JP2016122708A - Separation device and separation method - Google Patents

Separation device and separation method Download PDF

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JP2016122708A
JP2016122708A JP2014260999A JP2014260999A JP2016122708A JP 2016122708 A JP2016122708 A JP 2016122708A JP 2014260999 A JP2014260999 A JP 2014260999A JP 2014260999 A JP2014260999 A JP 2014260999A JP 2016122708 A JP2016122708 A JP 2016122708A
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adhesive sheet
holding
edge
plate
tension
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芳昭 杉下
Yoshiaki Sugishita
芳昭 杉下
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Lintec Corp
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Lintec Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a separation device capable of significantly widening a mutual interval of chip pieces, and a separation method.SOLUTION: A separation device 10 is configured to widen the mutual interval of a plurality of chip pieces CP each formed from a tabular member WF by applying a tension to an adhesive sheet AS to which the tabular member WF is stuck. The separation device comprises: hold means 20 for holding a hold area AS2 outside of a stick area AS1 in which the tabular member WF is stuck, in the adhesive sheet AS; abutment means 30 including a plurality of edge formation members 33C of which the outer edges are made into edge parts 33B; and tension application means 40 by which the adhesive sheet AS is abutted to the edge formation members 33C and the hold means 20 and the abutment means 30 are relatively moved, thereby applying the tension to the adhesive sheet AS while folding an interval between the stick area AS1 and the hold area AS2 in the adhesive sheet AS at the edge parts 33B. The abutment means 30 is provided in such a manner that the edge formation members 33C can be separated from each other along a surface of the tabular member WF.SELECTED DRAWING: Figure 1

Description

本発明は、離間装置および離間方法に関する。   The present invention relates to a separation device and a separation method.

従来、半導体製造工程において、半導体ウエハ(以下、単に「ウエハ」という場合がある)を所定の形状、所定のサイズに切断して複数の半導体チップ(片状体)に個片化し、各片状体の相互間隔を広げる装置は、例えば、特許文献1のようなものが知られている。   Conventionally, in a semiconductor manufacturing process, a semiconductor wafer (hereinafter sometimes simply referred to as a “wafer”) is cut into a predetermined shape and a predetermined size, and is divided into a plurality of semiconductor chips (pieces). For example, Patent Document 1 discloses an apparatus that widens the mutual space between bodies.

特開2007−123658号公報JP 2007-123658 A

しかしながら、特許文献1に記載されたような従来の装置では、テープ拡張手段(当接手段)の上面以上の広さに片状体の相互間隔を広げることができないという不都合がある。   However, the conventional apparatus described in Patent Document 1 has a disadvantage that the interval between the strips cannot be increased to a width larger than the upper surface of the tape expansion means (contact means).

本発明の目的は、片状体の相互間隔を大きく広げることができる離間装置および離間方法を提供することにある。   An object of the present invention is to provide a separation device and a separation method that can greatly increase the interval between pieces.

前記目的を達成するために、本発明の離間装置は、板状部材が貼付された接着シートに張力を付与して当該板状部材から形成される複数の片状体の相互間隔を広げる離間装置であって、前記接着シートにおける前記板状部材が貼付された貼付領域の外側の保持領域を保持する保持手段と、外縁部がエッジ部とされた複数のエッジ形成部材を有する当接手段と、前記接着シートをエッジ形成部材に当接させ、前記保持手段と当接手段とを相対移動させることで、当該接着シートにおける前記貼付領域と保持領域との間を前記エッジ部で折り曲げて当該接着シートに張力を付与する張力付与手段とを備え、前記当接手段は、前記エッジ形成部材を前記板状部材の面に沿って相互に離間可能に設けられている、という構成を採用している。   In order to achieve the above object, a separating apparatus according to the present invention is a separating apparatus that applies tension to an adhesive sheet to which a plate-like member is attached to increase the interval between a plurality of pieces formed from the plate-like member. The holding means for holding the holding area outside the sticking area to which the plate-like member is stuck in the adhesive sheet, and the contact means having a plurality of edge forming members whose outer edge parts are edge parts, The adhesive sheet is brought into contact with an edge forming member, and the holding means and the contact means are moved relative to each other to bend the gap between the pasting area and the holding area of the adhesive sheet at the edge portion. The abutment means employs a configuration in which the edge forming member is provided so as to be separated from each other along the surface of the plate-like member.

