WO2005085498A1 - Metal surface treating agent - Google Patents

Metal surface treating agent Download PDF

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Publication number
WO2005085498A1
WO2005085498A1 PCT/JP2005/002813 JP2005002813W WO2005085498A1 WO 2005085498 A1 WO2005085498 A1 WO 2005085498A1 JP 2005002813 W JP2005002813 W JP 2005002813W WO 2005085498 A1 WO2005085498 A1 WO 2005085498A1
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WO
WIPO (PCT)
Prior art keywords
surface treatment
molecule
formula
solder
metal
Prior art date
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PCT/JP2005/002813
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French (fr)
Japanese (ja)
Inventor
Takashi Ouchi
Original Assignee
Nippon Mining & Metals Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Mining & Metals Co., Ltd. filed Critical Nippon Mining & Metals Co., Ltd.
Priority to CN2005800070997A priority Critical patent/CN1930323B/en
Priority to JP2006510639A priority patent/JP4518507B2/en
Publication of WO2005085498A1 publication Critical patent/WO2005085498A1/en

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C22/00Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C22/05Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions
    • C23C22/06Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions using aqueous acidic solutions with pH less than 6
    • C23C22/48Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions using aqueous acidic solutions with pH less than 6 not containing phosphates, hexavalent chromium compounds, fluorides or complex fluorides, molybdates, tungstates, vanadates or oxalates
    • C23C22/58Treatment of other metallic material
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C13/00Alloys based on tin
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/48After-treatment of electroplated surfaces
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3478Applying solder preforms; Transferring prefabricated solder patterns

