TWI839164B - Substrate processing apparatus - Google Patents

Substrate processing apparatus Download PDF

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TWI839164B
TWI839164B TW112110468A TW112110468A TWI839164B TW I839164 B TWI839164 B TW I839164B TW 112110468 A TW112110468 A TW 112110468A TW 112110468 A TW112110468 A TW 112110468A TW I839164 B TWI839164 B TW I839164B
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section
carrier
substrate
processing
substrates
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TW202343646A (en
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天久賢治
谷口進一
岩﨑旭紘
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日商斯庫林集團股份有限公司
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Abstract

基板處理裝置具備基板搬入搬出部、及以自基板搬入搬出部朝第1方向並行延伸之方式設置之搬送部及處理部。搬送部自基板搬入搬出部向第1方向搬送收納未處理之基板之載體。處理部包含複數個處理槽。於處理部中,將收納有複數片基板之載體向與第1方向相反之第2方向搬送。搬送之載體浸漬於貯存在複數個處理槽之複數種處理液中之至少1者。以俯視下與處理部相鄰之方式,形成有保養空間。搬送部於俯視下與處理部及保養空間中之至少一部分重疊。The substrate processing device includes a substrate loading and unloading section, and a conveying section and a processing section that are arranged in a manner extending in parallel from the substrate loading and unloading section toward a first direction. The conveying section conveys a carrier that stores unprocessed substrates from the substrate loading and unloading section toward the first direction. The processing section includes a plurality of processing tanks. In the processing section, the carrier that stores a plurality of substrates is conveyed toward a second direction that is opposite to the first direction. The conveyed carrier is immersed in at least one of a plurality of processing liquids stored in a plurality of processing tanks. A maintenance space is formed in a manner adjacent to the processing section when viewed from above. The conveying section overlaps with at least a portion of the processing section and the maintenance space when viewed from above.

Description

基板處理裝置Substrate processing equipment

本發明係關於一種於處理槽中處理複數片基板之基板處理裝置。The present invention relates to a substrate processing device for processing a plurality of substrates in a processing tank.

為對半導體基板、液晶顯示裝置或有機EL(Electro Luminescence:電致發光)顯示裝置等之FPD(Flat Panel Display:平板顯示器)用基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用基板、陶瓷基板或太陽能電池用基板等基板進行各種處理,而使用基板處理裝置。A substrate processing apparatus is used to perform various processes on substrates such as semiconductor substrates, FPD (Flat Panel Display) substrates for liquid crystal display devices or organic EL (Electro Luminescence) display devices, optical disk substrates, magnetic disk substrates, magneto-optical disk substrates, mask substrates, ceramic substrates, or solar cell substrates.

作為此種基板處理裝置,具有將複數片基板浸漬於貯存在處理槽之處理液中,進行蝕刻等處理之批量式基板處理裝置。例如,專利文獻1記載之批量式基板處理裝置具有基板處理部。基板處理部具有以將第1藥液槽、第1清洗液槽、第2藥液槽、第2清洗液槽及乾燥處理部依序排列於一直線上之方式排列之構成。又,於上述基板處理裝置中,以進而自基板處理部之乾燥處理部排列於一直線上之方式,設定有第1交接位置及第2交接位置。As such a substrate processing device, there is a batch type substrate processing device that immerses a plurality of substrates in a processing liquid stored in a processing tank to perform a process such as etching. For example, the batch type substrate processing device described in Patent Document 1 has a substrate processing unit. The substrate processing unit has a structure in which a first chemical liquid tank, a first cleaning liquid tank, a second chemical liquid tank, a second cleaning liquid tank, and a drying processing unit are arranged in sequence on a straight line. In addition, in the above-mentioned substrate processing device, a first handover position and a second handover position are set in such a manner that the drying processing unit from the substrate processing unit is further arranged on a straight line.

搬入至基板處理裝置之未處理之複數片基板於第1交接位置由主搬送機構接收,並搬送至基板處理部。於基板處理部中,將未處理之複數片基板例如搬送至第1藥液槽或第2藥液槽之上方之位置。又,將該等複數片基板於位於下方之槽之藥液中浸漬規定時間並提起。其後,將複數片基板搬送至第1清洗液槽或第2清洗液槽之上方之位置。又,將該等複數片基板於位於下方之槽之清洗液中浸漬規定時間並提起。The unprocessed plurality of substrates transported into the substrate processing device are received by the main transport mechanism at the first transfer position and transported to the substrate processing section. In the substrate processing section, the unprocessed plurality of substrates are transported, for example, to a position above the first chemical liquid tank or the second chemical liquid tank. Furthermore, the plurality of substrates are immersed in the chemical liquid in the tank below for a predetermined time and lifted up. Thereafter, the plurality of substrates are transported to a position above the first cleaning liquid tank or the second cleaning liquid tank. Furthermore, the plurality of substrates are immersed in the cleaning liquid in the tank below for a predetermined time and lifted up.

於第1藥液槽或第2藥液槽之藥液之處理後,將複數片基板搬送至乾燥處理部。於乾燥處理部之乾燥處理後,將複數片基板自第2交接位置取出,且自基板處理裝置搬出。After the chemical solution in the first chemical solution tank or the second chemical solution tank is processed, the plurality of substrates are transported to the drying treatment section. After the drying treatment in the drying treatment section, the plurality of substrates are taken out from the second transfer position and unloaded from the substrate processing device.

[專利文獻1]日本專利特開2011-238945號公報[Patent Document 1] Japanese Patent Publication No. 2011-238945

[發明所欲解決之問題][The problem the invention is trying to solve]

於上述基板處理裝置中,於第1交接位置設置有夾盤洗淨單元,且以排列於第1交接位置之側方(與上述一直線正交之方向)之方式設置有複數個基板交接機構。又,於第2交接位置設置有2個基板交接機構(中介機器人),且以排列於第2交接位置之側方(與上述一直線正交之方向)之方式進而設置有複數個基板交接機構。又,於該等複數個基板交接機構附近設置有晶圓傳送盒保持部。晶圓傳送盒保持部構成為可保持收納複數片基板之收納器(FOUP(Front Opening Unified Pod:前開式晶圓傳送盒)),且具備將該收納器之蓋開閉之開閉器。In the above-mentioned substrate processing device, a chuck cleaning unit is provided at the first handover position, and a plurality of substrate handover mechanisms are provided in a manner arranged on the side of the first handover position (in a direction orthogonal to the above-mentioned straight line). Furthermore, two substrate handover mechanisms (intermediate robots) are provided at the second handover position, and a plurality of substrate handover mechanisms are further provided in a manner arranged on the side of the second handover position (in a direction orthogonal to the above-mentioned straight line). Furthermore, a wafer transfer box holding portion is provided near the plurality of substrate handover mechanisms. The wafer transfer box holding portion is configured as a container (FOUP (Front Opening Unified Pod: front-opening wafer transfer box)) that can hold a plurality of substrates, and is provided with an opener and closer for opening and closing the cover of the container.

上述基板處理裝置中設置於第1及第2交接位置及其周邊之複數個構成(夾盤洗淨單元、複數個基板交接機構及晶圓傳送盒保持部)以彼此相鄰之方式設置。因此,由於難以對各構成確保足夠大之保養空間,故保養之作業性較低。In the substrate processing apparatus, the plurality of components (chuck cleaning unit, plurality of substrate transfer mechanisms and wafer cassette holder) disposed at the first and second transfer positions and their peripheries are disposed adjacent to each other. Therefore, it is difficult to ensure a sufficiently large maintenance space for each component, so the maintenance workability is low.

因此,對於與基板之搬入及搬出相關之各構成,為確保足夠大之保養空間,考慮以隔著基板處理部之方式配置第1交接位置與第2交接位置。該情形時,由於第1交接位置與第2交接位置隔開,故需設置連接晶圓傳送盒保持部與第1交接位置之新的搬送路徑、或連接晶圓傳送盒保持部與第2交接位置之新的搬送路徑。然而,若於基板處理裝置設置新的搬送路徑,則基板處理裝置之佔地面積可能會擴大。Therefore, in order to ensure a sufficient maintenance space for each structure related to the substrate loading and unloading, it is considered to arrange the first handover position and the second handover position in a manner of separating the substrate processing unit. In this case, since the first handover position and the second handover position are separated, it is necessary to set a new transport path connecting the wafer cassette holding unit and the first handover position, or a new transport path connecting the wafer cassette holding unit and the second handover position. However, if a new transport path is set in the substrate processing device, the floor space occupied by the substrate processing device may be expanded.

本發明之目的在於提供一種可抑制佔地面積擴大且提高基板處理裝置各部之保養之作業性的基板處理裝置。 [解決問題之技術手段] The purpose of the present invention is to provide a substrate processing device that can suppress the expansion of the floor space occupied and improve the workability of the maintenance of each part of the substrate processing device. [Technical means for solving the problem]

(1)根據本發明之一態樣之基板處理裝置具備:基板搬入搬出部,其構成為可搬入複數片基板且可搬出複數片基板;及搬送部及處理部,其以自基板搬入搬出部朝第1方向並行延伸之方式設置;且搬送部具有依序排列於第1方向之第1端部及第2端部,構成為可於第1方向將收納有經搬入至基板搬入搬出部之複數片基板之載體自第1端部搬送至第2端部;處理部具有依序排列於第1方向之第3端部及第4端部,且具有設置於第3端部與第4端部之間之複數個處理槽,構成為可藉由將搬送部中搬送至第2端部之載體於與第1方向相反之第2方向上,自第4端部向第3端部搬送,且使搬送之載體浸漬於貯存在複數個處理槽之複數種處理液中之至少1者,而對收納於載體之複數片基板進行預設之處理,並將處理後之複數片基板移交給基板搬入搬出部;以俯視下於與第1及第2方向交叉之第3方向上與處理部之至少一部分相鄰之方式,形成對於處理部之保養空間;搬送部於俯視下與處理部及保養空間中之至少一部分重疊。(1) A substrate processing device according to one aspect of the present invention comprises: a substrate loading and unloading section, which is configured to load a plurality of substrates and unload a plurality of substrates; and a conveying section and a processing section, which are arranged in a manner extending in parallel from the substrate loading and unloading section toward a first direction; and the conveying section has a first end and a second end arranged in sequence in the first direction, and is configured to convey a carrier containing a plurality of substrates loaded into the substrate loading and unloading section from the first end to the second end in the first direction; and the processing section has a third end and a fourth end arranged in sequence in the first direction, and has a plurality of The processing tank is configured to carry out a preset treatment on a plurality of substrates stored in the carrier by transporting the carrier transported to the second end in the transport section in the second direction opposite to the first direction from the fourth end to the third end, and immersing the transported carrier in at least one of a plurality of processing liquids stored in a plurality of processing tanks, and transferring the processed plurality of substrates to the substrate loading and unloading section; a maintenance space for the processing section is formed in a manner that the processing section is adjacent to at least a portion of the processing section in a third direction intersecting the first and second directions in a plan view; the transport section overlaps with at least a portion of the processing section and the maintenance space in a plan view.

於該基板處理裝置中,將未處理之複數片基板搬入至基板搬入搬出部。該等複數片基板以收納於載體之狀態,於第1方向自搬送部之第1端部搬送至第2端部。搬送至搬送部之第2端部之複數片基板以收納於載體之狀態,於第2方向自處理部之第4端部向第3端部搬送。於該搬送時,收納複數片基板之載體於第4端部與第3端部之間,浸漬於分別貯存在複數個處理槽之複數種處理液中之至少1者。藉此,對收納於載體之複數片基板共通進行預設之處理。將處理後之複數片基板移交給基板搬入搬出部,並搬出。In the substrate processing device, a plurality of unprocessed substrates are moved into the substrate loading and unloading section. The plurality of substrates are transported from the first end of the transport section to the second end in the first direction while being stored in a carrier. The plurality of substrates transported to the second end of the transport section are transported from the fourth end of the processing section to the third end in the second direction while being stored in the carrier. During the transport, the carrier storing the plurality of substrates is immersed in at least one of a plurality of processing liquids stored in a plurality of processing tanks between the fourth end and the third end. In this way, a preset process is performed on the plurality of substrates stored in the carrier in common. The processed plurality of substrates are transferred to the substrate loading and unloading section and are transported out.

根據上述構成,由於處理部之第3端部與第4端部隔著複數個處理槽而隔開,故用以將基板移交給處理部之第4端部之構成及用以自處理部之第3端部取出基板之構成無法接近而設置。再者,以與處理部之至少一部分相鄰之方式,形成有保養空間。因此,對於基板處理裝置之各部,容易確保足夠大之保養空間。再者,根據上述構成,無需將搬送部設置於俯視下偏離處理部及保養空間之位置。According to the above structure, since the third end and the fourth end of the processing section are separated by a plurality of processing tanks, the structure for transferring the substrate to the fourth end of the processing section and the structure for taking out the substrate from the third end of the processing section cannot be arranged close to each other. Furthermore, a maintenance space is formed in a manner adjacent to at least a part of the processing section. Therefore, it is easy to ensure a sufficiently large maintenance space for each part of the substrate processing device. Furthermore, according to the above structure, it is not necessary to arrange the conveying section at a position that is offset from the processing section and the maintenance space when viewed from above.

其等之結果,可抑制佔地面積擴大且提高基板處理裝置之各部之保養之作業性。As a result, the footprint expansion can be suppressed and the maintenance workability of each part of the substrate processing device can be improved.

(2)處理部可容許載體向第2方向移動,且限制載體向第1方向移動。該情形時,將處理部中之載體之移動方向限制在第2方向。藉此,於處理部中搬送複數個載體時,抑制因一載體與另一載體互相朝相反方向移動引起之干擾之產生。(2) The processing section allows the carrier to move in the second direction and restricts the carrier from moving in the first direction. In this case, the moving direction of the carrier in the processing section is restricted to the second direction. In this way, when a plurality of carriers are transported in the processing section, interference caused by one carrier and another carrier moving in opposite directions is suppressed.

又,由於載體於處理部內不沿第1及第2方向往復移動,故俯視下處理部中之載體之搬送路徑之長度不超過處理部之第3端部與第4端部之間之距離。因此,抑制載體之搬送路徑過度變長。Furthermore, since the carrier does not reciprocate in the first and second directions in the processing section, the length of the carrier transport path in the processing section in a top view does not exceed the distance between the third end and the fourth end of the processing section. Therefore, the carrier transport path is prevented from becoming excessively long.

