WO2007040181A1 - Method and apparatus for controlling expanding apparatus - Google Patents

Method and apparatus for controlling expanding apparatus Download PDF

Info

Publication number
WO2007040181A1
WO2007040181A1 PCT/JP2006/319472 JP2006319472W WO2007040181A1 WO 2007040181 A1 WO2007040181 A1 WO 2007040181A1 JP 2006319472 W JP2006319472 W JP 2006319472W WO 2007040181 A1 WO2007040181 A1 WO 2007040181A1
Authority
WO
WIPO (PCT)
Prior art keywords
sheet
speed
chip interval
chip
image
Prior art date
Application number
PCT/JP2006/319472
Other languages
French (fr)
Japanese (ja)
Inventor
Akinori Toma
Shuji Kurokawa
Original Assignee
Lintec Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lintec Corporation filed Critical Lintec Corporation
Publication of WO2007040181A1 publication Critical patent/WO2007040181A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means

Definitions

  • the present invention relates to a method for controlling an expanding apparatus for expanding a chip interval of a plate-like member separated into chips, for example, a semiconductor wafer, and a control apparatus therefor.
  • Patent Document 1 Conventionally, this type of expanding apparatus is described in Patent Document 1, for example.
  • the expanding apparatus of the same document is a plate-like member that is supported by a first frame (4) via a first UV tape (3) and separated into chips.
  • the first UV tape (3) is stretched in advance, so that the diced semiconductor wafer (1) is The chip interval is extended.
  • each chip after extending the chip interval as described above is transferred from the first UV tape (3) to the second UV tape (9) and picked up by the pickup device in the next process.
  • the code in the box is the code used in Patent Document 1.
  • Patent Document 1 Japanese Patent No. 3064979
  • the present invention has been made to solve the above-described problems, and an object of the present invention is to provide a pick-up processing capability when picking up each chip of a plate-like member separated into chips.
  • a method for controlling an expanding device includes a plate member that is supported by a ring frame via a first sheet and is separated into chips.
  • the first sheet is stretched to expand the respective chip intervals of the plate-like member, and the control method is a first speed control method.
  • the first sheet is stretched to a predetermined position with the image processing means, and the first sheet is stretched at a second speed slower than the first speed while the chip distance is measured by an image processing means. It is characterized by extending a predetermined amount.
  • control method of the expanding device is such that each chip of the plate-like member that is supported by the ring frame via the first sheet and separated into a chip shape is transferred to the second sheet.
  • the first sheet is stretched to expand the respective chip intervals of the plate-like members, and the control method includes: expanding the first sheet; After stretching to a predetermined position, the process moves to an intermittent stretching operation, the chip interval is measured by the image processing means while the stretching operation is stopped, and the chip interval is expanded by a predetermined amount.
  • the measurement of the chip interval is performed at a plurality of locations, and the average value of the measurement data at the plurality of locations is compared with the set value. Also good.
  • the plate-like member may be a semiconductor wafer or a compound wafer.
  • a control device for an expanding device includes a plate member that is supported by a ring frame via a first sheet and is separated into chips. Before transferring the chips to the second sheet, the first sheet is stretched to expand the respective chip intervals of the plate-like member, and the control apparatus is connected to the expanding apparatus. On the other hand, a signal for stretching the first sheet to a predetermined position at the first speed, and a first speed after completion of the stretching at the first speed. An output unit that outputs a signal for stretching the first sheet at a slower second speed, and an image of a plate-like member on the first sheet are captured, and the chip interval is measured from the image.
  • control device of the expanding device transfers each chip of the plate-like member, which is supported by the ring frame via the first sheet and separated into chips, to the second sheet.
  • the first sheet is stretched to expand the respective chip intervals of the plate-like members, and the expanding apparatus controls the expanding apparatus with respect to the expanded apparatus at a predetermined position.
  • Output means for outputting a signal for stretching the first sheet up to a point and a signal for stretching the bow intermittently after completion of the bow I stretching at the predetermined speed, and a plate-like shape on the first sheet
  • Image processing means for capturing an image of a member and measuring the chip interval from the image; and determining means for determining whether or not the measured chip interval has reached a predetermined amount, at the predetermined speed After the sheet 1 is stretched to a predetermined position, an intermittent stretching operation is started, and the image processing means captures an image of the plate-shaped member while the intermittent bow I stretching operation is stopped.
  • the image force is measured, and when the determination means determines that the chip interval has reached a predetermined amount, the intermittent stretching operation is terminated, and the chip interval reaches the predetermined amount.
  • the determination unit determines that the image is captured, the chip interval is measured, and the chip interval is determined, a series of processing operations are repeated, so that the intermittent stretching operation causes the Extend tip spacing by a predetermined amount It is characterized by doing.
  • the measurement of the chip interval is performed at a plurality of locations, and an average value of the measurement data at the plurality of locations is compared with a set value. Also good.
  • the plate-like member may be a semiconductor wafer or a compound wafer.
  • each chip interval of the plate-like member separated into chips is set.
  • a configuration is adopted in which the first sheet is stretched at a second speed slower than the first speed while being measured by an image processing means, and the chip interval is expanded by a predetermined amount. For this reason, when the chip is picked up, the distance between the chips is expanded by a predetermined amount of chip intervals set in advance. Therefore, when the chip is picked up, the position of the chip is confirmed by a recognition device of the pickup device, for example, a camera. It is possible to shorten the time required for the position recognition process and the correction process for aligning the position of the pick-up collet to the recognized position, and the effect of improving the pick-up processing capability can be obtained.
  • the process proceeds to an intermittent stretching operation, and the chip interval is measured by an image processing means while the stretching operation is stopped.
  • the chip interval is expanded by a predetermined amount, even if it takes time to measure the chip interval, the stretching operation is not performed during the measurement process. While waiting for the determination result, the chip interval does not exceed a predetermined amount, so an accurate chip interval can be ensured.
  • FIG. 1 is an explanatory diagram of an expanding apparatus to which the present invention is applied and its control apparatus
  • FIG. 2 is a plan view of the expanding apparatus
  • FIG. 3 is a hardware configuration diagram of the control apparatus
  • FIG. FIG. 5 is an explanatory diagram of the measurement position of the chip interval.
  • An expand apparatus 1 shown in FIG. 1 has an expand table 3 mounted and fixed on a frame 2, and a pair of ring frame holding means 4 disposed on both sides of the expand table 3 serve as lifting means. It is structured to move up and down via the ball screw mechanism 5.
  • the ball screw mechanism 5 includes a screw shaft 6 disposed so as to penetrate the frame 2 in the vertical direction, a pulley 9A rotatably fixed to the lower surface of the frame 2, and a screw shaft that is rotated by the rotation of the pulley 9A. It is comprised with the bearing part 7 which supports 6 so that raising / lowering is possible.
  • the pulley 9A is wound around a driving pulley 9 fixed to the output shaft of the pulse motor 8 by an endless belt 10. As a result, the screw shaft 6 and the ring frame holding means 4 attached to the tip of the screw shaft 6 move up and down together with the rotation of the pulse motor 8.
  • the semiconductor wafer 11 as a plate-like member is supported on the first ring frame 12 via the first sheet 13 and is placed on the upper surface of the expand table 3 in a state of being separated into chips. .
  • the first ring frame 12 is set in such a manner that it is inserted into the holding grooves 14 and 14 of the both-side flanges 12a and 12a force ring frame holding means 4.
  • the first sheet 13 includes an ultraviolet curable adhesive layer, and the semiconductor wafer 11 is adhered to the adhesive layer, and the adhesive force is already lowered by irradiation with ultraviolet rays.
