TWI802348B - Equipment for optical appearance inspection and method for appearance inspection - Google Patents
Equipment for optical appearance inspection and method for appearance inspection Download PDFInfo
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- TWI802348B TWI802348B TW111111995A TW111111995A TWI802348B TW I802348 B TWI802348 B TW I802348B TW 111111995 A TW111111995 A TW 111111995A TW 111111995 A TW111111995 A TW 111111995A TW I802348 B TWI802348 B TW I802348B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
Abstract
Description
本發明涉及電路板光學檢測領域,尤其涉及一種光學外觀檢測設備及外觀檢測方法。 The invention relates to the field of optical inspection of circuit boards, in particular to an optical appearance inspection device and an appearance inspection method.
隨著光電子、通信電子、電腦、機械、材料等行業的飛速發展,IC載板也得到了迅速的發展,在現代電子及通信產品中,IC載板及PCB電路板幾乎隨處可見,小到一個晶片,大到超大集成PCB,IC載板及PCB板是現在以及未來電子行業中的支柱產業。由於IC載板行業的迅速發展,IC線路板的產品工藝也得到了巨大的提高,產品多為高集成、超精細線路,因此客戶對產品的品質也提出了更高的要求,縱觀IC載板的整個生產工藝制程,無論是內層佈局還是壓合外層線路以及表面處理成型,運用自動光學檢測都是必不可少的重要步驟。 With the rapid development of optoelectronics, communication electronics, computers, machinery, materials and other industries, IC substrates have also developed rapidly. In modern electronics and communication products, IC substrates and PCB circuit boards can be seen almost everywhere, as small as one Chips, large to ultra-large integrated PCBs, IC substrates and PCB boards are the pillar industries in the current and future electronics industry. Due to the rapid development of the IC substrate industry, the product technology of IC circuit boards has also been greatly improved. Most of the products are highly integrated and ultra-fine lines, so customers have also put forward higher requirements for product quality. The entire production process of the board, whether it is the inner layer layout, the lamination of the outer layer circuit and the surface treatment molding, the use of automatic optical inspection is an essential and important step.
但是,目前市場上的自動光學外觀檢測設備普遍存在檢測精度低以及效率低等問題,已經無法滿足高端IC載板廠商要求的檢測需求,IC載板廠商急需一款高精高效、實用穩定的自動光 學外觀檢測設備,因此研發一款高性能高效率的自動光學外觀檢測設備已經構成迫在眉睫的需求。 However, the automatic optical appearance inspection equipment currently on the market generally has problems such as low detection accuracy and low efficiency, and has been unable to meet the inspection needs of high-end IC substrate manufacturers. Light Therefore, the development of a high-performance and high-efficiency automatic optical appearance inspection equipment has constituted an imminent demand.
本發明的目的是提供一種著重運用於IC載板/電路板表面處理成型工序後的外觀檢測的光學外觀檢測設備及外觀檢測方法,設備機械穩定度高,提高檢測精度,並提高檢測效率,滿足高端PCB-IC載板生產廠商的要求。 The object of the present invention is to provide a kind of optical appearance inspection equipment and appearance inspection method which are mainly applied to the appearance inspection after the surface treatment and molding process of IC carrier board/circuit board. The mechanical stability of the equipment is high, the detection accuracy is improved, and the detection efficiency is improved. The requirements of high-end PCB-IC carrier board manufacturers.
為達到上述目的,本發明採用的技術方案如下: In order to achieve the above object, the technical scheme adopted in the present invention is as follows:
一種光學外觀檢測設備,包括:左右並排且間隔設置的第一工作臺和第二工作臺,所述第一工作臺包括第一載臺、沿著前後方向設置的第一滑軌、被配置為驅動第一載臺沿著第一滑軌移動的第一驅動裝置,所述第二工作臺包括第二載臺、沿著前後方向設置的第二滑軌、被配置為驅動第二載臺沿著第二滑軌移動的第二驅動裝置;橋架,其沿左右方向架設在所述第一滑軌和第二滑軌的上方,所述橋架上設有可移動的第一光學檢測裝置和第二光學檢測裝置,所述第一光學檢測裝置被配置為在第一滑軌的後部上方左右往復移動,所述第二光學檢測裝置被配置為在第二滑軌的後部上方左右往復移動;翻轉機構,其設置在第一工作臺與第二工作臺之間,所述翻轉機構包括基準平臺、可翻轉平臺及第三驅動裝置,所述基 準平臺與可翻轉平臺鉸接,所述第三驅動裝置被配置為驅動所述可翻轉平臺相對於基準平臺發生翻轉;上料容器和下料容器,其中,所述上料容器設置在所述第一工作臺的外側,所述下料容器設置在所述第二工作臺的外側,所述上料容器被配置為放置待檢測的物料,所述下料容器被配置為放置完成檢測的物料,該物料為電路板或IC載板;傳送機構,被配置為對所述物料進行傳送,其包括沿左右方向設置的橫樑、設置在橫樑上的第一傳送元件和第一抓取元件、第二傳送元件和第二抓取元件;其中,所述第一傳送元件被配置為帶動第一抓取組件沿著橫樑在第一工作臺和上料容器的上方左右移動,所述第二傳送元件被配置為帶動第二抓取元件沿著橫樑在第二工作臺和下料容器的上方左右移動,且所述第一抓取元件和第二抓取元件均被配置為抓取物料。 An optical appearance inspection device, comprising: a first workbench and a second workbench arranged side by side and at intervals, the first workbench includes a first carrier, a first slide rail arranged along the front-to-rear direction, and is configured as a first driving device that drives the first stage to move along the first slide rail, the second worktable includes a second stage, a second slide rail arranged along the front-to-back direction, and is configured to drive the second stage along the A second driving device moving along the second slide rail; a bridge frame, which is erected above the first slide rail and the second slide rail along the left and right direction, and the bridge frame is provided with a movable first optical detection device and a second slide rail. Two optical detection devices, the first optical detection device is configured to reciprocate left and right above the rear of the first slide rail, and the second optical detection device is configured to reciprocate left and right above the rear of the second slide rail; flip A mechanism, which is arranged between the first workbench and the second workbench, the turning mechanism includes a reference platform, a turntable platform and a third drive device, the base The quasi-platform is hinged to the reversible platform, and the third driving device is configured to drive the reversible platform to turn over relative to the reference platform; the loading container and the unloading container, wherein the loading container is arranged on the first On the outside of a workbench, the unloading container is arranged on the outside of the second workbench, the loading container is configured to place materials to be tested, and the unloading container is configured to place materials that have been tested, The material is a circuit board or an IC carrier board; the conveying mechanism is configured to convey the material, which includes a beam arranged along the left and right directions, a first conveying element and a first grabbing element arranged on the beam, and a second A conveying element and a second grabbing element; wherein, the first conveying element is configured to drive the first grabbing assembly to move left and right along the beam above the first workbench and the feeding container, and the second conveying element is It is configured to drive the second grabbing element to move left and right along the beam above the second workbench and the unloading container, and both the first grabbing element and the second grabbing element are configured to grab materials.