(3)保養空間可以與複數個處理槽相鄰之方式形成,搬送部可設置於較保養空間及複數個處理槽更上方之位置。該情形時,由於保養空間與複數個處理槽相鄰,故對於複數個處理槽之保養之作業性提高。又,由於搬送部位於較保養空間及複數個處理槽更上方之位置,故防止於保養空間及複數個處理槽中產生之微粒等附著於搬送中之複數片基板上。(3) The maintenance space can be formed in a manner adjacent to the plurality of processing tanks, and the transport unit can be arranged at a position higher than the maintenance space and the plurality of processing tanks. In this case, since the maintenance space is adjacent to the plurality of processing tanks, the workability of the maintenance of the plurality of processing tanks is improved. In addition, since the transport unit is located at a position higher than the maintenance space and the plurality of processing tanks, it is prevented that particles generated in the maintenance space and the plurality of processing tanks are attached to the plurality of substrates being transported.

(4)搬送部亦可於俯視下與保養空間之至少一部分重疊,且於俯視下不與處理部重疊。該情形時,可有效利用保養空間之上方之空間。又,由於在處理部之上方未設置搬送部,故處理部之高度方向上之設計之自由度不受搬送部限制。(4) The transport unit may overlap with at least a portion of the maintenance space when viewed from above, and may not overlap with the processing unit when viewed from above. In this case, the space above the maintenance space can be effectively utilized. In addition, since the transport unit is not provided above the processing unit, the degree of freedom in the design of the processing unit in the height direction is not limited by the transport unit.

(5)基板處理裝置亦可進而具備:第1搬送裝置,其將上述載體自上述搬送部之上述第2端部搬送至上述處理部之上述第4端部;且上述基板搬入搬出部包含:基板插入部,其以與上述搬送部之上述第1端部相鄰之方式設置,將搬入至上述基板搬入搬出部之未處理之上述複數片基板插入空的上述載體;基板取出部,其以與上述處理部之上述第3端部相鄰之方式設置,且用以將收納於自上述處理部移交之上述載體中之處理後之上述複數片基板自上述基板搬入搬出部搬出;及第2搬送裝置,其將取出上述複數片基板後之空的上述載體,自上述基板取出部搬送至上述基板插入部。(5) The substrate processing device may further include: a first conveying device, which conveys the above-mentioned carrier from the above-mentioned second end of the above-mentioned conveying section to the above-mentioned fourth end of the above-mentioned processing section; and the above-mentioned substrate loading and unloading section includes: a substrate insertion section, which is arranged in a manner adjacent to the above-mentioned first end of the above-mentioned conveying section, and inserts the above-mentioned plurality of unprocessed substrates loaded into the above-mentioned substrate loading and unloading section into the empty above-mentioned carrier; a substrate removal section, which is arranged in a manner adjacent to the above-mentioned third end of the above-mentioned processing section, and is used to remove the above-mentioned plurality of processed substrates stored in the above-mentioned carrier transferred from the above-mentioned processing section from the above-mentioned substrate loading and unloading section; and a second conveying device, which conveys the empty above-mentioned carrier after taking out the above-mentioned plurality of substrates from the above-mentioned substrate removal section to the above-mentioned substrate insertion section.

該情形時,於基板插入部中,於空的載體中收納未處理之複數片基板。收納有複數片基板之載體藉由搬送部及第1搬送裝置搬送至處理部之第4端部。又,載體於處理部內自第4端部搬送至第3端部。其後,於基板取出部中,自收納有處理後之基板之載體取出處理後之複數片基板。空的載體由第2搬送裝置搬送至基板插入部。藉此,可將搬送至基板插入部之空的載體用於新的複數片基板之處理。因此,無需過多準備用以收納複數片基板之載體。In this case, in the substrate insertion section, multiple unprocessed substrates are stored in an empty carrier. The carrier storing the multiple substrates is transported to the fourth end of the processing section by the conveying section and the first conveying device. Furthermore, the carrier is transported from the fourth end to the third end in the processing section. Thereafter, in the substrate removal section, multiple processed substrates are removed from the carrier storing the processed substrates. The empty carrier is transported to the substrate insertion section by the second conveying device. Thus, the empty carrier transported to the substrate insertion section can be used to process multiple new substrates. Therefore, there is no need to prepare too many carriers for storing multiple substrates.

(6)本發明亦可進而具備:載體洗淨部,其將取出由處理部處理後之複數片基板後之空的載體洗淨。該情形時,可將洗淨後之清潔之載體用於新的複數片基板之處理。 [發明之效果] (6) The present invention may further include: a carrier cleaning section that cleans the empty carrier after taking out the plurality of substrates processed by the processing section. In this case, the clean carrier after cleaning can be used to process a new plurality of substrates. [Effects of the invention]

根據本發明,可抑制佔地面積擴大且提高基板處理裝置之各部之保養之作業性。According to the present invention, the expansion of the floor space occupied can be suppressed and the maintenance workability of each part of the substrate processing device can be improved.

以下,參考圖式且說明本發明之一實施形態之基板處理裝置。於以下說明中,基板係指用於液晶顯示裝置或有機EL(Electro Luminescence)顯示裝置等之FPD(Flat Panel Display)用基板、半導體基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用基板、陶瓷基板或太陽能電池用基板等。又,以下說明之基板於俯視下具有矩形狀。Hereinafter, a substrate processing device according to an embodiment of the present invention will be described with reference to the drawings. In the following description, a substrate refers to a FPD (Flat Panel Display) substrate, a semiconductor substrate, an optical disk substrate, a magnetic disk substrate, a magneto-optical disk substrate, a mask substrate, a ceramic substrate, or a solar cell substrate, etc., which is used for a liquid crystal display device or an organic EL (Electro Luminescence) display device. In addition, the substrate described below has a rectangular shape when viewed from above.

<1>基板處理裝置之構成 (1)全體構成及方向之定義 圖1係顯示本發明之一實施形態之基板處理裝置之基本構成之模式性俯視圖。圖2係圖1之A-A線處之基板處理裝置1之模式性剖視圖。如圖1及圖2所示,基板處理裝置1主要具備基板搬入搬出區塊100、中繼區塊200、處理區塊300及洗淨區塊400。 <1> Structure of substrate processing device (1) Definition of overall structure and direction FIG. 1 is a schematic top view showing the basic structure of a substrate processing device of one embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing device 1 at line A-A of FIG. 1 . As shown in FIG. 1 and FIG. 2 , the substrate processing device 1 mainly includes a substrate loading and unloading block 100, a relay block 200, a processing block 300, and a cleaning block 400.

此處,於圖1及圖2之後之指定圖中,為明確基板處理裝置1之各構成要件之位置關係,而標註表示互相正交之X方向、Y方向及Z方向之箭頭。X方向及Y方向於水平面內互相正交,Z方向相當於鉛直方向。又,於各方向中將箭頭所朝向之方向設為+方向,將與該+方向相反之方向設為-方向。於以下說明中,於簡稱為X方向之情形時,該X方向包含+X方向及-X方向。又,於簡稱為Y方向之情形時,該Y方向包含+Y方向及-Y方向。又,於簡稱為Z方向之情形時,該Z方向包含+Z方向及-Z方向。Here, in the designated figures after FIG. 1 and FIG. 2, in order to clarify the positional relationship of each component of the substrate processing device 1, arrows representing mutually orthogonal X direction, Y direction and Z direction are marked. The X direction and the Y direction are mutually orthogonal in the horizontal plane, and the Z direction is equivalent to the vertical direction. In addition, in each direction, the direction pointed by the arrow is set as the + direction, and the direction opposite to the + direction is set as the - direction. In the following description, when it is simply referred to as the X direction, the X direction includes the +X direction and the -X direction. In addition, when it is simply referred to as the Y direction, the Y direction includes the +Y direction and the -Y direction. In addition, when it is simply referred to as the Z direction, the Z direction includes the +Z direction and the -Z direction.

(2)基板搬入搬出區塊100 基板搬入搬出區塊100包含複數個晶圓傳送盒架110、晶圓傳送盒搬送裝置111、112、開閉器120、130、基板交接機器人140、150、2個晶圓傳送盒載置部190及控制部160(圖2)。又,基板搬入搬出區塊100具有構成基板處理裝置1之外壁之一部分之端面部101、一側面部102及另一側面部103。端面部101位於朝向-X方向之基板處理裝置1之一端部,且與X方向正交。一側面部102及另一側面部103以於Y方向上互相對向之方式,於俯視下自端面部101之兩端部朝+X方向平行延伸。 (2) Substrate loading and unloading block 100 The substrate loading and unloading block 100 includes a plurality of wafer cassette racks 110, wafer cassette transport devices 111, 112, openers 120, 130, substrate transfer robots 140, 150, two wafer cassette loading units 190, and a control unit 160 (Figure 2). In addition, the substrate loading and unloading block 100 has an end portion 101, a side portion 102, and another side portion 103 constituting a portion of the outer wall of the substrate processing device 1. The end portion 101 is located at one end of the substrate processing device 1 facing the -X direction and is orthogonal to the X direction. The side portion 102 and the other side portion 103 extend parallel to each other in the Y direction from both ends of the end portion 101 in a plan view toward the +X direction.

2個晶圓傳送盒載置部190以自端面部101朝-X方向突出之方式設置。各晶圓傳送盒載置部190構成為可載置多段收納複數片基板之晶圓傳送盒(FOUP:Front Opening Unified Pod)8。於端面部101中,於與各晶圓傳送盒載置部190對應之部分,形成有用以使晶圓傳送盒8於X方向通過之未圖示之通路開口部。Two wafer cassette loading sections 190 are provided so as to protrude from the end surface 101 in the -X direction. Each wafer cassette loading section 190 is configured to load a wafer cassette (FOUP: Front Opening Unified Pod) 8 that can store multiple substrates in multiple stages. In the end surface 101, at a portion corresponding to each wafer cassette loading section 190, a passage opening (not shown) is formed for allowing the wafer cassette 8 to pass in the X direction.

於晶圓傳送盒8中,形成有用以自該晶圓傳送盒8之內部空間取出基板、及用以將基板插入該晶圓傳送盒8之內部空間之開口部。又,晶圓傳送盒8包含用以將該開口部開閉之蓋。晶圓傳送盒8之開口部於晶圓傳送盒8之搬送時及待機時封閉,於對晶圓傳送盒8取出及插入基板時開放。於圖1及圖2中,為可明確區分晶圓傳送盒8與後述之載體9,對晶圓傳送盒8標註有陰影線,對載體9標註有點圖案。於圖1之例中,於排列在Y方向之2個晶圓傳送盒載置部190中之一晶圓傳送盒載置部190載置有晶圓傳送盒8,於另一晶圓傳送盒載置部190未載置晶圓傳送盒8。The wafer transfer box 8 has an opening for taking out a substrate from the inner space of the wafer transfer box 8 and for inserting a substrate into the inner space of the wafer transfer box 8. The wafer transfer box 8 also includes a cover for opening and closing the opening. The opening of the wafer transfer box 8 is closed when the wafer transfer box 8 is being transported and on standby, and is opened when taking out and inserting a substrate into the wafer transfer box 8. In FIG. 1 and FIG. 2, in order to clearly distinguish the wafer transfer box 8 from the carrier 9 described later, the wafer transfer box 8 is marked with a hatched line, and the carrier 9 is marked with a dot pattern. In the example of FIG. 1 , a wafer cassette 8 is placed on one of the two wafer cassette placement portions 190 arranged in the Y direction, and no wafer cassette 8 is placed on the other wafer cassette placement portion 190 .

複數個晶圓傳送盒架110於與端面部101在+X方向上離開規定距離之位置,以互相隔開之方式設置。本例中,16個晶圓傳送盒架110以於與Z方向及Y方向平行之面內呈4列4行排列之方式,藉由未圖示之固定構件固定。各晶圓傳送盒架110構成為可載置晶圓傳送盒8。於圖1之例中,於位於最上段之4個晶圓傳送盒架110中之3個晶圓傳送盒架110各者載置有晶圓傳送盒8,於剩餘之1個晶圓傳送盒架110未載置晶圓傳送盒8。晶圓傳送盒8之數量或晶圓傳送盒架110之排列可根據裝置設計規格適當變更。A plurality of wafer transfer box racks 110 are arranged at a predetermined distance from the end surface portion 101 in the +X direction in a manner of being spaced apart from each other. In this example, 16 wafer transfer box racks 110 are arranged in 4 rows and 4 columns in a plane parallel to the Z direction and the Y direction and are fixed by a fixing member not shown in the figure. Each wafer transfer box rack 110 is configured to carry a wafer transfer box 8. In the example of FIG. 1 , three of the four wafer transfer box racks 110 located at the uppermost stage are each loaded with a wafer transfer box 8, and the remaining one wafer transfer box rack 110 is not loaded with a wafer transfer box 8. The number of wafer transfer boxes 8 or the arrangement of the wafer transfer box racks 110 can be appropriately changed according to the device design specifications.

2個開閉器120、130於與複數個晶圓傳送盒架110在+X方向上離開規定距離之位置,以互相隔開之方式設置。本例中,2個開閉器120、130以於Y方向上排列之方式,藉由未圖示之固定構件固定。一開閉器120位於一側面部102附近,另一開閉器130位於另一側面部103附近。各開閉器120、130構成為可載置晶圓傳送盒8且可將所載置之晶圓傳送盒8之蓋開閉。於圖1之例中,於一開閉器120載置有晶圓傳送盒8,於另一開閉器130上未載置晶圓傳送盒8。The two openers 120 and 130 are arranged at a predetermined distance from the plurality of wafer cassette racks 110 in the +X direction and are spaced apart from each other. In this example, the two openers 120 and 130 are arranged in the Y direction and fixed by a fixing member not shown. One opener 120 is located near one side surface 102, and the other opener 130 is located near the other side surface 103. Each opener 120 and 130 is configured to carry a wafer cassette 8 and to open and close the cover of the carried wafer cassette 8. In the example of FIG. 1 , a wafer cassette 8 is carried on one opener 120, and no wafer cassette 8 is carried on the other opener 130.

基板交接機器人140設置為於+X方向上與開閉器120相鄰。基板交接機器人140構成為可繞Z方向之軸旋轉且可沿Z方向移動(可升降)。於基板交接機器人140中,設置有用以交接1片或複數片基板之手。手由多關節型臂支持,可於水平方向進退。基板交接機器人140用於在將收納有未處理之基板之晶圓傳送盒8載置於開閉器120之狀態下,自該晶圓傳送盒8取出基板,並將取出之基板插入配置於中繼區塊200內之後述之載體9內。The substrate transfer robot 140 is arranged adjacent to the switch 120 in the +X direction. The substrate transfer robot 140 is configured to be rotatable around an axis in the Z direction and movable (liftable) in the Z direction. The substrate transfer robot 140 is provided with a hand for transferring one or more substrates. The hand is supported by a multi-joint arm and can move forward and backward in the horizontal direction. The substrate transfer robot 140 is used to take out a substrate from a wafer transfer box 8 containing unprocessed substrates while the wafer transfer box 8 is placed on the switch 120, and insert the taken-out substrate into a carrier 9 described later and arranged in the relay block 200.

