US8468417B2 - Data integrity in memory controllers and methods - Google Patents

Data integrity in memory controllers and methods Download PDF

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Publication number
US8468417B2
US8468417B2 US12/388,305 US38830509A US8468417B2 US 8468417 B2 US8468417 B2 US 8468417B2 US 38830509 A US38830509 A US 38830509A US 8468417 B2 US8468417 B2 US 8468417B2
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Prior art keywords
data
error detection
memory
circuitry
coupled
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US12/388,305
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US20100211834A1 (en
Inventor
Mehdi Asnaashari
Ronald Yamada
Siamack Nemazie
Jui-Yao (“Ray”) Yang
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Round Rock Research LLC
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Micron Technology Inc
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Assigned to MICRON TECHNOLOGY, INC. reassignment MICRON TECHNOLOGY, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ASNAASHARI, MEHDI, YAMADA, RONALD, YANG, JUI-YAO, NEMAZIE, SIAMACK
Priority to US12/388,305 priority Critical patent/US8468417B2/en
Priority to TW099104808A priority patent/TWI451434B/zh
Priority to EP20100744045 priority patent/EP2399194A4/en
Priority to JP2011550132A priority patent/JP5776107B2/ja
Priority to KR1020137028036A priority patent/KR101457518B1/ko
Priority to CN201080008211.XA priority patent/CN102317919B/zh
Priority to TW103118322A priority patent/TW201434051A/zh
Priority to KR1020117021511A priority patent/KR101351754B1/ko
Priority to PCT/US2010/000412 priority patent/WO2010096153A2/en
Publication of US20100211834A1 publication Critical patent/US20100211834A1/en
Priority to US13/920,451 priority patent/US9015553B2/en
Publication of US8468417B2 publication Critical patent/US8468417B2/en
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Assigned to ROUND ROCK RESEARCH, LLC reassignment ROUND ROCK RESEARCH, LLC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MICRON TECHNOLOGY, INC.
Priority to US14/688,323 priority patent/US20150220386A1/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/14—Handling requests for interconnection or transfer
    • G06F13/16—Handling requests for interconnection or transfer for access to memory bus
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/14—Handling requests for interconnection or transfer
    • G06F13/20—Handling requests for interconnection or transfer for access to input/output bus
    • G06F13/28—Handling requests for interconnection or transfer for access to input/output bus using burst mode transfer, e.g. direct memory access DMA, cycle steal
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/60—Protecting data
    • G06F21/64—Protecting data integrity, e.g. using checksums, certificates or signatures
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/09—Error detection only, e.g. using cyclic redundancy check [CRC] codes or single parity bit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/29—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0411—Online error correction
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13—Linear codes

Definitions

  • the present disclosure relates generally to semiconductor memory devices, methods, and systems, and more particularly, to data integrity.
  • Memory devices are typically provided as internal, semiconductor, integrated circuits in computers or other electronic devices. There are many different types of memory including volatile and non-volatile memory. Volatile memory can require power to maintain its data and includes random-access memory (RAM), dynamic random access memory (DRAM), and synchronous dynamic random access memory (SDRAM), among others. Non-volatile memory can provide persistent data by retaining stored information when not powered and can include NAND flash memory, NOR flash memory, read only memory (ROM), Electrically Erasable Programmable ROM (EEPROM), Erasable Programmable ROM (EPROM), and phase change random access memory (PCRAM), among others.
  • RAM random-access memory
  • DRAM dynamic random access memory
  • SDRAM synchronous dynamic random access memory
  • NAND flash memory NAND flash memory
  • NOR flash memory read only memory
  • ROM read only memory
  • EEPROM Electrically Erasable Programmable ROM
  • EPROM Erasable Programmable ROM
  • PCRAM phase change random access memory
  • SSD solid state drive
  • An SSD can include non-volatile memory, e.g., NAND flash memory and NOR flash memory, and/or can include volatile memory, e.g., DRAM and SRAM, among various other types of non-volatile and volatile memory.
  • non-volatile memory e.g., NAND flash memory and NOR flash memory
  • volatile memory e.g., DRAM and SRAM
  • An SSD can be used to replace hard disk drives as the main storage device for a computer, as the SSD can have advantages over hard drives in terms of performance, size, weight, ruggedness, operating temperature range, and power consumption.
  • SSDs can have superior performance when compared to magnetic disk drives due to their lack of moving parts, which may avoid seek time, latency, and other electro-mechanical delays associated with magnetic disk drives.
  • SSD manufacturers can use non-volatile flash memory to create flash SSDs that may not use an internal battery supply, thus allowing the drive to be more versatile and compact.
  • An SSD can include one or more memory devices, e.g., one or more memory chips.
  • a memory chip can include one or more dies. Each die can include one or more memory arrays and peripheral circuitry thereon.
  • a memory array can include one or more planes, with each plane including one or more physical blocks of memory cells. Each physical block can include one or more pages of memory cells that can store one or more sectors of data.
  • SSDs can interface with a host system with a serial interface such as universal serial bus (USB), serial advanced technology attachment (SATA), or peripheral component interconnect express (PCIe), among others.
  • Serial interfaces such as USB, SATA, and PCIe may have error detection mechanisms such as cyclic redundancy check (CRC) built into the link layer or transport layer of the architecture of the respective interfaces.
