WO2002075815A1 - Camera electronique a faible cout en technologie des circuits integres - Google Patents
Camera electronique a faible cout en technologie des circuits integres Download PDFInfo
- Publication number
- WO2002075815A1 WO2002075815A1 PCT/FR2002/000936 FR0200936W WO02075815A1 WO 2002075815 A1 WO2002075815 A1 WO 2002075815A1 FR 0200936 W FR0200936 W FR 0200936W WO 02075815 A1 WO02075815 A1 WO 02075815A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sensor
- electronic
- optical unit
- photosensitive surface
- electronic camera
- Prior art date
Links
- 238000005516 engineering process Methods 0.000 title description 5
- 230000003287 optical effect Effects 0.000 claims abstract description 56
- 239000004020 conductor Substances 0.000 claims abstract description 16
- 239000011325 microbead Substances 0.000 claims description 4
- 229910000679 solder Inorganic materials 0.000 claims description 4
- 229920003023 plastic Polymers 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 7
- 239000006185 dispersion Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
Definitions
- the invention relates to an electronic camera of series, of small dimensions, at low cost and in particular the optical part of focusing of the images on an electronic sensor in integrated circuit technology.
- Electronic cameras use an electronic image sensor (or electronic chip) instead of the film of traditional cameras.
- Electronic sensors made in integrated circuit technology, are in the form of electronic chips comprising an arrangement of pixels forming a photosensitive surface. The arrangement of photosensitive pixels provides electronic signals corresponding to the light image focused by the optics of the camera on the photosensitive surface of the sensor.
- Signal processing electronics generate an electronic signal corresponding to the actual light image projected onto the photosensitive surface of the sensor.
- FIG. 1 shows a simplified embodiment of an electronic camera 10 of the state of the art comprising an electronic sensor 12 of images in integrated circuit technology and a focusing lens 14 of the images on a photosensitive surface 16 of the sensor.
- the image sensor is fixed to a printed circuit 18 secured to a housing 20 of the camera, a support 22 for the lens is fixed to the same printed circuit.
- the structure of the state-of-the-art camera of FIG. 1 has drawbacks. Indeed, the dispersion of the manufacturing and mounting tolerances of the optical elements makes the positioning of the image projected by the lens on the photosensitive surface of the sensor imprecise. Adjustments of positioning of the lens relative to the sensor prove to be necessary and in particular a focusing adjustment of the lens, along the optical axis ZZ ′, which has an impact on the cost of mass production.
- the lens 14 In the assembly of FIG. 1, the lens 14 must be positioned on the one hand, horizontally with respect to the surface of the sensor so as to center the light images on the entire photosensitive surface of the sensor and, on the other hand, vertically along the optical axis ZZ 'to focus the image 5 as best as possible on this sensitive surface.
- the lens 14 is integral with a girl's ring 24 surrounding the lens, which can be screwed into the support 22 comprising a thread complementary to the thread of the ring.
- the lens can then be moved along the optical axis ZZ ′ to focus on the photosensitive surface of the sensor and compensate for variations in the mounting and manufacturing tolerances of the optical unit. Once the focus adjustment has been made, the lens can be fixed in position, for example by bonding the ring 24 to the support 22.
- FIG. 1 has another drawback linked to the dispersions of the positioning of the support 22 of the lens with respect to the photosensitive surface 16 of the sensor 12.
- FIG. 2 shows a defect in centering an image 30 on the photosensitive surface 16 of the sensor 12 of the camera of the figure.
- the theoretical center O of image 30 is located at the intersection of the axes of symmetry XX 'and YY' of the photosensitive surface 16 of the sensor.
- a dispersion of horizontal positioning, along these axes 0 XX ′ and YY ′, of the support of the lens with respect to the photosensitive surface of the sensor produces an image 32 whose center O ′ is offset from the theoretical center O.
- This dispersion of positioning the support 22 relative to the photosensitive surface of the sensor which can be of the order of 300 micrometers, produces an offset of the image focused on the sensitive surface of the sensor generating defects in linearity and sensitivity in particular at the corners of the image.
- part of the edges of the off-centered image can be projected onto elements of the chip or of the support of the lens producing parasitic reflections which decrease the contrast of the image.
- the invention provides an electronic camera for viewing light images comprising an electronic image sensor having an active face comprising an arrangement of photosensitive pixels forming a photosensitive surface, electrical conductors on the active face and a free face opposite the active face, an optical unit comprising at least a lens for focusing the light images on the photosensitive surface of the sensor, characterized in that the optical unit is mechanically integral with the sensor and in that, to ensure centered focusing of the light images on the photosensitive surface of the sensor, at least two surfaces positioning, one of the surfaces on the optical unit and the other surface on the sensor, are in direct mechanical contact.
