Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S5/00—Semiconductor lasers
  • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
  • H01S5/14—External cavity lasers
  • H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
  • H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
  • H01S3/1062—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using a controlled passive interferometer, e.g. a Fabry-Perot etalon
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S5/00—Semiconductor lasers
  • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
  • H01S5/0607—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying physical parameters other than the potential of the electrodes, e.g. by an electric or magnetic field, mechanical deformation, pressure, light, temperature
  • H01S5/0612—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying physical parameters other than the potential of the electrodes, e.g. by an electric or magnetic field, mechanical deformation, pressure, light, temperature controlled by temperature
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S5/00—Semiconductor lasers
  • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
  • H01S5/0617—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium using memorised or pre-programmed laser characteristics
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S5/00—Semiconductor lasers
  • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
  • H01S5/068—Stabilisation of laser output parameters
  • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S5/00—Semiconductor lasers
  • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
  • H01S5/068—Stabilisation of laser output parameters
  • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
  • H01S5/0687—Stabilising the frequency of the laser

Definitions

• the present invention relates to a laser module and a wavelength control method for an external resonant laser.
• the peak wavelength of light transmitted through the etalon is changed by changing the inclination of the wavelength selecting etalon.
• one peak wavelength of the etalon transmitted light falls within the effective gain of the semiconductor optical amplifier.
• the output wavelength of the semiconductor optical amplifier is determined by the peak wavelength of the etalon transmitted light.
• Patent Document 1 Japanese Patent Application Laid-Open No. 2003-152275
• the free spectral width (FSR) of the etalon is increased so that one peak wavelength of the etalon transmitted light falls within the effective gain of the semiconductor optical amplifier. Then, the half width of the etalon transmitted light peak is widened. On the other hand, if the free spectral width of the etalon is reduced in order to narrow the half-value width of the etalon transmitted light peak, a plurality of etalon transmitted light peaks within the effective gain of the semiconductor optical amplifier are obtained. As a result, the output wavelength selection accuracy of the semiconductor optical amplifier is degraded.
• An object of the present invention is to provide a laser module, an optical communication device, a laser module control device, laser module control data, and an external resonant laser wavelength control method with good output light wavelength selection accuracy.
• a laser module includes an optical amplifier and a periodic wavelength peak in transmission characteristics.
• the periodic wavelength peak is variable, functions as an external mirror of the first etalon that transmits light of the optical amplifier power and an external resonant laser including the optical amplifier, and the optical amplifier has an effective
• a wavelength selection mirror having a relatively high reflection intensity for a part of the wavelengths in the gain band is provided.
• the light is amplified by the optical amplifier, the light having the optical amplifier power has a periodic wavelength peak by the first etalon, and a part of the effective gain band is obtained by the wavelength selection mirror. Is reflected.
• the peak wavelength of the light transmitted through the first etalon is limited by the wavelength selection mirror. Therefore, the wavelength selection accuracy of the output light of the laser module according to the present invention is improved.
• the wavelength selection mirror may be formed by laminating a plurality of dielectrics having a thickness of substantially 1Z4 having a center wavelength of desired reflected light. In this case, light having a desired center wavelength is reflected by the wavelength selection mirror. Thereby, the wavelength selection accuracy of the output light of the laser module according to the present invention is improved.
• the periodic wavelength peak of the first etalon may be changed by changing the inclination of the first etalon with respect to the incident light.
• light having a desired peak wavelength can be reflected by the wavelength selection mirror.
• the first etalon includes a liquid crystal whose refractive index changes according to an applied voltage, and the periodic wavelength peak of the first etalon may change depending on the voltage applied to the liquid crystal.
• light having a desired peak wavelength can be reflected by the wavelength selection mirror by applying a voltage to the first etalon.
• a plurality of periodic wavelength peaks of the first etalon may exist within the effective gain of the optical amplifier.
• the reflection bandwidth at which the wavelength selective mirror has a relatively high reflection intensity may be smaller than twice the interval between the periodic wavelength peaks of the first etalon.
• the etalon peak reflected by the reflection selective mirror can be made one by changing the wavelength of the etalon peak. This improves the wavelength selection accuracy of the laser module according to the present invention.
• the transmission characteristic has a periodic wavelength peak
• a second etalon may be further provided.
• the periodic wavelength peak of the second etalon may be constant or variable. In this case, the wavelength selection accuracy can be further improved by using the first etalon and the second etalon.
