TW202343645A - Substrate processing apparatus - Google Patents

Substrate processing apparatus Download PDF

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TW202343645A
TW202343645A TW112110454A TW112110454A TW202343645A TW 202343645 A TW202343645 A TW 202343645A TW 112110454 A TW112110454 A TW 112110454A TW 112110454 A TW112110454 A TW 112110454A TW 202343645 A TW202343645 A TW 202343645A
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carrier
substrates
standby
unit
substrate
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TW112110454A
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TWI853500B (en
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天久賢治
谷口進一
岩﨑旭紘
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日商斯庫林集團股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/07Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for semiconductor wafers Not used, see H01L21/677
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

In the present invention, a carrier is conveyed along a first conveyance path. A plurality of substrates in the carrier are processed. A first standby unit is provided adjacent to a start point of the first conveyance path The first standby unit passes a carrier in which a plurality of unprocessed substrates are housed to the start point of the first conveyance path. A second standby unit is provided adjacent to an end point of the first conveyance path. The second standby unit receives the carrier in which the plurality of substrates, which have been processed, are housed. The plurality of substrates are removed from the carrier. After use, the carrier is picked up from a standby conveyance path connecting the second standby unit and the first standby unit, and then cleaned. The cleaned carrier is returned to the standby conveyance path.

Description

基板處理裝置Substrate processing equipment

本發明係關於一種於處理槽中處理複數片基板之基板處理裝置。The present invention relates to a substrate processing device for processing a plurality of substrates in a processing tank.

為對半導體基板、液晶顯示裝置或有機EL(Electro Luminescence:電致發光)顯示裝置等之FPD(Flat Panel Display:平板顯示器)用基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用基板、陶瓷基板或太陽能電池用基板等基板進行各種處理,而使用基板處理裝置。For FPD (Flat Panel Display) substrates such as semiconductor substrates, liquid crystal display devices or organic EL (Electro Luminescence) display devices, substrates for optical discs, substrates for magnetic discs, substrates for magneto-optical discs, optical discs, etc. A substrate processing apparatus is used to perform various processes on substrates such as cover substrates, ceramic substrates, and solar cell substrates.

作為此種基板處理裝置,具有將複數片基板浸漬於貯存在處理槽之處理液,進行蝕刻等處理之批量式基板處理裝置。例如,專利文獻1記載之批量式基板處理裝置包含晶圓傳送盒保持部、基板處理部及搬入搬出機構。晶圓傳送盒保持部構成為可保持晶圓傳送盒(FOUP:Front Opening Unified Pod)。晶圓傳送盒係構成為可以複數片基板於上下方向以規定間距排列之方式,將複數片基板以水平姿勢保持且收納之收納器。As such a substrate processing apparatus, there is a batch type substrate processing apparatus that immerses a plurality of substrates in a processing liquid stored in a processing tank and performs etching and other processes. For example, the batch type substrate processing apparatus described in Patent Document 1 includes a wafer cassette holding unit, a substrate processing unit, and a loading and unloading mechanism. The wafer pod holding unit is configured to hold a wafer pod (FOUP: Front Opening Unified Pod). The wafer transfer cassette is configured as a container that can hold and store a plurality of substrates in a horizontal position so that the plurality of substrates are arranged at a predetermined pitch in the up and down direction.

於該基板處理裝置中,將收納有未處理之複數片基板之晶圓傳送盒供給至晶圓傳送盒保持部並保持。於該狀態下,藉由搬入搬出機構具備之手自晶圓傳送盒取出複數片基板。該手構成為可一次保持複數片基板。藉由手取出之複數片基板經由複數個搬送機構及支持機構移交給基板處理部。In this substrate processing apparatus, a wafer transfer cassette containing a plurality of unprocessed substrates is supplied to and held in the wafer transfer cassette holding unit. In this state, a plurality of substrates are taken out from the wafer transfer cassette by the hand provided with the loading and unloading mechanism. The hand is configured to hold a plurality of substrates at a time. The plurality of substrates taken out by hand are transferred to the substrate processing unit through a plurality of conveying mechanisms and supporting mechanisms.

基板處理部具有複數個處理槽及主搬送機構。於複數個處理槽各者,貯存有用以對基板進行規定處理之處理液。移交給基板處理部之未處理之複數片基板各者藉由主搬送機構搬送至複數個處理槽之任一者之上方之位置。主搬送機構與上述手同樣,亦構成為可一次保持複數片基板。The substrate processing unit has a plurality of processing tanks and a main transport mechanism. Each of the plurality of processing tanks stores a processing liquid for predetermined processing of the substrate. The plurality of unprocessed substrates transferred to the substrate processing unit are each transported to a position above any one of the plurality of processing tanks by the main transport mechanism. The main conveying mechanism is also configured to hold a plurality of substrates at one time, similar to the above-mentioned hand.

搬送至複數個處理槽之任一者之上方之位置之複數片基板於位於該複數片基板之下方之處理槽內之處理液浸漬一定時間並提起。藉此,對複數片基板進行規定之處理。處理後之複數片基板自基板處理部取出,且經由複數個搬送機構及支持機構插入至保持於晶圓傳送盒保持部之空的晶圓傳送盒。收納有處理後之複數片基板之晶圓傳送盒自基板處理裝置搬出。The plurality of substrates transported to a position above any of the plurality of processing tanks are immersed in the processing liquid in the processing tank located below the plurality of substrates for a certain period of time and then lifted up. Thereby, predetermined processing is performed on a plurality of substrates. A plurality of processed substrates are taken out from the substrate processing part and inserted into an empty wafer transfer box held in the wafer transfer box holding part through a plurality of transport mechanisms and supporting mechanisms. The wafer transfer box containing the plurality of processed substrates is carried out from the substrate processing device.

[專利文獻1]日本專利特開2011-238945號公報[Patent Document 1] Japanese Patent Application Laid-Open No. 2011-238945

[發明所欲解決之問題][Problem to be solved by the invention]

如上所述,於專利文獻1記載之基板處理裝置中,於複數個搬送機構之間一體交接複數片基板。該等複數個搬送機構為一次保持複數片基板而具有相對複雜之構成。此種複雜之構成使對複數個搬送機構之洗淨等之保養作業繁瑣化。As described above, in the substrate processing apparatus described in Patent Document 1, a plurality of substrates are integrally transferred between a plurality of transport mechanisms. The plurality of transport mechanisms hold a plurality of substrates at one time and have a relatively complex structure. Such a complicated structure complicates maintenance work such as cleaning of the plurality of conveying mechanisms.

又,於上述基板處理裝置中,於包含複數個搬送機構之基板處理裝置之多個構成要件之間多次交接複數片基板。因此,自晶圓傳送盒取出之複數片基板各者於插入至空的晶圓傳送盒為止之期間,反復接觸多個構成要件及離開多個構成要件。此種基板處理裝置之多個構成要件相對於複數片基板各者之接觸及離開之反復成為微粒之產生要因。Furthermore, in the above-mentioned substrate processing apparatus, a plurality of substrates are transferred multiple times between a plurality of components of the substrate processing apparatus including a plurality of transport mechanisms. Therefore, each of the plurality of substrates taken out from the wafer transfer cassette repeatedly contacts and separates from multiple components while being inserted into an empty wafer transfer cassette. Repeated contact and separation of multiple components of such a substrate processing apparatus with respect to each of a plurality of substrates causes the generation of particles.

再者,當接觸複數片基板之複數個構成要件污染時,污染物質會自該等構成要件轉印至複數片基板,複數片基板之清潔度顯著降低。因此,考慮將接觸複數片基板之複數個構成要件各者洗淨。然而,若將與上述複數個構成要件分別對應之複數個洗淨機構設置於基板處理裝置,則基板處理裝置之構成複雜化且零件件數增加。Furthermore, when a plurality of components in contact with a plurality of substrates are contaminated, contaminants will be transferred from these components to the plurality of substrates, and the cleanliness of the plurality of substrates will be significantly reduced. Therefore, it is considered to clean each of the plurality of components that come into contact with the plurality of substrates. However, if a plurality of cleaning mechanisms respectively corresponding to the plurality of components described above are provided in the substrate processing apparatus, the structure of the substrate processing apparatus becomes complicated and the number of parts increases.

作為應對此種問題之方法,可考慮集中收納至可收納複數片基板之載體,一次搬送複數片基板。As a method to deal with this problem, it may be considered to centrally store a plurality of substrates into a carrier that can accommodate a plurality of substrates and transport a plurality of substrates at one time.

然而,因污染物質自複數片基板或處理槽轉印至載體,而有載體本身被污染之問題。因該載體上之污染物質轉印至基板,而成為使基板之品質降低之要因。However, since contaminants are transferred from multiple substrates or processing tanks to the carrier, there is a problem that the carrier itself is contaminated. Since the contaminants on the carrier are transferred to the substrate, they become a factor that degrades the quality of the substrate.

又,藉由附著於載體之處理液作用於載體之表面,亦有使載體之表面劣化之問題。又,於處理液為鍍覆液之情形時,可能會產生鍍覆附著於載體表面而生長之問題。In addition, there is also a problem of deterioration of the surface of the carrier by the treatment liquid adhering to the carrier acting on the surface of the carrier. In addition, when the treatment liquid is a plating liquid, there may be a problem that the plating adheres to the surface of the carrier and grows.

如此,於先前之基板處理技術中,未提供用以適當應對載體之污染或載體之變質之問題的構成及方法。As such, previous substrate processing technologies have not provided structures and methods to appropriately deal with the problems of carrier contamination or carrier deterioration.

因此,本發明之目的在於提供一種可防止複數片基板污染,且抑制搬送機構之構成複雜化及零件件數增加的基板處理裝置。Therefore, an object of the present invention is to provide a substrate processing apparatus that can prevent contamination of a plurality of substrates and suppress the complexity of the structure of the transport mechanism and the increase in the number of parts.

又,本發明之另一目的在於提供一種為防止構成為可收納複數片基板之載體之劣化,而可將載體之表面洗淨,重設載體之表面狀態之基板處理裝置。 [解決問題之技術手段] Another object of the present invention is to provide a substrate processing apparatus that can clean the surface of the carrier and reset the surface condition of the carrier in order to prevent deterioration of a carrier configured to accommodate a plurality of substrates. [Technical means to solve problems]

(1)根據本發明之一態樣之基板處理裝置係對複數片基板進行預設之處理者,且具備:載體,其構成為可收納複數片基板;搬送機構,其沿預設之第1搬送路徑,將載體自該第1搬送路徑之起點搬送至終點;處理單元,其設置於第1搬送路徑上,於將複數片基板收納於載體之狀態下,對收納於該載體之複數片基板進行預設之處理;基板插入部,其將搬入至基板處理裝置之未處理之複數片基板插入至空的載體;第1待機部,其以與第1搬送路徑之起點相鄰之方式設置,且構成為可藉由基板插入部支持收納有未處理之複數片基板之載體,並移交給第1搬送路徑之起點;第2待機部,其以與第1搬送路徑之終點相鄰之方式設置,且構成為可自第1搬送路徑之終點接收收納有處理後之複數片基板之載體,並支持;基板取出部,其自收納有由處理單元處理後之複數片基板之載體,取出處理後之複數片基板;及載體洗淨部,其將載體洗淨;且形成將載體自第2待機部搬送至第1待機部之預設之第2搬送路徑;載體洗淨部自第2搬送路徑拾起已由基板取出部取出處理後之複數片基板後之空的載體,並將拾起之載體洗淨,使洗淨後之載體返回至第2搬送路徑。(1) A substrate processing device according to one aspect of the present invention is designed to process a plurality of substrates, and is provided with: a carrier configured to accommodate a plurality of substrates; and a transport mechanism along a predetermined first The transport path transports the carrier from the starting point to the end point of the first transport path; the processing unit is provided on the first transport path and processes the plurality of substrates stored in the carrier while the plurality of substrates are stored in the carrier. Perform preset processing; a substrate insertion unit that inserts a plurality of unprocessed substrates carried into the substrate processing device into an empty carrier; a first standby unit that is provided adjacent to the starting point of the first transfer path, The substrate insertion portion is configured to support a carrier containing a plurality of unprocessed substrates and transfer them to the starting point of the first conveyance path; and the second standby portion is provided adjacent to the end point of the first conveyance path. , and is configured to receive and support a carrier containing a plurality of processed substrates from the end point of the first conveying path; A plurality of substrates; and a carrier cleaning part, which cleans the carrier; and forms a preset second transport path for transporting the carrier from the second standby part to the first standby part; the carrier cleaning part is from the second transport path Pick up the empty carrier after taking out the plurality of processed substrates from the substrate taking-out part, clean the picked up carrier, and return the cleaned carrier to the second transport path.

於該基板處理裝置中,搬入之未處理之複數片基板藉由基板插入部而插入至空的載體。收納未處理之複數片基板之載體由第1待機部支持,且移交給第1搬送路徑之起點。自第1搬送路徑之起點朝向終點,搬送收納複數片基板之載體。該情形時,搬送機構可藉由搬送收納有複數片基板之載體,而一體處理複數片基板。因此,搬送機構無需用以一體且直接保持複數片基板之繁瑣之構成。於將載體自第1搬送路徑之起點搬送至終點之期間,對收納於載體之複數片基板,藉由處理單元進行預設之處理。In this substrate processing apparatus, a plurality of loaded unprocessed substrates are inserted into an empty carrier through the substrate insertion portion. The carrier accommodating the plurality of unprocessed substrates is supported by the first standby unit and transferred to the starting point of the first conveyance path. The carrier accommodating a plurality of substrates is conveyed from the starting point to the end point of the first conveying path. In this case, the transport mechanism can handle the plurality of substrates in one piece by transporting the carrier accommodating the plurality of substrates. Therefore, the transport mechanism does not need to have a cumbersome structure for integrally and directly holding a plurality of substrates. During the period when the carrier is transported from the starting point to the end point of the first transport path, preset processing is performed on the plurality of substrates stored in the carrier by the processing unit.

收納處理後之複數片基板之載體自第1搬送路徑之終點由第2待機部接收,且由第2待機部支持。處理後之複數片基板藉由基板取出部自載體取出。空的載體於第2搬送路徑自第2待機部搬送至第1待機部。於該搬送中途,空的載體自第2搬送路徑被拾起,並藉由載體洗淨部洗淨。又,洗淨後之空的載體返回至第2搬送路徑。該情形時,可將通過第2搬送路徑搬送至第1待機部之洗淨後之空的載體用於插入未處理之複數片基板。如此,由於可再利用載體,故無需準備多個載體。又,由於將再利用之載體洗淨,故防止因再利用載體引起之複數片基板之污染。The carrier containing the plurality of processed substrates is received by the second standby unit from the end point of the first conveyance path and is supported by the second standby unit. The processed plurality of substrates are taken out from the carrier through the substrate taking-out part. The empty carrier is conveyed from the second waiting part to the first waiting part on the second conveying path. In the middle of the conveyance, the empty carrier is picked up from the second conveyance path and washed by the carrier washing part. Furthermore, the cleaned and empty carriers are returned to the second conveyance path. In this case, the cleaned and empty carrier transported to the first standby section through the second transport path can be used to insert a plurality of unprocessed substrates. In this way, since the carrier can be reused, there is no need to prepare multiple carriers. In addition, since the reused carrier is washed, contamination of multiple substrates caused by the reused carrier is prevented.

其等之結果,可防止複數片基板污染,且抑制搬送機構之構成複雜化及零件件數增加。As a result, it is possible to prevent contamination of a plurality of substrates, and to suppress the complexity of the structure of the transport mechanism and the increase in the number of parts.

再者,根據上述構成,可在每當用於處理複數片基板時,將用於處理複數片基板之載體洗淨。藉此,由於在每當處理複數片基板時,重設載體之表面狀態,故亦可抑制因污染或腐蝕等引起之載體之劣化。Furthermore, according to the above configuration, the carrier used for processing a plurality of substrates can be cleaned every time it is used for processing a plurality of substrates. Thereby, since the surface state of the carrier is reset each time a plurality of substrates are processed, deterioration of the carrier due to contamination, corrosion, etc. can also be suppressed.

(2)亦可為,載體洗淨部包含:洗淨槽,其貯存用以將載體洗淨之洗淨液;及載體搬送裝置,其構成為可將載體浸漬於處理槽之洗淨液、及自洗淨液提起浸漬於洗淨液之載體。(2) The carrier washing section may include: a washing tank that stores a cleaning liquid for washing the carrier; and a carrier transfer device that is configured to immerse the carrier in the cleaning liquid of the treatment tank. And the carrier is lifted up from the cleaning liquid and immersed in the cleaning liquid.

