WO2004003931A1 - 光ファイバープローブの製造方法と微細材料加工方法 - Google Patents
光ファイバープローブの製造方法と微細材料加工方法 Download PDFInfo
- Publication number
- WO2004003931A1 WO2004003931A1 PCT/JP2003/007412 JP0307412W WO2004003931A1 WO 2004003931 A1 WO2004003931 A1 WO 2004003931A1 JP 0307412 W JP0307412 W JP 0307412W WO 2004003931 A1 WO2004003931 A1 WO 2004003931A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical fiber
- probe
- core
- fiber probe
- polarization
- Prior art date
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/29—Coated or structually defined flake, particle, cell, strand, strand portion, rod, filament, macroscopic fiber or mass thereof
- Y10T428/2913—Rod, strand, filament or fiber
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/29—Coated or structually defined flake, particle, cell, strand, strand portion, rod, filament, macroscopic fiber or mass thereof
- Y10T428/2913—Rod, strand, filament or fiber
- Y10T428/2933—Coated or with bond, impregnation or core
Definitions
- the invention of this application relates to a method for manufacturing an optical fiber probe and a method for processing a fine material. More specifically, the invention of this application relates to a method of manufacturing an optical fiber probe for forming an optical fiber having a complicated structure in a cross-sectional direction, such as a polarization maintaining optical fiber, as an optical fiber probe, and a method of manufacturing the same.
- the present invention relates to a fine material processing method using an optical fiber probe.
- Optical probing technology using near-field light is below the diffraction limit (typically
- the PANDA type polarization maintaining optical fiber has a more complicated structure than the elliptical type polarization maintaining optical fiber, but is easy to manufacture and has a high degree of polarization.
- the direction of polarization can be confirmed by observing the cross section of the fiber with an optical microscope.
- an elliptical polarization-maintaining optical fiber it is difficult to confirm the direction of polarization. This is because the size of the core is equal to or less than the size of the wavelength, that is, less than the diffraction limit, so that optical observation is impossible.
- an elliptical polarization maintaining optical fiber is more convenient.
- the stretching method is, as shown in Fig. 8, physically heating and melting the optical fiber (82) by a heating means (81) such as a hydrogen flame, laser light, or arc discharge, and stretching the fiber. This is a method of sharpening an optical fiber.
- a heating means (81) such as a hydrogen flame, laser light, or arc discharge
- the etching method uses an etching solution (91) such as hydrofluoric acid to etch the cladding (92) and core (93) of the optical fiber. It is a method of melting and chemically sharpening the core (93).
- a physical method such as a stretching method has an advantage that the process is simple, but a chemical method such as an etching method can provide a probe having higher transmission efficiency.
- a PANDA-type polarization maintaining optical fiber as shown in Fig. 10, if the chemical sharpening is attempted, the stress-applied portion will remain melted. Therefore, it is impossible to probe. This is because the stress applying portion is doped with a material having high chemical resistance such as beryllium.
- the PANDA-type polarization maintaining optical fiber is easy to fabricate itself, has a high degree of polarization, and furthermore, observes the cross section of the fiber with an optical microscope to maintain the polarization. The feature is that the direction can be confirmed.
- it is considered difficult to manufacture a probe with high transmission efficiency from a PANDA-type polarization-maintaining optical fiber because a chemical method cannot be applied, and the development of a new method for easily forming a probe is considered. Was sought.
- the invention of this application has been made in view of the above circumstances, and a method of manufacturing a new optical fiber probe having both high transmission efficiency and a high degree of polarization has been developed.
- the task is to provide a method. Disclosure of the invention
- the invention of this application solves the above-mentioned problems.
- a method of manufacturing an optical fiber-probe in which a core portion is sharpened by etching a tip portion of the optical fiber to form an optical fiber probe.
- the optical fiber is a polarization-maintaining optical fiber comprising a core, a stress applying part, and a cladding, and the core comes to the sharpest part by mechanically polishing the end of the optical fiber.
- the end of the optical fiber is formed into a sharpened shape, and the formed end of the optical fiber is dipped in an etching solution to further sharpen the core to form an optical fiber probe.
- a method for manufacturing an optical fiber probe is provided.
- the invention of this application relates to a method of manufacturing an optical fiber-probe in which the core is sharpened by etching the tip of the optical fiber to form the optical fiber-probe.
- One is a polarization maintaining optical fiber comprising a core, a stress applying part and a clad, and At the end of the fiber, a cut is made in the cross-sectional direction at the outer periphery of the core, and the optical fiber is immersed vertically in the etchant until the cut is made, and the optical fiber is directed toward the tip from the cut.
- a method for manufacturing an optical fiber probe characterized in that the core portion is melted while being stretched by its own weight to sharpen the core portion to form an optical fiber probe.