  • An image processing means 16 including a camera 15 is installed above the expanding table 3, and the image processing means 16 is a camera for the semiconductor wafer 11 on the first sheet 13 placed on the expanding table 3. Take the image at 15, capture the image, and measure the chip interval G (see Fig. 5) from the captured image. The chip interval measurement data is output from the image processing means 16 to the control device 17.
  • the chip interval G is measured at a plurality of locations as indicated by arrows in FIG. 5, and the average value and the set value of the measurement data at the plurality of locations are compared.
  • the measurement data (D1 to D9 in FIG. 5) related to the missing portion C1 of the chip C and the dropout portion C2 of the chip C are not adopted.
  • the “set value” is a desired chip interval G to be actually expanded by the expanding device 1 from now on, and can be changed as necessary.
  • the control device 17 also has the power of a personal computer having various kinds of hardware resources such as the CPU 18, ROM 19, RAM 20, and signal output means 21, and performs the processing operation shown in the flowchart of FIG. Built-in program to be executed.
  • the signal output means 21 is a first signal for extending the first sheet 13 to the pulse motor 8 of the expanding device 1 at a first speed V1 to a predetermined position P1 (see FIG. 6). After the completion of the stretching at the first speed VI, the second signal S2 for stretching the first sheet 13 at the second speed V2 slower than the first speed VI is output.
  • pulse signals are used as the first and second signals Sl and S2.
  • the CPU 18 performs, for example, a process of outputting the signals Sl and S2 via the signal output means 21.
  • step Stl the control device 17 outputs the first signal S1 to the pulse motor 8 of the expanding device 1.
  • the ring frame holding means 4 and the first ring frame 12 descend at the first speed VI via the ball screw mechanism 5, and the first seat 13 moves at the predetermined position P1 in FIG. Stretched to.
  • the control device 17 When the stretching at the first speed VI as described above is completed (St2), the control device 17 then outputs the second signal S2 to the pulse motor 8 of the expanding device 1. As a result, the ring frame holding means 4 and the first ring frame 12 are lowered together at the second speed V2, and the first sheet 13 is stretched at the second speed V2 (St3). .
  • the image processing means 16 captures an image from the camera 15 while performing the stretching operation (St4), and the captured image The force also measures the chip interval G (St5), and the measurement data is output from the image processing means 16 to the control device 17, and the control device 17 determines whether or not the chip interval G has reached a predetermined amount (St6).
  • the fact that the average value of the measurement data is within the allowable range of the set value is expressed as reaching a predetermined amount, and the allowable range can be changed as appropriate.
  • the process returns to Step St4 while performing the enlargement operation at the second speed V2, and captures an image (St4) and measures the chip interval.
  • a series of processing operations (St5) and chip interval determination (St6) are performed. This series of processing operations is repeated until the chip interval G reaches a predetermined amount by the stretching operation at the second speed V2, and when this amount reaches the predetermined amount, the series of processing operations is completed.
  • the stretching operation at speed 2 of V2 is also completed (St 7) (see Fig. 7).
  • the second ring provided with the ultraviolet curable adhesive layer is formed from above the first ring frame 12 as shown in FIG.
  • the second ring frame 23 to which the sheet 22 is attached is lowered, the second sheet 22 is bonded to the chip C of the semiconductor wafer 11 whose chip interval is expanded by a predetermined amount, and then the first sheet 13 is peeled off.
  • chip C is transferred.
  • the transferred chip C is picked up by a pickup device in the next process.
  • FIG. 8 is a graph showing the enlargement of the present embodiment.
  • the bow I stretching operation at the first speed VI is performed from the starting position of XO stretching until the predetermined pulse XI, at which point the camera 15 starts, Until it is determined that the tip interval G has reached the predetermined amount, the bow I stretching operation is performed continuously at the second speed V2 which is slower than the first speed VI.
  • the image processing means is used.
  • the first sheet 13 is stretched at a second speed V2 that is slower than the first speed VI while measuring the chip interval G from the image of the semiconductor wafer 11 on the first sheet 13 captured by the A control method is adopted in which the chip interval G is extended by a predetermined amount. For this reason, when the chip is picked up, the distance between the chips is expanded by a predetermined amount of chip interval set in advance. The time required for the position recognition process and the correction process for aligning the pick-up collet with the recognized position can be shortened, and the pick-up processing capability can be improved.
  • the control device 17 during the period from the image capture to the chip interval determination processing (during the processing time from St4 to St6 in FIG. 4), the control device 17 uniformly pulls at the same second speed V2.
  • the stretching operation may be performed at a third speed that is slower than the second speed V2 only during the force chip interval measurement process (St5 in FIG. 4) employing a configuration in which the stretching operation is performed. According to such a configuration, even when time is required for the measurement processing of the chip interval, the stretching operation is performed at the third speed slower than the second speed during the measurement processing. It is possible to effectively prevent the chip interval G from exceeding the predetermined amount allowable range while waiting for the determination result of the quantity force.
  • the force is set so as to shift to the continuous stretching operation at the second speed V2.
  • a transition may be made to an intermittent stretching operation.
  • an image of the plate-like member may be captured by the image processing means while the intermittent stretching operation is stopped, the chip interval may be measured from the image, and the chip interval may be expanded by a predetermined amount.
  • FIG. 9 is a flowchart showing the processing operation of the control device when the intermittent stretching operation is performed. Based on this flowchart, the processing operation of the control device 17 will be described.
  • the control device 17 starts the stretching operation of the first sheet 13 at a predetermined speed.
  • this operation is completed (St2)
  • the first sheet 13 is then intermittently stretched.
  • Move to operation (St3).
  • the image processing means 16 captures an image from the camera 15 (St5), measures the captured image force chip interval G (St6), and this measurement data Is output from the image processing means 16 to the control device 17, and the control device 17 determines whether or not the chip interval G has reached a predetermined amount (St7).
  • the intermittent stretching operation is not performed thereafter (St8).
  • the process returns to step St3, and the processes from St3 to St7 are repeated until the chip interval G reaches a predetermined amount by the intermittent stretching operation.
  • the intermittent stretching operation is terminated (St8).
  • FIG. 10 shows a case where the first sheet is intermittently stretched and the stretch amount is determined.
  • the stretching operation at the predetermined speed VI is performed until the stretching starting position force of XO reaches the predetermined pulse XI.
  • the camera 15 is started and the image is displayed while the stretching operation is stopped.
  • the chip interval determination process is performed, and intermittent stretching operation is performed until it is determined that the chip interval G has reached a predetermined amount.
  • the configuration in which the chip interval is measured by the image processing unit 16 is adopted.
  • the chip interval measurement process may be performed by the control device 17.
  • the image of the camera 15 is output from the image processing means 16 to the control device 17, and the control device 17 also measures the chip interval of the image force.
  • the plate-like member is the semiconductor wafer 11
  • a compound wafer typified by gallium nitride (GaN) forming a light-emitting diode may be used.
  • FIG. 1 is an explanatory diagram of an expanding device to which the present invention is applied and its control device.
  • FIG. 2 is a plan view of the expanding device.
  • FIG. 3 is a hardware configuration diagram of the control device.
  • FIG. 4 is a flowchart showing the processing operation of the control device.
  • FIG. 5 is an explanatory diagram of a measurement position of a chip interval.
  • FIG. 6 is an explanatory diagram of the state of the expanding device when the stretching operation at the first speed is completed.
  • FIG. 7 is an explanatory diagram of the state of the expanding device when the stretching operation at the second speed is completed.
  • FIG. 8 A graph in which the bow I is stretched while the first sheet is continuously stretched at a second speed that is slower than the first speed.
  • FIG. 9 A flow chart showing the processing operation of the controller when intermittent stretching is performed.
  • FIG. 10 is a graph when the first sheet is intermittently stretched and the stretch amount is judged. Explanation of symbols