進一步地,所述第一工作臺上至少前部外側相對於其後部呈收窄結構,所述第二工作臺上至少前部外側相對於其後部呈收窄結構,所述上料容器靠近所述第一工作臺的前部外側,所述下料容器靠近所述第二工作臺的前部外側。前窄為位於設備主體前部的自動化模組提供所需的位置,後寬則滿足大跨度橋架需要架設兩個光學檢測裝置的所需。 Further, at least the outside of the front part of the first workbench has a narrowed structure relative to its rear part, and at least the outside of the front part of the second workbench has a narrow structure relative to its rear part, and the feeding container is close to the The outer front part of the first workbench, and the unloading container is close to the outer front part of the second workbench. The narrow front provides the required location for the automation module located at the front of the equipment body, and the wide rear meets the needs of two optical detection devices for the long-span bridge.
進一步地,所述第一工作臺、第二工作臺、翻轉機構、上料容器和下料容器設置在方形基臺上,所述方形基臺採用鑄鐵件打造而成,提高了設備主體平臺的機械穩定性; 所述橋架具有兩個橋樁以及架在兩個橋樁上的水準橋杆,所述水準橋杆左端的橋樁設置在所述第一工作臺的後部,所述水準橋杆右端的橋樁設置在所述第二工作臺的後部;所述傳送機構的橫樑的一外端架設在所述方形基臺上靠近上料容器的區域,另一外端架設在所述方形基臺上靠近下料容器的區域。 Further, the first workbench, the second workbench, the turning mechanism, the loading container and the unloading container are arranged on a square base platform, and the square base platform is made of cast iron, which improves the stability of the main platform of the equipment. mechanical stability; The bridge frame has two bridge piles and a horizontal bridge rod mounted on the two bridge piles. The bridge pile at the left end of the horizontal bridge rod is arranged at the rear of the first workbench, and the bridge pile at the right end of the horizontal bridge rod is It is arranged at the rear of the second workbench; one outer end of the beam of the transmission mechanism is erected on the square base platform near the area of the feeding container, and the other outer end is erected on the square base platform near the lower container area.
進一步地,所述第一光學檢測裝置與第二光學檢測裝置被配置為各自搭配不同的光學鏡頭,以滿足特定的電路板具有正反面不同的檢測精度的需求。 Further, the first optical detection device and the second optical detection device are configured to be equipped with different optical lenses, so as to meet the requirement that a specific circuit board has different detection accuracy on the front and back sides.
進一步地,所述第一光學檢測裝置的光學鏡頭的光學放大倍率大於與第二光學檢測裝置的光學鏡頭的光學放大倍率,所述第一光學檢測裝置的單次掃描檢測面積小於第二光學檢測裝置的單次掃描檢測面積;所述第二工作臺的數量為一個,所述第一工作臺的數量為兩個且相鄰設置,這樣既可以滿足對電路板其中一面的高精度檢測的需求,又不會因為單次掃描檢測面積變小而影響整體電路板正反面的檢測效率。 Further, the optical magnification of the optical lens of the first optical detection device is greater than the optical magnification of the optical lens of the second optical detection device, and the detection area of a single scan of the first optical detection device is smaller than that of the second optical detection device. The single-scan detection area of the device; the number of the second workbench is one, and the number of the first workbench is two and arranged adjacently, which can meet the requirements of high-precision detection on one side of the circuit board , and will not affect the detection efficiency of the front and back sides of the overall circuit board due to the smaller detection area of a single scan.
進一步地,所述第一抓取元件包括第一抓取部和第二抓取部,所述第一抓取部被配置為在所述上料容器與第一載臺之間移動,所述第二抓取部被配置為在所述第一載臺與可翻轉平臺之間移動;第一抓取部在將電路板放置在第一載臺上之後,可以返回上料容器抓取下一片電路板,而在第二抓取部從第一載臺上抓 取第一片電路板後,可以將第一抓取部抓取的下一片電路板放置在第一載臺上,之後/同時第二抓取部將抓取的第一片電路板放置在可翻轉平臺上。 Further, the first grabbing element includes a first grabbing part and a second grabbing part, the first grabbing part is configured to move between the loading container and the first carrier, the The second grabbing part is configured to move between the first carrier and the reversible platform; after the first grabbing part places the circuit board on the first carrier, it can return to the loading container to grab the next piece circuit board, while grabbing from the first carrier in the second grabbing part After the first piece of circuit board is taken, the next piece of circuit board grabbed by the first grasping part can be placed on the first carrier, and then/simultaneously the second grasping part can place the first piece of circuit board grasped on the movable platform. Flip onto the platform.
所述第二抓取元件包括第三抓取部和第四抓取部,所述第三抓取部被配置為在所述基準平臺與第二載臺之間移動,所述第四抓取部被配置為在所述第二載臺與下料容器之間移動;同上,第三抓取部在將電路板放置在第二載臺上之後,可以返回基準平臺抓取下一片電路板,而在第四抓取部從第二載臺上抓取第一片電路板後,可以將第三抓取部抓取的下一片電路板放置在第二載臺上,之後/同時第四抓取部將抓取的第一片電路板放置在可翻轉平臺上。 The second grasping element includes a third grasping part and a fourth grasping part, the third grasping part is configured to move between the reference platform and the second stage, and the fourth grasping part The part is configured to move between the second carrier and the blanking container; as above, after the third grabbing part places the circuit board on the second carrier, it can return to the reference platform to grab the next circuit board, And after the fourth grabbing part grabs the first circuit board from the second carrier, the next circuit board grabbed by the third grabbing part can be placed on the second carrier, and then/simultaneously the fourth grabbing The picking part places the first picked circuit board on the reversible platform.
進一步地,所述第一抓取組件的抓手上設有吸盤,所述吸盤在所述抓手上的左右位置和/或前後位置可調。 Further, the gripper of the first grabbing component is provided with a suction cup, and the left-right position and/or front-back position of the suction cup on the gripper is adjustable.
進一步地,所述光學外觀檢測設備還包括傳感裝置,其設置在所述上料容器的上方,其被配置為識別上料容器中最上一層為物料或間隔紙;和/或,所述上料容器的數量為兩個且相互並排設置。 Further, the optical appearance detection device also includes a sensing device, which is arranged above the feeding container, and is configured to identify that the uppermost layer in the feeding container is material or spacer paper; and/or, the upper The quantity of material container is two and mutually arranged side by side.
進一步地,所述上料容器被配置為能夠沿著抽屜軌道向前移出,所述下料容器的數量為多個。 Further, the loading container is configured to be able to move forward along the drawer rail, and there are multiple unloading containers.
進一步地,所述第一驅動裝置、第二驅動裝置、第一傳送元件和第二傳送元件均採用配合開放式編碼器光柵尺的線性馬達; 所述第一工作臺、第二工作臺和橋架均採用鑄鐵件打造而成。 Further, the first driving device, the second driving device, the first conveying element and the second conveying element all adopt linear motors matched with an open encoder grating scale; The first workbench, the second workbench and the bridge frame are all made of cast iron.
