TWI849143B - Substrate holding jig for plating treatment and plating treatment device - Google Patents
Substrate holding jig for plating treatment and plating treatment device Download PDFInfo
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- TWI849143B TWI849143B TW109119661A TW109119661A TWI849143B TW I849143 B TWI849143 B TW I849143B TW 109119661 A TW109119661 A TW 109119661A TW 109119661 A TW109119661 A TW 109119661A TW I849143 B TWI849143 B TW I849143B
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- movable piece
- substrate
- main body
- substrate holding
- body rod
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- 239000000758 substrate Substances 0.000 title claims abstract description 359
- 238000007747 plating Methods 0.000 title claims abstract description 171
- 238000012545 processing Methods 0.000 claims abstract description 144
- 230000007246 mechanism Effects 0.000 claims abstract description 54
- 238000013459 approach Methods 0.000 claims abstract description 9
- 239000011248 coating agent Substances 0.000 claims description 75
- 238000000576 coating method Methods 0.000 claims description 75
- 239000000463 material Substances 0.000 claims description 49
- 239000011162 core material Substances 0.000 claims description 27
- 238000003825 pressing Methods 0.000 claims description 25
- 229920005989 resin Polymers 0.000 claims description 23
- 239000011347 resin Substances 0.000 claims description 23
- 239000007788 liquid Substances 0.000 claims description 8
- 238000011068 loading method Methods 0.000 claims description 7
- 206010028980 Neoplasm Diseases 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 14
- 238000000034 method Methods 0.000 description 13
- 230000004048 modification Effects 0.000 description 12
- 238000012986 modification Methods 0.000 description 12
- 238000003780 insertion Methods 0.000 description 7
- 230000037431 insertion Effects 0.000 description 7
- 239000002585 base Substances 0.000 description 6
- 230000002093 peripheral effect Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000009471 action Effects 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 230000005291 magnetic effect Effects 0.000 description 5
- 239000007769 metal material Substances 0.000 description 5
- 239000010935 stainless steel Substances 0.000 description 5
- 229910001220 stainless steel Inorganic materials 0.000 description 5
- 239000004696 Poly ether ether ketone Substances 0.000 description 4
- 229920002530 polyetherether ketone Polymers 0.000 description 4
- 239000000057 synthetic resin Substances 0.000 description 4
- 229920003002 synthetic resin Polymers 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 229910000838 Al alloy Inorganic materials 0.000 description 3
- 229910018104 Ni-P Inorganic materials 0.000 description 3
- 229910018536 Ni—P Inorganic materials 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 239000002033 PVDF binder Substances 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000007772 electroless plating Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- -1 polytetrafluoroethylene Polymers 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 2
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 1
- VMHLLURERBWHNL-UHFFFAOYSA-M Sodium acetate Chemical compound [Na+].CC([O-])=O VMHLLURERBWHNL-UHFFFAOYSA-M 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 1
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000001632 sodium acetate Substances 0.000 description 1
- 235000017281 sodium acetate Nutrition 0.000 description 1
- 239000001509 sodium citrate Substances 0.000 description 1
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 description 1
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemically Coating (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Electroplating Methods And Accessories (AREA)
Abstract
本發明提供一種鍍覆處理用基板保持治具及鍍覆處理裝置,其於鍍浴槽中基板彼此不接觸而能夠把持相對較多之基板,但仍能夠以更簡單之構造抑制來自基板或治具之瘤塊之產生。 本發明之鍍覆處理用基板保持治具具備:本體桿部,其具有可沿軸方向插入圓盤狀基板內孔之外形長度;可動片,其可在與上述軸方向交叉之交叉方向上相對於上述本體桿部接近或遠離;及移動機構,其使上述可動片相對於上述本體桿部沿上述交叉方向移動;且上述可動片定位於以下位置:第1位置,其係可接近上述本體桿部並與該本體桿部一起通過上述圓盤狀基板內孔者;及第2位置,其係較上述第1位置而言於交叉方向靠外側,且上述鍍覆處理用基板保持治具中之上述外形長度變得大於上述基板之內孔徑者。The present invention provides a substrate holding fixture for plating processing and a plating processing device, which can hold a relatively large number of substrates without the substrates touching each other in the plating bath, but can still suppress the generation of tumors from the substrates or the fixture with a simpler structure. The substrate holding fixture for plating treatment of the present invention comprises: a main body rod, which has an outer shape length that can be inserted into the inner hole of the disc-shaped substrate along the axial direction; a movable piece, which can approach or move away from the main body rod in a cross direction that intersects the above-mentioned axial direction; and a moving mechanism, which enables the above-mentioned movable piece to move relative to the above-mentioned main body rod along the above-mentioned cross direction; and the above-mentioned movable piece is positioned at the following positions: a first position, which is close to the above-mentioned main body rod and passes through the inner hole of the disc-shaped substrate together with the main body rod; and a second position, which is on the outside of the above-mentioned first position in the cross direction, and the above-mentioned outer shape length in the above-mentioned substrate holding fixture for plating treatment becomes larger than the inner hole diameter of the above-mentioned substrate.
Description
本發明係關於一種鍍覆處理技術,更詳細而言,係關於一種用於將中心具有貫通孔之圓盤狀基板浸漬於鍍浴槽內而於該基板上形成鍍覆被膜之鍍覆處理用基板保持治具及鍍覆處理裝置。The present invention relates to a plating treatment technology, and more specifically, to a substrate holding jig for plating treatment and a plating treatment device for immersing a disc-shaped substrate having a through hole at the center into a plating bath to form a plating film on the substrate.
PC等中所使用之磁記錄媒體由於其高便利性等而需求較高,近年來不斷實現記錄密度之顯著提高。 關於此種磁記錄媒體,市場繼續要求實現更高之記錄密度,因此關於磁記錄媒體中所使用之圓盤狀基板,亦尋求較以往更為薄型且平滑性較高、損傷較少之高品質基板。Magnetic recording media used in PCs and other devices are in high demand due to their high convenience, and have been achieving significant increases in recording density in recent years. The market continues to demand higher recording densities for such magnetic recording media, so the disc-shaped substrates used in magnetic recording media are also seeking to be thinner, smoother, and less prone to damage than before.
作為該圓盤狀基板,例如使用鋁合金基板或玻璃基板等。其中,鋁合金基板例如藉由經過以下所示之工序等製造。即,首先,將厚度1~3 mm左右之鋁合金板沖裁加工為圓環狀而加工為所需尺寸之基板。接著,對沖裁後之基板實施端部之去角加工等後,進行利用磨石之研削加工,進而其後,進行對基板表面實施無電解鍍NiP等。As the disc-shaped substrate, for example, an aluminum alloy substrate or a glass substrate is used. The aluminum alloy substrate is manufactured, for example, by the following steps. That is, first, an aluminum alloy plate with a thickness of about 1 to 3 mm is punched into a ring shape to form a substrate of a desired size. Then, the punched substrate is subjected to chamfering of the end, grinding with a grindstone, and then electroless NiP plating is performed on the surface of the substrate.
並且,於無電解鍍NiP中,例如如專利文獻1所示,以鍍覆處理用治具保持複數個基板,進行將該等基板一次浸漬於鍍浴槽中。又,亦如專利文獻1中揭示般,亦已知為了於基板表面使鍍覆被膜高效率地成膜,而使鍍覆處理用治具自轉或公轉並同時對複數片基板實施無電解鍍NiP。In the electroless NiP plating, for example, as shown in Patent Document 1, a plurality of substrates are held by a plating processing jig and the substrates are immersed in a plating bath at one time. Also, as disclosed in Patent Document 1, it is also known that in order to efficiently form a plating film on the surface of the substrate, the plating processing jig is rotated or revolved to simultaneously perform electroless NiP plating on a plurality of substrates.
另一方面,於使上述鍍覆處理用治具於鍍浴槽內自轉或公轉之技術中,存在以下情況:由於由該治具中之滑動部分產生之磨耗粉末而於基板表面產生被稱為瘤塊(nodule)之凸狀缺陷。 若產生該瘤塊則基板品質顯著下降,因此,重要的是如何抑制此種瘤塊。On the other hand, in the technology of rotating or revolving the above-mentioned jig for plating treatment in the plating bath, there is a situation in which a convex defect called a nodule is generated on the surface of the substrate due to the wear powder generated by the sliding part of the jig. If the nodule is generated, the quality of the substrate is significantly reduced, so it is important to suppress such a nodule.
關於此點,例如於專利文獻1中,示出藉由將嵌入基板外周緣部之槽之剖面設為U字狀,而能夠抑制容易於基板外周緣部產生之瘤塊。 又,於例如專利文獻2中,提出一種表面處理裝置,其包含:主軸,其將嵌合於基板內周部之端部之環狀槽設於周面且水平配置;及加重桿,其於周面設置嵌合於基板內周部之端部且具有與主軸之環狀槽實質上相同間距之環狀槽。 進而,例如於專利文獻3中,揭示一種碟片基板之把持用治具,其由襯套沿周方向被分割之複數個圓弧狀區段、與介裝於各區段相互間使襯套於半徑方向放大/收縮之驅動彈簧之組合構成。 [先前技術文獻] [專利文獻]In this regard, for example, Patent Document 1 shows that by setting the cross-section of the groove embedded in the outer peripheral portion of the substrate to be U-shaped, it is possible to suppress the tumor that is easily generated in the outer peripheral portion of the substrate. In addition, for example, Patent Document 2 proposes a surface treatment device, which includes: a spindle, which has an annular groove embedded in the end of the inner peripheral portion of the substrate and is arranged horizontally on the circumferential surface; and a weighting rod, which has an annular groove embedded in the end of the inner peripheral portion of the substrate and has substantially the same spacing as the annular groove of the spindle. Furthermore, for example, Patent Document 3 discloses a jig for holding a disc substrate, which is composed of a plurality of arc-shaped segments divided along the circumferential direction of a sleeve and a driving spring installed between the segments to expand/contract the sleeve in the radial direction. [Prior Technical Document] [Patent Document]
[專利文獻1]日本特開2007-169757號公報 [專利文獻2]日本特開平7-90596號公報 [專利文獻3]日本特開2001-195730號公報[Patent Document 1] Japanese Patent Publication No. 2007-169757 [Patent Document 2] Japanese Patent Publication No. 7-90596 [Patent Document 3] Japanese Patent Publication No. 2001-195730
[發明所欲解決之課題][The problem that the invention wants to solve]
然而,上述之習知鍍覆處理用治具中存在下述之課題,可謂仍有應改善之點。 即,例如於專利文獻1中,由於係自基板外周側以保持用軸把持之構成,因此只要未大型化,則難以增加所保持之基板數量,對大量基板同時進行鍍覆處理之能力並不高。However, the above-mentioned known jig for plating treatment has the following problems, which can be said to still have points to be improved. That is, for example, in Patent Document 1, since the substrate is held by a holding shaft from the outer peripheral side, it is difficult to increase the number of substrates held unless it is enlarged, and the ability to perform plating treatment on a large number of substrates at the same time is not high.
又,例如於專利文獻2中,由於可於基板中心孔(以下亦稱為「內孔」)插入主軸及加重桿,因此每單位體積可收容之基板數可相對增大。然而,不可否認有於加重桿與中心孔邊緣碰撞之情形等時,加重桿被研削而促進磨耗粉之發塵,藉由該磨耗粉混入鍍覆被膜中而導致產生瘤塊之可能性。 進而,近年來,例如隨著多層驅動化,HDD用途之基板向薄型化發展,亦必須設想該厚度變薄之基板之處理過程中之基板搖晃等。關於此點,例如有時為了鍍覆之均一處理等而於鍍浴中移動基板,於專利文獻2所示之構成中,可謂亦可產生基板彼此之接觸等。In addition, for example, in Patent Document 2, since the spindle and the weighting rod can be inserted into the center hole of the substrate (hereinafter also referred to as the "inner hole"), the number of substrates that can be accommodated per unit volume can be relatively increased. However, it cannot be denied that when the weighting rod collides with the edge of the center hole, the weighting rod is ground and promotes the generation of abrasive powder, and the abrasive powder is mixed into the coating film to cause a tumor. Furthermore, in recent years, for example, with the development of multi-layer drives, the substrates for HDD use have developed towards thinning, and it is also necessary to assume the shaking of the substrate during the processing of the thinned substrate. In this regard, for example, in order to achieve uniform coating, the substrate is sometimes moved in the plating bath, and in the structure shown in Patent Document 2, it can be said that the substrates may come into contact with each other.
進而,於專利文獻3中,就使用複數個彈簧牢固把持碟片基板中心孔之方面而言,或許能夠避免基板彼此之接觸,但治具之構造本就複雜而導致成本高。又,於該專利文獻3所示之構造之把持用治具中,難以同時把持相對大量之基板,不可謂作為鍍覆處理之能力亦較高。Furthermore, in Patent Document 3, multiple springs are used to firmly hold the center hole of the disc substrate, which may prevent the substrates from contacting each other, but the structure of the fixture is complicated and leads to high costs. In addition, in the holding fixture of the structure shown in Patent Document 3, it is difficult to hold a relatively large number of substrates at the same time, and it cannot be said that the coating processing capability is also high.
本發明係鑒於解決此種課題作為一例而成者,其目的在於:提供一種鍍覆處理用基板保持治具及鍍覆處理裝置,其於鍍浴槽中基板彼此不接觸而能夠把持相對較多之基板,但仍能夠以更簡單之構造抑制藉由來自基板或治具之發塵混入鍍覆被膜而產生之瘤塊。 [解決課題之技術手段]The present invention is made in view of solving such a problem as an example, and its purpose is to provide a substrate holding fixture for plating processing and a plating processing device, which can hold a relatively large number of substrates in the plating bath without the substrates touching each other, but can still suppress the formation of nodules caused by dust from the substrate or fixture mixing into the plating film with a simpler structure. [Technical means for solving the problem]
為了解決上述課題,本發明之一實施形態之鍍覆處理用基板保持治具之特徵在於:(1)具備:本體桿部,其具有可沿軸方向插入圓盤狀基板內孔之外形長度;可動片,其可在與上述軸方向交叉之交叉方向上相對於上述本體桿部接近或遠離;及移動機構,其使上述可動片相對於上述本體桿部沿上述交叉方向移動;且上述可動片定位於以下位置:第1位置,其係可接近上述本體桿部並與該本體桿部一起通過上述圓盤狀基板內孔者;及第2位置,其係較上述第1位置而言於交叉方向靠外側,且上述鍍覆處理用基板保持治具中之上述外形長度變得大於上述基板之內孔徑者。In order to solve the above-mentioned problems, a substrate holding fixture for plating treatment in one embodiment of the present invention is characterized in that: (1) it has: a main body rod having an outer length that can be inserted into the inner hole of a disc-shaped substrate along the axial direction; a movable piece that can approach or move away from the main body rod in a cross direction that intersects the above-mentioned axial direction; and a moving mechanism that enables the above-mentioned movable piece to move relative to the above-mentioned main body rod along the above-mentioned cross direction; and the above-mentioned movable piece is positioned in the following positions: a first position, which is a position that can approach the above-mentioned main body rod and pass through the inner hole of the disc-shaped substrate together with the main body rod; and a second position, which is on the outer side of the above-mentioned first position in the cross direction, and the above-mentioned outer length in the above-mentioned substrate holding fixture for plating treatment becomes larger than the inner hole diameter of the above-mentioned substrate.
再者,於上述(1)所記載之鍍覆處理用基板保持治具中,較佳為:(2)上述移動機構包含規定上述可動片朝向上述交叉方向之移動範圍的限制部,且上述第1位置及上述第2位置分別由上述限制部規定而成。Furthermore, in the substrate holding jig for plating processing described in (1) above, it is preferred that: (2) the above-mentioned moving mechanism includes a limiting portion that defines the moving range of the above-mentioned movable piece toward the above-mentioned intersecting direction, and the above-mentioned first position and the above-mentioned second position are respectively defined by the above-mentioned limiting portion.
