US8842211B2 - Imaging element and imaging apparatus that extract light of a specific wavelength - Google Patents

Imaging element and imaging apparatus that extract light of a specific wavelength Download PDF

Info

Publication number
US8842211B2
US8842211B2 US13/146,270 US201013146270A US8842211B2 US 8842211 B2 US8842211 B2 US 8842211B2 US 201013146270 A US201013146270 A US 201013146270A US 8842211 B2 US8842211 B2 US 8842211B2
Authority
US
United States
Prior art keywords
image
light
pixels
imaging element
predetermined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active, expires
Application number
US13/146,270
Other languages
English (en)
Other versions
US20110285898A1 (en
Inventor
Ryosuke Kasahara
Hideaki Hirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Assigned to RICOH COMPANY, LTD. reassignment RICOH COMPANY, LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HIRAI, HIDEAKI, KASAHARA, RYOSUKE
Publication of US20110285898A1 publication Critical patent/US20110285898A1/en
Application granted granted Critical
Publication of US8842211B2 publication Critical patent/US8842211B2/en
Active legal-status Critical Current
Adjusted expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1876Diffractive Fresnel lenses; Zone plates; Kinoforms
    • G02B5/188Plurality of such optical elements formed in or on a supporting substrate
    • G02B5/1885Arranged as a periodic array
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/12Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths with one sensor only
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80Camera processing pipelines; Components thereof
    • H04N23/84Camera processing pipelines; Components thereof for processing colour signals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/1462Coatings
    • H01L27/14621Colour filter arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14625Optical elements or arrangements associated with the device
    • H01L27/14629Reflectors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70Circuitry for compensating brightness variation in the scene
    • H04N23/75Circuitry for compensating brightness variation in the scene by influencing optical camera components
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/134Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements

