US5549716A - Process for manufacturing integrated circuits using an automated multi-station apparatus including an adhesive dispenser and apparatus therefor - Google Patents
Process for manufacturing integrated circuits using an automated multi-station apparatus including an adhesive dispenser and apparatus therefor Download PDFInfo
- Publication number
- US5549716A US5549716A US08/046,151 US4615193A US5549716A US 5549716 A US5549716 A US 5549716A US 4615193 A US4615193 A US 4615193A US 5549716 A US5549716 A US 5549716A
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- US
- United States
- Prior art keywords
- bonding
- lead frame
- die
- wire
- bonder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
- H01L23/49513—Lead-frames or other flat leads characterised by the die pad having bonding material between chip and die pad
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01039—Yttrium [Y]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1433—Application-specific integrated circuit [ASIC]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49004—Electrical device making including measuring or testing of device or component part
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49121—Beam lead frame or beam lead device
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
- Y10T29/53178—Chip component
Definitions
- This invention relates to a process for manufacturing an electronic component having an outer package made of a resin material such as an integrated circuit or the like and an apparatus therefor, and more particularly to a process for manufacturing an electronic component of diversified small-quantity production such as an integrated circuit for specific applications called ASIC and an apparatus therefor.
- a process for manufacturing an electronic component which has been conventionally practiced in the art generally includes a die-bonding step of adhesively mounting integrated circuit chips (hereinafter referred to as "IC chips") on a lead frame, a wire-bonding step of connecting bonding pads of the IC chips and the lead frame to each other by means of lead wires, and a molding step of forming a resin material into an outer package for covering a periphery of each of the IC chips.
- the steps are executed independent from each other.
- it is required to arrange a number of identical equipments at every step and execute the steps independently from each other.
- the present invention has been made in view of the foregoing disadvantages of the prior art.
- an object of the present invention to provide a process for manufacturing an electronic component which is capable of continuously manufacturing electronic components on a through-line, i.e., a conveyor belt or similar in-line carrier for continuously moving the electronic component to and from each successive step.
- a process for manufacturing electronic components comprises the steps of a die-bonding step of adhesively mounting IC chips on a lead frame, a wire-bonding step of connecting bonding pads of the IC chips and the lead frame to each other through lead wires, and a molding step of forming a resin material into an outer package for covering a periphery of each of the IC chips.
- the lead frame is transferred by means of a carrier means to permit the die-bonding step, wire-bonding step and molding step to be executed in order on a through-line.
- an apparatus for manufacturing electronic components comprises a die bonder for adhesively mounting IC chips on a lead frame, a wire bonder for connecting bonding pads of the IC chips and the lead frame to each other through lead wires, a resin molding machine for forming a resin material into an outer package for covering a periphery of each of the IC chips, and a carrier means for carrying the lead frame to the die bonder, wire bonder and resin molding! machine in order on a through-line.
- the die-bonding for adhesively mounting the IC chips on the lead frame, the wire-bonding for connecting the bonding pads of the IC chips and the lead frame to each other by means of the lead wires, and the formation of the outer package for covering the periphery of each of the IC chips are successively executed on a through-line, resulting in effectively accomplishing unmanning and diversified small-quantity production such as production of ASIC or the like. Also, the present invention permits execution of each of the steps to be visually inspected through image processing and results of the inspection to be fed back, resulting in on-line inspection being possible.
- FIG. 1 is a perspective view showing a procedure from a die-bonding step to a molding step in an embodiment of the present invention
- FIG. 2 is a perspective view showing a procedure from an after-curing step to a forming step in an embodiment of the present invention
- FIG. 3 is a schematic view showing a lead frame which has been subjected to a die-bonding step
- FIG. 4 is a flow chart showing process feedback control for a die-bonding step
- FIGS. 5A to 5C each are a schematic view showing a positional relationship between a bonding pad and a wire bonder in a wire-bonding step.
- FIG. 6 is a flow chart showing process feedback control for a wire-bonding step.
- FIGS. 1 and 2 illustrate an embodiment of the present invention, wherein FIG. 1 shows a procedure from a die-bonding step to a molding step in the embodiment and FIG. 2 shows a subsequent procedure from an after-curing step to a forming step in the embodiment.
- reference numeral 1 designates a loader for successively feeding lead frames 2 on which IC chips are to be mounted onto a through-line or conveyor 3 serving as a carrier means.
- Reference numeral 4 is a die bonder for carrying out a die-bonding step for bonding or adhesively mounting IC chips onto the lead frame 2.
- 5 is a TV camera for confirming workmanship or propriety of the die-bonding.
- the TV camera 5 is adapted to carry out confirmation of execution of the die-bonding step and on-line inspection of the execution by image processing.