另一方面,本發明提供了一種基於上述光學外觀檢測設備的外觀檢測方法,在所述光學外觀檢測設備的主控模組的控制下,所述光學外觀檢測設備執行以下步驟:S1、在光學外觀檢測設備的第一傳送元件的傳送作用下,第一抓取組件抓取上料容器中的物料,並將該物料運輸至第一工作臺的第一載臺上;S2、在第一驅動裝置的驅動作用下,所述第一載臺沿著第一滑軌向後移動,以使第一光學檢測裝置對第一載臺上的物料進行掃描檢測;S3、待完成掃描檢測後,所述第一載臺沿著第一滑軌向前移動;S4、所述第一抓取組件抓取第一載臺上的物料,並將其運輸到翻轉機構的可翻轉平臺;S5、在第三驅動裝置的驅動作用下,所述可翻轉平臺帶動該物料向基準平臺翻轉,以使物料背面朝上地放置在所述基準平臺上;S6、在第二傳送元件的傳送作用下,第二抓取元件抓取所述基準平臺上的物料,並將其運輸至第二工作臺的第二載臺上;S7、在第二驅動裝置的驅動作用下,所述第二載臺沿著 第二滑軌向後移動,以使第二光學檢測裝置對第二載臺上的物料進行掃描檢測;S8、待完成掃描檢測後,所述第二載臺沿著第二滑軌向前移動;S9、所述第二抓取元件抓取第二載臺上的物料,並將其運輸到下料容器。 In another aspect, the present invention provides an appearance inspection method based on the above-mentioned optical appearance inspection equipment. Under the control of the main control module of the optical appearance inspection equipment, the optical appearance inspection equipment performs the following steps: S1. Under the transmission action of the first transmission element of the appearance inspection equipment, the first grabbing component grabs the material in the feeding container and transports the material to the first carrier of the first workbench; S2, in the first drive Driven by the device, the first stage moves backward along the first slide rail, so that the first optical detection device scans and detects the materials on the first stage; S3. After the scanning and detection is completed, the The first carrier moves forward along the first slide rail; S4, the first grabbing assembly grabs the material on the first carrier, and transports it to the reversible platform of the reversing mechanism; S5, in the third Under the driving action of the driving device, the reversible platform drives the material to turn over to the reference platform, so that the material is placed on the reference platform with its back facing up; S6, under the transmission action of the second transmission element, the second grab The fetching element grabs the material on the reference platform and transports it to the second carrier of the second workbench; S7, under the driving action of the second driving device, the second carrier moves along the The second slide rail moves backward, so that the second optical detection device scans and detects the material on the second stage; S8, after the scanning and detection is completed, the second stage moves forward along the second slide rail; S9. The second grabbing element grabs the material on the second carrier and transports it to the unloading container.
進一步地,在執行步驟S5之後,在執行S6-S9的同時,所述第一傳送元件、第一抓取元件、第一驅動裝置、第一光學檢測裝置、第三驅動裝置重複執行步驟S1-S5;在執行步驟S9之後,所述第二傳送元件、第二抓取元件、第二驅動裝置、第二光學檢測裝置重複執行步驟S6-S9。 Further, after executing step S5, while executing steps S6-S9, the first conveying element, the first grasping element, the first driving device, the first optical detection device, and the third driving device repeatedly execute steps S1- S5: After step S9 is executed, the second conveying element, the second grasping element, the second driving device, and the second optical detection device repeatedly execute steps S6-S9.
進一步地,所述第一抓取元件包括第一抓取部和第二抓取部,所述第二抓取元件包括第三抓取部和第四抓取部;步驟S1中由第一抓取部抓取物料,步驟S4中由第二抓取部抓取物料;步驟S6中由第三抓取部抓取物料,步驟S9中由第四抓取部抓取物料。 Further, the first grabbing element includes a first grabbing part and a second grabbing part, and the second grabbing element includes a third grabbing part and a fourth grabbing part; in step S1, the first grabbing The grabbing part grabs the material, and in step S4, the second grabbing part grabs the material; in step S6, the third grabbing part grabs the material, and in step S9, the fourth grabbing part grabs the material.
進一步地,所述第一抓取部與第二抓取部獨立動作,所述第三抓取部與第四抓取部獨立動作;在執行步驟S1之後,在執行S2-S4的同時,所述第一抓取部重複執行步驟S1;在執行步驟S4之後,在執行S5-S6的同時,所述第二抓取部重複執行步驟S4; 在執行步驟S6之後,在執行S7-S9的同時,所述第三抓取部重複執行步驟S6;在執行步驟S9之後,所述第四抓取部重複執行步驟S7-S9。 Further, the first grasping part and the second grasping part act independently, and the third grasping part and the fourth grasping part act independently; after step S1 is executed, while S2-S4 is executed, the The first grabbing part repeatedly executes step S1; after step S4 is executed, while executing S5-S6, the second grabbing part repeatedly executes step S4; After performing step S6, while performing steps S7-S9, the third grasping part repeatedly executes step S6; after performing step S9, the fourth grasping part repeatedly executes steps S7-S9.
進一步地,所述上料容器的上方還設有傳感裝置,所述傳感裝置與所述主控模組的輸入端電連接,所述傳感裝置被配置為識別上料容器中最上一層為物料或間隔紙;步驟S1進一步包括:若所述傳感裝置的識別結果為上料容器中最上一層為間隔紙,則所述第一抓取組件抓取該間隔紙並將其運輸至間隔紙收集區域;若所述傳感裝置的識別結果為上料容器中最上一層為物料,則所述第一抓取組件抓取該物料並將其運輸至第一載臺。 Further, a sensing device is provided above the feeding container, the sensing device is electrically connected to the input end of the main control module, and the sensing device is configured to identify the uppermost layer in the feeding container is material or spacer paper; step S1 further includes: if the recognition result of the sensing device is that the uppermost layer in the feeding container is spacer paper, the first grabbing component grabs the spacer paper and transports it to the spacer Paper collection area; if the recognition result of the sensing device is that the uppermost layer in the feeding container is material, the first grabbing component grabs the material and transports it to the first carrier.
進一步地,所述第一光學檢測裝置的光學鏡頭的光學放大倍率大於與第二光學檢測裝置的光學鏡頭的光學放大倍率,所述第一光學檢測裝置的單次掃描檢測面積小於第二光學檢測裝置的單次掃描檢測面積;所述第二工作臺的數量為一個,所述第一工作臺的數量為兩個且相鄰設置;步驟S1中所述第一抓取組件輪流給兩個第一工作臺的第一載臺運輸物料;步驟S4中所述第一抓取組件輪流從兩個第一載臺抓取物料並將其運輸到可翻轉平臺。 Further, the optical magnification of the optical lens of the first optical detection device is greater than the optical magnification of the optical lens of the second optical detection device, and the detection area of a single scan of the first optical detection device is smaller than that of the second optical detection device. The single-scanning detection area of the device; the number of the second workbench is one, and the number of the first workbench is two and arranged adjacently; in step S1, the first grabbing component is given to the two second workbenches in turn The first carrier of a worktable transports materials; in step S4, the first grabbing assembly grabs materials from the two first carriers in turn and transports them to the reversible platform.
本發明提供的技術方案帶來的有益效果如下: The beneficial effects brought by the technical solution provided by the invention are as follows:
a.設備主體的平臺採用1X2Z+2Y創新樣式,實現高度集成化和高度集中化的結構排布;b.流水式完成兩條Y向工作臺上物料的正面及反面的檢測,提高雙面檢測的自動化程度以及各自配置光學檢測精度的靈活性。 a. The platform of the main body of the equipment adopts 1X2Z+2Y innovative style to realize highly integrated and highly centralized structural arrangement; b. Flow-through completes the detection of the front and back of the material on the two Y-direction workbenches to improve double-sided detection The degree of automation and the flexibility of configuring the optical detection accuracy of each.
