M441826 五、新型說明： 【新型所屬之技術領域】 本創作是有關於微針治具連接器之改良結構，特別是 指一種可有效降低組裝困難度且易於維修之微針治具連接 器結構。 【先前技術】 習見之微針治具連接器之結構’乃如第1、2圖所示， 其主要包括一基板1及複數探針3〇，於該基板2之二表 • 側分別界定為一前側1 1及一後側1 2，並依需要設有複 數貫穿之探針孔1 3，而該探針3 〇之二端部分別設有一 抵觸端3 0 2及一接線端3 0 1 ;組裝時，係以各探針3 0之抵觸端3 0 2由基板1之後側1 2分別貫穿於各探針 孔1 3，以使各抵觸端3 0 2平齊地凸伸於前側1 1之表 面一適當高度，藉以與相關待測試之電路相接觸，而該接 線端3 0 1係可供焊接連結一導線4 〇。 而隨著目前電子產品日新月異，尤以體積小、功能 • 多元為主要趨勢，反映在電路板上亦增加線路複雜性，不 但測點小且密度高，因而微針測試治具精密度需求與曰俱 增，而針對現今微針治具之生產製程中，因其他製程均可 以設備提升做為改善，唯獨焊接導線的製程必須完全依賴 人工為之，故而，若能在焊接導線的製程加以適當的改善， 則將可大大提升微針治具的產出與品質。 於實際應用時，上述傳統之微針治具連接模組可依其 探針的針數及間距不同，而分為DD(1〇24pin)、 CD(2048㈣、QD(4096pin)等三種模组，其令以qd模組的 3 M441826 探針最細’其間距也最小，因此，將導線4 〇焊接於該探 針3 0之接線端3 Ο 1上之施工過程也極為困難，且由於 該導線4 0與探針3 0之間並無任何銜接套合之機制，因 此其焊接結合後多會於焊接部位產生一較大體積的焊錫4 Ο 1包覆部位（或使該導線4 0與探針3 0相交錯後再加 以焊接）’使該導線4 0與探針3 0皆可與焊錫4 Ο 1產生 較大的接觸面積，藉以增加其整體之結構強度；然而，此 種結構與加工方式於實際應用時有下列缺失： 1_由於該探針3 0與導線4 0之間缺乏銜接或套合之機 制’因此其焊接加工較為不易，且隨著導線4〇逐一與 探針3 0結合後’密集排列的導線4 〇會使焊接之工作 區域變小，使其整體之施工更為困難，影響其生產效率。 2·由於該探針3 0與導線4 0之焊接部位會產生一大體積 的焊錫40 1包覆部位，而該焊錫40 1包覆部位之外 徑大多會大於該探針孔1 3之内徑；因此，在維修上， 必須將損壞的探針3 〇由基板1的後側1 2拉出（因為 無法由基板1的前側1 1拉出），並剪斷該導線4〇，再 將該導線4 0焊接一新的探針3 0，然後，再將該新的 探針30插入該探針孔1 3内，而在此維修程序中，位 於基板1的後側1 2之密集排列導線4 0亦會影響操作 上之便利性。 有鑑於習見微針治具連接器之結構有上述缺點，創作 人乃針對該些缺點研究改進之道，終於有本創作產生。 【新型内容】 本創作之主要目的在於提供一種微針治具連接器之改 又結構’其係以複數套管嵌設於一基板上之探針孔内，該 4 等套管一端係供探針伸入，套管另一端係供套合並焊接於 導線端部，藉此’可有效簡化導線之焊接作業，以降低生 產成本。 本創作之另一目的在於提供一種微針治具連接器之改 良結構，其於維修時，可先卸下該探針，再將損壞之套管 抽出更換’具·維修之便利性。 本創作為達成上述目的及功效，其所採行的技術手段 包括：一基板，設有複數貫穿之探針孔；複數套管，係分 別嵌設於各探針孔内，各套管之三端部分科定為一容置 及銜接口，使該套管至少以該銜接口凸伸於該探針孔 之端外側，且該銜接口係套合焊接於一導線之一端；複 數探針，係由各容置口分別伸入各套管内，且保持各探針 以局部凸伸於該基板一側表面之外，以利於與相關之電路 相接觸導通。 依上述結構，其中該套管於外周側設有至少一向外擴 張之環凸緣，以供嵌卡於該探針孔内周側而形成一較穩固 之定位。 依上述結構，其中該容置口周側設有一向外擴張之喇 Π 〇 依上述結構，其中該套管内部中段環設有一擋止凸 緣，該擋止凸緣係供擋止該探針，以避免探針滑移至另一 端之銜接口。 依上述结構，其令該導線之端部設有一外徑凹縮且可 伸入該銜接口之銜接端。 至於本創作之詳細構造、應用原理、作用與功效，則 參照下列依附圖所作之說明即可得到完全的瞭解： 【實施方式】 請參第3、4圖所示，可知本創作之結構主要包括： 基板1、套管2及探針3等部份，其中該基板μ二表側 分別界前側i i及—後#]1 2 ’並設有複數貫穿之 探針孔1 3。 套管2可為-金屬成型之管狀體，其二端部分別界定 為一容置口2 1及-銜接，於該容置口2 !周側可 依需要設有一向外擴張之喇”八口 2丄丄，而於該套管2外 周側中段設有至少一向外擴張之環凸緣23，於該套管2 内部中段則環設有一擋止凸緣2 4，實際應用時，該銜接 口22之内徑可小於容置口21之内徑，且該容置口2ι 與銜接口 22之間恰可於擋止凸緣24形成一段差，而該 銜接口22係可套合於一導線4一端預設之銜接端41， 該銜接端41可依需要而為一外徑凹縮之端部。 探針3之二端部分別設有一較尖銳之抵觸端3 2及一 置入端3 1。 請參第5、6圖所示，可知本創作於組裝時，係將各 套管2分別植入基板1之各探針孔13，並以進管工且逐 一將套管2打入孔内，利用該環凸緣2 3迫緊嵌卡於該探 針孔1 3内壁周側而可形成一穩固之定位，並使其剩p八口 211恰可位於探針孔13接近該前側11之周緣，而各 銜接口 2 2則可凸伸於探針孔1 3外側且高度均一致；再 將各導線4之銜接端4 1伸入各銜接口 2 2内（約2〜3mm 深）’並施以焊接加工，使該銜接端4 1與銜接口 2 2内部 之間具有焊錫4 2結合，如此可將導線4牢牢固定於套管 2端部且不易脫落，且其焊錫4 2不會有過度向外膨脹擴 M441826 張之情形，並可依需要以熱縮管加以Μ (未_出），以择 加每一套管2與導線4銜接部位之絕緣性與完整性；各探 針3係以置入端3 i由各容置口 2 2分別伸入各套管2内 (該喇叭口2 1 1可便於探針3的伸入，以利於套管2結 構將探針3緊緊夾住），且藉由各擋止凸緣24擋止於各置 入端3 1，可使各探針3之抵觸端32保持凸伸於該基板 的前側1 1之外且间度均一致，以利於與相關之測試機 探針槽相接觸導通’並維持最好的接觸性。 上述結構於維修時，僅需將探針3由套管2之容置口 2 1取出，再以工具將套管2由前側工1勾出並剪斷該 導線4 ’然:後更換新的套管2，將導線4 (銜接端4工） 焊接於新的套管2上’再將套管2重新置入基板工之原探 針孔1 3中，並置入探針3即可；此種結構除可改善製程 上焊接不易之缺失，以增加焊線的穩定性，減少焊線不良 的現象’更由於其更換新套管2時，係於該基板χ之前側 1 1作業，因此不會有密集的導線4影響維修作業，可有 效提升連接模組的維修效率。 由上所述可知’本創作微針治具連接器之改良結構確 實具有組裝便利、易於維修之功效，確已具有產業上之利 用性、新穎性及進步性。 惟以上所述者’僅為本創作之一較佳實施例而已，並 非用來限定未創作實施之範圍。即凡依本創作申請專利範 圍所作之均等變化與修飾，皆為本創作專利範圍所涵蓋。 【圖式簡單說明】 第1圖係習見微針治具連接器之結構分解圖。 第2圖係習見微針治具連接器之組合刮面圖。 7 M441826 第3圖係本創作之構造分解圖。 第4圖係第3圖之探針及套管部位放大示意圖。 第5圖係本創作之整體組合剖面圖。 第6圖係第5圖之探針及套管結合部位放大示意圖。 【主要元件符號說明】 1.....基板 11.. ..前側 12....後侧 13·. ...探針孔 2.....套管 21.. ...容置口 211…制叭口 22.. ...銜接口 23....環凸緣 24.. ...擋止凸緣 3、30····探針 31.. 置入端 32....抵觸端 301 ...接線端 302...抵觸端 4、 40....導線 41....銜接端 42 ' .401.··.