WO2008081797A1 - 磁気検出装置 - Google Patents

磁気検出装置 Download PDF

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Publication number
WO2008081797A1
WO2008081797A1 PCT/JP2007/074898 JP2007074898W WO2008081797A1 WO 2008081797 A1 WO2008081797 A1 WO 2008081797A1 JP 2007074898 W JP2007074898 W JP 2007074898W WO 2008081797 A1 WO2008081797 A1 WO 2008081797A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetoresistive effect
relative movement
magnetization
magnetic layer
centers
Prior art date
Application number
PCT/JP2007/074898
Other languages
English (en)
French (fr)
Inventor
Koji Kurata
Ichiro Tokunaga
Original Assignee
Alps Electric Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co., Ltd. filed Critical Alps Electric Co., Ltd.
Priority to DE112007003178T priority Critical patent/DE112007003178T5/de
Priority to JP2008552113A priority patent/JPWO2008081797A1/ja
Publication of WO2008081797A1 publication Critical patent/WO2008081797A1/ja
Priority to US12/485,000 priority patent/US20090251830A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

【課題】　特に、従来に比べて、出力波形の安定化を図り、検出精度を向上させることが可能な磁気検出装置を提供することを目的としている。 【解決手段】　磁気抵抗効果素子２４ａ～２４ｈは磁化方向が一方向に固定される固定磁性層と、前記外部磁界に対して磁化変動するフリー磁性層とが、非磁性材料層を介して積層された積層構造を有する。永久磁石２１のＮ極と前記Ｓ極の中心間距離をλとしたとき、直列接続される前記磁気抵抗効果素子どうしは、相対移動方向と平行な方向にλの中心間距離を空けて配置されている。各磁気抵抗効果素子の前記積層構造の各層間の界面Ｓは、前記永久磁石２１の対向面２１ａに対して直交し、且つ、前記相対移動方向に向いている。各磁気抵抗効果素子の前記固定磁性層３１の磁化方向３１ａは、全て、前記界面Ｓと平行な面内にて、前記相対移動方向と直交する方向に向いている。
PCT/JP2007/074898 2006-12-28 2007-12-26 磁気検出装置 WO2008081797A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE112007003178T DE112007003178T5 (de) 2006-12-28 2007-12-26 Magnetdetektor
JP2008552113A JPWO2008081797A1 (ja) 2006-12-28 2007-12-26 磁気検出装置
US12/485,000 US20090251830A1 (en) 2006-12-28 2009-06-15 Magnetic detector

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006-354740 2006-12-28
JP2006354740 2006-12-28

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/485,000 Continuation US20090251830A1 (en) 2006-12-28 2009-06-15 Magnetic detector

Publications (1)

Publication Number Publication Date
WO2008081797A1 true WO2008081797A1 (ja) 2008-07-10

Family

ID=39588480

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/074898 WO2008081797A1 (ja) 2006-12-28 2007-12-26 磁気検出装置

Country Status (4)

Country Link
US (1) US20090251830A1 (ja)
JP (1) JPWO2008081797A1 (ja)
DE (1) DE112007003178T5 (ja)
WO (1) WO2008081797A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011017614A (ja) * 2009-07-09 2011-01-27 Tdk Corp 磁気式位置検出装置
JP2017194457A (ja) * 2016-03-31 2017-10-26 エヌテエヌ−エスエヌエール ルルモン 周期磁界検出するセンサ
CN110864619A (zh) * 2018-08-27 2020-03-06 恩智浦有限公司 用于旋转角测量的磁场传感器系统和方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6064816B2 (ja) * 2013-07-17 2017-01-25 株式会社デンソー 回転センサ
US9872115B2 (en) * 2015-09-14 2018-01-16 Cochlear Limited Retention magnet system for medical device
DE102018211500A1 (de) * 2018-07-11 2020-01-16 Infineon Technologies Ag Vorrichtung und Verfahren zur Bestimmung der Lage eines Permanentmagneten
EP4001853A1 (en) * 2020-11-17 2022-05-25 Universität Wien Magnetic encoder and method of detecting translational and/or rotational displacement

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06261523A (ja) * 1993-03-08 1994-09-16 Sony Corp 回転検出装置
JPH0868661A (ja) * 1994-08-30 1996-03-12 Sony Corp 位置検出装置
JP2006023179A (ja) * 2004-07-08 2006-01-26 Tdk Corp 磁気式位置検出装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3560821B2 (ja) 1998-07-17 2004-09-02 アルプス電気株式会社 巨大磁気抵抗効果素子を備えたエンコーダ

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06261523A (ja) * 1993-03-08 1994-09-16 Sony Corp 回転検出装置
JPH0868661A (ja) * 1994-08-30 1996-03-12 Sony Corp 位置検出装置
JP2006023179A (ja) * 2004-07-08 2006-01-26 Tdk Corp 磁気式位置検出装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011017614A (ja) * 2009-07-09 2011-01-27 Tdk Corp 磁気式位置検出装置
JP2017194457A (ja) * 2016-03-31 2017-10-26 エヌテエヌ−エスエヌエール ルルモン 周期磁界検出するセンサ
JP7071058B2 (ja) 2016-03-31 2022-05-18 エヌテエヌ－エスエヌエール ルルモン 周期磁界検出するセンサ
CN110864619A (zh) * 2018-08-27 2020-03-06 恩智浦有限公司 用于旋转角测量的磁场传感器系统和方法
CN110864619B (zh) * 2018-08-27 2023-10-24 恩智浦有限公司 用于旋转角测量的磁场传感器系统和方法

Also Published As

Publication number Publication date
JPWO2008081797A1 (ja) 2010-04-30
US20090251830A1 (en) 2009-10-08
DE112007003178T5 (de) 2009-11-26

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