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Dicing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

[PROBLEMS] To provide a method and an apparatus suitable for controlling an expanding apparatus, by which pickup performance at the time of picking up each chip of a board-like member separated into chips can be improved. [MEANS FOR SOLVING PROBLEMS] At the time of expanding intervals between chips of a board-like member (semiconductor wafer (11)), which is supported by a ring frame (12) through a first sheet (13) and separated into chips, by stretching the first sheet (13) prior to transferring each chip (C) of the board-like member onto a second sheet, the first sheet (13) is stretched to a prescribed position at a first speed, the first sheet (13) is stretched at a second speed slower than the first speed, while measuring the chip intervals from an image of the semiconductor wafer (11) on the first sheet (13) taken by an image processing means (16), and the chip intervals are expanded by a prescribed quantity.

Description

明 細 書  Specification
エキスパンド装置の制御方法とその制御装置  EXPANDING DEVICE CONTROL METHOD AND CONTROL DEVICE THEREOF
技術分野  Technical field
[0001] 本発明は、チップ状に個片化された板状部材、例えば半導体ウェハのチップ間隔 を拡張するエキスパンド装置の制御方法とその制御装置に関する。  TECHNICAL FIELD [0001] The present invention relates to a method for controlling an expanding apparatus for expanding a chip interval of a plate-like member separated into chips, for example, a semiconductor wafer, and a control apparatus therefor.
背景技術  Background art
[0002] 従来、この種のエキスパンド装置としては、例えば、特許文献 1に記載されている。  [0002] Conventionally, this type of expanding apparatus is described in Patent Document 1, for example.
同文献のエキスパンド装置は、その図 1と図 2に示されている通り、第 1フレーム (4)に 第 1UVテープ (3)を介して支持されチップ状に個片化された板状部材のそれぞれ のチップ、すなわちダイシング後の半導体ウェハ(1)のチップを第 2UVテープ(9)に 転写する前に、予め第 1UVテープ(3)を引き伸ばすことによって、ダイシング後の半 導体ウェハ(1)のチップ間隔を拡張している。  As shown in FIGS. 1 and 2, the expanding apparatus of the same document is a plate-like member that is supported by a first frame (4) via a first UV tape (3) and separated into chips. Before transferring each chip, that is, the chip of the diced semiconductor wafer (1), to the second UV tape (9), the first UV tape (3) is stretched in advance, so that the diced semiconductor wafer (1) is The chip interval is extended.
[0003] そして、上記の如くチップ間隔を拡張した後の各チップは、第 1UVテープ(3)から 第 2UVテープ(9)に転写され、次工程のピックアップ装置でピックアップされる。なお 、前記カツコ内の符号は特許文献 1で用いられて 、る符号である。  [0003] Then, each chip after extending the chip interval as described above is transferred from the first UV tape (3) to the second UV tape (9) and picked up by the pickup device in the next process. Note that the code in the box is the code used in Patent Document 1.
[0004] し力しながら、前記特許文献 1のエキスパンド装置によると、チップ状に個片化され た半導体ウェハ(1)のチップ間隔を拡張する際に、チップ間隔の測定を行なってい ない。このため、当該チップのピックアップ時にピックアップ装置の認識装置、例えば カメラでチップの位置確認を行なうときに、そのチップの位置を認識する処理や認識 した位置にピックアップ用のコレットの位置を合わせる補正処理に時間がかかり、処 理能力が低下してしまうと 、う問題点を有して 、る。  [0004] However, according to the expanding device of Patent Document 1, the chip interval is not measured when the chip interval of the semiconductor wafer (1) separated into chips is expanded. For this reason, when the chip is picked up, a recognition device of the pickup device, for example, when the position of the chip is confirmed by a camera, a process for recognizing the position of the chip or a correction process for adjusting the position of the collet for pickup to the recognized position If it takes time and processing capacity declines, there is a problem.
[0005] 特許文献 1:特許第 3064979号公報  [0005] Patent Document 1: Japanese Patent No. 3064979
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0006] 本発明は前記問題点を解決するためになされたもので、その目的とするところは、 チップ状に個片化された板状部材のそれぞれのチップをピックアップする際のピック アップ処理能力を向上させるのに好適なエキスパンド装置の制御方法とその制御装 置を提供することにある。 [0006] The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a pick-up processing capability when picking up each chip of a plate-like member separated into chips. Method for expanding apparatus suitable for improving Is to provide a place.
課題を解決するための手段  Means for solving the problem
[0007] 上記目的を達成するために、本発明に係るエキスパンド装置の制御方法は、リング フレームに第 1のシートを介して支持されチップ状に個片化された板状部材のそれぞ れのチップを第 2のシートに転写する前に、前記第 1のシートを引き伸ばし前記板状 部材のそれぞれのチップ間隔を拡張するエキスパンド装置の制御方法であって、前 記制御方法は、第 1の速度で前記第 1のシートを所定位置まで引き伸ばした後、前 記チップ間隔を画像処理手段によって計測しながら前記第 1の速度よりも遅い第 2の 速度で前記第 1のシートを引き伸ばし、前記チップ間隔を所定量拡張することを特徴 とするちのである。  [0007] In order to achieve the above object, a method for controlling an expanding device according to the present invention includes a plate member that is supported by a ring frame via a first sheet and is separated into chips. Before transferring the chip to the second sheet, the first sheet is stretched to expand the respective chip intervals of the plate-like member, and the control method is a first speed control method. The first sheet is stretched to a predetermined position with the image processing means, and the first sheet is stretched at a second speed slower than the first speed while the chip distance is measured by an image processing means. It is characterized by extending a predetermined amount.
[0008] また、本発明に係るエキスパンド装置の制御方法は、リングフレームに第 1のシート を介して支持されチップ状に個片化された板状部材のそれぞれのチップを第 2のシ ートに転写する前に、前記第 1のシートを引き伸ばし前記板状部材のそれぞれのチッ プ間隔を拡張するエキスパンド装置の制御方法であって、前記制御方法は、所定の 速度で前記第 1のシートを所定位置まで引き伸ばした後、間欠的な引き伸ばし動作 に移り、その引き伸ばし動作の停止中に前記チップ間隔を画像処理手段によって計 測し、前記チップ間隔を所定量拡張することを特徴とするものである。  [0008] In addition, the control method of the expanding device according to the present invention is such that each chip of the plate-like member that is supported by the ring frame via the first sheet and separated into a chip shape is transferred to the second sheet. Before the transfer to the expansion member, the first sheet is stretched to expand the respective chip intervals of the plate-like members, and the control method includes: expanding the first sheet; After stretching to a predetermined position, the process moves to an intermittent stretching operation, the chip interval is measured by the image processing means while the stretching operation is stopped, and the chip interval is expanded by a predetermined amount. .
[0009] 前記本発明に係るエキスパンド装置の制御方法にぉ 、て、前記チップ間隔の計測 は、複数箇所で行い、その複数箇所の計測データの平均値と設定値とを対比するよ うにしてもよい。  [0009] According to the control method of the expanding apparatus according to the present invention, the measurement of the chip interval is performed at a plurality of locations, and the average value of the measurement data at the plurality of locations is compared with the set value. Also good.
[0010] 前記本発明に係るエキスパンド装置の制御方法にぉ 、て、前記板状部材は、半導 体ウェハまたは化合物ウェハであってよ 、。  [0010] In the method for controlling an expanding apparatus according to the present invention, the plate-like member may be a semiconductor wafer or a compound wafer.
[0011] 前記目的を達成するために、本発明に係るエキスパンド装置の制御装置は、リング フレームに第 1のシートを介して支持されチップ状に個片化された板状部材のそれぞ れのチップを第 2のシートに転写する前に、前記第 1のシートを引き伸ばし前記板状 部材のそれぞれのチップ間隔を拡張するエキスパンド装置の制御装置であって、前 記制御装置は、前記エキスパンド装置に対し、第 1の速度で所定位置まで前記第 1 のシートを引き伸ばすための信号と、第 1の速度での引き伸ばし完了後に第 1の速度 より遅い第 2の速度で前記第 1のシートを引き伸ばすための信号とを出力する出力手 段と、前記第 1のシート上の板状部材の画像を取り込み、その画像から前記チップ間 隔を計測する画像処理手段と、前記計測したチップ間隔が所定量に達した力否かを 判定する判定手段とを含み、前記第 1の速度で前記第 1のシートを所定位置まで引 き伸ばした後、前記第 2の速度での前記第 1のシートの引き伸ばし動作を開始し、前 記第 2の速度での引き伸ばし動作を行 、ながら、前記画像処理手段が前記板状部 材の画像を取り込み、その画像力 前記チップ間隔を計測し、前記チップ間隔が所 定量に達したと前記判定手段が判定したときは、前記第 2の速度での引き伸ばし動 作を終了し、前記チップ間隔が所定量に達していないと前記判定手段が判定したと きは、前記画像の取り込み、前記チップ間隔の計測、前記チップ間隔の判定という一 連の処理動作を繰り返し行なうことで、前記第 2の速度での引き伸ばし動作により前 記チップ間隔を所定量拡張することを特徴とするものである。 [0011] In order to achieve the above object, a control device for an expanding device according to the present invention includes a plate member that is supported by a ring frame via a first sheet and is separated into chips. Before transferring the chips to the second sheet, the first sheet is stretched to expand the respective chip intervals of the plate-like member, and the control apparatus is connected to the expanding apparatus. On the other hand, a signal for stretching the first sheet to a predetermined position at the first speed, and a first speed after completion of the stretching at the first speed. An output unit that outputs a signal for stretching the first sheet at a slower second speed, and an image of a plate-like member on the first sheet are captured, and the chip interval is measured from the image. Image processing means for determining and determining means for determining whether or not the measured chip interval has reached a predetermined amount, and after stretching the first sheet to a predetermined position at the first speed, The image processing means captures an image of the plate-like member while starting the stretching operation of the first sheet at the second speed and performing the stretching operation at the second speed. Image force When the chip interval is measured and the determination means determines that the chip interval has reached a predetermined amount, the stretching operation at the second speed is terminated, and the chip interval reaches a predetermined amount. The determination means determined that it is not In this case, by repeating a series of processing operations such as capturing the image, measuring the chip interval, and determining the chip interval, the chip interval is expanded by a predetermined amount by the stretching operation at the second speed. It is characterized by doing.