• the period of the periodic wavelength peak of the second etalon may be different from the period of the periodic wavelength peak of the first etalon. In this case, the full width at half maximum of the peak wavelength of the light transmitted through the first etalon and the second etalon is reduced. Thereby, the wavelength selection accuracy can be further improved.
• the optical amplifier may be a semiconductor optical amplifier! Further, a phase adjuster may be provided between the optical amplifier and the wavelength selection mirror to control the phase of the transmitted light by changing the refractive index. In this case, the peak wavelength of light transmitted through the first etalon and the second etalon can be adjusted. As a result, the wavelength selection accuracy can be further improved.
• the phase adjuster may be composed of a semiconductor integrated with the optical amplifier. Further, a temperature control device in which the optical amplifier, the wavelength selection mirror, and the first etalon are arranged may be further provided. In this case, the temperatures of the optical amplifier, the wavelength selection mirror, and the etalon can be kept constant. Thereby, the wavelength selection accuracy can be further improved.
• a wavelength detection unit that detects the output wavelength of the external resonance laser may be further provided, and the refractive index of the phase adjuster may change according to the detection result of the wavelength detection unit.
• the peak wavelength of the light transmitted through the first etalon and the second etalon can be accurately adjusted. Thereby, the wavelength selection accuracy can be further improved.
• a shirter that transmits and blocks output light may be further provided.
• the shatter includes a liquid crystal and may transmit and block output light according to a voltage applied to the liquid crystal.
• the external output of unstable laser light can be stopped when adjusting the wavelength, output, phase, etc. of the laser light.
• the peak wavelength of light transmitted through the first etalon and the peak wavelength of light transmitted through the second etalon are one, and the peak wavelength of light transmitted through the first etalon is one. And at least part of the peak wavelength of the light transmitted through the second etalon. It may overlap. In this case, the full width at half maximum of the peak wavelength of the light transmitted through the first etalon and the second etalon is reduced. Thereby, the wavelength selection accuracy can be further improved.
• An external resonant laser wavelength control method includes an optical amplifier, an etalon having a periodic wavelength peak in transmission characteristics and transmitting light of an optical amplifier power, and an optical amplifier.
• a wavelength control method for an external resonant laser which functions as an external mirror of an external resonant laser and includes a wavelength selective mirror having a relatively high reflection intensity for a part of the wavelength of the effective gain band of the optical amplifier, The laser oscillation is performed by controlling the etalon so that the periodic wavelength peak of the etalon exists within the band overlap range between the effective gain band of the optical amplifier and the reflection band of the wavelength selective mirror. Is.
• the wavelength control method for an external resonance laser light is amplified by an optical amplifier, the light of the optical amplifier power is given a periodic wavelength peak by an etalon, and an effective gain band is obtained by a wavelength selection mirror. A part of the wavelength is reflected, and the reflected light is output to the outside. Further, the etalon is controlled so that the transmission wavelength peak of the etalon exists within the band overlap range between the effective gain band of the optical amplifier and the reflection band of the wavelength selection mirror. In this case, the peak wavelength of light passing through the etalon is limited by the reflection of the wavelength selective mirror. Therefore, the wavelength selection accuracy of the output light is improved.
• Laser oscillation is performed by controlling the etalon so that one periodic wavelength peak of the etalon exists within a band overlap range between the effective gain band of the optical amplifier and the reflection band of the wavelength selective mirror. You may let them. In this case, the accuracy of selecting the wavelength of the light output from the external resonant laser camera is further improved.
• the intensity of the output light may be set to a desired value by detecting the intensity of the output light of the external resonance laser and controlling the gain of the optical amplifier based on the intensity of the output light. In this case, light having a desired light intensity can be output.
• the wavelength of the output light is controlled to a desired value by detecting the wavelength of the output light of the external resonance laser and controlling the refractive index in the external resonance laser based on the wavelength of the output light. Good. In this case, light having a desired wavelength can be output.
• Control of the refractive index in the external cavity laser controls the temperature of the etalon or optical amplifier. It may be done by doing. In this case, the peak wavelength of the output light can be adjusted accurately. Thereby, the wavelength selection accuracy can be further improved.
• the external resonant laser further includes a phase adjuster that controls the phase of transmitted light by changing the refractive index, and the refractive index in the external resonant laser may be controlled by the phase adjuster. Good. In this case, the peak wavelength of the output light can be adjusted accurately. Thereby, the wavelength selection accuracy can be further improved.
• FIG. 1 is a schematic diagram for explaining an optical communication apparatus according to a first example.
