WO2004096786A1 - 含フッ素環状化合物、含フッ素重合性単量体、含フッ素高分子化合物並びにそれを用いたレジスト材料及びパターン形成方法 - Google Patents
含フッ素環状化合物、含フッ素重合性単量体、含フッ素高分子化合物並びにそれを用いたレジスト材料及びパターン形成方法 Download PDFInfo
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D307/00—Heterocyclic compounds containing five-membered rings having one oxygen atom as the only ring hetero atom
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D307/00—Heterocyclic compounds containing five-membered rings having one oxygen atom as the only ring hetero atom
- C07D307/77—Heterocyclic compounds containing five-membered rings having one oxygen atom as the only ring hetero atom ortho- or peri-condensed with carbocyclic rings or ring systems
- C07D307/93—Heterocyclic compounds containing five-membered rings having one oxygen atom as the only ring hetero atom ortho- or peri-condensed with carbocyclic rings or ring systems condensed with a ring other than six-membered
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
Definitions
- the present invention relates to a novel fluorine-containing cyclic compound and a polymer compound using the same, and more particularly to a resist material and a pattern forming method in a vacuum ultraviolet wavelength region which have been actively studied recently.
- Fluorine-containing compounds are used in advanced material fields due to the characteristics of fluorine such as water repellency, oil repellency, low water absorption, heat resistance, weather resistance, corrosion resistance, transparency, photosensitivity, low refractive index, and low dielectric properties. Mainly used or developed in a wide range of applications. In particular, when utilizing the characteristics of the transparency behavior at each wavelength, it is applied in the field of coatings, anti-reflection coatings utilizing low refractive index and transparency of visible light, high wavelength band (optical communication wavelength Active research and development are being carried out in fields such as optical devices utilizing transparency in the band, and resist materials utilizing transparency in the ultraviolet region (especially in the vacuum ultraviolet wavelength region).
- a common polymer design in these application fields is to introduce as much fluorine as possible to achieve transparency at each wavelength used while achieving adhesion to substrates and a high glass transition point (hardness). It is to try to make it.
- various proposals have been made to increase the transparency at each wavelength by contriving the fluorine content as a material design. There are few examples that have been devised.
- the conventional fluorine-containing norbornene compound has an electron-withdrawing group such as a fluorine atom and a trifluoromethyl group directly on the norpolene ring, and the electron density of the polymerizable double bond is reduced.
- An object of the present invention is to provide a novel fluorinated cyclic compound, a fluorinated polymerizable monomer, and a fluorinated polymer compound, and have high transparency in a wide wavelength range from the ultraviolet region to the near infrared region.
- Another object of the present invention is to provide a resist material having high adhesion to a substrate, high film forming property, and high etching resistance, and a pattern forming method using the same.
- the present inventors have conducted intensive studies in order to solve the above-mentioned problems, and as a result, have found a novel fluorinated cyclic compound having an oxacyclopentane or oxacyclobutane structure derived from norpolnadiene and hexafluoroacetone.
- Compounds were synthesized, and a fluorine-containing polymer compound polymerized or copolymerized using this fluorine-based cyclic compound or its derivative was synthesized, and had a high fluorine content in a wide wavelength range from the ultraviolet region to the near infrared region.
- the present invention has found a resist material having high transparency, high adhesiveness to a substrate and film forming property, and having high etching resistance by having a polycyclic structure, and a pattern forming method using the same.
- the present invention provides a fluorine-containing cyclic compound, a fluorine-containing polymerizable monomer, a fluorine-containing high molecular compound, a resist material using the same, and a pattern forming method.
- a fluorine-containing cyclic compound represented by the following formula (1) or (2):
- each of R 1, R 2, R 3, R 4, and R 5 is independently hydrogen, an alkyl group, a hydroxyl group, a halogen atom, a halogenated alkyl group, a carbinol group, or hexafluoro. It is selected from the group consisting of locarbinol groups.
- the hexafluorocarbinol group contained in the formula may be partially or entirely protected, and the protecting group may be a straight-chain, branched or cyclic hydrocarbon group having 1 to 25 carbon atoms or It is a group containing an aromatic hydrocarbon group, and may contain at least one of a fluorine atom, an oxygen atom, a nitrogen atom, and a hydroxyl bond.
- a fluorine-containing cyclic compound represented by the following structural formula (3) or (4).
- a fluorine-containing cyclic compound represented by any of the following structural formulas (5) to (8).
- each of R6, R7, R8, R9, R10, and R11 independently represents hydrogen, an alkyl group, a halogenated alkyl group, a hydroxyl group, an alkyloxy group, or a halogen.
- Examples of the protecting group include a linear, branched or cyclic hydrocarbon group having from 25 to 25 carbon atoms or an aromatic hydrocarbon group.
- each of R 12, R 13, R 14, R 15, R 16, and R 17 is independently hydrogen, an alkyl group, or a halogenated alkyl.
- the hexafluorocarbon group contained in the formula may be partially or wholly protected, and the protecting group may be a straight-chain, branched or cyclic hydrocarbon group having 25 to 25 carbon atoms or an aromatic carbon group.