該情形時,於載體洗淨部中,可藉由使載體於洗淨槽內之洗淨液中浸漬一定時間,而以簡單之構成及簡單之方法將載體洗淨。In this case, in the carrier washing section, the carrier can be washed with a simple structure and a simple method by immersing the carrier in the cleaning liquid in the washing tank for a certain period of time.

(3)亦可為,載體洗淨部進而包含使洗淨後之載體乾燥之載體乾燥部。該情形時,塵埃難以附著於洗淨後之載體。藉此,抑制洗淨後之載體之清潔度降低。(3) The carrier washing part may further include a carrier drying part for drying the washed carrier. In this case, it is difficult for dust to adhere to the washed carrier. Thereby, the deterioration of the cleanliness of the washed carrier is suppressed.

(4)亦可為,載體洗淨部進而包含使洗淨後之載體待機之載體待機部。該情形時,可使洗淨後之載體於載體洗淨部待機。藉此,可使洗淨後之載體於適當之時序返回至第2搬送路徑。(4) The carrier washing part may further include a carrier waiting part for waiting the washed carrier. In this case, the washed carrier can be left to wait in the carrier washing section. Thereby, the cleaned carrier can be returned to the second conveyance path at an appropriate timing.

(5)亦可為,載體洗淨部自第2搬送路徑中之第2待機部拾起空的載體。該情形時,由於第2待機部位於第2搬送路徑之起點,故防止用將處理複數片基板之使用後之載體以未被洗淨之狀態遍及第2搬送路徑之廣範圍搬送。因此,抑制第2搬送路徑之污染。(5) The carrier cleaning unit may pick up empty carriers from the second standby unit in the second conveyance path. In this case, since the second standby unit is located at the starting point of the second conveyance path, it is prevented that the used carrier for processing a plurality of substrates is conveyed across a wide range of the second conveyance path in an unwashed state. Therefore, contamination of the second conveyance path is suppressed.

(6)亦可為,載體洗淨部使洗淨後之載體返回至第2搬送路徑中之第1待機部。該情形時,由於第1待機部位於第2搬送路徑之終點,故不遍及第2搬送路徑之廣範圍搬送洗淨後之載體。因此,可不降低洗淨後之載體之清潔度,而使該載體收納未處理之複數片基板。 [發明之效果] (6) The carrier cleaning unit may return the cleaned carrier to the first standby unit in the second conveyance path. In this case, since the first standby unit is located at the end point of the second conveyance path, the cleaned carrier is not conveyed over the wide range of the second conveyance path. Therefore, the carrier can accommodate a plurality of unprocessed substrates without reducing the cleanliness of the washed carrier. [Effects of the invention]

根據本發明,可防止複數片基板污染,且抑制搬送裝置之構成複雜化及零件件數增加。According to the present invention, it is possible to prevent contamination of a plurality of substrates, and to suppress the complexity of the structure of the transport device and the increase in the number of parts.

以下,參考圖式且說明本發明之一實施形態之基板處理裝置。於以下說明中,基板係指用於液晶顯示裝置或有機EL(Electro Luminescence)顯示裝置等之FPD(Flat Panel Display)用基板、半導體基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用基板、陶瓷基板或太陽能電池用基板等。又,以下說明之基板於俯視下具有矩形狀。Hereinafter, a substrate processing apparatus according to an embodiment of the present invention will be described with reference to the drawings. In the following description, substrates refer to FPD (Flat Panel Display) substrates, semiconductor substrates, optical disk substrates, magnetic disk substrates, and magneto-optical disk substrates used in liquid crystal display devices or organic EL (Electro Luminescence) display devices. Substrates for photomasks, ceramic substrates, or solar cell substrates, etc. In addition, the substrate described below has a rectangular shape in plan view.

<1>基板處理裝置之構成 (1)全體構成及方向之定義 圖1係顯示本發明之一實施形態之基板處理裝置之基本構成之模式性俯視圖。圖2係圖1之A-A線處之基板處理裝置1之模式性剖視圖。如圖1及圖2所示,基板處理裝置1主要具備基板搬入搬出區塊100、中繼區塊200、處理區塊300及洗淨區塊400。 <1>Structure of substrate processing equipment (1) Definition of overall composition and direction FIG. 1 is a schematic plan view showing the basic structure of a substrate processing apparatus according to an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus 1 taken along line A-A in FIG. 1 . As shown in FIGS. 1 and 2 , the substrate processing apparatus 1 mainly includes a substrate loading and unloading block 100 , a relay block 200 , a processing block 300 and a cleaning block 400 .

此處,於圖1及圖2之後之指定圖中,為明確基板處理裝置1之各構成要件之位置關係,而標註表示互相正交之X方向、Y方向及Z方向之箭頭。X方向及Y方向於水平面內互相正交,Z方向相當於鉛直方向。又,於各方向中將箭頭所朝向之方向設為+方向,將與該+方向相反之方向設為-方向。於以下說明中,於簡稱為X方向之情形時,該X方向包含+X方向及-X方向。又,於簡稱為Y方向之情形時,該Y方向包含+Y方向及-Y方向。又,於簡稱為Z方向之情形時,該Z方向包含+Z方向及-Z方向。Here, in the designated drawings after FIG. 1 and FIG. 2 , in order to clarify the positional relationship of each component of the substrate processing apparatus 1 , arrows indicating the X direction, Y direction, and Z direction that are orthogonal to each other are marked. The X direction and the Y direction are orthogonal to each other in the horizontal plane, and the Z direction is equivalent to the vertical direction. Moreover, among each direction, let the direction toward which the arrow points is a + direction, and let the direction opposite to this + direction be a - direction. In the following description, when simply referred to as the X direction, the X direction includes the +X direction and the -X direction. In addition, when it is simply referred to as the Y direction, the Y direction includes the +Y direction and the -Y direction. In addition, when it is simply called the Z direction, the Z direction includes the +Z direction and the -Z direction.

(2)基板搬入搬出區塊100 基板搬入搬出區塊100包含複數個晶圓傳送盒架110、晶圓傳送盒搬送裝置111、112、開閉器120、130、基板交接機器人140、150、2個晶圓傳送盒載置部190及控制部160(圖2)。又,基板搬入搬出區塊100具有構成基板處理裝置1之外壁之一部分之端面部101、一側面部102及另一側面部103。端面部101位於朝向-X方向之基板處理裝置1之一端部,且與X方向正交。一側面部102及另一側面部103以於Y方向上互相對向之方式,於俯視下自端面部101之兩端部朝+X方向平行延伸。 (2)Substrate loading and unloading block 100 The substrate loading and unloading block 100 includes a plurality of wafer cassette racks 110, wafer cassette transporting devices 111, 112, switches 120, 130, substrate transfer robots 140, 150, two wafer cassette placing units 190, and Control unit 160 (Fig. 2). In addition, the substrate loading and unloading block 100 has an end surface 101 , one side surface 102 , and the other side surface 103 constituting a part of the outer wall of the substrate processing apparatus 1 . The end portion 101 is located at one end of the substrate processing apparatus 1 facing the -X direction, and is orthogonal to the X direction. One side surface part 102 and the other side surface part 103 are opposite to each other in the Y direction, and extend in parallel from both ends of the end surface part 101 toward the +X direction in a plan view.

2個晶圓傳送盒載置部190以自端面部101朝-X方向突出之方式設置。各晶圓傳送盒載置部190構成為可載置多段收納複數片基板之晶圓傳送盒(FOUP:Front Opening Unified Pod)8。於端面部101中,於與各晶圓傳送盒載置部190對應之部分,形成有用以使晶圓傳送盒8於X方向通過之未圖示之通路開口部。The two wafer transfer cassette placing portions 190 are provided to protrude from the end portion 101 in the −X direction. Each wafer pod mounting part 190 is configured as a wafer pod (FOUP: Front Opening Unified Pod) 8 that can accommodate a plurality of substrates in multiple stages. In the end portion 101 , a passage opening (not shown) for allowing the wafer transfer pod 8 to pass in the X direction is formed in a portion corresponding to each wafer transfer pod placement portion 190 .

於晶圓傳送盒8中,形成有用以自該晶圓傳送盒8之內部空間取出基板、及用以將基板插入該晶圓傳送盒8之內部空間之開口部。又,晶圓傳送盒8包含用以將該開口部開閉之蓋。晶圓傳送盒8之開口部於晶圓傳送盒8之搬送時及待機時封閉,於對晶圓傳送盒8取出及插入基板時開放。於圖1及圖2中,為可明確區分晶圓傳送盒8與後述之載體9,對晶圓傳送盒8標註有陰影線,對載體9標註有點圖案。於圖1之例中,於排列在Y方向之2個晶圓傳送盒載置部190中之一晶圓傳送盒載置部190載置有晶圓傳送盒8,於另一晶圓傳送盒載置部190未載置晶圓傳送盒8。晶圓傳送盒8之數量或晶圓傳送盒架110之排列可根據裝置設計規格適當變更。The wafer transfer box 8 is formed with an opening for taking out the substrate from the internal space of the wafer transfer box 8 and inserting the substrate into the internal space of the wafer transfer box 8 . In addition, the wafer transfer box 8 includes a cover for opening and closing the opening. The opening of the wafer transfer box 8 is closed when the wafer transfer box 8 is being transported and when it is on standby, and is opened when the wafer transfer box 8 is taken out and a substrate is inserted. In FIGS. 1 and 2 , in order to clearly distinguish the wafer transfer box 8 from the carrier 9 described below, the wafer transfer box 8 is marked with hatching and the carrier 9 is marked with a dotted pattern. In the example of FIG. 1 , the wafer transfer cassette 8 is placed on one of the two wafer transfer cassette loading parts 190 arranged in the Y direction, and the wafer transfer cassette 8 is placed on the other wafer transfer cassette. The wafer transfer cassette 8 is not placed on the placement portion 190 . The number of wafer transfer boxes 8 or the arrangement of the wafer transfer box racks 110 can be appropriately changed according to the device design specifications.

複數個晶圓傳送盒架110於與端面部101在+X方向上離開規定距離之位置,以互相隔開之方式設置。本例中,16個晶圓傳送盒架110以於與Z方向及Y方向平行之面內呈4列4行排列之方式,藉由未圖示之固定構件固定。各晶圓傳送盒架110構成為可載置晶圓傳送盒8。於圖1之例中,於位於最上段之4個晶圓傳送盒架110中之3個晶圓傳送盒架110各者載置有晶圓傳送盒8,於剩餘之1個晶圓傳送盒架110未載置晶圓傳送盒8。The plurality of wafer transfer cassette racks 110 are spaced apart from each other at positions separated from the end surface 101 by a predetermined distance in the +X direction. In this example, the 16 wafer transfer cassette racks 110 are arranged in 4 columns and 4 rows in a plane parallel to the Z direction and the Y direction, and are fixed by a fixing member not shown in the figure. Each wafer transfer cassette rack 110 is configured to mount the wafer transfer cassette 8 . In the example of FIG. 1 , a wafer transfer box 8 is placed on each of three of the four wafer transfer box racks 110 located in the uppermost section, and the remaining one wafer transfer box is loaded with a wafer transfer box 8 . The wafer transfer cassette 8 is not placed on the rack 110 .

2個開閉器120、130於與複數個晶圓傳送盒架110在+X方向上離開規定距離之位置,以互相隔開之方式設置。本例中,2個開閉器120、130以於Y方向上排列之方式,藉由未圖示之固定構件固定。一開閉器120位於一側面部102附近,另一開閉器130位於另一側面部103附近。各開閉器120、130構成為可載置晶圓傳送盒8且可將所載置之晶圓傳送盒8之蓋開閉。於圖1之例中,於一開閉器120載置有晶圓傳送盒8,於另一開閉器130上未載置晶圓傳送盒8。The two shutters 120 and 130 are spaced apart from each other at positions separated from the plurality of wafer transfer cassette racks 110 by a predetermined distance in the +X direction. In this example, the two switches 120 and 130 are arranged in the Y direction and are fixed by a fixing member (not shown). One shutter 120 is located near one side surface 102 , and the other shutter 130 is located near the other side surface 103 . Each of the shutters 120 and 130 is configured to be able to place the wafer transfer box 8 and open and close the lid of the placed wafer transfer box 8 . In the example of FIG. 1 , the wafer transfer cassette 8 is placed on one switch 120 , but the wafer transfer cassette 8 is not placed on the other switch 130 .

基板交接機器人140設置為於+X方向上與開閉器120相鄰。基板交接機器人140構成為可繞Z方向之軸旋轉且可沿Z方向移動(可升降)。於基板交接機器人140中,設置有用以交接1片或複數片基板之手。手由多關節型臂支持,可於水平方向進退。基板交接機器人140用於在將收納有未處理之基板之晶圓傳送盒8載置於開閉器120之狀態下,自該晶圓傳送盒8取出基板,並將取出之基板插入配置於中繼區塊200內之後述之載體9內。The substrate transfer robot 140 is provided adjacent to the shutter 120 in the +X direction. The substrate transfer robot 140 is configured to be rotatable about an axis in the Z direction and movable (liftable) in the Z direction. The substrate transfer robot 140 is provided with a hand for transferring one or a plurality of substrates. The hands are supported by multi-jointed arms and can move forward and backward in the horizontal direction. The substrate transfer robot 140 is used to take out the substrate from the wafer transfer cassette 8 with the wafer transfer cassette 8 containing unprocessed substrates placed on the switch 120 , and insert and arrange the removed substrate into the relay. Block 200 is located in the carrier 9 described later.

基板交接機器人150設置為於+X方向上與開閉器130相鄰。基板交接機器人150具有與基板交接機器人140相同之構成。基板交接機器人150用於在將空的晶圓傳送盒8載置於開閉器130之狀態下,自配置於中繼區塊200內之後述之載體9中取出基板,並將取出之基板插入開閉器130上之晶圓傳送盒8內。The substrate transfer robot 150 is provided adjacent to the shutter 130 in the +X direction. The substrate transfer robot 150 has the same structure as the substrate transfer robot 140 . The substrate transfer robot 150 is used to take out the substrate from the carrier 9 arranged in the relay block 200 to be described later, with the empty wafer transfer cassette 8 placed on the switch 130, and insert the removed substrate into the switch. In the wafer transfer box 8 on the device 130 .

晶圓傳送盒搬送裝置111位於X方向上之端面部101與複數個晶圓傳送盒架110之間。晶圓傳送盒搬送裝置111具有構成為可固持晶圓傳送盒8之未圖示之固持部,且構成為可使該固持部於Y方向移動及於Z方向移動。藉此,晶圓傳送盒搬送裝置111於2個晶圓傳送盒載置部190之任一者、與複數個晶圓傳送盒架110之任一者之間搬送晶圓傳送盒8。The wafer pod transport device 111 is located between the end portion 101 in the X direction and the plurality of wafer pod frames 110 . The wafer pod transport device 111 has a holding portion (not shown) configured to hold the wafer pod 8, and is configured to move the holding portion in the Y direction and the Z direction. Thereby, the wafer pod transport device 111 transports the wafer pod 8 between any one of the two wafer pod mounting parts 190 and any one of the plurality of wafer pod racks 110 .

晶圓傳送盒搬送裝置112位於X方向上之複數個晶圓傳送盒架110與2個開閉器120、130之間。晶圓傳送盒搬送裝置112具有與晶圓傳送盒搬送裝置111相同之構成。晶圓傳送盒搬送裝置112於複數個晶圓傳送盒架110之任一者、與2個開閉器120、130之任一者之間搬送晶圓傳送盒8。The wafer pod transport device 112 is located between the plurality of wafer pod racks 110 and the two shutters 120 and 130 in the X direction. The pod transport device 112 has the same structure as the pod transport device 111 . The wafer pod transport device 112 transports the wafer pod 8 between any one of the plurality of wafer pod racks 110 and any one of the two shutters 120 and 130 .

控制部160(圖2)包含含有CPU(Central Processing Unit:中央處理單元)、ROM(Read Only Memory:唯讀記憶體)及RAM(Random Access Memory:隨機存取記憶體)之電腦等,且控制基板處理裝置1內之各構成要件之動作。The control unit 160 (Fig. 2) includes a computer including a CPU (Central Processing Unit: Central Processing Unit), ROM (Read Only Memory: Read Only Memory), and RAM (Random Access Memory: Random Access Memory), and controls Operations of each component in the substrate processing apparatus 1.

