WO2005029532A3 - Massenspektrometer und flüssigmetall-ionenquelle für ein solches massenspektrometer - Google Patents

Massenspektrometer und flüssigmetall-ionenquelle für ein solches massenspektrometer Download PDF

Info

Publication number
WO2005029532A3
WO2005029532A3 PCT/EP2004/007154 EP2004007154W WO2005029532A3 WO 2005029532 A3 WO2005029532 A3 WO 2005029532A3 EP 2004007154 W EP2004007154 W EP 2004007154W WO 2005029532 A3 WO2005029532 A3 WO 2005029532A3
Authority
WO
WIPO (PCT)
Prior art keywords
ion
bismuth
mass spectrometer
liquid
type
Prior art date
Application number
PCT/EP2004/007154
Other languages
English (en)
French (fr)
Other versions
WO2005029532A2 (de
Inventor
Felix Kollmer
Peter Hoerster
Original Assignee
Ion Tof Gmbh
Felix Kollmer
Peter Hoerster
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34305558&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO2005029532(A3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Ion Tof Gmbh, Felix Kollmer, Peter Hoerster filed Critical Ion Tof Gmbh
Priority to EP04740521A priority Critical patent/EP1658632B1/de
Priority to US10/568,832 priority patent/US20060202130A1/en
Priority to JP2006524234A priority patent/JP5128814B2/ja
Priority to US10/568,832 priority patent/US9378937B2/en
Publication of WO2005029532A2 publication Critical patent/WO2005029532A2/de
Publication of WO2005029532A3 publication Critical patent/WO2005029532A3/de
Priority to US13/347,792 priority patent/US20120104249A1/en
Priority to US15/152,757 priority patent/US20160254134A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/26—Ion sources; Ion guns using surface ionisation, e.g. field effect ion sources, thermionic ion sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Combustion & Propulsion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

Massenspektrometer mit einer Ionenquelle zur Erzeugung eines Primärionenstrahls, die einen heizbaren Ionenemitter besitzt, der mit einer Flüssigmetall-Schicht überzogen ist, die im wesentlichen aus reinem metallischen Bismut oder einer niedrigschmelzenden, im wesentlichen Bismut enthaltenden Legierung besteht, wobei mit dem Ionenemitter unter Einfluss eines elektrischen Feldes ein Bismutionen-Mischstrahl emittierbar ist, aus dem eine von mehreren Bismutionenarten, deren Masse ein Mehrfaches des monoatomaren, ein- oder mehrfach geladenen Bismutions Bi1p+ beträgt, als massenreiner Ionenstrahl herauszufiltern ist, der ausschliesslich aus Ionen einer Art Binp+ besteht, bei denen n≥2 und p≥1 ist und n und p jeweils eine natürlich Zahl ist.
PCT/EP2004/007154 2003-08-25 2004-07-01 Massenspektrometer und flüssigmetall-ionenquelle für ein solches massenspektrometer WO2005029532A2 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
EP04740521A EP1658632B1 (de) 2003-08-25 2004-07-01 Massenspektrometer und flüssigmetall-ionenquelle für ein solches massenspektrometer
US10/568,832 US20060202130A1 (en) 2003-08-25 2004-07-01 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type
JP2006524234A JP5128814B2 (ja) 2003-08-25 2004-07-01 質量分析器およびこの質量分析器のための液体金属イオン源
US10/568,832 US9378937B2 (en) 2003-08-25 2004-07-01 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type
US13/347,792 US20120104249A1 (en) 2003-08-25 2012-01-11 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type
US15/152,757 US20160254134A1 (en) 2003-08-25 2016-05-12 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10339346A DE10339346B8 (de) 2003-08-25 2003-08-25 Massenspektrometer und Flüssigmetall-Ionenquelle für ein solches Massenspektrometer
DE10339346.3 2003-08-25

Related Child Applications (3)

