TWI853500B - Substrate processing apparatus - Google Patents

Substrate processing apparatus Download PDF

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TWI853500B
TWI853500B TW112110454A TW112110454A TWI853500B TW I853500 B TWI853500 B TW I853500B TW 112110454 A TW112110454 A TW 112110454A TW 112110454 A TW112110454 A TW 112110454A TW I853500 B TWI853500 B TW I853500B
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carrier
cleaning
substrates
section
standby
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TW112110454A
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TW202343645A (en
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天久賢治
谷口進一
岩﨑旭紘
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日商斯庫林集團股份有限公司
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Abstract

本發明之載體沿第1搬送路徑搬送。對該載體內之複數片基板進行處理。與第1搬送路徑之起點相鄰而設置第1待機部。第1待機部將收納有未處理之複數片基板之載體移交給第1搬送路徑之起點。與第1搬送路徑之終點相鄰而設置第2待機部。第2待機部接收收納有處理後之複數片基板之載體。自該載體取出複數片基板。自連接第2待機部與第1待機部之待機搬送路徑拾起使用後之載體並洗淨。洗淨後之載體返回至待機搬送路。The carrier of the present invention is transported along the first transport path. A plurality of substrates in the carrier are processed. A first standby section is provided adjacent to the starting point of the first transport path. The first standby section transfers the carrier containing a plurality of unprocessed substrates to the starting point of the first transport path. A second standby section is provided adjacent to the end point of the first transport path. The second standby section receives the carrier containing a plurality of processed substrates. A plurality of substrates are taken out from the carrier. The used carrier is picked up from the standby transport path connecting the second standby section and the first standby section and cleaned. The cleaned carrier returns to the standby transport path.

Description

基板處理裝置Substrate processing equipment

本發明係關於一種於處理槽中處理複數片基板之基板處理裝置。The present invention relates to a substrate processing device for processing a plurality of substrates in a processing tank.

為對半導體基板、液晶顯示裝置或有機EL(Electro Luminescence:電致發光)顯示裝置等之FPD(Flat Panel Display:平板顯示器)用基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用基板、陶瓷基板或太陽能電池用基板等基板進行各種處理,而使用基板處理裝置。A substrate processing apparatus is used to perform various processes on substrates such as semiconductor substrates, FPD (Flat Panel Display) substrates for liquid crystal display devices or organic EL (Electro Luminescence) display devices, optical disk substrates, magnetic disk substrates, magneto-optical disk substrates, mask substrates, ceramic substrates, or solar cell substrates.

作為此種基板處理裝置,具有將複數片基板浸漬於貯存在處理槽之處理液,進行蝕刻等處理之批量式基板處理裝置。例如,專利文獻1記載之批量式基板處理裝置包含晶圓傳送盒保持部、基板處理部及搬入搬出機構。晶圓傳送盒保持部構成為可保持晶圓傳送盒(FOUP:Front Opening Unified Pod)。晶圓傳送盒係構成為可以複數片基板於上下方向以規定間距排列之方式,將複數片基板以水平姿勢保持且收納之收納器。As such a substrate processing device, there is a batch type substrate processing device that immerses a plurality of substrates in a processing liquid stored in a processing tank and performs processing such as etching. For example, the batch type substrate processing device described in Patent Document 1 includes a wafer transfer box holding unit, a substrate processing unit, and a loading and unloading mechanism. The wafer transfer box holding unit is configured to hold a wafer transfer box (FOUP: Front Opening Unified Pod). The wafer transfer box is configured as a storage device that can hold and store a plurality of substrates in a horizontal position in a manner that the plurality of substrates are arranged at a specified interval in the vertical direction.

於該基板處理裝置中,將收納有未處理之複數片基板之晶圓傳送盒供給至晶圓傳送盒保持部並保持。於該狀態下,藉由搬入搬出機構具備之手自晶圓傳送盒取出複數片基板。該手構成為可一次保持複數片基板。藉由手取出之複數片基板經由複數個搬送機構及支持機構移交給基板處理部。In the substrate processing device, a wafer transfer box containing a plurality of unprocessed substrates is supplied to a wafer transfer box holding part and held. In this state, a plurality of substrates are taken out from the wafer transfer box by a hand provided by a loading and unloading mechanism. The hand is configured to hold a plurality of substrates at a time. The plurality of substrates taken out by the hand are transferred to the substrate processing part via a plurality of conveying mechanisms and a supporting mechanism.

基板處理部具有複數個處理槽及主搬送機構。於複數個處理槽各者,貯存有用以對基板進行規定處理之處理液。移交給基板處理部之未處理之複數片基板各者藉由主搬送機構搬送至複數個處理槽之任一者之上方之位置。主搬送機構與上述手同樣,亦構成為可一次保持複數片基板。The substrate processing unit has a plurality of processing tanks and a main transport mechanism. In each of the plurality of processing tanks, a processing liquid for performing a predetermined processing on the substrate is stored. Each of the plurality of unprocessed substrates transferred to the substrate processing unit is transported to a position above any one of the plurality of processing tanks by the main transport mechanism. The main transport mechanism is the same as the above-mentioned hand and is also configured to hold a plurality of substrates at a time.

搬送至複數個處理槽之任一者之上方之位置之複數片基板於位於該複數片基板之下方之處理槽內之處理液浸漬一定時間並提起。藉此,對複數片基板進行規定之處理。處理後之複數片基板自基板處理部取出,且經由複數個搬送機構及支持機構插入至保持於晶圓傳送盒保持部之空的晶圓傳送盒。收納有處理後之複數片基板之晶圓傳送盒自基板處理裝置搬出。The plurality of substrates transported to a position above any one of the plurality of processing tanks are immersed in the processing liquid in the processing tank located below the plurality of substrates for a certain period of time and then lifted up. In this way, the plurality of substrates are subjected to a predetermined process. The processed plurality of substrates are taken out from the substrate processing section and inserted into an empty wafer transfer box held in the wafer transfer box holding section through a plurality of transport mechanisms and support mechanisms. The wafer transfer box containing the processed plurality of substrates is transported out from the substrate processing device.

[專利文獻1]日本專利特開2011-238945號公報[Patent Document 1] Japanese Patent Publication No. 2011-238945

[發明所欲解決之問題][The problem the invention is trying to solve]

如上所述,於專利文獻1記載之基板處理裝置中,於複數個搬送機構之間一體交接複數片基板。該等複數個搬送機構為一次保持複數片基板而具有相對複雜之構成。此種複雜之構成使對複數個搬送機構之洗淨等之保養作業繁瑣化。As described above, in the substrate processing apparatus described in Patent Document 1, a plurality of substrates are transferred between a plurality of transport mechanisms. The plurality of transport mechanisms have a relatively complex structure in order to hold a plurality of substrates at a time. Such a complex structure makes the maintenance work such as cleaning of the plurality of transport mechanisms complicated.

又,於上述基板處理裝置中,於包含複數個搬送機構之基板處理裝置之多個構成要件之間多次交接複數片基板。因此,自晶圓傳送盒取出之複數片基板各者於插入至空的晶圓傳送盒為止之期間,反復接觸多個構成要件及離開多個構成要件。此種基板處理裝置之多個構成要件相對於複數片基板各者之接觸及離開之反復成為微粒之產生要因。Furthermore, in the above-mentioned substrate processing apparatus, a plurality of substrates are transferred multiple times between a plurality of components of the substrate processing apparatus including a plurality of transfer mechanisms. Therefore, each of the plurality of substrates taken out of the wafer cassette repeatedly contacts and leaves the plurality of components during the period from when the plurality of substrates are inserted into an empty wafer cassette. The repeated contact and separation of the plurality of components of such a substrate processing apparatus becomes a factor in the generation of particles.

再者,當接觸複數片基板之複數個構成要件污染時,污染物質會自該等構成要件轉印至複數片基板,複數片基板之清潔度顯著降低。因此,考慮將接觸複數片基板之複數個構成要件各者洗淨。然而,若將與上述複數個構成要件分別對應之複數個洗淨機構設置於基板處理裝置,則基板處理裝置之構成複雜化且零件件數增加。Furthermore, when multiple components that contact multiple substrates are contaminated, the contaminants are transferred from the components to the multiple substrates, significantly reducing the cleanliness of the multiple substrates. Therefore, it is considered to clean each of the multiple components that contact the multiple substrates. However, if multiple cleaning mechanisms corresponding to the multiple components are respectively provided in the substrate processing device, the structure of the substrate processing device becomes complicated and the number of parts increases.

作為應對此種問題之方法,可考慮集中收納至可收納複數片基板之載體,一次搬送複數片基板。As a method for coping with this problem, it can be considered to collect and store a plurality of substrates on a carrier that can store a plurality of substrates and transport the plurality of substrates at a time.

然而,因污染物質自複數片基板或處理槽轉印至載體,而有載體本身被污染之問題。因該載體上之污染物質轉印至基板,而成為使基板之品質降低之要因。However, there is a problem that the carrier itself is contaminated because the contaminants are transferred from the plurality of substrates or the processing tank to the carrier. The contaminants on the carrier are transferred to the substrate, which becomes a factor that reduces the quality of the substrate.

又,藉由附著於載體之處理液作用於載體之表面,亦有使載體之表面劣化之問題。又,於處理液為鍍覆液之情形時,可能會產生鍍覆附著於載體表面而生長之問題。Furthermore, the treatment liquid attached to the carrier acts on the surface of the carrier, which may cause the surface of the carrier to deteriorate. Furthermore, when the treatment liquid is a plating liquid, the plating may adhere to the surface of the carrier and grow.

如此,於先前之基板處理技術中,未提供用以適當應對載體之污染或載體之變質之問題的構成及方法。Thus, in the previous substrate processing technology, no structure and method are provided to properly deal with the problem of carrier contamination or carrier deterioration.

因此,本發明之目的在於提供一種可防止複數片基板污染,且抑制搬送機構之構成複雜化及零件件數增加的基板處理裝置。Therefore, an object of the present invention is to provide a substrate processing apparatus that can prevent contamination of a plurality of substrates and suppress the complexity of the structure of the transfer mechanism and the increase in the number of parts.

又,本發明之另一目的在於提供一種為防止構成為可收納複數片基板之載體之劣化,而可將載體之表面洗淨,重設載體之表面狀態之基板處理裝置。 [解決問題之技術手段] Furthermore, another object of the present invention is to provide a substrate processing device that can clean the surface of a carrier and reset the surface state of the carrier in order to prevent the deterioration of the carrier that is configured to accommodate a plurality of substrates. [Technical means for solving the problem]

(1)根據本發明之一態樣之基板處理裝置係對複數片基板進行預設之處理者,且具備:載體,其構成為可收納複數片基板;搬送機構,其沿預設之第1搬送路徑,將載體自該第1搬送路徑之起點搬送至終點;處理單元,其設置於第1搬送路徑上,於將複數片基板收納於載體之狀態下,對收納於該載體之複數片基板進行預設之處理;基板插入部,其將搬入至基板處理裝置之未處理之複數片基板插入至空的載體;第1待機部,其以與第1搬送路徑之起點相鄰之方式設置,且構成為可藉由基板插入部支持收納有未處理之複數片基板之載體,並移交給第1搬送路徑之起點;第2待機部,其以與第1搬送路徑之終點相鄰之方式設置,且構成為可自第1搬送路徑之終點接收收納有處理後之複數片基板之載體,並支持;基板取出部,其自收納有由處理單元處理後之複數片基板之載體,取出處理後之複數片基板;及載體洗淨部,其將載體洗淨;且形成將載體自第2待機部搬送至第1待機部之預設之第2搬送路徑;載體洗淨部自第2搬送路徑拾起已由基板取出部取出處理後之複數片基板後之空的載體,並將拾起之載體洗淨,使洗淨後之載體返回至第2搬送路徑。(1) According to one aspect of the present invention, a substrate processing device performs a preset processing on a plurality of substrates and comprises: a carrier configured to accommodate a plurality of substrates; a conveying mechanism configured to convey the carrier from a starting point to an end point of a preset first conveying path along the first conveying path; a processing unit configured to perform a preset processing on the plurality of substrates accommodated in the carrier while the plurality of substrates are accommodated in the carrier; a substrate inserting unit configured to insert the plurality of unprocessed substrates transported into the substrate processing device into an empty carrier; and a first standby unit configured to be adjacent to the starting point of the first conveying path and configured to support the plurality of unprocessed substrates accommodated in the carrier by the substrate inserting unit. The first conveying path is provided with a carrier for receiving a plurality of substrates after processing, and the carrier is transferred to the starting point of the first conveying path; the second standby part is arranged in a manner adjacent to the end point of the first conveying path, and is configured to receive and support the carrier containing a plurality of substrates after processing from the end point of the first conveying path; the substrate taking-out part takes out the substrates after processing from the carrier containing a plurality of substrates after processing by the processing unit. A plurality of substrates; and a carrier cleaning section that cleans the carriers; and forms a preset second transport path for transporting the carriers from the second standby section to the first standby section; the carrier cleaning section picks up an empty carrier from the second transport path after the plurality of substrates that have been taken out and processed by the substrate taking-out section, cleans the picked-up carrier, and returns the cleaned carrier to the second transport path.

於該基板處理裝置中,搬入之未處理之複數片基板藉由基板插入部而插入至空的載體。收納未處理之複數片基板之載體由第1待機部支持,且移交給第1搬送路徑之起點。自第1搬送路徑之起點朝向終點,搬送收納複數片基板之載體。該情形時,搬送機構可藉由搬送收納有複數片基板之載體,而一體處理複數片基板。因此,搬送機構無需用以一體且直接保持複數片基板之繁瑣之構成。於將載體自第1搬送路徑之起點搬送至終點之期間,對收納於載體之複數片基板,藉由處理單元進行預設之處理。In the substrate processing device, multiple unprocessed substrates are moved in and inserted into an empty carrier through a substrate insertion portion. The carrier storing the multiple unprocessed substrates is supported by the first standby portion and transferred to the starting point of the first conveying path. The carrier storing the multiple substrates is conveyed from the starting point of the first conveying path toward the end point. In this case, the conveying mechanism can process the multiple substrates as a whole by conveying the carrier storing the multiple substrates. Therefore, the conveying mechanism does not need to be a complicated structure for integrally and directly holding the multiple substrates. While the carrier is being conveyed from the starting point to the end point of the first conveying path, the multiple substrates stored in the carrier are subjected to preset processing by the processing unit.

收納處理後之複數片基板之載體自第1搬送路徑之終點由第2待機部接收,且由第2待機部支持。處理後之複數片基板藉由基板取出部自載體取出。空的載體於第2搬送路徑自第2待機部搬送至第1待機部。於該搬送中途,空的載體自第2搬送路徑被拾起,並藉由載體洗淨部洗淨。又,洗淨後之空的載體返回至第2搬送路徑。該情形時,可將通過第2搬送路徑搬送至第1待機部之洗淨後之空的載體用於插入未處理之複數片基板。如此,由於可再利用載體,故無需準備多個載體。又,由於將再利用之載體洗淨,故防止因再利用載體引起之複數片基板之污染。The carrier storing the processed plurality of substrates is received by the second standby section from the end point of the first conveying path and supported by the second standby section. The processed plurality of substrates are taken out from the carrier by the substrate taking-out section. The empty carrier is conveyed from the second standby section to the first standby section on the second conveying path. In the middle of the conveyance, the empty carrier is picked up from the second conveying path and cleaned by the carrier cleaning section. Furthermore, the cleaned empty carrier is returned to the second conveying path. In this case, the cleaned empty carrier conveyed to the first standby section via the second conveying path can be used to insert the unprocessed plurality of substrates. In this way, since the carrier can be reused, there is no need to prepare a plurality of carriers. Furthermore, since the reused carrier is cleaned, contamination of a plurality of substrates caused by the reused carrier can be prevented.

其等之結果,可防止複數片基板污染,且抑制搬送機構之構成複雜化及零件件數增加。As a result, contamination of a plurality of substrates can be prevented, and the complexity of the structure of the conveying mechanism and the increase in the number of parts can be suppressed.

再者,根據上述構成,可在每當用於處理複數片基板時,將用於處理複數片基板之載體洗淨。藉此,由於在每當處理複數片基板時,重設載體之表面狀態,故亦可抑制因污染或腐蝕等引起之載體之劣化。Furthermore, according to the above structure, the carrier used for processing a plurality of substrates can be cleaned each time the carrier is used for processing a plurality of substrates. Thus, since the surface state of the carrier is reset each time the plurality of substrates are processed, the degradation of the carrier caused by contamination or corrosion can be suppressed.

