WO2023182116A1 - Substrate processing apparatus - Google Patents

Substrate processing apparatus Download PDF

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Publication number
WO2023182116A1
WO2023182116A1 PCT/JP2023/010209 JP2023010209W WO2023182116A1 WO 2023182116 A1 WO2023182116 A1 WO 2023182116A1 JP 2023010209 W JP2023010209 W JP 2023010209W WO 2023182116 A1 WO2023182116 A1 WO 2023182116A1
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WO
WIPO (PCT)
Prior art keywords
substrate
carrier
substrates
processing
section
Prior art date
Application number
PCT/JP2023/010209
Other languages
French (fr)
Japanese (ja)
Inventor
賢治 天久
進一 谷口
旭紘 岩▲崎▼
Original Assignee
株式会社Screenホールディングス
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Publication of WO2023182116A1 publication Critical patent/WO2023182116A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/07Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for semiconductor wafers Not used, see H01L21/677
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations

Definitions

  • the present invention relates to a substrate processing apparatus that processes a plurality of substrates in a processing tank.
  • FPD Full Panel Display
  • OLED Electro Luminescence
  • optical disk substrates such as liquid crystal display devices or organic EL (Electro Luminescence) display devices
  • magnetic disk substrates such as magneto-optical disk substrates
  • magneto-optical disk substrates such as magneto-optical disks
  • photomask substrates such as ceramic substrates, or solar panels.
  • Substrate processing apparatuses are used to perform various treatments on substrates such as battery substrates.
  • a batch-type substrate processing apparatus in which a plurality of substrates are immersed in a processing liquid stored in a processing tank and subjected to processing such as etching.
  • a batch-type substrate processing apparatus described in Patent Document 1 includes a hoop holding section, a substrate processing section, and a loading/unloading mechanism.
  • the hoop holding section is configured to be able to hold a hoop (FOUP: Front Opening Unified Pod).
  • the hoop is a container configured to hold and accommodate a plurality of substrates in a horizontal position so that the plurality of substrates are arranged vertically at a predetermined pitch.
  • the hoop has an opening for accessing the interior space of the hoop from the outside of the hoop, and a lid for opening and closing the opening.
  • the hoop holding section is provided with an opener for opening and closing the lid of the hoop held by the hoop holding section.
  • a hoop containing a plurality of unprocessed substrates is supplied to a hoop holding section and held there.
  • the lid of the hoop is opened by the opener, and a plurality of substrates are taken out from the hoop by the loading/unloading mechanism.
  • a plurality of substrates taken out from the hoop are passed to a substrate processing section and subjected to predetermined processing.
  • the empty hoop from which a plurality of substrates have been taken out is evacuated from the hoop holding section.
  • the plurality of substrates processed by the substrate processing section are received by the loading/unloading mechanism.
  • an empty hoop that is to accommodate a plurality of processed substrates is held in the hoop holding section.
  • the lid of the hoop is opened.
  • a plurality of processed substrates are inserted into the empty hoop by the loading/unloading mechanism.
  • the hoop containing the plurality of processed substrates is carried out from the substrate processing apparatus.
  • the operation of taking out a plurality of unprocessed substrates from the hoop and the operation of accommodating a plurality of processed substrates into the hoop are performed by the hoop holding section and the loading/unloading mechanism.
  • the operation of carrying a plurality of unprocessed substrates into the substrate processing section and the operation of carrying out a plurality of processed substrates from the substrate processing section cannot be performed in parallel. Therefore, the processing speed of a plurality of substrates is determined by the loading and unloading operations of the substrates.
  • An object of the present invention is to provide a substrate processing apparatus that can suppress reduction in substrate processing throughput caused by loading and unloading operations of substrates.
  • a substrate processing apparatus has a substrate inlet and a substrate outlet, receives an unprocessed substrate at the substrate inlet, performs a predetermined process on the received substrate, and removes the processed substrate.
  • a processing block that leads to a substrate exit; and a first substrate container that is provided at a position corresponding to the substrate entrance and that supports a first substrate container containing a plurality of unprocessed substrates and opens and closes a lid of the first substrate container.
  • an opener a first substrate transfer unit that takes out a plurality of unprocessed substrates from a first substrate container whose lid has been opened by the first opener, and delivers the plurality of unprocessed substrates to a substrate entrance of a processing block; a second opener provided at a position corresponding to the outlet to support an empty second substrate container and open/close a lid of the second substrate container; and a second opener for receiving a plurality of processed substrates from the substrate outlet of the processing block. and a second substrate transfer section that inserts the plurality of substrates received into a second substrate container whose lid is opened by a second opener.
  • the lid of the first substrate container is opened and closed by the first opener at a position corresponding to the substrate entrance of the processing block. With the lid of the first substrate container open, a plurality of unprocessed substrates are removed from the first substrate container and passed to the processing block through the substrate inlet.
  • a second opener opens and closes the lid of the second substrate container at a position corresponding to the substrate outlet of the processing block. With the lid of the second substrate container open, a plurality of processed substrates are received from the substrate outlet of the processing block and inserted into the second substrate container.
  • the operation of passing a plurality of unprocessed substrates to the processing block and the operation of receiving a plurality of processed substrates from the processing block are performed independently.
  • the operation of opening and closing the lid of the first substrate container and the operation of taking out the substrate from the first substrate container in parallel with the operation of opening and closing the lid of the first substrate container and the operation of taking out the substrate from the first substrate container, the operation of opening and closing the lid of the second substrate container and the operation of taking out the substrate into the second substrate container are performed. It becomes possible to perform an insertion operation. This prevents the flow of processing of a plurality of substrates in the substrate processing apparatus from being rate-limited by the loading and unloading operations of the plurality of substrates in the substrate processing apparatus. Therefore, reduction in throughput caused by the loading and unloading operations of the substrates is suppressed.
  • the processing block includes a transport mechanism that transports a carrier configured to accommodate a plurality of substrates along a predetermined transport path from a substrate inlet to a substrate exit, and a a processing unit that performs predetermined processing on a plurality of substrates accommodated in the carrier while the substrates are accommodated in the carrier, and the first substrate delivery section includes an empty carrier at the substrate inlet.
  • the plurality of unprocessed substrates are taken out from the first substrate container, the plurality of taken out substrates are inserted into the carrier, and the second substrate transfer section is configured to transfer the plurality of unprocessed substrates from the carrier containing the plurality of processed substrates to the substrates.
  • a plurality of processed substrates may be taken out from the carrier, and the taken out plurality of substrates may be inserted into a second substrate container.
  • predetermined processing is performed on the plurality of substrates housed in the carrier. This prevents each of the plurality of substrates from being transported by a number of transport devices in the processing block, so that each Deterioration in cleanliness of the substrate is suppressed.
  • the operation of transferring a plurality of unprocessed substrates from the first substrate container to an empty carrier, and the transfer operation of a plurality of unprocessed substrates from a carrier containing a plurality of processed substrates to a second substrate container are performed independently. This allows these transfer operations to be performed in parallel. As a result, reduction in throughput caused by the loading and unloading operations of the substrates is suppressed.
  • the processing unit includes a processing tank that stores processing liquid corresponding to a predetermined processing, immersing carriers transported by a transport mechanism in the processing liquid of the processing tank, and immersing the carriers immersed in the processing liquid. It may also include a lifter configured to be able to be lifted from the processing tank.
  • a common process is performed on the plurality of substrates accommodated in the carrier by immersing the carrier containing the plurality of substrates in the processing liquid.
  • the substrate processing apparatus further includes a substrate loading/unloading section configured to be able to carry in a plurality of substrates and carry out a plurality of substrates, and the processing block has a substrate inlet and a substrate outlet that are connected to each other in a plan view.
  • the substrate loading/unloading section includes a first opener, a second opener, a first substrate transfer section, and a second substrate transfer section, and is configured to be adjacent to each other in the substrate entrance and the processing block in a plan view. It may be provided so as to be in contact with the substrate outlet and adjacent to the processing block in a second direction intersecting the first direction in plan view.
  • the substrate processing apparatus there is no need to make a large distance between the loading position of the plurality of substrates and the carrying-out position of the plurality of substrates. Therefore, outside the substrate processing apparatus, it is easy to make the carrying-in route of a plurality of substrates into the substrate processing apparatus and the carrying-out route of a plurality of substrates with respect to the substrate processing apparatus common.
  • the substrate loading/unloading section includes a plurality of substrate container mounting sections capable of holding a plurality of substrate containers including a first substrate container and a second substrate container, a plurality of substrate container mounting sections and a first substrate container mounting section.
  • a substrate container transport device configured to be able to transport a plurality of substrate containers between the opener and between the plurality of substrate container mounting sections and the second opener may be provided.
  • a plurality of substrate containers can be placed on a plurality of substrate container mounting sections.
  • the substrate containers placed on the plurality of substrate container mounting sections can be transported to the first opener or the second opener by the substrate container transport device.
  • the substrate container supported by the first opener or the second opener can be transported to a plurality of substrate container mounting sections by the substrate container transport device.
  • the present invention it is possible to suppress a decrease in the throughput of substrate processing caused by the loading and unloading operations of the substrate.
  • FIG. 1 is a schematic plan view showing the basic configuration of a substrate processing apparatus according to an embodiment of the present invention.
  • FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus taken along line AA in FIG.
  • FIG. 3 is a plan view of a carrier used in the substrate processing apparatus of FIG. 1.
  • FIG. 4 is a side view of the carrier of FIG. 3.
  • FIG. 5 is a cross-sectional view of the carrier taken along line BB in FIG. 4.
  • FIG. 6 is a diagram for explaining transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG.
  • FIG. 7 is a diagram for explaining transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1.
  • FIG. 8 is a diagram for explaining transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1.
  • substrates include FPD (Flat Panel Display) substrates used in liquid crystal display devices or organic EL (Electro Luminescence) display devices, semiconductor substrates, optical disk substrates, magnetic disk substrates, and magneto-optical disks.
  • FPD Full Panel Display
  • organic EL Electro Luminescence
  • semiconductor substrates semiconductor substrates
  • optical disk substrates optical disk substrates
  • magnetic disk substrates magnetic disk substrates
  • magneto-optical disks Refers to substrates, photomask substrates, ceramic substrates, solar cell substrates, etc.
  • the substrate described below has a rectangular shape in plan view.
  • FIG. 1 is a schematic plan view showing the basic configuration of a substrate processing apparatus according to an embodiment of the present invention.
  • FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus 1 taken along line AA in FIG.
  • the substrate processing apparatus 1 mainly includes a substrate loading/unloading block 100, a relay block 200, a processing block 300, and a cleaning block 400.
  • arrows indicating the X direction, Y direction, and Z direction which are orthogonal to each other, are added to the predetermined figures after FIG. 1 and FIG. 2. are doing.
  • the X direction and the Y direction are orthogonal to each other in the horizontal plane, and the Z direction corresponds to the vertical direction.
  • the direction in which the arrow heads is defined as a + direction
  • the direction opposite to the + direction is defined as a - direction.
  • the X direction when simply referred to as the X direction, the X direction includes the +X direction and the ⁇ X direction.
  • the Y direction includes the +Y direction and the ⁇ Y direction.
  • the Z direction includes the +Z direction and the -Z direction.
  • the substrate loading/unloading block 100 includes a plurality of hoop shelves 110, hoop transport devices 111, 112, openers 120, 130, substrate delivery robots 140, 150, two hoop placement units 190, and a control unit 160 (FIG. 2). . Further, the substrate loading/unloading block 100 has an end surface portion 101, one side surface portion 102, and the other side surface portion 103, which constitute a part of the outer wall of the substrate processing apparatus 1.
  • the end surface section 101 is located at one end of the substrate processing apparatus 1 facing the -X direction, and is orthogonal to the X direction.
  • the one side surface portion 102 and the other side surface portion 103 extend parallel to the +X direction from both ends of the end surface portion 101 in a plan view so as to face each other in the Y direction.
  • the two hoop placement parts 190 are provided so as to protrude from the end face part 101 in the -X direction.
  • Each hoop placement section 190 is configured to be able to place a FOUP (Front Opening Unified Pod) 8 that accommodates a plurality of substrates in multiple stages.
  • FOUP Front Opening Unified Pod
  • passage openings (not shown) for allowing the hoop 8 to pass in the X direction are formed in portions corresponding to the respective hoop placement portions 190.
  • the hoop 8 is formed with openings for taking out the substrate from the internal space of the hoop 8 and for inserting the substrate into the internal space of the hoop 8. Further, the hoop 8 includes a lid for opening and closing its opening. The opening of the hoop 8 is closed when the hoop 8 is transported and on standby, and is opened when the substrate is taken out and inserted into the hoop 8.
  • the hoop 8 is hatched and the carrier 9 is marked with a dot pattern so that the hoop 8 and a carrier 9, which will be described later, can be clearly distinguished.
  • the hoop 8 is placed on one of the two hoop placement sections 190 lined up in the Y direction, and the hoop 8 is placed on the other hoop placement section 190. do not have.
  • the plurality of hoop shelves 110 are provided at positions spaced apart from each other by a predetermined distance in the +X direction from the end surface portion 101.
  • 16 hoop shelves 110 are fixed by fixing members (not shown) so that they are lined up in 4 rows and 4 columns in a plane parallel to the Z direction and the Y direction.
  • Each hoop shelf 110 is configured such that a hoop 8 can be placed thereon.
  • the hoop 8 is placed on each of the three hoop shelves 110 among the four hoop shelves 110 located at the top, and the hoop 8 is placed on the remaining one hoop shelf 110.
  • the number of hoops 8 and the arrangement of hoop shelves 110 may be changed as appropriate depending on the device design specifications.
  • the two openers 120 and 130 are provided at positions separated from each other by a predetermined distance in the +X direction from the plurality of hoop shelves 110.
  • two openers 120 and 130 are fixed by a fixing member (not shown) so as to be lined up in the Y direction.
  • One opener 120 is located near one side 102
  • the other opener 130 is located near the other side 103 .
  • Each opener 120, 130 is configured to be able to place the hoop 8 thereon and open/close the lid of the hoop 8 placed thereon.
  • the hoop 8 is placed on one opener 120, and no hoop 8 is placed on the other opener 130.
  • the substrate transfer robot 140 is provided adjacent to the opener 120 in the +X direction.
  • the substrate transfer robot 140 is configured to be rotatable around an axis in the Z direction and movable in the Z direction (capable of moving up and down).
  • the substrate transfer robot 140 is provided with a hand for transferring one or more substrates.
  • the hand is supported by an articulated arm and can move forward and backward in the horizontal direction.
  • the substrate delivery robot 140 takes out the substrate from the hoop 8 with the hoop 8 containing unprocessed substrates placed on the opener 120, and transfers the taken out substrate to a carrier, which will be described later, arranged in the relay block 200. Used for insertion into 9.
  • the substrate transfer robot 150 is provided adjacent to the opener 130 in the +X direction.
  • the substrate transfer robot 150 has the same configuration as the substrate transfer robot 140. With the empty hoop 8 placed on the opener 130, the substrate delivery robot 150 takes out the substrate from a carrier 9, which will be described later, placed in the relay block 200, and places the taken out substrate into the hoop 8 on the opener 130. Used for insertion.
  • the hoop conveyance device 111 is located between the end surface portion 101 and the plurality of hoop shelves 110 in the X direction.
  • the hoop conveying device 111 has a gripping part (not shown) configured to be able to grip the hoop 8, and is configured to be able to move the gripping part in the Y direction and in the Z direction. Thereby, the hoop transport device 111 transports the hoop 8 between one of the two hoop placement sections 190 and one of the plurality of hoop shelves 110.
  • the hoop transport device 112 is located between the multiple hoop shelves 110 and the two openers 120 and 130 in the X direction.
  • the hoop transport device 112 has the same configuration as the hoop transport device 111.
  • the hoop transport device 112 transports the hoop 8 between one of the plurality of hoop shelves 110 and one of the two openers 120 and 130.
  • the control unit 160 (FIG. 2) is composed of a computer including a CPU (central processing unit), ROM (read only memory), and RAM (random access memory), and controls the operation of each component in the substrate processing apparatus 1. do.
  • the relay block 200 mainly includes two carrier support sections 210 and 220, a first standby section 230, a second standby section 240, and a standby transport device 250.
  • the carrier support section 210 is provided adjacent to the substrate transfer robot 140 of the substrate loading/unloading block 100 in the +X direction. Further, the carrier support section 210 is configured to be able to support the carrier 9 that accommodates a plurality of substrates in multiple stages. Details of the carrier 9 will be described later. Further, the carrier support section 210 is configured to support the carrier 9 and to change the attitude of the supported carrier 9. Details of the configuration of the carrier support section 210 for changing the attitude of the carrier 9 will be described later. Note that in the example of FIG. 1, the carrier 9 is supported on the carrier support section 210.
  • the carrier support section 220 is provided adjacent to the substrate transfer robot 150 of the substrate loading/unloading block 100 in the +X direction. Further, the carrier support section 220 has the same configuration as the carrier support section 210. In addition, in the example of FIG. 1, the carrier 9 is not supported on the carrier support part 220.
  • the first standby section 230 is provided adjacent to the carrier support section 210 in the +X direction. Further, the first standby section 230 is configured to be able to support the carrier 9. Further, the first standby section 230 can transfer the carrier 9 supported by the first standby section 230 to the carrier support section 210 and receive the carrier 9 supported by the carrier support section 210 from the carrier support section 210. configured to be possible.
  • the second standby section 240 is provided adjacent to the carrier support section 220 in the +X direction. Further, the second standby section 240 is configured to be able to support the carrier 9. Further, the second standby section 240 can transfer the carrier 9 supported by the second standby section 240 to the carrier support section 220 and receive the carrier 9 supported by the carrier support section 220 from the carrier support section 220. configured to be possible.
  • the standby transport device 250 is provided between the first standby section 230 and the second standby section 240.
  • the standby transport device 250 is configured to be able to hold the carrier 9 and to be movable in the Y direction between the first standby section 230 and the second standby section 240.
  • the standby transport device 250 transports the carrier 9 supported by the second standby section 240 to the first standby section 230, for example.
  • the processing block 300 includes a first transport section 310, a second transport section 320, and a processing section 330.
  • the first transport section 310 and the processing section 330 are arranged in this order in the +Y direction and are provided so as to extend in parallel from the relay block 200 in the +X direction.
  • the second transport section 320 is formed to extend in the Y direction, and connects the end of the first transport section 310 facing the +X direction and the end of the processing section 330 facing the +X direction.
  • first end TA1 first end facing the -X direction
  • the other end facing the + 2 is called the end TA2.
  • one end facing the -X direction is appropriately referred to as a third end TA3
  • the other end facing the +X direction is appropriately referred to as a fourth end TA4. It is called.
  • the first transport unit 310 includes a main transport device 311 and two sub-transport devices 312A and 312B.
  • the main transport device 311 includes a movable stage 311a and a guide rail 311b.
  • the guide rail 311b is provided to extend from the first end TA1 of the first transport section 310 to the second end TA2.
  • the movable stage 311a is configured to be movable in the X direction on the guide rail 311b and to be able to place the carrier 9 thereon.
  • the main transport device 311 further includes a drive mechanism (not shown) that moves the movable stage 311a in the X direction on the guide rail 311b.
  • the main conveyance device 311 moves the placed carrier 9 close to the second conveyance section 320. It is transported in the +X direction to the second end TA2.
  • the sub-transport device 312A and the sub-transport device 312B are provided at the first end TA1 and the second end TA2 of the first transport section 310 in the X direction, respectively.
  • the sub-transfer device 312A moves the carrier 9 onto the movable stage 311a of the main transfer device 311 disposed at the first end TA1. Place it on. Further, the sub-transport device 312A transports the empty carrier 9 from the first standby section 230 to the carrier support section 210.
  • the sub-transport device 312B transfers the carrier 9 to a transport device 321 of the second transport unit 320, which will be described later.
  • the first transport section 310 is provided at a position spaced apart from the installation surface of the substrate processing apparatus 1 in the +Z direction (upward).
  • the space located in the -Z direction (below) of the first transport section 310 can be used as a maintenance space MS1 for maintaining the processing section 330, which will be described later. Therefore, in the substrate processing apparatus 1 according to the present embodiment, as shown in FIG. 1, the first transport section 310 overlaps the maintenance space MS1 of the processing section 330 in plan view.
  • a worker WP is shown who performs maintenance work on the processing section 330 below the first transport section 310 in the maintenance space MS1.
  • the second transport section 320 includes a transport device 321.
  • the transport device 321 is configured to support the carrier 9 and to change the attitude of the supported carrier 9. Details of the configuration of the transport device 321 for changing the attitude of the carrier 9 will be described later.
  • the transport device 321 is configured to be movable in the Y direction. Thereby, the second transport section 320 can receive the carrier 9 from the sub-transport device 312B near the second end TA2 of the first transport section 310. Further, the second transport section 320 can change the attitude of the carrier 9 received from the sub-transport device 312B, and move the carrier 9 to a position near the fourth end TA4 of the processing section 330.
