TW202328668A - Equipment for optical appearance inspection and method for appearance inspection - Google Patents

Equipment for optical appearance inspection and method for appearance inspection Download PDF

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TW202328668A
TW202328668A TW111111995A TW111111995A TW202328668A TW 202328668 A TW202328668 A TW 202328668A TW 111111995 A TW111111995 A TW 111111995A TW 111111995 A TW111111995 A TW 111111995A TW 202328668 A TW202328668 A TW 202328668A
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optical
workbench
appearance inspection
grasping
container
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TW111111995A
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TWI802348B (en
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郭勇祥
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大陸商蘇州康代智能科技股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined

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  • Textile Engineering (AREA)
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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
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  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

The present disclosure provides an equipment for optical appearance inspection and method for appearance inspection, wherein the equipment adopts two Z-direction high-precision optical camera lens components suspended on an X-axis bridge, and two workbenches parallel along the Y-axis are arranged under the bridge; a flip mechanism is provided between the two workbenches, and a loading container and an unloading container are respectively arranged on the outsides of the two workbenches; and two sets of X-axis transmission components are set up, and the grabbing assemblies thereof hang vertically above the workbenches, the flip mechanism, the loading container and the unloading container, and the structural arrangement is highly integrated and centralized thereby; the detection of the front and back of the materials on the two Y-axis workbenches is completed in a streamlined manner, and the closely arranged main body of the equipment adopts linear motor and high-precision linear guide as a driving body on the driving direction of the X-axis and Y-axis, which meets the high-precision requirements of the movement of the main body, and also ensures the stability of the platform, so it provides a basic guarantee for highly sophisticated optical components.

Description

光學外觀檢測設備及外觀檢測方法Optical appearance inspection equipment and appearance inspection method

本發明涉及電路板光學檢測領域,尤其涉及一種光學外觀檢測設備及外觀檢測方法。The invention relates to the field of optical inspection of circuit boards, in particular to an optical appearance inspection device and an appearance inspection method.

隨著光電子、通信電子、電腦、機械、材料等行業的飛速發展,IC載板也得到了迅速的發展,在現代電子及通信產品中,IC載板及PCB電路板幾乎隨處可見,小到一個晶片,大到超大集成PCB,IC載板及PCB板是現在以及未來電子行業中的支柱產業。由於IC載板行業的迅速發展,IC線路板的產品工藝也得到了巨大的提高,產品多為高集成、超精細線路,因此客戶對產品的品質也提出了更高的要求,縱觀IC載板的整個生產工藝制程,無論是內層佈局還是壓合外層線路以及表面處理成型,運用自動光學檢測都是必不可少的重要步驟。With the rapid development of optoelectronics, communication electronics, computers, machinery, materials and other industries, IC substrates have also developed rapidly. In modern electronics and communication products, IC substrates and PCB circuit boards can be seen almost everywhere, as small as one Chips, large to ultra-large integrated PCBs, IC substrates and PCB boards are the pillar industries in the current and future electronics industry. Due to the rapid development of the IC substrate industry, the product technology of IC circuit boards has also been greatly improved. Most of the products are highly integrated and ultra-fine lines, so customers have also put forward higher requirements for product quality. The entire production process of the board, whether it is the inner layer layout, the lamination of the outer layer circuit and the surface treatment molding, the use of automatic optical inspection is an essential and important step.

但是,目前市場上的自動光學外觀檢測設備普遍存在檢測精度低以及效率低等問題,已經無法滿足高端IC載板廠商要求的檢測需求,IC載板廠商急需一款高精高效、實用穩定的自動光學外觀檢測設備,因此研發一款高性能高效率的自動光學外觀檢測設備已經構成迫在眉睫的需求。However, the automatic optical appearance inspection equipment currently on the market generally has problems such as low detection accuracy and low efficiency, and has been unable to meet the inspection needs of high-end IC substrate manufacturers. Optical appearance inspection equipment, so the development of a high-performance and high-efficiency automatic optical appearance inspection equipment has constituted an imminent demand.

