WO1998010298A1 - Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel - Google Patents
Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel Download PDFInfo
- Publication number
- WO1998010298A1 WO1998010298A1 PCT/JP1997/003049 JP9703049W WO9810298A1 WO 1998010298 A1 WO1998010298 A1 WO 1998010298A1 JP 9703049 W JP9703049 W JP 9703049W WO 9810298 A1 WO9810298 A1 WO 9810298A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- liquid crystal
- inspection
- crystal display
- display panel
- integrated circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Definitions
- Liquid crystal display panel inspection apparatus liquid crystal display panel inspection method, and liquid crystal panel manufacturing method
- the present invention relates to an inspection device for a liquid crystal display panel, and more particularly to a structure of an inspection probe device suitable for performing a lighting inspection of a liquid crystal display panel of a type having an IC chip mounted on an external terminal portion.
- one of two substrates constituting the panel is protruded from an outer peripheral portion of the liquid crystal display panel, and a plurality of substrates drawn out of the display area are provided on the surface of the protruding portion. It is common to have an external terminal portion formed with an external terminal.
- the external terminals are arranged with external terminals for applying a drive voltage for causing a liquid crystal display panel to perform a display operation. Wiring from a liquid crystal drive circuit is connected to each external terminal.
- a COG (Chip On G 1 ass) type liquid crystal display panel in which an IC chip with a built-in liquid crystal drive circuit is directly mounted on the above external terminals has is there.
- the wiring layer pulled out from the display area of the liquid crystal display panel is connected to the first terminal group to be connected to the output terminal of the IC chip, and the position of the IC chip is set at a position facing the first terminal group.
- a second terminal group corresponding to the input terminals is arranged. These second terminal groups are directly pulled out to the outer edge of the external terminal portion to become external terminal groups connected to an external control circuit or the like.
- the present invention is to solve the above-mentioned problem, and the problem is that an almost complete panel inspection can be performed before mounting an IC chip in a liquid crystal display panel inspection apparatus, and at the same time, an external terminal part can be inspected. It is an object of the present invention to provide a new configuration capable of simultaneously performing a wiring pattern inspection. Disclosure of the invention
- Means taken by the present invention to solve the above-mentioned problems include: a holder accommodating a plurality of wirings; an integrated circuit having a plurality of exposed connection terminals attached to a tip end of the holder; An inspection apparatus for a liquid crystal display panel, comprising: a plurality of inspection probes arranged in parallel with the connection terminals of a circuit, wherein the wiring is conductively connected to the inspection probes.
- an inspection apparatus for a liquid crystal display panel comprising: a plurality of inspection probes arranged in parallel with the connection terminals of a circuit, wherein the wiring is conductively connected to the inspection probes.
- the inspection probe may include an exposed contact terminal portion, a flexible wire connecting between the contact terminal portion and the wiring, and an elastic resin covering the flexible wire. preferable.
- the inspection probe since the inspection probe connects the wiring and the contact terminal with a flexible wire and is covered with the elastic resin, the position of the contact terminal is set to the surface height of the external terminal. Accordingly, a reliable connection can be obtained, and the contact between the connection terminal of the integrated circuit and the external terminal can be stabilized. In addition, since it can be formed only by connecting a flexible wire and filling and curing with an elastic resin, it can be easily manufactured.
- the integrated circuit is elastically attached to the holder.
- the integrated circuit is elastically attached to the holder, the contact state between the connection terminal and the external terminal portion can be stabilized, and a reliable contact can be obtained.
- the holding body has a wiring board to be connected to the liquid crystal display panel, and the wiring is a wiring layer formed on the wiring board.
- the holding body includes a holding mechanism for holding the integrated circuit detachably.
- the holding mechanism for detachably holding the integrated circuit, it is possible to appropriately select and inspect a different integrated circuit.
- the integrated circuit can be removed as it is after being bonded and fixed on the external terminals, so that the integrated circuit can be mounted on the liquid crystal display panel.
- connection terminal of the integrated circuit held by the integrated circuit holding means is brought into contact with the wiring pattern of the external terminal portion provided on the substrate of the liquid crystal panel with a predetermined pressing force
- An electrical inspection of the liquid crystal panel is performed by supplying a liquid crystal panel inspection signal to the integrated circuit through the inspection probe,
- the integrated circuit and the substrate are bonded via a resin adhesive in which conductive particles are dispersed, and the integrated circuit and the connection terminal are conductively connected.
- FIG. 1 is an enlarged vertical sectional view showing a state of use of a liquid crystal display panel inspection apparatus according to the present invention.
- FIG. 2 is an enlarged plan view of an external terminal portion of the liquid crystal display panel.
- FIG. 3 is a partial plan view of the outer edge of the liquid crystal display panel.
- FIG. 4 is a perspective view showing a method of forming a probe structure.
- FIG. 5 is a longitudinal sectional view showing a state before the start of the inspection.
- FIG. 6 is a longitudinal sectional view showing a state at the time of inspection.
- FIG. 7 is a plan view of an inspection arm showing a different embodiment.
- FIG. 8 is a sectional view showing an IC chip mounting process using an inspection arm.
- FIG. 1 is an enlarged partial cross-sectional view showing a use state of a probe device according to the present embodiment.
- the liquid crystal display panel is composed of various types of liquid crystal displays.In the illustrated example, the liquid crystal display panel includes an element substrate 10 having a wiring layer 11 connected to a pixel electrode, and a counter electrode 21. The liquid crystal layer 30 is sandwiched between the liquid crystal layer 30 and the counter substrate 20.
- an external terminal portion 15 is formed on the outer edge of the element substrate 10 so as to extend laterally beyond the end of the counter substrate 20.
- a plurality of first lead-out lines 12 drawn out from the display area facing the liquid crystal layer 30 and a space formed with respect to the first lead-out lines are formed.
- the second extraction wiring 13 is formed in a predetermined pattern with the first extraction wiring 13 ⁇
- the first extraction wiring 12 is connected to the wiring layer 11 or the counter electrode 21, and as shown in FIG.
- the tip is a first terminal 12a formed corresponding to the output terminal of a predetermined integrated circuit chip (hereinafter simply referred to as an IC chip) A.
- the inner end of the second lead-out wiring 13 is a second terminal 13a formed corresponding to the input terminal of the IC chip A, and the outer end of the second lead-out wiring 13 is formed.
- the external terminal 13b is conductively connected to a connection terminal configured to be arranged in the same bit as the external terminal 13b, for example, at the connection terminal portion B opposite to the flexible circuit.
- the external terminal section 15 is designed so that a plurality of IC chips A are arranged as shown in FIG. 3, and these IC chips A are connected to external terminals 13 b connected to a control circuit and a power supply circuit.
- the second terminal 13a receives the control signal and the power supplied from the second terminal 13a, generates a drive signal based on the control signal and the power, and outputs the driving signal from the first terminal 12a to the wiring layer in the liquid crystal display panel. It is configured to send a driving signal to the counter electrode and the like.
- the mark 14 is printed for positioning the IC chip A.
- the terminal portion 15 may be formed, a portion that protrudes outward from the end of the element substrate 10 is also formed on the outer edge of the counter substrate 20, and this protruding portion (on the back side) is connected to the external terminal. It may be formed as an external terminal part 25 similar to the part 15.
- a holding plate 40 made of an insulating material (for example, a hard resin) having a certain degree of rigidity as a holding body is mounted on a lifting mechanism (not shown) so as to be able to move up and down with high accuracy.
- a lifting mechanism not shown
- an air supply hole 40a penetrating vertically and a wide-opening portion 40b formed continuously below the air supply hole 40a are provided.
- An air supply tube 41 connected to an air supply device (not shown) is connected to an upper opening of the air supply hole 40a.
- a flexible thin film for example, an elastic sheet 42 made of a synthetic rubber sheet is attached so as to seal the wide opening 4 Ob.