Definitions

  • the present invention relates to a surface treatment agent for metals, particularly Sn and Sn alloys, and a surface treatment method using the same. Furthermore, the present invention provides an electronic component, a substrate, a solder ball, a solder powder, a ball grid array using the solder ball, a solder paste using the solder powder, a solder paste using the solder powder, and the like. Related mounting products. Background art
  • soldering is a technique for joining objects using a substance having a relatively low melting point, and is widely used in modern industry for joining and assembling electronic devices.
  • the commonly used solder is Sn-Pb alloy, and its eutectic composition (63% Sn-balance Pb) has a low melting point of 183 ° C. Since it is performed in C, it hardly causes thermal damage to electronic components and substrates.
  • the Sn-Pb alloy has excellent solderability, and also has the excellent characteristics that it solidifies immediately upon soldering and does not easily crack or peel even when vibration is applied to the soldered part. ing.
  • electronic devices are formed of a synthetic resin such as an outer frame or a board and a metal such as a conductor or a frame. When disposed, they are not incinerated and are mostly buried in the ground. Can be In recent years, rain falling on the ground tends to be acidic (acid rain), and contaminating groundwater by eluting solder for electronic devices buried underground has become a problem. For this reason, the use of lead-free solder (lead-free solder) is rapidly moving, especially in the electronics industry.
  • the external lead terminals of electronic components are mainly soldered (90% Sn-balance Pb) to respond to lead-free use. Is desired. Candidates for lead-free soldering are roughly classified into pure Sn, Sn-Ag (Cu), Sn-Zn, and Sn-Bi. Each has its own strengths and weaknesses. Has not been reached yet.
  • the Sn-Zn-based alloy is advantageous in that it does not need to change the current equipment process because the melting point is close to that of a conventional Sn-Pb-based alloy. Also, the mechanical strength of the plating film is excellent and the cost is also excellent. However, since Zn is an active metal species and is easily oxidized, the Sn-Zn alloy has very poor solder wettability, so it is considered that the possibility of practical application is the lowest at this time.
  • solder paste is used for surface mounting electronic components on a substrate, and its use has been increasing in recent years.
  • the solder paste is generally a solder alloy powder as a main component, and is obtained by adding a flux containing an adhesive, an activator, a thixotropic agent ij, a surfactant, a solvent, and the like.
  • As lead-free solder pastes Sn_Ag (Cu) -based alloys, Sn_Zn-based alloys, and Sn-Bi-based alloys are being studied. Eutectic temperature is considered a promising alternative.
  • solder paste using Sn-Zn-based alloy as the solder powder undergoes an oxidation reaction with the activator contained in the flux, resulting in remarkable solder wettability and storage stability.
  • an inert gas atmosphere is required during reflow.
  • Patent Document 1 Japanese Patent Application No. 2002-304554
  • Patent Document 2 Japanese Patent Application No. 2002-304554
  • a surface treatment agent characterized by containing salt was proposed.
  • Patent Document 2 Japanese Patent Application Laid-Open No. 7-188942 particularly proposes an antioxidant characterized by comprising diphenyl phosphate and / or diphenyl phosphite. ing.
  • Patent Document 2 Japanese Patent Application Laid-Open No. 7-188942
  • the present inventors have conducted intensive studies on the suppression of oxidation of metals, particularly Sn and Sn alloy surfaces, and as a result, they have two or more phosphonic acid groups in one molecule and have an ester bond in the molecule.
  • Surface treatment with a surface treatment agent containing a total of 0.1 Olg / L or more of one or more of compounds containing no and / or salts thereof imparts oxidation resistance and improves solder wettability. I found that I can do better.
  • the solder paste containing the surface-treated Sn alloy solder powder showed a remarkable improvement in storage stability. Furthermore, it was found that the occurrence of whiskers was significantly suppressed in the surface-treated Sn and Sn alloy.
  • the present invention is as follows.
  • a metal surface treatment agent characterized by the following:
  • the compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule and / or a salt thereof is represented by the following formula (1), (II) or (III) And / or a salt thereof with an alkali metal salt, an ammonium salt, or an amine compound, wherein the metal surface according to any one of (1) to (3) above, Processing agent.
  • x 1 —x 3 and ⁇ 1 — ⁇ X 3 each represent a hydrogen atom which may be the same or different, or a lower alkyl group having 115 carbon atoms.
  • R 2 and R 4 each represent the following groups (A) which may be the same or different;
  • R 3 represents the following groups (A) or lower alkyl groups having 15 carbon atoms; Represents an integer of 1 to 3.
  • x represents a hydrogen atom or a lower alkyl group having 115 carbon atoms
  • represents a hydrogen atom.
  • And represents a lower alkyl group having 1 to 5 carbon atoms, a hydroxyl group, or an amino group.
  • solder ball according to (8) is disposed on an electronic component and connected to a circuit board.
  • Examples of the metal to be treated with the surface treatment agent of the present invention include Fe, Ni, Co, Cr, Cu, Zn, Sn, Al, Mg, Ti, Ag, and Au, and these may be alloys. Les ,. In particular, Sn and Sn alloys are preferred. As a Sn alloy, a lead-free Sn alloy is more preferred because of problems such as environmental pollution. Examples of the Sn alloy that does not include a mouth include a solder alloy that includes one or more of Zn, Bi, Cu, In, Ag, and Sb in Sn.
  • the amount of the compound and / or its salt is less than 0.01 g / L, the effect is small. Conversely, there is no upper limit on the amount of addition because there is no deterioration in the properties even if the amount of added koji is too large. More preferably, it is 0.1-10 Og / L.
  • the surface treatment agent of the present invention uses a compound containing no ester bond in the molecule, a sufficient antioxidant effect can be obtained even at a relatively high temperature where the ester bond is not decomposed by the heat treatment. . Therefore, lead-free soldering temperature is relatively higher than before
  • the detailed mechanism of a compound having two or more phosphonic acid groups in one molecule is not clear as compared with a compound having two or more phosphonic acid groups in one molecule. Was found to be excellent.
  • the number of phosphonic acid groups in one molecule is preferably 26 from the viewpoint of cost.
  • x 1 —x 3 and Y 1 —Y 3 each represent a hydrogen atom which may be the same or different, or a lower alkyl group having 115 carbon atoms.
  • R 2 and R 4 each represent the following groups (A) which may be the same or different;
  • R 3 represents the following groups (A) or lower alkyl groups having 15 carbon atoms; Represents an integer of 1 to 3.
  • X represents a hydrogen atom or a lower alkyl group having 115 carbon atoms
  • Y represents a hydrogen atom, a lower alkyl group having 115 carbon atoms, a hydroxyl group, or an amino group.
  • ditrilotrismethylenephosphonic acid and the like are particularly preferable because they are commercially available.
  • ethylenediaminetetrakismethylenephosphonic acid diethylenetriaminepentakismethylenephosphonic acid and the like are particularly preferred.
  • compound represented by the general formula ( ⁇ ) 1-hydroxyethane-1,1,1-diphosphonic acid and the like are particularly preferred.
  • the alkali metal salt of the above compound is preferably a sodium salt, a potassium salt or the like.
  • a salt with a compound triethylamine salt / triethanolamine salt and the like are preferable.
  • the surface treatment agent of the present invention can be used by dissolving a compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and / or a salt thereof in a solvent. it can.
  • the solvent used is not particularly limited as long as it is soluble.
  • water is preferred in consideration of the power S, solubility, cost, and the like, which include polar solvents such as water and alcohols and glycols.
  • the oxidation resistance of the surface to be treated is further improved.
  • the pH of the surface treatment agent is more preferably pH 15 in consideration of the influence on the material and the like.
  • the pH adjuster generally available acids and alkalis can be used.
  • the oxidation resistance of the surface to be treated is further improved.
  • the amount of surfactant added to the surfactant is preferably 0.1 to 10 g / L.
  • surfactant one or more kinds of commercially available anionic, cationic, nonionic and amphoteric surfactants can be appropriately selected and used.
  • anionic surfactants include sulfate ester type, sulfonate type, ester phosphate salt type, and sulfosuccinate type
  • cationic surfactants include quaternary ammonium salt type and amine salt.
  • Nonionic surfactants such as higher alcohol ethylene oxide adducts, alkylphenol ethylene oxide adducts, polyoxyethylene polyoxypropylene block polymers, polyoxyethylene polyoxypropylene block polymers of ethylenediamine, and higher aliphatic surfactants
  • Preferred are ethylene oxide adducts of amines and ethylene oxide adducts of aliphatic amides
  • the amphoteric surfactants are preferably amino acid type, betaine type and the like.
  • anionic and nonionic When the pH is used in the range of 5 or less, it is preferable to appropriately select and use one or more of anionic and nonionic.
  • nonionic surfactants among the nonionic surfactants, the polyethylene glycol type is particularly preferred, and higher alcohol ethylene oxide adducts, alkylphenol ethylene oxide adducts, and polyoxyethylene polyoxypropylene are particularly preferred.
  • Block polymers and the like can be particularly preferably used, and among the anionic surfactants, sulfate ester type and phosphate ester type are particularly preferable.
  • the surface treatment agent of the present invention may contain an additive in an amount that does not impair the original properties for the purpose of imparting desired performance.
  • the additive include a preservative, a pH buffer, and the like, and those conventionally known can be used.
  • the surface treatment of the metal using the surface treatment agent of the present invention may be any method that forms a film on the surface of the metal.
  • a method in which the metal is simply immersed in the surface treatment agent a surface treatment
  • Examples of the method include applying the agent using a shower or an apparatus such as an air coater, a blade coater, a rod coater, a knife coater, a gravure coater, a reverse coater, or a cast coater.
  • the shape of the metal to be surface-treated with the surface treatment agent of the present invention may be any shape such as a line, a plate 'band' foil, a particle, and a powder. It can process electronic components, substrates, solder balls, solder powder, etc.
  • the surface treatment agent of the present invention By using the surface treatment agent of the present invention, the surface of the conductor of the connection terminal portion of the electronic component or the substrate is surface-treated, or the surface of the conductor is plated, and then the surface is treated, so that the oxidation resistance is excellent and the solder wets. An electronic component or a substrate having improved performance can be obtained.
  • Solder balls using the Sn alloy treated with the surface treatment agent of the present invention have excellent oxidation resistance, are arranged as ball grid arrays as electrical connection members, and are arranged on electronic components and connected to circuit boards. It can be used favorably as a mounted product.
  • the Sn alloy powder is treated with the surface treatment agent of the present invention, and a flux containing an adhesive, an activator, a thixotropic agent, a surfactant, a solvent, and the like is added thereto to form a solder paste. You can also use it. This solder paste has a remarkable effect of improving the storage stability. Conventionally known adhesives, activators, thixotropic agents, surfactants, and solvents can be used.
  • Examples 1 to 14 and Comparative Examples 1 to 5 Fifteen types of aqueous solutions containing two or more phosphonic acid groups in one molecule and containing no compound having an ester bond in the molecule or a salt thereof as an active ingredient were prepared (Examples 1 to 14 and Comparative Example 1). . Table 1 shows the breakdown.
  • This substrate was Sn plated with a thickness of about 5 xm (plating bath: Tincoat K (manufactured by Nikko Metal Plating Co., Ltd.), plating conditions: cathode current density 2A / dm 2 , temperature 20 ° C , Liquid flow and force sword rocking).
  • the Sn-plated substrate (hereinafter referred to as Sn substrate) contains a compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, or a salt thereof. After being immersed in the solution at a bath temperature of 60 ° C. for 10 seconds, it was washed with water and dried to obtain a test substrate.
  • Table 1 shows the test results.
  • solderability (zero cross time) with lead-free solder was measured by the meniscograph method under the following measurement conditions. .
  • solderability zero cross time
  • lead-free solder was measured using a meniscus. It was measured by the cograph method in the same manner as in the term of thermal oxidation resistance.
  • a substrate treated with an isopropanol solution containing lg / L of dodecylphosphonic acid on the above Sn substrate (however, without water washing after the surface treatment, Comparative Example 2), Japanese Unexamined Patent Publication No. 7-188942 discloses a base material treated with an aqueous solution containing lgZL phosphonate lgZL (Comparative Example 3), the untreated Sn base material (Comparative Example 4), and the Sn base material.
  • a substrate (Comparative Example 5) treated with the surface treatment agent aqueous solution containing 0.1 g / L of diphenyl phosphate was also evaluated. Table 1 also shows the test results.
  • Plating bath manufactured by Nikko Metal Plating Co., Ltd., plating conditions: cathodic current density 3 A / dm 2 , temperature 35 ° C., pH 4.0, liquid flow and force swinging).
  • Sn—Zn-plated substrate (hereinafter referred to as Sn—Zn substrate) was added to the solutions prepared in Examples 1-11, Comparative Examples 1-3, and Comparative Example 5 at a bath temperature of 60 ° C. After immersion for 10 seconds, the substrate washed with water, dried, and untreated were used as test substrates.
  • Example 114 After aging was performed on these test substrates in the same manner as in Example 114 and Comparative Example 115, the solderability was measured. Table 2 shows the test results.
  • a surface treatment agent (lwt% isopropanol of monodioctadecynyl phosphate) described in Japanese Patent Application No. 2002-304554 was used for the untreated Sn—Zn substrate. And the treated substrate (Comparative Example 11) was also evaluated. Table 2 shows the test results.
  • Example 29 The Sn-plated substrate treated in the same manner as in Example 7 and the substrate not subjected to the surface treatment were allowed to stand in a constant temperature and humidity atmosphere of 85 ° C. and 85% humidity for 24 hours. After that, the substrate was sufficiently dried, and the surface was observed with a scanning electron microscope (SEM). In the case where the surface was not treated, many whiskers were observed (Comparative Example 12). No whiskers were observed in the treated products (Example 29).
  • a compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule, and / or one or two or more of salts thereof in total of 0.1 Olg / L or more By treating the surface of the metal with a surface treatment agent containing it, it can impart oxidation resistance and improve solder wettability. By adjusting the pH of this surface treatment agent to 5 or less, and further adding a surfactant of 0.01 to 10 g / L, the oxidation resistance is improved.
  • the storage stability of the solder paste containing the Sn alloy solder powder subjected to the surface treatment using the surface treatment agent of the present invention is remarkably improved. Further, by treating Sn and the Sn alloy with the surface treatment agent of the present invention, the generation of whiskers can be significantly suppressed.

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)
  • Chemical Treatment Of Metals (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)

Abstract

Disclosed is a surface treating agent for imparting a metal, in particular an Sn and Sn alloy plating, with oxidation resistance and improving the solder wettability thereof. Also disclosed is a surface treating agent for suppressing generation of whiskers in the Sn and Sn alloy plating. The metal surface treating agent is characterized by containing one or more substances selected from compounds having two or more phosphonic acid groups and no ester bond in one molecule and/or salts thereof in an amount of not less than 0.01 g/L in total. It is preferable that the surface treating agent has a pH of not more than 5 and further contains 0.1-10 g/L of a surfactant. Metals preferably treated by this surface treating agent are Sn and Sn alloys.

