US8660156B2 - Method and system for powering and cooling semiconductor lasers - Google Patents

Method and system for powering and cooling semiconductor lasers Download PDF

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Publication number
US8660156B2
US8660156B2 US12/813,662 US81366210A US8660156B2 US 8660156 B2 US8660156 B2 US 8660156B2 US 81366210 A US81366210 A US 81366210A US 8660156 B2 US8660156 B2 US 8660156B2
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semiconductor laser
sides
diode
array
tile
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US20110051759A1 (en
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Steven J. Telford
Anthony S. Ladran
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Lawrence Livermore National Security LLC
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Lawrence Livermore National Security LLC
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Priority to US12/813,662 priority Critical patent/US8660156B2/en
Assigned to U.S. DEPARTMENT OF ENERGY reassignment U.S. DEPARTMENT OF ENERGY CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS). Assignors: LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Priority to CN2010800393161A priority patent/CN102640368A/zh
Priority to JP2012528057A priority patent/JP5740685B2/ja
Priority to PCT/US2010/047719 priority patent/WO2011028932A1/en
Priority to IN2236DEN2012 priority patent/IN2012DN02236A/en
Priority to RU2012112805/28A priority patent/RU2012112805A/ru
Priority to KR1020127008584A priority patent/KR101721282B1/ko
Priority to EP10814512.9A priority patent/EP2462665B1/en
Priority to CA2772710A priority patent/CA2772710C/en
Publication of US20110051759A1 publication Critical patent/US20110051759A1/en
Publication of US8660156B2 publication Critical patent/US8660156B2/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042—Electrical excitation ; Circuits therefor
    • H01S5/0428—Electrical excitation ; Circuits therefor for applying pulses to the laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/023—Mount members, e.g. sub-mount members
    • H01S5/02325—Mechanically integrated components on mount members or optical micro-benches
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/024—Arrangements for thermal management
    • H01S5/02438—Characterized by cooling of elements other than the laser chip, e.g. an optical element being part of an external cavity or a collimating lens
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/024—Arrangements for thermal management
    • H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
    • H01S5/06209—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in single-section lasers
    • H01S5/06216—Pulse modulation or generation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/06808—Stabilisation of laser output parameters by monitoring the electrical laser parameters, e.g. voltage or current
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4018—Lasers electrically in series

Definitions

  • High average power diode pumped lasers are currently being used in or designed into an increasing number of laser systems. As the optical output power of these high average power diode pumped lasers increases, the input optical power required from the diode laser pumps typically increases as well. Since the efficiency of the diode lasers has been substantially constant during the last few years, increases in optical power are accompanied by increases in electrical input power. In some applications, currents on the order of hundreds of amps are needed to drive the diode laser pumps. As a result, precise current regulation using power conditioning electronics are challenging.
  • an embodiment of the present invention provides a semiconductor laser pump module with integrated pulse generator.
  • the invention has been applied to an array of semiconductor laser bars sharing a common cooling structure with the drive electronics for the pulse generator.
  • the methods and systems described herein are also applicable to numerous optical systems including lasers, amplifiers, and the like.
  • a semiconductor laser system includes a diode laser tile.
  • the diode laser tile includes a mounting fixture having a first side and a second side opposing the first side and an array of semiconductor laser pumps coupled to the first side of the mounting fixture.
  • the semiconductor laser system also includes an electrical pulse generator thermally coupled to the diode laser tile and a cooling structure thermally coupled to the diode laser tile and the electrical pulse generator.
  • a method of operating a semiconductor laser pump unit includes applying DC power to a charge storage capacitor and a power bus and applying a current pulse to a drive amplifier connected to a current control FET.
  • the method also includes flowing a current through the current control FET in response to applying the current pulse to the drive amplifiers and flowing the current through a sense resistor connected to the power bus.
  • the method further includes sensing the current using a sense amplifier coupled to a first terminal of the sense resistor and a second terminal of the sense resistor and flowing the current through a semiconductor laser array to produce pump light.