- the above-mentioned IC chip A is adhesively fixed on the outer surface of the elastic sheet 42.
- This IC chip A may be the IC chip A itself mounted on the external terminal sections 15 and 25 shown in FIG. 2 or FIG. 3, and is not the same but has almost the same function formed for inspection. Other IC chips having the following may be used.
- the elastic sheet 42 covering the wide-opening 40b expands downward, and the elasticity according to the gas supply pressure.
- IC chip A can be held elastically by its characteristics.
- a flexible circuit board 43 is adhered and fixed to the lower surface of the holding plate 40.
- the flexible circuit board 43 has a plurality of wiring patterns 43 having a predetermined pattern formed on the surface or inside thereof. Is provided.
- the ends of the plurality of wiring patterns 43a are connection terminal portions 43b, and the connection terminal portions 43b are provided on the lower surface side of the holding plate 40, and have the above-described wide opening. It faces the recess 40c formed behind the opening 40b.
- connection terminal portion 43b One end of a conductive wire 44 made of a gold wire or the like is bonded to the connection terminal portion 43b.
- the other end of the conductive wire 44 is made of a metal connection. Connected to contact terminals 45. Then, the insulating resin is recessed so as to mold the plurality of connection terminal portions 43 b and the plurality of conductive wires 44.
- the mold body 46 After filling into 40 c, the mold body 46 is formed by solidification.
- the molding body 46 not only fills the recess 40 c of the holding plate 40, but also covers the connecting portion between the conductive wire 44 and the contact terminal 45, and furthermore, contacts the contact terminal 4 5.
- the lower surface 5 is configured to protrude downward from the concave portion 40c so as to be exposed.
- FIG. 4 is a perspective view showing a method of forming the mold body 46.
- the conductive wires 44 bonded to the connection terminals 4 3b of the wiring patterns 4 3a formed on the surface of the flexible circuit board 4 3 4 Bonded to pad 47.
- the flexible circuit board 43 is bonded and fixed to the lower surface of the holding plate 40 shown in FIG. 1, and the insulating resin is poured into the concave portion 40c of the holding plate 40.
- the frame plate 48 is removed, and the connection terminal 45 is joined to the exposed portion of the connection pad 47 (the portion that was in contact with the frame plate 48).
- Inspection control device is included in the wiring pattern 4 3 a of the flexible circuit board 4 3
- gas is supplied from the air supply device through the air supply tube 41 at a predetermined pressure, whereby the elastic sheet 42 is moved downward.
- a lifting mechanism (not shown) for operating the holding plate 40 is used.
- the chip A and the contact terminal 45 are lowered onto the external terminal 15 of the liquid crystal display panel.
- the input terminal a and the output terminal b of the IC chip A are When the holding plate 40 is pressed onto the element substrate 10 so that the second terminal 13a and the first terminal 12a shown in Fig.
- Tip A is an elastic sheath that is inflated by gas pressure.
- the contact terminal 45 is pressed against the external terminal 15 with a predetermined strength by the elasticity of the molding body 46 by pressing the contact terminal 45 with the predetermined strength by the elasticity given by the contact 42. Pressed to.
- the input terminal a of the IC chip A comes into contact with the second terminal 13a of the second lead-out wiring 13 and the output terminal b of the IC chip A comes out of the first lead-out wiring 12 (1)
- the same state as when the IC chip A is mounted can be achieved.
- the inspection can be performed via the wiring pattern 43 a of the flexible circuit board 43.
- the flexible circuit board 43 has the same or the same structure as the flexible circuit board connected to the external terminal of the second lead-out wiring 13 so that the same state as a completed liquid crystal display device is obtained. In this state, inspection can be performed.
- the IC chip A is brought into contact with the first terminal 12a and the second terminal 13a, and the contact terminal 45 is brought into contact with the external terminal 13b, so that the lighting inspection of the liquid crystal display panel or the like is performed. It can be performed.
- the IC chip A is detachably held on the holding plate 40 by a method such as vacuum suction or a gripping mechanism, and the IC chip A contacts the external terminal 15 of the liquid crystal display panel. After performing the inspection, if the inspection result is good, it is possible to mount the IC chip A on the external terminal portion 15 as it is.
- the mounting of IC chip A is provided with gripping arms 61, 62 with variable mutual distances at the tip end, and these gripping arms 61, 62 are used to mount IC chip A.
- the inspection is performed by the inspection arm 60 which also serves as the holding plate 40.
- the inspection arm 60 has the same probe structure as the contact terminals 45 connected to the wiring pattern 43 a of the flexible circuit board 43, similarly to the holding plate 40 described above. .
- a structure substantially similar to the holding plate 40 of the embodiment is realized.
- the liquid crystal display panel By lowering the inspection arm 60 onto the external terminal 15 of the liquid crystal display panel, the liquid crystal display panel can be inspected in the same manner as described above. At this time, if no defect is found in the liquid crystal display panel, then the inspection arm 60 is used as it is as a mounting head of the IC chip A.
- anisotropic conductive adhesive sheet 70 is laid on external terminals 15 and gripping arms 61 and 6 are attached. With IC chip A sandwiched by 2 and lowered onto external terminals 15 as in the case of inspection, the input and output terminals of IC chip A and the terminals formed on external terminals 15 Are positioned so as to make regular contact via the anisotropic conductive adhesive sheet 70.
- the anisotropic conductive adhesive sheet 70 is obtained by dispersing conductive particles in, for example, a photocurable or thermosetting resin adhesive.
- the inspection of the liquid crystal display panel and the mounting of the IC chip A can be continuously performed by the inspection arm 60, and the mounting of the IC chip A is directly performed by the inspection arm after the mounting of the IC chip A. It is also possible to confirm.
- Industrial applicability According to the present invention described above, in a liquid crystal display panel inspection apparatus, almost complete panel inspection can be performed before mounting an IC chip, and inspection of a wiring pattern on an external terminal portion can be simultaneously performed. Is the thing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
A novel structure of a device for inspecting liquid crystal display panels. A liquid crystal display panel is almost completely inspected using the device before an IC chip is mounted and, further, wiring patterns on external terminals can be inspected simultaneously. An air supply inlet (40a) and a wide opening part (40b) are provided in the edge part of a holding plate (40), and an elastic sheet (42) is attached so as to close the wide opening part (40b). An IC chip (A) is bonded and fixed to the outer surface of the elastic sheet (42). A flexible circuit board (43) is bonded and fixed to the lower surface of the holding plate (40), and wiring patterns (43a) are provided on the flexible circuit board (43). Connection terminal parts (43b) are provided on the edge parts of the wiring patterns (43a) to which one ends of conductive wires (44) are bonded. The other ends of the conductive wires (44) are bonded to contact terminals (45). The connection terminal parts (43b) and the conductive wires (44) are encapsulated in a molding body (46).
Description
明 細 書 Specification
液晶表示パネルの検査装置、 液晶表示パネルの検査方法、 並びに液晶 パネルの製造方法 技術分野 Liquid crystal display panel inspection apparatus, liquid crystal display panel inspection method, and liquid crystal panel manufacturing method
本発明は液晶表示パネルの検査装置に係り、 特に、 外部端子部上に I Cチップを搭載する種類の液晶表示パネルの点灯検査を行う場合に好適 な検査用プローブ装置の構造に関する。 背景技術 The present invention relates to an inspection device for a liquid crystal display panel, and more particularly to a structure of an inspection probe device suitable for performing a lighting inspection of a liquid crystal display panel of a type having an IC chip mounted on an external terminal portion. Background art
従来の液晶表示装置においては、 液晶表示パネルの外周縁部に当該パ ネルを構成する 2枚の基板のいずれかを張り出させ、 その張り出し部の 表面上に表示領域内から引き出された複数の外部端子を形成した外部端 子部を備えたものが一般的である。 In a conventional liquid crystal display device, one of two substrates constituting the panel is protruded from an outer peripheral portion of the liquid crystal display panel, and a plurality of substrates drawn out of the display area are provided on the surface of the protruding portion. It is common to have an external terminal portion formed with an external terminal.
