WO2006095479A1 - 高周波回路デバイス,高周波モジュール及び通信装置 - Google Patents
高周波回路デバイス,高周波モジュール及び通信装置 Download PDFInfo
- Publication number
- WO2006095479A1 WO2006095479A1 PCT/JP2005/022338 JP2005022338W WO2006095479A1 WO 2006095479 A1 WO2006095479 A1 WO 2006095479A1 JP 2005022338 W JP2005022338 W JP 2005022338W WO 2006095479 A1 WO2006095479 A1 WO 2006095479A1
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- WIPO (PCT)
- Prior art keywords
- slot line
- frequency
- circuit device
- stub
- frequency circuit
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/64—Impedance arrangements
- H01L23/66—High-frequency adaptations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/20—Frequency-selective devices, e.g. filters
- H01P1/201—Filters for transverse electromagnetic waves
- H01P1/2016—Slot line filters; Fin line filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
Definitions
- High frequency circuit device high frequency module and communication device
- the present invention relates to a high-frequency circuit device, a high-frequency module, and a communication device that use a slot line that transmits a high-frequency signal such as a microwave or a millimeter wave.
- Patent Document 1 Japanese Patent Laid-Open No. 08-265007
- Patent Document 2 Japanese Patent Laid-Open No. 2004-007349
- the conventional high-frequency circuit device using the PDTL type line has the following problems.
- FIG. 22 is a schematic cross-sectional view for explaining problems of the conventional high-frequency circuit device.
- slot lines 111 and 112 having substantially the same shape are formed on both surfaces of the dielectric substrate 100, and the same high frequency signal is sent to both slot lines 111 and 112.
- the present invention has been made to solve the above-described problems, and prevents high-frequency circuit devices, high-frequency modules, and communication apparatuses that prevent generation of unnecessary waves and avoid power loss and unnecessary coupling.
- the purpose is to provide.
- the invention of claim 1 is characterized in that a first slot line composed of a spacing line between electrodes disposed opposite to the surface of the substrate and an electrode disposed opposite to the back surface of the substrate.
- a high-frequency circuit device comprising a second slot line, which is formed of a plurality of spaced lines, and opposed to the first slot line, and an electric element interposed in the first slot line, the high-frequency signal propagating through the second slot line
- a phase adjustment unit for adjusting the phase to be approximately the same as the phase of the high-frequency signal propagating through the first slot line is provided in the second slot line.
- the same high-frequency signal can be propagated to the first slot line and the second slot line.
- the high-frequency signal propagating through the first slot line is subjected to predetermined processing by an electrical element interposed in the first slot line.
- the electric element is interposed in the first slot line, there may be a phase difference between the high-frequency signal propagating through the first slot line and the high-frequency signal propagating through the second slot line.
- the phase adjustment unit provided in the second slot line is used to adjust the phase of the high-frequency signal propagating through the second slot line to be approximately the same as the phase of the high-frequency signal propagating through the first slot line. Can be adjusted. As a result, unnecessary waves generated in the substrate due to the phase difference can be suppressed.
- the invention of claim 2 is the high-frequency circuit device according to claim 1, wherein the phase adjustment unit is a stub that branches off the second slot line force.
- the phase of the high-frequency signal propagating through the second slot line is substantially the same as the phase of the high-frequency signal propagating through the first slot line. It can be adjusted to the same phase.
- the invention of claim 3 is the high-frequency circuit device according to claim 2, wherein the stub is a straight short stub having a predetermined length.
- the invention of claim 4 is the high-frequency circuit device according to any one of claims 1 to 3, wherein the phase adjustment unit is connected between both electrodes so as to straddle the second slot line.
- the electrode line has a fixed length.
- the phase of the high-frequency signal propagating through the second slot line can be adjusted to substantially the same phase as the phase of the high-frequency signal propagating through the first slot line.
- the invention of claim 5 is the high-frequency circuit device according to any one of claims 1 to 4, wherein the phase adjustment unit is a portion of the second slot line, and the electrical element is interposed. It is set as the structure provided in the site
- a high-frequency module according to the invention of claim 6 includes the high-frequency circuit device according to any one of claims 1 to 5.
- a communication device includes the high-frequency module according to the sixth aspect.
- the invention of claim 8 is the communication apparatus according to claim 7, wherein the communication apparatus is a radar apparatus.
