WO2008052377A2 - Procédé et système de mesure pour la mesure d'une grandeur physique - Google Patents

Procédé et système de mesure pour la mesure d'une grandeur physique Download PDF

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Publication number
WO2008052377A2
WO2008052377A2 PCT/CH2007/000534 CH2007000534W WO2008052377A2 WO 2008052377 A2 WO2008052377 A2 WO 2008052377A2 CH 2007000534 W CH2007000534 W CH 2007000534W WO 2008052377 A2 WO2008052377 A2 WO 2008052377A2
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WO
WIPO (PCT)
Prior art keywords
signal
measuring
signal input
reference signal
output
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PCT/CH2007/000534
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German (de)
English (en)
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WO2008052377A3 (fr
Inventor
Lars Kamm
Werner Hinn
Roman Baumann
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Hsr Hochschule Für Technik Rapperswil
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Publication of WO2008052377A2 publication Critical patent/WO2008052377A2/fr
Publication of WO2008052377A3 publication Critical patent/WO2008052377A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Definitions

  • the invention relates to a method for
  • measuring systems with which even small amplitude changes of physical quantities can be detected, typically have high amplification factors of the order of 10 000 or more.
  • Such measuring systems are typically used when the absolute change in the amplitude of a measurement signal, which is an alternating signal, is to be determined with respect to a known amplitude of a reference signal of the same frequency.
  • the measuring systems include resistive, inductive or capacitive sensors, which are operated with alternating current, whereby typically two identical sensors are used, one of which serves as a measuring sensor and one as a reference sensor.
  • the measuring system 1 comprises a measuring sensor 2, a reference sensor 3 and a calculating unit 4.
  • the calculating unit 4 has a signal source 5 which supplies the measuring sensor 2 and the reference sensor 3 with an alternating voltage V 3 of the frequency f s .
  • the reference sensor 3 is subjected to a constant physical reference quantity, for example a constant pressure, a constant path or a material with constant dielectric, and inputs
  • Reference signal V ref to a reference signal input 6 of the calculation unit 4 from.
  • the measuring sensor 2 is exposed to the physical quantity to be measured and outputs a measuring signal V mess to a measuring signal input 7 of the calculating unit 4.
  • Measurement signal V me ss which is supplied by the measuring sensor 2, depends on the physical quantity to be measured.
  • the amplitude V ref a m pi of the reference signal V r ⁇ f which is output from the reference sensor 3, is constant.
  • the calculation unit 4 forms an amplified difference from the amplitude values of the measurement signal and the reference signal according to FIG.
  • V ou t G (V me ss_ainpl ⁇ Vref_ampl), ⁇
  • V mess _ amp i the amplitude of the measurement signal
  • V re f_ a ⁇ ipi the amplitude of the reference signal
  • V out are the signal applied to a signal output 8 of the calculation unit 4 output signal.
  • Environmental factors such as temperature and humidity, the Equally acting on the measuring sensor 2 and the reference sensor 3 are typically eliminated by the difference formation in the measuring system 1 or in the calculation unit 4.
  • the equation given above for calculating the output signal V out of the measuring system 1 applies to an ideal, error-free measuring system 1.
  • an offset error typically occurs, which is in particular an AC offset error (also AC offset error or AC-OS Called error). This manifests itself typically in that either the measuring signal or reference signal an error signal in the form of an error AC voltage having an amplitude V i acos _ar aP is added.
  • the error signal is typically the same
  • the offset error can be based, for example, on the fact that the partial amplifications in the channels of the measuring system 1 or of the calculation unit 4 assigned to the reference signal and the measuring signal are different or that a crosstalk from the one channel into the other channel takes place. Furthermore, the offset error can also be attributed to the temperature dependence of components or component parameters of the measuring system 1 or the calculation unit 4.
  • the amplification or amplification factor G is not an absolute constant, but also depends on parameter variations of the components used in the measuring system 1 or on the temperature dependencies of these parameters.
  • the variations in the amplification caused by these dependencies are referred to below as gain errors.
  • V aC os_a m pi indicates the offset error formed by the amplitude of the error AC voltage caused by the offset.