この外部端子部は、 液晶表示パネルの表示動作を行わせるための駆動 電圧を印加するための外部端子を配列したものであり、 各外部端子には、 液晶駆動回路からの配線が接続される。 The external terminals are arranged with external terminals for applying a drive voltage for causing a liquid crystal display panel to perform a display operation. Wiring from a liquid crystal drive circuit is connected to each external terminal.
外部端子部における外部端子の数は近年の液晶表示装置の高精細化に 伴って増加し、 また、 端子配列についても挟ピッチ化が進んでいる。 そ のため、 通常は、 外部端子部にフレキシブル配線基板をヒー トシールを 利用して接続する場合が多くなつている。 The number of external terminals in the external terminal section has increased with the recent increase in the definition of liquid crystal display devices, and the pitch of terminals has also been reduced. Therefore, in many cases, a flexible wiring board is usually connected to an external terminal portion using a heat seal.
さらに、 液晶表示装置の小型化、 薄型化に対応するために、 上記外部 端子部に液晶駆動回路を内蔵した I Cチップを直接実装した C O G ( C h i p O n G 1 a s s ) 型の液晶表示パネルがある。 この場合、 液 晶表示パネルの表示領域から引き出された配線層は I Cチップの出力端 子に接続されるべき第 1端子群に接続され、 この第 1端子群に対向する 位置に、 I Cチップの入力端子に対応する第 2端子群が配列される。 こ れらの第 2端子群はそのまま外部端子部の外縁部に引き出されて外部の 制御回路等に接続される外部端子群となる。
上記従来の C 0 G型の液晶表示パネルにおいては、 液晶表示パネルを 形成した後、 外部端子部上に I Cチップを実装し、 その後に、 パネル検 査を行うようにしている。 しかし、 I Cチップの実装後にパネル検査を 行う と、 液晶表示パネル自体が不良である場合、 I Cチップが不良であ る場合のいずれにおいても製品としては不良となるため、 残りの他方の 部品が無駄になってしまうという問題点がある。 実際には、 液晶表示パ ネルの不良が多く、 I Cチップが無駄になってしまう場合が多い。 Furthermore, in order to respond to the miniaturization and thinning of the liquid crystal display device, a COG (Chip On G 1 ass) type liquid crystal display panel in which an IC chip with a built-in liquid crystal drive circuit is directly mounted on the above external terminals has is there. In this case, the wiring layer pulled out from the display area of the liquid crystal display panel is connected to the first terminal group to be connected to the output terminal of the IC chip, and the position of the IC chip is set at a position facing the first terminal group. A second terminal group corresponding to the input terminals is arranged. These second terminal groups are directly pulled out to the outer edge of the external terminal portion to become external terminal groups connected to an external control circuit or the like. In the conventional C0G type liquid crystal display panel described above, after the liquid crystal display panel is formed, an IC chip is mounted on an external terminal portion, and thereafter, panel inspection is performed. However, if panel inspection is performed after mounting the IC chip, the product will be defective if the liquid crystal display panel itself is defective or if the IC chip is defective, and the other component is wasted. There is a problem that it becomes. In practice, the LCD panel is often defective, and IC chips are often wasted.
—方、 I Cチップの実装前にパネル検査を行う場合には、 液晶表示パ ネル自体の簡単な検査を行うことはできるが、 液晶駆動回路を介して例 えば階調制御による精密な点灯検査を行うことはできず、 当該点灯検査 を行うには、 液晶駆動回路と同様の機能を持つ検査装置を用意しなけれ ばならない。 On the other hand, when performing a panel inspection before mounting an IC chip, a simple inspection of the liquid crystal display panel itself can be performed, but a precise lighting inspection by gradation control, for example, through a liquid crystal drive circuit can be performed. It cannot be performed, and to perform the lighting inspection, an inspection device having the same function as the liquid crystal drive circuit must be prepared.
さらに、 上記 I Cチップの実装後におけるパネル検査では、 第 1端子 群から先の液晶表示パネルの部分しか検査できず、 第 2端子群及びこれ らに接続された外部端子群の配線検査を同時に行うことはできないため、 外部端子部上に欠陥があっても I Cチッブ実装後の検査時までは不良検 出ができず、 結局、 I Cチップが無駄になって しまう という問題点があ る。 Furthermore, in the panel inspection after the mounting of the IC chip, only the portion of the liquid crystal display panel beyond the first terminal group can be inspected, and the wiring inspection of the second terminal group and the external terminal group connected thereto are simultaneously performed. However, even if there is a defect on the external terminal, a defect cannot be detected until the inspection after mounting the IC chip, resulting in a problem that the IC chip is wasted.
そこで本発明は上記問題点を解決するものであり、 その課題は、 液晶 表示パネルの検査装置において、 I Cチップの実装前にほぼ完全なパネ ル検査を行うことができるとともに、 外部端子部上の配線パターンの検 査をも同時に行うことができる新規の構成を提供することにある。 発明の開示 Therefore, the present invention is to solve the above-mentioned problem, and the problem is that an almost complete panel inspection can be performed before mounting an IC chip in a liquid crystal display panel inspection apparatus, and at the same time, an external terminal part can be inspected. It is an object of the present invention to provide a new configuration capable of simultaneously performing a wiring pattern inspection. Disclosure of the invention
上記課題を解決するために本発明が講じた手段は、 複数の配線を収容 した保持体と、 該保持体の先端部に取り付けられ、 露出した複数の接続 端子を備えた集積回路と、 該集積回路の前記接続端子に並列配置された 複数の検査プローブとを有し、 該検査プローブに前記配線が導電接続さ れていることを特徴とする液晶表示パネルの検査装置である。
この手段によれば、 保持体を外部端子部上に降下させることによって、 外部端子部に集積回路の接続端子を接触させると同時に、 検査プローブ をも接触させることができるため、 この状態で液晶表示パネルの検査を 行うことによって集積回路を実装した場合と同様の検査を行うことがで きる。 Means taken by the present invention to solve the above-mentioned problems include: a holder accommodating a plurality of wirings; an integrated circuit having a plurality of exposed connection terminals attached to a tip end of the holder; An inspection apparatus for a liquid crystal display panel, comprising: a plurality of inspection probes arranged in parallel with the connection terminals of a circuit, wherein the wiring is conductively connected to the inspection probes. According to this means, by lowering the holder onto the external terminal portion, the connection terminal of the integrated circuit can be brought into contact with the external terminal portion, and at the same time, the inspection probe can be brought into contact with the external terminal portion. By performing panel inspection, the same inspection as when an integrated circuit is mounted can be performed.
ここで、 前記検査プローブは、 露出した接触端子部と、 該接触端子部 と前記配線との間を接続する可撓性ワイヤと、 該可撓性ワイヤを包摂す る弾性樹脂とを有することが好ましい。 Here, the inspection probe may include an exposed contact terminal portion, a flexible wire connecting between the contact terminal portion and the wiring, and an elastic resin covering the flexible wire. preferable.
この手段によれば、 検査プローブは、 配線と接触端子部との間を可撓 性ワイヤで接続し、 弾性樹脂で包摂してなるため、 接触端子部の位置を 外部端子部の表面高さに応じて柔軟に対応させることができ、 確実なコ' ン夕ク トを得ることができるとともに、 集積回路の接続端子と外部端子 部との間のコンタク トも安定させることができる。 しかも、 可撓性ワイ ャを接続して弾性樹脂で充填硬化させるだけで形成できるので、 容易に 製造することができる。 According to this means, since the inspection probe connects the wiring and the contact terminal with a flexible wire and is covered with the elastic resin, the position of the contact terminal is set to the surface height of the external terminal. Accordingly, a reliable connection can be obtained, and the contact between the connection terminal of the integrated circuit and the external terminal can be stabilized. In addition, since it can be formed only by connecting a flexible wire and filling and curing with an elastic resin, it can be easily manufactured.