- the phase adjustment unit converts the phase of the high-frequency signal propagating through the second slot line to the first slot line.
- the phase By adjusting the phase to be approximately the same as the phase of the high-frequency signal propagating through the substrate, unnecessary waves generated in the substrate can be suppressed, so that generation of unnecessary waves can be prevented and power loss can be reduced. It is possible to prevent unnecessary waves from leaking outside the board and unnecessarily coupling with external devices around. As a result, the characteristics of the high-frequency circuit device itself can be improved, the designability can be improved, and the variation in characteristics can be reduced.
- the length and shape of the stub are set.
- the phase of the high-frequency signal propagating through the second slot line can be adjusted to approximately the same phase as the phase of the high-frequency signal propagating through the first slot line, so that the generation of unnecessary waves can only be suppressed. It is possible to improve the design characteristics of the transmission characteristics of the second slot line.
- the high frequency that propagates through the second slot line by the electrode line straddling the second slot line without using a stub that requires a large arrangement space Since the signal phase can be adjusted, the high-frequency circuit device itself can be miniaturized. In addition, since the isolation on the second slot line side is improved, it is possible to improve the device characteristics and improve the design.
- the operating characteristics of the high-frequency module and the communication device can be improved, and the variation in characteristics can be reduced.
- the design of these devices can be improved.
- FIG. 1 is a perspective view showing a high-frequency circuit device according to a first embodiment of the present invention.
- FIG. 2 is an exploded perspective view of the high-frequency circuit device shown in FIG.
- FIG. 3 is a plan view showing the surface side of the high-frequency circuit device.
- FIG. 4 is a plan view showing the back side of the high-frequency circuit device.
- FIG. 5 is a diagram showing a gain of a high-frequency circuit device having no stub.
- FIG. 6 is a diagram showing the calculated value of the leakage loss estimation with respect to the stub length.
- FIG. 7 is a diagram showing the gain of a high-frequency circuit device having a stub having a length of 400 ⁇ m.
- FIG. 8 is an exploded perspective view showing a part of the high-frequency circuit device according to the second embodiment of the present invention.
- FIG. 9 is an exploded perspective view showing a part of the high-frequency circuit device according to the third embodiment of the present invention.
- FIG. 10 is an exploded perspective view showing a part of the high-frequency circuit device according to the fourth embodiment of the present invention.
- FIG. 11 is a plan view showing the back side of the high-frequency circuit device of this example.
- FIG. 12 is a diagram showing the gain of a high-frequency circuit device having electrode lines.
- FIG. 13 is a plan view showing a back surface side that is a main part of a high-frequency circuit device according to a fifth embodiment of the present invention.
- FIG. 14 is a diagram showing calculated values of leakage loss estimation with respect to stub length.
- FIG. 15 is an exploded perspective view showing a part of the high-frequency oscillation circuit according to the sixth embodiment of the present invention.
- FIG. 16 is an exploded perspective view showing a high frequency module according to a seventh embodiment of the present invention.
- FIG. 17 is a block diagram of a high-frequency module.
- FIG. 18 is a perspective view showing a main part of a communication device including a high-frequency module according to the seventh embodiment.
- FIG. 19 is a block diagram of a communication device.
- FIG. 20 is a plan view showing the back side of a high-frequency circuit device according to a modification.
- FIG. 21 is a plan view showing the back side of a high-frequency circuit device according to another modification.
- FIG. 22 is a schematic cross-sectional view for explaining problems of the conventional high-frequency circuit device. Explanation of symbols
- Receiver circuit 85 ⁇ ⁇ Oscillation Circuit, 86 ... Package, 87 ... Lid, 88 ... Parasitic antenna, 89 ... Blocking plate, D ... Drain electrode, G ... Gate electrode, Ml, ⁇ 2 ... High-frequency signal, S ... Source electrode.
- FIG. 1 is a perspective view showing a high-frequency circuit device according to a first embodiment of the present invention
- FIG. 2 is an exploded perspective view of the high-frequency circuit device shown in FIG. 1
- FIG. 3 is a high-frequency circuit.
- FIG. 4 is a plan view showing the front side of the chair, and FIG. 4 is a plan view showing the back side of the high-frequency circuit device.
- the high-frequency circuit device 1 of this embodiment is an amplifier circuit device, and includes a first slot line 3 and a second slot line 4 provided on both surfaces of the dielectric substrate 2, respectively. And a field effect transistor element (hereinafter referred to as “FET”) 5 as an electric element.