- a group containing a hydride group which may contain at least one of a fluorine atom, an oxygen atom, a nitrogen atom, and a carbonyl bond.
- a fluorine-containing cyclic compound represented by any of the following structural formulas (13) to (16).
- a fluorine-containing cyclic compound represented by any one of the following structural formulas (17) to (20).
- a fluorine-containing cyclic compound having at least one hydroxyl group or hexafluorocarbinol group represented by the following structural formula (25) or (26).
- n represents an integer of 1 or more and 4 or less.
- the hydroxyl group and hexafluorocarbinol group contained in the formula may be partially or wholly protected, and the protecting group may be a linear, branched or cyclic hydrocarbon having 1 to 25 carbon atoms.
- a group or a group containing an aromatic hydrocarbon group which may contain at least one of a fluorine atom, an oxygen atom, a nitrogen atom, and a carbonyl group.
- a fluorine-containing polymerizable monomer is provided.
- one of R 18, R 19, R20, R21, R22, and R23 is a polymerizable group represented by Formula (29);
- 19, R20 R21, R22 and R23 other than the polymerizable group are hydrogen, alkyl group, alkyl halide group, hydroxyl group, alkyloxy group, halogenated alkyloxy group, mercapto group, alkylthio group, halogenated alkylthio group.
- sulfoxy group alkylsulfonyloxy group, halogenated alkylsulfonyloxy group, alkylsilyl group, halogenated alkylsilyl group, alkoxysilyl group, halogen atom, amino group, alkylamino group, carbinol group, to It is selected from the group consisting of xafluorocarbinol groups.
- the hexafluorocarbinol group contained in the formulas (27) and (28) may be partially or wholly protected, and the protecting group may be a straight-chain, branched or cyclic carbon having 1 to 20 carbon atoms.
- a group containing a hydrogen group or an aromatic hydrocarbon group may contain at least one of a fluorine atom, an oxygen atom, a nitrogen atom, and a carbonyl bond.
- each of R24, R25 and R26 is independently a hydrogen atom, a fluorine atom, or a linear, branched or cyclic alkyl group having 1 to 25 carbon atoms or a fluorinated alkyl group. is there.
- each R 28 independently represents hydrogen, a methyl group, fluorine, or a trifluoromethyl group.
- a fluorine-containing cyclic compound having at least one polymerizable group represented by the following structural formula (38) or (39).
- n represents an integer of 1 to 4
- R29 and R30 is a polymerizable group represented by the formula (40).
- the group other than the polymerizable group in 30 represents hydrogen or a protecting group.
- the protecting group is a group containing a linear, branched, or cyclic hydrocarbon group having 1 to 20 carbon atoms or an aromatic hydrocarbon group, and at least one of a fluorine atom, an oxygen atom, a nitrogen atom, and a carbonyl bond. May include one.
- each of R 31, R 32, and R 33 independently represents a hydrogen atom, a fluorine atom, or a linear, branched, or cyclic group having 1 to 25 carbon atoms.
- R 34 is a single bond or a methylene group, a linear, branched or cyclic alkylene group having 2 to 20 carbon atoms, a linear, branched or cyclic fluorinated group having 2 to 20 carbon atoms It represents an alkylene group, a carbonyl group, or a dialkylsilylene group.
- the present invention provides a novel fluorinated cyclic compound, a fluorinated polymerizable monomer, and a fluorinated polymer compound, and a polymer compound synthesized using the novel fluorinated cyclic compound can be used in the ultraviolet region to near infrared region.
- Suitable for resist material that has high transparency over a wide wavelength range up to the region, high adhesion to substrate, film forming property and high etching resistance, especially for photoresist material in vacuum ultraviolet wavelength range In addition, a pattern forming method using the same is suitable for forming a high-resolution pattern shape.
- the compound represented by the formula (1) or (2) of the present invention is a novel fluorine-containing cyclic compound having an oxacyclopentane structure derived from norpolnadiene and hexafluoroacetone.
- an increase in the fluorine content causes an increase in transparency in a wide wavelength range from the ultraviolet region to the near infrared region and a decrease in the refractive index. As the amount increases, a decrease in adhesion to the substrate and a decrease in film forming property are also induced.
- the compound represented by the formula (1) or (2) has an oxacyclopentane structure, the polymer derived therefrom has high adhesion to the substrate and high film-forming property. Made possible. Further, the polycyclic skeleton contributes to the etching resistance required for the resist material.
- each of R 1, R 2, R 3, R 4 and R 5 is independently hydrogen, an alkyl group, a hydroxyl group, a halogen atom, a halogenated It represents an alkyl group, a carbinol group, or a hexafluorocarbinol group.
- the polymer is used as a polymer material by a polymerization reaction, as the number of carbon atoms of the substituent increases, the polymerizability decreases due to steric hindrance, the transparency decreases, and the refractive index increases. 1 to 5 are more preferred.