  • the method according to the invention for measuring a physical quantity by means of a measuring system comprising a measuring sensor, a signal source and a calculating unit, wherein the calculating unit has a reference signal input, a measuring signal input and a signal output and generates as output signal an amplified difference between a measuring signal and a reference signal characterized by the steps of applying a reference signal to both the reference signal input and the measurement signal input of the calculation unit such that an offset error of the measurement system is determined from the resulting output of the calculation unit
  • Reference signal input an attenuated reference signal and applied to the Meßsignaleingang the reference signal and determined by the difference of the now resulting output of the calculation unit and the previously calculated offset error an Istverstärkungsgrösse that now the reference signal to the reference signal input and a measurement signal applied to the Meßsignaleingang and a corrected output signal is determined by forming the difference
  • Target gain value is, or is increased when the target gain value is greater than the Istverstärkungsgrösse.
  • the predetermined desired amplification variable can be stored, for example, in the measuring system, in particular in the calculation unit, by the manufacturer or by the user.
  • the aforementioned steps are repeated, which advantageously leads to a minimization or elimination of a gain error of the measuring system.
  • the overall gain can be kept constant, i.
  • the aforesaid steps continue to all run through, so that when setting the overall gain time-variable
  • the comparison of the actual amplification variable with the predefined setpoint amplification variable can already be carried out before the measurement signal is applied to the measurement signal input in the method according to the invention.
  • the overall gain can be reduced or increased by changing the amplitude of the signal source, by varying gains of a measurement sensor and a reference sensor with the same factor, and / or by changing a gain of the calculation unit. This list is not exhaustive.
  • the measuring system has a measuring sensor, a signal source for supplying energy to the measuring sensor, a calculating unit which is provided with a reference signal input, a measuring signal input, a signal output and an amplifier and is configured in such a way that, during operation, the signals present at the reference signal input and at the measuring signal input determined an increased difference.
  • a reference multiplexer Next are a reference multiplexer, the
  • Reference signal input is connected upstream, and a measuring multiplexer, which is connected upstream of the measuring signal input, provided by the reference multiplexer, a reference signal and an attenuated reference signal and from the measuring multiplexer, a reference signal and a
  • Measuring signal can be output.
  • the reference multiplexer is preferably preceded by a signal attenuator, which can supply an attenuated reference signal to the reference multiplexer, which in turn can be output therefrom or applied to its output.
  • a microcontroller For controlling the calculation unit, the signal source, the reference multiplexer and / or measuring multiplexer, a microcontroller is preferably provided.
  • the method according to the invention and the measuring system according to the invention can be taken into account and corrected when measuring a physical offset error and gain error of a measuring system. As a result, an accurate measurement of a physical size is possible.
  • FIG. 1 shows a schematic representation of a measuring system without error correction
  • FIG. 2 shows a block diagram of a measuring system without error correction
  • FIG. 3 shows a graphical representation of time profiles of signals occurring in the measuring system according to FIG. 2,
  • Figure 4 is a graph of the offset error measured in a typical implementation versus temperature
  • FIG. 5 shows a graph of the gain error as a function of the temperature measured in a typical implementation
  • FIG. 6 shows a schematic representation of a measuring system according to the invention
  • FIG. 7 shows a flowchart for illustrating the method according to the invention
  • Figure 8 is a schematic diagram of the control of the overall gain
  • FIG. 9 is a graphic representation of the temporal behavior of magnitudes occurring in the block diagram of FIG.
  • FIG. 2 shows a block diagram of a measuring system 1 with a measuring sensor 2, a reference sensor 3 and a calculating unit 4.
  • the calculating unit 4 has a signal source 5 which emits an alternating signal V 3 with a frequency f s .
  • the signal source 5 supplies via corresponding unspecified lines the signal sensor 2 and the reference sensor 3 with the alternating signal V 3rd
  • the reference sensor 3 is exposed to a constant physical reference variable and outputs at its output a reference signal V ref with the frequency f s to the reference signal input 6 of the calculation unit 4.
  • the measuring sensor 2 is exposed to the physical quantity to be measured and delivers a measuring signal V mess with the frequency f s to the measuring signal input 7 of the calculating unit 4.
  • the calculation unit 4 furthermore has a first multiplexer 19 and a second multiplexer 20.
  • the multiplexers 19, 20 each have three inputs, with the reference signal and the measuring signal being applied to two of the inputs, while a switching signal V t having a switching frequency f t , which is also referred to as a toggle frequency, is present at the third input.
  • the switching signal is generated by a signal generator 18.