また、本発明に係るエキスパンド装置の制御装置は、リングフレームに第 1のシート を介して支持されチップ状に個片化された板状部材のそれぞれのチップを第 2のシ ートに転写する前に、前記第 1のシートを引き伸ばし前記板状部材のそれぞれのチッ プ間隔を拡張するエキスパンド装置の制御装置であって、前記制御装置は、前記ェ キスパンド装置に対し、所定の速度で所定位置まで前記第 1のシートを引き伸ばすた めの信号と、前記所定の速度での弓 Iき伸ばし完了後に間欠的に引き伸ばすための 信号とを出力する出力手段と、前記第 1のシート上の板状部材の画像を取り込み、そ の画像から前記チップ間隔を計測する画像処理手段と、前記計測したチップ間隔が 所定量に達したか否かを判定する判定手段とを含み、前記所定の速度で第 1のシー トを所定位置まで引き伸ばした後、間欠的な引き伸ばし動作を開始し、前記間欠的 な弓 Iき伸ばし動作の停止中に、前記画像処理手段が前記板状部材の画像を取り込 み、その画像力 前記チップ間隔を計測し、前記チップ間隔が所定量に達したと前 記判定手段が判定したときには、前記間欠的な引き伸ばし動作を終了し、前記チッ プ間隔が所定量に達して 、な 、と前記判定手段が判定したときには、前記画像の取 り込み、前記チップ間隔の計測、前記チップ間隔の判定という一連の処理動作を繰り 返し行なうことで、前記間欠的な引き伸ばし動作により前記チップ間隔を所定量拡張 することを特徴とするものである。 Further, the control device of the expanding device according to the present invention transfers each chip of the plate-like member, which is supported by the ring frame via the first sheet and separated into chips, to the second sheet. Before, the first sheet is stretched to expand the respective chip intervals of the plate-like members, and the expanding apparatus controls the expanding apparatus with respect to the expanded apparatus at a predetermined position. Output means for outputting a signal for stretching the first sheet up to a point and a signal for stretching the bow intermittently after completion of the bow I stretching at the predetermined speed, and a plate-like shape on the first sheet Image processing means for capturing an image of a member and measuring the chip interval from the image; and determining means for determining whether or not the measured chip interval has reached a predetermined amount, at the predetermined speed After the sheet 1 is stretched to a predetermined position, an intermittent stretching operation is started, and the image processing means captures an image of the plate-shaped member while the intermittent bow I stretching operation is stopped. Then, the image force is measured, and when the determination means determines that the chip interval has reached a predetermined amount, the intermittent stretching operation is terminated, and the chip interval reaches the predetermined amount. When the determination unit determines that the image is captured, the chip interval is measured, and the chip interval is determined, a series of processing operations are repeated, so that the intermittent stretching operation causes the Extend tip spacing by a predetermined amount It is characterized by doing.
[0013] 前記本発明に係るエキスパンド装置の制御装置にお 、て、前記チップ間隔の計測 は、複数箇所で行い、その複数箇所の計測データの平均値と設定値とを対比するよ うにしてもよい。  [0013] In the control device for an expanding apparatus according to the present invention, the measurement of the chip interval is performed at a plurality of locations, and an average value of the measurement data at the plurality of locations is compared with a set value. Also good.
[0014] 前記本発明に係るエキスパンド装置の制御装置にお 、て、前記板状部材は、半導 体ウェハまたは化合物ウェハであってよ 、。  [0014] In the control device for an expanding apparatus according to the present invention, the plate-like member may be a semiconductor wafer or a compound wafer.
発明の効果  The invention's effect
[0015] 本発明にあっては、上記の通り、第 1の速度で所定位置まで第 1のシートを引き伸 ばした後、チップ状に個片化された板状部材のそれぞれのチップ間隔を画像処理手 段によって計測しながら前記第 1の速度よりも遅い第 2の速度で前記第 1のシートを 引き伸ばし、前記チップ間隔を所定量拡張するという構成を採用した。このため、当 該チップのピックアップ時には予め設定された所定量のチップ間隔で当該チップ間 が拡張されて 、るから、当該チップのピックアップ時にピックアップ装置の認識装置、 例えばカメラでチップの位置確認を行なうときの位置認識処理や認識した位置にピッ クアップ用のコレットの位置を合わせる補正処理の時間を短縮することができ、ピック アップ処理能力の向上を図れるという作用効果が得られる。  [0015] In the present invention, as described above, after the first sheet is stretched to a predetermined position at the first speed, each chip interval of the plate-like member separated into chips is set. A configuration is adopted in which the first sheet is stretched at a second speed slower than the first speed while being measured by an image processing means, and the chip interval is expanded by a predetermined amount. For this reason, when the chip is picked up, the distance between the chips is expanded by a predetermined amount of chip intervals set in advance. Therefore, when the chip is picked up, the position of the chip is confirmed by a recognition device of the pickup device, for example, a camera. It is possible to shorten the time required for the position recognition process and the correction process for aligning the position of the pick-up collet to the recognized position, and the effect of improving the pick-up processing capability can be obtained.
[0016] また、所定の速度で前記第 1のシートを所定位置まで引き伸ばした後、間欠的な引 き伸ばし動作に移り、その引き伸ばし動作の停止中に前記チップ間隔を画像処理手 段によって計測し、前記チップ間隔を所定量拡張するという構成を採用することによ つて、チップ間隔の計測処理に時間が力かる場合でも、その計測処理中は引き伸ば し動作が行なわれないので、チップ間隔の判定結果を待っている間にチップ間隔が 所定量を超えてしまうことがないので正確なチップ間隔を確保することができる。 発明を実施するための最良の形態  [0016] In addition, after the first sheet is stretched to a predetermined position at a predetermined speed, the process proceeds to an intermittent stretching operation, and the chip interval is measured by an image processing means while the stretching operation is stopped. By adopting a configuration in which the chip interval is expanded by a predetermined amount, even if it takes time to measure the chip interval, the stretching operation is not performed during the measurement process. While waiting for the determination result, the chip interval does not exceed a predetermined amount, so an accurate chip interval can be ensured. BEST MODE FOR CARRYING OUT THE INVENTION
[0017] 以下、本発明を実施するための最良の形態について、添付した図面を参照しなが ら詳細に説明する。 Hereinafter, the best mode for carrying out the present invention will be described in detail with reference to the accompanying drawings.
[0018] 図 1は本発明を適用したエキスパンド装置とその制御装置の説明図、図 2はエキス パンド装置の平面図、図 3は制御装置のハードウェア構成図、図 4は制御装置の処 理動作を示したフローチャート、図 5はチップ間隔の計測位置の説明図である。 [0019] 図 1に示すエキスパンド装置 1は、フレーム 2上に取り付け固定されたエキスパンド テーブル 3を有し、このエキスパンドテーブル 3の両側に配置された一対のリングフレ ーム保持手段 4が、昇降手段としてのボールネジ機構 5を介して上下動する構造にな つている。 FIG. 1 is an explanatory diagram of an expanding apparatus to which the present invention is applied and its control apparatus, FIG. 2 is a plan view of the expanding apparatus, FIG. 3 is a hardware configuration diagram of the control apparatus, and FIG. FIG. 5 is an explanatory diagram of the measurement position of the chip interval. An expand apparatus 1 shown in FIG. 1 has an expand table 3 mounted and fixed on a frame 2, and a pair of ring frame holding means 4 disposed on both sides of the expand table 3 serve as lifting means. It is structured to move up and down via the ball screw mechanism 5.
[0020] ボールネジ機構 5は、フレーム 2を上下方向に貫通するように配置されたネジ軸 6と 、前記フレーム 2の下面にプーリ 9Aが回転可能に固定されるとともに当該プーリ 9A の回転によりネジ軸 6を昇降可能に支持する軸受部 7とで構成されている。また、プ ーリ 9Aは、エンドレスベルト 10によってパルスモータ 8の出力軸に固定された駆動用 プーリ 9に掛け回されている。これにより、パルスモータ 8の回転によってネジ軸 6とそ の先端部に取り付けられている前記リングフレーム保持手段 4とが一緒に上下動する 構造になっている。  [0020] The ball screw mechanism 5 includes a screw shaft 6 disposed so as to penetrate the frame 2 in the vertical direction, a pulley 9A rotatably fixed to the lower surface of the frame 2, and a screw shaft that is rotated by the rotation of the pulley 9A. It is comprised with the bearing part 7 which supports 6 so that raising / lowering is possible. The pulley 9A is wound around a driving pulley 9 fixed to the output shaft of the pulse motor 8 by an endless belt 10. As a result, the screw shaft 6 and the ring frame holding means 4 attached to the tip of the screw shaft 6 move up and down together with the rotation of the pulse motor 8.
