WO2005038475A1 - 絶縁劣化診断装置 - Google Patents

絶縁劣化診断装置 Download PDF

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Publication number
WO2005038475A1
WO2005038475A1 PCT/JP2004/015631 JP2004015631W WO2005038475A1 WO 2005038475 A1 WO2005038475 A1 WO 2005038475A1 JP 2004015631 W JP2004015631 W JP 2004015631W WO 2005038475 A1 WO2005038475 A1 WO 2005038475A1
Authority
WO
WIPO (PCT)
Prior art keywords
signal
current
discharge
pass filter
frequency
Prior art date
Application number
PCT/JP2004/015631
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Takashi Shinmoto
Yuji Urabe
Tatsuya Murofushi
Tatsuya Ogawa
Original Assignee
Fujikura Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd. filed Critical Fujikura Ltd.
Priority to JP2005513567A priority Critical patent/JP4592592B2/ja
Priority to GB0609189A priority patent/GB2422967B/en
Priority to US10/576,451 priority patent/US7285961B2/en
Publication of WO2005038475A1 publication Critical patent/WO2005038475A1/ja
Priority to HK07101335A priority patent/HK1094467A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/1272Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
PCT/JP2004/015631 2003-10-22 2004-10-21 絶縁劣化診断装置 WO2005038475A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005513567A JP4592592B2 (ja) 2003-10-22 2004-10-21 絶縁劣化診断装置
GB0609189A GB2422967B (en) 2003-10-22 2004-10-21 Insulation degradation diagnostic device
US10/576,451 US7285961B2 (en) 2003-10-22 2004-10-21 Insulation degradation diagnostic device
HK07101335A HK1094467A1 (en) 2003-10-22 2007-02-05 Insulation degradation diagnostic device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2003362135 2003-10-22
JP2003-362135 2003-10-22
JP2004-048148 2004-02-24
JP2004048148 2004-02-24

Publications (1)

Publication Number Publication Date
WO2005038475A1 true WO2005038475A1 (ja) 2005-04-28

Family

ID=34467809

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2004/015631 WO2005038475A1 (ja) 2003-10-22 2004-10-21 絶縁劣化診断装置

Country Status (7)

Country Link
US (1) US7285961B2 (ko)
JP (1) JP4592592B2 (ko)
KR (1) KR100812291B1 (ko)
CN (1) CN100480713C (ko)
GB (1) GB2422967B (ko)
HK (1) HK1094467A1 (ko)
WO (1) WO2005038475A1 (ko)

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WO2007144789A2 (en) * 2006-06-13 2007-12-21 Techimp Technologies S.A. Instrument and method for measuring partial electrical discharges in an electrical system
JP2010230497A (ja) * 2009-03-27 2010-10-14 Kanto Denki Hoan Kyokai 高圧受電設備の絶縁劣化診断装置
CN102735977A (zh) * 2012-07-12 2012-10-17 四川大学 高压大电流下电缆附件的电热老化装置及其试验方法
JP2014002095A (ja) * 2012-06-20 2014-01-09 Fujikura Ltd 部分放電測定方法
CN106483430A (zh) * 2015-08-26 2017-03-08 斯凯孚公司 通过输入信号混叠的局部放电检测频带扩展
KR102079874B1 (ko) * 2018-10-05 2020-04-13 한국전력공사 부분 방전 진단 장치 및 방법
WO2020161967A1 (ja) * 2019-02-04 2020-08-13 住友電気工業株式会社 部分放電検出装置
JP2020537118A (ja) * 2017-10-11 2020-12-17 リテルフューズ、インコーポレイテッド 電流フローの変化に基づくアーク検出