Description

明 細 書  Specification
金属の表面処理剤  Metal surface treatment agent
技術分野  Technical field
[0001] 本発明は、金属、特に Sn及び Sn合金に対する表面処理剤、及びそれを用いた表 面処理方法に関する。更に、本発明は、その表面処理方法で処理を行った電子部 品、基板、はんだボール、はんだ粉末、及び該はんだボールを用いたボールグリッド アレイ、該はんだ粉末を用いたはんだペースト、それらを用いた実装品に関する。 背景技術  The present invention relates to a surface treatment agent for metals, particularly Sn and Sn alloys, and a surface treatment method using the same. Furthermore, the present invention provides an electronic component, a substrate, a solder ball, a solder powder, a ball grid array using the solder ball, a solder paste using the solder powder, a solder paste using the solder powder, and the like. Related mounting products. Background art
[0002] はんだ付けは、融点が比較的低い物質を用いて物体同士を接合する技術であり、 現代産業において、電子機器の接合、組み立て等に幅広く用いられている。一般的 に用いられているはんだは Sn— Pb合金であり、その共晶組成(63%Sn—残部 Pb)の 融点が 183°Cと低いものであることから、そのはんだ付けは 220— 230°Cで行われる ため、電子部品や基板に対しほとんど熱損傷を与えなレ、。しかも、 Sn-Pb合金は、は んだ付け性が良好であるとともに、はんだ付け時にすぐに凝固して、はんだ付け部に 振動が加わっても割れや剥離を起こし難いという優れた特徴も有している。  [0002] Soldering is a technique for joining objects using a substance having a relatively low melting point, and is widely used in modern industry for joining and assembling electronic devices. The commonly used solder is Sn-Pb alloy, and its eutectic composition (63% Sn-balance Pb) has a low melting point of 183 ° C. Since it is performed in C, it hardly causes thermal damage to electronic components and substrates. In addition, the Sn-Pb alloy has excellent solderability, and also has the excellent characteristics that it solidifies immediately upon soldering and does not easily crack or peel even when vibration is applied to the soldered part. ing.
[0003] 一般に電子機器は、外枠や基板等の合成樹脂と導体部やフレーム等の金属により 形成されており、廃棄処分された場合は、焼却処分されず、ほとんどが地中に埋め立 てられる。近年、地上に降る雨は酸性を示す傾向にあり(酸性雨)、地中に埋められ た電子機器のはんだを溶出させて、地下水を汚染することが問題化している。このた め、特に電子機器業界において、鉛を含まないはんだ (鉛フリーはんだ)への代替の 動きが急速に進んでいる。  [0003] Generally, electronic devices are formed of a synthetic resin such as an outer frame or a board and a metal such as a conductor or a frame. When disposed, they are not incinerated and are mostly buried in the ground. Can be In recent years, rain falling on the ground tends to be acidic (acid rain), and contaminating groundwater by eluting solder for electronic devices buried underground has become a problem. For this reason, the use of lead-free solder (lead-free solder) is rapidly moving, especially in the electronics industry.
[0004] 電子部品の外部リード端子には、そのはんだ濡れ性と耐食性を向上させるため、主 にはんだめつき(90%Sn—残部 Pb)が施されており、その鉛フリー化への対応が望ま れている。鉛フリーはんだめつきの候補としては、純 Sn、 Sn— Ag (Cu)系、 Sn— Zn系 、 Sn— Bi系に大別される力 それぞれ一長一短があり Sn— Pb合金を完全に代替する には未だ至っていない。  [0004] To improve solder wettability and corrosion resistance, the external lead terminals of electronic components are mainly soldered (90% Sn-balance Pb) to respond to lead-free use. Is desired. Candidates for lead-free soldering are roughly classified into pure Sn, Sn-Ag (Cu), Sn-Zn, and Sn-Bi. Each has its own strengths and weaknesses. Has not been reached yet.
[0005] 純 Snめっきは、コストやめつきの作業性等、総合的にみて鉛フリーめつきとしては最 有力と考えられる。しかし、 Snめっきは表面の酸化や内部応力に起因して、ウイスカ 一が発生し易いことに加え、経時的にはんだ濡れ性が劣化し易いという課題があり、 その改善が強く要望されている。 [0005] Pure Sn plating is the best lead-free plating in terms of cost and workability. It is considered influential. However, Sn plating has problems that whiskers are easily generated due to surface oxidation and internal stress, and that the solder wettability is liable to deteriorate with time, and there is a strong demand for improvement.
[0006] Sn— Zn系合金は、従来の Sn— Pb系合金と融点が近いことから、現在の設備ゃェ 程を変える必要がないという点で有利である。また、めっき被膜の機械的強度に優れ コスト的にも優れている。しかし、 Znは活性な金属種であることから酸化し易ぐ Sn- Zn系合金のはんだ濡れ性が非常に悪いため、現時点では、実用化される可能性は 最も低いと考えられている。  [0006] The Sn-Zn-based alloy is advantageous in that it does not need to change the current equipment process because the melting point is close to that of a conventional Sn-Pb-based alloy. Also, the mechanical strength of the plating film is excellent and the cost is also excellent. However, since Zn is an active metal species and is easily oxidized, the Sn-Zn alloy has very poor solder wettability, so it is considered that the possibility of practical application is the lowest at this time.
[0007] はんだペーストは、電子部品を基板に表面実装するために用いられ、近年その使 用量が増大している。はんだペーストは、一般には、はんだ合金粉末を主体とし、粘 着剤、活性剤、チクソトロピック斉 ij、界面活性剤、溶剤等を含むフラックスをカ卩えたもの である。はんだペーストの鉛フリー化として、 Sn_Ag (Cu)系合金、 Sn_Zn系合金、 S n— Bi系合金が検討されている力 S、 Sn— Zn系合金は前述した通り、従来の Sn— Pb系 はんだの共晶温度に近いことから、代替の有力な候補として考えられている。しかし、 前述の通り Znの酸化されやすさから、 Sn— Zn系合金をはんだ粉末として用いたはん だペーストはフラックスに含まれる活性剤と酸化反応を起こし、はんだ濡れ性、保存 安定性が著しく悪ぐまたリフロー時に不活性ガス雰囲気が必要という欠点がある。  [0007] Solder paste is used for surface mounting electronic components on a substrate, and its use has been increasing in recent years. The solder paste is generally a solder alloy powder as a main component, and is obtained by adding a flux containing an adhesive, an activator, a thixotropic agent ij, a surfactant, a solvent, and the like. As lead-free solder pastes, Sn_Ag (Cu) -based alloys, Sn_Zn-based alloys, and Sn-Bi-based alloys are being studied. Eutectic temperature is considered a promising alternative. However, as described above, due to the susceptibility of Zn to oxidation, solder paste using Sn-Zn-based alloy as the solder powder undergoes an oxidation reaction with the activator contained in the flux, resulting in remarkable solder wettability and storage stability. There is a disadvantage that an inert gas atmosphere is required during reflow.
[0008] これらの問題に対処するため、本発明者らは特許文献 1 (特願 2002-304554号) にて、一つもしくは二つの、飽和もしくは不飽和アルキル基をもつ酸性リン酸エステル 及びその塩を含むことを特徴とする表面処理剤を提案した。  [0008] In order to address these problems, the present inventors have disclosed in Patent Document 1 (Japanese Patent Application No. 2002-304554) one or two acidic phosphate esters having a saturated or unsaturated alkyl group and an acidic phosphate ester thereof. A surface treatment agent characterized by containing salt was proposed.
[0009] また、特許文献 2 (特開平 7-188942号公報)には、特に、リン酸ジフヱニルエステ ル及び/又は亜リン酸ジフヱニルエステルからなることを特徴とする酸化防止剤が提 案されている。  [0009] Patent Document 2 (Japanese Patent Application Laid-Open No. 7-188942) particularly proposes an antioxidant characterized by comprising diphenyl phosphate and / or diphenyl phosphite. ing.
[0010] しかし、上記の技術におけるリン酸エステルもしくは亜リン酸エステルは、比較的高 温(200°C以上)の熱処理によってエステル結合が分解することにより、充分な酸化 防止効果が得られない。このため、上記の技術では、一般的にはんだ付け温度が従 来より上がる鉛フリーはんだ対応の Sn及び Sn合金材の酸化を防止することは困難 である。 特許文献 1:特願 2002-304554号 [0010] However, the phosphoric acid ester or the phosphite in the above-mentioned technology cannot obtain a sufficient antioxidant effect because the ester bond is decomposed by heat treatment at a relatively high temperature (200 ° C. or higher). For this reason, it is difficult with the above-mentioned technology to prevent oxidation of Sn and Sn alloy materials for lead-free solder, which generally raises the soldering temperature higher than before. Patent Document 1: Japanese Patent Application No. 2002-304554