基板交接機器人150設置為於+X方向上與開閉器130相鄰。基板交接機器人150具有與基板交接機器人140相同之構成。基板交接機器人150用於在將空的晶圓傳送盒8載置於開閉器130之狀態下,自配置於中繼區塊200內之後述之載體9中取出基板,並將取出之基板插入開閉器130上之晶圓傳送盒8內。The substrate transfer robot 150 is disposed adjacent to the shutter 130 in the +X direction. The substrate transfer robot 150 has the same structure as the substrate transfer robot 140. The substrate transfer robot 150 is used to take out a substrate from a carrier 9 to be described later arranged in the relay block 200 when an empty wafer cassette 8 is placed on the shutter 130, and insert the taken-out substrate into the wafer cassette 8 on the shutter 130.

晶圓傳送盒搬送裝置111位於X方向上之端面部101與複數個晶圓傳送盒架110之間。晶圓傳送盒搬送裝置111具有構成為可固持晶圓傳送盒8之未圖示之固持部,且構成為可使該固持部於Y方向移動及於Z方向移動。藉此,晶圓傳送盒搬送裝置111於2個晶圓傳送盒載置部190之任一者、與複數個晶圓傳送盒架110之任一者之間搬送晶圓傳送盒8。The wafer cassette transport device 111 is located between the end surface portion 101 in the X direction and the plurality of wafer cassette racks 110. The wafer cassette transport device 111 has a holding portion (not shown) configured to hold the wafer cassette 8, and is configured to move the holding portion in the Y direction and in the Z direction. Thus, the wafer cassette transport device 111 transports the wafer cassette 8 between any one of the two wafer cassette placement portions 190 and any one of the plurality of wafer cassette racks 110.

晶圓傳送盒搬送裝置112位於X方向上之複數個晶圓傳送盒架110與2個開閉器120、130之間。晶圓傳送盒搬送裝置112具有與晶圓傳送盒搬送裝置111相同之構成。晶圓傳送盒搬送裝置112於複數個晶圓傳送盒架110之任一者、與2個開閉器120、130之任一者之間搬送晶圓傳送盒8。The wafer cassette transport device 112 is located between the plurality of wafer cassette racks 110 and the two shutters 120 and 130 in the X direction. The wafer cassette transport device 112 has the same structure as the wafer cassette transport device 111. The wafer cassette transport device 112 transports the wafer cassette 8 between any one of the plurality of wafer cassette racks 110 and any one of the two shutters 120 and 130.

控制部160(圖2)包含含有CPU(Central Processing Unit:中央運算處理裝置)、ROM(Read Only Memory:唯讀記憶體)及RAM(Random Access Memory:隨機存取記憶體)之電腦等,且控制基板處理裝置1內之各構成要件之動作。The control unit 160 ( FIG. 2 ) includes a computer including a CPU (Central Processing Unit), a ROM (Read Only Memory), and a RAM (Random Access Memory), and controls the operation of each component in the substrate processing apparatus 1 .

(3)中繼區塊200 中繼區塊200主要具備2個載體支持部210、220、第1待機部230、第2待機部240及待機搬送裝置250。載體支持部210設置為於+X方向上與基板搬入搬出區塊100之基板交接機器人140相鄰。又,載體支持部210構成為可支持多段收納複數片基板之載體9。稍後敘述載體9之細節。再者,載體支持部210構成為可支持載體9,且變更所支持之載體9之姿勢。稍後敘述用以變更載體9之姿勢之載體支持部210之構成之細節。另,於圖1之例中,於載體支持部210上支持有載體9。 (3) Relay block 200 The relay block 200 mainly includes two carrier support sections 210 and 220, a first standby section 230, a second standby section 240, and a standby conveying device 250. The carrier support section 210 is disposed adjacent to the substrate transfer robot 140 of the substrate loading and unloading block 100 in the +X direction. In addition, the carrier support section 210 is configured to support a carrier 9 that stores a plurality of substrates in multiple stages. The details of the carrier 9 will be described later. Furthermore, the carrier support section 210 is configured to support the carrier 9 and change the posture of the supported carrier 9. The details of the structure of the carrier support section 210 for changing the posture of the carrier 9 will be described later. In addition, in the example of FIG. 1 , a carrier 9 is supported on the carrier support portion 210 .

載體支持部220設置為於+X方向上與基板搬入搬出區塊100之基板交接機器人150相鄰。又,載體支持部220具有與載體支持部210相同之構成。另,於圖1之例中,於載體支持部220上未支持載體9。The carrier support part 220 is disposed adjacent to the substrate transfer robot 150 of the substrate loading/unloading block 100 in the +X direction. The carrier support part 220 has the same structure as the carrier support part 210. In the example of FIG. 1 , the carrier 9 is not supported on the carrier support part 220.

第1待機部230設置為於+X方向上與載體支持部210相鄰。又,第1待機部230構成為可支持載體9。再者,第1待機部230構成為可將由該第1待機部230支持之載體9移交給載體支持部210、及自載體支持部210接收由載體支持部210支持之載體9。The first standby section 230 is disposed adjacent to the carrier support section 210 in the +X direction. The first standby section 230 is configured to support the carrier 9. Furthermore, the first standby section 230 is configured to transfer the carrier 9 supported by the first standby section 230 to the carrier support section 210 and receive the carrier 9 supported by the carrier support section 210 from the carrier support section 210.

第2待機部240設置為於+X方向上與載體支持部220相鄰。又,第2待機部240構成為可支持載體9。再者,第2待機部240構成為可將由該第2待機部240支持之載體9移交給載體支持部220、及自載體支持部220接收由載體支持部220支持之載體9。The second standby section 240 is disposed adjacent to the carrier support section 220 in the +X direction. The second standby section 240 is configured to support the carrier 9. Furthermore, the second standby section 240 is configured to transfer the carrier 9 supported by the second standby section 240 to the carrier support section 220 and receive the carrier 9 supported by the carrier support section 220 from the carrier support section 220.

待機搬送裝置250設置於第1待機部230與第2待機部240之間。待機搬送裝置250構成為可保持載體9且可於第1待機部230與第2待機部240之間於Y方向移動。待機搬送裝置250例如將由第2待機部240支持之載體9搬送至第1待機部230。The standby conveying device 250 is provided between the first standby section 230 and the second standby section 240. The standby conveying device 250 is configured to hold the carrier 9 and to be movable in the Y direction between the first standby section 230 and the second standby section 240. The standby conveying device 250 conveys the carrier 9 supported by the second standby section 240 to the first standby section 230, for example.

(4)處理區塊300 處理區塊300包含第1搬送部310、第2搬送部320及處理部330。第1搬送部310及處理部330設置為依序排列於+Y方向上,且自中繼區塊200朝+X方向並行延伸。第2搬送部320以於Y方向延伸之方式形成,連接第1搬送部310之朝向+X方向之端部、與處理部330之朝向+X方向之端部。 (4) Processing block 300 The processing block 300 includes a first conveying unit 310, a second conveying unit 320, and a processing unit 330. The first conveying unit 310 and the processing unit 330 are arranged in sequence in the +Y direction and extend in parallel from the relay block 200 in the +X direction. The second conveying unit 320 is formed in a manner extending in the Y direction, connecting the end of the first conveying unit 310 facing the +X direction and the end of the processing unit 330 facing the +X direction.

於以下說明中,將於X方向延伸之第1搬送部310之兩端部中朝向-X方向之端部適當稱為第1端部TA1,將朝向+X方向之另一端部適當稱為第2端部TA2。又,將於X方向延伸之處理部330之兩端部中朝向-X方向之一端部適當稱為第3端部TA3,將朝向+X方向之另一端部適當稱為第4端部TA4。In the following description, of the two ends of the first conveying unit 310 extending in the X direction, the end facing the -X direction is appropriately referred to as the first end TA1, and the other end facing the +X direction is appropriately referred to as the second end TA2. In addition, of the two ends of the processing unit 330 extending in the X direction, one end facing the -X direction is appropriately referred to as the third end TA3, and the other end facing the +X direction is appropriately referred to as the fourth end TA4.

第1搬送部310包含主搬送裝置311及2個副搬送裝置312A、312B。主搬送裝置311包含可動載台311a及導軌311b。導軌311b設置為自第1搬送部310之第1端部TA1延伸至第2端部TA2。可動載台311a構成為可於導軌311b上於X方向移動且可載置載體9。主搬送裝置311進而具備使可動載台311a於導軌311b上沿X方向移動之未圖示之驅動機構。藉此,主搬送裝置311於在靠近中繼區塊200之第1端部TA1,將載體9載置於可動載台311a上之情形時,將所載置之載體9於+X方向上搬送至靠近第2搬送部320之第2端部TA2。The first conveying section 310 includes a main conveying device 311 and two auxiliary conveying devices 312A and 312B. The main conveying device 311 includes a movable stage 311a and a guide rail 311b. The guide rail 311b is provided to extend from the first end TA1 to the second end TA2 of the first conveying section 310. The movable stage 311a is configured to be movable in the X direction on the guide rail 311b and to carry the carrier 9. The main conveying device 311 further includes a driving mechanism (not shown) that moves the movable stage 311a along the guide rail 311b in the X direction. Thereby, when the main transport device 311 places the carrier 9 on the movable stage 311 a at the first end TA1 close to the relay block 200 , the placed carrier 9 is transported in the +X direction to the second end TA2 close to the second transport unit 320 .

副搬送裝置312A及副搬送裝置312B分別設置於X方向上之第1搬送部310之第1端部TA1及第2端部TA2。副搬送裝置312A於載體支持部210支持有收納未處理之基板之載體9之情形時,將該載體9載置於在第1端部TA1配置之主搬送裝置311之可動載台311a上。又,副搬送裝置312A自第1待機部230向載體支持部210搬送空的載體9。另一方面,副搬送裝置312B於載置有載體9之可動載台311a移動至第2端部TA2之情形時,將該載體9移交給第2搬送部320之後述之搬送裝置321。The auxiliary conveying device 312A and the auxiliary conveying device 312B are respectively provided at the first end TA1 and the second end TA2 of the first conveying section 310 in the X direction. When the carrier support section 210 supports the carrier 9 storing an unprocessed substrate, the auxiliary conveying device 312A places the carrier 9 on the movable stage 311a of the main conveying device 311 arranged at the first end TA1. In addition, the auxiliary conveying device 312A conveys an empty carrier 9 from the first standby section 230 to the carrier support section 210. On the other hand, when the movable stage 311a carrying the carrier 9 moves to the second end TA2, the auxiliary conveying device 312B transfers the carrier 9 to the conveying device 321 described later of the second conveying section 320.

此處,如圖2所示,第1搬送部310設置於與基板處理裝置1之設置面於+Z方向(上方)上離開之位置。藉此,位於第1搬送部310之-Z方向(下方)之空間可作為後述之用以保養處理部330之保養空間MS1使用。因此,於本實施形態之基板處理裝置1中,如圖1所示,於俯視下第1搬送部310與處理部330之保養空間MS1重疊。於後述之圖8中,於保養空間MS1中,顯示於第1搬送部310之下方對處理部330進行保養作業之作業者WP。Here, as shown in FIG. 2 , the first conveying unit 310 is disposed at a position separated from the installation surface of the substrate processing apparatus 1 in the +Z direction (upper direction). Thus, the space located in the -Z direction (lower direction) of the first conveying unit 310 can be used as a maintenance space MS1 for maintaining the processing unit 330 described later. Therefore, in the substrate processing apparatus 1 of the present embodiment, as shown in FIG. 1 , the first conveying unit 310 and the maintenance space MS1 of the processing unit 330 overlap in a top view. In FIG. 8 described later, in the maintenance space MS1, an operator WP performing maintenance work on the processing unit 330 is shown below the first conveying unit 310.

第2搬送部320包含搬送裝置321。搬送裝置321構成為可支持載體9,且變更所支持之載體9之姿勢。稍後敘述用以變更載體9之姿勢之搬送裝置321之構成之細節。再者,搬送裝置321構成為可於Y方向移動。藉此,第2搬送部320可於第1搬送部310之第2端部TA2附近,自副搬送裝置312B接收載體9。又,第2搬送部320可變更自副搬送裝置312B接收到之載體9之姿勢,並使該載體9移動至處理部330之第4端部TA4附近之位置。The second conveying section 320 includes a conveying device 321. The conveying device 321 is configured to support the carrier 9 and change the posture of the supported carrier 9. The details of the structure of the conveying device 321 for changing the posture of the carrier 9 will be described later. Furthermore, the conveying device 321 is configured to be movable in the Y direction. Thereby, the second conveying section 320 can receive the carrier 9 from the auxiliary conveying device 312B near the second end TA2 of the first conveying section 310. In addition, the second conveying section 320 can change the posture of the carrier 9 received from the auxiliary conveying device 312B and move the carrier 9 to a position near the fourth end TA4 of the processing section 330.

處理部330包含複數個(本例中為5個)液體處理單元331、乾燥單元332及(本例中為3個)複數個主搬送裝置333A、333B、333C。複數個液體處理單元331及乾燥單元332以乾燥單元332位於第3端部TA3之方式排列於X方向。The processing section 330 includes a plurality of (five in this example) liquid processing units 331, a drying unit 332, and a plurality of (three in this example) main transport devices 333A, 333B, and 333C. The plurality of liquid processing units 331 and the drying unit 332 are arranged in the X direction such that the drying unit 332 is located at the third end TA3.

複數個主搬送裝置333A、333B、333C設置為依序自第3端部TA3朝向第4端部TA4排列於沿+X方向延伸之一條直線上。各主搬送裝置333A、333B、333C構成為可保持載體9,且構成為可於複數個液體處理單元331及乾燥單元332之間搬送所保持之載體9。位於離中繼區塊200最遠之位置之主搬送裝置333C於第2搬送部320中將載體9搬送至處理部330附近之情形時,接收該載體9。又,主搬送裝置333C將接收到之載體9搬送至複數個液體處理單元331之任一者。The plurality of main transport devices 333A, 333B, and 333C are arranged in sequence from the third end TA3 toward the fourth end TA4 on a straight line extending in the +X direction. Each of the main transport devices 333A, 333B, and 333C is configured to hold the carrier 9 and to transport the held carrier 9 between the plurality of liquid processing units 331 and the drying unit 332. The main transport device 333C located at the farthest position from the relay block 200 receives the carrier 9 when the second transport unit 320 transports the carrier 9 to the vicinity of the processing unit 330. Furthermore, the main transport device 333C transports the received carrier 9 to any one of the plurality of liquid processing units 331.