(3)中繼區塊200 中繼區塊200主要具備2個載體支持部210、220、第1待機部230、第2待機部240及待機搬送裝置250。載體支持部210設置為於+X方向上與基板搬入搬出區塊100之基板交接機器人140相鄰。又,載體支持部210構成為可支持多段收納複數片基板之載體9。稍後敘述載體9之細節。再者,載體支持部210構成為可支持載體9,且變更所支持之載體9之姿勢。稍後敘述用以變更載體9之姿勢之載體支持部210之構成之細節。另,於圖1之例中,於載體支持部210上支持有載體9。 (3) Relay block 200 The relay block 200 mainly includes two carrier support parts 210 and 220, a first standby part 230, a second standby part 240, and a standby transfer device 250. The carrier support unit 210 is provided adjacent to the substrate transfer robot 140 of the substrate loading and unloading block 100 in the +X direction. Furthermore, the carrier support part 210 is configured to support the carrier 9 that accommodates a plurality of substrates in multiple stages. Details of the carrier 9 will be described later. Furthermore, the carrier support part 210 is configured to support the carrier 9 and change the posture of the supported carrier 9 . Details of the structure of the carrier support portion 210 for changing the posture of the carrier 9 will be described later. In addition, in the example of FIG. 1 , the carrier 9 is supported on the carrier support part 210 .

載體支持部220設置為於+X方向上與基板搬入搬出區塊100之基板交接機器人150相鄰。又,載體支持部220具有與載體支持部210相同之構成。另,於圖1之例中,於載體支持部220上未支持載體9。The carrier support unit 220 is provided adjacent to the substrate transfer robot 150 of the substrate loading and unloading block 100 in the +X direction. In addition, the carrier support part 220 has the same structure as the carrier support part 210. In addition, in the example of FIG. 1 , the carrier 9 is not supported on the carrier support part 220 .

第1待機部230設置為於+X方向上與載體支持部210相鄰。又,第1待機部230構成為可支持載體9。再者,第1待機部230構成為可將由該第1待機部230支持之載體9移交給載體支持部210、及自載體支持部210接收由載體支持部210支持之載體9。The first standby part 230 is provided adjacent to the carrier support part 210 in the +X direction. Furthermore, the first standby unit 230 is configured to support the carrier 9 . Furthermore, the first standby unit 230 is configured to transfer the carrier 9 supported by the first standby unit 230 to the carrier support unit 210 and to receive the carrier 9 supported by the carrier support unit 210 from the carrier support unit 210 .

第2待機部240設置為於+X方向上與載體支持部220相鄰。又,第2待機部240構成為可支持載體9。再者,第2待機部240構成為可將由該第2待機部240支持之載體9移交給載體支持部220、及自載體支持部220接收由載體支持部220支持之載體9。The second standby part 240 is provided adjacent to the carrier support part 220 in the +X direction. In addition, the second standby unit 240 is configured to support the carrier 9 . Furthermore, the second standby unit 240 is configured to transfer the carrier 9 supported by the second standby unit 240 to the carrier support unit 220 and to receive the carrier 9 supported by the carrier support unit 220 from the carrier support unit 220 .

待機搬送裝置250設置於第1待機部230與第2待機部240之間。待機搬送裝置250構成為可保持載體9且可於第1待機部230與第2待機部240之間於Y方向移動。待機搬送裝置250例如將由第2待機部240支持之載體9搬送至第1待機部230。The standby transfer device 250 is provided between the first standby unit 230 and the second standby unit 240 . The standby transfer device 250 is configured to hold the carrier 9 and move in the Y direction between the first standby portion 230 and the second standby portion 240 . The standby transport device 250 transports the carrier 9 supported by the second standby unit 240 to the first standby unit 230 , for example.

(4)處理區塊300 處理區塊300包含第1搬送部310、第2搬送部320及處理部330。第1搬送部310及處理部330設置為依序排列於+Y方向上,且自中繼區塊200朝+X方向並行延伸。第2搬送部320以於Y方向延伸之方式形成,連接第1搬送部310之朝向+X方向之端部、與處理部330之朝向+X方向之端部。 (4) Processing block 300 The processing block 300 includes a first transport unit 310 , a second transport unit 320 and a processing unit 330 . The first transport unit 310 and the processing unit 330 are arranged in order in the +Y direction and extend in parallel from the relay block 200 in the +X direction. The second conveying part 320 is formed to extend in the Y direction, and connects the end of the first conveying part 310 facing the +X direction and the end of the processing part 330 facing the +X direction.

於以下說明中,將於X方向延伸之第1搬送部310之兩端部中朝向-X方向之端部適當稱為第1端部TA1,將朝向+X方向之另一端部適當稱為第2端部TA2。又,將於X方向延伸之處理部330之兩端部中朝向-X方向之一端部適當稱為第3端部TA3,將朝向+X方向之另一端部適當稱為第4端部TA4。In the following description, among the two ends of the first conveyance part 310 extending in the X direction, the end facing the -X direction is appropriately referred to as the first end TA1, and the other end facing the +X direction is appropriately referred to as the first end. 2 end TA2. In addition, of the two ends of the treatment part 330 extending in the X direction, the one facing the -X direction is appropriately called the third end TA3, and the other end facing the +X direction is appropriately called the fourth end TA4.

第1搬送部310包含主搬送裝置311及2個副搬送裝置312A、312B。主搬送裝置311包含可動載台311a及導軌311b。導軌311b設置為自第1搬送部310之第1端部TA1延伸至第2端部TA2。可動載台311a構成為可於導軌311b上於X方向移動且可載置載體9。主搬送裝置311進而具備使可動載台311a於導軌311b上沿X方向移動之未圖示之驅動機構。藉此,主搬送裝置311於在靠近中繼區塊200之第1端部TA1,將載體9載置於可動載台311a上之情形時,將所載置之載體9於+X方向上搬送至靠近第2搬送部320之第2端部TA2。The first conveyance unit 310 includes a main conveyance device 311 and two auxiliary conveyance devices 312A and 312B. The main transport device 311 includes a movable stage 311a and a guide rail 311b. The guide rail 311b is provided to extend from the first end TA1 of the first conveyance part 310 to the second end TA2. The movable stage 311a is configured to be movable in the X direction on the guide rail 311b and to be able to mount the carrier 9 . The main transport device 311 further includes a drive mechanism (not shown) that moves the movable stage 311a on the guide rail 311b in the X direction. Thereby, when the main conveying device 311 places the carrier 9 on the movable stage 311a near the first end TA1 of the relay block 200, it conveys the placed carrier 9 in the +X direction. to the second end TA2 close to the second conveying part 320.

副搬送裝置312A及副搬送裝置312B分別設置於X方向上之第1搬送部310之第1端部TA1及第2端部TA2。副搬送裝置312A於載體支持部210支持有收納未處理之基板之載體9之情形時,將該載體9載置於在第1端部TA1配置之主搬送裝置311之可動載台311a上。又,副搬送裝置312A自第1待機部230向載體支持部210搬送空的載體9。另一方面,副搬送裝置312B於載置有載體9之可動載台311a移動至第2端部TA2之情形時,將該載體9移交給第2搬送部320之後述之搬送裝置321。The auxiliary conveying device 312A and the auxiliary conveying device 312B are respectively provided at the first end TA1 and the second end TA2 of the first conveying part 310 in the X direction. When the carrier 9 accommodating unprocessed substrates is supported by the carrier support part 210, the auxiliary transport device 312A places the carrier 9 on the movable stage 311a of the main transport device 311 disposed at the first end TA1. Furthermore, the auxiliary transport device 312A transports the empty carrier 9 from the first standby unit 230 to the carrier support unit 210 . On the other hand, when the movable stage 311a on which the carrier 9 is mounted moves to the second end TA2, the auxiliary transport device 312B transfers the carrier 9 to the second transport part 320, to be described later, the transport device 321.

此處,如圖2所示,第1搬送部310設置於與基板處理裝置1之設置面於+Z方向(上方)上離開之位置。藉此,位於第1搬送部310之-Z方向(下方)之空間可作為後述之用以保養處理部330之保養空間MS1使用。因此,於本實施形態之基板處理裝置1中,如圖1所示,於俯視下第1搬送部310與處理部330之保養空間MS1重疊。於後述之圖8中,於保養空間MS1中,顯示於第1搬送部310之下方對處理部330進行保養作業之作業者WP。Here, as shown in FIG. 2 , the first transport unit 310 is provided at a position separated from the installation surface of the substrate processing apparatus 1 in the +Z direction (upper direction). Thereby, the space located in the -Z direction (below) of the first conveying part 310 can be used as the maintenance space MS1 for the maintenance processing part 330 described later. Therefore, in the substrate processing apparatus 1 of the present embodiment, as shown in FIG. 1 , the first transport section 310 and the maintenance space MS1 of the processing section 330 overlap in a plan view. In FIG. 8 , which will be described later, in the maintenance space MS1 , a worker WP who performs maintenance work on the processing unit 330 is shown below the first transport unit 310 .

第2搬送部320包含搬送裝置321。搬送裝置321構成為可支持載體9,且變更所支持之載體9之姿勢。稍後敘述用以變更載體9之姿勢之搬送裝置321之構成之細節。再者,搬送裝置321構成為可於Y方向移動。藉此,第2搬送部320可於第1搬送部310之第2端部TA2附近,自副搬送裝置312B接收載體9。又,第2搬送部320可變更自副搬送裝置312B接收到之載體9之姿勢,並使該載體9移動至處理部330之第4端部TA4附近之位置。The second transport unit 320 includes a transport device 321 . The conveying device 321 is configured to support the carrier 9 and change the posture of the supported carrier 9 . Details of the structure of the conveying device 321 for changing the posture of the carrier 9 will be described later. Furthermore, the conveying device 321 is configured to be movable in the Y direction. Thereby, the second conveying part 320 can receive the carrier 9 from the auxiliary conveying device 312B near the second end TA2 of the first conveying part 310. In addition, the second transport unit 320 can change the posture of the carrier 9 received from the sub-transport device 312B and move the carrier 9 to a position near the fourth end TA4 of the processing unit 330.

處理部330包含複數個(本例中為5個)液體處理單元331、乾燥單元332及(本例中為3個)複數個主搬送裝置333A、333B、333C。複數個液體處理單元331及乾燥單元332以乾燥單元332位於第3端部TA3之方式排列於X方向。The processing unit 330 includes a plurality (five in this example) of liquid processing units 331, a drying unit 332, and a plurality of main transport devices 333A, 333B, and 333C (three in this example). The plurality of liquid processing units 331 and drying units 332 are arranged in the X direction such that the drying unit 332 is located at the third end TA3.

複數個主搬送裝置333A、333B、333C設置為依序自第3端部TA3朝向第4端部TA4排列於沿+X方向延伸之一條直線上。各主搬送裝置333A、333B、333C構成為可保持載體9,且構成為可於複數個液體處理單元331及乾燥單元332之間搬送所保持之載體9。位於離中繼區塊200最遠之位置之主搬送裝置333C於第2搬送部320中將載體9搬送至處理部330附近之情形時,接收該載體9。又,主搬送裝置333C將接收到之載體9搬送至複數個液體處理單元331之任一者。The plurality of main conveying devices 333A, 333B, and 333C are arranged sequentially on a straight line extending in the +X direction from the third end TA3 toward the fourth end TA4. Each of the main conveying devices 333A, 333B, and 333C is configured to hold the carrier 9 and to convey the held carrier 9 between the plurality of liquid processing units 331 and drying units 332 . The main transport device 333C located at the farthest position from the relay block 200 receives the carrier 9 when the carrier 9 is transported to the vicinity of the processing unit 330 in the second transport unit 320 . Furthermore, the main transport device 333C transports the received carrier 9 to any one of the plurality of liquid processing units 331 .

複數個液體處理單元331各自具備1個或複數個處理槽331a及升降機331b。本例之各液體處理單元331具備2個處理槽331a。各處理槽331a構成為可自該處理槽331a之上方之位置插入及取出載體9。又,於處理槽331a中,貯存有用以將收納於載體9之複數片基板洗淨之處理液(藥液或清洗液)。Each of the plurality of liquid treatment units 331 includes one or a plurality of treatment tanks 331a and elevators 331b. Each liquid treatment unit 331 in this example includes two treatment tanks 331a. Each processing tank 331a is configured so that the carrier 9 can be inserted and taken out from a position above the processing tank 331a. In addition, the processing tank 331a stores a processing liquid (chemical liquid or cleaning liquid) for cleaning the plurality of substrates accommodated in the carrier 9 .

各液體處理單元331之升降機331b構成為可保持載體9。又,升降機331b構成為可自複數個主搬送裝置333A、333B、333C之任一者接收載體9、及將載體9移交給複數個主搬送裝置333A、333B、333C之任一者。再者,升降機331b構成為可對該液體處理單元331之2個處理槽331a各者,將載體9浸漬於處理液中、及自處理液中提起載體9。藉此,藉由將收納有未處理之基板之載體9移交給處理部330,而將收納於該載體9之複數片基板於1種或複數種處理液中浸漬規定時間,而對複數片基板進行共通之處理。The elevator 331b of each liquid treatment unit 331 is configured to hold the carrier 9 . Furthermore, the elevator 331b is configured to receive the carrier 9 from any one of the plurality of main conveyance devices 333A, 333B, and 333C, and to transfer the carrier 9 to any one of the plurality of main conveyance devices 333A, 333B, and 333C. Furthermore, the elevator 331b is configured to immerse the carrier 9 in the treatment liquid and to lift the carrier 9 from the treatment liquid in each of the two treatment tanks 331a of the liquid treatment unit 331. Thereby, the carrier 9 containing unprocessed substrates is transferred to the processing unit 330, and the plurality of substrates accommodated in the carrier 9 are immersed in one or a plurality of processing liquids for a predetermined time, thereby treating the plurality of substrates. Perform common processing.

乾燥單元332對由位於最靠近中繼區塊200之位置之主搬送裝置333A搬送之載體9進行乾燥處理。藉由該乾燥處理,收納於載體9內之複數片基板乾燥。乾燥處理後之載體9藉由位於最靠近中繼區塊200之位置之主搬送裝置333A移交給中繼區塊200之第2待機部240。The drying unit 332 dries the carrier 9 transported by the main transport device 333A located closest to the relay block 200 . Through this drying process, the plurality of substrates accommodated in the carrier 9 are dried. The dried carrier 9 is transferred to the second standby unit 240 of the relay block 200 by the main transport device 333A located closest to the relay block 200 .

此處,於複數個液體處理單元331之複數個處理槽331a,將分別與應對基板進行之複數個處理對應之複數種處理液以依應對基板進行之處理之順序排列於-X方向之方式貯存。圖2之控制部160容許主搬送裝置333A、333B、333C各者於保持載體9之狀態下於-X方向移動,且限制於保持載體9之狀態下於+X方向移動。該情形時,於藉由複數個主搬送裝置333A、333B、333C搬送複數個載體9時,抑制因一載體9與另一載體9互相朝相反方向移動引起之干擾之產生。又,由於載體9於處理部330內不於X方向往復移動,故處理部330中之載體9之搬送路徑之長度不超過處理部330之X方向之長度。Here, in the plurality of processing tanks 331a of the plurality of liquid processing units 331, a plurality of processing liquids respectively corresponding to a plurality of processes to be performed on the substrate are stored in a manner arranged in the -X direction in accordance with the order of processing to be performed on the substrate. . The control unit 160 in FIG. 2 allows each of the main transport devices 333A, 333B, and 333C to move in the -X direction while holding the carrier 9, and restricts the movement in the +X direction while holding the carrier 9. In this case, when the plurality of carriers 9 are conveyed by the plurality of main conveyance devices 333A, 333B, and 333C, the occurrence of interference caused by one carrier 9 and the other carrier 9 moving in opposite directions to each other is suppressed. In addition, since the carrier 9 does not reciprocate in the X direction in the processing part 330, the length of the transport path of the carrier 9 in the processing part 330 does not exceed the length of the processing part 330 in the X direction.

如圖1中虛線所示,於處理區塊300及其附近之區域中,除上述保養空間MS1外,還於處理部330之+Y方向側進而形成有保養空間MS2。如此,藉由以於Y方向上隔著處理部330之方式形成2個保養空間MS1、MS2,而確保對於處理部330之足夠大之保養空間。As shown by the dotted line in FIG. 1 , in the processing block 300 and its vicinity, in addition to the above-mentioned maintenance space MS1 , a maintenance space MS2 is also formed on the +Y direction side of the processing part 330 . In this way, by forming two maintenance spaces MS1 and MS2 across the processing part 330 in the Y direction, a sufficiently large maintenance space for the processing part 330 is ensured.