- the invention of this application is directed to a third aspect of the invention, in which an optical fiber probe manufactured by the above-described method for manufacturing an optical fiber probe is used as a probe for optical tweezers to interact with polarized light.
- a fine material processing method characterized by adsorbing, moving, and assembling a fine material comprising an anisotropic molecule group.
- the polarization direction of light incident on the optical fiber probe is switched to control the arrangement direction of the anisotropic molecules.
- a method for processing a fine material characterized by performing processing.
- an optical fiber probe manufactured by the above-described optical fiber probe manufacturing method is used as an optical tweezers probe, and an anisotropically mounted optical fiber probe is mounted on a substrate.
- the polarized light having a wavelength that is highly chemically active for the anisotropic molecules is incident on the optical fiber probe, and irradiates the anisotropic molecules, thereby forming a polymerization bond between the anisotropic molecules.
- a method for processing a fine material characterized by forming is provided.
- the anisotropic molecule is any one of an inorganic molecule, an organic molecule, a magnetic material molecule, a liquid crystal molecule, and a polymerizable molecule.
- FIG. 1 is a schematic diagram showing a procedure of a method for manufacturing an optical fiber probe according to the invention of the present application.
- FIG. 2 is a schematic diagram showing a manufacturing process of an optical fiber-probe by the method of manufacturing an optical fiber-probe according to the invention of this application.
- FIG. 3 is a schematic diagram showing a procedure of a method for manufacturing an optical fiber probe according to the invention of the present application.
- FIG. 4 is a schematic diagram showing an application method of an optical fiber probe manufactured by the optical fiber probe manufacturing method of the present invention.
- FIG. 5 is a schematic diagram showing an application method of an optical fiber-probe manufactured by the method of manufacturing an optical fiber-probe according to the invention of the present application.
- FIG. 6 is a schematic diagram showing the structure of a polarization-maintaining optical fiber used as a material in the embodiment of the present invention and the structure of a manufactured polarization-maintaining optical fiber.
- FIG. 7 is a schematic diagram showing one type of polarization-maintaining optical fiber.
- FIG. 8 is a schematic diagram showing a method for producing a conventional polarization-maintaining optical fiber probe.
- FIG. 9 is a schematic diagram showing a method for producing a conventional polarization-maintaining optical fiber probe.
- FIG. 10 is a schematic diagram showing a method for producing a conventional polarization-maintaining optical fiber probe.
- the method for manufacturing an optical fiber probe according to the invention of the present application involves etching a PANDA type polarization maintaining optical fiber or an optical fiber having a complicated structure in a cross-sectional direction, and forming a core at the tip of the optical fiber. The part is sharpened to form an optical fiber probe.
- FIG. 1 shows an outline of a method of manufacturing an optical fiber probe according to the invention of the present application.
- FIG. 2 shows a process of manufacturing an optical fiber-probe according to the optical fiber-probe manufacturing method of the present invention.
- the end of the optical fiber 1 is mechanically polished into a sharpened shape so that the core (1) is at the sharpest point.
- the stress applying part (2) is polished to the rear of the core part (1).
- an optical fiber formed into a sharp shape By immersing one end (indicated by the arrow in the right figure of Fig. 1) in the etching solution, the clad (3) is completely dissolved, and the core (1) is further sharpened and the light is Formed as a fiber-to-probe.
- Mechanical polishing of one end of the optical fiber is performed by a mechanical polishing method for the electronics industry. Specifically, as shown in Fig. 2, the optical fiber (2 2) is polished to a polishing platen (2 3) with a wax for electronics industry (2 1), etc., with reversing operation. Polishing is performed while being fixed in an oblique direction.
- the installation angle of the optical fiber (22) (the angle between the optical fiber (2 2) and the polishing platen (2 3)) when performing mechanical polishing is appropriately set according to the configuration of the optical fiber.
- the core diameter is 4 ⁇ m
- the clad diameter is 1-25 m
- the diameter of the stressed part is 4 mm. ⁇ , the length from the center to the end of the stressed part.
- the installation angle is preferably set to 1 to 8 °.
- an outer peripheral portion of the core (31), for example, a focused ion beam A notch (3 2) is formed in the cross-sectional direction by a processing method or the like, and then the optical fiber is vertically immersed in the etching solution (3 3) until the notch (32) enters.
- the core portion (31) is melted while being stretched by the weight of the optical fiber (34) in the direction of the tip from the cut (32), thereby sharpening the core portion (31) and sharpening the optical fiber (31). It may be formed as a probe.
- the length of the optical fiber (3 4) in the direction from the notch (3 2) to the tip is required to be about 3 cm because of the weight required to pull the core (3 1). preferable.
- the depth of the cut (32) is appropriately selected depending on the configuration of the optical fiber and the shape of the optical fiber probe to be formed. Notches (3 2) are formed so that is cut. .