  • some embodiments incorporate in-situ integrated intelligence for sensing and monitoring diode performance in order to prevent catastrophic cascading damage, also referred to as fratricide.
  • in-situ integrated intelligence for sensing and monitoring diode performance in order to prevent catastrophic cascading damage, also referred to as fratricide.
  • fratricide catastrophic cascading damage
  • FIG. 1 is a simplified schematic diagram of a semiconductor laser pump unit according to an embodiment of the present invention
  • FIG. 3 is a simplified schematic diagram of a power conditioning circuit according to an embodiment of the present invention.
  • FIG. 4 is a circuit schematic for a Multisim model of the power conditioning circuit illustrated in FIG. 2 ;
  • FIG. 5A illustrates a model benchmark output from the Multisim model shown in FIG. 4 ;
  • FIG. 5B illustrates load characteristics for the Multisim model shown in FIG. 4 ;
  • FIG. 5C illustrates power supply voltage and current characteristics for the Multisim model shown in FIG. 4 ;
  • FIG. 5D illustrates efficiency for the Multisim model shown in FIG. 4 ;
  • FIG. 6 is a simplified flowchart illustrating a method of operating a semiconductor laser pump unit according to an embodiment of the present invention.
  • power conditioning electronics used for high power diode laser (i.e., semiconductor laser) pumps are either actively cooled or limited in their duty cycle.
  • the power conditioning electronics used to drive the diode laser pumps used in the Mercury laser at Lawrence Livermore National Laboratory (LLNL) were actively cooled.
  • the control of the duty factor of the power conditioning electronics necessitated by thermal concerns may limit the operational characteristics of the laser.
  • Embodiments of the present invention integrate one or more components of the power conditioning system and the diode monitoring system with the diode package, thereby providing benefits not available using conventional systems. These benefits may include: (1) eliminating the need for a separate cooling system for the power conditioning electronics; (2) eliminating the duty factor limitation due to thermal constraints associated with the power conditioning electronics; (3) reducing the physical size of the power conditioning electronics; (4) increasing the overall system efficiency; (5) reducing power conditioning costs by at least an order of magnitude; and (6) enabling Inertial Fusion Energy (IFE) to be a competitive energy source.
  • IFE Inertial Fusion Energy
  • High average power diode laser arrays used for pumping of laser amplifiers which will be used for IFE power plants, utilize power conditioning systems to pulse the diode laser arrays at precise currents, pulse rates, and duty factors.
  • one or more components of the power conditioning electronics and monitoring systems will be moved from a remote electronics chassis to the diode laser package. Because the diode package is already actively cooled, the power conditioning will take advantage of the same cooling as the diode package.
  • Embodiments of the present invention are useful for a variety of high average power diode pumped lasers.
  • These lasers may include the Mercury Laser, directed energy laser systems such as the tailored-aperture ceramic laser (TACL), laser design prototypes, rep-rated femtosecond, petawatt, diode pumped high average power lasers, inertial fusion energy power plants, directed energy weapons systems, rep-rated laser induced HED physics, laser machining applications, and other laser applications including high power diode laser pumping.
  • TACL tailored-aperture ceramic laser
  • FIG. 1 is a simplified schematic diagram of a semiconductor laser pump unit according to an embodiment of the present invention.
  • the semiconductor laser pump unit includes a diode laser tile 110 that includes an array of semiconductor laser bars.
  • the semiconductor laser bars making up the array are characterized by an output power, for example, 100 W per bar.
  • These high power diode laser pumps are suitable for pumping of laser gain medium as will be evident to one of skill in the art.
  • Electrical connectors provide drive current for the semiconductor laser bars in the diode laser tile. Typical drive currents for the diode laser tile are on the order of hundreds of amps.
  • the semiconductor laser pump unit also includes power electronics 120 , which contains one or more components of an electrical pulse generator.