- a methyl group, an ethyl group, an n-propyl group, a sso-propyl group, an n-butyl group, a sec-butyl group, a tert-butyl group and the like can be mentioned.
- some or all of the hydrogen atoms may be substituted with fluorine atoms.
- Hexafluorocarbinol groups are preferably used because of their high fluorine content.
- a hexafluorocarbinol group is contained in the formula (1) or (2), a part or all of the hexafluorocarbinol group may be protected, and the protecting group may be a straight-chain having from 25 to 25 carbon atoms.
- Examples of the group containing an oxygen atom include an alkoxycarbonyl group, an acetal group, and an acyl group.
- Examples of the alkoxycarbonyl group include a tert-butoxycarbonyl group, a tert-amyloxycarbonyl group, a methoxycarbonyl group, Examples thereof include an ethoxycarbonyl group and an i-propoxycarbonyl group.
- acetal groups include methoxymethyl group, methoxyethoxymethyl group, ethoxyxethyl group, butoxyshethyl group, hexoxyhexyl ethyl group, benzyloxyxethyl group, phenethyloxethyl group, and ethoxypropyl group.
- cyclic ethers such as a benzyloxypropyl group, a phenethyloxypropyl group, a ethoxybutyl group, and a ethoxyisobutyl group as a linear ether, such as a tetrahydrofuranyl group and a tetrahydroviranyl group.
- Asyl groups include acetyl, propionyl, butyryl, heptanoyl, hexanoyl, valeryl, bivaloyl, isovaleryl, lauryloyl, myristyl, palmitoyl, stearoyl, oxalyl, malonyl.
- the compounds represented by the formulas (9) to (12) of the present invention are fluorine-containing cyclic compounds having an oxacyclobutane structure. These compounds can be derived from the fluorinated cyclic compounds represented by the formulas (1) to (8).
- These compounds contain a large amount of fluorine in the molecule similarly to the compounds described in the above formulas (1) and (2), and also have high transparency in a wide wavelength range by having an oxalic butane structure at the same time. Excellent adhesion to This effect is presumed to be due to the lone pair of electrons on the oxygen of the oxacyclobutane ring being directed to the outside of the molecule.
- the backbone of norbornane or norpolene and oxacyclobutane contributes to the required etch resistance of the resist material.
- R6, R7, R8, R9, R10, R11, R12, R13, and R14 , R15, R16, and R17 each independently represent hydrogen, an alkyl group, a halogenated alkyl group, a hydroxyl group, an alkyloxy group, a halogenated alkyloxy group, a mercapto group, an alkylthio group, or a halogenated alkylthio group.
- sulfoxy group alkylsulfonyloxy group, halogenated alkylsulfonyloxy group, alkylsilyl group, halogenated alkylsilyl group, alkoxysilyl group, It is selected from the group consisting of a halogen atom, an amino group, an alkylamino group, a carbinol group, and a hexafluorocarbinol group.
- the hexafluorocarbinyl group contained in the formula may be partially or entirely protected, and the protecting group may be a straight-chain, branched or cyclic hydrocarbon having 1 to 25 carbon atoms. And an aromatic hydrocarbon group, and are the same as those exemplified as the protecting group for the hexafluorocarbinol group contained in the formula (1) or (2).
- the compounds represented by the formulas (27) and (28) of the present invention are fluorine-containing polymerizable monomers. These compounds can be derived from the fluorine-containing cyclic compounds represented by the formulas (1) to (26).
- R 18, R 19, R20, R21, R22, and R 23 is a polymerizable group represented by Formula (29);
- the groups other than the polymerizable group are hydrogen, alkyl group, halogenated alkyl group, hydroxyl group, alkyloxy group, halogenated alkyloxy group, mercapto group, alkylthio group, and halogen.
- the hexafluorocarbinol group contained in the formulas (27) and (28) may be partially or wholly protected, and the protecting group may be a linear, branched or cyclic group having from ⁇ to 20 carbon atoms.
- a group containing a hydrocarbon group or an aromatic hydrocarbon group may contain at least one fluorine atom, oxygen atom, nitrogen atom, and carbonyl group.
- each of R24, R25 and R26 is. Independently, it is a hydrogen atom, a fluorine atom, or a linear, branched or cyclic alkyl group having 1 to 25 carbon atoms or a fluorinated alkyl group.
- R 27 is a single bond or a methylene group, a linear, branched or cyclic alkylene group having 2 to 20 carbon atoms, a linear, branched or cyclic fluorinated group having 2 to 20 carbon atoms
- Examples of the polymerizable group include a vinyl group, an aryl group, an acryloyl group, a methacryloyl group, a fluorovinyl group, a difluorovinyl group, a trifluorovinyl group, a difluorotrifluoromethylvinyl group, and a trifluoromethyl group.
- Examples thereof include an allyl group, a perfluoroaryl group, a trifluoromethylacryloyl group, a nonylfluorobutylacryloyl group, a vinyl ether group, a fluorine-containing vinyl ether group, a aryl ether group, and a fluorine-containing aryl ether group.