(5)洗淨區塊400 洗淨區塊400包含洗淨搬送裝置410及載體洗淨單元420。載體洗淨單元420設置為於基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置於X方向延伸。又,載體洗淨單元420包含以於X方向排列之方式設置之1個或複數個(本例中為3個)載體洗淨槽421、1個或複數個(本例中為1個)載體乾燥部422及1個或複數個(本例中為2個)載體待機部423。 (5) Wash block 400 The cleaning block 400 includes a cleaning transport device 410 and a carrier cleaning unit 420 . The carrier cleaning unit 420 is provided at a position on the side (+Y direction) of the substrate loading and unloading block 100 and the relay block 200 and extends in the X direction. In addition, the carrier washing unit 420 includes one or a plurality (three in this example) of carrier washing tanks 421 and one or a plurality (one in this example) of carriers arranged in the X direction. A drying part 422 and one or a plurality (in this example, two) carrier waiting parts 423.

1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423各者構成為可自該槽、乾燥部或待機部之上方之位置插入及取出載體9。又,於1個或複數個載體洗淨槽421各者,貯存有用以將載體9洗淨之處理液(藥液或清洗液)。1個或複數個載體乾燥部422各者對插入之載體9進行乾燥處理。One or a plurality of carrier washing tanks 421, one or a plurality of carrier drying sections 422, and one or a plurality of carrier standby sections 423 are each configured to be inserted from a position above the tank, drying section or standby section. Take out carrier 9. In addition, a treatment liquid (chemical liquid or cleaning liquid) for washing the carrier 9 is stored in each of one or a plurality of carrier washing tanks 421 . Each of one or a plurality of carrier drying parts 422 dries the inserted carrier 9 .

洗淨搬送裝置410構成為可於中繼區塊200之第2待機部240、1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間,搬送空的載體9。於洗淨區塊400中,於複數個載體洗淨槽421之間搬送空的載體9,且浸漬於貯存在1個或複數個載體洗淨槽421中之任一載體洗淨槽421之處理液中。藉此,將處理區塊300中用於處理複數片基板後之空的載體9洗淨。The cleaning and transporting device 410 is configured to be able to operate in the second standby section 240 of the relay block 200, one or a plurality of carrier washing tanks 421, one or a plurality of carrier drying sections 422, and one or a plurality of carrier standby sections. 423, the empty carrier 9 is transported. In the washing block 400, the empty carrier 9 is transported between the plurality of carrier washing tanks 421 and immersed in any one of the carrier washing tanks 421 stored in one or a plurality of carrier washing tanks 421. liquid. Thereby, the empty carrier 9 used for processing a plurality of substrates in the processing block 300 is cleaned.

將洗淨後之載體9搬送至1個或複數個載體乾燥部422中之任一者之載體乾燥部422,進行乾燥處理。將乾燥後之載體9搬送至1個或複數個載體待機部423中之任一者之載體待機部423並予以保持。其後,根據中繼區塊200中之複數片基板之接收時序,藉由洗淨搬送裝置410自載體待機部423取出,並搬送至中繼區塊200之第2待機部240。The washed carrier 9 is transported to the carrier drying section 422 of one or a plurality of carrier drying sections 422, and is dried. The dried carrier 9 is transported to the carrier standby part 423 of one or a plurality of carrier standby parts 423 and held. Thereafter, according to the receiving timing of the plurality of substrates in the relay block 200, they are taken out from the carrier standby section 423 by the cleaning and transport device 410, and transported to the second standby section 240 of the relay block 200.

<2>載體9之構成及載體9之姿勢 圖3係圖1之基板處理裝置1中使用之載體9之俯視圖,圖4係圖3之載體9之一側視圖,圖5係圖4之B-B線處之載體9之剖視圖。如圖3~圖5所示,載體9包含4個框架構件10a、10b、10c、10d。 <2>The structure of the carrier 9 and the posture of the carrier 9 FIG. 3 is a top view of the carrier 9 used in the substrate processing apparatus 1 of FIG. 1 , FIG. 4 is a side view of the carrier 9 of FIG. 3 , and FIG. 5 is a cross-sectional view of the carrier 9 along line B-B of FIG. 4 . As shown in FIGS. 3 to 5 , the carrier 9 includes four frame members 10a, 10b, 10c, and 10d.

框架構件10a、10b各者由大致正方形之板狀構件形成,具有較處理對象之基板大之外形。於框架構件10a、10b各者之中央部分,形成有4個開口部13。框架構件10c、10d各者由大致長方形之板狀構件形成。框架構件10c、10d之長邊之長度與框架構件10a、10b之一邊之長度大致相等。Each of the frame members 10a and 10b is formed of a substantially square plate-shaped member and has an outer shape larger than the substrate to be processed. Four openings 13 are formed in the center portions of each of the frame members 10a and 10b. Each of the frame members 10c and 10d is formed of a substantially rectangular plate-shaped member. The length of the long sides of the frame members 10c, 10d is substantially equal to the length of one side of the frame members 10a, 10b.

框架構件10a、10b配置為以互相對向之狀態隔開。以將框架構件10a之一側邊與框架構件10b之一側邊連接之方式設置有框架構件10c。以將框架構件10a之另一側邊與框架構件10b之另一側邊連接之方式設置有框架構件10d。於該狀態下,框架構件10c、10d亦互相對向配置。藉此,載體9具有角筒形狀。The frame members 10a and 10b are arranged so as to face each other and be spaced apart. The frame member 10c is provided so as to connect one side of the frame member 10a and one side of the frame member 10b. The frame member 10d is provided so as to connect the other side of the frame member 10a and the other side of the frame member 10b. In this state, the frame members 10c and 10d are also arranged facing each other. Thereby, the carrier 9 has a angular tube shape.

形成於具有角筒形狀之載體9之一端部之矩形之開口部作為用以將基板插入載體9內、及用以自載體9取出基板之基板出入口12發揮功能。於載體9之另一端部,以將框架構件10a與框架構件10b之間連接且於框架構件10c與框架構件10d之間分散配置之方式,設置有複數個(本例中為6個)支持片11。A rectangular opening formed at one end of the carrier 9 having a rectangular tube shape functions as a substrate entrance and exit 12 for inserting a substrate into the carrier 9 and for taking out the substrate from the carrier 9 . A plurality of support pieces (six in this example) are provided at the other end of the carrier 9 so as to connect the frame member 10a and the frame member 10b and to be dispersed between the frame member 10c and the frame member 10d. 11.

各支持片11由長條狀之板構件構成,且設置成與框架構件10c、10d平行。又,於各支持片11中,以預設之基準間距形成有可供收納於載體9之複數片基板之外緣之一部分插入之未圖示之複數個溝槽。形成於各支持片11之溝槽之數量與應收納於載體9之基板之數量相等。Each support piece 11 is composed of a long plate member and is provided parallel to the frame members 10c and 10d. In addition, in each supporting piece 11, a plurality of grooves (not shown) are formed at preset reference intervals into which a portion of the outer edge of a plurality of substrates accommodated in the carrier 9 can be inserted. The number of grooves formed in each supporting piece 11 is equal to the number of substrates to be accommodated in the carrier 9 .

於框架構件10c、10d之互相對向之2個面各者,形成有複數個突出部pr。複數個突出部pr形成為沿框架構件10c、10d之長邊方向延伸,且以上述基準間距排列於短邊方向上。藉此,於彼此相鄰之各2個之突出部pr之間,形成有可供基板之外緣插入之溝槽。A plurality of protrusions pr are formed on each of two mutually facing surfaces of the frame members 10c and 10d. The plurality of protrusions pr are formed to extend in the longitudinal direction of the frame members 10c and 10d and are arranged in the short-side direction at the above-mentioned reference pitch. Thereby, a groove into which the outer edge of the substrate can be inserted is formed between two adjacent protruding portions pr.

如上所述,於圖1之基板處理裝置1中,適當變更載體9之姿勢。此處,關於具有上述構成之載體9,將以複數個支持片11位於下端部且框架構件10a、10b與鉛直方向平行之方式維持之姿勢稱為鉛直姿勢。另一方面,將以框架構件10a、10b與鉛直方向正交之方式維持之姿勢稱為水平姿勢。As described above, in the substrate processing apparatus 1 of FIG. 1 , the posture of the carrier 9 is appropriately changed. Here, regarding the carrier 9 having the above structure, the posture in which the plurality of support pieces 11 are located at the lower end portion and the frame members 10a and 10b are parallel to the vertical direction is maintained is called a vertical posture. On the other hand, the posture maintained so that the frame members 10a, 10b are orthogonal to the vertical direction is called a horizontal posture.

於將複數片基板插入空的載體9之情形時,自處於水平姿勢之載體9之基板出入口12將複數片基板插入載體9之內部。此時,將各基板之外緣中之兩側部(互相對向之兩條邊之部分)插入框架構件10c之複數個突出部pr中之任意2者之間及框架構件10d之複數個突出部pr中之任意2者之間。藉此,於收納有複數片基板之載體9處於水平姿勢之情形時,各基板以該基板之兩側部由複數個突出部pr支持之狀態受保持。另一方面,於收納有複數片基板之載體9處於鉛直姿勢之情形時,各基板以該基板之下端部之複數個部分嵌入複數個支持片11之複數個溝槽之狀態受保持。When inserting a plurality of substrates into the empty carrier 9, the plurality of substrates are inserted into the interior of the carrier 9 from the substrate entrance and exit 12 of the carrier 9 in a horizontal position. At this time, insert both sides of the outer edge of each substrate (the portions of the two sides facing each other) between any two of the plurality of protruding portions pr of the frame member 10c and the plurality of protruding portions of the frame member 10d. Between any 2 of pr. Thereby, when the carrier 9 accommodating a plurality of substrates is in a horizontal posture, each substrate is held in a state in which both sides of the substrate are supported by the plurality of protrusions pr. On the other hand, when the carrier 9 accommodating a plurality of substrates is in a vertical posture, each substrate is held in a state in which a plurality of portions of the lower end portion of the substrate are embedded in a plurality of grooves of the plurality of supporting pieces 11 .

如上所述,於載體9處於水平姿勢之情形時,所收納之複數片基板各者之兩側部全體由複數個突出部pr支持。另一方面,於載體9處於鉛直姿勢之情形時,所收納之複數片基板各者藉由複數個支持片11局部支持該基板之下端部中之複數個部分。因此,於載體9處於水平姿勢之情形時,與載體9處於鉛直姿勢之情形相比,減少施加至所收納之各基板之外緣之負載(各基板之自重之負載)。As described above, when the carrier 9 is in the horizontal posture, the entire both sides of each of the accommodated plurality of substrates are supported by the plurality of protrusions pr. On the other hand, when the carrier 9 is in the vertical posture, each of the plurality of accommodated substrates is partially supported by the plurality of support pieces 11 at the lower end portion of the substrate. Therefore, when the carrier 9 is in the horizontal posture, the load (the load of the own weight of each substrate) applied to the outer edge of each accommodated substrate is reduced compared to the case when the carrier 9 is in the vertical posture.

本實施形態之載體9形成為,處於水平姿勢時之該載體9之鉛直方向之尺寸(高度)小於處於鉛直姿勢時之該載體9之鉛直方向之尺寸(高度)。The carrier 9 in this embodiment is formed such that the vertical dimension (height) of the carrier 9 when in the horizontal posture is smaller than the vertical dimension (height) of the carrier 9 when in the vertical posture.

<3>基板處理裝置中之複數片基板及載體9之搬送路徑 圖6~圖8係用以說明圖1之基板處理裝置1中之複數片基板及載體9之搬送路徑之圖。圖6中,與圖1同樣顯示基板處理裝置1之模式性俯視圖。圖7顯示於一方向觀察圖1之基板處理裝置1之模式性外觀立體圖。圖8顯示於另一方向觀察圖1之基板處理裝置1之模式性外觀立體圖。另,於圖7及圖8中,省略圖1之洗淨區塊400之圖示。再者,於圖6~圖8中,除圖8之保養空間MS1外,亦省略圖1之保養空間MS1、MS2之圖示。 <3>Transportation path of multiple substrates and carrier 9 in the substrate processing device 6 to 8 are diagrams for explaining the conveyance paths of a plurality of substrates and carriers 9 in the substrate processing apparatus 1 of FIG. 1 . FIG. 6 shows a schematic plan view of the substrate processing apparatus 1 as in FIG. 1 . FIG. 7 shows a schematic perspective view of the appearance of the substrate processing apparatus 1 of FIG. 1 viewed from one direction. FIG. 8 shows a schematic appearance perspective view of the substrate processing apparatus 1 of FIG. 1 viewed from another direction. In addition, in FIGS. 7 and 8 , the illustration of the cleaning block 400 in FIG. 1 is omitted. Furthermore, in FIGS. 6 to 8 , in addition to the maintenance space MS1 in FIG. 8 , the illustrations of the maintenance spaces MS1 and MS2 in FIG. 1 are also omitted.

設想對收納於一個晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,一個晶圓傳送盒8藉由搬入至基板搬入搬出區塊100,而如圖6所示,載置於開閉器120,且將蓋打開。又,於中繼區塊200之載體支持部210上將空的載體9以水平姿勢支持。此時,載體9之基板出入口12(圖5)以與晶圓傳送盒8對向之方式朝向-X方向。於該狀態下,藉由基板交接機器人140,自一個晶圓傳送盒8取出未處理之複數片基板W,並插入至載體9。於圖6~圖8以粗虛線之箭頭a1表示此時之複數片基板W之搬送路徑。It is assumed that a series of processes are performed on a plurality of unprocessed substrates W stored in one wafer transfer cassette 8 . In this case, one wafer transfer cassette 8 is loaded into the substrate loading and unloading block 100, and is placed on the shutter 120 as shown in FIG. 6, and the cover is opened. Furthermore, the empty carrier 9 is supported in a horizontal posture on the carrier support part 210 of the relay block 200 . At this time, the substrate entrance and exit 12 of the carrier 9 ( FIG. 5 ) faces the −X direction in a manner opposite to the wafer transfer box 8 . In this state, the substrate transfer robot 140 takes out a plurality of unprocessed substrates W from one wafer transfer box 8 and inserts them into the carrier 9 . In FIGS. 6 to 8 , arrow a1 with a thick dotted line indicates the transport path of the plurality of substrates W at this time.

其後,已變空之一個晶圓傳送盒8將蓋關閉,由晶圓傳送盒搬送裝置112保持,且載置於複數個晶圓傳送盒架110之任一者。另一方面,收納有複數片基板W之載體9由載體支持部210接收,藉由第1搬送部310之副搬送裝置312A載置於主搬送裝置311之可動載台311a上。圖6~圖8中以粗實線之箭頭a2表示此時之載體9之搬送路徑。Thereafter, the empty wafer pod 8 has its lid closed, is held by the wafer pod transport device 112 , and is placed on any one of the plurality of wafer pod racks 110 . On the other hand, the carrier 9 containing a plurality of substrates W is received by the carrier supporting part 210 and placed on the movable stage 311a of the main conveying device 311 by the auxiliary conveying device 312A of the first conveying part 310. In FIGS. 6 to 8 , arrow a2 with a thick solid line indicates the transport path of the carrier 9 at this time.

接著,載置於可動載台311a上之載體9以水平姿勢於+X方向上自中繼區塊200之附近位置(第1端部TA1)搬送至第2搬送部320之附近位置(第2端部TA2)。於圖8之對話框BA3內,顯示藉由第1搬送部310之主搬送裝置311搬送之載體9之狀態。Next, the carrier 9 placed on the movable stage 311a is transported in a horizontal posture in the +X direction from a position near the relay block 200 (first end TA1) to a position near the second transport part 320 (second end TA1) end TA2). In the dialog box BA3 of FIG. 8 , the state of the carrier 9 transported by the main transport device 311 of the first transport unit 310 is displayed.

其後,到達第2搬送部320之附近位置之載體9藉由第1搬送部310之副搬送裝置312B移交給第2搬送部320之搬送裝置321。因此,移交給搬送裝置321之載體9之姿勢藉由搬送裝置321而自水平姿勢變更為鉛直姿勢。於圖7之對話框BA2內,模式性顯示搬送裝置321中之載體9之姿勢變更之狀態。Thereafter, the carrier 9 that has reached the vicinity of the second conveyance part 320 is transferred to the conveyance device 321 of the second conveyance part 320 by the auxiliary conveyance device 312B of the first conveyance part 310 . Therefore, the posture of the carrier 9 transferred to the conveying device 321 is changed from the horizontal posture to the vertical posture by the conveying device 321 . In the dialog box BA2 of FIG. 7 , the status of the posture change of the carrier 9 in the transport device 321 is schematically displayed.