[0021] 板状部材としての半導体ウェハ 11は、第 1のリングフレーム 12に第 1のシート 13を 介して支持されチップ状に個片化された状態で、エキスパンドテーブル 3の上面に置 力れる。このとき、第 1のリングフレーム 12は、図 2のように、両縁咅 12a、 12a力リング フレーム保持手段 4の保持溝 14、 14に挿入される形態で、セットされる。なお、第 1の シート 13は、紫外線硬化型の接着剤層を備えており、当該接着剤層に半導体ウェハ 11が接着され、既に紫外線が照射され粘着力が低下している。  The semiconductor wafer 11 as a plate-like member is supported on the first ring frame 12 via the first sheet 13 and is placed on the upper surface of the expand table 3 in a state of being separated into chips. . At this time, as shown in FIG. 2, the first ring frame 12 is set in such a manner that it is inserted into the holding grooves 14 and 14 of the both-side flanges 12a and 12a force ring frame holding means 4. Note that the first sheet 13 includes an ultraviolet curable adhesive layer, and the semiconductor wafer 11 is adhered to the adhesive layer, and the adhesive force is already lowered by irradiation with ultraviolet rays.
[0022] エキスパンドテーブル 3の上方にはカメラ 15を含む画像処理手段 16が設置されて おり、画像処理手段 16は、エキスパンドテーブル 3上に置かれた第 1のシート 13上の 半導体ウェハ 11をカメラ 15で撮影し、その画像を取り込み、この取り込んだ画像から チップ間隔 G (図 5参照)を計測する。チップ間隔の計測データは画像処理手段 16か ら制御装置 17に出力される。  An image processing means 16 including a camera 15 is installed above the expanding table 3, and the image processing means 16 is a camera for the semiconductor wafer 11 on the first sheet 13 placed on the expanding table 3. Take the image at 15, capture the image, and measure the chip interval G (see Fig. 5) from the captured image. The chip interval measurement data is output from the image processing means 16 to the control device 17.
[0023] 本実施形態の場合、前記チップ間隔 Gの計測は、図 5中矢印で示したように複数箇 所で行い、その複数箇所の計測データの平均値と設定値とを対比する。この際、平 均値の信頼性を高めるため、チップ Cの欠損部 C1やチップ Cの脱落部 C2に係る計 測データ(図 5中 D1〜D9)は不採用とする処理がなされる。尚、前記「設定値」とは、 エキスパンド装置 1でこれから実際に拡張しょうとする所望のチップ間隔 Gのことであ り、必要に応じて適宜変更することができる。 [0024] 図 3に示したように、制御装置 17は、 CPU18、 ROM19、 RAM20および信号出 力手段 21等、各種ノヽードウエア資源を備えたパーソナルコンピュータ力もなり、図 4 のフローチャートに示す処理動作を実行するプログラムも内蔵して 、る。 In the present embodiment, the chip interval G is measured at a plurality of locations as indicated by arrows in FIG. 5, and the average value and the set value of the measurement data at the plurality of locations are compared. At this time, in order to increase the reliability of the average value, the measurement data (D1 to D9 in FIG. 5) related to the missing portion C1 of the chip C and the dropout portion C2 of the chip C are not adopted. The “set value” is a desired chip interval G to be actually expanded by the expanding device 1 from now on, and can be changed as necessary. As shown in FIG. 3, the control device 17 also has the power of a personal computer having various kinds of hardware resources such as the CPU 18, ROM 19, RAM 20, and signal output means 21, and performs the processing operation shown in the flowchart of FIG. Built-in program to be executed.
[0025] 前記信号出力手段 21は、エキスパンド装置 1のパルスモータ 8に対し、第 1の速度 V 1で所定位置 P 1 (図 6参照)まで第 1のシート 13を引き伸ばすための第 1の信号 S 1 と、第 1の速度 VIでの引き伸ばし完了後に第 1の速度 VIより遅い第 2の速度 V2で 第 1のシート 13を引き伸ばすための第 2の信号 S2とを出力する。本実施形態の場合 、第 1及び第 2の信号 Sl、 S2はパルス信号が用いられる。  [0025] The signal output means 21 is a first signal for extending the first sheet 13 to the pulse motor 8 of the expanding device 1 at a first speed V1 to a predetermined position P1 (see FIG. 6). After the completion of the stretching at the first speed VI, the second signal S2 for stretching the first sheet 13 at the second speed V2 slower than the first speed VI is output. In the present embodiment, pulse signals are used as the first and second signals Sl and S2.
[0026] 前記 CPU18は、例えば、信号出力手段 21を介して前記信号 Sl、 S2を出力する 処理等を行なう。  The CPU 18 performs, for example, a process of outputting the signals Sl and S2 via the signal output means 21.
[0027] 次に、図 4のフローチャートを基に制御装置 17の制御動作を説明する。  Next, a control operation of the control device 17 will be described based on the flowchart of FIG.
[0028] 制御装置 17は、最初にステップ Stlで、エキスパンド装置 1のパルスモータ 8に対し て第 1の信号 S1を出力する。これにより、ボールネジ機構 5を介してリングフレーム保 持手段 4と第 1のリングフレーム 12が第 1の速度 VIで下降し、第 1のシート 13は第 1 の速度 VIで図 6の所定位置 P1まで引き伸ばされる。  [0028] First, in step Stl, the control device 17 outputs the first signal S1 to the pulse motor 8 of the expanding device 1. As a result, the ring frame holding means 4 and the first ring frame 12 descend at the first speed VI via the ball screw mechanism 5, and the first seat 13 moves at the predetermined position P1 in FIG. Stretched to.
[0029] 上記のような第 1の速度 VIでの引き伸ばしが完了すると(St2)、その後、当該制御 装置 17は、エキスパンド装置 1のパルスモータ 8に対し第 2の信号 S2を出力する。こ れにより、リングフレーム保持手段 4と第 1のリングフレーム 12とが一緒に第 2の速度 V 2で下降し、第 2の速度 V2での第 1のシート 13の引き伸ばし動作が始まる(St3)。  [0029] When the stretching at the first speed VI as described above is completed (St2), the control device 17 then outputs the second signal S2 to the pulse motor 8 of the expanding device 1. As a result, the ring frame holding means 4 and the first ring frame 12 are lowered together at the second speed V2, and the first sheet 13 is stretched at the second speed V2 (St3). .
[0030] 以上のようにして第 2の速度 V2での引き伸ばし動作が始まると、この引き伸ばし動 作を行いながら、画像処理手段 16がカメラ 15からの画像を取り込み(St4)、この取り 込んだ画像力もチップ間隔 Gを計測し (St5)、その計測データが画像処理手段 16か ら制御装置 17に出力され、チップ間隔 Gが所定量に達した力どうかを制御装置 17が 判定する(St6)。なお、本実施形態では計測データの平均値が設定値の許容範囲 内に入ったことを所定量に達したと表現することとし、その許容範囲は適宜変更する ことができる。  [0030] When the stretching operation at the second speed V2 starts as described above, the image processing means 16 captures an image from the camera 15 while performing the stretching operation (St4), and the captured image The force also measures the chip interval G (St5), and the measurement data is output from the image processing means 16 to the control device 17, and the control device 17 determines whether or not the chip interval G has reached a predetermined amount (St6). In this embodiment, the fact that the average value of the measurement data is within the allowable range of the set value is expressed as reaching a predetermined amount, and the allowable range can be changed as appropriate.
[0031] ここで、チップ間隔 Gが所定量に達したと判定したときには、チップ間隔 Gを所定量 とする目的は達成されたから、第 2の速度 V2での引き伸ばし動作を終了する(St7)。 この一方、チップ間隔 Gが所定量に達していないと判定したときには、更に第 2の速 度 V2での引き伸ばし動作を行いながら、前記ステップ St4に戻り、画像の取り込み( St4)、チップ間隔の計測(St5)、チップ間隔の判定(St6)という一連の処理動作が 行われる。この一連の処理動作は、第 2の速度 V2での引き伸ばし動作によりチップ 間隔 Gが所定量に達するまで繰り返し行なわれ、所定量に達した時点で当該一連の 処理動作は終了し、これと同時に第 2の速度 V2での引き伸ばし動作も終了する(St 7) (図 7参照)。 Here, when it is determined that the chip interval G has reached a predetermined amount, the purpose of setting the chip interval G to the predetermined amount has been achieved, and thus the stretching operation at the second speed V2 is terminated (St7). On the other hand, when it is determined that the chip interval G has not reached the predetermined amount, the process returns to Step St4 while performing the enlargement operation at the second speed V2, and captures an image (St4) and measures the chip interval. A series of processing operations (St5) and chip interval determination (St6) are performed. This series of processing operations is repeated until the chip interval G reaches a predetermined amount by the stretching operation at the second speed V2, and when this amount reaches the predetermined amount, the series of processing operations is completed. The stretching operation at speed 2 of V2 is also completed (St 7) (see Fig. 7).
[0032] 上記のような第 2の速度 V2での引き伸ばし動作が終了した後は、図 7のように第 1 のリングフレーム 12の上方から、紫外線硬化型の接着剤層を備えた第 2のシート 22 を貼り付けた第 2のリングフレーム 23が降下し、チップ間隔所定量拡張済み半導体ゥ ェハ 11のチップ Cに第 2のシート 22を接着した後、第 1のシート 13を剥離することに よってチップ Cは転写される。この転写されたチップ Cは次工程のピックアップ装置で ピックアップされる。  [0032] After the stretching operation at the second speed V2 is completed, the second ring provided with the ultraviolet curable adhesive layer is formed from above the first ring frame 12 as shown in FIG. The second ring frame 23 to which the sheet 22 is attached is lowered, the second sheet 22 is bonded to the chip C of the semiconductor wafer 11 whose chip interval is expanded by a predetermined amount, and then the first sheet 13 is peeled off. Thus, chip C is transferred. The transferred chip C is picked up by a pickup device in the next process.
[0033] 図 8は、本実施形態の引き伸ばしをグラフで表した図である。同図のように、 XOの引 き伸ばし開始位置カゝら所定パルス XIまでの間は、第 1の速度 VIでの弓 Iき伸ばし動 作が行なわれ、その時点でカメラ 15が始動し、チップ間隔 Gが所定量に達したと判定 されるまでの間は、第 1の速度 VIより遅 、第 2の速度 V2で連続的に弓 Iき伸ばし動作 が行なわれる。  FIG. 8 is a graph showing the enlargement of the present embodiment. As shown in the figure, the bow I stretching operation at the first speed VI is performed from the starting position of XO stretching until the predetermined pulse XI, at which point the camera 15 starts, Until it is determined that the tip interval G has reached the predetermined amount, the bow I stretching operation is performed continuously at the second speed V2 which is slower than the first speed VI.