進而,於上述(1)或(2)所記載之鍍覆處理用基板保持治具中,較佳為:(3)上述移動機構包含配置於上述可動片與上述本體桿部之間之彈性構件,上述限制部包含具有凸緣部之傘形構件,且上述傘形構件係以上述凸緣部於上述可動片內部沿上述交叉方向移動之方式,其基端立設於上述本體桿部而成。Furthermore, in the substrate holding jig for coating processing described in (1) or (2) above, it is preferred that: (3) the above-mentioned moving mechanism includes an elastic member arranged between the above-mentioned movable piece and the above-mentioned main body rod, the above-mentioned limiting portion includes an umbrella-shaped member having a flange portion, and the above-mentioned umbrella-shaped member is formed in such a way that the above-mentioned flange portion moves inside the above-mentioned movable piece along the above-mentioned cross direction, and its base end is erected on the above-mentioned main body rod portion.
又,於上述(3)所記載之鍍覆處理用基板保持治具中,較佳為:(4)由上述限制部及上述彈性構件構成之組件於上述本體桿部之軸方向設置至少2組。Furthermore, in the substrate holding jig for plating processing described in (3) above, it is preferred that: (4) at least two sets of the assembly consisting of the above-mentioned limiting portion and the above-mentioned elastic member are provided in the axial direction of the above-mentioned main body rod portion.
又,於上述(1)至(4)中任一項所記載之鍍覆處理用基板保持治具中,較佳為:(5)上述本體桿部包含:每隔特定間隙保持上述圓盤狀基板之保持區域、及配置於上述保持區域兩端之端部區域,且上述交叉方向之上述保持區域的剖面形狀與上述交叉方向之上述端部區域的剖面形狀互不相同。Furthermore, in the substrate holding fixture for coating processing described in any one of the above (1) to (4), it is preferred that: (5) the above-mentioned main rod portion includes: a holding area for holding the above-mentioned disc-shaped substrate at each specific gap, and an end area arranged at both ends of the above-mentioned holding area, and the cross-sectional shape of the above-mentioned holding area in the above-mentioned cross-direction is different from the cross-sectional shape of the above-mentioned end area in the above-mentioned cross-direction.
又,於上述(1)至(5)中任一項所記載之鍍覆處理用基板保持治具中,較佳為:(6)相對於上述本體桿部數量不同之上述可動片經由上述移動機構可移動地設於上述交叉方向。 又,於上述(1)至(6)中任一項所記載之鍍覆處理用基板保持治具中,較佳為:(7)上述本體桿部及上述可動片包含每隔特定間隙保持上述圓盤狀基板之保持區域,且於上述保持區域中,由沿上述軸方向延伸之芯材、及覆蓋上述芯材之外表面而可與上述圓盤狀基板接觸之外裝樹脂材構成。Furthermore, in the substrate holding fixture for coating processing described in any one of the above (1) to (5), it is preferred that: (6) the movable pieces having a different number relative to the main body rod are movably arranged in the above cross direction via the above moving mechanism. Furthermore, in the substrate holding fixture for coating processing described in any one of the above (1) to (6), it is preferred that: (7) the main body rod and the movable piece include a holding area for holding the disk-shaped substrate at specific intervals, and in the holding area, the core material extending along the above axial direction and the outer coating resin material covering the outer surface of the core material and capable of contacting the disk-shaped substrate are formed.
又,於上述(1)、(5)及(6)中任一項所記載之鍍覆處理用基板保持治具中,較佳為:(8)包含以夾住上述保持區域之方式配置之端部區域,且上述移動機構具備形成於上述可動片及上述本體桿部之一者之導孔、及形成於上述可動片及上述本體桿部之另一者並插入於上述導孔之導銷,上述可動片及上述本體桿部分別具有上述端部區域。 又,為了解決上述課題,本發明之一實施形態之鍍覆處理裝置之特徵在於:(9)其係於鍍浴槽內之鍍覆液中浸漬圓盤狀基板者,且包含:載置部,其並列載置鍍覆處理前之複數個圓盤狀基板;及一對之軸按壓部,其等可分別保持上述(1)至(8)中任一項所記載之鍍覆處理用基板保持治具;且於上述可動片利用一個上述軸按壓部維持上述第1位置之狀態,在複數個上述圓盤狀基板各者之內孔插入上述鍍覆處理用基板保持治具,並且上述可動片以上述第2位置之狀態安裝於旋轉料架。 再者,於上述(9)所記載之鍍覆處理裝置中,較佳為:(10)上述旋轉料架具有搭載上述(1)至(8)中任一項所記載之鍍覆處理用基板保持治具之治具安裝用軸承構件,且於上述治具安裝用軸承構件,形成垂直突起,該垂直突起於安裝上述鍍覆處理用基板保持治具時插入上述可動片與上述本體桿部之間,藉由上述垂直突起插入上述可動片與上述本體桿部之間,而上述可動片與上述本體桿部相互隔開。 又,為了解決上述課題,本發明之一實施形態之鍍覆處理裝置之特徵在於:(11)具有:載置部,其並列載置鍍覆處理前之複數個圓盤狀基板;及導桿,其使上述(1)至(8)中任一項所記載之鍍覆處理用基板保持治具可出入複數個上述圓盤狀基板各者之內孔;且上述導桿具有前端,該前端用以於上述第1位置維持上述鍍覆處理用基板保持治具之上述可動片。 [發明之效果]Furthermore, in the substrate holding fixture for plating processing described in any one of (1), (5) and (6), it is preferred that: (8) it includes an end region arranged in a manner to clamp the holding region, and the moving mechanism has a guide hole formed in one of the movable piece and the main body rod, and a guide pin formed in the other of the movable piece and the main body rod and inserted into the guide hole, and the movable piece and the main body rod each have the end region. Furthermore, in order to solve the above-mentioned problem, the coating treatment device of one embodiment of the present invention is characterized in that: (9) it immerses the disc-shaped substrate in the coating liquid in the coating bath, and comprises: a loading portion, which loads a plurality of disc-shaped substrates before the coating treatment in parallel; and a pair of shaft pressing portions, which can respectively hold the substrate holding fixture for coating treatment described in any one of the above (1) to (8); and the above-mentioned movable piece is maintained in the state of the above-mentioned first position by using one of the above-mentioned shaft pressing portions, and the above-mentioned substrate holding fixture for coating treatment is inserted into the inner hole of each of the plurality of the above-mentioned disc-shaped substrates, and the above-mentioned movable piece is mounted on the rotary material rack in the state of the above-mentioned second position. Furthermore, in the coating processing device described in (9), it is preferred that: (10) the rotating material rack has a jig mounting bearing component for mounting the substrate holding jig for coating processing described in any one of (1) to (8), and a vertical protrusion is formed on the jig mounting bearing component, and the vertical protrusion is inserted between the movable piece and the main body rod when the substrate holding jig for coating processing is installed. The movable piece and the main body rod are separated from each other by the vertical protrusion being inserted between the movable piece and the main body rod. Furthermore, in order to solve the above-mentioned problem, the coating processing device of one embodiment of the present invention is characterized in that: (11) it has: a loading portion that loads a plurality of disc-shaped substrates before coating processing in parallel; and a guide rod that enables the substrate holding fixture for coating processing described in any one of the above (1) to (8) to enter and exit the inner hole of each of the plurality of disc-shaped substrates; and the guide rod has a front end that is used to maintain the movable piece of the substrate holding fixture for coating processing at the above-mentioned first position. [Effect of the invention]
根據本發明,能夠藉由以更簡單之構造減少來自基板或治具之發塵而抑制瘤塊產生,並且保持相對較多之圓盤狀基板浸漬於鍍浴中。According to the present invention, the generation of nodules can be suppressed by reducing dust from a substrate or a jig with a simpler structure, and a relatively large number of disc-shaped substrates can be kept immersed in a plating bath.
以下,對用於實施本發明之實施形態進行說明。再者,於以下說明所使用之圖式中,為了方便起見,將鍍覆處理用基板保持治具延伸之軸方向設定為AD,將與該軸方向AD交叉之方向(本實施形態中為徑方向)設定為RD。但該等方向僅係為了使說明之明確而設定者,並非不適當地限定解釋本發明者。The following is an explanation of the embodiments for implementing the present invention. In addition, in the drawings used in the following explanation, for the sake of convenience, the axial direction in which the substrate holding jig for plating processing extends is set as AD, and the direction intersecting the axial direction AD (in this embodiment, the radial direction) is set as RD. However, these directions are only set for the purpose of making the explanation clear, and are not intended to inappropriately limit the interpretation of the present invention.
《第1實施形態》 <鍍覆處理用基板保持治具100A> 首先,適當參照圖1~圖6,並且對第1實施形態中之鍍覆處理用基板保持治具100A之構成進行說明。 如圖1等所示,本實施形態中之鍍覆處理用基板保持治具100具有:插入圓盤狀基板1之內孔1a,並將複數個圓盤狀基板1浸漬於鍍浴槽內之鍍覆液中之功能。作為此種鍍覆處理用基板保持治具100之材質並無特別限制,例如可分別應用公知之金屬材、陶瓷、或合成樹脂材等作為主材料。此種主材料較佳為使用具有對酸及鹼較高之耐化學品性者,就耐磨耗性、電絕緣性、機械強度、加工性等觀點而言,可視平衡性而選擇。再者,就加工性觀點而言,較佳為選擇上述中之合成樹脂材或金屬材作為主材料。更具體而言,作為上述合成樹脂,例如可使用聚四氟乙烯(PTFE)、聚偏二氟乙烯(PVDF)、聚醚醚酮(PEEK)之任一者及/或該等之混合材料。又,作為上述金屬材,例如可使用不鏽鋼(SUS)、鈦(Ti)。又,本實施形態之鍍覆處理用基板保持治具100未必需要全部由單一材料構成,亦可如下所述般構成為例如將芯材設為金屬材(SUS等)並且將與圓盤狀基板1接觸之部分設為上述合成樹脂材等複合材料。《First Implementation》 <Substrate holding fixture 100A for plating treatment> First, with appropriate reference to FIGS. 1 to 6, the structure of the substrate holding fixture 100A for plating treatment in the first implementation is described. As shown in FIG. 1, etc., the substrate holding fixture 100 for plating treatment in this implementation has the function of inserting the inner hole 1a of the disc-shaped substrate 1 and immersing a plurality of disc-shaped substrates 1 in the plating liquid in the plating bath. There is no particular restriction on the material of the substrate holding fixture 100 for plating treatment. For example, known metal materials, ceramics, or synthetic resin materials can be used as the main materials. The main material is preferably one with high chemical resistance to acid and alkali, and can be selected based on the balance from the perspectives of wear resistance, electrical insulation, mechanical strength, and processability. Furthermore, from the perspective of processability, it is preferred to select the synthetic resin material or metal material mentioned above as the main material. More specifically, as the synthetic resin, for example, any one of polytetrafluoroethylene (PTFE), polyvinylidene fluoride (PVDF), polyetheretherketone (PEEK) and/or a mixed material thereof can be used. Moreover, as the metal material, for example, stainless steel (SUS) and titanium (Ti) can be used. Furthermore, the plating processing substrate holding jig 100 of this embodiment does not necessarily need to be entirely made of a single material, and may be constructed as described below, for example, by making the core material a metal material (SUS, etc.) and making the portion in contact with the disc-shaped substrate 1 a composite material such as the above-mentioned synthetic resin material.
本實施形態中較佳之圓盤狀基板1係由中心具有圓形貫通孔(內孔)之玻璃製或鋁等金屬製之材料構成之圓盤狀構件。此種圓盤狀基板1之厚度例如為0.3 mm~2.0 mm左右,一般而言,直徑超過2.5英吋之基板主要使用鋁製基板,2.5英吋以下之尺寸主要使用玻璃製基板。The preferred disc-shaped substrate 1 in this embodiment is a disc-shaped member made of glass or metal such as aluminum with a circular through hole (inner hole) in the center. The thickness of such disc-shaped substrate 1 is, for example, about 0.3 mm to 2.0 mm. Generally speaking, aluminum substrates are mainly used for substrates with a diameter exceeding 2.5 inches, and glass substrates are mainly used for substrates with a size below 2.5 inches.
其中,於鋁製圓盤狀基板1中,例如對自鋁原材料沖裁之受質實施所需之預處理後,實施利用下述Ni-P鍍覆液所進行之無電解鍍覆處理而於表面形成Ni-P合金被膜,進而,經過於其上積層強磁性金屬薄膜等形成為磁記錄碟片基板。Among them, in the aluminum disc-shaped substrate 1, for example, after the required pre-treatment is performed on the substrate punched from the aluminum raw material, an electroless plating treatment using the following Ni-P plating solution is performed to form a Ni-P alloy film on the surface, and then a ferromagnetic metal film is layered thereon to form a magnetic recording disk substrate.
如圖1~4等所示,鍍覆處理用基板保持治具100A係至少包含本體桿部10A、可動片20A及移動機構30而構成。 本體桿部10A係設有配置有下述可動片20A之凹陷區域,並且具有可沿軸方向插入圓盤狀基板1之內孔1a之外形長度的棒狀構件。此種本體桿部10A為以下形態:於其兩端設有端部區域ER,以夾於該等端部區域ER之方式配設有保持區域SR。換言之,本實施形態之本體桿部10A係包含每隔特定間隙保持圓盤狀基板1之保持區域SR、及配置於保持區域SR兩端之端部區域ER而構成。As shown in FIGS. 1 to 4, etc., the substrate holding fixture 100A for plating processing is composed of at least a main rod 10A, a movable piece 20A and a moving mechanism 30. The main rod 10A is a rod-shaped component having a recessed area in which the movable piece 20A described below is arranged, and having an outer length that can be inserted into the inner hole 1a of the disc-shaped substrate 1 along the axial direction. This main rod 10A is in the following form: end areas ER are provided at both ends thereof, and holding areas SR are arranged in a manner that is clamped by the end areas ER. In other words, the main rod 10A of this embodiment is composed of a holding area SR that holds the disc-shaped substrate 1 at a specific gap, and end areas ER arranged at both ends of the holding area SR.
端部區域ER例如為搭載於圖7所示之旋轉料架C時與治具安裝用軸承構件(未圖示)接觸之區域,進而,為放置於其他未圖示之支持台等時與該支持台接觸之區域,藉此,可於保持圓盤狀基板1之狀態下以該圓盤狀基板1不接地之方式支持。又,如下所述,端部區域ER亦可成為鍍覆處理裝置之機械手把持鍍覆處理用基板保持治具時與手部接觸之部位。 如下所述,於本發明中之各實施形態中,本體桿部10及可動片20可設為分別具有上述端部區域ER之構成。 再者,端部區域ER於本實施形態中,成為外形長度與下述保持區域SR相同之態樣,如下所述,成為其剖面為圓形且內部之一部分為空洞之圓筒狀。再者,端部區域ER及保持區域SR之外形長度可與本實施形態相同,亦可不同,就端部區域ER之外形長度於旋轉料架搭載時容易定位之觀點而言,較佳為不同。The end region ER is, for example, a region that contacts a jig mounting bearing member (not shown) when mounted on the rotating material rack C shown in FIG. 7, and further, a region that contacts the support platform when placed on other unshown support platforms, thereby supporting the disc-shaped substrate 1 in a non-grounded manner while holding the disc-shaped substrate 1. In addition, as described below, the end region ER can also be a portion that contacts the hand of a robot of a coating processing device when holding a substrate holding jig for coating processing. As described below, in each embodiment of the present invention, the main body rod 10 and the movable piece 20 can be configured to have the above-mentioned end region ER, respectively. Furthermore, in the present embodiment, the end region ER is formed to have the same outer length as the holding region SR described below, and as described below, is formed to have a cylindrical shape with a circular cross section and a part of the interior being hollow. Furthermore, the outer lengths of the end region ER and the holding region SR may be the same as those in the present embodiment or may be different. From the perspective of facilitating positioning when the rotary rack is mounted, it is preferred that the outer lengths of the end region ER are different.
