WO2006003867A3 - 顕微鏡観察方法、顕微鏡装置、微分干渉顕微鏡装置、位相差顕微鏡装置、干渉顕微鏡装置、画像処理方法、及び画像処理装置 - Google Patents
顕微鏡観察方法、顕微鏡装置、微分干渉顕微鏡装置、位相差顕微鏡装置、干渉顕微鏡装置、画像処理方法、及び画像処理装置 Download PDFInfo
- Publication number
- WO2006003867A3 WO2006003867A3 PCT/JP2005/011772 JP2005011772W WO2006003867A3 WO 2006003867 A3 WO2006003867 A3 WO 2006003867A3 JP 2005011772 W JP2005011772 W JP 2005011772W WO 2006003867 A3 WO2006003867 A3 WO 2006003867A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- microscope
- image processing
- image formation
- image
- interference
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/630,151 US20070242133A1 (en) | 2004-06-30 | 2005-06-27 | Microscope Observation Method, Microscope, Differentiation Interference Microscope, Phase Difference Microscope, Interference Microscope, Image Processing Method, and Image Processing Device |
EP05752944A EP1767923A4 (en) | 2004-06-30 | 2005-06-27 | MICROSCOPE OBSERVATION METHOD, MICROSCOPE, DIFFERENTIAL INERFERENTIAL MICROSCOPE, DEPHASING MICROSCOPE, ITERFERENTIAL MICROSCOPE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING DEVICE |
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004193288A JP4367261B2 (ja) | 2004-06-30 | 2004-06-30 | 顕微鏡観察方法、顕微鏡装置、及び画像処理装置 |
JP2004-193380 | 2004-06-30 | ||
JP2004193380A JP2006017494A (ja) | 2004-06-30 | 2004-06-30 | 顕微鏡観察方法、顕微鏡装置、及び画像処理装置 |
JP2004-193288 | 2004-06-30 | ||
JP2004203683A JP4479391B2 (ja) | 2004-07-09 | 2004-07-09 | 画像処理装置、位相差顕微鏡、および、画像処理方法 |
JP2004203684A JP4466240B2 (ja) | 2004-07-09 | 2004-07-09 | 画像処理装置、微分干渉顕微鏡、および、画像処理方法 |
JP2004-203684 | 2004-07-09 | ||
JP2004-203683 | 2004-07-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006003867A2 WO2006003867A2 (ja) | 2006-01-12 |
WO2006003867A3 true WO2006003867A3 (ja) | 2006-02-16 |
Family
ID=35783242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/011772 WO2006003867A2 (ja) | 2004-06-30 | 2005-06-27 | 顕微鏡観察方法、顕微鏡装置、微分干渉顕微鏡装置、位相差顕微鏡装置、干渉顕微鏡装置、画像処理方法、及び画像処理装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20070242133A1 (ja) |
EP (1) | EP1767923A4 (ja) |
WO (1) | WO2006003867A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104792706A (zh) * | 2015-04-23 | 2015-07-22 | 天津大学 | 面阵ccd的位置三角波频率编码激励的成像光测量系统 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5147454B2 (ja) * | 2007-03-07 | 2013-02-20 | キヤノン株式会社 | 画像形成装置、及び画像形成方法 |
DE102007039201A1 (de) * | 2007-08-20 | 2009-02-26 | Carl Zeiss Sms Gmbh | Verfahren und Vorrichtung zur Erhöhung der Auflösung eines optischen Abbildungssystems |
CN101526464B (zh) * | 2008-03-05 | 2011-05-11 | 清华大学 | 相衬成像方法及设备 |
CN101620176B (zh) * | 2009-06-10 | 2011-01-12 | 钱国英 | 一种珍珠粉和贝壳粉的鉴别方法 |
US8693000B2 (en) * | 2011-12-22 | 2014-04-08 | General Electric Company | Quantitative phase microscopy for label-free high-contrast cell imaging |
US8934103B2 (en) | 2011-12-22 | 2015-01-13 | General Electric Company | Quantitative phase microscopy for label-free high-contrast cell imaging |
WO2014070082A1 (en) * | 2012-10-29 | 2014-05-08 | General Electric Company | Quantitative phase microscopy for label-free high-contrast cell imaging |
CN103076107B (zh) * | 2013-01-17 | 2014-12-24 | 杭州电子科技大学 | 基于太赫兹脉冲测量的燃烧温度传感装置及方法 |
JP6112872B2 (ja) * | 2013-01-18 | 2017-04-12 | キヤノン株式会社 | 撮像システム、画像処理方法、および撮像装置 |
JP2015052663A (ja) * | 2013-09-06 | 2015-03-19 | キヤノン株式会社 | 画像処理方法、画像処理装置、撮像装置およびプログラム |
NL2013262B1 (en) * | 2014-07-25 | 2016-09-09 | Delmic B V | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope. |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005828A (ja) * | 2000-06-20 | 2002-01-09 | Tochigi Nikon Corp | 半導体の不純物濃度検査装置及び検査方法 |
JP2002257629A (ja) * | 2001-02-27 | 2002-09-11 | Communication Research Laboratory | 電磁波検出装置および検出方法 |
JP2003295104A (ja) * | 2002-04-01 | 2003-10-15 | Tochigi Nikon Corp | テラヘルツパルス光照射装置及びこれを用いたイメージ化装置 |
JP2004020352A (ja) * | 2002-06-14 | 2004-01-22 | Tochigi Nikon Corp | テラヘルツパルス光計測方法及び装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4164788A (en) * | 1976-10-13 | 1979-08-14 | Atul Jain | Super-resolution imaging system |
WO2003042670A1 (en) * | 2001-11-13 | 2003-05-22 | Rensselaer Polytechnic Institute | Method and system for performing three-dimensional teraherz imaging on an object |
-
2005
- 2005-06-27 US US11/630,151 patent/US20070242133A1/en not_active Abandoned
- 2005-06-27 EP EP05752944A patent/EP1767923A4/en not_active Withdrawn
- 2005-06-27 WO PCT/JP2005/011772 patent/WO2006003867A2/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005828A (ja) * | 2000-06-20 | 2002-01-09 | Tochigi Nikon Corp | 半導体の不純物濃度検査装置及び検査方法 |
JP2002257629A (ja) * | 2001-02-27 | 2002-09-11 | Communication Research Laboratory | 電磁波検出装置および検出方法 |
JP2003295104A (ja) * | 2002-04-01 | 2003-10-15 | Tochigi Nikon Corp | テラヘルツパルス光照射装置及びこれを用いたイメージ化装置 |
JP2004020352A (ja) * | 2002-06-14 | 2004-01-22 | Tochigi Nikon Corp | テラヘルツパルス光計測方法及び装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104792706A (zh) * | 2015-04-23 | 2015-07-22 | 天津大学 | 面阵ccd的位置三角波频率编码激励的成像光测量系统 |
Also Published As
Publication number | Publication date |
---|---|
EP1767923A2 (en) | 2007-03-28 |
EP1767923A4 (en) | 2009-10-28 |
US20070242133A1 (en) | 2007-10-18 |
WO2006003867A2 (ja) | 2006-01-12 |
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