[0034] 以上の説明から理解できるように、本実施形態の制御装置 17にあっては、第 1の速 度 V 1で所定位置 P 1まで第 1のシート 13を引き伸ばした後、画像処理手段 16によつ て取り込まれた第 1のシート 13上の半導体ウェハ 11の画像からチップ間隔 Gを計測 しながら第 1の速度 VIよりも遅い第 2の速度 V2で第 1のシート 13を引き伸ばし、チッ プ間隔 Gを所定量拡張する、という制御方式を採用したものである。このため、当該 チップのピックアップ時には予め設定された所定量のチップ間隔で当該チップ間が 拡張されているから、当該チップのピックアップ時にピックアップ装置の認識装置、例 えばカメラでチップの位置確認を行なうときの位置認識処理や認識した位置にピック アップ用のコレットの位置を合わせる補正処理の時間を短縮することができ、ピックァ ップ処理能力の向上を図れる。 [0035] 前記実施形態の制御装置 17では、画像の取り込みからチップ間隔の判定処理ま で(図 4の St4〜St6までの処理時間中)の間は、一律に同じ第 2の速度 V2で引き伸 ばし動作が行なわれる構成を採用した力 チップ間隔の計測処理(図 4の St5)中の み第 2の速度 V2より更に遅い第 3の速度で引き伸ばし動作が行なわれるようにしても よい。このような構成によると、チップ間隔の計測処理に時間が力かる場合でも、その 計測処理中は第 2の速度より遅い第 3の速度で引き伸ばし動作が行なわれるから、チ ップ間隔 Gが所定量力どうかの判定結果を待っている間にチップ間隔 Gが所定量の 許容範囲を超えてしまうことを効果的に防止できる。 As can be understood from the above description, in the control device 17 of the present embodiment, after the first sheet 13 is stretched to the predetermined position P 1 at the first speed V 1, the image processing means is used. The first sheet 13 is stretched at a second speed V2 that is slower than the first speed VI while measuring the chip interval G from the image of the semiconductor wafer 11 on the first sheet 13 captured by the A control method is adopted in which the chip interval G is extended by a predetermined amount. For this reason, when the chip is picked up, the distance between the chips is expanded by a predetermined amount of chip interval set in advance. The time required for the position recognition process and the correction process for aligning the pick-up collet with the recognized position can be shortened, and the pick-up processing capability can be improved. In the control device 17 of the above-described embodiment, during the period from the image capture to the chip interval determination processing (during the processing time from St4 to St6 in FIG. 4), the control device 17 uniformly pulls at the same second speed V2. The stretching operation may be performed at a third speed that is slower than the second speed V2 only during the force chip interval measurement process (St5 in FIG. 4) employing a configuration in which the stretching operation is performed. According to such a configuration, even when time is required for the measurement processing of the chip interval, the stretching operation is performed at the third speed slower than the second speed during the measurement processing. It is possible to effectively prevent the chip interval G from exceeding the predetermined amount allowable range while waiting for the determination result of the quantity force.
[0036] 前記実施形態の制御装置 17においては、第 1の速度 VIでの引き伸ばし動作が完 了した後は、第 2の速度 V2での連続的な引き伸ばし動作に移行するようにした力 こ れに代えて、間欠的な引き伸ばし動作に移行するように構成してもよい。この場合は 、間欠的な引き伸ばし動作の停止中に画像処理手段によって板状部材の画像を取 り込み、その画像からチップ間隔を計測して、チップ間隔を所定量拡張するものとし てよい。  [0036] In the control device 17 of the above-described embodiment, after the stretching operation at the first speed VI is completed, the force is set so as to shift to the continuous stretching operation at the second speed V2. Instead of this, a transition may be made to an intermittent stretching operation. In this case, an image of the plate-like member may be captured by the image processing means while the intermittent stretching operation is stopped, the chip interval may be measured from the image, and the chip interval may be expanded by a predetermined amount.
[0037] 図 9は、間欠的な引き伸ばし動作が行なわれるときの制御装置の処理動作を示した フローチャートである。このフローチャートを基に制御装置 17の処理動作を説明する FIG. 9 is a flowchart showing the processing operation of the control device when the intermittent stretching operation is performed. Based on this flowchart, the processing operation of the control device 17 will be described.
。当該制御装置 17は、最初のステップ Stlにおいて、所定の速度で第 1のシート 13 の引き伸ばし動作を開始し、この動作が完了すると(St2)、次に、第 1のシート 13を 間欠的に引き伸ばす動作に移行する(St3)。そして、この間欠的な引き伸ばし動作 の停止中に(St4)、画像処理手段 16がカメラ 15からの画像を取り込み(St5)、その 取り込んだ画像力 チップ間隔 Gを計測し (St6)、この計測データが画像処理手段 1 6から制御装置 17に出力され、チップ間隔 Gが所定量に達したかどうかを制御装置 1 7が判定する(St7)。ここで、チップ間隔 Gが所定量に達したと判定したときには、そ れ以降、間欠的な引き伸ばし動作は行なわない (St8)。この一方、チップ間隔 Gが所 定量に達していないと判定したときには、前記ステップ St3に戻り、間欠的な引き伸 ばし動作によりチップ間隔 Gが所定量に達するまで St3〜St7までの処理が繰り返し 行なわれ、所定量に達した時点で、間欠的な引き伸ばし動作を終了する(St8)。 . In the first step Stl, the control device 17 starts the stretching operation of the first sheet 13 at a predetermined speed. When this operation is completed (St2), the first sheet 13 is then intermittently stretched. Move to operation (St3). While this intermittent stretching operation is stopped (St4), the image processing means 16 captures an image from the camera 15 (St5), measures the captured image force chip interval G (St6), and this measurement data Is output from the image processing means 16 to the control device 17, and the control device 17 determines whether or not the chip interval G has reached a predetermined amount (St7). Here, when it is determined that the chip interval G has reached the predetermined amount, the intermittent stretching operation is not performed thereafter (St8). On the other hand, when it is determined that the chip interval G has not reached the predetermined amount, the process returns to step St3, and the processes from St3 to St7 are repeated until the chip interval G reaches a predetermined amount by the intermittent stretching operation. When the predetermined amount is reached, the intermittent stretching operation is terminated (St8).
[0038] 図 10は、間欠的に第 1のシートを引き伸ばしつつその引き伸ばし量を判定する場 合をグラフで表した図である。同図のように、 XOの引き伸ばし開始位置力も所定パル ス XIまでの間は、所定の速度 VIでの引き伸ばし動作が行なわれ、その時点でカメラ 15が始動し、引き伸ばし動作の停止中に、画像の取り込みとチップ間隔の判定処理 が行われ、チップ間隔 Gが所定量に達したと判定されるまで間欠的な引き伸ばし動 作が行なわれる。 [0038] FIG. 10 shows a case where the first sheet is intermittently stretched and the stretch amount is determined. FIG. As shown in the figure, the stretching operation at the predetermined speed VI is performed until the stretching starting position force of XO reaches the predetermined pulse XI. At that time, the camera 15 is started and the image is displayed while the stretching operation is stopped. And the chip interval determination process is performed, and intermittent stretching operation is performed until it is determined that the chip interval G has reached a predetermined amount.
[0039] 前記実施形態では、画像処理手段 16でチップ間隔を計測する構成を採用したが、 このチップ間隔の計測処理は、制御装置 17で行なわれるように構成してもよい。この 構成の場合は、画像処理手段 16から制御装置 17にカメラ 15の画像が出力され、そ の画像力もチップ間隔を制御装置 17が計測する。  In the embodiment, the configuration in which the chip interval is measured by the image processing unit 16 is adopted. However, the chip interval measurement process may be performed by the control device 17. In the case of this configuration, the image of the camera 15 is output from the image processing means 16 to the control device 17, and the control device 17 also measures the chip interval of the image force.
[0040] また前記実施形態では、板状部材が半導体ウェハ 11である場合を示したが、発光 ダイオードを形成する窒化ガリウム(GaN)で代表される化合物ウェハであってもよ!/ヽ 図面の簡単な説明  In the above embodiment, the case where the plate-like member is the semiconductor wafer 11 is shown, but a compound wafer typified by gallium nitride (GaN) forming a light-emitting diode may be used. easy explanation
[0041] [図 1]本発明を適用したエキスパンド装置とその制御装置の説明図。 [0041] FIG. 1 is an explanatory diagram of an expanding device to which the present invention is applied and its control device.
[図 2]エキスパンド装置の平面図。  FIG. 2 is a plan view of the expanding device.
[図 3]制御装置のハードウェア構成図。  FIG. 3 is a hardware configuration diagram of the control device.
[図 4]制御装置の処理動作を示したフローチャート。  FIG. 4 is a flowchart showing the processing operation of the control device.
[図 5]チップ間隔の計測位置の説明図。  FIG. 5 is an explanatory diagram of a measurement position of a chip interval.
[図 6]第 1の速度での引き伸ばし動作が完了したときのエキスパンド装置の状態説明 図。  FIG. 6 is an explanatory diagram of the state of the expanding device when the stretching operation at the first speed is completed.
[図 7]第 2の速度での引き伸ばし動作が完了したときのエキスパンド装置の状態説明 図。  FIG. 7 is an explanatory diagram of the state of the expanding device when the stretching operation at the second speed is completed.
[図 8]第 1の速度よりも遅い第 2の速度で連続的に第 1のシートを引き伸ばしつつその 弓 Iき伸ばし量を判定する場合のグラフ。  [FIG. 8] A graph in which the bow I is stretched while the first sheet is continuously stretched at a second speed that is slower than the first speed.
[図 9]間欠的な引き伸ばし動作が行なわれるときの制御装置の処理動作を示したフロ ーテヤート。  [Fig. 9] A flow chart showing the processing operation of the controller when intermittent stretching is performed.
[図 10]間欠的に第 1のシートを引き伸ばしつつその引き伸ばし量を判定する場合の グラフ。 符号の説明 FIG. 10 is a graph when the first sheet is intermittently stretched and the stretch amount is judged. Explanation of symbols
1 エキスパンド装置 1 Expanding device
8 パルスモータ 8 pulse motor
11 半導体ウェハ (板状部材) 11 Semiconductor wafer (plate member)
12 リングフレーム 12 Ring frame
13 第 1のシート  13 First sheet
16 画像処理手段  16 Image processing means
17 制御装置  17 Control unit
22 第 2のシート  22 Second sheet