此處,本實施形態中之「外形長度」指鍍覆處理用基板保持治具之最外周之徑方向長度中最長之部位。進而,鍍覆處理用基板保持治具之圓盤搭載方向之剖面形狀可為正圓、方形、橢圓或非對稱形狀等,該剖面形狀並無特別限定。因此,於鍍覆處理用基板保持治具之剖面形狀為圓之情形時,徑方向之長度大致相同,因此於該情形時,上述「外形長度」意指其外徑。再者,以下,為了對鍍覆處理用基板保持治具之剖面形狀為圓之情形進行說明,只要無特別說明,將「外形長度」作為「外徑」進行說明。Here, the "external length" in this embodiment refers to the longest part of the radial length of the outermost circumference of the substrate holding jig for plating processing. Furthermore, the cross-sectional shape of the disc mounting direction of the substrate holding jig for plating processing can be a perfect circle, a square, an ellipse or an asymmetric shape, etc., and the cross-sectional shape is not particularly limited. Therefore, when the cross-sectional shape of the substrate holding jig for plating processing is a circle, the length in the radial direction is roughly the same, so in this case, the above-mentioned "external length" means its outer diameter. Furthermore, below, in order to explain the case where the cross-sectional shape of the substrate holding jig for plating processing is a circle, unless otherwise specified, the "external length" will be explained as the "outer diameter".
保持區域SR於軸方向AD例如設定為端部區域ER之2倍以上之大小。於該保持區域SR,除設置下述移動機構30以外,形成有第1收容槽G1及第2收容槽G2。 又,關於移動機構30與第1收容槽G1及第2收容槽G2之排列關係,由圖1可知,於本實施形態中,於保持區域SR,移動機構30位於兩端,於該移動機構30內側配置有第1收容槽G1,於最內側配置有第2收容槽G2。The holding area SR is set to be, for example, twice or more the size of the end area ER in the axial direction AD. In the holding area SR, in addition to the following moving mechanism 30, a first receiving groove G1 and a second receiving groove G2 are formed. In addition, regarding the arrangement relationship between the moving mechanism 30 and the first receiving groove G1 and the second receiving groove G2, it can be seen from FIG. 1 that in this embodiment, in the holding area SR, the moving mechanism 30 is located at both ends, the first receiving groove G1 is arranged inside the moving mechanism 30, and the second receiving groove G2 is arranged at the innermost side.
第1收容槽G1如上所述配置於較第2收容槽G2靠外側(端部側)。該第1收容槽G1係具有收容未圖示之虛設基板之功能而構成。換言之,本實施形態之鍍覆處理用基板保持治具100A具有於複數個圓盤狀基板1之兩側保持虛設基板之功能。As described above, the first receiving groove G1 is arranged on the outer side (end side) of the second receiving groove G2. The first receiving groove G1 is configured to have the function of accommodating a dummy substrate not shown. In other words, the substrate holding fixture 100A for plating processing of this embodiment has the function of holding dummy substrates on both sides of a plurality of disc-shaped substrates 1.
此處,虛設基板指外形與圓盤狀基板1大致共通但未製成製品之基板。保持於鍍覆處理用基板保持治具100A之基板中之最外側之基板由於在鍍浴中暴露於最強之液體流動,因此形成於該基板之鍍覆被膜亦不易變得均一。就此種理由而言,於本實施形態中,較佳為搭載虛設基板,但未必必須,亦可無虛設基板。Here, the dummy substrate refers to a substrate that has a shape similar to that of the disk-shaped substrate 1 but has not yet been manufactured. The outermost substrate among the substrates held in the substrate holding jig 100A for plating treatment is exposed to the strongest liquid flow in the plating bath, so the plating film formed on the substrate is not easy to become uniform. For this reason, in this embodiment, it is preferred to carry a dummy substrate, but it is not necessarily necessary and there may be no dummy substrate.
因此,於本實施形態中,藉由對上述最外側之基板分配虛設基板,實現提高成為製品之在圓盤狀基板1所形成之鍍覆被膜之品質。再者,於本實施形態中,於第2收容槽G2之兩側配置有共2個第1收容槽G1,但並不限定於此,亦可於上述兩側配置2個以上第1收容槽G1。Therefore, in this embodiment, by allocating a dummy substrate to the outermost substrate, the quality of the coating film formed on the disk-shaped substrate 1 of the finished product is improved. Furthermore, in this embodiment, a total of two first receiving grooves G1 are arranged on both sides of the second receiving groove G2, but it is not limited to this, and more than two first receiving grooves G1 can also be arranged on the above-mentioned two sides.
第2收容槽G2為用以收容圓盤狀基板1之槽,於保持區域SR內沿軸方向AD相隔特定間隙設有複數個。再者,第2收容槽G2例如可為與槽之深度或底部相關之斜面之角度等與第1收容槽G1不同之形狀,該等亦可為相同形狀。The second receiving groove G2 is a groove for receiving the disc-shaped substrate 1, and a plurality of the second receiving grooves G2 are provided in the holding region SR at specific intervals along the axial direction AD. Furthermore, the second receiving groove G2 may be different from the first receiving groove G1 in shape, such as the groove depth or the angle of the slope related to the bottom, or may be the same shape.
可動片20A以如下方式構成:可在與軸方向交叉之交叉方向(本實施形態中為徑方向RD)上相對於上述本體桿部10A接近或遠離。 更具體而言,本實施形態中之可動片20A具有定位於以下位置之功能:第1位置P1(參照圖3及圖4),其係可接近本體桿部10A與該本體桿部10A一起通過圓盤狀基板1之內孔1a者;及第2位置P2(參照圖2及圖4),其係較該第1位置P1而言於交叉方向靠外側,且鍍覆處理用基板保持治具100A中之外形長度變得大於基板之內孔徑者。The movable piece 20A is configured as follows: it can approach or move away from the main body rod 10A in the intersecting direction (the radial direction RD in the present embodiment) intersecting the axial direction. More specifically, the movable piece 20A in the present embodiment has the function of being positioned at the following positions: the first position P1 (refer to FIG. 3 and FIG. 4 ), which is close to the main body rod 10A and passes through the inner hole 1a of the disc-shaped substrate 1 together with the main body rod 10A; and the second position P2 (refer to FIG. 2 and FIG. 4 ), which is outside the first position P1 in the intersecting direction and the outer length of the substrate holding fixture 100A for plating processing becomes larger than the inner hole diameter of the substrate.
再者,於本實施形態中,較佳為於可動片20A之至少一端部形成有錐形部20t。該錐形部20t具有於下述筒狀體150c插入時引導該筒狀體150c之功能,藉此,可動片20A藉由筒狀體150c移動至第1位置而不發生碰撞。又,關於錐形部20t之形成態樣並無特別限制,只要可發揮上述功能,例示如圖示之各種形狀。Furthermore, in this embodiment, it is preferred that a tapered portion 20t is formed at least at one end of the movable piece 20A. The tapered portion 20t has the function of guiding the cylindrical body 150c when the cylindrical body 150c described below is inserted, thereby allowing the movable piece 20A to move to the first position through the cylindrical body 150c without collision. In addition, there is no particular limitation on the formation of the tapered portion 20t, as long as the above-mentioned function can be exerted, and various shapes such as shown in the figure are exemplified.
移動機構30係具有使上述可動片20A相對於本體桿部10A沿上述交叉方向(本實施形態中為徑方向RD)相對移動之功能而構成。 由圖1(b)、圖2及圖4等可知,本實施形態中之移動機構30係包含限制部31、及彈性構件32而構成。如該圖所示,於本實施形態中,由限制部31及彈性構件32構成之組件於本體桿部10A之軸方向AD設有2組。再者,由限制部31及彈性構件32構成之組件較佳為設置1組,但亦可設置以3組以上之任意組數。又,限制部31及/或彈性構件32不僅可設為組件,亦可各自以任意數設置。The moving mechanism 30 is configured to have the function of making the movable piece 20A relatively move along the above-mentioned intersection direction (radial direction RD in this embodiment) relative to the main body rod 10A. As shown in Figures 1 (b), 2 and 4, the moving mechanism 30 in this embodiment includes a limiting portion 31 and an elastic member 32. As shown in the figure, in this embodiment, the assembly consisting of the limiting portion 31 and the elastic member 32 is provided in two groups in the axial direction AD of the main body rod 10A. Furthermore, the assembly consisting of the limiting portion 31 and the elastic member 32 is preferably provided in one group, but it can also be provided in any number of groups of more than three groups. In addition, the limiting portion 31 and/or the elastic member 32 can not only be provided as an assembly, but can also be provided in any number.
限制部31具有規定可動片20A朝向徑方向RD之移動範圍之功能。利用該限制部31規定上述可動片20A中之第2位置P2。 更具體而言,如圖1(b)及圖4所示,作為本實施形態之限制部31之具體例,可例示具有凸緣部F之傘形構件。作為此種傘形構件,例如較佳為螺絲、鉚釘等。The limiting portion 31 has the function of defining the range of movement of the movable piece 20A in the radial direction RD. The limiting portion 31 is used to define the second position P2 in the movable piece 20A. More specifically, as shown in FIG. 1 (b) and FIG. 4 , as a specific example of the limiting portion 31 of the present embodiment, an umbrella-shaped member having a flange portion F can be exemplified. As such an umbrella-shaped member, for example, a screw, a rivet, etc. are preferred.
如圖4所示,作為本實施形態之限制部31之傘形構件之基端側固定於本體桿部10A,並且,包含凸緣部F之上部收容於形成於可動片20之凹部21。如此,於本實施形態中,作為限制部31之傘形構件係以凸緣部F於可動片20A之內部(凹部21內)沿徑方向RD移動之方式,其基端立設於本體桿部10A。 再者,如圖4所示,於本體桿部10A以對應於凹部21之方式設有基準孔sh。藉此,於組裝本體桿部10A及可動片20A時,容易對準凹部21及限制部31。As shown in FIG. 4 , the base end side of the umbrella-shaped member as the limiting portion 31 of this embodiment is fixed to the main body rod 10A, and the upper part including the flange F is accommodated in the recess 21 formed in the movable piece 20. Thus, in this embodiment, the umbrella-shaped member as the limiting portion 31 is erected on the main body rod 10A in such a manner that the flange F moves along the radial direction RD inside the movable piece 20A (in the recess 21). Furthermore, as shown in FIG. 4 , a reference hole sh is provided in the main body rod 10A in a manner corresponding to the recess 21. Thereby, when assembling the main body rod 10A and the movable piece 20A, it is easy to align the recess 21 and the limiting portion 31.
並且,成為以下狀態:可動片20A成為第1位置P1時,於可動片20A之凹部21內,凸緣部F相對向上方移動,可動片20A成為第2位置P2時,凸緣部F接觸並掛在凹部21底部。若根據此種第2位置P2之功能面,則本實施形態中之「第2位置P2」亦可換言為以下位置:較第1位置P1靠徑方向外側,且本體桿部10A及可動片20A之至少一者與圓盤狀基板1之內孔1a接觸而可保持圓盤狀基板1。進而,若鑒於第2位置之狀態而換言之,則本實施形態中之「第2位置P2」亦可謂為以下位置:較第1位置P1靠徑方向外側,且鍍覆處理用基板保持治具100中之外徑之外接圓變得大於圓盤狀基板1之內孔1a之徑。Furthermore, the following state is achieved: when the movable piece 20A is at the first position P1, the flange F moves upward relatively in the recess 21 of the movable piece 20A, and when the movable piece 20A is at the second position P2, the flange F contacts and hangs on the bottom of the recess 21. According to the functional surface of the second position P2, the "second position P2" in this embodiment can also be said to be the following position: the position is radially outward from the first position P1, and at least one of the main rod 10A and the movable piece 20A contacts the inner hole 1a of the disc-shaped substrate 1 to hold the disc-shaped substrate 1. Furthermore, in view of the state of the second position, in other words, the "second position P2" in this embodiment can also be referred to as the following position: it is radially outward compared to the first position P1, and the circumscribed circle of the outer diameter in the coating processing substrate holding fixture 100 becomes larger than the diameter of the inner hole 1a of the disk-shaped substrate 1.
例如,如圖4所示,彈性構件32配置於可動片20A與本體桿部10A之間。更具體而言,於本體桿部10A及可動片20A中對向之面分別形成有凹部22,藉由該一對凹部22相對而形成有彈性構件32之收容空間。For example, as shown in Fig. 4, the elastic member 32 is disposed between the movable piece 20A and the main body rod 10A. More specifically, the main body rod 10A and the movable piece 20A have concave portions 22 formed on the opposing surfaces thereof, and the pair of concave portions 22 are opposed to form a space for accommodating the elastic member 32.
此種彈性構件32以相對於本體桿部10A隔開可動片20A之方式發揮作用。並且,如上所述,於本實施形態中,由於由限制部31規定可動片20A之間隔極限,因此,作為基準狀態,以可動片20A因彈性構件32之作用而成為第2位置P2之方式設定。Such elastic member 32 functions to separate movable piece 20A from main rod 10A. In addition, as described above, in this embodiment, since the spacing limit of movable piece 20A is defined by limiting portion 31, movable piece 20A is set to be at second position P2 by elastic member 32 as a reference state.
再者,於本實施形態中,應用螺旋彈簧作為彈性構件32,但只要能夠發揮上述作用則無特別限制,例如亦可應用橡膠等其他公知之彈性材作為彈性構件32。 又,於本實施形態中之移動機構30中,與彈性構件32相比,限制部31於軸方向AD配設於外側,但並不限定於該態樣,彈性構件32亦可較限制部31於軸方向AD配設於靠外側。Furthermore, in this embodiment, a coil spring is used as the elastic member 32, but there is no particular limitation as long as it can play the above-mentioned role. For example, other well-known elastic materials such as rubber can also be used as the elastic member 32. In addition, in the moving mechanism 30 in this embodiment, the limiting portion 31 is arranged on the outside in the axial direction AD compared to the elastic member 32, but it is not limited to this state. The elastic member 32 can also be arranged on the outside in the axial direction AD compared to the limiting portion 31.
<可動片20A之狀態轉換> 繼而,使用圖5及圖6,對本實施形態之鍍覆處理用基板保持治具100A插入圓盤狀基板1以保持該基板之態樣進行說明。 即,首先,如圖5(a)所示,可動片20A處於第1位置P1時,鍍覆處理用基板保持治具100A之外徑(外形長度)成為D3(參照圖3)。<State transition of movable piece 20A> Next, using FIG. 5 and FIG. 6, the state in which the substrate holding jig 100A for plating processing of this embodiment is inserted into the disc-shaped substrate 1 to hold the substrate is described. That is, first, as shown in FIG. 5 (a), when the movable piece 20A is at the first position P1, the outer diameter (external length) of the substrate holding jig 100A for plating processing becomes D3 (refer to FIG. 3).
該外徑D3(外形長度)之大小變成小於圓盤狀基板1之內孔1a之直徑。 因此,例如如下所述,若以機械手等機構維持該狀態,則鍍覆處理用基板保持治具100A可順利通過複數個圓盤狀基板1之內孔1a。The size of the outer diameter D3 (outer length) becomes smaller than the diameter of the inner hole 1a of the disk-shaped substrate 1. Therefore, if this state is maintained by a mechanism such as a robot as described below, the substrate holding jig 100A for plating processing can smoothly pass through the inner holes 1a of a plurality of disk-shaped substrates 1.
接著,鍍覆處理用基板保持治具100A於插入預定片數之圓盤狀基板1及虛設基板之內孔後藉由機械手等公知之把持機構而把持,分割導桿,設置於旋轉料架C。如此,如圖5(b)所示,因限制部31及彈性構件32之作用,可動片20A以相對於本體桿部10A採取第2位置P2之方式移動,上述虛設基板及圓盤狀基板1分別保持收容於保持區域SR內之第1收容槽G1及第2收容槽G2(參照圖6)。Next, the substrate holding jig 100A for plating treatment is inserted into the inner hole of the predetermined number of disc-shaped substrates 1 and the dummy substrate, and then held by a known holding mechanism such as a robot, the guide rod is divided, and set on the rotary material rack C. In this way, as shown in FIG5 (b), due to the action of the limiting portion 31 and the elastic member 32, the movable piece 20A moves in a manner of taking the second position P2 relative to the main rod portion 10A, and the dummy substrate and the disc-shaped substrate 1 are respectively held in the first receiving groove G1 and the second receiving groove G2 (see FIG6) contained in the holding area SR.