  • the power electronics 120 also referred to as pulse control electronics
  • the power electronics 120 include a sense resistor and a power control field effect transistor (FET), which are components of the electrical pulse generator.
  • FET power control field effect transistor
  • a cooling assembly 130 is provided to remove heat generated by the semiconductor laser pump unit and the power electronics. Because the diode laser bars operate at less than 100% electrical to optical efficiency, the high power output of the diode laser bars is accompanied by significant heat generation.
  • the cooling assembly 130 provides for active cooling of the diode laser bars. Additionally, the cooling assembly 130 is used to remove heat from power electronics 120 . Thus, the diode laser bars and the cooling electronics share a common heat sink or cooling structure.
  • one or more components of the electrical pulse generator are cooled to remove heat generated by the large diode currents (e.g., 100's of amps) carried by the electronics.
  • the pulse drive circuit and the performance monitor circuit illustrated in FIG. 2 , are mounted to a surface of the diode laser tile using high density surface mount technology.
  • diode packages are provided that output 12 KW of optical power (e.g., 60 bars at 200 W/bar) with a pulse width of 1,000 ⁇ s and a repetition rate of ⁇ 10 Hz.
  • a the diode lasers can operate at 60% electrical to optical efficiency.
  • the size of the various elements of the diode laser tile are such that the power components can fit on the footprint of the diode tile.
  • the current control FET 234 has a nominal footprint of 10 mm ⁇ 15 mm (including leads).
  • the current control FET 234 can operate at up to 40 V with a pulsed current of 790 A and a continuous current of 200 A, thereby operating at up to 230 W and dissipating 61.5 W.
  • the form factor can be a TO-263 outline.
  • the sense resistor 232 which is a 0.001 ⁇ resistor has a nominal footprint of 7 mm ⁇ 13 mm (including leads).
  • the sense resistor is a 1 m ⁇ resistor with a 0.5% tolerance operating at up to 3 W and dissipating 2.25 W.
  • both the current control FET 234 and the sense resistor 232 can be attached to the diode tile cooling block adjacent to each other to provide cooling to these components.
  • 56 diode laser tiles are utilized to form a larger diode laser array.
  • Other control electronics can be mounted on a mezzanine board that has the same or similar footprint to the diode tile.
  • embodiments of the present invention provide a diode laser tile module that integrates the cooling assembly and power electronics at a position below the footprint of the diode laser tile, the modules can be integrated in an array with little to no space needed between adjacent tiles. As a result, since the electronics are located on the back of the array, the diode heat sinking is provided in a manner that reduces or eliminates complications.
  • Embodiments of the present invention provide a diode laser system in which the components that need to be actively cooled (e.g., the current control FET and the current sense resistor) are attached to the diode laser tile cooling block, for example, the cooling assembly 130 so that the same cooling system used to cool the diode lasers is used to cool these components.
  • FIG. 2 is a simplified schematic diagram of an electrical pulse generator, also referred to as a power conditioning circuit according to an embodiment of the present invention.
  • the power conditioning circuit illustrated in FIG. 2 includes a DC power supply connected to a charge storage capacitor.
  • the illustrated embodiment, the charge storage capacitor has a rating of 33000 ⁇ F.
  • An attached IC includes a current sense amplifier, a drive amplifier and associated resistors and capacitors.
  • One or more of the components are mounted in thermal communication with the cooling assembly 130 .
  • These components are referred to as on-tile components since they are also in thermal communication with the diode laser tile and may be mounted on a fixture that is attached to the diode laser tile.
  • the on-tile components include a current sense resistor and a current control FET.
  • the diode laser tile is connected between the current sense resistor, which is connected to the DC power supply, and the current control FET, which has one terminal that is grounded.
  • the diode laser tile includes an array of semiconductor laser bars. Typically, each bar includes a number of semiconductor lasers in an array configuration.
  • one or more components of the electrical pulse generator can be mounted onto a surface of the diode laser tile.
