WO1998029814A1

WO1998029814A1 - Ic card

Info

Publication number: WO1998029814A1
Application number: PCT/JP1997/004691
Authority: WO
Inventors: Yoshihiro Ikefuji; Shigemi Chimura; Haruo Taguchi
Original assignee: Rohm Co., Ltd.
Priority date: 1996-12-26
Filing date: 1997-12-18
Publication date: 1998-07-09
Also published as: AU7892898A

Abstract

A sub-memory (11) is provided in addition to a main memory (10) so as to store data from a main control section (7) in the main memory (10) and the sub-memory (11), and error detecting circuits (12 and 13) respectively detect the errors of the data stored in the memories (10 and 11) and control selectors (8 and 9) so that data can be read out from the error-free memories.

Description

Specification

Field of Ic card technology

The present invention relates to an IC card, and more particularly, to an IC card that has a built-in nonvolatile memory for storing various data and that exchanges data with a control unit called an interrogator. . Background art

There are IC cards that exchange data by electrically connecting terminals to the control unit, and IC cards that exchange data without contact. This non-contact I C force

The ド is a device that obtains power from radio waves transmitted from an antenna and transmits information stored in a nonvolatile memory inside it. It is used for ski lift lifts, railway ticket gates, and sorting of luggage. It's being used.

Regardless of the contact type and non-contact type described above, the IC force is structurally vulnerable to external stress, and the data stored in the non-volatile memory may change due to static electricity or the like. is there. Conventionally, such a change in data cannot be detected as an error in the non-volatile memory of the IC card, and moreover, error correction of the data and the like cannot be performed. Disclosure of the invention

Therefore, a main object of the present invention is to provide an IC card which has a built-in spare nonvolatile memory and can cope with a data error.

Another object of the present invention is to provide an IC card capable of detecting an error in data stored when a nonvolatile memory is not operating.

The present invention relates to an IC card for exchanging data by interrogating with an interrogator, a non-volatile storage circuit for storing data given from the interrogator, and a pair of data stored in the non-volatile storage circuit. Spare to store data that can be handled by 1 And a non-volatile memory circuit.

According to a preferred embodiment of the present invention, there is further provided an error detection circuit for detecting an error in data stored in the nonvolatile storage circuit, and a non-volatile memory in response to no error being detected by the error detection circuit. A selection circuit for selecting data stored in the storage circuit and selecting data stored in the spare nonvolatile storage circuit in response to detection of an error.

In a more preferred embodiment of the present invention, an error detection circuit for detecting an error of data stored in the spare nonvolatile memory circuit, and a spare nonvolatile memory circuit in response to no error being detected. A selection circuit for selecting stored data and selecting data stored in the nonvolatile storage circuit in response to detection of an error. Two or more spare nonvolatile memory circuits are provided, and a majority decision is made between the data stored in the nonvolatile memory circuit and the data stored in each of the two or more spare nonvolatile memory circuits. And a selection circuit for selecting data stored in the non-volatile storage circuit indicated by the majority decision.

The non-volatile storage circuit and the spare non-volatile storage circuit are configured such that physical addresses for storing the same data are different. Further, the nonvolatile storage circuit and the spare nonvolatile storage circuit have different storage capacities. The error detection circuit performs an error detection for each byte or a plurality of bytes, and a detection result of the error detection circuit is stored in a nonvolatile storage circuit. Then, the data error is corrected based on the error detection result. According to another aspect of the present invention, there is provided an IC card for exchanging data with an interrogator, comprising: a nonvolatile memory circuit for storing data from the interrogator; and a nonvolatile memory when the nonvolatile memory circuit is not selected. An error detection circuit for detecting an error in the data stored in the storage circuit.

The embodiment of the present invention includes a spare nonvolatile memory circuit that stores the same data as the data stored in the nonvolatile memory circuit or data that can be corresponded one-to-one. Detects an error in data stored in the storage circuit or the non-volatile storage circuit for backup. Then, based on the error detection result, the error detection circuit stores the data stored in the nonvolatile storage circuit or the spare nonvolatile storage circuit. Data. BRIEF DESCRIPTION OF THE FIGURES

FIG. 1 is a block diagram showing an embodiment of the present invention.

FIG. 2 is a block diagram showing an example of the error detection circuit shown in FIG.

FIG. 3 is a block diagram showing another embodiment of the present invention.

FIG. 4 is a diagram showing an embodiment in which the physical locations for storing data in the main memory 10 and the sub memory 11 are changed.

FIG. 5 is a diagram showing a sequence of an interrogator and an IC card according to still another embodiment of the present invention.