• FIG. 2 is a diagram for explaining laser light resonating in the laser module.
• FIG. 3 is a schematic diagram of a laser module according to a second embodiment.
• FIG. 4 is a diagram for explaining laser light resonating in the laser module.
• FIG. 5 is a schematic diagram of an optical communication device according to a third embodiment.
• FIG. 6 is a diagram for explaining laser light resonating in the laser module.
• FIG. 7 is a diagram illustrating another example of laser light that resonates in the laser module.
• FIG. 8 is a schematic diagram showing an overall configuration of an optical communication apparatus according to a fourth embodiment.
• FIG. 9 is a diagram illustrating laser light that resonates in the laser module.
• FIG. 10 is a diagram for explaining control data of a laser module.
• FIG. 1 is a schematic diagram for explaining an optical communication apparatus according to the first embodiment.
• FIG. 1A is an overall configuration diagram of the optical communication device
• FIG. 1B is a schematic cross-sectional view of the wavelength selection mirror 4.
• the laser module 100 includes a semiconductor optical amplifier 1, a lens 2, an etalon 3, and a wavelength selection mirror 4.
• Various controls are applied to this laser module 100.
• the control unit 5 By combining the control unit 5, the optical communication device of this embodiment is configured.
• the lens 2, the etalon 3, and the wavelength selection mirror 4 are sequentially arranged behind the semiconductor optical amplifier 1.
• the semiconductor optical amplifier 1 gives gain to input light having a predetermined effective wavelength band and outputs laser light.
• a mirror 6 is provided at the front of the semiconductor optical amplifier 1.
• the laser light output from the semiconductor optical amplifier 1 is reflected by the mirror 6 and emitted from the rear part of the semiconductor optical amplifier 1 to the lens 2.
• the lens 2 collimates incident light.
• the laser light emitted from the rear part of the semiconductor optical amplifier 1 is converted into parallel light and applied to the ethanol port 3.
• the etalon 3 also has a band-pass filter force that transmits light at a predetermined wavelength period. Thereby, the light incident on the etalon 3 is emitted from the etalon 3 as light having a wavelength peak of a predetermined period.
• the wavelength peak of the transmission wavelength of etalon 3 is called the etalon peak.
• the etalon 3 changes the wavelength of the etalon peak according to the inclination with respect to the incident light. Further, the etalon 3 changes the inclination with respect to the incident light according to the instruction of the control unit 5.
• the light transmitted through the etalon 3 is given to the wavelength selection mirror 4.
• the wavelength selection mirror 4 has a structure in which, for example, a plurality of dielectric films 4a made of silicon oxide and dielectric films 4b made of titanium oxide are laminated. If the center wavelength of the desired reflected light reflected by the wavelength selection mirror 4 is selected, the dielectric films 4a and 4b have a desired optical film thickness (for example, ⁇ 4). In this case, the light of wavelength ⁇ among the light incident on the interfaces of the dielectric films 4a and 4b reinforce each other. As a result, the reflectance of light of wavelength ⁇ increases. In addition, light having wavelengths near the wavelength among the light incident on the interfaces between the dielectric films 4a and 4b also strengthen each other. As a result, the wavelength selection mirror 4 reflects light in the wavelength band near the wavelength center. From the above, the wavelength selection mirror 4 reflects the laser beam in the desired wavelength range among the laser beams given from the lens 2.
• the wavelength selection mirror 4 only needs to have a high reflectance in a predetermined wavelength band and reflect substantially in the vicinity of the center wavelength ⁇ 4. Therefore, the combination of the dielectric films 4a and 4b can be arbitrarily modified. In this case, the dielectric films 4a and 4b constituting the wavelength selection mirror may have the same material force with different refractive indexes. Yes.
• the control unit 5 When receiving a wavelength selection command (not shown) for selecting a predetermined wavelength from the outside, the control unit 5 sets the inclination of the etalon 3 to select the wavelength.
• the force control unit 5 in which the inclination of the etalon 3 is set by the control unit 5 is not necessarily required.
• the user can set the etalon 3 slope.
• FIG. 2 is a diagram for explaining laser light that resonates in the laser module 100.
• Fig. 2 (a) is a diagram showing the wavelength width of the laser light emitted from the semiconductor optical amplifier 1
• Fig. 2 (b) is a diagram showing the transmission characteristics of the etalon 3
• Fig. 2 (c) is a wavelength selection diagram.