如圖7之對話框BA2所示,搬送裝置321包含可動台座322及載體保持具323。可動台座322設置為可於第2搬送部320內於Y方向移動。載體保持具323由第1保持部323a及第2保持部323b構成。第1保持部323a具有可保持處於水平姿勢時之載體9之下端部之矩形之平板形狀。又,第2保持部323b具有可保持處於鉛直姿勢時之載體9之下端部之矩形之平板形狀。As shown in the dialog box BA2 of FIG. 7 , the transport device 321 includes a movable base 322 and a carrier holder 323 . The movable base 322 is provided movably in the Y direction in the second conveyance part 320 . The carrier holder 323 is composed of a first holding part 323a and a second holding part 323b. The first holding part 323a has a rectangular flat plate shape capable of holding the lower end of the carrier 9 in a horizontal posture. Furthermore, the second holding part 323b has a rectangular flat plate shape capable of holding the lower end of the carrier 9 in the vertical posture.

第1保持部323a及第2保持部323b以第1保持部323a之一邊與第2保持部323b之一邊互相相接且2個保持部互相正交之方式連接。可動台座322以第1保持部323a及第2保持部323b均與Y方向平行,且載體保持具323可繞於Y方向延伸之軸旋轉之方式,保持載體保持具323之一部分。The first holding part 323a and the second holding part 323b are connected in such a manner that one side of the first holding part 323a and one side of the second holding part 323b are in contact with each other and the two holding parts are orthogonal to each other. The movable base 322 holds a part of the carrier holder 323 in such a manner that the first holding part 323a and the second holding part 323b are both parallel to the Y direction, and the carrier holder 323 can rotate around an axis extending in the Y direction.

搬送裝置321進而具有可於可動台座322上調整載體保持具323之旋轉角度之未圖示之驅動部。藉此,於自第1搬送部310接收水平姿勢之載體9之情形時,載體保持具323以第1保持部323a成為水平且第2保持部323b成為鉛直之方式調整旋轉角度。其後,於載體保持具323上接收到水平姿勢之載體9後,載體保持具323以第1保持部323a成為鉛直且第2保持部323b成為水平之方式調整旋轉角度。藉此,載體9之姿勢自水平姿勢變更為鉛直姿勢。The conveying device 321 further has a driving part (not shown) that can adjust the rotation angle of the carrier holder 323 on the movable base 322. Thereby, when receiving the carrier 9 in a horizontal posture from the first conveying part 310, the carrier holder 323 adjusts the rotation angle so that the first holding part 323a becomes horizontal and the second holding part 323b becomes vertical. Thereafter, after receiving the carrier 9 in a horizontal posture on the carrier holder 323, the carrier holder 323 adjusts the rotation angle so that the first holding part 323a becomes vertical and the second holding part 323b becomes horizontal. Thereby, the posture of the carrier 9 is changed from a horizontal posture to a vertical posture.

搬送裝置321進而具有於第2搬送部320使可動台座322沿Y方向移動之未圖示之驅動部。藉此,以鉛直姿勢維持之載體9以鉛直姿勢於+Y方向上自第1搬送部310之附近位置搬送至處理部330之附近位置。The conveying device 321 further has a driving part (not shown) that moves the movable base 322 in the Y direction in the second conveying part 320 . Thereby, the carrier 9 maintained in the vertical posture is transported in the +Y direction from a position near the first transport unit 310 to a position near the processing unit 330 in the vertical posture.

其後,藉由處理部330之主搬送裝置333C,自搬送裝置321接收到達處理部330之附近位置之載體9。由主搬送裝置333C接收到之載體9藉由該主搬送裝置333C及其他主搬送裝置333B、333A搬送至1個或複數個液體處理單元331之任一者,且以維持鉛直姿勢之狀態於各種處理液中浸漬規定期間。藉此,對收納於載體9內之複數片基板W,進行與所浸漬之處理液相應之處理。於圖8之對話框BA4內,顯示藉由處理部330之主搬送裝置333A、333B、333C搬送之載體9之狀態。Thereafter, the carrier 9 arriving at a position near the processing unit 330 is received from the transportation device 321 by the main transport device 333C of the processing unit 330 . The carrier 9 received by the main transport device 333C is transported to one or any of a plurality of liquid processing units 331 by the main transport device 333C and the other main transport devices 333B and 333A, and is maintained in a vertical posture in various situations. Immerse in treatment liquid for specified period. Thereby, the plurality of substrates W accommodated in the carrier 9 are processed according to the processing liquid in which they are immersed. In the dialog box BA4 of FIG. 8 , the status of the carrier 9 transported by the main transport devices 333A, 333B, and 333C of the processing unit 330 is displayed.

如圖8之對話框BA4所示,各主搬送裝置333A、333B、333C包含可動支持柱333a及一對夾盤構件333b。可動支持柱333a可於X方向移動且可於Z方向移動(可升降)而設置於複數個液體處理單元331之側方(+Y方向側)。以自可動支持柱333a之上端部向液體處理單元331之上方延伸之方式設置有一對夾盤構件333b。一對夾盤構件333b構成為可夾持並保持鉛直姿勢之載體9。再者,各主搬送裝置333A、333B、333C具有可切換藉由一對夾盤構件333b保持載體9、及自一對夾盤構件333b釋放載體9之未圖示之驅動部。藉此,於複數個主搬送裝置333A、333B、333C與複數個液體處理單元331之間進行載體9之交接。As shown in the dialog box BA4 of FIG. 8 , each of the main transport devices 333A, 333B, and 333C includes a movable support column 333a and a pair of chuck members 333b. The movable support column 333a is movable in the X direction and movable in the Z direction (can be raised and lowered), and is provided on the side (+Y direction side) of the plurality of liquid processing units 331. A pair of chuck members 333b is provided to extend upward from the upper end of the movable support column 333a toward the upper side of the liquid treatment unit 331. The pair of chuck members 333b is configured to clamp and maintain the carrier 9 in a vertical posture. Furthermore, each of the main conveying devices 333A, 333B, and 333C has a driving unit (not shown) that can switch between holding the carrier 9 by the pair of chuck members 333b and releasing the carrier 9 from the pair of chuck members 333b. Thereby, the carrier 9 is transferred between the plurality of main transport devices 333A, 333B, and 333C and the plurality of liquid processing units 331.

其後,收納由處理液處理後之複數片基板W之載體9進而搬送至靠近中繼區塊200之乾燥單元332。藉此,載體9及載體9內之複數片基板W藉由乾燥單元332乾燥。如上所述,圖6~圖8中以粗實線之箭頭a3表示處理區塊300中之載體9之一連串之搬送路徑。Thereafter, the carrier 9 containing the plurality of substrates W processed by the processing liquid is transported to the drying unit 332 close to the relay block 200 . Thereby, the carrier 9 and the plurality of substrates W in the carrier 9 are dried by the drying unit 332 . As mentioned above, in FIGS. 6 to 8 , the thick solid line arrow a3 represents a series of transport paths of the carrier 9 in the processing block 300 .

收納有已處理之複數片基板W之載體9藉由主搬送裝置333A自乾燥單元332搬送至中繼區塊200之載體支持部220,且由載體支持部220支持。圖6~圖8中以粗虛線之箭頭a4表示此時之載體9之搬送路徑。The carrier 9 containing the plurality of processed substrates W is transported from the drying unit 332 to the carrier supporting part 220 of the relay block 200 by the main transporting device 333A, and is supported by the carrier supporting part 220 . In FIGS. 6 to 8 , arrow a4 with a thick dotted line indicates the transport path of the carrier 9 at this time.

因此,移交給載體支持部220之載體9之姿勢藉由載體支持部220而自鉛直姿勢變更為水平姿勢。於圖7之對話框BA1內,模式性顯示載體支持部220中之載體9之姿勢變更之狀態。Therefore, the posture of the carrier 9 handed over to the carrier support part 220 is changed from the vertical posture to the horizontal posture by the carrier support part 220 . In the dialog box BA1 of FIG. 7 , the status of the posture change of the carrier 9 in the carrier support unit 220 is schematically displayed.

如圖7之對話框BA1所示,載體支持部220包含固定於中繼區塊200內之固定台座211及載體保持具212。載體保持具212由第1保持部212a及第2保持部212b構成。第1保持部212a具有可保持處於水平姿勢時之載體9之下端部之矩形之平板形狀。又,第2保持部212b具有可保持處於鉛直姿勢時之載體9之下端部之矩形之平板形狀。As shown in the dialog box BA1 of FIG. 7 , the carrier support part 220 includes a fixed base 211 and a carrier holder 212 fixed in the relay block 200 . The carrier holder 212 is composed of a first holding part 212a and a second holding part 212b. The first holding part 212a has a rectangular flat plate shape capable of holding the lower end of the carrier 9 in a horizontal posture. Furthermore, the second holding part 212b has a rectangular flat plate shape capable of holding the lower end of the carrier 9 in the vertical posture.

第1保持部212a及第2保持部212b以第1保持部212a之一邊與第2保持部212b之一邊互相相接且2個保持部互相正交之方式連接。固定台座211以第1保持部212a及第2保持部212b均與Y方向平行,且載體保持具212可繞沿Y方向延伸之軸旋轉之方式,保持載體保持具212之一部分。The first holding part 212a and the second holding part 212b are connected in such a manner that one side of the first holding part 212a and one side of the second holding part 212b are in contact with each other and the two holding parts are orthogonal to each other. The fixed base 211 holds a part of the carrier holder 212 in such a manner that the first holding part 212a and the second holding part 212b are both parallel to the Y direction, and the carrier holder 212 is rotatable around an axis extending in the Y direction.

載體支持部220進而具有可於固定台座211上調整載體保持具212之旋轉角度之未圖示之驅動部。藉此,於自乾燥單元332接收鉛直姿勢之載體9之情形時,載體保持具212以第2保持部212b成為水平且第1保持部212a成為鉛直之方式調整旋轉角度。其後,於載體保持具212上接收到鉛直姿勢之載體9後,載體保持具212以第2保持部212b成為鉛直且第1保持部212a成為水平之方式調整旋轉角度。藉此,載體9之姿勢自鉛直姿勢變更為水平姿勢。此時,載體9之基板出入口12(圖5)朝向-X方向。The carrier support part 220 further has a driving part (not shown) that can adjust the rotation angle of the carrier holder 212 on the fixed base 211 . Thereby, when receiving the carrier 9 in a vertical posture from the drying unit 332, the carrier holder 212 adjusts the rotation angle so that the second holding part 212b becomes horizontal and the first holding part 212a becomes vertical. Thereafter, after receiving the carrier 9 in the vertical posture on the carrier holder 212, the carrier holder 212 adjusts the rotation angle so that the second holding part 212b becomes vertical and the first holding part 212a becomes horizontal. Thereby, the posture of the carrier 9 is changed from a vertical posture to a horizontal posture. At this time, the substrate entrance and exit 12 (Fig. 5) of the carrier 9 faces the -X direction.

於將收納有複數片基板W之載體9以水平姿勢支持於載體支持部220時,將空的晶圓傳送盒8載置於基板搬入搬出區塊100之開閉器130。又,將該晶圓傳送盒8之蓋打開。於該狀態下,藉由基板交接機器人150,自載體9取出處理後之複數片基板W,並插入至開閉器130上之晶圓傳送盒8。圖6~圖8中以粗虛線之箭頭a5表示此時之複數片基板W之搬送路徑。When the carrier 9 accommodating a plurality of substrates W is supported in the carrier support part 220 in a horizontal posture, the empty wafer transfer cassette 8 is placed on the shutter 130 of the substrate loading and unloading block 100 . Furthermore, the cover of the wafer transfer box 8 is opened. In this state, the substrate transfer robot 150 takes out a plurality of processed substrates W from the carrier 9 and inserts them into the wafer transfer box 8 on the shutter 130 . In FIGS. 6 to 8 , the arrow a5 with a thick dotted line indicates the transport path of the plurality of substrates W at this time.

其後,收納有處理後之複數片基板W之晶圓傳送盒8將蓋關閉,由晶圓傳送盒搬送裝置112保持,且載置於複數個晶圓傳送盒架110之任一者。又,該晶圓傳送盒8藉由晶圓傳送盒搬送裝置111搬送至晶圓傳送盒載置部190,且自基板處理裝置1搬出。另一方面,載體支持部220中變空之載體9藉由載體支持部220將該載體9之姿勢自水平姿勢再次變更為鉛直姿勢。載體支持部220中恢復為鉛直姿勢之空的載體9由主搬送裝置333A搬送,且由第2待機部240接收。Thereafter, the wafer pod 8 containing the plurality of processed substrates W is closed, held by the wafer pod transport device 112 , and placed on any of the plurality of wafer pod racks 110 . Furthermore, the wafer pod 8 is transported to the wafer pod placement portion 190 by the wafer pod transport device 111 , and is carried out from the substrate processing apparatus 1 . On the other hand, the posture of the carrier 9 that becomes empty in the carrier support part 220 is changed from the horizontal posture to the vertical posture again by the carrier support part 220 . The empty carrier 9 returned to the vertical posture in the carrier support unit 220 is transported by the main transport device 333A and received by the second standby unit 240 .

空的載體9較佳為為了對新的複數片基板W進行處理而進行再利用。因此,由第2待機部240支持之空的載體9例如藉由待機搬送裝置250搬送至第1待機部230而由第1待機部230支持。再者,自第1待機部230移交給載體支持部210。如此,於中繼區塊200,設定有用以再利用使用後之載體9之載體9之搬送路徑。自第1待機部230到達第2待機部240之載體9之搬送路徑(以下稱為待機搬送路徑)於圖6中以較粗之二點鏈線之箭頭b1表示。The empty carrier 9 is preferably reused for processing a plurality of new substrates W. Therefore, the empty carrier 9 supported by the second standby unit 240 is transported to the first standby unit 230 by, for example, the standby transfer device 250 and is supported by the first standby unit 230 . Furthermore, it is handed over from the first standby unit 230 to the carrier support unit 210 . In this way, the transfer path of the carrier 9 for reusing the used carrier 9 is set in the relay block 200 . The conveyance path of the carrier 9 from the first standby part 230 to the second standby part 240 (hereinafter referred to as the standby conveyance path) is indicated by a thick two-point chain line arrow b1 in FIG. 6 .

如上所述,於再利用使用後之空的載體9之情形時,為抑制處理對象之新的複數片基板W之清潔度降低,較佳為於再利用載體9之前進行洗淨。因此,本實施形態中,藉由第2待機部240自載體支持部220接收到之空的載體9維持鉛直姿勢,且藉由洗淨區塊400之洗淨搬送裝置410搬送至載體洗淨單元420。換言之,使用後之空的載體9自待機搬送路徑中之第2待機部240之部分拾起。圖6中以較粗之一點鏈線之箭頭c1表示此時之載體9之搬送路徑。As described above, when the used empty carrier 9 is reused, in order to prevent a decrease in the cleanliness of the new plurality of substrates W to be processed, it is preferable to wash the carrier 9 before reusing it. Therefore, in this embodiment, the empty carrier 9 received from the carrier support part 220 by the second standby part 240 maintains the vertical posture, and is transported to the carrier cleaning unit by the cleaning transport device 410 of the cleaning block 400 420. In other words, the used empty carrier 9 is picked up from the second standby portion 240 in the standby transport path. In FIG. 6 , the transport path of the carrier 9 at this time is indicated by the arrow c1 which is a thicker dotted chain line.

於載體洗淨單元420中,進而於1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間,藉由洗淨搬送裝置410搬送載體9。藉此,對使用後之載體9進行洗淨處理及乾燥處理。又,將洗淨處理後且乾燥處理後之載體9收納於1個或複數個載體待機部423之任一者。於各載體洗淨槽421、各載體乾燥部422及各載體待機部423中,維持載體9之鉛直姿勢。In the carrier washing unit 420, and between one or a plurality of carrier washing tanks 421, one or a plurality of carrier drying parts 422, and one or a plurality of carrier standby parts 423, the washing and conveying device 410 Transport carrier 9. Thereby, the used carrier 9 is washed and dried. Furthermore, the washed and dried carrier 9 is stored in one or a plurality of carrier waiting parts 423 . In each carrier washing tank 421, each carrier drying part 422, and each carrier standby part 423, the vertical posture of the carrier 9 is maintained.

