WO2008081713A1 - 信号品質測定装置、スペクトラム測定回路、プログラム - Google Patents

信号品質測定装置、スペクトラム測定回路、プログラム Download PDF

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Publication number
WO2008081713A1
WO2008081713A1 PCT/JP2007/074329 JP2007074329W WO2008081713A1 WO 2008081713 A1 WO2008081713 A1 WO 2008081713A1 JP 2007074329 W JP2007074329 W JP 2007074329W WO 2008081713 A1 WO2008081713 A1 WO 2008081713A1
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WO
WIPO (PCT)
Prior art keywords
signal
circuit
phase
phase modulation
clock generation
Prior art date
Application number
PCT/JP2007/074329
Other languages
English (en)
French (fr)
Inventor
Koichi Nose
Masayuki Mizuno
Original Assignee
Nec Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nec Corporation filed Critical Nec Corporation
Priority to EP07850815.7A priority Critical patent/EP2103948A4/en
Priority to US12/522,243 priority patent/US8355884B2/en
Priority to JP2008552085A priority patent/JP5347507B2/ja
Publication of WO2008081713A1 publication Critical patent/WO2008081713A1/ja

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters
    • H04B17/318—Received signal strength
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)

Abstract

　本発明の信号品質測定装置において、スペクトラム測定回路（１０１）は、位相変調量の設定が切り替えられる度に、クロック信号の位相を当該位相変調量だけずらした位相変調信号を出力するＮ（Ｎは２以上の整数）相クロック発生回路（３０４）と、送信器から出力された被測定信号とＮ相クロック発生回路（３０４）から出力された位相変調信号との積をとるミキサ回路（３０３）と、ミキサ回路（３０３）の出力信号の平均電圧値を出力する平均値出力回路（３０５）と、Ｎ相クロック発生回路（３０４）の位相変調量ごとに、平均値出力回路（３０５）から出力される平均電圧値を格納するメモリ（３０７）と、メモリ（３０７）に格納された、Ｎ相クロック発生回路（３０４）の位相変調量ごとの平均電圧値を用いて、被測定信号の信号強度を演算する演算器（３０８）と、を有する。
PCT/JP2007/074329 2007-01-05 2007-12-18 信号品質測定装置、スペクトラム測定回路、プログラム WO2008081713A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP07850815.7A EP2103948A4 (en) 2007-01-05 2007-12-18 SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASUREMENT AND PROGRAM
US12/522,243 US8355884B2 (en) 2007-01-05 2007-12-18 Signal quality measurement device, spectrum measurement circuit, and program
JP2008552085A JP5347507B2 (ja) 2007-01-05 2007-12-18 信号品質測定装置、スペクトラム測定回路、プログラム

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007000567 2007-01-05
JP2007-000567 2007-01-05
JP2007-146818 2007-06-01
JP2007146818 2007-06-01

Publications (1)

Publication Number Publication Date
WO2008081713A1 true WO2008081713A1 (ja) 2008-07-10

Family

ID=39588398

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/074329 WO2008081713A1 (ja) 2007-01-05 2007-12-18 信号品質測定装置、スペクトラム測定回路、プログラム

Country Status (4)

Country Link
US (1) US8355884B2 (ja)
EP (1) EP2103948A4 (ja)
JP (1) JP5347507B2 (ja)
WO (1) WO2008081713A1 (ja)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2083475A1 (en) 1999-09-20 2009-07-29 Fractus, S.A. Multilevel antennae
BR0017065A (pt) 2000-01-19 2003-11-04 Fractus Sa Antena e conjunto de antenas de enchimento de espaço
US8738103B2 (en) 2006-07-18 2014-05-27 Fractus, S.A. Multiple-body-configuration multimedia and smartphone multifunction wireless devices
US9176521B2 (en) * 2010-09-30 2015-11-03 Infineon Technologies Ag Signal generation for spectral measurements
US8816673B1 (en) * 2011-05-24 2014-08-26 Anritsu Company Frequency extension module for microwave and millimeter wave spectrum analyzers
FR3001807B1 (fr) * 2013-02-07 2016-06-10 Renault Sa Methode de determination de la tension moyenne des cellules d'une batterie notamment une batterie haute tension pour vehicule electrique