  • the processing section 330 includes a plurality of (five in this example) liquid processing units 331, a drying unit 332, and a plurality of (three in this example) main transport devices 333A, 333B, and 333C.
  • the plurality of liquid processing units 331 and drying units 332 are arranged in the X direction such that the drying unit 332 is located at the third end TA3.
  • the plurality of main transport devices 333A, 333B, and 333C are arranged in this order on a straight line extending in the +X direction from the third end TA3 toward the fourth end TA4.
  • Each of the main transport devices 333A, 333B, and 333C is configured to be able to hold the carrier 9, and is also configured to be able to transport the held carrier 9 between the plurality of liquid processing units 331 and drying units 332.
  • the main transport device 333C located farthest from the relay block 200 receives the carrier 9 when the second transport unit 320 transports the carrier 9 near the processing unit 330. Further, the main transport device 333C transports the received carrier 9 to any one of the plurality of liquid processing units 331.
  • Each of the plurality of liquid processing units 331 includes one or more processing tanks 331a and lifters 331b.
  • Each liquid processing unit 331 in this example includes two processing tanks 331a.
  • Each processing tank 331a is configured such that the carrier 9 can be inserted into and taken out from a position above the processing tank 331a. Further, a processing liquid (chemical liquid or rinsing liquid) for cleaning a plurality of substrates accommodated in the carrier 9 is stored in the processing tank 331a.
  • the lifter 331b of each liquid processing unit 331 is configured to be able to hold the carrier 9. Further, the lifter 331b is configured to be able to receive the carrier 9 from any of the plurality of main transport devices 333A, 333B, 333C, and to pass the carrier 9 to any of the plurality of main transport devices 333A, 333B, 333C. has been done. Further, the lifter 331b is configured to be capable of immersing the carrier 9 in the processing liquid and lifting the carrier 9 from the processing liquid for each of the two processing tanks 331a of the liquid processing unit 331. As a result, the carrier 9 containing unprocessed substrates is passed to the processing section 330, and the plurality of substrates accommodated in the carrier 9 are immersed in one or more processing liquids for a predetermined period of time. Common processing is performed.
  • the drying unit 332 performs a drying process on the carrier 9 transported by the main transport device 333A located closest to the relay block 200. Through this drying process, the plurality of substrates housed in the carrier 9 are dried. The carrier 9 after the drying process is transferred to the second standby section 240 of the relay block 200 by the main conveyance device 333A located closest to the relay block 200.
  • a plurality of processing liquids respectively corresponding to a plurality of treatments to be performed on the substrate are arranged in the -X direction in the order of the processing to be performed on the substrate. It is stored as follows.
  • the control unit 160 in FIG. 2 allows each of the main transport devices 333A, 333B, and 333C to move in the -X direction while holding the carrier 9, and allows the main transport devices 333A, 333B, and 333C to move in the +X direction while holding the carrier 9. Limit movement.
  • a further maintenance space MS2 is formed on the +Y direction side of the processing section 330.
  • a sufficiently large maintenance space for the processing section 330 is ensured.
  • the cleaning block 400 includes a cleaning conveyance device 410 and a carrier cleaning unit 420.
  • the carrier cleaning unit 420 is provided so as to extend in the X direction at a position to the side (+Y direction) of the substrate loading/unloading block 100 and the relay block 200. Further, the carrier cleaning unit 420 includes a plurality of carrier cleaning tanks 421, a carrier drying section 422, and a plurality of carrier waiting sections 423 arranged in the X direction.
  • Each of the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier waiting sections 423 is configured such that the carrier 9 can be inserted and taken out from a position above the tank, drying section, or waiting section. Further, each of the plurality of carrier cleaning tanks 421 stores a processing liquid (chemical liquid or rinsing liquid) for cleaning the carrier 9. The carrier drying section 422 performs a drying process on the inserted carrier 9.
  • the cleaning conveyance device 410 is configured to be able to convey empty carriers 9 between the second standby section 240 of the relay block 200, the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier standby sections 423. .
  • an empty carrier 9 is transported between a plurality of carrier cleaning tanks 421 and immersed in a processing liquid stored in one of the carrier cleaning tanks 421. As a result, the empty carrier 9 that has been used to process a plurality of substrates in the processing block 300 is cleaned.
  • the carrier 9 after cleaning is transported to the carrier drying section 422 and subjected to a drying process.
  • the dried carrier 9 is transported to the carrier standby section 423 and held there. Thereafter, in accordance with the timing of receiving a plurality of substrates in the relay block 200, the carrier is taken out from the carrier standby section 423 by the cleaning conveyance device 410 and conveyed to the second standby section 240 of the relay block 200.
  • FIG. 3 is a plan view of the carrier 9 used in the substrate processing apparatus 1 of FIG. 1
  • FIG. 4 is a side view of the carrier 9 of FIG. 3
  • FIG. is a sectional view of the carrier 9 taken along the line BB in FIG. 4.
  • carrier 9 includes four frame members 10a, 10b, 10c, and 10d.
  • Each of the frame members 10a and 10b is formed of a substantially square plate-like member, and has an outer shape larger than the substrate to be processed.
  • Four openings 13 are formed in the central portion of each of the frame members 10a, 10b.
  • Each of the frame members 10c and 10d is formed of a substantially rectangular plate-like member. The length of the long side of frame members 10c, 10d is approximately equal to the length of one side of frame members 10a, 10b.
  • the frame members 10a and 10b are arranged so as to face each other and to be separated from each other.
  • a frame member 10c is provided to connect one side of the frame member 10a and one side of the frame member 10b.
  • a frame member 10d is provided to connect the other side of the frame member 10a and the other side of the frame member 10b. In this state, the frame members 10c and 10d are also arranged to face each other.
  • the carrier 9 has a rectangular tube shape.
  • a rectangular opening formed at one end of the carrier 9 having a rectangular tube shape functions as a substrate entrance/exit 12 for inserting a substrate into the carrier 9 and for taking out the substrate from the carrier 9.
  • a plurality of (six in this example) are arranged so as to connect the frame member 10a and the frame member 10b and to be distributed between the frame member 10c and the frame member 10d. ) support pieces 11 are provided.
  • Each support piece 11 is composed of a long plate member, and is provided in parallel with the frame members 10c and 10d. Furthermore, each support piece 11 has a plurality of grooves (not shown) formed at a predetermined standard pitch into which parts of the outer edges of a plurality of substrates housed in the carrier 9 can be inserted. The number of grooves formed in each support piece 11 is equal to the number of substrates to be accommodated in the carrier 9.
  • a plurality of protrusions pr are formed on each of the two opposing surfaces of the frame members 10c and 10d.
  • the plurality of protrusions pr extend in the direction of the long sides of the frame members 10c and 10d, and are formed to be lined up in the direction of the short sides at the above-mentioned reference pitch. As a result, a groove into which the outer edge of the substrate can be inserted is formed between each two adjacent protrusions pr.
  • the attitude of the carrier 9 is changed as appropriate.
  • a posture in which the plurality of support pieces 11 are located at the lower end and the frame members 10a and 10b are maintained parallel to the vertical direction is referred to as a vertical posture.
  • a posture in which the frame members 10a, 10b are maintained perpendicular to the vertical direction is called a horizontal posture.
  • the plurality of substrates When inserting a plurality of substrates into an empty carrier 9, the plurality of substrates are inserted into the carrier 9 through the substrate entrance/exit 12 of the carrier 9 in a horizontal position. At this time, both sides (two opposing sides) of the outer edge of each board are located between any two of the plurality of protrusions pr of the frame member 10c and among the plurality of protrusions pr of the frame member 10d. inserted between any two.
  • the carrier 9 containing a plurality of substrates when the carrier 9 containing a plurality of substrates is in a horizontal position, each substrate is held with both sides of the substrate supported by the plurality of protrusions pr.
  • the carrier 9 containing a plurality of substrates is in a vertical position, each substrate is held with the plurality of lower end portions of the substrate fitted into the plurality of grooves of the plurality of support pieces 11. .
  • each of the plurality of accommodated substrates is supported entirely on both sides by the plurality of protrusions pr.
  • each of the plurality of accommodated substrates is locally supported by the plurality of support pieces 11 at a plurality of portions at the lower end of the substrate. Therefore, when the carrier 9 is in the horizontal position, the load (load due to the weight of each board) applied to the outer edge of each accommodated board is reduced compared to when the carrier 9 is in the vertical position.
  • the vertical dimension (height) of the carrier 9 in the horizontal position is smaller than the vertical dimension (height) of the carrier 9 in the vertical position. It is formed so that
  • FIGS. 6 to 8 are diagrams for explaining transport routes for a plurality of substrates and carriers 9 in the substrate processing apparatus 1 of FIG. 1. Similar to FIG. 1, FIG. 6 shows a schematic plan view of the substrate processing apparatus 1. FIG. 7 shows a schematic external perspective view of the substrate processing apparatus 1 of FIG. 1 when viewed in one direction. FIG. 8 shows a schematic external perspective view of the substrate processing apparatus 1 of FIG. 1 viewed from another direction. Note that in FIGS. 7 and 8, illustration of the cleaning block 400 in FIG. 1 is omitted. Furthermore, in FIGS. 6 to 8, illustrations of the maintenance spaces MS1 and MS2 in FIG. 1 are also omitted, except for the maintenance space MS1 in FIG.
  • a case is assumed in which a series of treatments are performed on a plurality of unprocessed substrates W housed in one hoop 8.
  • one hoop 8 is carried into the substrate loading/unloading block 100, and as shown in FIG. 6, is placed on the opener 120 and the lid is opened.
  • an empty carrier 9 is supported in a horizontal position on the carrier support portion 210 of the relay block 200.
  • the substrate entrance/exit 12 (FIG. 5) of the carrier 9 faces the ⁇ X direction so as to face the hoop 8.
  • the substrate transfer robot 140 takes out a plurality of unprocessed substrates W from one hoop 8 and inserts them into the carrier 9.
  • the transport paths of the plurality of substrates W in this case are shown in FIGS. 6 to 8 by thick dotted arrows a1.
  • the lid of the empty hoop 8 is closed, and the hoop transport device 112 holds the hoop 8 and places it on one of the hoop shelves 110.
  • the carrier 9 containing the plurality of substrates W is received by the carrier support section 210 and placed on the movable stage 311a of the main transport device 311 by the sub transport device 312A of the first transport section 310.
  • the conveyance path of the carrier 9 in this case is shown in FIGS. 6 to 8 by a thick solid arrow a2.
  • the carrier 9 placed on the movable stage 311a moves in the +X direction from a position near the relay block 200 (first end TA1) to a position near the second transport section 320 (second end TA2). transported in a horizontal position.
  • the state of the carrier 9 conveyed by the main conveyance device 311 of the first conveyance section 310 is shown in the balloon BA3 of FIG. 8 .
  • the carrier 9 that has reached a position near the second transport section 320 is transferred to the transport device 321 of the second transport section 320 by the sub transport device 312B of the first transport section 310. Therefore, the attitude of the carrier 9 passed to the transport device 321 is changed from a horizontal attitude to a vertical attitude by the transport device 321.
  • balloon BA2 of FIG. 7 the state of the attitude change of the carrier 9 in the transport device 321 is schematically shown.
  • the transport device 321 includes a movable base 322 and a carrier holder 323.
  • the movable pedestal 322 is provided so as to be movable in the Y direction within the second transport section 320.
  • the carrier holder 323 includes a first holder 323a and a second holder 323b.
  • the first holding portion 323a has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a horizontal position.
  • the second holding portion 323b has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a vertical posture.
  • the first holding part 323a and the second holding part 323b are connected such that one side of the first holding part 323a and one side of the second holding part 323b touch each other and the two holding parts are orthogonal to each other.
  • the movable base 322 holds the carrier so that the first holding part 323a and the second holding part 323b are both parallel to the Y direction, and the carrier holding tool 323 is rotatable around an axis extending in the Y direction. A part of the tool 323 is held.
  • the transport device 321 further includes a drive unit (not shown) that can adjust the rotation angle of the carrier holder 323 on the movable base 322.
  • a drive unit (not shown) that can adjust the rotation angle of the carrier holder 323 on the movable base 322.
  • the transport device 321 further includes a drive unit (not shown) that moves the movable pedestal 322 in the Y direction in the second transport unit 320.
  • a drive unit (not shown) that moves the movable pedestal 322 in the Y direction in the second transport unit 320.
  • the carrier 9 that has reached a position near the processing section 330 is received by the main transport device 333C of the processing section 330 from the transport device 321.
  • the carrier 9 received by the main transport device 333C is transported to one or more liquid processing units 331 by the main transport device 333C and other main transport devices 333B and 333A, and is maintained in a vertical posture. It is immersed in various processing solutions for a predetermined period of time. As a result, the plurality of substrates W accommodated in the carrier 9 are processed according to the immersed processing liquid.
  • a balloon BA4 in FIG. 8 shows the state of the carrier 9 being transported by the main transport devices 333A, 333B, and 333C of the processing section 330.
  • each main transport device 333A, 333B, 333C includes a movable support column 333a and a pair of chuck members 333b.
  • the movable support column 333a is provided on the side (+Y direction side) of the plurality of liquid processing units 331 so as to be movable in the X direction and movable in the Z direction (movable up and down).
  • a pair of chuck members 333b are provided to extend above the liquid processing unit 331 from the upper end of the movable support column 333a.
  • the pair of chuck members 333b are configured to be able to sandwich and hold the carrier 9 in a vertical position.
  • each of the main transport devices 333A, 333B, and 333C has a drive unit (not shown) that can switch between holding the carrier 9 by the pair of chuck members 333b and releasing the carrier 9 from the pair of chuck members 333b.
  • the carrier 9 is delivered between the plurality of main transport devices 333A, 333B, 333C and the plurality of liquid processing units 331.
  • the carrier 9 accommodating the plurality of substrates W treated with the treatment liquid is further transported to a drying unit 332 close to the relay block 200. Thereby, the carrier 9 and the plurality of substrates W in the carrier 9 are dried by the drying unit 332.
  • a series of transport paths of the carrier 9 in the processing block 300 are shown in FIGS. 6 to 8 by thick solid arrows a3.
  • the carrier 9 containing a plurality of processed substrates W is transported from the drying unit 332 to the carrier support section 220 of the relay block 200 by the main transport device 333A, and is supported by the carrier support section 220.
  • the conveyance path of the carrier 9 in this case is shown in FIGS. 6 to 8 by a thick dotted arrow a4.
  • the attitude of the carrier 9 passed to the carrier support part 220 is changed from the vertical attitude to the horizontal attitude by the carrier support part 220.
  • the state of the attitude change of the carrier 9 in the carrier support section 220 is schematically shown.
  • the carrier support section 220 includes a fixed pedestal 211 and a carrier holder 212 fixed within the relay block 200.
  • the carrier holder 212 includes a first holder 212a and a second holder 212b.
  • the first holding portion 212a has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a horizontal position.
  • the second holding portion 212b has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a vertical posture.
  • the first holding part 212a and the second holding part 212b are connected such that one side of the first holding part 212a and one side of the second holding part 212b touch each other and the two holding parts are orthogonal to each other.
  • the fixed base 211 holds the carrier so that the first holding part 212a and the second holding part 212b are both parallel to the Y direction, and the carrier holding tool 212 is rotatable around an axis extending in the Y direction. A portion of the tool 212 is held.
  • the carrier support section 220 further includes a drive section (not shown) that can adjust the rotation angle of the carrier holder 212 on the fixed base 211.
  • a drive section (not shown) that can adjust the rotation angle of the carrier holder 212 on the fixed base 211.
  • the rotation angle of the carrier holder 212 is adjusted so that the second holding part 212b is horizontal and the first holding part 212a is vertical.
  • the rotation angle of the carrier holder 212 is adjusted so that the second holding part 212b becomes vertical and the first holding part 212a becomes horizontal.
  • the attitude of the carrier 9 is changed from the vertical attitude to the horizontal attitude.
  • the substrate entrance/exit 12 (FIG. 5) of the carrier 9 faces in the -X direction.
  • the lid of the hoop 8 containing the plurality of processed substrates W is closed, held by the hoop transport device 112, and placed on one of the plurality of hoop shelves 110. Further, the hoop 8 is transferred to the hoop mounting section 190 by the hoop transfer device 111 and is carried out from the substrate processing apparatus 1 .
  • the attitude of the empty carrier 9 in the carrier support part 220 is changed from the horizontal attitude to the vertical attitude again by the carrier support part 220.
  • the empty carrier 9 returned to the vertical position in the carrier support section 220 is transported by the main transport device 333A and received by the second standby section 240.
  • the empty carrier 9 received from the carrier support unit 220 by the second standby unit 240 is transported to the carrier cleaning unit 420 by the cleaning transport device 410 of the cleaning block 400 while maintaining the vertical posture.
  • the conveyance path of the carrier 9 in this case is shown in FIG. 6 by a thick dashed line arrow c1.
  • the carrier 9 is further conveyed by a cleaning conveyance device 410 between a plurality of carrier cleaning tanks 421, a carrier drying section 422, and a plurality of carrier waiting sections 423.
  • a cleaning conveyance device 410 between a plurality of carrier cleaning tanks 421, a carrier drying section 422, and a plurality of carrier waiting sections 423.
  • the carrier 9 after use is subjected to a cleaning process and a drying process.
  • the carrier 9 after the cleaning process and the drying process is accommodated in one of the plurality of carrier standby parts 423.
  • the vertical posture of the carrier 9 is maintained.
  • a case is assumed in which a series of treatments are performed on a plurality of unprocessed substrates W accommodated in another new hoop 8.
  • the clean carrier 9 accommodated in the carrier standby section 423 of the cleaning block 400 is transported as a new carrier 9 from the carrier cleaning unit 420 to the second waiting section 240 by the cleaning transport device 410.
  • a new conveyance path of the carrier 9 is shown in FIG. 6 by a thick dashed line arrow c2.
  • the new carrier 9 delivered to the second standby section 240 is conveyed to the first standby section 230 by the standby conveyance device 250 while maintaining its vertical posture, and is supported by the first standby section 230.
  • a new conveyance path for the carrier 9 is shown in FIG. 6 by a thick two-dot chain arrow b1.
  • the first standby unit 230 passes the new carrier 9 supported by the first standby unit 230 to the carrier support unit 210. Therefore, the posture of the new carrier 9 passed to the carrier support section 210 is changed from the vertical posture to the horizontal posture by the carrier support section 210.
  • the two carrier supports 210 and 220 in the relay block 200 have the same configuration.
  • the new attitude of the carrier 9 is changed, as shown in the balloon BA1 in FIG. Thereafter, the plurality of unprocessed substrates W accommodated in another new hoop 8 are inserted into a new carrier 9 in a horizontal position.
  • a new carrier 9 containing a plurality of unprocessed substrates W is transported along a transport path indicated by a series of arrows a2, a3, and a4 shown in FIGS. 6 to 8. As a result, a series of processes are performed on the plurality of substrates W accommodated in the new carrier 9.
  • the first end TA1 of the first transport section 310 functions as a substrate entrance of the processing block 300. Further, the third end TA3 of the processing section 330 functions as a substrate outlet of the processing block 300.
  • a hoop 8 containing a plurality of unprocessed substrates W is supported by the opener 120. Further, the lid of the hoop 8 supported by the opener 120 is opened. In this state, a plurality of unprocessed substrates W are taken out from the hoop 8 on the opener 120 and passed into the processing block 300 through the substrate entrance.
  • predetermined processing is performed on each of the plurality of unprocessed substrates W.
  • An empty hoop 8 is supported by an opener 130 at a location corresponding to the substrate outlet of the processing block. Further, the lid of the hoop 8 supported by the opener 130 is opened. In this state, a plurality of processed substrates W are received from the substrate outlet of the processing block 300 and inserted into the hoop 8 on the opener 130.
  • the operation of passing a plurality of unprocessed substrates W to the processing block 300 and the operation of receiving a plurality of processed substrates W from the processing block 300 are performed independently.
  • the opening/closing operation of the lid of the hoop 8 containing a plurality of unprocessed substrates W and the operation of taking out the substrates from the hoop 8 in parallel with the opening/closing operation of the lid of the hoop 8 containing a plurality of unprocessed substrates W and the operation of taking out the substrates from the hoop 8, the opening/closing operation of the lid of the empty hoop 8 and the operation of opening/closing the lid of the empty hoop 8 It becomes possible to perform an operation of inserting a plurality of substrates W into the substrate.
  • the flow of processing of the plurality of substrates W in the substrate processing apparatus 1 is prevented from being rate-limited by the carrying-in operation and the carrying-out operation of the plurality of substrates W. Therefore, a decrease in throughput caused by the loading and unloading operations of the substrate W is suppressed.