本発明の離間装置において、前記当接手段は、前記エッジ部を前記保持手段の内縁部よりも外方に移動可能に設けられていることが好ましい。
本発明の離間装置において、前記片状体の相互間隔を測定する測定手段を備え、前記当接手段は、前記測定手段の測定結果を基に前記接着シートに対して部位別にエッジ形成部材を移動可能に設けられていることが好ましい。
In the separation device according to the aspect of the invention, it is preferable that the abutting means is provided so that the edge portion can be moved outward from the inner edge portion of the holding means.
In the separation apparatus of the present invention, the separation device includes a measurement unit that measures a mutual interval between the pieces, and the contact unit moves the edge forming member for each part with respect to the adhesive sheet based on the measurement result of the measurement unit. It is preferable to be provided.

一方、本発明の離間方法は、板状部材が貼付された接着シートに張力を付与して当該板状部材から形成される複数の片状体の相互間隔を広げる離間方法であって、前記接着シートにおける前記板状部材が貼付された貼付領域の外側の保持領域を保持する工程と、外縁部がエッジ部とされた複数のエッジ形成部材を前記接着シートに当接させ、前記保持領域とエッジ形成部材とを相対移動させることで、当該接着シートにおける前記貼付領域と保持領域との間を前記エッジ部で折り曲げて当該接着シートに張力を付与する工程と、前記エッジ形成部材を前記板状部材の面に沿って相互に離間させる工程とを備えている、という構成を採用している。   On the other hand, the separation method of the present invention is a separation method in which a tension is applied to an adhesive sheet to which a plate-like member is affixed to widen the interval between a plurality of pieces formed from the plate-like member. A step of holding a holding region outside the pasting region to which the plate-like member is pasted in the sheet, and a plurality of edge forming members having outer edge portions as edge portions are brought into contact with the adhesive sheet, and the holding region and the edge A step of bending the portion between the pasting region and the holding region of the adhesive sheet by the edge portion by relatively moving the forming member, and applying tension to the adhesive sheet; and the edge forming member as the plate-like member And a step of separating them from each other along the surface.

以上のような本発明によれば、外縁部がエッジ部とされた複数のエッジ形成部材を板状部材の面に沿って相互に離間可能に設けられているので、片状体の相互間隔を大きく広げることができる。
また、エッジ形成部材を保持手段の内縁部よりも外方に移動可能に設けられているので、片状体の相互間隔をより大きく広げることができる。
さらに、測定手段による測定結果を基にして部位別に張力を付与すれば、片状体の相互間隔を部位別に微調整することができる。
According to the present invention as described above, the plurality of edge forming members whose outer edge portions are edge portions are provided so as to be separated from each other along the surface of the plate-like member. Can be greatly expanded.
Further, since the edge forming member is provided so as to be movable outward from the inner edge portion of the holding means, the mutual interval between the strips can be greatly increased.
Furthermore, if a tension is applied to each part based on the measurement result obtained by the measuring means, the mutual interval between the pieces can be finely adjusted for each part.

本発明の一実施形態に係る離間装置を示す側面図。The side view which shows the separation apparatus which concerns on one Embodiment of this invention. 前記離間装置の動作説明図。Operation | movement explanatory drawing of the said separation apparatus.

以下、本発明の一実施形態を図面に基づいて説明する。
なお、本実施形態において、X軸、Y軸、Z軸は、それぞれが直交する関係にあり、X軸およびY軸は、所定平面内の軸とし、Z軸は、前記所定平面に直交する軸とする。さらに、本実施形態では、Y軸と平行な図1中手前方向から観た場合を基準とし、方向を示した場合、「上」がZ軸の矢印方向で「下」がその逆方向、「左」がX軸の矢印方向で「右」がその逆方向、「前」がY軸の矢印方向であって図1中紙面に直交する手前方向で「後」がその逆方向とする。
Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
In the present embodiment, the X axis, the Y axis, and the Z axis are orthogonal to each other, the X axis and the Y axis are axes within a predetermined plane, and the Z axis is an axis orthogonal to the predetermined plane. And Furthermore, in the present embodiment, when viewed from the front side in FIG. 1 parallel to the Y axis, when indicating the direction, “up” is the arrow direction of the Z axis and “down” is the opposite direction, “ “Left” is the arrow direction of the X axis, “Right” is the opposite direction, “Front” is the arrow direction of the Y axis, and the “Rear” is the opposite direction in the front direction perpendicular to the paper surface in FIG.