また、 前記集積回路は、 前記保持体に対して弾性的に取り付けられて いることが好ましい。 Preferably, the integrated circuit is elastically attached to the holder.
この手段によれば、 集積回路が保持体に対して弾性的に取り付けられ ているため、 接続端子と外部端子部との間の接触状態を安定させ、 確実 なコンタク トを得ることができる。 According to this means, since the integrated circuit is elastically attached to the holder, the contact state between the connection terminal and the external terminal portion can be stabilized, and a reliable contact can be obtained.
さらに、 前記保持体は、 前記液晶表示パネルに接続されるべき配線基 板を装着し、 前記配線は、 該配線基板に形成された配線層であることが 好ましい。 Further, it is preferable that the holding body has a wiring board to be connected to the liquid crystal display panel, and the wiring is a wiring layer formed on the wiring board.
この手段によれば、 液晶表示パネルに接続されるべき配線基板を保持 体に装着してあるため、 制作が容易になる。 According to this means, since the wiring board to be connected to the liquid crystal display panel is mounted on the holder, the production is facilitated.
そして、 前記保持体は、 前記集積回路を着脱可能に保持する保持機構 を備えていることが好ましい。 Further, it is preferable that the holding body includes a holding mechanism for holding the integrated circuit detachably.
この手段によれば、 集積回路を着脱可能に保持する保持機構を備えて いることによって、 異なる集積回路を適宜選定して検査することができ
るとともに、 集積回路を装着して検査を行った後、 そのまま、 当該集積 回路を外部端子部上に接着固定した後に取り外すことができるため、 液 晶表示パネルに集積回路を実装することができる。 According to this means, by providing the holding mechanism for detachably holding the integrated circuit, it is possible to appropriately select and inspect a different integrated circuit. In addition, after the integrated circuit is mounted and inspected, the integrated circuit can be removed as it is after being bonded and fixed on the external terminals, so that the integrated circuit can be mounted on the liquid crystal display panel.
また、 液晶パネルの基板に設けられた外部端子部の配線パターンに、 集積回路把持手段に把持された集積回路の接続端子を所定の押圧力で接 触させ、 Also, the connection terminal of the integrated circuit held by the integrated circuit holding means is brought into contact with the wiring pattern of the external terminal portion provided on the substrate of the liquid crystal panel with a predetermined pressing force,
次に、 前記外部端子部に対応して設けられた複数の検査プローブを前 記外部端子部に接触させ、 Next, a plurality of inspection probes provided corresponding to the external terminal portion are brought into contact with the external terminal portion,
該検査プローブを通じて前記集積回路に液晶パネル検査用信号を供給 することによって液晶パネルの電気的検査を行い、 An electrical inspection of the liquid crystal panel is performed by supplying a liquid crystal panel inspection signal to the integrated circuit through the inspection probe,
次いで、 前記集積回路と前記基板とを、 導電性粒子を分散させた樹脂 接着剤を介して接着し、 前記集積回路と前記接続端子とを導電接続する ことが好ましい。 Next, it is preferable that the integrated circuit and the substrate are bonded via a resin adhesive in which conductive particles are dispersed, and the integrated circuit and the connection terminal are conductively connected.
この手段によれば、 集積回路を用いて液晶パネルの電気的検査を行い、 続けて集積回路の実装を行うため、 効率の高い液晶パネルの製造方法を 提供できる。 図面の簡単な説明 According to this means, the electrical inspection of the liquid crystal panel is performed using the integrated circuit, and subsequently, the mounting of the integrated circuit is performed. Therefore, a highly efficient liquid crystal panel manufacturing method can be provided. BRIEF DESCRIPTION OF THE FIGURES
第 1図は、 本発明に係る液晶表示パネルの検査装置の使用状態を示 す拡大縦断面図である。 FIG. 1 is an enlarged vertical sectional view showing a state of use of a liquid crystal display panel inspection apparatus according to the present invention.
第 2図は、 液晶表示パネルの外部端子部上の拡大平面図である。 第 3図は、 液晶表示パネルの外縁部の一部平面図である。 FIG. 2 is an enlarged plan view of an external terminal portion of the liquid crystal display panel. FIG. 3 is a partial plan view of the outer edge of the liquid crystal display panel.
第 4図は、 プローブ構造の形成方法を示すための斜視図である。 第 5図は、 検査開始前の状態を示す縦断面図である。 FIG. 4 is a perspective view showing a method of forming a probe structure. FIG. 5 is a longitudinal sectional view showing a state before the start of the inspection.
第 6図は、 検査時の状態を示す縦断面図である。 FIG. 6 is a longitudinal sectional view showing a state at the time of inspection.
第 7図は、 異なる実施形態を示す検査アームの平面図である。 FIG. 7 is a plan view of an inspection arm showing a different embodiment.
第 8図は、 検査アームを用いた I Cチップの実装工程を示す断面図 である。
発明を実施するための最良の形態 FIG. 8 is a sectional view showing an IC chip mounting process using an inspection arm. BEST MODE FOR CARRYING OUT THE INVENTION
次に、 添付図面を参照して本発明に係る実施形態について説明する。 第 1図は本実施形態におけるプローブ装置の使用状態を示す拡大一部断 面図である。 液晶表示パネルは、 さまざまなタイプの液晶表示体で構成 されるが、 図示の例においては、 画素電極に接続された配線層 1 1 を備 えた素子基板 1 0と、 対向電極 2 1 を備えた対向基板 2 0 との間に液晶 層 3 0を挟持した状態に構成されている。 Next, an embodiment according to the present invention will be described with reference to the accompanying drawings. FIG. 1 is an enlarged partial cross-sectional view showing a use state of a probe device according to the present embodiment. The liquid crystal display panel is composed of various types of liquid crystal displays.In the illustrated example, the liquid crystal display panel includes an element substrate 10 having a wiring layer 11 connected to a pixel electrode, and a counter electrode 21. The liquid crystal layer 30 is sandwiched between the liquid crystal layer 30 and the counter substrate 20.
第 3図に示すように、 素子基板 1 0の外縁部には、 対向基板 2 0の端 部よりも側方に張り出した外部端子部 1 5が形成されている。 この外部 端子部 1 5の表面上には、 液晶層 3 0に対向する表示領域から引き出さ れた複数の第 1引出配線 1 2 と、 この第 1引出配線に対して間隔をもつ て形成された第 2引出配線 1 3 とが所定のパターンにて形成されている < 第 1引出配線 1 2は上記配線層 1 1又は対向電極 2 1 に接続されてお り、 第 2図に示すように、 その先端部は所定の集積回路チップ (以下、 単に I Cチップと称する。 ) Aの出力端子に対応して形成された第 1端 子 1 2 aとなっている。 また、 第 2引出配線 1 3の内側端部は、 上記 I Cチヅプ Aの入力端子に対応して形成された第 2端子 1 3 aとなってお り、 第 2引出配線 1 3の外側端部は、 外部の制御回路や給電回路等に接 続するための外部端子 1 3 bとなっている。 外部端子 1 3 bは、 例えば フレキシブル回路基反の接続端子部 Bにおいて、 外部端子 1 3 bと同一 ビッチで配列されるように構成された接続端子に導電接続される。 As shown in FIG. 3, an external terminal portion 15 is formed on the outer edge of the element substrate 10 so as to extend laterally beyond the end of the counter substrate 20. On the surface of the external terminal portion 15, a plurality of first lead-out lines 12 drawn out from the display area facing the liquid crystal layer 30 and a space formed with respect to the first lead-out lines are formed. The second extraction wiring 13 is formed in a predetermined pattern with the first extraction wiring 13 <The first extraction wiring 12 is connected to the wiring layer 11 or the counter electrode 21, and as shown in FIG. The tip is a first terminal 12a formed corresponding to the output terminal of a predetermined integrated circuit chip (hereinafter simply referred to as an IC chip) A. The inner end of the second lead-out wiring 13 is a second terminal 13a formed corresponding to the input terminal of the IC chip A, and the outer end of the second lead-out wiring 13 is formed. Is an external terminal 13b for connection to an external control circuit or power supply circuit. The external terminal 13b is conductively connected to a connection terminal configured to be arranged in the same bit as the external terminal 13b, for example, at the connection terminal portion B opposite to the flexible circuit.