Application Number Title Priority Date Filing Date
US10/568,832 A-371-Of-International US9378937B2 (en) 2003-08-25 2004-07-01 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type
US13/347,792 Continuation US20120104249A1 (en) 2003-08-25 2012-01-11 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type
US15/152,757 Continuation US20160254134A1 (en) 2003-08-25 2016-05-12 Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type

Publications (2)

Publication Number Publication Date
WO2005029532A2 WO2005029532A2 (de) 2005-03-31
WO2005029532A3 true WO2005029532A3 (de) 2006-04-20

Family

ID=34305558

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2004/007154 WO2005029532A2 (de) 2003-08-25 2004-07-01 Massenspektrometer und flüssigmetall-ionenquelle für ein solches massenspektrometer

Country Status (6)

Country Link
US (4) US9378937B2 (de)
EP (1) EP1658632B1 (de)
JP (3) JP5128814B2 (de)
AT (1) ATE408891T1 (de)
DE (1) DE10339346B8 (de)
WO (1) WO2005029532A2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005027937B3 (de) * 2005-06-16 2006-12-07 Ion-Tof Gmbh Verfahren zur Analyse einer Festkörperprobe
US20090114809A1 (en) * 2005-09-02 2009-05-07 Australian Nuclear Science & Technology Organisation Isotope ratio mass spectrometer and methods for determining isotope ratios
US8080930B2 (en) * 2006-09-07 2011-12-20 Michigan Technological University Self-regenerating nanotips for low-power electric propulsion (EP) cathodes
US20080128608A1 (en) * 2006-11-06 2008-06-05 The Scripps Research Institute Nanostructure-initiator mass spectrometry
JP2008185547A (ja) * 2007-01-31 2008-08-14 Canon Inc 情報取得方法及び情報取得装置
JP4854590B2 (ja) * 2007-05-11 2012-01-18 キヤノン株式会社 飛行時間型２次イオン質量分析装置
US7723697B2 (en) * 2007-09-21 2010-05-25 Varian Semiconductor Equipment Associates, Inc. Techniques for optical ion beam metrology
EP2056333B1 (de) 2007-10-29 2016-08-24 ION-TOF Technologies GmbH Flüssigmetallionenquelle, Sekundärionenmassenspektrometer, sekundärionenmassenspektrometisches Analyseverfahren sowie deren Verwendungen
WO2009061313A1 (en) * 2007-11-06 2009-05-14 The Scripps Research Institute Nanostructure-initiator mass spectrometry
EP2313230A4 (de) * 2008-07-09 2017-03-08 FEI Company Verfahren und vorrichtung für laserbearbeitung
CN102226981B (zh) * 2011-05-10 2013-03-06 中国科学院地质与地球物理研究所 二次离子质谱仪的样品保护装置和保护方法
US9551079B2 (en) 2013-09-13 2017-01-24 Purdue Research Foundation Systems and methods for producing metal clusters; functionalized surfaces; and droplets including solvated metal ions
CN104616962B (zh) * 2015-02-16 2017-03-01 江苏天瑞仪器股份有限公司 用于液相色谱‑质谱仪的离子源组件
EP3290913B1 (de) * 2016-09-02 2022-07-27 ION-TOF Technologies GmbH Sekundärionenmassenspektrokopisches verfahren, system und verwendungen hiervon
CN106920735B (zh) * 2017-03-20 2018-10-16 北京大学深圳研究生院 可检测活性中间体的方法、电喷雾离子源装置及质谱仪
GB2585327B (en) * 2018-12-12 2023-02-15 Thermo Fisher Scient Bremen Gmbh Cooling plate for ICP-MS
US20220102131A1 (en) * 2019-01-11 2022-03-31 Helmholtz-Zentrum Potsdam - Deutsches Geoforschungszentrum GFZ Stiftung des Offentlichen Rechts des Ion source including structured sample for ionization

