US6177668B1 - Axial ejection in a multipole mass spectrometer - Google Patents

Axial ejection in a multipole mass spectrometer Download PDF

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US6177668B1
US6177668B1 US09/087,909 US8790998A US6177668B1 US 6177668 B1 US6177668 B1 US 6177668B1 US 8790998 A US8790998 A US 8790998A US 6177668 B1 US6177668 B1 US 6177668B1
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ions
rod set
mass
field
voltage
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James W. Hager
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Nordion Inc
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MDS Inc
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Priority to US09/087,909 priority Critical patent/US6177668B1/en
Priority to CA002239399A priority patent/CA2239399C/fr
Priority to EP99923351A priority patent/EP1084507B1/fr
Priority to AU40276/99A priority patent/AU4027699A/en
Priority to JP2000552706A priority patent/JP2002517888A/ja
Priority to AT99923351T priority patent/ATE273563T1/de
Priority to PCT/CA1999/000515 priority patent/WO1999063578A2/fr
Priority to DE69919353T priority patent/DE69919353T2/de
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

Definitions

  • This invention relates to a multipole elongated rod ion trap mass spectrometer with mass dependent axial ejection.
  • Conventional ion traps are generally composed of three electrodes, namely a ring electrode, and a pair of end caps, with appropriate RF and DC voltages applied to these electrodes to establish a three-dimensional field which traps ions within a mass range of interest in the relatively small volume between the ring electrode and the end caps.
  • the electrodes may be hyperbolic, producing a theoretically perfect three-dimensional quadrupole field, or they may deviate from hyperbolic geometry, giving rise to additional multipole fields superimposed on the quadrupole field and which can produce improved results.
  • ion trap mass spectrometers are filled in an essentially mass-independent manner and are emptied mass-dependently by manipulating the RF and DC voltages applied to one or more of the electrodes.
  • the ion storage and fast scanning capabilities of the ion trap are advantageous in analytical mass spectrometry.
  • High analysis efficiency, compared to typical beam-type mass spectrometers, can be achieved if the time to eject and detect ions from the trap is smaller than the time required to fill a trap. If this condition is met, then very few ions are wasted.
  • ion traps are usually of very low efficiency, e.g. one to ten percent, primarily due to the relatively small volume of the trap and the very demanding ion energetic constraints for trap acceptance of externally generated ions.
  • the relatively small volume of the ion trap means that the number of ions that can be accepted before space charge effects become serious is also relatively small.
  • Increasing the radial dimension of the volume of the trapping chamber of a conventional ion trap partially overcomes this limitation, but with the additional disadvantages of reduced analytical utility and/or increased costs (e.g. reduced mass range, larger power supplies).
  • the small volume of the ion trapping chamber will also tend to limit the linear response range (i.e. dynamic range), again because of the effects of space charge at high ion densities.
  • ions can be trapped and stored very efficiently in a two-dimensional RF quadrupole.
  • ions have been admitted into and then trapped in a two-dimensional quadrupole for purposes of releasing them into a conventional ion trap, as shown in U.S. Pat. No. 5,179,278.
  • More generally ions have been admitted into a pressurized linear cell or a two-dimensional RF quadrupole for the purpose of studying ion molecule reactions.
  • the ions enter the device from a mass selective source such as a resolving quadrupole, are trapped for a specified period of time, and then are ejected mass-independently for subsequent mass analysis.
  • U.S. Pat. No. 5,420,425 teaches that ions can be trapped and stored in a two-dimensional RF quadrupole and scanned out mass-dependently, using the technique of mass selective instability.
  • the device disclosed therein was conceived in order to improve ion sensitivities, detection limits, and dynamic range, by increasing the volume of the trapping chamber in the axial dimension.
  • the mass selective instability mode of ion ejection (and all other mass analysis scanning modes described in U.S. Pat. No. 5,420,425) involve ejecting ions out of the trapping chamber in a direction orthogonal to the center axis of the device, i.e. radially.
  • radial ejection of ions from a two-dimensional RF quadrupole there are several disadvantages of radial ejection of ions from a two-dimensional RF quadrupole.
  • One disadvantage is that radial ejection expels ions through or between the quadrupole (or higher order multipole) rods. This forces the ions through regions of space for which there are significant RF field imperfections. The effect of these imperfections is to eject ions at points not predicted by the normal stability diagram.
  • Radial ejection from a two-dimensional RF quadrupole has the further disadvantage of providing a poor match between the dimensions of the plug of ejected ions and conventional ion detectors.
  • radially ejected ions will exit throughout the length of the device, i.e. with a rectangular cross-section of length corresponding to the rods themselves.
  • Most conventional ion detectors have relatively small circular acceptance apertures (e.g. less than 2 cm 2 ) that are not well-suited for elongated ion sources.
  • Mass selective instability for radial ion ejection of ions from a two-dimensional RF quadrupole has additional problems. Ions ejected radially from such a device will exit with a diverging spacial profile with a characteristic solid angle. Some of the ejected ions will hit the rods and be lost. In addition, radially ejected ions will leave the trapping structure in opposite directions. Multiple ion detectors would be required to collect all of the ions made unstable by this and similar techniques. Ions ejected away from the detector(s) or which encounter one of the electrodes are lost and therefore do not contribute to the measured ion signal. Therefore only a small fraction of trapped ions would normally be collected, despite the very high storage ability of this device.
  • an object of the present invention in one of its aspects to provide an elongated multipole mass spectrometer which has a high injection efficiency and an enlarged trapping volume, and in which ions are ejected along the major axis of the device, thus allowing a good geometric match with commonly used ion detectors.
  • the invention provides a method of operating a mass spectrometer having an elongated rod set, said rod set having an entrance end and an exit end and a longitudinal axis, said method comprising:
  • the invention provides a method of operating a mass spectrometer having a plurality of elongated rod sets in series, each rod set having a longitudinal access, and thereby providing MS/MS, said method comprising:
  • FIG. 1 is a diagrammatic view of a simple mass spectrometer apparatus with which the present invention may be used;
  • FIG. 1 a is an end view of a rod set of FIG. 1 and showing electrical connections to such rod set;
  • FIG. 2 is a diagrammatic view of a modification of a part of the apparatus of FIG. 1;
  • FIG. 3 is a diagrammatic view of a further modification of the apparatus of FIG. 1;
  • FIG. 4 is a diagrammatic view of another modification of the FIG. 1 apparatus
  • FIG. 5 is a graph showing results obtained with the apparatus of FIG. 4;
  • FIG. 6 is a graph showing further results obtained with the FIG. 4 apparatus.
  • FIG. 7 is an end view of rods which can be used as an exit lens
  • FIG. 8 is a plan view of a modified exit lens
  • FIG. 9 is a graph showing still further results obtained with the FIG. 4 apparatus.
  • FIG. 10 is a diagrammatic view of a further modification of the FIG. 1 apparatus
  • FIG. 11 shows a mass spectrum obtained with the FIG. 10 apparatus
  • FIG. 12 shows another mass spectrum obtained with the FIG. 10 apparatus
  • FIG. 13 shows a further mass spectrum obtained with the FIG. 10 apparatus
  • FIG. 14 shows yet another mass spectrum obtained with the FIG. 10 apparatus
  • FIG. 15 a shows a mass spectrum obtained using a modification of the FIG. 10 apparatus
  • FIGS. 15 b and 15 c show enlarged portions of the FIG. 15 a mass spectrum
  • FIGS. 16 a, 16 b, 16 c and 16 d show mass spectra obtained during different modes of operation of a modification of the FIG. 10 apparatus
  • FIGS. 17 a shows a further mass spectrum obtained using a modification of the FIG. 10 apparatus
  • FIGS. 17 b and 17 c show enlarged portions of the FIG. 17 a mass spectrum
  • FIG. 18 shows a further mass spectrum obtained using a modification of the FIG. 10 apparatus
  • FIG. 19 shows a simplified modification of the FIG. 10 apparatus
  • FIG. 20 shows a mass spectrum obtained using the FIG. 19 apparatus
  • FIG. 21 shows two additional mass spectra obtained using the FIG. 19 apparatus
  • FIG. 22 shows a modification of the FIG. 10 apparatus used for MS/MS
  • FIG. 23 shows another modification of the FIG. 10 apparatus used for MS/M.
  • FIG. 24 shows a mass spectrum obtained using the FIG. 23 appartus.
  • FIG. 1 shows a mass analyzer system 10 with which the invention may be used.
  • the system 10 includes a sample source 12 (normally a liquid sample source such as a liquid chromatograph) from which sample is supplied to a conventional ion source 14 .
  • Ion source 14 may be an electrospray, an ion spray, or a corona discharge device, or any other known ion source.
  • An ion spray device of the kind shown in U.S. Pat. No. 4,861,988 issued Aug. 29, 1989 to Cornell Research Foundation Inc. is suitable.
  • Ions from ion source 14 are directed through an aperture 16 in an aperture plate 18 .
  • Plate 18 forms one wall of a gas curtain chamber 19 which is supplied with curtain gas from a curtain gas source 20 .
  • the curtain gas can be argon, nitrogen or other inert gas and is described in the above-mentioned U.S. Pat. No. 4,861,988.
  • the ions then pass through an orifice 22 in an orifice plate 24 into a first stage vacuum chamber 26 evacuated by a pump 28 to a pressure of about 1 Torr.
  • the ions then pass through a skimmer orifice 30 in a skimmer plate 32 and into a main vacuum chamber 34 evacuated to a pressure of about 2 milli-Torr by a pump 36 .
  • the main vacuum chamber 34 contains a set of four linear conventional quadrupole rods 38 .
  • the lens 42 is simply a plate with an aperture 44 therein, allowing passage of ions through aperture 44 to a conventional detector 46 (which may for example be a channel electron multiplier of the kind conventionally used in mass spectrometers).
  • the rods 38 are connected to the main power supply 50 which applies a DC rod offset to all the rods 38 and also applies RF in conventional manner between the rods.
  • the power supply 50 is also connected (by connections not shown) to the ion source 14 , the aperture and orifice plates 18 and 24 , the skimmer plate 32 , and to the exit lens 42 .
  • the ion source 14 may typically be at +5,000 volts, the aperture plate 18 may be at +1,000 volts, the orifice plate 24 may be at +250 volts, and the skimmer plate 32 may be at ground (zero volts).
  • the DC offset applied to rods 38 may be ⁇ 5 volts.
  • the axis of the device, which is the path of ion travel, is indicated at 52 .
  • ions of interest which are admitted into the device from ion source 14 move down a potential well and are allowed to enter the rods 38 .
  • Ions that are stable in the applied main RF field applied to the rods 38 travel the length of the device undergoing numerous momentum dissipating collisions with the background gas.
  • a trapping DC voltage typically ⁇ 2 volts DC, is applied to the exit lens 42 .
  • the exit lens 42 Normally the ion transmission efficiency between the skimmer 32 and the exit lens 42 is very high and may approach 100%. Ions that enter the main vacuum chamber 34 and travel to the exit lens 42 are thermalized due to the numerous collisions with the background gas and have little net velocity in the direction of axis 52 .
  • the ions also experience forces from the main RF field which confines them radially.
  • the RF voltage applied is in the order of about 450 volts (unless it is scanned with mass) and is of a frequency of the order of about 816 kHz. No resolving DC field is applied to rods 38 .
  • ions in region 54 in the vicinity of the exit lens 42 will experience fields that are not entirely quadrupolar, due to the nature of the termination of the main RF and DC fields near the exit lens. Such fields, commonly referred to as fringing fields, will tend to couple the radial and axial degrees of freedom of the trapped ions. This means that there will be axial and radial components of ion motion that are not mutually orthogonal. This is in contrast to the situation at the center of rod structure 38 further removed from the exit lens and fringing fields, where the axial and radial components of ion motion are not coupled or are minimally coupled.
  • ions may be scanned mass dependently axially out of the ion trap constituted by rods 38 , by the application to the exit lens 42 of a low voltage auxiliary AC field of appropriate frequency.
  • the auxiliary AC field may be provided by an auxiliary AC supply 56 , which for illustrative purposes is shown as forming part of the main power supply 50 .
  • the auxiliary AC field is an addition to the trapping DC voltage supplied to exit lens 42 and couples to both the radial and axial secular ion motions.
  • the auxiliary AC field is found to excite the ions sufficiently that they surmount the axial DC potential barrier at the exit lens 42 , so that they can leave axially in the direction of arrow 58 .
  • the deviations in the field in the vicinity of the exit lens 42 lead to the above described coupling of axial and radial ion motions enabling the axial ejection at radial secular frequencies. This is in contrast to the situation existing in a conventional ion trap, where excitation of radial secular motion will generally lead to radial ejection and excitation of axial secular motion will generally lead to axial ejection, unlike the situation described above.
  • ion ejection in a sequential mass dependent manner can be accomplished by scanning the frequency of the low voltage auxiliary AC field.
  • the frequency of the auxiliary AC field matches a radial secular frequency of an ion in the vicinity of the exit lens 42 , the ion will absorb energy and will now be capable of traversing the potential barrier present on the exit lens due to the radial/axial motion coupling.
  • the ion exits axially, it will be detected by detector 46 .
  • other ions upstream of the region 54 in the vicinity of the exit lens are energetically permitted to enter the region 54 and be excited by subsequent AC frequency scans.
  • Ion ejection by scanning the frequency of the auxiliary AC voltage applied to the exit lens is desirable because it does not empty the trapping volume of the entire elongated rod structure 38 .
  • the RF voltage on the rods would be ramped and ions would be ejected from low to high masses along the entire length of the rods when the q value for each ion reaches a value of 0.907. After each mass selective instability scan, time is required to refill the trapping volume before another analysis can be performed.
  • ion ejection will normally only happen in the vicinity of the exit lens because this is where the coupling of the axial and radial ion motions occurs and where the auxiliary AC voltage is applied.
  • the upstream portion 60 of the rods serves to store other ions for subsequent analysis.
  • the time required to refill the volume 54 in the vicinity of the exit lens with ions will always be shorter than the time required to refill the entire trapping volume. Therefore fewer ions will be wasted.
  • the auxiliary AC voltage on end lens 42 can be fixed and the main RF voltage applied to rods 38 can be scanned in amplitude, as will be described. While this does change the trapping conditions, a q of only about 0.2 to 0.3 is needed for axial ejection, while a q of about 0.907 is needed for radial ejection. Therefore, as will be explained, few if any ions are lost to radial ejection if the RF voltage is scanned through an appropriate amplitude range, except possibly for very low mass ions.
  • a further supplementary or auxiliary AC dipole voltage or quadrupole voltage may be applied to rods 38 (as indicated by dotted connection 57 in FIG. 1) and scanned, to produce varying fringing fields which will eject ions axially in the manner described.
  • an auxiliary dipole voltage it is usually applied between an opposed pair of the rods 38 , as indicated in FIG. 1 a.