図1、図2(A)において、離間装置10は、板状部材としてのウエハWFが貼付された接着シートASに張力を付与して当該ウエハWFから形成される複数の片状体としてのチップCPの相互間隔を広げる離間装置であって、接着シートASにおけるウエハWFが貼付された貼付領域AS1の外側の保持領域AS2を保持する保持手段20と、外縁部がエッジ部33Bとされた複数のエッジ形成部材33Cを有する当接手段30と、接着シートASをエッジ形成部材33Cに当接させ、保持手段20と当接手段30とを相対移動させることで、当該接着シートASにおける貼付領域AS1と保持領域AS2との間をエッジ部33Bで折り曲げて当該接着シートASに張力を付与する張力付与手段40と、チップCPの相互間隔を測定する光学センサや撮像手段等の測定手段50とを備えている。なお、ウエハWFは、切断刃や加圧水等のウエハ切断手段によりチップCPに個片化されているか、レーザ光や薬液等のウエハ脆弱化手段によりチップCPに個片化可能とされ、接着シートASを介してフレーム部材としてのリングフレームRFに支持されて一体物WKとされている。   In FIG. 1 and FIG. 2A, the separating device 10 is a chip as a plurality of pieces formed from the wafer WF by applying tension to the adhesive sheet AS to which the wafer WF as a plate-like member is attached. A separation device for widening the mutual interval between CPs, a holding means 20 for holding a holding area AS2 outside the sticking area AS1 to which the wafer WF is stuck on the adhesive sheet AS, and a plurality of edge portions 33B. The abutting means 30 having the edge forming member 33C and the adhesive sheet AS are brought into contact with the edge forming member 33C, and the holding means 20 and the abutting means 30 are moved relative to each other to thereby apply the pasting area AS1 on the adhesive sheet AS. Light for measuring the mutual distance between the tip CP and the tension applying means 40 for applying tension to the adhesive sheet AS by bending the edge portion 33B with the holding region AS2. And a measuring means 50 such as a sensor or an imaging device. The wafer WF is separated into chips CP by a wafer cutting means such as a cutting blade or pressurized water, or can be separated into chips CP by a wafer weakening means such as a laser beam or a chemical solution. And is supported by a ring frame RF as a frame member to form an integrated object WK.

保持手段20は、リングフレームRFを受容可能な溝21Aが形成された一対の支持部材21を備えている。なお、本実施形態の場合、リングフレームRFは、当該保持手段20を構成する部材となる。   The holding means 20 includes a pair of support members 21 formed with grooves 21A that can receive the ring frame RF. In the present embodiment, the ring frame RF is a member constituting the holding means 20.

当接手段30は、ベースプレート31上に支持された4体の駆動機器としてのリニアモータ32と、各リニアモータ32それぞれのスライダ32Aに支持された離間テーブル33とを備えている。各離間テーブル33は、上下方向に延設された立上部33Aと、立上部33Aの上端からウエハWFの面方向外方に延設されその円弧状の外縁部がエッジ部33Bとされたエッジ形成部材33Cとを備えている。   The contact means 30 includes four linear motors 32 as drive devices supported on a base plate 31 and a separation table 33 supported by a slider 32A of each linear motor 32. Each spacing table 33 includes an upright portion 33A extending in the vertical direction, and an edge formation in which the arc-shaped outer edge portion is formed as an edge portion 33B extending outward from the upper end of the upright portion 33A in the surface direction of the wafer WF. And a member 33C.

張力付与手段40は、それぞれの出力軸41Aで支持部材21を支持し、ベースプレート31の下面に支持された一対の駆動機器としての直動モータ41を備えている。   The tension applying means 40 includes a linear motion motor 41 as a pair of drive devices that support the support member 21 with the respective output shafts 41 </ b> A and are supported on the lower surface of the base plate 31.

以上の離間装置10において、ウエハWFから形成される複数のチップCPの相互間隔を広げる手順を説明する。
先ず、図1中実線で示す各部材が初期位置で待機する離間装置10に対し、人手または多関節ロボットやベルトコンベア等の図示しない搬送手段が一体物WKを搬送し、図2(A)に示すように、リングフレームRFを支持部材21の溝21Aに挿通させ、位置決めした後退避する。
A procedure for increasing the interval between the plurality of chips CP formed from the wafer WF in the spacing device 10 will be described.
First, with respect to the separating device 10 in which each member indicated by a solid line in FIG. 1 stands by at an initial position, a conveying means (not shown) such as a human hand or an articulated robot or a belt conveyor conveys the integrated object WK, and FIG. As shown, the ring frame RF is inserted into the groove 21A of the support member 21, positioned, and then retracted.