外部端子部 1 5には、 第 3図に示すように複数の I Cチップ Aが並ぶ ように設計されており、 これらの I Cチップ Aは、 制御回路や給電回路 に接続される外部端子 1 3 bから供給される制御信号及び電力を第 2端 子 1 3 aにて受け、 これらの制御信号及び電力に基づいて駆動信号を生 成し、 第 1端子 1 2 aから液晶表示パネル内の配線層や対向電極等に向 けて駆動信号を送るように構成されている。 なお、 マーク 1 4は、 I C チップ Aの位置決め用に印刷されたものである。 The external terminal section 15 is designed so that a plurality of IC chips A are arranged as shown in FIG. 3, and these IC chips A are connected to external terminals 13 b connected to a control circuit and a power supply circuit. The second terminal 13a receives the control signal and the power supplied from the second terminal 13a, generates a drive signal based on the control signal and the power, and outputs the driving signal from the first terminal 12a to the wiring layer in the liquid crystal display panel. It is configured to send a driving signal to the counter electrode and the like. The mark 14 is printed for positioning the IC chip A.
液晶表示パネルの種類によっては、 素子基板 1 0の外縁部のみに外部
端子部 1 5が形成される場合もあるが、 対向基板 2 0の外縁部にも素子 基板 1 0の端部から外側へ張り出した部分を形成し、 この張り出し部分 (の裏側) を上記外部端子部 1 5 と同様の外部端子部 2 5 として形成す る場合もある。 Depending on the type of liquid crystal display panel, only the outer edge of the element substrate 10 Although the terminal portion 15 may be formed, a portion that protrudes outward from the end of the element substrate 10 is also formed on the outer edge of the counter substrate 20, and this protruding portion (on the back side) is connected to the external terminal. It may be formed as an external terminal part 25 similar to the part 15.
本実施形態においては、 保持体としてある程度剛性の高い絶縁性の材 質 (例えば硬質樹脂) で形成された保持板 4 0を、 図示しない昇降機構 に搭載し、 精度良く上下動できるように構成されている。 この保持板 4 0の先端部には上下に貫通する給気孔 4 0 aと、 この給気孔 4 0 aの下 側に連続して形成された広口開口部 4 0 bとが設けられている。 給気孔 4 0 aの上部開口には、 図示しない給気装置に接続された給気チューブ 4 1が接続されている。 また、 広口開口部 4 O bを密閉するように、 可 撓性の薄膜、 例えば合成ゴムシ一トで構成された弾性シー卜 4 2が取り 付けられている。 In the present embodiment, a holding plate 40 made of an insulating material (for example, a hard resin) having a certain degree of rigidity as a holding body is mounted on a lifting mechanism (not shown) so as to be able to move up and down with high accuracy. ing. At the tip of the holding plate 40, an air supply hole 40a penetrating vertically and a wide-opening portion 40b formed continuously below the air supply hole 40a are provided. An air supply tube 41 connected to an air supply device (not shown) is connected to an upper opening of the air supply hole 40a. Further, a flexible thin film, for example, an elastic sheet 42 made of a synthetic rubber sheet is attached so as to seal the wide opening 4 Ob.
この弾性シ一ト 4 2の外面上には上記の I Cチップ Aが接着固定され ている。 この I Cチップ Aは、 第 2図又は第 3図に示す外部端子部 1 5, 2 5に実装する I Cチップ Aそのものでもよ く、 また、 そのものではな いが検査用に形成されたほぼ同機能を有する他の I Cチップでもよい。 給気孔 4 0 aに給気チューブ 4 1 を介して気体を供給することによつ て、 広口開口部 4 0 bを覆う弾性シート 4 2は下方へ膨らみ、 気体の供 給圧力に応じた弾性特性によって I Cチップ Aを弾性的に保持すること ができる。 The above-mentioned IC chip A is adhesively fixed on the outer surface of the elastic sheet 42. This IC chip A may be the IC chip A itself mounted on the external terminal sections 15 and 25 shown in FIG. 2 or FIG. 3, and is not the same but has almost the same function formed for inspection. Other IC chips having the following may be used. By supplying gas to the air supply hole 40a through the air supply tube 41, the elastic sheet 42 covering the wide-opening 40b expands downward, and the elasticity according to the gas supply pressure. IC chip A can be held elastically by its characteristics.
保持板 4 0の下面にはフ レキシブル回路基板 4 3が接着固定されてお り、 このフ レキシブル回路基板 4 3には、 表面若しくは内部に形成され た所定パターン形状の複数の配線パターン 4 3 aが設けられている。 こ れらの複数の配線パターン 4 3 aの先端部は接続端子部 4 3 bとなって おり、 この接铳端子部 4 3 bは、 保持板 4 0の下面側であって、 上記広 口開口部 4 0 bの後方に形成された凹部 4 0 cに臨んでいる。 A flexible circuit board 43 is adhered and fixed to the lower surface of the holding plate 40. The flexible circuit board 43 has a plurality of wiring patterns 43 having a predetermined pattern formed on the surface or inside thereof. Is provided. The ends of the plurality of wiring patterns 43a are connection terminal portions 43b, and the connection terminal portions 43b are provided on the lower surface side of the holding plate 40, and have the above-described wide opening. It faces the recess 40c formed behind the opening 40b.
接続端子部 4 3 bには、 金線等からなる導電性ワイャ 4 4の一端がボ ンデイ ングされている。 また、 導電性ワイヤ 4 4の他端は、 金属製の接
触端子 4 5に接続されている。 そして、 上記の複数の接続端子部 4 3 b と、 複数の導電性ワイヤ 4 4 とをモールドするように、 絶縁樹脂を凹部One end of a conductive wire 44 made of a gold wire or the like is bonded to the connection terminal portion 43b. The other end of the conductive wire 44 is made of a metal connection. Connected to contact terminals 45. Then, the insulating resin is recessed so as to mold the plurality of connection terminal portions 43 b and the plurality of conductive wires 44.
4 0 cに充填した後に、 固化させることによってモールド体 4 6が形成 されている。 このモール ド体 4 6は、 単に保持板 4 0の凹部 4 0 cを充 填するだけでなく、 導電性ワイヤ 4 4 と接触端子 4 5 との接続部を覆う ように、 しかも、 接触端子 4 5の下側表面は露出するように、 凹部 4 0 cから下方へ突出する形状に構成されている。 After filling into 40 c, the mold body 46 is formed by solidification. The molding body 46 not only fills the recess 40 c of the holding plate 40, but also covers the connecting portion between the conductive wire 44 and the contact terminal 45, and furthermore, contacts the contact terminal 4 5. The lower surface 5 is configured to protrude downward from the concave portion 40c so as to be exposed.
