Classifications

• • H—ELECTRICITY
  • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
  • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
  • H05K13/08—Monitoring manufacture of assemblages
  • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
  • H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/8806—Specially adapted optical and illumination features

Definitions

• the invention relates to a method for adjusting the lighting in a device for position detection and / or quality control of components and / or substrates according to the preamble of claim 1.
• the position of the components relative to the placement position on the printed circuit board is determined by means of position detection devices before the assembly.
• components includes all objects that can be fitted, for example shielding plates.
• Vision systems which comprise a camera, for example a CCD camera, and an illumination device are generally used as position detection devices.
• a visual inspection of the components is carried out in analog quality control devices in order to identify defective components and to remove them from the assembly process.
• Centering marks applied to the substrates serve to identify the position of the substrates.
• Reject markings made on the substrates are used for marking defective substrates, so that these defective substrates are identified in the quality control device and then removed from the placement process.
• a wide variety of substrates epoxy / glass fiber composites, plastic films, ceramics, hard paper
• Different materials such as shiny or matt metals / metal oxides or plastic or lacquer covers are also used for the markings.
• the optical surface properties markings of different materials for substrates and Mar ⁇ vary extremely and thus the illumination by a Be ⁇ caused contrast between the label and the substrate. The lighting should therefore be selected so that useful structures (in general the connections of the components or the markings) are displayed in high contrast to interference structures (for example the body of the components or substrate background).
• Markings and substrates and / or components are each made from materials with mutually different optical properties, such as absorption, metallic or diffuse reflection, in order to be distinguished from one another when illuminated with an illumination device with an almost constant spectral distribution due to their different backscattering behavior in an image evaluation unit.
• the optical properties vary with the wavelength of the illuminating light, so that, in the case of illumination with an almost constant spectral distribution, material combinations for markings, substrates and / or components are not distinguished from one another disadvantageously can.
• Replacement of the lighting equipment in depen ⁇ dependence on the materials used is not feasible very complex and at a aspired high placement due to the time loss.
• JP 5-332939 discloses a method for quality control of components with a number of lighting units, each of which has its own intensity control device.
• the light emitted by the lighting units is changed by changing the intensity until optimal lighting (maximum contrast) is achieved, in which the component is reliably recognized.
• JP 8-219716 A A method for illuminating objects with different colors is known from JP 8-219716 A, in which the color of the light emitted by an illumination unit is changed via an illumination control.
• the method according to the invention has the advantage that the spectral distribution of the illumination by varying the parameters of the intensity control rt Pl P a ⁇ P ) : cn d P- cn LJ. cn li ⁇ al li ⁇ Q dd r ⁇ j ⁇ öd öd ⁇ ⁇ C ⁇ öd ⁇
• Training phase first the optimum lighting for it determines ⁇ stes component 19 and then used for further similar components 19th
• the method according to the invention therefore has the advantage of ensuring optimized lighting for components 19, substrates 5 and / or markings 7 consisting of a wide variety of materials.

Landscapes

• Engineering & Computer Science (AREA)
• Operations Research (AREA)
• Manufacturing & Machinery (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Analytical Chemistry (AREA)
• General Physics & Mathematics (AREA)
• Life Sciences & Earth Sciences (AREA)
• Chemical & Material Sciences (AREA)
• Physics & Mathematics (AREA)
• Biochemistry (AREA)
• General Health & Medical Sciences (AREA)
• Health & Medical Sciences (AREA)
• Immunology (AREA)
• Pathology (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
• Supply And Installment Of Electrical Components (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Image Input (AREA)
• Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Priority Applications (4)

Applications Claiming Priority (2)

Publications (1)

Family

ID=7844945

Family Applications (1)

Country Status (7)

Cited By (8)

Families Citing this family (28)

Citations (2)

Family Cites Families (10)

• 1998
  • 1998-04-29 US US09/069,283 patent/US6040895A/en not_active Expired - Fee Related
  • 1998-09-21 JP JP2000516517A patent/JP2001520392A/ja active Pending
  • 1998-09-21 CN CNB988100541A patent/CN1183819C/zh not_active Expired - Lifetime
  • 1998-09-21 EP EP98954206A patent/EP1020105B1/de not_active Expired - Lifetime
  • 1998-09-21 DE DE59803363T patent/DE59803363D1/de not_active Expired - Lifetime
  • 1998-09-21 KR KR1020007003844A patent/KR100356957B1/ko not_active IP Right Cessation
  • 1998-09-21 WO PCT/DE1998/002795 patent/WO1999020093A1/de active IP Right Grant

Patent Citations (2)

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