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000009768A (ja) 1998-06-19 2000-01-14 Neucore Technol Inc 周波数解析装置
JP2000111587A (ja) * 1998-09-30 2000-04-21 Nec Corp ジッタ検出回路
JP2002196025A (ja) * 2000-10-17 2002-07-10 Toyota Motor Corp 正弦波測定装置及び同測定方法、インピーダンス測定装置、並びに回転角検出装置
JP2006166153A (ja) * 2004-12-09 2006-06-22 Matsushita Electric Ind Co Ltd 高周波電力送信回路およびそれを用いた無線通信装置
JP2006250586A (ja) * 2005-03-08 2006-09-21 Fujitsu Ltd 半導体集積回路、およびその試験方法
JP2007000567A (ja) 2005-06-23 2007-01-11 Atsushi Shirasawa 足指捕握器
JP2007146818A (ja) 2005-11-30 2007-06-14 Toyota Motor Corp 内燃機関の吸気管構造

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US4309677A (en) * 1980-05-05 1982-01-05 Alpha Industries, Inc. Microstrip "T" type attenuator network
JP3131913B2 (ja) 1992-05-11 2001-02-05 株式会社アドバンテスト スペクトラムアナライザ
TW297965B (ja) * 1995-06-26 1997-02-11 Hitachi Ltd
US20030039319A1 (en) 2001-08-22 2003-02-27 Willem Engelse Monitoring upstream frequency band
US6985020B2 (en) * 2002-07-09 2006-01-10 General Instrument Corporation Inline predistortion for both CSO and CTB correction
DE10249886B4 (de) 2002-10-25 2005-02-10 Sp3D Chip Design Gmbh Verfahren und Vorrichtung zum Erzeugen eines Taktsignals mit vorbestimmten Taktsingaleigenschaften
US7471134B2 (en) * 2004-05-25 2008-12-30 Silicon Laboratories, Inc. Mixer with clock resynchronization and method therefor
JP2005338033A (ja) 2004-05-31 2005-12-08 Renesas Technology Corp 半導体集積回路装置と周波数スペクトラム測定方法。
JP4249699B2 (ja) 2004-12-28 2009-04-02 Ｎｅｃパーソナルプロダクツ株式会社 折り畳み式電子機器

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000009768A (ja) 1998-06-19 2000-01-14 Neucore Technol Inc 周波数解析装置
JP2000111587A (ja) * 1998-09-30 2000-04-21 Nec Corp ジッタ検出回路
JP2002196025A (ja) * 2000-10-17 2002-07-10 Toyota Motor Corp 正弦波測定装置及び同測定方法、インピーダンス測定装置、並びに回転角検出装置
JP2006166153A (ja) * 2004-12-09 2006-06-22 Matsushita Electric Ind Co Ltd 高周波電力送信回路およびそれを用いた無線通信装置
JP2006250586A (ja) * 2005-03-08 2006-09-21 Fujitsu Ltd 半導体集積回路、およびその試験方法
JP2007000567A (ja) 2005-06-23 2007-01-11 Atsushi Shirasawa 足指捕握器
JP2007146818A (ja) 2005-11-30 2007-06-14 Toyota Motor Corp 内燃機関の吸気管構造

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 40, no. 4, April 2005 (2005-04-01), pages 820
See also references of EP2103948A4
SYMP. VLSI CIRCUITS DIGEST, vol. 18, pages 240 - 243
VLSI TEST SYMPOSIUM, 2005. PROCEEDINGS. 23RD IEEE, May 2005 (2005-05-01), pages 131 - 136

Also Published As

Publication number Publication date
JPWO2008081713A1 (ja) 2010-04-30
US20100094577A1 (en) 2010-04-15
EP2103948A4 (en) 2013-09-25
EP2103948A1 (en) 2009-09-23
JP5347507B2 (ja) 2013-11-20
US8355884B2 (en) 2013-01-15

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