Definitions

  • the present invention relates to an imaging element which is used in an imaging apparatus such as a digital camera, or the like and an imaging apparatus having the same.
  • an high sensitive imaging apparatus capable of obtaining a color image.
  • multifunctional imaging apparatus capable of, for example, imaging a polarized image for detecting a wet state of a road surface with a high sensitivity has been required.
  • a light amount received by each pixel is reduced to one-third of a light amount in a case where the filter is not used.
  • a polarizer since only a light amount of either P-polarized light or S-polarized light, that is, 1 ⁇ 2 of total light amount is received by each pixel, the light amount received by each pixel is reduced to 1 ⁇ 2 of light amount in a case where the filter is not used is received by each pixel. Therefore, there is a problem in that sensitivity is degraded in principle. Furthermore, resolution of brightness information is degraded compared to the case where the filter is not used, so that low resolution of an obtained image is visible to the human eyes.
  • the present invention is to provide an imaging element capable of achieving a normal color reproduction as well as high resolution and sensitivity can be achieved and ratio of pixels without filter can be increased, and an imaging apparatus using the imaging element.
  • an imaging element includes a light receiving surface having pixels, a low-pass filter device configured to focus predetermined light on a predetermined pixel of the pixels of the light-receiving surface.
  • FIG. 1 is a schematic configuration diagram of an imaging optical system having an imaging element according to an embodiment of the present invention.
  • FIG. 2A is a perspective view illustrating a low-pass filter viewed from a side of a lens.
  • FIG. 2B is a perspective view illustrating the low-pass filter viewed from a side of an imaging element body.
  • FIG. 2C is a sectional view illustrating the low-pass filter.
  • FIG. 3A is an explanatory view illustrating a case where light having wavelengths of 450 nm and 550 nm enters the low-pass filter on a diffracting surface of the low-pass filter at a side of a lens.
  • FIG. 3B is an explanatory view illustrating a case where light having wavelength of 650 nm enters the low-pass filter on the diffracting surface of the low-pass filter at the side of the lens.
  • FIG. 4 is a view illustrating a relationship between a 0-order light transmissivity or a first order light diffraction efficiency and a groove depth of concave-convex shapes on the diffracting surface of the low-pass filter at the side of the lens.
  • FIG. 5A is an explanatory view illustrating a case where the light having the wavelengths of 450 nm and 550 nm enters the low-pass filter on a diffracting surface of the low-pass filter at a side of an imaging element body.
  • FIG. 5B is an explanatory view illustrating a case where the light having the wavelength of 650 nm enters the low-pass filter on the diffracting surface of the low-pass filter at the side of the imaging element body.
  • FIG. 6 is a view illustrating a relationship between a 0-order light transmissivity or a first order light diffraction efficiency and a groove depth of concave-convex shapes on the diffracting surface of the low-pass filter at the side of the imaging element body.
  • FIG. 7 is an explanatory view explaining a structure of a filter array having a period of 6 ⁇ 6.
  • FIG. 8 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 9 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 10 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 11 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 12 is an explanatory view explaining a structure of a filter array having a period of 16 ⁇ 16 in a second embodiment.
  • FIG. 13 is a view illustrating paths of light beams when transmitting a birefringent medium.
  • FIG. 14A is a view illustrating a diffracting grating which a light beam enters.
  • FIG. 14B is a sectional view along B-B line of FIG. 14A .
  • FIG. 14C is a view illustrating a transmitting state according to a polarization direction of a light beam.
  • FIG. 14D is a view illustrating a transmitting state according to a polarization direction of a light beam.
  • FIG. 15 is a sectional view illustrating a low-pass filter of the second embodiment.
  • FIG. 16 is a perspective view of the low-pass filter.
  • FIG. 17A is an explanatory view explaining a state where an extraordinary light beam enters the low-pass filter.
  • FIG. 17B is an explanatory view explaining a state where an ordinary light beam enters the low-pass filter.
  • FIG. 18 is a view illustrating a relationship between a 0-order light transmissivity or a first order light diffraction efficiency of the ordinary light beam and a groove depth of concave-convex shapes on the diffracting surface of the low-pass filter at the side of the imaging element body.
  • FIG. 19 is a sectional view illustrating a low-pass filter where diffracting structures are oppositely disposed.
  • FIG. 20 is a perspective view illustrating a low-pass filter having a periodic structure with a period smaller than a wavelength.
  • FIG. 21 is an explanatory view explaining a structure of a filter array having a period of 6 ⁇ 6 in a second embodiment.
  • FIG. 22 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 23 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 24 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 25 is a view illustrating a flow to process an image imaged by an imaging element.
  • FIG. 26A is a view illustrating an example of an image imaged by a vehicle camera.
  • FIG. 26B is an explanatory view explaining a method for processing an imaged result.
  • FIG. 27A includes an exemplary image imaged by an imaging element in which a color filter having a spatial LPF function is applied.
  • FIG. 27B includes the exemplary image of FIG. 27A in which the color filter does not have the spatial LPF function.
  • FIG. 27C includes the exemplary image imaged by an imaging element using a Bayer arrangement color filter.
  • FIG. 28A includes an exemplary image of a Circular Zone Plate (CZP).
  • CZP Circular Zone Plate
  • FIG. 28B includes the exemplary image of the CZP in which a color filter with the spatial LPF function is applied.
  • FIG. 28C includes the exemplary image of the CZP imaged by an imaging element using a Bayer arrangement color filter.
  • FIG. 29A includes an exemplary image imaging by an imaging element using an LFP processing with a reduction process of 1/16 and an expansion process of 16 times is performed.
  • FIG. 29B includes an exemplary image imaging by an imaging element using an LFP processing with a reduction process of 1 ⁇ 8 and an expansion process of 8 times is performed.
  • An imaging element includes, as illustrated in FIG. 1 , a light receiving surface 15 b having pixels, a low-pass filter device 14 such as a low-pass filter, a filter array having a low-pass filter (LPF) function or the like configured to focus predetermined light on a predetermined pixel or predetermined pixels of the pixels of the light-receiving surface 15 b .
  • the imaging element according to an embodiment of the present invention may be used in an imaging apparatus.
  • the imaging apparatus may include a lens system 13 ( 11 ), the imaging element configured to image a subject to form a subject image via the lens system, and a control device (not shown) configured to process the subject image as image data.
  • FIG. 1 is a configuration diagram illustrating an imaging optical system including an imaging element according to an embodiment of the present invention.
  • a left side of FIG. 1 indicates a subject side and a right side of FIG. 1 indicates an imaging plane side.
  • Reference number 11 indicates a lens system 11 formed by one or more lenses
  • reference number 12 indicates an aperture stop to set an F number within about 1 to 3
  • reference number 13 indicates a lens system formed by one or more lenses
  • reference number 15 indicates an imaging element body.
  • the lens system 11 is disposed at the subject side from the aperture stop 12 and the lens system 13 is disposed at the imaging plane side from the aperture stop 12 .
  • the lens system 11 , the aperture stop 12 and the lens system 13 are disposed on an optical axis L.
  • the low-pass filter 14 and the imaging element body 15 are disposed in order from a side close to the lens system 13 .
  • the imaging element body 15 may be separately provided or integrally provided with the low-pass filter 14
  • the imaging element body 15 a known monochrome sensor such as a CCD, a CMOS, or the like may be used.
  • the imaging element body 15 is protected by a package 15 c depending on an intended use and a lens-side surface of the package 15 c is sealed by a cover glass 15 a .
  • a light-receiving part 15 b as the light-receiving surface is provided at a center portion of the package 15 c sealed by the cover glass 15 a .