焊錫M441826 V. New description: [New technical field] This creation is about the improved structure of the micro-needle fixture connector, especially the micro-needle fixture connector structure which can effectively reduce the assembly difficulty and is easy to repair. [Previous Art] The structure of the microneedle jig connector is as shown in Figs. 1 and 2, which mainly includes a substrate 1 and a plurality of probes 3, which are respectively defined on the two sides of the substrate 2 as a front side 1 1 and a rear side 1 2, and a plurality of probe holes 13 are provided as needed, and the two end portions of the probe 3 are respectively provided with an abutting end 3 0 2 and a terminal 3 0 1 When assembling, the opposite end of the substrate 1 is inserted through the probe holes 13 from the rear side 1 2 of the substrate 1 so that the respective abutting ends 3 0 2 are flushly projected on the front side 1 The surface of 1 is at an appropriate height to contact the associated circuit to be tested, and the terminal 310 is adapted to be soldered to a wire 4 〇. With the current rapid changes in electronic products, especially the small size, function and diversity are the main trends, which are reflected in the circuit board and increase the complexity of the circuit. Not only the measuring point is small, but also the density is high. Therefore, the precision requirements of the micro-needle test fixture are met. In the production process of today's micro-needle fixtures, equipment upgrades can be improved for other processes, but the process of soldering wires must be completely manual, so if the process of soldering wires is properly applied The improvement will greatly improve the output and quality of the microneedle fixture. In practical applications, the above-mentioned conventional micro-needle jig connection module can be divided into three modules: DD (1〇24pin), CD (2048(4), QD(4096pin), etc. according to the needle number and spacing of the probe. The 3 M441826 probe with the qd module has the smallest pitch, and the spacing is also minimal. Therefore, the construction process of soldering the wire 4 to the terminal 3 Ο 1 of the probe 30 is extremely difficult, and because of the wire There is no mechanism for the connection between the 40 and the probe 30, so that after welding and welding, a large volume of solder 4 Ο 1 covering portion is generated at the welded portion (or the wire is 40 The pins 30 are interleaved and then soldered) 'The wire 40 and the probe 30 can both have a large contact area with the solder 4 Ο 1 to increase the overall structural strength; however, this structure and processing The method has the following defects in practical application: 1_Because of the lack of connection or nesting mechanism between the probe 30 and the wire 40, the welding process is relatively difficult, and the wire is twisted one by one with the probe 3 0 After the combination, the 'densely arranged wires 4 〇 will make the working area of the welding smaller, making it overall The construction is more difficult, which affects the production efficiency. 2. Because the welding part of the probe 30 and the wire 40 has a large volume of the solder 40 1 covered portion, and the outer diameter of the covered portion of the solder 40 1 is mostly It will be larger than the inner diameter of the probe hole 13; therefore, in repair, the damaged probe 3 must be pulled out from the rear side 1 2 of the substrate 1 (because it cannot be pulled out from the front side 1 1 of the substrate 1), And cutting the wire 4〇, soldering the wire 40 to a new probe 30, and then inserting the new probe 30 into the probe hole 13 in the maintenance procedure, The dense arrangement of the wires 40 on the rear side of the substrate 1 also affects the operational convenience. In view of the above-mentioned shortcomings of the structure of the microneedle jig connector, the creator has researched and improved the shortcomings for these shortcomings. The creation of this creation. [New content] The main purpose of this creation is to provide a modified structure of a micro-needle jig