複數個液體處理單元331各自具備1個或複數個處理槽331a及升降機331b。本例之各液體處理單元331具備2個處理槽331a。各處理槽331a構成為可自該處理槽331a之上方之位置插入及取出載體9。又,於處理槽331a中,貯存有用以將收納於載體9之複數片基板洗淨之處理液(藥液或清洗液)。Each of the plurality of liquid processing units 331 has one or more processing tanks 331a and an elevator 331b. In this example, each liquid processing unit 331 has two processing tanks 331a. Each processing tank 331a is configured so that the carrier 9 can be inserted and removed from the upper position of the processing tank 331a. In addition, the processing tank 331a stores a processing liquid (chemical liquid or cleaning liquid) for cleaning the plurality of substrates stored in the carrier 9.

各液體處理單元331之升降機331b構成為可保持載體9。又,升降機331b構成為可自複數個主搬送裝置333A、333B、333C之任一者接收載體9、及將載體9移交給複數個主搬送裝置333A、333B、333C之任一者。再者,升降機331b構成為可對該液體處理單元331之2個處理槽331a各者,將載體9浸漬於處理液中、及自處理液中提起載體9。藉此,藉由將收納有未處理之基板之載體9移交給處理部330,而將收納於該載體9之複數片基板於1種或複數種處理液中浸漬規定時間,而對複數片基板進行共通之處理。The lift 331b of each liquid processing unit 331 is configured to hold the carrier 9. Furthermore, the lift 331b is configured to receive the carrier 9 from any one of the plurality of main transport devices 333A, 333B, and 333C, and to transfer the carrier 9 to any one of the plurality of main transport devices 333A, 333B, and 333C. Furthermore, the lift 331b is configured to immerse the carrier 9 in the processing liquid and lift the carrier 9 from the processing liquid for each of the two processing tanks 331a of the liquid processing unit 331. In this way, by transferring the carrier 9 containing the unprocessed substrate to the processing unit 330, the plurality of substrates stored in the carrier 9 are immersed in one or more processing liquids for a predetermined time, and the plurality of substrates are subjected to a common process.

乾燥單元332對由位於最靠近中繼區塊200之位置之主搬送裝置333A搬送之載體9進行乾燥處理。藉由該乾燥處理,收納於載體9內之複數片基板乾燥。乾燥處理後之載體9藉由位於最靠近中繼區塊200之位置之主搬送裝置333A移交給中繼區塊200之第2待機部240。The drying unit 332 performs a drying process on the carrier 9 transported by the main transport device 333A located closest to the relay block 200. The plurality of substrates stored in the carrier 9 are dried by the drying process. The carrier 9 after the drying process is transferred to the second standby unit 240 of the relay block 200 by the main transport device 333A located closest to the relay block 200.

此處,於複數個液體處理單元331之複數個處理槽331a,將分別與應對基板進行之複數個處理對應之複數種處理液以依應對基板進行之處理之順序排列於-X方向之方式貯存。圖2之控制部160容許主搬送裝置333A、333B、333C各者於保持載體9之狀態下於-X方向移動,且限制於保持載體9之狀態下於+X方向移動。該情形時,於藉由複數個主搬送裝置333A、333B、333C搬送複數個載體9時,抑制因一載體9與另一載體9互相朝相反方向移動引起之干擾之產生。又,由於載體9於處理部330內不於X方向往復移動,故處理部330中之載體9之搬送路徑之長度不超過處理部330之X方向之長度。Here, in the plurality of processing tanks 331a of the plurality of liquid processing units 331, a plurality of processing liquids corresponding to the plurality of processing to be performed on the substrate are stored in the order of the processing to be performed on the substrate in the -X direction. The control unit 160 of FIG. 2 allows each of the main transport devices 333A, 333B, and 333C to move in the -X direction while holding the carrier 9, and restricts the movement in the +X direction while holding the carrier 9. In this case, when the plurality of carriers 9 are transported by the plurality of main transport devices 333A, 333B, and 333C, the generation of interference caused by one carrier 9 and another carrier 9 moving in opposite directions is suppressed. In addition, since the carrier 9 does not reciprocate in the X direction in the processing section 330, the length of the transport path of the carrier 9 in the processing section 330 does not exceed the length of the processing section 330 in the X direction.

如圖1中虛線所示,於處理區塊300及其附近之區域中,除上述保養空間MS1外,還於處理部330之+Y方向側進而形成有保養空間MS2。如此,藉由以於Y方向上隔著處理部330之方式形成2個保養空間MS1、MS2,而確保對於處理部330之足夠大之保養空間。As shown by the dotted line in FIG1 , in the processing block 300 and the vicinity thereof, in addition to the maintenance space MS1, a maintenance space MS2 is formed laterally in the +Y direction of the processing section 330. In this way, by forming two maintenance spaces MS1 and MS2 in a manner that separates the processing section 330 in the Y direction, a sufficiently large maintenance space is ensured for the processing section 330.

(5)洗淨區塊400 洗淨區塊400包含洗淨搬送裝置410及載體洗淨單元420。載體洗淨單元420設置為於基板搬入搬出區塊100及中繼區塊200之側方(+Y方向)之位置於X方向延伸。又,載體洗淨單元420包含以於X方向排列之方式設置之複數個載體洗淨槽421、載體乾燥部422及複數個載體待機部423。 (5) Cleaning block 400 The cleaning block 400 includes a cleaning conveying device 410 and a carrier cleaning unit 420. The carrier cleaning unit 420 is disposed to extend in the X direction at a position to the side (+Y direction) of the substrate loading and unloading block 100 and the relay block 200. In addition, the carrier cleaning unit 420 includes a plurality of carrier cleaning tanks 421, a carrier drying section 422, and a plurality of carrier standby sections 423 arranged in the X direction.

複數個載體洗淨槽421、載體乾燥部422及複數個載體待機部423各者構成為可自該槽、乾燥部或待機部之上方之位置插入及取出載體9。又,於複數個載體洗淨槽421各者,貯存有用以將載體9洗淨之處理液(藥液或清洗液)。載體乾燥部422對插入之載體9進行乾燥處理。Each of the plurality of carrier cleaning tanks 421, the carrier drying section 422 and the plurality of carrier standby sections 423 is configured to allow the carrier 9 to be inserted and removed from a position above the tank, the drying section or the standby section. In addition, each of the plurality of carrier cleaning tanks 421 stores a treatment liquid (chemical solution or cleaning liquid) for washing the carrier 9. The carrier drying section 422 performs a drying process on the inserted carrier 9.

洗淨搬送裝置410構成為可於中繼區塊200之第2待機部240、複數個載體洗淨槽421、載體乾燥部422及複數個載體待機部423之間,搬送空的載體9。於洗淨區塊400中,於複數個載體洗淨槽421之間搬送空的載體9,且浸漬於貯存在任一載體洗淨槽421之處理液中。藉此,將處理區塊300中用於處理複數片基板後之空的載體9洗淨。The cleaning and transporting device 410 is configured to transport empty carriers 9 between the second standby section 240, the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier standby sections 423 of the relay block 200. In the cleaning block 400, the empty carriers 9 are transported between the plurality of carrier cleaning tanks 421 and immersed in the processing liquid stored in any of the carrier cleaning tanks 421. In this way, the empty carriers 9 that have been used to process a plurality of substrates in the processing block 300 are cleaned.

將洗淨後之載體9搬送至載體乾燥部422,進行乾燥處理。將乾燥後之載體9搬送至載體待機部423並予以保持。其後,根據中繼區塊200中之複數片基板之接收時序,藉由洗淨搬送裝置410自載體待機部423取出,並搬送至中繼區塊200之第2待機部240。The cleaned carrier 9 is transported to the carrier drying section 422 for drying. The dried carrier 9 is transported to the carrier standby section 423 and held. Thereafter, according to the receiving sequence of the plurality of substrates in the relay block 200, the carrier 9 is taken out from the carrier standby section 423 by the cleaning transport device 410 and transported to the second standby section 240 of the relay block 200.

<2>載體9之構成及載體9之姿勢 圖3係圖1之基板處理裝置1中使用之載體9之俯視圖,圖4係圖3之載體9之一側視圖,圖5係圖4之B-B線處之載體9之剖視圖。如圖3~圖5所示,載體9包含4個框架構件10a、10b、10c、10d。 <2> Structure of carrier 9 and posture of carrier 9 FIG. 3 is a top view of carrier 9 used in substrate processing device 1 of FIG. 1 , FIG. 4 is a side view of carrier 9 of FIG. 3 , and FIG. 5 is a cross-sectional view of carrier 9 at line B-B of FIG. 4 . As shown in FIG. 3 to FIG. 5 , carrier 9 includes four frame members 10a, 10b, 10c, and 10d.

框架構件10a、10b各者由大致正方形之板狀構件形成,具有較處理對象之基板大之外形。於框架構件10a、10b各者之中央部分,形成有4個開口部13。框架構件10c、10d各者由大致長方形之板狀構件形成。框架構件10c、10d之長邊之長度與框架構件10a、10b之一邊之長度大致相等。Each of the frame members 10a and 10b is formed of a substantially square plate-shaped member and has a larger shape than the substrate to be processed. Four openings 13 are formed in the central portion of each of the frame members 10a and 10b. Each of the frame members 10c and 10d is formed of a substantially rectangular plate-shaped member. The length of the long side of the frame members 10c and 10d is substantially equal to the length of one side of the frame members 10a and 10b.

框架構件10a、10b配置為以互相對向之狀態隔開。以將框架構件10a之一側邊與框架構件10b之一側邊連接之方式設置有框架構件10c。以將框架構件10a之另一側邊與框架構件10b之另一側邊連接之方式設置有框架構件10d。於該狀態下,框架構件10c、10d亦互相對向配置。藉此,載體9具有角筒形狀。The frame members 10a and 10b are arranged to be spaced in a mutually opposed state. The frame member 10c is provided in a manner that one side of the frame member 10a is connected to one side of the frame member 10b. The frame member 10d is provided in a manner that the other side of the frame member 10a is connected to the other side of the frame member 10b. In this state, the frame members 10c and 10d are also arranged to face each other. Thereby, the carrier 9 has a square tube shape.

形成於具有角筒形狀之載體9之一端部之矩形之開口部作為用以將基板插入載體9內、及用以自載體9取出基板之基板出入口12發揮功能。於載體9之另一端部,以將框架構件10a與框架構件10b之間連接且於框架構件10c與框架構件10d之間分散配置之方式,設置有複數個(本例中為6個)支持片11。The rectangular opening formed at one end of the carrier 9 having a square tube shape functions as a substrate entrance 12 for inserting a substrate into the carrier 9 and for taking a substrate out of the carrier 9. At the other end of the carrier 9, a plurality of (six in this example) supporting pieces 11 are provided in a manner connecting the frame members 10a and 10b and dispersedly arranged between the frame members 10c and 10d.

各支持片11由長條狀之板構件構成,且設置成與框架構件10c、10d平行。又,於各支持片11中,以預設之基準間距形成有可供收納於載體9之複數片基板之外緣之一部分插入之未圖示之複數個溝槽。形成於各支持片11之溝槽之數量與應收納於載體9之基板之數量相等。Each support sheet 11 is formed of a long strip plate member and is arranged parallel to the frame members 10c and 10d. In addition, each support sheet 11 is provided with a plurality of grooves (not shown) at a preset reference pitch into which a portion of the outer edges of the plurality of substrates to be accommodated in the carrier 9 can be inserted. The number of grooves formed in each support sheet 11 is equal to the number of substrates to be accommodated in the carrier 9.

於框架構件10c、10d之互相對向之2個面各者,形成有複數個突出部pr。複數個突出部pr形成為沿框架構件10c、10d之長邊方向延伸,且以上述基準間距排列於短邊方向上。藉此,於彼此相鄰之各2個之突出部pr之間,形成有可供基板之外緣插入之溝槽。A plurality of protrusions pr are formed on each of the two mutually facing surfaces of the frame members 10c and 10d. The plurality of protrusions pr are formed to extend along the long side direction of the frame members 10c and 10d and are arranged in the short side direction at the above-mentioned reference pitch. Thus, a groove into which the outer edge of the substrate can be inserted is formed between each two adjacent protrusions pr.

如上所述,於圖1之基板處理裝置1中,適當變更載體9之姿勢。此處,關於具有上述構成之載體9,將以複數個支持片11位於下端部且框架構件10a、10b與鉛直方向平行之方式維持之姿勢稱為鉛直姿勢。另一方面,將以框架構件10a、10b與鉛直方向正交之方式維持之姿勢稱為水平姿勢。As described above, in the substrate processing apparatus 1 of FIG. 1 , the posture of the carrier 9 is appropriately changed. Here, regarding the carrier 9 having the above-mentioned structure, the posture in which the plurality of support pieces 11 are located at the lower end and the frame members 10a, 10b are parallel to the lead vertical direction is referred to as the lead vertical posture. On the other hand, the posture in which the frame members 10a, 10b are perpendicular to the lead vertical direction is referred to as the horizontal posture.

於將複數片基板插入空的載體9之情形時,自處於水平姿勢之載體9之基板出入口12將複數片基板插入載體9之內部。此時,將各基板之外緣中之兩側部(互相對向之兩條邊之部分)插入框架構件10c之複數個突出部pr中之任意2者之間及框架構件10d之複數個突出部pr中之任意2者之間。藉此,於收納有複數片基板之載體9處於水平姿勢之情形時,各基板以該基板之兩側部由複數個突出部pr支持之狀態受保持。另一方面,於收納有複數片基板之載體9處於鉛直姿勢之情形時,各基板以該基板之下端部之複數個部分嵌入複數個支持片11之複數個溝槽之狀態受保持。When inserting a plurality of substrates into an empty carrier 9, the plurality of substrates are inserted into the carrier 9 from the substrate entrance 12 of the carrier 9 in a horizontal position. At this time, the two side portions (parts of two sides facing each other) of the outer edge of each substrate are inserted between any two of the plurality of protrusions pr of the frame member 10c and between any two of the plurality of protrusions pr of the frame member 10d. Thus, when the carrier 9 storing the plurality of substrates is in a horizontal position, each substrate is held in a state where the two side portions of the substrate are supported by the plurality of protrusions pr. On the other hand, when the carrier 9 storing the plurality of substrates is in a vertical position, each substrate is held in a state where the plurality of portions of the lower end of the substrate are embedded in the plurality of grooves of the plurality of support sheets 11.