- the lead frame 2 is transferred to a curing oven of a nitrogen atmosphere (N 2 curing oven) 6 in which a curing step is carried out for subjecting adhesive used in the die-bonding step to heating in an N 2 atmosphere, resulting in curing the adhesive.
- the lead frame 2 is carried to a wire bonder 7, at which the lead frame 2 is subjected to wire-bonding, and then fed to a location at which a TV camera 8 for confirming workmanship or propriety of execution of the wire-bonding is provided.
- the TV camera 8 is adapted to carry out confirmation of execution of the die-bonding step and on-line inspection of the execution by image processing.
- the lead frame is then transported to a resin molding machine 9, wherein a molding step is carried out with respect to the lead frame 2 to form an insulating resin material into an outer package for covering a periphery of each of the IC chips mounted on the lead frame.
- Reference numeral 10 designates a trimming machine for carrying out a trimming step with respect to the lead frame 2 and 11 is an unloader wherein the lead frame 2 trimmed is taken out from the conveyor 3.
- the lead frame 2 is fed to an after-curing oven 12 in which it is subjected to after-curing and then transported to a plating unit 13 in which it is subjected to plating.
- Reference numeral 14 designates a loader for feeding the lead frames 2 plated to a forming machine 16 in order.
- the forming machine 16 acts to separate, from the lead frame 2 on which integrated circuits each having the outer package are mounted, an unnecessary portion of the lead frame to provide electronic components and form each of the remaining leads of the electronic components into a desired shape.
- Reference numeral 17 designates a TV camera which functions to confirm workmanship or propriety of the forming step.
- the TV camera 17 is adapted to carry out confirmation of execution of the forming step and on-line inspection of the execution by image processing.
- Reference numerals 18, 19 and 31 designate a conveyor, an unloader and a tray for storing thereon IC electronic components thus completed, respectively.
- the lead frames 2 are successively fed from the loader 1 onto the conveyor 3 intermittently actuated, so that intermittent movement of the conveyor 3 permits each of the lead frames 2 to be transported to a position below the die bonder 4.
- the die bonder 4 functions to deposit adhesive on each of die pads of the lead frame 2 which is a portion of the lead frame on which an IC chip is to be mounted and then, as shown in FIG. 3, mount IC chips 20 on the lead frame 2 in turn.
- the lead frame 2 thus mounted thereon with the IC chips 20 as shown in FIG. 3 is then transferred to a position below the TV camera 5.
- An image of the lead frame and an image of a peripheral region of each of the IC chips 20 which are obtained by the TV camera 5 are fed to an image processing unit, in which each of the images are subjected to image processing, resulting in an image signal being formed by, for example, binary processing.
- FIG. 4 is a flow chart showing a procedure of process feedback control carried out using the images obtained through the TV camera 5 in a control section fed with the output or image signal of the image processing unit. More particularly, in the control section, a lead frame inspection step #1 is carried out to determine or judge propriety of the lead frame 2. The lead frame 2 which has been judged to be defective is removed from the conveyor 3. Then, a die-bonding inspection step #2 is carried out to judge propriety of extrusion or runout of the adhesive which occurs when the IC chip 20 is mounted on each of the die pads of the lead frame 20. When the extrusion is judged to be adequate or suitable, the lead frame 2 is fed to the N 2 curing oven 6, wherein the curing step is carried out.
- intermittent movement of the conveyor 3 permits the lead frame 2 having the IC chips mounted thereon to be fed into the N 2 curing oven 6, wherein the adhesive is heated in an N 2 atmosphere, resulting being cured.
- a solvent adding step #3 is executed. More particularly, in the step #3, it is carried out to feed the die bonder 4 with solvent to adjust flowability of the adhesive to an appropriate level.
- the above-described images obtained by the TV camera 5 are subjected to image processing in the image processing unit to confirm a position of each of the leads of the lead frame 2 for the purpose of getting ready for the subsequent wire-bonding step.
- the lead frame 2 having the IC chips mounted thereon which has been subjected to the curing step in the N 2 curing oven 6 is then fed to a position below the wire bonder 7 by means of the conveyor 3.
- the wire bonder 7 executes the wire-bonding step with respect to the lead frame 2 intermittently stopped due to intermittent movement of the conveyor 3. More particularly, as shown in FIGS. 5A to 5C, a lead wire is provided so as to establish connection between each of bonding pads 21 of the IC chip 20 and a lead 22 on the side of the lead frame 2.
- the bonding pad 21 may comprise an electrode of aluminum or the like formed on a silicon wafer.
- the wire-bonding is carried out utilizing results of the above-described processing of the images obtained by the TV camera 5 which has been carried out for confirming the position of each of the leads.
- the lead frame 2 which has been thus subjected to the wire-bonding treatment is then transferred to a position below the TV camera 8 by means of the conveyor 3.