  • a combination of some or all of the above three approaches can be used to eject ions axially and mass dependently past the DC potential barrier present at the end lens 42 .
  • the device illustrated may be operated in a continuous fashion, in which ions entering the main RF containment field applied to rods 38 are transported by their own residual momentum toward the exit lens 42 and ultimate axial ejection.
  • the ions which have reached the extraction volume in the vicinity of the exit lens have been preconditioned by their numerous collisions with background gas, eliminating the need for an explicit cooling time (and the attendant delay) as is required in most conventional ion traps.
  • ions are being ejected axially from region 54 in the mass dependent manner described.
  • the extraction volume 54 in the vicinity of the exit lens is quite small.
  • the exit lens 42 is normally placed very close to the ends of the rods 38 , e.g. 2 mm from the rod ends (as mentioned).
  • the penetration of the fringing fields from the exit lens 42 into the space between the rods 38 is believed to be very small, typically of the order of between 0.5 mm and 1.0 mm, so the extent of volume or region 54 is exaggerated in FIG. 1, for clarity of illustration.
  • the DC offset applied to all four rods 38 can be modulated at the same frequency as the AC which would have been applied to exit lens 42 .
  • no AC is needed on exit lens 42 since modulating the DC offset is equivalent to applying an AC voltage to the exit lens, in that it creates an AC field in the fringing region.
  • the DC potential barrier is still applied to the exit lens 42 .
  • the amplitude of the modulation of the DC offset will be the same as the amplitude of the AC voltage which otherwise would have been applied to the exit lens 42 , i.e. it is set to optimize the axially ejected ion signal.
  • the RF amplitude is scanned to bring ions sequentially into resonance with the AC field created by the DC modulation, or else the frequency of the modulation is scanned so that again, when such frequency matches a radial secular frequency of an ion in the fringing fields in the vicinity of the exit lens, the ion will absorb energy and be ejected axially for detection.
  • the rod offset would not be modulated until after ions have been injected and trapped within the rods, since the modulation would otherwise interfere with ion injection, so this process would be a batch process. This is in contrast to the continuous process possible when AC is placed on the exit lens, in which case ions can be ejected from the extraction region 54 at the same time as ions are entering region 60 (because the AC field on exit lens 42 does not affect ion injection).
  • the highest efficiency in a continuous mode operation is achieved when the ion ejection rate is faster than the rate at which ions of the desired mass/charge ratio are injected into the rods and travel along them to the exit lens 42 .
  • Ion ejection processes can require some tens of milliseconds.
  • the time required for ions to travel from one end to the other of the rods 38 depends on the lengths of the rods themselves, the initial energy of the ions, and the pressure in the vacuum chamber 34 . In some cases the end-to-end transit time will dominate, but more often the time required to extract the ions from the region in the vicinity of the exit lens 42 will be more important.
  • One method of matching the time required for ions to travel from one end to the other of the rods 38 to the time required to eject the ions is to apply an axial field along the rods 38 .
  • Methods for imposing axial fields of this kind are described in application Ser. No. 08/514,372 filed Aug. 5, 1995 and entitled “Spectrometer with Axial Field” (abandoned parent of application Ser. No. 08/796,582 filed Feb. 6, 1997, which issued as U.S. Pat. No. 5,847,386 on Dec. 8, 1998 to Thomson et al. and which is assigned to the assignee of this application).
  • An applied axial field in the direction of the exit lens 42 will tend to concentrate ions in the region of rods 38 in the vicinity of lens 42 , i.e. in the volume 54 of the device from which the ions are extracted.
  • An applied axial field in the opposite direction will tend to deplete ions from the extraction volume 54 , and may also be desirable in some cases.
  • FIG. 2 One typical electrode geometry which may be used is that depicted in FIG. 2, where primed reference numerals indicate parts corresponding to those of FIG. 1 .
  • the rods 38 ′ are divided into segments 38 - 1 ′ to 38 - 6 ′, with DC offsets V 1 to V 6 which increase in negative value applied to successive segments from 38 - 1 ′ to 38 - 6 ′.
  • This arrangement will provide an axial field as described in said application.
  • Such an arrangement will strongly concentrate ions in the volume near the exit lens 42 ′ and will increase the coupling of axial and radial ion motion.
  • the axial field can be oscillated as described in the above mentioned copending application. Such oscillation may enhance axial ejection of ions trapped in the volume near the exit lens 42 . It can also be used for ion dissociation as described in said application, by oscillating the ion population trapped in the rod structure about their equilibrium positions.
  • the system described can be considered as being an open-ended three-dimensional ion trap, where the open end is an integrated high efficiency ion injection device (supplied by ion source 14 ).
  • the ions in the vicinity of the exit lens 42 experience a three-dimensional trapping field comprised of radial and axial components. Radially the ions are contained by the main RF field applied to the linear rods 38 . Axially the ions are contained at the exit end of the device by the DC potential on the exit lens 42 , and are contained at the entrance end of the device by the potential gradient from the applied axial field (or from the skimmer 32 ).
  • the ions are also to some extent contained in the trapping region or volume 54 by the field created by the build-up of charge density upstream of that region. It will therefore be appreciated that the actual trapping volume 54 is variable along the axial or Z direction.
  • the RF on the rods 38 can be scanned to eject ions mass dependently, while keeping a DC potential barrier on end lens 42 but with no AC field on end lens 42 , no modulation of the DC offset on rods 38 , and no auxiliary AC field on rods 38 .
  • ions in the fringing fields at the downstream ends of rods 38 will leave axially mass dependently and be detected, but most of the ions between rods 38 (those in region 60 ) will leave radially and will be wasted.
  • the wastage can be reduced by segmenting rods 38 as shown in FIG. 2, making the last set of segments 38 - 6 ′ very short (e.g. less than 1 cm), and scanning the RF for ejection only on segments 38 - 6 ′. In this way, a higher proportion of the ions between rods 38 - 6 ′ will be ejected axially mass dependently, for detection.
  • ions from conventional ion sources are of little or no analytical utility.
  • examples of such ions are low mass solvent and cluster ions. These ions simply serve to increase the overall charge density within the ion trap at the expense of optimum performance.
  • Various techniques may be used to eliminate such unwanted ions from the linear ion trap described.
  • One such method is to operate the main RF voltage from power supply 50 at a level where the analytes of interest are stable within the rod structure 38 , but the unwanted ions are unstable. For example if the unwanted ions are in the mass to charge range 10 to 100, and the ions of interest are in the mass to charge range 200 to 1,000, then the main RF voltage can be operated at 214 volts peak to peak.
  • Another method of eliminating unwanted ions from the ion trap is to apply an additional auxiliary AC voltage between opposite pairs of the rods 38 , to resonantly eject the unwanted ions radially out of the rod set.
  • This technique is well known, as mentioned.
  • an auxiliary AC voltage of magnitude equal to about 10% of the level of the main RF voltage and of much lower frequency, is typically applied between opposite pairs of rods.
  • the auxiliary AC voltage of appropriate amplitude and frequency, may be scanned to resonantly eject unwanted ions radially.
  • Another technique for removing unwanted ions is to apply low voltage DC to opposite pairs of rods to make the rods 38 act as a low resolution mass spectrometer.
  • the magnitude of the DC applied will be such that the combination of AC and DC ejects ions only in the low mass range which is not of interest.
  • FIG. 3 illustrates a device which uses these principles.
  • rods 38 ′′ have been divided into three sets of rods 38 a, 38 b and 38 c.
  • Rods 38 a are used to pre-trap ions from the continuous ion source 14 ′′.
  • the rods 38 b are used as an RF rod mirror that can reflect or transmit ions, by changing the DC offset of rods 38 b.
  • the rods 38 c and lens 42 ′′ serve as the open-ended ion trap previously described, for analysis of ions which are injected into rods 38 c through the rods 38 b.
  • the RF and DC voltages on rod set 38 a are set to accept ions within a mass range of interest, while the AC and DC voltages on rod set 38 b are set to reflect ions, so that a population of ions accumulates in rod set 38 a.
  • the operation is exactly as described for rod set 44 in U.S. Pat. No. 5,179,278.
  • the voltages on rod set 38 b are changed to allow passage of the accumulated ions in rod set 38 a through rod set 38 b to rod set 38 c.
  • the RF voltage and DC offset voltage applied to rod set 38 c, and the AC and DC voltages applied to lens 42 ′′, are set such that rod set 38 c operates as an ion trap with axial ejection as described in connection with FIG. 1 .
  • ions are axially ejected in a mass dependent manner from rod set 38 c, as previously described, for detection in detector 46 ′′.
  • An advantage of this configuration is that while ions are being analyzed in rod set 38 c, ions from the continuous source are accumulated for subsequent analysis in the pre-trapping region, i.e. rod set 38 a, and are not lost.
  • U.S. Pat. No. 5,179,278 teaches, proper optimization of the time to collect sufficient ions to fill the analysis region of the device, the time to empty the pre-trap region, and the time to perform analysis can result in very high duty cycles, and thus high overall sensitivity. Of course even in the FIG.
  • ions are collected in region 60 of rods 38 while ions from the extraction region 54 are being ejected, so that some ions can be collected while the ion trap constituted by rods 38 and lens 42 is scanning out ions.
  • FIG. 3 version allows storage of more ions since a larger volume can be used.
  • some DC can conveniently be applied between the pairs of rods of rod set 38 a to eliminate unwanted ions, thus reducing space charge effects in rod set 38 c.
  • 0.1 ⁇ M (micro moles) of reserpine (having mass to charge ratio 609 ) was introduced using the well known ion spray source (not shown) into a conventional mass spectrometer model API 300 produced by Sciex Division of MDS Inc. of Concord, Ontario, Canada.
  • a simplified diagrammatic view of the model API 300 ion optical path is shown in FIG.
  • the gas curtain entrance plate is indicated at 70
  • the gas curtain exit plate is indicated at 72
  • the skimmer plate is shown at 74
  • four sets of rods are indicated as Q 0 , Q 1 , Q 2 and Q 3 , with orifice plates IQ 1 between rod sets Q 0 and Q 1 , IQ 2 between Q 2 and Q 3 , and IQ 3 between Q 2 and Q 3 .
  • the exit lens is indicated at 76 and the detector (a channel electron multiplier) is indicated at 78 .
  • the pressures were 2.2 Torr in chamber 80 , 8 milli-Torr in chamber 82 and 2 ⁇ 10 ⁇ 5 Torr in the remainder of the vacuum chamber 84 .
  • the applied DC voltages were: ground at skimmer plate 80 ; ⁇ 5 volts DC at Q 0 , ⁇ 7 volts DC at IQ 1 , ⁇ 10 volts at Q 1 , ⁇ 20 volts at IQ 2 , ⁇ 7 volts DC at Q 2 , ⁇ 3 volts DC at IQ 3 (which served as the equivalent of the exit lens 42 ); ⁇ 15 volts DC on Q 3 , and 0 volts on the final exit plate 76 . All resolving DC voltages were removed from the quadrupoles.
  • Q 2 which was normally a collision cell, was configured to trap ions and had a cell pressure of 1 ⁇ 10 ⁇ 3 Torr.
  • an auxiliary AC voltage was applied to the exit lens IQ 3 .
  • the auxiliary AC power supply could produce 100 volts peak to peak, at frequency one-ninth that of the main RF frequency, and was synchronized and phase locked to the phase and frequency of the main RF frequency.
  • the main RF frequency was 816 kHz so that of the auxiliary AC voltage was 90.67 kHz.
  • the auxiliary AC voltage was held at 47 volts peak to peak, its frequency was held constant at 90.67 kHz for the experiment, and the RF voltage applied to the Q 2 rods was scanned to obtain a mass spectrum.
  • the q of the device is so low under the conditions described that ions of interest trapped in the rod set Q 2 are not normally ejected (unless the experimenter is interested in extremely low mass ions).
  • FIG. 5 A typical spectrum produced using this technique is shown in FIG. 5, which shows a peak 100 at mass 529.929. Since the spectrum was not mass calibrated, the reported peak of 529.929 was incorrect; the true mass was 609 .
  • the peak width at half height corrected manually for the mass calibration offset, is 0.42 AMU.
  • good resolution was best obtained by scanning slowly, at a scan speed in this example of 78 AMU per second. However with optimization, higher scan rates are expected to be achieved.
  • Q 1 was set to a resolving mode (RF and DC were applied) to allow only transmission of a selected parent ion, namely renin substrate tetra decapeptide (M+3H) 3+ at m/z 587.
  • a pulse of m/z 587 ions was allowed to pass from Q 0 to Q 2 by changing the voltage on lens IQ 1 from 20 volts to ⁇ 7 volts.
  • Ions within Q 2 were excited by setting the RF rod voltage to 897.8 volts peak to peak for 50 ms. This was an excitation step. Ions in Q 2 which were in resonance with the applied AC field (on IQ 3 ) were excited (absorbed power) and, because of their increased kinetic energy, were either ejected from the trap or fragmented due to collisions with the background gas.
  • Peak 108 is the parent ion at m/z 587 (triply charged), while the fragment ions m/z 697 and m/z 720 are shown at 106 , 108 (they have higher m/z ratios because they are only doubly charged).
  • collisional fragmentation can readily be performed in the linear trap described, and the fragment ions can be scanned axially in a mass dependent manner for detection and analysis.
  • the fringing fields in the vicinity of exit lens IQ 3 created by the interaction of the DC barrier field on lens IQ 3 and the RF field on rod set Q 2 , extend only a short distance into rod set Q 2 in the vicinity of the exit lens IQ 3 .
  • the distance of such penetration is not presently known and so far as the applicant is aware, no mathematical model for determining the depth of penetration presently exists.
  • the depth of penetration will however increase as the exit lens IQ 3 is brought closer to the rod ends of Q 2 . Since the rod set Q 2 in FIG. 4 was 200 mm long, therefore when the RF on the rod set Q 3 is ramped, most of the ions are lost to radial ejection and only a relatively small proportion are axially ejected.
  • a 1 ⁇ M solution of reserpine with mass to charge ratio of 609 was introduced into the FIG. 4 instrument.
  • the relevant voltages and pressures were as follows.
  • the pressure in chamber 82 was 8 milli-Torr, and in the remainder of the vacuum chamber 84 was 2 ⁇ 10 ⁇ 5 Torr.
  • the applied DC voltages were: ground at skimmer plate 74 , ⁇ 5 volts DC at Q 0 , ⁇ 10 volts DC at IQ 1 , ⁇ 6.5 volts DC at Q 1 , ⁇ 15 volts DC at IQ 2 , ⁇ 20 volts DC at Q 2 , ⁇ 14 volts DC at IQ 3 , ⁇ 20 volts DC at Q 3 , and 0 volts on the final exit plate 76 . All resolving DC voltages were removed from the quadrupoles.
  • the standard collision cell Q 2 was configured to trap ions and had a pressure of 1 ⁇ 10 ⁇ 3 Torr of helium. As mentioned, no auxiliary AC voltage was applied to the exit lens IQ 3 .