(2)亦可為,載體洗淨部包含:洗淨槽,其貯存用以將載體洗淨之洗淨液;及載體搬送裝置,其構成為可將載體浸漬於處理槽之洗淨液、及自洗淨液提起浸漬於洗淨液之載體。(2) Alternatively, the carrier cleaning section may include: a cleaning tank storing a cleaning liquid for cleaning the carrier; and a carrier transport device configured to immerse the carrier in the cleaning liquid in the treatment tank and lift the carrier immersed in the cleaning liquid from the cleaning liquid.

該情形時,於載體洗淨部中,可藉由使載體於洗淨槽內之洗淨液中浸漬一定時間,而以簡單之構成及簡單之方法將載體洗淨。In this case, in the carrier cleaning section, the carrier can be cleaned with a simple structure and a simple method by immersing the carrier in the cleaning liquid in the cleaning tank for a certain period of time.

(3)亦可為,載體洗淨部進而包含使洗淨後之載體乾燥之載體乾燥部。該情形時,塵埃難以附著於洗淨後之載體。藉此,抑制洗淨後之載體之清潔度降低。(3) The carrier cleaning section may further include a carrier drying section for drying the cleaned carrier. In this case, dust is less likely to adhere to the cleaned carrier, thereby suppressing the cleanliness of the cleaned carrier from being reduced.

(4)亦可為,載體洗淨部進而包含使洗淨後之載體待機之載體待機部。該情形時,可使洗淨後之載體於載體洗淨部待機。藉此,可使洗淨後之載體於適當之時序返回至第2搬送路徑。(4) The carrier cleaning section may further include a carrier standby section for making the cleaned carrier standby. In this case, the cleaned carrier may standby in the carrier cleaning section. Thus, the cleaned carrier may be returned to the second transport path at an appropriate timing.

(5)亦可為,載體洗淨部自第2搬送路徑中之第2待機部拾起空的載體。該情形時,由於第2待機部位於第2搬送路徑之起點,故防止用將處理複數片基板之使用後之載體以未被洗淨之狀態遍及第2搬送路徑之廣範圍搬送。因此,抑制第2搬送路徑之污染。(5) Alternatively, the carrier cleaning section may pick up an empty carrier from the second standby section in the second transport path. In this case, since the second standby section is at the starting point of the second transport path, it is prevented that a carrier used to process a plurality of substrates is transported over a wide range of the second transport path in an unwashed state. Therefore, contamination of the second transport path is suppressed.

(6)亦可為,載體洗淨部使洗淨後之載體返回至第2搬送路徑中之第1待機部。該情形時,由於第1待機部位於第2搬送路徑之終點,故不遍及第2搬送路徑之廣範圍搬送洗淨後之載體。因此,可不降低洗淨後之載體之清潔度,而使該載體收納未處理之複數片基板。 [發明之效果] (6) Alternatively, the carrier cleaning section may return the cleaned carrier to the first standby section in the second conveying path. In this case, since the first standby section is at the end of the second conveying path, the cleaned carrier is not conveyed over the wide range of the second conveying path. Therefore, the cleanliness of the cleaned carrier can be maintained without reducing the cleanliness of the carrier, and the carrier can accommodate a plurality of unprocessed substrates. [Effect of the invention]

根據本發明,可防止複數片基板污染,且抑制搬送裝置之構成複雜化及零件件數增加。According to the present invention, contamination of a plurality of substrates can be prevented, and the complexity of the structure of the conveying device and the increase in the number of parts can be suppressed.

以下,參考圖式且說明本發明之一實施形態之基板處理裝置。於以下說明中,基板係指用於液晶顯示裝置或有機EL(Electro Luminescence)顯示裝置等之FPD(Flat Panel Display)用基板、半導體基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用基板、陶瓷基板或太陽能電池用基板等。又,以下說明之基板於俯視下具有矩形狀。Hereinafter, a substrate processing device according to an embodiment of the present invention will be described with reference to the drawings. In the following description, a substrate refers to a FPD (Flat Panel Display) substrate, a semiconductor substrate, an optical disk substrate, a magnetic disk substrate, a magneto-optical disk substrate, a mask substrate, a ceramic substrate, or a solar cell substrate, etc., which is used for a liquid crystal display device or an organic EL (Electro Luminescence) display device. In addition, the substrate described below has a rectangular shape when viewed from above.

<1>基板處理裝置之構成 (1)全體構成及方向之定義 圖1係顯示本發明之一實施形態之基板處理裝置之基本構成之模式性俯視圖。圖2係圖1之A-A線處之基板處理裝置1之模式性剖視圖。如圖1及圖2所示,基板處理裝置1主要具備基板搬入搬出區塊100、中繼區塊200、處理區塊300及洗淨區塊400。 <1> Structure of substrate processing apparatus (1) Definition of overall structure and direction FIG. 1 is a schematic top view showing the basic structure of a substrate processing apparatus of one embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus 1 at line A-A of FIG. 1 . As shown in FIG. 1 and FIG. 2 , the substrate processing apparatus 1 mainly includes a substrate loading and unloading block 100, a relay block 200, a processing block 300, and a cleaning block 400.

此處,於圖1及圖2之後之指定圖中,為明確基板處理裝置1之各構成要件之位置關係,而標註表示互相正交之X方向、Y方向及Z方向之箭頭。X方向及Y方向於水平面內互相正交,Z方向相當於鉛直方向。又,於各方向中將箭頭所朝向之方向設為+方向,將與該+方向相反之方向設為-方向。於以下說明中,於簡稱為X方向之情形時,該X方向包含+X方向及-X方向。又,於簡稱為Y方向之情形時,該Y方向包含+Y方向及-Y方向。又,於簡稱為Z方向之情形時,該Z方向包含+Z方向及-Z方向。Here, in the designated figures after FIG. 1 and FIG. 2, in order to clarify the positional relationship of each component of the substrate processing device 1, arrows representing mutually orthogonal X direction, Y direction and Z direction are marked. The X direction and the Y direction are mutually orthogonal in the horizontal plane, and the Z direction is equivalent to the vertical direction. Moreover, in each direction, the direction pointed by the arrow is set as the + direction, and the direction opposite to the + direction is set as the - direction. In the following description, when it is simply referred to as the X direction, the X direction includes the +X direction and the -X direction. Moreover, when it is simply referred to as the Y direction, the Y direction includes the +Y direction and the -Y direction. Moreover, when it is simply referred to as the Z direction, the Z direction includes the +Z direction and the -Z direction.

(2)基板搬入搬出區塊100 基板搬入搬出區塊100包含複數個晶圓傳送盒架110、晶圓傳送盒搬送裝置111、112、開閉器120、130、基板交接機器人140、150、2個晶圓傳送盒載置部190及控制部160(圖2)。又,基板搬入搬出區塊100具有構成基板處理裝置1之外壁之一部分之端面部101、一側面部102及另一側面部103。端面部101位於朝向-X方向之基板處理裝置1之一端部,且與X方向正交。一側面部102及另一側面部103以於Y方向上互相對向之方式,於俯視下自端面部101之兩端部朝+X方向平行延伸。 (2) Substrate loading and unloading block 100 The substrate loading and unloading block 100 includes a plurality of wafer cassette racks 110, wafer cassette transport devices 111, 112, openers 120, 130, substrate transfer robots 140, 150, two wafer cassette loading units 190, and a control unit 160 (Figure 2). In addition, the substrate loading and unloading block 100 has an end portion 101, a side portion 102, and another side portion 103 that constitute a part of the outer wall of the substrate processing device 1. The end portion 101 is located at one end of the substrate processing device 1 facing the -X direction and is orthogonal to the X direction. The side portion 102 and the other side portion 103 extend parallel to each other in the Y direction from both ends of the end portion 101 in a plan view toward the +X direction.

2個晶圓傳送盒載置部190以自端面部101朝-X方向突出之方式設置。各晶圓傳送盒載置部190構成為可載置多段收納複數片基板之晶圓傳送盒(FOUP:Front Opening Unified Pod)8。於端面部101中,於與各晶圓傳送盒載置部190對應之部分,形成有用以使晶圓傳送盒8於X方向通過之未圖示之通路開口部。Two wafer cassette loading sections 190 are provided so as to protrude from the end surface 101 in the -X direction. Each wafer cassette loading section 190 is configured to load a wafer cassette (FOUP: Front Opening Unified Pod) 8 that can store multiple substrates in multiple stages. In the end surface 101, at a portion corresponding to each wafer cassette loading section 190, a passage opening (not shown) is formed for allowing the wafer cassette 8 to pass in the X direction.

於晶圓傳送盒8中,形成有用以自該晶圓傳送盒8之內部空間取出基板、及用以將基板插入該晶圓傳送盒8之內部空間之開口部。又,晶圓傳送盒8包含用以將該開口部開閉之蓋。晶圓傳送盒8之開口部於晶圓傳送盒8之搬送時及待機時封閉,於對晶圓傳送盒8取出及插入基板時開放。於圖1及圖2中,為可明確區分晶圓傳送盒8與後述之載體9,對晶圓傳送盒8標註有陰影線,對載體9標註有點圖案。於圖1之例中,於排列在Y方向之2個晶圓傳送盒載置部190中之一晶圓傳送盒載置部190載置有晶圓傳送盒8,於另一晶圓傳送盒載置部190未載置晶圓傳送盒8。晶圓傳送盒8之數量或晶圓傳送盒架110之排列可根據裝置設計規格適當變更。The wafer transfer box 8 has an opening for taking out a substrate from the inner space of the wafer transfer box 8 and for inserting a substrate into the inner space of the wafer transfer box 8. The wafer transfer box 8 also includes a cover for opening and closing the opening. The opening of the wafer transfer box 8 is closed when the wafer transfer box 8 is being transported and on standby, and is opened when taking out and inserting a substrate into the wafer transfer box 8. In FIG. 1 and FIG. 2, in order to clearly distinguish the wafer transfer box 8 from the carrier 9 described later, the wafer transfer box 8 is marked with a hatched line, and the carrier 9 is marked with a dot pattern. In the example of FIG. 1 , one of the two wafer cassette loading sections 190 arranged in the Y direction has a wafer cassette 8 loaded thereon, and the other wafer cassette loading section 190 has no wafer cassette 8 loaded thereon. The number of wafer cassettes 8 or the arrangement of the wafer cassette racks 110 may be appropriately changed according to the device design specifications.

複數個晶圓傳送盒架110於與端面部101在+X方向上離開規定距離之位置,以互相隔開之方式設置。本例中,16個晶圓傳送盒架110以於與Z方向及Y方向平行之面內呈4列4行排列之方式,藉由未圖示之固定構件固定。各晶圓傳送盒架110構成為可載置晶圓傳送盒8。於圖1之例中,於位於最上段之4個晶圓傳送盒架110中之3個晶圓傳送盒架110各者載置有晶圓傳送盒8,於剩餘之1個晶圓傳送盒架110未載置晶圓傳送盒8。A plurality of wafer transfer box racks 110 are arranged at a predetermined distance from the end surface portion 101 in the +X direction in a manner of being spaced apart from each other. In this example, 16 wafer transfer box racks 110 are arranged in 4 rows and 4 columns in a plane parallel to the Z direction and the Y direction and are fixed by a fixing member not shown in the figure. Each wafer transfer box rack 110 is configured to carry a wafer transfer box 8. In the example of FIG. 1 , three of the four wafer transfer box racks 110 located at the uppermost stage are each loaded with a wafer transfer box 8, and the remaining one wafer transfer box rack 110 is not loaded with a wafer transfer box 8.

2個開閉器120、130於與複數個晶圓傳送盒架110在+X方向上離開規定距離之位置,以互相隔開之方式設置。本例中,2個開閉器120、130以於Y方向上排列之方式,藉由未圖示之固定構件固定。一開閉器120位於一側面部102附近,另一開閉器130位於另一側面部103附近。各開閉器120、130構成為可載置晶圓傳送盒8且可將所載置之晶圓傳送盒8之蓋開閉。於圖1之例中,於一開閉器120載置有晶圓傳送盒8,於另一開閉器130上未載置晶圓傳送盒8。Two openers 120 and 130 are arranged at a predetermined distance from a plurality of wafer cassette racks 110 in the +X direction and are spaced apart from each other. In this example, the two openers 120 and 130 are arranged in the Y direction and fixed by a fixing member not shown. One opener 120 is located near one side surface 102, and the other opener 130 is located near the other side surface 103. Each opener 120 and 130 is configured to carry a wafer cassette 8 and to open and close the cover of the carried wafer cassette 8. In the example of FIG. 1 , a wafer cassette 8 is carried on one opener 120, and no wafer cassette 8 is carried on the other opener 130.

基板交接機器人140設置為於+X方向上與開閉器120相鄰。基板交接機器人140構成為可繞Z方向之軸旋轉且可沿Z方向移動(可升降)。於基板交接機器人140中,設置有用以交接1片或複數片基板之手。手由多關節型臂支持,可於水平方向進退。基板交接機器人140用於在將收納有未處理之基板之晶圓傳送盒8載置於開閉器120之狀態下,自該晶圓傳送盒8取出基板,並將取出之基板插入配置於中繼區塊200內之後述之載體9內。The substrate transfer robot 140 is arranged adjacent to the switch 120 in the +X direction. The substrate transfer robot 140 is configured to be rotatable around an axis in the Z direction and movable (liftable) in the Z direction. The substrate transfer robot 140 is provided with a hand for transferring one or more substrates. The hand is supported by a multi-joint arm and can move forward and backward in the horizontal direction. The substrate transfer robot 140 is used to take out a substrate from a wafer transfer box 8 containing unprocessed substrates while the wafer transfer box 8 is placed on the switch 120, and insert the taken-out substrate into a carrier 9 described later and arranged in the relay block 200.

基板交接機器人150設置為於+X方向上與開閉器130相鄰。基板交接機器人150具有與基板交接機器人140相同之構成。基板交接機器人150用於在將空的晶圓傳送盒8載置於開閉器130之狀態下,自配置於中繼區塊200內之後述之載體9中取出基板,並將取出之基板插入開閉器130上之晶圓傳送盒8內。The substrate transfer robot 150 is disposed adjacent to the shutter 130 in the +X direction. The substrate transfer robot 150 has the same structure as the substrate transfer robot 140. The substrate transfer robot 150 is used to take out a substrate from a carrier 9 (described later) disposed in the relay block 200 while an empty wafer cassette 8 is placed on the shutter 130, and insert the taken-out substrate into the wafer cassette 8 on the shutter 130.

晶圓傳送盒搬送裝置111位於X方向上之端面部101與複數個晶圓傳送盒架110之間。晶圓傳送盒搬送裝置111具有構成為可固持晶圓傳送盒8之未圖示之固持部,且構成為可使該固持部於Y方向移動及於Z方向移動。藉此,晶圓傳送盒搬送裝置111於2個晶圓傳送盒載置部190之任一者、與複數個晶圓傳送盒架110之任一者之間搬送晶圓傳送盒8。The wafer cassette transport device 111 is located between the end surface portion 101 in the X direction and the plurality of wafer cassette racks 110. The wafer cassette transport device 111 has a holding portion (not shown) configured to hold the wafer cassette 8, and is configured to move the holding portion in the Y direction and in the Z direction. Thus, the wafer cassette transport device 111 transports the wafer cassette 8 between any one of the two wafer cassette placement portions 190 and any one of the plurality of wafer cassette racks 110.

晶圓傳送盒搬送裝置112位於X方向上之複數個晶圓傳送盒架110與2個開閉器120、130之間。晶圓傳送盒搬送裝置112具有與晶圓傳送盒搬送裝置111相同之構成。晶圓傳送盒搬送裝置112於複數個晶圓傳送盒架110之任一者、與2個開閉器120、130之任一者之間搬送晶圓傳送盒8。The wafer cassette transport device 112 is located between the plurality of wafer cassette racks 110 and the two shutters 120 and 130 in the X direction. The wafer cassette transport device 112 has the same structure as the wafer cassette transport device 111. The wafer cassette transport device 112 transports the wafer cassette 8 between any one of the plurality of wafer cassette racks 110 and any one of the two shutters 120 and 130.