  • each of the plurality of substrates W is prevented from being transported by a large number of transport devices, and each of the plurality of substrates W is suppressed from being supported by a large number of support parts. That is, a large number of members are prevented from coming into contact with a plurality of parts of each of the plurality of substrates W. Therefore, a decrease in the cleanliness of each substrate W due to contact of a large number of components of the substrate processing apparatus 1 with each of the plurality of substrates W is suppressed.
  • the operation of transferring the plurality of substrates W from the hoop 8 containing the plurality of unprocessed substrates W to the empty carrier 9, and the operation of transferring the plurality of substrates W containing the plurality of processed substrates W are performed.
  • the operation of transferring the plurality of substrates W from the carrier 9 to the empty hoop 8 is performed independently. This allows these transfer operations to be performed in parallel. As a result, reduction in throughput caused by loading and unloading operations of the substrate W is suppressed.
  • the processing block 300 described above includes one or more liquid processing units 331 and drying units 332.
  • Each liquid processing unit 331 includes a plurality of processing tanks 331a and lifters 331b.
  • a processing liquid is stored in each processing tank 331a.
  • the lifter 331b is configured to be able to immerse the carrier 9 in the processing liquid stored in the processing tank 331a and to lift the carrier 9 from the processing liquid stored in the processing tank 331a.
  • the carrier 9 that accommodates a plurality of substrates W is immersed in the processing liquid, so that a common process is simultaneously performed on the plurality of substrates W accommodated in the carrier 9. .
  • the substrate entrance of the processing block 300 (the first end TA1 of the first transport section 310) and the substrate exit of the processing block 300 (the third end TA3 of the processing section 330) are configured to be adjacent to each other in the Y direction in plan view. Further, the substrate loading/unloading block 100 and the processing block 300 are arranged in the X direction with the relay block 200 interposed therebetween in a plan view.
  • the substrate loading/unloading block 100 and the relay block 200 include a configuration for delivering a plurality of unprocessed substrates W to the processing block 300 and a configuration for receiving a plurality of processed substrates W from the processing block 300. .
  • operations related to loading and unloading a plurality of substrates W are performed in the substrate loading/unloading block 100. Therefore, in the substrate processing apparatus 1, there is no need to make a large distance between the loading position of the plurality of substrates W and the carrying-out position of the plurality of substrates W. Therefore, outside the substrate processing apparatus 1, it becomes easy to use a common path for carrying the FOUP 8 into the substrate processing apparatus 1 and a path for carrying the FOUP 8 out of the substrate processing apparatus 1.
  • the substrate loading/unloading block 100 described above is provided with a plurality of hoop shelves 110.
  • the hoop 8 is transported between the plurality of hoop shelves 110 and the openers 120 and 130 by a hoop transport device 112.
  • multiple hoops 8 can be placed on any of the multiple hoop shelves 110. Thereby, even when the hoop 8 is placed on the openers 120 and 130, it is possible to continue loading and unloading a plurality of substrates W into and out of the substrate processing apparatus 1.
  • the first transport section is used to transport the carrier 9 from the relay block 200 to the fourth end TA4 of the processing section 330.
  • 310 and a second transport section 320 are provided, but the present invention is not limited thereto.
  • a relay block 200 for carrying in substrates and a substrate carrying-in/out block 100 are provided in the +X direction from the fourth end TA4 of the processing section 330, and a relay block 200 for carrying in substrates is provided in the -X direction from the third end TA3 of the processing section 330.
  • a relay block 200 and a substrate loading/unloading block 100 may be provided. In this case, it is not necessary to provide the first transport section 310 and the second transport section 320 in the substrate processing apparatus 1.
  • the present invention is not limited thereto.
  • various processes may be performed on the plurality of substrates W without being accommodated in the carrier 9.
  • the main transport devices 311, 333A, 333B, 333C, the transport device 321, etc. are configured to be able to hold or support a plurality of substrates W, for example.
  • the main transport devices 311, 333A, 333B, 333C, transport device 321, etc. are configured to be able to hold or support one substrate W, for example. Further, in these cases, it is not necessary to prepare the carrier 9.
  • each of the substrate transfer robots 140 and 150 may be configured to be able to sequentially transfer a plurality of substrates W one by one, or may be configured to be able to transfer a plurality of substrates W simultaneously. may be configured.
  • the carrier 9 passed from the relay block 200 is transported from the first end TA1 to the second end TA2 of the first transport section 310. Thereafter, various processes are performed on the plurality of substrates W while returning from the fourth end TA4 to the third end TA3 of the processing section 330.
  • the invention is not limited to the above example.
  • the processing block 300 may have a configuration in which the positions of the first transport section 310 and the processing section 330 are switched.
  • the processing unit 330 has a configuration that is symmetrical in a plane perpendicular to the X direction, for example.
  • the carrier 9 passed from the relay block 200 is first immersed in a plurality of processing liquids in the processing section 330 and subjected to a drying process. Thereafter, the carrier 9 accommodating the plurality of processed substrates W is returned to the relay block 200 by the main transport device 311 of the first transport section 310 .
  • the substrate processing apparatus 1 includes a cleaning block 400 that cleans the used carrier 9 used to process a plurality of substrates W
  • the present invention is not limited thereto.
  • the substrate processing apparatus 1 may not be provided with the cleaning block 400.
  • the used carrier 9 from which a plurality of substrates W have been taken out at the carrier support section 220 of the relay block 200 may be transported to the carrier support section 210 without being cleaned.
  • the used carrier 9 may be taken out of the substrate processing apparatus 1 and discarded without being cleaned.
  • the carrier support section 210 and the first standby section 230 are separately provided in the relay block 200, but the present invention is not limited to this. If it is possible to add the function of changing the posture of the carrier 9 to the first standby section 230, the carrier support section 210 may not be provided.
  • the carrier support section 220 and the second standby section 240 are separately provided in the relay block 200, but the present invention is not limited to this. If it is possible to add the function of changing the posture of the carrier 9 to the second standby section 240, the carrier support section 220 may not be provided.
  • the transport device 321 has the function of changing the attitude of the carrier 9 and the function of transporting the carrier 9. Not limited.
  • a component having a function of changing the attitude of the carrier 9 and a component having a function of transporting the carrier 9 may be separately provided in place of the above-described transport device 321.
  • the substrate W to be processed has a rectangular shape in plan view, but the substrate to be processed may have a circular shape in plan view. However, it may have a polygonal shape other than a quadrangle, such as a triangle or a pentagon when viewed in plan.
  • the carrier 9 supports both sides of the rectangular substrate W when the rectangular substrate W is accommodated in a horizontal position
  • the present invention is not limited thereto.
  • the carrier 9 may be configured to be able to support the center portion of the substrate W in a horizontal position.
  • the processing liquid for cleaning the substrate W is stored in the plurality of processing tanks 331a of the processing section 330, but the present invention is not limited to this. Not limited. In at least some of the plurality of processing tanks 331a of the processing section 330, a plating solution for performing plating processing on the substrate W, a liquid for modifying the surface condition of the substrate W, etc. is stored as a processing solution. Good too.
  • the above embodiment is an example in which the present invention is applied to cleaning processing of a plurality of substrates W, but the present invention is not limited to this, and other processing such as plating processing or surface modification processing of a plurality of substrates W can be applied. The present invention may also be applied to.
  • openings 13 are formed in the center portion of each of the frame members 10a, 10b, but the present invention is not limited thereto.
  • the number of openings 13 is not limited to four, and other numbers such as one, two, three, or five openings 13 may be formed in the central portion of each of the frame members 10a, 10b. Alternatively, the opening 13 may not be formed in the center portion of each of the frame members 10a, 10b.
  • the shapes of the frame members 10a and 10b may be changed in design as appropriate.
  • the pair of chuck members 333b hold the carrier 9 by sandwiching the carrier 9 in the X direction, but the present invention is directed to this. Not limited.
  • the pair of chuck members 333b may hold the carrier 9 by sandwiching the carrier 9 in the Y direction, or may hold the carrier 9 by sandwiching the carrier 9 in a direction intersecting the X and Y directions in a horizontal plane. You may.
  • the first end TA1 of the first transport section 310 is an example of the substrate entrance
  • the third end TA3 of the processing section 330 is an example of the substrate exit
  • the processing block 300 is an example of the substrate exit.
  • the hoop 8 which is an example of a block and accommodates a plurality of unprocessed substrates W and is supported by an opener 120, is an example of a first substrate container
  • the opener 120 is an example of a first opener.
  • the empty hoop 8 supported by the opener 130 is an example of the second substrate container
  • the opener 130 is an example of the second opener
  • the component group including the substrate transfer robot 150, the carrier support section 220, and the second standby section 240 is an example of the second substrate transfer section.
  • the processing apparatus 1 is an example of a substrate processing apparatus.
  • the carrier 9 is an example of a carrier
  • the transport route of the carrier 9 indicated by the thick solid arrow a3 in FIGS. 6 to 8 is an example of a predetermined transport route
  • the main transport device 311 of the processing block 300 , 333A, 333B, 333C and the transport device 321 are examples of the transport mechanism
  • the plurality of liquid processing units 331 and the drying unit 332 are examples of the processing units.
  • the processing tank 331a is an example of a processing tank
  • the lifter 331b is an example of a lifter
  • the substrate loading/unloading block 100 and the relay block 200 are examples of a substrate loading/unloading section
  • the Y direction is an example of the first direction.
  • the X direction is an example of the second direction
  • the plurality of hoop shelves 110 are an example of a plurality of substrate container mounting sections
  • the hoop transport device 112 is an example of a substrate container transport device.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)

Abstract

This substrate processing apparatus comprises a processing block, two openers, and two substrate delivery robots. The processing block has a substrate inlet and a substrate outlet, and an unprocessed substrate is received in the substrate inlet, and a predetermined process is carried out on the substrate. A processed substrate is guided to the substrate outlet. One of the openers opens a lid of one hoop in which an unprocessed substrate is accommodated at a position corresponding to the substrate inlet. One of the substrate delivery robots receives the substrate from the one hoop, and passes the substrate to the substrate inlet of the processing block. The other openers opens a lid of the other hoop, which is empty, at a position corresponding to the substrate outlet. The other substrate delivery robot receives the substrate from the substrate outlet of the processing block, and inserts the substrate in the other hoop.

Description

基板処理装置Substrate processing equipment
 本発明は、複数の基板を処理槽で処理する基板処理装置に関する。 The present invention relates to a substrate processing apparatus that processes a plurality of substrates in a processing tank.
 半導体基板、液晶表示装置もしくは有機EL(Electro Luminescence)表示装置等のFPD(Flat Panel Display)用基板、光ディスク用基板、磁気ディスク用基板、光磁気ディスク用基板、フォトマスク用基板、セラミック基板または太陽電池用基板等の基板に種々の処理を行うために、基板処理装置が用いられる。 Semiconductor substrates, FPD (Flat Panel Display) substrates such as liquid crystal display devices or organic EL (Electro Luminescence) display devices, optical disk substrates, magnetic disk substrates, magneto-optical disk substrates, photomask substrates, ceramic substrates, or solar panels. 2. Description of the Related Art Substrate processing apparatuses are used to perform various treatments on substrates such as battery substrates.
 このような基板処理装置として、複数の基板を処理槽に貯留された処理液に浸漬し、エッチング等の処理を行うバッチ式の基板処理装置がある。例えば、特許文献1に記載されたバッチ式の基板処理装置は、フープ保持部、基板処理部および搬入搬出機構を含む。フープ保持部は、フープ(FOUP:Front Opening Unified Pod)を保持可能に構成される。フープは、複数の基板が上下方向に所定ピッチで並ぶように、複数の基板を水平姿勢で保持しつつ収容可能に構成された収容器である。フープは、フープの外部からそのフープの内部空間にアクセスするための開口とその開口を開閉するための蓋とを有する。フープ保持部には、フープ保持部により保持されたフープの蓋を開閉するためのオープナが設けられている。 As such a substrate processing apparatus, there is a batch-type substrate processing apparatus in which a plurality of substrates are immersed in a processing liquid stored in a processing tank and subjected to processing such as etching. For example, a batch-type substrate processing apparatus described in Patent Document 1 includes a hoop holding section, a substrate processing section, and a loading/unloading mechanism. The hoop holding section is configured to be able to hold a hoop (FOUP: Front Opening Unified Pod). The hoop is a container configured to hold and accommodate a plurality of substrates in a horizontal position so that the plurality of substrates are arranged vertically at a predetermined pitch. The hoop has an opening for accessing the interior space of the hoop from the outside of the hoop, and a lid for opening and closing the opening. The hoop holding section is provided with an opener for opening and closing the lid of the hoop held by the hoop holding section.
 その基板処理装置においては、未処理の複数の基板が収容されたフープがフープ保持部に供給され、保持される。この状態で、フープの蓋がオープナにより開かれ、搬入搬出機構によりフープから複数の基板が取り出される。フープから取り出された複数の基板は、基板処理部に渡され、所定の処理が施される。複数の基板が取り出された空のフープは、フープ保持部から退避される。 In the substrate processing apparatus, a hoop containing a plurality of unprocessed substrates is supplied to a hoop holding section and held there. In this state, the lid of the hoop is opened by the opener, and a plurality of substrates are taken out from the hoop by the loading/unloading mechanism. A plurality of substrates taken out from the hoop are passed to a substrate processing section and subjected to predetermined processing. The empty hoop from which a plurality of substrates have been taken out is evacuated from the hoop holding section.
 基板処理部による処理後の複数の基板は、搬入搬出機構により受け取られる。このとき、処理後の複数の基板を収容すべき空のフープがフープ保持部に保持される。また、当該フープの蓋が開かれる。この状態で、処理後の複数の基板が、搬入搬出機構により空のフープ内に挿入される。処理後の複数の基板が収容されたフープは、基板処理装置から搬出される。 The plurality of substrates processed by the substrate processing section are received by the loading/unloading mechanism. At this time, an empty hoop that is to accommodate a plurality of processed substrates is held in the hoop holding section. Also, the lid of the hoop is opened. In this state, a plurality of processed substrates are inserted into the empty hoop by the loading/unloading mechanism. The hoop containing the plurality of processed substrates is carried out from the substrate processing apparatus.
特開2011-238945号公報JP2011-238945A
 特許文献1の基板処理装置においては、未処理の複数の基板をフープから取り出す動作と、処理後の複数の基板をフープ内に収容する動作とが、フープ保持部および搬入搬出機構により行われる。この場合、基板処理部に対する未処理の複数の基板の搬入動作と、基板処理部に対する処理後の複数の基板の搬出動作とを並行して行うことができない。そのため、複数の基板の処理速度は、基板の搬入動作および搬出動作により律速される。 In the substrate processing apparatus of Patent Document 1, the operation of taking out a plurality of unprocessed substrates from the hoop and the operation of accommodating a plurality of processed substrates into the hoop are performed by the hoop holding section and the loading/unloading mechanism. In this case, the operation of carrying a plurality of unprocessed substrates into the substrate processing section and the operation of carrying out a plurality of processed substrates from the substrate processing section cannot be performed in parallel. Therefore, the processing speed of a plurality of substrates is determined by the loading and unloading operations of the substrates.
 本発明の目的は、基板の搬入動作および搬出動作に起因する基板処理のスループットの低下を抑制することが可能な基板処理装置を提供することである。 An object of the present invention is to provide a substrate processing apparatus that can suppress reduction in substrate processing throughput caused by loading and unloading operations of substrates.
 (1)本発明の一局面に従う基板処理装置は、基板入口および基板出口を有し、基板入口において未処理の基板を受け取り、受け取った基板に予め定められた処理を行うとともに処理後の基板を基板出口に導く処理ブロックと、基板入口に対応する位置に設けられ、未処理の複数の基板が収容された第1の基板容器を支持するとともに第1の基板容器の蓋を開閉する第1のオープナと、第1のオープナにより蓋が開かれた第1の基板容器から未処理の複数の基板を取り出し、取り出した複数の基板を処理ブロックの基板入口に渡す第1の基板受渡部と、基板出口に対応する位置に設けられ、空の第2の基板容器を支持するとともに第2の基板容器の蓋を開閉する第2のオープナと、処理ブロックの基板出口から処理後の複数の基板を受け取り、受け取った複数の基板を第2のオープナにより蓋が開かれた第2の基板容器に挿入する第2の基板受渡部とを備える。 (1) A substrate processing apparatus according to one aspect of the present invention has a substrate inlet and a substrate outlet, receives an unprocessed substrate at the substrate inlet, performs a predetermined process on the received substrate, and removes the processed substrate. a processing block that leads to a substrate exit; and a first substrate container that is provided at a position corresponding to the substrate entrance and that supports a first substrate container containing a plurality of unprocessed substrates and opens and closes a lid of the first substrate container. an opener, a first substrate transfer unit that takes out a plurality of unprocessed substrates from a first substrate container whose lid has been opened by the first opener, and delivers the plurality of unprocessed substrates to a substrate entrance of a processing block; a second opener provided at a position corresponding to the outlet to support an empty second substrate container and open/close a lid of the second substrate container; and a second opener for receiving a plurality of processed substrates from the substrate outlet of the processing block. and a second substrate transfer section that inserts the plurality of substrates received into a second substrate container whose lid is opened by a second opener.
 その基板処理装置においては、処理ブロックの基板入口に対応する位置で第1の基板容器の蓋が第1のオープナにより開閉される。第1の基板容器の蓋が開かれた状態で、第1の基板容器から未処理の複数の基板が取り出され、基板入口を通して処理ブロックに渡される。 In the substrate processing apparatus, the lid of the first substrate container is opened and closed by the first opener at a position corresponding to the substrate entrance of the processing block. With the lid of the first substrate container open, a plurality of unprocessed substrates are removed from the first substrate container and passed to the processing block through the substrate inlet.
 処理ブロックにおいては、未処理の複数の基板の各々に予め定められた処理が行われる。処理ブロックの基板出口に対応する位置で第2の基板容器の蓋が第2のオープナにより開閉される。第2の基板容器の蓋が開かれた状態で、処理後の複数の基板が、処理ブロックの基板出口から受け取られ、第2の基板容器に挿入される。 In the processing block, predetermined processing is performed on each of the plurality of unprocessed substrates. A second opener opens and closes the lid of the second substrate container at a position corresponding to the substrate outlet of the processing block. With the lid of the second substrate container open, a plurality of processed substrates are received from the substrate outlet of the processing block and inserted into the second substrate container.
 上記のように、未処理の複数の基板を処理ブロックに渡す動作と、処理後の複数の基板を処理ブロックから受け取る動作とが、独立して行われる。この場合、第1の基板容器の蓋の開閉動作および第1の基板容器からの基板の取り出し動作に並行して、第2の基板容器の蓋の開閉動作および第2の基板容器への基板の挿入動作を行うことが可能になる。それにより、基板処理装置における複数の基板の処理の流れが、基板処理装置における複数の基板の搬入動作および搬出動作により律速されることが防止される。したがって、基板の搬入動作および搬出動作に起因するスループットの低下が抑制される。 As described above, the operation of passing a plurality of unprocessed substrates to the processing block and the operation of receiving a plurality of processed substrates from the processing block are performed independently. In this case, in parallel with the operation of opening and closing the lid of the first substrate container and the operation of taking out the substrate from the first substrate container, the operation of opening and closing the lid of the second substrate container and the operation of taking out the substrate into the second substrate container are performed. It becomes possible to perform an insertion operation. This prevents the flow of processing of a plurality of substrates in the substrate processing apparatus from being rate-limited by the loading and unloading operations of the plurality of substrates in the substrate processing apparatus. Therefore, reduction in throughput caused by the loading and unloading operations of the substrates is suppressed.
 (2)処理ブロックは、複数の基板を収容可能に構成されたキャリアを、基板入口から基板出口に至る予め定められた搬送経路に沿って搬送する搬送機構と、搬送経路上に設けられ、複数の基板がキャリアに収容された状態で、当該キャリアに収容された複数の基板に予め定められた処理を行う処理ユニットとを含み、第1の基板受渡部は、空のキャリアが基板入口にある状態で、第1の基板容器から未処理の複数の基板を取り出し、取り出した複数の基板をキャリアに挿入し、第2の基板受渡部は、処理後の複数の基板が収容されたキャリアが基板出口にある状態で、キャリアから処理後の複数の基板を取り出し、取り出した複数の基板を第2の基板容器に挿入してもよい。 (2) The processing block includes a transport mechanism that transports a carrier configured to accommodate a plurality of substrates along a predetermined transport path from a substrate inlet to a substrate exit, and a a processing unit that performs predetermined processing on a plurality of substrates accommodated in the carrier while the substrates are accommodated in the carrier, and the first substrate delivery section includes an empty carrier at the substrate inlet. In this state, the plurality of unprocessed substrates are taken out from the first substrate container, the plurality of taken out substrates are inserted into the carrier, and the second substrate transfer section is configured to transfer the plurality of unprocessed substrates from the carrier containing the plurality of processed substrates to the substrates. In the state at the outlet, a plurality of processed substrates may be taken out from the carrier, and the taken out plurality of substrates may be inserted into a second substrate container.