  • FIG. 9 shows the reserpine parent ion at mass 611 , indicated at reference 120 .
  • the instrument was slightly out of calibration, causing the correct mass of 609 to be reported as 611 .
  • the peak width at half height is broad (approximately 4 AMU)
  • the configuration described is easy to optimize, can be scanned rapidly (e.g. up to or more than about 5,000 AMU per second) and provides sufficient resolution for many applications. In addition it is believed that the mass resolution can be enhanced.
  • an auxiliary dipole AC field may be applied to rod set Q 2 , typically across one pair of rods.
  • the dipole field is set at a low level, e.g. 1 volt, to excite ions radially but not enough to eject them, and then the RF field is ramped in amplitude as before to mass dependently eject the ions from the rod set past the barrier field at the end lens.
  • the RF can be fixed and the frequency of the dipole field can be ramped to excite the ions.
  • ions are excited along the length of rod set Q 2 but remain in the rod set, and under the influence of an axial DC field can be drifted toward the exit end of rod set Q 2 , where their radial movement is converted into axial movement by the fringing fields.
  • the axial motion created by this coupling will then be augmented by ramping the RF or dipole fields to mass dependently axially eject the ions past the barrier field of the end lens, for detection.
  • An auxiliary quadrupole field may be used instead of the auxiliary dipole field, with similar results.
  • FIG. 10 shows a mass spectrometer system similar to that of FIG. 4, and in which corresponding reference numerals indicate corresponding parts. Only the differences from FIG. 4 will be described.
  • the FIG. 10 mass spectrometer may be used as a high resolution axial ejection ion trap.
  • rods ST 1 and ST 2 (“ST” means “stubbies”) are provided. These are simply short (typically one inch long) rods which form conventional Brubaker ion lenses. The rods of Q 1 and Q 3 are also short, typically one inch long.
  • a cooling gas source 130 supplies an inert gas, e.g. helium, to the Q 2 rods at about 1 milli-Torr (as described but not shown in connection with FIG. 4 ).
  • an inert gas e.g. helium
  • RF from the main power supply 50 (not shown in FIG. 4) was connected to the Q 3 rods, and RF for Q 2 was capacitively coupled from the Q 3 rods.
  • RF from the power supply 50 (typically at 1 MHz) is connected directly to the Q 2 rods, and RF on rods ST 1 and Q 3 is derived from the Q 2 rods by capacitive coupling through capacitors C 1 , C 2 . This allows the RF amplitude on the Q 2 rods to be made relatively high (higher in amplitude than that on the Q 3 rods).
  • rods Q 0 , ST 1 , Q 1 , ST 2 and Q 3 are all operated in an RF-only mode, i.e. in an “ion pipe” or ion transmission mode.
  • the pressure in ST 1 , Q 1 , ST 2 and Q 3 is typically about 3 ⁇ 10 ⁇ 5 Torr.
  • Lens IQ 3 is made slightly repulsive, e.g. by about 2 volts, with respect to the rod offset on Q 2 (as before).
  • the FIG. 10 arrangement is preferably operated to excite trapped ions in Q 2 with an auxiliary AC frequency (from source 56 ) applied to IQ 3 at twice the secular frequency of the trapped ions (or if desired at three times or more the secular frequency). It is found, for reasons that are not fully understood, that this provides increased resolution.
  • FIG. 11 shows a mass spectrum for reserpine, made using the FIG. 10 arrangement with auxiliary AC applied to IQ 3 at 300 kHz.
  • FIG. 12 shows another reserpine spectrum made from the FIG. 10 arrangement, but with the auxiliary AC frequency applied to IQ 3 now at 889 kHz (again twice the secular frequency at the q in question for the ions being detected).
  • a small amount of resolving DC 2.0 volts was applied to the Q 2 rods from DC source 132 (FIG. 10) in power supply 50 . It will be seen that the resolution m/ ⁇ m was vastly increased and was now 7,000, measured at the 50% level.
  • the three peaks shown in FIG. 12 are the singly charged reserpine isotopes with one amu spacing.
  • the AC amplitude applied to IQ 3 was 16.5 volts (p—p).
  • FIG. 13 shows another spectrum obtained with the FIG. 10 arrangement, operating as described in connection with FIG. 12 .
  • the substance being analyzed was renin substrate.
  • five triply charged peaks from the (M+3H) 3+ ion at m/z 587 (not mass calibrated) were displayed, all very close to each other, with a resolution m/ ⁇ m of about 6500.
  • FIG. 14 shows another spectrum, for renin, using the FIG. 10 arrangement operated as described in connection with FIG. 13, i.e. with the auxiliary AC frequency applied to IQ 3 at 889 kHz.
  • the peaks shown in FIG. 14 represent quadruply charged ions from the (M+4H) 4+ ion at m/z 440 (not mass calibrated), and it will be seen that four peaks are displayed within about 1 m/z unit.
  • the resolution approaches that of a time-of-flight mass spectrometer, but with much less cost and fewer operating difficulties, although the scanning time is slower than that of a time-of-flight instrument.
  • FIG. 15 a shows a mass spectrum for reserpine made using the above-described mode of operation of the FIG. 10 arrangement (pretrapping in Q 0 , no cooling gas added to Q 2 , and a small amount of resolving DC on Q 2 ).
  • FIG. 15 b shows a close-up of mass 364
  • FIG. 15 c shows a close-up of mass 537 , from FIG. 15 a (the spectrum was not calibrated so the masses shown are not the actual masses). It will be seen that the resolution is less than before, although still approximately unit resolution, but the intensity is 10 to 50 times higher than the previous reserpine spectra, as shown for example in FIG. 12 .
  • FIGS. 16 a to FIG. 16 e show clearly the benefits of using resolving DC during the mass dependent axial ion scan from Q 2 .
  • FIG. 16 a shows the spectrum when resolving DC was applied during both fill of and scan from Q 2
  • FIG. 16 b shows the spectrum when resolving DC was applied during the scan only from Q 2 .
  • the sensitivity for the peaks indicated at reference numerals 134 a, 136 b was very high (more than 6 ⁇ 10 5 ion counts per second).
  • FIG. 17 a Another example is shown by the spectrum of FIG. 17 a, for minoxidil, and by the spectra of FIG. 17 b and 17 c which show two peaks 136 , 138 from the FIG. 17 a spectrum.
  • the FIGS. 17 a, 17 b and 17 c spectra were made using the FIG. 10 apparatus in the mode just described, with no cooling gas added, and with pre-trapping in Q 0 , and with added resolving DC. Because the mass scale has not been calibrated, the feature reported at 192.221 amu is actually the minoxidil (M+H) + ion. Again, it will be seen that the sensitivity was very high (more than 6 ⁇ 10 5 counts per second for the smaller peak 138 ); the resolution was good (unit resolution or better), and the scan rate was 3350 amu per second, which was considered to be very high.
  • FIG. 18 shows a mass spectra for renin substrate, again obtained using the FIG. 10 arrangement as just described, with no cooling gas in the Q 2 rods, pre-trapping in the Q 0 rods, and resolving DC applied to the Q 2 rods.
  • the resolution was good (although not as good as in the FIG. 13 spectrum), but the sensitivity was more than 5 ⁇ 10 6 counts per second for the (M+3H) 3+ ion, as compared with only about 2 ⁇ 10 4 counts per second for the FIG. 13 spectrum.
  • FIG. 10 arrangement operated without cooling gas as described, can be simplified as shown in FIG. 19, in which corresponding reference remarks indicate parts corresponding to those of FIG. 10 .
  • Q 2 , ST 2 and Q 3 have been eliminated.
  • Q 0 is used to accumulate ions during scanning, as before, ions are now trapped in Q 1 (instead of in Q 2 ), and are then scanned mass dependently axially out of Q 1 past repulsive barrier IQ 2 .
  • the auxiliary AC may be applied from source 56 either to barrier IQ 2 , or to the Q 1 rods, depending on the mode of operation desired (the second arrangement is shown).
  • the ions axially scanned from Q 1 are focussed by exit lens 76 into detector 78 for recording of the ion count.
  • Resolving DC is applied to the Q 1 rods as before, but since the Q 1 rods are only one inch long, as compared with the 5 inch rods used in FIG. 10, and since their dimensional tolerances need not be high, they are quite inexpensive. Nevertheless, essentially the same sensitivity and resolution can be achieved with the FIG. 19 arrangement as with the FIG. 10 arrangement.
  • FIG. 20 shows a mass spectrum obtained for reserpine, using the FIG. 19 arrangement and with 1.0 MHz RF, and 3.0 volts resolving DC applied to the Q 1 rods.
  • FIG. 21 which shows two spectra for reserpine made using the FIG. 19 arrangement, demonstrates that space charge effects did not cause difficulty even with the very short one inch trapping rods of Q 1 .
  • peak 150 identifies mass 609 for 100 pg/ ⁇ L reserpine
  • peak 152 identifies the corresponding peak (mass 609 ) for 10 nanograms/ ⁇ L reserpine.
  • the peak 152 at the higher concentration would have moved and broadened, but this has not occurred despite the fact that the ion detection electronics have been saturated by the response from the 10 nanogram/ ⁇ L solution.
  • An advantage of the methods described is that a conventional commercially viable mass spectrometer, such as the model API 300 illustrated in simplified form in FIG. 4, can be operated using at least some of the methods. This can produce 10 times the signal intensity and at least the same resolution, simply by changing the previously used operating procedure.
  • Q 0 since in a standard model API 300 mass spectrometer Q 0 obtains its RF from Q 1 and therefore is forced to scan when Q 1 scans, Q 0 can be supplied with separate RF so it can accumulate and pre-trap ions while Q 1 is scanning ions out axially in a mass dependent manner.
  • FIG. 10 A modification of the FIG. 10 arrangement, shown in FIG. 22, can also be used to perform MS/MS.
  • ions are pre-trapped in Q 0 by a suitably repulsive voltage on lens IQ 1 , and are then at appropriate times pulsed into Q 1 , which acts as a trap (without added cooling gas), with a repulsive voltage on lens IQ 2 to trap ions in Q 1 .
  • RF is applied directly to Q 1 from power source 50 for this purpose, together with a small amount of resolving DC for the purpose described.
  • Ions (parent ions) trapped in Q 1 are mass dependently scanned axially out of Q 1 into Q 2 , which contains collision gas (from a source not shown) to dissociate the parent ions or fragment them, to produce fragment ions.
  • the ions in Q 2 are permitted to leave Q 2 under the influence of the rod offset voltages and enter Q 3 , where they are trapped by a repulsive DC voltage applied to one of the lenses 76 .
  • the mixture of trapped ions in rods Q 3 is then axially scanned out mass selectively for detection by detector 78 and recording of the ion count.
  • Separate auxiliary AC voltages may be applied to the Q 1 and Q 3 rods, from power supplies 50 a, 50 b, either as dipole or quadrupole voltages, as described and as shown in FIG. 22 .
  • separate auxiliary AC voltages may be applied to lenses IQ 2 and 76 for the purposes described.
  • the RF frequency is an integral multiple of the auxiliary AC frequency, the AC frequency can be synchronized and phase locked to the RF frequency. Note that the AC and RF frequencies are fixed while the RF amplitude is scanned.
  • the mixture of fragment and parent ions in Q 2 can be trapped there by a suitably repulsive voltage on lens IQ 3 .
  • the trapped mixture can then be scanned axially mass dependently out of Q 2 , through ST 2 and Q 3 (which now are in RF-only mode and act as an ion pipe) into the detector 78 .
  • the resolution will be higher than previously described, due to the gas in the trapping rods Q 2 .
  • Ions are pre-trapped in Q 0 by a suitable repulsive voltage on lens IQ 1 , and are then at appropriate times pulsed through Q 1 .
  • Q 1 is a standard RF/DC quadrupole mass analyzer, with its own power supply 50 a to supply RF and resolving DC thereto, and is not operated as an ion trap.
  • the RF and DC voltages applied to Q 1 are chosen to transmit the parent ions of interest into Q 2 , with other ions being lost radially in the usual and well understood manner.
  • Q 2 contains collision gas from source 200 to dissociate the parent ions or fragment them, to produce fragment ions.
  • the fragment ions and residual parent ions are trapped in Q 2 by a repulsive DC voltage applied to lens IQ 3 , in the manner previously described.
  • RF, a small amount of resolving DC, and auxiliary AC are applied to the Q 2 rods as previously described.
  • the ions trapped in Q 2 are then scanned axially out of Q 2 mass selectively toward the detector 78 , yielding an MS/MS mass spectrum.
  • the mass isolation step of the parent ion is very simply and rapid. It simply involves passing the ions extracted from Q 0 through the conventional resolving mass spectrometer Q 1 . This eliminates the rather long times (milliseconds) involved when parent ions are isolated within an ion trap. Furthermore, the capability to perform conventional RF/DC scans with Q 1 remains, which simplifies the operation while retaining the advantages of ion trapping and increased duty cycles. It is understood that the first stage of mass spectrometry (here done with Q 1 ) need not be accomplished using a quadrupole mass filter.
  • Any mass filter device such as a time-of-flight mass spectrometer, an RF-only quadrupole, or a single or double focusing sector mass spectrometer would be effective in the parent ion isolation step.
  • fragment ions scanned from Q 2 can be further fragmented by the method described, yielding further stages of MS.
  • FIG. 24 shows an MS/MS spectrum obtained with the apparatus described in FIG. 23 .
  • a 100pg/ ⁇ L solution of minoxidil (molecular weight 209) is introduced into the ion source 14 .
  • Q 1 was set to transmit a 3 amu wide window centered at m/z 209 into the pressurized Q 2 which acts as an ion trap.
  • An auxiliary AC voltage at a frequency of 500 kHz phase locked to the 1 MHz drive RF was applied to the Q 2 rods in a quadrupole fashion.
  • the AC voltage was 6 V(p—p). 1 V of resolving DC was also applied to the Q 2 rods.
  • the collision gas supplied from source 200 was nitrogen at a pressure of approximately 3 ⁇ 10 ⁇ 4 Torr, approximately 10 to 50 times less than that currently used in commercial triple quadrupole mass spectrometers such as that sold by MDS Inc. under the name API 300.
  • the spectrum in FIG. 24 shows all of the expected minoxidil fragment ions at high sensitivity and peak width of ⁇ 0.15 amu measured at half height. This resolution is very good.
  • exit lens 42 has been described as a plate with an aperture, other configurations of exit lenses may be used, for example a short RF-only rod array such as that indicated at 102 in FIG. 7 and having A and B poles 102 a, 102 b.
  • the rod offsets of the A and B poles 102 a, 102 b may then be resonated at the resonance frequency of the ion to be ejected, producing axial ejection as was achieved by the auxiliary AC field applied to exit lens 42 .
