WO2008093573A1 - 半導体レーザ - Google Patents
半導体レーザ Download PDFInfo
- Publication number
- WO2008093573A1 WO2008093573A1 PCT/JP2008/050850 JP2008050850W WO2008093573A1 WO 2008093573 A1 WO2008093573 A1 WO 2008093573A1 JP 2008050850 W JP2008050850 W JP 2008050850W WO 2008093573 A1 WO2008093573 A1 WO 2008093573A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- face
- side end
- axis side
- axis
- semiconductor laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0282—Passivation layers or treatments
- H01S5/0283—Optically inactive coating on the facet, e.g. half-wave coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2201—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure in a specific crystallographic orientation
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
Abstract
この半導体レーザは、c面以外の結晶面を結晶成長主面とした六方晶構造のIII族窒化物半導体からなるファブリペロー型半導体レーザである。この半導体レーザは、c軸と交差する平面に平行な+c軸側端面および-c軸側端面を有し、+c軸側端面からのレーザ出力が、-c軸側端面からのレーザ出力よりも大きくなるようにして、前記+c軸側端面をレーザ出射端面としてある。c軸の前記結晶成長主面への投影ベクトルに平行に導波路が形成されていることが好ましい。また、前記結晶成長主面がm面であることが好ましい。さらに、前記+c軸側端面が+c面であり、前記-c軸側端面が-c面であることが好ましい。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007-019915 | 2007-01-30 | ||
| JP2007019915A JP2008187044A (ja) | 2007-01-30 | 2007-01-30 | 半導体レーザ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2008093573A1 true WO2008093573A1 (ja) | 2008-08-07 |
Family
ID=39673885
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/050850 Ceased WO2008093573A1 (ja) | 2007-01-30 | 2008-01-23 | 半導体レーザ |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP2008187044A (ja) |
| TW (1) | TW200845524A (ja) |
| WO (1) | WO2008093573A1 (ja) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010056282A (ja) * | 2008-08-28 | 2010-03-11 | Tohoku Univ | 窒化物半導体発光素子およびその製造方法 |
| WO2010100699A1 (ja) * | 2009-03-06 | 2010-09-10 | パナソニック株式会社 | 窒化物半導体の結晶成長方法および半導体装置の製造方法 |
| CN102668279A (zh) * | 2009-12-25 | 2012-09-12 | 住友电气工业株式会社 | Iii族氮化物半导体激光器元件及制作iii族氮化物半导体激光器元件的方法 |
| CN102696158A (zh) * | 2010-01-07 | 2012-09-26 | 住友电气工业株式会社 | Iii族氮化物半导体激光器元件、制作iii族氮化物半导体激光器元件的方法及评估因形成刻划槽所致损伤的方法 |
| EP2518840A4 (en) * | 2009-12-25 | 2014-12-31 | Sumitomo Electric Industries | GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT, METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT, AND EPITAXIAL SUBSTRATE |
| EP2518841A4 (en) * | 2009-12-25 | 2014-12-31 | Sumitomo Electric Industries | GROUP III NITRIDE SEMI-CONDUCTIVE LASER ELEMENT, AND METHOD FOR MANUFACTURING GROUP III NITRIDE SEMI-CONDUCTIVE LASER ELEMENT |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010123920A (ja) * | 2008-10-20 | 2010-06-03 | Sumitomo Electric Ind Ltd | 窒化物系半導体発光素子を作製する方法、及びエピタキシャルウエハを作製する方法 |
| JP5387302B2 (ja) * | 2009-09-30 | 2014-01-15 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子、及びiii族窒化物半導体レーザ素子を作製する方法 |
| JP5397136B2 (ja) * | 2009-09-30 | 2014-01-22 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子、及びiii族窒化物半導体レーザ素子を作製する方法 |