控制部160(圖2)包含含有CPU(Central Processing Unit:中央處理單元)、ROM(Read Only Memory:唯讀記憶體)及RAM(Random Access Memory:隨機存取記憶體)之電腦等,且控制基板處理裝置1內之各構成要件之動作。The control unit 160 ( FIG. 2 ) includes a computer including a CPU (Central Processing Unit), a ROM (Read Only Memory), and a RAM (Random Access Memory), and controls the operation of each component in the substrate processing apparatus 1 .

(3)中繼區塊200 中繼區塊200主要具備2個載體支持部210、220、第1待機部230、第2待機部240及待機搬送裝置250。載體支持部210設置為於+X方向上與基板搬入搬出區塊100之基板交接機器人140相鄰。又,載體支持部210構成為可支持多段收納複數片基板之載體9。稍後敘述載體9之細節。再者,載體支持部210構成為可支持載體9,且變更所支持之載體9之姿勢。稍後敘述用以變更載體9之姿勢之載體支持部210之構成之細節。另,於圖1之例中,於載體支持部210上支持有載體9。 (3) Relay block 200 The relay block 200 mainly includes two carrier support sections 210 and 220, a first standby section 230, a second standby section 240, and a standby conveyor 250. The carrier support section 210 is disposed adjacent to the substrate transfer robot 140 of the substrate loading and unloading block 100 in the +X direction. In addition, the carrier support section 210 is configured to support a carrier 9 that stores a plurality of substrates in multiple stages. The details of the carrier 9 will be described later. Furthermore, the carrier support section 210 is configured to support the carrier 9 and change the posture of the supported carrier 9. The details of the structure of the carrier support section 210 for changing the posture of the carrier 9 will be described later. In addition, in the example of FIG. 1 , a carrier 9 is supported on the carrier support portion 210 .

載體支持部220設置為於+X方向上與基板搬入搬出區塊100之基板交接機器人150相鄰。又,載體支持部220具有與載體支持部210相同之構成。另,於圖1之例中,於載體支持部220上未支持載體9。The carrier support part 220 is disposed adjacent to the substrate transfer robot 150 of the substrate loading/unloading block 100 in the +X direction. The carrier support part 220 has the same structure as the carrier support part 210. In the example of FIG. 1 , the carrier 9 is not supported on the carrier support part 220.

第1待機部230設置為於+X方向上與載體支持部210相鄰。又,第1待機部230構成為可支持載體9。再者,第1待機部230構成為可將由該第1待機部230支持之載體9移交給載體支持部210、及自載體支持部210接收由載體支持部210支持之載體9。The first standby section 230 is disposed adjacent to the carrier support section 210 in the +X direction. The first standby section 230 is configured to support the carrier 9. Furthermore, the first standby section 230 is configured to transfer the carrier 9 supported by the first standby section 230 to the carrier support section 210 and receive the carrier 9 supported by the carrier support section 210 from the carrier support section 210.

第2待機部240設置為於+X方向上與載體支持部220相鄰。又,第2待機部240構成為可支持載體9。再者,第2待機部240構成為可將由該第2待機部240支持之載體9移交給載體支持部220、及自載體支持部220接收由載體支持部220支持之載體9。The second standby section 240 is disposed adjacent to the carrier support section 220 in the +X direction. The second standby section 240 is configured to support the carrier 9. Furthermore, the second standby section 240 is configured to transfer the carrier 9 supported by the second standby section 240 to the carrier support section 220 and receive the carrier 9 supported by the carrier support section 220 from the carrier support section 220.

待機搬送裝置250設置於第1待機部230與第2待機部240之間。待機搬送裝置250構成為可保持載體9且可於第1待機部230與第2待機部240之間於Y方向移動。待機搬送裝置250例如將由第2待機部240支持之載體9搬送至第1待機部230。The standby conveying device 250 is provided between the first standby section 230 and the second standby section 240. The standby conveying device 250 is configured to hold the carrier 9 and to be movable in the Y direction between the first standby section 230 and the second standby section 240. The standby conveying device 250 conveys the carrier 9 supported by the second standby section 240 to the first standby section 230, for example.

(4)處理區塊300 處理區塊300包含第1搬送部310、第2搬送部320及處理部330。第1搬送部310及處理部330設置為依序排列於+Y方向上,且自中繼區塊200朝+X方向並行延伸。第2搬送部320以於Y方向延伸之方式形成,連接第1搬送部310之朝向+X方向之端部、與處理部330之朝向+X方向之端部。 (4) Processing block 300 The processing block 300 includes a first conveying unit 310, a second conveying unit 320, and a processing unit 330. The first conveying unit 310 and the processing unit 330 are arranged in sequence in the +Y direction and extend in parallel from the relay block 200 in the +X direction. The second conveying unit 320 is formed in a manner extending in the Y direction, connecting the end of the first conveying unit 310 facing the +X direction and the end of the processing unit 330 facing the +X direction.

於以下說明中,將於X方向延伸之第1搬送部310之兩端部中朝向-X方向之端部適當稱為第1端部TA1,將朝向+X方向之另一端部適當稱為第2端部TA2。又,將於X方向延伸之處理部330之兩端部中朝向-X方向之一端部適當稱為第3端部TA3,將朝向+X方向之另一端部適當稱為第4端部TA4。In the following description, of the two ends of the first conveying unit 310 extending in the X direction, the end facing the -X direction is appropriately referred to as the first end TA1, and the other end facing the +X direction is appropriately referred to as the second end TA2. In addition, of the two ends of the processing unit 330 extending in the X direction, one end facing the -X direction is appropriately referred to as the third end TA3, and the other end facing the +X direction is appropriately referred to as the fourth end TA4.

第1搬送部310包含主搬送裝置311及2個副搬送裝置312A、312B。主搬送裝置311包含可動載台311a及導軌311b。導軌311b設置為自第1搬送部310之第1端部TA1延伸至第2端部TA2。可動載台311a構成為可於導軌311b上於X方向移動且可載置載體9。主搬送裝置311進而具備使可動載台311a於導軌311b上沿X方向移動之未圖示之驅動機構。藉此,主搬送裝置311於在靠近中繼區塊200之第1端部TA1,將載體9載置於可動載台311a上之情形時,將所載置之載體9於+X方向上搬送至靠近第2搬送部320之第2端部TA2。The first conveying section 310 includes a main conveying device 311 and two auxiliary conveying devices 312A and 312B. The main conveying device 311 includes a movable stage 311a and a guide rail 311b. The guide rail 311b is provided to extend from the first end TA1 to the second end TA2 of the first conveying section 310. The movable stage 311a is configured to be movable in the X direction on the guide rail 311b and to carry the carrier 9. The main conveying device 311 further includes a driving mechanism (not shown) that moves the movable stage 311a along the guide rail 311b in the X direction. Thereby, when the main transport device 311 places the carrier 9 on the movable stage 311 a at the first end TA1 close to the relay block 200 , the placed carrier 9 is transported in the +X direction to the second end TA2 close to the second transport unit 320 .

副搬送裝置312A及副搬送裝置312B分別設置於X方向上之第1搬送部310之第1端部TA1及第2端部TA2。副搬送裝置312A於載體支持部210支持有收納未處理之基板之載體9之情形時,將該載體9載置於在第1端部TA1配置之主搬送裝置311之可動載台311a上。又,副搬送裝置312A自第1待機部230向載體支持部210搬送空的載體9。另一方面,副搬送裝置312B於載置有載體9之可動載台311a移動至第2端部TA2之情形時,將該載體9移交給第2搬送部320之後述之搬送裝置321。The auxiliary conveying device 312A and the auxiliary conveying device 312B are respectively provided at the first end TA1 and the second end TA2 of the first conveying section 310 in the X direction. When the carrier support section 210 supports the carrier 9 storing an unprocessed substrate, the auxiliary conveying device 312A places the carrier 9 on the movable stage 311a of the main conveying device 311 arranged at the first end TA1. In addition, the auxiliary conveying device 312A conveys an empty carrier 9 from the first standby section 230 to the carrier support section 210. On the other hand, when the movable stage 311a carrying the carrier 9 moves to the second end TA2, the auxiliary conveying device 312B transfers the carrier 9 to the conveying device 321 described later of the second conveying section 320.

此處,如圖2所示,第1搬送部310設置於與基板處理裝置1之設置面於+Z方向(上方)上離開之位置。藉此,位於第1搬送部310之-Z方向(下方)之空間可作為後述之用以保養處理部330之保養空間MS1使用。因此,於本實施形態之基板處理裝置1中,如圖1所示,於俯視下第1搬送部310與處理部330之保養空間MS1重疊。於後述之圖8中,於保養空間MS1中,顯示於第1搬送部310之下方對處理部330進行保養作業之作業者WP。Here, as shown in FIG. 2 , the first conveying unit 310 is disposed at a position separated from the installation surface of the substrate processing apparatus 1 in the +Z direction (upper direction). Thus, the space located in the -Z direction (lower direction) of the first conveying unit 310 can be used as a maintenance space MS1 for maintaining the processing unit 330 described later. Therefore, in the substrate processing apparatus 1 of the present embodiment, as shown in FIG. 1 , the first conveying unit 310 and the maintenance space MS1 of the processing unit 330 overlap in a top view. In FIG. 8 described later, in the maintenance space MS1, an operator WP performing maintenance work on the processing unit 330 is shown below the first conveying unit 310.

第2搬送部320包含搬送裝置321。搬送裝置321構成為可支持載體9,且變更所支持之載體9之姿勢。稍後敘述用以變更載體9之姿勢之搬送裝置321之構成之細節。再者,搬送裝置321構成為可於Y方向移動。藉此,第2搬送部320可於第1搬送部310之第2端部TA2附近,自副搬送裝置312B接收載體9。又,第2搬送部320可變更自副搬送裝置312B接收到之載體9之姿勢,並使該載體9移動至處理部330之第4端部TA4附近之位置。The second conveying section 320 includes a conveying device 321. The conveying device 321 is configured to support the carrier 9 and change the posture of the supported carrier 9. The details of the structure of the conveying device 321 for changing the posture of the carrier 9 will be described later. Furthermore, the conveying device 321 is configured to be movable in the Y direction. Thereby, the second conveying section 320 can receive the carrier 9 from the auxiliary conveying device 312B near the second end TA2 of the first conveying section 310. In addition, the second conveying section 320 can change the posture of the carrier 9 received from the auxiliary conveying device 312B and move the carrier 9 to a position near the fourth end TA4 of the processing section 330.

處理部330包含複數個(本例中為5個)液體處理單元331、乾燥單元332及(本例中為3個)複數個主搬送裝置333A、333B、333C。複數個液體處理單元331及乾燥單元332以乾燥單元332位於第3端部TA3之方式排列於X方向。The processing section 330 includes a plurality of (five in this example) liquid processing units 331, a drying unit 332, and a plurality of (three in this example) main transport devices 333A, 333B, and 333C. The plurality of liquid processing units 331 and the drying unit 332 are arranged in the X direction such that the drying unit 332 is located at the third end TA3.

複數個主搬送裝置333A、333B、333C設置為依序自第3端部TA3朝向第4端部TA4排列於沿+X方向延伸之一條直線上。各主搬送裝置333A、333B、333C構成為可保持載體9,且構成為可於複數個液體處理單元331及乾燥單元332之間搬送所保持之載體9。位於離中繼區塊200最遠之位置之主搬送裝置333C於第2搬送部320中將載體9搬送至處理部330附近之情形時,接收該載體9。又,主搬送裝置333C將接收到之載體9搬送至複數個液體處理單元331之任一者。The plurality of main transport devices 333A, 333B, and 333C are arranged in sequence from the third end TA3 toward the fourth end TA4 on a straight line extending in the +X direction. Each of the main transport devices 333A, 333B, and 333C is configured to hold the carrier 9 and to transport the held carrier 9 between the plurality of liquid processing units 331 and the drying unit 332. The main transport device 333C located at the farthest position from the relay block 200 receives the carrier 9 when the second transport unit 320 transports the carrier 9 to the vicinity of the processing unit 330. Furthermore, the main transport device 333C transports the received carrier 9 to any one of the plurality of liquid processing units 331.

複數個液體處理單元331各自具備1個或複數個處理槽331a及升降機331b。本例之各液體處理單元331具備2個處理槽331a。各處理槽331a構成為可自該處理槽331a之上方之位置插入及取出載體9。又,於處理槽331a中,貯存有用以將收納於載體9之複數片基板洗淨之處理液(藥液或清洗液)。Each of the plurality of liquid processing units 331 has one or more processing tanks 331a and an elevator 331b. In this example, each liquid processing unit 331 has two processing tanks 331a. Each processing tank 331a is configured so that the carrier 9 can be inserted and removed from the upper position of the processing tank 331a. In addition, the processing tank 331a stores a processing liquid (chemical liquid or cleaning liquid) for cleaning the plurality of substrates stored in the carrier 9.

各液體處理單元331之升降機331b構成為可保持載體9。又,升降機331b構成為可自複數個主搬送裝置333A、333B、333C之任一者接收載體9、及將載體9移交給複數個主搬送裝置333A、333B、333C之任一者。再者,升降機331b構成為可對該液體處理單元331之2個處理槽331a各者,將載體9浸漬於處理液中、及自處理液中提起載體9。藉此,藉由將收納有未處理之基板之載體9移交給處理部330,而將收納於該載體9之複數片基板於1種或複數種處理液中浸漬規定時間,而對複數片基板進行共通之處理。The lift 331b of each liquid processing unit 331 is configured to hold the carrier 9. Furthermore, the lift 331b is configured to receive the carrier 9 from any one of the plurality of main transport devices 333A, 333B, and 333C, and to transfer the carrier 9 to any one of the plurality of main transport devices 333A, 333B, and 333C. Furthermore, the lift 331b is configured to immerse the carrier 9 in the processing liquid and to lift the carrier 9 from the processing liquid for each of the two processing tanks 331a of the liquid processing unit 331. Thus, by transferring the carrier 9 containing the unprocessed substrate to the processing unit 330, the plurality of substrates stored in the carrier 9 are immersed in one or more processing liquids for a predetermined time, and the plurality of substrates are subjected to a common process.

乾燥單元332對由位於最靠近中繼區塊200之位置之主搬送裝置333A搬送之載體9進行乾燥處理。藉由該乾燥處理,收納於載體9內之複數片基板乾燥。乾燥處理後之載體9藉由位於最靠近中繼區塊200之位置之主搬送裝置333A移交給中繼區塊200之第2待機部240。The drying unit 332 performs a drying process on the carrier 9 transported by the main transport device 333A located closest to the relay block 200. The plurality of substrates stored in the carrier 9 are dried by the drying process. The carrier 9 after the drying process is transferred to the second standby unit 240 of the relay block 200 by the main transport device 333A located closest to the relay block 200.

此處,於複數個液體處理單元331之複數個處理槽331a,將分別與應對基板進行之複數個處理對應之複數種處理液以依應對基板進行之處理之順序排列於-X方向之方式貯存。圖2之控制部160容許主搬送裝置333A、333B、333C各者於保持載體9之狀態下於-X方向移動,且限制於保持載體9之狀態下於+X方向移動。該情形時,於藉由複數個主搬送裝置333A、333B、333C搬送複數個載體9時,抑制因一載體9與另一載體9互相朝相反方向移動引起之干擾之產生。又,由於載體9於處理部330內不於X方向往復移動,故處理部330中之載體9之搬送路徑之長度不超過處理部330之X方向之長度。Here, in the plurality of processing tanks 331a of the plurality of liquid processing units 331, a plurality of processing liquids corresponding to the plurality of processing to be performed on the substrate are stored in the order of the processing to be performed on the substrate in the -X direction. The control unit 160 of FIG. 2 allows each of the main transport devices 333A, 333B, and 333C to move in the -X direction while holding the carrier 9, and restricts the movement in the +X direction while holding the carrier 9. In this case, when the plurality of carriers 9 are transported by the plurality of main transport devices 333A, 333B, and 333C, the generation of interference caused by one carrier 9 and another carrier 9 moving in opposite directions is suppressed. In addition, since the carrier 9 does not reciprocate in the X direction in the processing section 330, the length of the transport path of the carrier 9 in the processing section 330 does not exceed the length of the processing section 330 in the X direction.