特許文献 2:特開平 7 - 188942号公報  Patent Document 2: Japanese Patent Application Laid-Open No. 7-188942
発明の開示  Disclosure of the invention
[0011] 本発明は、金属、特に Sn及び Sn合金に耐酸化性を付与し、はんだ濡れ性を改善 する表面処理剤を提供することを目的とする。更に、本発明は、 Sn及び Sn合金のゥ イスカーの発生を抑制する表面処理剤を提供することを目的とする。  An object of the present invention is to provide a surface treatment agent that imparts oxidation resistance to metals, particularly Sn and Sn alloys, and improves solder wettability. Another object of the present invention is to provide a surface treatment agent that suppresses the generation of whiskers of Sn and Sn alloys.
[0012] 本発明者らは、金属、特に Sn及び Sn合金表面の酸化抑制に対し、鋭意研究を重 ねた結果、一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含 まない化合物、及び/又はその塩の 1種もしくは 2種以上を合計で 0. Olg/L以上 含む表面処理剤で表面処理することにより、耐酸化性を付与し、はんだ濡れ性を改 善することができることを見出した。また、この表面処理を施した Sn合金はんだ粉末 を含むはんだペーストは、その保存安定性に顕著な改善効果が見られた。更に、こ の表面処理を施した Sn及び Sn合金は、ゥイスカーの発生が大幅に抑制されることが わかった。  The present inventors have conducted intensive studies on the suppression of oxidation of metals, particularly Sn and Sn alloy surfaces, and as a result, they have two or more phosphonic acid groups in one molecule and have an ester bond in the molecule. Surface treatment with a surface treatment agent containing a total of 0.1 Olg / L or more of one or more of compounds containing no and / or salts thereof imparts oxidation resistance and improves solder wettability. I found that I can do better. The solder paste containing the surface-treated Sn alloy solder powder showed a remarkable improvement in storage stability. Furthermore, it was found that the occurrence of whiskers was significantly suppressed in the surface-treated Sn and Sn alloy.
[0013] 即ち本発明は、以下のとおりである。  [0013] That is, the present invention is as follows.
(1)一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない 化合物、及び/又はその塩の 1種もしくは 2種以上を合計で 0. Olg/L以上含むこと を特徴とする金属の表面処理剤。  (1) A compound containing two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and / or a total of at least one or two or more of its salts. A metal surface treatment agent characterized by the following:
(2)—分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない 化合物、及び/又はその塩の 1種もしくは 2種以上を合計で 0. Olg/L以上含み、 溶液の PHを 5以下に調整したことを特徴とする金属の表面処理剤。 (2)-a compound having two or more phosphonic acid groups in the molecule and containing no ester bond in the molecule, and / or a total of at least one or more of salts thereof at least 0.1 Olg / L; surface treatment agent of metal, characterized in that to adjust the P H to the 5 following solutions.
(3)更に界面活性剤を 0. OlgZL— 10g/L含有することを特徴とする前記(2)に記 載の金属の表面処理剤。  (3) The metal surface treating agent according to the above (2), further comprising a surfactant of 0.1 OlgZL-10 g / L.
[0014] (4)前記一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含ま ない化合物、及び/又はその塩が下記式 (1)、(II)又は(III)で表される化合物、及び /又はそのアルカリ金属塩、アンモニゥム塩、又はアミン化合物との塩であることを特 徴とする前記(1)一 (3)のいずれか一項に記載の金属の表面処理剤。  (4) The compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule and / or a salt thereof is represented by the following formula (1), (II) or (III) And / or a salt thereof with an alkali metal salt, an ammonium salt, or an amine compound, wherein the metal surface according to any one of (1) to (3) above, Processing agent.
[化 1] c X Y I I丄[Chemical 1] c XYII 丄
Figure imgf000005_0001
Figure imgf000005_0001
(式 (I)中、 x1— x3及び γ1— γ X3は各々同一もしくは異なってもよぐ水素原子、又は 炭素数 1一 5の低級アルキル基を表す。 ) (In the formula (I), x 1 —x 3 and γ 1 —γ X 3 each represent a hydrogen atom which may be the same or different, or a lower alkyl group having 115 carbon atoms.)
[化 2] [Formula 2]
R R
R1 \ IR 1 \ I
N- [CH2 -CH2 - N] n-R4 (Π) N- [CH 2 -CH 2 -N] n -R 4 (Π)
R2 ^ R 2 ^
(式 (Π)中、
Figure imgf000005_0002
R2及び R4は、各々同一もしくは異なってもよぐ以下の基 (A)を表し 、 R3は、以下の基 (A)、又は炭素数 1一 5の低級アルキル基を表し、 nは 1一 3の整数 を表す。
(In the formula (Π),
Figure imgf000005_0002
R 2 and R 4 each represent the following groups (A) which may be the same or different; R 3 represents the following groups (A) or lower alkyl groups having 15 carbon atoms; Represents an integer of 1 to 3.
[化 3] [Formula 3]
Figure imgf000005_0003
基 (A)中、 X1、及び Y1は、一般式 (I)における定義と同じである。 )
Figure imgf000005_0003
In the group (A), X 1 and Y 1 are the same as defined in the general formula (I). )
[化 4] [Formula 4]
O X o O X o
II I II HO-P -C- P-OH  II I II HO-P -C- P-OH
HO Y OH  HO Y OH
(式 (m)中、 xは水素原子、又は炭素数 1一 5の低級アルキル基を表し、 γは水素原 子、炭素数 1一 5の低級アルキル基、水酸基、又はアミノ基を表す。 ) (In the formula (m), x represents a hydrogen atom or a lower alkyl group having 115 carbon atoms, and γ represents a hydrogen atom. And represents a lower alkyl group having 1 to 5 carbon atoms, a hydroxyl group, or an amino group. )
[0017] (5)前記金属が Sn又は Sn合金であることを特徴とする前記(1)一(4)のレ、ずれか一 項に記載の金属の表面処理剤。 (5) The metal surface treatment agent according to any one of (1) to (4), wherein the metal is Sn or a Sn alloy.
(6)前記(1)一 (5)のレ、ずれか一項に記載の金属の表面処理剤による表面処理方 法。  (6) The method for surface treatment of a metal with a surface treatment agent according to any one of (1) to (5) above.
(7)電子部品もしくは基板の接続端子部の導体表面に、またはその表面にめっきを 施した後に、前記(6)に記載の表面処理方法により表面処理を行ったことを特徴とす る電子部品もしくは基板。  (7) An electronic component characterized by being subjected to surface treatment by the surface treatment method according to (6) above, or after plating on the conductor surface of the connection terminal portion of the electronic component or the substrate. Or a substrate.
(8)前記(6)に記載の表面処理方法により表面処理を行った Sn合金を用いたことを 特徴とするはんだボールもしくははんだ粉末。  (8) A solder ball or solder powder using a Sn alloy surface-treated by the surface treatment method according to (6).
(9)前記(8)に記載のはんだボールを電気的接続部材として用いたことを特徴とする ボールグリッドアレイ。  (9) A ball grid array using the solder ball according to (8) as an electrical connection member.
(10)前記(8)に記載のはんだボールを電子部品に配置し、これを回路基板に接続 したことを特徴とする実装品。  (10) A mounted product, wherein the solder ball according to (8) is disposed on an electronic component and connected to a circuit board.
(11)前記(8)に記載のはんだ粉末を用いたことを特徴とするはんだペースト。  (11) A solder paste using the solder powder according to (8).
(12)前記(11)に記載のはんだペーストを用いたことを特徴とする実装品。  (12) A mounted product characterized by using the solder paste according to (11).
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0018] 以下に本発明の表面処理剤について詳述する。  Hereinafter, the surface treatment agent of the present invention will be described in detail.
本発明の表面処理剤で処理される金属としては、 Fe、 Ni、 Co、 Cr、 Cu、 Zn、 Sn、 Al、 Mg、 Ti、 Ag、 Au等が挙げられ、これらは合金であってもよレ、。特に Sn及び Sn 合金が好ましぐ Sn合金としては、環境汚染等の問題から鉛を含まない Sn合金がよ り好ましレヽ。 口、を含まなレヽ Sn合金としては、 Snに Zn、 Bi、 Cu、 In, Ag、 Sbのレヽずれ か一つもしくは二つ以上を含むはんだ合金等が挙げられる。  Examples of the metal to be treated with the surface treatment agent of the present invention include Fe, Ni, Co, Cr, Cu, Zn, Sn, Al, Mg, Ti, Ag, and Au, and these may be alloys. Les ,. In particular, Sn and Sn alloys are preferred. As a Sn alloy, a lead-free Sn alloy is more preferred because of problems such as environmental pollution. Examples of the Sn alloy that does not include a mouth include a solder alloy that includes one or more of Zn, Bi, Cu, In, Ag, and Sb in Sn.