  • the end lens 110 may be a segmented plate having wedge-shaped segments 110 - 1 , 110 - 2 , 110 - 3 , 110 - 4 and an aperture 112 . This allows different fields to be applied to each segment, to optimize the results, while still limiting the quantity of gas which can leave the part of the vacuum chamber upstream of lens 110 .

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US09/087,909 US6177668B1 (en) 1996-06-06 1998-06-01 Axial ejection in a multipole mass spectrometer
CA002239399A CA2239399C (fr) 1998-06-01 1998-06-02 Ejection axiale dans un spectrometre de masse multipolaire
PCT/CA1999/000515 WO1999063578A2 (fr) 1998-06-01 1999-06-01 Ejection axiale dans un spectrometre de masse a plusieurs poles
AU40276/99A AU4027699A (en) 1998-06-01 1999-06-01 Axial ejection in a multipole mass spectrometer
JP2000552706A JP2002517888A (ja) 1998-06-01 1999-06-01 多重極質量分析計における軸方向射出
AT99923351T ATE273563T1 (de) 1998-06-01 1999-06-01 Axialejektion aus einem mutipolmassenspektrometer
EP99923351A EP1084507B1 (fr) 1998-06-01 1999-06-01 Ejection axiale dans un spectrometre de masse a plusieurs poles
DE69919353T DE69919353T2 (de) 1998-06-01 1999-06-01 Axialejektion aus einem mutipolmassenspektrometer

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Cited By (128)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002009144A2 (fr) * 2000-07-21 2002-01-31 Mds Inc., Doing Business As Mds Sciex Spectrometre de masse a trois quadripoles pouvant realiser des operations d'analyse de masse multiples
WO2002071439A2 (fr) * 2001-03-02 2002-09-12 Mds Inc., Doing Business As Mds Sciex Controle de la reaction temporelle de spectometres de masse en spectrometrie de masse
WO2002097412A2 (fr) * 2001-05-25 2002-12-05 Mds Inc., Doing Business As Mds Sciex Procede de spectrometrie de masse pour accentuer la separation d'ions possedant des charges differentes
US6504148B1 (en) * 1999-05-27 2003-01-07 Mds Inc. Quadrupole mass spectrometer with ION traps to enhance sensitivity
US6525314B1 (en) * 1999-09-15 2003-02-25 Waters Investments Limited Compact high-performance mass spectrometer
WO2003019614A2 (fr) * 2001-08-30 2003-03-06 Mds Inc., Doing Busness As Mds Sciex Procede de reduction de la charge d'espace dans un spectrometre de masse lineaire de piegeage d'ions
US6570153B1 (en) * 2000-10-18 2003-05-27 Agilent Technologies, Inc. Tandem mass spectrometry using a single quadrupole mass analyzer
WO2003060945A1 (fr) * 2002-01-09 2003-07-24 Trustees Of Boston University Appareil et procede permettant d'effectuer une spectrometrie de masse par resonance cyclotron des ions
WO2003088306A1 (fr) * 2002-04-05 2003-10-23 Mds Inc., Doing Business As Mds Sciex Fragmentation des ions par excitation resonante dans un piege a ions basse pression
US20030197844A1 (en) * 2002-02-01 2003-10-23 Mertens Jeroen Johannes Sophia Maria Lithographic apparatus and device manufacturing method
WO2003088305A1 (fr) * 2002-04-05 2003-10-23 Mds Inc., Doing Business As Mds Sciex Fragmentation d'ions par excitation resonante dans un champ multipole de rang superieur, et piege d'ions basse pression
WO2003094197A1 (fr) * 2002-04-29 2003-11-13 Mds Inc., Doing Business As Mds Sciex Couverture pour fragmentation d'ions importante en spectrometrie de masse (ms) par variation de l'energie de collision
WO2003102517A2 (fr) * 2002-05-30 2003-12-11 Mds Inc., Doing Business As Mds Sciex Procedes et appareils permettant de reduire les artefacts dans les spectrometres de masse
WO2003103009A1 (fr) * 2002-05-30 2003-12-11 Mds Inc., Doing Business As Mds Sciex Resolution d'ejection axiale amelioree pour spectrometres de masse multipolaires
US20040021072A1 (en) * 2002-08-05 2004-02-05 Mikhail Soudakov Geometry for generating a two-dimensional substantially quadrupole field
US20040108456A1 (en) * 2002-08-05 2004-06-10 University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
US20040159785A1 (en) * 2001-11-07 2004-08-19 Yoshiaki Kato Mass analyzing method using an ion trap type mass spectrometer
US20040222369A1 (en) * 2003-03-19 2004-11-11 Thermo Finnigan Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
US20040238734A1 (en) * 2003-05-30 2004-12-02 Hager James W. System and method for modifying the fringing fields of a radio frequency multipole
US20040245455A1 (en) * 2003-03-21 2004-12-09 Bruce Reinhold Mass spectroscopy system
US20050006580A1 (en) * 2000-07-21 2005-01-13 Hager James W. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US20050067564A1 (en) * 2003-09-25 2005-03-31 The University Of British Columbia Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components
US20050098719A1 (en) * 2000-12-14 2005-05-12 Bruce Thomson Apparatus and method for msnth in a tandem mass spectrometer system
US20050109931A1 (en) * 2003-10-20 2005-05-26 Schultz J. A. Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
US20050127290A1 (en) * 2003-12-16 2005-06-16 Hitachi High-Technologies Corporation Mass Spectrometer
WO2005106922A1 (fr) * 2004-05-05 2005-11-10 Mds Inc. , Doing Business As Mds Sciex Procede et appareil d'ejection axiale a selectivite de masse
US20050258353A1 (en) * 2004-05-20 2005-11-24 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
US20050258354A1 (en) * 2004-05-24 2005-11-24 Hitachi High-Technologies Corporation Mass spectrometer
US20050263697A1 (en) * 2004-05-20 2005-12-01 Hydrogenics Corporation Method for providing barrier fields at the entrance and exit end of a mass spectrometer
US20050263696A1 (en) * 2004-05-26 2005-12-01 Wells Gregory J Linear ion trap apparatus and method utilizing an asymmetrical trapping field
US20050269504A1 (en) * 2004-06-08 2005-12-08 Hitachi High-Technologies Corporation Mass spectrometer
US20060071665A1 (en) * 2002-06-07 2006-04-06 Thomas Blake System and method for preparative mass spectrometry
US20060079002A1 (en) * 2002-06-07 2006-04-13 Bogdan Gologan System and method for landing of ions on a gas/liquid interface
WO2006054101A2 (fr) * 2004-11-18 2006-05-26 Micromass Uk Limited Spectrometre de masse
US20060138317A1 (en) * 2003-06-06 2006-06-29 Schultz J A Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
US20060219933A1 (en) * 2005-03-15 2006-10-05 Mingda Wang Multipole ion mass filter having rotating electric field
US20060219896A1 (en) * 2005-03-18 2006-10-05 Hitachi High-Technologies Corporation Mass spectrometer and mass analysis method
US20060289744A1 (en) * 2005-05-18 2006-12-28 Jolliffe Charles L Method and apparatus for mass selective axial transport using quadrupolar DC
GB2429579A (en) * 2005-08-22 2007-02-28 Bruker Daltonik Gmbh A tandem mass spectrometer
US20070045533A1 (en) * 2005-08-31 2007-03-01 Krutchinsky Andrew N Novel linear ion trap for mass spectrometry
WO2007052372A1 (fr) 2005-10-31 2007-05-10 Hitachi, Ltd. Spectromètre de masse et procédé de spectrométrie de masse
WO2006075189A3 (fr) * 2005-01-17 2007-05-18 Micromass Ltd Spectrometre de masse
US20070114384A1 (en) * 2005-05-11 2007-05-24 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
US20070120053A1 (en) * 2005-11-30 2007-05-31 Alexander Loboda Method and apparatus for mass selective axial transport using pulsed axial field
US20070158545A1 (en) * 2005-12-22 2007-07-12 Leco Corporation Linear ion trap with an imbalanced radio frequency field
US20070158546A1 (en) * 2006-01-11 2007-07-12 Lock Christopher M Fragmenting ions in mass spectrometry
US20070158550A1 (en) * 2006-01-10 2007-07-12 Varian, Inc. Increasing ion kinetic energy along axis of linear ion processing devices
WO2007010272A3 (fr) * 2005-07-21 2007-12-06 Micromass Ltd Spectrometre de masse
US7312444B1 (en) 2005-05-24 2007-12-25 Chem - Space Associates, Inc. Atmosperic pressure quadrupole analyzer
US20080067340A1 (en) * 2005-06-03 2008-03-20 Nicholas Bloomfield System and Method for Data Collection in Recursive Mass Analysis
WO2008037058A1 (fr) 2006-09-28 2008-04-03 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Procédé d'éjection axiale et fragmentation par piége d'ions à l'aide d'électrodes auxiliaires dans un spectromètre de masse multipolaire
US20080116372A1 (en) * 2006-11-22 2008-05-22 Yuichiro Hashimoto Mass spectrometer and method of mass spectrometry
US20080121795A1 (en) * 2006-11-24 2008-05-29 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US20080142705A1 (en) * 2006-12-13 2008-06-19 Schwartz Jae C Differential-pressure dual ion trap mass analyzer and methods of use thereof
US20080142706A1 (en) * 2006-12-18 2008-06-19 Karsten Michelmann Linear rf ion trap with high mass resolution
US20080272295A1 (en) * 2007-05-02 2008-11-06 Michael Mircea-Guna Multipole mass filter having improved mass resolution
US20090008543A1 (en) * 2007-06-11 2009-01-08 Dana-Farber Cancer Institute, Inc. Mass spectroscopy system and method including an excitation gate
US20090014645A1 (en) * 2007-07-09 2009-01-15 Igor Chernushevich Confining ions with fast-oscillating electric fields
US20090114810A1 (en) * 2005-11-25 2009-05-07 Micromass Uk Limited Mass spectrometer
US20090127481A1 (en) * 2007-11-02 2009-05-21 Richard Syms Mounting arrangement
US20090146054A1 (en) * 2007-12-10 2009-06-11 Spacehab, Inc. End cap voltage control of ion traps
US20090166534A1 (en) * 2007-12-28 2009-07-02 Mds Analytical Technologies, A Business Unit Of Mds Inc. Method and apparatus for reducing space charge in an ion trap
US20090230302A1 (en) * 2004-03-12 2009-09-17 University Of Virginia Patent Foundation Electron Transfer Dissociation for Biopolymer Sequence Analysis
US20090294657A1 (en) * 2008-05-27 2009-12-03 Spacehab, Inc. Driving a mass spectrometer ion trap or mass filter
US20090294661A1 (en) * 2008-05-28 2009-12-03 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US20090302209A1 (en) * 2006-04-28 2009-12-10 Micromass Uk Limited Mass spectrometer
US20090302216A1 (en) * 2008-06-09 2009-12-10 Mds Analytical Technologies, A Buisness Unit Of Mds Inc, Doing Buisness Through Its Sciex Division Multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field
US20090302215A1 (en) * 2008-06-09 2009-12-10 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Method of operating tandem ion traps
US7633060B2 (en) 2007-04-24 2009-12-15 Thermo Finnigan Llc Separation and axial ejection of ions based on m/z ratio
DE112008000583T5 (de) 2007-03-02 2010-01-14 Thermo Finnigan Llc, San Jose Segmentierte Ionenfallenmassenspektrometrie
WO2009087402A3 (fr) * 2008-01-11 2010-02-18 Micromass Uk Limited Piège à ions linéaire
US20100078551A1 (en) * 2008-10-01 2010-04-01 MDS Analytical Technologies, a business unit of MDS, Inc. Method, System And Apparatus For Multiplexing Ions In MSn Mass Spectrometry Analysis
US20100090101A1 (en) * 2004-06-04 2010-04-15 Ionwerks, Inc. Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
GB2455377B (en) * 2007-07-12 2010-04-28 Micromass Ltd Mass spectrometer
US20100108879A1 (en) * 2006-11-15 2010-05-06 Micromass Uk Limited Mass Spectrometer
EP2186109A2 (fr) * 2007-09-04 2010-05-19 Micromass UK Limited Dispositif tandem de piégeage d'ions
US20100171035A1 (en) * 2007-12-20 2010-07-08 Shimadzu Corporation Mass spectrometer
US20100276583A1 (en) * 2009-04-29 2010-11-04 Senko Michael W Multi-Resolution Scan
US20100276586A1 (en) * 2009-04-30 2010-11-04 Senko Michael W Intrascan data dependency
US7858926B1 (en) 2002-05-31 2010-12-28 Perkinelmer Health Sciences, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions
WO2011003186A1 (fr) 2009-07-06 2011-01-13 Dh Technologies Development Pte. Ltd. Procédés et systèmes destinés à procurer un champ sensiblement quadripôle avec un composant d'ordre supérieur
US7872228B1 (en) 2008-06-18 2011-01-18 Bruker Daltonics, Inc. Stacked well ion trap