FIG. 6 is a flowchart for explaining the operation of still another embodiment of the present invention. BEST MODE FOR CARRYING OUT THE INVENTION

FIG. 1 is a block diagram showing an embodiment of the present invention. I C force shown in Fig. 1

The following describes an example of a signal superimposition method in which data transmission and reception and power supply to the contactless card are performed using a single frequency signal.However, data transmission and reception and power supply are performed using different frequency signals. A signal separation type IC card may be used. In FIG. 1, a tuning circuit 1 composed of a coil L and a capacitor C tunes to a modulation signal sent from an interrogator (not shown), and supplies the sent carrier to a rectifier circuit 2. The rectifier circuit 2 rectifies the carrier and supplies a voltage to each part as a DC power supply. When a modulation signal is sent, the tuning circuit 1 supplies the modulation signal to the amplification / demodulation unit 3, and the amplification / demodulation unit 3 demodulates data from the modulation signal. Since the demodulated output data is sent serially, it is converted into parallel data by the S / P converter 5 and given to the main controller 7.

When returning a response to the interrogator, the main control unit 7 uses non-volatile storage means; the data from the main memory 10 of r is supplied to the PZS converter 6 to be converted into serial data, and the serial data is modulated and amplified. The modulation and amplification section 4 amplifies the data and modulates when the unmodulated wave is supplied to the tuning circuit 1. In addition, the main control unit 7 The main memory 10 and the sub-memory 11 as spare nonvolatile storage means are connected via selectors 8 and 9.

As the main memory 10 and the sub memory 11, for example, an E ² ROM, a flash memory, a ferroelectric memory, or the like is used. The sub-memory 11 is used as a backup of the main memory 10 and writes data that can correspond to the main memory 10 on a one-to-one basis. Error detection circuits 12 and 13 are provided to detect errors in the data written corresponding to the main memory 10 and the sub memory 11 respectively. As the error detection circuits 12 and 13, a parity check circuit, a CRC check circuit, and the like are used. Further, when an error is detected by the error detection circuits 12 and 13, error correction circuits 16 and 17 are provided to correct the error.

When data is transmitted as a modulation signal from the interrogator, the tuning circuit 1 tunes to the modulation signal, the data is demodulated by the amplification / demodulation unit 3, and the serial data is converted to parallel data by the S / P conversion unit 5. And is given to the main control unit 7. The main controller 7 stores the data in the main memory 10 and the sub memory 11 via the selectors 8 and 9. The error detection circuits 12 and 13 detect whether there is an error in the data stored in the main memory 10 and the sub memory 11 respectively. If there is no error in the main memory 10, the error detection circuit 12 controls the selector 8 so that data is read from the main memory 10 to the main control unit 7, and the sub memory 11 reads data. The selector 9 is controlled so that is not read.

If the error detection circuit 12 detects that there is a data error in the main memory 10, it controls the selector 8 so that data is not read from the main memory 10, and the data is read from the sub memory 11. Control the selector 9 so that it is read. The error detection circuit 13 detects whether there is an error in the data stored in the sub memory 11. If there is an error in data not only in the main memory 10 but also in the sub memory 11, data is not supplied from the main memory 10 and the sub memory 11 to the main controller 7. In this case, the main control unit 7 re-requests data transmission to the interrogator or specifies that there is an error in the data. After reading data from the main memory 10 or the sub memory 11, the error correction circuits 16 and 17 correct data errors. Note that the error detection circuit 13 is omitted, and the main memory Only the error detection of the data of the data 10 may be performed.

FIG. 2 is a block diagram showing an example of the error detection circuit shown in FIG. The error detection circuit 12 shown in FIG. 2 performs a CRC check, and includes a 5-bit shift register 121, a 7-bit shift register 122, and a 4-bit shift register 123. These are serially connected by EXOR gates 124, 125, and 126.

FIG. 3 is a block diagram showing another embodiment of the present invention, and does not show a circuit between the tuning circuit 1 and the SZP converter 5 and the PZS converter 6 shown in FIG. In this embodiment, a sub memory 14 is further provided in addition to the main memory 10 and the sub memory 11, and the majority decision of the data stored in the main memory 10 and the sub memories 11 and 14 is performed by a majority circuit. In step 15, it is determined whether the data stored in the main memory 10 or the sub memory 11 is correct, and the selectors 8 and 9 are switched accordingly.

FIG. 4 is a diagram showing an embodiment in which the physical locations for storing data in the main memory 10 and the sub memory 11 are changed. In this way, by changing the physical location where data is stored, even if the data changes due to stress applied to the IC card, the data storage location is not close, The probability that such data remains normal will increase.