如圖1中虛線所示,於處理區塊300及其附近之區域中,除上述保養空間MS1外,還於處理部330之+Y方向側進而形成有保養空間MS2。如此,藉由以於Y方向上隔著處理部330之方式形成2個保養空間MS1、MS2,而確保對於處理部330之足夠大之保養空間。As shown by the dotted line in FIG1 , in the processing block 300 and the vicinity thereof, in addition to the maintenance space MS1, a maintenance space MS2 is formed laterally in the +Y direction of the processing section 330. In this way, by forming two maintenance spaces MS1 and MS2 in a manner that separates the processing section 330 in the Y direction, a sufficiently large maintenance space is ensured for the processing section 330.

(5)洗淨區塊400 洗淨區塊400包含洗淨搬送裝置410及載體洗淨單元420。載體洗淨單元420設置為於基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置於X方向延伸。又,載體洗淨單元420包含以於X方向排列之方式設置之1個或複數個(本例中為3個)載體洗淨槽421、1個或複數個(本例中為1個)載體乾燥部422及1個或複數個(本例中為2個)載體待機部423。 (5) Cleaning block 400 The cleaning block 400 includes a cleaning conveying device 410 and a carrier cleaning unit 420. The carrier cleaning unit 420 is provided to extend in the X direction at a position to the side (+Y direction) of the substrate loading and unloading block 100 and the relay block 200. In addition, the carrier cleaning unit 420 includes one or more (three in this example) carrier cleaning tanks 421 arranged in the X direction, one or more (one in this example) carrier drying sections 422, and one or more (two in this example) carrier standby sections 423.

1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423各者構成為可自該槽、乾燥部或待機部之上方之位置插入及取出載體9。又,於1個或複數個載體洗淨槽421各者,貯存有用以將載體9洗淨之處理液(藥液或清洗液)。1個或複數個載體乾燥部422各者對插入之載體9進行乾燥處理。Each of one or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 is configured to allow the carrier 9 to be inserted and removed from a position above the tank, drying section, or standby section. In addition, each of one or more carrier cleaning tanks 421 stores a treatment liquid (chemical solution or cleaning liquid) for cleaning the carrier 9. Each of one or more carrier drying sections 422 performs a drying process on the inserted carrier 9.

洗淨搬送裝置410構成為可於中繼區塊200之第2待機部240、1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間,搬送空的載體9。於洗淨區塊400中,於複數個載體洗淨槽421之間搬送空的載體9,且浸漬於貯存在1個或複數個載體洗淨槽421中之任一載體洗淨槽421之處理液中。藉此,將處理區塊300中用於處理複數片基板後之空的載體9洗淨。The cleaning and transporting device 410 is configured to transport an empty carrier 9 between the second standby section 240, one or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 of the relay block 200. In the cleaning block 400, the empty carrier 9 is transported between the plurality of carrier cleaning tanks 421 and immersed in the processing liquid stored in any one of the one or more carrier cleaning tanks 421. In this way, the empty carrier 9 after being used to process a plurality of substrates in the processing block 300 is cleaned.

將洗淨後之載體9搬送至1個或複數個載體乾燥部422中之任一者之載體乾燥部422,進行乾燥處理。將乾燥後之載體9搬送至1個或複數個載體待機部423中之任一者之載體待機部423並予以保持。其後,根據中繼區塊200中之複數片基板之接收時序,藉由洗淨搬送裝置410自載體待機部423取出,並搬送至中繼區塊200之第2待機部240。The cleaned carrier 9 is transported to one or more carrier drying sections 422 for drying. The dried carrier 9 is transported to one or more carrier standby sections 423 for holding. Thereafter, the carrier 9 is taken out from the carrier standby section 423 by the cleaning transport device 410 according to the receiving sequence of the plurality of substrates in the relay block 200 and transported to the second standby section 240 of the relay block 200.

<2>載體9之構成及載體9之姿勢 圖3係圖1之基板處理裝置1中使用之載體9之俯視圖,圖4係圖3之載體9之一側視圖,圖5係圖4之B-B線處之載體9之剖視圖。如圖3~圖5所示,載體9包含4個框架構件10a、10b、10c、10d。 <2> Structure of carrier 9 and posture of carrier 9 FIG. 3 is a top view of carrier 9 used in substrate processing device 1 of FIG. 1 , FIG. 4 is a side view of carrier 9 of FIG. 3 , and FIG. 5 is a cross-sectional view of carrier 9 at line B-B of FIG. 4 . As shown in FIG. 3 to FIG. 5 , carrier 9 includes four frame members 10a, 10b, 10c, and 10d.

框架構件10a、10b各者由大致正方形之板狀構件形成,具有較處理對象之基板大之外形。於框架構件10a、10b各者之中央部分,形成有4個開口部13。框架構件10c、10d各者由大致長方形之板狀構件形成。框架構件10c、10d之長邊之長度與框架構件10a、10b之一邊之長度大致相等。Each of the frame members 10a and 10b is formed of a substantially square plate-shaped member and has a larger shape than the substrate to be processed. Four openings 13 are formed in the central portion of each of the frame members 10a and 10b. Each of the frame members 10c and 10d is formed of a substantially rectangular plate-shaped member. The length of the long side of the frame members 10c and 10d is substantially equal to the length of one side of the frame members 10a and 10b.

框架構件10a、10b配置為以互相對向之狀態隔開。以將框架構件10a之一側邊與框架構件10b之一側邊連接之方式設置有框架構件10c。以將框架構件10a之另一側邊與框架構件10b之另一側邊連接之方式設置有框架構件10d。於該狀態下,框架構件10c、10d亦互相對向配置。藉此,載體9具有角筒形狀。The frame members 10a and 10b are arranged to be spaced apart in a mutually opposed state. The frame member 10c is provided in a manner that one side of the frame member 10a is connected to one side of the frame member 10b. The frame member 10d is provided in a manner that the other side of the frame member 10a is connected to the other side of the frame member 10b. In this state, the frame members 10c and 10d are also arranged to be mutually opposed. Thereby, the carrier 9 has a square tube shape.

形成於具有角筒形狀之載體9之一端部之矩形之開口部作為用以將基板插入載體9內、及用以自載體9取出基板之基板出入口12發揮功能。於載體9之另一端部,以將框架構件10a與框架構件10b之間連接且於框架構件10c與框架構件10d之間分散配置之方式,設置有複數個(本例中為6個)支持片11。The rectangular opening formed at one end of the carrier 9 having a square tube shape functions as a substrate entrance 12 for inserting a substrate into the carrier 9 and for taking a substrate out of the carrier 9. At the other end of the carrier 9, a plurality of (six in this example) supporting pieces 11 are provided in a manner connecting the frame members 10a and 10b and dispersedly arranged between the frame members 10c and 10d.

各支持片11由長條狀之板構件構成,且設置成與框架構件10c、10d平行。又,於各支持片11中,以預設之基準間距形成有可供收納於載體9之複數片基板之外緣之一部分插入之未圖示之複數個溝槽。形成於各支持片11之溝槽之數量與應收納於載體9之基板之數量相等。Each support sheet 11 is formed of a long strip plate member and is arranged parallel to the frame members 10c and 10d. In addition, each support sheet 11 is provided with a plurality of grooves (not shown) at a preset reference pitch into which a portion of the outer edges of the plurality of substrates to be accommodated in the carrier 9 can be inserted. The number of grooves formed in each support sheet 11 is equal to the number of substrates to be accommodated in the carrier 9.

於框架構件10c、10d之互相對向之2個面各者,形成有複數個突出部pr。複數個突出部pr形成為沿框架構件10c、10d之長邊方向延伸,且以上述基準間距排列於短邊方向上。藉此,於彼此相鄰之各2個之突出部pr之間,形成有可供基板之外緣插入之溝槽。A plurality of protrusions pr are formed on each of the two mutually facing surfaces of the frame members 10c and 10d. The plurality of protrusions pr are formed to extend along the long side direction of the frame members 10c and 10d and are arranged in the short side direction at the above-mentioned reference pitch. Thus, a groove into which the outer edge of the substrate can be inserted is formed between each two adjacent protrusions pr.

如上所述,於圖1之基板處理裝置1中,適當變更載體9之姿勢。此處,關於具有上述構成之載體9,將以複數個支持片11位於下端部且框架構件10a、10b與鉛直方向平行之方式維持之姿勢稱為鉛直姿勢。另一方面,將以框架構件10a、10b與鉛直方向正交之方式維持之姿勢稱為水平姿勢。As described above, in the substrate processing apparatus 1 of FIG. 1 , the posture of the carrier 9 is appropriately changed. Here, regarding the carrier 9 having the above-mentioned structure, the posture in which the plurality of support pieces 11 are located at the lower end and the frame members 10a, 10b are maintained in parallel with the vertical direction is referred to as the vertical posture. On the other hand, the posture in which the frame members 10a, 10b are maintained in a manner perpendicular to the vertical direction is referred to as the horizontal posture.

於將複數片基板插入空的載體9之情形時,自處於水平姿勢之載體9之基板出入口12將複數片基板插入載體9之內部。此時,將各基板之外緣中之兩側部(互相對向之兩條邊之部分)插入框架構件10c之複數個突出部pr中之任意2者之間及框架構件10d之複數個突出部pr中之任意2者之間。藉此,於收納有複數片基板之載體9處於水平姿勢之情形時,各基板以該基板之兩側部由複數個突出部pr支持之狀態受保持。另一方面,於收納有複數片基板之載體9處於鉛直姿勢之情形時,各基板以該基板之下端部之複數個部分嵌入複數個支持片11之複數個溝槽之狀態受保持。When inserting a plurality of substrates into an empty carrier 9, the plurality of substrates are inserted into the carrier 9 from the substrate entrance 12 of the carrier 9 in a horizontal position. At this time, the two side portions (parts of two sides facing each other) of the outer edge of each substrate are inserted between any two of the plurality of protrusions pr of the frame member 10c and between any two of the plurality of protrusions pr of the frame member 10d. Thus, when the carrier 9 storing the plurality of substrates is in a horizontal position, each substrate is held in a state where the two side portions of the substrate are supported by the plurality of protrusions pr. On the other hand, when the carrier 9 storing the plurality of substrates is in a vertical position, each substrate is held in a state where the plurality of portions of the lower end of the substrate are embedded in the plurality of grooves of the plurality of support sheets 11.

如上所述,於載體9處於水平姿勢之情形時,所收納之複數片基板各者之兩側部全體由複數個突出部pr支持。另一方面,於載體9處於鉛直姿勢之情形時,所收納之複數片基板各者藉由複數個支持片11局部支持該基板之下端部中之複數個部分。因此,於載體9處於水平姿勢之情形時,與載體9處於鉛直姿勢之情形相比,減少施加至所收納之各基板之外緣之負載(各基板之自重之負載)。As described above, when the carrier 9 is in a horizontal position, both sides of each of the plurality of substrates stored are entirely supported by the plurality of protrusions pr. On the other hand, when the carrier 9 is in a vertical position, each of the plurality of substrates stored is partially supported at a plurality of portions of the lower end of the substrate by the plurality of support sheets 11. Therefore, when the carrier 9 is in a horizontal position, the load (load of the self-weight of each substrate) applied to the outer edge of each stored substrate is reduced compared to the case where the carrier 9 is in a vertical position.

本實施形態之載體9形成為,處於水平姿勢時之該載體9之鉛直方向之尺寸(高度)小於處於鉛直姿勢時之該載體9之鉛直方向之尺寸(高度)。The carrier 9 of this embodiment is formed so that the dimension (height) of the carrier 9 in the vertical direction when in a horizontal position is smaller than the dimension (height) of the carrier 9 in the vertical direction when in a vertical position.

<3>基板處理裝置中之複數片基板及載體9之搬送路徑 圖6~圖8係用以說明圖1之基板處理裝置1中之複數片基板及載體9之搬送路徑之圖。圖6中,與圖1同樣顯示基板處理裝置1之模式性俯視圖。圖7顯示於一方向觀察圖1之基板處理裝置1之模式性外觀立體圖。圖8顯示於另一方向觀察圖1之基板處理裝置1之模式性外觀立體圖。另,於圖7及圖8中,省略圖1之洗淨區塊400之圖示。再者,於圖6~圖8中,除圖8之保養空間MS1外,亦省略圖1之保養空間MS1、MS2之圖示。 <3> Conveying path of multiple substrates and carrier 9 in substrate processing device Figures 6 to 8 are used to illustrate the conveying path of multiple substrates and carrier 9 in substrate processing device 1 of Figure 1. Figure 6 shows a schematic top view of substrate processing device 1 as in Figure 1. Figure 7 shows a schematic external perspective view of substrate processing device 1 of Figure 1 observed from one direction. Figure 8 shows a schematic external perspective view of substrate processing device 1 of Figure 1 observed from another direction. In addition, in Figures 7 and 8, the illustration of cleaning block 400 of Figure 1 is omitted. Furthermore, in Figures 6 to 8, except for maintenance space MS1 of Figure 8, the illustration of maintenance spaces MS1 and MS2 of Figure 1 is also omitted.

設想對收納於一個晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,一個晶圓傳送盒8藉由搬入至基板搬入搬出區塊100,而如圖6所示,載置於開閉器120,且將蓋打開。又,於中繼區塊200之載體支持部210上將空的載體9以水平姿勢支持。此時,載體9之基板出入口12(圖5)以與晶圓傳送盒8對向之方式朝向-X方向。於該狀態下,藉由基板交接機器人140,自一個晶圓傳送盒8取出未處理之複數片基板W,並插入至載體9。於圖6~圖8以粗虛線之箭頭a1表示此時之複數片基板W之搬送路徑。Imagine a situation where a series of processes are performed on a plurality of unprocessed substrates W stored in a wafer transfer box 8. In this situation, a wafer transfer box 8 is moved into the substrate loading and unloading block 100, and as shown in FIG6, is placed on the opening and closing device 120, and the lid is opened. In addition, an empty carrier 9 is supported in a horizontal position on the carrier support portion 210 of the relay block 200. At this time, the substrate entrance 12 (FIG. 5) of the carrier 9 is oriented in the -X direction in a manner opposite to the wafer transfer box 8. In this state, the substrate transfer robot 140 takes out a plurality of unprocessed substrates W from a wafer transfer box 8 and inserts them into the carrier 9. The thick dashed arrow a1 in FIG6 to FIG8 indicates the transfer path of the plurality of substrates W at this time.

其後,已變空之一個晶圓傳送盒8將蓋關閉,由晶圓傳送盒搬送裝置112保持,且載置於複數個晶圓傳送盒架110之任一者。另一方面,收納有複數片基板W之載體9由載體支持部210接收,藉由第1搬送部310之副搬送裝置312A載置於主搬送裝置311之可動載台311a上。圖6~圖8中以粗實線之箭頭a2表示此時之載體9之搬送路徑。After that, the empty wafer cassette 8 closes its lid, is held by the wafer cassette transfer device 112, and is placed on any one of the plurality of wafer cassette racks 110. On the other hand, the carrier 9 containing the plurality of substrates W is received by the carrier support 210, and is placed on the movable stage 311a of the main transfer device 311 by the auxiliary transfer device 312A of the first transfer unit 310. The thick solid arrow a2 in FIGS. 6 to 8 indicates the transfer path of the carrier 9 at this time.

接著,載置於可動載台311a上之載體9以水平姿勢於+X方向上自中繼區塊200之附近位置(第1端部TA1)搬送至第2搬送部320之附近位置(第2端部TA2)。於圖8之對話框BA3內,顯示藉由第1搬送部310之主搬送裝置311搬送之載體9之狀態。Next, the carrier 9 placed on the movable stage 311a is transported in a horizontal position in the +X direction from a position near the intermediate block 200 (first end TA1) to a position near the second transport unit 320 (second end TA2). In the dialog box BA3 of FIG. 8 , the state of the carrier 9 transported by the main transport device 311 of the first transport unit 310 is displayed.

其後,到達第2搬送部320之附近位置之載體9藉由第1搬送部310之副搬送裝置312B移交給第2搬送部320之搬送裝置321。因此,移交給搬送裝置321之載體9之姿勢藉由搬送裝置321而自水平姿勢變更為鉛直姿勢。於圖7之對話框BA2內,模式性顯示搬送裝置321中之載體9之姿勢變更之狀態。Thereafter, the carrier 9 that has reached the vicinity of the second conveying unit 320 is transferred to the conveying device 321 of the second conveying unit 320 by the auxiliary conveying device 312B of the first conveying unit 310. Therefore, the posture of the carrier 9 transferred to the conveying device 321 is changed from the horizontal posture to the vertical posture by the conveying device 321. In the dialog box BA2 of FIG. 7 , the state of the posture change of the carrier 9 in the conveying device 321 is schematically displayed.