次に、張力付与手段40が直動モータ41を駆動し、支持部材21を下降させる。これにより、接着シートASにおける貼付領域AS1と保持領域AS2との間がエッジ部33Bで折り曲げられて当該接着シートASに張力が付与され、チップCPの相互間隔が広がる。ここで、図1中左側の二点鎖線で示すように、相互間隔が広げられたチップCP群の最外縁に位置するチップCPがエッジ部33Bの近傍に達すると、チップCPの相互間隔が所望の値以下であったとしても、当該相互間隔をそれ以上広げることができなくなる。そこで、当接手段30がリニアモータ32を駆動し、エッジ部33Bすなわち離間テーブル33をウエハWFの面に沿って相互に離間させる。そして、測定手段50の測定結果を基に、チップCPの相互間隔が所望の値になった時点で、当接手段30がリニアモータ32の駆動を停止する。このとき、当接手段30は、図1中右側の二点鎖線および、図2(B)で示すように、エッジ部33BをリングフレームRFの内縁部または、支持部材21の内縁部よりも外方に配置することができる。   Next, the tension applying means 40 drives the linear motor 41 to lower the support member 21. Thereby, the space between the pasting area AS1 and the holding area AS2 in the adhesive sheet AS is bent at the edge portion 33B, tension is applied to the adhesive sheet AS, and the mutual interval between the chips CP is increased. Here, as shown by the two-dot chain line on the left side in FIG. 1, when the chip CP located at the outermost edge of the group of chips CP with the increased mutual distance reaches the vicinity of the edge portion 33B, the mutual distance between the chips CP is desired. Even if it is less than this value, the mutual interval cannot be increased further. Therefore, the contact means 30 drives the linear motor 32 to separate the edge portion 33B, that is, the separation table 33 from each other along the surface of the wafer WF. Based on the measurement result of the measuring means 50, the contact means 30 stops driving the linear motor 32 when the mutual distance between the chips CP reaches a desired value. At this time, the contact means 30 has the edge portion 33B outside the inner edge portion of the ring frame RF or the inner edge portion of the support member 21 as shown by the two-dot chain line on the right side in FIG. 1 and FIG. Can be arranged in the direction.

この際、測定手段50の測定結果を基に、チップCPの相互間隔が所定の間隔からずれている箇所がある場合、当接手段30がリニアモータ32を駆動し、接着シートASに対して部位別に離間テーブル33を移動させてチップCPの相互間隔を極力均一に広げる動作を行うことができる。すなわち、例えば、図2(B)に示す右部分におけるチップCPの相互間隔が所定の間隔よりも狭かった場合(広かった場合)、当接手段30が同図右部分におけるチップCPの相互間隔を広げるように(縮めるように)、当該右部分に対応するリニアモータ32を駆動する。また、本実施形態のように、リングフレームRFの左右2箇所を保持手段20で保持してチップCPの相互間隔を広げる場合、当該保持手段20で支持されていないリングフレームRFの前後部分が上方に撓みやすくなる傾向がある。このため、相互間隔が広げられたチップCP群における中央部の前後方向への広がりが少なくなるので、当接手段30が同中央部の前後方向におけるチップCPの相互間隔を広げるように、当該前後部分に対応するリニアモータ32を駆動するとよい。なお、チップCPの相互間隔を広げたり縮めたりするにあたり、当接手段30によりいずれのリニアモータ32を駆動させるかは、使用者の経験値で任意に決定することができる。また、測定手段50がチップCPの相互間隔を測定する箇所も使用者が任意に決定することができる。 At this time, based on the measurement result of the measuring means 50, when there is a place where the mutual distance between the chips CP is deviated from a predetermined distance, the contact means 30 drives the linear motor 32 and the part with respect to the adhesive sheet AS. Separately, the spacing table 33 can be moved to perform the operation of widening the mutual spacing between the chips CP as much as possible. That is, for example, when the mutual interval between the chips CP in the right portion shown in FIG. 2B is narrower (larger) than the predetermined interval, the contact means 30 sets the mutual interval between the chips CP in the right portion in FIG. The linear motor 32 corresponding to the right part is driven so as to expand (shrink). Further, as in the present embodiment, when the two left and right portions of the ring frame RF are held by the holding means 20 and the distance between the chips CP is increased, the front and rear portions of the ring frame RF that are not supported by the holding means 20 are Tend to bend easily. For this reason, since the spread in the front-rear direction of the central portion in the chip CP group with the increased mutual spacing is reduced, the contact means 30 increases the mutual spacing of the chips CP in the front-rear direction of the central portion. The linear motor 32 corresponding to the part may be driven. It should be noted that which of the linear motors 32 is driven by the contact means 30 can be arbitrarily determined based on the experience value of the user when the mutual distance between the chips CP is increased or decreased. Also, the user can arbitrarily determine the location where the measuring means 50 measures the mutual distance between the chips CP.