  • the multiplexers 19, 20 switch at the switching frequency ft from the reference signal to the measurement signal or from the measurement signal to the reference signal, so that either the reference signal or the measurement signal is present at the respective one output of the multiplexers 19, 20.
  • the multiplexers 19, 20 are designed in such a way or are driven in such a way via the switching signal V t that, if at the output of the first multiplexer 19, the reference signal is present at the output of the second multiplexer 20, the measurement signal is applied and vice versa.
  • the switching frequency f t is preferably chosen to be much lower than the signal frequency f s .
  • the signal frequency f s is 300 kHz
  • the ümschaltfrequenz f t is 1 kHz.
  • the calculation unit 4 also has a subtraction element 9, which forms the difference between the output signals of the multiplexers 19, 20. That is, the output signal of the subtraction element 9 corresponds to the difference between the reference signal and the measurement signal or the measurement signal and the reference signal.
  • the output signal of the subtraction element 9 is multiplied in a multiplier 10 (so-called multiplier) by a square wave signal having the frequency f s .
  • the rectangular signal is preferably formed via an amplitude limiter circuit 11 (so-called limiter) either from the reference signal generated by the reference sensor 3 or from the signal supplied by the signal source 5.
  • amplitude limiter circuit 11 so-called limiter
  • phase shifter 14 In the unspecified lines to the signal source 5 and to the output of the reference sensor 3 switches 12, 13 are provided, one of which is closed and the other is open, so that at the input of the Amplitudenbealiarscaria 11 either the reference signal or the signal source signal .5 is present. If the square-wave signal is generated from the signal of the signal source 5, it is preferably ensured via a phase shifter 14 that the square-wave signal has the same phase position as the reference signal. For this purpose, in the unspecified line from the signal source 5 to the Amplitudenbegrenzerscnies 11th preferably a phase shifter 14 (so-called phase shifter) is provided.
  • the calculation unit 4 also has a low-pass filter 15, a high-pass filter 16 and an amplifier 17.
  • the output signal V MPY of the multiplier 10 is filtered in the low-pass filter 15, so that high-frequency signal components, including signal components with the frequency 2 f s , can be suppressed.
  • the low-pass filter 15 is preferably designed such that its output variable V L p contains only signal components whose frequency is less than or equal to five times the switching frequency f t , so that a square wave signal of the frequency ft can be reproduced substantially undistorted.
  • the output signal V LP of the low-pass filter 15 is then filtered in the high-pass filter 16 to suppress DC components and to avoid DC offset problems (DC offset problems) in the amplifier 17 following the high-pass filter 16.
  • the output signal of the high-pass filter 16 is amplified.
  • the output signal V out of the amplifier 17 forms the output signal of the measuring system 1 or the signal output at the signal output 8 of the calculation unit 4.
  • the amplifier 17 can also be between the
  • Subtraction 9 and the multiplier 10 may be arranged. However, this would mean that the amplifier 17 would have to be designed with a broader bandwidth than when it is connected downstream of the low-pass filter 15, since the output signal of the subtraction element 9 still remains
  • the multiplier 10 has the effect of a synchronous rectifier, so that a good linearity of the rectification process is ensured.
  • the measuring system 1 shown in FIG. 2 represents a so-called lock in-amplifier, which is characterized in that its filter characteristic is such that spurious signals having a frequency other than the signal frequency f s and their odd multiples, are well suppressed. Interference signals of the frequency f s and their odd multiples can be advantageously suppressed if their phase position deviates from the phase position of the square wave signal which is generated by the amplitude limiter circuit 11. Even very noisy, from the
  • Measuring sensor 2 supplied measurement signals can thus be converted into substantially noise-free output signals V out .
  • FIG. 3 shows exemplary signal profiles of signals which are present in the measuring system illustrated in FIG.
  • the measuring sensor 2 and the reference sensor 3 preferably deliver voltages as the output signal, so that the waveforms shown in FIG. 3 are preferably voltage profiles.
  • the time is indicated on the abscissa of the coordinate systems a) to f) shown in FIG.
  • the switching signal V t is shown.
  • the switching signal is a square wave signal with the
  • Coordinate systems b) and c) show the multiplexer output signals V mux i, V mux2 of the multiplexers 19, 20.