- An image of a periphery of each of the bonding pads of the IC chip 20 obtained through the TV camera 8 is fed to the image processing unit, resulting in an image signal being produced by, for example, binary processing.
- FIG. 5A shows an ideal state at which a center of the pad and a center of the tool are coincided with each other.
- FIG. 5B shows that an environmental change due to thermal expansion or the like causes the centers of the pad and tool to be deviated from each other by a distance of ⁇ X in an X direction and a distance of ⁇ Y in a Y direction.
- FIG. 5C shows correction of the center of the tool carried out when the positional deviations ⁇ X and ⁇ Y between the center of the pad and that of the tool exceed tolerances X O and Y O , respectively.
- FIG. 6 is a flow chart showing a procedure of process feedback control carried out using images obtained through the TV camera 8 in the above-described control section fed with the output or image signal of the above-described image processing unit.
- a ⁇ X and ⁇ Y calculating step #11 is executed using the output or image signal of the image processing unit. More particularly, the step #11 is carried out to determine the positional deviations ⁇ X and ⁇ Y between the center of the bonding pad 21 and that of the tool of the wire bonder 7 (the center of the circle 23). Then, a judgment step #12 is executed to judge whether or not the deviations ⁇ X and ⁇ Y are within the tolerances X O and Y O .
- the wire bonding step is executed.
- ⁇ X exceeds X O and/or ⁇ Y exceeds Y O
- a tool position correcting step #13 is executed, so that the position of the tool of the wire bonder 7 is subjected to subtraction of ⁇ X and ⁇ Y to coincide the center of the ball and that of the tool with each other.
- the lead frame 2 which has been subjected to the wire-bonding treatment is then fed to the resin molding machine 9, wherein the molding step is carried out to form an insulating resin material into an outer package for covering each of the IC chips 20 on the lead frame 2.
- the lead frame 2 thus formed thereon with the outer package is transferred to the trimming machine 10 while being carried on the conveyor 3, wherein the trimming step of removing, from the lead frame 2, an unnecessary portion thereof.
- the lead frame 2 is not yet separated into individual integrated circuits, so that a plurality of the integrated circuits are kept integral with each other. Thereafter, the lead frame 2 is transferred to a discharge end of the conveyor 3, at which it is taken out from the conveyor by means of the unloader 11.
- the lead frame 2 taken out from the conveyor 3 by means of the unloader 11 is subsequently fed to the after-curing oven 12 wherein the after-curing step for drying the resin forming the outer package of the lead frame 2 to cure it is carried out.
- the lead frame 2 thus cured is transferred to the plating unit 13 wherein the lead frame 2 is plated, and then it is fed to the forming machine 16 by means of the loader 14, in which the forming step is carried out with respect to the lead frame 2.
- the forming machine 16 functions to remove, from the lead frame 2, an unnecessary portion of the lead frame to separate integrated circuits 30 formed on the lead frame from each other and form leads of each of the integrated circuits into a predetermined shape.
- the integrated circuits 30 thus formed each are then transferred to a position below the TV camera 17 while being carried on the conveyor 18.
- the TV camera 17 provides an image of the leads of the integrated circuit 30, which image is subsequently fed to the image processing unit, resulting in an image signal being produced by binary processing.
- the image signal permit the control section to inspect a configuration of each of the leads, its dimensions, its bending, its arrangement, intervals between the leads, and the like, so that propriety of each of the integrated circuits is judged.
- Defective integrated circuits are separated from non-defective ones. Thereafter, the non-defective integrated circuits are transferred to the tray 31 by means of the unloader 19 and then stored.
- the present invention permits the die-bonding step, wire-bonding step and molding step to be successively executed on a through-line, to thereby contribute to labor saving. Also, the present invention can effectively accommodated such diversified small-quantity production as seen in production of ASIC or the like.