connector, which is embedded in a probe hole of a plurality of sleeves on a substrate, the 4 sets One end of the tube is for the probe to extend, and the other end of the sleeve is provided with the sleeve and welded to the end of the wire. Therefore, the welding operation of the wire can be effectively simplified to reduce the production cost. Another object of the present invention is to provide an improved structure of the microneedle jig connector, which can be removed first during maintenance. The damaged casing is taken out and replaced with the convenience of maintenance and repair. In order to achieve the above objectives and effects, the technical means adopted by the present invention include: a substrate having a plurality of probe holes penetrating; a plurality of casings Separately disposed in each of the probe holes, the three end portions of each sleeve are defined as a receiving and engaging interface, so that the sleeve protrudes at least outside the end of the probe hole by the interface, and the connection The mouthpiece is welded to one end of a wire; the plurality of probes are respectively inserted into the sleeves from the respective receiving openings, and the probes are partially protruded outside the one side surface of the substrate to facilitate correlation The circuits are in contact with each other. According to the above structure, the sleeve is provided with at least one outwardly expanding ring flange on the outer peripheral side for being fitted to the inner peripheral side of the probe hole to form a relatively stable positioning. According to the above structure, the peripheral side of the accommodating opening is provided with an outwardly expanding shackle according to the above structure, wherein the inner middle ring of the sleeve is provided with a blocking flange for blocking the probe. To avoid slipping the probe to the interface at the other end. According to the above structure, the end portion of the wire is provided with an outer diameter recessed and can extend into the engaging end of the interface. As for the detailed structure, application principle, function and effect of this creation, it can be fully understood by referring to the following description according to the drawings: [Embodiment] Please refer to Figures 3 and 4, it can be seen that the structure of this creation mainly includes The substrate 1, the sleeve 2, the probe 3, and the like, wherein the substrate μ side has a front side ii and a back #] 1 2 ', and a plurality of probe holes 13 are provided. The sleeve 2 can be a metal-formed tubular body, and the two ends thereof are respectively defined as a receiving port 21 and a connection. On the circumference side of the receiving port 2, an outwardly expanding bar can be provided as needed. The outer side of the sleeve 2 is provided with at least one outwardly expanding ring flange 23, and a middle portion of the sleeve 2 is provided with a blocking flange 24, which is used in practical applications. The inner diameter of the opening 22 can be smaller than the inner diameter of the receiving opening 21, and the gap between the receiving opening 2 and the interface 22 can form a difference between the blocking flange 24, and the interface 22 can be fitted to the one. The end of the wire 4 is a predetermined end of the connecting end 41. The engaging end 41 can be an end of the outer diameter of the outer diameter. The two ends of the probe 3 are respectively provided with a sharper abutting end 3 2 and a receiving end. 3 1. Please refer to Fig. 5 and Fig. 6, it can be seen that in the assembly, each sleeve 2 is implanted into each probe hole 13 of the substrate 1, and the casing 2 is drilled one by one. In the