- the mechanical positioning of the optical unit and the electronic sensor, with respect to each other, is achieved by direct mechanical contact between two positioning surfaces, one on the optical unit and the other on the electronic sensor. These two positioning surfaces in direct mechanical contact determine with great precision the position of the optical axis ZZ 'and the distance of the focusing lens from the sensitive surface of the sensor.
- the optical unit and the electronic sensor each have three plane surfaces perpendicular to each other, a planar surface of the optical unit being in contact with a respective parallel planar surface of the electronic sensor, each pair of surfaces in contact canceling, at least in one of the two directions of each of the three axes of an Oxyz reference trihedron, one of the three degrees of freedom of the optical unit with respect to the sensor.
- This first embodiment according to the invention ensures precise and reproducible focusing and centering in the production of light images on the photosensitive surface of the sensor.
- the lens is an integral part of the optical unit, making it directly integral with the sensor via the optical unit and the positioning surfaces.
- the electronic sensor is transferred to a printed circuit comprising electrical conductors connected to the electrical input / output ports of the sensor.
- the electrical connections between the sensor and the printed circuit can be made according to various known techniques.
- the electronic sensor is transferred by its free face to a printed circuit comprising electrical conductors, electrical connection wires connecting the conductors from the active side to the electrical conductors of the printed circuit.
- connection technique using connection wires, is commonly called in English “bonding”
- the electronic sensor is transferred by its active face to the printed circuit comprising an opening for the passage of light over the photosensitive surface of the sensor.
- the electrical connections are made by the fusion of solder microbeads, between the electronic sensor and the printed circuit. These balls are arranged at the electrical connections of the electronic sensor facing the electrical conductors of the printed circuit.
- FIG. 2 shows a defect in centering an image on the photosensitive surface of the sensor of the camera of Figure 1;
- FIG. 3a shows a partial sectional view of an electronic camera according to the invention
- Figure 3b shows a bottom view of the camera of Figure 3a
- FIG. 4a shows an alternative mounting of the camera of Figure 3a;
- FIG. 4b shows a bottom view of the camera of Figure
- FIG. 5 shows a perspective view of an optical unit of the cameras of Figures 3a and 4a.
- Figure 3a shows a partial sectional view along A'A of an electronic camera 40 according to the invention and Figure 3b a bottom view of the camera of Figure 3a.
- the camera 40 comprises an electronic image sensor 42 (or electronic chip) comprising an arrangement of photosensitive pixels forming a photosensitive surface 44 and an optical unit 46.
- the optical unit 46 of cylindrical shape along the axis of revolution ZZ ' has a first cylindrical wall 48, along this same axis ZZ'.
- the first cylindrical wall is closed at an upper part by a second wall 50 perpendicular to the axis ZZ '.
- the second wall 50 has at its center a focusing lens 52 of the images on the photosensitive surface of the electronic sensor 42.
- the lower part of the cylindrical wall 48 has passages 54, 56, 58, 60 revealing feet 62, 64, 66, 68 for fixing the electronic sensor 42, on the side of its photosensitive surface 44, on the optical unit 46
- Each of the feet 62, 64, 66, 68 comprises:
- the vertical surfaces of a pair, perpendicular to each other and to the horizontal surfaces 72, 74, 76, 78, of each of the feet, are in contact with vertical surfaces of the edges 88, 90, 92, 94 of the electronic sensor.
- the vertical surfaces of the optical unit 46 and of the sensor 42 in mechanical contact maintain in horizontal position, in the Oxy plane, the focusing lens 52 relative to the photosensitive surface of the sensor. Only two tolerances linked to the manufacturing precision of the optical unit and to the manufacturing precision of the sensor 42 are involved in the positioning of the focusing lens 52 relative to the photosensitive surface 44 of the sensor.
- the mechanical contacts between the different positioning surfaces of the optical unit and of the sensor can be obtained in a manner known to those skilled in the mechanical art by a choice of manufacturing tolerances for the optical unit and the sensor. For example, these tolerances can be calculated so as to obtain the maintenance of the sensor between the feet of the optical unit by clamping the sensor between the contacting surfaces and thus obtaining the desired positioning precision.
- the sensor is transferred to a printed circuit 100 by its free face 102, opposite to its active face 79 comprising the photosensitive surface.