本發明的目的是提供一種著重運用於IC載板/電路板表面處理成型工序後的外觀檢測的光學外觀檢測設備及外觀檢測方法,設備機械穩定度高,提高檢測精度,並提高檢測效率,滿足高端PCB-IC載板生產廠商的要求。The object of the present invention is to provide a kind of optical appearance inspection equipment and appearance inspection method which are mainly applied to the appearance inspection after the surface treatment and molding process of IC carrier board/circuit board. The mechanical stability of the equipment is high, the detection accuracy is improved, and the detection efficiency is improved. The requirements of high-end PCB-IC carrier board manufacturers.

為達到上述目的,本發明採用的技術方案如下:In order to achieve the above object, the technical scheme adopted in the present invention is as follows:

一種光學外觀檢測設備,包括:An optical appearance inspection device, comprising:

左右並排且間隔設置的第一工作臺和第二工作臺,所述第一工作臺包括第一載臺、沿著前後方向設置的第一滑軌、被配置為驅動第一載臺沿著第一滑軌移動的第一驅動裝置,所述第二工作臺包括第二載臺、沿著前後方向設置的第二滑軌、被配置為驅動第二載臺沿著第二滑軌移動的第二驅動裝置;A first workbench and a second workbench arranged side by side and at intervals, the first workbench includes a first carrier, a first slide rail arranged along the front-to-back direction, and is configured to drive the first carrier along the first A first driving device for sliding rail movement, the second worktable includes a second carrier, a second sliding rail arranged along the front-to-back direction, and a first driving device configured to drive the second carrier to move along the second sliding rail Two driving devices;

橋架,其沿左右方向架設在所述第一滑軌和第二滑軌的上方,所述橋架上設有可移動的第一光學檢測裝置和第二光學檢測裝置,所述第一光學檢測裝置被配置為在第一滑軌的後部上方左右往復移動,所述第二光學檢測裝置被配置為在第二滑軌的後部上方左右往復移動;A bridge, which is erected above the first slide rail and the second slide rail along the left and right direction, the bridge is provided with a movable first optical detection device and a second optical detection device, and the first optical detection device configured to reciprocate left and right above the rear of the first slide rail, and the second optical detection device is configured to reciprocate left and right above the rear of the second slide rail;

翻轉機構,其設置在第一工作臺與第二工作臺之間,所述翻轉機構包括基準平臺、可翻轉平臺及第三驅動裝置,所述基準平臺與可翻轉平臺鉸接,所述第三驅動裝置被配置為驅動所述可翻轉平臺相對於基準平臺發生翻轉;Turnover mechanism, which is arranged between the first workbench and the second workbench, the turnover mechanism includes a reference platform, a turntable platform and a third driving device, the benchmark platform is hinged to the turntable platform, and the third drive The device is configured to drive the invertible platform to invert relative to the reference platform;

上料容器和下料容器,其中,所述上料容器設置在所述第一工作臺的外側,所述下料容器設置在所述第二工作臺的外側,所述上料容器被配置為放置待檢測的物料,所述下料容器被配置為放置完成檢測的物料,該物料為電路板或IC載板;A feeding container and a feeding container, wherein the feeding container is arranged outside the first workbench, the unloading container is arranged outside the second workbench, and the feeding container is configured as Place the material to be tested, and the unloading container is configured to place the material that has been tested, and the material is a circuit board or an IC carrier;

傳送機構,被配置為對所述物料進行傳送,其包括沿左右方向設置的橫樑、設置在橫樑上的第一傳送元件和第一抓取元件、第二傳送元件和第二抓取元件;其中,所述第一傳送元件被配置為帶動第一抓取組件沿著橫樑在第一工作臺和上料容器的上方左右移動,所述第二傳送元件被配置為帶動第二抓取元件沿著橫樑在第二工作臺和下料容器的上方左右移動,且所述第一抓取元件和第二抓取元件均被配置為抓取物料。The conveying mechanism is configured to convey the material, which includes a beam arranged along the left and right directions, a first conveying element and a first grasping element arranged on the crossbeam, a second conveying element and a second grasping element; wherein , the first conveying element is configured to drive the first grabbing component to move left and right along the beam above the first workbench and the feeding container, and the second conveying element is configured to drive the second grabbing element along the The beam moves left and right above the second workbench and the unloading container, and the first grabbing element and the second grabbing element are both configured to grab materials.