  • CRC may include the ability to detect the presence of errors caused by noise or other impairments during transmission of data from a transmitter to a receiver.
  • CRC data generation may be based on a frame structure supported by a particular interface.
  • a SATA frame structure may include a start-of-frame (SOF), followed by a frame information structure (FIS), followed by CRC data, and followed by an end-of-frame (FOF).
  • SOF start-of-frame
  • FIS frame information structure
  • CRC data CRC data
  • FIF end-of-frame
  • SATA may use 32-bits of CRC data calculated over the contents of the FIS.
  • An example of a 32-bit CRC polynomial used in the calculation of CRC data is: X 32 +X 26 +X 23 +X 22 +X 16 +X 12 +X 11 +X 10 +X 8 +X 7 +X 5 +X 4 +X 2 +X+1.
  • a SATA frame may include 2064 dwords including the FIS and CRC data, wherein the FIS payload may include 2048 dwords (8192 bytes). However, the payload may include less data.
  • logical block addressing is a scheme that can be used by a host for identifying a sector of information, e.g., each sector can correspond to a unique logical block address (LBA).
  • a sector may be the smallest addressable portion of a storage volume.
  • a sector of data can be a member of bytes of data, e.g., 512 bytes. Because each payload at a serial host interface, e.g., a SATA interface, does not necessarily include the same number of bytes, and because payloads at a serial host interface of a mass storage device may be of different units, the CRC data may not propagate past the host interface, e.g., the link or transport layer of the host interface.
  • FIG. 1 is a functional block diagram of a computing system including a memory system in accordance with one or more embodiments of the present disclosure.
  • FIG. 2 is a functional block diagram of a system including a memory controller in accordance with one or more embodiments of the present disclosure.
  • FIG. 3 is a functional block diagram of a system including a memory controller in accordance with one or more embodiments of the present disclosure.
  • FIG. 4 is a functional block diagram of a system including a memory controller in accordance with one or more embodiments of the present disclosure.
  • One memory controller embodiment includes a host interface and first error detection circuitry coupled to the host interface.
  • the memory controller can include a memory interface and second error detection circuitry coupled to the memory interface.
  • the first error detection circuitry can be configured to calculate error detection data for data received from the host interface and to check the integrity of data transmitted to the host interface.
  • the second error detection circuitry can be configured to calculate error correction data for data and first error correction data transmitted to the memory interface and to check integrity of data and first error correction data received from the memory interface.
  • FIG. 1 is a functional block diagram of a computing system 100 including a memory system 120 in accordance with one or more embodiments of the present disclosure.
  • the memory system 120 e.g., a solid state drive (SSD)
  • the memory controller 101 can include a memory controller 101 , a physical interface 103 , and one or more solid state memory devices 130 - 1 , . . . 130 -N, e.g., NAND flash devices.
  • the memory controller 101 can be coupled to the physical interface 103 and to the solid state memory devices 130 - 1 , . . . , 130 -N.
  • the physical interface 103 can be used to communicate information between the memory system 120 and another device such as a host system 102 .
  • Host system 102 can include a memory access device, e.g., a processor.
  • a processor can intend one or more processors, such as a parallel processing system, a number of coprocessors, etc. Examples of host systems include laptop computers, personal computers, digital cameras, digital recording and playback devices, mobile telephones, PDAs, memory card readers, interface hubs, and the like.
  • the physical interface 103 can be in the form of a standardized physical interface.
  • the physical interface 103 can be a serial advanced technology attachment (SATA), peripheral component interconnect express (PCIe), or a universal serial bus (USB), among other physical interfaces.
  • SATA serial advanced technology attachment
  • PCIe peripheral component interconnect express
  • USB universal serial bus
  • physical interface 103 can provide a physical connection for passing control, address, data, and other signals between a host interface, e.g., host interface 210 in FIG. 2 , of the controller 101 of the memory system 120 and a host system 102 having compatible receptors for the physical interface 103 .
  • the memory controller 101 can communicate with the solid state memory devices 130 - 1 , . . . , 130 -N to read, write, and erase data, among other operations.
  • Memory controller 101 can have circuitry that may be one or more integrated circuits and/or discrete components.
  • the circuitry in memory controller 101 may include control circuitry for controlling access across the solid state memory devices 130 - 1 , . . . , 130 -N and circuitry for providing a translation layer between a host system 102 and the memory system 120 .
  • a memory controller could selectively couple an I/O connection (not shown in FIG. 1 ) of a solid state memory device 130 - 1 , . . .
  • the communication protocol between a host system 102 and the memory system 120 may be different than what is required for access of a solid state memory device 130 - 1 , . . . , 130 -N.
  • Memory controller 101 could then translate the commands received from a host into the appropriate commands to achieve the desired access to a solid state memory device 130 - 1 , . . . , 130 -N.
  • the embodiment of FIG. 1 can include additional circuitry that is not illustrated so as not to obscure embodiments of the present disclosure.
  • the memory system 120 can include address circuitry to latch address signals provided over I/O connections through I/O circuitry. Address signals can be received and decoded by a row decoder and a column decoder to access the solid state memory devices 130 - 1 , . . . , 130 -N. It will be appreciated by those skilled in the art that the number of address input connections can depend on the density and architecture of the solid state memory devices 130 - 1 , . . . , 130 -N.