- the printed circuit is mechanically supported by a housing 104 of the camera. Electrical connections 106 connect pads 107 (or metal pads) of the electronic output of the electronic sensor and the electrical conductors of the printed circuit making the electrical connections between the sensor and a pixel signal processing electronics (not shown in the figures) of the electronic camera.
- the optical unit can also be held in position, along the axis ZZ ', in direct contact with the electronic sensor, using a holding piece 108 secured to the printed circuit 100, the holding piece exerting a force for holding the optical unit against the electronic sensor 42.
- Figure 4a shows a partial section along BB 'of an alternative embodiment of the camera of Figure 3a and Figure 4b a bottom view of the camera of Figure 4a.
- the electronic sensor 42 is transferred, according to the “flip-chip” mounting technique, to a printed circuit 110 by the side of its active face 79 comprising the photosensitive surface 44.
- the printed circuit 110 fixed on a housing 111 of the camera, has openings 112, 114, 116, 118 for the passages of the respective feet 62, 64, 66, 68 of the optical unit 46 in mechanical contact with the horizontal and vertical surfaces for positioning the sensor electronic.
- Electrical connections connecting the electrical conductors of the active face (79) of the sensor to the electrical conductors of the printed circuit 110 are made by solder microbeads 120 according to the "flip-chip” technique for transferring the sensor to the printed circuit.
- FIG. 5 shows a perspective view of the optical unit 46 comprising the focusing lens 52.
- the optical unit 46 and the focusing lens 52 are molded in a single plastic part transparent.
- the optical unit is covered with a layer opaque to light revealing the focusing lens 52.
- FIG. 5 shows the opacified surface of the optical unit, the lens having remained transparent to light.
- the precision of the molding is the order of 1 micrometer compatible with the positioning accuracy of the optical unit and of the camera sensor according to the invention.
- reference zones are provided, facing the vertical and horizontal surfaces of the feet of the optical unit. These reference zones are of the order of a square millimeter and must not include ranges of electrical outputs.
- the only tolerance between the active part of the optics (output diopter) and that of the electronic sensor (photosensitive area of the electronic sensor) is the geometric tolerance of the optical unit.
- the details obtained with this type of assembly are of the order of ten micrometers. These tolerances are compatible with fixed optics, not adjustable, and which have focal distances less than 5 millimeters.
- Another advantage of the camera according to the invention lies in the fact that the dimensions of the optical unit are of the same order of magnitude as those of the silicon image sensor. This allows non-damaging forces to be applied to the silicon during assembly of the optical unit on the image sensor.
- the camera according to the invention ensures, without any adjustment, focal depths of about 30 centimeters to infinity which allows their integration in electronic equipment such as microcomputers and mobile phones and for which a camera focus adjustment is not desired.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Camera Bodies And Camera Details Or Accessories (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Studio Devices (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002574129A JP2004522346A (ja) | 2001-03-16 | 2002-03-15 | 集積回路技術による安価な電子カメラ |
CA002440947A CA2440947A1 (fr) | 2001-03-16 | 2002-03-15 | Camera electronique a faible cout en technologie des circuits integres |
EP02718261A EP1374315A1 (fr) | 2001-03-16 | 2002-03-15 | Camera electronique a faible cout en technologie des circuits integres |
US10/469,873 US20040080658A1 (en) | 2001-03-16 | 2002-03-15 | Low cost electronic camera made using integrated circuit technology |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0103626A FR2822326B1 (fr) | 2001-03-16 | 2001-03-16 | Camera electronique a faible cout en technologie des circuits integres |
FR01/03626 | 2001-03-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002075815A1 true WO2002075815A1 (fr) | 2002-09-26 |
Family
ID=8861230