その後、搬送装置やピックアップ装置等の図示しない搬送手段が各チップCPを保持して搬送し、リードフレームや基板等の被搭載物上に搭載する。その後、全てのチップCPの搬送が終了すると、張力付与手段40および当接手段30が直動モータ41およびリニアモータ32を駆動し、支持部材21および離間テーブル33を初期位置に復帰させた後、チップCPが取り外された一体物WKを搬送手段が回収し、以降上記同様の動作が繰り返される。   Thereafter, a conveying means (not shown) such as a conveying device or a pickup device holds and conveys each chip CP and mounts it on a mounted object such as a lead frame or a substrate. Thereafter, after the transfer of all the chips CP is completed, the tension applying means 40 and the contact means 30 drive the linear motion motor 41 and the linear motor 32 to return the support member 21 and the separation table 33 to the initial positions. The conveying means collects the integrated object WK from which the chip CP has been removed, and thereafter the same operation as described above is repeated.

以上のような実施形態によれば、外縁部がエッジ部33Bとされた複数のエッジ形成部材33CをウエハWFの面に沿って相互に離間可能に設けられているので、チップCPの相互間隔をより大きく広げることができる。   According to the embodiment as described above, the plurality of edge forming members 33C whose outer edge portions are the edge portions 33B are provided so as to be separated from each other along the surface of the wafer WF. It can be expanded more.

以上のように、本発明を実施するための最良の構成、方法等は、前記記載で開示されているが、本発明は、これに限定されるものではない。すなわち、本発明は、主に特定の実施形態に関して特に図示され、かつ説明されているが、本発明の技術的思想および目的の範囲から逸脱することなく、以上述べた実施形態に対し、形状、材質、数量、その他の詳細な構成において、当業者が様々な変形を加えることができるものである。また、上記に開示した形状、材質などを限定した記載は、本発明の理解を容易にするために例示的に記載したものであり、本発明を限定するものではないから、それらの形状、材質などの限定の一部もしくは全部の限定を外した部材の名称での記載は、本発明に含まれる。   As described above, the best configuration, method and the like for carrying out the present invention have been disclosed in the above description, but the present invention is not limited to this. That is, the invention has been illustrated and described with particular reference to certain specific embodiments, but without departing from the spirit and scope of the invention, Various modifications can be made by those skilled in the art in terms of material, quantity, and other detailed configurations. In addition, the description of the shape, material, and the like disclosed above is exemplary for ease of understanding of the present invention, and does not limit the present invention. The description by the name of the member which remove | excluded the limitation of some or all of such restrictions is included in this invention.

保持手段20は、メカチャックやチャックシリンダ等のチャック手段や、減圧ポンプや真空エジェクタ等の図示しない減圧手段や、接着剤、磁力等で接着シートASを支持する構成でもよい。
保持手段20は、リングフレームRFを介することなく、ウエハWFに貼付された接着シートASを直接支持してもよい。この場合、一体物WKは、リングフレームRFがなくてもよいし、あってもよい。
保持手段20が接着シートASを支持する箇所は、1箇所でもよいし、3箇所以上でもよい。
保持手段20は、1体でもよいし、3体以上でもよい。
The holding means 20 may be configured to support the adhesive sheet AS with chuck means such as a mechanical chuck or a chuck cylinder, decompression means (not shown) such as a decompression pump or a vacuum ejector, or an adhesive or magnetic force.
The holding unit 20 may directly support the adhesive sheet AS attached to the wafer WF without using the ring frame RF. In this case, the integrated object WK may or may not have the ring frame RF.
The place where the holding means 20 supports the adhesive sheet AS may be one place or three places or more.
The holding means 20 may be one body or three or more bodies.