[0019] 一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物、及び/又はその塩を、合計で 0. Olg/L以上含有する表面処理剤で表面処 理することにより、被処理材表面に耐酸化性を付与し、はんだ濡れ性を向上させるこ とができる。  [0019] A surface treating agent containing a total of at least 0.1 Olg / L of a compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and / or a salt thereof. By performing the surface treatment, oxidation resistance can be imparted to the surface of the material to be treated, and solder wettability can be improved.
一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物、及び/又はその塩の量が 0. 01g/L未満であるとその効果が小さい。また、 逆に添カ卩量が多過ぎても特性が劣化することはないため、添加量の上限はないが、 コスト的な H問題から、添力卩量は 0. 01— 500g/Lが望ましぐより好ましくは 0. 1— 10 Og/Lである。 It has two or more phosphonic acid groups in one molecule and does not contain ester bonds in the molecule If the amount of the compound and / or its salt is less than 0.01 g / L, the effect is small. Conversely, there is no upper limit on the amount of addition because there is no deterioration in the properties even if the amount of added koji is too large. More preferably, it is 0.1-10 Og / L.
[0020] また、本発明の表面処理剤は、分子内にエステル結合を含まない化合物を用いる ため、熱処理によるエステル結合の分解がなぐ比較的高温で熱処理しても十分な 酸化防止効果が得られる。従って、はんだ付け温度が比較的従来より高い鉛フリー  Further, since the surface treatment agent of the present invention uses a compound containing no ester bond in the molecule, a sufficient antioxidant effect can be obtained even at a relatively high temperature where the ester bond is not decomposed by the heat treatment. . Therefore, lead-free soldering temperature is relatively higher than before
X  X
はんだ対応の Sn及び Sn合金材に対しても、十分な耐酸化性を付与することができる  Sufficient oxidation resistance can be imparted to Sn and Sn alloy materials compatible with solder
[0021] また、一分子内に 2個以上のホスホン酸基を有する化合物の方が、一分子内にホス ホン酸基力 ^個の化合物より、詳細なメカニズムは不明であるが、耐酸化性能が優れ ることが判明した。一分子内のホスホン酸基の数は、コスト的な問題から 2 6が好ま しい。 [0021] The detailed mechanism of a compound having two or more phosphonic acid groups in one molecule is not clear as compared with a compound having two or more phosphonic acid groups in one molecule. Was found to be excellent. The number of phosphonic acid groups in one molecule is preferably 26 from the viewpoint of cost.
一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物、及び/又はその塩としては、例えば下記一般式 (1)、(Π)、 (III)で示されるィ匕 合物、及び/又はそのアルカリ金属塩、アンモニゥム塩、ァミン化合物との塩が挙げ られる。  As a compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and / or a salt thereof, for example, the following general formulas (1), ()), and (III) And / or an alkali metal salt, an ammonium salt, and a salt thereof with an amine compound.
[0022] [化 5] [0022] [Formula 5]
Figure imgf000007_0001
Figure imgf000007_0001
(式 (I)中、 x1— x3及び Y1— Y3は各々同一もしくは異なってもよぐ水素原子、又は 炭素数 1一 5の低級アルキル基を表す。 ) [0023] [化 6] (In the formula (I), x 1 —x 3 and Y 1 —Y 3 each represent a hydrogen atom which may be the same or different, or a lower alkyl group having 115 carbon atoms.) [0023] [Formula 6]
(式 (Π)中、
Figure imgf000008_0001
R2及び R4は、各々同一もしくは異なってもよぐ以下の基 (A)を表し 、 R3は、以下の基 (A)、又は炭素数 1一 5の低級アルキル基を表し、 nは 1一 3の整数 を表す。
(In the formula (Π),
Figure imgf000008_0001
R 2 and R 4 each represent the following groups (A) which may be the same or different; R 3 represents the following groups (A) or lower alkyl groups having 15 carbon atoms; Represents an integer of 1 to 3.
[化 7]  [Formula 7]
Figure imgf000008_0002
基 (A)中、 X1、及び Y1は、一般式 (I)における定義と同じである。 )
Figure imgf000008_0002
In the group (A), X 1 and Y 1 are the same as defined in the general formula (I). )
[0024] [化 8] [0024] [Formula 8]
O X o O X o
II I II H O - P - C - P - O H  II I II H O-P-C-P-O H
H O Y OH  H O Y OH
(式 (ΠΙ)中、 Xは水素原子、又は炭素数 1一 5の低級アルキル基を表し、 Yは水素原 子、炭素数 1一 5の低級アルキル基、水酸基、又はアミノ基を表す。 ) (In the formula (ΠΙ), X represents a hydrogen atom or a lower alkyl group having 115 carbon atoms, and Y represents a hydrogen atom, a lower alkyl group having 115 carbon atoms, a hydroxyl group, or an amino group.)
[0025] 上記一般式 (I)で表される化合物としては、二トリロトリスメチレンホスホン酸等がェ 業的に入手可能なため特に好ましい。 As the compound represented by the above general formula (I), ditrilotrismethylenephosphonic acid and the like are particularly preferable because they are commercially available.
同様に、上記一般式 (II)で表される化合物としては、エチレンジアミンテトラキスメチ レンホスホン酸、ジエチレントリァミンペンタキスメチレンホスホン酸等が特に好ましぐ 上記一般式(ΠΙ)で表される化合物としては、 1—ヒドロキシェタン一 1, 1—ジホスホン酸 等が特に好ましい。  Similarly, as the compound represented by the general formula (II), ethylenediaminetetrakismethylenephosphonic acid, diethylenetriaminepentakismethylenephosphonic acid and the like are particularly preferred. As the compound represented by the general formula (ΠΙ), , 1-hydroxyethane-1,1,1-diphosphonic acid and the like are particularly preferred.
[0026] 上記化合物のアルカリ金属塩としては、ナトリウム塩、カリウム塩等が好ましぐァミン 化合物との塩としては、トリェチルアミン塩ゃトリエタノールアミン塩等が好ましい。 The alkali metal salt of the above compound is preferably a sodium salt, a potassium salt or the like. As a salt with a compound, triethylamine salt / triethanolamine salt and the like are preferable.
[0027] 本発明の表面処理剤は、一分子内に 2個以上のホスホン酸基を持ち、分子内にェ ステル結合を含まない化合物、及び/又はその塩を溶媒に溶解して用いることがで きる。使用される溶媒としては、可溶であれば特に制限されるものでなレ、。例えば、水 や、アルコール、グリコール等の極性溶媒が挙げられる力 S、溶解度、、コスト等を考慮 すると水が好ましい。  [0027] The surface treatment agent of the present invention can be used by dissolving a compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and / or a salt thereof in a solvent. it can. The solvent used is not particularly limited as long as it is soluble. For example, water is preferred in consideration of the power S, solubility, cost, and the like, which include polar solvents such as water and alcohols and glycols.
[0028] また、水系表面処理剤の場合は、 pHを 5以下に調整することにより、被処理表面の 耐酸化性が更に向上することを見出した。表面処理剤の pHは、素材等への影響を 鑑み、より好ましくは pHl 5である。 pH調整剤としては、一般的に入手可能な酸、 アルカリが使用可能である。  [0028] Further, in the case of an aqueous surface treating agent, it has been found that by adjusting the pH to 5 or less, the oxidation resistance of the surface to be treated is further improved. The pH of the surface treatment agent is more preferably pH 15 in consideration of the influence on the material and the like. As the pH adjuster, generally available acids and alkalis can be used.
[0029] 更に、水系表面処理剤に界面活性剤を 0. 01— 10g/L添カ卩し、 pHを 5以下に調 整することにより、被処理表面の耐酸化性がよりいつそう向上する。界面活性剤の添 加量が 0. Olg/L未満であったり、 10g/Lを超えて添加しても耐酸化性の効果が 得られない。界面活性剤の添カ卩量は、好ましくは 0. 1— 10g/Lである。 [0029] Furthermore, by adding a surfactant to the aqueous surface treating agent at 0.01 to 10 g / L and adjusting the pH to 5 or less, the oxidation resistance of the surface to be treated is further improved. . Even if the amount of the surfactant added is less than 0.1 Olg / L or exceeds 10 g / L, the effect of oxidation resistance cannot be obtained. The amount of surfactant added to the surfactant is preferably 0.1 to 10 g / L.