 この場合、処理ブロックにおいては、キャリアに収容された複数の基板に対して予め定められた処理が行われる。それにより、処理ブロックにおいて、複数の基板の各々が多数の搬送装置により搬送されることが抑制されるので、複数の基板の各々に基板処理装置の多数の構成要素が接触することに起因する各基板の清浄度の低下が抑制される。 In this case, in the processing block, predetermined processing is performed on the plurality of substrates housed in the carrier. This prevents each of the plurality of substrates from being transported by a number of transport devices in the processing block, so that each Deterioration in cleanliness of the substrate is suppressed.
 また、上記の構成によれば、第1の基板容器から空のキャリアへの未処理の複数の基板の移し替え動作と、処理後の複数の基板が収容されたキャリアから第2の基板容器への複数の基板の移し替え動作とが、独立して行われる。それにより、これらの移し替え動作を並行して行うことが可能になる。その結果、基板の搬入動作および搬出動作に起因するスループットの低下が抑制される。 Further, according to the above configuration, the operation of transferring a plurality of unprocessed substrates from the first substrate container to an empty carrier, and the transfer operation of a plurality of unprocessed substrates from a carrier containing a plurality of processed substrates to a second substrate container. The operations of transferring a plurality of substrates are performed independently. This allows these transfer operations to be performed in parallel. As a result, reduction in throughput caused by the loading and unloading operations of the substrates is suppressed.
 (3)処理ユニットは、予め定められた処理に対応する処理液を貯留する処理槽と、搬送機構により搬送されるキャリアを処理槽の処理液に浸漬することおよび処理液に浸漬されたキャリアを処理槽から引き上げることが可能に構成されたリフタとを含んでもよい。 (3) The processing unit includes a processing tank that stores processing liquid corresponding to a predetermined processing, immersing carriers transported by a transport mechanism in the processing liquid of the processing tank, and immersing the carriers immersed in the processing liquid. It may also include a lifter configured to be able to be lifted from the processing tank.
 この場合、複数の基板を収容するキャリアが、処理液に浸漬されることにより、キャリアに収容された複数の基板に共通の処理が行われる。 In this case, a common process is performed on the plurality of substrates accommodated in the carrier by immersing the carrier containing the plurality of substrates in the processing liquid.
 (4)基板処理装置は、複数の基板を搬入可能かつ複数の基板を搬出可能に構成された基板搬入搬出部をさらに備え、処理ブロックは、平面視で基板入口と基板出口とが第1の方向に隣り合うように構成され、基板搬入搬出部は、第1のオープナ、第2のオープナ、第1の基板受渡部および第2の基板受渡部を含み、平面視で処理ブロックの基板入口および基板出口に接するようにかつ平面視で処理ブロックに対して第1の方向に交差する第2の方向に隣り合うように設けられてもよい。 (4) The substrate processing apparatus further includes a substrate loading/unloading section configured to be able to carry in a plurality of substrates and carry out a plurality of substrates, and the processing block has a substrate inlet and a substrate outlet that are connected to each other in a plan view. The substrate loading/unloading section includes a first opener, a second opener, a first substrate transfer section, and a second substrate transfer section, and is configured to be adjacent to each other in the substrate entrance and the processing block in a plan view. It may be provided so as to be in contact with the substrate outlet and adjacent to the processing block in a second direction intersecting the first direction in plan view.
 この場合、基板処理装置において、複数の基板の搬入位置と複数の基板の搬出位置とを大きく離間させる必要がない。したがって、基板処理装置の外部において、基板処理装置に対する複数の基板の搬入経路と、基板処理装置に対する複数の基板の搬出経路とを共通化しやすい。 In this case, in the substrate processing apparatus, there is no need to make a large distance between the loading position of the plurality of substrates and the carrying-out position of the plurality of substrates. Therefore, outside the substrate processing apparatus, it is easy to make the carrying-in route of a plurality of substrates into the substrate processing apparatus and the carrying-out route of a plurality of substrates with respect to the substrate processing apparatus common.
 (5)基板搬入搬出部は、第1の基板容器および第2の基板容器を含む複数の基板容器を保持可能な複数の基板容器載置部と、複数の基板容器載置部と第1のオープナとの間、および複数の基板容器載置部と第2のオープナとの間で複数の基板容器を搬送可能に構成された基板容器搬送装置とを備えてもよい。 (5) The substrate loading/unloading section includes a plurality of substrate container mounting sections capable of holding a plurality of substrate containers including a first substrate container and a second substrate container, a plurality of substrate container mounting sections and a first substrate container mounting section. A substrate container transport device configured to be able to transport a plurality of substrate containers between the opener and between the plurality of substrate container mounting sections and the second opener may be provided.
 この場合、基板搬入搬出部においては、複数の基板容器載置部に複数の基板容器を載置することができる。複数の基板容器載置部に載置される基板容器は、基板容器搬送装置により第1のオープナまたは第2のオープナに搬送可能である。あるいは、第1のオープナまたは第2のオープナに支持される基板容器は、基板容器搬送装置により複数の基板容器載置部に搬送可能である。それにより、第1のオープナにおける基板容器の交換動作および第2のオープナにおける基板容器の交換動作によらず、基板処理装置における複数の基板容器の搬入および搬出を継続することが可能になる。 In this case, in the substrate loading/unloading section, a plurality of substrate containers can be placed on a plurality of substrate container mounting sections. The substrate containers placed on the plurality of substrate container mounting sections can be transported to the first opener or the second opener by the substrate container transport device. Alternatively, the substrate container supported by the first opener or the second opener can be transported to a plurality of substrate container mounting sections by the substrate container transport device. Thereby, it becomes possible to continue carrying in and out a plurality of substrate containers in the substrate processing apparatus, regardless of the substrate container exchanging operation in the first opener and the substrate container exchanging operation in the second opener.
 本発明によれば、基板の搬入動作および搬出動作に起因する基板処理のスループットの低下を抑制することが可能となる。 According to the present invention, it is possible to suppress a decrease in the throughput of substrate processing caused by the loading and unloading operations of the substrate.
図1は本発明の一実施の形態に係る基板処理装置の基本構成を示す模式的平面図である。FIG. 1 is a schematic plan view showing the basic configuration of a substrate processing apparatus according to an embodiment of the present invention. 図2は図1のA-A線における基板処理装置の模式的断面図である。FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus taken along line AA in FIG. 図3は図1の基板処理装置において用いられるキャリアの平面図である。FIG. 3 is a plan view of a carrier used in the substrate processing apparatus of FIG. 1. 図4は図3のキャリアの一方側面図である。FIG. 4 is a side view of the carrier of FIG. 3. 図5は図4のB-B線におけるキャリアの断面図である。FIG. 5 is a cross-sectional view of the carrier taken along line BB in FIG. 4. 図6は図1の基板処理装置における複数の基板およびキャリアの搬送経路を説明するための図である。FIG. 6 is a diagram for explaining transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 図7は図1の基板処理装置における複数の基板およびキャリアの搬送経路を説明するための図である。FIG. 7 is a diagram for explaining transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1. 図8は図1の基板処理装置における複数の基板およびキャリアの搬送経路を説明するための図である。FIG. 8 is a diagram for explaining transport paths of a plurality of substrates and carriers in the substrate processing apparatus of FIG. 1.
 以下、本発明の一実施の形態に係る基板処理装置について図面を参照しつつ説明する。以下の説明において、基板とは、液晶表示装置または有機EL(Electro Luminescence)表示装置等に用いられるFPD(Flat Panel Display)用基板、半導体基板、光ディスク用基板、磁気ディスク用基板、光磁気ディスク用基板、フォトマスク用基板、セラミック基板または太陽電池用基板等をいう。また、以下に説明する基板は、平面視で矩形状を有する。 Hereinafter, a substrate processing apparatus according to an embodiment of the present invention will be described with reference to the drawings. In the following description, substrates include FPD (Flat Panel Display) substrates used in liquid crystal display devices or organic EL (Electro Luminescence) display devices, semiconductor substrates, optical disk substrates, magnetic disk substrates, and magneto-optical disks. Refers to substrates, photomask substrates, ceramic substrates, solar cell substrates, etc. Further, the substrate described below has a rectangular shape in plan view.
 <1>基板処理装置の構成
 (1)全体構成および方向の定義
 図1は、本発明の一実施の形態に係る基板処理装置の基本構成を示す模式的平面図である。図2は、図1のA-A線における基板処理装置1の模式的断面図である。図1および図2に示すように、基板処理装置1は、主として基板搬入搬出ブロック100、中継ブロック200、処理ブロック300および洗浄ブロック400を備える。
<1> Configuration of Substrate Processing Apparatus (1) Definition of Overall Configuration and Direction FIG. 1 is a schematic plan view showing the basic configuration of a substrate processing apparatus according to an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing apparatus 1 taken along line AA in FIG. As shown in FIGS. 1 and 2, the substrate processing apparatus 1 mainly includes a substrate loading/unloading block 100, a relay block 200, a processing block 300, and a cleaning block 400.
 ここで、図1および図2以降の所定の図には、基板処理装置1の各構成要素の位置関係を明確にするために、互いに直交するX方向、Y方向およびZ方向を示す矢印を付している。X方向およびY方向は水平面内で互いに直交し、Z方向は鉛直方向に相当する。また、各方向において矢印が向かう方向を+方向とし、その+方向とは反対の方向を-方向とする。以下の説明においては、単にX方向と呼ぶ場合、そのX方向は、+X方向および-X方向を含むものとする。また、単にY方向と呼ぶ場合、そのY方向は、+Y方向および-Y方向を含むものとする。また、単にZ方向と呼ぶ場合、そのZ方向は、+Z方向および-Z方向を含むものとする。 Here, in order to clarify the positional relationship of each component of the substrate processing apparatus 1, arrows indicating the X direction, Y direction, and Z direction, which are orthogonal to each other, are added to the predetermined figures after FIG. 1 and FIG. 2. are doing. The X direction and the Y direction are orthogonal to each other in the horizontal plane, and the Z direction corresponds to the vertical direction. Further, in each direction, the direction in which the arrow heads is defined as a + direction, and the direction opposite to the + direction is defined as a - direction. In the following description, when simply referred to as the X direction, the X direction includes the +X direction and the −X direction. Furthermore, when simply referred to as the Y direction, the Y direction includes the +Y direction and the −Y direction. Furthermore, when simply referred to as the Z direction, the Z direction includes the +Z direction and the -Z direction.
 (2)基板搬入搬出ブロック100
 基板搬入搬出ブロック100は、複数のフープ棚110、フープ搬送装置111,112、オープナ120,130、基板受渡ロボット140,150、2個のフープ載置部190および制御部160(図2)を含む。また、基板搬入搬出ブロック100は、基板処理装置1の外壁の一部を構成する端面部101、一方側面部102および他方側面部103を有する。端面部101は、-X方向を向く基板処理装置1の一端部に位置し、X方向に直交する。一方側面部102および他方側面部103は、Y方向において互いに対向するように、平面視で端面部101の両端部から+X方向に平行に延びている。
(2) Board loading/unloading block 100
The substrate loading/unloading block 100 includes a plurality of hoop shelves 110, hoop transport devices 111, 112, openers 120, 130, substrate delivery robots 140, 150, two hoop placement units 190, and a control unit 160 (FIG. 2). . Further, the substrate loading/unloading block 100 has an end surface portion 101, one side surface portion 102, and the other side surface portion 103, which constitute a part of the outer wall of the substrate processing apparatus 1. The end surface section 101 is located at one end of the substrate processing apparatus 1 facing the -X direction, and is orthogonal to the X direction. The one side surface portion 102 and the other side surface portion 103 extend parallel to the +X direction from both ends of the end surface portion 101 in a plan view so as to face each other in the Y direction.
 2個のフープ載置部190は、端面部101から-X方向に突出するように設けられている。各フープ載置部190は、複数の基板を多段に収容するフープ(FOUP:Front Opening Unified Pod)8を載置可能に構成されている。端面部101においては、各フープ載置部190に対応する部分に、フープ8をX方向に通過させるための図示しない通路開口部が形成されている。 The two hoop placement parts 190 are provided so as to protrude from the end face part 101 in the -X direction. Each hoop placement section 190 is configured to be able to place a FOUP (Front Opening Unified Pod) 8 that accommodates a plurality of substrates in multiple stages. In the end surface portion 101, passage openings (not shown) for allowing the hoop 8 to pass in the X direction are formed in portions corresponding to the respective hoop placement portions 190.
 フープ8には、そのフープ8の内部空間から基板を取り出すため、およびそのフープ8の内部空間に基板を挿入するための開口部が形成されている。また、フープ8は、その開口部を開閉するための蓋を含む。フープ8の開口部は、フープ8の搬送時および待機時に閉塞され、フープ8に対する基板の取り出し時および挿入時に開放される。図1および図2では、フープ8と後述するキャリア9とが明確に区別できるように、フープ8にハッチングが付され、キャリア9にドットパターンが付されている。図1の例では、Y方向に並ぶ2個のフープ載置部190のうち一方のフープ載置部190にフープ8が載置され、他方のフープ載置部190にフープ8が載置されていない。 The hoop 8 is formed with openings for taking out the substrate from the internal space of the hoop 8 and for inserting the substrate into the internal space of the hoop 8. Further, the hoop 8 includes a lid for opening and closing its opening. The opening of the hoop 8 is closed when the hoop 8 is transported and on standby, and is opened when the substrate is taken out and inserted into the hoop 8. In FIGS. 1 and 2, the hoop 8 is hatched and the carrier 9 is marked with a dot pattern so that the hoop 8 and a carrier 9, which will be described later, can be clearly distinguished. In the example of FIG. 1, the hoop 8 is placed on one of the two hoop placement sections 190 lined up in the Y direction, and the hoop 8 is placed on the other hoop placement section 190. do not have.
 複数のフープ棚110は、端面部101から+X方向に所定距離離間した位置で、互いに離間するように設けられている。本例では、16個のフープ棚110が、Z方向およびY方向に平行な面内で4行4列で並ぶように、図示しない固定部材により固定されている。各フープ棚110は、フープ8を載置可能に構成されている。図1の例では、最上段に位置する4個のフープ棚110のうち3個のフープ棚110の各々にフープ8が載置され、残りの1個のフープ棚110にフープ8が載置されていない。フープ8の数やフープ棚110の配列は、装置設計仕様に応じて適宜変更してもよい。 The plurality of hoop shelves 110 are provided at positions spaced apart from each other by a predetermined distance in the +X direction from the end surface portion 101. In this example, 16 hoop shelves 110 are fixed by fixing members (not shown) so that they are lined up in 4 rows and 4 columns in a plane parallel to the Z direction and the Y direction. Each hoop shelf 110 is configured such that a hoop 8 can be placed thereon. In the example of FIG. 1, the hoop 8 is placed on each of the three hoop shelves 110 among the four hoop shelves 110 located at the top, and the hoop 8 is placed on the remaining one hoop shelf 110. Not yet. The number of hoops 8 and the arrangement of hoop shelves 110 may be changed as appropriate depending on the device design specifications.
 2つのオープナ120,130は、複数のフープ棚110から+X方向に所定距離離間した位置で、互いに離間するように設けられている。本例では、2つのオープナ120,130が、Y方向に並ぶように、図示しない固定部材により固定されている。一方のオープナ120は一方側面部102の近傍に位置し、他方のオープナ130は他方側面部103の近傍に位置する。各オープナ120,130は、フープ8を載置可能かつ載置されたフープ8の蓋を開閉可能に構成されている。図1の例では、一方のオープナ120にフープ8が載置され、他方のオープナ130にフープ8が載置されていない。 The two openers 120 and 130 are provided at positions separated from each other by a predetermined distance in the +X direction from the plurality of hoop shelves 110. In this example, two openers 120 and 130 are fixed by a fixing member (not shown) so as to be lined up in the Y direction. One opener 120 is located near one side 102 , and the other opener 130 is located near the other side 103 . Each opener 120, 130 is configured to be able to place the hoop 8 thereon and open/close the lid of the hoop 8 placed thereon. In the example of FIG. 1, the hoop 8 is placed on one opener 120, and no hoop 8 is placed on the other opener 130.
 基板受渡ロボット140は、+X方向においてオープナ120に隣り合うように設けられている。基板受渡ロボット140は、Z方向の軸の周りで回転可能かつZ方向に移動可能(昇降可能)に構成されている。基板受渡ロボット140には、1または複数の基板を受け渡すためのハンドが設けられている。ハンドは、多関節型アームにより支持され、水平方向に進退可能となっている。基板受渡ロボット140は、未処理の基板が収容されたフープ8がオープナ120に載置された状態で、そのフープ8から基板を取り出し、取り出した基板を中継ブロック200内に配置された後述するキャリア9内に挿入するために用いられる。 The substrate transfer robot 140 is provided adjacent to the opener 120 in the +X direction. The substrate transfer robot 140 is configured to be rotatable around an axis in the Z direction and movable in the Z direction (capable of moving up and down). The substrate transfer robot 140 is provided with a hand for transferring one or more substrates. The hand is supported by an articulated arm and can move forward and backward in the horizontal direction. The substrate delivery robot 140 takes out the substrate from the hoop 8 with the hoop 8 containing unprocessed substrates placed on the opener 120, and transfers the taken out substrate to a carrier, which will be described later, arranged in the relay block 200. Used for insertion into 9.
 基板受渡ロボット150は、+X方向においてオープナ130に隣り合うように設けられている。基板受渡ロボット150は、基板受渡ロボット140と同じ構成を有する。基板受渡ロボット150は、空のフープ8がオープナ130に載置された状態で、中継ブロック200内に配置された後述するキャリア9から基板を取り出し、取り出した基板をオープナ130上のフープ8内に挿入するために用いられる。 The substrate transfer robot 150 is provided adjacent to the opener 130 in the +X direction. The substrate transfer robot 150 has the same configuration as the substrate transfer robot 140. With the empty hoop 8 placed on the opener 130, the substrate delivery robot 150 takes out the substrate from a carrier 9, which will be described later, placed in the relay block 200, and places the taken out substrate into the hoop 8 on the opener 130. Used for insertion.
 フープ搬送装置111は、X方向における端面部101と複数のフープ棚110との間に位置する。フープ搬送装置111は、フープ8を把持可能に構成された図示しない把持部を有し、その把持部をY方向に移動させることおよびZ方向に移動させることが可能に構成されている。これにより、フープ搬送装置111は、2つのフープ載置部190のいずれかと、複数のフープ棚110のいずれかとの間でフープ8を搬送する。 The hoop conveyance device 111 is located between the end surface portion 101 and the plurality of hoop shelves 110 in the X direction. The hoop conveying device 111 has a gripping part (not shown) configured to be able to grip the hoop 8, and is configured to be able to move the gripping part in the Y direction and in the Z direction. Thereby, the hoop transport device 111 transports the hoop 8 between one of the two hoop placement sections 190 and one of the plurality of hoop shelves 110.
 フープ搬送装置112は、X方向における複数のフープ棚110と2つのオープナ120,130との間に位置する。フープ搬送装置112は、フープ搬送装置111と同じ構成を有する。フープ搬送装置112は、複数のフープ棚110のいずれかと、2つのオープナ120,130のいずれかとの間でフープ8を搬送する。 The hoop transport device 112 is located between the multiple hoop shelves 110 and the two openers 120 and 130 in the X direction. The hoop transport device 112 has the same configuration as the hoop transport device 111. The hoop transport device 112 transports the hoop 8 between one of the plurality of hoop shelves 110 and one of the two openers 120 and 130.
 制御部160(図2)は、CPU(中央演算処理装置)、ROM(リードオンリメモリ)およびRAM(ランダムアクセスメモリ)を含むコンピュータ等からなり、基板処理装置1内の各構成要素の動作を制御する。 The control unit 160 (FIG. 2) is composed of a computer including a CPU (central processing unit), ROM (read only memory), and RAM (random access memory), and controls the operation of each component in the substrate processing apparatus 1. do.
 (3)中継ブロック200
 中継ブロック200は、主として2個のキャリア支持部210,220、第1待機部230、第2待機部240および待機搬送装置250を備える。キャリア支持部210は、+X方向において基板搬入搬出ブロック100の基板受渡ロボット140に隣り合うように設けられている。また、キャリア支持部210は、複数の基板を多段に収容するキャリア9を支持可能に構成されている。キャリア9の詳細は後述する。さらに、キャリア支持部210は、キャリア9を支持するとともに、支持されたキャリア9の姿勢を変更可能に構成されている。キャリア9の姿勢を変更するためのキャリア支持部210の構成の詳細については後述する。なお、図1の例では、キャリア支持部210上にキャリア9が支持されている。
(3) Relay block 200
The relay block 200 mainly includes two carrier support sections 210 and 220, a first standby section 230, a second standby section 240, and a standby transport device 250. The carrier support section 210 is provided adjacent to the substrate transfer robot 140 of the substrate loading/unloading block 100 in the +X direction. Further, the carrier support section 210 is configured to be able to support the carrier 9 that accommodates a plurality of substrates in multiple stages. Details of the carrier 9 will be described later. Further, the carrier support section 210 is configured to support the carrier 9 and to change the attitude of the supported carrier 9. Details of the configuration of the carrier support section 210 for changing the attitude of the carrier 9 will be described later. Note that in the example of FIG. 1, the carrier 9 is supported on the carrier support section 210.