- optical fiber probe manufactured by the method for manufacturing an optical fiber probe according to the invention of the present application described above can be used for various purposes. It is. The uses are described below, and the advantages of the optical fiber probe manufactured by the method of manufacturing an optical fiber probe according to the invention of the present application in those applications will be described.
- an optical fiber probe manufactured by the optical fiber probe manufacturing method of the present invention as a probe for optical tweezers, the direction of anisotropic molecules such as liquid crystal molecules can be controlled. It is expected to provide a new perspective in the field of nano-fiber applications, as it will be possible to transport and assemble in the future.
- a fine material composed of a plurality of anisotropic molecules (41) having an interaction with polarized light is manufactured by the optical fiber-probe manufacturing method of the present invention.
- the optical fiber probe (4 2) can be used for suction, movement, and assembling processing.
- the micromaterial to be assembled is composed of anisotropic molecules such as inorganic molecules, organic molecules, magnetic molecules, liquid crystal molecules, or polymerizable molecules. 2) Polymerization reaction with orientation control
- the optical fiber probe (51) manufactured by the method for manufacturing an optical fiber probe according to the invention of the present application is used as a probe for optical tweezers.
- the orientation of the anisotropic molecule group (54) set on the substrate (53) is controlled.
- the anisotropic molecules provided on the substrate include inorganic molecules, organic molecules, magnetic molecules, liquid crystal molecules, and polymerizable molecules. This The method makes it possible to fabricate electronic circuits and microstructures with alternately oriented structures as shown in FIG.
- the optical fiber-probe manufactured by the method for manufacturing an optical fiber-probe, which is the invention of this application, can control the polarization, so that application to a near-field optical microscope dramatically improves the performance of the microscope. It is expected to improve.
- Fine processing such as lithography using a probe
- optical fiber-probe manufactured by the optical fiber-probe manufacturing method according to the invention of the present application is highly likely to be an elemental technology for realizing it.
- the exposed core is etched and A fiber probe was made.
- a polarization maintaining optical fiber having a core diameter of 4 urn, a cladding diameter of 125 m, and a stress applying part diameter of 40 nm was used.
- the length from the center of the polarization-maintaining optical fiber to the end from the stress applying part was 6 m, and the operating wavelength was 0.62 m.
- Material co ⁇ portion is G E_ ⁇ 2 doped quartz, a material of the cladding portion is pure silica, also, the material of the stress-applying parts were B 2 0 3 doped silica.
- the crosstalk used was less than 30 dB after transmission.
- the tip of this polarization-maintaining optical fiber was fixed with an electronics box and polished from an oblique angle at an angle of 5 °.
- Mirror polishing was performed using diamond particles having a particle diameter of 0.3111 and 0.05 m, respectively. As a result, a part with a tip length of about 68.6 m, where no stress applying part exists, could be exposed.
- a two-step tapered probe was fabricated by two-step chemical etching, and gold was sputter-coated on the probe.
- the thickness of the metal film is 140 nm.
- a notch was formed around the core by the focused ion beam processing method, and the stress applying part was cut. Etching was performed. At this time, the cut was formed at a position about 3 cm away from the end of the optical fiber. During the etching, a portion 3 cm from the end (beyond the cut) was immersed vertically in the etching solution. Even if the liquid level of the etchant does not exactly match the notch, it rises due to capillary action, so it is necessary to hold the etchant at a position just before the liquid level climbs up to the notch. Regarding the etching, the same two-stage chemical etching as in Example 1 was performed.
- the crosstalk ratio of the polarization-maintaining optical fiber manufactured according to the present embodiment was measured to be 200: 1, and the crosstalk yield of the optical fiber probe according to the first embodiment was 1%. On the other hand, it was 19% in the present example, which proved to be an extremely excellent method for producing an optical fiber probe.
- Example 2 Using the polarization-maintaining optical fiber probe prepared in Example 2, fine processing by local polymerization of a dimethylene thin film was performed. An optical fiber probe having an opening diameter of 50 nm was used.
- An unpolymerized diacetylene thin film was deposited on a silicon substrate by spin coating, and the sample was scanned while irradiating ultraviolet light with a polarization-maintaining optical fiber probe to form a polymerization reaction between molecules.
- the wavelength of the irradiated ultraviolet light was 325 nm, and a He-Cd laser was used as a light source.
- the polarization direction was set at an angle of 45 ° to the scanning direction, one line was scanned in the forward direction, and the scan was performed by rotating the polarization direction by 90 ° during the return scan.
- microstructures with different orientation directions at 50 nm intervals could be produced. This is, of course, impossible with conventional methods such as STM.
- one row of the formed microstructure is one polymer, and their lengths are all equal. In ordinary chemical reactions, it is impossible to polymerize such high molecular weight polymers. Industrial applicability
- a new optical fiber probe having both high transmission efficiency and polarization degree is provided.