界面活性剤としては、市販のァニオン系、カチオン系、ノニオン系、及び両性界面 活性剤の 1種もしくは 2種以上を適宜選択して使用することができる。  As the surfactant, one or more kinds of commercially available anionic, cationic, nonionic and amphoteric surfactants can be appropriately selected and used.
ァニオン系界面活性剤としては、硫酸エステル塩型、スルホン酸塩型、リン酸エステ ノレ塩型、スルホサクシネート型等が、カチオン系界面活性剤としては、四級アンモニ ゥム塩型、アミン塩型等力 ノニオン系界面活性剤としては、高級アルコールェチレ ンオキサイド付加物、アルキルフエノールエチレンオキサイド付加物、ポリオキシェチ レンポリオキシプロピレンブロックポリマー、エチレンジァミンのポリオキシエチレンポリ ォキシプロピレンブロックポリマー、高級脂肪族ァミンのエチレンオキサイド付加物、 脂肪族アミドのエチレンオキサイド付加物等が、両性界面活性剤としては、アミノ酸型 、ベタイン型等が好ましい。  Examples of anionic surfactants include sulfate ester type, sulfonate type, ester phosphate salt type, and sulfosuccinate type, and cationic surfactants include quaternary ammonium salt type and amine salt. Nonionic surfactants such as higher alcohol ethylene oxide adducts, alkylphenol ethylene oxide adducts, polyoxyethylene polyoxypropylene block polymers, polyoxyethylene polyoxypropylene block polymers of ethylenediamine, and higher aliphatic surfactants Preferred are ethylene oxide adducts of amines and ethylene oxide adducts of aliphatic amides, and the amphoteric surfactants are preferably amino acid type, betaine type and the like.
pHを 5以下の範囲で使用する際は、ァニオン系、ノニオン系の 1種もしくは 2種以上 を適宜選択して使用することが好ましい。中でも、ノニオン系界面活性剤では、ポリエ チレングリコール型が特に好ましぐ高級アルコールエチレンオキサイド付加物、アル キルフエノールエチレンオキサイド付加物、ポリオキシエチレンポリオキシプロピレン ブロックポリマー等を特に好ましく用いることができる、また、ァニオン系界面活性剤 では、硫酸エステル塩型、リン酸エステル塩型が特に好ましい。 When the pH is used in the range of 5 or less, it is preferable to appropriately select and use one or more of anionic and nonionic. Among them, among the nonionic surfactants, the polyethylene glycol type is particularly preferred, and higher alcohol ethylene oxide adducts, alkylphenol ethylene oxide adducts, and polyoxyethylene polyoxypropylene are particularly preferred. Block polymers and the like can be particularly preferably used, and among the anionic surfactants, sulfate ester type and phosphate ester type are particularly preferable.
[0030] また、本発明の表面処理剤は、所望の性能を付与させる目的で本来の性質を損な わない範囲の量の添加剤を含んでいてもよレ、。添加剤としては、防腐剤、 pH緩衝剤 等が挙げられ、これらは従来公知のものを用いることができる。  [0030] Further, the surface treatment agent of the present invention may contain an additive in an amount that does not impair the original properties for the purpose of imparting desired performance. Examples of the additive include a preservative, a pH buffer, and the like, and those conventionally known can be used.
[0031] 本発明の表面処理剤を用いて金属を表面処理するには、金属の表面に被膜を形 成する方法であればよぐ例えば、金属を単に表面処理剤に浸漬させる方法、表面 処理剤を、シャワー、又はエアードコータ、ブレードコータ、ロッドコータ、ナイフコータ 、グラビアコータ、リバースコータ、キャストコータなどの装置を用いて塗布する方法が 挙げられる。  [0031] The surface treatment of the metal using the surface treatment agent of the present invention may be any method that forms a film on the surface of the metal. For example, a method in which the metal is simply immersed in the surface treatment agent, a surface treatment Examples of the method include applying the agent using a shower or an apparatus such as an air coater, a blade coater, a rod coater, a knife coater, a gravure coater, a reverse coater, or a cast coater.
[0032] 本発明の表面処理剤で表面処理をする金属の形状は、線状、板 '帯'箔状、粒状、 粉末状等いずれの形状であってもよぐ本発明の表面処理剤は、電子部品、基板、 はんだボール、はんだ粉末等を処理することができる。  [0032] The shape of the metal to be surface-treated with the surface treatment agent of the present invention may be any shape such as a line, a plate 'band' foil, a particle, and a powder. It can process electronic components, substrates, solder balls, solder powder, etc.
本発明の表面処理剤を用い、電子部品もしくは基板の接続端子部の導体表面を 表面処理する、またはその導体表面にめっきを施した後に、表面処理することにより 、耐酸化性に優れ、はんだ濡れ性が改善された電子部品もしくは基板とすることがで きる。  By using the surface treatment agent of the present invention, the surface of the conductor of the connection terminal portion of the electronic component or the substrate is surface-treated, or the surface of the conductor is plated, and then the surface is treated, so that the oxidation resistance is excellent and the solder wets. An electronic component or a substrate having improved performance can be obtained.
本発明の表面処理剤で処理された Sn合金を用いたはんだボールは、耐酸化性に 優れ、電気的接続部材であるボールグリッドアレイとして、また、電子部品に配置し、 これを回路基板に接続した実装品として良好に用いることができる。  Solder balls using the Sn alloy treated with the surface treatment agent of the present invention have excellent oxidation resistance, are arranged as ball grid arrays as electrical connection members, and are arranged on electronic components and connected to circuit boards. It can be used favorably as a mounted product.
[0033] また、 Sn合金粉末を本発明の表面処理剤を用いて処理し、これに粘着剤、活性剤 、チクソトロピック剤、界面活性剤、溶剤等を含むフラックスをカ卩えてはんだペーストと して用レ、ることもできる。このはんだペーストは、その保存安定性に顕著な改善効果 が見られる。上記粘着剤、活性剤、チクソトロピック剤、界面活性剤、溶剤としては従 来公知のものを用いることができる。 [0033] Further, the Sn alloy powder is treated with the surface treatment agent of the present invention, and a flux containing an adhesive, an activator, a thixotropic agent, a surfactant, a solvent, and the like is added thereto to form a solder paste. You can also use it. This solder paste has a remarkable effect of improving the storage stability. Conventionally known adhesives, activators, thixotropic agents, surfactants, and solvents can be used.
実施例  Example
[0034] 以下に実施例を挙げて本発明を詳細に説明する。  Hereinafter, the present invention will be described in detail with reference to Examples.
実施例 1一 14、及び比較例 1一 5 一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物又はその塩を有効成分とする水溶液を 15種類調製した(実施例 1一 14、比較 例 1)。内訳を表 1に示す。 Examples 1 to 14 and Comparative Examples 1 to 5 Fifteen types of aqueous solutions containing two or more phosphonic acid groups in one molecule and containing no compound having an ester bond in the molecule or a salt thereof as an active ingredient were prepared (Examples 1 to 14 and Comparative Example 1). . Table 1 shows the breakdown.
[0035] 他方、銅材(C1020P、 10mm X 25mm X O. 2tmm)に対し、以下の前処理を行つ た。 On the other hand, the following pretreatment was performed on a copper material (C1020P, 10 mm × 25 mm × O. 2 tmm).
アルカリ電解脱脂 (常温、 15AZdm2、約 30秒程度処理)→水洗→酸浸漬(10%硫 酸、常温、 5秒)→水洗→化学研磨(CPB - 40、常温、 1分浸漬)→水洗→酸浸漬(1Alkali electrolytic degreasing (room temperature, 15AZdm 2, about 30 seconds to process) → water washing → acid dip (10% sulfuric acid, room temperature, 5 seconds) → water washing → chemical polishing (CPB - 40, room temperature, 1 minute immersion) → water washing → Acid immersion (1
0%硫酸、常温、 5秒)→水洗 (0% sulfuric acid, normal temperature, 5 seconds) → water washing
この基材に対し、膜厚約 5 x mの Snめっきを行つた(めっき浴:ティンコート K (日鉱 メタルプレーティング (株)製)、めっき条件:陰極電流密度 2A/dm2、温度 20°C、液 流動及び力ソード揺動めつき)。 This substrate was Sn plated with a thickness of about 5 xm (plating bath: Tincoat K (manufactured by Nikko Metal Plating Co., Ltd.), plating conditions: cathode current density 2A / dm 2 , temperature 20 ° C , Liquid flow and force sword rocking).
