition system, and method for physical vapor deposition |
CN105951052B (zh) * | 2016-06-29 | 2018-10-12 | 昆山国显光电有限公司 | 磁控溅射装置 |
FR3073279A1 (fr) * | 2017-11-09 | 2019-05-10 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Systeme de mesure d'un diametre et/ou d'une epaisseur d'une cible disposee dans une chambre de depot d'un equipement de depot |
KR102149680B1 (ko) * | 2018-08-03 | 2020-08-31 | 주식회사 테토스 | 기판 측면부 증착 장치 |
BE1026859B1 (nl) * | 2018-10-22 | 2020-07-14 | Soleras Advanced Coatings Bv | Magnetron met geïntegreerd circuit voor het monitoren en controle |
CN112553583B (zh) * | 2019-09-25 | 2023-03-28 | 亚威科股份有限公司 | 溅射装置及溅射装置控制方法 |
CN112593193B (zh) * | 2020-11-16 | 2022-12-09 | 中建材玻璃新材料研究院集团有限公司 | 一种真空磁控溅射镀膜设备及其镀膜方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63307270A (ja) * | 1987-06-08 | 1988-12-14 | Matsushita Electric Ind Co Ltd | スパッタリング装置 |
JPH1026698A (ja) * | 1996-07-12 | 1998-01-27 | Nikon Corp | 真空薄膜形成装置及び反射鏡の製造方法 |
JP2001032067A (ja) * | 1999-07-22 | 2001-02-06 | Sanyo Shinku Kogyo Kk | 成膜用磁石とそれを用いた成膜方法及びその装置 |
WO2007043476A1 (ja) * | 2005-10-07 | 2007-04-19 | Tohoku University | マグネトロンスパッタ装置 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4194962A (en) * | 1978-12-20 | 1980-03-25 | Advanced Coating Technology, Inc. | Cathode for sputtering |
DE3521053A1 (de) * | 1985-06-12 | 1986-12-18 | Leybold-Heraeus GmbH, 5000 Köln | Vorrichtung zum aufbringen duenner schichten auf ein substrat |
JPS63290270A (ja) * | 1987-05-20 | 1988-11-28 | Toshiba Corp | スパッタリング装置におけるタ−ゲットの厚さ測定方法 |
JPH05148642A (ja) | 1991-11-28 | 1993-06-15 | Hitachi Ltd | マグネトロンスパツタ装置 |
US5399253A (en) | 1992-12-23 | 1995-03-21 | Balzers Aktiengesellschaft | Plasma generating device |
CN1067118C (zh) * | 1994-07-08 | 2001-06-13 | 松下电器产业株式会社 | 磁控管溅射装置 |
US6093293A (en) * | 1997-12-17 | 2000-07-25 | Balzers Hochvakuum Ag | Magnetron sputtering source |
JP3803520B2 (ja) | 1999-02-22 | 2006-08-02 | 忠弘 大見 | マグネット回転スパッタ装置 |
US6251242B1 (en) * | 2000-01-21 | 2001-06-26 | Applied Materials, Inc. | Magnetron and target producing an extended plasma region in a sputter reactor |
US6811657B2 (en) * | 2003-01-27 | 2004-11-02 | Micron Technology, Inc. | Device for measuring the profile of a metal film sputter deposition target, and system and method employing same |
WO2004097401A1 (en) * | 2003-04-24 | 2004-11-11 | Tosoh Smd, Inc. | Systems and methods for non-contact measuring sputtering target thickness ultrasoniics |
US7674360B2 (en) * | 2003-12-12 | 2010-03-09 | Applied Materials, Inc. | Mechanism for varying the spacing between sputter magnetron and target |
EP1626433B1 (de) * | 2004-08-10 | 2007-02-21 | Applied Materials GmbH & Co. KG | Magnetronsputtereinrichtung, Zylinderkathode und Verfahren zur Aufbringung von dünnen Mehrkomponentenschichten auf einem Substrat |
TWI403603B (zh) * | 2004-12-17 | 2013-08-01 | Oerlikon Solar Ag | 磁控管濺鍍設備 |
TWI322190B (en) * | 2004-12-28 | 2010-03-21 | Fts Corp | Facing-targets sputtering apparatus |
JPWO2006097994A1 (ja) * | 2005-03-14 | 2008-08-21 | 株式会社薄膜プロセス | スパッタリング装置 |
CN101351865B (zh) * | 2005-12-22 | 2012-08-29 | 欧瑞康太阳能股份公司(特吕巴赫) | 制作至少一个溅射涂覆基板的方法及溅射源 |
-
2008
- 2008-03-28 US US12/593,660 patent/US8496792B2/en not_active Expired - Fee Related
- 2008-03-28 KR KR1020127006088A patent/KR101231261B1/ko not_active IP Right Cessation
- 2008-03-28 KR KR1020097021033A patent/KR101166396B1/ko not_active IP Right Cessation
- 2008-03-28 DE DE112008000765T patent/DE112008000765T5/de not_active Ceased
- 2008-03-28 JP JP2009509225A patent/JP5147083B2/ja not_active Expired - Fee Related
- 2008-03-28 WO PCT/JP2008/056139 patent/WO2008123434A1/ja active Application Filing
- 2008-03-28 CN CN2008800094162A patent/CN101641458B/zh not_active Expired - Fee Related
- 2008-03-31 TW TW097111690A patent/TWI391508B/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63307270A (ja) * | 1987-06-08 | 1988-12-14 | Matsushita Electric Ind Co Ltd | スパッタリング装置 |
JPH1026698A (ja) * | 1996-07-12 | 1998-01-27 | Nikon Corp | 真空薄膜形成装置及び反射鏡の製造方法 |
JP2001032067A (ja) * | 1999-07-22 | 2001-02-06 | Sanyo Shinku Kogyo Kk | 成膜用磁石とそれを用いた成膜方法及びその装置 |
WO2007043476A1 (ja) * | 2005-10-07 | 2007-04-19 | Tohoku University | マグネトロンスパッタ装置 |
Non-Patent Citations (1)
Title |
---|
ITAGAKI K., HARI Y., HAYAKAWA K.: "Ogata Kiban'yo Spatter Sochi ni Okeru Multi Magnet Cathode (MMC) no Tokucho", CANON ANELVA TECHNICAL REPORTS, vol. 12, May 2006 (2006-05-01), pages 29 - 32 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009054060A1 (de) * | 2009-11-20 | 2011-05-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und Verfahren zum Beschichten eines Substrates |
DE102009054060B4 (de) * | 2009-11-20 | 2014-10-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und Verfahren zum Beschichten eines Substrates |
JP2016514207A (ja) * | 2013-03-01 | 2016-05-19 | スパッタリング・コンポーネンツ・インコーポレーテッド | スパッタリング装置 |
Also Published As
Publication number | Publication date |
---|---|
TW200916596A (en) | 2009-04-16 |
DE112008000765T5 (de) | 2010-04-29 |
KR101231261B1 (ko) | 2013-02-07 |
US20100126852A1 (en) | 2010-05-27 |
US8496792B2 (en) | 2013-07-30 |
JPWO2008123434A1 (ja) | 2010-07-15 |
CN101641458B (zh) | 2013-07-24 |
KR20120034824A (ko) | 2012-04-12 |
JP5147083B2 (ja) | 2013-02-20 |
KR20090122376A (ko) | 2009-11-27 |
KR101166396B1 (ko) | 2012-07-23 |
TWI391508B (zh) | 2013-04-01 |
CN101641458A (zh) | 2010-02-03 |
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