如上所述,於載體9處於水平姿勢之情形時,所收納之複數片基板各者之兩側部全體由複數個突出部pr支持。另一方面,於載體9處於鉛直姿勢之情形時,所收納之複數片基板各者藉由複數個支持片11局部支持該基板之下端部中之複數個部分。因此,於載體9處於水平姿勢之情形時,與載體9處於鉛直姿勢之情形相比,減少施加至所收納之各基板之外緣之負載(各基板之自重之負載)。As described above, when the carrier 9 is in a horizontal position, both sides of each of the plurality of substrates stored are supported entirely by the plurality of protrusions pr. On the other hand, when the carrier 9 is in a vertical position, each of the plurality of substrates stored is partially supported at a plurality of portions of the lower end of the substrate by the plurality of support sheets 11. Therefore, when the carrier 9 is in a horizontal position, the load (load of the self-weight of each substrate) applied to the outer edge of each stored substrate is reduced compared to the case where the carrier 9 is in a vertical position.

本實施形態之載體9形成為,處於水平姿勢時之該載體9之鉛直方向之尺寸(高度)小於處於鉛直姿勢時之該載體9之鉛直方向之尺寸(高度)。The carrier 9 of this embodiment is formed so that the dimension (height) of the carrier 9 in the vertical direction when in a horizontal position is smaller than the dimension (height) of the carrier 9 in the vertical direction when in a vertical position.

<3>基板處理裝置中之複數片基板及載體9之搬送路徑 圖6~圖8係用以說明圖1之基板處理裝置1中之複數片基板及載體9之搬送路徑之圖。圖6中,與圖1同樣顯示基板處理裝置1之模式性俯視圖。圖7顯示於一方向觀察圖1之基板處理裝置1之模式性外觀立體圖。圖8顯示於另一方向觀察圖1之基板處理裝置1之模式性外觀立體圖。另,於圖7及圖8中,省略圖1之洗淨區塊400之圖示。再者,於圖6~圖8中,除圖8之保養空間MS1外,亦省略圖1之保養空間MS1、MS2之圖示。 <3> Conveying path of multiple substrates and carrier 9 in substrate processing device Figures 6 to 8 are used to illustrate the conveying path of multiple substrates and carrier 9 in substrate processing device 1 of Figure 1. Figure 6 shows a schematic top view of substrate processing device 1 as in Figure 1. Figure 7 shows a schematic external perspective view of substrate processing device 1 of Figure 1 observed from one direction. Figure 8 shows a schematic external perspective view of substrate processing device 1 of Figure 1 observed from another direction. In addition, in Figures 7 and 8, the illustration of cleaning block 400 of Figure 1 is omitted. Furthermore, in Figures 6 to 8, except for maintenance space MS1 of Figure 8, the illustration of maintenance spaces MS1 and MS2 of Figure 1 is also omitted.

設想對收納於一個晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,一個晶圓傳送盒8藉由搬入至基板搬入搬出區塊100,而如圖6所示,載置於開閉器120,且將蓋打開。又,於中繼區塊200之載體支持部210上將空的載體9以水平姿勢支持。此時,載體9之基板出入口12(圖5)以與晶圓傳送盒8對向之方式朝向-X方向。於該狀態下,藉由基板交接機器人140,自一個晶圓傳送盒8取出未處理之複數片基板W,並插入至載體9。於圖6~圖8以粗虛線之箭頭a1表示此時之複數片基板W之搬送路徑。Imagine a situation where a series of processes are performed on a plurality of unprocessed substrates W stored in a wafer transfer box 8. In this situation, a wafer transfer box 8 is moved into the substrate loading and unloading block 100, and as shown in FIG6, is placed on the opening and closing device 120, and the lid is opened. In addition, an empty carrier 9 is supported in a horizontal position on the carrier support portion 210 of the relay block 200. At this time, the substrate entrance 12 (FIG. 5) of the carrier 9 is oriented in the -X direction in a manner opposite to the wafer transfer box 8. In this state, the substrate transfer robot 140 takes out a plurality of unprocessed substrates W from a wafer transfer box 8 and inserts them into the carrier 9. The thick dashed arrow a1 in FIG6 to FIG8 indicates the transfer path of the plurality of substrates W at this time.

其後,已變空之一個晶圓傳送盒8將蓋關閉,由晶圓傳送盒搬送裝置112保持,且載置於複數個晶圓傳送盒架110之任一者。另一方面,收納有複數片基板W之載體9由載體支持部210接收,藉由第1搬送部310之副搬送裝置312A載置於主搬送裝置311之可動載台311a上。圖6~圖8中以粗實線之箭頭a2表示此時之載體9之搬送路徑。Afterwards, the empty wafer cassette 8 closes its lid, is held by the wafer cassette transfer device 112, and is placed on any one of the plurality of wafer cassette racks 110. On the other hand, the carrier 9 containing the plurality of substrates W is received by the carrier support 210, and is placed on the movable stage 311a of the main transfer device 311 by the auxiliary transfer device 312A of the first transfer unit 310. The thick solid arrow a2 in FIGS. 6 to 8 indicates the transfer path of the carrier 9 at this time.

接著,載置於可動載台311a上之載體9以水平姿勢於+X方向上自中繼區塊200之附近位置(第1端部TA1)搬送至第2搬送部320之附近位置(第2端部TA2)。於圖8之對話框BA3內,顯示藉由第1搬送部310之主搬送裝置311搬送之載體9之狀態。Next, the carrier 9 placed on the movable stage 311a is transported in a horizontal position in the +X direction from a position near the intermediate block 200 (first end TA1) to a position near the second transport unit 320 (second end TA2). In the dialog box BA3 of FIG. 8 , the state of the carrier 9 transported by the main transport device 311 of the first transport unit 310 is displayed.

其後,到達第2搬送部320之附近位置之載體9藉由第1搬送部310之副搬送裝置312B移交給第2搬送部320之搬送裝置321。因此,移交給搬送裝置321之載體9之姿勢藉由搬送裝置321而自水平姿勢變更為鉛直姿勢。於圖7之對話框BA2內,模式性顯示搬送裝置321中之載體9之姿勢變更之狀態。Thereafter, the carrier 9 that has reached the vicinity of the second conveying unit 320 is transferred to the conveying device 321 of the second conveying unit 320 by the auxiliary conveying device 312B of the first conveying unit 310. Therefore, the posture of the carrier 9 transferred to the conveying device 321 is changed from the horizontal posture to the vertical posture by the conveying device 321. In the dialog box BA2 of FIG. 7 , the state of the posture change of the carrier 9 in the conveying device 321 is schematically displayed.

如圖7之對話框BA2所示,搬送裝置321包含可動台座322及載體保持具323。可動台座322設置為可於第2搬送部320內於Y方向移動。載體保持具323由第1保持部323a及第2保持部323b構成。第1保持部323a具有可保持處於水平姿勢時之載體9之下端部的矩形之平板形狀。又,第2保持部323b具有可保持處於鉛直姿勢時之載體9之下端部的矩形之平板形狀。As shown in the dialog box BA2 of FIG. 7 , the conveying device 321 includes a movable pedestal 322 and a carrier holder 323. The movable pedestal 322 is configured to be movable in the Y direction within the second conveying section 320. The carrier holder 323 is composed of a first holder 323a and a second holder 323b. The first holder 323a has a rectangular flat plate shape that can hold the lower end of the carrier 9 when it is in a horizontal position. In addition, the second holder 323b has a rectangular flat plate shape that can hold the lower end of the carrier 9 when it is in a vertical position.

第1保持部323a及第2保持部323b以第1保持部323a之一邊與第2保持部323b之一邊互相相接且2個保持部互相正交之方式連接。可動台座322以第1保持部323a及第2保持部323b均與Y方向平行,且載體保持具323可繞於Y方向延伸之軸旋轉之方式,保持載體保持具323之一部分。The first holding portion 323a and the second holding portion 323b are connected in a manner that one side of the first holding portion 323a and one side of the second holding portion 323b are connected to each other and the two holding portions are orthogonal to each other. The movable pedestal 322 holds a portion of the carrier holder 323 in a manner that the first holding portion 323a and the second holding portion 323b are parallel to the Y direction and the carrier holder 323 can rotate around an axis extending in the Y direction.

搬送裝置321進而具有可於可動台座322上調整載體保持具323之旋轉角度之未圖示之驅動部。藉此,於自第1搬送部310接收水平姿勢之載體9之情形時,載體保持具323以第1保持部323a成為水平且第2保持部323b成為鉛直之方式調整旋轉角度。其後,於載體保持具323上接收到水平姿勢之載體9後,載體保持具323以第1保持部323a成為鉛直且第2保持部323b成為水平之方式調整旋轉角度。藉此,載體9之姿勢自水平姿勢變更為鉛直姿勢。The conveying device 321 further has a driving portion (not shown) that can adjust the rotation angle of the carrier holder 323 on the movable pedestal 322. Thereby, when receiving the carrier 9 in a horizontal position from the first conveying portion 310, the carrier holder 323 adjusts the rotation angle in a manner that the first holding portion 323a becomes horizontal and the second holding portion 323b becomes vertical. Thereafter, after receiving the carrier 9 in a horizontal position on the carrier holder 323, the carrier holder 323 adjusts the rotation angle in a manner that the first holding portion 323a becomes vertical and the second holding portion 323b becomes horizontal. Thereby, the posture of the carrier 9 is changed from a horizontal posture to a vertical posture.

搬送裝置321進而具有於第2搬送部320使可動台座322沿Y方向移動之未圖示之驅動部。藉此,以鉛直姿勢維持之載體9以鉛直姿勢於+Y方向上自第1搬送部310之附近位置搬送至處理部330之附近位置。The conveying device 321 further includes a driving unit (not shown) for moving the movable pedestal 322 in the Y direction on the second conveying unit 320. Thus, the carrier 9 maintained in a vertical position is conveyed in a vertical position in the +Y direction from a position near the first conveying unit 310 to a position near the processing unit 330.

其後,藉由處理部330之主搬送裝置333C,自搬送裝置321接收到達至處理部330之附近位置之載體9。由主搬送裝置333C接收到之載體9藉由該主搬送裝置333C及其他主搬送裝置333B、333A搬送至1個或複數個液體處理單元331之任一者,且以維持鉛直姿勢之狀態於各種處理液中浸漬規定期間。藉此,對收納於載體9內之複數片基板W,進行與所浸漬之處理液相應之處理。於圖8之對話框BA4內,顯示藉由處理部330之主搬送裝置333A、333B、333C搬送之載體9之狀態。Thereafter, the carrier 9 that has reached the vicinity of the processing section 330 is received from the conveying device 321 by the main conveying device 333C of the processing section 330. The carrier 9 received by the main conveying device 333C is conveyed to one or more liquid processing units 331 by the main conveying device 333C and other main conveying devices 333B and 333A, and is immersed in various processing liquids for a predetermined period of time while maintaining a lead-up posture. In this way, the plurality of substrates W stored in the carrier 9 are processed according to the immersed processing liquid. In the dialog box BA4 of FIG. 8 , the state of the carrier 9 conveyed by the main conveying devices 333A, 333B, and 333C of the processing section 330 is displayed.

如圖8之對話框BA4所示,各主搬送裝置333A、333B、333C包含可動支持柱333a及一對夾盤構件333b。可動支持柱333a可於X方向移動且可於Z方向移動(可升降)而設置於複數個液體處理單元331之側方(+Y方向側)。以自可動支持柱333a之上端部向液體處理單元331之上方延伸之方式設置有一對夾盤構件333b。一對夾盤構件333b構成為可夾持並保持鉛直姿勢之載體9。再者,各主搬送裝置333A、333B、333C具有可切換藉由一對夾盤構件333b保持載體9、及自一對夾盤構件333b釋放載體9之未圖示之驅動部。藉此,於複數個主搬送裝置333A、333B、333C與複數個液體處理單元331之間進行載體9之交接。As shown in the dialog box BA4 of FIG8 , each main transport device 333A, 333B, 333C includes a movable support column 333a and a pair of chuck components 333b. The movable support column 333a is movable in the X direction and movable in the Z direction (can be raised and lowered) and is disposed on the side (+Y direction side) of the plurality of liquid processing units 331. A pair of chuck components 333b is disposed in a manner extending from the upper end of the movable support column 333a to the upper side of the liquid processing unit 331. The pair of chuck components 333b is configured to clamp and maintain the carrier 9 in an upright position. Furthermore, each main transport device 333A, 333B, 333C has a driving unit (not shown) that can switch between holding the carrier 9 by a pair of chuck components 333b and releasing the carrier 9 from the pair of chuck components 333b. In this way, the carrier 9 is transferred between the plurality of main transport devices 333A, 333B, 333C and the plurality of liquid processing units 331.

其後,收納由處理液處理後之複數片基板W之載體9進而搬送至靠近中繼區塊200之乾燥單元332。藉此,載體9及載體9內之複數片基板W藉由乾燥單元332乾燥。如上所述,圖6~圖8中以粗實線之箭頭a3表示處理區塊300中之載體9之一連串之搬送路徑。Thereafter, the carrier 9 containing the plurality of substrates W treated by the treatment liquid is further transported to the drying unit 332 near the intermediate block 200. Thus, the carrier 9 and the plurality of substrates W in the carrier 9 are dried by the drying unit 332. As described above, the arrow a3 in the thick solid line in FIGS. 6 to 8 indicates a series of transport paths of the carrier 9 in the treatment block 300.

收納有已處理之複數片基板W之載體9藉由主搬送裝置333A自乾燥單元332搬送至中繼區塊200之載體支持部220,且由載體支持部220支持。圖6~圖8中以粗虛線之箭頭a4表示此時之載體9之搬送路徑。The carrier 9 containing the processed substrates W is transferred from the drying unit 332 to the carrier support 220 of the intermediate block 200 by the main transfer device 333A, and is supported by the carrier support 220. The thick dashed arrow a4 in FIG6 to FIG8 indicates the transfer path of the carrier 9 at this time.

因此,移交給載體支持部220之載體9之姿勢藉由載體支持部220而自鉛直姿勢變更為水平姿勢。於圖7之對話框BA1內,模式性顯示載體支持部220中之載體9之姿勢變更之狀態。Therefore, the posture of the carrier 9 transferred to the carrier support unit 220 is changed from the upright posture to the horizontal posture by the carrier support unit 220. In the dialog box BA1 of FIG. 7 , the state of the posture change of the carrier 9 in the carrier support unit 220 is schematically displayed.