- An acryloyl group, a methacryloyl group, a trifluoromethylacryloyl group, and a vinyl ether group can be suitably used because of their high polymerization reactivity and high copolymerization reactivity with other monomers. Those having a fluorine atom in the functional group are applied to further impart transparency and low refractive index.
- any group can be used without particular limitation as long as it is a group that undergoes elimination due to the effect of a photoacid generator, hydrolysis, or the like.
- Examples include an alkyloxycarbonyl group, an acetal group, a silyl group, and an acyl group.
- Examples of the alkoxycarbonyl group include a tert-butoxycarbonyl group, a tert-amyloxycarbonyl group, a methoxycarbonyl group, a ethoxycarbonyl group, and an i-propoxycarbonyl group.
- Acetal groups include methoxymethyl, ethoxyxethyl, butoxyxyl, and cyclohexyl. Xyloxyxetyl, benzyloxyxetyl, phenethyloxyxetyl, ethoxypropyl, benzyloxypropyl, phenethyloxypropyl, ethoxybutyl, ethoxyisobutyl, etc. . An acetal group obtained by adding a pinyl ether to a hydroxyl group can also be used.
- silyl group examples include a trimethylsilyl group, an ethyldimethylsilyl group, a methylethylsilyl group, a triethylsilyl group, a ⁇ -propyldimethylsilyl group, a methyldi-i-propyl-silyl group, a tri-i-propyl-silyl group, and a t-butyldimethylsilyl.
- acetyl group examples include acetyl group, propionyl group, butyryl group, heptanyl group, hexanoyl group, valeryl group, bivaloyl group, isovaleryl group, lauryloyl group, myristoyl group, palmitolyl group, stearoyl group, oxalyl group, and malonyl.
- the purpose of using an acid labile group is to use positive acid photosensitivity due to the acid labile group and after exposure to high-energy rays such as deep ultraviolet rays having a wavelength of 300 nm or less, excimer lasers, X-rays, or electron beams.
- high-energy rays such as deep ultraviolet rays having a wavelength of 300 nm or less, excimer lasers, X-rays, or electron beams.
- Is to express solubility in aqueous solution and those with a fluorine atom in the functional group are more transparent, and those containing a cyclic structure are further added with features such as etching resistance and high glass transition point. Therefore, it is possible to properly use each application field of the present invention.
- the polymer compound according to the present invention will be described.
- the polymer compound of the present invention is a polymer compound obtained by homopolymerizing or copolymerizing the fluorine-containing cyclic compound represented by any one of the structural formulas
- the monomer copolymerizable with the fluorinated cyclic compound of the present invention include, at least, maleic anhydride, acrylate, fluorinated acrylate, methacrylate, and fluorinated methacrylate.
- the ester side chain can be used without any particular limitation.
- Examples of known compounds include methylacrylate or methacrylate, ethylacrylate or methacrylate, and n-acrylate.
- the fluorinated acrylic ester and fluorinated methacrylic ester that can be used in the present invention include a monomer containing a fluorine atom or a group having a fluorine atom at the acryl position, or a substitution containing a fluorine atom at the ester site. Also preferred are fluorinated compounds which are acrylates or methacrylates comprising a group and which contain fluorine at both the position and the ester portion. Further, a cyano group may be introduced at the position.
- a monomer having a fluorine-containing alkyl group introduced at the ⁇ -position a trifluoromethyl group, a trifluoroethyl group, a nonafluoro- ⁇ - group at the position of the above-mentioned non-fluorinated acrylate or methacrylate ester
- a monomer to which a butyl group or the like is added is suitably used, and in that case, the ester site does not necessarily need to contain fluorine.
- alkyl trifluoromethyl acrylate is used as a copolymerization component, the polymer yield is relatively high, and the solubility of the obtained polymer in an organic solvent is good, which is preferred. '
- monomers containing fluorine in the ester moiety include a perfluoroalkyl group and a fluoroalkyl group as a fluoroalkyl group as the ester moiety, and a unit having a cyclic structure and a fluorine atom in the ester moiety.
- the cyclic structure is substituted with, for example, a fluorine atom, a trifluoromethyl group, a hexafluorocarbinol group, or the like, a fluorinated benzene ring, a fluorinated cyclopentane ring, or a fluorinated cyclohexane ring
- acrylate or methacrylate having a unit having a fluorine-containing cycloheptane ring or the like.
- acrylic acid or methacrylic acid ester whose ester moiety is a fluorine-containing t-butyl ester group. It is possible.
- the styrene-based compound and fluorine-containing styrene-based compound usable in the present invention include, in addition to styrene, fluorinated styrene, hydroxystyrene, etc., one or more functional groups obtained by modifying a hexafluorocarbinol group or a hydroxyl group thereof. Bound compounds can be used.
- styrene or hydroxystyrene in which hydrogen has been replaced by a fluorine atom or a trifluoromethyl group styrene having a halogen, an alkyl group, or a fluorine-containing alkyl group bonded at the position, styrene having a perfluorovinyl group, etc.