  • the multiplexer output signals V mux i, V muX2 switch in each case after half a period of the switching signal V t of the reference signal to the measurement signal or from the measurement signal to the reference signal, wherein the sake of simplicity of the presentation, the frequency f s of the measurement signal and the reference signal is selected equal to four times the switching frequency f t , while in practice it is preferably selected equal to 300 times the switching frequency f t .
  • the output signal of the subtraction element 9 is shown, which is formed by the difference V mux i - V mU ⁇ 2 .
  • the output signal V L p of the low-pass filter 15 is the output signal V MPY of the multiplier 10 filtered with the low-pass filter 15.
  • the parameters of the low-pass filter 15 are chosen so that the output signal V LP of the low-pass filter 15 is a substantially rectangular signal with the frequency ft.
  • In the coordinate system f) is amplified with the amplifier 17 output signal V LP of the low-pass filter 15, which was preferably additionally filtered by the high-pass filter 16 is shown.
  • the output signal V out of the amplifier 17 is likewise a substantially rectangular signal of the frequency f t with a greater amplitude than the low-pass filter output signal V LP .
  • Output signal V out of the amplifier 17 is defined as twice the amplitude of the output signal V out and is proportional to the difference between the amplitude V mess _ampi of the measurement signal and the amplitude V ref _ at the pi of the reference signal, ie
  • Voutpp 2 G (V me ss_ampl ⁇ V re f_ampl) r
  • G represents the gain of the amplifier 17.
  • the peak-peak amplitude V out p P is preferably digitized via an analog-to-digital converter and determined numerically using a microcontroller.
  • the analog / digital converter can be integrated in the microcontroller.
  • the peak peak amplitude V outpp should be 0 if the amplitude Vm e ss_ainpi of the measurement signal is equal to the amplitude V re f_ampi of the reference signal.
  • V acos also called V offs e t
  • V O utpp vacos
  • FIG. 4 shows the typical course of a
  • Offset error V acOs as a function of the temperature T, where the temperature T is indicated on the abscissa and the offset error V aCos on the ordinate.
  • the output signal V out also a certain constant value.
  • FIG. 5 shows a typical progression of the gain error as a function of the temperature, wherein the temperature T is indicated on the abscissa and the percentage gain error factor G Fe h e r on the ordinate.
  • FIG. 5 shows two curves, wherein the curve with the lower-frequency signal component corresponds to the mean value of the curve with the higher-frequency signal component.
  • FIG. 6 shows a block diagram of a measuring system 21 according to the invention, which comprises a measuring sensor 3, a reference sensor 2 and a calculating unit 22.
  • the calculation unit 22 is preferably configured according to the calculation unit 4 (see FIG. 2).
  • the calculation unit 22 has a
  • Signal source 5 for outputting a signal V s with a frequency f s , a reference signal input 6, a
  • the signal source 5 can also be provided outside the calculation unit 22.
  • the reference signal input 6 is preceded by a reference multiplexer 23 and the measuring signal input 7 is a
  • the multiplexers 23, 24 each have three signal inputs and a signal output, which are not specified.
  • Two signal inputs of the reference multiplexer 23 are connected to the output of the reference sensor 2, wherein between the reference sensor 2 and one of the signal inputs of the reference multiplexer 23, a signal attenuator 25 is connected, so that at the connected to the signal attenuator 25 signal input of the reference multiplexer 23, an attenuated reference signal is applied.
  • One of the inputs of the measuring multiplexer 24 is connected to the output of the measuring sensor 3, while another input of the measuring multiplexer 24 is connected to the output of the reference sensor 2.
  • the multiplexers 23, 24 and / or the signal attenuator 25 can also be arranged within the calculation unit 22.
  • a microcontroller 26 which controls the multiplexers 23, 24 via control signals S 0 and s x .
  • the control signal Si is the
  • the calculation unit 22 preferably corresponds to the calculation unit 4 shown in FIG. 2, in which two further multiplexers 19, 20 are provided (compare FIG. 2).
  • the microcontroller 26 preferably generates a control signal s t which serves the switching signal V t with the frequency ft for driving the multiplexer 19, 20 provided in the calculation unit 22 or 4, as configured according to FIG.
  • An analog / digital converter 27 is preferably provided which digitizes the output signal V out of the calculation unit 22 or of the measuring system 21.
  • the numerical value of the peak-peak amplitude Voutpp of the output signal V ou t can be calculated in the microcontroller 26 and stored in a register of the microcontroller 26.