1:第一工作臺 1: The first workbench
101:第一載臺 101: The first platform
102:第一滑軌 102: The first slide rail
103:第一拖鏈 103: The first drag chain
2:第二工作臺 2: The second workbench
201:第二載臺 201:Second platform
202:第二滑軌 202: Second slide rail
203:第二拖鏈 203: Second drag chain
3:橋架 3: Bridge
301:第一光學檢測裝置 301: the first optical detection device
302:第二光學檢測裝置 302: the second optical detection device
311:第一X向拖鏈 311: The first X-direction drag chain
312:第二X向拖鏈 312: The second X-direction drag chain
321:第一Z向拖鏈 321: The first Z-direction drag chain
322:第二Z向拖鏈 322: The second Z-direction drag chain
401:基準平臺 401: Benchmark Platform
402:可翻轉平臺 402: Reversible platform
501:上料容器 501: Feeding container
502:下料容器 502: Feed container
61:第一橫樑 61: First beam
611:第一傳送組件 611: The first transmission component
612:第一抓取組件 612: The first grabbing component
6121:第一抓取部 6121: The first grasping department
6122:第二抓取部 6122: The second grasping department
62:第二橫樑 62: Second beam
621:第二傳送元件 621: Second transmission element
622:第二抓取元件 622: Second grabbing element
6221:第三抓取部 6221: The third grasping department
6222:第四抓取部 6222: The fourth grasping department
6001:吸盤 6001: suction cup
63:中間支柱 63: middle pillar
7:電路板 7: Circuit board
為了更清楚地說明本申請實施例或現有技術中的技術方案,下面將對實施例或現有技術描述中所需要使用的附圖作簡單地介紹,顯而易見地,下面描述中的附圖僅僅是本申請中記載的一些實施例,對於本領域普通技術人員來講,在不付出創造性勞動的前提下,還可以根據這些附圖獲得其他的附圖。 In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings that need to be used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the accompanying drawings in the following description are only the present invention For some embodiments described in the application, those skilled in the art can also obtain other drawings based on these drawings without creative work.
圖1為本公開的一個示例性實施例提供的光學外觀檢測設備的立體示意圖;圖2為圖1所示的光學外觀檢測設備俯視示意圖;圖3為本公開的一個示例性實施例提供的光學外觀檢測設備的工作臺及橋架的組裝結構示意圖;圖4為圖3所示的組裝結構的俯視示意圖;圖5為將圖3所示的組裝結構從圖1所示的光學外觀檢測設備中分離出去後的結構示意圖;圖6為圖5所示的結構中位元元於右半部分的放大示意圖; 圖7為圖5所示的結構的俯視示意圖。 Fig. 1 is a three-dimensional schematic view of an optical appearance inspection device provided by an exemplary embodiment of the present disclosure; Fig. 2 is a schematic top view of the optical appearance inspection device shown in Fig. 1; Fig. 3 is an optical appearance inspection device provided by an exemplary embodiment of the present disclosure Schematic diagram of the assembly structure of the workbench and bridge frame of the appearance inspection equipment; Figure 4 is a schematic top view of the assembly structure shown in Figure 3; Figure 5 is the separation of the assembly structure shown in Figure 3 from the optical appearance inspection equipment shown in Figure 1 Schematic diagram of the structure after going out; Fig. 6 is an enlarged schematic diagram of the bit in the right half of the structure shown in Fig. 5; FIG. 7 is a schematic top view of the structure shown in FIG. 5 .
為了使本技術領域的人員更好地理解本發明方案,下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例僅僅是本發明一部分的實施例,而不是全部的實施例。基於本發明中的實施例,本領域普通技術人員在沒有做出創造性勞動前提下所獲得的所有其他實施例,都應當屬於本發明保護的範圍。 In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
需要說明的是,本發明的說明書和申請專利範圍及上述附圖中的術語“第一”、“第二”等是用於區別類似的物件,而不必用於描述特定的順序或先後次序。應該理解這樣使用的資料在適當情況下可以互換,以便這裡描述的本發明的實施例能夠以除了在這裡圖示或描述的那些以外的順序實施。此外,術語“包括”和“具有”以及他們的任何變形,意圖在於覆蓋不排他的包含,例如,包含了一系列步驟或單元的過程、方法、裝置、產品或設備不必限於清楚地列出的那些步驟或單元,而是可包括沒有清楚地列出的或對於這些過程、方法、產品或設備固有的其他步驟或單元。 It should be noted that the terms "first" and "second" in the specification and scope of claims of the present invention and the above drawings are used to distinguish similar items, but not necessarily used to describe a specific order or sequence. It is to be understood that the materials so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein can be practiced in sequences other than those illustrated or described herein. Furthermore, the terms "comprising" and "having", as well as any variations thereof, are intended to cover a non-exclusive inclusion, for example, a process, method, means, product or equipment comprising a series of steps or elements need not be limited to the expressly listed instead, may include other steps or elements not explicitly listed or inherent to the process, method, product or apparatus.
在本發明的一個實施例中,提供了一種光學外觀檢測設備,設備主體集成有自動化智慧控制模組,可實現上料、翻轉、下料、分類等智慧化流水式操作,作為設備高效率的必備條件, 參見圖1-圖7,其中,圖1所示的光學外觀檢測設備可以分解為圖3所示的設備和圖5所示的設備。 In one embodiment of the present invention, an optical appearance inspection device is provided. The main body of the device is integrated with an automatic intelligent control module, which can realize intelligent flow-type operations such as loading, turning, unloading, and classification. Prerequisites, Referring to FIGS. 1-7 , the optical appearance inspection device shown in FIG. 1 can be decomposed into the device shown in FIG. 3 and the device shown in FIG. 5 .