当接手段30の各エッジ部33Bの形状は、円弧状、楕円弧状、直線状さらにはそれら形状が適宜に組み合わさった形状でもよく、エッジ部33Bで形成される辺縁の平面形状は、円形、楕円形、三角形や四角形以上の多角形、幾何学形など、任意の形状でもよく、板状体の平面形状よりも大きな相似関係にある形状としてもよいし、相似関係にない形状としてもよい。
当接手段30は、接着シートASに対して部位別に張力を付与できなくてもよい。
当接手段30によるチップCPの相互間隔の測長や微調整は、測定手段50の測定結果に基づかずに行ってもよく、例えば、リニアモータ32の出力値を基に行ったり、スライダ32Aの位置を基に行ったり、使用者が相互間隔を測長したりしてもよい。
離間テーブル33は、2体や3体でもよいし、5体以上でもよく、その数に合わせてリニアモータ32を設ければよい。
当接手段30は、ウエハWFが貼付された貼付面にエッジ部33Bを当接させる構成でもよく、例えば、X−Y平面に平行な面を設けることなく線状部材でエッジ部33Bを形成する離間テーブルを採用することができる。このようなX−Y平面に平行な面のないエッジ部33Bだけのものの場合、上記実施形態に対して天地反転させた一体物WKのリングフレームRFを支持部材21の溝21Aに挿通し、ウエハWFを下側にしてチップCPの相互間隔を広げることができる。
The shape of each edge portion 33B of the contact means 30 may be an arc shape, an elliptical arc shape, a linear shape, or a shape obtained by appropriately combining these shapes, and the planar shape of the edge formed by the edge portion 33B is a circle. , Any shape such as an ellipse, a triangle or a polygon more than a quadrangle, a geometric shape, etc., a shape having a similar relationship larger than the planar shape of a plate-like body, or a shape not having a similar relationship .
The contact means 30 may not be able to apply tension to the adhesive sheet AS for each part.
The length measurement and fine adjustment of the mutual distance between the chips CP by the contact means 30 may be performed without being based on the measurement result of the measurement means 50, for example, based on the output value of the linear motor 32 or the slider 32A. Based on the position, the user may measure the mutual distance.
The separation table 33 may be two or three, or five or more, and the linear motor 32 may be provided according to the number.
The abutting means 30 may be configured to abut the edge portion 33B on the affixing surface to which the wafer WF is affixed. For example, the edge portion 33B is formed by a linear member without providing a surface parallel to the XY plane. A spacing table can be employed. In the case of only the edge portion 33B having no surface parallel to the XY plane, the ring frame RF of the integrated object WK that is inverted upside down with respect to the above embodiment is inserted into the groove 21A of the support member 21, and the wafer is The distance between the chips CP can be widened with WF on the lower side.

張力付与手段40は、保持手段20を固定しておき当接手段30を移動させてもよいし、保持手段20および当接手段30の両方を移動させてもよい。
張力付与手段40は、相互間隔が広げられたチップCP群の最外縁に位置するチップCPがエッジ部33Bの近傍に達した時点で、直動モータ41の駆動を停止し、当接手段30がリニアモータ32を駆動し、チップCPの相互間隔を広げてもよいし、直動モータ41の駆動を停止することなく当接手段30がリニアモータ32を駆動し、チップCPの相互間隔を広げてもよいし、相互間隔が広げられたチップCP群の最外縁に位置するチップCPがエッジ部33Bの近傍に達する前から当接手段30とリンクしてチップCPの相互間隔を広げてもよい。
測定手段50は、なくてもよい。
The tension applying unit 40 may move the contact unit 30 while fixing the holding unit 20, or may move both the holding unit 20 and the contact unit 30.
The tension applying means 40 stops the driving of the linear motor 41 when the chip CP located at the outermost edge of the chip CP group with the increased mutual spacing reaches the vicinity of the edge portion 33B. The linear motor 32 may be driven to increase the mutual distance between the chips CP, or the contact means 30 may drive the linear motor 32 without stopping the driving of the linear motion motor 41 to increase the mutual distance between the chips CP. Alternatively, the chip CP positioned at the outermost edge of the group of chips CP with the increased mutual spacing may be linked to the contact means 30 before the chip CP located in the vicinity of the edge portion 33B to increase the mutual distance between the chips CP.
The measuring means 50 may be omitted.

板状部材や片状体の形状は、例えば円形、楕円形、三角形や四角形以上の多角形等、その他の形状であってもよい。
フレーム部材は、リングフレーム以外に、環状でない(外周が繋がっていない)フレームや、円形以外に三角形や四角形等の多角形や楕円形等、その他の形状であってもよい。
The shape of the plate-like member or piece-like body may be other shapes such as a circle, an ellipse, a triangle, or a polygon more than a quadrangle.
In addition to the ring frame, the frame member may have other shapes such as a non-circular frame (the outer periphery is not connected), a polygon other than a circle, a polygon such as a triangle or a rectangle, and an ellipse.