進一步地,所述第一工作臺上至少前部外側相對於其後部呈收窄結構,所述第二工作臺上至少前部外側相對於其後部呈收窄結構,所述上料容器靠近所述第一工作臺的前部外側,所述下料容器靠近所述第二工作臺的前部外側。前窄為位於設備主體前部的自動化模組提供所需的位置,後寬則滿足大跨度橋架需要架設兩個光學檢測裝置的所需。Further, at least the outside of the front part of the first workbench has a narrowed structure relative to its rear part, and at least the outside of the front part of the second workbench has a narrow structure relative to its rear part, and the feeding container is close to the The outer front part of the first workbench, and the unloading container is close to the outer front part of the second workbench. The narrow front provides the required location for the automation module located at the front of the equipment body, and the wide rear meets the needs of two optical detection devices for the long-span bridge.

進一步地,所述第一工作臺、第二工作臺、翻轉機構、上料容器和下料容器設置在方形基臺上,所述方形基臺採用鑄鐵件打造而成,提高了設備主體平臺的機械穩定性;Further, the first workbench, the second workbench, the turning mechanism, the loading container and the unloading container are arranged on a square base platform, and the square base platform is made of cast iron, which improves the stability of the main platform of the equipment. mechanical stability;

所述橋架具有兩個橋樁以及架在兩個橋樁上的水準橋杆,所述水準橋杆左端的橋樁設置在所述第一工作臺的後部,所述水準橋杆右端的橋樁設置在所述第二工作臺的後部;The bridge frame has two bridge piles and a horizontal bridge rod mounted on the two bridge piles. The bridge pile at the left end of the horizontal bridge rod is arranged at the rear of the first workbench, and the bridge pile at the right end of the horizontal bridge rod is arranged at the rear of the second workbench;

所述傳送機構的橫樑的一外端架設在所述方形基臺上靠近上料容器的區域,另一外端架設在所述方形基臺上靠近下料容器的區域。One outer end of the beam of the conveying mechanism is erected on the square base platform near the loading container, and the other outer end is erected on the square base platform near the unloading container area.

進一步地,所述第一光學檢測裝置與第二光學檢測裝置被配置為各自搭配不同的光學鏡頭,以滿足特定的電路板具有正反面不同的檢測精度的需求。Further, the first optical detection device and the second optical detection device are configured to be equipped with different optical lenses, so as to meet the requirement that a specific circuit board has different detection accuracy on the front and back sides.

進一步地,所述第一光學檢測裝置的光學鏡頭的光學放大倍率大於與第二光學檢測裝置的光學鏡頭的光學放大倍率,所述第一光學檢測裝置的單次掃描檢測面積小於第二光學檢測裝置的單次掃描檢測面積;Further, the optical magnification of the optical lens of the first optical detection device is greater than the optical magnification of the optical lens of the second optical detection device, and the detection area of a single scan of the first optical detection device is smaller than that of the second optical detection device. The detection area of a single scan of the device;

所述第二工作臺的數量為一個,所述第一工作臺的數量為兩個且相鄰設置,這樣既可以滿足對電路板其中一面的高精度檢測的需求,又不會因為單次掃描檢測面積變小而影響整體電路板正反面的檢測效率。The number of the second workbench is one, and the number of the first workbench is two and arranged adjacent to each other, so that the requirement for high-precision detection on one side of the circuit board can be met, and it will not be caused by a single scan. The detection area becomes smaller and affects the detection efficiency of the front and back sides of the overall circuit board.

進一步地,所述第一抓取元件包括第一抓取部和第二抓取部,所述第一抓取部被配置為在所述上料容器與第一載臺之間移動,所述第二抓取部被配置為在所述第一載臺與可翻轉平臺之間移動;第一抓取部在將電路板放置在第一載臺上之後,可以返回上料容器抓取下一片電路板,而在第二抓取部從第一載臺上抓取第一片電路板後,可以將第一抓取部抓取的下一片電路板放置在第一載臺上,之後/同時第二抓取部將抓取的第一片電路板放置在可翻轉平臺上。Further, the first grabbing element includes a first grabbing part and a second grabbing part, the first grabbing part is configured to move between the loading container and the first carrier, the The second grabbing part is configured to move between the first carrier and the reversible platform; after the first grabbing part places the circuit board on the first carrier, it can return to the loading container to grab the next piece circuit board, and after the second grabbing part grabs the first circuit board from the first carrier, the next circuit board grabbed by the first grabbing part can be placed on the first carrier, and then/simultaneously The second grasping part places the grasped first circuit board on the reversible platform.