第 4図は、 モールド体 4 6の形成方法を示す斜視図である。 フレキシ ブル回路基板 4 3の表面上にパターン形成された配線パターン 4 3 aの 接続端子部 4 3 bにボンディ ングされた導電性ワイャ 4 4は、 枠板 4 8 の上に複数配列された接続パッ ド 4 7にボンディ ングされる。 この状態 で、 フレキシブル回路基板 4 3を第 1図に示す保持板 4 0の下面に接着 固定し、 絶縁樹脂を保持板 4 0の凹部 4 0 cに流し込む。 絶縁樹脂を硬 化させた後、 枠板 4 8を取り外し、 接続パッ ド 4 7の露出した部分 (枠 板 4 8に接触していた部分) に接続端子 4 5を接合させる。 FIG. 4 is a perspective view showing a method of forming the mold body 46. The conductive wires 44 bonded to the connection terminals 4 3b of the wiring patterns 4 3a formed on the surface of the flexible circuit board 4 3 4 Bonded to pad 47. In this state, the flexible circuit board 43 is bonded and fixed to the lower surface of the holding plate 40 shown in FIG. 1, and the insulating resin is poured into the concave portion 40c of the holding plate 40. After hardening the insulating resin, the frame plate 48 is removed, and the connection terminal 45 is joined to the exposed portion of the connection pad 47 (the portion that was in contact with the frame plate 48).
フレキシブル回路基板 4 3の配線パターン 4 3 aには、 検査制御装置 Inspection control device is included in the wiring pattern 4 3 a of the flexible circuit board 4 3
5 0が接続され、 複数の配線パターン 4 3 aに対して、 所定の検査サイ クル及び検査パターンにて制御信号や電源電位を供給するように構成さ れている。 50 are connected, and a control signal and a power supply potential are supplied to the plurality of wiring patterns 43a in a predetermined test cycle and test pattern.
以上説明した本実施形態によれば.、 第 5図に示すように、 給気装置か ら気体を所定圧力で給気チューブ 4 1を介して供給するこどによって、 弾性シート 4 2を下方へ膨らませ、 I Cチップ Aを気体圧力によって下 方へ突出させた状態に保持する。 供給気体の圧力を一定に保ったまま、 保持板 4 0を動作させるための図示しない昇降機構によって I 。チップ A及び接触端子 4 5を液晶表示パネルの外部端子部 1 5上に降下させる, 次に、 第 6図に示すように、 I Cチップ Aの入力端子 aと出力端子 b とが第 1図に示す第 2端子 1 3 aと第 1端子 1 2 aに接触し、 接触端子 4 5が外部端子 1 3 bに接触するように、 保持板 4 0を素子基板 1 0の 上に押し付けると、 I Cチップ Aは気体圧力によって膨らんだ弾性シー
ト 4 2によって付与された弾性により所定の強さで外部端子部 1 5上に 押し付けられ、 また、 接触端子 4 5はモール ド体 4 6の弾性により所定 の強さで外部端子部 1 5上に押し付けられる。 According to the present embodiment described above, as shown in FIG. 5, gas is supplied from the air supply device through the air supply tube 41 at a predetermined pressure, whereby the elastic sheet 42 is moved downward. Inflate and hold IC chip A in a state of protruding downward by gas pressure. While the pressure of the supplied gas is kept constant, a lifting mechanism (not shown) for operating the holding plate 40 is used. The chip A and the contact terminal 45 are lowered onto the external terminal 15 of the liquid crystal display panel.Next, as shown in FIG. 6, the input terminal a and the output terminal b of the IC chip A are When the holding plate 40 is pressed onto the element substrate 10 so that the second terminal 13a and the first terminal 12a shown in Fig. Tip A is an elastic sheath that is inflated by gas pressure. The contact terminal 45 is pressed against the external terminal 15 with a predetermined strength by the elasticity of the molding body 46 by pressing the contact terminal 45 with the predetermined strength by the elasticity given by the contact 42. Pressed to.
このとき、 I Cチップ Aの入力端子 aと出力端子 bとが、 それそれ第 2端子 1 3 a及び第 1端子 1 2 aに確実に接触したことを確認するため に、 一定に保持されていた気体圧力が I Cチップ Aの接触圧力によって 上昇したことを検知する圧力センサを取付け、 この圧力センサの圧力検 出値が所定値以上に上昇した場合に昇降機構を停止させ、 保持板 4 0の 移動を停止させるように制御することが好ましい。 At this time, the input terminal a and the output terminal b of IC chip A were held constant to confirm that they were securely in contact with the second terminal 13a and the first terminal 12a, respectively. Attach a pressure sensor that detects that the gas pressure has increased due to the contact pressure of IC chip A. When the pressure detection value of this pressure sensor rises above a predetermined value, stop the elevating mechanism and move the holding plate 40. Is preferably controlled to be stopped.
保持板 4 0を降下させて、 I Cチップ Aの入力端子 aが第 2引出配線 1 3の第 2端子 1 3 aに接触し、 I Cチップ Aの出力端子 bが第 1引出 配線 1 2の第 1端子 1 2 aに接触し、 しかも、 接触端子 4 5が第 2引出 配線 1 3の外部端子 1 3 bに接触した状態とすることによって、 I Cチ ッブ Aを実装した状態と同じ状態でフレキシブル回路基板 4 3の配線パ ターン 4 3 aを介して検査を行うことができる。 By lowering the holding plate 40, the input terminal a of the IC chip A comes into contact with the second terminal 13a of the second lead-out wiring 13 and the output terminal b of the IC chip A comes out of the first lead-out wiring 12 (1) By contacting the terminal 12a with the contact terminal 45 being in contact with the external terminal 13b of the second lead-out wiring 13, the same state as when the IC chip A is mounted can be achieved. The inspection can be performed via the wiring pattern 43 a of the flexible circuit board 43.
ここで、 フレキシブル回路基板 4 3は、 第 2引出配線 1 3の外部端子 に接続されるフレキシブル回路基板と同一若しくは同一構造のものを使 用することによって、 液晶表示装置として完成した状態と同一の状態で、 検査を行うことが可能になる。 Here, the flexible circuit board 43 has the same or the same structure as the flexible circuit board connected to the external terminal of the second lead-out wiring 13 so that the same state as a completed liquid crystal display device is obtained. In this state, inspection can be performed.
本実施形態では、 I Cチップ Aを第 1端子 1 2 aと第 2端子 1 3 aに 接触させて、 接触端子 4 5を外部端子 1 3 bに接触させることにより、 液晶表示パネルの点灯検査等を行うことができる。 この場合、 I Cチッ プ Aを保持板 4 0に対して真空吸着や把持機構等の方法によ り着脱可能 に保持しておき、 I Cチッブ Aを液晶表示パネルの外部端子部 1 5に接 触させて検査を行った後、 検査結果が良好であれば、 そのまま I Cチッ ブ Aを外部端子部 1 5上に実装してしまうことも可能である。 In the present embodiment, the IC chip A is brought into contact with the first terminal 12a and the second terminal 13a, and the contact terminal 45 is brought into contact with the external terminal 13b, so that the lighting inspection of the liquid crystal display panel or the like is performed. It can be performed. In this case, the IC chip A is detachably held on the holding plate 40 by a method such as vacuum suction or a gripping mechanism, and the IC chip A contacts the external terminal 15 of the liquid crystal display panel. After performing the inspection, if the inspection result is good, it is possible to mount the IC chip A on the external terminal portion 15 as it is.
I Cチップ Aの実装は、 第 7図に示すように、 相互距離を可変に構成 した把持腕部 6 1, 6 2を先端部に備え、 これらの把持腕部 6 1, 6 2 で I Cチッブ Aを挟持するように構成された、 上記実施形態における保
持板 4 0を兼用する検査アーム 6 0によって実施される。 この検査ァー ム 6 0には、 上記保持板 4 0 と同様に、 フレキシブル回路基板 4 3の配 線パターン 4 3 aに接続された接触端子 4 5 と同一のプローブ構造が設 けられている。 このように、 上記把持腕部 6 1 , 6 2によ り I Cチヅプ Aを挟持するとともにプローブ構造を設けることによって、 上記実施形 態の保持板 4 0とほぼ同様の構造を実現している。 As shown in Fig. 7, the mounting of IC chip A is provided with gripping arms 61, 62 with variable mutual distances at the tip end, and these gripping arms 61, 62 are used to mount IC chip A. In the above embodiment, which is configured to hold The inspection is performed by the inspection arm 60 which also serves as the holding plate 40. The inspection arm 60 has the same probe structure as the contact terminals 45 connected to the wiring pattern 43 a of the flexible circuit board 43, similarly to the holding plate 40 described above. . As described above, by holding the IC chip A between the gripping arms 61 and 62 and providing the probe structure, a structure substantially similar to the holding plate 40 of the embodiment is realized.