- styrene or hydroxystyrene in which hydrogen has been replaced by a fluorine atom or a trifluoromethyl group styrene having a halogen, an alkyl group, or a fluorine-containing alkyl group bonded at the position, styrene having a perfluorovinyl group, etc.
- styrene or hydroxystyrene in which hydrogen has been replaced by a fluorine atom or a trifluoromethyl group styrene having a halogen, an alkyl group, or a fluorine
- Examples of the vinyl ether, fluorine-containing vinyl ether, aryl ether, and fluorine-containing aryl ether include alkyl vinyl ethers which may contain a hydroxyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, a hydroxyethyl group, and a hydroxybutyl group. Alternatively, an alkylaryl ether or the like can be used.
- a cyclohexyl group, a norbornel group, a cyclic vinyl or aryl ether having a hydrogen or a carbonyl bond in an aromatic ring or its cyclic structure, or a part or all of hydrogen of the above functional group is substituted with a fluorine atom.
- Fluorinated vinyl ethers and fluorinated aryl ethers can also be used.
- any vinyl ester, vinyl silane, olefin, fluorinated olefin, norpolenene compound, fluorinated norponene compound, and other compounds containing a polymerizable unsaturated bond can be used without any particular limitation.
- olefins examples include ethylene, propylene, isobutene, cyclopentene, cyclohexene, etc.
- fluorinated olefins examples include vinyl fluoride, vinylidene fluoride, trifluoroethylene, chlorofluoroethylene, tetrafluoroethylene, and hexafluene. Examples include propylene and hexafluoroisobutene.
- a norpolene compound and a fluorine-containing norbornene compound are norpolene monomers having a mononuclear structure or a plurality of nuclear structures.
- the alcohol is acrylic acid, monofluoroacrylic acid, monotrifluoromethylacrylic acid, methacrylic acid, any of the acrylic esters, methacrylic esters, fluorinated acrylic esters or fluorinated methacrylic esters described herein; , 2- (benzoyloxy) pentafluoropropane, 2- (methoxoxy methoxymethyloxy) pentafluoropropene, 2- (tetrahydroxyvinyldioxy) pentafluoropropene, 2- (benzoyloxy) trifluoroethylene Is a norbornene compound formed by the Die Is s-AI der addition reaction of
- the ratio of the fluorine-containing compound of the present invention to the comonomer is not particularly limited, but is preferably selected from 10 to 100%. More preferably, it is 30 to 100%, and if it is less than 30%, sufficient transparency and film formability are not exhibited depending on the wavelength range of the application field.
- the method of polymerizing the polymer compound according to the present invention is not particularly limited as long as it is a generally used method, but radical polymerization, ionic polymerization, and the like are preferable, and in some cases, coordination anion polymerization, living anion polymerization, and the like. It is also possible to use cationic polymerization, ring-opening metathesis polymerization, vinylene polymerization and the like.
- Radical polymerization is carried out in the presence of a radical polymerization initiator or a radical initiation source by a known polymerization method such as bulk polymerization, solution polymerization, suspension polymerization, or emulsion polymerization, and is either batch, semi-continuous or continuous. Operation.
- the radical polymerization initiator is not particularly limited, but examples thereof include azo compounds, peroxide compounds, and redox compounds, and in particular, azobisisobutyronitrile, t-butylvaloxybivalate, and tert-butylperoxide.
- P-Ptyryl peroxide, lauroyl peroxide, succinic acid peroxide, dicinnamyl peroxide, G- ⁇ -propyl peroxy dicarbonate Preferred are monobutyl, t-butyl peroxyaryl monocarbonate, benzoyl peroxide, hydrogen peroxide, and ammonium persulfate.
- the reaction vessel used for the polymerization reaction is not particularly limited.
- a polymerization solvent may be used.
- the polymerization solvent those which do not inhibit the radical polymerization are preferable, and typical ones are ester systems such as ethyl acetate and n-butyl acetate, ketone systems such as acetone and methyl isobutyl ketone, toluene, and cyclohexane.
- hydrocarbon solvents such as methanol, isopropyl alcohol, and ethylene glycol monomethyl ether. It is also possible to use various solvents such as water, ethers, cyclic ethers, fluorocarbons and aromatics.
- the reaction temperature of the co-polymerization reaction is appropriately changed depending on the radical polymerization initiator or the radical polymerization initiation source, and is usually preferably from 20 to 200 ° C, particularly preferably from 30 to 140 ° C.
- the ring-opening metathesis polymerization may use a transition metal catalyst of Groups 4 to 7 of the periodic table in the presence of a cocatalyst, and may use a known method in the presence of a solvent.
- the polymerization catalyst is not particularly limited, but examples thereof include Ti-based, V-based, Mo-based, and W-based catalysts.
- Ti-based, V-based, Mo-based, and W-based catalysts include Ti-based, V-based, Mo-based, and W-based catalysts.
- the amount of the catalyst is from 1 Omo1% to 0.01 MoI%, preferably from 1 MoI% to 0.01 MoI%, based on the monomer used.
- Examples of the co-catalyst include alkylaluminum, alkyltin, and the like.