  • FIG. 2 is a functional block diagram of a system 200 including a memory controller 201 in accordance with one or more embodiments of the present disclosure.
  • Controller 201 can be analogous to controller 101 illustrated in FIG. 1 .
  • controller 201 can be a component of a memory system, such as an SSD. It will be appreciated by one of ordinary skill in the art that additional circuitry and components can be provided beyond those illustrated in FIG. 2 , and that the controller detail of FIG. 2 has been reduced to facilitate ease of illustration.
  • memory controller 201 can be coupled to one or more solid state memory devices 230 .
  • the solid state memory devices 230 can be analogous to solid state memory devices 130 - 1 , . . . , 130 -N, illustrated in FIG. 1 .
  • Controller 201 can include a front end portion 204 and a back end portion 206 .
  • the memory controller can include a number of front end components coupled between a host interface 210 and data transfer circuitry, e.g., a direct memory access (DMA) module 214 .
  • DMA direct memory access
  • the memory controller can also include a number of back end components coupled between the DMA module 214 and a memory interface, e.g., a memory interface component of error detection circuitry/memory interface (I/F) 222 .
  • the error detection circuitry component of the error detection circuitry/memory I/F 222 can be an error correction code (ECC) engine.
  • ECC error correction code
  • the memory controller 201 can process commands and data received from or transferred to a host system 202 , e.g., host system 102 in FIG. 1 , with the front end 204 .
  • the memory controller 201 can manage communications with the solid state memory devices 230 to read, write, and erase data, among other operations, on the solid state memory devices 230 with the back end 206 .
  • certain aspects of command processing and memory communication management can be handled by the controller 201 on either or both of the front end 204 and back end 206 .
  • the host interface 210 and DMA module 214 can be front end components.
  • the front end portion 204 can include a host interface 210 that can be coupled to a host system 202 , e.g., host system 102 in FIG. 1 .
  • the host interface 210 can be configured to receive data from the host system.
  • the data received from the host interface can be a data payload including a number of sectors of data.
  • the data received from the host interface can be streaming data.
  • the host interface 210 can interface with the host system 202 through a number of layers including a physical layer 205 , a link layer 207 , and a transport layer 209 .
  • a transport layer can indicate at least a transport layer as part of a SATA standard or a transaction layer as part of a PCIe standard.
  • a transport layer according to a SATA standard can be analogous to a transaction layer according to a PCIe standard.
  • Host interface 210 can be coupled to a physical interface, e.g., physical interface 103 illustrated in FIG. 1 , on a memory system, e.g., an SSD, to communicate with a host system 202 . Such detail is not shown in FIG. 2 , for ease of illustration.
  • the host interface 210 can be coupled with a DMA module 214 and front end error detection circuitry, e.g., cyclic redundancy check (CRC) engine 212 .
  • error detection circuitry can provide functionality other than cyclic redundancy checks.
  • error detection circuitry can include repetition schemes, parity schemes, checksums, Hamming distance based checks, hash functions, horizontal and vertical redundancy checks, polarity schemes, and/or error correction schemes such as ECC, among others.
  • the host interface 210 can be directly coupled with the front end CRC engine 212 and directly coupled with the DMA module 214 .
  • the front end CRC engine 212 can be coupled to the host interface 210 , and thus to the host system, by a link layer 207 and/or a transport layer 209 .
  • the front end error detection circuitry, e.g., CRC engine 212 can be configured to detect errors in data, e.g., while the data is in a memory system such as memory system 120 in FIG. 1 .
  • the front end CRC engine 212 can calculate error correction data, e.g., CRC data, corresponding to data, e.g., a sector of a data payload such as a DMA payload, received from the link layer 207 and/or the transport layer 209 , e.g., as part of a write operation.
  • error correction data e.g., CRC data
  • data e.g., a sector of a data payload such as a DMA payload
  • the front end CRC engine 212 can calculate CRC data on a sector-by-sector basis.
  • the front end CRC engine 212 can be coupled to the host interface 210 by a link layer 207 and/or a transport layer 209 and receive a number of sectors of data, e.g., a DMA payload, from the link layer 207 and/or the transport layer 209 . In one or more embodiments, the front end CRC engine 212 can receive the number of sectors of data from either the link layer 207 exclusively, or from the transport layer 209 exclusively. However, embodiments are so limited. CRC data that may have been generated by a host system 202 for data transferred to a memory controller 201 may be stripped from the data at a transport layer 209 for PCIe type interfaces or at a link layer 207 for SATA type interfaces. However, according to one or more embodiments of the present disclosure, the front end CRC engine 212 can calculate and check CRC data per sector of data received from a host interface 210 , to which it can be coupled.
  • a link layer 207 and/or a transport layer 209 receive a number of sectors
  • the DMA module 214 can be coupled to a back end data buffer 218 and a back end error detection memory, e.g., CRC memory 216 .
  • the back end data buffer 218 can be coupled to the ECC engine/memory I/F 222 .
  • the back end data buffer 218 can be configured to buffer at least a portion, e.g., a number of sectors of data, of a DMA payload received from DMA module 214 for the ECC engine/memory I/F 222 during a write operation.