如圖7之對話框BA1所示,載體支持部220包含固定於中繼區塊200內之固定台座211及載體保持具212。載體保持具212由第1保持部212a及第2保持部212b構成。第1保持部212a具有可保持處於水平姿勢時之載體9之下端部之矩形之平板形狀。又,第2保持部212b具有可保持處於鉛直姿勢時之載體9之下端部之矩形之平板形狀。As shown in the dialog box BA1 of FIG. 7 , the carrier support part 220 includes a fixed base 211 fixed in the relay block 200 and a carrier holder 212. The carrier holder 212 is composed of a first holder 212a and a second holder 212b. The first holder 212a has a rectangular flat plate shape that can hold the lower end of the carrier 9 in a horizontal position. In addition, the second holder 212b has a rectangular flat plate shape that can hold the lower end of the carrier 9 in a vertical position.

第1保持部212a及第2保持部212b以第1保持部212a之一邊與第2保持部212b之一邊互相相接且2個保持部互相正交之方式連接。固定台座211以第1保持部212a及第2保持部212b均與Y方向平行,且載體保持具212可繞沿Y方向延伸之軸旋轉之方式,保持載體保持具212之一部分。The first holding portion 212a and the second holding portion 212b are connected in a manner that one side of the first holding portion 212a and one side of the second holding portion 212b are connected to each other and the two holding portions are orthogonal to each other. The fixed base 211 holds a portion of the carrier holder 212 in a manner that the first holding portion 212a and the second holding portion 212b are parallel to the Y direction and the carrier holder 212 can rotate around an axis extending in the Y direction.

載體支持部220進而具有可於固定台座211上調整載體保持具212之旋轉角度之未圖示之驅動部。藉此,於自乾燥單元332接收鉛直姿勢之載體9之情形時,載體保持具212以第2保持部212b成為水平且第1保持部212a成為鉛直之方式調整旋轉角度。其後,於載體保持具212上接收到鉛直姿勢之載體9後,載體保持具212以第2保持部212b成為鉛直且第1保持部212a成為水平之方式調整旋轉角度。藉此,載體9之姿勢自鉛直姿勢變更為水平姿勢。此時,載體9之基板出入口12(圖5)朝向-X方向。The carrier support portion 220 further has an unillustrated driving portion that can adjust the rotation angle of the carrier holder 212 on the fixed base 211. Thereby, when the carrier 9 in a lead-up position is received from the drying unit 332, the carrier holder 212 adjusts the rotation angle in a manner that the second holding portion 212b becomes horizontal and the first holding portion 212a becomes lead-up. Thereafter, after the carrier 9 in a lead-up position is received on the carrier holder 212, the carrier holder 212 adjusts the rotation angle in a manner that the second holding portion 212b becomes lead-up and the first holding portion 212a becomes horizontal. Thereby, the posture of the carrier 9 is changed from the lead-up position to the horizontal posture. At this time, the substrate inlet and outlet 12 (Figure 5) of the carrier 9 is facing the -X direction.

於將收納有複數片基板W之載體9以水平姿勢支持於載體支持部220時,將空的晶圓傳送盒8載置於基板搬入搬出區塊100之開閉器130。又,將該晶圓傳送盒8之蓋打開。於該狀態下,藉由基板交接機器人150,自載體9取出處理後之複數片基板W,並插入至開閉器130上之晶圓傳送盒8。圖6~圖8中以粗虛線之箭頭a5表示此時之複數片基板W之搬送路徑。When the carrier 9 containing the plurality of substrates W is supported in a horizontal position on the carrier support portion 220, an empty wafer transfer box 8 is placed on the switch 130 of the substrate loading and unloading block 100. Furthermore, the cover of the wafer transfer box 8 is opened. In this state, the substrate transfer robot 150 takes out the processed plurality of substrates W from the carrier 9 and inserts them into the wafer transfer box 8 on the switch 130. The arrow a5 with a thick dashed line in Figures 6 to 8 indicates the transfer path of the plurality of substrates W at this time.

其後,收納有處理後之複數片基板W之晶圓傳送盒8將蓋關閉,由晶圓傳送盒搬送裝置112保持,且載置於複數個晶圓傳送盒架110之任一者。又,該晶圓傳送盒8藉由晶圓傳送盒搬送裝置111搬送至晶圓傳送盒載置部190,且自基板處理裝置1搬出。另一方面,載體支持部220中變空之載體9藉由載體支持部220將該載體9之姿勢自水平姿勢再次變更為鉛直姿勢。載體支持部220中恢復為鉛直姿勢之空的載體9由主搬送裝置333A搬送,且由第2待機部240接收。Thereafter, the wafer cassette 8 containing the processed plurality of substrates W has its lid closed, is held by the wafer cassette transfer device 112, and is placed on any one of the plurality of wafer cassette racks 110. Furthermore, the wafer cassette 8 is transferred to the wafer cassette placement section 190 by the wafer cassette transfer device 111, and is unloaded from the substrate processing device 1. On the other hand, the empty carrier 9 in the carrier support section 220 is changed from a horizontal position to a vertical position by the carrier support section 220. The empty carrier 9 in the carrier support section 220 that has been restored to a vertical position is transferred by the main transfer device 333A and is received by the second standby section 240.

本實施形態中,藉由第2待機部240自載體支持部220接收到之空的載體9維持鉛直姿勢,且藉由洗淨區塊400之洗淨搬送裝置410搬送至載體洗淨單元420。圖6中以較粗之一點鏈線之箭頭c1表示此時之載體9之搬送路徑。In this embodiment, the empty carrier 9 received from the carrier support part 220 by the second standby part 240 is kept in an upright position and is transported to the carrier cleaning unit 420 by the cleaning transport device 410 of the cleaning block 400. The thick dot-link arrow c1 in FIG6 indicates the transport path of the carrier 9 at this time.

於載體洗淨單元420中,進而於複數個載體洗淨槽421、載體乾燥部422及複數個載體待機部423之間,藉由洗淨搬送裝置410搬送載體9。藉此,對使用後之載體9進行洗淨處理及乾燥處理。又,將洗淨處理後且乾燥處理後之載體9收納於複數個載體待機部423之任一者。於複數個載體洗淨槽421、載體乾燥部422及複數個載體待機部423中,維持載體9之鉛直姿勢。In the carrier cleaning unit 420, the carrier 9 is transported between the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier standby sections 423 by the cleaning and transporting device 410. In this way, the used carrier 9 is cleaned and dried. Furthermore, the cleaned and dried carrier 9 is stored in any one of the plurality of carrier standby sections 423. In the plurality of carrier cleaning tanks 421, the carrier drying section 422, and the plurality of carrier standby sections 423, the upright posture of the carrier 9 is maintained.

設想對新的收納於其他晶圓傳送盒8之未處理之複數片基板W進行一連串處理之情形。該情形時,收納於洗淨區塊400之載體待機部423之清潔之載體9作為新的載體9,藉由洗淨搬送裝置410自載體洗淨單元420搬送至第2待機部240。圖6中以較粗之一點鏈線之箭頭c2表示此時之新的載體9之搬送路徑。Assume that a series of processes are performed on a plurality of unprocessed substrates W newly stored in other wafer cassettes 8. In this case, the cleaned carrier 9 stored in the carrier standby section 423 of the cleaning block 400 is used as a new carrier 9 and is transported from the carrier cleaning unit 420 to the second standby section 240 by the cleaning transport device 410. The thick dot-link arrow c2 in FIG. 6 indicates the transport path of the new carrier 9 at this time.

移交給第2待機部240之新的載體9維持鉛直姿勢,且藉由待機搬送裝置250搬送至第1待機部230,並由第1待機部230支持。圖6中以較粗之兩點鏈線之箭頭b1表示此時之新的載體9之搬送路徑。第1待機部230將由該第1待機部230支持之新的載體9移交給載體支持部210。因此,移交給載體支持部210之新的載體9之姿勢藉由載體支持部210而自鉛直姿勢變更為水平姿勢。如上所述,中繼區塊200內之2個載體支持部210、220具有相同構成。藉此,於載體支持部210中,如圖7之對話框BA1內所示,變更新的載體9之姿勢。其後,將新的收納於其他晶圓傳送盒8之未處理之複數片基板W插入至處於水平姿勢之新的載體9內。The new carrier 9 transferred to the second standby section 240 maintains a vertical posture, and is transferred to the first standby section 230 by the standby transfer device 250, and is supported by the first standby section 230. The arrow b1 of the thicker two-point chain in FIG6 indicates the conveying path of the new carrier 9 at this time. The first standby section 230 transfers the new carrier 9 supported by the first standby section 230 to the carrier support section 210. Therefore, the posture of the new carrier 9 transferred to the carrier support section 210 is changed from a vertical posture to a horizontal posture by the carrier support section 210. As described above, the two carrier support sections 210 and 220 in the relay block 200 have the same structure. Thereby, in the carrier support part 210, as shown in the dialog box BA1 of Fig. 7, the posture of the new carrier 9 is changed. Thereafter, a plurality of unprocessed substrates W newly stored in other wafer cassettes 8 are inserted into the new carrier 9 in the horizontal posture.

收納有未處理之複數片基板W之新的載體9沿圖6~圖8所示之一連串之箭頭a2、a3、a4所示之搬送路徑搬送。藉此,對收納於新的載體9之複數片基板W進行一連串處理。The new carrier 9 storing the unprocessed plurality of substrates W is transported along a transport path indicated by a series of arrows a2, a3, and a4 shown in Fig. 6 to Fig. 8. Thus, the plurality of substrates W stored in the new carrier 9 are subjected to a series of processes.

<4>效果 (1)於上述基板處理裝置1中,處理部330之第3端部TA3與第4端部TA4隔著複數個液體處理單元331之複數個處理槽331a而隔開。藉此,用以將載體9搬入處理部330之第4端部TA4之構成、與用以自處理部330之第3端部TA3搬出載體9之構成未接近而設置。再者,以與多個處理槽331a排列之處理部330相鄰之方式,形成有保養空間MS1。因此,對於基板處理裝置1之各部,確保了足夠大之保養空間。再者,根據上述構成,用以將載體9搬送至處理部330之第4端部TA4之第1搬送部310不設置於俯視下偏離處理部330及保養空間MS1、MS2之位置。 <4> Effects (1) In the above-mentioned substrate processing device 1, the third end TA3 and the fourth end TA4 of the processing section 330 are separated by the plurality of processing tanks 331a of the plurality of liquid processing units 331. Thus, the structure for carrying the carrier 9 into the fourth end TA4 of the processing section 330 and the structure for carrying the carrier 9 out of the third end TA3 of the processing section 330 are not arranged close to each other. Furthermore, a maintenance space MS1 is formed in a manner adjacent to the processing section 330 in which the plurality of processing tanks 331a are arranged. Therefore, a sufficiently large maintenance space is ensured for each part of the substrate processing device 1. Furthermore, according to the above-mentioned structure, the first conveying unit 310 for conveying the carrier 9 to the fourth end TA4 of the processing unit 330 is not disposed at a position deviated from the processing unit 330 and the maintenance spaces MS1 and MS2 in a plan view.

其等之結果,可抑制佔地面積擴大且提高基板處理裝置1各部之保養之作業性。As a result, the footprint expansion can be suppressed and the maintenance workability of each part of the substrate processing apparatus 1 can be improved.

(2)又,於上述基板處理裝置1中,如圖8所示,第1搬送部310位於與處理部330於-Y方向隔開之位置且保養空間MS1之上方。再者,第1搬送部310位於較處理部330之複數個處理槽331a更上方。一般而言,於設置基板處理裝置1之無塵室內,形成有清潔之下降氣流(降流)。藉此,防止於保養空間MS1及複數個處理槽331a中產生之微粒等附著於在第1搬送部310中搬送之載體9內之複數片基板W上。(2) In addition, in the above-mentioned substrate processing apparatus 1, as shown in FIG. 8, the first conveying unit 310 is located at a position separated from the processing unit 330 in the -Y direction and above the maintenance space MS1. Furthermore, the first conveying unit 310 is located above the plurality of processing tanks 331a of the processing unit 330. Generally speaking, a clean downward airflow (downflow) is formed in the clean room where the substrate processing apparatus 1 is installed. Thereby, particles generated in the maintenance space MS1 and the plurality of processing tanks 331a are prevented from being attached to the plurality of substrates W in the carrier 9 transported in the first conveying unit 310.

(3)又,於上述基板處理裝置1中,第1搬送部310於俯視下與保養空間MS1重疊,且於俯視下不與處理部330重疊。藉此,可有效利用保養空間MS1之上方之空間。又,由於在處理部330之上方未設置第1搬送部310,故處理部330之高度方向上之設計之自由度不受第1搬送部310限制。(3) In the substrate processing apparatus 1, the first conveyor 310 overlaps with the maintenance space MS1 in a plan view, and does not overlap with the processing section 330 in a plan view. Thus, the space above the maintenance space MS1 can be effectively utilized. In addition, since the first conveyor 310 is not provided above the processing section 330, the degree of freedom in designing the processing section 330 in the height direction is not limited by the first conveyor 310.

(4)於上述基板處理裝置1中,用於處理複數片基板W之使用後之載體9藉由載體洗淨單元420洗淨。由載體洗淨單元420洗淨後之載體9用於新的複數片基板W之處理。因此,無需為對多個基板W進行處理,而準備過量之載體9。(4) In the substrate processing apparatus 1, the carrier 9 used for processing a plurality of substrates W is cleaned by the carrier cleaning unit 420. The carrier 9 cleaned by the carrier cleaning unit 420 is used for processing a new plurality of substrates W. Therefore, it is not necessary to prepare an excess of carriers 9 for processing a plurality of substrates W.

(5)第1搬送部310之鉛直方向之尺寸根據搬送之載體9之鉛直方向之尺寸(高度)而定。上述基板處理裝置1中使用之載體9中,處於水平姿勢時之該載體9之鉛直方向之尺寸(高度)小於處於鉛直姿勢時之該載體9之鉛直方向之尺寸(高度)。又,於第1搬送部310中,以水平姿勢搬送載體9。因此,第1搬送部310之鉛直方向之尺寸可較以鉛直姿勢搬送載體9時減小。藉此,即便於限制基板處理裝置1之鉛直方向之尺寸之情形時,亦減少第1搬送部310之鉛直方向之尺寸,故於第1搬送部310之下方形成足夠之高度之保養空間MS1。(5) The vertical dimension of the first conveying unit 310 is determined according to the vertical dimension (height) of the carrier 9 to be conveyed. In the above-mentioned substrate processing apparatus 1, the vertical dimension (height) of the carrier 9 in a horizontal position is smaller than the vertical dimension (height) of the carrier 9 in a vertical position. In addition, in the first conveying unit 310, the carrier 9 is conveyed in a horizontal position. Therefore, the vertical dimension of the first conveying unit 310 can be reduced compared to when the carrier 9 is conveyed in a vertical position. Thereby, even when the dimension of the substrate processing apparatus 1 in the vertical direction is limited, the dimension of the first conveying unit 310 in the vertical direction is reduced, so that a maintenance space MS1 with a sufficient height is formed below the first conveying unit 310 .