設想對新的收納於其他晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,收納於洗淨區塊400之載體待機部423之清潔之載體9作為新的載體9,藉由洗淨搬送裝置410自載體洗淨單元420搬送至第2待機部240。換言之,洗淨後之空的載體9作為新的載體9返回至待機搬送路徑中之第2待機部240之部分。圖6中以較粗之一點鏈線之箭頭c2表示此時之新的載體9之搬送路徑。It is assumed that a series of processes are performed on a plurality of unprocessed substrates W newly accommodated in another wafer transfer cassette 8 . In this case, the cleaned carrier 9 stored in the carrier standby section 423 of the cleaning block 400 is transported as a new carrier 9 from the carrier cleaning unit 420 to the second standby section 240 by the cleaning transfer device 410 . In other words, the cleaned and empty carrier 9 is returned to the second standby portion 240 in the standby conveyance path as a new carrier 9 . In FIG. 6 , arrow c2 , which is a thicker dotted chain line, indicates the conveying path of the new carrier 9 at this time.

移交給第2待機部240之新的載體9維持鉛直姿勢,且藉由待機搬送裝置250沿著待機搬送路徑搬送至第1待機部230(參照上述圖6中較粗之二點鏈線之箭頭b1)。又,由第1待機部230支持。第1待機部230將由該第1待機部230支持之新的載體9移交給載體支持部210。因此,移交給載體支持部210之新的載體9為了接收未處理之複數片基板W,姿勢藉由載體支持部210自鉛直姿勢變更為水平姿勢。The new carrier 9 transferred to the second standby unit 240 maintains a vertical posture and is transported to the first standby unit 230 along the standby transfer path by the standby transfer device 250 (refer to the thicker two-point chain line arrow in FIG. 6 mentioned above). b1). Also, it is supported by the first standby unit 230 . The first standby unit 230 transfers the new carrier 9 supported by the first standby unit 230 to the carrier support unit 210 . Therefore, the posture of the new carrier 9 transferred to the carrier support unit 210 is changed from the vertical posture to the horizontal posture by the carrier support unit 210 in order to receive the plurality of unprocessed substrates W.

如上所述,中繼區塊200內之2個載體支持部210、220具有相同構成。藉此,於載體支持部210中,如圖7之對話框BA1內所示,變更新的載體9之姿勢。其後,將新的收納於其他晶圓傳送盒8之未處理之複數片基板W插入至處於水平姿勢之新的載體9內。As mentioned above, the two bearer supporting parts 210 and 220 in the relay block 200 have the same structure. Thereby, in the carrier support part 210, as shown in the dialog box BA1 of FIG. 7, the posture of the updated carrier 9 is changed. Thereafter, a plurality of new unprocessed substrates W stored in other wafer transfer boxes 8 are inserted into the new carrier 9 in a horizontal position.

收納有未處理之複數片基板W之新的載體9沿圖6~圖8所示之一連串之箭頭a2、a3、a4所示之搬送路徑搬送。藉此,對收納於新的載體9之複數片基板W進行一連串處理。The new carrier 9 containing the plurality of unprocessed substrates W is conveyed along a conveyance path indicated by a series of arrows a2, a3, and a4 shown in FIGS. 6 to 8 . Thereby, a series of processes are performed on the plurality of substrates W accommodated in the new carrier 9 .

<4>效果 (1)於上述基板處理裝置1中,於將空的載體9支持於載體支持部210之狀態下,搬入之晶圓傳送盒8內之未處理之複數片基板W藉由基板交接機器人140插入至空的載體9。收納有未處理之複數片基板W之載體9由第1待機部230接收。再者,該載體9由處理區塊300之第1端部TA1接收。於處理區塊300中,載體9於圖6之箭頭a3之搬送路徑上,自第1端部TA1搬送至第3端部TA3。於在處理區塊300內搬送載體9之期間,對於收納於載體9之複數片基板W,藉由各種液體處理單元331及乾燥單元332進行預設之處理。 <4>Effect (1) In the above-mentioned substrate processing apparatus 1, while the empty carrier 9 is supported on the carrier support part 210, a plurality of unprocessed substrates W in the loaded wafer transfer cassette 8 are inserted by the substrate transfer robot 140 to empty carrier 9. The carrier 9 containing a plurality of unprocessed substrates W is received by the first standby unit 230 . Furthermore, the carrier 9 is received by the first end TA1 of the processing block 300 . In the processing block 300, the carrier 9 is conveyed from the first end TA1 to the third end TA3 on the conveyance path of arrow a3 in FIG. 6 . While the carrier 9 is transported in the processing block 300 , preset processing is performed on the plurality of substrates W stored in the carrier 9 by various liquid processing units 331 and drying units 332 .

該情形時,處理區塊300內之複數個搬送裝置(311、321、333A、333B、333C)各者可藉由搬送收納有複數片基板W之載體9,而一體處理複數片基板W。因此,複數個搬送裝置(311、321、333A、333B、333C)各者無需用以一體且直接保持複數片基板W之繁瑣之構成。In this case, each of the plurality of conveying devices (311, 321, 333A, 333B, and 333C) in the processing block 300 can integrally process the plurality of substrates W by conveying the carrier 9 accommodating the plurality of substrates W. Therefore, each of the plurality of conveying devices (311, 321, 333A, 333B, 333C) does not need to have a cumbersome structure to integrate and directly hold a plurality of substrates W.

收納有處理後之複數片基板W之載體9自處理區塊300之第3端部TA3移交給第2待機部240,且由第2待機部240支持。再者,收納有處理後之複數片基板W之載體9移交給載體支持部220,且受其支持。於將空的晶圓傳送盒8載置於開閉器130之狀態下,處理後之複數片基板W藉由基板交接機器人150自載體9取出,並插入至空的晶圓傳送盒8。The carrier 9 storing the plurality of processed substrates W is transferred from the third end TA3 of the processing block 300 to the second standby unit 240 and is supported by the second standby unit 240 . Furthermore, the carrier 9 containing the plurality of processed substrates W is transferred to the carrier support part 220 and supported by it. With the empty wafer transfer box 8 placed on the shutter 130 , the processed substrates W are taken out from the carrier 9 by the substrate transfer robot 150 and inserted into the empty wafer transfer box 8 .

已取出處理後之複數片基板W之空的載體9例如沿圖6之箭頭b1之搬送路徑(待機搬送路徑),自第2待機部240搬送至第1待機部230。藉此,可再利用載體9。The empty carrier 9 from which the plurality of processed substrates W has been taken out is conveyed from the second standby part 240 to the first standby part 230 along the conveyance path (standby conveyance path) of arrow b1 in FIG. 6 , for example. Thereby, the carrier 9 can be reused.

此處,上述基板處理裝置1具備洗淨區塊400。洗淨區塊400之洗淨搬送裝置410自該待機搬送路徑拾起待機搬送路徑上之空的載體9,並搬送至載體洗淨單元420。於載體洗淨單元420中,將使用後之空的載體9洗淨。又,洗淨後之空的載體9再次返回至待機搬送路徑。返回至待機搬送路徑之載體9沿該待機搬送路徑搬送至第1待機部230。該情形時,可將搬送至第1待機部230之洗淨後之空的載體9用於插入未處理之複數片基板W。Here, the above-mentioned substrate processing apparatus 1 includes a cleaning block 400 . The cleaning transport device 410 of the cleaning block 400 picks up the empty carriers 9 on the waiting transport path from the waiting transport path, and transports them to the carrier cleaning unit 420 . In the carrier washing unit 420, the empty carrier 9 after use is washed. Furthermore, the cleaned and empty carrier 9 is returned to the waiting conveyance path again. The carrier 9 returned to the standby conveyance path is conveyed to the first standby part 230 along the standby conveyance path. In this case, the cleaned and empty carrier 9 transported to the first standby unit 230 can be used to insert a plurality of unprocessed substrates W.

如上所述,於本實施形態之基板處理裝置1中,由於可再利用載體9,故無需準備多個載體9。又,由於可將再利用之載體9洗淨,故防止因再利用載體9引起之複數片基板W之污染。其等之結果,可防止複數片基板W污染,且抑制複數個搬送裝置(311、321、333A、333B、333C)之構成之複雜化及零件件數之增加。As described above, in the substrate processing apparatus 1 of this embodiment, since the carrier 9 can be reused, there is no need to prepare a plurality of carriers 9 . In addition, since the reused carrier 9 can be washed, contamination of the plurality of substrates W caused by the reused carrier 9 can be prevented. As a result, it is possible to prevent contamination of the plurality of substrates W, and to suppress the complexity of the structure of the plurality of transport devices (311, 321, 333A, 333B, 333C) and the increase in the number of parts.

再者,根據上述基板處理裝置1,可在每當用於處理複數片基板W時,將用於處理複數片基板W之載體9洗淨。藉此,由於在每當處理複數片基板W時,重設載體9之表面狀態,故亦可抑制因污染或腐蝕等引起之載體9之劣化。Furthermore, according to the above-mentioned substrate processing apparatus 1, the carrier 9 used for processing the plurality of substrates W can be cleaned every time it is used to process the plurality of substrates W. Thereby, since the surface state of the carrier 9 is reset each time a plurality of substrates W are processed, deterioration of the carrier 9 due to contamination, corrosion, etc. can also be suppressed.

(2)如上所述,載體洗淨單元420包含1個或複數個載體洗淨槽421及洗淨搬送裝置410。於1個或複數個載體洗淨槽421各者,貯存有處理液。洗淨搬送裝置410構成為可將載體9浸漬於各載體洗淨槽421內之處理液、及自各載體洗淨槽421內提起載體9。藉此,於載體洗淨單元420中,可以簡單之構成及簡單之方法將載體9洗淨。(2) As mentioned above, the carrier washing unit 420 includes one or a plurality of carrier washing tanks 421 and a washing and conveying device 410 . The processing liquid is stored in each of one or a plurality of carrier washing tanks 421 . The washing and conveying device 410 is configured to immerse the carrier 9 in the treatment liquid in each carrier washing tank 421 and to lift the carrier 9 from each carrier washing tank 421 . Thereby, in the carrier washing unit 420, the carrier 9 can be washed with a simple structure and a simple method.

(3)載體洗淨單元420包含1個或複數個載體乾燥部422。藉此,可藉由1個或複數個載體乾燥部422,使由載體洗淨槽421洗淨後之載體9乾燥。藉此,塵埃不易附著於洗淨後之載體9。因此,抑制洗淨後之載體9之清潔度降低。(3) The carrier washing unit 420 includes one or a plurality of carrier drying parts 422 . Thereby, the carrier 9 washed by the carrier washing tank 421 can be dried by one or a plurality of carrier drying parts 422 . Thereby, dust is less likely to adhere to the cleaned carrier 9 . Therefore, deterioration in the cleanliness of the washed carrier 9 is suppressed.

(4)載體洗淨單元420包含1個或複數個載體待機部423。藉此,可使洗淨後之載體9於載體洗淨單元420內待機。因此,可使洗淨後之載體9於適當之時序返回至待機搬送路徑。(4) The carrier cleaning unit 420 includes one or a plurality of carrier standby units 423 . Thereby, the washed carrier 9 can be put on standby in the carrier washing unit 420 . Therefore, the cleaned carrier 9 can be returned to the standby transport path at an appropriate timing.

(5)於上述基板處理裝置1中,洗淨搬送裝置410自第2待機部240拾起使用後之空的載體9。該情形時,由於第2待機部240位於待機搬送路徑之起點,故防止將使用後之載體9以未洗淨之狀態遍及待機搬送路徑之廣範圍搬送。因此,抑制待機搬送路徑之污染。(5) In the substrate processing apparatus 1 described above, the cleaning and transporting device 410 picks up the used empty carrier 9 from the second standby unit 240 . In this case, since the second standby unit 240 is located at the starting point of the standby conveyance path, the used carrier 9 is prevented from being conveyed throughout the wide range of the standby conveyance path in an unwashed state. Therefore, contamination of the standby conveyance path is suppressed.

<5>其他實施形態 (1)於上述實施形態之基板處理裝置1中,載體洗淨單元420設置於基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置。又,洗淨搬送裝置410自待機搬送路徑中之第2待機部240之部分拾起使用後之載體9,且使洗淨後之載體9返回至第2待機部240之部分。然而,於根據本發明之一態樣之基板處理裝置1中,載體洗淨單元420之配置不限定於上述例。又,待機搬送路徑中拾起載體9之部分、及待機搬送路徑中載體9返回之部分不限定於上述例。 <5>Other implementation forms (1) In the substrate processing apparatus 1 of the above embodiment, the carrier cleaning unit 420 is provided at a side (+Y direction) position of the substrate loading and unloading block 100 and the relay block 200 . Furthermore, the cleaning and conveying device 410 picks up the used carrier 9 from the second standby part 240 in the standby conveying path, and returns the washed carrier 9 to the second standby part 240 . However, in the substrate processing apparatus 1 according to an aspect of the present invention, the configuration of the carrier cleaning unit 420 is not limited to the above example. In addition, the portion of the standby conveyance path where the carrier 9 is picked up and the portion of the standby conveyance path where the carrier 9 returns are not limited to the above example.

圖9係顯示另一實施形態之基板處理裝置1之基本構成之模式性俯視圖。圖10係圖9之基板處理裝置1之模式性一側視圖。於圖9及圖10中,與上述實施形態之基板處理裝置1之各圖之例同樣,標註有表示互相正交之X方向、Y方向及Z方向之箭頭。圖10之模式性一側視圖係於+Y方向上觀察圖9之基板處理裝置1之模式性一側視圖。說明另一實施形態之基板處理裝置1中與上述實施形態之基板處理裝置1不同之點。FIG. 9 is a schematic plan view showing the basic structure of the substrate processing apparatus 1 according to another embodiment. FIG. 10 is a schematic side view of the substrate processing apparatus 1 of FIG. 9 . In FIGS. 9 and 10 , arrows indicating mutually orthogonal X directions, Y directions, and Z directions are marked, as in the examples of the respective figures of the substrate processing apparatus 1 of the above-mentioned embodiment. The schematic side view of FIG. 10 is a schematic side view of the substrate processing apparatus 1 of FIG. 9 viewed in the +Y direction. The differences between the substrate processing apparatus 1 of another embodiment and the substrate processing apparatus 1 of the above embodiment will be described.

於本實施形態之基板處理裝置1中,載體洗淨單元420代替基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置,設置於處理區塊300之第1搬送部310之下方之位置。因此,本例之載體洗淨單元420於俯視下與第1搬送部310重疊。圖9中,為易於理解載體洗淨單元420之配置,以虛線顯示處理區塊300之第1搬送部310。In the substrate processing apparatus 1 of this embodiment, the carrier cleaning unit 420 is installed in the first transfer of the processing block 300 instead of the position on the side (+Y direction) of the substrate loading and unloading block 100 and the relay block 200 The position below part 310. Therefore, the carrier cleaning unit 420 of this example overlaps with the first transport part 310 in a plan view. In FIG. 9 , in order to make it easier to understand the arrangement of the carrier cleaning unit 420 , the first transport section 310 of the processing block 300 is shown with a dotted line.

又,本例之載體洗淨單元420配置為與中繼區塊200之第1待機部230於+X方向上相鄰。再者,本例之載體洗淨單元420包含1個或複數個(本例中為2個)載體洗淨槽421、1個或複數個(本例中為1個)載體乾燥部422及1個或複數個(本例中為2個)載體待機部423。1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423自中繼區塊200之第1待機部230沿+X方向排列。In addition, the carrier cleaning unit 420 in this example is disposed adjacent to the first standby unit 230 of the relay block 200 in the +X direction. Furthermore, the carrier washing unit 420 in this example includes one or a plurality (two in this example) of carrier washing tanks 421, one or a plurality (one in this example) of carrier drying parts 422 and 1 One or a plurality of (in this example, two) carrier standby units 423. One or a plurality of carrier washing tanks 421, one or a plurality of carrier drying units 422, and one or a plurality of carrier standby units 423 are self-relayed The first standby portion 230 of the block 200 is arranged along the +X direction.