此時如該圖所示,可動片20A處於第2位置P2時,鍍覆處理用基板保持治具100A之外徑(外形長度)成為D2(參照圖2)。該外徑(外形長度)D2之大小以變得大於圓盤狀基板1之內孔1a之直徑的方式設定。又,該外徑(外形長度)D2之大小以變得大於本體桿部10A之端部區域ER之外徑的方式構成。At this time, as shown in the figure, when the movable piece 20A is at the second position P2, the outer diameter (outer length) of the substrate holding jig 100A for plating processing becomes D2 (refer to Figure 2). The size of the outer diameter (outer length) D2 is set so as to become larger than the diameter of the inner hole 1a of the disc-shaped substrate 1. In addition, the size of the outer diameter (outer length) D2 is configured so as to become larger than the outer diameter of the end region ER of the main body rod 10A.
此時,如圖5(b)所示,圓盤狀基板1之內孔1a成為與可動片20A側之第2收容槽G2接觸之狀態。換言之,於本實施形態中,於圓盤狀基板1收容保持於鍍覆處理用基板保持治具100A時(收容保持基板時),可動片20A及本體桿部10A之至少一者與圓盤狀基板1之內孔1a接觸即可(將該態樣稱為1點接觸或上部接觸)。At this time, as shown in FIG. 5( b ), the inner hole 1a of the disk-shaped substrate 1 is in contact with the second receiving groove G2 on the side of the movable piece 20A. In other words, in this embodiment, when the disk-shaped substrate 1 is received and held in the substrate holding jig 100A for plating processing (when receiving and holding the substrate), at least one of the movable piece 20A and the main body rod 10A may be in contact with the inner hole 1a of the disk-shaped substrate 1 (this state is referred to as single-point contact or upper contact).
又,亦可為以下態樣:藉由利用限制部31調整可動片20A朝向徑方向RD之移動範圍(間隙之寬度D1),於收容保持基板時,可動片20A及本體桿部10A兩者之第2收容槽G2與圓盤狀基板1之內孔1a接觸(亦稱為2點接觸或上下接觸)。藉此,與1點接觸或上部接觸之情形相比,由於進一步抑制圓盤狀基板1之擺動,因此進一步避免於鍍浴中亦導致圓盤狀基板1彼此接觸。再者,於第2位置P2之收容槽較佳為最深部(底)之外接圓之大小未達圓盤狀基板1之內孔1a。又,於收容槽以2點接觸(或上下接觸)之方式與圓盤狀基板1之內孔1a接觸2點以上之情形時,較佳為於基板與槽之間具有該圓盤狀基板1可於鍍覆液中旋轉程度之間隙。即,鍍覆液中之圓盤狀基板1可為旋轉中之接觸點數量發生變化之構造。Furthermore, the following embodiment may be adopted: by adjusting the moving range (gap width D1) of the movable piece 20A in the radial direction RD by using the limiting portion 31, when accommodating and holding the substrate, the second receiving groove G2 of both the movable piece 20A and the main rod portion 10A contacts the inner hole 1a of the disc-shaped substrate 1 (also referred to as two-point contact or upper and lower contact). In this way, compared with the case of one-point contact or upper contact, since the swing of the disc-shaped substrate 1 is further suppressed, the disc-shaped substrates 1 are further prevented from contacting each other in the plating bath. Furthermore, the receiving groove at the second position P2 is preferably such that the size of the circumscribed circle of the deepest part (bottom) does not reach the inner hole 1a of the disc-shaped substrate 1. Furthermore, when the receiving groove contacts the inner hole 1a of the disc-shaped substrate 1 at two or more points in a two-point contact manner (or upper and lower contact), it is preferred that there is a gap between the substrate and the groove to the extent that the disc-shaped substrate 1 can rotate in the coating liquid. That is, the disc-shaped substrate 1 in the coating liquid can be configured to have a structure in which the number of contact points changes during rotation.
<鍍覆處理裝置200> 繼而,亦參照圖7(a)及圖8,對本實施形態中之鍍覆處理裝置200及使用該裝置之基板保持方法以及鍍覆處理方法進行詳述。 首先,如圖7(a)所示,鍍覆處理裝置200係於鍍浴槽內之鍍覆液中浸漬圓盤狀基板之鍍覆處理裝置,且至少包含載置部110及軸按壓部120,進而具有把持部130及升降部140而構成。<Coating treatment device 200> Next, referring to FIG. 7 (a) and FIG. 8, the coating treatment device 200 in this embodiment and the substrate holding method and coating treatment method using the device are described in detail. First, as shown in FIG. 7 (a), the coating treatment device 200 is a coating treatment device for immersing a disc-shaped substrate in a coating liquid in a coating bath, and includes at least a mounting portion 110 and a shaft pressing portion 120, and further has a holding portion 130 and a lifting portion 140.
載置部110係並列載置鍍覆處理前之複數個圓盤狀基板1之構件。 由該圖可知,載置部110以可於使圓盤狀基板1及/或虛設基板立起之狀態(內孔橫向之狀態)下間隔特定間隙而載置之方式形成有收容槽部。再者,上述圓盤狀基板1彼此之特定間隙設定為與第1收容槽G1或第2收容槽G2對應之大小。The mounting part 110 is a component for mounting a plurality of disk-shaped substrates 1 before plating in parallel. As can be seen from the figure, the mounting part 110 is formed with receiving grooves in a manner that allows the disk-shaped substrates 1 and/or dummy substrates to be mounted with a specific gap in a state where the disk-shaped substrates 1 and/or dummy substrates are erected (in a state where the inner hole is horizontal). Furthermore, the specific gaps between the above-mentioned disk-shaped substrates 1 are set to a size corresponding to the first receiving groove G1 or the second receiving groove G2.
如圖7(a)所示,軸按壓部120於鍍覆處理用基板保持治具100A之兩端側合計配置有2個。該等一對之軸按壓部120係於未圖示之控制裝置之控制下,具有把持鍍覆處理用基板保持治具100A之端部側之功能、及將把持之鍍覆處理用基板保持治具100A安裝於旋轉料架C之功能而構成。 作為此種軸按壓部120之具體例,可應用機械手等公知之把持機構。As shown in FIG. 7 (a), a total of two shaft pressing parts 120 are arranged on both ends of the substrate holding fixture 100A for plating processing. The pair of shaft pressing parts 120 are controlled by a control device not shown in the figure, and have the function of holding the end side of the substrate holding fixture 100A for plating processing and installing the held substrate holding fixture 100A for plating processing on the rotating material rack C. As a specific example of such a shaft pressing part 120, a known holding mechanism such as a robot can be applied.
把持部130係具有以自兩側夾住圓盤狀基板1及/或虛設基板外周面之方式把持之功能而構成。藉此,能夠一次把持載置於載置部110之複數個圓盤狀基板1及/或虛設基板。The holding portion 130 is configured to hold the outer peripheral surface of the disk-shaped substrate 1 and/or the dummy substrate by clamping it from both sides. Thus, a plurality of disk-shaped substrates 1 and/or dummy substrates placed on the placing portion 110 can be held at one time.
升降部140兼具經由電動馬達等公知之動力源,使把持部130沿鉛直方向移動之上下移動功能、及沿水平方向移動之水平移動功能。再者,該等上下移動功能與水平移動功能可為分離之形態。藉此,可於以把持部130一次把持複數個圓盤狀基板1及/或虛設基板之狀態下,例如使基板移動至一對之軸按壓部120之間等任意部位。The lifting part 140 has both the up-and-down movement function of the holding part 130 in the vertical direction and the horizontal movement function of the holding part 130 in the horizontal direction through a known power source such as an electric motor. Furthermore, the up-and-down movement function and the horizontal movement function can be separated. In this way, when the holding part 130 holds a plurality of disk-shaped substrates 1 and/or dummy substrates at one time, the substrates can be moved to any position such as between a pair of shaft pressing parts 120.
導桿150a係用於將鍍覆處理用基板保持治具100A插入立設之複數個圓盤狀基板1及/或虛設基板之內孔之構件。導桿150a以可利用公知之驅動機構相對於立設之複數個圓盤狀基板1及/或虛設基板之內孔進退之方式構成。The guide rod 150a is a member for inserting the substrate holding jig 100A for plating processing into the inner holes of the plurality of upright disc-shaped substrates 1 and/or dummy substrates. The guide rod 150a is constructed in a manner that it can advance and retreat relative to the inner holes of the plurality of upright disc-shaped substrates 1 and/or dummy substrates using a known driving mechanism.
如下所述,首先,導桿150a自身插入內孔後進行自該內孔拔出之動作。並且藉由導桿150a自內孔脫離時伴有鍍覆處理用基板保持治具100A,以無縫替換之形式鍍覆處理用基板保持治具100A插入至內孔。 此時,導桿150a可具有將鍍覆處理用基板保持治具100A維持為通過圓盤狀基板1之內孔之外徑之功能。例如,將圖7(b)所示之導桿150b之前端設為開口之筒狀體150c,可將鍍覆處理用基板保持治具100A之一端(與導桿接觸之側)於第1位置P1之狀態下插入筒狀體150c。藉由如此構成,可將鍍覆處理用基板保持治具100A之可動片20A維持於第1位置P1之狀態。 再者,作為旋轉料架C,於本實施形態中省略圖示,但例如可應用配設有治具安裝用C形軸承構件(未圖示)等之公知形狀。As described below, first, the guide rod 150a itself is inserted into the inner hole and then pulled out from the inner hole. And when the guide rod 150a is detached from the inner hole, the substrate holding jig 100A for coating processing is inserted into the inner hole in a seamless replacement manner. At this time, the guide rod 150a can have the function of maintaining the substrate holding jig 100A for coating processing to the outer diameter passing through the inner hole of the disc-shaped substrate 1. For example, the front end of the guide rod 150b shown in Figure 7 (b) is set as an open cylindrical body 150c, and one end (the side in contact with the guide rod) of the substrate holding jig 100A for coating processing can be inserted into the cylindrical body 150c in the state of the first position P1. By configuring in this way, the movable piece 20A of the substrate holding jig 100A for plating processing can be maintained at the first position P1. Furthermore, although the rotary rack C is not shown in the present embodiment, a known shape such as a C-shaped bearing member (not shown) for jig mounting can be applied.
繼而,亦參照圖8且對本實施形態之鍍覆處理用基板保持治具中之基板保持方法進行說明。 首先,於步驟1中,利用未圖示之供給機構將鍍覆處理前之複數個圓盤狀基板1並列載置於載置部110。此時由圖7亦可知,複數個圓盤狀基板1及/或虛設基板以立起之狀態並列配置。Next, the substrate holding method in the substrate holding fixture for plating treatment of this embodiment is described with reference to FIG8. First, in step 1, a plurality of disc-shaped substrates 1 before plating treatment are placed side by side on the placement portion 110 using a supply mechanism not shown. At this time, it can also be seen from FIG7 that a plurality of disc-shaped substrates 1 and/or dummy substrates are arranged side by side in an upright state.
接著於步驟2中,把持圓盤狀基板1及/或虛設基板之外周。更具體而言,對於並列配置於載置部110之圓盤狀基板1及/或虛設基板,以把持部130把持該等基板之外周。進而,於本步驟中,於把持部130把持基板外周之狀態下,升降部140升起圓盤狀基板1及/或虛設基板。 藉此,以可供導桿150插入之方式,複數個圓盤狀基板1及/或虛設基板之內孔直線排列。 再者,於步驟2之狀態下,於旋轉料架C之正面定位由把持部130把持之圓盤狀基板1及/或虛設基板,鍍覆處理用基板保持治具100A為仍未插入內孔而於側方待機之狀態。Then, in step 2, the outer periphery of the disk-shaped substrate 1 and/or the dummy substrate is held. More specifically, the outer periphery of the disk-shaped substrate 1 and/or the dummy substrate arranged in parallel on the mounting portion 110 is held by the holding portion 130. Furthermore, in this step, the lifting portion 140 lifts the disk-shaped substrate 1 and/or the dummy substrate while the holding portion 130 holds the outer periphery of the substrate. Thereby, the inner holes of the plurality of disk-shaped substrates 1 and/or the dummy substrates are arranged in a straight line in a manner that allows the guide rod 150 to be inserted. Furthermore, in the state of step 2, the disc-shaped substrate 1 and/or the dummy substrate held by the holding portion 130 is positioned on the front of the rotating material rack C, and the substrate holding fixture 100A for plating processing is not yet inserted into the inner hole and is in a standby state at the side.
並且,於步驟3中,把持可動片20A中之非插入側之握把區域GR(參照圖1)。更具體而言,藉由圖7所示之一對之軸按壓部120中之紙面右側(由於導桿150配置於左側,因此右側為非插入側)之軸按壓部120把握上述握把區域GR。藉此,可動片20A被拉至本體桿部10A側,該可動片20A定位於第1位置P1。Furthermore, in step 3, the gripping region GR of the non-insertion side of the movable piece 20A is gripped (refer to FIG. 1 ). More specifically, the gripping region GR is gripped by the shaft pressing portion 120 on the right side of the paper (since the guide rod 150 is arranged on the left side, the right side is the non-insertion side) of the pair of shaft pressing portions 120 shown in FIG. 7 . As a result, the movable piece 20A is pulled to the main rod portion 10A side, and the movable piece 20A is positioned at the first position P1.
又,於步驟4中,以與複數個圓盤狀基板1及/或虛設基板(此時之該等基板亦稱為「基板群」)之內孔對向之方式,於基板群中之非插入側之外側(圖7中較右側之軸按壓部120更靠右側)使鍍覆處理用基板保持治具100A待機。此時,鍍覆處理用基板保持治具100A之端部孔10h(參照圖1)定位於與上述基板群之內孔對向之位置。Furthermore, in step 4, the substrate holding jig 100A for plating processing is placed on standby outside the non-insertion side of the substrate group (to the right of the shaft pressing portion 120 on the right side in FIG. 7 ) in a manner that the substrates are opposed to the inner holes of the plurality of disk-shaped substrates 1 and/or dummy substrates (these substrates are also referred to as "substrate group" at this time). At this time, the end hole 10h (refer to FIG. 1 ) of the substrate holding jig 100A for plating processing is positioned to be opposed to the inner hole of the substrate group.
因此,到達步驟4後,於以把持部130把持各基板群之外周,並且自插入側插入導桿150之情形時,仍為可插入至鍍覆處理用基板保持治具100A之端部孔10h之狀態。 再者,上述步驟2~4可至少一部分並行實行,亦可步驟2與步驟3以相反之順序實行。又,於鍍覆處理用基板保持治具100A配置於與導桿150之行進方向一致之部位之情形時,上述步驟4可省略。Therefore, after reaching step 4, when the outer periphery of each substrate group is held by the holding portion 130 and the guide rod 150 is inserted from the insertion side, it is still in a state where it can be inserted into the end hole 10h of the substrate holding fixture 100A for plating processing. Furthermore, the above steps 2 to 4 can be performed at least partially in parallel, and step 2 and step 3 can be performed in the opposite order. In addition, when the substrate holding fixture 100A for plating processing is arranged at a position consistent with the travel direction of the guide rod 150, the above step 4 can be omitted.
接著,於步驟5中,將導桿150自插入側(為未配置鍍覆處理用基板保持治具100A之側,於圖7之情形時為紙面左側)插入基板群之內孔,並且進而導桿150之前端部插入於鍍覆處理用基板保持治具100A之一部分(端部孔10h)。Next, in step 5, the guide rod 150 is inserted into the inner hole of the substrate group from the insertion side (the side where the substrate holding jig 100A for coating processing is not configured, which is the left side of the paper in the case of Figure 7), and then the front end of the guide rod 150 is inserted into a part of the substrate holding jig 100A for coating processing (the end hole 10h).