また、本発明における接着シートASの材質、種別、形状等は、特に限定されることはない。例えば、接着シートASは、円形、楕円形、三角形や四角形以上の多角形、その他の形状であってもよい。また、接着シートASは、例えば、接着剤層だけの単層のもの、基材と接着剤層との間に中間層を有するもの、基材の上面にカバー層を有する等3層以上のもの、さらには、基材を接着剤層から剥離することのできる所謂両面接着シートのようなものであってもよく、両面接着シートは、単層または複層の中間層を有するものや、中間層のない単層または複層のものであってよい。さらに、板状部材としては、例えば、シリコン半導体ウエハや化合物半導体ウエハ等の半導体ウエハ、回路基板、光ディスク等の情報記録基板、ガラス板、鋼板、陶器、木板または樹脂板等、任意の形態の部材や物品なども対象とすることができ、片状体は、それらが個片化されたものであればよい。なお、接着シートASは、機能的、用途的な読み方に換え、例えば、保護シート、ダイシングテープ、ダイアタッチフィルム、ダイボンディングテープ等の任意のシート、フィルム、テープ等でもよい。   Further, the material, type, shape and the like of the adhesive sheet AS in the present invention are not particularly limited. For example, the adhesive sheet AS may be a circle, an ellipse, a triangle or a polygon more than a quadrangle, and other shapes. Also, the adhesive sheet AS is, for example, a single layer having only an adhesive layer, having an intermediate layer between the base material and the adhesive layer, or having a cover layer on the upper surface of the base material. Further, it may be a so-called double-sided adhesive sheet that can peel the substrate from the adhesive layer, and the double-sided adhesive sheet has a single-layer or multi-layer intermediate layer, It may be a single layer or multiple layers without any. Furthermore, as a plate-shaped member, for example, a semiconductor wafer such as a silicon semiconductor wafer or a compound semiconductor wafer, an information recording substrate such as a circuit board or an optical disk, a glass plate, a steel plate, a ceramic, a wooden plate, a resin plate, or any other member Can also be used as the object, and the piece may be any piece as long as they are separated. Note that the adhesive sheet AS may be replaced with a functional or application reading, and may be any sheet such as a protective sheet, a dicing tape, a die attach film, a die bonding tape, a film, a tape, or the like.

本発明における手段は、それら手段について説明した動作や機能を果たすことができる限りなんら限定されることはなく、まして、前記実施形態で示した単なる一実施形態の構成物に全く限定されることはない。例えば、保持手段は、接着シートにおける板状部材が貼付された貼付領域の外側の保持領域を保持可能なものであれば、出願当初の技術常識に照らし合わせ、その技術範囲内のものであればなんら限定されることはない(他の手段についての説明は省略する)。
また、前記実施形態における駆動機器は、回動モータ、直動モータ、リニアモータ、単軸ロボット、多関節ロボット等の電動機器、エアシリンダ、油圧シリンダ、ロッドレスシリンダおよびロータリシリンダ等のアクチュエータ等を採用することができる上、それらを直接的または間接的に組み合せたものを採用することもできる(実施形態で例示したものと重複するものもある)。
The means in the present invention is not limited in any way as long as the operations and functions described for these means can be achieved, and moreover, the means in the present invention are not limited to the structure of the simple embodiment described in the above embodiment. Absent. For example, if the holding means can hold the holding area outside the sticking area where the plate-like member is stuck on the adhesive sheet, it is in the technical scope in light of the common general technical knowledge at the beginning of the application. There is no limitation at all (the description of other means is omitted).
The drive device in the embodiment includes an electric device such as a rotation motor, a linear motion motor, a linear motor, a single axis robot, an articulated robot, an actuator such as an air cylinder, a hydraulic cylinder, a rodless cylinder, and a rotary cylinder. In addition to the above, it is possible to adopt a combination of them directly or indirectly (some of them overlap with those exemplified in the embodiment).