附隨於載體洗淨單元420,設置有洗淨搬送裝置410。洗淨搬送裝置410可藉由於X方向及Z方向移動,而於第1待機部230、1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間搬送基板W。A cleaning transfer device 410 is provided accompanying the carrier cleaning unit 420 . The washing and conveying device 410 can move in the X direction and the Z direction between the first standby part 230, one or a plurality of carrier washing tanks 421, one or a plurality of carrier drying parts 422, and one or a plurality of carriers. The substrate W is transported between the standby units 423 .

於該基板處理裝置1中,由第2待機部240支持之使用後之載體9藉由待機搬送裝置250而沿待機搬送路徑搬送至第1待機部230(參考圖9中以較粗之兩點鏈線之箭頭b1)。其後,由第1待機部230支持之空的載體9維持鉛直姿勢,且藉由洗淨搬送裝置410搬送至載體洗淨單元420。換言之,使用後之空的載體9自待機搬送路徑中之第1待機部230之部分拾起,並搬送至載體洗淨單元420。以圖9及圖10中較粗之一點鏈線之箭頭d1表示此時之載體9之搬送路徑。In this substrate processing apparatus 1, the used carrier 9 supported by the second standby part 240 is transported to the first standby part 230 along the standby transport path by the standby transport device 250 (refer to the two thicker dots in FIG. 9 Arrow b1) of the chain line. Thereafter, the empty carrier 9 supported by the first standby unit 230 maintains the vertical posture and is transported to the carrier cleaning unit 420 by the cleaning transport device 410 . In other words, the used empty carrier 9 is picked up from the first standby portion 230 in the standby conveyance path and conveyed to the carrier cleaning unit 420 . The transport path of the carrier 9 at this time is represented by the arrow d1 of the thicker dotted chain line in FIGS. 9 and 10 .

於載體洗淨單元420中,與上述實施形態同樣,對使用後之載體9進行洗淨處理及乾燥處理。洗淨處理後及乾燥處理後之載體9保持於1個或複數個載體待機部423,成為待機狀態。In the carrier washing unit 420, the used carrier 9 is washed and dried in the same manner as in the above embodiment. The carrier 9 after the washing process and the drying process is held in one or a plurality of carrier standby parts 423 and enters a standby state.

此處,設想對收納於新的其他個晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,保持於載體待機部423之清潔之載體9作為新的載體9,藉由洗淨搬送裝置410搬送至第1待機部230。換言之,洗淨後之空的載體9作為新的載體9返回至待機搬送路徑中之第1待機部230之部分。圖9及圖10中以較粗之一點鏈線之箭頭d2表示該新的載體9之搬送路徑。Here, it is assumed that a series of processes are performed on a plurality of unprocessed substrates W accommodated in a new wafer transfer cassette 8 . In this case, the clean carrier 9 held in the carrier standby unit 423 is transported to the first standby unit 230 by the cleaning transfer device 410 as a new carrier 9 . In other words, the cleaned and empty carrier 9 is returned to the first standby portion 230 in the standby conveyance path as a new carrier 9 . In FIGS. 9 and 10 , the transport path of the new carrier 9 is indicated by the arrow d2 which is a thicker dotted chain line.

如上所述,於圖9及圖10之基板處理裝置1中,亦將載體9用於複數片基板W之處理,且再利用載體9。再者,將使用後之載體9洗淨。因此,可獲得與上述實施形態同樣之效果。As mentioned above, in the substrate processing apparatus 1 of FIGS. 9 and 10 , the carrier 9 is also used to process a plurality of substrates W, and the carrier 9 is reused. Furthermore, wash the carrier 9 after use. Therefore, the same effects as those of the above embodiment can be obtained.

於圖9及圖10之基板處理裝置1中,洗淨搬送裝置410自第1待機部230拾起使用後之空的載體9。該情形時,由於第1待機部230位於待機搬送路徑之終點,故不遍及待機搬送路徑之廣範圍搬送洗淨後之載體9。因此,可不降低洗淨後之載體9之清潔度,而使該載體9收納未處理之複數片基板W。In the substrate processing apparatus 1 of FIGS. 9 and 10 , the cleaning and conveying device 410 picks up the used empty carrier 9 from the first standby part 230 . In this case, since the first standby unit 230 is located at the end of the standby conveyance path, the washed carrier 9 is not conveyed over the wide range of the standby conveyance path. Therefore, the carrier 9 can accommodate a plurality of unprocessed substrates W without reducing the cleanliness of the washed carrier 9 .

(2)載體洗淨單元420亦可進而設置於與圖1及圖9之基板處理裝置1之例不同之部分。圖11係顯示又一實施形態之基板處理裝置1之基本構成之模式性俯視圖。於圖11中,與上述實施形態之基板處理裝置1之各圖之例同樣,標註有表示互相正交之X方向、Y方向及Z方向之箭頭。說明圖11之基板處理裝置1中與上述實施形態之基板處理裝置1不同之點。(2) The carrier cleaning unit 420 may be further provided in a part different from the example of the substrate processing apparatus 1 shown in FIGS. 1 and 9 . FIG. 11 is a schematic plan view showing the basic structure of the substrate processing apparatus 1 according to another embodiment. In FIG. 11 , arrows indicating the mutually orthogonal X direction, Y direction, and Z direction are marked, as in the examples of the respective figures of the substrate processing apparatus 1 of the above-mentioned embodiment. The differences between the substrate processing apparatus 1 of FIG. 11 and the substrate processing apparatus 1 of the above embodiment will be described.

本例之載體洗淨單元420以於基板搬入搬出區塊100及中繼區塊200之內部沿X方向延伸之方式設置,包含洗淨搬送裝置410、1個或複數個(本例中為2個)載體洗淨槽421、1個或複數個(本例中為1個)載體乾燥部422及1個或複數個(本例中為1個)載體待機部423。1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423自中繼區塊200內之待機搬送路徑沿-X方向排列。The carrier cleaning unit 420 in this example is provided to extend along the X direction inside the substrate loading and unloading block 100 and the relay block 200, and includes one or a plurality of cleaning and transporting devices 410 (two in this example). 1) carrier washing tank 421, 1 or multiple carriers (1 in this example) carrier drying section 422, and 1 or multiple (1 in this example) carrier standby section 423. 1 or multiple carriers The washing tank 421, one or a plurality of carrier drying parts 422, and one or a plurality of the carrier waiting parts 423 are arranged along the -X direction from the standby transfer path in the relay block 200.

附隨於載體洗淨單元420,設置有洗淨搬送裝置410。洗淨搬送裝置410可藉由於X方向及Z方向移動,而於待機搬送路徑、1個或複數個載體洗淨槽421、1個或複數個載體乾燥部422及1個或複數個載體待機部423之間搬送基板W。A cleaning transfer device 410 is provided accompanying the carrier cleaning unit 420 . The washing and conveying device 410 can move along the waiting conveying path, one or a plurality of carrier washing tanks 421, one or a plurality of carrier drying parts 422, and one or a plurality of carrier waiting parts by moving in the X direction and the Z direction. The substrate W is transported between 423.

於該基板處理裝置1中,藉由洗淨搬送裝置410拾起沿待機搬送路徑自第2待機部240搬送至第1待機部230之中途之空的載體9,並搬送至載體洗淨單元420。圖11中以較粗之一點鏈線之箭頭e1表示此時之載體9之搬送路徑。In the substrate processing apparatus 1 , the cleaning and conveying device 410 picks up the empty carrier 9 that is conveyed from the second standby part 240 to the first standby part 230 along the standby conveyance path, and conveys it to the carrier cleaning unit 420 . In FIG. 11 , the transport path of the carrier 9 at this time is indicated by the arrow e1 of a thicker dotted chain line.

又,由載體洗淨單元420洗淨後之載體9藉由洗淨搬送裝置410返回至待機搬送路徑。圖11中以較粗之一點鏈線之箭頭e2表示此時之載體9之搬送路徑。藉由將返回至待機搬送路徑之載體9搬送至第1待機部230,可將該清潔之載體9用於新的複數片基板W之處理。Furthermore, the carrier 9 washed by the carrier washing unit 420 is returned to the standby conveying path by the washing conveying device 410 . In FIG. 11 , the transport path of the carrier 9 at this time is indicated by an arrow e2 of a thicker dotted chain line. By transporting the carrier 9 returned to the standby transport path to the first standby section 230, the cleaned carrier 9 can be used for processing a plurality of new substrates W.

(3)於上述實施形態之洗淨區塊400中,亦可於1個或複數個載體洗淨槽421中,設置可使載體9浸漬於處理液、及自處理液提起載體9之升降機。該情形時,載體洗淨單元420與處理區塊300之處理部330同樣,亦可具備能使載體9相對於複數個載體洗淨槽421升降之升降機。又,載體洗淨單元420亦可具備於複數個升降機之間交接載體9之主搬送裝置。(3) In the cleaning block 400 of the above embodiment, an elevator that can immerse the carrier 9 in the treatment liquid and lift the carrier 9 from the treatment liquid may be provided in one or a plurality of carrier washing tanks 421 . In this case, the carrier washing unit 420 may be equipped with an elevator capable of raising and lowering the carrier 9 relative to the plurality of carrier washing tanks 421 , similarly to the processing unit 330 of the processing block 300 . Furthermore, the carrier washing unit 420 may be provided with a main transport device for transferring the carrier 9 between a plurality of elevators.

(4)於上述實施形態之基板處理裝置1中,處於鉛直姿勢之載體9之框架構件10a、10b維持與鉛直方向平行,但亦可為處於鉛直姿勢之載體9之框架構件10a、10b維持與鉛直方向大致平行。即,處於鉛直姿勢之載體9只要可將收納之複數片基板W保持與鉛直方向平行或大致平行即可。(4) In the substrate processing apparatus 1 of the above embodiment, the frame members 10a and 10b of the carrier 9 in the vertical posture are maintained parallel to the vertical direction. However, the frame members 10a and 10b of the carrier 9 in the vertical posture may be maintained parallel to the vertical direction. The vertical direction is roughly parallel. That is, the carrier 9 in the vertical posture only needs to be able to keep the plurality of accommodated substrates W parallel or substantially parallel to the vertical direction.

又,於上述實施形態之基板處理裝置1中,處於水平姿勢之載體9之框架構件10a、10b維持與鉛直方向正交,但亦可為處於水平姿勢之載體9之框架構件10a、10b維持與鉛直方向大致正交。即,處於水平姿勢之載體9只要可將收納之複數片基板W保持為與水平方向平行或大致平行即可。Furthermore, in the substrate processing apparatus 1 of the above embodiment, the frame members 10a and 10b of the carrier 9 in the horizontal posture are maintained orthogonal to the vertical direction. However, the frame members 10a and 10b of the carrier 9 in the horizontal posture may be maintained orthogonal to the vertical direction. The vertical directions are approximately orthogonal. That is, the carrier 9 in the horizontal posture only needs to be able to hold the plurality of accommodated substrates W parallel to or substantially parallel to the horizontal direction.

(5)於上述實施形態之基板處理裝置1中,於中繼區塊200中個別地設置有載體支持部210與第1待機部230,但本發明不限定於此。於可對第1待機部230附加變更載體9之姿勢之功能之情形時,亦可不設置載體支持部210。(5) In the substrate processing apparatus 1 of the above embodiment, the carrier support part 210 and the first standby part 230 are separately provided in the relay block 200, but the present invention is not limited to this. When the function of changing the posture of the carrier 9 can be added to the first standby portion 230, the carrier support portion 210 may not be provided.

又,於上述實施形態之基板處理裝置1中,於中繼區塊200中個別地設置有載體支持部220與第2待機部240,但本發明不限定於此。於可對第2待機部240附加變更載體9之姿勢之功能之情形時,亦可不設置載體支持部220。Furthermore, in the substrate processing apparatus 1 of the above embodiment, the carrier support part 220 and the second standby part 240 are separately provided in the relay block 200, but the present invention is not limited to this. When the function of changing the posture of the carrier 9 can be added to the second standby portion 240, the carrier support portion 220 may not be provided.

(6)於上述實施形態之處理區塊300之第2搬送部320中,搬送裝置321具有變更載體9之姿勢之功能且具有搬送載體9之功能,但本發明不限定於此。於第2搬送部320中,亦可代替上述搬送裝置321,個別地設置具有變更載體9之姿勢之功能之構成要件、及具有搬送載體9之功能之構成要件。(6) In the second transport section 320 of the processing block 300 in the above embodiment, the transport device 321 has the function of changing the posture of the carrier 9 and transporting the carrier 9, but the present invention is not limited to this. In the second transport unit 320 , components having a function of changing the posture of the carrier 9 and components having a function of transporting the carrier 9 may be separately provided in place of the above-mentioned transport device 321 .

(7)於上述實施形態之基板處理裝置1中,處理對象之基板W於俯視下具有矩形狀,但處理對象之基板亦可於俯視下具有圓形狀,又可於俯視下具有三邊形或五邊形等四邊形以外之多邊形狀。(7) In the substrate processing apparatus 1 of the above embodiment, the substrate W to be processed has a rectangular shape when viewed from above. However, the substrate W to be processed may also have a circular shape when viewed from above, or may have a triangular or triangular shape when viewed from above. Polygonal shapes other than quadrilaterals such as pentagons.

(8)上述實施形態之載體9於以水平姿勢收納有矩形之基板W之情形時支持矩形之基板W之兩側部,但本發明不限定於此。載體9亦可構成為能以水平姿勢支持基板W之中央部。(8) The carrier 9 of the above embodiment supports both sides of the rectangular substrate W when the rectangular substrate W is stored in a horizontal posture, but the present invention is not limited to this. The carrier 9 may be configured to support the center portion of the substrate W in a horizontal posture.

(9)於上述實施形態之基板處理裝置1中,設為於處理部330之複數個處理槽331a中貯存用以將基板W洗淨之處理液,但本發明不限定於此。亦可於處理部330之複數個處理槽331a之至少一部分,貯存用以對基板W進行鍍覆處理之鍍覆液、或用以將基板W之表面狀態改質之液體等,作為處理液。如此,上述實施形態係將本發明應用於複數片基板W之洗淨處理之例,但不限於此,亦可將本發明應用於複數片基板W之鍍覆處理或表面改質處理等之其他處理。(9) In the substrate processing apparatus 1 of the above embodiment, the processing liquid for cleaning the substrate W is stored in the plurality of processing tanks 331a of the processing unit 330. However, the present invention is not limited to this. A plating liquid for plating the substrate W, a liquid for modifying the surface state of the substrate W, or the like may be stored in at least a part of the plurality of processing tanks 331a of the processing unit 330 as the processing liquid. As described above, the above embodiment is an example of applying the present invention to the cleaning process of a plurality of substrates W, but it is not limited thereto. The present invention can also be applied to other processes such as plating processing or surface modification processing of a plurality of substrates W. handle.

(10)於上述實施形態之基板處理裝置1中,洗淨區塊400從自第2待機部240至第1待機部230之待機搬送路徑取出空的載體9,進行洗淨,並使之再次返回至待機搬送路徑,但本發明不限定於此。洗淨區塊400亦可構成自第2待機部240至第1待機部230之待機搬送路徑之一部分。(10) In the substrate processing apparatus 1 of the above embodiment, the cleaning block 400 takes out the empty carrier 9 from the standby transfer path from the second standby part 240 to the first standby part 230, cleans it, and makes it again Returning to the standby conveyance path, the present invention is not limited to this. The washing block 400 may also constitute a part of the waiting conveyance path from the second waiting part 240 to the first waiting part 230.

具體而言,洗淨區塊400例如亦可藉由洗淨搬送裝置410自第2待機部240接收洗淨前之空的載體9,且藉由載體洗淨單元420進行洗淨,將洗淨後之載體9移交給第1待機部230。或,洗淨區塊400例如亦可藉由洗淨搬送裝置410自第2待機部240與第1待機部230之間之位置接收洗淨前之空的載體9,藉由載體洗淨單元420進行洗淨,將洗淨後之載體9移交給第1待機部230。Specifically, for example, the cleaning block 400 may receive the empty carrier 9 before cleaning from the second standby unit 240 through the cleaning transport device 410, and wash the carrier 9 through the carrier cleaning unit 420. The carrier 9 is then handed over to the first standby unit 230 . Or, for example, the cleaning block 400 can also receive the empty carrier 9 before cleaning from the position between the second standby part 240 and the first standby part 230 through the cleaning transport device 410, and use the carrier cleaning unit 420 to Washing is performed, and the washed carrier 9 is handed over to the first standby part 230 .