US7947948B2 (en) 2008-09-05 2011-05-24 Thermo Funnigan LLC Two-dimensional radial-ejection ion trap operable as a quadrupole mass filter
DE112008003955T5 (de) 2008-07-28 2011-06-01 Leco Corp., St. Joseph Verfahren und Vorrichtung zur Manipulation von Ionen unter Verwendung eines Netzes in einem Radiofrequenzfeld
US20110133075A1 (en) * 2008-08-29 2011-06-09 Hitachi High-Technologies Corporation Mass spectrometer
US20110204221A1 (en) * 2008-10-14 2011-08-25 Hiroyuki Satake Mass spectrometer and method of mass spectrometry
WO2011089419A3 (fr) * 2010-01-19 2011-09-15 Micromass Uk Limited Éjection, sélective sur base du rapport masse/charge, à partir d'un guide d'ions auquel est appliquée une tension radiofréquence d'appoint
US20110233396A1 (en) * 2005-01-10 2011-09-29 Micromass Uk Limited Mass Spectrometer
WO2011073794A3 (fr) * 2009-12-18 2011-11-03 Dh Technologies Development Pte. Ltd. Procédé de traitement d'ions
EP2421023A1 (fr) 2002-05-31 2012-02-22 PerkinElmer Health Sciences, Inc. Spectrometrie de masse a multiples guides ioniques rf segmentes en plusieurs zones de pression
EP2498272A1 (fr) 2011-03-04 2012-09-12 Hitachi High-Technologies Corporation Procédé spectrométrique de masse et spectromètre de masse
US20120248306A1 (en) * 2011-04-01 2012-10-04 Hitachi, Ltd. Ion Detecting Device
GB2491678A (en) * 2011-03-07 2012-12-12 Micromass Ltd An ion guide comprising a 3D array of electrodes
US8368011B2 (en) 2009-04-17 2013-02-05 Hitachi, Ltd. Ion detector
WO2013067090A2 (fr) 2011-11-02 2013-05-10 Thermo Finnigan Llc Dispositif d'interface ionique possédant de multiples cellules de confinement et ses procédés d'utilisation
WO2013098614A1 (fr) 2011-12-29 2013-07-04 Dh Technologies Development Pte. Ltd. Procédé d'extraction d'ions pour la spectrométrie de masse à piégeage d'ions
CN103460332A (zh) * 2011-01-31 2013-12-18 株式会社岛津制作所 三级四极型质谱仪
US8674299B2 (en) 2009-02-19 2014-03-18 Hitachi High-Technologies Corporation Mass spectrometric system
US20140117219A1 (en) * 2011-03-07 2014-05-01 Micromass Uk Limited Dynamic Resolution Correction of Quadrupole Mass Analyser
US8742333B2 (en) 2010-09-17 2014-06-03 Wisconsin Alumni Research Foundation Method to perform beam-type collision-activated dissociation in the pre-existing ion injection pathway of a mass spectrometer
US8822916B2 (en) 2008-06-09 2014-09-02 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
US8835834B2 (en) 2009-07-15 2014-09-16 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US8835841B2 (en) 2009-12-28 2014-09-16 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry
WO2014197341A3 (fr) * 2013-06-02 2015-03-19 Perkinelmer Health Sciences, Inc. Cellules de collision et procédés utilisant ces cellules
US20150097115A1 (en) * 2013-10-04 2015-04-09 Thermo Finnigan Llc Method and apparatus for a combined linear ion trap and quadrupole mass filter
EP2732458A4 (fr) * 2011-07-11 2015-05-20 Dh Technologies Dev Pte Ltd Procédé pour réguler la charge d'espace dans un spectromètre de masse
US20150162174A1 (en) * 2013-11-26 2015-06-11 Perkinelmer Health Sciences, Inc. Detectors and methods of using them
US20150179419A1 (en) * 2013-12-23 2015-06-25 Thermo Finnigan Llc Method for Mass Spectrometer with Enhanced Sensitivity to Product Ions
WO2015097504A1 (fr) 2013-12-23 2015-07-02 Dh Technologies Development Pte. Ltd. Spectromètre de masse
US9147563B2 (en) 2011-12-22 2015-09-29 Thermo Fisher Scientific (Bremen) Gmbh Collision cell for tandem mass spectrometry
WO2016020789A1 (fr) 2014-08-05 2016-02-11 Dh Technologies Development Pte. Ltd. Extraction de passe-bande d'un dispositif de piégeage d'ions et amélioration de sensibilité de spectromètre de masse à temps de vol
US9355832B2 (en) 2013-05-30 2016-05-31 Perkinelmer Health Sciences, Inc. Reflectrons and methods of producing and using them
US9355831B2 (en) 2013-06-03 2016-05-31 Perkinelmer Health Sciences, Inc. Ion guide or filters with selected gas conductance
US9384954B2 (en) 2013-05-31 2016-07-05 Perkinelmer Health Sciences, Inc. Time of flight tubes and methods of using them
EP2539915A4 (fr) * 2010-02-26 2016-08-10 Perkinelmer Health Sci Inc Spectrométrie de masse à plasma à suppression ionique
WO2017055978A1 (fr) 2015-10-01 2017-04-06 Dh Technologies Development Pte. Ltd. Piège à ions linéaire à éjection axiale sélective de masse
WO2017089991A1 (fr) * 2015-11-27 2017-06-01 Q-Tek D.O.O. Procédé d'analyse de traces ciblée avec miroir ionique rf
US9748083B2 (en) 2011-12-22 2017-08-29 Thermo Fisher Scientific (Bremen) Gmbh Method of tandem mass spectrometry
US20190234901A1 (en) * 2013-12-02 2019-08-01 Micromass Uk Limited Method of charge state selection
CN110291613A (zh) * 2017-02-01 2019-09-27 Dh科技发展私人贸易有限公司 傅里叶变换质谱仪
EP2758982B1 (fr) * 2011-09-22 2020-01-01 Purdue Research Foundation Spectromètre de masse quadripolaire linéaire double à piège ionique et à pompage différentiel
WO2020049487A1 (fr) * 2018-09-07 2020-03-12 Dh Technologies Development Pte. Ltd. Procédé de chargement d'ions par piège à ions rf
US10665441B2 (en) * 2018-08-08 2020-05-26 Thermo Finnigan Llc Methods and apparatus for improved tandem mass spectrometry duty cycle
US10727041B2 (en) 2016-01-28 2020-07-28 Purdue Research Foundation Systems and methods for separating ions at about or above atmospheric pressure
WO2020157655A1 (fr) 2019-02-01 2020-08-06 Dh Technologies Development Pte. Ltd. Commande de gain automatique pour remplissage optimal de piège à ions
WO2020157656A1 (fr) * 2019-02-01 2020-08-06 Dh Technologies Development Pte. Ltd. Spectrométrie de masse à piège à ions linéaire à transformée de fourier à verrouillage de phase
US10937638B2 (en) * 2017-07-27 2021-03-02 Purdue Research Foundation Systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap
US11443933B1 (en) 2020-10-30 2022-09-13 Agilent Technologies, Inc. Inductively coupled plasma mass spectrometry (ICP-MS) with ion trapping

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9820210D0 (en) 1998-09-16 1998-11-11 Vg Elemental Limited Means for removing unwanted ions from an ion transport system and mass spectrometer
GB0210930D0 (en) 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
DE10236346A1 (de) 2002-08-08 2004-02-19 Bruker Daltonik Gmbh Nichtlinearer Resonanzauswurf aus linearen Ionenfallen
CA2565455C (fr) * 2004-05-05 2013-11-19 Mds Inc. Doing Business Through Its Mds Sciex Division Guide d'ions pour spectrometre de masse
TWI484529B (zh) * 2006-11-13 2015-05-11 Mks Instr Inc 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備
KR101570652B1 (ko) * 2009-05-06 2015-11-23 엠케이에스 인스트루먼츠, 인코포레이티드 정전 이온 트랩
EP2502258B1 (fr) * 2009-11-16 2021-09-01 DH Technologies Development Pte. Ltd. Appareil et procédé de couplage de signaux rf et ca pour l'alimentation d'un multipôle d'un spectromètre de masse
CN103151236A (zh) * 2012-12-29 2013-06-12 聚光科技(杭州)股份有限公司 离子碰撞反应池及离子传输方法
DE102021127556B4 (de) * 2021-10-22 2024-09-12 Universität zu Köln, Körperschaft des öffentlichen Rechts Verfahren zum Erfassen eines Spektrums einer Ionenspezies, zum Entmischen einer Mischung mehrerer Ionenspezies und zum Bestimmen eines Mischungsverhältnisses der Mischung

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3065640A (en) 1959-08-27 1962-11-27 Thompson Ramo Wooldridge Inc Containment device
US3371204A (en) 1966-09-07 1968-02-27 Bell & Howell Co Mass filter with one or more rod electrodes separated into a plurality of insulated segments
US4090075A (en) 1970-03-17 1978-05-16 Uwe Hans Werner Brinkmann Method and apparatus for mass analysis by multi-pole mass filters
US4328420A (en) 1980-07-28 1982-05-04 French John B Tandem mass spectrometer with open structure AC-only rod sections, and method of operating a mass spectrometer system
US4731533A (en) 1986-10-15 1988-03-15 Vestec Corporation Method and apparatus for dissociating ions by electron impact
US4963736A (en) 1988-12-12 1990-10-16 Mds Health Group Limited Mass spectrometer and method and improved ion transmission
US5089703A (en) 1991-05-16 1992-02-18 Finnigan Corporation Method and apparatus for mass analysis in a multipole mass spectrometer
USRE34000E (en) 1985-05-24 1992-07-21 Finnigan Corporation Method of operating ion trap detector in MS/MS mode
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5381007A (en) 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5479012A (en) 1992-05-29 1995-12-26 Varian Associates, Inc. Method of space charge control in an ion trap mass spectrometer
US5521382A (en) * 1994-02-24 1996-05-28 Shimadzu Corporation MS/MS type mass analyzer
US5598001A (en) 1996-01-30 1997-01-28 Hewlett-Packard Company Mass selective multinotch filter with orthogonal excision fields
US5679950A (en) 1995-04-03 1997-10-21 Hitachi, Ltd. Ion trapping mass spectrometry method and apparatus therefor
WO1997047025A1 (fr) 1996-06-06 1997-12-11 Mds, Inc. Spectrometre de masse multipolaire a ejection axiale
US5847386A (en) * 1995-08-11 1998-12-08 Mds Inc. Spectrometer with axial field
EP0738000B1 (fr) 1995-03-18 2000-02-16 Bruker Daltonik GmbH Stockage intermédiaire d'ions pour des analyses spectrométriques

Patent Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3065640A (en) 1959-08-27 1962-11-27 Thompson Ramo Wooldridge Inc Containment device
US3371204A (en) 1966-09-07 1968-02-27 Bell & Howell Co Mass filter with one or more rod electrodes separated into a plurality of insulated segments
US4090075A (en) 1970-03-17 1978-05-16 Uwe Hans Werner Brinkmann Method and apparatus for mass analysis by multi-pole mass filters
US4328420A (en) 1980-07-28 1982-05-04 French John B Tandem mass spectrometer with open structure AC-only rod sections, and method of operating a mass spectrometer system
USRE34000E (en) 1985-05-24 1992-07-21 Finnigan Corporation Method of operating ion trap detector in MS/MS mode
US4731533A (en) 1986-10-15 1988-03-15 Vestec Corporation Method and apparatus for dissociating ions by electron impact
US4963736B1 (en) 1988-12-12 1999-05-25 Mds Inc Mass spectrometer and method and improved ion transmission
US4963736A (en) 1988-12-12 1990-10-16 Mds Health Group Limited Mass spectrometer and method and improved ion transmission
US5381007A (en) 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5089703A (en) 1991-05-16 1992-02-18 Finnigan Corporation Method and apparatus for mass analysis in a multipole mass spectrometer
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5479012A (en) 1992-05-29 1995-12-26 Varian Associates, Inc. Method of space charge control in an ion trap mass spectrometer
US5521382A (en) * 1994-02-24 1996-05-28 Shimadzu Corporation MS/MS type mass analyzer
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
EP0738000B1 (fr) 1995-03-18 2000-02-16 Bruker Daltonik GmbH Stockage intermédiaire d'ions pour des analyses spectrométriques
US5679950A (en) 1995-04-03 1997-10-21 Hitachi, Ltd. Ion trapping mass spectrometry method and apparatus therefor
US5847386A (en) * 1995-08-11 1998-12-08 Mds Inc. Spectrometer with axial field
US5598001A (en) 1996-01-30 1997-01-28 Hewlett-Packard Company Mass selective multinotch filter with orthogonal excision fields
WO1997047025A1 (fr) 1996-06-06 1997-12-11 Mds, Inc. Spectrometre de masse multipolaire a ejection axiale

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
P.H. Dawson-Performance Characteristics of an rf-only Quadrupole, published in the International Journal of Mass Spectrometry, vol. 67, p. 267-276 1985.
P.H. Dawson—Performance Characteristics of an rf-only Quadrupole, published in the International Journal of Mass Spectrometry, vol. 67, p. 267-276 1985.