[0036] この Snめっきを施した基材(以下 Sn基材)を、上記の一分子内に 2個以上のホスホ ン酸基を持ち、分子内にエステル結合を含まない化合物又はその塩を含む溶液に、 浴温 60°Cで 10秒間浸漬した後、水洗し、乾燥させたものを試験基板とした。 [0036] The Sn-plated substrate (hereinafter referred to as Sn substrate) contains a compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, or a salt thereof. After being immersed in the solution at a bath temperature of 60 ° C. for 10 seconds, it was washed with water and dried to obtain a test substrate.
[0037] これらの試験基板に対し、以下の評価を行った。表 1に試験結果を示す。 The following evaluations were performed on these test substrates. Table 1 shows the test results.
耐熱酸化性  Thermal oxidation resistance
これらの試験基板を、 220°Cに保持した電気炉において、大気雰囲気で 1時間熱 処理した後、鉛フリーはんだとのはんだ付け性(ゼロクロスタイム)をメニスコグラフ法 で以下の測定条件に基づき測定した。  After heat-treating these test substrates in an electric furnace maintained at 220 ° C for 1 hour in the air atmosphere, the solderability (zero cross time) with lead-free solder was measured by the meniscograph method under the following measurement conditions. .
装置;ソルダーチェッカー SAT— 2000 (レス力製)  Equipment: Solder checker SAT-2000 (less power)
はんだ槽;すず:銀:銅 = 96· 5 : 3 : 0. 5 (浴温 245°C)  Solder bath; Tin: silver: copper = 96 · 5: 3: 0.5 (bath temperature 245 ° C)
フラックス; NA—200 (タムラ化研製)  Flux: NA-200 (Tamura Kaken)
浸漬深さ; 2mm  Immersion depth: 2mm
浸漬速度; 4mm/se  Immersion speed: 4mm / se
浸漬時間; 5sec.  Immersion time: 5sec.
[0038] 耐湿酸化性 [0038] Moisture and oxidation resistance
これらの試験基板に対し、 PCT処理(温度 105°C、湿度 100%の密閉釜内にて 16 時間放置)を施した後、鉛フリーはんだとのはんだ付け性(ゼロクロスタイム)をメニス コグラフ法で耐熱酸化性の項と同様に測定した。 After subjecting these test substrates to PCT treatment (leaving them in a closed oven at a temperature of 105 ° C and a humidity of 100% for 16 hours), the solderability (zero cross time) with lead-free solder was measured using a meniscus. It was measured by the cograph method in the same manner as in the term of thermal oxidation resistance.
[0039] また、更に比較例として、上記 Sn基材に対し、ドデシルホスホン酸を lg/L含むィ ソプロパノール溶液で表面処理した基材(但し、表面処理後の水洗なし、比較例 2)、 ホスホン酸ジェチルエステルを lgZL含む水溶液で表面処理した基材(比較例 3)、 未処理の上記 Sn基材(比較例 4)、上記 Sn基材に対し、特開平 7 - 188942号公報 に開示された表面処理剤(リン酸ジフヱニルエステルを 0. lg/L含む水溶液)を用い 処理を行った基板(比較例 5)も併せて評価した。試験結果を併せて表 1に示す。  Further, as a comparative example, a substrate treated with an isopropanol solution containing lg / L of dodecylphosphonic acid on the above Sn substrate (however, without water washing after the surface treatment, Comparative Example 2), Japanese Unexamined Patent Publication No. 7-188942 discloses a base material treated with an aqueous solution containing lgZL phosphonate lgZL (Comparative Example 3), the untreated Sn base material (Comparative Example 4), and the Sn base material. A substrate (Comparative Example 5) treated with the surface treatment agent (aqueous solution containing 0.1 g / L of diphenyl phosphate) was also evaluated. Table 1 also shows the test results.
[0040] [表 1] [0040] [Table 1]
表 1 表面 ¾¾W§J*と «S果 (S nめつき **ί)Table 1 Surface ¾¾W§J * and «S fruit (S n ****)
Figure imgf000013_0001
Figure imgf000013_0001
Figure imgf000013_0002
Figure imgf000013_0002
@=ゼロクロスタイム 1 ¾*¾ 0=ゼロクロスタイム 1秒 J¾±3«J*満、 △=ゼロクロスタイム 3秒 ¾±5«*満、 x=ゼロクロスタイム 5秒 JiLh @ = Zero cross time 1 ¾ * ¾ 0 = zero cross time 1 second J¾ ± 3 «J * full, △ = zero cross time 3 seconds ¾ ± 5« * full, x = zero cross time 5 seconds JiLh
前記実施例 1一 14、及び比較例 1一 5と同様な前処理を行った銅材(C1020P、 1 Omm X 25mm X 0. 2 mm)に対し、膜厚約 5 μ mの Sn— Ζηめっきを行った(めっき 浴:日鉱メタルプレーティング (株)製、めっき条件:陰極電流密度 3A/dm2、温度 35 °C、 pH4. 0、液流動及び力ソード揺動めつき)。 A copper material (C1020P, 1 Omm X 25 mm X 0.2 mm) subjected to the same pretreatment as in Example 114 and Comparative Example 115 was subjected to Sn- Snη plating with a film thickness of about 5 μm. (Plating bath: manufactured by Nikko Metal Plating Co., Ltd., plating conditions: cathodic current density 3 A / dm 2 , temperature 35 ° C., pH 4.0, liquid flow and force swinging).
この Sn— Znめっきを施した基材 (以下 Sn— Zn基材)を、前記実施例 1一 14、比較 例 1一 3、及び比較例 5にて調製した溶液に、浴温 60°Cで 10秒間浸漬した後、水洗 し、乾燥させたもの、及び未処理のものを試験基板とした。  The Sn—Zn-plated substrate (hereinafter referred to as Sn—Zn substrate) was added to the solutions prepared in Examples 1-11, Comparative Examples 1-3, and Comparative Example 5 at a bath temperature of 60 ° C. After immersion for 10 seconds, the substrate washed with water, dried, and untreated were used as test substrates.
これらの試験基板に対し、前記実施例 1一 14、及び比較例 1一 5と同様に、エージ ングを行った後、はんだ付け性の測定を行った。試験結果を表 2に示す。  After aging was performed on these test substrates in the same manner as in Example 114 and Comparative Example 115, the solderability was measured. Table 2 shows the test results.
[0042] また、更に比較例として、未処理の上記 Sn— Zn基材に対し、特願 2002— 304554 号に示された表面処理剤(モノジォクタデシニルリン酸エステルの lwt%イソプロパノ ール溶液)を用レ、処理を行つた基板(比較例 11 )も併せて評価した。試験結果を併 せて表 2に示す。 Further, as a comparative example, a surface treatment agent (lwt% isopropanol of monodioctadecynyl phosphate) described in Japanese Patent Application No. 2002-304554 was used for the untreated Sn—Zn substrate. And the treated substrate (Comparative Example 11) was also evaluated. Table 2 shows the test results.
[0043] [表 2] [Table 2]
Figure imgf000015_0002
Figure imgf000015_0001
Figure imgf000015_0002
Figure imgf000015_0001
前記実施例 7と同等の処理をした Snめっき基板と、表面処理をしなかった基板を、 温度 85°C、湿度 85%の恒温恒湿雰囲気下において、 24時間放置した。その後、基 板を充分に乾燥した後、走査型電子顕微鏡 (SEM)にて表面観察したところ、表面 処理をしなかったものは、ゥイスカーが多く観察された(比較例 12)のに対し、表面処 理をしたものからは、ゥイスカーが全く観察されなかった(実施例 29)。 The Sn-plated substrate treated in the same manner as in Example 7 and the substrate not subjected to the surface treatment were allowed to stand in a constant temperature and humidity atmosphere of 85 ° C. and 85% humidity for 24 hours. After that, the substrate was sufficiently dried, and the surface was observed with a scanning electron microscope (SEM). In the case where the surface was not treated, many whiskers were observed (Comparative Example 12). No whiskers were observed in the treated products (Example 29).
産業上の利用可能性  Industrial applicability
[0045] 一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物、及び/又はその塩の 1種もしくは 2種以上を合計で 0. Olg/L以上含む表面 処理剤で金属を表面処理することにより、耐酸化性を付与し、はんだ濡れ性を改善 すること力 Sできる。この表面処理剤の pHを 5以下にすることにより、更に界面活性剤 を 0. 01— 10g/L含有させることにより耐酸化性が向上する。  [0045] A compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule, and / or one or two or more of salts thereof in total of 0.1 Olg / L or more By treating the surface of the metal with a surface treatment agent containing it, it can impart oxidation resistance and improve solder wettability. By adjusting the pH of this surface treatment agent to 5 or less, and further adding a surfactant of 0.01 to 10 g / L, the oxidation resistance is improved.
[0046] また、本発明の表面処理剤を用いて表面処理を施した Sn合金はんだ粉末を含む はんだペーストは、その保存安定性が著しく改善される。更に、 Sn及び Sn合金めつ きを本発明の表面処理剤を用いて処理することにより、ゥイスカーの発生を大幅に抑 制すること力 Sできる。  [0046] The storage stability of the solder paste containing the Sn alloy solder powder subjected to the surface treatment using the surface treatment agent of the present invention is remarkably improved. Further, by treating Sn and the Sn alloy with the surface treatment agent of the present invention, the generation of whiskers can be significantly suppressed.