  • the analog / digital converter 27 is preferably integrated in the microcontroller 26.
  • the microcontroller 26 preferably carries out the method according to the invention described below with reference to FIG. 7, corrects the output signal V out of offset and amplification errors and then preferably makes the corrected output signal available digitally, for example via a serial interface.
  • FIG. 7 shows a flowchart of the method according to the invention.
  • a first method step 30 which serves to determine the offset error
  • the reference multiplexer 23 and the measuring multiplexer 24 are controlled by the control signals so and Si by the microcontroller 26 such that both at the output of
  • Reference signal input 6 as well as at the measuring signal input 7 of the calculation unit 22 is thus the reference signal and at the signal output 8 of the calculation unit 22 results in the output signal
  • V r ⁇ f corresponds to the reference signal
  • V acos corresponds to the offset error
  • g the gain error factor
  • G the gain of the computing unit 22.
  • Output signal V out is proportional to offset error V acos and is referred to as an offset signal.
  • the offset signal would have the value 0.
  • the value determined for the offset signal is preferably stored in a register D 0 of the microcontroller 26.
  • the microcontroller 26 controls the reference multiplexer 23 in such a way that the attenuated reference signal aV ref is present at its output.
  • the control signal Si has the value 0.
  • the control signal So has the value 1. At the signal output 8 of the calculation unit 22 or the measuring system 21, the following output signal results
  • a corresponds to the attenuation factor of the signal attenuator 25 and is preferably less than 1.
  • the determined value for the output signal V out is preferably stored in a register Di of the microcontroller 26.
  • the actual gain value is the value
  • step 32 a correction of the ascertained in step 32 output to set offset from the Off or to the offset signal.
  • Method step 33 is the measurement sensor measurement, in which the microcontroller 26 drives the reference multiplexer 23 in such a way that the reference signal V Ee: E is present at its output, and controls the measurement multiplexer 24 in such a way that the measurement signal V meSs is present at its output.
  • the reference signal V re f is present at the reference signal input 6 and the measurement signal V mess is present at the measurement signal input 7.
  • the signal output 8 results in the output signal
  • Vout gG (VMeas ⁇ V re f + acos V)
  • the value ascertained for the corrected output signal V out is preferably stored in a register D mess of the microcontroller 26 and can be called from there, for example via a serial interface.
  • the corrected output signal V out korr is initially still subject to a gain error (in the equations considered by the gain error factor g). This is eliminated iteratively in the following.
  • the actual amplification variable stored in the register D is compared with a predetermined setpoint amplification variable, which is stored, for example, in a register D so n of the microcontroller 26. If there is no gain error, ie
  • Gain factor g has the value 1, so the Istverstärkungsgrösse corresponds to the target gain size. If, on the other hand, it is determined in method step 35 that the actual gain variable is greater than the setpoint gain variable, then a
  • Process step 36 reduces the overall gain of the measuring system 21. If it is determined in method step 35 that the actual amplification variable is smaller than the desired amplification variable, then in a method step 37 the overall amplification of
  • Measuring system 21 increased. After increasing or reducing the overall gain of the measuring system 21, the method steps 30 to 35 and 36 or 37 are repeated. The repeated execution of the method steps can take place until the actual amplification variable corresponds to the desired amplification variable. Then the overall gain of the Messsysteins 21 are kept constant. However, in order to be able to correct continuously amplification errors that may occur due to time-varying temperature conditions, the method steps 30 to 35 and 36 or 37 are preferably carried out repeatedly.
  • the overall gain of the measurement system 21 may preferably be altered thereby, i. reduced or increased, that, in particular by means of the microcontroller 26, the gain G of
  • Calculation unit 22 is reduced or increased.
  • the amplitude of the signal V s supplied by the signal source 5, for example likewise by means of the microcontroller 26, can be changed.
  • a signal V s supplied by the signal source 5 for example likewise by means of the microcontroller 26
  • a signal V s supplied by the signal source 5 for example likewise by means of the microcontroller 26
  • Amplification of the multiplier 10 of the calculation unit 22 or 4 are increased or reduced. This can also be done by means of the microcontroller 26. Furthermore, additional adjustable amplifiers or attenuators can be provided at corresponding points in the measuring system 21, for example within an electronics associated with the measuring sensor 3. Also, the overall gain of the measurement system 21 can be influenced via a change in a reference voltage of the analog / digital converter 27.