  • the light-receiving part 15 b may have pixels each having a size of predetermined micrometers, for example, about 1 to 9 micrometers, and the light-receiving part may have hundreds of thousands pixels or about 10 million, as recently used.
  • a high thermally resistant package may be selected for using as a vehicle camera or an outdoor monitoring camera, and a small size package may be selected for using as a portable devices.
  • the low-pass filter 14 may be configured to extract a wavelength component of the predetermined light when focusing the predetermined light on the predetermined pixel or predetermined pixels of the light-receiving surface 15 b.
  • the low-pass filter 14 is formed by a flat glass plate or a resin substrate having surfaces opposite each other, each surface being provided with diffracting structures.
  • FIG. 2A is a perspective view illustrating an end portion of the low-pass filter, viewed from a side of the lens systems.
  • One end surface of the low-pass filter 14 which is disposed at the side close to the lens system 13 , is divided into a plurality of areas 21 a , 21 b , . . . .
  • a concentric circular diffracting area 22 a , 22 b , . . . is formed in each area 21 a , 21 b , . . . .
  • the diffracting area 22 a is formed by a plurality of concentric circular bands about an optical axis 23 a as a center
  • the diffracting area 22 b is formed by a plurality of concentric circular bands about an optical axis 23 b as a center.
  • a pitch (an interval) between the circular bands of a center part differs from that of a peripheral part to modulate the pitches between the circular bands. According to such a modulation, the diffracting areas 22 a , 22 b can have a lens function. Light-focusing capability becomes higher with decreasing the pitch or the interval between the circular bands.
  • FIG. 2B is a perspective view illustrating an end portion of the low-pass filter 14 , viewed from a side of the imaging element body 15 .
  • the other end surface of the low-pass filter 14 which is disposed at a side close to the imaging element body 15 , is divided into a plurality of areas 24 a , 24 b , . . .
  • the areas 24 a , 24 b , . . . are disposed substantially at opposite positions of the areas 21 a , 21 b , . . . , respectively.
  • a concentric circular diffracting area 25 a , 25 b , . . . is formed in each area 24 a , 24 b , . . . .
  • the diffracting area 25 a is provided with a plurality of concentric circular bands about an optical axis 26 a as a center and the diffracting area 26 a is provided with a plurality of concentric circular bands about an optical axis 26 b as a center.
  • FIG. 2C is a sectional view illustrating a section of the low-pass filter 14 , viewed in a direction shown by arrow A of FIG. 2A .
  • Sectional shapes of the diffracting structures are rectangular and the optical axes 23 a , 26 a of the diffracting areas are disposed so as to slightly deviate upwardly or downwardly from each other.
  • Effective diameters of the diffracting areas 22 a and 25 a differ from each other and modulated degrees of the pitches and groove depths of the diffracting areas 22 a and 25 a are also different from each other.
  • light beams transmitting the areas 21 a , 21 b , . . . and the areas 24 a , 24 b , . . . are focused on different two point on the light-receiving surface 15 b of the imaging element body 15 , depending on the wavelengths of the light beams.
  • the low-pass filter may be produced by forming a pattern in a die having a shape and performing an injection moulding or a so-called 2P method with a transparent material to copy a plurality of diffracting optical elements.
  • the diffracting areas 22 a , 22 b , . . . of the one end surface of the opposites surface of the low-pass filter 14 , which is disposed at the side close to the lens system 13 have a function as a spatial low-pass filter for a light beam having a wavelength of 650 nm.
  • the area 21 a will be explained as a representative example. As shown in FIG.
  • the diffracting area 22 a formed in the area 21 a is configured to emit a 0-order diffraction light when light having a wavelength of 450 nm or 550 nm enters the diffraction area 22 a of the low-pass filter, that is, the diffracting area 22 a is configured to transmit the light as a dead zone transmission and focus the transmitting light on a light-receiving area 31 a as a part of the light-receiving part 15 b of the imaging element body 15 .
  • the light-receiving area 31 a corresponds to an area having 16 pixels.
  • when light having a wavelength of 650 nm enter the low-pass filter as shown in FIG.
  • the light is emitted as a first diffraction light and focused on one pixel 32 a on the light-receiving part 15 b .
  • the one end surface of the low-pass filter 14 is configured to function as a mere transmitting element for the light having the wavelengths of 450 nm and 550 nm and function as a diffracting element for the light having the wavelength of 650 nm.
  • the above-described wavelength selectivity can be achieved by selecting a groove depth of the diffracting structures.
  • a periodic phase difference of concave-convex shapes in section of a diffracting grating to be 2n times (multiples of two) of a predetermined wavelength (for example, 450 nm, 550 nm) of a predetermined light which is desired to be selectively transmitted by the low-pass filter, a high 0-order light transmissivity can be achieved for the light having the wavelengths of 450 nm and 550 nm.
  • FIG. 4 is a view illustrating a relationship between the 0-order light transmissivity or the first order light diffraction efficiency of the diffracting grating having the sectional concave-convex shapes and the groove depth of the concave-convex shapes for the wavelengths of 450 nm, 550 nm, and 650 nm.
  • Material for the used diffracting grating is quartz having a refractive index of 1.45.
  • the 0-order light transmissivity for the wavelength of 450 nm and 550 nm is 90% or more and the first order light diffraction efficiency for the wavelength of 650 nm is about 6%.
  • the light having the average (the light transmissivity of 6% per pixel for 16 pixels, that is, the light transmissivity of 96%) of the wavelength of 650 nm, transmitting the area 21 a is focused on the pixel 32 a shown in FIG. 3B .
  • the light of 450 nm, 550 nm, and 650 nm are substantially uniformly received by the pixels of the light-receiving part 31 a other than the pixel 32 a.
  • the other end surface of the low-pass filter 14 which is disposed at a side close to the imaging element body has the diffracting areas 25 a , 25 b , . . .
  • Each diffracting area 25 a , 25 b , . . . functions as a spatial low-pass filter, mainly for the light having the wavelength 550 nm.
  • the area 24 a will be explained as a representative example.
  • the diffracting area 25 a formed in the area 24 a is, as shown in FIG.
  • the diffracting area 25 a transmits the light having the wavelengths of 450 nm and 650 nm as a dead zone transmission and focuses the transmitting light on the light-receiving area 31 a of a part of the light-receiving part 15 b of the imaging element body 15 .
  • the light-receiving area 31 a corresponds to an area of 16 pixels.
  • the light having the wavelength of 550 nm enters the low-pass filter 14 , as shown in FIG.
  • the first order diffraction light is focused on one pixel 32 b on the light-receiving part 15 b of the imaging element body.
  • the other end of the low-pass filter 14 is configured to function as a mere transmitting element for the light having the wavelengths of 450 nm and 650 nm and function as a diffracting element for the light having the wavelength of 550 nm.
  • the optical axis 26 a of the diffracting area 25 a is positioned so as to obliquely deviate by one pixel in a focused position from the optical axis 23 a of the diffracting area 22 a
  • the above-described wavelength selectivity can be achieved by selecting a groove depth of the diffracting structures.
  • a periodic phase difference of concave-convex shapes in section of a diffracting grating to be 2n times (multiples of two) of a predetermined wavelength (for example, 450 nm, 650 nm) of a predetermined light, which is desired to be selectively transmitted by the low-pass filter, a high 0-order light transmissivity can be achieved for the light having the wavelengths of 450 nm and 650 nm.
  • FIG. 6 is a view illustrating a relationship between the 0-order light transmissivity or the first order light diffraction efficiency of the diffracting grating having the sectional concave-convex shapes and the groove depth of the concave-convex shapes for the wavelengths of 450 nm, 550 nm, and 650 nm.
  • Material for the used diffracting grating is quartz having a refractive index of 1.45.
  • the 0-order light transmissivity for the wavelength of 450 nm and 650 nm is 90% or more and the first order light diffraction efficiency for the wavelength of 550 nm is about 7%.
  • the light having the average (the light transmissivity of 7% per pixel for 16 pixels, that is, the light transmissivity of about 100%) of the wavelength of 550 nm, transmitting the area 25 a is focused on the pixel 32 b shown in FIG. 5B .