  • the high power current control FET is mounted in raw die format in thermal communication with the cooling assembly that is also in thermal communication with the diode laser tile. Mounting of the current control FET in raw die format saves space and takes advantage of the cooling capacity utilized to cool the diode laser tile.
  • the current sense resistor is another high power component that can be mounted in thermal communication with the cooling assembly. The current sense resistor, designed for current sensing applications, is thus cooled by conduction or convection using the cooling structure.
  • the charge storage capacitor also referred to as an intermediate energy storage system, is mounted in thermal communication with the cooling structure.
  • the charge storage capacitor can be mounted on a surface of the diode tile in addition to one or more components of the electrical pulse generator.
  • the semiconductor laser pump unit illustrated in FIG. 1 enables a system designer to optimize pump unit efficiency and lower cost in comparison with conventional systems.
  • the inventors have determined that a mean time between failure of more than three years is provided by embodiments of the present invention.
  • 110 watts are delivered to the diode laser tile at a operating voltage of 24 Volts DC.
  • the operating voltage is higher, for example, up to 100 V DC.
  • Energy storage in the charge storage capacitor is on the order of 6.1 Joules and can be up to 10 Joules.
  • the electrical pulse generator and diode laser tile can be an integrated assembly with non-repairable components.
  • the electrical pulse generator can be constructed onto the diode laser tile substrate as the diodes are being mounted.
  • the current control FET in die form
  • Control over the diode laser optical output can be provided by using the electrical pulse generator input trim resistor when the diode laser pump unit is manufactured.
  • the design of the electrical pulse generator provides a number of advantages in comparison with conventional systems. For example, this design extrapolates well to larger arrays, where the DC power will be greater than 100 V because the Drive Amplifier 224 is ground referenced. Additionally, the bias voltage of the Drive Amplifier 224 can be obtained from a Zener regulator based on the diode power.
  • another embodiment switches the positions of the diode laser tile 119 and the current control FET 234 , with the current control FET connected to the current sense resistor and the diode laser tile attached to ground.
  • the bias voltage for the Driver Amplifier 224 can be obtained from a Zener regulator off of the diode power.
  • the diode lasers are ground referenced, which can provide benefits in relation to packaging of the diode lasers.
  • a semiconductor laser system includes a diode laser tile 110 that includes a mounting fixture having a first side and a second side opposing the first side.
  • An array of semiconductor laser pumps are coupled to the first side of the mounting fixture, the top side in the illustrated embodiment.
  • each semiconductor laser pump of the array of semiconductor laser pumps includes an array of semiconductor lasers.
  • a plurality of lenslet arrays are coupled to the array of semiconductor laser pumps in order to collimate the light emitted by the semiconductor lasers, also referred to as diode lasers.
  • an electrical pulse generator illustrated by the power electronics 120 in FIG. 1 is thermally coupled to the diode laser tile 100 .
  • one or more components of the electrical pulse generator e.g., a FET in die form and a sense resistor
  • a cooling structure illustrated by cooling assembly 130 is thermally coupled to the diode laser tile and the electrical pulse generator.
  • one or more components of the electrical pulse generator are mounted on a third side of the mounting fixture disposed between the first side and the second side.
  • the third side is a vertical side of the diode laser tile 110 .
  • a semiconductor laser pump unit includes a semiconductor laser source (e.g., an array of semiconductor laser bars, each including an array of semiconductor lasers) and a heat sink thermally coupled to the semiconductor laser source.
  • the semiconductor laser pump unit also includes a pulse generator thermally coupled to the heat sink.
  • the pulse generator includes a sense resistor connected to a power supply (e.g., a DC power supply) and a field effect transistor connected to ground.
  • the field effect transistor is mounted in die form.
  • the heat sink is typically in thermal communication with a cooling fluid, such as chilled water.
  • a first end of the sense resistor is connected to a first terminal of a current sense amplifier and a second end of the sense resistor is connected to a second terminal of the current sense amplifier.
  • FIG. 3 is a simplified schematic diagram of an electrical pulse generator according to an embodiment of the present invention.