 キャリア支持部220は、+X方向において基板搬入搬出ブロック100の基板受渡ロボット150に隣り合うように設けられている。また、キャリア支持部220は、キャリア支持部210と同じ構成を有する。なお、図1の例では、キャリア支持部220上にキャリア9は支持されていない。 The carrier support section 220 is provided adjacent to the substrate transfer robot 150 of the substrate loading/unloading block 100 in the +X direction. Further, the carrier support section 220 has the same configuration as the carrier support section 210. In addition, in the example of FIG. 1, the carrier 9 is not supported on the carrier support part 220.
 第1待機部230は、+X方向においてキャリア支持部210に隣り合うように設けられている。また、第1待機部230は、キャリア9を支持可能に構成されている。さらに、第1待機部230は、当該第1待機部230に支持されるキャリア9をキャリア支持部210に渡すこと、およびキャリア支持部210に支持されるキャリア9をキャリア支持部210から受け取ることが可能に構成されている。 The first standby section 230 is provided adjacent to the carrier support section 210 in the +X direction. Further, the first standby section 230 is configured to be able to support the carrier 9. Further, the first standby section 230 can transfer the carrier 9 supported by the first standby section 230 to the carrier support section 210 and receive the carrier 9 supported by the carrier support section 210 from the carrier support section 210. configured to be possible.
 第2待機部240は、+X方向においてキャリア支持部220に隣り合うように設けられている。また、第2待機部240は、キャリア9を支持可能に構成されている。さらに、第2待機部240は、当該第2待機部240に支持されるキャリア9をキャリア支持部220に渡すこと、およびキャリア支持部220に支持されるキャリア9をキャリア支持部220から受け取ることが可能に構成されている。 The second standby section 240 is provided adjacent to the carrier support section 220 in the +X direction. Further, the second standby section 240 is configured to be able to support the carrier 9. Further, the second standby section 240 can transfer the carrier 9 supported by the second standby section 240 to the carrier support section 220 and receive the carrier 9 supported by the carrier support section 220 from the carrier support section 220. configured to be possible.
 待機搬送装置250は、第1待機部230と第2待機部240との間に設けられている。待機搬送装置250は、キャリア9を保持可能かつ第1待機部230と第2待機部240との間でY方向に移動可能に構成されている。待機搬送装置250は、例えば第2待機部240に支持されたキャリア9を第1待機部230に搬送する。 The standby transport device 250 is provided between the first standby section 230 and the second standby section 240. The standby transport device 250 is configured to be able to hold the carrier 9 and to be movable in the Y direction between the first standby section 230 and the second standby section 240. The standby transport device 250 transports the carrier 9 supported by the second standby section 240 to the first standby section 230, for example.
 (4)処理ブロック300
 処理ブロック300は、第1搬送部310、第2搬送部320および処理部330を含む。第1搬送部310および処理部330は、この順で+Y方向に並び、中継ブロック200から+X方向に並列に延びるように設けられている。第2搬送部320は、Y方向に延びるように形成され、第1搬送部310の+X方向を向く端部と、処理部330の+X方向を向く端部とをつないでいる。
(4) Processing block 300
The processing block 300 includes a first transport section 310, a second transport section 320, and a processing section 330. The first transport section 310 and the processing section 330 are arranged in this order in the +Y direction and are provided so as to extend in parallel from the relay block 200 in the +X direction. The second transport section 320 is formed to extend in the Y direction, and connects the end of the first transport section 310 facing the +X direction and the end of the processing section 330 facing the +X direction.
 以下の説明では、X方向に延びる第1搬送部310の両端部のうち-X方向を向く一方の端部を適宜第1の端部TA1と呼び、+X方向を向く他方の端部を適宜第2の端部TA2と呼ぶ。また、X方向に延びる処理部330の両端部のうち-X方向を向く一方の端部を適宜第3の端部TA3と呼び、+X方向を向く他方の端部を適宜第4の端部TA4と呼ぶ。 In the following description, among both ends of the first conveyance section 310 extending in the X direction, one end facing the -X direction will be appropriately referred to as a first end TA1, and the other end facing the + 2 is called the end TA2. Further, among both ends of the processing section 330 extending in the X direction, one end facing the -X direction is appropriately referred to as a third end TA3, and the other end facing the +X direction is appropriately referred to as a fourth end TA4. It is called.
 第1搬送部310は、主搬送装置311および2つの副搬送装置312A,312Bを含む。主搬送装置311は、可動ステージ311aおよびガイドレール311bを含む。ガイドレール311bは、第1搬送部310の第1の端部TA1から第2の端部TA2に延びように設けられている。可動ステージ311aは、ガイドレール311b上でX方向に移動可能かつキャリア9を載置可能に構成されている。主搬送装置311は、ガイドレール311b上で可動ステージ311aをX方向に移動させる図示しない駆動機構をさらに備える。それにより、主搬送装置311は、中継ブロック200に近接する第1の端部TA1で可動ステージ311aにキャリア9が載置された場合に、載置されたキャリア9を第2搬送部320に近接する第2の端部TA2まで+X方向に搬送する。 The first transport unit 310 includes a main transport device 311 and two sub-transport devices 312A and 312B. The main transport device 311 includes a movable stage 311a and a guide rail 311b. The guide rail 311b is provided to extend from the first end TA1 of the first transport section 310 to the second end TA2. The movable stage 311a is configured to be movable in the X direction on the guide rail 311b and to be able to place the carrier 9 thereon. The main transport device 311 further includes a drive mechanism (not shown) that moves the movable stage 311a in the X direction on the guide rail 311b. Thereby, when the carrier 9 is placed on the movable stage 311a at the first end TA1 close to the relay block 200, the main conveyance device 311 moves the placed carrier 9 close to the second conveyance section 320. It is transported in the +X direction to the second end TA2.
 副搬送装置312Aおよび副搬送装置312Bは、X方向における第1搬送部310の第1の端部TA1および第2の端部TA2にそれぞれ設けられる。副搬送装置312Aは、キャリア支持部210に未処理の基板を収容するキャリア9が支持された場合に、当該キャリア9を第1の端部TA1に配置された主搬送装置311の可動ステージ311a上に載置する。また、副搬送装置312Aは、第1待機部230からキャリア支持部210へと空のキャリア9を搬送する。一方、副搬送装置312Bは、キャリア9が載置された可動ステージ311aが第2の端部TA2まで移動した場合に、当該キャリア9を第2搬送部320の後述する搬送装置321に渡す。 The sub-transport device 312A and the sub-transport device 312B are provided at the first end TA1 and the second end TA2 of the first transport section 310 in the X direction, respectively. When the carrier 9 that accommodates an unprocessed substrate is supported by the carrier support section 210, the sub-transfer device 312A moves the carrier 9 onto the movable stage 311a of the main transfer device 311 disposed at the first end TA1. Place it on. Further, the sub-transport device 312A transports the empty carrier 9 from the first standby section 230 to the carrier support section 210. On the other hand, when the movable stage 311a on which the carrier 9 is placed moves to the second end TA2, the sub-transport device 312B transfers the carrier 9 to a transport device 321 of the second transport unit 320, which will be described later.
 ここで、図2に示すように、第1搬送部310は、基板処理装置1の設置面から+Z方向(上方)に離間した位置に設けられる。それにより、第1搬送部310の-Z方向(下方)に位置する空間は、後述する処理部330をメンテナンスするためのメンテナンス空間MS1として利用可能となる。そのため、本実施の形態に係る基板処理装置1においては、図1に示すように、平面視で第1搬送部310が処理部330のメンテナンス空間MS1に重なる。後述する図8では、メンテナンス空間MS1において、第1搬送部310の下方で処理部330に対するメンテナンス作業を行う作業者WPが示される。 Here, as shown in FIG. 2, the first transport section 310 is provided at a position spaced apart from the installation surface of the substrate processing apparatus 1 in the +Z direction (upward). As a result, the space located in the -Z direction (below) of the first transport section 310 can be used as a maintenance space MS1 for maintaining the processing section 330, which will be described later. Therefore, in the substrate processing apparatus 1 according to the present embodiment, as shown in FIG. 1, the first transport section 310 overlaps the maintenance space MS1 of the processing section 330 in plan view. In FIG. 8, which will be described later, a worker WP is shown who performs maintenance work on the processing section 330 below the first transport section 310 in the maintenance space MS1.
 第2搬送部320は、搬送装置321を含む。搬送装置321は、キャリア9を支持するとともに、支持されたキャリア9の姿勢を変更可能に構成されている。キャリア9の姿勢を変更するための搬送装置321の構成の詳細については後述する。さらに、搬送装置321は、Y方向に移動可能に構成されている。これにより、第2搬送部320は、第1搬送部310の第2の端部TA2近傍で副搬送装置312Bからキャリア9を受け取ることができる。また、第2搬送部320は、副搬送装置312Bから受け取ったキャリア9の姿勢を変更し、当該キャリア9を処理部330の第4の端部TA4近傍の位置まで移動させることができる。 The second transport section 320 includes a transport device 321. The transport device 321 is configured to support the carrier 9 and to change the attitude of the supported carrier 9. Details of the configuration of the transport device 321 for changing the attitude of the carrier 9 will be described later. Furthermore, the transport device 321 is configured to be movable in the Y direction. Thereby, the second transport section 320 can receive the carrier 9 from the sub-transport device 312B near the second end TA2 of the first transport section 310. Further, the second transport section 320 can change the attitude of the carrier 9 received from the sub-transport device 312B, and move the carrier 9 to a position near the fourth end TA4 of the processing section 330.
 処理部330は、複数(本例では5個)の液処理ユニット331、乾燥ユニット332および(本例では3個)複数の主搬送装置333A,333B,333Cを含む。複数の液処理ユニット331および乾燥ユニット332は、乾燥ユニット332が第3の端部TA3に位置するようにX方向に並んでいる。 The processing section 330 includes a plurality of (five in this example) liquid processing units 331, a drying unit 332, and a plurality of (three in this example) main transport devices 333A, 333B, and 333C. The plurality of liquid processing units 331 and drying units 332 are arranged in the X direction such that the drying unit 332 is located at the third end TA3.
 複数の主搬送装置333A,333B,333Cは、この順で第3の端部TA3から第4の端部TA4に向かって+X方向に延びる一の直線上に並ぶように設けられている。各主搬送装置333A,333B,333Cは、キャリア9を保持可能に構成されるとともに、保持されたキャリア9を複数の液処理ユニット331および乾燥ユニット332間で搬送することが可能に構成されている。中継ブロック200から最も遠い位置にある主搬送装置333Cは、第2搬送部320において処理部330の近傍にキャリア9が搬送される場合に、当該キャリア9を受け取る。また、主搬送装置333Cは、受け取ったキャリア9を複数の液処理ユニット331のいずれかに搬送する。 The plurality of main transport devices 333A, 333B, and 333C are arranged in this order on a straight line extending in the +X direction from the third end TA3 toward the fourth end TA4. Each of the main transport devices 333A, 333B, and 333C is configured to be able to hold the carrier 9, and is also configured to be able to transport the held carrier 9 between the plurality of liquid processing units 331 and drying units 332. . The main transport device 333C located farthest from the relay block 200 receives the carrier 9 when the second transport unit 320 transports the carrier 9 near the processing unit 330. Further, the main transport device 333C transports the received carrier 9 to any one of the plurality of liquid processing units 331.
 複数の液処理ユニット331の各々は、1または複数の処理槽331aおよびリフタ331bを備える。本例の各液処理ユニット331は、2つの処理槽331aを備える。各処理槽331aは、当該処理槽331aの上方の位置からキャリア9を挿入および取り出し可能に構成されている。また、処理槽331aには、キャリア9に収容される複数の基板を洗浄するための処理液(薬液またはリンス液)が貯留されている。 Each of the plurality of liquid processing units 331 includes one or more processing tanks 331a and lifters 331b. Each liquid processing unit 331 in this example includes two processing tanks 331a. Each processing tank 331a is configured such that the carrier 9 can be inserted into and taken out from a position above the processing tank 331a. Further, a processing liquid (chemical liquid or rinsing liquid) for cleaning a plurality of substrates accommodated in the carrier 9 is stored in the processing tank 331a.
 各液処理ユニット331のリフタ331bは、キャリア9を保持可能に構成されている。また、リフタ331bは、複数の主搬送装置333A,333B,333Cのいずれかからキャリア9を受け取ること、および複数の主搬送装置333A,333B,333Cのいずれかにキャリア9を渡すことが可能に構成されている。さらに、リフタ331bは、当該液処理ユニット331の2つの処理槽331aの各々について、処理液へのキャリア9の浸漬、および処理液からのキャリア9の引き上げが可能に構成されている。これにより、未処理の基板が収容されたキャリア9が処理部330に渡されることにより、当該キャリア9に収容された複数の基板が1または複数の処理液に所定時間浸漬され、複数の基板に共通の処理が行われる。 The lifter 331b of each liquid processing unit 331 is configured to be able to hold the carrier 9. Further, the lifter 331b is configured to be able to receive the carrier 9 from any of the plurality of main transport devices 333A, 333B, 333C, and to pass the carrier 9 to any of the plurality of main transport devices 333A, 333B, 333C. has been done. Further, the lifter 331b is configured to be capable of immersing the carrier 9 in the processing liquid and lifting the carrier 9 from the processing liquid for each of the two processing tanks 331a of the liquid processing unit 331. As a result, the carrier 9 containing unprocessed substrates is passed to the processing section 330, and the plurality of substrates accommodated in the carrier 9 are immersed in one or more processing liquids for a predetermined period of time. Common processing is performed.
 乾燥ユニット332は、中継ブロック200から最も近い位置にある主搬送装置333Aにより搬送されるキャリア9に乾燥処理を行う。この乾燥処理により、キャリア9内に収容された複数の基板が乾燥する。乾燥処理後のキャリア9は、中継ブロック200から最も近い位置にある主搬送装置333Aにより中継ブロック200の第2待機部240に渡される。 The drying unit 332 performs a drying process on the carrier 9 transported by the main transport device 333A located closest to the relay block 200. Through this drying process, the plurality of substrates housed in the carrier 9 are dried. The carrier 9 after the drying process is transferred to the second standby section 240 of the relay block 200 by the main conveyance device 333A located closest to the relay block 200.
 ここで、複数の液処理ユニット331の複数の処理槽331aには、基板に行われるべき複数の処理にそれぞれ対応する複数の処理液が、基板に行われるべき処理の順で-X方向に並ぶように貯留される。図2の制御部160は、主搬送装置333A,333B,333Cの各々に対して、キャリア9を保持する状態で-X方向に移動することを許容し、キャリア9を保持する状態で+X方向に移動することを制限する。この場合、複数のキャリア9が複数の主搬送装置333A,333B,333Cにより搬送される際に、一のキャリア9と他のキャリア9とが互いに逆方向に移動することによる干渉の発生が抑制される。また、キャリア9が処理部330内でX方向に往復移動しないので、処理部330におけるキャリア9の搬送経路の長さが、処理部330のX方向の長さを超えない。 Here, in the plurality of processing tanks 331a of the plurality of liquid processing units 331, a plurality of processing liquids respectively corresponding to a plurality of treatments to be performed on the substrate are arranged in the -X direction in the order of the processing to be performed on the substrate. It is stored as follows. The control unit 160 in FIG. 2 allows each of the main transport devices 333A, 333B, and 333C to move in the -X direction while holding the carrier 9, and allows the main transport devices 333A, 333B, and 333C to move in the +X direction while holding the carrier 9. Limit movement. In this case, when a plurality of carriers 9 are transported by a plurality of main transport devices 333A, 333B, 333C, interference caused by one carrier 9 and another carrier 9 moving in mutually opposite directions is suppressed. Ru. Further, since the carrier 9 does not reciprocate in the X direction within the processing section 330, the length of the transport path of the carrier 9 in the processing section 330 does not exceed the length of the processing section 330 in the X direction.
 図1に点線で示すように、処理ブロック300およびその近傍の領域においては、上記のメンテナンス空間MS1に加えて、処理部330の+Y方向側にさらなるメンテナンス空間MS2が形成されている。このように、Y方向において処理部330を挟み込むように2つのメンテナンス空間MS1,MS2が形成されることにより、処理部330に対する十分な大きさのメンテナンス空間が確保されている。 As shown by the dotted line in FIG. 1, in the processing block 300 and its vicinity, in addition to the maintenance space MS1 described above, a further maintenance space MS2 is formed on the +Y direction side of the processing section 330. In this way, by forming the two maintenance spaces MS1 and MS2 so as to sandwich the processing section 330 in the Y direction, a sufficiently large maintenance space for the processing section 330 is ensured.
 (5)洗浄ブロック400
 洗浄ブロック400は、洗浄搬送装置410およびキャリア洗浄ユニット420を含む。キャリア洗浄ユニット420は、基板搬入搬出ブロック100および中継ブロック200の側方(+Y方向)の位置でX方向に延びるように設けられている。また、キャリア洗浄ユニット420は、X方向に並ぶように設けられた複数のキャリア洗浄槽421、キャリア乾燥部422および複数のキャリア待機部423を含む。
(5) Cleaning block 400
The cleaning block 400 includes a cleaning conveyance device 410 and a carrier cleaning unit 420. The carrier cleaning unit 420 is provided so as to extend in the X direction at a position to the side (+Y direction) of the substrate loading/unloading block 100 and the relay block 200. Further, the carrier cleaning unit 420 includes a plurality of carrier cleaning tanks 421, a carrier drying section 422, and a plurality of carrier waiting sections 423 arranged in the X direction.
 複数のキャリア洗浄槽421、キャリア乾燥部422および複数のキャリア待機部423の各々は、当該、槽、乾燥部または待機部の上方の位置からキャリア9を挿入および取り出し可能に構成されている。また、複数のキャリア洗浄槽421の各々には、キャリア9を洗浄するための処理液(薬液またはリンス液)が貯留されている。キャリア乾燥部422は、挿入されたキャリア9に乾燥処理を行う。 Each of the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier waiting sections 423 is configured such that the carrier 9 can be inserted and taken out from a position above the tank, drying section, or waiting section. Further, each of the plurality of carrier cleaning tanks 421 stores a processing liquid (chemical liquid or rinsing liquid) for cleaning the carrier 9. The carrier drying section 422 performs a drying process on the inserted carrier 9.
 洗浄搬送装置410は、空のキャリア9を、中継ブロック200の第2待機部240、複数のキャリア洗浄槽421、キャリア乾燥部422および複数のキャリア待機部423の間で搬送可能に構成されている。洗浄ブロック400においては、空のキャリア9が複数のキャリア洗浄槽421間で搬送され、いずれかのキャリア洗浄槽421に貯留された処理液に浸漬される。それにより、処理ブロック300において複数の基板の処理に用いられた後の空のキャリア9が洗浄される。 The cleaning conveyance device 410 is configured to be able to convey empty carriers 9 between the second standby section 240 of the relay block 200, the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier standby sections 423. . In the cleaning block 400, an empty carrier 9 is transported between a plurality of carrier cleaning tanks 421 and immersed in a processing liquid stored in one of the carrier cleaning tanks 421. As a result, the empty carrier 9 that has been used to process a plurality of substrates in the processing block 300 is cleaned.
 洗浄後のキャリア9は、キャリア乾燥部422に搬送され、乾燥処理が行われる。乾燥後のキャリア9は、キャリア待機部423に搬送され、保持される。その後、中継ブロック200における複数の基板の受け入れのタイミングに応じて洗浄搬送装置410によりキャリア待機部423から取り出され、中継ブロック200の第2待機部240に搬送される。 The carrier 9 after cleaning is transported to the carrier drying section 422 and subjected to a drying process. The dried carrier 9 is transported to the carrier standby section 423 and held there. Thereafter, in accordance with the timing of receiving a plurality of substrates in the relay block 200, the carrier is taken out from the carrier standby section 423 by the cleaning conveyance device 410 and conveyed to the second standby section 240 of the relay block 200.
 <2>キャリア9の構成およびキャリア9の姿勢
 図3は図1の基板処理装置1において用いられるキャリア9の平面図であり、図4は図3のキャリア9の一方側面図であり、図5は図4のB-B線におけるキャリア9の断面図である。図3~図5に示すように、キャリア9は、4つのフレーム部材10a,10b,10c,10dを含む。
<2> Configuration of carrier 9 and attitude of carrier 9 FIG. 3 is a plan view of the carrier 9 used in the substrate processing apparatus 1 of FIG. 1, FIG. 4 is a side view of the carrier 9 of FIG. 3, and FIG. is a sectional view of the carrier 9 taken along the line BB in FIG. 4. As shown in FIGS. 3 to 5, carrier 9 includes four frame members 10a, 10b, 10c, and 10d.