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CN101160713B (zh) * 2005-04-15 2011-07-27 株式会社日立制作所 交流电动机控制装置
US8482338B1 (en) * 2005-10-13 2013-07-09 Marvell International Ltd. Shock detector with DC offset suppression using internal components
EP2107384A1 (en) * 2008-03-31 2009-10-07 ABB Research Ltd. Determining degraded insulating ability in an inductively operating element
US8093906B2 (en) * 2008-04-02 2012-01-10 Caterpillar, Inc. System and method for testing winding insulation resistance
ES2370613T3 (es) * 2008-04-14 2011-12-20 Abb Research Ltd. Determinación de la capacidad aislante degradada en un aislamiento previsto entre dos objetos de un elemento de funcionamiento inductivo.
ZA200905123B (en) * 2008-08-06 2010-05-26 Eskom Holdings Pty Ltd Partial discharge monitor
JP2010271091A (ja) 2009-05-20 2010-12-02 Seiko Epson Corp 周波数測定装置
JP5517033B2 (ja) * 2009-05-22 2014-06-11 セイコーエプソン株式会社 周波数測定装置
JP5440999B2 (ja) 2009-05-22 2014-03-12 セイコーエプソン株式会社 周波数測定装置
GB0911574D0 (en) * 2009-07-03 2009-08-12 Ea Tech Ltd Current passage indicator
JP5582447B2 (ja) 2009-08-27 2014-09-03 セイコーエプソン株式会社 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス
JP5815918B2 (ja) 2009-10-06 2015-11-17 セイコーエプソン株式会社 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置
JP5876975B2 (ja) 2009-10-08 2016-03-02 セイコーエプソン株式会社 周波数測定装置及び周波数測定装置における変速分周信号の生成方法
IT1398250B1 (it) 2010-03-10 2013-02-22 Techimp Technologies S A Ora Techimp Technologies S R L Strumento e procedimento per rilevare scariche elettriche parziali
DE102010013103B4 (de) * 2010-03-29 2015-06-11 B2 Electronic Gmbh Vorrichtung und Verfahren zur Diagnose von Messobjekten unter Verwendung einer Messspannung
KR101434079B1 (ko) * 2010-04-14 2014-08-25 미쓰비시덴키 가부시키가이샤 절연 열화 진단 장치
JP5475555B2 (ja) * 2010-06-08 2014-04-16 株式会社日立製作所 配電設備劣化診断装置
JP5883558B2 (ja) 2010-08-31 2016-03-15 セイコーエプソン株式会社 周波数測定装置及び電子機器
US8446154B2 (en) * 2010-09-24 2013-05-21 The Boeing Company Methods and systems for quantifying degradation of wiring insulation
CN102914729B (zh) * 2012-10-16 2015-08-05 西安交通大学 一种矿用电缆局部放电在线监测与定位脉冲发射装置
CN103344889B (zh) * 2013-07-02 2015-08-05 华北电力大学 一种用电容跳线来测量电缆局部放电的方法
CN104965161B (zh) * 2015-05-29 2017-11-07 广西电网有限责任公司电力科学研究院 一种电缆绝缘介质谱及局部放电缺陷检测方法及装置
KR101762505B1 (ko) 2015-09-14 2017-07-28 아주대학교산학협력단 케이블 검사 장치
EP3361587B1 (en) * 2017-02-10 2020-11-25 Airbus Operations GmbH Protection and fault detection for high voltage power lines on aircraft
TWI599782B (zh) 2017-02-14 2017-09-21 徐政村 室內配電線品質檢測裝置
RU2651641C1 (ru) * 2017-04-27 2018-04-23 Федеральное государственное бюджетное образовательное учреждение высшего образования "Кубанский государственный аграрный университет имени И.Т. Трубилина" Способ оценки качества кабеля
CA3007729A1 (en) 2017-06-12 2018-12-12 Vibrosystm Inc. Method of monitoring partial discharges in a high voltage electric machine, and connection cable therefore
KR20200135428A (ko) * 2018-03-20 2020-12-02 위스커 랩스 인코포레이티드 전기 배선에서 화재들에 선행하는 전기 방전들의 검출
EP3570052A1 (de) * 2018-05-18 2019-11-20 Siemens Aktiengesellschaft Verfahren zur messung eines gepulsten hochfrequenten ereignissignals
JP7184706B2 (ja) * 2019-05-10 2022-12-06 株式会社日立産機システム 電力変換装置、それを用いたシステム、およびその診断方法
CN111239565B (zh) * 2020-02-26 2022-05-24 国网陕西省电力公司电力科学研究院 基于分层式去噪模型的充油套管局部放电脉冲信号处理方法及系统
CN114280432B (zh) * 2021-11-24 2023-10-13 浙江新图维电子科技有限公司 一种电缆局放监测设备及方法