  • the light of 450 nm, 550 nm, and 650 nm are substantially uniformly received by the pixels of the light-receiving part 31 a other than the pixel 32 b.
  • the light having the wavelength of 650 nm is focused on the pixel 32 a on the light receiving area 31 a of the imaging element body 15 and the light having the wavelength of 550 nm is focused on the pixel 32 b .
  • the light beams having the wavelengths 450 nm, 550 nm, and 650 nm uniformly enter the pixels other than the pixels 32 a and 32 b . Under such a receiving state, an color image can be formed from a monochrome image by the reconstruction processes described below with reference to, for example, FIGS. 8 to 11 .
  • the three wavelengths of 450 nm, 550 nm, and 650 nm are used but the wavelengths are not limited thereto.
  • a combination of wavelengths of 470 nm, 520 nm, and 600 nm can be used.
  • the combination of wavelengths can have further a near-infrared wavelength band, for example, about 850 nm in addition to the three wavelengths.
  • Each area 21 a , 21 b , 24 a , 24 b and each diffracting area 22 a , 22 b , 25 a , 25 b may have a size variation (corresponding to a number of pixels) depending on a position thereof. That is, the sizes of the areas 21 a , 21 b , 24 a , and 24 b may be varied depending on the positions from a center of an optical axis of an imaging lens or the aperture stop to a peripheral area (an area out of the optical axis).
  • the sectional shape of the diffracting grating may have a stepped structure.
  • the diffraction order is not limited to the 0-order light and the first diffraction light and a second order light or a higher order light may be used.
  • the optical axes 23 a , 26 a , 23 b , and 26 b of the diffracting areas of the front and rear side surfaces of the low-pass filter may be coaxial. In this case, the focusing positions of the diffracting areas 22 a , 25 a and the diffracting areas 22 b , 25 b are set to deviate from each other in a phase difference function.
  • the diffracting structure may be formed on only one end surface.
  • the wavelength selectivity can be achieved by use of a difference in the diffraction order, that is, it can be achieved, for example, when the light having the wavelength of 650 nm is focused on a pixel as a +first order light and the light having the wavelength of 550 nm is focused as a ⁇ first order light on a pixel different from the pixel where the +first order light is focused.
  • the structure of the diffracting area is not limited to the concentric circular pattern and a liner pattern may be used.
  • the diffraction light is focused on the imaging element body not as a point but a line and therefore, the image reconstruction can be achieved according to the liner pattern.
  • the low-pass filter 14 is disposed separately from the imaging element body and between the lens system 13 and the imaging element body 15 , it is not limited thereto.
  • the low-pass filter may be used as a substitute for the cover glass 15 a of the imaging element body 15 .
  • the low-pass filter may be formed on a lens surface of the lens system 13 .
  • the low-pass filter may be formed integrally with the light-receiving part 15 b . In this case, positional misalignment of the imaging element body or the like can be reduced to achieve a stable property.
  • every array period of 6 ⁇ 6 has a pixel having a function of extracting a wavelength component of red light and a pixel having a function of extracting a wavelength component of blue light, which are disposed at a center of the array period.
  • the pixel having the function of extracting the wavelength component of red light is referred to as the red filter
  • the pixel having the function of extracting the wavelength component of blue light is referred to as the blue filter.
  • color filter arrays are continuously disposed at a 6 ⁇ 6 pixel period.
  • the pixels of the imaging element may be divided into a plurality of periods each having an anomalous pixel.
  • the filter array may have an LPF characteristic such that a light amount of a light beam focused on the anomalous pixel configured to extract a predetermined wavelength component is larger than an average light amount of light beams of the predetermined wavelength component focused on pixels adjacent to the anomalous pixel entering within one period of the pixels of the imaging element.
  • the pixels other than the pixels of the red and blue filters do not have a filter function but are configured to obtain brightness information and therefore are referred to as Y pixels hereinafter.
  • the important point is that the R (red) pixel of the red filter and the B (blue) pixel of the blue filter have a spatial LPF effect. Therefore, an average value of an intensity of red light entering the array of the 6 ⁇ 6 and an average value of an average value of an intensity of blue light entering of the 6 ⁇ 6 can be obtained by the red pixel and the blue pixel, respectively.
  • LPF low-pass filter
  • the pixels having filter functions is provided with the spatial LPF effect and composing process is performed under the consideration of the spatial LPF effect so that the above-described problems can be solved.
  • the process in this case is shown in FIG. 8 .
  • the above-described control device may be configured to perform a separation process to separate the subject image formed by the imaging element into a first image formed by the predetermined pixels and a second image formed by the other pixels.
  • the first image may be an image regarding color information and the second image may be an image regarding brightness information.
  • the control device may be configured to perform an image expansion process to generate a fourth image by expanding the first image and an image composition process to compose the second and fourth images to form a third image in addition to the separation process.
  • the control device may be configured to perform an image conversion process to convert color information of the second and third images into brightness information and to form a fifth image having brightness values of RGB in addition to the image expansion process and the image composition process.
  • the control device may be configured to perform an image expansion process to expand the first image to form a fourth image, an LPF process to apply an LPF processing to the first image to form a sixth image by removing high frequency component from the first image, and an image composition process to compose the fourth and sixth images to form a third image in addition to the separation process.
  • the control device may be configured to perform an image conversion process to convert color information of the second and third images into brightness information to form a fifth image having brightness values of RGB in addition to the image expansion process, the LPF process and the image composition process.
  • the LPF process may be a process to average brightness values of pixels within a small range in relation to a period in which the predetermined pixels are arranged.
  • the LPF process may include an image reduction process and an image expansion process.
  • the third image may be an image relating to color information.
  • a separation process is performed.
  • signals from the imaging element are separated into a second image formed by Y pixels and a first image formed by R pixels and B pixels.
  • failure parts in the second image formed by the Y pixels are interpolated by peripheral Y pixels before the following image composition process and the second image has a same size (a number of pixels) as the imaging element.
  • an image expansion process is performed to expand the first image formed by the R pixels and B pixels such that the first image has a same size as the second image and then the image composition process is performed to generate Cb, Cr (color-difference) signals to form a third image.
  • Y_in is input data of the second image
  • B_in and R_in are input signals of B pixels and R pixels of the fourth image
  • Cb_out and Cr_out are output brightness signals and color signals of the third image.
  • the Y (brightness) signals of the second image are combined and by use of signals of the imaging element, which are obtained from the above-described color filter array, a color image obtained from the YCbCr signals of the fifth image can be obtained.
  • the process shown in FIG. 9 may be performed so that high quality image with reduction of aliasing noise can be obtained.
  • an LPF process to apply an LPF processing to the second image to obtain a sixth image is added. Since in this embodiment, the filter array of 6 ⁇ 6 is used, a filter smoothing 6 ⁇ 6 pixels is preferably used for the LPF processing.
  • an image size of the reduced image is a same size as the size of the first image (that is, a pixel number of anomalous pixels of the imaging element) and an image size of the expanded image is a same size of the fourth image.
  • FIG. 11 is shown as a specific example of the processes shown in FIG. 10 .
