TWM528423U - 外觀檢查裝置及檢查系統 - Google Patents

外觀檢查裝置及檢查系統 Download PDF

Info

Publication number
TWM528423U
TWM528423U TW104220732U TW104220732U TWM528423U TW M528423 U TWM528423 U TW M528423U TW 104220732 U TW104220732 U TW 104220732U TW 104220732 U TW104220732 U TW 104220732U TW M528423 U TWM528423 U TW M528423U
Authority
TW
Taiwan
Prior art keywords
light
inspection
light source
half mirror
observed
Prior art date
Application number
TW104220732U
Other languages
English (en)
Chinese (zh)
Inventor
Akinori Tsuda
Original Assignee
Goyo Co Ltd
Akinori Tsuda
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Goyo Co Ltd, Akinori Tsuda filed Critical Goyo Co Ltd
Publication of TWM528423U publication Critical patent/TWM528423U/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
TW104220732U 2014-12-26 2015-12-24 外觀檢查裝置及檢查系統 TWM528423U (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014265684A JP5784815B1 (ja) 2014-12-26 2014-12-26 外観検査装置および検査システム

Publications (1)

Publication Number Publication Date
TWM528423U true TWM528423U (zh) 2016-09-11

Family

ID=54200791

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104220732U TWM528423U (zh) 2014-12-26 2015-12-24 外觀檢查裝置及檢查系統

Country Status (3)

Country Link
JP (1) JP5784815B1 (fr)
TW (1) TWM528423U (fr)
WO (1) WO2016103622A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6040387B1 (ja) * 2016-04-07 2016-12-07 アキム株式会社 レンズ検査装置
FR3053790B1 (fr) * 2016-07-07 2019-07-19 Rcp Design Global Dispositif destine a analyser la perception d'objets en fonction de son eclairage notamment
JP6512585B1 (ja) * 2017-12-01 2019-05-15 株式会社アセット・ウィッツ 部品外観自動検査装置
JP6482710B1 (ja) * 2018-09-06 2019-03-13 五洋商事株式会社 外観検査装置及び検査システム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3436326B2 (ja) * 1995-01-31 2003-08-11 旭硝子株式会社 透明板状体の欠点検査方法及び装置
JP3215858B2 (ja) * 1998-12-25 2001-10-09 ライオンエンジニアリング株式会社 物品外観検査装置
JP4163039B2 (ja) * 2003-04-21 2008-10-08 株式会社エム・アイ・エル 容器内気泡判定方法及びその装置
JP4566769B2 (ja) * 2005-02-04 2010-10-20 株式会社エム・アイ・エル 物品欠陥情報検出装置
JP2013246059A (ja) * 2012-05-25 2013-12-09 Sharp Corp 欠陥検査装置および欠陥検査方法

Also Published As

Publication number Publication date
JP5784815B1 (ja) 2015-09-24
WO2016103622A1 (fr) 2016-06-30
JP2016125871A (ja) 2016-07-11

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