  • the back end data buffer 218 can be configured to buffer a number of sectors of data received from the ECC engine/memory I/F 222 during a read operation.
  • the back end data buffer 218 and back end CRC memory 216 can be coupled to error detection circuitry, e.g., an ECC engine and memory interface.
  • error detection circuitry e.g., an ECC engine and memory interface.
  • the ECC engine and memory interface can be coupled together as one component, e.g., “ECC ENGINE/MEMORY I/F” 222 .
  • ECC ENGINE/MEMORY I/F can be coupled together as one component, e.g., “ECC ENGINE/MEMORY I/F” 222 .
  • Reference herein collectively to an ECC engine/memory I/F does not exclude embodiments having error detection circuitry and memory interfaces as separate components.
  • reference herein to either component individually does not exclude embodiments where error detection circuitry and a memory interface are included as one component.
  • the back end CRC memory 216 can be configured to store CRC data calculated by the front end CRC engine 212 .
  • the back end CRC memory 216 can be coupled to an ECC engine/memory I/F 222 and be configured to receive and store CRC data from the memory interface portion of ECC engine/memory I/F 222 , e.g., CRC data that had previously been stored in the solid state memory devices 230 .
  • the back end data buffer 218 can be configured to transfer a number of sectors of data received from an ECC engine/memory I/F 222 across the DMA module 214 to the front end CRC engine 212 .
  • the front end CRC engine 212 can be coupled to the error detection circuitry portion of the ECC engine/memory I/F 222 , e.g., via the DMA module 214 .
  • the back end CRC memory 216 can be configured to transfer CRC data corresponding to the number of sectors of data received from the ECC engine/memory I/F 222 across the DMA module 214 to the front end CRC engine 212 .
  • the front end CRC engine 212 can be configured to calculate CRC data for a, e.g., each, sector of data received from the DMA module 214 .
  • the front end CRC engine can then compare the calculated CRC data for the sector of data received from the DMA module 214 to the CRC data received from the back end CRC memory 216 via the DMA module 214 , e.g., to verify the integrity of the sector of data received from the DMA module 214 before the sector of data is transferred across the host interface 210 to a host system. Additional detail on the operation of a DMA module can be found in commonly assigned U.S. patent application Ser. No. 12/421,093, now U.S. Pat. No. 8,055,816, entitled “Memory Controllers, Memory Systems, Solid State Drives and Methods for Processing a Number of Commands.”
  • the ECC engine/memory I/F 222 can be coupled to the solid state memory devices 230 .
  • the ECC engine/memory I/F 222 can be configured to append CRC data, e.g., CRC data received from a back end CRC memory 216 , to a corresponding sector of data.
  • the ECC engine portion of the ECC engine/memory I/F 222 can be configured to detect errors in data, e.g., in a sector of data.
  • the ECC engine portion of the ECC engine/memory I/F 222 can be configured to detect and/or correct errors in data while the data is in a memory system such as memory system 120 in FIG. 1 .
  • the ECC engine portion of the ECC engine/memory I/F 222 can calculate error correction data, e.g., ECC data, for data alone and/or for data and appended error detection, e.g., CRC, data.
  • the ECC engine portion of the ECC engine/memory I/F 222 can be configured to calculate ECC data on a sector-by-sector basis.
  • the ECC engine/memory I/F 222 can be configured to append ECC data to a corresponding sector of data.
  • the ECC engine portion of the ECC engine/memory I/F 222 can be configured to calculate ECC data for a corresponding sector of data along with appended CRC data, e.g., CRC data calculated by the front end CRC engine 212 .
  • CRC data calculated by the front end CRC engine 212 .
  • the ECC engine portion of the ECC engine/memory I/F 222 can be configured to correct errors in a number of sectors of data while the number of sectors of data are in the back end data buffer 218 .
  • the ECC engine portion of the ECC engine/memory I/F 222 can be configured to correct errors in the CRC data while the CRC data is in the back end CRC memory 216 . Embodiments are not limited to correcting errors in these particular locations.
  • the memory controller 201 can be configured to transfer a number of sectors of data, corresponding calculated CRC data, and corresponding ECC data, or a different combination thereof, across the ECC engine/memory I/F 222 , e.g., to the solid state memory devices 230 for a write operation. That is, the controller can be configured to store a sector of data, corresponding CRC data, and corresponding ECC data in a location in the solid state memory devices 230 .
  • One or more embodiments can include the controller 201 receiving a number of sectors of data from a host system 202 with a link layer 207 and/or a transport layer 209 of a host interface 210 , e.g., in conjunction with a write operation.
  • the number of sectors of data can be transferred through a host interface 210 to a front end CRC engine 212 and a DMA module 214 .
  • the number of sectors of data can be received in parallel with the front end CRC engine 212 and the DMA module 214 .
  • the front end CRC engine 212 can calculate CRC data corresponding to each of the number of sectors of data, e.g., each sector of data can correspond to unique CRC data.
  • DMA module 214 can transfer the CRC data from CRC engine 212 to back end CRC memory 216 .
  • the front end CRC engine 212 can be coupled to the back end CRC memory 216 , e.g., via the DMA module 214 .
  • the back end CRC memory 216 can store the CRC data.
  • the back end CRC memory 216 can store more than one unique CRC data where each unique CRC data can correspond to a particular sector of data.