具體地,所示光學外觀檢測設備包括:如圖3和圖4所示,左右並排且間隔設置的第一工作臺1和第二工作臺2,所述第一工作臺1包括第一載臺101、沿著前後方向設置的第一滑軌102、被配置為驅動第一載臺101沿著第一滑軌102移動的第一驅動裝置(未圖示),所述第二工作臺2包括第二載臺201、沿著前後方向設置的第二滑軌202、被配置為驅動第二載臺201沿著第二滑軌202移動的第二驅動裝置(未圖示);其中,第一工作臺1還配置有用於走線的第一拖鏈103,當第一驅動裝置驅動第一載臺101滑動時,第一拖鏈103隨著第一載臺101移動;同理,第二工作臺2還配置有用於走線的第二拖鏈203,當第二驅動裝置驅動第二載臺201滑動時,第二拖鏈203隨著第二載臺201移動。
Specifically, the shown optical appearance inspection equipment includes: as shown in FIG. 3 and FIG. 4 , a
橋架3,其沿左右方向架設在所述第一滑軌102和第二滑軌202的上方,如圖3所示,所述橋架3上設有可移動的第一光學檢測裝置301和第二光學檢測裝置302,所述第一光學檢測裝置301被配置為在第一滑軌102的後部上方左右往復移動,所述第二光學檢測裝置302被配置為在第二滑軌202的後部上方左右往復移動,第一光學檢測裝置301和第二光學檢測裝置302還需要上下移動以調節與待檢測的電路板之間的距離;相應地,橋架3還配置有用於走線的第一X向拖鏈311、第二X向拖鏈312、第一Z向拖鏈321和第二Z向拖鏈322,當第一光學檢測裝置301左右
移動時,第一X向拖鏈311隨著第一光學檢測裝置301移動,當第二光學檢測裝置302左右移動時,第二X向拖鏈312隨著第二光學檢測裝置302移動,當第一光學檢測裝置301上下移動時,第一Z向拖鏈321隨著第一光學檢測裝置301移動,當第二光學檢測裝置302上下移動時,第二Z向拖鏈322隨著第二光學檢測裝置302移動。顯然,第一光學檢測裝置301、第二光學檢測裝置302左右移動的行程範圍均應當覆蓋待測電路板在X軸方向上的長度,當待檢測的電路板被放置在第一載臺101上時,其沿Y軸方向進入到第一光學檢測裝置301的行程範圍內,由第一光學檢測裝置301完成檢測掃描後,再退回到初始的上料位置;當待檢測的電路板被放置在第二載臺201上時,其沿Y軸方向進入到第二光學檢測裝置302的行程範圍內,由第二光學檢測裝置302完成檢測掃描後,再退回到初始的上料位置。
Bridge 3, which is erected above the first slide rail 102 and the second slide rail 202 along the left and right direction, as shown in Figure 3, the bridge 3 is provided with a movable first optical detection device 301 and a second Optical detection device 302, the first optical detection device 301 is configured to reciprocate left and right above the rear portion of the first slide rail 102, and the second optical detection device 302 is configured to move left and right above the rear portion of the second slide rail 202 Moving back and forth, the first optical detection device 301 and the second optical detection device 302 also need to move up and down to adjust the distance between the circuit board to be detected; Chain 311, second X-direction drag chain 312, first Z-direction drag chain 321 and second Z-direction drag chain 322, when the first optical detection device 301 left and right
When moving, the first X-direction drag chain 311 moves with the first optical detection device 301, when the second optical detection device 302 moves left and right, the second X-direction drag chain 312 moves with the second optical detection device 302, when the second optical detection device 302 moves When an optical detection device 301 moves up and down, the first Z-direction drag chain 321 moves with the first optical detection device 301; when the second optical detection device 302 moves up and down, the second Z-direction drag chain 322 moves with the second optical detection device Device 302 moves. Obviously, the travel ranges of the first
翻轉機構,其設置在第一工作臺1與第二工作臺2之間,如圖3和圖4所示,所述翻轉機構包括基準平臺401、可翻轉平臺402及第三驅動裝置(未圖示),所述基準平臺401與可翻轉平臺402鉸接,所述第三驅動裝置被配置為驅動所述可翻轉平臺402相對於基準平臺401發生翻轉,在本實施例中,可翻轉平臺402上還設有抽真空氣孔,當電路板放置在可翻轉平臺402上後,抽吸真空以使電路板在接下來翻轉的過程中始終貼合可翻轉平臺402而不會掉落,待電路板翻轉接近或等於180°之後,停止抽吸真空,電路板即脫離可翻轉平臺402而到達基準平臺401;當然,也
可以採用輔助壓板將電路板壓合在可翻轉平臺上來替換抽真空吸合的方式;關於翻轉機構,可通過引用的方式,將專利公告號為CN213209951U的實用新型全文併入本發明實施例。以放置在第一載臺101上的電路板為正面朝上為例,顯然,經過翻轉機構的翻轉,再放置在上述第二載臺201上的電路板為背面朝上。
Turning mechanism, it is arranged between the
上料容器501和下料容器502,參見圖1和圖2,所述上料容器501設置在所述第一工作臺1的外側,所述下料容器502設置在所述第二工作臺2的外側,所述上料容器501被配置為放置待檢測的電路板,所述下料容器502被配置為放置完成檢測的電路板;傳送機構,被配置為對所述電路板進行傳送,參見圖5-圖7,傳送機構包括橫跨於主體設備基體前端、並與橋架3形成平行結構的橫樑,本實施例中傳送機構包括左右對接的第一橫樑61和第二橫樑62、設置在第一橫樑61上的第一傳送組件611和第一抓取元件612、設置在第二橫樑62上的第二傳送元件621和第二抓取元件622;其中,第一橫樑61和第二橫樑62的內端可以與豎立在兩者之間的中間支柱63固定連接,所述第一橫樑61架設在第一工作臺1和上料容器501的上方,所述第二橫樑62架設在第二工作臺2和下料容器502的上方;所述第一傳送元件611被配置為帶動第一抓取元件612沿著第一橫樑61移動,所述第二傳送元件621被配置為帶動第二抓取元件622沿著第二橫樑62移動,且所述第一抓取元件612和第二抓取元件622均被配置為抓取電