 フレーム部材10a,10bの各々は、略正方形の板状部材で形成され、処理対象となる基板よりも大きい外形を有する。フレーム部材10a,10bの各々の中央部分には、4つの開口部13が形成されている。フレーム部材10c,10dの各々は、略長方形の板状部材で形成されている。フレーム部材10c,10dの長辺の長さは、フレーム部材10a,10bの一辺の長さにほぼ等しい。 Each of the frame members 10a and 10b is formed of a substantially square plate-like member, and has an outer shape larger than the substrate to be processed. Four openings 13 are formed in the central portion of each of the frame members 10a, 10b. Each of the frame members 10c and 10d is formed of a substantially rectangular plate-like member. The length of the long side of frame members 10c, 10d is approximately equal to the length of one side of frame members 10a, 10b.
 フレーム部材10a,10bは、互いに対向した状態で離間するように配置されている。フレーム部材10aの一側辺とフレーム部材10bの一側辺とをつなぐようにフレーム部材10cが設けられている。フレーム部材10aの他側辺とフレーム部材10bの他側辺とをつなぐようにフレーム部材10dが設けられている。この状態で、フレーム部材10c,10dも互いに対向配置されている。これにより、キャリア9は角筒形状を有する。 The frame members 10a and 10b are arranged so as to face each other and to be separated from each other. A frame member 10c is provided to connect one side of the frame member 10a and one side of the frame member 10b. A frame member 10d is provided to connect the other side of the frame member 10a and the other side of the frame member 10b. In this state, the frame members 10c and 10d are also arranged to face each other. As a result, the carrier 9 has a rectangular tube shape.
 角筒形状を有するキャリア9の一方の端部に形成される矩形の開口部は、キャリア9内に基板を挿入するため、およびキャリア9から基板を取り出すための基板出入口12として機能する。キャリア9の他方の端部には、フレーム部材10aとフレーム部材10bとの間をつなぐようにかつフレーム部材10cとフレーム部材10dとの間で分散配置されるように、複数(本例では6個)の支持片11が設けられている。 A rectangular opening formed at one end of the carrier 9 having a rectangular tube shape functions as a substrate entrance/exit 12 for inserting a substrate into the carrier 9 and for taking out the substrate from the carrier 9. At the other end of the carrier 9, a plurality of (six in this example) are arranged so as to connect the frame member 10a and the frame member 10b and to be distributed between the frame member 10c and the frame member 10d. ) support pieces 11 are provided.
 各支持片11は、長尺状の板部材で構成され、フレーム部材10c,10dと平行に設けられている。また、各支持片11には、キャリア9に収容される複数の基板の外縁の一部を挿入可能な図示しない複数の溝が予め定められた基準ピッチで形成されている。各支持片11に形成される溝の数は、キャリア9に収容されるべき基板の数に等しい。 Each support piece 11 is composed of a long plate member, and is provided in parallel with the frame members 10c and 10d. Furthermore, each support piece 11 has a plurality of grooves (not shown) formed at a predetermined standard pitch into which parts of the outer edges of a plurality of substrates housed in the carrier 9 can be inserted. The number of grooves formed in each support piece 11 is equal to the number of substrates to be accommodated in the carrier 9.
 フレーム部材10c,10dの互いに対向する2つの面の各々には、複数の突出部prが形成されている。複数の突出部prは、フレーム部材10c,10dの長辺の方向に延びるとともに、短辺の方向に上記の基準ピッチで並ぶように形成されている。これにより、互いに隣り合う各2つの突出部prの間には、基板の外縁を挿入可能な溝が形成されている。 A plurality of protrusions pr are formed on each of the two opposing surfaces of the frame members 10c and 10d. The plurality of protrusions pr extend in the direction of the long sides of the frame members 10c and 10d, and are formed to be lined up in the direction of the short sides at the above-mentioned reference pitch. As a result, a groove into which the outer edge of the substrate can be inserted is formed between each two adjacent protrusions pr.
 上記のように、図1の基板処理装置1においては、適宜キャリア9の姿勢が変更される。ここで、上記の構成を有するキャリア9について、複数の支持片11が下端部に位置しかつフレーム部材10a,10bが鉛直方向に平行に維持される姿勢を鉛直姿勢と呼ぶ。一方、フレーム部材10a,10bが鉛直方向に直交するように維持される姿勢を水平姿勢と呼ぶ。 As described above, in the substrate processing apparatus 1 of FIG. 1, the attitude of the carrier 9 is changed as appropriate. Here, regarding the carrier 9 having the above configuration, a posture in which the plurality of support pieces 11 are located at the lower end and the frame members 10a and 10b are maintained parallel to the vertical direction is referred to as a vertical posture. On the other hand, a posture in which the frame members 10a, 10b are maintained perpendicular to the vertical direction is called a horizontal posture.
 空のキャリア9に複数の基板を挿入する場合には、水平姿勢にあるキャリア9の基板出入口12からキャリア9の内部に複数の基板が挿入される。このとき、各基板の外縁のうち両側部(互いに対向する二辺の部分)がフレーム部材10cの複数の突出部prのうちのいずれか2つの間およびフレーム部材10dの複数の突出部prのうちのいずれか2つの間に挿入される。これにより、複数の基板が収容されたキャリア9が水平姿勢にある場合、各基板は、当該基板の両側部が複数の突出部prにより支持された状態で保持される。一方、複数の基板が収容されたキャリア9が鉛直姿勢にある場合、各基板は、当該基板の下端部の複数の部分が複数の支持片11の複数の溝に嵌め込まれた状態で保持される。 When inserting a plurality of substrates into an empty carrier 9, the plurality of substrates are inserted into the carrier 9 through the substrate entrance/exit 12 of the carrier 9 in a horizontal position. At this time, both sides (two opposing sides) of the outer edge of each board are located between any two of the plurality of protrusions pr of the frame member 10c and among the plurality of protrusions pr of the frame member 10d. inserted between any two. As a result, when the carrier 9 containing a plurality of substrates is in a horizontal position, each substrate is held with both sides of the substrate supported by the plurality of protrusions pr. On the other hand, when the carrier 9 containing a plurality of substrates is in a vertical position, each substrate is held with the plurality of lower end portions of the substrate fitted into the plurality of grooves of the plurality of support pieces 11. .
 上記のように、キャリア9が水平姿勢にある場合、収容される複数の基板の各々は、両側部全体が複数の突出部prにより支持される。一方、キャリア9が鉛直姿勢にある場合、収容される複数の基板の各々は、当該基板の下端部における複数の部分が複数の支持片11により局所的に支持される。そのため、キャリア9が水平姿勢にある場合には、キャリア9が鉛直姿勢にある場合に比べて、収容される各基板の外縁に加わる負荷(各基板の自重による負荷)が低減される。 As described above, when the carrier 9 is in the horizontal position, each of the plurality of accommodated substrates is supported entirely on both sides by the plurality of protrusions pr. On the other hand, when the carrier 9 is in a vertical position, each of the plurality of accommodated substrates is locally supported by the plurality of support pieces 11 at a plurality of portions at the lower end of the substrate. Therefore, when the carrier 9 is in the horizontal position, the load (load due to the weight of each board) applied to the outer edge of each accommodated board is reduced compared to when the carrier 9 is in the vertical position.
 本実施の形態に係るキャリア9は、水平姿勢にある時の当該キャリア9の鉛直方向の寸法(高さ)が鉛直姿勢にある時の当該キャリア9の鉛直方向の寸法(高さ)よりも小さくなるように、形成されている。 In the carrier 9 according to the present embodiment, the vertical dimension (height) of the carrier 9 in the horizontal position is smaller than the vertical dimension (height) of the carrier 9 in the vertical position. It is formed so that
 <3>基板処理装置における複数の基板およびキャリア9の搬送経路
 図6~図8は、図1の基板処理装置1における複数の基板およびキャリア9の搬送経路を説明するための図である。図6には、図1と同様に、基板処理装置1の模式的平面図が示される。図7には、図1の基板処理装置1を一の方向に見た模式的外観斜視図が示される。図8には、図1の基板処理装置1を他の方向に見た模式的外観斜視図が示される。なお、図7および図8では、図1の洗浄ブロック400の図示を省略している。さらに、図6~図8では、図8のメンテナンス空間MS1を除いて、図1のメンテナンス空間MS1,MS2の図示も省略している。
<3> Transport routes for a plurality of substrates and carriers 9 in the substrate processing apparatus FIGS. 6 to 8 are diagrams for explaining transport routes for a plurality of substrates and carriers 9 in the substrate processing apparatus 1 of FIG. 1. Similar to FIG. 1, FIG. 6 shows a schematic plan view of the substrate processing apparatus 1. FIG. 7 shows a schematic external perspective view of the substrate processing apparatus 1 of FIG. 1 when viewed in one direction. FIG. 8 shows a schematic external perspective view of the substrate processing apparatus 1 of FIG. 1 viewed from another direction. Note that in FIGS. 7 and 8, illustration of the cleaning block 400 in FIG. 1 is omitted. Furthermore, in FIGS. 6 to 8, illustrations of the maintenance spaces MS1 and MS2 in FIG. 1 are also omitted, except for the maintenance space MS1 in FIG.
 一のフープ8に収容された未処理の複数の基板Wに一連の処理を行う場合を想定する。この場合、一のフープ8は、基板搬入搬出ブロック100に搬入されることにより、図6に示すように、オープナ120に載置され、蓋が開かれる。また、中継ブロック200のキャリア支持部210上に空のキャリア9が水平姿勢で支持される。このとき、キャリア9の基板出入口12(図5)は、フープ8に対向するように-X方向を向く。この状態で、基板受渡ロボット140により、一のフープ8から未処理の複数の基板Wが取り出され、キャリア9に挿入される。この場合の複数の基板Wの搬送経路が、図6~図8に太い点線の矢印a1で示される。 A case is assumed in which a series of treatments are performed on a plurality of unprocessed substrates W housed in one hoop 8. In this case, one hoop 8 is carried into the substrate loading/unloading block 100, and as shown in FIG. 6, is placed on the opener 120 and the lid is opened. Further, an empty carrier 9 is supported in a horizontal position on the carrier support portion 210 of the relay block 200. At this time, the substrate entrance/exit 12 (FIG. 5) of the carrier 9 faces the −X direction so as to face the hoop 8. In this state, the substrate transfer robot 140 takes out a plurality of unprocessed substrates W from one hoop 8 and inserts them into the carrier 9. The transport paths of the plurality of substrates W in this case are shown in FIGS. 6 to 8 by thick dotted arrows a1.
 その後、空になった一のフープ8は、蓋が閉じられ、フープ搬送装置112により保持されて、複数のフープ棚110のいずれかに載置される。一方、複数の基板Wが収容されたキャリア9は、キャリア支持部210により受け取られ、第1搬送部310の副搬送装置312Aにより主搬送装置311の可動ステージ311a上に載置される。この場合のキャリア9の搬送経路が、図6~図8に太い実線の矢印a2で示される。 Thereafter, the lid of the empty hoop 8 is closed, and the hoop transport device 112 holds the hoop 8 and places it on one of the hoop shelves 110. On the other hand, the carrier 9 containing the plurality of substrates W is received by the carrier support section 210 and placed on the movable stage 311a of the main transport device 311 by the sub transport device 312A of the first transport section 310. The conveyance path of the carrier 9 in this case is shown in FIGS. 6 to 8 by a thick solid arrow a2.
 次に、可動ステージ311a上に載置されたキャリア9は、中継ブロック200の近傍位置(第1の端部TA1)から第2搬送部320の近傍位置(第2の端部TA2)まで+X方向に水平姿勢で搬送される。図8の吹き出しBA3内に、第1搬送部310の主搬送装置311により搬送されるキャリア9の状態が示される。 Next, the carrier 9 placed on the movable stage 311a moves in the +X direction from a position near the relay block 200 (first end TA1) to a position near the second transport section 320 (second end TA2). transported in a horizontal position. The state of the carrier 9 conveyed by the main conveyance device 311 of the first conveyance section 310 is shown in the balloon BA3 of FIG. 8 .
 その後、第2搬送部320の近傍位置に到達したキャリア9は、第1搬送部310の副搬送装置312Bにより第2搬送部320の搬送装置321に渡される。そこで、搬送装置321に渡されたキャリア9は、搬送装置321により姿勢が水平姿勢から鉛直姿勢に変更される。図7の吹き出しBA2内に、搬送装置321におけるキャリア9の姿勢変更の状態が模式的に示される。 Thereafter, the carrier 9 that has reached a position near the second transport section 320 is transferred to the transport device 321 of the second transport section 320 by the sub transport device 312B of the first transport section 310. Therefore, the attitude of the carrier 9 passed to the transport device 321 is changed from a horizontal attitude to a vertical attitude by the transport device 321. In balloon BA2 of FIG. 7, the state of the attitude change of the carrier 9 in the transport device 321 is schematically shown.
 図7の吹き出しBA2に示すように、搬送装置321は、可動台座322およびキャリア保持具323を含む。可動台座322は、第2搬送部320内でY方向に移動可能に設けられている。キャリア保持具323は、第1保持部323aおよび第2保持部323bから構成される。第1保持部323aは、水平姿勢にあるときのキャリア9の下端部を保持可能な矩形の平板形状を有する。また、第2保持部323bは、鉛直姿勢にあるときのキャリア9の下端部を保持可能な矩形の平板形状を有する。 As shown in balloon BA2 in FIG. 7, the transport device 321 includes a movable base 322 and a carrier holder 323. The movable pedestal 322 is provided so as to be movable in the Y direction within the second transport section 320. The carrier holder 323 includes a first holder 323a and a second holder 323b. The first holding portion 323a has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a horizontal position. Further, the second holding portion 323b has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a vertical posture.
 第1保持部323aおよび第2保持部323bは、第1保持部323aの一辺と第2保持部323bの一辺とが互いに接するようにかつ2つの保持部が互いに直交するように接続されている。可動台座322は、第1保持部323aおよび第2保持部323bがともにY方向に平行となるように、かつキャリア保持具323がY方向に延びる軸の周りで回転可能となるように、キャリア保持具323の一部を保持する。 The first holding part 323a and the second holding part 323b are connected such that one side of the first holding part 323a and one side of the second holding part 323b touch each other and the two holding parts are orthogonal to each other. The movable base 322 holds the carrier so that the first holding part 323a and the second holding part 323b are both parallel to the Y direction, and the carrier holding tool 323 is rotatable around an axis extending in the Y direction. A part of the tool 323 is held.
 搬送装置321は、さらに可動台座322上でキャリア保持具323の回転角度を調整可能な図示しない駆動部を有する。これにより、第1搬送部310から水平姿勢のキャリア9を受け取る場合に、キャリア保持具323は、第1保持部323aが水平となりかつ第2保持部323bが鉛直となるように回転角度が調整される。その後、キャリア保持具323上に水平姿勢のキャリア9が受け取られると、キャリア保持具323は、第1保持部323aが鉛直となりかつ第2保持部323bが水平となるように回転角度が調整される。これにより、キャリア9の姿勢が水平姿勢から鉛直姿勢に変更される。 The transport device 321 further includes a drive unit (not shown) that can adjust the rotation angle of the carrier holder 323 on the movable base 322. As a result, when receiving the carrier 9 in a horizontal position from the first transport section 310, the rotation angle of the carrier holder 323 is adjusted so that the first holding section 323a is horizontal and the second holding section 323b is vertical. Ru. After that, when the carrier 9 in the horizontal position is received on the carrier holder 323, the rotation angle of the carrier holder 323 is adjusted so that the first holding part 323a is vertical and the second holding part 323b is horizontal. . As a result, the attitude of the carrier 9 is changed from the horizontal attitude to the vertical attitude.
 搬送装置321は、さらに第2搬送部320において可動台座322をY方向に移動させる図示しない駆動部を有する。これにより、鉛直姿勢で維持されたキャリア9は、第1搬送部310の近傍位置から処理部330の近傍位置まで+Y方向に鉛直姿勢で搬送される。 The transport device 321 further includes a drive unit (not shown) that moves the movable pedestal 322 in the Y direction in the second transport unit 320. As a result, the carrier 9 maintained in a vertical position is transported in a vertical position in the +Y direction from a position near the first transport section 310 to a position near the processing section 330.
 その後、処理部330の近傍位置に到達したキャリア9は、搬送装置321から処理部330の主搬送装置333Cにより受け取られる。主搬送装置333Cにより受け取られたキャリア9は、当該主搬送装置333Cおよび他の主搬送装置333B,333Aにより1または複数の液処理ユニット331のいずれかに搬送され、鉛直姿勢が維持された状態で各種処理液に所定期間浸漬される。これにより、キャリア9内に収容される複数の基板Wに、浸漬された処理液に応じた処理が行われる。図8の吹き出しBA4内に、処理部330の主搬送装置333A,333B,333Cにより搬送されるキャリア9の状態が示される。 Thereafter, the carrier 9 that has reached a position near the processing section 330 is received by the main transport device 333C of the processing section 330 from the transport device 321. The carrier 9 received by the main transport device 333C is transported to one or more liquid processing units 331 by the main transport device 333C and other main transport devices 333B and 333A, and is maintained in a vertical posture. It is immersed in various processing solutions for a predetermined period of time. As a result, the plurality of substrates W accommodated in the carrier 9 are processed according to the immersed processing liquid. A balloon BA4 in FIG. 8 shows the state of the carrier 9 being transported by the main transport devices 333A, 333B, and 333C of the processing section 330.
 図8の吹き出しBA4に示すように、各主搬送装置333A,333B,333Cは、可動支持柱333aおよび一対のチャック部材333bを含む。可動支持柱333aは、X方向に移動可能にかつZ方向に移動可能(昇降可能)に複数の液処理ユニット331の側方(+Y方向側)に設けられている。可動支持柱333aの上端部から液処理ユニット331の上方に延びるように一対のチャック部材333bが設けられている。一対のチャック部材333bは、鉛直姿勢のキャリア9を挟んで保持することが可能に構成されている。さらに、各主搬送装置333A,333B,333Cは、一対のチャック部材333bによりキャリア9を保持すること、および一対のチャック部材333bからキャリア9を解放することを切替可能な図示しない駆動部を有する。これにより、複数の主搬送装置333A,333B,333Cと複数の液処理ユニット331との間でキャリア9の受け渡しが行われる。 As shown in balloon BA4 in FIG. 8, each main transport device 333A, 333B, 333C includes a movable support column 333a and a pair of chuck members 333b. The movable support column 333a is provided on the side (+Y direction side) of the plurality of liquid processing units 331 so as to be movable in the X direction and movable in the Z direction (movable up and down). A pair of chuck members 333b are provided to extend above the liquid processing unit 331 from the upper end of the movable support column 333a. The pair of chuck members 333b are configured to be able to sandwich and hold the carrier 9 in a vertical position. Further, each of the main transport devices 333A, 333B, and 333C has a drive unit (not shown) that can switch between holding the carrier 9 by the pair of chuck members 333b and releasing the carrier 9 from the pair of chuck members 333b. Thereby, the carrier 9 is delivered between the plurality of main transport devices 333A, 333B, 333C and the plurality of liquid processing units 331.
 その後、処理液による処理後の複数の基板Wを収容するキャリア9は、さらに中継ブロック200に近接する乾燥ユニット332に搬送される。それにより、キャリア9およびキャリア9内の複数の基板Wが乾燥ユニット332により乾燥される。上記のように、処理ブロック300におけるキャリア9の一連の搬送経路が、図6~図8に太い実線の矢印a3で示される。 Thereafter, the carrier 9 accommodating the plurality of substrates W treated with the treatment liquid is further transported to a drying unit 332 close to the relay block 200. Thereby, the carrier 9 and the plurality of substrates W in the carrier 9 are dried by the drying unit 332. As described above, a series of transport paths of the carrier 9 in the processing block 300 are shown in FIGS. 6 to 8 by thick solid arrows a3.
 処理済みの複数の基板Wが収容されたキャリア9は、主搬送装置333Aにより乾燥ユニット332から中継ブロック200のキャリア支持部220に搬送され、キャリア支持部220により支持される。この場合のキャリア9の搬送経路が、図6~図8に太い点線の矢印a4で示される。 The carrier 9 containing a plurality of processed substrates W is transported from the drying unit 332 to the carrier support section 220 of the relay block 200 by the main transport device 333A, and is supported by the carrier support section 220. The conveyance path of the carrier 9 in this case is shown in FIGS. 6 to 8 by a thick dotted arrow a4.