As described above, the provision of the sub-memory 11 greatly enhances the resistance to data changes and errors due to externally applied forces such as stress and static electricity, and increases the reliability of the nonvolatile memory block. Can be enhanced.

When it is determined that one of the data in the main memory 10 and the data in the sub memory 11 is correct, the content of the memory having the error may be corrected.

The main memory 10 and the sub-memory 11 store the same data.The main memory 12 has the information of a certain data value Q, and the sub-memory has the information of the reciprocal of Q. You can. In addition, any data such as a complement can be applied as long as the data can correspond one-to-one.

Further, the sub memory 11 may be a memory having a different capacity from the main memory 10. Further, the error detection by the error detection circuits 12 and 13 is performed for one or more bytes. It is better to do it every time. Further, the result of the error detection may be stored in either the main memory 10 or the sub memory 11.

FIG. 5 is a diagram for explaining the operation of still another embodiment of the present invention, and FIG. 6 is a flowchart for explaining the operation of still another embodiment of the present invention. Next, with reference to FIGS. 1, 2, 5, and 6, the operation of still another embodiment of the present invention will be described. I. As shown in Fig. 5, when the card is activated, data is transmitted from the interrogator, which is recognized by the main control unit 7, and the main control unit 7 exchanges data with the interrogator when The main memory 10 and the sub memory 11 are not operating. Therefore, in the embodiment of the present invention, error detection of data stored in the main memory 10 and sub-memory 11 and correction of data are performed during this period.

That is, as shown in FIG. 6, the main control unit 7 determines whether or not data is being exchanged. If the data is being exchanged, the main controller 7 does not perform the memory error detection operation. The main control unit 7 performs error detection unless data is being exchanged, and records the detection result in the main memory 10 or the sub memory 11. This allows you to deal with multiple errors. The main control unit 7 determines whether error detection has been performed for all bytes of the main memory 10 or the sub memory 11 and performs error detection for all bytes. If no error is detected, the main control unit 7 ends the error detection operation and waits for data exchange with the interrogator.

If an error is detected in either the main memory 10 or the sub memory 11, the main control unit 7 determines whether to exchange data with the interrogator, and corrects the data if it is not operating. Do. Then, it is determined whether or not the data has been corrected for all errors. If the actual program is running during the process, the correction result is stored, and a series of operations is completed.

In the above-described embodiment, when data is not exchanged with the interrogator at the time of activation, data error detection is performed. However, the present invention is not limited to this. It is also possible to perform error detection and correction of data in the main memory 10 or the sub memory 11 during a period in which only exchange is performed. Further, in the above-described embodiment, the present invention is applied to a non-contact type IC card, but may be applied to a contact type IC card.

As described above, according to the present invention, by adding a spare nonvolatile memory, it is possible to increase the reliability against data changes and errors due to externally applied forces such as stress and static electricity. . Moreover, according to the present invention, data error detection and data correction are performed when the original non-volatile storage means is not selected, so that the actual communication time can be changed without any change. You can save time. Industrial applicability

According to the present invention, by adding a spare nonvolatile memory, it is possible to increase the reliability against data changes and errors due to externally applied forces such as stress and static electricity, and to improve the reliability of the nonvolatile memory. Errors in data stored during operation can be detected, and a highly reliable Ic card can be provided.

Claims

The scope of the claims

1. An IC card that exchanges data with the interrogator.

Non-volatile storage means for storing data given from the interrogator, and spare non-volatile storage means for storing data that can correspond one-to-one with data stored in the non-volatile storage means The IC card.

2. Error detecting means for detecting an error in data stored in the nonvolatile storage means;

When the error is not detected by the error detecting means, the data stored in the non-volatile storage means is selected, and when the error is detected, the data is stored in the spare non-volatile storage means. 2. The IC card according to claim 1, further comprising a selection unit for selecting data stored therein.

3. Further, an error detecting means for detecting an error of data stored in the spare nonvolatile storage means,

When the error is not detected by the error detecting unit, the data stored in the spare nonvolatile storage unit is selected, and is stored in the nonvolatile storage unit in response to the detection of the error. 2. The IC card according to claim 1, further comprising a selection unit for selecting data stored therein.

4. Two or more spare nonvolatile storage means are provided,

Majority decision means for taking a majority decision on the contents of the data stored in the nonvolatile storage means and the data stored in each of the two or more spare nonvolatile storage means;

2. The IC card according to claim 1, further comprising: selection means for selecting data stored in the non-volatile storage means indicated by the majority decision by the majority decision means.