路板。由於橫樑分段式的設計,使得第一橫樑61上的第一傳送元件611和第一抓取元件612與第二橫樑62上的第二傳送元件621和第二抓取元件622互不干擾,以提高第一抓取元件612和第二抓取元件622的移動精度和抓取電路板的可靠性,尤其是可以避免自動化傳送運動時對光學元件精度的干擾。
The
本發明的光學外觀檢測設備的平臺採用1X2Z+2Y的創新伺服驅動平臺樣式,即以橋架3的延伸方向為X軸,並懸掛了兩個驅動載體並各自配備了高精光學相機鏡頭元件(即第一光學檢測裝置和第二光學檢測裝置),以第一工作臺1和第二工作臺2的延伸方向為Y軸,在X軸向的橋架3上,橋架的底部有兩個與Y軸並行的工作臺,可分別流水式完成兩條Y向工作臺上物料的正面及反面的光學外觀檢測。
The platform of the optical appearance inspection equipment of the present invention adopts the innovative servo-driven platform style of 1X2Z+2Y, that is, the extension direction of the
參見圖4,所述第一工作臺1上至少前部(前部加中部)外側相對於其後部呈收窄結構,所述第二工作臺2上至少前部外側相對於其後部呈收窄結構,使得收窄後的外側可以與其他部件緊密排布,前窄後寬的工作臺設計中,後寬滿足了大跨度X軸向的橋架3的所需,X軸橋架主體結構同樣採用鑄鐵件打造,本發明實施例採用長行程X橋架設計,目的在於使橋架3上可懸掛兩組獨立的光學元件,前窄則為位於設備主體前部的自動化模組以及上料容器501和下料容器502提供了所需的位置。具體如圖1所示,所述上料容器501靠近所述第一工作臺1的前部外側,所述下料容器502靠近所述第二工作臺2的前部外側,且所述第一
橫樑61的外端架設在所述方形基臺上靠近上料容器501的區域,所述第二橫樑62的外端架設在所述方形基臺上靠近下料容器502的區域。參見圖2,基於第一工作臺1和第二工作臺2的前部收窄結構、後部未收窄結構,所述橋架3的兩個橋樁分別設置在第一工作臺1的後部以及第二工作臺2的後部,所述第一工作臺1、第二工作臺2、翻轉機構、上料容器501和下料容器502、傳送機構的佈局接近矩形或方形,且橋架3不會額外增加占地面積,結構緊湊,高度集成化的結構排布是本設備的優勢之一,其可設置在方形基臺上,所述方形基臺、第一工作臺1、第二工作臺2、橋架3均可以採用鑄鐵件打造而成;X、Y軸向的驅動採用線性馬達配合高精直線導軌作為驅動主體,從而在運動精度上、速度上都優於市場上的常見的伺服馬達配合絲杆性型的XY運動平臺,滿足了平臺運動高精度的要求與也是平臺穩定性的保證,同樣地,穩定又可靠的運動平臺主體也為高度精密化的光學元件提供了基礎保障。
Referring to FIG. 4 , at least the outer side of the front part (the front part plus the middle part) on the
佈局上,兩組自動化抓取模組架設於設備本體之上,與X軸向橋架平行,分別垂直架設於兩條Y軸的工作臺之上,兩組智慧化物料上料容器與三組物料下料容器分別分佈在兩條Y軸向工作臺的左右兩側,並與Y軸平行,自動翻轉平臺位於兩條Y軸工作臺中間,同樣平行於兩條Y軸,從而達到最合理化佈局設計,具體即:第一抓取組件612從上料容器501取料至Y軸的第一工作臺1上,並由Z軸的第一光學檢測裝置301掃描完成後再抓取
至可翻轉平臺402以進行換面(翻轉後背面朝上),再由第二抓取元件622從翻轉機構的基準平臺401上取至Y軸的第二工作臺2上並由Z軸的第二光學檢測裝置302進行反面掃描,完成後由第二抓取元件622取走並放至下料容器,以此完成單片料(電路板,可以具體為IC載板)的正反雙面外觀檢測的流程。自動化智慧模組的高度集成是外觀檢測設備實現穩定的必要條件。
In terms of layout, two sets of automatic grabbing modules are set up on the equipment body, parallel to the X-axis bridge, and vertically set up on the two Y-axis workbenches respectively. Two sets of intelligent material feeding containers and three sets of material The unloading containers are respectively distributed on the left and right sides of the two Y-axis worktables, parallel to the Y-axis, and the automatic turning platform is located in the middle of the two Y-axis worktables, which are also parallel to the two Y-axis, so as to achieve the most rational layout design , specifically: the first
在本發明的一個實施例中,第一抓取元件612被配置為在所述上料容器與第一載臺101之間移動,以抓取上料容器501中待檢測的電路板並將其放置到第一載臺101;後在第一載臺101與可翻轉平臺402之間移動,以抓取第一載臺101上完成檢測的電路板並將其放置到可翻轉平臺402上;第二抓取元件622被配置為在所述基準平臺401與第二載臺201之間移動,以抓取基準平臺401上背面朝上的電路板並將其放置到第二載臺201;後在所述第二載臺201與下料容器502之間移動,以抓取第二載臺201上完成檢測的電路板並將其放置到下料容器502。具體參見圖5和圖6:每組抓取元件具有2個抓取部,可在流程中被合理的分配使用,從而做到不間斷迴圈作業,具體到實際操控流程可以根據不同的客戶要求、不同的物料尺寸、不同的使用場景等變化出最合理化的流水式作業迴圈步驟。具體地,所述第一抓取元件612包括第一抓取部6121和第二抓取部6122,所述第一抓取部6121被配置為在所述上料容器501與第一載臺101之間移動,所述第
二抓取部6122被配置為在所述第一載臺101與可翻轉平臺402之間移動;所述第二抓取元件622包括第三抓取部6221和第四抓取部6222,所述第三抓取部6221被配置為在所述基準平臺401與第二載臺201之間移動,所述第四抓取部6222被配置為在所述第二載臺201與下料容器502之間移動;第一抓取部6121和第二抓取部6122、第三抓取部6221和第四抓取部6222還能夠向下移動以抓取電路板,在本實施例中,抓取部的抓手上設有吸盤6001,參見圖6和圖1,利用吸盤6001可以吸取電路板7,本實施例中,單個抓取部包括兩個平行的直線軸及多個可滑動套設在直線軸上的吸盤6001,但是本發明不限於吸盤抓取電路板的抓取方式,其他方式比如夾取方式同樣落入本發明要求保護的範圍。本實施例中,所述吸盤6001在所述抓取部的抓手上的左右位置和/或前後位置可調,以滿足用戶端不同產品的尺寸需求。
In one embodiment of the present invention, the first
對應上述實施例中的光學外觀檢測設備,其具有主控模組,用於控制各個驅動機構,具體工作過程如下:S1、在光學外觀檢測設備的第一傳送元件611的傳送作用下,第一抓取元件612抓取上料容器501中的電路板,並將該電路板運輸至第一工作臺1的第一載臺101上;S2、在第一驅動裝置的驅動作用下,所述第一載臺101沿著第一滑軌102向後移動,以使第一光學檢測裝置301對第一載臺101上的電路板進行掃描檢測;
S3、待完成掃描檢測後,所述第一載臺101沿著第一滑軌102向前移動;S4、所述第一抓取元件612抓取第一載臺101上的電路板,並將其運輸到翻轉機構的可翻轉平臺402;S5、在第三驅動裝置的驅動作用下,所述可翻轉平臺402帶動該電路板向基準平臺401翻轉,以使電路板背面朝上地放置在所述基準平臺401上;S6、在第二傳送元件621的傳送作用下,第二抓取元件622抓取所述基準平臺401上的電路板,並將其運輸至第二工作臺2的第二載臺201上;S7、在第二驅動裝置的驅動作用下,所述第二載臺201沿著第二滑軌202向後移動,以使第二光學檢測裝置302對第二載臺201上的電路板進行掃描檢測;S8、待完成掃描檢測後,所述第二載臺201沿著第二滑軌202向前移動;S9、所述第二抓取元件622抓取第二載臺201上的電路板,並將其運輸到下料容器502。