• FIG. 2 (d) is a diagram showing a wavelength peak of laser light resonating in the laser module 100.
• the horizontal axis indicates the wavelength of the laser beam
• the vertical axis indicates the gain of the semiconductor optical amplifier (SOA) 1.
• the vertical axis of (b) indicates the intensity of light transmitted through the etalon 3
• the vertical axis of FIG. 2 (c) indicates the intensity of light reflected by the wavelength selection mirror 4, and the vertical axis of FIG. 2 (d).
• the gain of the laser light emitted by the semiconductor optical amplifier 1 has a predetermined wavelength width.
• a wavelength width in a range that is equal to or greater than a predetermined gain value is called an effective gain band.
• the transmission wavelength of the etalon 3 has a plurality of peaks at a predetermined period. This period is called a free spectral width.
• the intensity of the laser beam reflected by the wavelength selection mirror 4 increases only within a predetermined reflection bandwidth R. It is configured as follows.
• the etalon peak included in the reflection bandwidth R can be made one, and the wavelength capable of resonating in the laser module 100 becomes one. From the above, the output wavelength selection accuracy of the laser module 100 is improved.
• the reflection bandwidth R of the selection mirror 4 is within the effective gain band of the semiconductor optical amplifier 1 is described.
• the wavelength selection mirror 4 is not affected even if the reflection bandwidth R is maximum. It may be configured to be less than twice the free spectral width of Ron-3.
• the etalon 3 is appropriately controlled so that an undesired etalon peak does not enter the reflection bandwidth R, the etalon peak included in the reflection bandwidth R can be made one. .
• the reflection bandwidth R is more than twice the free spectrum width of etalon 3, there will always be multiple etalon peaks of etalon 3 in both the effective gain band and reflection bandwidth R of semiconductor optical amplifier 1. .
• the wavelength width of the reflection bandwidth R can be set larger than twice the free spectral width.
• the thicknesses of the dielectric films 4a and 4b of the wavelength selection mirror 4 are combined so that the end of the reflection bandwidth R is outside the effective gain band of the semiconductor optical amplifier 1, and the reflection bandwidth R.
• the force using an etalon in which the wavelength of the etalon peak changes depending on the inclination with respect to the incident light is not limited thereto.
• an etalon whose etalon peak wavelength changes according to the applied voltage may be used, or an etalon whose etalon peak wavelength changes due to temperature change.
• the semiconductor optical amplifier 1 corresponds to an optical amplifier
• the etalon 3 corresponds to a first etalon or an etalon.
• FIG. 3 is a schematic diagram of a laser module 100a according to the second embodiment.
• the laser module 100a differs from the laser module 100 of FIG. 1 in that a fixed etalon 7 is provided instead of the etalon 3.
• the fixed etalon is an etalon having a constant refractive index.
• the fixed etalon 7 is fixed in the laser module 100a.
• Resonator length of the fixed E Talon 7, the etalon peak of the fixed etalon 7 is determined to be present in the reflection bandwidth R of the wavelength selective mirror 4.
• the inclination of the fixed etalon 7 is set so that one etalon peak of the fixed etalon 7 exists in the reflection bandwidth R of the wavelength selective mirror 4. Yes.
• FIG. 4 is a diagram for explaining laser light that resonates in the laser module 100a.
• 4A is a diagram showing the wavelength width of the laser light emitted by the semiconductor optical amplifier 1
• FIG. 4B is a diagram showing the transmission characteristics of the fixed etalon 7
• FIG. 4 is a diagram showing a wavelength band of laser light reflected by a selection mirror 4
• FIG. 4 (d) is a diagram showing a wavelength peak of laser light resonating in the laser module 10Oa.
• the horizontal axis indicates the wavelength of the laser beam
• the vertical axis indicates the gain of the semiconductor optical amplifier 1
• FIG. The vertical axis of Fig. 4 shows the intensity of light transmitted through the fixed etalon 7
• the vertical axis of Fig. 4 (c) shows the intensity of light reflected by the wavelength selection mirror 4
• the vertical axis of Fig. 4 (d) shows the laser module.
• the intensity of laser light resonating in 100a is shown.
• the fixed etalon 7 can be replaced with another fixed etalon having a different resonator length.
• the inclination of the fixed etalon 7 can be determined when the fixed etalon 7 is fixed to the laser module 100a.
• the output wavelength of the laser module 100a can be set arbitrarily. Note that the output wavelength of the laser module 100a can be adjusted by a temperature control device 60 described later.