5. The IC card according to claim 1, wherein the non-volatile storage means and the spare non-volatile storage means are separated by a distance in an arrangement of storage elements for storing the same data on an IC chip. .

6. The Ic card according to claim 1, wherein the nonvolatile storage means and the spare nonvolatile storage means have different storage capacities.

7. The IC card according to claim 2, wherein the error detection means performs error detection for each byte or every plural bytes.

8. The IC card according to claim 2, wherein a detection result of the error detection unit is stored in the nonvolatile storage unit.

9. The IC card according to claim 2, further comprising correcting a data error based on a detection result of the error detection unit.

10. In an IC card that exchanges data with the interrogator,

Non-volatile storage means for storing data from the interrogator,

An IC card comprising: an error detection unit configured to detect an error in data stored in the nonvolatile storage unit when the nonvolatile storage unit is not selected.

11. A spare non-volatile storage unit for storing the same data as the data stored in the non-volatile storage unit or data that can be made to correspond one-to-one, wherein the error detection unit is a non-volatile storage unit. 10. The IC card according to claim 10, wherein an error of data stored in the means or the spare nonvolatile storage means is detected.

12. The method according to claim 11, wherein the error detection means corrects data stored in the nonvolatile storage means or the spare nonvolatile storage means based on an error detection result. IC card.

Claims of amendment

[May 7, 1980 (07.0.9.8) Accepted by the International Bureau: Claim 2 originally filed was withdrawn; Claims 1, 3, 4 originally filed And 7-9 have been amended; other claims are unchanged. (2 pages)]

1. (After correction) An I-force for exchanging data with the interrogator, the non-volatile memory means for storing data given from the interrogator, and the nonvolatile memory A spare non-volatile storage means for storing data so that the data stored in the storage means can be made one-to-one correspondence;

An error detecting unit configured to detect an error in data stored in the non-volatile storage unit before updating the non-volatile storage unit;

If the error is not detected by the error detecting means, the data stored in the non-volatile storage means is selected; and if the error is detected, the non-volatile memory is reserved. Selecting means for selecting data stored in the storage means.

2. (Delete)

3. (After Correction) An IC card for exchanging data with a printer, wherein the non-volatile storage means for storing data given from the printer and the non-volatile memory means ; A non-volatile nonvolatile storage tS means for storing data that can be made to correspond one-to-one with data to be breathed;

An error detection unit configured to be able to detect an error in the data stored in the spare ffl non-volatile storage unit before updating the non-volatile storage unit;

When the error is not detected by the error detecting means, the data stored in the spare nonvolatile storage means is selected, and when the error is detected, the non-volatile memory is selected. The claim 1 further includes a selecting means for selecting data stored in the t'S means. The claim 1;

4. (After Correction) The spare nonvolatile storage means S is provided at least 2 and the data stored in the nonvolatile storage means and the two or more spare nonvolatile storage means are further provided. A majority vote means for taking a majority vote of the contents with the data stored in each of the means,

The selecting means selects the data stored in the non-volatile storage means indicated by the majority vote by the majority means.

10 Amended paper (Article 19 of the Convention)

5. The nonvolatile memory I means and the spare nonvolatile memory means are arranged apart from each other by disposing the storage elements for storing the same data on the I c chip. -IC force as described in claim 1.

6. The non-volatile memory means and the preliminary non-volatile memory means are different from each other in ¾ 'capacity δ. :

7. (After Correction) The IC card according to claim 1 is characterized in that the error detecting means detects one or more bytes.

8. (After correction) The IC force according to claim 1, wherein a detection result of the error detecting means is stored in the non-volatile storage means.

0 9. (After Sode Masaru) Further, a data error is corrected based on a detection result of the error detection means, wherein the error is corrected.

1 0. In the I C mode that exchanges data with the interrogator,

Non-volatile storage means for storing data from the interrogator;

When the non-volatile memory means is not selected, the non-volatile memory means has an error detection step for detecting an error in ditted data.

1 1. In addition, irregularly; And a spare memory for storing the same data or data that can be made to correspond one-to-one with the data stored in the memory. and detecting an error in data stored in ί) ίί¾ preliminary non ^ nonvolatile memory ^ stage, 0 IC card according to ^ Motome项1 ^().

1 2. The error detecting means corrects the data stored in the end non-permanence t'ST-stage or the spare non-volatile memory I based on the error detection result. 11. The method according to claim 11, wherein:

11

Paper captured (Article 19 of the Convention)