  • FIG. 27A (referred to as “Photo 1”, hereinafter) shows an imaged image in the case where the color filter has the spatial LPF function and FIG. 27B (referred to as “Photo 2”, herein after) shows an imaged image in the case where the color filter does not have the spatial LPF function.
  • Photo 3 an imaged image in a case where an imaging element having the conventionally used Bayer arrangement color filter is used is shown in FIG. 27C (referred to as “Photo 3”, hereinafter).
  • Photo 3 especially, as can be seen from parts of characters, the resolution of Photo 3 is less than that of Photo 1.
  • Photo 1 has a higher sensitivity and better resolution.
  • the color filters of R and B are used but other combinations of color filters, for example, of G and B, of R, G, and B, of IR (infrared) and B, and the like may be used.
  • FIG. 28A referred to as “Photo 4”, hereinafter
  • FIG. 28B referred to as “Photo 5”, hereinafter
  • FIG. 28C referred to as “Photo 6”, hereinafter
  • Photo 4 is an input CZP image
  • Photo 5 is an image imaged by using the imaging element according to this embodiment, that is, the imaging element having the color filter with the spatial LPF function
  • Photo 6 is an image imaged by using the imaging element having the Bayer arrangement color filter. In Photo 5, generation of fake color is suppressed and high resolution can be achieved in comparison with Photo 6.
  • the filter array of 6 ⁇ 6 is used to gather 1/36 of an R component of the pixel into the R pixel in the optical LPF, simply, white light has the R component of 1 ⁇ 3 of total light amount. That is, the brightness of the R pixel is 1 ⁇ 3 of the brightness of the Y pixel for a white subject. Accordingly, there is a problem in that S/N of the R pixels are degraded.
  • the filter array is preferably configured such that each R component is set to have 3/36, that is, 1/12 to be gathered into the R pixels.
  • the configuration for the B pixels is preferably the same.
  • a period of the filter array of more than 6 ⁇ 6 in a case where more sensitivity is needed. For example, in a case where the filter array having the period of 16 ⁇ 16 is used, since resolution of the color information is degraded, color bleed is easily generated in an output image.
  • FIG. 29A A result of the LPF processing where the reduction process of 1/16 and the expansion process of 16 times are performed is shown in FIG. 29A (referred to as “Photo 7”, hereinafter).
  • FIG. 29B A result of the LPF processing where the reduction process of 1 ⁇ 8 and the expansion process of 8 times are performed is shown in FIG. 29B (referred to as “Photo 8”, hereinafter).
  • the low-pass filter may have a polarization-dependent characteristic changing depending on a polarization direction of the predetermined light.
  • wavelength-selective low-pass filter is used in the first embodiment
  • a polarization-selective low-pass filter is used in this embodiment.
  • FIG. 13 is a view illustrating paths of the light beams in a case where the light beams enter and transmit the general birefringent medium.
  • a direction of the light beams is changed depending on polarizations of the light beams. That is, as shown in FIG. 13 , the light beam polarized in a direction parallel to a plane of FIG.
  • the light beam is referred to as an ordinary light beam or a normal light beam.
  • the light beam polarized in a direction perpendicular to the plane of FIG. 13 in relation to the birefringent medium passes through the birefringent medium with changing the direction.
  • the light beam is referred to as an extraordinary light beam or an anomalous light.
  • FIG. 14A is a view illustrating a surface of the diffracting grating, at a side where the light beam enters and
  • FIG. 14B is a sectional view along B-B line of FIG. 14A .
  • the diffracting grating shown in FIG. 14B includes an isotropic medium 81 , a birefringent medium 82 , and glasses 83 disposed so as to sandwich the isotropic medium 81 and the birefringent medium therebetween.
  • the birefringent medium 82 has a plurality of concentric circular bands (see FIG. 14A ), and each circular band has a rectangular shape in section. In the sectional view along B-B line of FIG. 14A , the birefringent medium has concave-convex shapes.
  • the isotropic medium 81 has complementary shapes in relation to the shapes of the birefringent medium and is in a contact state with surfaces of the concave-convex shapes of the birefringent medium 82 .
  • FIGS. 14C and 14D are views each illustrating a transmitting state of the light beams according to polarization directions of polarized light beams.
  • the birefringent medium 82 has refractive indices of “no” and “ne” depending on the polarization directions of the light beams entering the birefringent medium.
  • no is a refractive index (ordinary refractive index) for the ordinary light beam
  • ne is a refractive index (extraordinary refractive index) for the extraordinary light beam.
  • the polarization-selective diffracting grating is produced by selecting the isotropic medium 81 and the birefringent medium 82 so as to set a refractive index n1 of the isotropic medium to be equal to ne will be explained.
  • the refractive index of the isotropic medium 81 is the same as that of the birefringent medium so that the light beam can transmits without any influence.
  • the refractive indices of the isotropic medium 81 and the birefringent medium are different from each other. Accordingly, the diffraction occurs due to the shapes of boundary surfaces of the isotropic medium and the birefringent medium 82 of the diffracting grating and the direction of the light beam is changed. As shown in FIGS. 14C and 14D , the dead zone transmission or the light focusing is selected depending on the polarization of the entering light beam.
  • the low-pass filter 14 has the above-described configuration and function of the polarization-selective diffracting grating. That is, the low-pass filter 14 has a sectional structure shown in FIG. 15 , in which diffracting structures 92 are formed on a glass plate or a resin substrate 91 by use of the birefringent medium. An isotropic medium 93 are complementarily added and the diffracting grating is sealed with a glass plate or a resin substrate 94 . The light beam enters the sealing glass plate 94 .
  • FIG. 16 is a perspective view illustrating an end portion of the low-pass filter 14 , viewed from a side of the lens systems.
  • the low-pass filter 14 is divided into a plurality of areas 101 a , 101 b , . . . each having a same area.
  • a concentric circular diffracting area 102 a , 102 b , . . . is formed.
  • the diffracting area 102 a is formed by a plurality of concentric circular bands about an optical axis 103 a as a center
  • the diffracting area 102 b is formed by a plurality of concentric circular bands about an optical axis 103 b as a center.
  • a pitch (an interval) between the circular bands varies from a center part to a peripheral part to modulate the pitches between the circular bands. According to such a modulation, the diffracting areas can have a lens function. Light-focusing capability becomes higher with decreasing the pitch or the interval between the circular bands.
  • the low-pass filter 14 As a method for producing the low-pass filter 14 , a method applying a photolithographic technology or a method using precision cutting process with, for example, a diamond bite, may be used.
  • the low-pass filter may be produced by forming a pattern in a die and performing an injection moulding or a so-called 2P method with a transparent material to copy a plurality of diffracting optical elements.
  • the diffracting areas 102 a , 102 b , . . . of the low-pass filter 14 have mainly a function as a spatial low-pass filter for a light beam having a polarization direction of an ordinary light.
  • the area 101 a will be explained as a representative example. As shown in FIG.
  • the diffracting area 102 a formed in the area 101 a is configured to emit substantially a 0-order diffraction light when light having a polarization direction of the extraordinary light beam enters the diffraction area 102 a of the low-pass filter, that is, the diffracting area 102 a is configured to transmit the light as a dead zone transmission and focus the transmitting light on a light-receiving area 111 a as a part of the light-receiving part 15 b of the imaging element body 15 (see FIG. 1 ).
  • the light-receiving area 111 a corresponds to an area having 16 pixels.
  • the ordinary light beam enters the low-pass filter as shown in FIG.
  • the light beam is emitted as a first diffraction light and focused on one pixel 112 a on the light-receiving part 15 b .
  • the low-pass filter 14 is configured to function as a mere transmitting element for the extraordinary light beam and function as a diffracting element for the ordinary light beam.
  • the above-described polarization-selectivity can be achieved by selecting a groove depth of the diffracting structures, the refractive index no of the ordinary light beam, the refractive index ne for the ordinary light beam, and the refractive index n1 for the isotropic medium.