  • FIG. 8 shows a block diagram of a control for correcting the gain error.
  • the controlled system is formed by the measuring system 21 (cf. FIG. 6). On the controlled system 21 affects a disturbance, such as a jump
  • the output variable of the measuring system 21 is formed by the actual amplification variable, and a reference value-actual value comparison takes place at a connection point 40, wherein the desired value is formed by the desired amplification variable and the actual value by the actual amplification variable.
  • the difference between the nominal value determined at the connection point 40 and actual value is applied to a quantizer 41, by means of which the value of the gain manipulated variable is determined as the output value during the transition from step 35 to step 30 via step 36 or 37 (see FIG.
  • the output value of the quantizer 41 is applied to an integrator 42 whose output variable represents the gain control variable for setting the overall gain of the controlled system or of the measuring system 21.
  • FIG. 9 shows the curves of signals or magnitudes occurring in the basic circuit diagram of FIG. 8.
  • the coordinate system g) shows the temporal course of a disturbance variable at which an interference quantity jump, for example a temperature jump, takes place at the instant t.sub.i.
  • Coordinate system h) shows the course of the Istverstärkungsgrösse, which is adjusted to a target gain value (setpoint). After the abrupt change in the disturbance variable at time
  • Coordinate system i) the temporal course of the gain control variable is shown.
  • the gain variable changes so long until the target gain is reached. After that, it oscillates around a constant mean, unless the control process is stopped and the gain is frozen.
  • the gain control variable begins to move again until the

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Abstract

L'invention concerne un procédé de mesure d'une grandeur physique au moyen d'un système de mesure qui présente un détecteur de mesure, une source de signaux et une unité de calcul. L'unité de calcul présente une entrée de signal de référence, une entrée de signal de mesure et une sortie de signal, et délivre comme signal de sortie une différence amplifiée entre un signal de mesure et un signal de référence. Dans le procédé, on applique un signal de référence à la fois sur l'entrée de signal de référence et sur l'entrée de signal de mesure de l'unité de calcul, on détermine à partir du signal de sortie de l'unité de calcul ainsi obtenu une erreur de décalage du système de mesure, on applique un signal de référence affaibli sur l'entrée de signal de référence et le signal de référence sur l'entrée de signal de mesure, et par la différence entre le signal de sortie de l'unité de calcul que l'on obtient ainsi et l'erreur de décalage calculée précédemment, on détermine une grandeur d'amplification effective. Le signal de référence est alors appliqué sur l'entrée de signal de référence, un signal de mesure est appliqué sur l'entrée de signal de mesure et on détermine un signal de sortie corrigé en formant la différence entre le signal de sortie de l'unité de calcul que l'on obtient ainsi et l'erreur de décalage, on compare la grandeur d'amplification effective à une grandeur prédéterminée d'amplification de consigne et on réduit l'amplification totale du système de mesure lorsque la grandeur d'amplification effective est plus grande que la grandeur d'amplification de consigne ou on l'augmente lorsque la grandeur d'amplification de consigne est plus grande que la grandeur d'amplification effective. L'invention concerne en outre un système de mesure qui permet de mettre en oevre ce procédé.
PCT/CH2007/000534 2006-11-02 2007-10-29 Procédé et système de mesure pour la mesure d'une grandeur physique WO2008052377A2 (fr)

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CH17402006A CH698811B1 (de) 2006-11-02 2006-11-02 Verfahren und Messsystem zum Erfassen und Verarbeiten einer physikalischen Grösse.
CH1740/06 2006-11-02

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CN103884372A (zh) * 2012-12-20 2014-06-25 克洛纳测量技术有限公司 用于确定测量参数的测量组件和用于产生输出信号的方法
CN104614002A (zh) * 2015-01-04 2015-05-13 中国科学院光电技术研究所 一种跟踪控制平台光电编码器细分信号误差补偿方法

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CN103884372A (zh) * 2012-12-20 2014-06-25 克洛纳测量技术有限公司 用于确定测量参数的测量组件和用于产生输出信号的方法
CN104614002A (zh) * 2015-01-04 2015-05-13 中国科学院光电技术研究所 一种跟踪控制平台光电编码器细分信号误差补偿方法

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