- FET field effect transistor element
- the first slot line 3 is composed of a spacing line between a pair of electrodes 31 and 32 disposed to face the surface 2 a of the dielectric substrate 2. Specifically, as shown in FIG. 2, the first slot line 3 having a width W is obtained by forming the electrodes 31 and 32 on the dielectric substrate 2 at intervals W. And the stub 3a is the electrode 31, and is recessed in the mounting part of FET5 mentioned later. This stub 3a is an isolation stub, and its length is set to 1Z4 of the wavelength of the high-frequency signal Ml to be propagated to the first slot line 3.
- the second slot line 4 is composed of a spacing line between a pair of electrodes 4 1 and 42 disposed opposite to the back surface 2 b of the dielectric substrate 2.
- the second slot line 4 faces the first slot line 3. That is, the electrodes 41 and 42 are formed below the dielectric substrate 2 with a spacing W, and the stub 4a having the same length and the same shape as the isolation stub 3a of the first slot line 3 is formed at a portion facing the stub 3a. Yes.
- the FET 5 is an element that functions as an active element such as an amplifying element, and is interposed in the first slot line 3 as shown in FIG. Specifically, the FET 5 has a drain electrode D, a gate electrode G, and a source electrode S on the back surface, the source electrode S is connected to the electrode 32, and the drain electrode D and the gate electrode G are connected to the stub for isolation. It is mounted in a state where it is connected to the electrode 31 so as to straddle 3a.
- the second slot line 4 is provided with a stub 6 as a phase adjustment unit.
- the phase of the high-frequency signal M2 propagating through the second slot line 4 is adjusted to be substantially the same as the phase of the high-frequency signal Ml propagating through the first slot line 3.
- the stub 6 is a straight short stub having a length L as shown in FIG.
- the positional force of the stub 4a of the slot line 4 also branches to the opposite side of the stub 4a.
- the stub 6 is positioned almost directly behind the FET 5, and thus the phase of the high-frequency signal M 2 propagating through the second slot line 4 can be adjusted by changing the length L of the stub 6.
- the length L of the stub 6 is changed to adjust the phase of the high-frequency signal M2 propagating through the second slot line 4 so that it is in phase with the phase of the high-frequency signal Ml of the first slot line 3. Therefore, there is no phase difference. As a result, unnecessary waves generated in the dielectric substrate 2 are suppressed, so that it is possible to prevent power loss due to the generation of unnecessary waves and unnecessary coupling with surrounding external devices.
- a dielectric having a dielectric constant of 24 is used as the dielectric substrate 2 in length (length direction of the first slot line 3) 8.03 mm in width (first slot line). (Width direction of 3) 6.
- the distance between the first slot lines 3 was set to 10 m and the distance between the second slot lines 4 was set to 100 m.
- GS type FET was used as FET5.
- the length L of the stub 6 was set to “Omm”. In other words, for a high-frequency circuit device that does not have a stub 6, a high-frequency signal with a frequency ranging from 54 GHz to 66 GHz was propagated and its gain was calculated.
- FIG. 5 is a diagram showing the gain of a high-frequency circuit device without a stub.
- the high-frequency circuit device without the stub 6 generates periodic ripples as indicated by points, p ′ and pi in the range of 54 GHz to 66 GHz.
- the period and point between points p-p! -v 'period is about 3.7GHz
- the wavelength corresponds to the length of the dielectric substrate 2.
- the period between points pi-pi is about 4.5 GHz, and the wavelength corresponds to the width of the dielectric substrate 2. That is, this is presumed that an unnecessary wave is generated in the dielectric substrate 2, and the unnecessary ripples resonate in the dielectric substrate 2, thereby causing the ripple as described above.
- the length L of the stub 6 was set to a predetermined length, a high-frequency signal having a frequency in the range of 54 GHz to 66 GHz was propagated, and the gain was calculated.
- an estimate (Q conversion value) of the leakage loss with respect to the length of the stub 6 was calculated.
- Fig. 6 is a diagram showing the calculated value of the leakage loss with respect to the length of the stub 6, and the curve S1 is the calculated value of the high-frequency circuit device used in this simulation.
- the length L of the stub 6 that maximizes the calculated value was 400 m. Therefore, the length L of stub 6 was set to 400 m and the gain of the high-frequency circuit device was calculated.