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
- Die Bonding (AREA)
Abstract
Description
Claims (7)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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JP3248274A JP2811613B2 (en) | 1991-09-02 | 1991-09-02 | Manufacturing method and apparatus for electronic components |
US08/046,151 US5549716A (en) | 1991-09-02 | 1993-04-13 | Process for manufacturing integrated circuits using an automated multi-station apparatus including an adhesive dispenser and apparatus therefor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3248274A JP2811613B2 (en) | 1991-09-02 | 1991-09-02 | Manufacturing method and apparatus for electronic components |
US08/046,151 US5549716A (en) | 1991-09-02 | 1993-04-13 | Process for manufacturing integrated circuits using an automated multi-station apparatus including an adhesive dispenser and apparatus therefor |
Publications (1)
Publication Number | Publication Date |
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US5549716A true US5549716A (en) | 1996-08-27 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US08/046,151 Expired - Fee Related US5549716A (en) | 1991-09-02 | 1993-04-13 | Process for manufacturing integrated circuits using an automated multi-station apparatus including an adhesive dispenser and apparatus therefor |
Country Status (2)
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US (1) | US5549716A (en) |
JP (1) | JP2811613B2 (en) |
Cited By (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5807762A (en) * | 1996-03-12 | 1998-09-15 | Micron Technology, Inc. | Multi-chip module system and method of fabrication |
US5840594A (en) * | 1996-09-27 | 1998-11-24 | Matsushita Electric Industrial Co., Ltd. | Method of and apparatus for mounting electronic parts on a board |
US5894659A (en) * | 1996-03-18 | 1999-04-20 | Motorola, Inc. | Method for inspecting lead frames in a tape lead bonding system |
US5987722A (en) * | 1995-02-28 | 1999-11-23 | Samsung Electronics Co., Ltd. | Apparatus for transporting lead frames |
US6039770A (en) * | 1997-06-25 | 2000-03-21 | Samsung Electronics Co., Ltd. | Semiconductor device manufacturing system having means for reducing a pressure difference between loadlock and processing chambers |
WO2002103763A1 (en) * | 2001-06-14 | 2002-12-27 | Renesas Technology Corp. | Method for manufacturing semiconductor device |
US6546985B2 (en) * | 1998-08-19 | 2003-04-15 | Nec Machinery Corporation | Die bonder |
US20030094241A1 (en) * | 2001-11-19 | 2003-05-22 | Huang Yao-Ting | Die bonder |
EP1376658A2 (en) | 2002-06-25 | 2004-01-02 | Kabushiki Kaisha Toshiba | Method and apparatus for manufacturing semiconductor device |
US6705001B2 (en) * | 2001-11-28 | 2004-03-16 | Asm Technology Singapore Pte Ltd. | Apparatus for assembling integrated circuit packages |
WO2004068562A1 (en) * | 2003-01-28 | 2004-08-12 | Infineon Technologies Ag | Packaging integrated circuits |
US6789235B1 (en) * | 2001-09-05 | 2004-09-07 | National Semiconductor Corporation | Bond program verification system |
KR100472310B1 (en) * | 1997-07-21 | 2005-06-01 | 삼성전자주식회사 | Automatic monitoring method of molding apparatus and apparatus |
US20050216104A1 (en) * | 2004-02-13 | 2005-09-29 | Assembleon N.V. | Method for estimating at least one component placement position on a substrate as well as a device for carrying out such a method |
DE19736685B4 (en) * | 1996-11-08 | 2006-02-09 | Samsung Electronics Co., Ltd., Suwon | bonder |
US7105377B1 (en) * | 2004-04-13 | 2006-09-12 | Cypress Semiconductor Corporation | Method and system for universal packaging in conjunction with a back-end integrated circuit manufacturing process |
US20080054452A1 (en) * | 2002-02-20 | 2008-03-06 | Micron Technology, Inc. | Microelectronic device having a plurality of stacked microelectronic dies and methods for manufacturing such microelectronic assemblies |
US7698015B1 (en) | 2001-02-27 | 2010-04-13 | Cypress Semiconductor Corporation | Integrated back-end integrated circuit manufacturing assembly |
US7818085B1 (en) | 2001-02-27 | 2010-10-19 | Cypress Semiconductor Corporation | System for controlling the processing of an integrated circuit chip assembly line |
ITUD20090156A1 (en) * | 2009-09-03 | 2011-03-04 | Applied Materials Inc | SUBSTRATI PROCESSING DEVICE INCLUDING A DEVICE FOR THE MANIPULATION OF DAMAGED SUBSTRATES |
US20130316294A1 (en) * | 2012-05-25 | 2013-11-28 | Ming Yeung Luke Wan | Apparatus for heating a substrate during die bonding |
US20190201963A1 (en) * | 2017-12-29 | 2019-07-04 | Texas Instruments Incorporated | Component forming machine with jammed component mitigation |
US11017554B2 (en) * | 2017-02-03 | 2021-05-25 | Hesse Gmbh | Method for securing a bonding product in a working region of a bonder |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100439955B1 (en) * | 2002-09-02 | 2004-07-14 | 한미반도체 주식회사 | Guide apparatus of semiconductor package |
KR101537044B1 (en) * | 2014-07-10 | 2015-07-16 | (주)티에스이 | Inspection device for led package |
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US7474417B2 (en) * | 2004-02-13 | 2009-01-06 | Assembleon N.V. | Method for estimating at least one component placement position on a substrate as well as a device for carrying out such a method |
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US20130316294A1 (en) * | 2012-05-25 | 2013-11-28 | Ming Yeung Luke Wan | Apparatus for heating a substrate during die bonding |
US10199350B2 (en) * | 2012-05-25 | 2019-02-05 | Asm Technology Singapore Pte Ltd | Apparatus for heating a substrate during die bonding |
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Also Published As
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JPH0563007A (en) | 1993-03-12 |
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