如圖7之對話框BA2所示,搬送裝置321包含可動台座322及載體保持具323。可動台座322設置為可於第2搬送部320內於Y方向移動。載體保持具323由第1保持部323a及第2保持部323b構成。第1保持部323a具有可保持處於水平姿勢時之載體9之下端部之矩形之平板形狀。又,第2保持部323b具有可保持處於鉛直姿勢時之載體9之下端部之矩形之平板形狀。As shown in the dialog box BA2 of FIG. 7 , the conveying device 321 includes a movable pedestal 322 and a carrier holder 323. The movable pedestal 322 is configured to be movable in the Y direction within the second conveying section 320. The carrier holder 323 is composed of a first holder 323a and a second holder 323b. The first holder 323a has a rectangular flat plate shape that can hold the lower end of the carrier 9 when it is in a horizontal position. In addition, the second holder 323b has a rectangular flat plate shape that can hold the lower end of the carrier 9 when it is in a vertical position.

第1保持部323a及第2保持部323b以第1保持部323a之一邊與第2保持部323b之一邊互相相接且2個保持部互相正交之方式連接。可動台座322以第1保持部323a及第2保持部323b均與Y方向平行,且載體保持具323可繞於Y方向延伸之軸旋轉之方式,保持載體保持具323之一部分。The first holding portion 323a and the second holding portion 323b are connected in a manner that one side of the first holding portion 323a and one side of the second holding portion 323b are connected to each other and the two holding portions are orthogonal to each other. The movable pedestal 322 holds a portion of the carrier holder 323 in a manner that the first holding portion 323a and the second holding portion 323b are parallel to the Y direction and the carrier holder 323 can rotate around an axis extending in the Y direction.

搬送裝置321進而具有可於可動台座322上調整載體保持具323之旋轉角度之未圖示之驅動部。藉此,於自第1搬送部310接收水平姿勢之載體9之情形時,載體保持具323以第1保持部323a成為水平且第2保持部323b成為鉛直之方式調整旋轉角度。其後,於載體保持具323上接收到水平姿勢之載體9後,載體保持具323以第1保持部323a成為鉛直且第2保持部323b成為水平之方式調整旋轉角度。藉此,載體9之姿勢自水平姿勢變更為鉛直姿勢。The conveying device 321 further has a driving portion (not shown) that can adjust the rotation angle of the carrier holder 323 on the movable pedestal 322. Thereby, when receiving the carrier 9 in a horizontal position from the first conveying portion 310, the carrier holder 323 adjusts the rotation angle in a manner that the first holding portion 323a becomes horizontal and the second holding portion 323b becomes vertical. Thereafter, after receiving the carrier 9 in a horizontal position on the carrier holder 323, the carrier holder 323 adjusts the rotation angle in a manner that the first holding portion 323a becomes vertical and the second holding portion 323b becomes horizontal. Thereby, the posture of the carrier 9 is changed from a horizontal posture to a vertical posture.

搬送裝置321進而具有於第2搬送部320使可動台座322沿Y方向移動之未圖示之驅動部。藉此,以鉛直姿勢維持之載體9以鉛直姿勢於+Y方向上自第1搬送部310之附近位置搬送至處理部330之附近位置。The conveying device 321 further includes a driving unit (not shown) for moving the movable pedestal 322 in the Y direction on the second conveying unit 320. Thus, the carrier 9 maintained in a vertical position is conveyed in a vertical position in the +Y direction from a position near the first conveying unit 310 to a position near the processing unit 330.

其後,藉由處理部330之主搬送裝置333C,自搬送裝置321接收到達處理部330之附近位置之載體9。由主搬送裝置333C接收到之載體9藉由該主搬送裝置333C及其他主搬送裝置333B、333A搬送至1個或複數個液體處理單元331之任一者,且以維持鉛直姿勢之狀態於各種處理液中浸漬規定期間。藉此,對收納於載體9內之複數片基板W,進行與所浸漬之處理液相應之處理。於圖8之對話框BA4內,顯示藉由處理部330之主搬送裝置333A、333B、333C搬送之載體9之狀態。Thereafter, the carrier 9 that has arrived at the vicinity of the processing section 330 is received from the conveying device 321 by the main conveying device 333C of the processing section 330. The carrier 9 received by the main conveying device 333C is conveyed to one or more liquid processing units 331 by the main conveying device 333C and other main conveying devices 333B and 333A, and is immersed in various processing liquids for a predetermined period of time while maintaining a lead-up posture. In this way, the plurality of substrates W stored in the carrier 9 are processed according to the immersed processing liquid. In the dialog box BA4 of FIG. 8 , the state of the carrier 9 conveyed by the main conveying devices 333A, 333B, and 333C of the processing section 330 is displayed.

如圖8之對話框BA4所示,各主搬送裝置333A、333B、333C包含可動支持柱333a及一對夾盤構件333b。可動支持柱333a可於X方向移動且可於Z方向移動(可升降)而設置於複數個液體處理單元331之側方(+Y方向側)。以自可動支持柱333a之上端部向液體處理單元331之上方延伸之方式設置有一對夾盤構件333b。一對夾盤構件333b構成為可夾持並保持鉛直姿勢之載體9。再者,各主搬送裝置333A、333B、333C具有可切換藉由一對夾盤構件333b保持載體9、及自一對夾盤構件333b釋放載體9之未圖示之驅動部。藉此,於複數個主搬送裝置333A、333B、333C與複數個液體處理單元331之間進行載體9之交接。As shown in the dialog box BA4 of FIG8 , each main transport device 333A, 333B, 333C includes a movable support column 333a and a pair of chuck components 333b. The movable support column 333a is movable in the X direction and movable in the Z direction (can be raised and lowered) and is disposed on the side (+Y direction side) of the plurality of liquid processing units 331. A pair of chuck components 333b is disposed in a manner extending from the upper end of the movable support column 333a to the upper side of the liquid processing unit 331. The pair of chuck components 333b is configured to clamp and maintain the carrier 9 in an upright position. Furthermore, each main transport device 333A, 333B, 333C has a driving unit (not shown) that can switch to hold the carrier 9 through a pair of chuck components 333b and release the carrier 9 from the pair of chuck components 333b. In this way, the carrier 9 is transferred between the plurality of main transport devices 333A, 333B, 333C and the plurality of liquid processing units 331.

其後,收納由處理液處理後之複數片基板W之載體9進而搬送至靠近中繼區塊200之乾燥單元332。藉此,載體9及載體9內之複數片基板W藉由乾燥單元332乾燥。如上所述,圖6~圖8中以粗實線之箭頭a3表示處理區塊300中之載體9之一連串之搬送路徑。Thereafter, the carrier 9 containing the plurality of substrates W treated by the treatment liquid is further transported to the drying unit 332 near the intermediate block 200. Thus, the carrier 9 and the plurality of substrates W in the carrier 9 are dried by the drying unit 332. As described above, the arrow a3 in the thick solid line in FIGS. 6 to 8 indicates a series of transport paths of the carrier 9 in the treatment block 300.

收納有已處理之複數片基板W之載體9藉由主搬送裝置333A自乾燥單元332搬送至中繼區塊200之載體支持部220,且由載體支持部220支持。圖6~圖8中以粗虛線之箭頭a4表示此時之載體9之搬送路徑。The carrier 9 containing the processed substrates W is transferred from the drying unit 332 to the carrier support 220 of the intermediate block 200 by the main transfer device 333A, and is supported by the carrier support 220. The bold dashed arrow a4 in FIG6 to FIG8 indicates the transfer path of the carrier 9 at this time.

因此,移交給載體支持部220之載體9之姿勢藉由載體支持部220而自鉛直姿勢變更為水平姿勢。於圖7之對話框BA1內,模式性顯示載體支持部220中之載體9之姿勢變更之狀態。Therefore, the posture of the carrier 9 transferred to the carrier support unit 220 is changed from the upright posture to the horizontal posture by the carrier support unit 220. In the dialog box BA1 of FIG. 7 , the state of the posture change of the carrier 9 in the carrier support unit 220 is schematically displayed.

如圖7之對話框BA1所示,載體支持部220包含固定於中繼區塊200內之固定台座211及載體保持具212。載體保持具212由第1保持部212a及第2保持部212b構成。第1保持部212a具有可保持處於水平姿勢時之載體9之下端部之矩形之平板形狀。又,第2保持部212b具有可保持處於鉛直姿勢時之載體9之下端部之矩形之平板形狀。As shown in the dialog box BA1 of FIG. 7 , the carrier support part 220 includes a fixed base 211 fixed in the relay block 200 and a carrier holder 212. The carrier holder 212 is composed of a first holder 212a and a second holder 212b. The first holder 212a has a rectangular flat plate shape that can hold the lower end of the carrier 9 in a horizontal position. In addition, the second holder 212b has a rectangular flat plate shape that can hold the lower end of the carrier 9 in a vertical position.

第1保持部212a及第2保持部212b以第1保持部212a之一邊與第2保持部212b之一邊互相相接且2個保持部互相正交之方式連接。固定台座211以第1保持部212a及第2保持部212b均與Y方向平行,且載體保持具212可繞沿Y方向延伸之軸旋轉之方式,保持載體保持具212之一部分。The first holding portion 212a and the second holding portion 212b are connected in a manner that one side of the first holding portion 212a and one side of the second holding portion 212b are connected to each other and the two holding portions are orthogonal to each other. The fixed base 211 holds a portion of the carrier holder 212 in a manner that the first holding portion 212a and the second holding portion 212b are parallel to the Y direction and the carrier holder 212 can rotate around an axis extending in the Y direction.

載體支持部220進而具有可於固定台座211上調整載體保持具212之旋轉角度之未圖示之驅動部。藉此,於自乾燥單元332接收鉛直姿勢之載體9之情形時,載體保持具212以第2保持部212b成為水平且第1保持部212a成為鉛直之方式調整旋轉角度。其後,於載體保持具212上接收到鉛直姿勢之載體9後,載體保持具212以第2保持部212b成為鉛直且第1保持部212a成為水平之方式調整旋轉角度。藉此,載體9之姿勢自鉛直姿勢變更為水平姿勢。此時,載體9之基板出入口12(圖5)朝向-X方向。The carrier support portion 220 further has an unillustrated driving portion that can adjust the rotation angle of the carrier holder 212 on the fixed base 211. Thereby, when the carrier 9 in a lead-up position is received from the drying unit 332, the carrier holder 212 adjusts the rotation angle in a manner that the second holding portion 212b becomes horizontal and the first holding portion 212a becomes lead-up. Thereafter, after the carrier 9 in a lead-up position is received on the carrier holder 212, the carrier holder 212 adjusts the rotation angle in a manner that the second holding portion 212b becomes lead-up and the first holding portion 212a becomes horizontal. Thereby, the posture of the carrier 9 is changed from the lead-up position to the horizontal posture. At this time, the substrate inlet and outlet 12 (Figure 5) of the carrier 9 is facing the -X direction.

於將收納有複數片基板W之載體9以水平姿勢支持於載體支持部220時,將空的晶圓傳送盒8載置於基板搬入搬出區塊100之開閉器130。又,將該晶圓傳送盒8之蓋打開。於該狀態下,藉由基板交接機器人150,自載體9取出處理後之複數片基板W,並插入至開閉器130上之晶圓傳送盒8。圖6~圖8中以粗虛線之箭頭a5表示此時之複數片基板W之搬送路徑。When the carrier 9 containing the plurality of substrates W is supported in a horizontal position on the carrier support portion 220, an empty wafer transfer box 8 is placed on the switch 130 of the substrate loading and unloading block 100. Furthermore, the cover of the wafer transfer box 8 is opened. In this state, the substrate transfer robot 150 takes out the processed plurality of substrates W from the carrier 9 and inserts them into the wafer transfer box 8 on the switch 130. The arrow a5 with a thick dashed line in Figures 6 to 8 indicates the transfer path of the plurality of substrates W at this time.

其後,收納有處理後之複數片基板W之晶圓傳送盒8將蓋關閉,由晶圓傳送盒搬送裝置112保持,且載置於複數個晶圓傳送盒架110之任一者。又,該晶圓傳送盒8藉由晶圓傳送盒搬送裝置111搬送至晶圓傳送盒載置部190,且自基板處理裝置1搬出。另一方面,載體支持部220中變空之載體9藉由載體支持部220將該載體9之姿勢自水平姿勢再次變更為鉛直姿勢。載體支持部220中恢復為鉛直姿勢之空的載體9由主搬送裝置333A搬送,且由第2待機部240接收。Thereafter, the wafer cassette 8 containing the plurality of processed substrates W has its lid closed, is held by the wafer cassette transport device 112, and is placed on any one of the plurality of wafer cassette racks 110. Furthermore, the wafer cassette 8 is transported to the wafer cassette placement section 190 by the wafer cassette transport device 111, and is unloaded from the substrate processing device 1. On the other hand, the empty carrier 9 in the carrier support section 220 is changed from a horizontal position to a vertical position by the carrier support section 220. The empty carrier 9 in the carrier support section 220 that has been restored to a vertical position is transported by the main transport device 333A and received by the second standby section 240.

空的載體9較佳為為了對新的複數片基板W進行處理而進行再利用。因此,由第2待機部240支持之空的載體9例如藉由待機搬送裝置250搬送至第1待機部230而由第1待機部230支持。再者,自第1待機部230移交給載體支持部210。如此,於中繼區塊200,設定有用以再利用使用後之載體9之載體9之搬送路徑。自第1待機部230到達第2待機部240之載體9之搬送路徑(以下稱為待機搬送路徑)於圖6中以較粗之二點鏈線之箭頭b1表示。The empty carrier 9 is preferably reused for processing a new plurality of substrates W. Therefore, the empty carrier 9 supported by the second standby section 240 is, for example, transported to the first standby section 230 by the standby transport device 250 and supported by the first standby section 230. Furthermore, it is transferred from the first standby section 230 to the carrier support section 210. In this way, a transport path for the carrier 9 for reusing the used carrier 9 is set in the relay block 200. The transport path for the carrier 9 from the first standby section 230 to the second standby section 240 (hereinafter referred to as the standby transport path) is indicated by a thicker two-point chain arrow b1 in FIG. 6 .

如上所述,於再利用使用後之空的載體9之情形時,為抑制處理對象之新的複數片基板W之清潔度降低,較佳為於再利用載體9之前進行洗淨。因此,本實施形態中,藉由第2待機部240自載體支持部220接收到之空的載體9維持鉛直姿勢,且藉由洗淨區塊400之洗淨搬送裝置410搬送至載體洗淨單元420。換言之,使用後之空的載體9自待機搬送路徑中之第2待機部240之部分拾起。圖6中以較粗之一點鏈線之箭頭c1表示此時之載體9之搬送路徑。As described above, in the case of reusing the empty carrier 9 after use, in order to suppress the decrease in the cleanliness of the new plurality of substrates W to be processed, it is preferable to clean the carrier 9 before reusing it. Therefore, in this embodiment, the empty carrier 9 received from the carrier support part 220 by the second standby part 240 is maintained in a vertical position and is transported to the carrier cleaning unit 420 by the cleaning conveying device 410 of the cleaning block 400. In other words, the empty carrier 9 after use is picked up from the part of the second standby part 240 in the standby conveying path. The conveying path of the carrier 9 at this time is represented by the thicker one-dot chain arrow c1 in FIG. 6.

於載體洗淨單元420中,進而於1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間,藉由洗淨搬送裝置410搬送載體9。藉此,對使用後之載體9進行洗淨處理及乾燥處理。又,將洗淨處理後且乾燥處理後之載體9收納於1個或複數個載體待機部423之任一者。於各載體洗淨槽421、各載體乾燥部422及各載體待機部423中,維持載體9之鉛直姿勢。In the carrier cleaning unit 420, the carrier 9 is further transported between one or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 by the cleaning and transporting device 410. In this way, the used carrier 9 is cleaned and dried. In addition, the cleaned and dried carrier 9 is stored in any one of the one or more carrier standby sections 423. In each carrier cleaning tank 421, each carrier drying section 422, and each carrier standby section 423, the upright posture of the carrier 9 is maintained.