- FIG. 7 is a diagram showing the gain of a high frequency circuit device having a 400 m long stub.
- FIG. 8 is an exploded perspective view showing a part of the high-frequency circuit device according to the second embodiment of the present invention.
- the high-frequency circuit device 1 of this example has a stagger as a phase adjustment unit.
- the shape of the hub was made different from the shape of the stub 6 of the first embodiment.
- the circular short stub 61 was formed at the position of the stub 4a. Then, by adjusting the diameter of the short stub 61, the phase of the high-frequency signal M2 propagating through the second slot line 4 is adjusted! /.
- FIG. 9 is an exploded perspective view showing a part of the high-frequency circuit device according to the third embodiment of the present invention.
- the shape of the stub as the phase adjustment unit is made different from the shape of the stubs 6 and 61 of the first and second embodiments.
- a tapered short stub 62 is formed at the position of the stub 4a.
- the short stub 62 is set so that the branching portion with the second slot line 4 is set narrow and widens toward the tip end side.
- the phase of the high-frequency signal M2 propagating through the second slot line 4 can be adjusted by adjusting the expansion angle of the short stub 62, the protruding length from the second slot line 4, and the like.
- a fan-shaped short stub formed at the position of the stub 4a can be presented.
- FIG. 10 is an exploded perspective view showing a part of the high-frequency circuit device according to the fourth embodiment of the present invention
- FIG. 11 is a rear view of the high-frequency circuit device of this embodiment. It is a top view which shows the side.
- the high-frequency circuit device 1 of this embodiment is different from the first to third embodiments in that the electrode line 63 is used as a phase adjusting unit.
- an electrode line 63 having a predetermined length was connected between the electrodes 41 and 42 so as to straddle the second slot line 4. Specifically, the bridge-shaped electrode line 63 is passed to the portion directly behind FET5 in the second slot line 4 and corresponding to the drain electrode D and source electrode S of the FET5, and the corresponding portion is short-circuited. did.
- the phase of the high-frequency signal M2 propagating through the second slot line 4 is adjusted to be approximately the same as the phase of the high-frequency signal Ml propagating through the first slot line 3 by adjusting the length of the electrode line 63. can do. As a result, the generation of unnecessary waves can be suppressed.
- FIG. 12 is a diagram showing the gain of a high-frequency circuit device having electrode lines.
- the phase adjustment is performed using the stubs 6, 61, 62 that require a relatively large arrangement space.
- the second slot line is used. Since the phase is adjusted by the electrode line 63 straddling 4, the high-frequency circuit device 1 itself can be downsized. Further, since the isolation on the second slot line 4 side is improved, it is possible to obtain the effects of improving the device characteristics and improving the design. Other configurations, operations, and effects are the same as those in the first to third embodiments, and thus description thereof is omitted.
- FIG. 13 shows the back side, which is the main part of the high-frequency circuit device according to the fifth embodiment of the invention.
- FIG. Fig. 14 is a diagram showing the calculated value of the leakage loss estimate with respect to the stub length.
- the vertical axis represents the reciprocal of the insertion loss, which is the calculated value for the high-frequency circuit device of the example of the curve S2 force.
- This embodiment is different from the above-described fourth embodiment in that the second slot line 4 is provided with the stub 6 in addition to the electrode line 63.
- the electrode line 63 having a predetermined length was connected between the electrodes 41 and 42 so as to straddle the second slot line 4, and the stub 6 was formed at the position of the stub 4a. Specifically, the portion directly behind FET 5 in the second slot line 4, the portion corresponding to the drain electrode D and the source electrode S of the FET 5 is short-circuited by the electrode line 63, and the high frequency is generated by the stub 6. The signal M2 is reflected.
- the length L of the stub 6 that minimizes the calculated leakage loss was about 300 ⁇ m.
- a circular or elliptical short stub, or a taper or fan-shaped short stub may be presented. it can.
- FIG. 15 is an exploded perspective view showing a part of the high-frequency oscillation circuit according to the sixth embodiment of the present invention.
- This embodiment shows an example in which a high-frequency circuit device is applied to a high-frequency oscillation circuit.
- the high-frequency oscillation circuit 7 transmits a high-frequency signal having a predetermined resonance frequency generated by the dielectric resonator 70 to the first and second slot lines 3 and 4, and amplifies it by the FET 5 and outputs it. It is.