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2002/000936 WO2002075815A1 (fr) | 2001-03-16 | 2002-03-15 | Camera electronique a faible cout en technologie des circuits integres |
Country Status (6)
Country | Link |
---|---|
US (1) | US20040080658A1 (fr) |
EP (1) | EP1374315A1 (fr) |
JP (1) | JP2004522346A (fr) |
CA (1) | CA2440947A1 (fr) |
FR (1) | FR2822326B1 (fr) |
WO (1) | WO2002075815A1 (fr) |
Cited By (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004010687A1 (fr) * | 2002-07-18 | 2004-01-29 | Koninklijke Philips Electronics N.V. | Module de camera, support a utiliser dans un module de camera, systeme de camera et procede de fabrication d'un module de camera |
WO2004010686A1 (fr) * | 2002-07-18 | 2004-01-29 | Koninklijke Philips Electronics N.V. | Module de camera, support destine a un module de camera, systeme de camera et procede de fabrication d'un module de camera |
WO2004057677A2 (fr) * | 2002-12-20 | 2004-07-08 | Em Microelectronic-Marin Sa | Structure a circuit integre ayant une partie optoelectronique recouverte par un capot a passage de lumiere |
WO2005055316A2 (fr) * | 2003-11-26 | 2005-06-16 | Micron Technology, Inc. | Groupe d'imageurs microelectroniques et procedes permettant de former un groupe d'imageurs microelectroniques |
US7009654B2 (en) | 2001-02-26 | 2006-03-07 | Mitsubishi Denki Kabushiki Kaisha | Image pickup apparatus |
US7115961B2 (en) | 2004-08-24 | 2006-10-03 | Micron Technology, Inc. | Packaged microelectronic imaging devices and methods of packaging microelectronic imaging devices |
US7189954B2 (en) | 2004-07-19 | 2007-03-13 | Micron Technology, Inc. | Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers |
US7199439B2 (en) | 2004-06-14 | 2007-04-03 | Micron Technology, Inc. | Microelectronic imagers and methods of packaging microelectronic imagers |
US7223626B2 (en) | 2004-08-19 | 2007-05-29 | Micron Technology, Inc. | Spacers for packaged microelectronic imagers and methods of making and using spacers for wafer-level packaging of imagers |
US7253397B2 (en) | 2004-02-23 | 2007-08-07 | Micron Technology, Inc. | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
US7253957B2 (en) | 2004-05-13 | 2007-08-07 | Micron Technology, Inc. | Integrated optics units and methods of manufacturing integrated optics units for use with microelectronic imagers |
US7253390B2 (en) | 2004-06-14 | 2007-08-07 | Micron Technology, Inc. | Methods for packaging microelectronic imagers |
US7262134B2 (en) | 2005-09-01 | 2007-08-28 | Micron Technology, Inc. | Microfeature workpieces and methods for forming interconnects in microfeature workpieces |
US7271482B2 (en) | 2004-12-30 | 2007-09-18 | Micron Technology, Inc. | Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods |
US7276393B2 (en) | 2004-08-26 | 2007-10-02 | Micron Technology, Inc. | Microelectronic imaging units and methods of manufacturing microelectronic imaging units |
US7294897B2 (en) | 2004-06-29 | 2007-11-13 | Micron Technology, Inc. | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
US7300857B2 (en) | 2004-09-02 | 2007-11-27 | Micron Technology, Inc. | Through-wafer interconnects for photoimager and memory wafers |
US7303931B2 (en) | 2005-02-10 | 2007-12-04 | Micron Technology, Inc. | Microfeature workpieces having microlenses and methods of forming microlenses on microfeature workpieces |
US7321455B2 (en) | 2003-09-18 | 2008-01-22 | Micron Technology, Inc. | Microelectronic devices and methods for packaging microelectronic devices |
US7397066B2 (en) | 2004-08-19 | 2008-07-08 | Micron Technology, Inc. | Microelectronic imagers with curved image sensors and methods for manufacturing microelectronic imagers |
US7402453B2 (en) | 2004-07-28 | 2008-07-22 | Micron Technology, Inc. | Microelectronic imaging units and methods of manufacturing microelectronic imaging units |
US7416913B2 (en) | 2004-07-16 | 2008-08-26 | Micron Technology, Inc. | Methods of manufacturing microelectronic imaging units with discrete standoffs |
US7429494B2 (en) | 2004-08-24 | 2008-09-30 | Micron Technology, Inc. | Microelectronic imagers with optical devices having integral reference features and methods for manufacturing such microelectronic imagers |
US7498647B2 (en) | 2004-06-10 | 2009-03-03 | Micron Technology, Inc. | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
US7511262B2 (en) | 2004-08-30 | 2009-03-31 | Micron Technology, Inc. | Optical device and assembly for use with imaging dies, and wafer-label imager assembly |