所述第二抓取元件包括第三抓取部和第四抓取部,所述第三抓取部被配置為在所述基準平臺與第二載臺之間移動,所述第四抓取部被配置為在所述第二載臺與下料容器之間移動;同上,第三抓取部在將電路板放置在第二載臺上之後,可以返回基準平臺抓取下一片電路板,而在第四抓取部從第二載臺上抓取第一片電路板後,可以將第三抓取部抓取的下一片電路板放置在第二載臺上,之後/同時第四抓取部將抓取的第一片電路板放置在可翻轉平臺上。The second grasping element includes a third grasping part and a fourth grasping part, the third grasping part is configured to move between the reference platform and the second stage, and the fourth grasping part The part is configured to move between the second carrier and the blanking container; as above, after the third grabbing part places the circuit board on the second carrier, it can return to the reference platform to grab the next circuit board, And after the fourth grabbing part grabs the first circuit board from the second carrier, the next circuit board grabbed by the third grabbing part can be placed on the second carrier, and then/simultaneously the fourth grabbing The picking part places the first picked circuit board on the reversible platform.

進一步地,所述第一抓取組件的抓手上設有吸盤,所述吸盤在所述抓手上的左右位置和/或前後位置可調。Further, the gripper of the first grabbing component is provided with a suction cup, and the left-right position and/or front-back position of the suction cup on the gripper is adjustable.

進一步地,所述光學外觀檢測設備還包括傳感裝置,其設置在所述上料容器的上方,其被配置為識別上料容器中最上一層為物料或間隔紙;和/或,所述上料容器的數量為兩個且相互並排設置。Further, the optical appearance detection device also includes a sensing device, which is arranged above the feeding container, and is configured to identify that the uppermost layer in the feeding container is material or spacer paper; and/or, the upper The quantity of material container is two and mutually arranged side by side.

進一步地,所述上料容器被配置為能夠沿著抽屜軌道向前移出,所述下料容器的數量為多個。Further, the loading container is configured to be able to move forward along the drawer rail, and there are multiple unloading containers.

進一步地,所述第一驅動裝置、第二驅動裝置、第一傳送元件和第二傳送元件均採用配合開放式編碼器光柵尺的線性馬達;Further, the first driving device, the second driving device, the first conveying element and the second conveying element all adopt linear motors matched with an open encoder grating scale;

所述第一工作臺、第二工作臺和橋架均採用鑄鐵件打造而成。The first workbench, the second workbench and the bridge frame are all made of cast iron.

另一方面,本發明提供了一種基於上述光學外觀檢測設備的外觀檢測方法,在所述光學外觀檢測設備的主控模組的控制下,所述光學外觀檢測設備執行以下步驟:In another aspect, the present invention provides an appearance inspection method based on the above-mentioned optical appearance inspection equipment, under the control of the main control module of the optical appearance inspection equipment, the optical appearance inspection equipment performs the following steps:

S1、在光學外觀檢測設備的第一傳送元件的傳送作用下,第一抓取組件抓取上料容器中的物料,並將該物料運輸至第一工作臺的第一載臺上;S1. Under the transmission action of the first transmission element of the optical appearance inspection device, the first grabbing component grabs the material in the feeding container, and transports the material to the first carrier of the first workbench;

S2、在第一驅動裝置的驅動作用下,所述第一載臺沿著第一滑軌向後移動,以使第一光學檢測裝置對第一載臺上的物料進行掃描檢測;S2. Under the driving action of the first driving device, the first stage moves backward along the first slide rail, so that the first optical detection device scans and detects the materials on the first stage;