hole, the ring flange 23 is tightly clamped on the inner wall side of the probe hole 13 to form a stable positioning, and the remaining p eight port 211 can be located in the probe hole 13 The periphery of the side 11 and the respective interfaces 2 2 can protrude outside the probe hole 13 and have the same height; and the connecting ends 4 1 of the wires 4 are inserted into the respective interfaces 2 2 (about 2 to 3 mm). Deeply' and applying a welding process to bond the connecting end 4 1 and the inside of the interface 2 2 with a solder 4 2, so that the wire 4 can be firmly fixed to the end of the sleeve 2 and is not easily peeled off, and the solder thereof 4 2 There will be no excessive expansion and expansion of M441826 sheets, and can be Μ (not _) with heat shrinkable tubes as needed to select the insulation and integrity of the joint between each sleeve 2 and the conductor 4. Each of the probes 3 is inserted into each of the sleeves 2 through the respective receiving ports 2 2 at the insertion end 3 i (the bell mouth 2 1 1 can facilitate the penetration of the probe 3 to facilitate the structure of the sleeve 2 The probe 3 is tightly clamped, and the blocking end 24 of each probe 3 is kept protruding beyond the front side 1 1 of the substrate by the respective blocking flanges 24 blocking the respective insertion ends 3 1 . The uniformity is uniform to facilitate contact with the relevant test machine probe slot and maintain the best contact. The above structure is only required to cover the probe 3 from the casing 2 during maintenance. 1 Take out, and then use the tool to hook the sleeve 2 from the front side work 1 and cut the wire 4 ': then replace the new sleeve 2 and weld the wire 4 (the joint end 4) to the new sleeve 2 'Re-insert the sleeve 2 into the original probe hole 13 of the substrate, and insert the probe 3; this structure can improve the stability of the soldering wire in addition to improving the soldering defect. Reducing the phenomenon of poor wire bonding' is also due to the fact that when the new casing 2 is replaced, it is operated on the front side of the substrate, so that no dense wires 4 affect the maintenance work, and the maintenance efficiency of the connection module can be effectively improved. It can be seen from the above that the improved structure of the micro-needle jig connector of the present invention has the advantages of convenient assembly and easy maintenance, and has industrial applicability, novelty and advancement. However, the above description is only a preferred embodiment of the present invention and is not intended to limit the scope of the uncreated implementation. That is, the equal changes and modifications made by the patent application scope of this creation are covered by the scope of the creation patent. [Simple description of the diagram] Fig. 1 is a structural exploded view of the microneedle jig connector. Figure 2 shows the combined scraping view of the microneedle fixture connector. 7 M441826 Figure 3 is an exploded view of the structure of this creation. Fig. 4 is an enlarged schematic view of the probe and the casing portion of Fig. 3. Figure 5 is a cross-sectional view of the overall composition of the creation. Fig. 6 is an enlarged schematic view showing the binding portion of the probe and the sleeve of Fig. 5. [Description of main component symbols] 1.....substrate 11.. .. front side 12....rear side 13·....probe hole 2.....sleeve 21.. The opening 211 is made up of the mouth 22.....the interface 23...the ring flange 24.....the stop flange 3,30····the probe 31.. the insertion end 32. ...interfering end 301 ... terminal 302 ... resisting end 4, 40 .... wire 41.... connecting end 42 ' .401.··. solder