WO2003005002A1 - Appareil et procede de mesure des propagations - Google Patents

Appareil et procede de mesure des propagations Download PDF

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Publication number
WO2003005002A1
WO2003005002A1 PCT/JP2002/006175 JP0206175W WO03005002A1 WO 2003005002 A1 WO2003005002 A1 WO 2003005002A1 JP 0206175 W JP0206175 W JP 0206175W WO 03005002 A1 WO03005002 A1 WO 03005002A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
propagation measurement
measured
frequency
terahertz
Prior art date
Application number
PCT/JP2002/006175
Other languages
English (en)
French (fr)
Inventor
Takashi Kido
Shoji Niki
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2003510927A priority Critical patent/JP3828111B2/ja
Priority to DE10297037T priority patent/DE10297037B4/de
Publication of WO2003005002A1 publication Critical patent/WO2003005002A1/ja
Priority to US10/740,999 priority patent/US6873405B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
PCT/JP2002/006175 2001-07-02 2002-06-20 Appareil et procede de mesure des propagations WO2003005002A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003510927A JP3828111B2 (ja) 2001-07-02 2002-06-20 伝搬測定装置及び伝搬測定方法
DE10297037T DE10297037B4 (de) 2001-07-02 2002-06-20 Ausbreitungsmessvorrichtung und Ausbreitungsmessverfahren
US10/740,999 US6873405B2 (en) 2001-07-02 2003-12-19 Propagation measuring apparatus and a propagation measuring method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001-200377 2001-07-02
JP2001200377 2001-07-02

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/740,999 Continuation US6873405B2 (en) 2001-07-02 2003-12-19 Propagation measuring apparatus and a propagation measuring method

Publications (1)

Publication Number Publication Date
WO2003005002A1 true WO2003005002A1 (fr) 2003-01-16

Family

ID=19037511

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/006175 WO2003005002A1 (fr) 2001-07-02 2002-06-20 Appareil et procede de mesure des propagations

Country Status (4)

Country Link
US (1) US6873405B2 (ja)
JP (1) JP3828111B2 (ja)
DE (1) DE10297037B4 (ja)
WO (1) WO2003005002A1 (ja)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006524343A (ja) * 2003-04-22 2006-10-26 アイティーティー マニュファクチャリング エンタープライジーズ， インコーポレイテッド スペクトルロックイン技術を使用したアクティブ・リモートセンシング
WO2007029836A1 (ja) 2005-09-07 2007-03-15 Advantest Corporation 測定装置、方法、プログラムおよび記録媒体
JP2007101319A (ja) * 2005-10-03 2007-04-19 Advantest Corp 伝達特性測定装置、方法、プログラムおよび記録媒体
JP2007183106A (ja) * 2006-01-04 2007-07-19 Univ Of Tsukuba ヘテロダインビートプローブ走査プローブ顕微鏡およびこれによってトンネル電流に重畳された微小信号の計測方法
JP2010002218A (ja) * 2008-06-18 2010-01-07 Advantest Corp 光測定装置
JP2010133931A (ja) * 2008-09-19 2010-06-17 Goodrich Corp 経路変調により信号抽出を行うシステム及び方法
JP2010133859A (ja) * 2008-12-05 2010-06-17 Nippon Telegr & Teleph Corp <Ntt> 電磁波処理装置及び電磁波処理方法
JP2010151839A (ja) * 2010-03-23 2010-07-08 Univ Of Tsukuba ヘテロダインビートプローブ走査プローブトンネル顕微鏡およびこれによってトンネル電流に重畳された微小信号の計測方法
JP2010210593A (ja) * 2009-03-12 2010-09-24 Nippon Telegr & Teleph Corp <Ntt> 分光システム
JP2012098264A (ja) * 2010-10-29 2012-05-24 Emcore Corp 光源レーザビームの周波数をシフトするテラヘルツ周波数領域の分光計
JP2013003007A (ja) * 2011-06-17 2013-01-07 Nippon Telegr & Teleph Corp <Ntt> 分光システムおよびその制御方法
JP2014052272A (ja) * 2012-09-06 2014-03-20 Nippon Telegr & Teleph Corp <Ntt> 電磁波検出システム及び電磁波検出方法
JP2016011895A (ja) * 2014-06-30 2016-01-21 日本電信電話株式会社 イメージングシステム及びその方法