並且,於接下來之步驟6中,拔出導桿150,並且使鍍覆處理用基板保持治具100A與導桿150連動而插入基板群之內孔。如上所述,經過步驟5之時點後,導桿150之前端部與鍍覆處理用基板保持治具100A之端部孔10h一體化。因此,導桿150自基板群之內孔拔出時,與導桿150連動之鍍覆處理用基板保持治具100A亦可無縫插入上述基板群之內孔。再者,此時可動片20A為利用軸按壓部120維持第1位置P1之狀態,或者為利用導桿150維持第1位置P1之狀態。 如此,於本實施形態中,以可動片20A利用一軸按壓部120而維持第1位置P1之狀態,鍍覆處理用基板保持治具100A與導桿150之上述自內孔拔出之動作連動而插入複數個圓盤狀基板各者之內孔。Furthermore, in the next step 6, the guide rod 150 is pulled out, and the substrate holding fixture 100A for coating processing is linked with the guide rod 150 and inserted into the inner hole of the substrate group. As described above, after the time point of step 5, the front end of the guide rod 150 is integrated with the end hole 10h of the substrate holding fixture 100A for coating processing. Therefore, when the guide rod 150 is pulled out from the inner hole of the substrate group, the substrate holding fixture 100A for coating processing linked with the guide rod 150 can also be seamlessly inserted into the inner hole of the above-mentioned substrate group. Furthermore, at this time, the movable piece 20A is in a state of maintaining the first position P1 by using the shaft pressing part 120, or in a state of maintaining the first position P1 by using the guide rod 150. Thus, in this embodiment, the movable piece 20A is maintained at the first position P1 by the axial pressing portion 120, and the substrate holding jig 100A for coating processing is inserted into the inner holes of each of the plurality of disc-shaped substrates in conjunction with the above-mentioned withdrawal of the guide rod 150 from the inner hole.
再者,於本實施形態中,將鍍覆處理用基板保持治具100A插入基板群之內孔時輔助性使用了導桿150,但該導桿150未必必須,亦可適當將其省略。 繼而於步驟7中,以步驟3中把持可動片20A之握把區域GR之狀態,驅動一對之軸按壓部120將鍍覆處理用基板保持治具100A安裝於旋轉料架C。此時,例如一對之軸按壓部120可把持鍍覆處理用基板保持治具100A之端部區域ER。又,於步驟7中亦可進行適當躲避升降部140之動作。將鍍覆處理用基板保持治具100A安裝於旋轉料架C後,解除軸按壓部120之把持,可將可動片20A設為第2位置P2之狀態。Furthermore, in this embodiment, the guide rod 150 is used as an auxiliary when inserting the substrate holding fixture 100A for coating processing into the inner hole of the substrate group, but the guide rod 150 is not necessarily required and can be appropriately omitted. Then, in step 7, in the state of holding the gripping area GR of the movable piece 20A in step 3, the pair of shaft pressing parts 120 are driven to install the substrate holding fixture 100A for coating processing on the rotating material rack C. At this time, for example, the pair of shaft pressing parts 120 can hold the end area ER of the substrate holding fixture 100A for coating processing. In addition, in step 7, the action of appropriately avoiding the lifting part 140 can also be performed. After the substrate holding jig 100A for plating processing is mounted on the rotary rack C, the holding of the shaft pressing portion 120 is released, and the movable piece 20A can be set to the second position P2.
因此,於步驟7中,於可動片20A成為第1位置P1之狀態下,保持複數個圓盤狀基板1之鍍覆處理用基板保持治具100A實行由一對之軸按壓部120安裝於旋轉料架C之動作。 再者,於本實施形態中,例示了於可動片20A成為第1位置P1之狀態下安裝於旋轉料架C,但亦可設為於將可動片20之位置自第1位置P1轉換為第2位置P2之狀態後安裝於旋轉料架C之構成。Therefore, in step 7, the substrate holding jig 100A for plating processing that holds a plurality of disc-shaped substrates 1 is mounted on the rotary material rack C by a pair of shaft pressing parts 120 when the movable piece 20A is in the first position P1. In this embodiment, the movable piece 20A is mounted on the rotary material rack C when it is in the first position P1, but it may be mounted on the rotary material rack C after the position of the movable piece 20 is changed from the first position P1 to the second position P2.
並且於步驟8中判定是否將預定片數設置於旋轉料架C,於仍非預定片數之情形時再次實行自步驟1之處理,於達到預定片數之情形時結束設置處理而將旋轉料架C移動至鍍覆預處理槽、鍍浴槽及水洗、乾燥槽中。 再者,本實施形態中較佳之鍍浴槽為能夠內包1或複數個旋轉料架C的程度之大小之金屬製或樹脂製槽。作為鍍覆預處理槽,可用於脫脂、酸蝕刻、除垢、1st鋅酸鹽、脫鋅酸鹽、2nd鋅酸鹽。作為鍍浴槽,例如可應用上述專利文獻中所揭示之浴槽或其他公知之無電解鍍浴槽。於本實施形態中,貯存於鍍浴槽內之鍍覆液作為一例可應用公知之Ni-P鍍覆液,例如可例示包含硫酸鎳:20 g/dm3 、次磷酸鈉:20 g/dm3 、乙酸鈉:10 g/dm3 、檸檬酸鈉:10 g/dm3 之水溶液等。此外,亦可於各工序間之水洗或乾燥中使用,就生產性提高之觀點而言,較佳為於所有工序中使用本發明,但亦可僅於一部分工序中使用。In step 8, it is determined whether the predetermined number of sheets is set on the rotary rack C. If the predetermined number of sheets is not set, the process from step 1 is performed again. If the predetermined number of sheets is reached, the setting process is terminated and the rotary rack C is moved to the coating pretreatment tank, the coating bath tank, and the water washing and drying tank. In addition, the preferred coating bath tank in this embodiment is a metal or resin tank of a size that can contain one or more rotary racks C. As a coating pretreatment tank, it can be used for degreasing, acid etching, descaling, 1st zincate, dezincification, and 2nd zincate. As a plating bath, for example, the bath disclosed in the above patent document or other known electroless plating baths can be used. In this embodiment, the plating solution stored in the plating bath can be a known Ni-P plating solution as an example, for example, an aqueous solution containing nickel sulfate: 20 g/dm 3 , sodium hypophosphite: 20 g/dm 3 , sodium acetate: 10 g/dm 3 , sodium citrate: 10 g/dm 3 , etc. In addition, it can also be used in water washing or drying between each process. From the perspective of improving productivity, it is preferred to use the present invention in all processes, but it can also be used in only a part of the process.
根據以上說明之本實施形態中之鍍覆處理用基板保持治具100A、鍍覆處理裝置200,於可動片20A處於第1位置P1時可將鍍覆處理用基板保持治具100A插入於複數個圓盤狀基板1之內孔1a,另一方面,於可動片20A經由移動機構30處於第2位置P2時,可抑制基板彼此之接觸並且於儘可能少之接觸部位保持該等基板。 藉此,即使於基板之薄壁化不斷發展而成為厚度極薄之基板(例如厚度為0.635 mm、0.6 mm、0.5 mm或0.38 mm等)之情形時,亦可抑制基板之搖晃等並抑制來自基板或治具之瘤塊產生,並且,將相對較多之基板浸漬於鍍浴中。According to the above-described substrate holding fixture 100A for plating processing and the plating processing device 200 in this embodiment, when the movable piece 20A is at the first position P1, the substrate holding fixture 100A for plating processing can be inserted into the inner holes 1a of the plurality of disc-shaped substrates 1. On the other hand, when the movable piece 20A is at the second position P2 via the moving mechanism 30, the contact between the substrates can be suppressed and the substrates can be held at the least possible contact positions. Thereby, even when the substrate wall thickness continues to be reduced to an extremely thin substrate (for example, a thickness of 0.635 mm, 0.6 mm, 0.5 mm, or 0.38 mm, etc.), shaking of the substrate and generation of tumors from the substrate or the jig can be suppressed, and a relatively large number of substrates can be immersed in the plating bath.
《第2實施形態》 <鍍覆處理用基板保持治具100B> 以下,使用圖9對第2實施形態之鍍覆處理用基板保持治具100B進行說明。再者,於以下之說明中,關於功能及效果與第1實施形態共通之構成,標註相同之參照序號而適當省略其說明(關於下述第3實施形態~第6實施形態及變形例亦相同)。《Second Implementation》 <Substrate holding jig 100B for plating treatment> The following describes the substrate holding jig 100B for plating treatment of the second implementation using FIG. 9. In the following description, the same reference numbers are used to indicate the same components as those of the first implementation and their descriptions are omitted as appropriate (the same applies to the third to sixth implementations and variations described below).
於上述第1實施形態中,包含限制部31及彈性構件32而構成移動機構30。相對於此,於本實施形態中,如圖9所示,其特徵在於以下方面:藉由於本體桿部10B及可動片20B相對接觸並同時滑動移動之一對之傾斜面13a、23a,可動片20B相對於本體桿部10B接近或遠離。In the first embodiment, the limiting portion 31 and the elastic member 32 are included to form the moving mechanism 30. In contrast, in the present embodiment, as shown in FIG. 9 , the movable piece 20B is characterized in that the movable piece 20B moves closer to or farther from the main body rod 10B by a pair of inclined surfaces 13a and 23a that are in contact with each other and slide at the same time.
即如圖9(a)所示,於可動片20B定位於第1位置P1時,鍍覆處理用基板保持治具100B之外徑成為D3(外形長度)。於該狀態下,與第1實施形態同樣地,使基板群之內孔可供鍍覆處理用基板保持治具100B插入。 又,藉由分別於本體桿部10B之傾斜面13a之端部形成有基準端13b,於可動片20B之傾斜面23a之端部形成有基準端23b,且彼此之基準端接觸,而規定上述外徑D3(外形長度)之大小。That is, as shown in FIG. 9 (a), when the movable piece 20B is positioned at the first position P1, the outer diameter of the substrate holding fixture 100B for plating processing becomes D3 (external length). In this state, the inner hole of the substrate group is made available for the substrate holding fixture 100B for plating processing to be inserted, as in the first embodiment. In addition, the size of the outer diameter D3 (external length) is determined by forming a reference end 13b at the end of the inclined surface 13a of the main rod 10B, and forming a reference end 23b at the end of the inclined surface 23a of the movable piece 20B, and the reference ends are in contact with each other.
另一方面,如圖9(b)所示,於鍍覆處理用基板保持治具100B之外徑(外形長度)成為D2時,換言之,於可動片20B定位於第2位置P2時,立設於本體桿部10B中之端(本例中為兩端)之傾斜面13a之卡止鉤31b(限制部31之一形態)插入於可動片20B之插入槽31z。藉此,即使於可動片20B成為第2位置P2時,亦抑制可動片20B相對於本體桿部10B向徑方向RD大幅度脫離。On the other hand, as shown in FIG. 9( b ), when the outer diameter (outer length) of the substrate holding jig 100B for plating processing becomes D2, in other words, when the movable piece 20B is positioned at the second position P2, the locking hook 31b (a form of the limiting portion 31) of the inclined surface 13a erected at the end (in this example, both ends) of the main body rod 10B is inserted into the insertion groove 31z of the movable piece 20B. Thus, even when the movable piece 20B becomes the second position P2, the movable piece 20B is prevented from being largely disengaged in the radial direction RD relative to the main body rod 10B.
再者,於相對於本體桿部10B安裝可動片20B時,為了能夠確保圖9(a)之狀態,於可動片20B之傾斜面23a之一部分設置切口23d。 又,構成該鍍覆處理用基板保持治具100B之本體桿部10B或可動片20B例如可藉由切削加工、或3D打印機等可進行三維造形之公知手法而形成。Furthermore, when the movable piece 20B is mounted relative to the main rod 10B, in order to ensure the state of FIG. 9 (a), a cutout 23d is provided on a portion of the inclined surface 23a of the movable piece 20B. In addition, the main rod 10B or the movable piece 20B constituting the substrate holding fixture 100B for coating processing can be formed by a known method that can perform three-dimensional shaping, such as cutting processing or a 3D printer.
根據以上說明之第2實施形態之鍍覆處理用基板保持治具100B,可不經由彈性構件32而實現可動片20B相對於本體桿部10B之移動。藉此,能夠發揮與第1實施形態相同之效果,進而,根據本實施形態,可省略由於彈性構件之經時劣化而進行之更換等作業。According to the substrate holding jig 100B for plating processing of the second embodiment described above, the movable piece 20B can be moved relative to the main rod 10B without the elastic member 32. Thereby, the same effect as the first embodiment can be exerted, and further, according to this embodiment, the replacement of the elastic member due to the deterioration over time can be omitted.
<鍍覆處理裝置200> 繼而,對本實施形態中之鍍覆處理裝置200及使用該裝置之基板保持方法以及鍍覆處理方法進行詳述。再者,關於與第1實施形態重複之方面省略說明,僅對與第1實施形態不同之部分進行說明。<Coating treatment apparatus 200> Next, the coating treatment apparatus 200 in this embodiment and the substrate holding method and coating treatment method using the apparatus are described in detail. In addition, the description of the aspects overlapped with the first embodiment is omitted, and only the parts different from the first embodiment are described.
於本實施形態中,首先,導桿150a自身插入圓盤狀基板1之內孔1a後進行自該內孔1a拔出之動作之方面與實施形態1相同,但將可動片20自第1位置P1轉換至第2位置P2之態樣不同。 即,於本實施形態中之鍍覆處理裝置200中,作為鍍覆處理用基板保持治具維持為通過圓盤狀基板1之內孔1a程度之外形長度之功能,例如可設為以下構成:於鍍覆處理用基板保持治具100B插入內孔1a後,藉由將可動片20B壓入行進方向,可動片20B轉換至第2位置P2之狀態(亦參照圖9,圖10亦相同)。In this embodiment, first, the guide rod 150a itself is inserted into the inner hole 1a of the disk-shaped substrate 1 and then pulled out from the inner hole 1a, which is the same as the embodiment 1, but the manner in which the movable piece 20 is transferred from the first position P1 to the second position P2 is different. That is, in the plating processing device 200 in this embodiment, as a function of maintaining the outer length of the substrate holding fixture for plating processing to the extent of passing through the inner hole 1a of the disk-shaped substrate 1, for example, the following structure can be set: after the substrate holding fixture 100B for plating processing is inserted into the inner hole 1a, the movable piece 20B is pressed into the travel direction, and the movable piece 20B is transferred to the state of the second position P2 (also refer to Figure 9, Figure 10 is the same).
或於圖11所示之可動片20D之形態中,於鍍覆處理用基板保持治具100D插入圓盤狀基板1之內孔1a後,能夠以將可動片20D轉換至第2位置P2之方式使用機械手等進行轉換而代替此。 如此,於本實施形態中,藉由將可動片20轉換至第2位置P2後載置於旋轉料架C,可將鍍覆處理用基板保持治具100安裝於鍍覆處理裝置200。Alternatively, in the form of the movable piece 20D shown in FIG. 11 , after the substrate holding jig 100D for plating processing is inserted into the inner hole 1a of the disc-shaped substrate 1, the movable piece 20D can be transferred to the second position P2 using a robot or the like instead of this. Thus, in this embodiment, by transferring the movable piece 20 to the second position P2 and placing it on the rotary rack C, the substrate holding jig 100 for plating processing can be installed in the plating processing device 200.
《第3實施形態》 <鍍覆處理用基板保持治具100C> 以下,使用圖10對第3實施形態之鍍覆處理用基板保持治具100C進行說明。於上述第2實施形態中,卡止鉤31b相對於本體桿部10B一體形成。相對於此,於本實施形態中,其特徵在於以下方面:於本體桿部10C中之傾斜面13a設有一對可裝卸之卡止鉤31c(限制部31之一形態)。《Third embodiment》 <Substrate holding jig 100C for plating treatment> The third embodiment of the substrate holding jig 100C for plating treatment is described below using FIG. 10. In the second embodiment described above, the locking hook 31b is formed integrally with the main body rod 10B. In contrast, in this embodiment, the following features are provided: a pair of removable locking hooks 31c (a form of the limiting portion 31) are provided on the inclined surface 13a in the main body rod 10C.