<5>其他實施形態 (1)於上述實施形態之基板處理裝置1中,第1搬送部310設置於保養空間MS1之上方之位置,但本發明不限定於此。第1搬送部310亦可代替保養空間MS1之上方之位置,而設置於保養空間MS1之下方之位置。例如,可將基板處理裝置1中之一部分構成要件與保養空間MS1設置於規定之設置面之上方,且將包含第1搬送部310之其他部分之構成要件設置於設置面之下方。 <5> Other implementation forms (1) In the substrate processing device 1 of the above-mentioned implementation form, the first conveyor 310 is disposed above the maintenance space MS1, but the present invention is not limited thereto. The first conveyor 310 may also be disposed below the maintenance space MS1 instead of above the maintenance space MS1. For example, a part of the components of the substrate processing device 1 and the maintenance space MS1 may be disposed above a prescribed installation surface, and other components including the first conveyor 310 may be disposed below the installation surface.

或,第1搬送部310亦可設置為於俯視下至少一部分與處理部330重疊。即,第1搬送部310亦可設置為至少一部分位於處理部330之上方或下方。Alternatively, the first conveying unit 310 may be disposed so that at least a portion overlaps with the processing unit 330 in a plan view. That is, the first conveying unit 310 may be disposed so that at least a portion is located above or below the processing unit 330.

(2)於上述實施形態之基板處理裝置1中,處於鉛直姿勢之載體9之框架構件10a、10b維持與鉛直方向平行,但亦可為處於鉛直姿勢之載體9之框架構件10a、10b維持與鉛直方向大致平行。即,處於鉛直姿勢之載體9只要可將所收納之複數片基板W保持為與鉛直方向平行或大致平行即可。(2) In the substrate processing apparatus 1 of the above-mentioned embodiment, the frame members 10a and 10b of the carrier 9 in the lead-up position are maintained parallel to the lead-up direction, but the frame members 10a and 10b of the carrier 9 in the lead-up position may be maintained substantially parallel to the lead-up direction. That is, the carrier 9 in the lead-up position only needs to be able to keep the plurality of substrates W stored therein parallel or substantially parallel to the lead-up direction.

又,於上述實施形態之基板處理裝置1中,處於水平姿勢之載體9之框架構件10a、10b維持與鉛直方向正交,但亦可為處於水平姿勢之載體9之框架構件10a、10b維持與鉛直方向大致正交。即,處於水平姿勢之載體9只要可將所收納之複數片基板W保持為與水平方向平行或大致平行即可。In the substrate processing apparatus 1 of the above-mentioned embodiment, the frame members 10a and 10b of the carrier 9 in the horizontal position are maintained perpendicular to the vertical direction, but the frame members 10a and 10b of the carrier 9 in the horizontal position may be maintained substantially perpendicular to the vertical direction. That is, the carrier 9 in the horizontal position only needs to keep the plurality of substrates W stored therein parallel or substantially parallel to the horizontal direction.

(3)於上述實施形態之基板處理裝置1中,保養空間MS1以與處理部330之複數個處理槽331a之全部於Y方向上相鄰之方式形成,但本發明不限定於此。保養空間MS1亦可以與處理部330之複數個處理槽331a之一部分於Y方向上相鄰之方式形成。(3) In the substrate processing apparatus 1 of the above embodiment, the maintenance space MS1 is formed to be adjacent to all of the plurality of processing tanks 331a of the processing section 330 in the Y direction, but the present invention is not limited thereto. The maintenance space MS1 may also be formed to be adjacent to a portion of the plurality of processing tanks 331a of the processing section 330 in the Y direction.

(4)於上述實施形態之基板處理裝置1中,具備將用於處理複數片基板W之使用後之載體9洗淨之洗淨區塊400,但本發明不限定於此。亦可不於基板處理裝置1中設置洗淨區塊400。該情形時,於中繼區塊200之載體支持部220中,已取出複數片基板W之使用後之載體9亦可未洗淨而搬送至載體支持部210。或,使用後之載體9亦可未洗淨而取出至基板處理裝置1之外部並廢棄。(4) In the substrate processing apparatus 1 of the above-mentioned embodiment, a cleaning block 400 is provided for cleaning the carrier 9 used for processing a plurality of substrates W, but the present invention is not limited thereto. The cleaning block 400 may not be provided in the substrate processing apparatus 1. In this case, the carrier 9 used after the plurality of substrates W have been taken out of the carrier support portion 220 of the relay block 200 may be transported to the carrier support portion 210 without being cleaned. Alternatively, the carrier 9 used may be taken out of the substrate processing apparatus 1 without being cleaned and discarded.

(5)於上述實施形態之基板處理裝置1中,於中繼區塊200中個別地設置有載體支持部210與第1待機部230,但本發明不限定於此。於可對第1待機部230附加變更載體9之姿勢之功能之情形時,亦可不設置載體支持部210。(5) In the substrate processing apparatus 1 of the above embodiment, the carrier support unit 210 and the first standby unit 230 are separately provided in the relay block 200, but the present invention is not limited thereto. In the case where the first standby unit 230 can be provided with a function of changing the posture of the carrier 9, the carrier support unit 210 may not be provided.

又,於上述實施形態之基板處理裝置1中,於中繼區塊200中個別地設置有載體支持部220與第2待機部240,但本發明不限定於此。於可對第2待機部240附加變更載體9之姿勢之功能之情形時,亦可不設置載體支持部220。In the substrate processing apparatus 1 of the above embodiment, the carrier support unit 220 and the second standby unit 240 are separately provided in the relay block 200, but the present invention is not limited thereto. When the second standby unit 240 can be provided with a function of changing the posture of the carrier 9, the carrier support unit 220 may not be provided.

(6)於上述實施形態之處理區塊300之第2搬送部320中,搬送裝置321具有變更載體9之姿勢之功能且具有搬送載體9之功能,但本發明不限定於此。於第2搬送部320中,亦可代替上述搬送裝置321,個別地設置具有變更載體9之姿勢之功能之構成要件、及具有搬送載體9之功能之構成要件。(6) In the second conveying section 320 of the processing block 300 of the above-mentioned embodiment, the conveying device 321 has the function of changing the posture of the carrier 9 and has the function of conveying the carrier 9, but the present invention is not limited to this. In the second conveying section 320, a component having the function of changing the posture of the carrier 9 and a component having the function of conveying the carrier 9 may be separately provided instead of the above-mentioned conveying device 321.

(7)於上述實施形態之基板處理裝置1中,處理對象之基板W於俯視下具有矩形狀,但處理對象之基板亦可於俯視下具有圓形狀,又可於俯視下具有三邊形或五邊形等四邊形以外之多邊形狀。(7) In the substrate processing apparatus 1 of the above-mentioned embodiment, the substrate W to be processed has a rectangular shape in a plan view, but the substrate to be processed may also have a circular shape in a plan view, or may have a polygonal shape other than a quadrilateral such as a triangle or pentagon in a plan view.

(8)上述實施形態之載體9於以水平姿勢收納有矩形之基板W之情形時支持矩形之基板W之兩側部,但本發明不限定於此。載體9亦可構成為能以水平姿勢支持基板W之中央部。(8) The carrier 9 of the above-mentioned embodiment supports both sides of the rectangular substrate W when the rectangular substrate W is stored in a horizontal position, but the present invention is not limited to this. The carrier 9 may also be configured to support the central portion of the substrate W in a horizontal position.

(9)於上述實施形態之基板處理裝置1中,於處理部330之複數個處理槽331a中貯存用以將基板W洗淨之處理液,但本發明不限定於此。亦可於處理部330之複數個處理槽331a之至少一部分,貯存用以對基板W進行鍍覆處理之鍍覆液、或用以將基板W之表面狀態改質之液體等,作為處理液。如此,上述實施形態係將本發明應用於複數片基板W之洗淨處理之例,但不限於此,亦可將本發明應用於複數片基板W之鍍覆處理或表面改質處理等之其他處理。(9) In the substrate processing apparatus 1 of the above-mentioned embodiment, a processing liquid for cleaning the substrate W is stored in the plurality of processing tanks 331a of the processing section 330, but the present invention is not limited thereto. A coating liquid for coating the substrate W or a liquid for modifying the surface state of the substrate W may be stored as the processing liquid in at least a portion of the plurality of processing tanks 331a of the processing section 330. Thus, the above-mentioned embodiment is an example of applying the present invention to a cleaning process of a plurality of substrates W, but the present invention is not limited thereto and may also be applied to other processes such as a coating process or a surface modification process of a plurality of substrates W.

(10)於上述實施形態之載體9中,於框架構件10a、10b各者之中央部分形成有4個開口部13,但本發明不限定於此。於框架構件10a、10b之各者之中央部分,不限於4個,亦可形成1個、2個、3個或5個等其他個數量之開口部13。或,亦可不於框架構件10a、10b各者之中央部分形成開口部13。再者,亦可適當設計並變更框架構件10a、10b之形狀。(10) In the carrier 9 of the above-mentioned embodiment, four openings 13 are formed in the central portion of each of the frame members 10a and 10b, but the present invention is not limited thereto. The number of openings 13 in the central portion of each of the frame members 10a and 10b is not limited to four, and one, two, three, five, or other number of openings 13 may be formed. Alternatively, the opening 13 may not be formed in the central portion of each of the frame members 10a and 10b. Furthermore, the shapes of the frame members 10a and 10b may be appropriately designed and changed.

(11)於上述實施形態之主搬送裝置333A、333B、333C各者中,一對夾盤構件333b藉由於X方向上夾住載體9而保持該載體9,但本發明不限定於此。一對夾盤構件333b亦可藉由於Y方向上夾住載體9而保持該載體9,又可藉由於水平面內於與X方向及Y方向交叉之方向上夾住載體9而保持該載體9。(11) In each of the main transport devices 333A, 333B, and 333C of the above-mentioned embodiments, the pair of chuck members 333b holds the carrier 9 by clamping the carrier 9 in the X direction, but the present invention is not limited thereto. The pair of chuck members 333b may hold the carrier 9 by clamping the carrier 9 in the Y direction, or may hold the carrier 9 by clamping the carrier 9 in a direction intersecting the X direction and the Y direction in a horizontal plane.

<6>技術方案之各構成要件與實施形態之各要件之對應關係 以下,對技術方案之各構成要件與實施形態之各要件之對應例進行說明,但本發明不限定於下述例。作為技術方案之各構成要件,亦可使用具有技術方案所記載之構成或功能之其他各種要件。 <6> Correspondence between the constituent elements of the technical solution and the elements of the implementation form Below, the correspondence between the constituent elements of the technical solution and the elements of the implementation form is described, but the present invention is not limited to the following example. As the constituent elements of the technical solution, various other elements having the structure or function described in the technical solution can also be used.

於上述實施形態中,基板搬入搬出區塊100及中繼區塊200為基板搬入搬出部之例,+X方向為第1方向之例,第1搬送部310為搬送部之例,處理部330為處理部之例,第1搬送部310之第1端部TA1為第1端部之例,第1搬送部310之第2端部TA2為第2端部之例。In the above-mentioned embodiment, the substrate carrying-in/out block 100 and the relay block 200 are examples of a substrate carrying-in/out unit, the +X direction is an example of a first direction, the first conveying unit 310 is an example of a conveying unit, the processing unit 330 is an example of a processing unit, the first end TA1 of the first conveying unit 310 is an example of a first end, and the second end TA2 of the first conveying unit 310 is an example of a second end.

又,處理部330之第3端部TA3為第3端部之例,處理部330之第4端部TA4為第4端部之例,複數個液體處理單元331之複數個處理槽331a為複數個處理槽之例,-X方向為第2方向之例,Y方向為第3方向之例,保養空間MS1為保養空間之例。Furthermore, the third end TA3 of the processing section 330 is an example of the third end, the fourth end TA4 of the processing section 330 is an example of the fourth end, the multiple processing tanks 331a of the multiple liquid processing units 331 are an example of the multiple processing tanks, the -X direction is an example of the second direction, the Y direction is an example of the third direction, and the maintenance space MS1 is an example of the maintenance space.

又,基板處理裝置1為基板處理裝置之例,搬送裝置321為第1搬送裝置之例,包含開閉器120、基板交接機器人140、載體支持部210及第1待機部230之構成要件群為基板插入部之例,包含開閉器130、基板交接機器人150、載體支持部220及第2待機部240之構成要件群為基板取出部之例,待機搬送裝置250為第2搬送裝置之例,載體洗淨單元420為載體洗淨部之例。Furthermore, the substrate processing device 1 is an example of a substrate processing device, the conveying device 321 is an example of a first conveying device, the group of constituent elements including the opener 120, the substrate transfer robot 140, the carrier support part 210 and the first standby part 230 is an example of a substrate insertion part, the group of constituent elements including the opener 130, the substrate transfer robot 150, the carrier support part 220 and the second standby part 240 is an example of a substrate removal part, the standby conveying device 250 is an example of a second conveying device, and the carrier cleaning unit 420 is an example of a carrier cleaning part.