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US7129491B2 (en) * 2002-11-13 2006-10-31 Rensselaer Polytechnic Institute Diffraction mode terahertz tomography
US7259859B2 (en) * 2004-01-23 2007-08-21 Hrl Laboratories, Llc Terahertz modulation spectrometer
GB2418337B (en) * 2004-09-17 2008-07-16 Tera View Ltd An imaging apparatus and method
JP2006275910A (ja) * 2005-03-30 2006-10-12 Canon Inc 位置センシング装置及び位置センシング方法
GB0510109D0 (en) * 2005-05-18 2005-06-22 Ct For Integrated Photonics Th Method to generate and detect the radiation
DE102006001731A1 (de) * 2006-01-13 2007-07-19 Robert Bosch Gmbh Heterodyninterferometer
WO2008155723A1 (en) * 2007-06-21 2008-12-24 Koninklijke Philips Electronics N. V. Microelectronic sensor device with light source and light detector
DE102008019010A1 (de) * 2008-04-15 2009-10-22 Deutsche Telekom Ag Verfahren und Vorrichtung zur Verarbeitung von Terahertz-Wellen
GB0807176D0 (en) * 2008-04-18 2008-05-21 Univ Leeds Signal generation
DE102008020466A1 (de) * 2008-04-23 2009-10-29 Deutsche Telekom Ag Drahtlose Datenübertragung mit Terahertz-Wellen
WO2009146561A1 (en) * 2008-06-06 2009-12-10 T-Ray Science Inc. Dual mode terahertz spectroscopy and imaging systems and methods
US8145064B2 (en) * 2008-09-19 2012-03-27 Goodrich Corporation System and method for suppressing noise by frequency dither
JP5717335B2 (ja) * 2009-01-23 2015-05-13 キヤノン株式会社 分析装置
JP4574718B1 (ja) 2009-04-22 2010-11-04 株式会社アドバンテスト 電磁波測定装置、測定方法、プログラム、記録媒体
US8481938B2 (en) * 2009-07-01 2013-07-09 Advantest Corporation Electromagnetic wave measuring apparatus, measuring method, program, and recording medium
DE102010003239A1 (de) * 2010-03-25 2011-09-29 Robert Bosch Gmbh Vorrichtunng und Verfahren zur Erkennung von Hautkrebs mittels THz-Strahlung
US9279723B2 (en) * 2010-08-19 2016-03-08 Novatrans Group Sa Terahertz spectroscopy system and method
DE102010040356A1 (de) * 2010-09-07 2012-03-08 Universität Zu Köln THz-Spektrometer und THz-Spektroskopieverfahren
WO2015020515A1 (en) † 2013-08-05 2015-02-12 Stichting Sron Netherlands Institute For Space Research Method and apparatus for estimating a seed germination ability
US10404397B2 (en) * 2015-12-23 2019-09-03 Adva Optical Networking Se Wavelength division multiplexed telecommunication system with automatic compensation of chromatic dispersion

Citations (1)

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JP2001021503A (ja) * 1999-07-09 2001-01-26 Japan Science & Technology Corp テラヘルツ帯複素誘電率測定装置

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IT1155284B (it) * 1982-02-10 1987-01-28 Cselt Centro Studi Lab Telecom Procedimento e apparecchiatura per la misura dell'indice di rifrazione e dello spessore di materiali trasparenti
JP2882803B2 (ja) * 1988-12-01 1999-04-12 科学技術振興事業団 光断層像画像化装置
US5150248A (en) * 1989-07-21 1992-09-22 Alfano Robert R Terahertz repetition rate optical computing systems, and communication systems and logic elements using cross-phase modulation based optical processors
FR2680248B1 (fr) * 1991-08-09 1993-10-08 Slimane Loualiche Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.
US6525862B2 (en) * 1996-10-30 2003-02-25 Photogen, Inc. Methods and apparatus for optical imaging
US6348683B1 (en) * 1998-05-04 2002-02-19 Massachusetts Institute Of Technology Quasi-optical transceiver having an antenna with time varying voltage
JP2000121550A (ja) * 1998-10-16 2000-04-28 Japan Science & Technology Corp ヘテロダイン検波による生体試料の画像検出方法及びその装置
GB2343964B (en) * 1998-11-03 2000-11-01 Toshiba Res Europ Ltd An optical device
US6144679A (en) * 1999-01-15 2000-11-07 Science Applications International Corporation Method and apparatus for providing a coherent terahertz source
AU5566600A (en) * 1999-06-21 2001-01-09 Hamamatsu Photonics K.K. Terahertz wave spectrometer
GB2352512B (en) * 1999-07-23 2002-03-13 Toshiba Res Europ Ltd A radiation probe and detecting tooth decay
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WO2002015416A2 (en) * 2000-08-17 2002-02-21 Terabit Communications, L.L.C. High-speed communications system
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JP2001021503A (ja) * 1999-07-09 2001-01-26 Japan Science & Technology Corp テラヘルツ帯複素誘電率測定装置