Claims

請求の範囲 The scope of the claims
[1] リングフレームに第 1のシートを介して支持されチップ状に個片化された板状部材 のそれぞれのチップを第 2のシートに転写する前に、前記第 1のシートを引き伸ばし 前記板状部材のそれぞれのチップ間隔を拡張するエキスパンド装置の制御方法で あって、  [1] The first sheet is stretched before each chip of the plate-like member supported by the ring frame via the first sheet and separated into chips is transferred to the second sheet. A method for controlling an expanding device that expands the interval between tips of each of the members.
前記制御方法は、  The control method is:
第 1の速度で前記第 1のシートを所定位置まで引き伸ばした後、前記チップ間隔を 画像処理手段によって計測しながら前記第 1の速度よりも遅い第 2の速度で前記第 1 のシートを引き伸ばし、前記チップ間隔を所定量拡張すること  After stretching the first sheet to a predetermined position at a first speed, the first sheet is stretched at a second speed slower than the first speed while measuring the chip interval by an image processing unit, Extending the chip interval by a predetermined amount
を特徴とするエキスパンド装置の制御方法。  A method of controlling an expanding device characterized by the above.
[2] リングフレームに第 1のシートを介して支持されチップ状に個片化された板状部材 のそれぞれのチップを第 2のシートに転写する前に、前記第 1のシートを引き伸ばし 前記板状部材のそれぞれのチップ間隔を拡張するエキスパンド装置の制御方法で あって、 [2] The first sheet is stretched before each chip of the plate-like member supported by the ring frame via the first sheet and separated into chips is transferred to the second sheet. A method for controlling an expanding device that expands the interval between tips of each of the members.
前記制御方法は、  The control method is:
所定の速度で前記第 1のシートを所定位置まで引き伸ばした後、間欠的な引き伸 ばし動作に移り、その引き伸ばし動作の停止中に前記チップ間隔を画像処理手段に よって計測し、前記チップ間隔を所定量拡張すること  After the first sheet is stretched to a predetermined position at a predetermined speed, the process proceeds to an intermittent stretching operation, and the chip interval is measured by the image processing means while the stretching operation is stopped, and the chip interval is Extending a predetermined amount
を特徴とするエキスパンド装置の制御方法。  A method of controlling an expanding device characterized by the above.
[3] 前記チップ間隔の計測は、複数箇所で行!、、その複数箇所の計測データの平均 値と設定値とを対比すること [3] The chip interval is measured at multiple locations !, and the average value of the measurement data at the multiple locations is compared with the set value.
を特徴とする請求項 1又は 2のいずれかに記載のエキスパンド装置の制御方法。  The method for controlling an expanding apparatus according to claim 1, wherein:
[4] 前記板状部材は、半導体ウェハまたは化合物ウェハであること [4] The plate member is a semiconductor wafer or a compound wafer
を特徴とする請求項 1乃至 3のいずれかに記載のエキスパンド装置の制御方法。  The method for controlling an expanding apparatus according to any one of claims 1 to 3.
[5] リングフレームに第 1のシートを介して支持されチップ状に個片化された板状部材 のそれぞれのチップを第 2のシートに転写する前に、前記第 1のシートを引き伸ばし 前記板状部材のそれぞれのチップ間隔を拡張するエキスパンド装置の制御装置で あって、 前記制御装置は、 [5] The first sheet is stretched before each chip of the plate-like member supported by the ring frame via the first sheet and separated into chips is transferred to the second sheet. A control device for an expanding device that expands the distance between the tips of each member, The controller is
前記エキスパンド装置に対し、第 1の速度で所定位置まで前記第 1のシートを引き 伸ばすための信号と、第 1の速度での引き伸ばし完了後に第 1の速度より遅い第 2の 速度で前記第 1のシートを引き伸ばすための信号とを出力する出力手段と、 前記第 1のシート上の板状部材の画像を取り込み、その画像から前記チップ間隔を 計測する画像処理手段と、  A signal for stretching the first sheet to a predetermined position at a first speed with respect to the expanding device, and the first speed at a second speed slower than the first speed after completion of stretching at the first speed. Output means for outputting a signal for stretching the sheet, image processing means for capturing an image of the plate-like member on the first sheet and measuring the chip interval from the image,
前記計測したチップ間隔が所定量に達したか否かを判定する判定手段とを含み、 前記第 1の速度で前記第 1のシートを所定位置まで引き伸ばした後、前記第 2の速 度での前記第 1のシートの弓 Iき伸ばし動作を開始し、  Determination means for determining whether or not the measured chip interval has reached a predetermined amount, and after the first sheet is stretched to a predetermined position at the first speed, at the second speed The first sheet bow I starts stretching operation,
前記第 2の速度での引き伸ばし動作を行いながら、前記画像処理手段が前記板状 部材の画像を取り込み、その画像力 前記チップ間隔を計測し、前記チップ間隔が 所定量に達したと前記判定手段が判定したときは、前記第 2の速度での引き伸ばし 動作を終了し、前記チップ間隔が所定量に達していないと前記判定手段が判定した ときは、前記画像の取り込み、前記チップ間隔の計測、前記チップ間隔の判定という 一連の処理動作を繰り返し行なうことで、前記第 2の速度での引き伸ばし動作により 前記チップ間隔を所定量拡張すること  While performing the stretching operation at the second speed, the image processing means captures an image of the plate-like member, measures the image force thereof, and determines that the chip interval has reached a predetermined amount. When the determination means ends the stretching operation at the second speed and the determination means determines that the chip interval has not reached a predetermined amount, the image is captured, the chip interval is measured, By repeating a series of processing operations of determining the chip interval, the chip interval is expanded by a predetermined amount by the stretching operation at the second speed.
を特徴とするエキスパンド装置の制御装置。  A control device for an expanding device.
[6] リングフレームに第 1のシートを介して支持されチップ状に個片化された板状部材 のそれぞれのチップを第 2のシートに転写する前に、前記第 1のシートを引き伸ばし 前記板状部材のそれぞれのチップ間隔を拡張するエキスパンド装置の制御装置で あって、 [6] The first sheet is stretched before each chip of the plate-like member supported by the ring frame via the first sheet and separated into chips is transferred to the second sheet. A control device for an expanding device that expands the distance between the tips of each member,
前記制御装置は、  The controller is
前記エキスパンド装置に対し、所定の速度で所定位置まで前記第 1のシートを引き 伸ばすための信号と、前記所定の速度での引き伸ばし完了後に間欠的に引き伸ば すための信号とを出力する出力手段と、  Output to the expanding device for outputting a signal for stretching the first sheet to a predetermined position at a predetermined speed and a signal for intermittent stretching after the completion of the stretching at the predetermined speed Means,
前記第 1のシート上の板状部材の画像を取り込み、その画像から前記チップ間隔を 計測する画像処理手段と、  Image processing means for capturing an image of the plate-like member on the first sheet and measuring the chip interval from the image;
前記計測したチップ間隔が所定量に達したか否かを判定する判定手段とを含み、 前記所定の速度で第 1のシートを所定位置まで引き伸ばした後、間欠的な引き伸 ばし動作を開始し、 Determining means for determining whether the measured chip interval has reached a predetermined amount, After the first sheet is stretched to a predetermined position at the predetermined speed, an intermittent stretching operation is started.
前記間欠的な引き伸ばし動作の停止中に、前記画像処理手段が前記板状部材の 画像を取り込み、その画像力 前記チップ間隔を計測し、前記チップ間隔が所定量 に達したと前記判定手段が判定したときには、前記間欠的な引き伸ばし動作を終了 し、前記チップ間隔が所定量に達していないと前記判定手段が判定したときには、前 記画像の取り込み、前記チップ間隔の計測、前記チップ間隔の判定という一連の処 理動作を繰り返し行なうことで、前記間欠的な引き伸ばし動作により前記チップ間隔 を所定量拡張すること  While the intermittent stretching operation is stopped, the image processing means captures an image of the plate-like member, measures its image force, the chip interval is measured, and the determination unit determines that the chip interval has reached a predetermined amount. When the determination means determines that the intermittent stretching operation is finished and the chip interval has not reached a predetermined amount, the above-described image capture, chip interval measurement, and chip interval determination are referred to. By repeating a series of processing operations, the chip interval is expanded by a predetermined amount by the intermittent stretching operation.
を特徴とするエキスパンド装置の制御装置。  A control device for an expanding device.
[7] 前記チップ間隔の計測は、複数箇所で行!、、その複数箇所の計測データの平均 値と設定値とを対比すること  [7] The measurement of the chip interval is performed at a plurality of locations !, and the average value of the measurement data at the plurality of locations is compared with the set value.
を特徴とする請求項 5又は 6のいずれかに記載のエキスパンド装置の制御装置。  The control device for an expanding device according to any one of claims 5 and 6.
[8] 前記板状部材は、半導体ウェハまたは化合物ウェハであること [8] The plate member is a semiconductor wafer or a compound wafer.
を特徴とする請求項 5乃至 7のいずれかに記載のエキスパンド装置の制御装置。  The control device for an expanding device according to any one of claims 5 to 7.
PCT/JP2006/319472 2005-10-04 2006-09-29 Method and apparatus for controlling expanding apparatus WO2007040181A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005291193A JP4793981B2 (en) 2005-10-04 2005-10-04 EXPANDING DEVICE CONTROL METHOD AND CONTROL DEVICE THEREOF
JP2005-291193 2005-10-04