該等情形時,洗淨區塊400亦可進而個別地具備用以接收洗淨前之載體9之搬送裝置、及用以移交洗淨後之載體9之搬送裝置。藉此,藉由不共通使用用以搬送洗淨前之載體9之構成與用以搬送洗淨後之載體9之構成,而防止載體9與用以搬送載體9之構成之間之污染物質之轉印。其結果,抑制中繼區塊200及洗淨區塊400中之載體9之清潔度降低。In this case, the cleaning block 400 may also be separately provided with a transport device for receiving the carrier 9 before cleaning and a transport device for transferring the carrier 9 after cleaning. Thereby, by not using the same structure for transporting the carrier 9 before cleaning and the structure for transporting the carrier 9 after cleaning, the exchange of contaminants between the carrier 9 and the structure for transporting the carrier 9 is prevented. Transfer. As a result, deterioration in the cleanliness of the carrier 9 in the relay block 200 and the washing block 400 is suppressed.

(11)於上述實施形態之載體9中,於框架構件10a、10b各者之中央部分形成有4個開口部13,但本發明不限定於此。於框架構件10a、10b各者之中央部分,不限於4個,亦可形成1個、2個、3個或5個等其他個數之開口部13。或,亦可不於框架構件10a、10b各者之中央部分形成開口部13。再者,亦可適當設計並變更框架構件10a、10b之形狀。(11) In the carrier 9 of the above embodiment, four openings 13 are formed in the center portions of each of the frame members 10a and 10b, but the present invention is not limited to this. The number of openings 13 is not limited to four, but other numbers such as one, two, three or five may be formed in the central portion of each of the frame members 10a and 10b. Alternatively, the opening 13 may not be formed in the central portion of each of the frame members 10a and 10b. Furthermore, the shapes of the frame members 10a and 10b can also be appropriately designed and changed.

(12)於上述實施形態之主搬送裝置333A、333B、333C各者,一對夾盤構件333b藉由於X方向上夾住載體9而保持該載體9,但本發明不限定於此。一對夾盤構件333b亦可藉由於Y方向上夾住載體9而保持該載體9,又可藉由於水平面內於與X方向及Y方向交叉之方向上夾住載體9而保持該載體9。(12) In each of the main conveying devices 333A, 333B, and 333C of the above embodiment, the pair of chuck members 333b holds the carrier 9 by sandwiching the carrier 9 in the X direction, but the present invention is not limited to this. The pair of chuck members 333b can also hold the carrier 9 by sandwiching the carrier 9 in the Y direction, and can hold the carrier 9 by sandwiching the carrier 9 in a horizontal plane in a direction intersecting the X direction and the Y direction.

<6>技術方案之各構成要件與實施形態之各要件之對應關係 以下,對技術方案之各構成要件與實施形態之各要件之對應例進行說明,但本發明不限定於下述例。作為技術方案之各構成要件,亦可使用具有技術方案所記載之構成或功能之其他各種要件。 <6>Correspondence between each component element of the technical solution and each element of the implementation form Hereinafter, examples corresponding to each constituent element of the technical solution and each element of the embodiment will be described, but the present invention is not limited to the following examples. As each constituent element of the technical solution, various other elements having the constitution or functions described in the technical solution can also be used.

於上述實施形態中,基板處理裝置1為基板處理裝置之例,載體9為載體之例,圖6之箭頭a3所示之載體9之搬送路徑為第1搬送路徑之例,第1搬送部310之第1端部TA1為第1搬送路徑之起點之例,處理部330之第3端部TA3為第1搬送路徑之終點之例,包含處理區塊300之主搬送裝置311、333A、333B、333C及搬送裝置321之構成要件群為搬送機構之例。In the above embodiment, the substrate processing apparatus 1 is an example of a substrate processing apparatus, the carrier 9 is an example of a carrier, the conveyance path of the carrier 9 shown by arrow a3 in FIG. 6 is an example of the first conveyance path, and the first conveyance part 310 The first end TA1 is an example of the starting point of the first conveyance path, and the third end TA3 of the processing unit 330 is an example of the end point of the first conveyance path, including the main conveyance devices 311, 333A, 333B of the processing block 300. The component group of 333C and the conveyance device 321 is an example of a conveyance mechanism.

又,處理部330之複數個液體處理單元331為處理單元之例,基板交接機器人140為基板插入部之例,第1待機部230為第1待機部之例,第2待機部240為第2待機部之例,基板交接機器人150為基板取出部之例,洗淨區塊400及載體洗淨單元420為載體洗淨部之例。In addition, the plurality of liquid processing units 331 of the processing unit 330 is an example of the processing unit, the substrate transfer robot 140 is an example of the substrate insertion unit, the first standby unit 230 is an example of the first standby unit, and the second standby unit 240 is an example of the second standby unit. As an example of the standby section, the substrate transfer robot 150 is an example of the substrate taking-out section, and the cleaning block 400 and the carrier cleaning unit 420 are an example of the carrier cleaning section.

又,圖6之箭頭b1所示之載體9之待機搬送路徑為第2搬送路徑之例,載體洗淨槽421為洗淨槽之例,洗淨搬送裝置410為載體搬送裝置之例,載體乾燥部422為載體乾燥部之例,載體待機部423為載體待機部之例。In addition, the standby conveying path of the carrier 9 indicated by arrow b1 in FIG. 6 is an example of the second conveying path, the carrier washing tank 421 is an example of a washing tank, the washing and conveying device 410 is an example of a carrier conveying device, and the carrier is dried The part 422 is an example of a carrier drying part, and the carrier standby part 423 is an example of a carrier standby part.

1:基板處理裝置 8:晶圓傳送盒 9:載體 10a,10b,10c,10d:框架構件 11:支持片 12:基板出入口 13:開口部 100:基板搬入搬出區塊 101:端面部 102:一側面部 103:另一側面部 110:晶圓傳送盒架 111,112:晶圓傳送盒搬送裝置 120,130:開閉器 140,150:基板交接機器人 160:控制部 190:晶圓傳送盒載置部 200:中繼區塊 210,220:載體支持部 211:固定台座 212:載體保持具 212a:第1保持部 212b:第2保持部 230:第1待機部 240:第2待機部 250:待機搬送裝置 300:處理區塊 310:第1搬送部 311:主搬送裝置 311a:可動載台 311b:導軌 312A,312B:副搬送裝置 320:第2搬送部 321:搬送裝置 322:可動台座 323:載體保持具 323a:第1保持部 323b:第2保持部 330:處理部 331:液體處理單元 331a:處理槽 331b:升降機 332:乾燥單元 333a:可動支持柱 333A,333B,333C:主搬送裝置 333b:夾盤構件 400:洗淨區塊 410:洗淨搬送裝置 420:載體洗淨單元 421:載體洗淨槽 422:載體乾燥部 423:載體待機部 a1~a5,b1,c1,c2,d1,d2,e1,e2:箭頭 BA1,BA2,BA3,BA4:對話框 MS1,MS2:保養空間 pr:突出部 TA1:第1端部 TA2:第2端部 TA3:第3端部 TA4:第4端部 W:基板 WP:作業者 1:Substrate processing device 8: Wafer transfer box 9: Carrier 10a, 10b, 10c, 10d: frame members 11: Support film 12:Substrate entrance and exit 13:Opening part 100: Substrate loading and unloading area 101:End face 102: One side of face 103:The other side of the face 110:Wafer transfer box rack 111,112: Wafer transfer box transport device 120,130: switch 140,150:Substrate handover robot 160:Control Department 190: Wafer transfer cassette loading part 200: Relay block 210,220: Carrier Support Department 211: Fixed pedestal 212: Carrier holder 212a: 1st holding part 212b: 2nd maintenance part 230: 1st standby section 240: 2nd standby section 250: Standby transfer device 300: Processing block 310: 1st Transport Department 311: Main transport device 311a: Movable carrier 311b: Guide rail 312A, 312B: Sub-conveying device 320: 2nd Transport Department 321:Conveying device 322: Movable pedestal 323: Carrier holder 323a: 1st holding part 323b: 2nd holding part 330:Processing Department 331:Liquid handling unit 331a: Processing tank 331b: Lift 332:Drying unit 333a: Movable support column 333A, 333B, 333C: Main transport device 333b:Chuck member 400: Clean block 410: Cleaning and conveying device 420: Carrier cleaning unit 421: Carrier washing tank 422: Carrier drying section 423: Carrier standby department a1~a5,b1,c1,c2,d1,d2,e1,e2: arrow BA1, BA2, BA3, BA4: dialog box MS1, MS2: Maintenance space pr:protrusion TA1: 1st end TA2: 2nd end TA3: 3rd end TA4: 4th end W: substrate WP:worker

圖1係顯示本發明之一實施形態之基板處理裝置之基本構成之模式性俯視圖。 圖2係圖1之A-A線處之基板處理裝置之模式性剖視圖。 圖3係圖1之基板處理裝置中使用之載體之俯視圖。 圖4係圖3之載體之一側視圖。 圖5係圖4之B-B線處之載體之剖視圖。 圖6係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖7係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖8係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖9係顯示另一實施形態之基板處理裝置之基本構成之模式性俯視圖。 圖10係圖9之基板處理裝置之模式性一側視圖。 圖11係顯示又一實施形態之基板處理裝置之基本構成之模式性俯視圖。 FIG. 1 is a schematic plan view showing the basic structure of a substrate processing apparatus according to an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus taken along line A-A in FIG. 1 . FIG. 3 is a top view of the carrier used in the substrate processing apparatus of FIG. 1 . Figure 4 is a side view of the carrier of Figure 3. Figure 5 is a cross-sectional view of the carrier along line B-B in Figure 4. FIG. 6 is a diagram illustrating transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1 . FIG. 7 is a diagram illustrating transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1 . FIG. 8 is a diagram illustrating transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1 . FIG. 9 is a schematic plan view showing the basic structure of a substrate processing apparatus according to another embodiment. FIG. 10 is a schematic side view of the substrate processing apparatus of FIG. 9 . FIG. 11 is a schematic plan view showing the basic structure of a substrate processing apparatus according to another embodiment.

1:基板處理裝置 1:Substrate processing device

8:晶圓傳送盒 8: Wafer transfer box

9:載體 9: Carrier

100:基板搬入搬出區塊 100: Substrate loading and unloading area

110:晶圓傳送盒架 110:Wafer transfer box rack

111,112:晶圓傳送盒搬送裝置 111,112: Wafer transfer box transport device

120,130:開閉器 120,130: switch

140,150:基板交接機器人 140,150:Substrate handover robot

190:晶圓傳送盒載置部 190: Wafer transfer cassette loading part

200:中繼區塊 200: Relay block

210,220:載體支持部 210,220: Carrier Support Department

230:第1待機部 230: 1st standby section

240:第2待機部 240: 2nd standby section

250:待機搬送裝置 250: Standby transfer device

300:處理區塊 300: Processing block

310:第1搬送部 310: 1st Transport Department

311:主搬送裝置 311: Main transport device

311a:可動載台 311a: Movable carrier

311b:導軌 311b: Guide rail

312A,312B:副搬送裝置 312A, 312B: Sub-conveying device

320:第2搬送部 320: 2nd Transport Department

321:搬送裝置 321:Conveying device

330:處理部 330:Processing Department

331:液體處理單元 331:Liquid handling unit

332:乾燥單元 332:Drying unit

333A,333B,333C:主搬送裝置 333A, 333B, 333C: Main transport device

400:洗淨區塊 400: Clean block

410:洗淨搬送裝置 410: Cleaning and conveying device

420:載體洗淨單元 420: Carrier cleaning unit

421:載體洗淨槽 421: Carrier washing tank

422:載體乾燥部 422: Carrier drying section

423:載體待機部 423: Carrier standby department

a1~a5,b1,c1,c2:箭頭 a1~a5,b1,c1,c2: arrow

TA1:第1端部 TA1: 1st end

TA2:第2端部 TA2: 2nd end

TA3:第3端部 TA3: 3rd end

TA4:第4端部 TA4: 4th end

Claims (6)

一種基板處理裝置,其係對複數片基板進行預設之處理者,且具備: 載體,其構成為可收納上述複數片基板; 搬送機構,其沿預設之第1搬送路徑,將上述載體自該第1搬送路徑之起點搬送至終點; 處理單元,其設置於上述第1搬送路徑上,於將上述複數片基板收納於上述載體之狀態下,對收納於該載體之上述複數片基板進行上述預設之處理; 基板插入部,其將搬入至上述基板處理裝置之未處理之上述複數片基板插入至空的上述載體; 第1待機部,其以與上述第1搬送路徑之上述起點相鄰之方式設置,且構成為可藉由上述基板插入部支持收納有未處理之上述複數片基板之上述載體,並將其移交給上述第1搬送路徑之上述起點; 第2待機部,其以與上述第1搬送路徑之上述終點相鄰之方式設置,且構成為可自上述第1搬送路徑之上述終點接收並支持收納有處理後之上述複數片基板之上述載體; 基板取出部,其自收納有由上述處理單元處理後之上述複數片基板之上述載體,取出處理後之上述複數片基板;及 載體洗淨部,其將上述載體洗淨;且 形成將上述載體自上述第2待機部搬送至上述第1待機部之預設之第2搬送路徑; 上述載體洗淨部自上述第2搬送路徑拾起已藉由上述基板取出部取出處理後之上述複數片基板後之空的上述載體,將拾起之上述載體洗淨,使洗淨後之上述載體返回至上述第2搬送路徑。 A substrate processing device that performs preset processing on a plurality of substrates and has: A carrier configured to accommodate the plurality of substrates; A transport mechanism that transports the above-mentioned carrier from the starting point to the end point of the first transport path along the preset first transport path; A processing unit, which is disposed on the first transport path and performs the preset processing on the plurality of substrates stored in the carrier while the plurality of substrates are stored in the carrier; a substrate insertion unit that inserts the plurality of unprocessed substrates carried into the substrate processing device into the empty carrier; A first standby unit is provided adjacent to the starting point of the first transfer path, and is configured to support and transfer the carrier accommodating the plurality of unprocessed substrates via the substrate insertion unit To the above-mentioned starting point of the above-mentioned first conveyance path; A second standby unit is provided adjacent to the end point of the first conveyance path, and is configured to receive and support the carrier containing the plurality of processed substrates from the end point of the first conveyance path. ; a substrate taking-out part that takes out the plurality of processed substrates from the carrier containing the plurality of substrates processed by the processing unit; and a carrier washing section, which washes the above-mentioned carrier; and Forming a preset second transport path for transporting the carrier from the second standby part to the first standby part; The carrier cleaning unit picks up the empty carriers from the second transport path after the plurality of substrates have been processed by the substrate taking-out unit, and cleans the picked up carriers so that the cleaned carriers The carrier returns to the second conveyance path described above. 如請求項1之基板處理裝置,其中 上述載體洗淨部包含: 洗淨槽,其貯存用以將上述載體洗淨之洗淨液;及 載體搬送裝置,其構成為可將上述載體浸漬於上述洗淨槽之洗淨液、及自上述洗淨液提起浸漬於上述洗淨液之上述載體。 The substrate processing device of claim 1, wherein The above-mentioned carrier cleaning part includes: A washing tank that stores the cleaning liquid used to wash the above-mentioned carrier; and The carrier transport device is configured to immerse the carrier in the cleaning liquid of the cleaning tank and lift the carrier immersed in the cleaning liquid from the cleaning liquid. 如請求項2之基板處理裝置,其中 上述載體洗淨部進而包含使洗淨後之載體乾燥之載體乾燥部。 The substrate processing device of claim 2, wherein The carrier washing part further includes a carrier drying part for drying the washed carrier. 如請求項1至3中任一項之基板處理裝置,其中 上述載體洗淨部進而包含:載體待機部,其使洗淨後之載體待機。 The substrate processing device according to any one of claims 1 to 3, wherein The above-mentioned carrier washing part further includes a carrier standby part that waits for the washed carrier. 如請求項1至3中任一項之基板處理裝置,其中 上述載體洗淨部自上述第2搬送路徑中之上述第2待機部拾起空的上述載體。 The substrate processing device according to any one of claims 1 to 3, wherein The carrier cleaning unit picks up the empty carrier from the second standby unit in the second conveyance path. 如請求項1至3中任一項之基板處理裝置,其中 上述載體洗淨部使洗淨後之上述載體返回至上述第2搬送路徑中之上述第1待機部。 The substrate processing device according to any one of claims 1 to 3, wherein The carrier washing part returns the washed carrier to the first standby part in the second conveyance path.
TW112110454A 2022-03-24 2023-03-21 Substrate processing apparatus TWI853500B (en)

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