Citations (4)

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Publication number Priority date Publication date Assignee Title
JPS585677A (ja) * 1981-07-01 1983-01-13 Showa Electric Wire & Cable Co Ltd 電力ケ−ブルの部分放電検出方法
JPH0560827A (ja) * 1991-09-02 1993-03-12 Mitsui Petrochem Ind Ltd 絶縁劣化検出装置
JP2004085479A (ja) * 2002-08-28 2004-03-18 Central Res Inst Of Electric Power Ind 電力ケーブルの劣化診断方法及び電力ケーブルの劣化診断用装置
JP2004347424A (ja) * 2003-05-21 2004-12-09 Fujikura Ltd 活線絶縁劣化診断方法及びその装置

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JPS585677A (ja) * 1981-07-01 1983-01-13 Showa Electric Wire & Cable Co Ltd 電力ケ−ブルの部分放電検出方法
JPH0560827A (ja) * 1991-09-02 1993-03-12 Mitsui Petrochem Ind Ltd 絶縁劣化検出装置
JP2004085479A (ja) * 2002-08-28 2004-03-18 Central Res Inst Of Electric Power Ind 電力ケーブルの劣化診断方法及び電力ケーブルの劣化診断用装置
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Cited By (15)

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CN103809088A (zh) * 2006-06-13 2014-05-21 特英普科技股份责任有限公司 用于测量电气系统中局部放电的仪器和方法
WO2007144789A3 (en) * 2006-06-13 2008-02-21 Techimp S P A Instrument and method for measuring partial electrical discharges in an electrical system
US8055459B2 (en) 2006-06-13 2011-11-08 Techimp Technologies S.R.L. Instrument and method for measuring partial electrical discharges in an electrical system
KR101423753B1 (ko) 2006-06-13 2014-08-13 테크임프 테크놀로지스 에스.알.엘. 전기 시스템 내의 부분 전기 방전의 측정 장치 및 방법
KR101321561B1 (ko) 2006-06-13 2013-10-25 테크임프 테크놀로지스 에스.알.엘. 전기 시스템 내의 부분 전기 방전의 측정 장치 및 방법
WO2007144789A2 (en) * 2006-06-13 2007-12-21 Techimp Technologies S.A. Instrument and method for measuring partial electrical discharges in an electrical system
JP2010230497A (ja) * 2009-03-27 2010-10-14 Kanto Denki Hoan Kyokai 高圧受電設備の絶縁劣化診断装置
JP2014002095A (ja) * 2012-06-20 2014-01-09 Fujikura Ltd 部分放電測定方法
CN102735977A (zh) * 2012-07-12 2012-10-17 四川大学 高压大电流下电缆附件的电热老化装置及其试验方法
CN106483430A (zh) * 2015-08-26 2017-03-08 斯凯孚公司 通过输入信号混叠的局部放电检测频带扩展
CN106483430B (zh) * 2015-08-26 2020-11-06 Avo公司 通过输入信号混叠的局部放电检测频带扩展
JP2020537118A (ja) * 2017-10-11 2020-12-17 リテルフューズ、インコーポレイテッド 電流フローの変化に基づくアーク検出
JP7275448B2 (ja) 2017-10-11 2023-05-18 リテルフューズ、インコーポレイテッド 電流フローの分散に基づくアーク検出
KR102079874B1 (ko) * 2018-10-05 2020-04-13 한국전력공사 부분 방전 진단 장치 및 방법
WO2020161967A1 (ja) * 2019-02-04 2020-08-13 住友電気工業株式会社 部分放電検出装置

Also Published As

Publication number Publication date
JP4592592B2 (ja) 2010-12-01
GB2422967A (en) 2006-08-09
KR20060085947A (ko) 2006-07-28
CN1871523A (zh) 2006-11-29
CN100480713C (zh) 2009-04-22
KR100812291B1 (ko) 2008-03-10
US20070085548A1 (en) 2007-04-19
JPWO2005038475A1 (ja) 2007-01-18
GB2422967B (en) 2007-06-06
GB0609189D0 (en) 2006-06-21
US7285961B2 (en) 2007-10-23
HK1094467A1 (en) 2007-05-04

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