Corresponding to the optical appearance inspection device in the above embodiment, it has a main control module for controlling each driving mechanism, and the specific working process is as follows: S1. Under the transmission action of the
以上為單片電路板從收容於上料容器501,至其完成正反面外觀檢測、直至被收集到下料容器的流程。
The above is the flow of the single-chip circuit board from being stored in the
由於左右分別設置兩套工作臺、光學檢測裝置、傳送元件和抓取元件,因此,其可以提高外觀檢測效率,體現在:在執行步驟S5之後,在執行S6-S9的同時,所述第一傳
送元件611、第一抓取元件612、第一驅動裝置、第一光學檢測裝置301、第三驅動裝置重複執行步驟S1-S5;在執行步驟S9之後,所述第二傳送元件621、第二抓取元件622、第二驅動裝置、第二光學檢測裝置302重複執行步驟S6-S9。
Since two sets of workbenches, optical detection devices, conveying elements, and grabbing elements are respectively arranged on the left and right, it can improve the efficiency of appearance inspection, which is reflected in: after step S5 is executed, while executing S6-S9, the first pass
The sending
更進一步地,第一抓取元件612在將電路板運輸至可翻轉平臺之後,一方面,翻轉機構執行步驟S5,另一方面,第一抓取組件612返回執行S1-S4。而第二抓取元件則重複將電路板依次由基準平臺運輸至第二載臺201、下料容器502。
Furthermore, after the
具體地,第一抓取元件612包括第一抓取部6121和第二抓取部6122,所述第二抓取元件622包括第三抓取部6221和第四抓取部6222;步驟S1中由第一抓取部6121抓取電路板,步驟S4中由第二抓取部6122抓取電路板;步驟S6中由第三抓取部6221抓取電路板,步驟S9中由第四抓取部6222抓取電路板。
Specifically, the first
在一個實施例中,第一抓取部6121和第二抓取部6122為左右聯動,即在第一傳送組件611的傳送作用下,第一抓取部6121和第二抓取部6122共同向右移動或共同向左移動,第三抓取部6221和第四抓取部6222同樣左右聯動。每個抓取元件設置兩個抓取部是為了提高外觀檢測效率,具體如下:在執行步驟S1之後,即在第一載臺101將電路板的一面送檢的過程中,第一抓取部6121可以返回上料容器501取下一片
電路板;待S4中,第二抓取部6122抓取電路板之後,第一抓取部6121將抓取的下一片電路板放置在第一載臺101上;尤其是,設置上料容器501與第一載臺101之間的X軸向距離與第一載臺101與可翻轉平臺402之間的X軸向距離大致相同的情況下,第一抓取部6121將抓取的下一片電路板放置在第一載臺101上的同時,第二抓取部6122抓取的電路板可以在相同時間放置在可翻轉平臺上。
In one embodiment, the first
在執行步驟S4之後,所述第一抓取部6121和第二抓取部6122一起返回至上料容器501,重複執行上述步驟;在執行步驟S6之後,即在第二載臺201將電路板的另一面送檢的過程中,所述第三抓取部6221返回基準平臺抓取下一片被翻轉的電路板;待S9中,第四抓取部6222抓取電路板後,第三抓取部6221將抓取的下一片被翻轉的電路板放置在第二載臺201上;尤其是,設置基準平臺401與第二載臺201之間的X軸向距離與第二載臺201與下料容器502之間的X軸向距離大致相同的情況下,第三抓取部6221將抓取的下一片被翻轉的電路板放置在第二載臺201上的同時,第四抓取部6222抓取的電路板可以在相同時間放置在下料容器502。
After step S4 is executed, the first
總之,正是每個抓取元件設置了兩個抓取部,可以使得第一載臺101、第二載臺201能夠連續不間斷地運輸電路板至對應的光學檢測裝置進行外觀檢測,前提是,第一載臺101送檢時間小於或等於從第二抓取部6122抓取電路板至可翻轉平臺402至返
回至上料容器501處,第一抓取部6121抓取再下一片電路板至第一載臺101處的時間;第二載臺201送檢時間小於或等於從第四抓取部6222抓取電路板至下料容器502至返回至基準平臺401處,第三抓取部6221抓取再下一片電路板至第二載臺201處的時間。
In short, each grabbing element is provided with two grabbing parts, which can enable the
在另一個實施例中,所述第一抓取部6121與第二抓取部6122獨立動作,所述第三抓取部6221與第四抓取部6222獨立動作,比如將第一傳送元件611分為兩個子元件,第一個子元件驅動第一抓取部6121,另一個子元件驅動第二抓取部6122;同樣地,第二傳送元件621的第一個子元件驅動第三抓取部6221,另一個子組件驅動第四抓取部6222,這樣四個抓取部獨立動作的方式互不干擾,可以進一步提高外觀檢測效率,具體體現在:在執行步驟S1之後,在執行S2-S4的同時,所述第一抓取部6121重複執行步驟S1;在執行步驟S4之後,在執行S5-S6的同時,所述第二抓取部6122重複執行步驟S4;在執行步驟S6之後,在執行S7-S9的同時,所述第三抓取部6221重複執行步驟S6;在執行步驟S9之後,所述第四抓取部6222重複執行步驟S7-S9。
In another embodiment, the first
也就是說,第一抓取部6121無需等待電路板的正面檢測完後將其運輸至可翻轉平臺再返回上料容器,而是每次在將電路板運輸至第一載臺101後,即可立即返回至上料容器501;
同理,第二抓取部6122每次在將電路板運輸至可翻轉平臺402後,即可立即返回至第一載臺101;第三抓取部6221每次在將電路板運輸至第二載臺201後,即可立即返回至基準平臺401;第四抓取部6222每次在將電路板運輸至下料容器502後,即可立即返回至第二載臺201。
That is to say, the first
以上無論是聯動或者獨立動作的實施例中,均可以分別調節第一驅動機構、第二驅動機構、第一傳送元件和第二傳送元件的動力輸出大小,使得各個抓取部抓取電路板並運輸的時間與載臺送檢電路板的時間相適配。 In the above embodiments, no matter whether it is linkage or independent action, the power output of the first drive mechanism, the second drive mechanism, the first transmission element and the second transmission element can be adjusted respectively, so that each grasping part grasps the circuit board and The time of transportation matches the time when the stage sends the circuit board for inspection.