Publications (1)

Publication Number Publication Date
WO2007040181A1 true WO2007040181A1 (en) 2007-04-12

Family

ID=37906222

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2006/319472 WO2007040181A1 (en) 2005-10-04 2006-09-29 Method and apparatus for controlling expanding apparatus

Country Status (3)

Country Link
JP (1) JP4793981B2 (en)
TW (1) TW200721287A (en)
WO (1) WO2007040181A1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009016471A (en) * 2007-07-03 2009-01-22 Panasonic Corp Sheet stretcher and sheet expanding method
WO2010119506A1 (en) * 2009-04-14 2010-10-21 パイオニア株式会社 Apparatus and method for separating electronic components
EP2339611A1 (en) * 2009-12-23 2011-06-29 ISMECA Semiconductor Holding SA Wafer handler comprising a vision system
JP2018190885A (en) * 2017-05-10 2018-11-29 リンテック株式会社 Separation device and separation method

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4955377B2 (en) * 2006-12-12 2012-06-20 リンテック株式会社 Chip spacing measuring device and measuring method
JP5345348B2 (en) * 2008-07-15 2013-11-20 株式会社ディスコ Breaking method and breaking device
JP5533695B2 (en) * 2011-01-26 2014-06-25 豊田合成株式会社 Semiconductor chip manufacturing method and semiconductor chip mounting method
JP5912274B2 (en) * 2011-03-28 2016-04-27 株式会社東京精密 Chip dividing / separating device and chip dividing / separating method
JP2016122708A (en) * 2014-12-24 2016-07-07 リンテック株式会社 Separation device and separation method
JP6896990B2 (en) * 2017-03-27 2021-06-30 株式会社東京精密 Work division method
JP6996046B2 (en) * 2017-05-10 2022-01-17 リンテック株式会社 Separation device and separation method
JP7494067B2 (en) 2020-09-14 2024-06-03 キオクシア株式会社 Semiconductor device manufacturing method and semiconductor manufacturing device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62222642A (en) * 1986-03-25 1987-09-30 Toshiba Corp Die bonding unit
JPH01248638A (en) * 1988-03-30 1989-10-04 Sharp Corp Wafer expanding device
JPH0541451A (en) * 1991-08-06 1993-02-19 Sony Corp Method and device for pelletizing semiconductor wafer
JP3064979B2 (en) * 1997-08-19 2000-07-12 日本電気株式会社 Dicing method for semiconductor wafer
JP2001110757A (en) * 1999-10-06 2001-04-20 Toshiba Corp Manufacturing method of semiconductor device
WO2004105109A1 (en) * 2003-05-22 2004-12-02 Tokyo Seimitsu Co., Ltd. Dicing device
JP2005045149A (en) * 2003-07-25 2005-02-17 Tokyo Seimitsu Co Ltd Method for expansion

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2893741B2 (en) * 1989-08-02 1999-05-24 日本電気株式会社 Electrostrictive effect element

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62222642A (en) * 1986-03-25 1987-09-30 Toshiba Corp Die bonding unit
JPH01248638A (en) * 1988-03-30 1989-10-04 Sharp Corp Wafer expanding device
JPH0541451A (en) * 1991-08-06 1993-02-19 Sony Corp Method and device for pelletizing semiconductor wafer
JP3064979B2 (en) * 1997-08-19 2000-07-12 日本電気株式会社 Dicing method for semiconductor wafer
JP2001110757A (en) * 1999-10-06 2001-04-20 Toshiba Corp Manufacturing method of semiconductor device
WO2004105109A1 (en) * 2003-05-22 2004-12-02 Tokyo Seimitsu Co., Ltd. Dicing device
JP2005045149A (en) * 2003-07-25 2005-02-17 Tokyo Seimitsu Co Ltd Method for expansion

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009016471A (en) * 2007-07-03 2009-01-22 Panasonic Corp Sheet stretcher and sheet expanding method
WO2010119506A1 (en) * 2009-04-14 2010-10-21 パイオニア株式会社 Apparatus and method for separating electronic components
EP2339611A1 (en) * 2009-12-23 2011-06-29 ISMECA Semiconductor Holding SA Wafer handler comprising a vision system
WO2011076507A1 (en) * 2009-12-23 2011-06-30 Ismeca Semiconductor Holding Sa Wafer handler comprising a vision system
CN102696093A (en) * 2009-12-23 2012-09-26 伊斯梅卡半导体控股公司 Wafer handler comprising a vision system
JP2013516056A (en) * 2009-12-23 2013-05-09 イスメカ セミコンダクター ホールディング エス アー Wafer handler including vision system
TWI496229B (en) * 2009-12-23 2015-08-11 Ismeca Semiconductor Holding Wafer handler comprising a vision system
US9153470B2 (en) 2009-12-23 2015-10-06 Ismeca Semiconductor Holding Sa Wafer handler comprising a vision system
JP2018190885A (en) * 2017-05-10 2018-11-29 リンテック株式会社 Separation device and separation method

Also Published As

Publication number Publication date
JP2007103649A (en) 2007-04-19
TW200721287A (en) 2007-06-01
JP4793981B2 (en) 2011-10-12

Similar Documents

Publication Publication Date Title
WO2007040181A1 (en) Method and apparatus for controlling expanding apparatus
US8991681B2 (en) Die bonder and bonding method
JP4372605B2 (en) Electronic component mounting apparatus and electronic component mounting method
TWI756160B (en) Die bonding device and manufacturing method of semiconductor device
US20040157368A1 (en) Die bonding method and apparatus
JP3674587B2 (en) Electronic component mounting method
CN107452641B (en) Method for picking up bare chip from wafer
JP4232511B2 (en) Semiconductor manufacturing equipment
JP4202376B2 (en) Semiconductor device manufacturing apparatus and semiconductor device manufacturing method
JP4955377B2 (en) Chip spacing measuring device and measuring method
JP5191753B2 (en) Die bonder and die bonding method
JP4746948B2 (en) Electronic component mounting apparatus and mounting method
JP4800076B2 (en) Component mounting method and apparatus
JP7368962B2 (en) mounting equipment
US7757390B2 (en) Method for production of a semiconductor component
JP2007201115A (en) Device and method for chip component transfer
JP4237486B2 (en) Pellet pick-up method and pellet bonding apparatus
JP2006041089A (en) Bonding apparatus
JP2004103603A (en) Method and apparatus for manufacturing semiconductor device
JP4080143B2 (en) Wire bonder
JP2021013002A5 (en)
KR0119092Y1 (en) Wafer aligning apparatus
JP2002231789A (en) Pickup method of semiconductor chip
JP2005032828A (en) Manufacturing apparatus of semiconductor device, and method for manufacturing semiconductor device
JP2004311681A (en) Semiconductor device manufacturing apparatus, and manufacturing method using the same

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application
NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 06810870

Country of ref document: EP

Kind code of ref document: A1