  • the electrical pulse generator illustrated in FIG. 3 shares common components with the one illustrated in FIG. 2 .
  • the diode laser array 310 which includes a plurality of diode lasers 312 a , 312 b , etc., is connected to the DC power supply 210 .
  • the charge storage capacitor 212 is also coupled to the DC power supply 210 and the diode laser array 310 .
  • the current control FET 320 is connected to the diode laser array 310 and the current sense resistor 330 , which has a terminal grounded. As illustrated in FIG.
  • the power components are actively cooled using the cooling assembly that is used to cool the diode lasers 312 a , 312 b , etc. in the diode laser array 310 .
  • the diode laser array can be fabricated in the form of a tile that reduces costs and enhances reliability by integrating the pulse power electronics directly into the diode laser tile submount.
  • the pulsed power cost can be reduced by more than a factor of 40 and the pulser electronics envelope can be reduced by about a factor of 20.
  • the design of the electrical pulse generator provides a number of advantages in comparison with conventional systems.
  • the Drive Amplifier bias voltage can be obtained from Zener regulator off of diode power.
  • the diodes are ground referenced, which facilitates packaging.
  • the pulse drive shares common components with the attached IC 220 illustrated in FIG. 2 .
  • a performance monitor 340 is provided that receives voltage, drive, and current as inputs and can be used to monitor performance of the diode laser array 310 as well as other system components.
  • the performance monitor 340 can sense and monitor diode laser performance to prevent catastrophic cascading failure.
  • Embodiments of the present invention enable a backplane design that enables parallel connection of tiles for enhanced reliability and close proximity to pulsers.
  • a backplane with ten laser bars connected in series provides an operating voltage of approximately 20 V. This configuration decreases the probability of catastrophic tile failure due to contact or bar failure operating at about 20 V, which is an operating voltage below “high voltage” levels. In this configuration, failure of a tile will result in a reduced number of bars that are affected and increases the space available for the mounting hardware for the array pulsers.
  • FIG. 4 is a circuit schematic for a Multisim model of the power conditioning circuit illustrated in FIG. 2 .
  • a similar model can be constructed for the electrical pulse generator illustrated in FIG. 3 .
  • the Multisim model includes a current limited power supply providing a source current at a source voltage.
  • the current sense resistor 232 , the diode laser tile 110 and the current control FET 234 are included in the model as On Tile Components, representing their mounting on the cooling assembly that is used to actively cool the diode lasers.
  • the current sense amplifier 222 and the drive amplifier 224 are also illustrated in the model shown in FIG. 4 .
  • FIG. 5A illustrates a model benchmark output from the Multisim model shown in FIG. 4 .
  • the measured SIMM tile current is plotted along with the current predicted using two models: Diode Model L and diode Model M.
  • Diode Model L represents one Multisim model of the diode load
  • Diode Model M represents a second Multisim diode load model.
  • a threshold voltage of 16.8 V and an inverse slope of 0.0215 V/A are characteristic of both the measured as well as modeled results.
  • FIG. 5B illustrates load characteristics for the Multisim model shown in FIG. 4 .
  • the voltage applied to the load is substantially constant at approximately 20 V during the 1 ms time during which power is applied to the circuit.
  • the voltage applied to the load drops at a substantially linear rate to a value of about 10 V.
  • the current applied to the load is substantially equal to 150 A during the 1 ms time during which power is applied to the circuit.
  • FIG. 5C illustrates power supply voltage and current characteristics for the Multisim model shown in FIG. 4 .
  • the power supply current is substantially constant at approximately 6.5 A during the 1 ms time during which power is applied to the circuit as well as the following 8 ms, dropping to zero for a 1 ms time period during each 10 ms period.
  • the power supply voltage drops from about 24 V to about 21 V during the 1 ms time during which power is applied to the circuit and then recovers to 24 V over the next 9 ms.
  • FIG. 5D illustrates efficiency for the Multisim model shown in FIG. 4 .