  • FIG. 18 is a view illustrating a relationship between the 0-order light transmissivity or the first order light diffraction efficiency for the ordinary light beam of the diffracting grating having sectional concave-convex shapes and the groove depth of the concave-convex shapes.
  • the 0-order light transmissivity is 90% or more and the first order light diffraction efficiency is about 7%.
  • the ordinary light beam is focused only on the pixel 112 a of FIG. 17B and the light having the average of the ordinary light passing through the area 111 a .
  • the ordinary light beam and the extraordinary light beam are substantially uniformly received by the pixels of the light-receiving part 121 a other than the pixel 112 a.
  • the light passing through the area 101 a of the low-pass filter 14 is focused on the pixel 112 a of the light-receiving area 11 a of the imaging element body 15 as the ordinary light beam.
  • the light of the extraordinary light beam is uniformly focused.
  • the polarized image can be formed by using a monochrome imaging in the above-described reconstruction process with reference to FIGS. 8 to 11 .
  • the diffraction structure may be formed at two sides. That is, as shown in FIG. 19 , in addition to the plate 91 where the diffraction structure 92 of the birefringent medium is formed, the low-pass filter may have a plate 91 ′ where a diffraction structure 92 ′ is formed at an opposite side of the plate 91 and an isotropic medium 93 is added therebetween. Furthermore, as described in the first embodiment, it is possible to set each diffracting surfaces such that a focusing position of each diffracting surface deviate from each other and the ordinary light beam and the extraordinary light beams are separately focused.
  • Each area may have a size variation (corresponding to a number of pixels) depending on a position thereof. That is, the sizes of the areas 101 a may be varied depending on the positions from a center of an optical axis of an imaging lens or the aperture stop to a peripheral area (an area out of the optical axis).
  • the sectional shape of the diffracting grating may have a stepped structure.
  • the diffraction order is not limited to the 0-order light and the first diffraction light and a second order light or a higher order light may be used.
  • the structure of the diffracting area is not limited to the concentric circular pattern and a liner pattern may be used.
  • the diffraction light is focused on the imaging element body not as a point but a line and therefore, the image reconstruction can be achieved according to the liner pattern.
  • the low-pass filter 14 is disposed separately from the imaging element body 15 between the lens system 13 and the imaging element body 15 in this embodiment, it is not limited thereto.
  • the low-pass filter may be used as a substitute for the cover glass 15 a of the imaging element body 15 .
  • the polarization-selective diffracting grating is not limited to the combinations of the above-described isotropic material and birefringent material, and a diffracting grating using a sub-wavelength structure may be used. That is, as shown in FIG. 20 , the polarization selectivity can be achieved by superimposing the diffracting structure 92 having a pitch larger than the wavelength of the structure formed on the plate 91 with a periodic structure having a period ( ⁇ ) shorter than the wavelength.
  • simple structure of the polarization selective diffracting grating can be achieved so that low cost and thin low-pass filter can be achieved.
  • the first image may be an image regarding polarization information and the second image is an image regarding brightness information.
  • every array period of 6 ⁇ 6 has a pixel having a filter configured to transmit a P-polarized light and a pixel having a filter configured to transmit a S-polarized light at a center of the array period.
  • Other pixels referred to as Y pixels
  • Y pixels have no filter function. It is important that the S-polarized filter and the P-polarized filter have also a spatial LPF effect and therefore, an average value of an intensity of the S-polarized light entering the array of the 6 ⁇ 6 and an average value of an intensity of the P-polarized light entering of the 6 ⁇ 6 pixels can be obtained.
  • a separation process of anomalous pixels is performed.
  • signals from the imaging element are separated into a second image formed by Y pixels and a first image formed by S-polarized pixels and P-polarized pixels.
  • failure parts in the second image formed by the Y pixels are interpolated by peripheral Y pixels before the following image composition process and the second image has a same size (a number of pixels) as that of the imaging element (for example, 640 ⁇ 480, as shown in the above example).
  • an image expansion process is performed to expand the first image formed by the S-polarized pixels and P-polarized pixels such that the first image has a same size as the second image and then the image composition process is performed to form a third image and therefore brightness information and corresponding polarization information constituting the third image can be obtained.
  • the polarization information is not required to have same resolution as the brightness information, but the brightness information is required to have high resolution because the brightness information is used for displaying an image or performing a road surface detection processing.
  • the method in this embodiment is preferable because the high resolution brightness information and the polarization information having low resolution but no occurrence of aliasing noise can be obtained by one imaging apparatus.
  • the image composition process may include simply packing the brightness information and the polarization information having a same number of pixels each other and then passing the information to the following devices.
  • the image composition process also may include assigning or providing the polarization information to the color difference information to display the color polarization information.
  • FIG. 23 shows an example where the first to third images are assigned or provided to the actual data.
  • the case where the above-described filter array is used is more particularly shown in a process flow of FIG. 24 .
  • the control device may be configured to perform an image reduction process to reduce the second image to form a fourth image and an image composition process to compose the first and fourth images to form a third image in addition to the separation process.
  • a method shown in FIG. 25 is also preferable. That is, at first, a separation process of anomalous pixels is performed. In the separation process, signals from the imaging element are separated into a second image formed by S-polarized pixels and a first image formed by P-pixels. At this time, failure parts in the second image formed by the Y pixels are interpolated by peripheral Y pixels before the following image composition process and the second image has a same size (a number of pixels) as the imaging element, for example, 640 ⁇ 480 pixels.
  • an image reduction process is performed to reduce the second image of the brightness information such that the second image has a same size as the first image formed by the S-pixels and the P-pixels to form the fourth image.
  • the image composition process is performed to generate a third image constituted by the brightness information and the corresponding polarization information from the fourth image and the first image.
  • a color detection function to detect a color of a traffic light is necessary at an upper side of a screen and a function of detecting a wet road surface by using the polarization information is necessary at a lower side of the screen.
  • an upper side of an imaging element is provided with the filter array of the first embodiment to obtain a color image and a lower side of the imaging element is formed by the configuration where the low-pass filter is configured to extract a wavelength component of the predetermined light when focusing the predetermined light, or other combinations of the different filter arrays to be used in each area.
  • a low-pass filter configured to focus a predetermined light on a predetermined pixel on a light-receiving part of an imaging element
  • high resolution and sensitivity of the imaging element can be achieved.
  • ratio of pixels without filter can be increased as well as the imaging element capable of achieving a normal color reproduction can be provided.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Studio Devices (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Optical Filters (AREA)
  • Polarising Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Color Television Image Signal Generators (AREA)
US13/146,270 2009-01-26 2010-01-26 Imaging element and imaging apparatus that extract light of a specific wavelength Active 2031-05-24 US8842211B2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2009014195A JP5572954B2 (ja) 2009-01-26 2009-01-26 撮像素子及び該撮像素子を備えた画像撮像装置
JP2009-014195 2009-01-26
JP2009014195 2009-01-26
PCT/JP2010/051314 WO2010085000A1 (en) 2009-01-26 2010-01-26 Imaging element and imaging apparatus using the same