Cited By (336)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6504148B1 (en) * 1999-05-27 2003-01-07 Mds Inc. Quadrupole mass spectrometer with ION traps to enhance sensitivity
AU780291B2 (en) * 1999-05-27 2005-03-17 Mds Inc. Quadrupole mass spectrometer with ion traps to enhance sensitivity
US6525314B1 (en) * 1999-09-15 2003-02-25 Waters Investments Limited Compact high-performance mass spectrometer
US20030168589A1 (en) * 2000-07-21 2003-09-11 Hager James W Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
WO2002009144A2 (fr) * 2000-07-21 2002-01-31 Mds Inc., Doing Business As Mds Sciex Spectrometre de masse a trois quadripoles pouvant realiser des operations d'analyse de masse multiples
US20050006580A1 (en) * 2000-07-21 2005-01-13 Hager James W. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
WO2002009144A3 (fr) * 2000-07-21 2003-01-23 Mds Inc Dba Mds Sciex Spectrometre de masse a trois quadripoles pouvant realiser des operations d'analyse de masse multiples
US6720554B2 (en) 2000-07-21 2004-04-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US7060972B2 (en) 2000-07-21 2006-06-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US6570153B1 (en) * 2000-10-18 2003-05-27 Agilent Technologies, Inc. Tandem mass spectrometry using a single quadrupole mass analyzer
US7145133B2 (en) 2000-12-14 2006-12-05 Mds Inc. Apparatus and method for MSnth in a tandem mass spectrometer system
US20050098719A1 (en) * 2000-12-14 2005-05-12 Bruce Thomson Apparatus and method for msnth in a tandem mass spectrometer system
AU2002238327B2 (en) * 2001-03-02 2006-05-11 Mds Inc., Doing Business As Mds Sciex Controlling the temporal response of mass spectrometers for mass spectrometry
WO2002071439A3 (fr) * 2001-03-02 2003-03-13 Mds Inc Dba Mds Sciex Controle de la reaction temporelle de spectometres de masse en spectrometrie de masse
US6713757B2 (en) 2001-03-02 2004-03-30 Mds Inc. Controlling the temporal response of mass spectrometers for mass spectrometry
WO2002071439A2 (fr) * 2001-03-02 2002-09-12 Mds Inc., Doing Business As Mds Sciex Controle de la reaction temporelle de spectometres de masse en spectrometrie de masse
WO2002097412A3 (fr) * 2001-05-25 2003-02-27 Mds Inc Dba Mds Sciex Procede de spectrometrie de masse pour accentuer la separation d'ions possedant des charges differentes
WO2002097412A2 (fr) * 2001-05-25 2002-12-05 Mds Inc., Doing Business As Mds Sciex Procede de spectrometrie de masse pour accentuer la separation d'ions possedant des charges differentes
US20040183005A1 (en) * 2001-05-25 2004-09-23 Hager James W Method of mass spectrometry, to enhance separation of ions with different charges
US7041967B2 (en) 2001-05-25 2006-05-09 Mds Inc. Method of mass spectrometry, to enhance separation of ions with different charges
WO2003019614A3 (fr) * 2001-08-30 2003-06-19 Mds Inc Doing Busness As Mds S Procede de reduction de la charge d'espace dans un spectrometre de masse lineaire de piegeage d'ions
WO2003019614A2 (fr) * 2001-08-30 2003-03-06 Mds Inc., Doing Busness As Mds Sciex Procede de reduction de la charge d'espace dans un spectrometre de masse lineaire de piegeage d'ions
US6627876B2 (en) * 2001-08-30 2003-09-30 Mds Inc. Method of reducing space charge in a linear ion trap mass spectrometer
US20040238737A1 (en) * 2001-08-30 2004-12-02 Hager James W. Method of reducing space charge in a linear ion trap mass spectrometer
US6953929B2 (en) * 2001-11-07 2005-10-11 Hitachi High-Technologies Corporation Mass analyzing method using an ion trap type mass spectrometer
US20040159785A1 (en) * 2001-11-07 2004-08-19 Yoshiaki Kato Mass analyzing method using an ion trap type mass spectrometer
US6720555B2 (en) 2002-01-09 2004-04-13 Trustees Of Boston University Apparatus and method for ion cyclotron resonance mass spectrometry
WO2003060945A1 (fr) * 2002-01-09 2003-07-24 Trustees Of Boston University Appareil et procede permettant d'effectuer une spectrometrie de masse par resonance cyclotron des ions
US20050098718A1 (en) * 2002-01-09 2005-05-12 O'connor Peter B. Apparatus and method for ion cyclotron resonance mass spectrometry
US20030197844A1 (en) * 2002-02-01 2003-10-23 Mertens Jeroen Johannes Sophia Maria Lithographic apparatus and device manufacturing method
US6847430B2 (en) * 2002-02-01 2005-01-25 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7227137B2 (en) 2002-04-05 2007-06-05 Mds Inc. Fragmentation of ions by resonant excitation in a high order multipole field, low pressure ion trap
WO2003088306A1 (fr) * 2002-04-05 2003-10-23 Mds Inc., Doing Business As Mds Sciex Fragmentation des ions par excitation resonante dans un piege a ions basse pression
US20050178963A1 (en) * 2002-04-05 2005-08-18 Frank Londry Fragmentation of ions by resonant excitation in a high order multipole field, low pressure ion trap
WO2003088305A1 (fr) * 2002-04-05 2003-10-23 Mds Inc., Doing Business As Mds Sciex Fragmentation d'ions par excitation resonante dans un champ multipole de rang superieur, et piege d'ions basse pression
US20040041090A1 (en) * 2002-04-29 2004-03-04 Nic Bloomfield Broad ion fragmentation coverage in mass spectrometry by varying the collision energy
US20050277789A1 (en) * 2002-04-29 2005-12-15 Mds Inc., Broad ion fragmentation coverage in mass spectrometry by varying the collision energy
US7199361B2 (en) 2002-04-29 2007-04-03 Mds Inc. Broad ion fragmentation coverage in mass spectrometry by varying the collision energy
WO2003094197A1 (fr) * 2002-04-29 2003-11-13 Mds Inc., Doing Business As Mds Sciex Couverture pour fragmentation d'ions importante en spectrometrie de masse (ms) par variation de l'energie de collision
US6909089B2 (en) 2002-05-30 2005-06-21 Mds Inc. Methods and apparatus for reducing artifacts in mass spectrometers
US20040011956A1 (en) * 2002-05-30 2004-01-22 Londry Frank R. Methods and apparatus for reducing artifacts in mass spectrometers
WO2003103009A1 (fr) * 2002-05-30 2003-12-11 Mds Inc., Doing Business As Mds Sciex Resolution d'ejection axiale amelioree pour spectrometres de masse multipolaires
WO2003102517A2 (fr) * 2002-05-30 2003-12-11 Mds Inc., Doing Business As Mds Sciex Procedes et appareils permettant de reduire les artefacts dans les spectrometres de masse
WO2003102517A3 (fr) * 2002-05-30 2004-04-15 Mds Inc Dba Mds Sciex Procedes et appareils permettant de reduire les artefacts dans les spectrometres de masse
US6703607B2 (en) 2002-05-30 2004-03-09 Mds Inc. Axial ejection resolution in multipole mass spectrometers
EP2421023A1 (fr) 2002-05-31 2012-02-22 PerkinElmer Health Sciences, Inc. Spectrometrie de masse a multiples guides ioniques rf segmentes en plusieurs zones de pression
US7858926B1 (en) 2002-05-31 2010-12-28 Perkinelmer Health Sciences, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions
US7381373B2 (en) * 2002-06-07 2008-06-03 Purdue Research Foundation System and method for preparative mass spectrometry
US20060079002A1 (en) * 2002-06-07 2006-04-13 Bogdan Gologan System and method for landing of ions on a gas/liquid interface
US20060071665A1 (en) * 2002-06-07 2006-04-06 Thomas Blake System and method for preparative mass spectrometry
US7045797B2 (en) 2002-08-05 2006-05-16 The University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
US6897438B2 (en) 2002-08-05 2005-05-24 University Of British Columbia Geometry for generating a two-dimensional substantially quadrupole field
US20040021072A1 (en) * 2002-08-05 2004-02-05 Mikhail Soudakov Geometry for generating a two-dimensional substantially quadrupole field
US20040108456A1 (en) * 2002-08-05 2004-06-10 University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
US20040222369A1 (en) * 2003-03-19 2004-11-11 Thermo Finnigan Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
DE112004000453B4 (de) 2003-03-19 2021-08-12 Thermo Finnigan Llc Erlangen von Tandem-Massenspektrometriedaten für Mehrfachstammionen in einer Ionenpopulation
US7157698B2 (en) 2003-03-19 2007-01-02 Thermo Finnigan, Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
US7071464B2 (en) 2003-03-21 2006-07-04 Dana-Farber Cancer Institute, Inc. Mass spectroscopy system
US20040245455A1 (en) * 2003-03-21 2004-12-09 Bruce Reinhold Mass spectroscopy system
WO2004093122A3 (fr) * 2003-04-16 2004-12-16 Univ British Columbia Ejection axiale a geometrie amelioree pour generer un champ bidimensionnel sensiblement quadripolaire
WO2004093122A2 (fr) * 2003-04-16 2004-10-28 The University Of British Columbia Ejection axiale a geometrie amelioree pour generer un champ bidimensionnel sensiblement quadripolaire
WO2004107389A3 (fr) * 2003-05-30 2006-02-16 Mds Inc Dba Mds Sciex Systeme et procede pour modifier les champs de franges d'un appareil multipolaire a radiofrequences
US7019290B2 (en) * 2003-05-30 2006-03-28 Applera Corporation System and method for modifying the fringing fields of a radio frequency multipole
US20040238734A1 (en) * 2003-05-30 2004-12-02 Hager James W. System and method for modifying the fringing fields of a radio frequency multipole
US20060138317A1 (en) * 2003-06-06 2006-06-29 Schultz J A Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
US7629576B2 (en) 2003-06-06 2009-12-08 Ionwerks, Inc. Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
US20050067564A1 (en) * 2003-09-25 2005-03-31 The University Of British Columbia Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components
US7141789B2 (en) 2003-09-25 2006-11-28 Mds Inc. Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components
WO2005029533A1 (fr) * 2003-09-25 2005-03-31 Mds Inc., Doing Business As Mds Sciex Procede et appareil pour la fourniture de champs bidimensionnels sensiblement quadrupolaires ayant des composantes hexapolaires selectionnees
US7223969B2 (en) 2003-10-20 2007-05-29 Ionwerks, Inc. Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
US20050109931A1 (en) * 2003-10-20 2005-05-26 Schultz J. A. Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
US20060192104A1 (en) * 2003-10-20 2006-08-31 Ionwerks, Inc. Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
US6992284B2 (en) * 2003-10-20 2006-01-31 Ionwerks, Inc. Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
US20050127290A1 (en) * 2003-12-16 2005-06-16 Hitachi High-Technologies Corporation Mass Spectrometer
US7208728B2 (en) 2003-12-16 2007-04-24 Hitachi High-Technologies Corporation Mass spectrometer
US7329862B2 (en) 2003-12-16 2008-02-12 Hitachi High-Technologies, Corporation Mass spectrometer
US20060284072A1 (en) * 2003-12-16 2006-12-21 Hitachi High-Technologies Corporation Mass spectrometer
US8742339B2 (en) 2004-01-09 2014-06-03 Micromass Uk Limited Mass spectrometer
US9312118B2 (en) 2004-01-09 2016-04-12 Micromass Uk Limited Mass spectrometer
US8692187B2 (en) 2004-03-12 2014-04-08 University Of Virginia Patent Foundation Electron transfer dissociation for biopolymer sequence analysis
US20090230302A1 (en) * 2004-03-12 2009-09-17 University Of Virginia Patent Foundation Electron Transfer Dissociation for Biopolymer Sequence Analysis
US7084398B2 (en) 2004-05-05 2006-08-01 Sciex Division Of Mds Inc. Method and apparatus for selective axial ejection
US20050253064A1 (en) * 2004-05-05 2005-11-17 Sciex Division Of Mds Inc. Method and apparatus for selective axial ejection
WO2005106922A1 (fr) * 2004-05-05 2005-11-10 Mds Inc. , Doing Business As Mds Sciex Procede et appareil d'ejection axiale a selectivite de masse
US7365319B2 (en) * 2004-05-20 2008-04-29 Mds Inc. Method for providing barrier fields at the entrance and exit end of a mass spectrometer
US20050263697A1 (en) * 2004-05-20 2005-12-01 Hydrogenics Corporation Method for providing barrier fields at the entrance and exit end of a mass spectrometer
US20050258353A1 (en) * 2004-05-20 2005-11-24 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
US7227130B2 (en) * 2004-05-20 2007-06-05 Mds Inc. Method for providing barrier fields at the entrance and exit end of a mass spectrometer
US20070018094A1 (en) * 2004-05-20 2007-01-25 Sciex Division Of Mds Inc. Method for providing barrier fields at the entrance and exit end of a mass spectrometer
US7170051B2 (en) 2004-05-20 2007-01-30 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
US20050258354A1 (en) * 2004-05-24 2005-11-24 Hitachi High-Technologies Corporation Mass spectrometer
US7397025B2 (en) 2004-05-24 2008-07-08 Hitachi High-Technologies Corporation Mass spectrometer
US7129478B2 (en) 2004-05-24 2006-10-31 Hitachi High-Technologies Corporation Mass spectrometer
US20070023648A1 (en) * 2004-05-24 2007-02-01 Hitachi High-Technologies Corporation Mass spectrometer
US7034293B2 (en) * 2004-05-26 2006-04-25 Varian, Inc. Linear ion trap apparatus and method utilizing an asymmetrical trapping field
US20050263696A1 (en) * 2004-05-26 2005-12-01 Wells Gregory J Linear ion trap apparatus and method utilizing an asymmetrical trapping field
US20100090101A1 (en) * 2004-06-04 2010-04-15 Ionwerks, Inc. Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
US7348554B2 (en) * 2004-06-08 2008-03-25 Hitachi High-Technologies Corporation Mass spectrometer
US7569814B2 (en) 2004-06-08 2009-08-04 Hitachi High-Technologies Corporation Mass spectrometer
US20080156979A1 (en) * 2004-06-08 2008-07-03 Hitachi High-Technologies Corporation Mass spectrometer
US20050269504A1 (en) * 2004-06-08 2005-12-08 Hitachi High-Technologies Corporation Mass spectrometer
WO2006054101A3 (fr) * 2004-11-18 2007-01-18 Micromass Ltd Spectrometre de masse
US8952320B2 (en) 2004-11-18 2015-02-10 Micromass Uk Limited Mass spectrometer
WO2006054101A2 (fr) * 2004-11-18 2006-05-26 Micromass Uk Limited Spectrometre de masse
US20110233396A1 (en) * 2005-01-10 2011-09-29 Micromass Uk Limited Mass Spectrometer
US8389933B2 (en) 2005-01-10 2013-03-05 Micromass Uk Limited Mass analyzer utilizing a plurality of axial pseudo-potential wells
US20090014637A1 (en) * 2005-01-17 2009-01-15 Micromass Uk Limited Mass Spectrometer
WO2006075189A3 (fr) * 2005-01-17 2007-05-18 Micromass Ltd Spectrometre de masse
US20100038530A1 (en) * 2005-01-17 2010-02-18 Micromass Uk Limited Mass Spectrometer