この検査アーム 6 0を液晶表示パネルの外部端子部 1 5上に降下させ て、 上述と同様に液晶表示パネルの検査を行うことができる。 このとき、 液晶表示パネルに不良が発見されなかった場合には、 その後、 当該検査 アーム 6 0をそのまま I Cチップ Aの実装へッ ドとして使用する。 実装 方法としてヒートシール法を用いる場合には、 第 8図に示すように、 実 装前に外部端子部 1 5上に異方性導電接着シー ト 7 0を敷き、 把持腕部 6 1 と 6 2によって I Cチップ Aを挟持した状態で、 検査時と同様に外 部端子部 1 5上に降下させ、 I Cチップ Aの入力端子及び出力端子と外 部端子部 1 5上に形成された端子部とが異方性導電接着シー卜 7 0を介 して正規に接触するように位置決めする。 なお、 異方性導電接着シー ト 7 0は、 例えば光硬化性又は熱硬化性の樹脂接着剤中に導電性粒子を分 散させたものである。 By lowering the inspection arm 60 onto the external terminal 15 of the liquid crystal display panel, the liquid crystal display panel can be inspected in the same manner as described above. At this time, if no defect is found in the liquid crystal display panel, then the inspection arm 60 is used as it is as a mounting head of the IC chip A. When using the heat sealing method as the mounting method, as shown in Fig. 8, before mounting, anisotropic conductive adhesive sheet 70 is laid on external terminals 15 and gripping arms 61 and 6 are attached. With IC chip A sandwiched by 2 and lowered onto external terminals 15 as in the case of inspection, the input and output terminals of IC chip A and the terminals formed on external terminals 15 Are positioned so as to make regular contact via the anisotropic conductive adhesive sheet 70. The anisotropic conductive adhesive sheet 70 is obtained by dispersing conductive particles in, for example, a photocurable or thermosetting resin adhesive.
次に、 把持腕部 6 1 , 6 2に挟持されている I Cチップ Aの上から第 8図に示す加圧ツール 7 1 によって加熱 ( 2 0 0 °C程度) しながら加圧 し、 異方性導電接着シート 7 0を融解させつつ、 上下方向の導通を発生 させ、 I Cチップ Aの端子と外部端子部 1 5上の端子とが導通した状態 で接着固定する。 Next, pressure is applied from above the IC chip A sandwiched between the gripping arms 6 1, 62 while heating (about 200 ° C.) with the pressing tool 71 shown in FIG. While the conductive adhesive sheet 70 is melted, conduction in the vertical direction is generated, and the terminal of the IC chip A and the terminal on the external terminal portion 15 are adhered and fixed in a state of conduction.
この方法によれば、 検査アーム 6 0によって液晶表示パネルの検査と I Cチップ Aの実装とを連続して行うことができるとともに、 I Cチッ プ Aの実装後にそのまま検査アームによって I Cチップ Aの実装不良の 確認を行うことも可能である。 産業上の利用可能性
以上述べた本発明は、 液晶表示パネルの検査装置において、 I Cチッ プの実装前にほぼ完全なパネル検査を行うことができるとともに、 外部 端子部上の配線パターンの検査をも同時に行うことができるものである
According to this method, the inspection of the liquid crystal display panel and the mounting of the IC chip A can be continuously performed by the inspection arm 60, and the mounting of the IC chip A is directly performed by the inspection arm after the mounting of the IC chip A. It is also possible to confirm. Industrial applicability According to the present invention described above, in a liquid crystal display panel inspection apparatus, almost complete panel inspection can be performed before mounting an IC chip, and inspection of a wiring pattern on an external terminal portion can be simultaneously performed. Is the thing
Claims
1 . 複数の配線を収容した保持体と、 該保持体の先端部に取り付け られ、 露出した複数の接続端子を備えた集積回路と、 該集積回路の前記 接続端子に並列配置された複数の検査プローブとを有し、 該検査ブロー ブに前記配線が導電接続されていることを特徴とする液晶表示パネルの 検査装置。 1. A holding body accommodating a plurality of wirings, an integrated circuit attached to an end of the holding body and having a plurality of exposed connection terminals, and a plurality of inspections arranged in parallel with the connection terminals of the integrated circuit An inspection apparatus for a liquid crystal display panel, comprising: a probe; and the wiring is conductively connected to the inspection probe.
2 . 請求の範囲第 1項において、 前記検査プローブは、 露出した接 触端子部と、 該接触端子部と前記配線との間を接続する可撓性ワイャと、 該可撓性ワイヤを包摂する弾性樹脂とを有することを特徴とする液晶表 示パネルの検査装置。 2. The inspection probe according to claim 1, wherein the inspection probe includes an exposed contact terminal portion, a flexible wire connecting between the contact terminal portion and the wiring, and the flexible wire. An inspection device for a liquid crystal display panel, comprising an elastic resin.
3 . 請求の範囲第 1項において、 前記集積回路は、 前記保持体に対 して弾性的に取り付けられていることを特徴とする液晶表示パネルの検 査装置。 3. The inspection device for a liquid crystal display panel according to claim 1, wherein the integrated circuit is elastically attached to the holder.
4 . 請求の範囲第 1項において、 前記保持体は、 前記液晶表示パネ ルに接続されるべき配線基板を装着し、 前記配線は、 該配線基板に形成 された配線層であることを特徴とする液晶表示パネルの検査装置。 4. The liquid crystal display according to claim 1, wherein the holder is provided with a wiring board to be connected to the liquid crystal display panel, and the wiring is a wiring layer formed on the wiring board. Liquid crystal display panel inspection equipment.
5 . 請求の範囲第 1項において、 前記保持体は、 前記集積回路を着 脱可能に保持する保持機構を備えていることを特徴とする液晶表示パネ ルの検査装置。 5. The liquid crystal display panel inspection apparatus according to claim 1, wherein the holding body includes a holding mechanism for holding the integrated circuit in a detachable manner.
6 . 液晶パネルの基板に設けられた外部端子部の配線パターンに集 積回路の接続端子を所定の押圧力で接触させ、 6. The connection terminal of the integrated circuit is brought into contact with the wiring pattern of the external terminal part provided on the substrate of the liquid crystal panel with a predetermined pressing force,
次に、 前記外部端子部に対応して設けられた複数の検査プローブを前 記外部端子部に接触させ、 Next, a plurality of inspection probes provided corresponding to the external terminal portion are brought into contact with the external terminal portion,
該検査プローブを通じて前記集積回路に液晶パネル検査用信号を供給 することによって液晶パネルの電気的検査を行うことを特徵とする液晶 パネルの検査方法。 A method for inspecting a liquid crystal panel, wherein an electrical inspection of a liquid crystal panel is performed by supplying a signal for inspecting a liquid crystal panel to the integrated circuit through the inspection probe.