| JP5365679B2 (ja) * | 2009-12-25 | 2013-12-11 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子 |
| JP5348216B2 (ja) * | 2011-10-20 | 2013-11-20 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子、及びiii族窒化物半導体レーザ素子を作製する方法 |
| JP5348217B2 (ja) * | 2011-10-20 | 2013-11-20 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子、及びiii族窒化物半導体レーザ素子を作製する方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000216497A (ja) * | 1999-01-22 | 2000-08-04 | Sanyo Electric Co Ltd | 半導体素子およびその製造方法 |
| JP2001156383A (ja) * | 1999-09-16 | 2001-06-08 | Furukawa Electric Co Ltd:The | 半導体レーザ素子 |
| JP2001217506A (ja) * | 2000-02-03 | 2001-08-10 | Ricoh Co Ltd | 半導体基板およびその作製方法および発光素子 |
| JP2005531154A (ja) * | 2002-06-26 | 2005-10-13 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | 窒化物半導体レーザ素子及びその性能を向上させる方法 |
| JP2006245564A (ja) * | 2005-02-07 | 2006-09-14 | Matsushita Electric Ind Co Ltd | 半導体装置 |
-
2007
- 2007-01-30 JP JP2007019915A patent/JP2008187044A/ja active Pending
-
2008
- 2008-01-23 WO PCT/JP2008/050850 patent/WO2008093573A1/ja not_active Ceased
- 2008-01-28 TW TW97103142A patent/TW200845524A/zh unknown
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000216497A (ja) * | 1999-01-22 | 2000-08-04 | Sanyo Electric Co Ltd | 半導体素子およびその製造方法 |
| JP2001156383A (ja) * | 1999-09-16 | 2001-06-08 | Furukawa Electric Co Ltd:The | 半導体レーザ素子 |
| JP2001217506A (ja) * | 2000-02-03 | 2001-08-10 | Ricoh Co Ltd | 半導体基板およびその作製方法および発光素子 |
| JP2005531154A (ja) * | 2002-06-26 | 2005-10-13 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | 窒化物半導体レーザ素子及びその性能を向上させる方法 |
| JP2006245564A (ja) * | 2005-02-07 | 2006-09-14 | Matsushita Electric Ind Co Ltd | 半導体装置 |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010056282A (ja) * | 2008-08-28 | 2010-03-11 | Tohoku Univ | 窒化物半導体発光素子およびその製造方法 |
| WO2010100699A1 (ja) * | 2009-03-06 | 2010-09-10 | パナソニック株式会社 | 窒化物半導体の結晶成長方法および半導体装置の製造方法 |
| JPWO2010100699A1 (ja) * | 2009-03-06 | 2012-09-06 | パナソニック株式会社 | 窒化物半導体の結晶成長方法および半導体装置の製造方法 |
| CN102668279A (zh) * | 2009-12-25 | 2012-09-12 | 住友电气工业株式会社 | Iii族氮化物半导体激光器元件及制作iii族氮化物半导体激光器元件的方法 |
| CN102668279B (zh) * | 2009-12-25 | 2014-09-10 | 住友电气工业株式会社 | Iii族氮化物半导体激光器元件及制作iii族氮化物半导体激光器元件的方法 |
| EP2518840A4 (en) * | 2009-12-25 | 2014-12-31 | Sumitomo Electric Industries | GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT, METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT, AND EPITAXIAL SUBSTRATE |
| EP2518841A4 (en) * | 2009-12-25 | 2014-12-31 | Sumitomo Electric Industries | GROUP III NITRIDE SEMI-CONDUCTIVE LASER ELEMENT, AND METHOD FOR MANUFACTURING GROUP III NITRIDE SEMI-CONDUCTIVE LASER ELEMENT |
| CN102696158A (zh) * | 2010-01-07 | 2012-09-26 | 住友电气工业株式会社 | Iii族氮化物半导体激光器元件、制作iii族氮化物半导体激光器元件的方法及评估因形成刻划槽所致损伤的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008187044A (ja) | 2008-08-14 |
| TW200845524A (en) | 2008-11-16 |
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