US7646075B2 (en) | 2004-08-31 | 2010-01-12 | Micron Technology, Inc. | Microelectronic imagers having front side contacts |
US8008192B2 (en) | 2005-06-28 | 2011-08-30 | Micron Technology, Inc. | Conductive interconnect structures and formation methods using supercritical fluids |
US8092734B2 (en) | 2004-05-13 | 2012-01-10 | Aptina Imaging Corporation | Covers for microelectronic imagers and methods for wafer-level packaging of microelectronics imagers |
US8816463B2 (en) | 2004-06-09 | 2014-08-26 | Round Rock Research, Llc | Wafer-level packaged microelectronic imagers having interconnects formed through terminals |
FR3057434A1 (fr) * | 2016-10-11 | 2018-04-13 | Delphi Technologies, Inc. | Dispositif de camera comportant un systeme d'alignement avec un capteur d'image |
Families Citing this family (14)
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---|---|---|---|---|
US7473218B2 (en) * | 2002-08-06 | 2009-01-06 | Olympus Corporation | Assembling method of capsule medical apparatus |
US20040061799A1 (en) | 2002-09-27 | 2004-04-01 | Konica Corporation | Image pickup device and portable terminal equipped therewith |
FR2854498B1 (fr) * | 2003-04-29 | 2005-09-16 | St Microelectronics Sa | Boitier semi-conducteur a capteur optique s'installant a l'interieur d'un objet. |
FR2854496B1 (fr) * | 2003-04-29 | 2005-09-16 | St Microelectronics Sa | Boitier semi-conducteur |
DE10344760A1 (de) * | 2003-09-26 | 2005-05-04 | Siemens Ag | Optisches Modul und optisches System |
FR2861217B1 (fr) | 2003-10-21 | 2006-03-17 | St Microelectronics Sa | Dispositif optique pour boitier semi-conducteur optique et procede de fabrication. |
US7091571B1 (en) * | 2003-12-11 | 2006-08-15 | Amkor Technology, Inc. | Image sensor package and method for manufacture thereof |
US7821564B2 (en) * | 2003-12-30 | 2010-10-26 | Given Imaging Ltd. | Assembly for aligning an optical system |
KR100700507B1 (ko) * | 2006-06-02 | 2007-03-28 | (주)모비솔 | 초소형 일체형 광학장치 |
EP2529333A4 (fr) * | 2010-01-28 | 2013-10-23 | Pathway Innovations And Technologies Inc | Système d'imagerie documentaire comportant un appareil caméra-scanneur et un logiciel de traitement basé sur un ordinateur personnel |
DE102010047106A1 (de) * | 2010-10-01 | 2012-04-05 | Conti Temic Microelectronic Gmbh | Optische Vorrichtung mit Justageelement |
FR3037190B1 (fr) * | 2015-06-02 | 2017-06-16 | Radiall Sa | Module optoelectronique pour liaison optique sans contact mecanique, ensemble de modules, systeme d'interconnexion, procede de realisation et de connexion a une carte associes |
US20180315894A1 (en) * | 2017-04-26 | 2018-11-01 | Advanced Semiconductor Engineering, Inc. | Semiconductor device package and a method of manufacturing the same |
US10948682B2 (en) | 2018-03-23 | 2021-03-16 | Amazon Technologies, Inc. | Self-aligning lens holder and camera assembly |
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EP0400176A1 (fr) * | 1989-05-31 | 1990-12-05 | Siemens Aktiengesellschaft | Elément optique fixable sur une surface |
US5216805A (en) * | 1990-12-12 | 1993-06-08 | Eastman Kodak Company | Method of manufacturing an optoelectronic device package |
EP0585186A2 (fr) * | 1992-08-28 | 1994-03-02 | Eastman Kodak Company | Enveloppe de protection pour des semiconducteurs avec des composants optiques |
US5783815A (en) * | 1995-10-24 | 1998-07-21 | Sony Corporation | Light receiving device having lens fitting element |
JPH11191865A (ja) * | 1997-12-25 | 1999-07-13 | Matsushita Electric Ind Co Ltd | 固体撮像装置及びその製造方法 |
JPH11317895A (ja) * | 1998-03-05 | 1999-11-16 | Olympus Optical Co Ltd | 光学装置 |
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-
2001
- 2001-03-16 FR FR0103626A patent/FR2822326B1/fr not_active Expired - Fee Related
-
2002
- 2002-03-15 JP JP2002574129A patent/JP2004522346A/ja not_active Withdrawn
- 2002-03-15 CA CA002440947A patent/CA2440947A1/fr not_active Abandoned
- 2002-03-15 WO PCT/FR2002/000936 patent/WO2002075815A1/fr not_active Application Discontinuation
- 2002-03-15 US US10/469,873 patent/US20040080658A1/en not_active Abandoned
- 2002-03-15 EP EP02718261A patent/EP1374315A1/fr not_active Withdrawn
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Also Published As
Publication number | Publication date |
---|---|
EP1374315A1 (fr) | 2004-01-02 |
CA2440947A1 (fr) | 2002-09-26 |
US20040080658A1 (en) | 2004-04-29 |
FR2822326A1 (fr) | 2002-09-20 |
FR2822326B1 (fr) | 2003-07-04 |
JP2004522346A (ja) | 2004-07-22 |
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