US9460906B2 (en) * 2005-01-17 2016-10-04 Micromass Uk Limited Mass spectrometer
WO2006075182A3 (fr) * 2005-01-17 2007-06-07 Micromass Ltd Spectrometre de masse
US8847153B2 (en) 2005-01-17 2014-09-30 Micromass Uk Limited Segmented ion trap mass spectrometer
US7183545B2 (en) 2005-03-15 2007-02-27 Agilent Technologies, Inc. Multipole ion mass filter having rotating electric field
US20060219933A1 (en) * 2005-03-15 2006-10-05 Mingda Wang Multipole ion mass filter having rotating electric field
US7319222B2 (en) 2005-03-18 2008-01-15 Hitachi High-Technologies Corporation Mass spectrometer and mass analysis method
US20060219896A1 (en) * 2005-03-18 2006-10-05 Hitachi High-Technologies Corporation Mass spectrometer and mass analysis method
US20070114384A1 (en) * 2005-05-11 2007-05-24 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
US7397029B2 (en) 2005-05-11 2008-07-08 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
US20060289744A1 (en) * 2005-05-18 2006-12-28 Jolliffe Charles L Method and apparatus for mass selective axial transport using quadrupolar DC
EP1889282A4 (fr) * 2005-05-18 2011-01-19 Mds Inc Dba Mds Sciex Procede et appareil de transport axial selectif de masse utilisant un cc quadripolaire
EP1889282A1 (fr) * 2005-05-18 2008-02-20 MDS Inc., doing business as MDS Sciex Procede et appareil de transport axial selectif de masse utilisant un cc quadripolaire
US7709785B2 (en) 2005-05-18 2010-05-04 Mds Inc. Method and apparatus for mass selective axial transport using quadrupolar DC
US7312444B1 (en) 2005-05-24 2007-12-25 Chem - Space Associates, Inc. Atmosperic pressure quadrupole analyzer
US20080067340A1 (en) * 2005-06-03 2008-03-20 Nicholas Bloomfield System and Method for Data Collection in Recursive Mass Analysis
US7391015B2 (en) 2005-06-03 2008-06-24 Mds Analytical Technologies System and method for data collection in recursive mass analysis
US9679752B2 (en) 2005-07-21 2017-06-13 Micromass Uk Limited Mass spectrometer
WO2007010272A3 (fr) * 2005-07-21 2007-12-06 Micromass Ltd Spectrometre de masse
EP2637195A3 (fr) * 2005-07-21 2013-10-23 Micromass UK Limited Spectromètre de masse
US10388500B2 (en) 2005-07-21 2019-08-20 Micromass Uk Limited Mass spectrometer
US20090134321A1 (en) * 2005-07-21 2009-05-28 Micromass Uk Limited Mass spectrometer
US20070084998A1 (en) * 2005-08-22 2007-04-19 Bruker Daltonik Gmbh Novel tandem mass spectrometer
GB2429579A (en) * 2005-08-22 2007-02-28 Bruker Daltonik Gmbh A tandem mass spectrometer
DE102005039560A1 (de) * 2005-08-22 2007-03-01 Bruker Daltonik Gmbh Neuartiges Tandem-Massenspektrometer
DE102005039560B4 (de) * 2005-08-22 2010-08-26 Bruker Daltonik Gmbh Neuartiges Tandem-Massenspektrometer
US7323683B2 (en) 2005-08-31 2008-01-29 The Rockefeller University Linear ion trap for mass spectrometry
US20070045533A1 (en) * 2005-08-31 2007-03-01 Krutchinsky Andrew N Novel linear ion trap for mass spectrometry
EP1944791A1 (fr) * 2005-10-31 2008-07-16 Hitachi, Ltd. Spectromètre de masse et procédé de spectrométrie de masse
US7592589B2 (en) 2005-10-31 2009-09-22 Hitachi, Ltd. Method of mass spectrometry and mass spectrometer
WO2007052372A1 (fr) 2005-10-31 2007-05-10 Hitachi, Ltd. Spectromètre de masse et procédé de spectrométrie de masse
US20070181804A1 (en) * 2005-10-31 2007-08-09 Yuichiro Hashimoto Method of mass spectrometry and mass spectrometer
US20090189065A1 (en) * 2005-10-31 2009-07-30 Yuichiro Hashimoto Method of mass spectrometry and mass spectrometer
EP1944791B1 (fr) * 2005-10-31 2015-05-06 Hitachi, Ltd. Spectromètre de masse et procédé de spectrométrie de masse
US7675033B2 (en) 2005-10-31 2010-03-09 Hitachi, Ltd. Method of mass spectrometry and mass spectrometer
US20100219337A1 (en) * 2005-10-31 2010-09-02 Yuichiro Hashimoto Method Of Mass Spectrometry And Mass Spectrometer
US8227751B2 (en) 2005-11-25 2012-07-24 Micromass Uk Limited Mass spectrometer
EP2677532A3 (fr) * 2005-11-25 2014-01-22 Micromass UK Limited Spectromètre de masse
US8487248B2 (en) 2005-11-25 2013-07-16 Micromass Uk Limited Method and apparatus for frequency-based axial ejection of ions
EP1952424B1 (fr) * 2005-11-25 2014-06-25 Micromass UK Limited Spectrometre de masse
US20090114810A1 (en) * 2005-11-25 2009-05-07 Micromass Uk Limited Mass spectrometer
WO2007062498A1 (fr) * 2005-11-30 2007-06-07 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Procede et dispositif pour transport axial par selection de masse au moyen d'un champ axial pulse
US20070120053A1 (en) * 2005-11-30 2007-05-31 Alexander Loboda Method and apparatus for mass selective axial transport using pulsed axial field
US7459679B2 (en) 2005-11-30 2008-12-02 Mds Inc. Method and apparatus for mass selective axial transport using pulsed axial field
US20070158545A1 (en) * 2005-12-22 2007-07-12 Leco Corporation Linear ion trap with an imbalanced radio frequency field
US7582864B2 (en) * 2005-12-22 2009-09-01 Leco Corporation Linear ion trap with an imbalanced radio frequency field
US20070158550A1 (en) * 2006-01-10 2007-07-12 Varian, Inc. Increasing ion kinetic energy along axis of linear ion processing devices
US7378653B2 (en) 2006-01-10 2008-05-27 Varian, Inc. Increasing ion kinetic energy along axis of linear ion processing devices
US20070158546A1 (en) * 2006-01-11 2007-07-12 Lock Christopher M Fragmenting ions in mass spectrometry
US7541575B2 (en) 2006-01-11 2009-06-02 Mds Inc. Fragmenting ions in mass spectrometry
US20130267037A1 (en) * 2006-04-28 2013-10-10 Micromass Uk Limited Mass spectrometer device and method using scanned phase applied potentials in ion guidance
US9786479B2 (en) 2006-04-28 2017-10-10 Micromass Uk Limited Mass spectrometer device and method using scanned phase applied potentials in ion guidance
US8455819B2 (en) * 2006-04-28 2013-06-04 Micromass Uk Limited Mass spectrometer device and method using scanned phase applied potentials in ion guidance
US20110180704A1 (en) * 2006-04-28 2011-07-28 Micromass Uk Limited Mass Spectrometer
US8586917B2 (en) * 2006-04-28 2013-11-19 Micromass Uk Limited Mass spectrometer device and method using scanned phase applied potentials in ion guidance
US20090302209A1 (en) * 2006-04-28 2009-12-10 Micromass Uk Limited Mass spectrometer
US9269549B2 (en) * 2006-04-28 2016-02-23 Micromass Uk Limited Mass spectrometer device and method using scanned phase applied potentials in ion guidance
US7919747B2 (en) * 2006-04-28 2011-04-05 Micromass Uk Limited Mass spectrometer
US20080078927A1 (en) * 2006-09-28 2008-04-03 Mds Analytical Technologies, A Business Unit Of Mds Inc. Doing Business Through Its Sciex Division Method for axial ejection and in-trap fragmentation using auxiliary electrodes in a multipole mass spectrometer
US7692143B2 (en) 2006-09-28 2010-04-06 Mds Analytical Technologies, A Business Unit Of Mds Inc. Method for axial ejection and in-trap fragmentation using auxiliary electrodes in a multipole mass spectrometer
WO2008037058A1 (fr) 2006-09-28 2008-04-03 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Procédé d'éjection axiale et fragmentation par piége d'ions à l'aide d'électrodes auxiliaires dans un spectromètre de masse multipolaire
EP2084730A4 (fr) * 2006-09-28 2011-12-07 Mds Analytical Tech Bu Mds Inc Procédé d'éjection axiale et fragmentation par piége d'ions à l'aide d'électrodes auxiliaires dans un spectromètre de masse multipolaire
EP2084730A1 (fr) * 2006-09-28 2009-08-05 MDS Analytical Technologies, a business unit Of MDS Inc., doing busi. through its SCIEX div. Procédé d'éjection axiale et fragmentation par piége d'ions à l'aide d'électrodes auxiliaires dans un spectromètre de masse multipolaire
US20100108879A1 (en) * 2006-11-15 2010-05-06 Micromass Uk Limited Mass Spectrometer
US9685313B2 (en) * 2006-11-15 2017-06-20 Micromass Uk Limited Combined mass-to-charge ratio and charge state selection in tandem mass spectrometry
US10319577B2 (en) 2006-11-15 2019-06-11 Micromass Uk Limited Combined mass-to-charge ratio and charge state selection in tandem mass spectrometry
US20080116372A1 (en) * 2006-11-22 2008-05-22 Yuichiro Hashimoto Mass spectrometer and method of mass spectrometry
US7820961B2 (en) 2006-11-22 2010-10-26 Hitachi, Ltd. Mass spectrometer and method of mass spectrometry
US20080121795A1 (en) * 2006-11-24 2008-05-29 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US7800058B2 (en) 2006-11-24 2010-09-21 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US20080142705A1 (en) * 2006-12-13 2008-06-19 Schwartz Jae C Differential-pressure dual ion trap mass analyzer and methods of use thereof
US7692142B2 (en) 2006-12-13 2010-04-06 Thermo Finnigan Llc Differential-pressure dual ion trap mass analyzer and methods of use thereof
US7737398B2 (en) * 2006-12-18 2010-06-15 Bruker Daltonik Gmbh Linear RF ion trap with high mass resolution
US20080142706A1 (en) * 2006-12-18 2008-06-19 Karsten Michelmann Linear rf ion trap with high mass resolution
DE112008000583T5 (de) 2007-03-02 2010-01-14 Thermo Finnigan Llc, San Jose Segmentierte Ionenfallenmassenspektrometrie
US7633060B2 (en) 2007-04-24 2009-12-15 Thermo Finnigan Llc Separation and axial ejection of ions based on m/z ratio
US20080272295A1 (en) * 2007-05-02 2008-11-06 Michael Mircea-Guna Multipole mass filter having improved mass resolution
US7880140B2 (en) 2007-05-02 2011-02-01 Dh Technologies Development Pte. Ltd Multipole mass filter having improved mass resolution
US7847240B2 (en) 2007-06-11 2010-12-07 Dana-Farber Cancer Institute, Inc. Mass spectroscopy system and method including an excitation gate
US20090008543A1 (en) * 2007-06-11 2009-01-08 Dana-Farber Cancer Institute, Inc. Mass spectroscopy system and method including an excitation gate
US20090014645A1 (en) * 2007-07-09 2009-01-15 Igor Chernushevich Confining ions with fast-oscillating electric fields
US7557344B2 (en) 2007-07-09 2009-07-07 Mds Analytical Technologies, A Business Unit Of Mds Inc. Confining ions with fast-oscillating electric fields
US20140131568A1 (en) * 2007-07-12 2014-05-15 Micromass Uk Limited Mass Spectrometer
US8426803B2 (en) * 2007-07-12 2013-04-23 Micromass Uk Limited Mass spectrometer
US8987661B2 (en) * 2007-07-12 2015-03-24 Micromass Uk Limited Mass spectrometer
US20100252730A1 (en) * 2007-07-12 2010-10-07 Micromass Uk Limited Mass Spectrometer
US8796615B2 (en) * 2007-07-12 2014-08-05 Micromass Uk Limited Mass spectrometer
GB2455377B (en) * 2007-07-12 2010-04-28 Micromass Ltd Mass spectrometer
US20130221242A1 (en) * 2007-07-12 2013-08-29 Micromass Uk Limited Mass Spectrometer
US9082601B2 (en) 2007-09-04 2015-07-14 Micromass Uk Limited Tandem ion trapping arrangement
US8729461B2 (en) 2007-09-04 2014-05-20 Micromass Uk Limited Tandem ion trapping arrangement
EP2186109A2 (fr) * 2007-09-04 2010-05-19 Micromass UK Limited Dispositif tandem de piégeage d'ions
EP2063452A2 (fr) 2007-11-02 2009-05-27 Microsaic systems limited Agencement de montage
US20090127481A1 (en) * 2007-11-02 2009-05-21 Richard Syms Mounting arrangement
US8618502B2 (en) 2007-11-02 2013-12-31 Microsaic Systems Plc Mounting arrangement
US20090146054A1 (en) * 2007-12-10 2009-06-11 Spacehab, Inc. End cap voltage control of ion traps
US8704168B2 (en) 2007-12-10 2014-04-22 1St Detect Corporation End cap voltage control of ion traps
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US20100171035A1 (en) * 2007-12-20 2010-07-08 Shimadzu Corporation Mass spectrometer
US7985951B2 (en) * 2007-12-20 2011-07-26 Shimadzu Corporation Mass spectrometer
US20110240851A1 (en) * 2007-12-20 2011-10-06 Shimadzu Corporation Mass spectrometer
US8563920B2 (en) * 2007-12-20 2013-10-22 Shimadzu Corporation Mass spectrometer
US7847248B2 (en) * 2007-12-28 2010-12-07 Mds Analytical Technologies, A Business Unit Of Mds Inc. Method and apparatus for reducing space charge in an ion trap
US20090166534A1 (en) * 2007-12-28 2009-07-02 Mds Analytical Technologies, A Business Unit Of Mds Inc. Method and apparatus for reducing space charge in an ion trap
US8212208B2 (en) 2008-01-11 2012-07-03 Micromass Uk Limited Linear ion trap
US20110049358A1 (en) * 2008-01-11 2011-03-03 Micromass Uk Limited Linear Ion Trap
GB2466522B (en) * 2008-01-11 2011-02-09 Micromass Ltd Linear ion trap
GB2466522A (en) * 2008-01-11 2010-06-30 Micromass Ltd A multipole linear ion trap
WO2009087402A3 (fr) * 2008-01-11 2010-02-18 Micromass Uk Limited Piège à ions linéaire
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US20090294657A1 (en) * 2008-05-27 2009-12-03 Spacehab, Inc. Driving a mass spectrometer ion trap or mass filter
US7982182B2 (en) * 2008-05-28 2011-07-19 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US20090294661A1 (en) * 2008-05-28 2009-12-03 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
US20090302215A1 (en) * 2008-06-09 2009-12-10 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Method of operating tandem ion traps
US20090302216A1 (en) * 2008-06-09 2009-12-10 Mds Analytical Technologies, A Buisness Unit Of Mds Inc, Doing Buisness Through Its Sciex Division Multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field
US8822916B2 (en) 2008-06-09 2014-09-02 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
US8766170B2 (en) 2008-06-09 2014-07-01 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
US8008618B2 (en) 2008-06-09 2011-08-30 Frank Londry Multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field
WO2009149550A1 (fr) 2008-06-09 2009-12-17 Mds Analytical Technologies Guide d'ions multipolaire permettant de fournir un champ électrique axial dont la force augmente avec la position radiale et procédé de fonctionnement d'un guide d'ions multipolaire ayant ledit champ électrique axial
WO2009149546A1 (fr) 2008-06-09 2009-12-17 Mds Analytical Technologies Procédé de fonctionnement de pièges à ions en tandem
EP2294603A4 (fr) * 2008-06-09 2017-01-18 DH Technologies Development Pte. Ltd. Guide d'ions multipolaire permettant de fournir un champ électrique axial dont la force augmente avec la position radiale et procédé de fonctionnement d'un guide d'ions multipolaire ayant ledit champ électrique axial