- Trialkyls such as aluminum, tri-2-methylpentyl aluminum, tri-3-methylpentyl aluminum, tri-4-methylpentyl aluminum, tri-2-methylhexyl aluminum, tri-3-methylhexyl aluminum, trioctyl aluminum
- Dialkylaluminum halides such as lual aluminum, dimethylaluminum chloride, getylaluminum chloride, diisopropylaluminum chloride, diisobutylaluminum dimethylchloride, methylaluminum dichloride, ethylaluminum dichloride, ethylaluminum diiod
- the polymerization solvent may be any one that does not inhibit the polymerization reaction.
- Representative examples thereof include aromatic hydrocarbons such as benzene, toluene, xylene, benzene, dichlorobenzene, hexane, heptane, and cyclohexane.
- halogenated hydrocarbons such as carbon tetrachloride, carbon form, methylene chloride, and 1,2-dichloroethane. These solvents can be used alone or in combination of two or more.
- the reaction temperature is usually preferably from 170 to 200 ° C, particularly preferably from 30 to 60 ° C.
- Vinylene polymerization is carried out in the presence of a co-catalyst in the presence of a co-catalyst, such as iron, nickel, rhodium, palladium, platinum, etc. It is sufficient to use a metal catalyst belonging to Group 4-6 of the above, and a known method may be used in the presence of a solvent.
- a co-catalyst such as iron, nickel, rhodium, palladium, platinum, etc. It is sufficient to use a metal catalyst belonging to Group 4-6 of the above, and a known method may be used in the presence of a solvent.
- the polymerization catalyst is not particularly limited, but examples thereof include iron (II) chloride, iron (III) chloride, iron (II) bromide, iron (III) bromide, iron (II) acetate, and iron (II).
- the amount of the catalyst is from 1 Omo I% to 0.001 mol%, preferably from 101% to 0.001 mol%, based on the monomer used.
- Examples of the cocatalyst include alkylaluminoxane and alkylaluminum. Particularly, methylaluminoxane (MAO), trimethylaluminum, triethylaluminum, tripropylaluminum, triisopropylaluminum Aluminum, triisobutyl aluminum, tri-2-methylbutyl aluminum, tri-3-methylbutyl aluminum, tri-2-methylpentyl aluminum, tri-3-methylpentyl aluminum, tri-4-methylpentyl aluminum, Trialkylalluminums such as tri-2-methylhexylaluminum, tri-3-methylhexylaluminum, trioctylaluminum, dimethylaluminum chloride, getylaluminum chloride, diisopropylaluminum chloride, diisobutylaluminum chloride, etc.
- MAO methylaluminoxane
- trimethylaluminum triethylaluminum
- Alkyl aluminum halides methyl aluminum dichloride, ethyl aluminum dichloride, ethyl aluminum diiodide, propyl aluminum dichloride
- Monoalkyl aluminum halides such as butyl aluminum chloride, isopropyl aluminum dichloride, butyl aluminum dichloride, and isobutyl aluminum dichloride, methyl aluminum sesquik mouth light, ethyl aluminum sesquik mouth light, propyl aluminum sesquik mouth light, and isobutyl aluminum Examples thereof include alkylaluminum sesqui-mouth rides such as a mini-mouth sesqui-mouth ride.
- the amount of cocatalyst is 50 to 500 equivalents in terms of AI, and in the case of other alkylaluminums, it is in the range of 100 equivalents or less, preferably 30 equivalents or less, per equivalent of transition metal catalyst. It is.
- the polymerization solvent it is sufficient that the polymerization reaction is not hindered.
- Typical examples thereof include aromatic hydrocarbons such as benzene, toluene, xylene, cyclobenzene, and dichlorobenzene; hexane, heptane, and cyclohexane.
- halogenated hydrocarbons such as carbon tetrachloride, carbon form, methylene chloride and 1,2-dichloroethane, dimethylformamide, N-methylpyrrolidone, and N-cyclohexylpyrrolidone.
- the reaction temperature is usually preferably from 170 to + 200 ° C, particularly preferably from 140 to + 80 ° C.
- any known method can be used. There are methods such as filtration or heat distillation under reduced pressure.
- the number average molecular weight of the polymer compound of the present invention is usually in the range of 1,000 to 100,000, preferably in the range of 3,000 to 500,000.
- the present invention is based on the use of coating, and is usually applied by dissolving the polymer compound of the present invention in an organic solvent to form a film. Therefore, the organic solvent used is not particularly limited as long as the polymer compound is soluble, but ketones such as acetone, methyl ethyl ketone, cyclohexanone, methyl isoamyl ketone, and 2-heptanone; ethylene glycol; Monomethyl ether, monoethyl ether, monopropyl ether, monobutyl ether of ethylene glycol monoacetate, diethylene glycol, diethylene glycol monoacetate, propylene glycol, propylene glycol monoacetate, dipropylene glycol, or dipropylene glycol monoacetate Or polyhydric alcohols such as monophenyl ether and derivatives thereof, cyclic ethers such as dioxane, methyl lactate, ethyl lactate, methyl acetate,
- Esters such as butyl, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, and ethyl ethoxypropionate; aromatic solvents such as xylene and toluene; chlorofluorocarbon; alternative chlorofluorocarbons; perfluoro compounds; and hexafluoro Fluorine-containing solvents such as isopropyl alcohol, and terpen-based petroleum naphtha solvents and paraffin-based solvents, which are weak solvents with a high boiling point for the purpose of enhancing coatability, can be used. These may be used alone or as a mixture of two or more.