如此,設於本體桿部之傾斜面之卡止鉤並不限於一體形成於本體桿部之形態,可如本形態般,本體桿部與卡止鉤分開構成。又,於本實施形態中,卡止鉤可由一對(2個)構成,亦可由3個以上任意數量或單一之卡止鉤構成(第2實施形態亦相同)。Thus, the locking hook provided on the inclined surface of the main body rod is not limited to the form of being integrally formed on the main body rod, and the main body rod and the locking hook may be separately formed as in this form. In addition, in this embodiment, the locking hook may be composed of a pair (2), or may be composed of any number of more than 3 or a single locking hook (the same applies to the second embodiment).
《第4實施形態》 <鍍覆處理用基板保持治具100D> 以下,使用圖11對第4實施形態之鍍覆處理用基板保持治具100D進行說明。於上述第2實施形態及第3實施形態中,本體桿部及可動片分別構成鍍覆處理用基板保持治具中一者之端部及另一者之端部。《Fourth Implementation》 <Substrate holding jig 100D for plating processing> The following describes the substrate holding jig 100D for plating processing of the fourth implementation using FIG. 11. In the above-mentioned second and third implementations, the main body rod and the movable piece constitute the end of one and the end of the other substrate holding jig for plating processing, respectively.
相對於此,於本實施形態中,其特徵在於以下方面:本體桿部10D構成鍍覆處理用基板保持治具中一者之端部及另一者之端部兩者,可動片20D埋沒於本體桿部10D之凹部13e。 根據該態樣,與上述各實施形態之鍍覆處理用基板保持治具100A~C相比,可於鍍覆處理用基板保持治具100之軸方向AD之全長不變之情況下穩定支持等。 又,為了維持圖11(b)之狀態,即第2位置P2,而於凹部13e之空間裝入未圖示之間隔件等。In contrast, in this embodiment, the following features are present: the main body rod 10D constitutes both the end of one and the end of the other substrate holding fixture for plating processing, and the movable piece 20D is buried in the recess 13e of the main body rod 10D. According to this aspect, compared with the substrate holding fixture for plating processing 100A to C of the above-mentioned embodiments, the substrate holding fixture for plating processing 100 can be stably supported while the entire length in the axial direction AD of the substrate holding fixture for plating processing remains unchanged. In addition, in order to maintain the state of FIG. 11 (b), that is, the second position P2, a spacer not shown is installed in the space of the recess 13e.
《第5實施形態》 <鍍覆處理用基板保持治具100E> 以下,使用圖12對第5實施形態之鍍覆處理用基板保持治具100E進行說明。於上述各實施形態中,保持區域SR中之構件由樹脂(作為一例,為PEEK樹脂)構成。相對於此,於本實施形態中,其特徵主要在於以下方面:本體桿部10及可動片20之至少一者中之保持區域SR由不同之複數個材料構成。再者,進而於本實施形態中,其特徵亦在於以下方面:以代替上述保持區域SR之構成之方式、或除上述保持區域SR之構成外,以一對端部區域ER(兩端)中之構成排列相互不同之方式構成。《Fifth Implementation》 <Substrate holding fixture 100E for plating treatment> Below, FIG. 12 is used to explain the substrate holding fixture 100E for plating treatment of the fifth implementation. In each of the above-mentioned implementations, the components in the holding area SR are composed of resin (for example, PEEK resin). In contrast, in this implementation, its main feature is that the holding area SR in at least one of the main body rod 10 and the movable piece 20 is composed of a plurality of different materials. Furthermore, in this implementation, its feature is also that the configuration of the holding area SR is replaced by or in addition to the configuration of the holding area SR, and the configuration arrangement in a pair of end areas ER (two ends) is different from each other.
即,如自圖12理解般,鍍覆處理用基板保持治具100E具備本體桿部10E及可動片20E。又,鍍覆處理用基板保持治具100E係包含:每隔特定間隙保持圓盤狀基板1之保持區域SR、以夾住該保持區域SR之方式之第一端部區域ER1、及第二端部區域ER2而構成。That is, as can be understood from Fig. 12, the substrate holding jig 100E for plating processing includes a main rod 10E and a movable piece 20E. The substrate holding jig 100E for plating processing includes: a holding region SR for holding the disc-shaped substrate 1 at a specific gap, a first end region ER1 for clamping the holding region SR, and a second end region ER2.
並且,關於該保持區域SR,本體桿部10E及可動片20E之各者由沿軸方向AD延伸之芯材IM、及覆蓋該芯材IM之外表面而可與圓盤狀基板1接觸之外裝樹脂材OR構成。再者,於本實施形態中,本體桿部10E及可動片20E之各者由複合材料(上述芯材IM及外裝樹脂材OR)構成,但若調整芯材IM之強度,則亦可如上所述,本體桿部10及可動片20之至少一者由複合材料構成。Furthermore, regarding the holding region SR, each of the main body rod 10E and the movable piece 20E is composed of a core material IM extending along the axial direction AD and a coating resin material OR covering the outer surface of the core material IM and being in contact with the disc-shaped substrate 1. Furthermore, in the present embodiment, each of the main body rod 10E and the movable piece 20E is composed of a composite material (the core material IM and the coating resin material OR), but if the strength of the core material IM is adjusted, at least one of the main body rod 10 and the movable piece 20 may be composed of a composite material as described above.
芯材IM例如由SUS(不鏽鋼鋼材)或實施了表面處理之鋁材等公知之金屬材料或陶瓷而形成。本實施形態之芯材IM具有較上述外裝樹脂材OR高之強度。又,芯材IM以本體桿部10E之芯材IM與可動片20E之芯材IM相互對向之方式相對於各者之外裝樹脂材OR而配置於內側。再者,芯材IM設定為軸方向AD之長度與外裝樹脂材OR大致相等,但並不限定於此,例如,可成為軸方向AD之長度短於外裝樹脂材OR等相互不同之長度。The core material IM is formed of, for example, a known metal material such as SUS (stainless steel) or a surface-treated aluminum material or ceramic. The core material IM of this embodiment has a higher strength than the above-mentioned exterior resin material OR. In addition, the core material IM is arranged on the inner side relative to the exterior resin material OR of each in such a manner that the core material IM of the main rod 10E and the core material IM of the movable piece 20E face each other. Furthermore, the core material IM is set to have a length in the axial direction AD that is approximately equal to the exterior resin material OR, but is not limited to this. For example, the length in the axial direction AD can be shorter than the exterior resin material OR, etc., and can be different from each other.
又,本實施形態之芯材IM以其寬度(與軸方向正交之徑方向之長度)一樣之方式沿軸方向AD延伸。然而,本實施形態之芯材IM並不限定於上述例,例如,亦能夠以隨著朝向保持區域SR中央,上述寬度變大等寬度沿軸方向AD發生變化之方式延伸。Furthermore, the core material IM of the present embodiment extends along the axial direction AD in a manner that its width (length in the radial direction orthogonal to the axial direction) is the same. However, the core material IM of the present embodiment is not limited to the above example, and for example, the core material IM can also extend in a manner that the width changes along the axial direction AD such that the width increases toward the center of the holding region SR.
外裝樹脂材OR以可覆蓋上述芯材IM之外表面而與圓盤狀基板1接觸之方式構成。此種外裝樹脂材OR之材質例如可應用PEEK等公知之樹脂材。又,如圖12所示,外裝樹脂材OR及芯材IM可於各自之組中分離。The outer resin material OR is formed so as to cover the outer surface of the core material IM and contact the disc-shaped substrate 1. The material of the outer resin material OR can be, for example, a known resin material such as PEEK. In addition, as shown in FIG. 12 , the outer resin material OR and the core material IM can be separated in their respective groups.
更具體而言,於一外裝樹脂材OR及芯材IM之組中,於外裝樹脂材OR及芯材IM形成有連結孔33a,並且於該連結孔33a內部設有螺絲等公知之連結構件33c。又,於另一外裝樹脂材OR及芯材IM之組中,與上述同樣地,外裝樹脂材OR及芯材IM之組經由連結孔33b及連結構件33d連結。 藉此,於保持區域SR中,上述一對外裝樹脂材OR及芯材IM之組於各者連結,並且一外裝樹脂材OR及芯材IM之組與另一外裝樹脂材OR及芯材IM之組可分離。More specifically, in a set of an exterior resin material OR and a core material IM, a connecting hole 33a is formed in the exterior resin material OR and the core material IM, and a known connecting member 33c such as a screw is provided inside the connecting hole 33a. In addition, in another set of an exterior resin material OR and a core material IM, the set of the exterior resin material OR and the core material IM is connected via a connecting hole 33b and a connecting member 33d as described above. Thereby, in the holding area SR, the above pair of sets of the exterior resin material OR and the core material IM are connected at each other, and the set of the exterior resin material OR and the core material IM can be separated from the set of the other exterior resin material OR and the core material IM.
如圖12所示,本實施形態之鍍覆處理用基板保持治具100E係以夾住上述保持區域SR之方式包含一對之端部區域(第一端部區域ER1、第二端部區域ER2)而構成。又,如上述各實施形態所示,於本實施形態中,移動機構30亦具備配置於可動片20E與本體桿部10E之間之彈性構件32、及規定該可動片20E朝向交叉方向之移動範圍之限制部31。As shown in Fig. 12, the substrate holding jig 100E for plating processing of this embodiment is composed of a pair of end regions (first end region ER1 and second end region ER2) in a manner of clamping the above-mentioned holding region SR. In addition, as shown in the above-mentioned embodiments, in this embodiment, the moving mechanism 30 also has an elastic member 32 disposed between the movable piece 20E and the main rod 10E, and a limiting portion 31 that defines the moving range of the movable piece 20E in the intersecting direction.
又,於本實施形態之鍍覆處理用基板保持治具100E中,於第一端部區域ER1之端面,形成可供導桿150a插入之端部孔10h。又,於可動片20E亦形成有與該端部孔10h連續收容有導桿150a之前端部之收容孔24。In the substrate holding jig 100E for plating processing of this embodiment, an end hole 10h for inserting the guide rod 150a is formed on the end surface of the first end region ER1. In addition, a receiving hole 24 for receiving the front end of the guide rod 150a is formed in the movable piece 20E in succession to the end hole 10h.
如圖12所示,例如於導桿150a插入端部孔10h及收容孔24時,藉由導桿150a之前端錐形部朝向徑方向RD推動收容孔24,上述一對本體桿部10E與可動片20E相互移動而接近。另一方面,例如若將導桿150a自端部孔10h及收容孔24拔出,則因彈性構件32之作用,上述一對本體桿部10E與可動片20E具有特定間隙而成為相互隔開之狀態。 再者,為了進一步促進對本實施形態之理解,為了便於說明,於該圖12中下側(可動片20E自本體桿部10E遠離之狀態)之圖中,未圖示外裝樹脂材OR、連結構件33c及33d。As shown in FIG. 12 , for example, when the guide rod 150a is inserted into the end hole 10h and the receiving hole 24, the front end conical portion of the guide rod 150a pushes the receiving hole 24 toward the radial direction RD, and the pair of main body rods 10E and the movable piece 20E move toward each other and approach each other. On the other hand, for example, if the guide rod 150a is pulled out of the end hole 10h and the receiving hole 24, the pair of main body rods 10E and the movable piece 20E have a specific gap due to the action of the elastic member 32 and are separated from each other. Furthermore, in order to further promote the understanding of this embodiment and for the convenience of explanation, the exterior resin material OR and the connecting members 33c and 33d are not shown in the lower side of FIG. 12 (the state where the movable piece 20E is away from the main rod 10E).
此時於本實施形態中,以一端部區域(第一端部區域ER1)中之彈性構件32及限制部31的排列與另一端部區域(第二端部區域ER2)中之彈性構件32及限制部31的排列不同之方式構成。 更具體而言,於本實施形態中,於第一端部區域ER1中,限制部31較彈性構件32而言配置得相對於保持區域SR更遠,而於第二端部區域ER2中,彈性構件32較限制部31而言配置得相對於保持區域SR更遠。At this time, in this embodiment, the arrangement of the elastic member 32 and the limiting portion 31 in one end region (first end region ER1) is different from the arrangement of the elastic member 32 and the limiting portion 31 in the other end region (second end region ER2). More specifically, in this embodiment, in the first end region ER1, the limiting portion 31 is arranged farther from the holding region SR than the elastic member 32, and in the second end region ER2, the elastic member 32 is arranged farther from the holding region SR than the limiting portion 31.
如此,藉由以於一端部區域及另一端部區域中,限制部31與彈性構件32之排列互不相同之方式構成,而保持區域SR中之上述間隙可沿軸方向AD設為大致固定寬度。 再者,於本實施形態中,於形成有收容孔24之側之端部,限制部31配置於較彈性構件32靠外側,但並不限定於該形態,於形成收容孔24之側之端部,亦可彈性構件32配置於較限制部31靠外側。In this way, by configuring the arrangement of the limiting portion 31 and the elastic member 32 in one end region and the other end region in different ways, the above-mentioned gap in the holding region SR can be set to a substantially constant width along the axial direction AD. Furthermore, in the present embodiment, the limiting portion 31 is arranged on the outer side of the elastic member 32 at the end portion on the side where the receiving hole 24 is formed, but it is not limited to this form. At the end portion on the side where the receiving hole 24 is formed, the elastic member 32 can also be arranged on the outer side of the limiting portion 31.
再者,如上所述,只要上述間隙沿軸方向AD穩定(例如不極端變窄等),則可於上述第一端部區域ER1及第二端部區域ER2以成為相同排列之方式設置限制部31及彈性構件32。 根據以上說明之本實施形態,與上述各實施形態同樣地,可藉由以更簡單之構造減少來自基板或治具之發塵而抑制瘤塊產生,並且保持相對較多之圓盤狀基板而浸漬於鍍浴中。進而,於本實施形態中,於保持區域SR中使用不同材料之情形時可提高其強度,可使上述間隙沿軸方向AD穩定。Furthermore, as described above, as long as the gap is stable along the axial direction AD (for example, it is not extremely narrowed, etc.), the limiting portion 31 and the elastic member 32 can be arranged in the first end region ER1 and the second end region ER2 in the same manner. According to the above-described embodiment, as in the above-mentioned embodiments, the generation of tumors can be suppressed by reducing dust from the substrate or the jig with a simpler structure, and a relatively large number of disc-shaped substrates can be kept immersed in the plating bath. Furthermore, in the present embodiment, when different materials are used in the holding region SR, its strength can be increased, and the gap can be stabilized along the axial direction AD.
《第6實施形態》 <鍍覆處理用基板保持治具100F> 以下,使用圖13及14對第6實施形態之鍍覆處理用基板保持治具100F進行說明。於上述各實施形態中,利用限制部31及彈性構件32控制可動片20相對於本體桿部10之接近/遠離狀態。相對於此,於本實施形態之鍍覆處理用基板保持治具100F中,其特徵主要在於以下方面:未裝備限制部31及彈性構件32,與該鍍覆處理用基板保持治具100F所安裝之構件(例如旋轉料架C)合作,而控制可動片20相對於本體桿部10朝向徑方向RD之接近/遠離狀態。《Sixth Implementation》 <Substrate holding fixture 100F for plating processing> The following uses Figures 13 and 14 to explain the sixth implementation of the substrate holding fixture 100F for plating processing. In each of the above-mentioned implementations, the limiting portion 31 and the elastic member 32 are used to control the approach/distancing state of the movable piece 20 relative to the main rod 10. In contrast, in the substrate holding fixture 100F for plating processing of this implementation, its characteristics are mainly the following aspects: the limiting portion 31 and the elastic member 32 are not equipped, and the movable piece 20 is controlled to approach/distancing state relative to the main rod 10 toward the radial direction RD in cooperation with the member (such as the rotating material rack C) installed on the substrate holding fixture 100F for plating processing.