設想對新的收納於其他晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,收納於洗淨區塊400之載體待機部423之清潔之載體9作為新的載體9,藉由洗淨搬送裝置410自載體洗淨單元420搬送至第2待機部240。換言之,洗淨後之空的載體9作為新的載體9返回至待機搬送路徑中之第2待機部240之部分。圖6中以較粗之一點鏈線之箭頭c2表示此時之新的載體9之搬送路徑。Assume that a series of processes are performed on a plurality of unprocessed substrates W newly stored in other wafer transfer boxes 8. In this case, the cleaned carrier 9 stored in the carrier standby section 423 of the cleaning block 400 is transported from the carrier cleaning unit 420 to the second standby section 240 by the cleaning transfer device 410 as a new carrier 9. In other words, the empty carrier 9 after cleaning is returned to the second standby section 240 in the standby transfer path as a new carrier 9. The thicker dot chain arrow c2 in FIG6 indicates the transfer path of the new carrier 9 at this time.

移交給第2待機部240之新的載體9維持鉛直姿勢,且藉由待機搬送裝置250沿著待機搬送路徑搬送至第1待機部230(參照上述圖6中較粗之二點鏈線之箭頭b1)。又,由第1待機部230支持。第1待機部230將由該第1待機部230支持之新的載體9移交給載體支持部210。因此,移交給載體支持部210之新的載體9為了接收未處理之複數片基板W,姿勢藉由載體支持部210自鉛直姿勢變更為水平姿勢。The new carrier 9 transferred to the second standby section 240 maintains a vertical posture and is transferred to the first standby section 230 along the standby transfer path by the standby transfer device 250 (refer to the arrow b1 of the thicker two-point chain in FIG. 6 ). Furthermore, it is supported by the first standby section 230. The first standby section 230 transfers the new carrier 9 supported by the first standby section 230 to the carrier support section 210. Therefore, the new carrier 9 transferred to the carrier support section 210 changes its posture from a vertical posture to a horizontal posture by the carrier support section 210 in order to receive a plurality of unprocessed substrates W.

如上所述,中繼區塊200內之2個載體支持部210、220具有相同構成。藉此,於載體支持部210中,如圖7之對話框BA1內所示,變更新的載體9之姿勢。其後,將新的收納於其他晶圓傳送盒8之未處理之複數片基板W插入至處於水平姿勢之新的載體9內。As described above, the two carrier support parts 210 and 220 in the relay block 200 have the same structure. Thus, in the carrier support part 210, as shown in the dialog box BA1 of FIG. 7, the posture of the new carrier 9 is changed. Thereafter, the unprocessed plurality of substrates W newly stored in other wafer cassettes 8 are inserted into the new carrier 9 in the horizontal posture.

收納有未處理之複數片基板W之新的載體9沿圖6~圖8所示之一連串之箭頭a2、a3、a4所示之搬送路徑搬送。藉此,對收納於新的載體9之複數片基板W進行一連串處理。The new carrier 9 storing the unprocessed plurality of substrates W is transported along a transport path indicated by a series of arrows a2, a3, and a4 shown in Fig. 6 to Fig. 8. Thus, the plurality of substrates W stored in the new carrier 9 are subjected to a series of processes.

<4>效果 (1)於上述基板處理裝置1中,於將空的載體9支持於載體支持部210之狀態下,搬入之晶圓傳送盒8內之未處理之複數片基板W藉由基板交接機器人140插入至空的載體9。收納有未處理之複數片基板W之載體9由第1待機部230接收。再者,該載體9由處理區塊300之第1端部TA1接收。於處理區塊300中,載體9於圖6之箭頭a3之搬送路徑上,自第1端部TA1搬送至第3端部TA3。於在處理區塊300內搬送載體9之期間,對於收納於載體9之複數片基板W,藉由各種液體處理單元331及乾燥單元332進行預設之處理。 <4> Effects (1) In the above-mentioned substrate processing device 1, while the empty carrier 9 is supported on the carrier support portion 210, the unprocessed plurality of substrates W in the wafer transfer box 8 are inserted into the empty carrier 9 by the substrate transfer robot 140. The carrier 9 containing the unprocessed plurality of substrates W is received by the first standby portion 230. Furthermore, the carrier 9 is received by the first end TA1 of the processing block 300. In the processing block 300, the carrier 9 is transported from the first end TA1 to the third end TA3 on the transport path of arrow a3 in FIG. 6. While the carrier 9 is being transported in the processing block 300, the plurality of substrates W stored in the carrier 9 are subjected to preset processing by various liquid processing units 331 and drying units 332.

該情形時,處理區塊300內之複數個搬送裝置(311、321、333A、333B、333C)各者可藉由搬送收納有複數片基板W之載體9,而一體處理複數片基板W。因此,複數個搬送裝置(311、321、333A、333B、333C)各者無需用以一體且直接保持複數片基板W之繁瑣之構成。In this case, each of the plurality of transfer devices (311, 321, 333A, 333B, 333C) in the processing block 300 can process the plurality of substrates W in an integrated manner by transferring the carrier 9 storing the plurality of substrates W. Therefore, each of the plurality of transfer devices (311, 321, 333A, 333B, 333C) does not need to be a complicated structure for directly holding the plurality of substrates W in an integrated manner.

收納有處理後之複數片基板W之載體9自處理區塊300之第3端部TA3移交給第2待機部240,且由第2待機部240支持。再者,收納有處理後之複數片基板W之載體9移交給載體支持部220,且受其支持。於將空的晶圓傳送盒8載置於開閉器130之狀態下,處理後之複數片基板W藉由基板交接機器人150自載體9取出,並插入至空的晶圓傳送盒8。The carrier 9 containing the processed plural substrates W is transferred from the third end TA3 of the processing block 300 to the second standby unit 240 and supported by the second standby unit 240. Furthermore, the carrier 9 containing the processed plural substrates W is transferred to the carrier support unit 220 and supported by it. When the empty wafer cassette 8 is placed on the shutter 130, the processed plural substrates W are taken out from the carrier 9 by the substrate transfer robot 150 and inserted into the empty wafer cassette 8.

已取出處理後之複數片基板W之空的載體9例如沿圖6之箭頭b1之搬送路徑(待機搬送路徑),自第2待機部240搬送至第1待機部230。藉此,可再利用載體9。The empty carrier 9 from which the processed plurality of substrates W have been taken out is transported from the second standby section 240 to the first standby section 230 along the transport path (standby transport path) indicated by the arrow b1 in FIG6 , for example. In this way, the carrier 9 can be reused.

此處,上述基板處理裝置1具備洗淨區塊400。洗淨區塊400之洗淨搬送裝置410自該待機搬送路徑拾起待機搬送路徑上之空的載體9,並搬送至載體洗淨單元420。於載體洗淨單元420中,將使用後之空的載體9洗淨。又,洗淨後之空的載體9再次返回至待機搬送路徑。返回至待機搬送路徑之載體9沿該待機搬送路徑搬送至第1待機部230。該情形時,可將搬送至第1待機部230之洗淨後之空的載體9用於插入未處理之複數片基板W。Here, the substrate processing device 1 is provided with a cleaning block 400. The cleaning conveying device 410 of the cleaning block 400 picks up the empty carrier 9 on the standby conveying path from the standby conveying path and conveys it to the carrier cleaning unit 420. In the carrier cleaning unit 420, the empty carrier 9 after use is cleaned. Furthermore, the empty carrier 9 after cleaning is returned to the standby conveying path again. The carrier 9 returned to the standby conveying path is conveyed to the first standby section 230 along the standby conveying path. In this case, the empty carrier 9 after cleaning conveyed to the first standby section 230 can be used to insert a plurality of unprocessed substrates W.

如上所述,於本實施形態之基板處理裝置1中,由於可再利用載體9,故無需準備多個載體9。又,由於可將再利用之載體9洗淨,故防止因再利用載體9引起之複數片基板W之污染。其等之結果,可防止複數片基板W污染,且抑制複數個搬送裝置(311、321、333A、333B、333C)之構成之複雜化及零件件數之增加。As described above, in the substrate processing apparatus 1 of the present embodiment, since the carrier 9 can be reused, it is not necessary to prepare a plurality of carriers 9. Furthermore, since the reused carrier 9 can be cleaned, contamination of the plurality of substrates W caused by the reused carrier 9 can be prevented. As a result, contamination of the plurality of substrates W can be prevented, and the complexity of the structure of the plurality of transfer devices (311, 321, 333A, 333B, 333C) and the increase in the number of parts can be suppressed.

再者,根據上述基板處理裝置1,可在每當用於處理複數片基板W時,將用於處理複數片基板W之載體9洗淨。藉此,由於在每當處理複數片基板W時,重設載體9之表面狀態,故亦可抑制因污染或腐蝕等引起之載體9之劣化。Furthermore, according to the substrate processing apparatus 1, the carrier 9 used for processing a plurality of substrates W can be cleaned each time the carrier 9 is used for processing a plurality of substrates W. Thus, since the surface state of the carrier 9 is reset each time the plurality of substrates W are processed, degradation of the carrier 9 due to contamination or corrosion can be suppressed.

(2)如上所述,載體洗淨單元420包含1個或複數個載體洗淨槽421及洗淨搬送裝置410。於1個或複數個載體洗淨槽421各者,貯存有處理液。洗淨搬送裝置410構成為可將載體9浸漬於各載體洗淨槽421內之處理液、及自各載體洗淨槽421內提起載體9。藉此,於載體洗淨單元420中,可以簡單之構成及簡單之方法將載體9洗淨。(2) As described above, the carrier cleaning unit 420 includes one or more carrier cleaning tanks 421 and a cleaning conveying device 410. A treatment liquid is stored in each of the one or more carrier cleaning tanks 421. The cleaning conveying device 410 is configured to immerse the carrier 9 in the treatment liquid in each carrier cleaning tank 421 and to lift the carrier 9 from each carrier cleaning tank 421. Thus, in the carrier cleaning unit 420, the carrier 9 can be cleaned with a simple structure and a simple method.

(3)載體洗淨單元420包含1個或複數個載體乾燥部422。藉此,可藉由1個或複數個載體乾燥部422,使由載體洗淨槽421洗淨後之載體9乾燥。藉此,塵埃不易附著於洗淨後之載體9。因此,抑制洗淨後之載體9之清潔度降低。(3) The carrier cleaning unit 420 includes one or more carrier drying sections 422. The carrier 9 cleaned in the carrier cleaning tank 421 can be dried by the one or more carrier drying sections 422. As a result, dust is less likely to adhere to the cleaned carrier 9. Therefore, the cleanliness of the cleaned carrier 9 is suppressed from decreasing.

(4)載體洗淨單元420包含1個或複數個載體待機部423。藉此,可使洗淨後之載體9於載體洗淨單元420內待機。因此,可使洗淨後之載體9於適當之時序返回至待機搬送路徑。(4) The carrier cleaning unit 420 includes one or more carrier standby sections 423. Thus, the cleaned carrier 9 can be placed on standby in the carrier cleaning unit 420. Therefore, the cleaned carrier 9 can be returned to the standby transport path at an appropriate timing.

(5)於上述基板處理裝置1中,洗淨搬送裝置410自第2待機部240拾起使用後之空的載體9。該情形時,由於第2待機部240位於待機搬送路徑之起點,故防止將使用後之載體9以未洗淨之狀態遍及待機搬送路徑之廣範圍搬送。因此,抑制待機搬送路徑之污染。(5) In the above-mentioned substrate processing apparatus 1, the cleaning and conveying device 410 picks up the empty carrier 9 after use from the second standby section 240. In this case, since the second standby section 240 is located at the starting point of the standby conveying path, it is prevented that the used carrier 9 is conveyed in an uncleaned state over a wide range of the standby conveying path. Therefore, contamination of the standby conveying path is suppressed.

<5>其他實施形態 (1)於上述實施形態之基板處理裝置1中,載體洗淨單元420設置於基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置。又,洗淨搬送裝置410自待機搬送路徑中之第2待機部240之部分拾起使用後之載體9,且使洗淨後之載體9返回至第2待機部240之部分。然而,於根據本發明之一態樣之基板處理裝置1中,載體洗淨單元420之配置不限定於上述例。又,待機搬送路徑中拾起載體9之部分、及待機搬送路徑中載體9返回之部分不限定於上述例。 <5> Other embodiments (1) In the substrate processing device 1 of the above embodiment, the carrier cleaning unit 420 is arranged at a position to the side (+Y direction) of the substrate loading and unloading block 100 and the relay block 200. In addition, the cleaning conveying device 410 picks up the used carrier 9 from the second standby section 240 in the standby conveying path, and returns the cleaned carrier 9 to the second standby section 240. However, in the substrate processing device 1 according to one aspect of the present invention, the configuration of the carrier cleaning unit 420 is not limited to the above example. In addition, the part of the standby conveying path that picks up the carrier 9 and the part of the standby conveying path that returns the carrier 9 are not limited to the above example.

圖9係顯示另一實施形態之基板處理裝置1之基本構成之模式性俯視圖。圖10係圖9之基板處理裝置1之模式性一側視圖。於圖9及圖10中,與上述實施形態之基板處理裝置1之各圖之例同樣,標註有表示互相正交之X方向、Y方向及Z方向之箭頭。圖10之模式性一側視圖係於+Y方向上觀察圖9之基板處理裝置1之模式性一側視圖。說明另一實施形態之基板處理裝置1中與上述實施形態之基板處理裝置1不同之點。FIG9 is a schematic top view showing the basic structure of another embodiment of the substrate processing apparatus 1. FIG10 is a schematic side view of the substrate processing apparatus 1 of FIG9. In FIG9 and FIG10, as in the examples of the respective figures of the substrate processing apparatus 1 of the above-mentioned embodiment, arrows indicating mutually orthogonal X-direction, Y-direction and Z-direction are marked. The schematic side view of FIG10 is a schematic side view of the substrate processing apparatus 1 of FIG9 observed in the +Y direction. The differences between another embodiment of the substrate processing apparatus 1 and the substrate processing apparatus 1 of the above-mentioned embodiment are described.

於本實施形態之基板處理裝置1中,載體洗淨單元420代替基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置,設置於處理區塊300之第1搬送部310之下方之位置。因此,本例之載體洗淨單元420於俯視下與第1搬送部310重疊。圖9中,為易於理解載體洗淨單元420之配置,以虛線顯示處理區塊300之第1搬送部310。In the substrate processing apparatus 1 of this embodiment, the carrier cleaning unit 420 is disposed below the first conveying unit 310 of the processing block 300 instead of the position on the side (+Y direction) of the substrate loading and unloading block 100 and the relay block 200. Therefore, the carrier cleaning unit 420 of this example overlaps with the first conveying unit 310 in a plan view. In FIG. 9 , the first conveying unit 310 of the processing block 300 is shown in dotted lines for easy understanding of the arrangement of the carrier cleaning unit 420.

又,本例之載體洗淨單元420配置為與中繼區塊200之第1待機部230於+X方向上相鄰。再者,本例之載體洗淨單元420包含1個或複數個(本例中為2個)載體洗淨槽421、1個或複數個(本例中為1個)載體乾燥部422及1個或複數個(本例中為2個)載體待機部423。1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423自中繼區塊200之第1待機部230沿+X方向排列。In addition, the carrier cleaning unit 420 of this example is arranged to be adjacent to the first standby section 230 of the relay block 200 in the +X direction. Furthermore, the carrier cleaning unit 420 of this example includes one or more (two in this example) carrier cleaning tanks 421, one or more (one in this example) carrier drying sections 422, and one or more (two in this example) carrier standby sections 423. One or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 are arranged from the first standby section 230 of the relay block 200 along the +X direction.

附隨於載體洗淨單元420,設置有洗淨搬送裝置410。洗淨搬送裝置410可藉由於X方向及Z方向移動,而於第1待機部230、1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間搬送基板W。A cleaning and transporting device 410 is provided in conjunction with the carrier cleaning unit 420. The cleaning and transporting device 410 can transport the substrate W between the first standby section 230, one or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 by moving in the X direction and the Z direction.