對於一些特別高精密IC載板,來料時板子與板子之間會墊放隔紙作為保護,當檢測完成後每兩片板子之間也需要放置隔紙以此做到對電路板的保護。在本發明的一個實施例中,所述上料容器501的上方還設有傳感裝置(比如說可以採用顏色感測器或者圖像感測器),所述傳感裝置與所述主控模組的輸入端電連接,所述傳感裝置被配置為識別上料容器501中最上一層為電路板或間隔紙;步驟S1進一步包括:若所述傳感裝置的識別結果為上料容器501中最上一層為間隔紙,則所述第一抓取組件612抓取該間隔紙並將其運輸至隔紙回收料盒;若所述傳感裝置的識別結果為上料容器501中最上一層為電路板,則所述第一抓取元件612抓取該電路板並將其運輸至第一載臺101。作為一種可實施的方式,上料容器501的數量為兩個且相互並排設置,其中一個用於放置
電路板,另一個作為所述間隔紙收集區域。
For some special high-precision IC carrier boards, a spacer is placed between the boards for protection when the incoming materials are received, and a spacer is also required between every two boards after the inspection is completed to protect the circuit board. In an embodiment of the present invention, a sensing device (for example, a color sensor or an image sensor can be used) is provided above the feeding
設置多個並排的上料容器501還可以用以不間斷地提供上料,所述上料容器501被配置為能夠沿著抽屜軌道向前移出,至少兩個上料容器501中放置有待檢測的電路板,當其中一個上料容器501中的電路板被取空,可以取另一個上料容器501中的電路板,而將空的上料容器501向前抽出以對其補充電路板,由於向前抽出的上料容器501與第一抓取組件612抓取未向前抽出的上料容器501中的電路板的運動軌跡相錯開,因此向向前抽出的上料容器501內補充電路板的動作並不會與第一抓取元件612從另一上料容器501抓取電路板的動作發生碰撞或衝突,以此迴圈,從而實現不停機、不間斷地供料,以此保證設備高效率檢測載板的外觀。關於上料容器抽屜機構的設計部分通過引用的方式,將公告號為CN209023756U的中國專利的全文併入本實施例中。
A plurality of side-by-
綜上,設計安裝帶有兩組上料容器501的目的如上所描述的,第一可實現不間斷供料,第二當使用場景為兩片電路板之間設有物料間隔紙時,其中一個上料容器501便可被設置為隔紙回收料盒,具體實施為當抓取部去另一上料容器501抓取物料前,需獲得裝在上料容器501後上方的顏色感測器的判定信號,如判定上料容器501中浮在最上面的物料是電路板(IC載板),則抓取部會將IC載板運輸至Y軸第一工作臺1的第一載臺101上進行檢測,反之,如判定為間隔紙,則由抓取部將間隔紙傳送至作為隔紙回收料盒的上料容器501,此設計很好地體現了設備操控的智能
化。
In summary, the purpose of designing and installing two sets of feeding
針對位於設備左側即第二工作臺2外側的三組下料容器502,其功能主要是可方便於對完成檢測的物料進行歸類,行業內通常設置為三類即:良品、需再次確認品、報廢品,設計帶有三組下料歸類盒可很好地滿足此要求。
For the three sets of blanking
在本發明的一個實施例中,第一光學檢測裝置301與第二光學檢測裝置302各自搭配的光學鏡頭相同;在另一個實施例中,所述第一光學檢測裝置301與第二光學檢測裝置302被配置為各自搭配不同的光學鏡頭。此目的在於可根據產品的不同特性給出不同的光學解析度,比如當客戶的產品正面比較精密而需要高解析度檢測時,用於檢測正面的光學鏡頭便可根據需求給出相應的光學放大距,反之如果產品反面不需高精密檢測,則對應檢測反面的光學鏡頭便可自動調整到相應的放大距,不同的光學放大距也代表著單次可掃描檢測的面積不同,光學放大距越大,則單次可掃描檢測的面積則越小。比如,上料容器501中放置的電路板為正面向上,通常對電路板正面的檢測精度要高於對電路板反面的檢測精度,在這樣的需求下,所述第一光學檢測裝置301的光學鏡頭的光學放大倍率大於與第二光學檢測裝置302的光學鏡頭的光學放大倍率,所述第一光學檢測裝置301的單次掃描檢測面積小於第二光學檢測裝置302的單次掃描檢測面積。
In one embodiment of the present invention, the optical lens of the first
對應地,本實施例提出了一種改進的結構,使設備達到
高檢測效率:第二工作臺2的數量為一個,第一工作臺1的數量為兩個且相鄰設置,即可以視為在圖3所示的第一工作臺1與翻轉機構之間多增加一個第一工作臺1,增加的該第一工作臺1上同樣設有第一載臺101、第一滑軌102、第一驅動裝置,但是新增的第一工作臺1可以為接近矩形狀,而無需設置為前窄後寬的結構。
Correspondingly, this embodiment proposes an improved structure, so that the device can achieve
High detection efficiency: the number of the
操作步驟S1和S4相應調整如下:步驟S1中所述第一抓取組件612輪流給兩個第一工作臺1的第一載臺101運輸電路板;步驟S4中所述第一抓取組件612輪流從兩個第一載臺101抓取電路板並將其運輸到可翻轉平臺402。
Operation steps S1 and S4 are correspondingly adjusted as follows: the first grabbing
多設置一個第一載臺101、第一滑軌102和第一驅動裝置,可以既確保對電路板其中一面更精密地檢測需求,又可以不會因為單次掃描檢測面積減小而降低外觀檢測效率,且電路板的運送程式簡單明瞭,不需要作出大的改變。
Setting up one more
本發明的光學外觀檢測設備採用在X軸橋架上懸掛兩個Z向的高精光學相機鏡頭組件,橋架下方設置兩條沿Y軸並行的工作臺,並在兩個工作臺之間設置翻轉機構、在兩個工作臺的外側分別設置上料容器和下料容器,以及設置兩組X軸傳送組件並使其抓取元件垂直懸掛於工作臺、翻轉機構、上料容器和下料容器的上方,結構排布高度集成化和集中化;流水化地完成兩個Y軸工作臺上物料分別正面及反面的檢測,緊密佈局的設備主體在X軸、Y軸向驅動採用線性馬達配合高精直線導軌作為驅動主體,
滿足了設備主體的運動高精度要求,也是平臺穩定性的保證,因此為高度精密化的光學元件提供了基礎保障。
The optical appearance inspection equipment of the present invention adopts two Z-direction high-precision optical camera lens assemblies suspended on the X-axis bridge, and two parallel workbenches along the Y-axis are arranged under the bridge, and a turning mechanism is arranged between the two
需要說明的是,在本文中,諸如第一和第二等之類的關係術語僅僅用來將一個實體或者操作與另一個實體或操作區分開來,而不一定要求或者暗示這些實體或操作之間存在任何這種實際的關係或者順序。而且,術語“包括”、“包含”或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者設備不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者設備所固有的要素。在沒有更多限制的情況下,由語句“包括一個……”限定的要素,並不排除在包括所述要素的過程、方法、物品或者設備中還存在另外的相同要素。 It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is a relationship between these entities or operations. There is no such actual relationship or order between them. Furthermore, the term "comprises", "comprises" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus comprising a set of elements includes not only those elements, but also includes elements not expressly listed. other elements of or also include elements inherent in such a process, method, article, or device. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.
以上所述僅是本申請的具體實施方式,應當指出,對於本技術領域的普通技術人員來說,在不脫離本申請原理的前提下,還可以做出若干改進和潤飾,這些改進和潤飾也應視為本申請的保護範圍。 The above description is only the specific implementation of the present application. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present application, some improvements and modifications can also be made. It should be regarded as the protection scope of this application.
1:第一工作臺 1: The first workbench
102:第一滑軌 102: The first slide rail
2:第二工作臺 2: The second workbench
202:第二滑軌 202: Second slide rail
3:橋架 3: Bridge
301:第一光學檢測裝置 301: the first optical detection device
302:第二光學檢測裝置 302: the second optical detection device
401:基準平臺 401: Benchmark Platform
402:可翻轉平臺 402: Reversible platform
501:上料容器 501: Feeding container
502:下料容器 502: Feed container
61:第一橫樑 61: First beam
611:第一傳送組件 611: The first transmission component
62:第二橫樑 62: Second beam
621:第二傳送元件 621: Second transmission element
7:電路板 7: Circuit board
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CN113740260A (en) * | 2021-08-31 | 2021-12-03 | 苏州天准科技股份有限公司 | Optical detection device, imaging method and intelligent double-sided detection system |
CN113751341A (en) * | 2021-08-31 | 2021-12-07 | 苏州天准科技股份有限公司 | Intelligent detection equipment and method for circuit board, storage medium and terminal |
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CN111570325A (en) * | 2020-06-11 | 2020-08-25 | 苏州健雄职业技术学院 | Circuit board double-side detection equipment based on artificial intelligence and working method thereof |
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CN113740260A (en) * | 2021-08-31 | 2021-12-03 | 苏州天准科技股份有限公司 | Optical detection device, imaging method and intelligent double-sided detection system |
CN113751341A (en) * | 2021-08-31 | 2021-12-07 | 苏州天准科技股份有限公司 | Intelligent detection equipment and method for circuit board, storage medium and terminal |
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