• the fixed etalon 7 is fixed in the laser module 100a, a space for changing the inclination of the fixed etalon 7 and a driving device are not required. Therefore, the structure of the laser module 100a is simplified.
• the fixed etalon 7 corresponds to an etalon.
• FIG. 5 is a schematic diagram of an optical communication apparatus according to the third embodiment.
• the laser module 100b employed in the optical communication apparatus of this embodiment is different from the laser module 100 of FIG. 1 in that liquid crystal etalons 8 and 9 are further provided instead of the etalon 3.
• a lens 2 a liquid crystal etalon 8, a liquid crystal element are disposed behind the semiconductor optical amplifier 1.
• Talon 9 and wavelength selection mirror 4 are arranged in this order.
• the liquid crystal etalons 8, 9 are composed of a liquid crystal band-pass filter that transmits light at a predetermined wavelength period.
• the refractive indexes of the liquid crystal etalons 8 and 9 change according to the voltage applied from the control unit 5 to the liquid crystal of the liquid crystal etalons 8 and 9.
• the wavelength of the etalon peak of the liquid crystal etalon 8, 9 changes as the refractive index of the liquid crystal etalon 8, 9 changes.
• FIG. 6 is a diagram for explaining laser light that resonates in the laser module 100b.
• 6A is a diagram showing the wavelength width of the laser light emitted by the semiconductor optical amplifier 1
• FIG. 6B is a diagram showing the transmission characteristics of the liquid crystal etalon 8
• FIG. 6 (d) is a diagram showing the combined light of the light transmitted through the liquid crystal etalon 8 and the liquid crystal etalon 9, and
• FIG. 6 (e) is reflected by the wavelength selection mirror 4.
• FIG. 6 (f) is a diagram showing the wavelength peak of the laser beam resonating in the laser module 100b.
• the horizontal axis represents the wavelength of the laser light
• the vertical axis in FIG. 6 (a) represents the gain of the semiconductor optical amplifier 1
• the vertical axis represents the intensity of light transmitted through the liquid crystal etalon 8
• the vertical axis in FIG. 6 (c) represents the intensity of light transmitted through the liquid crystal etalon 9
• the vertical axis in FIG. 6 (d) represents the liquid crystal etalon 8 and
• the intensity of light transmitted through the liquid crystal etalon 9 is shown
• the vertical axis of FIG. 6 (e) shows the intensity of light reflected by the wavelength selection mirror 4
• the vertical axis of FIG. 6 (f) shows the inside of the laser module 100b.
• the intensity of the resonating laser beam is shown.
• the free spectral width of the liquid crystal etalon 8, 9 is larger than the width of the reflection bandwidth R of the wavelength selective mirror 4. Is set. In this case, the full width at half maximum of the wavelength peak of the light transmitted through the liquid crystal etalon 8, 9 is widened.
• the controller 5 controls the liquid crystal etalon 8, so that at least a part of the etalon peak of the laser light transmitted through the liquid crystal etalon 8 and at least a part of the etalon peak of the laser light transmitted through the liquid crystal etalon 9 overlap. Control the voltage applied to 9. As a result, as shown in FIG. 6 (d), the full width at half maximum of the wavelength peak of the laser light synthesized by passing through the liquid crystal etalons 8, 9 becomes narrow. In addition, since the free spectral width of the liquid crystal etalon 8, 9 is set to be larger than the width of the reflection bandwidth R of the wavelength selective mirror 4, as shown in Fig. 6 (f), it is allowed in the laser module 100b. The peak wavelength of the emitted laser light is one. From the above, The selection accuracy of the output wavelength of the one module 100b is improved.
• the force using the liquid crystal etalons 8 and 9 can be used.
• a plurality of fixed etalons having an etalon peak shown in FIGS. 6 (b) and 6 (c) can be used.
• a plurality of etalons whose etalon peak wavelengths change according to temperature changes can be used.
• the liquid crystal etalon 8 corresponds to the first etalon or etalon
• the liquid crystal etalon 9 corresponds to the second etalon
• optical communication apparatus according to the fourth embodiment.
• the configuration of the optical communication apparatus of the present embodiment is the same as that of the optical communication apparatus of FIG. 5, but the free spectral widths of the liquid crystal etalons 8 and 9 of the laser module 100b are different from each other.
• the wavelength is selected using the barr effect. Details will be described below.
• FIG. 7 is a diagram for explaining another example of laser light that resonates in the laser module 100b.