 そこで、キャリア支持部220に渡されたキャリア9は、キャリア支持部220により姿勢が鉛直姿勢から水平姿勢に変更される。図7の吹き出しBA1内に、キャリア支持部220におけるキャリア9の姿勢変更の状態が模式的に示される。 Therefore, the attitude of the carrier 9 passed to the carrier support part 220 is changed from the vertical attitude to the horizontal attitude by the carrier support part 220. In the balloon BA1 of FIG. 7, the state of the attitude change of the carrier 9 in the carrier support section 220 is schematically shown.
 図7の吹き出しBA1に示すように、キャリア支持部220は、中継ブロック200内に固定された固定台座211およびキャリア保持具212を含む。キャリア保持具212は、第1保持部212aおよび第2保持部212bから構成される。第1保持部212aは、水平姿勢にあるときのキャリア9の下端部を保持可能な矩形の平板形状を有する。また、第2保持部212bは、鉛直姿勢にあるときのキャリア9の下端部を保持可能な矩形の平板形状を有する。 As shown in balloon BA1 in FIG. 7, the carrier support section 220 includes a fixed pedestal 211 and a carrier holder 212 fixed within the relay block 200. The carrier holder 212 includes a first holder 212a and a second holder 212b. The first holding portion 212a has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a horizontal position. Further, the second holding portion 212b has a rectangular flat plate shape capable of holding the lower end portion of the carrier 9 when it is in a vertical posture.
 第1保持部212aおよび第2保持部212bは、第1保持部212aの一辺と第2保持部212bの一辺とが互いに接するようにかつ2つの保持部が互いに直交するように接続されている。固定台座211は、第1保持部212aおよび第2保持部212bがともにY方向に平行となるように、かつキャリア保持具212がY方向に延びる軸の周りで回転可能となるように、キャリア保持具212の一部を保持する。 The first holding part 212a and the second holding part 212b are connected such that one side of the first holding part 212a and one side of the second holding part 212b touch each other and the two holding parts are orthogonal to each other. The fixed base 211 holds the carrier so that the first holding part 212a and the second holding part 212b are both parallel to the Y direction, and the carrier holding tool 212 is rotatable around an axis extending in the Y direction. A portion of the tool 212 is held.
 キャリア支持部220は、さらに固定台座211上でキャリア保持具212の回転角度を調整可能な図示しない駆動部を有する。これにより、乾燥ユニット332から鉛直姿勢のキャリア9を受け取る場合に、キャリア保持具212は、第2保持部212bが水平となりかつ第1保持部212aが鉛直となるように回転角度が調整される。その後、キャリア保持具212上に鉛直姿勢のキャリア9が受け取られると、キャリア保持具212は、第2保持部212bが鉛直となりかつ第1保持部212aが水平となるように回転角度が調整される。これにより、キャリア9の姿勢が鉛直姿勢から水平姿勢に変更される。このとき、キャリア9の基板出入口12(図5)は-X方向を向く。 The carrier support section 220 further includes a drive section (not shown) that can adjust the rotation angle of the carrier holder 212 on the fixed base 211. Thereby, when receiving the carrier 9 in a vertical position from the drying unit 332, the rotation angle of the carrier holder 212 is adjusted so that the second holding part 212b is horizontal and the first holding part 212a is vertical. After that, when the carrier 9 in a vertical position is received on the carrier holder 212, the rotation angle of the carrier holder 212 is adjusted so that the second holding part 212b becomes vertical and the first holding part 212a becomes horizontal. . As a result, the attitude of the carrier 9 is changed from the vertical attitude to the horizontal attitude. At this time, the substrate entrance/exit 12 (FIG. 5) of the carrier 9 faces in the -X direction.
 複数の基板Wが収容されたキャリア9が水平姿勢でキャリア支持部220に支持される際には、基板搬入搬出ブロック100のオープナ130に、空のフープ8が載置される。また、当該フープ8の蓋が開かれる。この状態で、基板受渡ロボット150により、キャリア9から処理後の複数の基板Wが取り出され、オープナ130上のフープ8に挿入される。この場合の複数の基板Wの搬送経路が、図6~図8に太い点線の矢印a5で示される。 When the carrier 9 containing a plurality of substrates W is supported by the carrier support section 220 in a horizontal position, an empty hoop 8 is placed on the opener 130 of the substrate loading/unloading block 100. Further, the lid of the hoop 8 is opened. In this state, the substrate delivery robot 150 takes out a plurality of processed substrates W from the carrier 9 and inserts them into the hoop 8 on the opener 130. The transport paths of the plurality of substrates W in this case are shown in FIGS. 6 to 8 by thick dotted arrows a5.
 その後、処理後の複数の基板Wが収容されたフープ8は、蓋が閉じられ、フープ搬送装置112により保持されて、複数のフープ棚110のいずれかに載置される。また、そのフープ8は、フープ搬送装置111によりフープ載置部190に搬送され、基板処理装置1から搬出される。一方、キャリア支持部220において空になったキャリア9は、そのキャリア9の姿勢がキャリア支持部220により水平姿勢から再度鉛直姿勢に変更される。キャリア支持部220において鉛直姿勢に戻された空のキャリア9は、主搬送装置333Aで搬送され、第2待機部240に受け取られる。 Thereafter, the lid of the hoop 8 containing the plurality of processed substrates W is closed, held by the hoop transport device 112, and placed on one of the plurality of hoop shelves 110. Further, the hoop 8 is transferred to the hoop mounting section 190 by the hoop transfer device 111 and is carried out from the substrate processing apparatus 1 . On the other hand, the attitude of the empty carrier 9 in the carrier support part 220 is changed from the horizontal attitude to the vertical attitude again by the carrier support part 220. The empty carrier 9 returned to the vertical position in the carrier support section 220 is transported by the main transport device 333A and received by the second standby section 240.
 本実施の形態においては、第2待機部240によりキャリア支持部220から受け取られた空のキャリア9は、鉛直姿勢が維持されつつ洗浄ブロック400の洗浄搬送装置410によりキャリア洗浄ユニット420に搬送される。この場合のキャリア9の搬送経路が、図6に太い一点鎖線の矢印c1で示される。 In the present embodiment, the empty carrier 9 received from the carrier support unit 220 by the second standby unit 240 is transported to the carrier cleaning unit 420 by the cleaning transport device 410 of the cleaning block 400 while maintaining the vertical posture. . The conveyance path of the carrier 9 in this case is shown in FIG. 6 by a thick dashed line arrow c1.
 キャリア洗浄ユニット420においては、さらに複数のキャリア洗浄槽421、キャリア乾燥部422および複数のキャリア待機部423の間で洗浄搬送装置410によりキャリア9が搬送される。それにより、使用後のキャリア9に洗浄処理および乾燥処理が行われる。また、洗浄処理後かつ乾燥処理後のキャリア9が、複数のキャリア待機部423のいずれかに収容される。複数のキャリア洗浄槽421、キャリア乾燥部422および複数のキャリア待機部423においては、キャリア9の鉛直姿勢が維持される。 In the carrier cleaning unit 420, the carrier 9 is further conveyed by a cleaning conveyance device 410 between a plurality of carrier cleaning tanks 421, a carrier drying section 422, and a plurality of carrier waiting sections 423. Thereby, the carrier 9 after use is subjected to a cleaning process and a drying process. Further, the carrier 9 after the cleaning process and the drying process is accommodated in one of the plurality of carrier standby parts 423. In the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier waiting sections 423, the vertical posture of the carrier 9 is maintained.
 新たな他のフープ8に収容された未処理の複数の基板Wに一連の処理を行う場合を想定する。この場合、洗浄ブロック400のキャリア待機部423に収容された清浄なキャリア9は、新たなキャリア9として洗浄搬送装置410によりキャリア洗浄ユニット420から第2待機部240に搬送される。この場合の新たなキャリア9の搬送経路が、図6に太い一点鎖線の矢印c2で示される。 A case is assumed in which a series of treatments are performed on a plurality of unprocessed substrates W accommodated in another new hoop 8. In this case, the clean carrier 9 accommodated in the carrier standby section 423 of the cleaning block 400 is transported as a new carrier 9 from the carrier cleaning unit 420 to the second waiting section 240 by the cleaning transport device 410. In this case, a new conveyance path of the carrier 9 is shown in FIG. 6 by a thick dashed line arrow c2.
 第2待機部240に渡された新たなキャリア9は、鉛直姿勢が維持されつつ待機搬送装置250により第1待機部230に搬送され、第1待機部230により支持される。この場合の新たなキャリア9の搬送経路が、図6に太い二点鎖線の矢印b1で示される。第1待機部230は、当該第1待機部230に支持される新たなキャリア9をキャリア支持部210に渡す。そこで、キャリア支持部210に渡された新たなキャリア9は、キャリア支持部210により姿勢が鉛直姿勢から水平姿勢に変更される。上記のように、中継ブロック200内の2つのキャリア支持部210,220は同じ構成を有する。それにより、キャリア支持部210においては、図7の吹き出しBA1内に示されるように、新たなキャリア9の姿勢が変更される。その後、新たな他のフープ8に収容された未処理の複数の基板Wが、水平姿勢にある新たなキャリア9内に挿入される。 The new carrier 9 delivered to the second standby section 240 is conveyed to the first standby section 230 by the standby conveyance device 250 while maintaining its vertical posture, and is supported by the first standby section 230. In this case, a new conveyance path for the carrier 9 is shown in FIG. 6 by a thick two-dot chain arrow b1. The first standby unit 230 passes the new carrier 9 supported by the first standby unit 230 to the carrier support unit 210. Therefore, the posture of the new carrier 9 passed to the carrier support section 210 is changed from the vertical posture to the horizontal posture by the carrier support section 210. As described above, the two carrier supports 210 and 220 in the relay block 200 have the same configuration. As a result, in the carrier support section 210, the new attitude of the carrier 9 is changed, as shown in the balloon BA1 in FIG. Thereafter, the plurality of unprocessed substrates W accommodated in another new hoop 8 are inserted into a new carrier 9 in a horizontal position.
 未処理の複数の基板Wが収容された新たなキャリア9は、図6~図8に示される一連の矢印a2,a3,a4で示される搬送経路に沿って搬送される。それにより、新たなキャリア9に収容された複数の基板Wに一連の処理が行われる。 A new carrier 9 containing a plurality of unprocessed substrates W is transported along a transport path indicated by a series of arrows a2, a3, and a4 shown in FIGS. 6 to 8. As a result, a series of processes are performed on the plurality of substrates W accommodated in the new carrier 9.
 <4>効果
 (1)上記の基板処理装置1においては、第1搬送部310の第1の端部TA1は、処理ブロック300の基板入口として機能する。また、処理部330の第3の端部TA3は、処理ブロック300の基板出口として機能する。処理ブロック300の基板入口に対応する位置で、未処理の複数の基板Wが収容されたフープ8がオープナ120に支持される。また、オープナ120に支持されたフープ8の蓋が開かれる。この状態で、オープナ120上のフープ8から未処理の複数の基板Wが取り出され、基板入口を通して処理ブロック300内に渡される。
<4> Effects (1) In the substrate processing apparatus 1 described above, the first end TA1 of the first transport section 310 functions as a substrate entrance of the processing block 300. Further, the third end TA3 of the processing section 330 functions as a substrate outlet of the processing block 300. At a position corresponding to the substrate entrance of the processing block 300, a hoop 8 containing a plurality of unprocessed substrates W is supported by the opener 120. Further, the lid of the hoop 8 supported by the opener 120 is opened. In this state, a plurality of unprocessed substrates W are taken out from the hoop 8 on the opener 120 and passed into the processing block 300 through the substrate entrance.
 処理ブロック300においては、未処理の複数の基板Wの各々に予め定められた処理が行われる。処理ブロックの基板出口に対応する位置で、空のフープ8がオープナ130に支持される。また、オープナ130に支持されたフープ8の蓋が開かれる。この状態で、処理後の複数の基板Wが、処理ブロック300の基板出口から受け取られ、オープナ130上のフープ8に挿入される。 In the processing block 300, predetermined processing is performed on each of the plurality of unprocessed substrates W. An empty hoop 8 is supported by an opener 130 at a location corresponding to the substrate outlet of the processing block. Further, the lid of the hoop 8 supported by the opener 130 is opened. In this state, a plurality of processed substrates W are received from the substrate outlet of the processing block 300 and inserted into the hoop 8 on the opener 130.
 上記のように、未処理の複数の基板Wを処理ブロック300に渡す動作と、処理後の複数の基板Wを処理ブロック300から受け取る動作とが、独立して行われる。この場合、未処理の複数の基板Wが収容されたフープ8の蓋の開閉動作および当該フープ8からの基板の取り出し動作に並行して、空のフープ8の蓋の開閉動作および空のフープ8への複数の基板Wの挿入動作を行うことが可能になる。それにより、基板処理装置1における複数の基板Wの処理の流れが、複数の基板Wの搬入動作および搬出動作により律速されることが防止される。したがって、基板Wの搬入動作および搬出動作に起因するスループットの低下が抑制される。 As described above, the operation of passing a plurality of unprocessed substrates W to the processing block 300 and the operation of receiving a plurality of processed substrates W from the processing block 300 are performed independently. In this case, in parallel with the opening/closing operation of the lid of the hoop 8 containing a plurality of unprocessed substrates W and the operation of taking out the substrates from the hoop 8, the opening/closing operation of the lid of the empty hoop 8 and the operation of opening/closing the lid of the empty hoop 8 It becomes possible to perform an operation of inserting a plurality of substrates W into the substrate. Thereby, the flow of processing of the plurality of substrates W in the substrate processing apparatus 1 is prevented from being rate-limited by the carrying-in operation and the carrying-out operation of the plurality of substrates W. Therefore, a decrease in throughput caused by the loading and unloading operations of the substrate W is suppressed.
 (2)上記の処理ブロック300においては、キャリア9に収容された複数の基板Wに対して予め定められた複数の処理が行われる。それにより、処理ブロック300において、複数の基板Wの各々が多数の搬送装置により搬送されること、および複数の基板Wの各々が多数の支持部に支持されることが抑制される。すなわち、複数の基板Wの各々における複数の部分に多数の部材が接触することが防止される。したがって、複数の基板Wの各々に基板処理装置1の多数の構成要素が接触することに起因する各基板Wの清浄度の低下が抑制される。 (2) In the processing block 300 described above, a plurality of predetermined processes are performed on a plurality of substrates W accommodated in the carrier 9. Thereby, in the processing block 300, each of the plurality of substrates W is prevented from being transported by a large number of transport devices, and each of the plurality of substrates W is suppressed from being supported by a large number of support parts. That is, a large number of members are prevented from coming into contact with a plurality of parts of each of the plurality of substrates W. Therefore, a decrease in the cleanliness of each substrate W due to contact of a large number of components of the substrate processing apparatus 1 with each of the plurality of substrates W is suppressed.
 また、上記の構成によれば、未処理の複数の基板Wが収容されたフープ8から空のキャリア9への複数の基板Wの移し替え動作と、処理後の複数の基板Wが収容されたキャリア9から空のフープ8への複数の基板Wの移し替え動作とが、独立して行われる。それにより、これらの移し替え動作を並行して行うことが可能になる。その結果、基板Wの搬入動作および搬出動作に起因するスループットの低下が抑制される。 Further, according to the above configuration, the operation of transferring the plurality of substrates W from the hoop 8 containing the plurality of unprocessed substrates W to the empty carrier 9, and the operation of transferring the plurality of substrates W containing the plurality of processed substrates W are performed. The operation of transferring the plurality of substrates W from the carrier 9 to the empty hoop 8 is performed independently. This allows these transfer operations to be performed in parallel. As a result, reduction in throughput caused by loading and unloading operations of the substrate W is suppressed.
 (3)上記の処理ブロック300は、1または複数の液処理ユニット331および乾燥ユニット332を含む。各液処理ユニット331は、複数の処理槽331aおよびリフタ331bを含む。各処理槽331aには、処理液が貯留されている。リフタ331bは、処理槽331aに貯留された処理液にキャリア9を浸漬すること、および処理槽331aに貯留された処理液からキャリア9を引き上げることが可能に構成されている。これにより、各液処理ユニット331においては、複数の基板Wを収容するキャリア9が処理液に浸漬されることにより、キャリア9に収容された複数の基板Wに対して同時に共通の処理が行われる。 (3) The processing block 300 described above includes one or more liquid processing units 331 and drying units 332. Each liquid processing unit 331 includes a plurality of processing tanks 331a and lifters 331b. A processing liquid is stored in each processing tank 331a. The lifter 331b is configured to be able to immerse the carrier 9 in the processing liquid stored in the processing tank 331a and to lift the carrier 9 from the processing liquid stored in the processing tank 331a. As a result, in each liquid processing unit 331, the carrier 9 that accommodates a plurality of substrates W is immersed in the processing liquid, so that a common process is simultaneously performed on the plurality of substrates W accommodated in the carrier 9. .
 (4)上記の処理ブロック300においては、処理ブロック300の基板入口(第1搬送部310の第1の端部TA1)と処理ブロック300の基板出口(処理部330の第3の端部TA3)とが、平面視でY方向に互いに隣り合うように構成されている。また、基板搬入搬出ブロック100および処理ブロック300は、平面視で中継ブロック200を挟んでX方向に並ぶように配置されている。 (4) In the processing block 300 described above, the substrate entrance of the processing block 300 (the first end TA1 of the first transport section 310) and the substrate exit of the processing block 300 (the third end TA3 of the processing section 330) are configured to be adjacent to each other in the Y direction in plan view. Further, the substrate loading/unloading block 100 and the processing block 300 are arranged in the X direction with the relay block 200 interposed therebetween in a plan view.
 さらに、基板搬入搬出ブロック100および中継ブロック200は、処理ブロック300に未処理の複数の基板Wを渡すための構成と、処理ブロック300から処理後の複数の基板Wを受け取るための構成とを含む。この場合、基板搬入搬出ブロック100において複数の基板Wの搬入および搬出に関する動作が行われる。そのため、基板処理装置1において、複数の基板Wの搬入位置と複数の基板Wの搬出位置とを大きく離間させる必要がない。したがって、基板処理装置1の外部において、基板処理装置1に対するフープ8の搬入のための経路と、基板処理装置1に対するフープ8の搬出のための経路とを共通化することが容易になる。 Furthermore, the substrate loading/unloading block 100 and the relay block 200 include a configuration for delivering a plurality of unprocessed substrates W to the processing block 300 and a configuration for receiving a plurality of processed substrates W from the processing block 300. . In this case, operations related to loading and unloading a plurality of substrates W are performed in the substrate loading/unloading block 100. Therefore, in the substrate processing apparatus 1, there is no need to make a large distance between the loading position of the plurality of substrates W and the carrying-out position of the plurality of substrates W. Therefore, outside the substrate processing apparatus 1, it becomes easy to use a common path for carrying the FOUP 8 into the substrate processing apparatus 1 and a path for carrying the FOUP 8 out of the substrate processing apparatus 1.
 (5)上記の基板搬入搬出ブロック100には、複数のフープ棚110が設けられている。複数のフープ棚110とオープナ120,130との間では、フープ搬送装置112によりフープ8が搬送される。この場合、複数のフープ8を複数のフープ棚110のいずれかに載置することができる。それにより、オープナ120,130にフープ8が載置された状態であっても、基板処理装置1に対する複数の基板Wの搬入および搬出を継続することが可能になる。 (5) The substrate loading/unloading block 100 described above is provided with a plurality of hoop shelves 110. The hoop 8 is transported between the plurality of hoop shelves 110 and the openers 120 and 130 by a hoop transport device 112. In this case, multiple hoops 8 can be placed on any of the multiple hoop shelves 110. Thereby, even when the hoop 8 is placed on the openers 120 and 130, it is possible to continue loading and unloading a plurality of substrates W into and out of the substrate processing apparatus 1.
 <5>他の実施の形態
 (1)上記実施の形態に係る基板処理装置1においては、中継ブロック200から処理部330の第4の端部TA4までキャリア9を搬送するために第1搬送部310および第2搬送部320が設けられるが、本発明はこれに限定されない。処理部330の第4の端部TA4から+X方向に基板搬入用の中継ブロック200および基板搬入搬出ブロック100が設けられ、かつ処理部330の第3の端部TA3から-X方向に基板搬出用の中継ブロック200および基板搬入搬出ブロック100が設けられてもよい。この場合、基板処理装置1に第1搬送部310および第2搬送部320を設ける必要がなくなる。
<5> Other Embodiments (1) In the substrate processing apparatus 1 according to the above embodiment, the first transport section is used to transport the carrier 9 from the relay block 200 to the fourth end TA4 of the processing section 330. 310 and a second transport section 320 are provided, but the present invention is not limited thereto. A relay block 200 for carrying in substrates and a substrate carrying-in/out block 100 are provided in the +X direction from the fourth end TA4 of the processing section 330, and a relay block 200 for carrying in substrates is provided in the -X direction from the third end TA3 of the processing section 330. A relay block 200 and a substrate loading/unloading block 100 may be provided. In this case, it is not necessary to provide the first transport section 310 and the second transport section 320 in the substrate processing apparatus 1.