- a material containing both a dissolution inhibitor and a polymer compound whose solubility in a real aqueous solution changes due to the action of an acid, or a dissolution inhibitor incorporated into a polymer compound are particularly suitable as a positive resist material, and are suitable for recent semiconductor miniaturization with a 248 nm KrF or 1993 nm ArF excimer laser.
- F 2 laser positive resist in the vacuum ultraviolet area represented by 7 nm, electron beam resist, even when the resist for X-ray are preferred. That is, a dissolution inhibitor whose solubility in an alkaline aqueous solution changes due to the action of an acid has at least one of hexafluorocarbinol groups.
- the general acid labile group is the above-described acid labile group, and is a functional group that is cleaved by an acid.
- a polymer compound using such a dissolution inhibitor is insoluble or hardly soluble in an aqueous alkaline solution before being irradiated with active energy rays, and is irradiated with an active energy ray to generate a polymer from the acid generator. It is hydrolyzed by the generated acid and becomes soluble in aqueous solutions.
- the photoacid generator used in the composition of the present invention is not particularly limited, and any one can be selected and used from those used as acid generators in chemically amplified resists.
- acid generators include bissulfonyldiazomethans, nitrobenzyl derivatives, onium salts, halogen-containing triazine compounds, cyano-containing oxime sulfonate compounds, and other oxime sulfones.
- Compounds. These acid generators may be used alone or in combination of two or more, and the content thereof is generally 0.5 to 100 parts by weight of the polymer compound. It is selected in the range of 20 parts by weight. When the amount is less than 0.5 part by weight, the image forming property is insufficient. When the amount is more than 20 parts by weight, a uniform solution is hardly formed, and storage stability tends to decrease.
- a conventional method of forming a resist pattern of a photoresist technique is used.
- a solution of a resist composition is first coated on a support such as silicon wafer.
- the composition is coated with a spinner or the like and dried to form a light-sensitive layer, which is then irradiated with an excimer laser beam through a desired mask pattern by an exposure device or the like and heated.
- a developing solution for example, an aqueous solution such as an aqueous solution of 0.1 to 10% by weight of tetramethylammonium hydroxide.
- the field of application of the invention is furthermore additives which are optionally miscible, for example additional resins, quenchers, plasticizers, stabilizers, colorants, surfactants, thickeners, leveling agents, defoamers
- additives such as an agent, a compatibilizer, an adhesive, and an antioxidant can be contained.
- a compound (A) (10.5 g) was placed in a nitrogen stream in a 300 ml flask equipped with a reflux condenser, a dropping funnel, a thermometer, and a stirrer, and ethyl vinyl ether (54.8 g) was added and dissolved. To this were added palladium acetate (428 mg) and 2,2′-biviridyl (0.36 g), and the mixture was stirred at room temperature for 47 hours.
- n-butyl acetate (20. Og) and AIBN (150 mg) were added, and the mixture was heated with oil / soil at 60 ° C. and stirred for 20 hours.
- Methyl methyl methacrylate "f In a flask equipped with a reflux condenser and a stirrer, compound (2) (7.2 g), methyl adamantyl methacrylate (2.8 g), n-butyl acetate under a nitrogen stream
- the polymer compounds of Examples 9 to 16 were dissolved in propylene glycol methyl acetate and adjusted to a solid content of 14%. Further, 100 parts by weight of the polymer compound was dissolved in 2 parts by weight of Midori Chemical's triphenylsulfonium triflate (TPS 105) as an acid generator, and the two types of resist solutions were dissolved. It was adjusted. These are spin-coated, and the light transmittance of a film thickness of 100 nanometers is adjusted to a wavelength of 1 nm.