Non-Patent Citations (2)

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Title
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MATSUURA, S., et al., "High-Resolution Terahertz Spectroscopy by a Compact Radiation Source Based on Photomixing with Diode Lasers in a Photoconductive Antenna", Journal of Molecular Spectroscopy, 1998nen, Vol. 187, pages 97 to 101 *

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006524343A (ja) * 2003-04-22 2006-10-26 アイティーティー マニュファクチャリング エンタープライジーズ， インコーポレイテッド スペクトルロックイン技術を使用したアクティブ・リモートセンシング
WO2007029836A1 (ja) 2005-09-07 2007-03-15 Advantest Corporation 測定装置、方法、プログラムおよび記録媒体
JP2007071704A (ja) * 2005-09-07 2007-03-22 Advantest Corp 測定装置、方法、プログラムおよび記録媒体
US7697122B2 (en) 2005-09-07 2010-04-13 Advantest Corporation Measuring device, method, program, and recording medium
JP2007101319A (ja) * 2005-10-03 2007-04-19 Advantest Corp 伝達特性測定装置、方法、プログラムおよび記録媒体
JP4534045B2 (ja) * 2006-01-04 2010-09-01 国立大学法人 筑波大学 ヘテロダインビートプローブ走査プローブトンネル顕微鏡およびこれによってトンネル電流に重畳された微小信号の計測方法
JP2007183106A (ja) * 2006-01-04 2007-07-19 Univ Of Tsukuba ヘテロダインビートプローブ走査プローブ顕微鏡およびこれによってトンネル電流に重畳された微小信号の計測方法
JP2010002218A (ja) * 2008-06-18 2010-01-07 Advantest Corp 光測定装置
JP2010133931A (ja) * 2008-09-19 2010-06-17 Goodrich Corp 経路変調により信号抽出を行うシステム及び方法
JP2010133859A (ja) * 2008-12-05 2010-06-17 Nippon Telegr & Teleph Corp <Ntt> 電磁波処理装置及び電磁波処理方法
JP4643705B2 (ja) * 2008-12-05 2011-03-02 日本電信電話株式会社 電磁波処理装置及び電磁波処理方法
JP2010210593A (ja) * 2009-03-12 2010-09-24 Nippon Telegr & Teleph Corp <Ntt> 分光システム
JP2010151839A (ja) * 2010-03-23 2010-07-08 Univ Of Tsukuba ヘテロダインビートプローブ走査プローブトンネル顕微鏡およびこれによってトンネル電流に重畳された微小信号の計測方法
JP2012098264A (ja) * 2010-10-29 2012-05-24 Emcore Corp 光源レーザビームの周波数をシフトするテラヘルツ周波数領域の分光計
JP2013003007A (ja) * 2011-06-17 2013-01-07 Nippon Telegr & Teleph Corp <Ntt> 分光システムおよびその制御方法
JP2014052272A (ja) * 2012-09-06 2014-03-20 Nippon Telegr & Teleph Corp <Ntt> 電磁波検出システム及び電磁波検出方法
JP2016011895A (ja) * 2014-06-30 2016-01-21 日本電信電話株式会社 イメージングシステム及びその方法

Also Published As

Publication number Publication date
DE10297037T5 (de) 2004-08-19
JPWO2003005002A1 (ja) 2004-10-28
US20040130725A1 (en) 2004-07-08
JP3828111B2 (ja) 2006-10-04
US6873405B2 (en) 2005-03-29
DE10297037B4 (de) 2008-01-17

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