  • the DMA module 214 can transfer the number of sectors of data to the back end data buffer 218 .
  • the ECC engine/memory I/F 222 can transfer the number of sectors of data from the back end data buffer 218 and the corresponding CRC data from back end CRC memory 216 , calculate unique ECC data for each of the number of sectors of data and the corresponding CRC data, append the ECC data to the corresponding sector of data, and store the sector of data, CRC data, and ECC data in the one or more solid state memory devices 230 .
  • CRC data can be calculated on the contents of a frame information structure (FIS) in dword (32 bit) quantities, among other CRC computational methods.
  • a data payload received from a host system 202 may include a number of sectors, e.g., 512 byte portions, of a data payload.
  • CRC data may be calculated for the data payload as a whole rather than for each sector of data included in the data payload. That is, even if CRC data propagates past the link layer 207 or the transport layer 209 , the CRC data may not be useful for a particular sector of data at least partially because data may be transferred to and/or from a memory system, e.g., memory system 120 in FIG.
  • CRC data is calculated for each sector of data on a sector by sector basis, e.g., unique CRC data can be calculated for each sector of data. For example, if a data payload comprises 2048 bytes, CRC data can be calculated for each of four 512 byte sectors of data.
  • Data integrity can be provided for the number of sectors from the point it is received by the controller 201 from the host system 202 at the front end 204 , e.g., at the host interface 210 , to the point where it is transferred from the back end 206 to the solid state memory devices 230 .
  • Providing data integrity can include maintaining the same CRC data for a sector of data from the host interface 210 to the ECC engine/memory I/F 222 and/or to the solid state memory devices 230 .
  • ECC engine/memory I/F 222 can receive a number of sectors of data, their corresponding first CRC data, and FCC data from one or more solid state memory devices 230 , e.g., in conjunction with a read operation.
  • the ECC engine/memory I/F 222 can store the number of sectors of data in the back end data buffer 218 and store their corresponding CRC data in back end CRC memory 216 .
  • the number of sectors of data and their corresponding first CRC data and ECC data can be error checked with an ECC engine portion of an ECC engine/memory I/F 222 .
  • One or more errors identified by the ECC engine portion of the ECC engine/memory I/F 222 in the CRC data can be corrected while the CRC data is stored in the back end CRC memory 216 .
  • One or more errors identified by the ECC engine portion of the ECC engine/memory I/F 222 in the number of sectors of data can be corrected while the number of sectors of data are buffered in back end data buffer 218 .
  • the DMA module 214 can receive and transfer the number of sectors of data and their corresponding CRC data to the front end CRC engine 212 .
  • the front end CRC engine 212 can calculate second CRC data for the number of transferred sectors of data and compare the first CRC data with the corresponding second CRC data to verify the integrity of the number of sectors of data. After comparing the first CRC data with the second CRC data, the number of sectors of data can be transferred across a transport layer 209 of host interface 210 , e.g., to a host system 202 that requested data, e.g., the number of read sectors of data. In one or more embodiments, the number of sectors of data can be transferred across the host interface 210 without either the first CRC data or the second CRC data. In one or more embodiments, the ECC engine/memory I/F 222 can remove ECC data from the number of sectors of data and transfer the number of sectors of data and first CRC data in parallel to a front end CRC engine 212 .
  • data integrity can be provided for the number of sectors of data. That is, data integrity can be provided for the number of sectors of data from the point is the number of sectors are received by the back end 206 of controller 201 from the solid state memory devices 230 , e.g., at ECC engine/memory I/F 222 , to the point where the number of sectors are transferred across the host interface 210 , e.g., from the front end 204 to a host system 202 .
  • Providing data integrity can include maintaining the same CRC data from the solid state memory devices 230 to the host interface 210 .
  • FIG. 3 is a functional block diagram of a system 300 including a memory controller 301 in accordance with one or more embodiments of the present disclosure.
  • Controller 301 can be analogous to controller 101 illustrated in FIG. 1 .
  • controller 301 can be a component of a memory system, such as an SSD. It will be appreciated by those skilled in the art that additional circuitry and components can be provided beyond those illustrated in FIG. 3 , and that the controller detail of FIG. 3 has been reduced to facilitate ease of illustration.
  • the embodiment illustrated in FIG. 3 includes components that can be analogous to those illustrated in FIG. 2 including host interface 310 with physical layer 305 , link layer 307 , and transport layer 309 , as well as front end error detection circuitry, e.g., CRC engine 312 , and data transfer circuitry, e.g., DMA module 314 .
  • the host interface 310 can be coupled to the DMA module via a front end host buffer 324 , e.g., FIFO 324 as shown, and encryption circuitry, e.g., advanced encryption standard (AES) engine 326 .
  • AES advanced encryption standard
  • FIG. 3 includes components that can be analogous to those illustrated in FIG. 2 including host interface 310 with physical layer 305 , link layer 307 , and transport layer 309 , as well as front end error detection circuitry, e.g., CRC engine 312 , and data transfer circuitry, e.g., DMA module 314 .
  • the host interface 310 can be coupled
  • FIFO 324 can be configured to buffer a DMA payload between a host interface 310 and an AES engine 326 .