於該基板處理裝置1中,由第2待機部240支持之使用後之載體9藉由待機搬送裝置250而沿待機搬送路徑搬送至第1待機部230(參考圖9中以較粗之兩點鏈線之箭頭b1)。其後,由第1待機部230支持之空的載體9維持鉛直姿勢,且藉由洗淨搬送裝置410搬送至載體洗淨單元420。換言之,使用後之空的載體9自待機搬送路徑中之第1待機部230之部分拾起,並搬送至載體洗淨單元420。以圖9及圖10中較粗之一點鏈線之箭頭d1表示此時之載體9之搬送路徑。In the substrate processing apparatus 1, the used carrier 9 supported by the second standby section 240 is transported to the first standby section 230 along the standby transport path by the standby transport device 250 (refer to the arrow b1 of the thicker two-dot chain line in FIG. 9). Thereafter, the empty carrier 9 supported by the first standby section 230 maintains a vertical posture and is transported to the carrier cleaning unit 420 by the cleaning transport device 410. In other words, the used empty carrier 9 is picked up from the first standby section 230 in the standby transport path and transported to the carrier cleaning unit 420. The transport path of the carrier 9 at this time is indicated by the arrow d1 of the thicker one-dot chain line in FIG. 9 and FIG. 10.

於載體洗淨單元420中,與上述實施形態同樣,對使用後之載體9進行洗淨處理及乾燥處理。洗淨處理後及乾燥處理後之載體9保持於1個或複數個載體待機部423,成為待機狀態。In the carrier cleaning unit 420, the used carrier 9 is cleaned and dried as in the above-mentioned embodiment. The cleaned and dried carriers 9 are held in one or more carrier standby sections 423 and are in a standby state.

此處,設想對收納於新的其他個晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,保持於載體待機部423之清潔之載體9作為新的載體9,藉由洗淨搬送裝置410搬送至第1待機部230。換言之,洗淨後之空的載體9作為新的載體9返回至待機搬送路徑中之第1待機部230之部分。圖9及圖10中以較粗之一點鏈線之箭頭d2表示該新的載體9之搬送路徑。Here, it is assumed that a series of processes are performed on a plurality of unprocessed substrates W stored in another new wafer transfer box 8. In this case, the clean carrier 9 held in the carrier standby section 423 is transported to the first standby section 230 by the cleaning conveying device 410 as a new carrier 9. In other words, the cleaned empty carrier 9 is returned to the first standby section 230 in the standby conveying path as a new carrier 9. The thick dot chain arrow d2 in Figures 9 and 10 indicates the conveying path of the new carrier 9.

如上所述,於圖9及圖10之基板處理裝置1中,亦將載體9用於複數片基板W之處理,且再利用載體9。再者,將使用後之載體9洗淨。因此,可獲得與上述實施形態同樣之效果。As described above, in the substrate processing apparatus 1 of FIG. 9 and FIG. 10 , the carrier 9 is also used to process a plurality of substrates W, and the carrier 9 is reused. Furthermore, the carrier 9 is cleaned after use. Therefore, the same effect as the above-mentioned embodiment can be obtained.

於圖9及圖10之基板處理裝置1中,洗淨搬送裝置410自第1待機部230拾起使用後之空的載體9。該情形時,由於第1待機部230位於待機搬送路徑之終點,故不遍及待機搬送路徑之廣範圍搬送洗淨後之載體9。因此,可不降低洗淨後之載體9之清潔度,而使該載體9收納未處理之複數片基板W。In the substrate processing apparatus 1 of FIG9 and FIG10, the cleaning and conveying device 410 picks up the empty carrier 9 after use from the first standby section 230. In this case, since the first standby section 230 is located at the end of the standby conveying path, the cleaned carrier 9 is not conveyed over the wide range of the standby conveying path. Therefore, the cleanliness of the cleaned carrier 9 can be kept without reducing the cleanliness of the carrier 9, and the carrier 9 can store a plurality of unprocessed substrates W.

(2)載體洗淨單元420亦可進而設置於與圖1及圖9之基板處理裝置1之例不同之部分。圖11係顯示又一實施形態之基板處理裝置1之基本構成之模式性俯視圖。於圖11中,與上述實施形態之基板處理裝置1之各圖之例同樣,標註有表示互相正交之X方向、Y方向及Z方向之箭頭。說明圖11之基板處理裝置1中與上述實施形態之基板處理裝置1不同之點。(2) The carrier cleaning unit 420 may be further provided in a portion different from the substrate processing apparatus 1 of the examples of FIG. 1 and FIG. 9. FIG. 11 is a schematic top view showing the basic structure of another embodiment of the substrate processing apparatus 1. In FIG. 11, as in the examples of the respective figures of the substrate processing apparatus 1 of the above-mentioned embodiment, arrows indicating the X direction, the Y direction, and the Z direction orthogonal to each other are marked. The differences between the substrate processing apparatus 1 of FIG. 11 and the substrate processing apparatus 1 of the above-mentioned embodiment are explained.

本例之載體洗淨單元420以於基板搬入搬出區塊100及中繼區塊200之內部沿X方向延伸之方式設置,包含洗淨搬送裝置410、1個或複數個(本例中為2個)載體洗淨槽421、1個或複數個(本例中為1個)載體乾燥部422及1個或複數個(本例中為1個)載體待機部423。1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423自中繼區塊200內之待機搬送路徑沿-X方向排列。The carrier cleaning unit 420 of this example is arranged in a manner extending along the X direction inside the substrate loading and unloading block 100 and the relay block 200, and includes a cleaning conveying device 410, one or more (two in this example) carrier cleaning tanks 421, one or more (one in this example) carrier drying sections 422, and one or more (one in this example) carrier standby sections 423. One or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 are arranged along the -X direction from the standby conveying path in the relay block 200.

附隨於載體洗淨單元420,設置有洗淨搬送裝置410。洗淨搬送裝置410可藉由於X方向及Z方向移動,而於待機搬送路徑、1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間搬送基板W。A cleaning and transporting device 410 is provided in conjunction with the carrier cleaning unit 420. The cleaning and transporting device 410 can transport the substrate W between the standby transport path, one or more carrier cleaning tanks 421, one or more carrier drying sections 422, and one or more carrier standby sections 423 by moving in the X direction and the Z direction.

於該基板處理裝置1中,藉由洗淨搬送裝置410拾起沿待機搬送路徑自第2待機部240搬送至第1待機部230之中途之空的載體9,並搬送至載體洗淨單元420。圖11中以較粗之一點鏈線之箭頭e1表示此時之載體9之搬送路徑。In the substrate processing apparatus 1, the cleaning and transporting device 410 picks up the empty carrier 9 being transported from the second standby section 240 to the first standby section 230 along the standby transport path, and transports it to the carrier cleaning unit 420. The thick dot-link arrow e1 in FIG. 11 indicates the transport path of the carrier 9 at this time.

又,由載體洗淨單元420洗淨後之載體9藉由洗淨搬送裝置410返回至待機搬送路徑。圖11中以較粗之一點鏈線之箭頭e2表示此時之載體9之搬送路徑。藉由將返回至待機搬送路徑之載體9搬送至第1待機部230,可將該清潔之載體9用於新的複數片基板W之處理。Furthermore, the carrier 9 cleaned by the carrier cleaning unit 420 is returned to the standby transport path by the cleaning transport device 410. The thick one-dot chain arrow e2 in FIG. 11 indicates the transport path of the carrier 9 at this time. By transporting the carrier 9 returned to the standby transport path to the first standby section 230, the cleaned carrier 9 can be used for processing a plurality of new substrates W.

(3)於上述實施形態之洗淨區塊400中,亦可於1個或複數個載體洗淨槽421中,設置可使載體9浸漬於處理液、及自處理液提起載體9之升降機。該情形時,載體洗淨單元420與處理區塊300之處理部330同樣,亦可具備能使載體9相對於複數個載體洗淨槽421升降之升降機。又,載體洗淨單元420亦可具備於複數個升降機之間交接載體9之主搬送裝置。(3) In the cleaning block 400 of the above-mentioned embodiment, an elevator that can immerse the carrier 9 in the processing liquid and lift the carrier 9 from the processing liquid can be provided in one or more carrier cleaning tanks 421. In this case, the carrier cleaning unit 420 can also have an elevator that can lift the carrier 9 relative to the plurality of carrier cleaning tanks 421, similar to the processing section 330 of the processing block 300. In addition, the carrier cleaning unit 420 can also have a main transport device that transfers the carrier 9 between the plurality of elevators.

(4)於上述實施形態之基板處理裝置1中,處於鉛直姿勢之載體9之框架構件10a、10b維持與鉛直方向平行,但亦可為處於鉛直姿勢之載體9之框架構件10a、10b維持與鉛直方向大致平行。即,處於鉛直姿勢之載體9只要可將收納之複數片基板W保持與鉛直方向平行或大致平行即可。(4) In the substrate processing apparatus 1 of the above-mentioned embodiment, the frame members 10a and 10b of the carrier 9 in the lead vertical position are maintained parallel to the lead vertical direction, but the frame members 10a and 10b of the carrier 9 in the lead vertical position may be maintained substantially parallel to the lead vertical direction. That is, the carrier 9 in the lead vertical position only needs to be able to keep the plurality of substrates W stored therein parallel or substantially parallel to the lead vertical direction.

又,於上述實施形態之基板處理裝置1中,處於水平姿勢之載體9之框架構件10a、10b維持與鉛直方向正交,但亦可為處於水平姿勢之載體9之框架構件10a、10b維持與鉛直方向大致正交。即,處於水平姿勢之載體9只要可將收納之複數片基板W保持為與水平方向平行或大致平行即可。In the substrate processing apparatus 1 of the above-mentioned embodiment, the frame members 10a and 10b of the carrier 9 in a horizontal position are maintained perpendicular to the vertical direction, but the frame members 10a and 10b of the carrier 9 in a horizontal position may be maintained substantially perpendicular to the vertical direction. That is, the carrier 9 in a horizontal position only needs to be able to keep the plurality of substrates W stored therein parallel or substantially parallel to the horizontal direction.

(5)於上述實施形態之基板處理裝置1中,於中繼區塊200中個別地設置有載體支持部210與第1待機部230,但本發明不限定於此。於可對第1待機部230附加變更載體9之姿勢之功能之情形時,亦可不設置載體支持部210。(5) In the substrate processing apparatus 1 of the above embodiment, the carrier support unit 210 and the first standby unit 230 are separately provided in the relay block 200, but the present invention is not limited thereto. In the case where the first standby unit 230 can be provided with a function of changing the posture of the carrier 9, the carrier support unit 210 may not be provided.

又,於上述實施形態之基板處理裝置1中,於中繼區塊200中個別地設置有載體支持部220與第2待機部240,但本發明不限定於此。於可對第2待機部240附加變更載體9之姿勢之功能之情形時,亦可不設置載體支持部220。In the substrate processing apparatus 1 of the above embodiment, the carrier support unit 220 and the second standby unit 240 are separately provided in the relay block 200, but the present invention is not limited thereto. When the second standby unit 240 can be provided with a function of changing the posture of the carrier 9, the carrier support unit 220 may not be provided.

(6)於上述實施形態之處理區塊300之第2搬送部320中,搬送裝置321具有變更載體9之姿勢之功能且具有搬送載體9之功能,但本發明不限定於此。於第2搬送部320中,亦可代替上述搬送裝置321,個別地設置具有變更載體9之姿勢之功能之構成要件、及具有搬送載體9之功能之構成要件。(6) In the second conveying section 320 of the processing block 300 of the above-mentioned embodiment, the conveying device 321 has the function of changing the posture of the carrier 9 and has the function of conveying the carrier 9, but the present invention is not limited to this. In the second conveying section 320, a component having the function of changing the posture of the carrier 9 and a component having the function of conveying the carrier 9 may be separately provided instead of the above-mentioned conveying device 321.

(7)於上述實施形態之基板處理裝置1中,處理對象之基板W於俯視下具有矩形狀,但處理對象之基板亦可於俯視下具有圓形狀,又可於俯視下具有三邊形或五邊形等四邊形以外之多邊形狀。(7) In the substrate processing apparatus 1 of the above-mentioned embodiment, the substrate W to be processed has a rectangular shape in a plan view, but the substrate to be processed may also have a circular shape in a plan view, or may have a polygonal shape other than a quadrilateral such as a triangle or pentagon in a plan view.

(8)上述實施形態之載體9於以水平姿勢收納有矩形之基板W之情形時支持矩形之基板W之兩側部,但本發明不限定於此。載體9亦可構成為能以水平姿勢支持基板W之中央部。(8) The carrier 9 of the above-mentioned embodiment supports both sides of the rectangular substrate W when the rectangular substrate W is stored in a horizontal position, but the present invention is not limited to this. The carrier 9 may also be configured to support the central portion of the substrate W in a horizontal position.

(9)於上述實施形態之基板處理裝置1中,設為於處理部330之複數個處理槽331a中貯存用以將基板W洗淨之處理液,但本發明不限定於此。亦可於處理部330之複數個處理槽331a之至少一部分,貯存用以對基板W進行鍍覆處理之鍍覆液、或用以將基板W之表面狀態改質之液體等,作為處理液。如此,上述實施形態係將本發明應用於複數片基板W之洗淨處理之例,但不限於此,亦可將本發明應用於複數片基板W之鍍覆處理或表面改質處理等之其他處理。(9) In the substrate processing apparatus 1 of the above-mentioned embodiment, a processing liquid for cleaning the substrate W is stored in the plurality of processing tanks 331a of the processing section 330, but the present invention is not limited thereto. A coating liquid for coating the substrate W or a liquid for modifying the surface state of the substrate W may be stored as the processing liquid in at least a portion of the plurality of processing tanks 331a of the processing section 330. Thus, the above-mentioned embodiment is an example of applying the present invention to a cleaning process of a plurality of substrates W, but the present invention is not limited thereto and may also be applied to other processes such as a coating process or a surface modification process of a plurality of substrates W.

(10)於上述實施形態之基板處理裝置1中,洗淨區塊400從自第2待機部240至第1待機部230之待機搬送路徑取出空的載體9,進行洗淨,並使之再次返回至待機搬送路徑,但本發明不限定於此。洗淨區塊400亦可構成自第2待機部240至第1待機部230之待機搬送路徑之一部分。(10) In the substrate processing apparatus 1 of the above-mentioned embodiment, the cleaning block 400 takes out an empty carrier 9 from the standby conveying path from the second standby section 240 to the first standby section 230, cleans it, and returns it to the standby conveying path again, but the present invention is not limited to this. The cleaning block 400 may also constitute a part of the standby conveying path from the second standby section 240 to the first standby section 230.

具體而言,洗淨區塊400例如亦可藉由洗淨搬送裝置410自第2待機部240接收洗淨前之空的載體9,且藉由載體洗淨單元420進行洗淨,將洗淨後之載體9移交給第1待機部230。或,洗淨區塊400例如亦可藉由洗淨搬送裝置410自第2待機部240與第1待機部230之間之位置接收洗淨前之空的載體9,藉由載體洗淨單元420進行洗淨,將洗淨後之載體9移交給第1待機部230。Specifically, the cleaning block 400 may receive the empty carrier 9 before cleaning from the second standby section 240 by the cleaning transfer device 410, clean the carrier 9 by the carrier cleaning unit 420, and transfer the cleaned carrier 9 to the first standby section 230. Alternatively, the cleaning block 400 may receive the empty carrier 9 before cleaning from a position between the second standby section 240 and the first standby section 230 by the cleaning transfer device 410, clean the carrier 9 by the carrier cleaning unit 420, and transfer the cleaned carrier 9 to the first standby section 230.

該等情形時,洗淨區塊400亦可進而個別地具備用以接收洗淨前之載體9之搬送裝置、及用以移交洗淨後之載體9之搬送裝置。藉此,藉由不共通使用用以搬送洗淨前之載體9之構成與用以搬送洗淨後之載體9之構成,而防止載體9與用以搬送載體9之構成之間之污染物質之轉印。其結果,抑制中繼區塊200及洗淨區塊400中之載體9之清潔度降低。In such cases, the cleaning block 400 may also be provided with a conveying device for receiving the carrier 9 before cleaning and a conveying device for transferring the carrier 9 after cleaning. In this way, by not using the same structure for conveying the carrier 9 before cleaning and the structure for conveying the carrier 9 after cleaning, the transfer of contaminants between the carrier 9 and the structure for conveying the carrier 9 is prevented. As a result, the cleanliness of the carrier 9 in the relay block 200 and the cleaning block 400 is suppressed from being reduced.