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686414A (en) * 1984-11-20 1987-08-11 Hughes Aircraft Company Enhanced wetting of liquid metal alloy ion sources

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3508045A (en) * 1968-07-12 1970-04-21 Applied Res Lab Analysis by bombardment with chemically reactive ions
GB1483966A (en) * 1974-10-23 1977-08-24 Sharp Kk Vapourized-metal cluster ion source and ionized-cluster beam deposition
NL7415318A (nl) 1974-11-25 1976-05-28 Philips Nv Wienfilter.
US4426582A (en) * 1980-01-21 1984-01-17 Oregon Graduate Center Charged particle beam apparatus and method utilizing liquid metal field ionization source and asymmetric three element lens system
JPS57132632A (en) * 1981-02-09 1982-08-17 Hitachi Ltd Ion source
JPS59138044A (ja) * 1983-01-27 1984-08-08 Agency Of Ind Science & Technol 集束イオンビ−ム装置
JPS59157943A (ja) * 1983-02-25 1984-09-07 Hitachi Ltd 分子二次イオン質量分析計
JPS61248335A (ja) * 1985-04-26 1986-11-05 Hitachi Ltd 液体金属イオン源
JPH0756469B2 (ja) * 1989-08-29 1995-06-14 株式会社日立製作所 Ｓｉｍｓにおける質量数較正用混合標準試料
JPH03155025A (ja) * 1989-11-10 1991-07-03 Sanyo Electric Co Ltd インジウムビスマスイオン源
DE4416413C2 (de) * 1994-05-10 1996-03-28 Ion Tof Gmbh Verfahren zum Betreiben eines Flugzeit-Sekundärionen-Massenspektrometers
GB9513586D0 (en) * 1995-07-04 1995-09-06 Ionoptika Limited Sample analyzer
JPH11274255A (ja) 1998-03-19 1999-10-08 Seiko Instruments Inc 断面加工観察方法
US6291820B1 (en) * 1999-01-08 2001-09-18 The Regents Of The University Of California Highly charged ion secondary ion mass spectroscopy
US6791078B2 (en) * 2002-06-27 2004-09-14 Micromass Uk Limited Mass spectrometer
WO2005001869A2 (en) * 2003-06-06 2005-01-06 Ionwerks Gold implantation/deposition of biological samples for laser desorption three dimensional depth profiling of tissues
US7701138B2 (en) * 2003-07-02 2010-04-20 Canon Kabushiki Kaisha Information acquisition method, information acquisition apparatus and disease diagnosis method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686414A (en) * 1984-11-20 1987-08-11 Hughes Aircraft Company Enhanced wetting of liquid metal alloy ion sources

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
HEINRICH R ET AL: "Cluster formation under bombardment with polyatomic projectiles", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER, AMSTERDAM, NL, vol. 164-165, April 2000 (2000-04-01), pages 720 - 726, XP004195249, ISSN: 0168-583X *
J. VAN DER WALLE, P. JOYES: "Study of Bi(n)(p+) ions formed in liquid-metal ion sources", PHYSICAL REVIEW B, vol. 35, no. 11, 15 April 1987 (1987-04-15), pages 5509 - 5513, XP002366516 *
LE BEYEC Y: "Cluster impacts at keV and MeV energies: Secondary emission phenomena", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, ELSEVIER SCIENCE PUBLISHERS, AMSTERDAM, NL, vol. 174, no. 1-3, March 1998 (1998-03-01), pages 101 - 117, XP004116637, ISSN: 1387-3806 *
S.S. JOHAR, D.A. THOMPSON: "Spike effects in heavy-ion sputtering of Ag, Au and Pt thin films", SURFACE SCIENCE, vol. 90, 1979, pages 319 - 330, XP002366490 *