US7872228B1 (en) 2008-06-18 2011-01-18 Bruker Daltonics, Inc. Stacked well ion trap
US8373120B2 (en) 2008-07-28 2013-02-12 Leco Corporation Method and apparatus for ion manipulation using mesh in a radio frequency field
US20110192969A1 (en) * 2008-07-28 2011-08-11 Leco Corporation Method and apparatus for ion manipulation using mesh in a radio frequency field
DE112008003955T5 (de) 2008-07-28 2011-06-01 Leco Corp., St. Joseph Verfahren und Vorrichtung zur Manipulation von Ionen unter Verwendung eines Netzes in einem Radiofrequenzfeld
DE112008003955B4 (de) 2008-07-28 2018-02-08 Leco Corp. Ionenführung, Verwendung einer solchen Ionenführung, Schnittstelle, gepulster Ionenkonverter für die Ionenführung sowie Verfahren zur Ionenmanipulation
US8525108B2 (en) 2008-08-29 2013-09-03 Hitachi High-Technologies Corporation Mass spectrometer
JP5542055B2 (ja) * 2008-08-29 2014-07-09 株式会社日立ハイテクノロジーズ 質量分析装置
US20110133075A1 (en) * 2008-08-29 2011-06-09 Hitachi High-Technologies Corporation Mass spectrometer
US7947948B2 (en) 2008-09-05 2011-05-24 Thermo Funnigan LLC Two-dimensional radial-ejection ion trap operable as a quadrupole mass filter
US20100078551A1 (en) * 2008-10-01 2010-04-01 MDS Analytical Technologies, a business unit of MDS, Inc. Method, System And Apparatus For Multiplexing Ions In MSn Mass Spectrometry Analysis
US8101910B2 (en) 2008-10-01 2012-01-24 Dh Technologies Development Pte. Ltd. Method, system and apparatus for multiplexing ions in MSn mass spectrometry analysis
US20110204221A1 (en) * 2008-10-14 2011-08-25 Hiroyuki Satake Mass spectrometer and method of mass spectrometry
US8674299B2 (en) 2009-02-19 2014-03-18 Hitachi High-Technologies Corporation Mass spectrometric system
US8368011B2 (en) 2009-04-17 2013-02-05 Hitachi, Ltd. Ion detector
US8101908B2 (en) * 2009-04-29 2012-01-24 Thermo Finnigan Llc Multi-resolution scan
US20100276583A1 (en) * 2009-04-29 2010-11-04 Senko Michael W Multi-Resolution Scan
WO2010126655A1 (fr) * 2009-04-29 2010-11-04 Thermo Finnigan Llc Balayage à plusieurs résolutions
US8053723B2 (en) * 2009-04-30 2011-11-08 Thermo Finnigan Llc Intrascan data dependency
US20100276586A1 (en) * 2009-04-30 2010-11-04 Senko Michael W Intrascan data dependency
WO2010126673A1 (fr) * 2009-04-30 2010-11-04 Thermo Finnigan Llc Dépendance à l'égard de données intra-scan
US20110155902A1 (en) * 2009-07-06 2011-06-30 Dh Technologies Development Pte. Ltd. Methods and systems for providing a substantially quadrupole field with a higher order component
EP2452355A4 (fr) * 2009-07-06 2017-03-29 DH Technologies Development Pte. Ltd. Procédés et systèmes destinés à procurer un champ sensiblement quadripôle avec un composant d'ordre supérieur
EP2452355A1 (fr) * 2009-07-06 2012-05-16 DH Technologies Development Pte. Ltd. Procédés et systèmes destinés à procurer un champ sensiblement quadripôle avec un composant d'ordre supérieur
WO2011003186A1 (fr) 2009-07-06 2011-01-13 Dh Technologies Development Pte. Ltd. Procédés et systèmes destinés à procurer un champ sensiblement quadripôle avec un composant d'ordre supérieur
US8835834B2 (en) 2009-07-15 2014-09-16 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
WO2011073794A3 (fr) * 2009-12-18 2011-11-03 Dh Technologies Development Pte. Ltd. Procédé de traitement d'ions
US8835841B2 (en) 2009-12-28 2014-09-16 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry
US9177776B2 (en) 2010-01-19 2015-11-03 Micromass Uk Limited Mass to charge ratio selective ejection from ion guide having supplemental RF voltage applied thereto
WO2011089419A3 (fr) * 2010-01-19 2011-09-15 Micromass Uk Limited Éjection, sélective sur base du rapport masse/charge, à partir d'un guide d'ions auquel est appliquée une tension radiofréquence d'appoint
EP2539915A4 (fr) * 2010-02-26 2016-08-10 Perkinelmer Health Sci Inc Spectrométrie de masse à plasma à suppression ionique
US9053916B2 (en) 2010-09-17 2015-06-09 Wisconsin Alumni Research Foundation Method to perform beam-type collision-activated dissociation in the pre-existing ion injection pathway of a mass spectrometer
US9478405B2 (en) 2010-09-17 2016-10-25 Wisconsin Alumni Research Foundation Method to perform beam-type collision-activated dissociation in the pre-existing ion injection pathway of a mass spectrometer
US8742333B2 (en) 2010-09-17 2014-06-03 Wisconsin Alumni Research Foundation Method to perform beam-type collision-activated dissociation in the pre-existing ion injection pathway of a mass spectrometer
CN103460332B (zh) * 2011-01-31 2016-01-20 株式会社岛津制作所 三级四极型质谱仪
CN103460332A (zh) * 2011-01-31 2013-12-18 株式会社岛津制作所 三级四极型质谱仪
US9076638B2 (en) 2011-03-04 2015-07-07 Hitachi-High Technologies Corporation Mass spectrometer method and mass spectrometer
EP2498272A1 (fr) 2011-03-04 2012-09-12 Hitachi High-Technologies Corporation Procédé spectrométrique de masse et spectromètre de masse
US20140117219A1 (en) * 2011-03-07 2014-05-01 Micromass Uk Limited Dynamic Resolution Correction of Quadrupole Mass Analyser
US9111654B2 (en) 2011-03-07 2015-08-18 Micromass Uk Limited DC ion guide for analytical filtering/separation
US9805920B2 (en) * 2011-03-07 2017-10-31 Micromass Uk Limited Dynamic resolution correction of quadrupole mass analyser
GB2491678B (en) * 2011-03-07 2015-10-14 Micromass Ltd DC ion guide for analytical filtering/separation
GB2491678A (en) * 2011-03-07 2012-12-12 Micromass Ltd An ion guide comprising a 3D array of electrodes
US20160240359A1 (en) * 2011-03-07 2016-08-18 Micromass Uk Limited Dynamic Resolution Correction of Quadrupole Mass Analyser
US9324543B2 (en) * 2011-03-07 2016-04-26 Micromass Uk Limited Dynamic resolution correction of quadrupole mass analyser
US20120248306A1 (en) * 2011-04-01 2012-10-04 Hitachi, Ltd. Ion Detecting Device
US8921776B2 (en) * 2011-04-01 2014-12-30 Hitachi, Ltd. Ion detecting device
EP2732458A4 (fr) * 2011-07-11 2015-05-20 Dh Technologies Dev Pte Ltd Procédé pour réguler la charge d'espace dans un spectromètre de masse
US9318310B2 (en) 2011-07-11 2016-04-19 Dh Technologies Development Pte. Ltd. Method to control space charge in a mass spectrometer
EP2758982B1 (fr) * 2011-09-22 2020-01-01 Purdue Research Foundation Spectromètre de masse quadripolaire linéaire double à piège ionique et à pompage différentiel
EP3667702A1 (fr) * 2011-09-22 2020-06-17 Purdue Research Foundation Double spectromètre de masse quadripolaire linéaire à piège ionique et à pompage différentiel
WO2013067090A2 (fr) 2011-11-02 2013-05-10 Thermo Finnigan Llc Dispositif d'interface ionique possédant de multiples cellules de confinement et ses procédés d'utilisation
US9831076B2 (en) * 2011-11-02 2017-11-28 Thermo Finnigan Llc Ion interface device having multiple confinement cells and methods of use thereof
US10541120B2 (en) 2011-12-22 2020-01-21 Thermo Fisher Scientific (Bremen) Gmbh Method of tandem mass spectrometry
US9147563B2 (en) 2011-12-22 2015-09-29 Thermo Fisher Scientific (Bremen) Gmbh Collision cell for tandem mass spectrometry
US10224193B2 (en) 2011-12-22 2019-03-05 Thermo Fisher Scientific (Bremen) Gmbh Method of tandem mass spectrometry
US9685309B2 (en) 2011-12-22 2017-06-20 Thermo Fisher Scientific (Bremen) Gmbh Collision cell for tandem mass spectrometry
US9748083B2 (en) 2011-12-22 2017-08-29 Thermo Fisher Scientific (Bremen) Gmbh Method of tandem mass spectrometry
JP2015503827A (ja) * 2011-12-29 2015-02-02 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド イオントラップ質量分析のためのイオン励起方法
US20150041639A1 (en) * 2011-12-29 2015-02-12 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
WO2013098614A1 (fr) 2011-12-29 2013-07-04 Dh Technologies Development Pte. Ltd. Procédé d'extraction d'ions pour la spectrométrie de masse à piégeage d'ions
US9859106B2 (en) 2013-05-30 2018-01-02 Perkinelmer Health Sciences, Inc. Reflectrons and methods of producing and using them
US9355832B2 (en) 2013-05-30 2016-05-31 Perkinelmer Health Sciences, Inc. Reflectrons and methods of producing and using them
US9899202B2 (en) 2013-05-31 2018-02-20 Perkinelmer Health Sciences, Inc. Time of flight tubes and methods of using them
US9384954B2 (en) 2013-05-31 2016-07-05 Perkinelmer Health Sciences, Inc. Time of flight tubes and methods of using them
WO2014197341A3 (fr) * 2013-06-02 2015-03-19 Perkinelmer Health Sciences, Inc. Cellules de collision et procédés utilisant ces cellules
US10103013B2 (en) 2013-06-02 2018-10-16 Perkinelmer Health Sciences, Inc. Collision cells and methods of using them
US9368334B2 (en) 2013-06-02 2016-06-14 Perkinelmer Health Sciences, Inc. Collision cells and methods of using them
US9818592B2 (en) 2013-06-03 2017-11-14 Perkinelmer Health Sciences, Inc. Ion guide or filters with selected gas conductance
US9355831B2 (en) 2013-06-03 2016-05-31 Perkinelmer Health Sciences, Inc. Ion guide or filters with selected gas conductance
US9117646B2 (en) * 2013-10-04 2015-08-25 Thermo Finnigan Llc Method and apparatus for a combined linear ion trap and quadrupole mass filter
US20150097115A1 (en) * 2013-10-04 2015-04-09 Thermo Finnigan Llc Method and apparatus for a combined linear ion trap and quadrupole mass filter
US20150162174A1 (en) * 2013-11-26 2015-06-11 Perkinelmer Health Sciences, Inc. Detectors and methods of using them
US9847214B2 (en) * 2013-11-26 2017-12-19 Perkinelmer Health Sciences, Inc. Detectors and methods of using them
US20190234901A1 (en) * 2013-12-02 2019-08-01 Micromass Uk Limited Method of charge state selection
US10788449B2 (en) * 2013-12-02 2020-09-29 Micromass Uk Limited Method of charge state selection
US9583321B2 (en) * 2013-12-23 2017-02-28 Thermo Finnigan Llc Method for mass spectrometer with enhanced sensitivity to product ions
WO2015097504A1 (fr) 2013-12-23 2015-07-02 Dh Technologies Development Pte. Ltd. Spectromètre de masse
US20150179419A1 (en) * 2013-12-23 2015-06-25 Thermo Finnigan Llc Method for Mass Spectrometer with Enhanced Sensitivity to Product Ions
US9870911B2 (en) * 2013-12-23 2018-01-16 Dh Technologies Development Pte. Ltd. Method and apparatus for processing ions
US20170032953A1 (en) * 2013-12-23 2017-02-02 DH Technologies Development Pte Ltd. Mass Spectrometer
EP3178106A4 (fr) * 2014-08-05 2018-03-07 DH Technologies Development PTE. Ltd. Extraction de passe-bande d'un dispositif de piégeage d'ions et amélioration de sensibilité de spectromètre de masse à temps de vol
WO2016020789A1 (fr) 2014-08-05 2016-02-11 Dh Technologies Development Pte. Ltd. Extraction de passe-bande d'un dispositif de piégeage d'ions et amélioration de sensibilité de spectromètre de masse à temps de vol
US10381213B2 (en) 2015-10-01 2019-08-13 Dh Technologies Development Pte. Ltd. Mass-selective axial ejection linear ion trap
WO2017055978A1 (fr) 2015-10-01 2017-04-06 Dh Technologies Development Pte. Ltd. Piège à ions linéaire à éjection axiale sélective de masse
WO2017089991A1 (fr) * 2015-11-27 2017-06-01 Q-Tek D.O.O. Procédé d'analyse de traces ciblée avec miroir ionique rf
GB2559306A (en) * 2015-11-27 2018-08-01 Q Tek D O O Method for targeted trace analysis with RF ion mirror
US11610769B2 (en) 2016-01-28 2023-03-21 Purdue Research Foundation Systems and methods for separating ions at about or above atmospheric pressure
US10727041B2 (en) 2016-01-28 2020-07-28 Purdue Research Foundation Systems and methods for separating ions at about or above atmospheric pressure
US11037777B2 (en) 2016-01-28 2021-06-15 Purdue Research Foundation Systems and methods for separating ions at about or above atmospheric pressure
CN110291613B (zh) * 2017-02-01 2022-06-28 Dh科技发展私人贸易有限公司 傅里叶变换质谱仪
CN110291613A (zh) * 2017-02-01 2019-09-27 Dh科技发展私人贸易有限公司 傅里叶变换质谱仪
US12027355B2 (en) * 2017-07-27 2024-07-02 Purdue Research Foundation Systems and methods for performing multiple precurser, neutral loss and product ion scans in a single ion trap
US20230298874A1 (en) * 2017-07-27 2023-09-21 Purdue Research Foundation Systems and methods for performing multiple precurser, neutral loss and product ion scans in a single ion trap
US10937638B2 (en) * 2017-07-27 2021-03-02 Purdue Research Foundation Systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap
US11676805B2 (en) * 2017-07-27 2023-06-13 Purdue Research Foundation Systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap
US10665441B2 (en) * 2018-08-08 2020-05-26 Thermo Finnigan Llc Methods and apparatus for improved tandem mass spectrometry duty cycle
CN112534547A (zh) * 2018-09-07 2021-03-19 Dh科技发展私人贸易有限公司 Rf离子阱离子加载方法
WO2020049487A1 (fr) * 2018-09-07 2020-03-12 Dh Technologies Development Pte. Ltd. Procédé de chargement d'ions par piège à ions rf
US11348777B2 (en) 2018-09-07 2022-05-31 Dh Technologies Development Pte. Ltd. RF ion trap ion loading method
US11810772B2 (en) 2018-09-07 2023-11-07 Dh Technologies Development Pte. Ltd. RF ion trap ion loading method
CN112534547B (zh) * 2018-09-07 2024-05-14 Dh科技发展私人贸易有限公司 Rf离子阱离子加载方法
JP2022500813A (ja) * 2018-09-07 2022-01-04 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド Ｒｆイオントラップイオン装填方法
WO2020157656A1 (fr) * 2019-02-01 2020-08-06 Dh Technologies Development Pte. Ltd. Spectrométrie de masse à piège à ions linéaire à transformée de fourier à verrouillage de phase
WO2020157655A1 (fr) 2019-02-01 2020-08-06 Dh Technologies Development Pte. Ltd. Commande de gain automatique pour remplissage optimal de piège à ions
CN113383406A (zh) * 2019-02-01 2021-09-10 Dh科技发展私人贸易有限公司 相位锁定的傅里叶变换线性离子阱质谱分析法
US11929246B2 (en) 2019-02-01 2024-03-12 Dh Technologies Development Pte. Ltd. Phase locked Fourier transform linear ion trap mass spectrometry
US11443933B1 (en) 2020-10-30 2022-09-13 Agilent Technologies, Inc. Inductively coupled plasma mass spectrometry (ICP-MS) with ion trapping

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WO1999063578A2 (fr) 1999-12-09
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JP2002517888A (ja) 2002-06-18
CA2239399A1 (fr) 1999-12-01
CA2239399C (fr) 2004-04-06
DE69919353T2 (de) 2005-09-08
DE69919353D1 (de) 2004-09-16
ATE273563T1 (de) 2004-08-15
AU4027699A (en) 1999-12-20

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