- DC cut lines 71 and 72 are formed on the electrode 32 on the surface side of the dielectric substrate 2 to define the DC electrode 32a. Then, the gate electrode G of FET5 is connected to the DC electrode 32a, the drain electrode D is connected to the electrode 32 located on the right side of the DC cut line 71, and The source electrode S is connected to the electrode 31.
- DC cut lines 71 /, 12 ' are also formed in the second slot line 4 on the back side of the dielectric substrate 2, and a straight stub 6 for phase adjustment projects from the position of the DC cut line 71 /. ing.
- FIG. 16 is an exploded perspective view showing a high-frequency module according to a seventh embodiment of the present invention
- FIG. 17 is a block diagram of the high-frequency module.
- the high-frequency module 8 of this embodiment includes divided boards 81 to 85 on which circuits are formed, and a package 86 that houses these divided boards 81 to 85.
- Each of the divided boards 81 to 85 is a circuit board having a PDTL structure, and each of the divided boards 81 to 85 includes, as circuit blocks, an antenna circuit 81A, a duplexer circuit 82A, a transmission circuit 83A, a reception circuit 84A, Each oscillation circuit 85A is formed.
- the antenna circuit 81 A formed on the divided substrate 81 is a block that transmits a transmission radio wave and receives a reception radio wave, and includes a radiation slot 81a.
- the duplexer circuit 82A formed on the divided substrate 82 is a block that is connected to the antenna circuit 81A to form an antenna duplexer, and includes a resonator 82a and the like.
- the transmission circuit 83A formed on the divided substrate 83 is a block that is connected to the duplexer circuit 82A and outputs a transmission signal toward the antenna circuit 81A.
- the power amplifier 83c is a high-frequency amplifier circuit.
- the receiving circuit 84A formed on the dividing board 84 is a block for inputting a received signal received by the antenna circuit 81A connected to the duplexer circuit 82A, and a low-noise amplifier 84a as a high-frequency amplifier circuit and a band-pass It consists of a filter 84b and a mixer 84c as a mixer circuit. It is.
- the oscillation circuit 85A formed on the divided substrate 85 is a block that is connected to the transmission circuit 83A and the reception circuit 84A and oscillates a signal of a predetermined frequency serving as a carrier wave, and has the same structure as the high-frequency oscillator of the sixth embodiment. is there.
- a package 86 is a resin package that has been subjected to metallization treatment of a conductive metal material, and the divided substrates 81 to 85 are accommodated therein.
- the lid 87 attached on the package 86 has an opening 87a at the center thereof, and an electromagnetic wave transmitting blocking plate 89 having a parasitic antenna 88 is attached in the opening 87a.
- the parasitic antenna 88 faces the radiation slot 81a on the divided substrate 81.
- reference numeral 86a is an input terminal for inputting an intermediate frequency signal to the transmission circuit 83A
- reference numeral 86b is an output terminal for outputting the intermediate frequency signal from the reception circuit 84A. is there.
- the high-frequency oscillation circuit of the sixth embodiment is applied to the oscillation circuit 85A.
- the stub 6 for phase adjustment is provided on the back side of the divided substrate 85 of the oscillation circuit 85A, but the divided substrate 83 of the transmission circuit 83A that has a mixer 83a and a power amplifier 83c and needs to be provided with an FET.
- a stub 6 for phase adjustment is provided on the divided substrate 84 of the receiving circuit 84A that has a low-noise amplifier 84a and a mixer 84c and needs to be provided with an FET, and a high-frequency signal that propagates through these circuits. It is preferable to match the phases.
- FIG. 18 is a perspective view illustrating a main part of a communication device including the high-frequency module according to the seventh embodiment
- FIG. 19 is a block diagram of the communication device.
- reference numeral 90 is a substrate, and the high-frequency module 8 and the BB (baseband) chip 9 of the seventh embodiment are mounted on the substrate 90.
- the BB chip 9 functions as the BB section due to the power applied, and the intermediate-frequency baseband signal modulated by the BB chip 9 is output from the output terminal 91 via the input terminal 86a. Input to the control 8 (functions as the RF section). Then, the baseband signal of the intermediate frequency is converted to a predetermined high frequency by the transmission circuit 83A and transmitted as a radio wave from the parasitic antenna 88. The received signal received by the parasitic antenna 88 and converted to the intermediate frequency by the receiving circuit 84A is output from the output terminal 86b to the input terminal 92 of the BB chip 9. Then, the received signal power is demodulated into a predetermined baseband signal in the B chip 9.