  • the AES engine 326 can include or be coupled to an AES buffer separate from the FIFO 324 .
  • the AES engine 326 may be configured to receive a number of sectors of data, e.g., a data payload (DMA payload) such as a data stream derived from a number of data packets received by the controller 301 .
  • a data payload e.g., a data payload (DMA payload)
  • DMA payload a data payload
  • the number of sectors of data Prior to encryption, can be plaintext (P.T.).
  • the AES engine 326 may be arranged and configured to process the number of sectors of data optionally to provide an encrypted output, e.g., ciphertext (C.T.) to the DMA module 314 .
  • C.T. ciphertext
  • the AES engine 326 can process the number of sectors of data optionally, meaning that the AES engine can encrypt the number of sectors of data from plaintext to ciphertext, or the AES engine 326 can transfer the number of sectors of data to the DMA module 314 without encryption, e.g., in plaintext.
  • a number of sectors of data received from a host system via host interface 310 can be received in parallel with the front end CRC engine 312 and the front end host buffer 324 , e.g., FIFO 324 as shown.
  • the number of sectors of data can be transferred from the host buffer 324 to the AES engine 326 , where the number of sectors of data can be encrypted from plaintext to ciphertext.
  • the number of sectors of data can be transferred from the AES engine 326 to a DMA module 314 for further processing. Additional examples of the operation of encryption engines are described in more detail in commonly assigned U.S. patent application Ser. No. 12/333,822, entitled “Parallel Encryption/Decryption”, having at least one common inventor.
  • the DMA module 314 effectively couples the front end 304 circuitry to the back end 306 circuitry.
  • the back end portion 306 of controller 301 can include more than one back end channel.
  • the controller 301 includes a number of back end channels 319 - 1 , . . . , 319 -N.
  • Each back end channel 319 - 1 , . . . , 319 -N can include a channel processor, 332 - 1 , . . . , 332 -N, and channel memory, 334 - 1 , . . . , 334 -N.
  • Each back end channel 319 - 1 , . . . , 319 -N can include back end channel data transfer circuitry, e.g., channel DMA modules 328 - 1 , . . . , 328 -N, which can be coupled to the DMA module 314 .
  • the DMA module 314 can be configured to direct commands associated with a DMA payload to a respective back end channel processor, e.g., back end channel processor 332 - 1 , and to direct data associated with a DMA payload to a respective back end channel DMA module, e.g., back end channel DMA module 328 - 1 .
  • Example operations of channel processors are described in more detail in commonly assigned U.S. patent application Ser. No. 12/351,206, entitled “Modifying Commands”, having at least one common inventor.
  • each back end channel 319 - 1 , . . . , 319 -N can include a back end data buffer 318 - 1 , . . . , 318 -N, back end error detection memory, e.g., CRC memory 316 - 1 , . . . , 316 -N, and ECC engines/memory interfaces 322 - 1 , . . . , 322 -N.
  • back end error detection memory e.g., CRC memory 316 - 1 , . . . , 316 -N
  • ECC engines/memory interfaces 322 - 1 , . . . , 322 -N e.g., ECC engines/memory interfaces
  • the ECC engine and memory interface can be coupled together as one component, e.g., “ECC ENGINE/MEMORY I/F” 322 .
  • the ECC engine and memory interface can be separate components.
  • the back end data buffers 318 - 1 , . . . , 318 -N can be coupled between the back end channel DMA modules 328 - 1 , . . . , 328 -N and the ECC engines/memory interfaces 322 - 1 , . . . , 322 -N.
  • 316 -N can be coupled between the DMA module 314 and the ECC engines/memory interfaces 322 - 1 , . . . , 322 -N.
  • a particular memory device, chip, array, etc. can correspond to a particular channel.
  • the solid state memory device(s) 330 - 1 can correspond to channel 319 - 1 .
  • FIG. 4 is a functional block diagram of a system 400 including a memory controller 401 in accordance with one or more embodiments of the present disclosure.
  • Controller 401 can be analogous to controller 101 illustrated in FIG. 1 .
  • controller 401 can be a component of a memory system, such as an SSD. It will be appreciated by those skilled in the art that additional circuitry and components can be provided beyond those illustrated in FIG. 4 , and that the detail of controller 401 in FIG. 4 has been reduced to facilitate ease of illustration.
  • the embodiment illustrated in FIG. 4 includes components that can be analogous to those illustrated in FIG. 3 including front end 404 components of controller 401 such as host interface 410 including physical layer 405 , link layer 407 , and transport layer 409 , as well as front end error detection circuitry, e.g., CRC engine 412 -F, and data transfer circuitry, e.g., DMA module 414 .
  • the controller 401 also includes a number of back end 406 components that can be analogous to those illustrated in FIG. 3 such as back end channels 419 - 1 , . . . , 419 -N, including back end channel processors 432 - 1 , . . . , 432 -N and memory 434 - 1 , .
  • back end channel data transfer circuitry e.g., channel DMA modules 428 - 1 , . . . , 428 -N, back end data buffers 418 - 1 , . . . , 418 -N, error detection circuitry, e.g., ECC engines/memory interfaces 422 - 1 , . . . , 422 -N, and back end error detection memory, e.g., CRC memory 416 - 1 , . . . , 416 -N.