7 . 液晶パネルの基板に設けられた外部端子部の配線パターンに、 集積回路把持手段に把持された集積回路の接続端子を所定の押圧力で接 触させ、
次に、 前記外部端子部に対応して設けられた複数の検査プローブを前 記外部端子部に接触させ、 7. The connection terminal of the integrated circuit held by the integrated circuit holding means is brought into contact with the wiring pattern of the external terminal portion provided on the substrate of the liquid crystal panel with a predetermined pressing force, Next, a plurality of inspection probes provided corresponding to the external terminal portion are brought into contact with the external terminal portion,
該検査プローブを通じて前記集積回路に液晶パネル検査用信号を供給 することによって液晶パネルの電気的検査を行い、 An electrical inspection of the liquid crystal panel is performed by supplying a liquid crystal panel inspection signal to the integrated circuit through the inspection probe,
次いで、 前記集積回路と前記基板とを、 導電性粒子を分散させた樹脂 接着剤を介して接着し、 前記集積回路と前記接続端子とを導電接続する ことを特徴とする液晶パネルの製造方法。
Next, the integrated circuit and the substrate are bonded via a resin adhesive in which conductive particles are dispersed, and the integrated circuit and the connection terminal are conductively connected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-1998-0703235A KR100518161B1 (en) | 1996-09-02 | 1997-09-02 | Inspection apparatus of liquid crystal display panel, inspection method of liquid crystal display panel and manufacturing method of liquid crystal panel |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8/232335 | 1996-09-02 | ||
JP23233596A JP3624570B2 (en) | 1996-09-02 | 1996-09-02 | Liquid crystal display panel inspection apparatus, liquid crystal display panel inspection method, and integrated circuit mounting method |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1998010298A1 true WO1998010298A1 (en) | 1998-03-12 |
Family
ID=16937594
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1997/003049 WO1998010298A1 (en) | 1996-09-02 | 1997-09-02 | Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP3624570B2 (en) |
KR (1) | KR100518161B1 (en) |
CN (1) | CN1175271C (en) |
TW (1) | TW359748B (en) |
WO (1) | WO1998010298A1 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100911467B1 (en) * | 2002-12-31 | 2009-08-11 | 삼성전자주식회사 | Apparatus for inspecting liquid crystal display |
JP4219729B2 (en) * | 2003-04-25 | 2009-02-04 | 日本発條株式会社 | LCD panel inspection equipment |
JP4579074B2 (en) * | 2005-07-15 | 2010-11-10 | 三菱電機株式会社 | Flexible circuit board and display device using the same |
JP2008032958A (en) * | 2006-07-28 | 2008-02-14 | Optrex Corp | Lighting inspection device and lighting inspection method for display panel |
KR100843126B1 (en) * | 2006-08-29 | 2008-07-02 | 주식회사 에스에프에이 | Device for inspecting panel of flat display and method thereof, and system for bonding PCB of flat display and method thereof |
KR20060122804A (en) * | 2006-11-11 | 2006-11-30 | 윤재완 | Probe block for display panel test |
JP5347258B2 (en) * | 2007-09-28 | 2013-11-20 | カシオ計算機株式会社 | Functional inspection equipment for electronic devices |
KR101219285B1 (en) * | 2011-01-06 | 2013-01-11 | (주)에이앤아이 | Inspection method and apparatus of substrate |
KR101290669B1 (en) * | 2013-02-04 | 2013-07-29 | (주)메리테크 | Bump-type probe, glass block panels for testing |
CN105867003A (en) * | 2016-06-15 | 2016-08-17 | 苏州众显电子科技有限公司 | Novel STN liquid crystal display screen |
CN106205030B (en) * | 2016-07-25 | 2019-01-29 | 京东方科技集团股份有限公司 | A kind of circuit for alarming, integrated circuit board and warning system |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01170857A (en) * | 1987-12-25 | 1989-07-05 | Tokyo Electron Ltd | Contactor device for probe |
JPH02253168A (en) * | 1989-03-28 | 1990-10-11 | Seiko Epson Corp | Probe for checking lighting of liquid crystal display panel |
JPH0390081U (en) * | 1989-12-27 | 1991-09-13 | ||
JPH0495929A (en) * | 1990-08-08 | 1992-03-27 | Fujitsu Ltd | Device and method for test using active probe |
JPH05218150A (en) * | 1991-11-18 | 1993-08-27 | Tokyo Electron Yamanashi Kk | Probe card |
JPH06120647A (en) * | 1992-10-06 | 1994-04-28 | Fujitsu Ltd | Method and apparatus for mounting semiconductor element |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0489579A (en) * | 1990-07-31 | 1992-03-23 | Morimichi Fujiyoshi | Inspecting device for printed board and the like |
-
1996
- 1996-09-02 JP JP23233596A patent/JP3624570B2/en not_active Expired - Fee Related
-
1997
- 1997-09-02 KR KR10-1998-0703235A patent/KR100518161B1/en not_active IP Right Cessation
- 1997-09-02 WO PCT/JP1997/003049 patent/WO1998010298A1/en active IP Right Grant
- 1997-09-02 CN CNB971911258A patent/CN1175271C/en not_active Expired - Fee Related
- 1997-09-02 TW TW086112603A patent/TW359748B/en not_active IP Right Cessation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01170857A (en) * | 1987-12-25 | 1989-07-05 | Tokyo Electron Ltd | Contactor device for probe |
JPH02253168A (en) * | 1989-03-28 | 1990-10-11 | Seiko Epson Corp | Probe for checking lighting of liquid crystal display panel |
JPH0390081U (en) * | 1989-12-27 | 1991-09-13 | ||
JPH0495929A (en) * | 1990-08-08 | 1992-03-27 | Fujitsu Ltd | Device and method for test using active probe |
JPH05218150A (en) * | 1991-11-18 | 1993-08-27 | Tokyo Electron Yamanashi Kk | Probe card |
JPH06120647A (en) * | 1992-10-06 | 1994-04-28 | Fujitsu Ltd | Method and apparatus for mounting semiconductor element |
Also Published As
Publication number | Publication date |
---|---|
JPH1078456A (en) | 1998-03-24 |
TW359748B (en) | 1999-06-01 |
KR20000064315A (en) | 2000-11-06 |
KR100518161B1 (en) | 2005-12-01 |
CN1199466A (en) | 1998-11-18 |
JP3624570B2 (en) | 2005-03-02 |
CN1175271C (en) | 2004-11-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4036863B2 (en) | Method for measuring contact resistance of an electronic device joined to a liquid crystal display panel and liquid crystal display for this measurement method | |
US5261156A (en) | Method of electrically connecting an integrated circuit to an electric device | |
US20070052344A1 (en) | Flat panel display device and method of correcting bonding misalignment of driver IC and flat panel display | |
WO1998010298A1 (en) | Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel | |
KR19980032057A (en) | Probe card and test device using it | |
JP2001203244A (en) | Inspection method and device of semiconductor integrated circuit, and aligning device | |
US9299280B2 (en) | Substrate of electronic device, electronic device including the same, and measuring method of resistance at connection portion | |
WO2001036987A1 (en) | Probe device, method of manufacture thereof, method of testing substrate using probe device | |
JPH0782032B2 (en) | Display panel probe and its assembly method | |
WO2006132243A1 (en) | Inspection device | |
JPS59155769A (en) | Inspecting apparatus for electronic device | |
JPH08304846A (en) | Inspection device for liquid crystal display element | |
KR100806910B1 (en) | liquid crystal device and method for measuring bonding state in manufacturing the liquid crystal device | |
KR100480860B1 (en) | LCD Display | |
JP2004294144A (en) | Module for testing, and testing method of semiconductor device | |
JP5347258B2 (en) | Functional inspection equipment for electronic devices | |
JPH02293671A (en) | Prober for substrate | |
JP2006086328A (en) | Method of conduction bonding between electric circuits and device therefor | |
KR100199854B1 (en) | Leadframes for chip scale package and chip scale package using them | |
JP2006147766A (en) | Method for connecting cof | |
US20010052422A1 (en) | Structure for supporting connecting member | |
JPH08179010A (en) | Electric inspection device for electronic part | |
JPH06120647A (en) | Method and apparatus for mounting semiconductor element | |
JPH0855874A (en) | Bonding method for semiconductor chip | |
JPH08313557A (en) | Probe device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 97191125.8 Country of ref document: CN |
|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): CN KR SG |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1019980703235 Country of ref document: KR |
|
WWP | Wipo information: published in national office |
Ref document number: 1019980703235 Country of ref document: KR |
|
WWG | Wipo information: grant in national office |
Ref document number: 1019980703235 Country of ref document: KR |