即,如自圖13理解般,鍍覆處理用基板保持治具100F係包含具備形成於可動片20F及本體桿部10F之一者之導孔GH、及形成於該可動片20F及本體桿部10F之另一者並插入於導孔GH之導銷GP之移動機構30而構成。如此,本實施形態中之移動機構30不具備上述限制部31及彈性構件32,成為零件件數較少且簡單之構成。 另一方面,由該圖亦可知,於本實施形態之鍍覆處理用基板保持治具100F中,於本體桿部10F及可動片20F之各者設有端部區域ER。換言之,由於該等本體桿部10F及可動片20F於其構造上無法以自力開閉(相互隔開),因此,需要於本體桿部10F側及可動片20F側分別設置端部區域ER而作為其替代。That is, as can be understood from FIG. 13 , the substrate holding jig 100F for plating processing includes a moving mechanism 30 having a guide hole GH formed in one of the movable piece 20F and the main body rod 10F, and a guide pin GP formed in the other of the movable piece 20F and the main body rod 10F and inserted into the guide hole GH. Thus, the moving mechanism 30 in this embodiment does not have the above-mentioned limiting portion 31 and the elastic member 32, and has a simple structure with a small number of parts. On the other hand, it can also be seen from the figure that in the substrate holding jig 100F for plating processing of this embodiment, an end region ER is provided in each of the main body rod 10F and the movable piece 20F. In other words, since the main rod 10F and the movable piece 20F cannot be opened and closed by themselves (separated from each other) in their structure, it is necessary to set the end area ER on the side of the main rod 10F and the side of the movable piece 20F respectively as a substitute.
再者,由該圖亦可知,本實施形態中之可動片20F及本體桿部10F除導孔GH及導銷GP以外為對稱構造。因此,於本實施形態中,將具有導銷GP之側規定為本體桿部10F,並且,將具有導孔GH之側設為可動片20F,但並不限定於該規定,亦可將具有導銷GP之側設為可動片20F。Furthermore, as can be seen from the figure, the movable piece 20F and the main body rod 10F in this embodiment are symmetrical structures except for the guide hole GH and the guide pin GP. Therefore, in this embodiment, the side with the guide pin GP is defined as the main body rod 10F, and the side with the guide hole GH is set as the movable piece 20F, but it is not limited to this definition, and the side with the guide pin GP may also be set as the movable piece 20F.
如此,於鍍覆處理用基板保持治具100F中,由於不具備限制部31及彈性構件32,因此,無法以自身作用控制上述間隙之狀態。因此,於本實施形態中,設為以下構成:藉由於第二端部區域ER2之端面形成端部孔10i,並且導桿150b插入至該端部孔10i,而維持本體桿部10F與可動片20F相接近之狀態。即,於本實施形態中,導桿150b之前端成為可維持本體桿部10F與可動片20F之接近狀態(第1位置)之形狀,具有如統一約束分別形成於本體桿部10F及可動片20F之端部之凸起之凹陷。導桿150b之前端形狀只要為可將本體桿部10F及可動片20F之端部約束為可維持接近狀態之程度之形狀即可,可為如圖7(b)之筒狀、或如圖13之凹陷狀、或如尖端銳利之圓柱狀且具有凹陷之插座之形狀等。進而,若為可維持本體桿部及可動片之接近狀態之形狀,則可為各種形狀,亦可為叉狀而代替上述形狀。Thus, in the substrate holding jig 100F for plating treatment, since the limiting portion 31 and the elastic member 32 are not provided, the state of the above-mentioned gap cannot be controlled by its own action. Therefore, in this embodiment, the following configuration is adopted: by forming an end hole 10i at the end surface of the second end region ER2 and inserting the guide rod 150b into the end hole 10i, the state in which the main body rod 10F and the movable piece 20F are close to each other is maintained. That is, in this embodiment, the front end of the guide rod 150b is formed into a shape that can maintain the close state (first position) of the main body rod 10F and the movable piece 20F, and has a concave shape that uniformly constrains the protrusions formed at the ends of the main body rod 10F and the movable piece 20F, respectively. The front end of the guide rod 150b may be in any shape as long as it can constrain the ends of the main rod 10F and the movable piece 20F to maintain a close state, and may be in a cylindrical shape as shown in FIG7(b), a concave shape as shown in FIG13, or a shape of a sharp-tipped cylindrical shape with a concave socket, etc. Furthermore, as long as the shape can maintain the close state of the main rod and the movable piece, it may be in various shapes, and may be in a fork shape instead of the above shapes.
另一方面,例如使可動片20F相對於本體桿部10F遠離時,與其他構件合作。作為此種其他構件,可例示上述鍍覆處理裝置中之旋轉料架C。 即,如圖14所示,本實施形態中之旋轉料架C具備約束本實施形態之鍍覆處理用基板保持治具100F中之端部區域ER之治具安裝用軸承構件12。On the other hand, for example, when the movable piece 20F is moved away from the main rod 10F, it cooperates with other components. As such other components, the rotating rack C in the above-mentioned coating processing device can be exemplified. That is, as shown in FIG. 14, the rotating rack C in this embodiment has a jig mounting bearing component 12 that constrains the end area ER of the substrate holding jig 100F for coating processing of this embodiment.
如該圖所示,此種治具安裝用軸承構件12係包含軸承12a及壓抵構件12b而構成。再者,該治具安裝用軸承構件12之構造與國際公開WO2018/083914號所揭示之設於旋轉料架13之治具安裝用軸承構件12相同。因此,關於治具安裝用軸承構件12安裝於旋轉料架C之態樣、或該治具安裝用軸承構件12之詳細構造,可參照上述WO2018/083914號之內容。As shown in the figure, the jig mounting bearing member 12 is composed of a bearing 12a and a pressing member 12b. Furthermore, the structure of the jig mounting bearing member 12 is the same as the jig mounting bearing member 12 provided on the rotating material rack 13 disclosed in the international publication No. WO2018/083914. Therefore, the manner in which the jig mounting bearing member 12 is installed on the rotating material rack C or the detailed structure of the jig mounting bearing member 12 can refer to the content of the above-mentioned WO2018/083914.
並且,如圖14所示,於將鍍覆處理用基板保持治具100F安裝於用以將圓盤狀基板1浸漬於鍍浴槽之鍍覆處理裝置(旋轉料架C)時,藉由於可動片20F與本體桿部10F之間插入該鍍覆處理裝置之形成於治具安裝用軸承構件12之垂直突起VP,可動片20F與本體桿部10F相互隔開。 再者,較佳為於鍍覆處理用基板保持治具100F之本體桿部10F及可動片20F之至少一者,具有用於引導治具安裝用軸承構件12之垂直突起VP的前端插入本體桿部10F與可動片20F之間之引導傾斜面,更佳為於本體桿部10F及可動片20F兩者形成有上述引導傾斜面。Furthermore, as shown in FIG. 14 , when the substrate holding jig 100F for plating treatment is mounted on a plating treatment device (rotating rack C) for immersing a disc-shaped substrate 1 in a plating bath, the movable piece 20F and the main body rod 10F are separated from each other by inserting a vertical protrusion VP formed on the jig mounting bearing member 12 of the plating treatment device between the movable piece 20F and the main body rod 10F. Furthermore, it is preferred that at least one of the main rod 10F and the movable piece 20F of the substrate holding jig 100F for coating processing has a guiding inclined surface for guiding the front end of the vertical protrusion VP of the jig mounting bearing component 12 to be inserted between the main rod 10F and the movable piece 20F, and it is more preferred that the above-mentioned guiding inclined surface is formed on both the main rod 10F and the movable piece 20F.
此時,亦由圖14(c)理解般,本體桿部10F與可動片20F之間之間隙之寬度D1由垂直突起VP之寬度規定。又,隨著垂直突起VP插入本體桿部10F與可動片20F之間,本體桿部10F與可動片20F相互隔開,藉此可於鍍覆處理用基板保持治具100F之第1收容槽G1內保持圓盤狀基板1。 又,安裝於治具安裝用軸承構件12之鍍覆處理用基板保持治具100F藉由以與本體桿部10F及可動片20F之各者相接之壓抵構件12b壓抵於垂直突起VP側,而保持上述間隙之寬度D1。At this time, as can be understood from FIG. 14 (c), the width D1 of the gap between the main body rod 10F and the movable piece 20F is determined by the width of the vertical protrusion VP. Moreover, as the vertical protrusion VP is inserted between the main body rod 10F and the movable piece 20F, the main body rod 10F and the movable piece 20F are separated from each other, thereby being able to hold the disc-shaped substrate 1 in the first receiving groove G1 of the substrate holding jig 100F for plating processing. Moreover, the substrate holding jig 100F for plating processing mounted on the jig mounting bearing member 12 maintains the width D1 of the above-mentioned gap by pressing against the side of the vertical protrusion VP with the pressing member 12b connected to each of the main body rod 10F and the movable piece 20F.
此處,關於本實施形態中之對鍍覆處理裝置之裝卸動作,使用圖8而僅對與實施形態1不同之處進行說明。 於步驟6中,於將導桿自鍍覆處理用基板保持治具100F之端部卸除之情形時,以可利用軸按壓部120維持於第1位置P1(本體桿部10F與可動片20F接近)之狀態之方式把持握把區域GR後,以使導桿遠離鍍覆處理用基板保持治具100F之端部之方式動作。Here, regarding the loading and unloading operation of the coating processing device in this embodiment, only the differences from the embodiment 1 are described using FIG. 8. In step 6, when the guide rod is removed from the end of the substrate holding jig 100F for coating processing, the handle area GR is gripped in a manner that the shaft pressing portion 120 can be maintained at the first position P1 (the main rod portion 10F and the movable piece 20F are close), and then the guide rod is moved away from the end of the substrate holding jig 100F for coating processing.
又,於步驟7中,於將鍍覆處理用基板保持治具100F安裝於旋轉料架C之情形時,需要把持為容許本體桿部10F與可動片20F緩慢隔開之程度。另一方面,使鍍覆處理用基板保持治具100F脫離旋轉料架C後,利用軸按壓部維持第1位置P1之狀態,等待導桿之安裝。 軸按壓部120較佳為能夠適當控制把持鍍覆處理用基板保持治具100F之力,可進行用於將鍍覆處理用基板保持治具100F維持為第1位置P1之狀態之輔助性動作。Furthermore, in step 7, when the substrate holding jig 100F for coating processing is installed on the rotating material rack C, it is necessary to hold it to a degree that allows the main rod 10F and the movable piece 20F to be slowly separated. On the other hand, after the substrate holding jig 100F for coating processing is separated from the rotating material rack C, the shaft pressing part is used to maintain the state of the first position P1, waiting for the installation of the guide rod. The shaft pressing part 120 is preferably capable of appropriately controlling the force of holding the substrate holding jig 100F for coating processing, and can perform an auxiliary action for maintaining the substrate holding jig 100F for coating processing in the state of the first position P1.
再者,上述所說明之實施形態可於不脫離本發明主旨之範圍內進行各種變形。以下,對可應用於本發明之變形例進行說明。 <變形例1> 圖15示出可應用於上述各實施形態之變形例1之鍍覆處理用基板保持治具。於上述各實施形態中,端部區域ER之剖面為與保持區域SR相同之圓形,但並不限定於該形態,端部區域ER之剖面可為多邊形狀。再者,於本變形例1中,鍍覆處理用基板保持治具之端部區域ER之剖面為六邊形狀,但上述剖面亦可為四邊形狀或三角形狀。 如此,於鍍覆處理用基板保持治具中,能夠以使徑方向RD之保持區域SR的剖面形狀與徑方向RD之端部區域ER的剖面形狀互不相同之方式構成。Furthermore, the above-described embodiments can be variously modified within the scope of the present invention. The following describes the modified examples applicable to the present invention. <Modification 1> Figure 15 shows a substrate holding fixture for plating processing that can be applied to the above-described embodiments of Modification 1. In the above-described embodiments, the cross-section of the end region ER is the same circular shape as the holding region SR, but it is not limited to this shape, and the cross-section of the end region ER can be a polygon. Furthermore, in this Modification 1, the cross-section of the end region ER of the substrate holding fixture for plating processing is hexagonal, but the above cross-section can also be a quadrilateral or a triangle. In this way, the substrate holding jig for plating processing can be configured so that the cross-sectional shape of the holding region SR in the radial direction RD and the cross-sectional shape of the end region ER in the radial direction RD are different from each other.
<變形例2> 圖16示出可應用於上述各實施形態或變形例1之變形例2之鍍覆處理用基板保持治具。即,本體桿部與可動片不一定需要為1對1之關係,如本例所示,可具有1對多、或多對多之關係。 更具體而言,如圖16(a)所示,相對於本體桿部10數量不同之可動片20可經由移動機構30可移動地設於徑方向RD。再者,於該圖中,可動片20之數量大於本體桿部10之數量,但亦可為其相反之構成。<Variant 2> Figure 16 shows a substrate holding fixture for plating treatment that can be applied to each of the above-mentioned embodiments or variant 2 of variant 1. That is, the main body rod and the movable piece do not necessarily need to be in a one-to-one relationship, as shown in this example, they can have a one-to-many or many-to-many relationship. More specifically, as shown in Figure 16 (a), the movable pieces 20 that are different in number from the main body rods 10 can be movably arranged in the radial direction RD via the moving mechanism 30. Furthermore, in this figure, the number of movable pieces 20 is greater than the number of main body rods 10, but it can also be the opposite configuration.
又,如圖16(b)所示,可使用限制部31及彈性構件32之功能經一體化之移動機構30(由具有凸緣之橡膠等構成之彈性伸縮片31x)。 又,如圖16(c)所示,可動片20可成為經由限制部31及彈性構件32之功能經一體化之其他形態之移動機構30(環狀橡膠31y)而連環之構成。再者,於該形態中,亦可成為以下構成:未圖示之本體桿部10與可動片20連接,僅複數個可動片20經由移動機構30(環狀橡膠31y)連環。Furthermore, as shown in FIG. 16 (b), a moving mechanism 30 (elastic expansion piece 31x composed of rubber with a flange or the like) in which the functions of the limiting portion 31 and the elastic member 32 are integrated can be used. Furthermore, as shown in FIG. 16 (c), the movable piece 20 can be connected via another form of moving mechanism 30 (ring-shaped rubber 31y) in which the functions of the limiting portion 31 and the elastic member 32 are integrated. Furthermore, in this form, the following structure can also be formed: the main body rod 10 not shown is connected to the movable piece 20, and only a plurality of movable pieces 20 are connected via the moving mechanism 30 (ring-shaped rubber 31y).
<變形例3> 圖17示出變形例3之鍍覆處理用基板保持治具。 於上述各實施形態或變形例中,例示了可動片20進行平行移動之形態,但如本變形例所示,可動片20亦可為平行移動以外之移動形態。 即,如圖17(a)所示,本變形例3中之可動片20定位於上述第1位置P1,以軸支持部20p為基點以可旋回之方式對其基端部進行軸支持。此時,可動片20之基端部以利用彈性構件32(本例中為彈簧)維持第1位置P1之狀態之方式施壓。<Variant 3> Figure 17 shows a substrate holding jig for plating processing of variant 3. In each of the above-mentioned embodiments or variants, the movable piece 20 is exemplified as being in a state of parallel movement, but as shown in this variant, the movable piece 20 may also be in a state of movement other than parallel movement. That is, as shown in Figure 17 (a), the movable piece 20 in this variant 3 is positioned at the above-mentioned first position P1, and its base end is axially supported in a rotatable manner with the axial support portion 20p as the base point. At this time, the base end of the movable piece 20 is pressed in a manner that the elastic member 32 (a spring in this example) is used to maintain the state of the first position P1.
並且,本變形例3中之可動片20之前端部以半徑方向之大小緩慢放大之方式構成。藉此,如圖17(b)所示,若凸輪機構Cm(移動機構30)沿周方向(繞軸)旋轉,則利用該凸輪機構Cm,上述前端部可沿上述交叉方向移動而定位於第2位置P2。 如此,於本變形例中,藉由可動片20之前端部利用作為移動機構30之一例之凸輪機構Cm旋回,可成為上述第2位置P2而保持圓盤狀基板1。再者,若凸輪機構Cm成為圖17(a)之狀態,則可動片20利用上述彈性構件32返回第1位置P1。Furthermore, the front end portion of the movable piece 20 in this modification 3 is configured in a manner that the size in the radial direction is gradually enlarged. Thus, as shown in FIG. 17 (b), if the cam mechanism Cm (moving mechanism 30) rotates in the circumferential direction (around the axis), the front end portion can be moved in the above-mentioned cross direction and positioned at the second position P2 by using the cam mechanism Cm. Thus, in this modification, the front end portion of the movable piece 20 can be rotated by using the cam mechanism Cm as an example of the moving mechanism 30 to achieve the above-mentioned second position P2 and maintain the disc-shaped substrate 1. Furthermore, if the cam mechanism Cm becomes the state of FIG. 17 (a), the movable piece 20 returns to the first position P1 by using the above-mentioned elastic member 32.