  • ECC engines/memory interfaces 422 - 1 , . . . , 422 -N back end error detection memory
  • the ECC engine and memory interface can be coupled together as one component, e.g., “ECC ENGINE/MEMORY I/F” 422 .
  • the ECC engine and memory interface can be separate components.
  • each channel 419 - 1 , . . . , 419 -N can be coupled to one or more solid state memory devices 430 - 1 , . . . , 430 -N by the ECC engines/memory interfaces 422 - 1 , . . . , 422 -N.
  • back end channels 419 - 1 , . . . , 419 -N can include a back end error detection circuitry, e.g., back end CRC engine 412 -B 1 , . . . , 412 -BN coupled to the back end CRC memory 416 - 1 , . . . , 416 -N.
  • a back end CRC engine 412 -B 1 , . . . , 412 -BN can be configured to calculate error detection data, e.g., “second” CRC data, for corresponding data, e.g., a corresponding sector of data.
  • the corresponding data can be at least a portion of a DMA payload.
  • the front end CRC engine 412 -F can calculate “first” CRC data for a sector of data.
  • a back end CRC engine 412 -B 1 , . . . , 412 -BN can be configured to compare the first CRC data with the second CRC data to check and/or verify the integrity of the sector of data.
  • the DMA module 414 can be coupled to the front end CRC engine 412 -F and to the back end CRC memory 416 - 1 , . . . , 416 -N.
  • the DMA module 414 can be configured to transfer the first CRC data to a back end CRC memory 416 - 1 , . . . 416 -N. Then a back end CRC engine 412 -B 1 , . . . , 412 -BN can compare the first CRC data received from a back end CRC memory 416 - 1 , . . . , 416 -N with the calculated second CRC data.
  • a back end CRC engine 412 -B 1 , . . . , 412 -RN is disclosed with respect to FIG. 4 , which illustrates a controller 401 including multiple back end channels 419 - 1 , . . .
  • one or more embodiments of the present disclosure can include a memory controller with a single back end channel, e.g., as illustrated with respect to the back end 206 in FIG. 2 , that includes a back end CRC engine.
  • a back end CRC engine 412 -B 1 , . . . , 412 -BN can be coupled to an ECC engine/memory interface 422 - 1 , . . . , 422 -N.
  • the back end CRC engine 412 -B 1 , . . . , 412 -BN can be directly coupled to the ECC engine/memory I/F 422 - 1 , . . . , 422 -N.
  • the controller 401 can be configured to transfer the sector of data and corresponding ECC data across the ECC engine/memory I/F 422 - 1 , . . . , 422 -N without the first or the second corresponding CRC data. That is, in one or more embodiments, the sector of data and corresponding ECC data can be stored in the solid state memory devices 430 - 1 , . . .
  • the controller 401 can be configured to store the sector of data and the corresponding FCC data without the corresponding CRC data in a location in the solid state memory devices 430 - 1 , . . . , 430 -N when a back end CRC engine 412 -B 1 , . . . , 412 -BN verifies the integrity of the sector of data. That is, if a back end CRC engine 412 -B 1 , . . .
  • the controller 401 may not store the sector of data in the solid state memory devices 430 - 1 , . . . , 430 -N.
  • One or more embodiments can include receiving a number of sectors of data with the front end CRC engine 412 -F from a link layer 407 and/or a transport layer 409 of a host interface 410 , e.g., in conjunction with a write operation.
  • the front end CRC engine 412 -F can be configured to calculate first CRC data for each sector of data. Accordingly, for the write operation, data integrity of the number of sectors of data can be maintained on the front end 404 of the controller 401 at least in part due to CRC data being calculated for the number of sectors of data before, or separate from, the performance of other operations on the number of sectors of data.
  • the first CRC data can be transferred to the DMA module 414 .
  • the DMA module 414 can transfer the number of sectors of data to a back end channel DMA module 428 - 1 , . . . , 428 -N. In one or more embodiments, the DMA module 414 can transfer the number of sectors of data to a back end channel 419 - 1 , . . . , 419 -N that corresponds to a memory address associated with the number of sectors of data, e.g., the channel coupled to the solid state memory device corresponding to the memory address.
  • the DMA module can transfer the number of sectors of data to back end channel DMA module 428 - 1 on channel 419 - 1 when a memory address associated with the number of sectors of data corresponds to a particular solid state memory device, e.g., 430 - 1 .
  • the number of sectors of data can be transferred from the back end channel DMA module 428 - 1 , . . . , 428 -N to a back end data buffer 418 - 1 , . . . , 418 -N.
  • the back end data buffer 418 - 1 , . . . , 418 -N can buffer the sector of data received from the back end channel DMA module 428 - 1 , . . .
  • the number of sectors of data can be transferred in parallel from a back end data buffer 418 - 1 , . . . , 418 -N to the back end CRC engine 412 -B 1 , . . . , 412 -BN and to an ECC engine/memory I/F 422 - 1 , . . . , 422 -N.
  • the DMA module 414 can transfer the first CRC data to back end CRC memory 416 - 1 , . . . , 416 -N. In one or more embodiments, the DMA module 414 can transfer the first CRC data to a back end channel that corresponds to a memory address associated with the sector of data for which the first CRC data was calculated.