 (2)上記の基板処理装置1においては、キャリア9に収容された複数の基板Wに対して各種処理が行われるが、本発明はこれに限定されない。基板処理装置1においては、複数の基板Wは、キャリア9に収容されない状態で各種処理が行われてもよい。この場合、上記の主搬送装置311,333A,333B,333Cおよび搬送装置321等は、例えば複数の基板Wを保持可能または支持可能に構成される。あるいは、上記の主搬送装置311,333A,333B,333Cおよび搬送装置321等は、例えば一枚の基板Wを保持可能または支持可能に構成される。また、これらの場合には、キャリア9を用意する必要がなくなる。 (2) In the substrate processing apparatus 1 described above, various processes are performed on the plurality of substrates W accommodated in the carrier 9, but the present invention is not limited thereto. In the substrate processing apparatus 1, various processes may be performed on the plurality of substrates W without being accommodated in the carrier 9. In this case, the main transport devices 311, 333A, 333B, 333C, the transport device 321, etc. are configured to be able to hold or support a plurality of substrates W, for example. Alternatively, the main transport devices 311, 333A, 333B, 333C, transport device 321, etc. are configured to be able to hold or support one substrate W, for example. Further, in these cases, it is not necessary to prepare the carrier 9.
 (3)上記の基板処理装置1においては、基板受渡ロボット140,150の各々は、複数の基板Wを1枚ずつ順次受渡可能に構成されてもよいし、複数の基板Wを同時に受渡可能に構成されてもよい。 (3) In the substrate processing apparatus 1 described above, each of the substrate transfer robots 140 and 150 may be configured to be able to sequentially transfer a plurality of substrates W one by one, or may be configured to be able to transfer a plurality of substrates W simultaneously. may be configured.
 (4)上記の処理ブロック300においては、中継ブロック200から渡されたキャリア9が第1搬送部310の第1の端部TA1から第2の端部TA2まで搬送される。その後、処理部330の第4の端部TA4から第3の端部TA3に戻る間に、複数の基板Wに各種処理が行われる。しかしながら、本発明は上記の例に限定されない。 (4) In the above processing block 300, the carrier 9 passed from the relay block 200 is transported from the first end TA1 to the second end TA2 of the first transport section 310. Thereafter, various processes are performed on the plurality of substrates W while returning from the fourth end TA4 to the third end TA3 of the processing section 330. However, the invention is not limited to the above example.
 処理ブロック300は、第1搬送部310の位置と処理部330の位置とが入れ替わった構成を有してもよい。この場合、処理部330は、例えばX方向に直交する面に対称な構成を有する。このような構成を有する処理ブロック300においては、中継ブロック200から渡されたキャリア9が、最初に処理部330内で複数の処理液に浸漬され、乾燥処理される。その後、処理後の複数の基板Wを収容するキャリア9が、第1搬送部310の主搬送装置311により中継ブロック200に戻される。 The processing block 300 may have a configuration in which the positions of the first transport section 310 and the processing section 330 are switched. In this case, the processing unit 330 has a configuration that is symmetrical in a plane perpendicular to the X direction, for example. In the processing block 300 having such a configuration, the carrier 9 passed from the relay block 200 is first immersed in a plurality of processing liquids in the processing section 330 and subjected to a drying process. Thereafter, the carrier 9 accommodating the plurality of processed substrates W is returned to the relay block 200 by the main transport device 311 of the first transport section 310 .
 (5)上記実施の形態に係る基板処理装置1は、複数の基板Wの処理に使用された使用後のキャリア9を洗浄する洗浄ブロック400を備えるが、本発明はこれに限定されない。基板処理装置1には、洗浄ブロック400が設けられなくてもよい。この場合、中継ブロック200のキャリア支持部220において複数の基板Wが取り出された使用後のキャリア9は、洗浄されることなくキャリア支持部210に搬送されてもよい。あるいは、使用後のキャリア9は、洗浄されることなく基板処理装置1の外部に取り出され、廃棄されてもよい。 (5) Although the substrate processing apparatus 1 according to the embodiment described above includes a cleaning block 400 that cleans the used carrier 9 used to process a plurality of substrates W, the present invention is not limited thereto. The substrate processing apparatus 1 may not be provided with the cleaning block 400. In this case, the used carrier 9 from which a plurality of substrates W have been taken out at the carrier support section 220 of the relay block 200 may be transported to the carrier support section 210 without being cleaned. Alternatively, the used carrier 9 may be taken out of the substrate processing apparatus 1 and discarded without being cleaned.
 (6)上記実施の形態に係る基板処理装置1においては、中継ブロック200でキャリア支持部210と第1待機部230とが個別に設けられているが、本発明はこれに限定されない。第1待機部230にキャリア9の姿勢変更の機能を付加することが可能である場合、キャリア支持部210は設けられなくてもよい。 (6) In the substrate processing apparatus 1 according to the above embodiment, the carrier support section 210 and the first standby section 230 are separately provided in the relay block 200, but the present invention is not limited to this. If it is possible to add the function of changing the posture of the carrier 9 to the first standby section 230, the carrier support section 210 may not be provided.
 また、上記実施の形態に係る基板処理装置1においては、中継ブロック200でキャリア支持部220と第2待機部240とが個別に設けられているが、本発明はこれに限定されない。第2待機部240にキャリア9の姿勢変更の機能を付加することが可能である場合、キャリア支持部220は設けられなくてもよい。 Furthermore, in the substrate processing apparatus 1 according to the embodiment described above, the carrier support section 220 and the second standby section 240 are separately provided in the relay block 200, but the present invention is not limited to this. If it is possible to add the function of changing the posture of the carrier 9 to the second standby section 240, the carrier support section 220 may not be provided.
 (7)上記実施の形態に係る処理ブロック300の第2搬送部320においては、搬送装置321はキャリア9の姿勢変更の機能を有するとともにキャリア9の搬送の機能を有するが、本発明はこれに限定されない。第2搬送部320においては、上記の搬送装置321に代えて、キャリア9の姿勢変更の機能を有する構成要素と、キャリア9の搬送の機能を有する構成要素とが個別に設けられてもよい。 (7) In the second transport section 320 of the processing block 300 according to the above embodiment, the transport device 321 has the function of changing the attitude of the carrier 9 and the function of transporting the carrier 9. Not limited. In the second transport unit 320, a component having a function of changing the attitude of the carrier 9 and a component having a function of transporting the carrier 9 may be separately provided in place of the above-described transport device 321.
 (8)上記実施の形態に係る基板処理装置1においては、処理対象となる基板Wが平面視で矩形状を有するが、処理対象となる基板は、平面視で円形状を有してもよいし、平面視で三角形または五角形等の四角形以外の多角形状を有してもよい。 (8) In the substrate processing apparatus 1 according to the above embodiment, the substrate W to be processed has a rectangular shape in plan view, but the substrate to be processed may have a circular shape in plan view. However, it may have a polygonal shape other than a quadrangle, such as a triangle or a pentagon when viewed in plan.
 (9)上記実施の形態に係るキャリア9は、水平姿勢で矩形の基板Wが収容された場合に矩形の基板Wの両側部を支持するが、本発明はこれに限定されない。キャリア9は、水平姿勢で基板Wの中央部を支持可能に構成されてもよい。 (9) Although the carrier 9 according to the above embodiment supports both sides of the rectangular substrate W when the rectangular substrate W is accommodated in a horizontal position, the present invention is not limited thereto. The carrier 9 may be configured to be able to support the center portion of the substrate W in a horizontal position.
 (10)上記実施の形態に係る基板処理装置1においては、処理部330の複数の処理槽331aには、基板Wを洗浄するための処理液が貯留されるとしているが、本発明はこれに限定されない。処理部330の複数の処理槽331aの少なくとも一部には、基板Wにめっき処理を行うためのめっき液、または基板Wの表面状態を改質させるための液体等が、処理液として貯留されてもよい。このように、上記実施の形態は、本発明を複数の基板Wの洗浄処理に適用した例であるが、これに限らず、複数の基板Wのめっき処理または表面改質処理等の他の処理に本発明を適用してもよい。 (10) In the substrate processing apparatus 1 according to the embodiment described above, the processing liquid for cleaning the substrate W is stored in the plurality of processing tanks 331a of the processing section 330, but the present invention is not limited to this. Not limited. In at least some of the plurality of processing tanks 331a of the processing section 330, a plating solution for performing plating processing on the substrate W, a liquid for modifying the surface condition of the substrate W, etc. is stored as a processing solution. Good too. As described above, the above embodiment is an example in which the present invention is applied to cleaning processing of a plurality of substrates W, but the present invention is not limited to this, and other processing such as plating processing or surface modification processing of a plurality of substrates W can be applied. The present invention may also be applied to.
 (11)上記実施の形態に係るキャリア9においては、フレーム部材10a,10bの各々の中央部分に4個の開口部13が形成されているが、本発明はこれに限定されない。フレーム部材10a,10bの各々の中央部分には、4個に限らず、1個、2個、3個または5個等の他の個数の開口部13が形成されてもよい。あるいは、フレーム部材10a,10bの各々の中央部分には、開口部13が形成されなくてもよい。さらに、フレーム部材10a,10bの形状は適宜設計変更してもよい。 (11) In the carrier 9 according to the above embodiment, four openings 13 are formed in the center portion of each of the frame members 10a, 10b, but the present invention is not limited thereto. The number of openings 13 is not limited to four, and other numbers such as one, two, three, or five openings 13 may be formed in the central portion of each of the frame members 10a, 10b. Alternatively, the opening 13 may not be formed in the center portion of each of the frame members 10a, 10b. Furthermore, the shapes of the frame members 10a and 10b may be changed in design as appropriate.
 (12)上記実施の形態に係る主搬送装置333A,333B,333Cの各々においては、一対のチャック部材333bはX方向においてキャリア9を挟み込むことにより当該キャリア9を保持するが、本発明はこれに限定されない。一対のチャック部材333bはY方向においてキャリア9を挟み込むことにより当該キャリア9を保持してもよいし、水平面内でX方向およびY方向に交差する方向においてキャリア9を挟み込むことにより当該キャリア9を保持してもよい。 (12) In each of the main conveyance devices 333A, 333B, and 333C according to the above embodiments, the pair of chuck members 333b hold the carrier 9 by sandwiching the carrier 9 in the X direction, but the present invention is directed to this. Not limited. The pair of chuck members 333b may hold the carrier 9 by sandwiching the carrier 9 in the Y direction, or may hold the carrier 9 by sandwiching the carrier 9 in a direction intersecting the X and Y directions in a horizontal plane. You may.
 <6>請求項の各構成要素と実施の形態の各要素との対応関係
 以下、請求項の各構成要素と実施の形態の各要素との対応の例について説明するが、本発明は下記の例に限定されない。請求項の各構成要素として、請求項に記載されている構成または機能を有する他の種々の要素を用いることもできる。
<6> Correspondence between each component of the claims and each element of the embodiments Examples of correspondences between each component of the claims and each element of the embodiments will be described below. Not limited to examples. Various other elements having the configuration or function described in the claims can also be used as each component in the claims.
 上記実施の形態においては、第1搬送部310の第1の端部TA1が基板入口の例であり、処理部330の第3の端部TA3が基板出口の例であり、処理ブロック300が処理ブロックの例であり、未処理の複数の基板Wが収容されかつオープナ120に支持されるフープ8が第1の基板容器の例であり、オープナ120が第1のオープナの例である。 In the embodiment described above, the first end TA1 of the first transport section 310 is an example of the substrate entrance, the third end TA3 of the processing section 330 is an example of the substrate exit, and the processing block 300 is an example of the substrate exit. The hoop 8, which is an example of a block and accommodates a plurality of unprocessed substrates W and is supported by an opener 120, is an example of a first substrate container, and the opener 120 is an example of a first opener.
 また、オープナ130に支持される空のフープ8が第2の基板容器の例であり、オープナ130が第2のオープナの例であり、基板受渡ロボット140、キャリア支持部210および第1待機部230を含む構成要素群が第1の基板受渡部の例であり、基板受渡ロボット150、キャリア支持部220および第2待機部240を含む構成要素群が第2の基板受渡部の例であり、基板処理装置1が基板処理装置の例である。 Further, the empty hoop 8 supported by the opener 130 is an example of the second substrate container, the opener 130 is an example of the second opener, and the substrate delivery robot 140, the carrier support part 210, and the first standby part 230 The component group including the substrate transfer robot 150, the carrier support section 220, and the second standby section 240 is an example of the second substrate transfer section. The processing apparatus 1 is an example of a substrate processing apparatus.
 また、キャリア9がキャリアの例であり、図6~図8に太い実線の矢印a3で示されるキャリア9の搬送経路が予め定められた搬送経路の例であり、処理ブロック300の主搬送装置311,333A,333B,333Cおよび搬送装置321を含む構成要素群が搬送機構の例であり、複数の液処理ユニット331および乾燥ユニット332が処理ユニットの例である。 Further, the carrier 9 is an example of a carrier, and the transport route of the carrier 9 indicated by the thick solid arrow a3 in FIGS. 6 to 8 is an example of a predetermined transport route, and the main transport device 311 of the processing block 300 , 333A, 333B, 333C and the transport device 321 are examples of the transport mechanism, and the plurality of liquid processing units 331 and the drying unit 332 are examples of the processing units.
 また、処理槽331aが処理槽の例であり、リフタ331bがリフタの例であり、基板搬入搬出ブロック100および中継ブロック200が基板搬入搬出部の例であり、Y方向が第1の方向の例であり、X方向が第2の方向の例であり、複数のフープ棚110が複数の基板容器載置部の例であり、フープ搬送装置112が基板容器搬送装置の例である。 Furthermore, the processing tank 331a is an example of a processing tank, the lifter 331b is an example of a lifter, the substrate loading/unloading block 100 and the relay block 200 are examples of a substrate loading/unloading section, and the Y direction is an example of the first direction. The X direction is an example of the second direction, the plurality of hoop shelves 110 are an example of a plurality of substrate container mounting sections, and the hoop transport device 112 is an example of a substrate container transport device.

Claims (5)

  1. 基板入口および基板出口を有し、前記基板入口において未処理の基板を受け取り、受け取った基板に予め定められた処理を行うとともに処理後の基板を前記基板出口に導く処理ブロックと、
     前記基板入口に対応する位置に設けられ、未処理の複数の基板が収容された第1の基板容器を支持するとともに前記第1の基板容器の蓋を開閉する第1のオープナと、
     前記第1のオープナにより前記蓋が開かれた前記第1の基板容器から未処理の複数の基板を取り出し、取り出した複数の基板を前記処理ブロックの前記基板入口に渡す第1の基板受渡部と、
     前記基板出口に対応する位置に設けられ、空の第2の基板容器を支持するとともに前記第2の基板容器の蓋を開閉する第2のオープナと、
     前記処理ブロックの前記基板出口から処理後の複数の基板を受け取り、受け取った複数の基板を前記第2のオープナにより前記蓋が開かれた前記第2の基板容器に挿入する第2の基板受渡部とを備える、基板処理装置。
    a processing block having a substrate inlet and a substrate outlet, receiving an unprocessed substrate at the substrate inlet, performing a predetermined process on the received substrate, and guiding the processed substrate to the substrate outlet;
    a first opener that is provided at a position corresponding to the substrate entrance, supports a first substrate container containing a plurality of unprocessed substrates, and opens and closes a lid of the first substrate container;
    a first substrate transfer unit that takes out a plurality of unprocessed substrates from the first substrate container whose lid has been opened by the first opener and delivers the plurality of unprocessed substrates to the substrate entrance of the processing block; ,
    a second opener that is provided at a position corresponding to the substrate outlet, supports an empty second substrate container, and opens and closes a lid of the second substrate container;
    a second substrate transfer unit that receives a plurality of processed substrates from the substrate outlet of the processing block and inserts the received plurality of substrates into the second substrate container whose lid is opened by the second opener; A substrate processing apparatus comprising:
  2. 前記処理ブロックは、
     複数の基板を収容可能に構成されたキャリアを、前記基板入口から前記基板出口に至る予め定められた搬送経路に沿って搬送する搬送機構と、
     前記搬送経路上に設けられ、複数の基板が前記キャリアに収容された状態で、当該キャリアに収容された複数の基板に前記予め定められた処理を行う処理ユニットとを含み、
     前記第1の基板受渡部は、空の前記キャリアが前記基板入口にある状態で、前記第1の基板容器から未処理の複数の基板を取り出し、取り出した複数の基板を前記キャリアに挿入し、
     前記第2の基板受渡部は、処理後の複数の基板が収容された前記キャリアが前記基板出口にある状態で、前記キャリアから処理後の複数の基板を取り出し、取り出した複数の基板を前記第2の基板容器に挿入する、請求項1記載の基板処理装置。
    The processing block is
    a transport mechanism that transports a carrier configured to accommodate a plurality of substrates along a predetermined transport path from the substrate entrance to the substrate exit;
    a processing unit that is provided on the transport path and performs the predetermined process on a plurality of substrates accommodated in the carrier while the plurality of substrates are accommodated in the carrier;
    The first substrate delivery unit takes out a plurality of unprocessed substrates from the first substrate container while the empty carrier is at the substrate entrance, and inserts the taken out plurality of substrates into the carrier,
    The second substrate delivery unit takes out the plurality of processed substrates from the carrier while the carrier containing the plurality of processed substrates is at the substrate outlet, and transfers the taken out plurality of substrates to the first substrate. 2. The substrate processing apparatus according to claim 1, wherein the substrate processing apparatus is inserted into a second substrate container.
  3. 前記処理ユニットは、
     前記予め定められた処理に対応する処理液を貯留する処理槽と、
     前記搬送機構により搬送される前記キャリアを前記処理槽の処理液に浸漬することおよび処理液に浸漬された前記キャリアを前記処理槽から引き上げることが可能に構成されたリフタとを含む、請求項2記載の基板処理装置。
    The processing unit includes:
    a processing tank that stores a processing liquid corresponding to the predetermined processing;
    Claim 2, further comprising a lifter configured to be able to immerse the carrier transported by the transport mechanism in the processing liquid in the processing tank and to lift the carrier immersed in the processing liquid from the processing tank. The substrate processing apparatus described.
  4. 複数の基板を搬入可能かつ複数の基板を搬出可能に構成された基板搬入搬出部をさらに備え、
     前記処理ブロックは、平面視で前記基板入口と前記基板出口とが第1の方向に隣り合うように構成され、
     前記基板搬入搬出部は、
     前記第1のオープナ、前記第2のオープナ、前記第1の基板受渡部および前記第2の基板受渡部を含み、
     平面視で前記処理ブロックの前記基板入口および前記基板出口に接するようにかつ平面視で前記処理ブロックに対して前記第1の方向に交差する第2の方向に隣り合うように設けられた、請求項1~3のいずれか一項に記載の基板処理装置。
    Further comprising a board loading/unloading section configured to be able to carry in a plurality of boards and to carry out a plurality of boards,
    The processing block is configured such that the substrate inlet and the substrate outlet are adjacent to each other in a first direction in a plan view,
    The board loading/unloading section is
    including the first opener, the second opener, the first substrate transfer section and the second substrate transfer section,
    The processing block is provided so as to be in contact with the substrate inlet and the substrate outlet of the processing block in a plan view, and to be adjacent to the processing block in a second direction intersecting the first direction in a plan view. The substrate processing apparatus according to any one of Items 1 to 3.
  5. 前記基板搬入搬出部は、
     前記第1の基板容器および前記第2の基板容器を含む複数の基板容器を保持可能な複数の基板容器載置部と、
     前記複数の基板容器載置部と前記第1のオープナとの間、および前記複数の基板容器載置部と前記第2のオープナとの間で前記複数の基板容器を搬送可能に構成された基板容器搬送装置とを備える、請求項4記載の基板処理装置。
    The board loading/unloading section is
    a plurality of substrate container mounting parts capable of holding a plurality of substrate containers including the first substrate container and the second substrate container;
    A substrate configured to be able to transport the plurality of substrate containers between the plurality of substrate container placement parts and the first opener and between the plurality of substrate container placement parts and the second opener. The substrate processing apparatus according to claim 4, further comprising a container transport device.
PCT/JP2023/010209 2022-03-24 2023-03-16 Substrate processing apparatus WO2023182116A1 (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0817894A (en) * 1994-06-27 1996-01-19 Dainippon Screen Mfg Co Ltd Substrate surface treatment device
JP2009099710A (en) * 2007-10-16 2009-05-07 Tokyo Electron Ltd Substrate treatment device, substrate transporting method, computer program, and storing medium

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0817894A (en) * 1994-06-27 1996-01-19 Dainippon Screen Mfg Co Ltd Substrate surface treatment device
JP2009099710A (en) * 2007-10-16 2009-05-07 Tokyo Electron Ltd Substrate treatment device, substrate transporting method, computer program, and storing medium

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