再者,變形例3中之作為移動機構30之凸輪機構Cm僅圖示1個,但本發明並不限定於該形態。 即,如圖18(a)所示,可於鍍覆處理用基板保持治具之繞軸(周方向)設有複數個凸輪機構Cm。於該圖所示之形態中,繞軸配置有共2個凸輪機構Cm,對應於該凸輪機構Cm,2個可動片20分別以其前端部可旋回之方式對基端部進行軸支持。Furthermore, only one cam mechanism Cm as the moving mechanism 30 in the modification example 3 is shown in the figure, but the present invention is not limited to this form. That is, as shown in FIG. 18 (a), a plurality of cam mechanisms Cm may be provided around the axis (circumferential direction) of the substrate holding fixture for plating processing. In the form shown in the figure, a total of two cam mechanisms Cm are arranged around the axis, and corresponding to the cam mechanisms Cm, two movable pieces 20 respectively support the base end portion in a manner that the front end portion thereof can be rotated.
進而,作為上述移動機構30之凸輪機構Cm以將鍍覆處理用基板保持治具之中心軸作為基準而旋轉之方式構成,但本發明並不限定於該形態。 即,如圖18(b)所示,可為凸輪機構Cm朝向鍍覆處理用基板保持治具之徑方向直線移動之形態。於該情形時,於該圖所示之例中,可動片20設置複數個,但亦可為僅設置任一者之形態。 又,如圖18(b)所示,為了將可動片20移動至第2位置P2,可利用導桿150使凸輪機構Cm旋轉。例如,於凸輪機構Cm之插入側表面形成加號形狀之槽,可藉由以導桿150之前端匹配該槽之方式設為加號之凸形狀而使凸輪機構Cm旋轉。Furthermore, the cam mechanism Cm as the above-mentioned moving mechanism 30 is configured to rotate with the central axis of the substrate holding fixture for plating processing as a reference, but the present invention is not limited to this form. That is, as shown in FIG. 18 (b), the cam mechanism Cm may be linearly moved toward the radial direction of the substrate holding fixture for plating processing. In this case, in the example shown in the figure, a plurality of movable pieces 20 are provided, but it may also be a form in which only any one is provided. Furthermore, as shown in FIG. 18 (b), in order to move the movable piece 20 to the second position P2, the guide rod 150 may be used to rotate the cam mechanism Cm. For example, a plus-shaped groove is formed on the insertion side surface of the cam mechanism Cm, and the cam mechanism Cm can be rotated by setting the front end of the guide rod 150 to be a plus-shaped convex shape in a manner that matches the groove.
<變形例4> 圖19示出變形例4之鍍覆處理用基板保持治具。 於上述第2實施形態~第4實施形態中之鍍覆處理用基板保持治具中,由於亦具有可動片20沿著軸方向之移動成分,因此,成為於第1位置P1及第2位置P2轉換收容槽位置之構成。<Variant 4> Figure 19 shows a substrate holding jig for plating processing of variant 4. In the substrate holding jig for plating processing in the second to fourth embodiments, since the movable piece 20 also has a moving component along the axial direction, it becomes a structure for switching the position of the receiving groove between the first position P1 and the second position P2.
相對於此,本變形例4中之可動片20於第1位置P1及第2位置P2之移動路徑中,不包含僅向徑方向RD移動且沿著軸方向之移動成分。並且,本變形例中之作為移動機構30之凸輪機構Cm係包含凸輪本體cb、形成於該凸輪本體cb而兼用作上述限制部31之凸輪槽cg、可於該凸輪槽cg內移動之凸輪銷cp、及與該凸輪銷cp連結之凸輪軸cs而構成。 再者,凸輪本體cb以可沿軸方向直線移動之方式,以本體桿部10內之限制槽(未圖示)等限制朝向徑方向之移動。In contrast, the movable piece 20 in the present modification 4 does not include a movement component that moves only in the radial direction RD and along the axial direction in the movement path between the first position P1 and the second position P2. Furthermore, the cam mechanism Cm as the moving mechanism 30 in the present modification includes a cam body cb, a cam groove cg formed in the cam body cb and serving as the above-mentioned limiting portion 31, a cam pin cp movable in the cam groove cg, and a cam shaft cs connected to the cam pin cp. Furthermore, the cam body cb is limited in its movement in the radial direction by a limiting groove (not shown) in the body rod 10 in a manner that allows it to move linearly along the axial direction.
並且,如圖19(a)所示,於將可動片20定位於第1位置P1時,藉由將導桿150d之凸狀前端部150e自本體桿部10之端部插入,成為可動片20收容於本體桿部10內之狀態。 另一方面,如圖19(b)所示,於將可動片20定位於第2位置P2時,使導桿150d之凸狀前端部150e脫離本體桿部10之端部。 藉此,成為以下狀態:凸輪銷cp追隨施壓於彈性構件32之凸輪本體cb之移動而於凸輪槽cg移動,可動片20自本體桿部10朝向徑方向RD脫離。 於以上說明之變形例1~4中,亦可發揮與上述實施形態相同之效果。Furthermore, as shown in FIG. 19 (a), when the movable piece 20 is positioned at the first position P1, the convex front end portion 150e of the guide rod 150d is inserted from the end of the main body rod 10, so that the movable piece 20 is accommodated in the main body rod 10. On the other hand, as shown in FIG. 19 (b), when the movable piece 20 is positioned at the second position P2, the convex front end portion 150e of the guide rod 150d is separated from the end of the main body rod 10. Thus, the following state is achieved: the cam pin cp moves in the cam groove cg following the movement of the cam body cb pressing the elastic member 32, and the movable piece 20 is separated from the main body rod 10 toward the radial direction RD. In the above-described variations 1 to 4, the same effects as those of the above-described embodiment can also be achieved.
再者,於上述實施形態中,可動片20之剖面形狀以成為將真圓切割(分割)一部分而得之圓弧之方式構成,但本體桿部10或可動片20之剖面形狀可不一定成為切割真圓而得之圓弧。即,本發明之本體桿部或可動片之剖面形狀可為橢圓或魚板(kamaboko)形或者船底形等非真圓之圓弧狀等外周或槽底之至少一部分包含直線之曲線形狀。 藉此,例如於可動片20A之剖面形狀為魚板形之情形時,可於1方向之移動保持共2個部位(2方向)之圓盤狀基板1。Furthermore, in the above-mentioned embodiment, the cross-sectional shape of the movable piece 20 is formed in a manner of an arc obtained by cutting (dividing) a part of a true circle, but the cross-sectional shape of the main body rod 10 or the movable piece 20 may not necessarily be an arc obtained by cutting a true circle. That is, the cross-sectional shape of the main body rod or movable piece of the present invention may be an elliptical or kamaboko-shaped or boat-bottom-shaped arc-shaped non-true circle, such as an outer circumference or a groove bottom, and at least a part of the curved shape includes a straight line. Thus, for example, when the cross-sectional shape of the movable piece 20A is a kamaboko-shaped, a total of 2 parts (2 directions) of the disc-shaped substrate 1 can be maintained in 1 direction of movement.
又,於上述實施形態中,將用於HDD之磁碟(磁記錄媒體)作為圓盤狀基板1之用途之例而進行了說明,但亦可應用於磁碟以外之其他用途。於該情形時,可理所當然地根據其用途變更鍍浴槽內之鍍覆液。 又,於第1實施形態中,較佳為於可動片20A之至少一端部形成有錐形部20t,第2實施形態以後亦相同。 [產業上之可利用性]Furthermore, in the above-mentioned embodiment, the disk (magnetic recording medium) used for HDD is described as an example of the use of the disk-shaped substrate 1, but it can also be applied to other uses besides the disk. In this case, the plating liquid in the plating bath can be changed according to its use. In addition, in the first embodiment, it is preferred that a tapered portion 20t is formed at least at one end of the movable piece 20A, and the same is true for the second embodiment and thereafter. [Industrial Applicability]
如以上說明,本發明之鍍覆處理用基板保持治具及鍍覆處理裝置適於各種進行鍍覆處理之基板之製造,可應用於廣泛領域之產業。As described above, the substrate holding jig for plating treatment and the plating treatment apparatus of the present invention are suitable for the manufacture of various substrates to be plated, and can be applied to industries in a wide range of fields.
1:基板 10:本體桿部 20:可動片 30:移動機構 100:鍍覆處理用基板保持治具 110:載置部 120:軸按壓部 130:把持部 140:升降部 150:導桿 200:鍍覆處理裝置1: Substrate 10: Main body rod 20: Movable piece 30: Moving mechanism 100: Substrate holding fixture for plating treatment 110: Loading part 120: Shaft pressing part 130: Holding part 140: Lifting part 150: Guide rod 200: Plating treatment device
[圖1]係第1實施形態中之鍍覆處理用基板保持治具之外觀斜視圖、及自特定方向觀察之箭視圖。 [圖2]係可動片處於第2位置時之鍍覆處理用基板保持治具之側面圖。 [圖3]係可動片處於第1位置時之鍍覆處理用基板保持治具之側面圖。 [圖4]係說明第1實施形態中之可動片之狀態轉換之模式圖。 [圖5]係表示自端部側觀察到之可動片之狀態轉換之模式圖。 [圖6]係保持圓盤狀基板之狀態下之鍍覆處理用基板保持治具之模式圖。 [圖7]係模式性表示第1實施形態中之鍍覆處理裝置之外觀斜視圖。 [圖8]係表示第1實施形態中之鍍覆處理用基板保持治具之保持方法之流程圖。 [圖9]係模式性表示第2實施形態中之鍍覆處理用基板保持治具之外觀圖。 [圖10]係模式性表示第3實施形態中之鍍覆處理用基板保持治具之外觀圖。 [圖11]係模式性表示第4實施形態中之鍍覆處理用基板保持治具之外觀圖。 [圖12]係模式性表示第5實施形態中之鍍覆處理用基板保持治具之外觀圖。 [圖13]係模式性表示第6實施形態中之鍍覆處理用基板保持治具之外觀圖。 [圖14]係表示第6實施形態中之鍍覆處理用基板保持治具安裝於旋轉料架時之狀態轉換之模式圖。 [圖15]係模式性表示變形例1中之鍍覆處理用基板保持治具之外觀圖。 [圖16]係表示變形例2中之鍍覆處理用基板保持治具之模式圖。 [圖17]係表示變形例3中之鍍覆處理用基板保持治具之模式圖。 [圖18]係表示凸輪機構Cm中之另一構成例之模式圖。 [圖19]係模式性表示變形例4中之鍍覆處理用基板保持治具之外觀圖。[FIG. 1] is an oblique external view of the substrate holding jig for plating processing in the first embodiment, and an arrow view observed from a specific direction. [FIG. 2] is a side view of the substrate holding jig for plating processing when the movable piece is in the second position. [FIG. 3] is a side view of the substrate holding jig for plating processing when the movable piece is in the first position. [FIG. 4] is a schematic diagram illustrating the state transition of the movable piece in the first embodiment. [FIG. 5] is a schematic diagram showing the state transition of the movable piece observed from the end side. [FIG. 6] is a schematic diagram of the substrate holding jig for plating processing in the state of holding a disc-shaped substrate. [FIG. 7] is a schematic oblique external view of the plating processing device in the first embodiment. [Figure 8] is a flow chart showing a holding method of a substrate holding jig for plating processing in the first embodiment. [Figure 9] is a schematic diagram showing the external appearance of a substrate holding jig for plating processing in the second embodiment. [Figure 10] is a schematic diagram showing the external appearance of a substrate holding jig for plating processing in the third embodiment. [Figure 11] is a schematic diagram showing the external appearance of a substrate holding jig for plating processing in the fourth embodiment. [Figure 12] is a schematic diagram showing the external appearance of a substrate holding jig for plating processing in the fifth embodiment. [Figure 13] is a schematic diagram showing the external appearance of a substrate holding jig for plating processing in the sixth embodiment. [Figure 14] is a schematic diagram showing the state transition when the substrate holding jig for plating processing in the sixth embodiment is mounted on a rotary rack. [FIG. 15] is a schematic diagram showing the external appearance of the substrate holding jig for plating processing in Modification 1. [FIG. 16] is a schematic diagram showing the substrate holding jig for plating processing in Modification 2. [FIG. 17] is a schematic diagram showing the substrate holding jig for plating processing in Modification 3. [FIG. 18] is a schematic diagram showing another configuration example of the cam mechanism Cm. [FIG. 19] is a schematic diagram showing the external appearance of the substrate holding jig for plating processing in Modification 4.
10h:端部孔 10h: End hole
10A:本體桿部 10A: Main rod
20A:可動片 20A: Movable piece
21:凹部 21: Concave part
100A:鍍覆處理用基板保持治具 100A: Substrate holding fixture for plating process
G1:第1收容槽 G1: Storage slot 1
G2:第2收容槽 G2: Storage tank No. 2
ER:端部區域 ER: terminal region
GR:握把區域 GR: Grip area
SR:保持區域 SR:Retention Zone
AD:軸方向 AD: Axial direction
Claims (11)
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JPH06306621A (en) * | 1993-04-28 | 1994-11-01 | Fuji Electric Co Ltd | Discoid substrate support |
JPH0790596A (en) * | 1993-09-10 | 1995-04-04 | Mitsubishi Chem Corp | Surface treating device and surface treatment |
JPH11335857A (en) * | 1998-05-27 | 1999-12-07 | Nippon Light Metal Co Ltd | Temporary placement disk for plating and plating of aluminum disk |
US20010051837A1 (en) * | 2000-06-07 | 2001-12-13 | Masanori Tateyama | Substrate processing system and substrate processing method |
JP2002038275A (en) * | 2000-07-25 | 2002-02-06 | Mitsubishi Materials Corp | Disk support |
JP2005089773A (en) * | 2003-09-12 | 2005-04-07 | Fujitsu Ltd | Electroless plating apparatus, and plating film manufacturing method using the apparatus |
WO2011074551A1 (en) * | 2009-12-18 | 2011-06-23 | 平田機工株式会社 | Vacuum deposition method and vacuum deposition apparatus |
Family Cites Families (1)
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JP3192642B2 (en) * | 1998-10-02 | 2001-07-30 | 住友特殊金属株式会社 | Surface treatment support member, surface treatment holder, and surface treatment method |
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2020
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- 2020-06-10 WO PCT/JP2020/022861 patent/WO2020250935A1/en active Application Filing
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Patent Citations (7)
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JPH06306621A (en) * | 1993-04-28 | 1994-11-01 | Fuji Electric Co Ltd | Discoid substrate support |
JPH0790596A (en) * | 1993-09-10 | 1995-04-04 | Mitsubishi Chem Corp | Surface treating device and surface treatment |
JPH11335857A (en) * | 1998-05-27 | 1999-12-07 | Nippon Light Metal Co Ltd | Temporary placement disk for plating and plating of aluminum disk |
US20010051837A1 (en) * | 2000-06-07 | 2001-12-13 | Masanori Tateyama | Substrate processing system and substrate processing method |
JP2002038275A (en) * | 2000-07-25 | 2002-02-06 | Mitsubishi Materials Corp | Disk support |
JP2005089773A (en) * | 2003-09-12 | 2005-04-07 | Fujitsu Ltd | Electroless plating apparatus, and plating film manufacturing method using the apparatus |
WO2011074551A1 (en) * | 2009-12-18 | 2011-06-23 | 平田機工株式会社 | Vacuum deposition method and vacuum deposition apparatus |
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WO2020250935A1 (en) | 2020-12-17 |
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