1:基板處理裝置 8:晶圓傳送盒 9:載體 10a,10b,10c,10d:框架構件 11:支持片 12:基板出入口 13:開口部 100:基板搬入搬出區塊 101:端面部 102:一側面部 103:另一側面部 110:晶圓傳送盒架 111,112:晶圓傳送盒搬送裝置 120,130:開閉器 140,150:基板交接機器人 160:控制部 190:晶圓傳送盒載置部 200:中繼區塊 210,220:載體支持部 211:固定台座 212:載體保持具 212a:第1保持部 212b:第2保持部 230:第1待機部 240:第2待機部 250:待機搬送裝置 300:處理區塊 310:第1搬送部 311:主搬送裝置 311a:可動載台 311b:導軌 312A,312B:副搬送裝置 320:第2搬送部 321:搬送裝置 322:可動台座 323:載體保持具 323a:第1保持部 323b:第2保持部 330:處理部 331:液體處理單元 331a:處理槽 331b:升降機 332:乾燥單元 333a:可動支持柱 333A,333B,333C:主搬送裝置 333b:夾盤構件 400:洗淨區塊 410:洗淨搬送裝置 420:載體洗淨單元 421:載體洗淨槽 422:載體乾燥部 423:載體待機部 a1~a5,b1,c1,c2:箭頭 BA1,BA2,BA3,BA4:對話框 MS1,MS2:保養空間 pr:突出部 TA1:第1端部 TA2:第2端部 TA3:第3端部 TA4:第4端部 W:基板 WP:作業者 1: Substrate processing device 8: Wafer cassette 9: Carrier 10a, 10b, 10c, 10d: Frame member 11: Support plate 12: Substrate inlet and outlet 13: Opening 100: Substrate loading and unloading area 101: End surface 102: One side surface 103: Other side surface 110: Wafer cassette rack 111, 112: Wafer cassette transport device 120, 130: Opener 140, 150: Substrate transfer robot 160: Control unit 190: Wafer cassette loading unit 200: Intermediate block 210, 220: Carrier support unit 211: Fixed pedestal 212: Carrier holder 212a: 1st holding section 212b: 2nd holding section 230: 1st standby section 240: 2nd standby section 250: Standby conveyor 300: Processing block 310: 1st conveyor 311: Main conveyor 311a: Movable stage 311b: Guide rail 312A, 312B: Sub-conveying device 320: 2nd conveyor 321: Conveying device 322: Movable pedestal 323: Carrier holder 323a: 1st holding section 323b: 2nd holding section 330: Processing section 331: Liquid processing unit 331a: Processing tank 331b: Elevator 332: Drying unit 333a: Movable support column 333A, 333B, 333C: Main transport device 333b: Chuck member 400: Cleaning block 410: Cleaning transport device 420: Carrier cleaning unit 421: Carrier cleaning tank 422: Carrier drying section 423: Carrier standby section a1~a5, b1, c1, c2: Arrows BA1, BA2, BA3, BA4: Dialog box MS1, MS2: Maintenance space pr: Protrusion TA1: 1st end TA2: 2nd end TA3: 3rd end TA4: 4th end W: Substrate WP: Worker

圖1係顯示本發明之一實施形態之基板處理裝置之基本構成之模式性俯視圖。 圖2係圖1之A-A線處之基板處理裝置之模式性剖視圖。 圖3係圖1之基板處理裝置中使用之載體之俯視圖。 圖4係圖3之載體之一側視圖。 圖5係圖4之B-B線處之載體之剖視圖。 圖6係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖7係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 圖8係用以說明圖1之基板處理裝置中之複數片基板及載體之搬送路徑之圖。 FIG. 1 is a schematic top view showing the basic structure of a substrate processing device of an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the substrate processing device at line A-A of FIG. 1. FIG. 3 is a top view of a carrier used in the substrate processing device of FIG. 1. FIG. 4 is a side view of the carrier of FIG. 3. FIG. 5 is a cross-sectional view of the carrier at line B-B of FIG. 4. FIG. 6 is a diagram for illustrating the transport path of multiple substrates and carriers in the substrate processing device of FIG. 1. FIG. 7 is a diagram for illustrating the transport path of multiple substrates and carriers in the substrate processing device of FIG. 1. FIG. 8 is a diagram for illustrating the transport path of multiple substrates and carriers in the substrate processing device of FIG. 1.

1:基板處理裝置 1: Substrate processing equipment

8:晶圓傳送盒 8: Wafer transfer box

9:載體 9: Carrier

100:基板搬入搬出區塊 100: Substrate loading and unloading area

101:端面部 101: End face

102:一側面部 102: One side of the face

103:另一側面部 103: The other side of the face

110:晶圓傳送盒架 110: Wafer transfer box rack

111,112:晶圓傳送盒搬送裝置 111,112: Wafer transfer box transport device

120,130:開閉器 120,130: switch

140,150:基板交接機器人 140,150: Substrate transfer robot

190:晶圓傳送盒載置部 190: Wafer transfer box loading unit

200:中繼區塊 200: Relay block

210,220:載體支持部 210,220: Carrier support department

230:第1待機部 230: 1st standby unit

240:第2待機部 240: Second standby unit

250:待機搬送裝置 250: Standby transport device

300:處理區塊 300: Processing block

310:第1搬送部 310: 1st transport section

311:主搬送裝置 311: Main transport device

311a:可動載台 311a: Movable platform

311b:導軌 311b:Guide rails

312A,312B:副搬送裝置 312A, 312B: Auxiliary conveyor device

320:第2搬送部 320: Second transport section

321:搬送裝置 321: Transport device

330:處理部 330: Processing Department

331:液體處理單元 331:Liquid handling unit

331a:處理槽 331a: Processing tank

331b:升降機 331b: Elevator

332:乾燥單元 332: Drying unit

333A,333B,333C:主搬送裝置 333A, 333B, 333C: Main transport device

400:洗淨區塊 400: Washing area

410:洗淨搬送裝置 410: Cleaning and conveying device

420:載體洗淨單元 420: Carrier cleaning unit

421:載體洗淨槽 421: Carrier cleaning tank

422:載體乾燥部 422: Carrier drying section

423:載體待機部 423: Carrier standby unit

MS1,MS2:保養空間 MS1,MS2: Maintenance space

TA1:第1端部 TA1: End 1

TA2:第2端部 TA2: End 2

TA3:第3端部 TA3: End 3

TA4:第4端部 TA4: End 4

Claims (9)

一種基板處理裝置,其具備:基板搬入搬出部,其構成為可搬入複數片基板且可搬出上述複數片基板;及搬送部及處理部,其等以自上述基板搬入搬出部朝第1方向並行延伸之方式設置;且上述基板搬入搬出部具有:晶圓傳送盒載置部,其載置晶圓傳送盒,該晶圓傳送盒收納自基板處理裝置之外搬入至上述基板搬入搬出部之上述複數片基板;及載體支持部,其支持載體,該載體收納自上述晶圓傳送盒取出之上述複數片基板;上述搬送部具有依序排列於上述第1方向之第1端部及第2端部,且構成為可於上述第1方向自上述第1端部至上述第2端部,搬送上述載體;上述處理部具有依序排列於上述第1方向之第3端部及第4端部,且具有設置於上述第3端部與上述第4端部之間之複數個處理槽,構成為可藉由將上述搬送部中搬送至上述第2端部之上述載體於與上述第1方向相反之第2方向,自上述第4端部朝上述第3端部搬送,且使搬送之上述載體浸漬於貯存在上述複數個處理槽之複數種處理液中之至少1者,而對收納於上述載體之上述複數片基板進行預設之處理,並將處理後之上述複數片基板移交給上述基板搬入搬出部;以俯視下於與上述第1及第2方向交叉之第3方向上與上述處理部之至 少一部分相鄰之方式,形成對於上述處理部之保養空間;上述搬送部於俯視下與上述處理部及上述保養空間中之至少一部分重疊。 A substrate processing device, which comprises: a substrate carrying-in and carrying-out section, which is configured to carry in a plurality of substrates and carry out the plurality of substrates; and a carrying section and a processing section, which are arranged in a manner extending in parallel from the substrate carrying-in and carrying-out section toward a first direction; and the substrate carrying-in and carrying-out section has: a wafer transfer box loading section, which carries a wafer transfer box, the wafer transfer box storing the plurality of substrates carried into the substrate carrying-in and carrying-out section from outside the substrate processing device; and a carrier supporting section, which supports a carrier, the carrier storing the plurality of substrates taken out from the wafer transfer box; the carrying section has a first end and a second end sequentially arranged in the first direction, and is configured to carry the carrier from the first end to the second end in the first direction; the processing section has a third end sequentially arranged in the first direction. The conveyor has a first end and a fourth end, and has a plurality of processing tanks disposed between the third end and the fourth end, and is configured to carry out a preset treatment on the plurality of substrates stored in the carrier by carrying the carrier transported to the second end in a second direction opposite to the first direction from the fourth end toward the third end, and immersing the transported carrier in at least one of the plurality of processing liquids stored in the plurality of processing tanks, and transferring the processed plurality of substrates to the substrate loading and unloading section; a maintenance space for the processing section is formed by being adjacent to at least a portion of the processing section in a third direction intersecting the first and second directions in a plan view; the conveyor overlaps with at least a portion of the processing section and the maintenance space in a plan view. 如請求項1之基板處理裝置,其中上述處理部容許上述載體向上述第2方向移動,且限制上述載體向上述第1方向移動。 A substrate processing device as claimed in claim 1, wherein the processing unit allows the carrier to move in the second direction and restricts the carrier from moving in the first direction. 如請求項1或2之基板處理裝置,其中上述保養空間以與上述複數個處理槽相鄰之方式形成;上述搬送部設置於較上述保養空間及上述複數個處理槽更上方之位置。 The substrate processing device of claim 1 or 2, wherein the maintenance space is formed adjacent to the plurality of processing tanks; the transfer unit is disposed at a position higher than the maintenance space and the plurality of processing tanks. 如請求項3之基板處理裝置,其中上述搬送部於俯視下與上述保養空間之至少一部分重疊,且於俯視下不與上述處理部重疊。 A substrate processing device as claimed in claim 3, wherein the transport unit overlaps with at least a portion of the maintenance space when viewed from above, and does not overlap with the processing unit when viewed from above. 如請求項1或2之基板處理裝置,其進而具備:載體洗淨部,其將取出由上述處理部處理後之上述複數片基板之空的載體洗淨。 The substrate processing device of claim 1 or 2 further comprises: a carrier cleaning section, which cleans the empty carriers of the plurality of substrates processed by the processing section. 如請求項1或2之基板處理裝置,其進而具備:第1搬送裝置,其將上述載體自上述搬送部之上述第2端部搬送至上 述處理部之上述第4端部。 The substrate processing device of claim 1 or 2 further comprises: a first conveying device that conveys the carrier from the second end of the conveying section to the fourth end of the processing section. 如請求項1或2之基板處理裝置,其中上述基板搬入搬出部包含:基板插入部,其以與上述搬送部之上述第1端部相鄰之方式設置,將搬入至上述基板搬入搬出部之未處理之上述複數片基板插入空的上述載體。 The substrate processing device of claim 1 or 2, wherein the substrate loading and unloading section includes: a substrate insertion section, which is arranged adjacent to the first end of the conveying section, and inserts the unprocessed plurality of substrates loaded into the substrate loading and unloading section into the empty carrier. 如請求項1或2之基板處理裝置,其中上述基板搬入搬出部包含:基板取出部,其以與上述處理部之上述第3端部相鄰之方式設置,且用於將收納於自上述處理部移交之上述載體中之處理後之上述複數片基板自上述基板搬入搬出部搬出;及第2搬送裝置,其將取出上述複數片基板後之空的上述載體,自上述基板取出部搬送至上述基板插入部。 The substrate processing device of claim 1 or 2, wherein the substrate loading and unloading section comprises: a substrate unloading section, which is arranged adjacent to the third end of the processing section and is used to unload the processed plurality of substrates stored in the carrier transferred from the processing section from the substrate loading and unloading section; and a second transport device, which transports the empty carrier after the plurality of substrates are unloaded from the substrate unloading section to the substrate insertion section. 一種基板處理裝置,其具備:基板搬入搬出部,其構成為可搬入複數片基板且可搬出上述複數片基板;搬送部及處理部,其等以自上述基板搬入搬出部朝第1方向並行延伸之方式設置;及第1搬送裝置;且上述搬送部 具有依序排列於上述第1方向之第1端部及第2端部,且構成為可於上述第1方向自上述第1端部至上述第2端部,搬送收納有經搬入至上述基板搬入搬出部之上述複數片基板之載體;上述處理部具有依序排列於上述第1方向之第3端部及第4端部,且具有設置於上述第3端部與上述第4端部之間之複數個處理槽,構成為可藉由將上述搬送部中搬送至上述第2端部之上述載體於與上述第1方向相反之第2方向,自上述第4端部朝上述第3端部搬送,且使搬送之上述載體浸漬於貯存在上述複數個處理槽之複數種處理液中之至少1者,而對收納於上述載體之上述複數片基板進行預設之處理,並將處理後之上述複數片基板移交給上述基板搬入搬出部;以俯視下於與上述第1及第2方向交叉之第3方向上與上述處理部之至少一部分相鄰之方式,形成對於上述處理部之保養空間;上述搬送部於俯視下與上述處理部及上述保養空間中之至少一部分重疊;上述第1搬送裝置將上述載體自上述搬送部之上述第2端部搬送至上述處理部之上述第4端部;且上述基板搬入搬出部包含:基板插入部,其以與上述搬送部之上述第1端部相鄰之方式設置,將搬入至上述基板搬入搬出部之未處理之上述複數片基板插入空的上述載體;基板取出部,其以與上述處理部之上述第3端部相鄰之方式設置,且用於將收納於自上述處理部移交之上述載體中之處理後之上述複數片基板 自上述基板搬入搬出部搬出;及第2搬送裝置,其將取出上述複數片基板後之空的上述載體,自上述基板取出部搬送至上述基板插入部。 A substrate processing device, comprising: a substrate loading and unloading section, which is configured to load a plurality of substrates and unload the plurality of substrates; a conveying section and a processing section, which are arranged in a manner extending in parallel from the substrate loading and unloading section toward a first direction; and a first conveying device; wherein the conveying section has a first end and a second end arranged in sequence in the first direction, and is configured to convey a carrier containing the plurality of substrates loaded into the substrate loading and unloading section from the first end to the second end in the first direction; The processing section has a third end and a fourth end arranged in sequence in the first direction, and has a plurality of processing tanks disposed between the third end and the fourth end, and is configured to perform a preset processing on the plurality of substrates stored in the carrier by transporting the carrier transported to the second end in a second direction opposite to the first direction from the fourth end toward the third end, and immersing the transported carrier in at least one of a plurality of processing liquids stored in the plurality of processing tanks. , and transfer the processed plurality of substrates to the substrate loading and unloading section; in a plan view, the maintenance space for the processing section is formed in a manner that the processing section is adjacent to at least a portion of the processing section in a third direction intersecting the first and second directions; the conveying section overlaps with at least a portion of the processing section and the maintenance space in a plan view; the first conveying device conveys the carrier from the second end of the conveying section to the fourth end of the processing section; and the substrate loading and unloading section includes: a substrate insertion section, which is The first end of the conveying section is provided adjacent to the first end of the conveying section, and the unprocessed plurality of substrates transported into the substrate transporting section are inserted into the empty carrier; the substrate taking-out section is provided adjacent to the third end of the processing section, and is used to take out the processed plurality of substrates stored in the carrier transferred from the processing section from the substrate transporting section; and the second conveying device transports the empty carrier after taking out the plurality of substrates from the substrate taking-out section to the substrate inserting section.
TW112110468A 2022-03-24 2023-03-21 Substrate processing apparatus TWI839164B (en)

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050005849A1 (en) 2003-05-22 2005-01-13 Noboru Masuoka Semiconductor processing system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050005849A1 (en) 2003-05-22 2005-01-13 Noboru Masuoka Semiconductor processing system

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