- the invention of this application realizes inexpensively and easily manufacturing a high-quality polarization-maintaining optical fiber probe from a PANDA-type polarization-maintaining optical fiber, which was impossible with the prior art. Since there is a high possibility that it will be applied in various fields of nanotechnology, it is highly expected that it will be put to practical use.
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- Engineering & Computer Science (AREA)
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- Crystallography & Structural Chemistry (AREA)
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- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
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- Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03761762A EP1513162A4 (en) | 2002-06-11 | 2003-06-11 | METHOD FOR PRODUCING A FIBER OPTIC PROBE AND METHOD FOR MICROMATERIAL PROCESSING |
US10/498,881 US7341681B2 (en) | 2002-06-11 | 2003-06-11 | Method of manufacturing optical fiber probe and for finishing micro material |
IL162993A IL162993A (en) | 2002-06-11 | 2004-07-13 | Method of manufacturing optical fiber probe and method of finishing micro material |
US12/007,789 US7754114B2 (en) | 2002-06-11 | 2008-01-15 | Methods for manufacturing optical fiber probe and for processing micromaterial |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002170466A JP3491043B1 (ja) | 2002-06-11 | 2002-06-11 | 光ファイバープローブの製造方法と微細材料加工方法 |
JP2002-170466 | 2002-06-11 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10498881 A-371-Of-International | 2003-06-11 | ||
US12/007,789 Division US7754114B2 (en) | 2002-06-11 | 2008-01-15 | Methods for manufacturing optical fiber probe and for processing micromaterial |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004003931A1 true WO2004003931A1 (ja) | 2004-01-08 |
Family
ID=29996453
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2003/007412 WO2004003931A1 (ja) | 2002-06-11 | 2003-06-11 | 光ファイバープローブの製造方法と微細材料加工方法 |
Country Status (5)
Country | Link |
---|---|
US (2) | US7341681B2 (ja) |
EP (1) | EP1513162A4 (ja) |
JP (1) | JP3491043B1 (ja) |
IL (1) | IL162993A (ja) |
WO (1) | WO2004003931A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4841120B2 (ja) | 2004-06-30 | 2011-12-21 | マニー株式会社 | 光ファイバーの加工方法及びレーザ光照射装置 |
DE102008043314B4 (de) * | 2008-10-30 | 2010-12-09 | Airbus Deutschland Gmbh | Verfahren und Vorrichtung zum Verstärken eines Substrats oder eines Textils einer Kernstruktur eines Bauelementes, beispielsweise eines Luft- oder Raumfahrzeugs |
EP2379341A4 (en) * | 2008-11-04 | 2017-12-06 | The University Of Queensland | Surface structure modification |
KR101134265B1 (ko) | 2010-04-23 | 2012-04-12 | 가천대학교 산학협력단 | 광섬유 탐침 제조 방법 및 장치 |
FR2987131B1 (fr) * | 2012-02-17 | 2015-03-20 | Commissariat Energie Atomique | Sonde active pour microscopie optique en champ proche et son procede de fabrication. |
CN108732388A (zh) * | 2018-03-30 | 2018-11-02 | 姜全博 | 一种单光子源主动探针的制作方法 |
DE102021102091A1 (de) | 2021-01-29 | 2022-08-04 | Leibniz-Institut für Photonische Technologien e.V. (Engl.Leibniz Institute of Photonic Technology) | Mulitmode-Lichtleitfaser, Endoskopisches System und Verfahren zum Untersuchen einer Probe |
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2002
- 2002-06-11 JP JP2002170466A patent/JP3491043B1/ja not_active Expired - Lifetime
-
2003
- 2003-06-11 EP EP03761762A patent/EP1513162A4/en not_active Withdrawn
- 2003-06-11 WO PCT/JP2003/007412 patent/WO2004003931A1/ja active Application Filing
- 2003-06-11 US US10/498,881 patent/US7341681B2/en not_active Expired - Fee Related
-
2004
- 2004-07-13 IL IL162993A patent/IL162993A/en not_active IP Right Cessation
-
2008
- 2008-01-15 US US12/007,789 patent/US7754114B2/en not_active Expired - Fee Related
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Also Published As
Publication number | Publication date |
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IL162993A (en) | 2009-09-01 |
JP2004012427A (ja) | 2004-01-15 |
US20080121614A1 (en) | 2008-05-29 |
EP1513162A1 (en) | 2005-03-09 |
JP3491043B1 (ja) | 2004-01-26 |
US7754114B2 (en) | 2010-07-13 |
EP1513162A4 (en) | 2007-07-18 |
US7341681B2 (en) | 2008-03-11 |
US20050115922A1 (en) | 2005-06-02 |
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