Claims

請求の範囲 [1] 一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物、及 Hび/又はその塩の 1種もしくは 2種以上を合計で 0. 01g/L以上含むことを 特徴とする金属の表面処理剤。 [2] 一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まない化 合物、及び/又はその塩の 1種もしくは 2種以上を合計で 0. 01g/L以上含み、溶 液の pHを 5以下に調整したことを特徴とする金属の表面処理剤。 ¾ [3] 更に界面活性剤を 0. 01g/L— 10g/L含有することを特徴とする請求の範囲 2記 載の金属の表面処理剤。 [4] 前記一分子内に 2個以上のホスホン酸基を持ち、分子内にエステル結合を含まな い化合物、及び/又はその塩が下記式 (1)、(Π)又は(III)で表される化合物、及び/又はそのアルカリ金属塩、アンモニゥム塩、又はアミン化合物との塩であることを特 徴とする請求の範囲 1一 3のいずれか一項に記載の金属の表面処理剤。 Claims [1] A compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and one or more of H and / or a salt thereof in a total of 0 A metal surface treatment agent containing at least 01 g / L. [2] A compound having two or more phosphonic acid groups in one molecule and containing no ester bond in the molecule, and / or one or more salts thereof in a total of 0.01 g / L or more A metal surface treatment agent, wherein the pH of the solution is adjusted to 5 or less. ¾ [3] The metal surface treating agent according to claim 2, further comprising a surfactant in an amount of 0.01 g / L to 10 g / L. [4] The compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule, and / or a salt thereof is represented by the following formula (1), (Π) or (III). 14. The metal surface treatment agent according to claim 13, wherein the metal surface treatment agent is a compound to be used and / or a salt thereof with an alkali metal salt, an ammonium salt, or an amine compound.
[化 1]  [Chemical 1]
Figure imgf000017_0001
Figure imgf000017_0001
(式 (I)中、 X1 X3及び Y1— Y3は各々同一もしくは異なってもよぐ水素原子、又は 炭素数 1一 5の低級アルキル基を表す。 ) (In the formula (I), X 1 X 3 and Y 1 —Y 3 each represent a hydrogen atom which may be the same or different, or a lower alkyl group having 115 carbon atoms.)
[化 2]  [Formula 2]
R3 R 3
R1 . IR 1 .I
N _ [ C H 2 _ C H 2 _ N ] n— R4 (Π) N _ [CH 2 _ CH 2 _ N] n — R 4 (Π)
R2 ^ R 2 ^
(式 (Π)中、
Figure imgf000017_0002
R2及び R4は、各々同一もしくは異なってもよぐ以下の基 (A)を表し 、 Rは、以下の基 (A)、又は炭素数 1一 5の低級アルキル基を表し、 nは 1一 3の整数 を表す。
(In the formula (Π),
Figure imgf000017_0002
R 2 and R 4 each represent the following groups (A) which may be the same or different And R represent the following group (A) or a lower alkyl group having 115 carbon atoms, and n represents an integer of 113.
[化 3] c X Y I I丄
Figure imgf000018_0001
基 (A)中、 X1、及び Y1は、一般式 (I)における定義と同じである。 )
[Formula 3] c XYII 丄
Figure imgf000018_0001
In the group (A), X 1 and Y 1 are the same as defined in the general formula (I). )
[化 4] H  [Formula 4] H
Figure imgf000018_0002
Figure imgf000018_0002
T O Y OH  T O Y OH
(式 (ΠΙ)中、 Xは水素原子、又は炭素数 1一 5の低級アルキル基を表し、 Yは水素原 子、炭素数 1一 5の低級アルキル基、水酸基、又はアミノ基を表す。 ) (In the formula (ΠΙ), X represents a hydrogen atom or a lower alkyl group having 115 carbon atoms, and Y represents a hydrogen atom, a lower alkyl group having 115 carbon atoms, a hydroxyl group, or an amino group.)
[5] 前記金属が Sn又は Sn合金であることを特徴とする請求の範囲 1一 4のいずれか一 項に記載の金属の表面処理剤。 [5] The metal surface treating agent according to any one of [14] to [14], wherein the metal is Sn or a Sn alloy.
[6] 請求の範囲 1一 5のいずれか一項に記載の金属の表面処理剤による表面処理方 法。 [6] A method for treating a metal with a surface treating agent according to any one of claims 115.
[7] 電子部品もしくは基板の接続端子部の導体表面に、またはその表面にめっきを施 した後に、請求の範囲 6に記載の表面処理方法により表面処理を行ったことを特徴と する電子部品もしくは基板。  [7] An electronic component or a component characterized in that a surface treatment is performed by the surface treatment method according to claim 6, after plating on the conductor surface of the connection terminal portion of the electronic component or the board, or after plating the surface. substrate.
[8] 請求の範囲 6に記載の表面処理方法により表面処理を行った Sn合金を用いたこと を特徴とするはんだボール、又ははんだ粉末。 [8] A solder ball or solder powder using a Sn alloy surface-treated by the surface treatment method according to claim 6.
[9] 請求の範囲 8記載のはんだボールを電気的接続部材として用いたことを特徴とする ボールグリッドアレイ。 [9] A ball grid array using the solder ball according to claim 8 as an electrical connection member.
[10] 請求の範囲 8に記載のはんだボールを電子部品に配置し、これを回路基板に接続 したことを特徴とする実装品。 請求の範囲 8に記載のはんだ粉末を用いたことを特徴とするはんだペースト。 請求の範囲 11に記載のはんだペーストを用いたことを特徴とする実装品。 [10] A mounted product, wherein the solder ball according to claim 8 is arranged on an electronic component and connected to a circuit board. A solder paste comprising the solder powder according to claim 8. A mounted product using the solder paste according to claim 11.
PCT/JP2005/002813 2004-03-05 2005-02-22 Metal surface treating agent WO2005085498A1 (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007197791A (en) * 2006-01-27 2007-08-09 Daiwa Fine Chemicals Co Ltd (Laboratory) Composition of post-treatment agent for plating
WO2010081833A3 (en) * 2009-01-14 2010-09-16 Atotech Deutschland Gmbh Solution and process for increasing the solderability and corrosion resistance of a metal or metal alloy surface
WO2012073783A1 (en) * 2010-12-01 2012-06-07 Jx日鉱日石金属株式会社 Surface treatment agent for pd or alloy mainly composed of pd, and surface coating layer structure of copper surface
CN104805425A (en) * 2012-12-13 2015-07-29 蒋红娟 Treatment fluid capable of forming corrosion-resistant protecting film on surface of polar plate

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104894569B (en) * 2015-06-30 2018-03-02 长沙理工大学 Ni-Pd metal surface treatment agent
CN107326413A (en) * 2017-07-04 2017-11-07 苏州道蒙恩电子科技有限公司 A kind of electrotinning fastness inorganic agent and application method
CN115070259A (en) * 2022-07-15 2022-09-20 深圳市同方电子新材料有限公司 Novel environment-friendly lead-free soldering paste of superfine soldering tin powder

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000332399A (en) * 1999-05-24 2000-11-30 Sumitomo Metal Mining Co Ltd Solder ball and manufacture thereof
JP2003193255A (en) * 2001-12-26 2003-07-09 Kansai Paint Co Ltd Surface treatment composition for metallic material

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000332399A (en) * 1999-05-24 2000-11-30 Sumitomo Metal Mining Co Ltd Solder ball and manufacture thereof
JP2003193255A (en) * 2001-12-26 2003-07-09 Kansai Paint Co Ltd Surface treatment composition for metallic material

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007197791A (en) * 2006-01-27 2007-08-09 Daiwa Fine Chemicals Co Ltd (Laboratory) Composition of post-treatment agent for plating
WO2010081833A3 (en) * 2009-01-14 2010-09-16 Atotech Deutschland Gmbh Solution and process for increasing the solderability and corrosion resistance of a metal or metal alloy surface
US8491713B2 (en) 2009-01-14 2013-07-23 Atotech Deutschland Gmbh Solution and process for increasing the solderability and corrosion resistance of a metal or metal alloy surface
WO2012073783A1 (en) * 2010-12-01 2012-06-07 Jx日鉱日石金属株式会社 Surface treatment agent for pd or alloy mainly composed of pd, and surface coating layer structure of copper surface
JP5649139B2 (en) * 2010-12-01 2015-01-07 Jx日鉱日石金属株式会社 Surface coating layer structure on copper surface
CN104805425A (en) * 2012-12-13 2015-07-29 蒋红娟 Treatment fluid capable of forming corrosion-resistant protecting film on surface of polar plate

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CN1930323A (en) 2007-03-14
TWI301515B (en) 2008-10-01
TW200533783A (en) 2005-10-16
KR100802878B1 (en) 2008-02-13
JP4518507B2 (en) 2010-08-04
JPWO2005085498A1 (en) 2008-04-24
CN102424965A (en) 2012-04-25
KR20060122967A (en) 2006-11-30

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