(11)於上述實施形態之載體9中,於框架構件10a、10b各者之中央部分形成有4個開口部13,但本發明不限定於此。於框架構件10a、10b各者之中央部分,不限於4個,亦可形成1個、2個、3個或5個等其他個數之開口部13。或,亦可不於框架構件10a、10b各者之中央部分形成開口部13。再者,亦可適當設計並變更框架構件10a、10b之形狀。(11) In the carrier 9 of the above-mentioned embodiment, four openings 13 are formed in the central portion of each of the frame members 10a and 10b, but the present invention is not limited thereto. The number of openings 13 in the central portion of each of the frame members 10a and 10b is not limited to four, and one, two, three, five, or other numbers of openings 13 may be formed. Alternatively, the opening 13 may not be formed in the central portion of each of the frame members 10a and 10b. Furthermore, the shapes of the frame members 10a and 10b may be appropriately designed and changed.

(12)於上述實施形態之主搬送裝置333A、333B、333C各者,一對夾盤構件333b藉由於X方向上夾住載體9而保持該載體9,但本發明不限定於此。一對夾盤構件333b亦可藉由於Y方向上夾住載體9而保持該載體9,又可藉由於水平面內於與X方向及Y方向交叉之方向上夾住載體9而保持該載體9。(12) In each of the main transport devices 333A, 333B, and 333C of the above-mentioned embodiment, the pair of chuck members 333b holds the carrier 9 by clamping the carrier 9 in the X direction, but the present invention is not limited thereto. The pair of chuck members 333b may also hold the carrier 9 by clamping the carrier 9 in the Y direction, or may hold the carrier 9 by clamping the carrier 9 in a direction intersecting the X direction and the Y direction in a horizontal plane.

<6>技術方案之各構成要件與實施形態之各要件之對應關係 以下,對技術方案之各構成要件與實施形態之各要件之對應例進行說明,但本發明不限定於下述例。作為技術方案之各構成要件,亦可使用具有技術方案所記載之構成或功能之其他各種要件。 <6> Correspondence between the constituent elements of the technical solution and the elements of the implementation form Below, the correspondence between the constituent elements of the technical solution and the elements of the implementation form is described, but the present invention is not limited to the following example. As the constituent elements of the technical solution, various other elements having the structure or function described in the technical solution can also be used.

於上述實施形態中,基板處理裝置1為基板處理裝置之例,載體9為載體之例,圖6之箭頭a3所示之載體9之搬送路徑為第1搬送路徑之例,第1搬送部310之第1端部TA1為第1搬送路徑之起點之例,處理部330之第3端部TA3為第1搬送路徑之終點之例,包含處理區塊300之主搬送裝置311、333A、333B、333C及搬送裝置321之構成要件群為搬送機構之例。In the above-mentioned embodiment, the substrate processing device 1 is an example of a substrate processing device, the carrier 9 is an example of a carrier, the transport path of the carrier 9 indicated by the arrow a3 in Figure 6 is an example of a first transport path, the first end TA1 of the first transport section 310 is an example of a starting point of the first transport path, the third end TA3 of the processing section 330 is an example of an end point of the first transport path, and the component group including the main transport device 311, 333A, 333B, 333C of the processing block 300 and the transport device 321 is an example of a transport mechanism.

又,處理部330之複數個液體處理單元331為處理單元之例,基板交接機器人140為基板插入部之例,第1待機部230為第1待機部之例,第2待機部240為第2待機部之例,基板交接機器人150為基板取出部之例,洗淨區塊400及載體洗淨單元420為載體洗淨部之例。In addition, the plurality of liquid processing units 331 of the processing section 330 is an example of a processing unit, the substrate transfer robot 140 is an example of a substrate insertion section, the first standby section 230 is an example of a first standby section, the second standby section 240 is an example of a second standby section, the substrate transfer robot 150 is an example of a substrate removal section, and the cleaning block 400 and the carrier cleaning unit 420 are examples of a carrier cleaning section.

又,圖6之箭頭b1所示之載體9之待機搬送路徑為第2搬送路徑之例,載體洗淨槽421為洗淨槽之例,洗淨搬送裝置410為載體搬送裝置之例,載體乾燥部422為載體乾燥部之例,載體待機部423為載體待機部之例。6 is an example of the second transport path, the carrier cleaning tank 421 is an example of a cleaning tank, the cleaning transport device 410 is an example of a carrier transport device, the carrier drying section 422 is an example of a carrier drying section, and the carrier standby section 423 is an example of a carrier standby section.

1:基板處理裝置 8:晶圓傳送盒 9:載體 10a,10b,10c,10d:框架構件 11:支持片 12:基板出入口 13:開口部 100:基板搬入搬出區塊 101:端面部 102:一側面部 103:另一側面部 110:晶圓傳送盒架 111,112:晶圓傳送盒搬送裝置 120,130:開閉器 140,150:基板交接機器人 160:控制部 190:晶圓傳送盒載置部 200:中繼區塊 210,220:載體支持部 211:固定台座 212:載體保持具 212a:第1保持部 212b:第2保持部 230:第1待機部 240:第2待機部 250:待機搬送裝置 300:處理區塊 310:第1搬送部 311:主搬送裝置 311a:可動載台 311b:導軌 312A,312B:副搬送裝置 320:第2搬送部 321:搬送裝置 322:可動台座 323:載體保持具 323a:第1保持部 323b:第2保持部 330:處理部 331:液體處理單元 331a:處理槽 331b:升降機 332:乾燥單元 333a:可動支持柱 333A,333B,333C:主搬送裝置 333b:夾盤構件 400:洗淨區塊 410:洗淨搬送裝置 420:載體洗淨單元 421:載體洗淨槽 422:載體乾燥部 423:載體待機部 a1~a5,b1,c1,c2,d1,d2,e1,e2:箭頭 BA1,BA2,BA3,BA4:對話框 MS1,MS2:保養空間 pr:突出部 TA1:第1端部 TA2:第2端部 TA3:第3端部 TA4:第4端部 W:基板 WP:作業者 1: Substrate processing device 8: Wafer cassette 9: Carrier 10a, 10b, 10c, 10d: Frame member 11: Support plate 12: Substrate inlet and outlet 13: Opening 100: Substrate loading and unloading area 101: End surface 102: One side surface 103: Other side surface 110: Wafer cassette rack 111, 112: Wafer cassette transport device 120, 130: Opener 140, 150: Substrate transfer robot 160: Control unit 190: Wafer cassette loading unit 200: Intermediate block 210, 220: Carrier support unit 211: Fixed pedestal 212: Carrier holder 212a: 1st holding section 212b: 2nd holding section 230: 1st standby section 240: 2nd standby section 250: Standby conveyor 300: Processing block 310: 1st conveyor 311: Main conveyor 311a: Movable stage 311b: Guide rail 312A, 312B: Sub-conveying device 320: 2nd conveyor 321: Conveying device 322: Movable pedestal 323: Carrier holder 323a: 1st holding section 323b: 2nd holding section 330: Processing section 331: Liquid processing unit 331a: Processing tank 331b: Elevator 332: Drying unit 333a: Movable support column 333A, 333B, 333C: Main transport device 333b: Chuck member 400: Cleaning block 410: Cleaning transport device 420: Carrier cleaning unit 421: Carrier cleaning tank 422: Carrier drying section 423: Carrier standby section a1~a5, b1, c1, c2, d1, d2, e1, e2: Arrows BA1, BA2, BA3, BA4: Dialog box MS1, MS2: Maintenance space pr: Protrusion TA1: 1st end TA2: 2nd end TA3: 3rd end TA4: 4th end W: Substrate WP: Worker

圖1係顯示本發明之一實施形態之基板處理裝置之基本構成之模式性俯視圖。 圖2係圖1之A-A線處之基板處理裝置之模式性剖視圖。 圖3係圖1之基板處理裝置中使用之載體之俯視圖。 圖4係圖3之載體之一側視圖。 圖5係圖4之B-B線處之載體之剖視圖。 圖6係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖7係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖8係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖9係顯示另一實施形態之基板處理裝置之基本構成之模式性俯視圖。 圖10係圖9之基板處理裝置之模式性一側視圖。 圖11係顯示又一實施形態之基板處理裝置之基本構成之模式性俯視圖。 FIG. 1 is a schematic top view showing the basic structure of a substrate processing device of an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing device at line A-A of FIG. 1 . FIG. 3 is a top view of a carrier used in the substrate processing device of FIG. 1 . FIG. 4 is a side view of the carrier of FIG. 3 . FIG. 5 is a cross-sectional view of the carrier at line B-B of FIG. 4 . FIG. 6 is a diagram for illustrating the transport path of a plurality of substrates and a carrier in the substrate processing device of FIG. 1 . FIG. 7 is a diagram for illustrating the transport path of a plurality of substrates and a carrier in the substrate processing device of FIG. 1 . FIG. 8 is a diagram for illustrating the transport path of a plurality of substrates and a carrier in the substrate processing device of FIG. 1 . FIG. 9 is a schematic top view showing the basic structure of another embodiment of a substrate processing device. FIG. 10 is a schematic side view of the substrate processing device of FIG. 9. FIG. 11 is a schematic top view showing the basic structure of another embodiment of a substrate processing device.

1:基板處理裝置 1: Substrate processing equipment

8:晶圓傳送盒 8: Wafer transfer box

9:載體 9: Carrier

100:基板搬入搬出區塊 100: Substrate loading and unloading area

110:晶圓傳送盒架 110: Wafer transfer box rack

111,112:晶圓傳送盒搬送裝置 111,112: Wafer transfer box transport device

120,130:開閉器 120,130: switch

140,150:基板交接機器人 140,150: Substrate transfer robot

190:晶圓傳送盒載置部 190: Wafer transfer box loading unit

200:中繼區塊 200: Relay block

210,220:載體支持部 210,220: Carrier support department

230:第1待機部 230: 1st standby unit

240:第2待機部 240: Second standby unit

250:待機搬送裝置 250: Standby transport device

300:處理區塊 300: Processing block

310:第1搬送部 310: 1st transport section

311:主搬送裝置 311: Main transport device

311a:可動載台 311a: Movable platform

311b:導軌 311b:Guide rails

312A,312B:副搬送裝置 312A, 312B: Auxiliary conveyor device

320:第2搬送部 320: Second transport section

321:搬送裝置 321: Transport device

330:處理部 330: Processing Department

331:液體處理單元 331:Liquid handling unit

332:乾燥單元 332: Drying unit

333A,333B,333C:主搬送裝置 333A, 333B, 333C: Main transport device

400:洗淨區塊 400: Washing area

410:洗淨搬送裝置 410: Cleaning and conveying device

420:載體洗淨單元 420: Carrier cleaning unit

421:載體洗淨槽 421: Carrier cleaning tank

422:載體乾燥部 422: Carrier drying section

423:載體待機部 423: Carrier standby unit

a1~a5,b1,c1,c2:箭頭 a1~a5,b1,c1,c2:arrow

TA1:第1端部 TA1: End 1

TA2:第2端部 TA2: End 2

TA3:第3端部 TA3: End 3

TA4:第4端部 TA4: End 4

Claims (6)

一種基板處理裝置,其係對複數片基板進行預設之處理者,且具備:載體,其構成為可收納上述複數片基板;搬送機構,其沿預設之第1搬送路徑,將上述載體自該第1搬送路徑之起點搬送至終點;處理單元,其設置於上述第1搬送路徑上,於將上述複數片基板收納於上述載體之狀態下,對收納於該載體之上述複數片基板進行上述預設之處理;基板插入部,其將搬入至上述基板處理裝置之未處理之上述複數片基板插入至空的上述載體;第1待機部,其以與上述第1搬送路徑之上述起點相鄰之方式設置,且構成為可藉由上述基板插入部支持收納有未處理之上述複數片基板之上述載體,並將其移交給上述第1搬送路徑之上述起點;第2待機部,其以與上述第1搬送路徑之上述終點相鄰之方式設置,且構成為可自上述第1搬送路徑之上述終點接收並支持收納有處理後之上述複數片基板之上述載體;基板取出部,其自收納有由上述處理單元處理後之上述複數片基板之上述載體,取出處理後之上述複數片基板;及載體洗淨部,其將上述載體洗淨;且形成將上述載體自上述第2待機部搬送至上述第1待機部之預設之第2搬送路徑; 上述載體洗淨部具有洗淨搬送裝置及載體洗淨單元;上述載體洗淨單位洗淨上述載體;上述洗淨搬送裝置自上述第2搬送路徑中之上述第2待機部拾起已藉由上述基板取出部取出處理後之上述複數片基板後之空的上述載體並移交給上述載體洗淨單元,將藉由上述載體洗淨單元洗淨之上述載體返回至上述第2搬送路徑。 A substrate processing device is used to perform a preset processing on a plurality of substrates, and comprises: a carrier, which is configured to accommodate the plurality of substrates; a conveying mechanism, which conveys the carrier from a starting point to an end point along a preset first conveying path; and a processing unit, which is arranged on the first conveying path and performs the preset processing on the plurality of substrates accommodated in the carrier while the plurality of substrates are accommodated in the carrier. processing; a substrate inserting section, which inserts the unprocessed plurality of substrates carried into the substrate processing device into the empty carrier; a first standby section, which is arranged adjacent to the starting point of the first conveying path, and is configured to support the carrier containing the unprocessed plurality of substrates by the substrate inserting section and transfer the carrier to the starting point of the first conveying path; a second standby section, which is arranged adjacent to the starting point of the first conveying path The first transport path is configured to receive and support the carrier containing the plurality of processed substrates from the first transport path; a substrate removal portion that removes the plurality of processed substrates from the carrier containing the plurality of processed substrates by the processing unit; and a carrier cleaning portion that cleans the carrier; and forms a preset position for transporting the carrier from the second standby portion to the first standby portion. The second conveying path of the carrier cleaning section; the carrier cleaning section has a cleaning conveying device and a carrier cleaning unit; the carrier cleaning unit cleans the carrier; the cleaning conveying device picks up the empty carrier after the plurality of substrates processed by the substrate removal section are removed from the second standby section in the second conveying path and transfers it to the carrier cleaning unit, and returns the carrier cleaned by the carrier cleaning unit to the second conveying path. 如請求項1之基板處理裝置,其中上述載體洗淨單元包含:洗淨槽,其貯存用以將上述載體洗淨之洗淨液;上述洗淨搬送裝置構成為可將上述載體浸漬於上述洗淨槽之洗淨液、及自上述洗淨液提起浸漬於上述洗淨液之上述載體。 The substrate processing device of claim 1, wherein the carrier cleaning unit comprises: a cleaning tank storing a cleaning liquid for cleaning the carrier; the cleaning transport device is configured to immerse the carrier in the cleaning liquid in the cleaning tank and lift the carrier immersed in the cleaning liquid from the cleaning liquid. 如請求項2之基板處理裝置,其中上述載體洗淨單元進而包含使洗淨後之載體乾燥之載體乾燥部。 As in claim 2, the substrate processing device, wherein the carrier cleaning unit further includes a carrier drying section for drying the cleaned carrier. 如請求項1至3中任一項之基板處理裝置,其中上述載體洗淨單元進而包含:載體待機部,其使洗淨後之載體待機。 A substrate processing device as claimed in any one of claims 1 to 3, wherein the carrier cleaning unit further comprises: a carrier standby unit which allows the cleaned carrier to standby. 如請求項1至3中任一項之基板處理裝置,其中上述載體洗淨部使洗淨後之上述載體返回至上述第2搬送路徑中之上述第1待機部。 A substrate processing device as claimed in any one of claims 1 to 3, wherein the carrier cleaning section returns the cleaned carrier to the first standby section in the second transport path. 如請求項1至3中任一項之基板處理裝置,其中上述載體洗淨部相對於上述第2待機部位於遠離上述第1待機部的方向。 A substrate processing device as claimed in any one of claims 1 to 3, wherein the carrier cleaning section is located in a direction away from the first standby section relative to the second standby section.
TW112110454A 2022-03-24 2023-03-21 Substrate processing apparatus TWI853500B (en)

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JP2022-048681 2022-03-24
JP2022048681A JP2023142023A (en) 2022-03-24 2022-03-24 Substrate treatment device

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TW202343645A TW202343645A (en) 2023-11-01
TWI853500B true TWI853500B (en) 2024-08-21

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0817894B2 (en) 1992-01-29 1996-02-28 株式会社栗田機械製作所 Filter press filtration method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0817894B2 (en) 1992-01-29 1996-02-28 株式会社栗田機械製作所 Filter press filtration method

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