Publications (2)

Publication Number Publication Date
US20110285898A1 US20110285898A1 (en) 2011-11-24
US8842211B2 true US8842211B2 (en) 2014-09-23

Family

ID=42356045

Family Applications (1)

Application Number Title Priority Date Filing Date
US13/146,270 Active 2031-05-24 US8842211B2 (en) 2009-01-26 2010-01-26 Imaging element and imaging apparatus that extract light of a specific wavelength

Country Status (7)

Country Link
US (1) US8842211B2 (ko)
EP (1) EP2382787B1 (ko)
JP (1) JP5572954B2 (ko)
KR (1) KR101265432B1 (ko)
CN (1) CN102318349B (ko)
TW (1) TW201119361A (ko)
WO (1) WO2010085000A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9944293B2 (en) 2013-12-19 2018-04-17 Ricoh Company, Ltd. Object detection apparatus, moving body device control system and program thereof

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5713816B2 (ja) 2011-03-16 2015-05-07 株式会社東芝 固体撮像装置及びカメラモジュール
JP2013031054A (ja) 2011-07-29 2013-02-07 Ricoh Co Ltd 撮像装置及びこれを備えた物体検出装置、並びに、光学フィルタ及びその製造方法
JP2013029451A (ja) 2011-07-29 2013-02-07 Ricoh Co Ltd 付着物検出装置及び付着物検出方法
JP5983954B2 (ja) * 2011-08-08 2016-09-06 パナソニックIpマネジメント株式会社 固体撮像装置
JP5899957B2 (ja) * 2012-01-20 2016-04-06 株式会社リコー 画像処理システム及びそれを備えた車両
JP5853719B2 (ja) * 2012-01-20 2016-02-09 株式会社リコー 画像処理システム及びそれを備えた車両
DE102012221356A1 (de) * 2012-06-20 2013-12-24 Robert Bosch Gmbh Sensor und Verfahren zur Erfassung von Licht und Verfahren und Vorrichtung zur Ermittlung einer Farbinformation
TW201428245A (zh) * 2012-09-10 2014-07-16 Bluelight Analytics Inc 光量測裝置和方法
JP6417666B2 (ja) * 2013-05-15 2018-11-07 株式会社リコー 画像処理システム
FR3007534A1 (fr) * 2013-06-20 2014-12-26 St Microelectronics Crolles 2 Realisation d'un filtre spectral nanostructure
JP6676040B2 (ja) * 2015-04-08 2020-04-08 マクセル株式会社 車両搭載カメラ
US11092815B2 (en) * 2016-09-15 2021-08-17 Magna International Inc. Metasurface lens assembly for chromatic separation
EP3441804A1 (en) * 2017-08-10 2019-02-13 Canon Kabushiki Kaisha Optical low-pass filter and imaging apparatus

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04144630A (ja) 1990-10-06 1992-05-19 Rheon Autom Mach Co Ltd 包被切断装置
JPH1118095A (ja) 1997-06-20 1999-01-22 Nikon Corp 撮像装置および記録媒体
JP2000278503A (ja) 1999-03-23 2000-10-06 Minolta Co Ltd ベイヤ補間装置およびベイヤ補間方法ならびにベイヤ補間プログラムを記録した記録媒体
US6345116B1 (en) * 1996-05-31 2002-02-05 Matsushita Electric Industrial Co., Ltd. Image processing apparatus
US20040160519A1 (en) * 2003-02-14 2004-08-19 Pentax Corporation Image processor, image-processing method, and image-processing program product
US20040189818A1 (en) * 2000-02-22 2004-09-30 Olympus Optical Co., Ltd. Image processing apparatus
JP2005167356A (ja) 2003-11-28 2005-06-23 Canon Inc 撮像素子
JP2005318465A (ja) 2004-04-30 2005-11-10 Casio Comput Co Ltd 撮像装置及びその画像データ処理方法
TW200702956A (en) 2005-05-06 2007-01-16 Seereal Technologies Gmbh Device for holographic reconstructions of three-dimensional scenes
JP2007086720A (ja) 2005-08-23 2007-04-05 Photonic Lattice Inc 偏光イメージング装置
JP2007109801A (ja) 2005-10-12 2007-04-26 Sumitomo Electric Ind Ltd 固体撮像装置とその製造方法
US20070183020A1 (en) * 2003-10-23 2007-08-09 Koninklijke Philips Electronics N.V. Polarization independent phase modulator
US20090009668A1 (en) * 2007-07-03 2009-01-08 Jds Uniphase Corporation Non-Etched Flat Polarization-Selective Diffractive Optical Elements
US7566180B2 (en) * 2004-11-19 2009-07-28 Hoya Corporation Shutter unit for a digital camera
US20090238455A1 (en) 2008-03-18 2009-09-24 Ricoh Company, Ltd. Imaging apparatus
US7796814B2 (en) 2006-04-14 2010-09-14 Sony Corporation Imaging device
US8189091B2 (en) * 2008-12-08 2012-05-29 Samsung Electronics Co., Ltd. Apparatus and method for electro-optical split image focusing
US8471999B2 (en) * 2008-04-24 2013-06-25 The Hong Kong University Of Science And Technology Low voltage liquid crystal lens with variable focal length