• Fig. 7 (a) is a diagram showing the transmission characteristics of the liquid crystal etalon 8
• Fig. 7 (b) is a diagram showing the transmission characteristics of the liquid crystal etalon 9
• Fig. 7 (c) is resonant in the laser module 100b. It is a figure which shows the wavelength peak of a laser beam.
• FIGS. 7 (a) to 7 (c) represent the wavelength of the laser beam
• the vertical axis of FIG. 7 (a) represents the intensity of the light transmitted through the liquid crystal etalon 8
• FIG. ) Indicates the intensity of light transmitted through the liquid crystal etalon 9
• the vertical axis of FIG. 7 (c) indicates the intensity of light transmitted through the liquid crystal etalon 8, 9.
• the free spectral width of the liquid crystal etalon 8 and the free spectral width of the liquid crystal etalon 9 are different. Therefore, when the relative relationship between the etalon peaks of liquid crystal etalon 8 and 9 is changed, the wavelength at which the etalon peak of liquid crystal etalon 8 and the etalon peak of liquid crystal etalon 9 match changes.
• the wavelength of the resonant light is selected by matching the etalon peak of liquid crystal etalon 8 and the etalon peak of liquid crystal etalon 9, the greater of the free spectral width of liquid crystal etalon 8 and the free spectral width of liquid crystal etalon 9
• the etalon peaks of all liquid crystal etalons 8 and 9 within the reflection bandwidth R can be selected by the relative change of the spectral width. So just It is possible to select a wide band wavelength with a wide variable width.
• the free spectrum of the liquid crystal etalons 8 and 9 is such that the wavelength where the etalon peak of the liquid crystal etalon 8 and the etalon peak of the liquid crystal etalon 9 overlap is one in the reflection bandwidth R of the wavelength selection mirror 4.
• the width is set.
• the peak wavelength of the laser beam resonating in the laser module 100b becomes one. From the above, the selection accuracy of the output wavelength of the laser module 100b is improved.
• the liquid crystal etalon 8 corresponds to the first etalon or etalon
• the liquid crystal etalon 9 corresponds to the second etalon.
• a plurality of liquid crystal etalons are used, and the power for changing each etalon peak. It is also possible to select the wavelength of the resonant light by changing the etalon peak of one liquid crystal etalon. It is also possible to replace one liquid crystal etalon with a fixed etalon and perform wavelength control by the vernier effect described above.
• FIG. 8 is a schematic diagram illustrating the overall configuration of the optical communication apparatus according to the fifth embodiment.
• the laser module 100c includes an external resonant laser 10, an output unit 20, an initial wavelength monitor unit 30, a power monitor unit 40, a wavelength porter unit 50, and a temperature control device 60. By connecting a control unit 60 that performs various controls to the laser module 100c, the optical communication apparatus of this embodiment is configured.
• the external resonance laser 10 includes a semiconductor optical amplifier 11, a lens 12, a fixed etalon 13, a liquid crystal etalon 14, and a wavelength selection mirror 15.
• the lens 12, the fixed etalon 13, and a liquid crystal etalon are located behind the semiconductor optical amplifier 11. 14 and a wavelength selection mirror 15 are arranged in this order.
• the semiconductor optical amplifier 11 gives a gain to input light having a predetermined effective wavelength band and outputs a laser beam in accordance with an instruction from the control unit 70.
• a mirror 16 is provided in front of the semiconductor optical amplifier 11.
• a phase adjuster 17 is provided at the rear of the semiconductor optical amplifier 11.
• the phase adjuster 17 and the semiconductor optical amplifier 11 of this embodiment are connected to each other with an optical waveguide, and are integrated on the same substrate.
• the refractive index of the phase adjuster 17 changes according to the current given from the control unit 70. When the refractive index of the phase adjuster 17 changes, the phase of the peak wavelength of the light transmitted through the phase adjuster 17 changes. Similarly to the lens 2 in FIG.
• the lens 12 converts the laser light emitted from the semiconductor optical amplifier 11 into parallel light and supplies the parallel light to the fixed etalon 13.
• the fixed etalon 13 also has a band-pass filter force that transmits light at a predetermined wavelength period. Thereby, the light incident on the fixed etalon 13 is emitted from the fixed etalon 13 as light having a predetermined peak.
• the fixed etalon 13 is fixed on the temperature control device 60.
• the fixed etalon 13 of the present embodiment realizes 88 channel wavelengths in the C band. Specifically, in the C band, the free spectral width is set to about 0.4 nm so as to realize the wavelength of 88 channels in the 1528 nm to 1563 nm band (bandwidth 35 mm).