- TPS 105 Midori Chemical's triphenylsulfonium triflate
- Examples 9, 10, 11, 12, 12, 13, 14, 15, and 16 were 52%, 38%, 35%, 50%, 55%, 57%, 72%,
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Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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KR1020057019871A KR100756401B1 (ko) | 2003-04-25 | 2004-03-24 | 함불소 환상화합물, 함불소 중합성 단량체, 함불소고분자화합물 및 이를 이용한 레지스트 재료 및 패턴형성방법 |
US10/553,600 US20060135744A1 (en) | 2003-04-25 | 2004-03-24 | Fluorinated cyclic compound, polymerizable fluoromonomer, fluoropolymer, resist material comprising the same, and method of forming pattern with the same |
KR1020077006877A KR100756400B1 (ko) | 2003-04-25 | 2004-03-24 | 함불소 환상화합물, 함불소 중합성 단량체, 함불소고분자화합물 및 이를 이용한 레지스트 재료 및 패턴형성방법 |
US11/941,433 US7781602B2 (en) | 2003-04-25 | 2007-11-16 | Fluorinated cyclic compound, polymerizable fluoromonomer, fluoropolymer, resist material comprising the same, and method of forming pattern with the same |
Applications Claiming Priority (2)
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JP2003120921A JP4557500B2 (ja) | 2003-04-25 | 2003-04-25 | フッ素系環状化合物 |
JP2003-120921 | 2003-04-25 |
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US10553600 A-371-Of-International | 2004-03-24 | ||
US11/941,433 Continuation-In-Part US7781602B2 (en) | 2003-04-25 | 2007-11-16 | Fluorinated cyclic compound, polymerizable fluoromonomer, fluoropolymer, resist material comprising the same, and method of forming pattern with the same |
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WO2004096786A1 true WO2004096786A1 (ja) | 2004-11-11 |
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US (1) | US20060135744A1 (ja) |
JP (1) | JP4557500B2 (ja) |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7067231B2 (en) * | 2003-10-23 | 2006-06-27 | Shin-Etsu Chemical Co., Ltd. | Polymers, resist compositions and patterning process |
US7919226B2 (en) | 2005-04-06 | 2011-04-05 | Shin-Etsu Chemical Co., Ltd. | Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
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US20060194143A1 (en) * | 2005-02-25 | 2006-08-31 | Shinichi Sumida | Fluorine-containing polymerizable monomers, fluorine-containing polymer compounds, resist compositions using the same, and patterning process |
EP1780199B1 (en) * | 2005-10-31 | 2012-02-01 | Shin-Etsu Chemical Co., Ltd. | Novel fluorohydroxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process |
EP1780198B1 (en) * | 2005-10-31 | 2011-10-05 | Shin-Etsu Chemical Co., Ltd. | Novel fluorosulfonyloxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process |
JP5124806B2 (ja) * | 2006-06-27 | 2013-01-23 | 信越化学工業株式会社 | 光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法 |
JP5124805B2 (ja) | 2006-06-27 | 2013-01-23 | 信越化学工業株式会社 | 光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法 |
US7527912B2 (en) * | 2006-09-28 | 2009-05-05 | Shin-Etsu Chemical Co., Ltd. | Photoacid generators, resist compositions, and patterning process |
US7568527B2 (en) * | 2007-01-04 | 2009-08-04 | Rock Well Petroleum, Inc. | Method of collecting crude oil and crude oil collection header apparatus |
US7543649B2 (en) * | 2007-01-11 | 2009-06-09 | Rock Well Petroleum Inc. | Method of collecting crude oil and crude oil collection header apparatus |
US7823662B2 (en) * | 2007-06-20 | 2010-11-02 | New Era Petroleum, Llc. | Hydrocarbon recovery drill string apparatus, subterranean hydrocarbon recovery drilling methods, and subterranean hydrocarbon recovery methods |
US7832483B2 (en) * | 2008-01-23 | 2010-11-16 | New Era Petroleum, Llc. | Methods of recovering hydrocarbons from oil shale and sub-surface oil shale recovery arrangements for recovering hydrocarbons from oil shale |
JP7140964B2 (ja) * | 2017-06-05 | 2022-09-22 | セントラル硝子株式会社 | 含フッ素単量体、含フッ素重合体およびそれを用いたパターン形成用組成物、並びにそのパターン形成方法 |
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JP2003002883A (ja) * | 2001-04-10 | 2003-01-08 | Shin Etsu Chem Co Ltd | ラクトン構造を有する(メタ)アクリレート化合物、その重合体、レジスト材料及びパターン形成方法 |
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- 2003-04-25 JP JP2003120921A patent/JP4557500B2/ja not_active Expired - Fee Related
-
2004
- 2004-03-24 WO PCT/JP2004/004007 patent/WO2004096786A1/ja active Application Filing
- 2004-03-24 US US10/553,600 patent/US20060135744A1/en not_active Abandoned
- 2004-03-24 KR KR1020057019871A patent/KR100756401B1/ko not_active IP Right Cessation
- 2004-03-24 KR KR1020077006877A patent/KR100756400B1/ko not_active IP Right Cessation
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7067231B2 (en) * | 2003-10-23 | 2006-06-27 | Shin-Etsu Chemical Co., Ltd. | Polymers, resist compositions and patterning process |
US7919226B2 (en) | 2005-04-06 | 2011-04-05 | Shin-Etsu Chemical Co., Ltd. | Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process |
Also Published As
Publication number | Publication date |
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US20060135744A1 (en) | 2006-06-22 |
JP2004323422A (ja) | 2004-11-18 |
KR20070038581A (ko) | 2007-04-10 |
KR100756400B1 (ko) | 2007-09-11 |
KR100756401B1 (ko) | 2007-09-10 |
KR20050123171A (ko) | 2005-12-29 |
JP4557500B2 (ja) | 2010-10-06 |
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