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2861525B2 (ja) * 1991-09-10 1999-02-24 松下電器産業株式会社 波長選択性位相格子光学的ローパスフィルタ
JP2001235710A (ja) * 2000-02-24 2001-08-31 Japan Science & Technology Corp 回折光学素子及び撮像光学装置
US8018508B2 (en) * 2004-04-13 2011-09-13 Panasonic Corporation Light-collecting device and solid-state imaging apparatus
US7978240B2 (en) * 2005-10-03 2011-07-12 Konica Minolta Photo Imaging, Inc. Enhancing image quality imaging unit and image sensor
JP2009217123A (ja) * 2008-03-12 2009-09-24 Fujinon Corp 回折格子型ローパスフィルタ

Patent Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04144630A (ja) 1990-10-06 1992-05-19 Rheon Autom Mach Co Ltd 包被切断装置
US6345116B1 (en) * 1996-05-31 2002-02-05 Matsushita Electric Industrial Co., Ltd. Image processing apparatus
JPH1118095A (ja) 1997-06-20 1999-01-22 Nikon Corp 撮像装置および記録媒体
JP2000278503A (ja) 1999-03-23 2000-10-06 Minolta Co Ltd ベイヤ補間装置およびベイヤ補間方法ならびにベイヤ補間プログラムを記録した記録媒体
US20040189818A1 (en) * 2000-02-22 2004-09-30 Olympus Optical Co., Ltd. Image processing apparatus
US20040160519A1 (en) * 2003-02-14 2004-08-19 Pentax Corporation Image processor, image-processing method, and image-processing program product
US20070183020A1 (en) * 2003-10-23 2007-08-09 Koninklijke Philips Electronics N.V. Polarization independent phase modulator
JP2005167356A (ja) 2003-11-28 2005-06-23 Canon Inc 撮像素子
JP2005318465A (ja) 2004-04-30 2005-11-10 Casio Comput Co Ltd 撮像装置及びその画像データ処理方法
US7566180B2 (en) * 2004-11-19 2009-07-28 Hoya Corporation Shutter unit for a digital camera
TW200702956A (en) 2005-05-06 2007-01-16 Seereal Technologies Gmbh Device for holographic reconstructions of three-dimensional scenes
JP2007086720A (ja) 2005-08-23 2007-04-05 Photonic Lattice Inc 偏光イメージング装置
JP2007109801A (ja) 2005-10-12 2007-04-26 Sumitomo Electric Ind Ltd 固体撮像装置とその製造方法
CN101283453A (zh) 2005-10-12 2008-10-08 住友电气工业株式会社 固态成像装置及其制造方法
US20090115011A1 (en) * 2005-10-12 2009-05-07 Sumitomo Electric Industries, Ltd. Solid-state imaging device and production method thereof
US7796814B2 (en) 2006-04-14 2010-09-14 Sony Corporation Imaging device
US20090009668A1 (en) * 2007-07-03 2009-01-08 Jds Uniphase Corporation Non-Etched Flat Polarization-Selective Diffractive Optical Elements
US20090238455A1 (en) 2008-03-18 2009-09-24 Ricoh Company, Ltd. Imaging apparatus
JP2009225286A (ja) 2008-03-18 2009-10-01 Ricoh Co Ltd 画像撮像装置
US8471999B2 (en) * 2008-04-24 2013-06-25 The Hong Kong University Of Science And Technology Low voltage liquid crystal lens with variable focal length
US8189091B2 (en) * 2008-12-08 2012-05-29 Samsung Electronics Co., Ltd. Apparatus and method for electro-optical split image focusing

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Combined Office Action and Search Report issued Jun. 9, 2013 in Chinese Patent Application No. 201080005436.X with English language translation.
Combined Taiwanese Office Action and Search Report issued Mar. 14, 2013, in Patent Application No. 099102143 (with English-language translation).
International Search Report issued Apr. 20, 2010 in PCT/JP10/051314 filed Jan. 26, 2010.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9944293B2 (en) 2013-12-19 2018-04-17 Ricoh Company, Ltd. Object detection apparatus, moving body device control system and program thereof

Also Published As

Publication number Publication date
CN102318349B (zh) 2014-12-17
JP2010171861A (ja) 2010-08-05
CN102318349A (zh) 2012-01-11
JP5572954B2 (ja) 2014-08-20
KR101265432B1 (ko) 2013-05-16
EP2382787A4 (en) 2015-03-18
KR20110112826A (ko) 2011-10-13
EP2382787B1 (en) 2016-11-23
TW201119361A (en) 2011-06-01
WO2010085000A1 (en) 2010-07-29
US20110285898A1 (en) 2011-11-24
EP2382787A1 (en) 2011-11-02

Similar Documents

Publication Publication Date Title
US8842211B2 (en) Imaging element and imaging apparatus that extract light of a specific wavelength
JP5879549B2 (ja) ライトフィールド撮像装置、および画像処理装置
JP5325117B2 (ja) 固体撮像装置
US9848118B2 (en) Phase detection autofocus using opposing filter masks
JP5842146B2 (ja) 固体撮像装置、撮像装置、及び分光素子
JP5066420B2 (ja) 色分解光学系および撮像装置
US20150130962A1 (en) Polarization color image capture device
WO2010058545A1 (ja) 撮像装置
CN102484723B (zh) 固体摄像元件、摄像装置以及信号处理方法
JP2004228662A (ja) 撮像装置
JP6039558B2 (ja) 固体撮像装置
US20130135502A1 (en) Color separation filter array, solid-state imaging element, imaging device, and display device
US6166800A (en) Solid-state image capture system including H-PDLC color separation element
JP5894573B2 (ja) 固体撮像素子、撮像装置および信号処理方法
WO2013099151A1 (ja) 固体撮像素子、撮像装置、および信号処理方法
US20050219699A1 (en) Color separator and imager
JP6039567B2 (ja) 固体撮像装置
JP2005167356A (ja) 撮像素子
JP4951209B2 (ja) 色分離装置及び撮像装置
JP2004208212A (ja) 撮像装置
JPH11295513A (ja) 色分光素子を有する装置

Legal Events

Date Code Title Description
AS Assignment

Owner name: RICOH COMPANY, LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KASAHARA, RYOSUKE;HIRAI, HIDEAKI;REEL/FRAME:026649/0483

Effective date: 20110707

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

STCF Information on status: patent grant

Free format text: PATENTED CASE

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551)

Year of fee payment: 4

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 8