• the liquid crystal etalon 14 is a liquid crystal type bandpass filter that transmits light with a predetermined wavelength period.
• the refractive index of the liquid crystal etalon 14 changes according to the voltage applied from the control unit 70.
• the wavelength of the etalon peak of the liquid crystal etalon 14 changes as the refractive index of the liquid crystal etalon 14 changes.
• the wavelength selection mirror 15 of the present embodiment has the same configuration as the wavelength selection mirror 4 of FIG. 1, and in this embodiment, the reflection bandwidth R is the bandwidth of the 88 channel. Covering is set to 36nm.
• the free spectral width of the liquid crystal etalon 14 needs to limit its etalon peak to one in the reflection band of the wavelength selection mirror 15, and therefore the reflection bandwidth R of the wavelength selection mirror 15 is 36 nm. Is set larger than
• the liquid crystal etalon inherently has a periodic etalon peak, its free spectral width matches the variable width of the etalon peak. That is, since the free spectral width of the liquid crystal etalon 14 of this embodiment is larger than the reflection bandwidth R of the wavelength selection mirror 15 as described above, the variable width of the liquid crystal etalon 14 is the entire reflection band of the wavelength selection mirror 15. Will cover.
• the output unit 20 includes a lens 21, beam splitters 22 and 23, and a shirter 24.
• Laser light output from the external resonance laser 10 is incident on the lens 21.
• the lens 21 converts the laser light incident from the external resonance laser 10 into parallel light and applies it to the beam splitter 22.
• the beam splitter 22 transmits a part of the laser light given from the lens 21 and gives 24 shots, and reflects a part of the laser light given from the lens 21 to reflect the beam.
• Rita 23 As the shirter 24, for example, a shirter that transmits and blocks light by applying a voltage to the liquid crystal can be used.
• the shirter 24 transmits and blocks the laser beam supplied from the splitter 22 to the outside in accordance with an instruction from the control unit 70. This makes it possible to stop external output of unstable laser light when adjusting the wavelength, output power, phase, etc. of the laser output from the laser module 100c.
• the beam splitter 23 transmits a part of the incident laser beam to the power monitor unit 40 and reflects a part of the incident laser beam to the initial wavelength monitor unit 30.
• the power monitor unit 40 functions as a light intensity detection unit that measures the intensity of the output wavelength, and includes a light detection element 41.
• the light detecting element 41 measures the light intensity of the laser beam given from the beam splitter 23 and gives the measured value to the control unit 70.
• the control unit 70 controls the gain of the semiconductor optical amplifier 11 based on the measurement value given from the light detecting element 41. A part of the laser beam given to the light detection element 41 is given to the wavelength mouthpiece unit 50.
• the wavelength mouthpiece unit 50 functions as a wavelength detection unit that measures the output wavelength, and includes a mouthpiece etalon 51 and a light detection element 52.
• the mouthpiece etalon 51 is provided with a part of the laser beam applied to the light detecting element 41.
• the laser light given to the mouthpiece etalon 51 is given to the light detection element 52 as laser light having a wavelength peak of a predetermined period.
• the light detecting element 52 measures the light intensity of the laser beam given from the mouthpiece etalon 51 and gives the measurement result to the control unit 70.
• the control unit 70 calculates the wavelength of the laser light output from the external resonant laser 10 based on the measurement result given from the light detection element 52. Further, based on the calculation result, the control unit 70 controls the refractive index of the phase adjuster 17 so that the phase of the peak wavelength of the laser light output from the external resonance laser 10 becomes a desired phase.
• the initial wavelength monitor unit 30 includes a filter 31 and a light detection element 32.
• the filter 31 converts the absolute wavelength information of the laser beam given from the beam splitter 23 into intensity information and gives it to the light detection element 32.
• the current value of the semiconductor optical amplifier 11 is controlled based on the output of the photodetecting element 41 so that a predetermined optical output value is obtained, and the photodetecting element 32 is supplied from the filter 31.
• Measure the intensity of laser light and control the measurement results Give to part 70.
• the control unit 70 Based on the measurement result given from the photodetecting element 32, the control unit 70 adjusts the liquid crystal etalon so that the output value of the photodetecting element 32 becomes a value corresponding to the initial wavelength of the desired channel of the wavelength stopper unit 50. Control the voltage applied to 14. Accordingly, the control unit 70 can accurately calculate the wavelength of the laser beam output from the external resonance laser 10 based on the measurement result of the light detection element 52.