- the high-frequency module 8 of the above-described embodiment it is possible to provide a communication device having high reliability with respect to operation characteristics and less variation in characteristics. In addition, the design of these devices can be improved.
- a mobile phone or other communication device including the high-frequency module 8 and the BB chip 9 has been described as an example.
- a signal processing unit instead of the BB chip 9, a mimic can be obtained.
- the present invention can also be applied to a radar apparatus that transmits and receives a high frequency signal in a re-band.
- the phase adjustment stubs 6, 61, 62 are formed at the same position as the isolator stub 4a of the second slot line 4, but as shown in FIG.
- the stub 6 may be formed by being displaced from the stub 4a.
- the electrode line 63 for phase adjustment is formed at the same position as the stub 4a for isolator of the second slot line 4. However, as shown in FIG. Of course, it may be formed by being displaced from the stub 4a.
- the intervals W between the first slot line 3 and the second slot line 4 are set equal, but the width of the first slot line 3 is made smaller than that of the second slot line 4 or vice versa.
- the line widths of the first and second slot lines 3 and 4 may be made different.
- the high-frequency circuit device is applied to the high-frequency oscillation circuit.
- the high-frequency amplifier circuit and the mixer circuit applied to the high-frequency module of the seventh embodiment are also applicable to the present invention.
- a high-frequency circuit device can be applied.
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
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Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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JP2007506991A JP4356116B2 (ja) | 2005-03-10 | 2005-12-06 | 高周波回路デバイス,高周波モジュール及び通信装置 |
US11/830,976 US7365618B2 (en) | 2005-12-06 | 2007-07-31 | High-frequency circuit device, high-frequency module, and communication apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2005-067685 | 2005-03-10 | ||
JP2005067685 | 2005-03-10 |
Related Child Applications (1)
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US11/830,976 Continuation-In-Part US7365618B2 (en) | 2005-12-06 | 2007-07-31 | High-frequency circuit device, high-frequency module, and communication apparatus |
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WO2006095479A1 true WO2006095479A1 (ja) | 2006-09-14 |
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PCT/JP2005/022338 WO2006095479A1 (ja) | 2005-03-10 | 2005-12-06 | 高周波回路デバイス,高周波モジュール及び通信装置 |
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WO (1) | WO2006095479A1 (ja) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58189604U (ja) * | 1982-06-09 | 1983-12-16 | 三菱電機株式会社 | フインラインダイオ−ドスイツチ |
JPH10242717A (ja) * | 1997-02-27 | 1998-09-11 | Murata Mfg Co Ltd | 平面誘電体集積回路 |
JPH10335909A (ja) * | 1997-06-05 | 1998-12-18 | Murata Mfg Co Ltd | 非放射性平面誘電体線路およびその集積回路 |
-
2005
- 2005-12-06 WO PCT/JP2005/022338 patent/WO2006095479A1/ja not_active Application Discontinuation
- 2005-12-06 JP JP2007506991A patent/JP4356116B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58189604U (ja) * | 1982-06-09 | 1983-12-16 | 三菱電機株式会社 | フインラインダイオ−ドスイツチ |
JPH10242717A (ja) * | 1997-02-27 | 1998-09-11 | Murata Mfg Co Ltd | 平面誘電体集積回路 |
JPH10335909A (ja) * | 1997-06-05 | 1998-12-18 | Murata Mfg Co Ltd | 非放射性平面誘電体線路およびその集積回路 |
Non-Patent Citations (2)
Title |
---|
OHTA Y. ET AL.: "Analysis of CPW Angular Bends by Spatial Network Method", PROCEEDINGS OF THE 1994 IEICE FALL CONFERENCE, 5 September 1994 (1994-09-05), XP002996560 * |
SAKAMOTO K., MIKAMI S., ISHIKAWA Y.: "Proposal of Millimeter-Wave RF Module Utilizing High-Dielectric Substrate", PROCEEDINGS OF THE 2003 IEICE GENERAL CONFERENCE, 3 March 2003 (2003-03-03), XP002996561 * |
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JPWO2006095479A1 (ja) | 2008-08-14 |
JP4356116B2 (ja) | 2009-11-04 |
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