  • FIG. 5D plots the energy consumed by the diode load in relation to the energy delivered by the power supply as a function of time.
  • the energy consumed by the diode load increases from zero to about 1.25 J.
  • the energy consumed by the diode load remains constant prior to the next pulse.
  • the energy delivered by the power supply increases linearly for the first 9 ms, increasing from zero to about 1.37 J, and then remaining constant for the next millisecond.
  • the energy delivered by the power supply is 2.74 J and the energy consumed by the diode load is 24.1 J, producing an efficiency of 88%.
  • FIG. 6 is a simplified flowchart illustrating a method of operating a semiconductor laser pump unit according to an embodiment of the present invention.
  • the method 600 includes applying DC power to a charge storage capacitor and a power bus ( 610 ).
  • the DC power can be applied to the charge storage capacitor using a DC power supply 210 as illustrated in FIG. 2 .
  • the method also includes applying a current pulse to a drive amplifier connected to a current control FET ( 612 ).
  • the current pulse can be controlled by an external pulse source to provide a predetermined current, pulse width, and repetition rate, among other parameters.
  • the method further includes flowing a current through the current control FET in response to applying the current pulse to the drive amplifier ( 614 ). In some embodiments, a terminal of the current control FET is grounded.
  • the method also includes flowing the current through a sense resistor connected to the power bus ( 616 ) and sensing the current using a sense amplifier coupled to a first terminal of the sense resistor and a second terminal of the sense resistor ( 618 ).
  • the current control FET and the sense resistor are thermally coupled to a heatsink that is used to actively cool the diode laser tile, which includes a semiconductor laser array.
  • the same cooling source is used to cool the semiconductor laser array as well as the current control FET and the sense resistor.
  • the method further includes flowing the current through a semiconductor laser array to produce pump light ( 620 ).
  • FIG. 6 provides a particular method of operating a semiconductor laser pump unit according to an embodiment of the present invention. Other sequences of steps may also be performed according to alternative embodiments. For example, alternative embodiments of the present invention may perform the steps outlined above in a different order. Moreover, the individual steps illustrated in FIG. 6 may include multiple sub-steps that may be performed in various sequences as appropriate to the individual step. Furthermore, additional steps may be added or removed depending on the particular applications.
  • One of ordinary skill in the art would recognize many variations, modifications, and alternatives.
  • Table 1 illustrates diode driver specifications according to an embodiment of the present invention. The values shown in Table 1 are not intended to limit the scope of the present invention, but merely to illustrate exemplary specifications.

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
US12/813,662 2009-09-03 2010-06-11 Method and system for powering and cooling semiconductor lasers Active 2031-09-26 US8660156B2 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
US12/813,662 US8660156B2 (en) 2009-09-03 2010-06-11 Method and system for powering and cooling semiconductor lasers
CA2772710A CA2772710C (en) 2009-09-03 2010-09-02 Method and system for powering and cooling semiconductor lasers
RU2012112805/28A RU2012112805A (ru) 2009-09-03 2010-09-02 Способ и система энергоснабжения и охлаждения полупроводниковых лазеров
JP2012528057A JP5740685B2 (ja) 2009-09-03 2010-09-02 半導体レーザを駆動し冷却する方法及びシステム
PCT/US2010/047719 WO2011028932A1 (en) 2009-09-03 2010-09-02 Method and system for powering and cooling semiconductor lasers
IN2236DEN2012 IN2012DN02236A (ko) 2009-09-03 2010-09-02
CN2010800393161A CN102640368A (zh) 2009-09-03 2010-09-02 用于对半导体激光器进行供电和冷却的方法和系统
KR1020127008584A KR101721282B1 (ko) 2009-09-03 2010-09-02 반도체 레이저를 작동시키고 냉각시키는 방법 및 시스템
EP10814512.9A EP2462665B1 (en) 2009-09-03 2010-09-02 Method and system for powering and cooling semiconductor lasers

Applications Claiming Priority (2)

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