• the external resonant laser 10, the output unit 20, the initial wavelength monitor unit 30, the power monitor unit 40, and the wavelength porter unit 50 are arranged on the temperature control device 60.
• the temperature control device 60 maintains a constant temperature in accordance with instructions from the control unit 70. Thereby, the temperature of the laser module 100c is kept constant, and the wavelength of the laser beam output from the laser module 100c is stabilized.
• the temperature control device 60 includes a temperature sensor (not shown). This temperature sensor gives the temperature of the temperature control device 60 to the control unit 70. Note that the etalon peaks of the liquid crystal etalon 14 and the mouthpiece etalon 51 can be adjusted by controlling the temperature of the temperature controller 60.
• FIG. 9 is a diagram illustrating laser light that resonates in the laser module 100c.
• Fig. 9 (a) is a diagram showing the wavelength width of the laser light emitted by the semiconductor optical amplifier 11
• Fig. 9 (b) is a diagram showing the transmission characteristics of the liquid crystal etalon 14
• Fig. 9 (c) is a diagram.
• FIG. 9 is a diagram showing the wavelength band of the laser light reflected by the wavelength selection mirror 15
• FIG. 9 (d) is a diagram showing the transmission characteristics of the fixed etalon 13
• FIG. 9 (e) is resonant in the laser module 100c. It is a figure which shows the wavelength peak of a laser beam.
• the horizontal axis represents the wavelength of the laser beam
• the vertical axis in FIG. 9 (a) represents the gain of the semiconductor optical amplifier 11
• FIG. 9 (b) The vertical axis of Fig. 9 shows the intensity of light transmitted through the liquid crystal etalon 14, the vertical axis of Fig. 9 (c) shows the intensity of light reflected by the wavelength selection mirror 15, and the vertical axis of Fig. 9 (d) is fixed.
• the intensity of light transmitted through the etalon 13 is shown, and the vertical axis in FIG. 9 (e) shows the intensity of laser light resonating in the laser module 100c.
• the wavelength is selected by matching the etalon peak of the fixed etalon 13 and the etalon peak of the liquid crystal etalon 14, and therefore, the laser module 100c
• the output wavelength selection accuracy is improved.
• FIG. 10 is a diagram for explaining the control data 200 of the laser module 100c.
• Fig. 10 (a) Shows a table of control data 200
• FIG. 10 (b) shows a recording medium in which the control data 200 is stored
• FIG. 10 (c) shows a state in which the control data 200 is transmitted to the user.
• the control data 200 includes the control current value of the semiconductor optical amplifier 11, the control current value of the phase adjuster 17, the control voltage value of the liquid crystal etalon 14 and the light detection for each channel. Includes target current values for elements 32, 41, and 52. These data are created by preliminarily checking and recording values when the desired wavelength is output. Each voltage value and current value is set for each channel of the fixed etalon 13.
• the control data 200 is referred to by the control unit 70 when a predetermined channel is designated by the wavelength selection command, and is used for controlling the semiconductor optical amplifier 11, the phase adjuster 17, and the liquid crystal etalon 14 by the control unit 70.
• the wavelength of the laser beam output from the laser module 100c can be easily controlled.
• the control data 200 is stored in the recording medium 201.
• a portable medium such as a semiconductor memory, a magnetic disk, or a CD-ROM can be used.
• 8 uses the control data 200 stored in the recording medium 201 to control the wavelength of the laser light output from the laser module 100c.
• the control data 200 is recorded on a recording medium prepared in advance by the user by electronic transmission means such as the Internet 202.
• the liquid crystal etalon 14 corresponds to the first etalon or etalon
• the fixed etalon 13 corresponds to the second etalon
• the semiconductor optical amplifier 11 corresponds to the optical amplifier
• the phase adjuster 17 Corresponds to a phase adjuster
• the light detection element 51 corresponds to a light intensity detection unit.

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• Physics & Mathematics (AREA)
• Condensed Matter Physics & Semiconductors (AREA)
• General Physics & Mathematics (AREA)
• Electromagnetism (AREA)
• Optics & Photonics (AREA)
• Semiconductor Lasers (AREA)
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• Mechanical Light Control Or Optical Switches (AREA)

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• 2005
  • 2005-01-27 JP JP2005019597A patent/JP5183013B2/ja not_active Expired - Fee Related
• 2006
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• 2007
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