Also Published As

Publication number Publication date
DE10339346A1 (de) 2005-04-14
JP2014006265A (ja) 2014-01-16
DE10339346B4 (de) 2005-12-08
JP2011243591A (ja) 2011-12-01
US20160254134A1 (en) 2016-09-01
JP5128814B2 (ja) 2013-01-23
US20120104249A1 (en) 2012-05-03
JP2007503685A (ja) 2007-02-22
EP1658632B1 (de) 2008-09-17
US9378937B2 (en) 2016-06-28
ATE408891T1 (de) 2008-10-15
WO2005029532A2 (de) 2005-03-31
EP1658632A2 (de) 2006-05-24
JP5416178B2 (ja) 2014-02-12
US20060202130A1 (en) 2006-09-14
DE10339346B8 (de) 2006-04-13

Similar Documents

Publication Publication Date Title
WO2005029532A3 (de) Massenspektrometer und flüssigmetall-ionenquelle für ein solches massenspektrometer
EP1467398A3 (de) Massenspektrometer.
WO2004097888A3 (en) X-ray sources
WO2004079765A3 (en) Novel electro ionization source for orthogonal acceleration time-of-flight mass spectrometry
Aaij Measurement of the Ratio of Branching Fractions B ([bar over B][superscript 0] D [superscript*+][superscript-][bar over][subscript])/B ([bar over B][superscript 0] D [superscript [superscript-][bar over][subscript])
WO2004030024A3 (en) Methods and devices for laser desorption chemical ionization
WO2005045419A3 (en) Ion source and methods for maldi mass spectrometry
Kelbch et al. Cross sections for the production of highly charged argon and xenon recoil ions in collisions with high-velocity uranium projectiles
CA2065581A1 (en) Plasma enhancement apparatus and method for physical vapor deposition
EP1990827A3 (de) Sekundärionen-Flugzeitmassenspektrometer
WO2005048290A3 (en) Carbon nanotube electron ionization sources
SG158737A1 (en) Method for increasing ionization efficiency in mass spectroscopy
CA2373351A1 (en) Ion mobility and mass spectrometer
US8525125B1 (en) Liquid metal ion source and secondary ion mass spectrometric method and use thereof
WO2001023863A3 (en) Modified ion source targets for use in liquid maldi ms
Vockenhuber et al. Accelerator Mass Spectrometry of 129I towards its lower limits
WO2007125297A3 (en) Mass spectrometer
JP2011501367A5 (de)
WO2005104178A3 (en) Mass spectrometer
WO2005116378A3 (en) Multiplexed tandem mass spectrometry
Moon et al. Temperature of peptide ions generated by matrix-assisted laser desorption ionization and their dissociation kinetic parameters
EP1598850A3 (de) Massenspektrometer mit Ionenfragmentierung durch Reaktion mit Elektronen
Ribeiro et al. Low-temperature chemistry induced by cosmic rays: positive and negative ion desorption from nitrile-bearing astrophysical ice analogues
EA201892197A1 (ru) Стеклянная подложка со сниженным внутренним отражением и способ ее изготовления
WO2003010794A3 (de) Massenspektrometrie-vorrichtung

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BW BY BZ CA CH CN CO CR CU CZ DM DZ EC EE EG ES FI GB GD GE GH HR HU ID IL IN IS JP KE KG KP KR KZ LK LR LS LT LU LV MA MD MG MK MW MX MZ NA NI NO NZ OM PG PH PT RO RU SC SD SE SG SK SL SY TJ TN TR TT TZ UA UG US UZ VC VN ZA ZM

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ NA SD SZ TZ UG ZM ZW AM AZ BY KG MD RU TJ TM AT BE BG CH CY DE DK EE ES FI FR GB GR HU IE IT MC NL PL PT RO SE SI SK TR BF CF CG CI CM GA GN GQ GW ML MR SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 10568832

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 2006524234

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 2004740521

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2004740521

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 10568832

Country of ref document: US

WWG Wipo information: grant in national office

Ref document number: 2004740521

Country of ref document: EP