  • the first CRC data can be stored in back end CRC memory 416 - 1 , . . . , 416 -N before the back end CRC engine 412 -B 1 , . . . , 412 -BN calculates second CRC data.
  • an ECC engine portion of an ECC engine/memory I/F 422 - 1 , . . . , 422 -N can calculate ECC data for the sector of data after the comparison of first CRC data with second CRC data, but prior to the sector of data being stored in a solid state memory device 430 - 1 , . . . , 430 -N.
  • the ECC data can be appended to the sector of data before it is stored in a solid state memory device 430 - 1 , . . . , 430 -N, such that the sector of data and the ECC data are stored, but neither the first nor the second CRC data are stored in a solid state memory device 430 - 1 , . . . , 430 -N.
  • Such embodiments can be beneficial at least partially due to a reduction in the amount of information stored in the solid state memory devices 430 - 1 , . . . , 430 -N, e.g., when CRC data is not stored therein.
  • the number of sectors of data are only transferred from the ECC engine/memory I/F 422 - 1 , . . . , 422 -N to the solid state memory device 430 - 1 , . . . , 430 -N if the back end CRC engine 412 -B 1 , . . . , 412 -BN verifies the integrity of the number of sectors of data, e.g., if the first CRC data matches the second CRC data.
  • data integrity of the number of sectors of data can be maintained on the back end 406 of the controller 401 at least in part due to second CRC data being calculated for the number of sectors of data after processing by the DMA module 414 and back end channel DMA module 428 - 1 , . . . , 428 -N and compared to the first CRC data, which was calculated before, or separate from, the performance of other operations on the number of sectors of data.
  • second CRC data being calculated for the number of sectors of data after processing by the DMA module 414 and back end channel DMA module 428 - 1 , . . . , 428 -N and compared to the first CRC data, which was calculated before, or separate from, the performance of other operations on the number of sectors of data.
  • one or more embodiments of the present disclosure can provide data integrity for the number of sectors of data on the controller 401 .
  • One or more memory system operation embodiments can include a read operation including reading a number of sectors of data and corresponding ECC data from one or more solid state memory devices 430 - 1 , . . . , 430 -N.
  • the number of sectors of data can be error checked with an ECC engine portion of an ECC engine/memory I/F 422 - 1 , . . . , 422 -N.
  • the ECC data can be removed from the number of sectors of data.
  • 412 -BN can calculate CRC data for each of the number of sectors of data.
  • the number of sectors of data and the CRC data can be transferred in parallel, e.g., from the host buffer 424 and DMA module 414 respectively, to the front end CRC engine 412 -F.
  • the front end CRC engine 412 -F can calculate CRC data for the each of the number of sectors of data and compare it to the CRC data calculated by the back end CRC engine to check the integrity of the number of sectors of data.
  • the number of sectors of data can be transferred across a transport layer 409 of the host interface 410 after the comparison.
  • data integrity of a number of sectors of data can be maintained from the back end 406 of the controller 401 to the front end 404 at least in part due to calculating CRC data for each of the number of sectors of data after is the number of sectors of data are transferred from an ECC engine/memory I/F 422 - 1 , . . . , 422 -N. Furthermore, transferring previously calculated CRC data to the front end 404 of the controller 401 for comparison with newly calculated CRC data for a particular sector of data can help to verify that the integrity of the particular sector of data has been maintained. Thus, one or more embodiments of the present disclosure can provide data integrity for a number of sectors of data on the controller 401 .
  • One memory controller embodiment includes a host interface and first error detection circuitry coupled to the host interface.
  • the memory controller can include a memory interface and second error detection circuitry coupled to the memory interface.
  • the first error detection circuitry can be configured to calculate error detection data for data received from the host interface and to check the integrity of data transmitted to the host interface.
  • the second error detection circuitry can be configured to calculate error correction data for data and first error correction data transmitted to the memory interface and to check integrity of data and first error correction data received from the memory interface.

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US12/388,305 US8468417B2 (en) 2009-02-18 2009-02-18 Data integrity in memory controllers and methods
TW103118322A TW201434051A (zh) 2009-02-18 2010-02-12 在記憶體控制器中之資料完整性及方法
PCT/US2010/000412 WO2010096153A2 (en) 2009-02-18 2010-02-12 Data integrity in memory controllers and methods
JP2011550132A JP5776107B2 (ja) 2009-02-18 2010-02-12 メモリコントローラ及び方法におけるデータ完全性
KR1020137028036A KR101457518B1 (ko) 2009-02-18 2010-02-12 메모리 제어기들에 있어서의 데이터 무결성 및 방법들
CN201080008211.XA CN102317919B (zh) 2009-02-18 2010-02-12 在存储器控制器中的数据完整性及方法
TW099104808A TWI451434B (zh) 2009-02-18 2010-02-12 在記憶體控制器中之資料完整性及方法
KR1020117021511A KR101351754B1 (ko) 2009-02-18 2010-02-12 메모리 제어기들에 있어서의 데이터 무결성 및 방법들
EP20100744045 EP2399194A4 (en) 2009-02-18 2010-02-12 DATA INTEGRITY IN MEMORY CONTROL DEVICES AND METHOD THEREFOR
US13/920,451 US9015553B2 (en) 2009-02-18 2013-06-18 Data integrity in memory controllers and methods
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