10…離間装置
20…保持手段
30…当接手段
33B…エッジ部
33C…エッジ形成部材
40…張力付与手段
50…測定手段
AS…接着シート
AS1…貼付領域
AS2…保持領域
CP…チップ(片状体)
WF…ウエハ(板状部材)
DESCRIPTION OF SYMBOLS 10 ... Separating device 20 ... Holding means 30 ... Contact means 33B ... Edge part 33C ... Edge forming member 40 ... Tension applying means 50 ... Measuring means AS ... Adhesive sheet AS1 ... Adhering area AS2 ... Holding area CP ... Chip (strip-shaped body) )
WF ... Wafer (plate member)

Claims (4)

板状部材が貼付された接着シートに張力を付与して当該板状部材から形成される複数の片状体の相互間隔を広げる離間装置であって、
前記接着シートにおける前記板状部材が貼付された貼付領域の外側の保持領域を保持する保持手段と、
外縁部がエッジ部とされた複数のエッジ形成部材を有する当接手段と、
前記接着シートをエッジ形成部材に当接させ、前記保持手段と当接手段とを相対移動させることで、当該接着シートにおける前記貼付領域と保持領域との間を前記エッジ部で折り曲げて当該接着シートに張力を付与する張力付与手段とを備え、
前記当接手段は、前記エッジ形成部材を前記板状部材の面に沿って相互に離間可能に設けられていることを特徴とする離間装置。
A separation device that applies tension to the adhesive sheet to which the plate-like member is attached to widen the interval between a plurality of pieces formed from the plate-like member,
Holding means for holding a holding region outside the pasting region to which the plate-like member is pasted in the adhesive sheet;
A contact means having a plurality of edge forming members whose outer edge portions are edge portions;
The adhesive sheet is brought into contact with an edge forming member, and the holding means and the contact means are moved relative to each other to bend the gap between the pasting area and the holding area of the adhesive sheet at the edge portion. A tension applying means for applying tension to the
The said contact means is provided so that the said edge formation member can be mutually spaced apart along the surface of the said plate-shaped member, The separation apparatus characterized by the above-mentioned.
前記当接手段は、前記エッジ部を前記保持手段の内縁部よりも外方に移動可能に設けられていることを特徴とする請求項1に記載の離間装置。   The spacing device according to claim 1, wherein the abutting means is provided so that the edge portion can move outward from the inner edge portion of the holding means. 前記片状体の相互間隔を測定する測定手段を備え、
前記当接手段は、前記測定手段の測定結果を基に前記接着シートに対して部位別にエッジ形成部材を移動可能に設けられていることを特徴とする請求項1または請求項2に記載の離間装置。
Comprising a measuring means for measuring the distance between the pieces,
The spacing according to claim 1 or 2, wherein the abutting means is provided such that an edge forming member can be moved for each part with respect to the adhesive sheet based on a measurement result of the measuring means. apparatus.
板状部材が貼付された接着シートに張力を付与して当該板状部材から形成される複数の片状体の相互間隔を広げる離間方法であって、
前記接着シートにおける前記板状部材が貼付された貼付領域の外側の保持領域を保持する工程と、
外縁部がエッジ部とされた複数のエッジ形成部材を前記接着シートに当接させ、前記保持領域とエッジ形成部材とを相対移動させることで、当該接着シートにおける前記貼付領域と保持領域との間を前記エッジ部で折り曲げて当該接着シートに張力を付与する工程と、
前記エッジ形成部材を前記板状部材の面に沿って相互に離間させる工程とを備えていることを特徴とする離間方法。
A separation method that applies tension to the adhesive sheet to which the plate-like member is attached to increase the interval between the plurality of pieces formed from the plate-like member,
Holding the holding region outside the pasting region to which the plate-like member is pasted in the adhesive sheet;
A plurality of edge forming members whose outer edge portions are edge portions are brought into contact with the adhesive sheet, and the holding area and the edge forming member are moved relative to each other, so that the area between the pasting area and the holding area in the adhesive sheet is reduced. Bending the edge part to apply tension to the adhesive sheet;
And a step of separating the edge forming members from each other along the surface of the plate-like member.
JP2014260999A 2014-12-24 2014-12-24 Separation device and separation method Pending JP2016122708A (en)

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JP7494067B2 (en) 2020-09-14 2024-06-03 キオクシア株式会社 Semiconductor device manufacturing method and semiconductor manufacturing device

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JP2007103649A (en) * 2005-10-04 2007-04-19 Lintec Corp Method and device for controlling expand device
US20140339673A1 (en) * 2013-05-14 2014-11-20 Texas Instruments Incorporated Wafer processing

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Publication number Priority date Publication date Assignee Title
JP2007103649A (en) * 2005-10-04 2007-04-19 Lintec Corp Method and device for controlling expand device
US20140339673A1 (en) * 2013-05-14 2014-11-20 Texas Instruments Incorporated Wafer processing

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7494067B2 (en) 2020-09-14 2024-06-03 キオクシア株式会社 Semiconductor device manufacturing method and semiconductor manufacturing device

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