S3、待完成掃描檢測後,所述第一載臺沿著第一滑軌向前移動;S3. After the scanning detection is completed, the first carrier moves forward along the first slide rail;

S4、所述第一抓取組件抓取第一載臺上的物料,並將其運輸到翻轉機構的可翻轉平臺;S4. The first grabbing component grabs the material on the first carrier, and transports it to the reversible platform of the reversing mechanism;

S5、在第三驅動裝置的驅動作用下,所述可翻轉平臺帶動該物料向基準平臺翻轉,以使物料背面朝上地放置在所述基準平臺上;S5. Under the driving action of the third driving device, the reversible platform drives the material to turn over to the reference platform, so that the material is placed on the reference platform with its back facing upward;

S6、在第二傳送元件的傳送作用下,第二抓取元件抓取所述基準平臺上的物料,並將其運輸至第二工作臺的第二載臺上;S6. Under the transmission action of the second transmission element, the second grabbing element grabs the material on the reference platform and transports it to the second carrier of the second workbench;

S7、在第二驅動裝置的驅動作用下,所述第二載臺沿著第二滑軌向後移動,以使第二光學檢測裝置對第二載臺上的物料進行掃描檢測;S7. Under the driving action of the second driving device, the second stage moves backward along the second slide rail, so that the second optical detection device scans and detects the materials on the second stage;

S8、待完成掃描檢測後,所述第二載臺沿著第二滑軌向前移動;S8. After the scanning detection is completed, the second stage moves forward along the second slide rail;

S9、所述第二抓取元件抓取第二載臺上的物料,並將其運輸到下料容器。S9. The second grabbing element grabs the material on the second carrier and transports it to the unloading container.

進一步地,在執行步驟S5之後,在執行S6-S9的同時,所述第一傳送元件、第一抓取元件、第一驅動裝置、第一光學檢測裝置、第三驅動裝置重複執行步驟S1-S5;Further, after executing step S5, while executing steps S6-S9, the first conveying element, the first grasping element, the first driving device, the first optical detection device, and the third driving device repeatedly execute steps S1- S5;

在執行步驟S9之後,所述第二傳送元件、第二抓取元件、第二驅動裝置、第二光學檢測裝置重複執行步驟S6-S9。After step S9 is executed, the second conveying element, the second grasping element, the second driving device, and the second optical detection device repeatedly execute steps S6-S9.

進一步地,所述第一抓取元件包括第一抓取部和第二抓取部,所述第二抓取元件包括第三抓取部和第四抓取部;Further, the first grabbing element includes a first grabbing part and a second grabbing part, and the second grabbing element includes a third grabbing part and a fourth grabbing part;

步驟S1中由第一抓取部抓取物料,步驟S4中由第二抓取部抓取物料;步驟S6中由第三抓取部抓取物料,步驟S9中由第四抓取部抓取物料。In step S1, the material is grasped by the first grasping part, in step S4, the material is grasped by the second grasping part; in step S6, the material is grasped by the third grasping part, and in step S9, the material is grasped by the fourth grasping part materials.

進一步地,所述第一抓取部與第二抓取部獨立動作,所述第三抓取部與第四抓取部獨立動作;Further, the first grasping part and the second grasping part act independently, and the third grasping part and the fourth grasping part act independently;

在執行步驟S1之後,在執行S2-S4的同時,所述第一抓取部重複執行步驟S1;After performing step S1, while performing S2-S4, the first grasping part repeatedly performs step S1;

在執行步驟S4之後,在執行S5-S6的同時,所述第二抓取部重複執行步驟S4;After performing step S4, while performing steps S5-S6, the second grasping part repeatedly performs step S4;

在執行步驟S6之後,在執行S7-S9的同時,所述第三抓取部重複執行步驟S6;After performing step S6, while performing steps S7-S9, the third grasping part repeatedly performs step S6;

在執行步驟S9之後,所述第四抓取部重複執行步驟S7-S9。After step S9 is executed, the fourth grasping part repeatedly executes steps S7-S9.

進一步地,所述上料容器的上方還設有傳感裝置,所述傳感裝置與所述主控模組的輸入端電連接,所述傳感裝置被配置為識別上料容器中最上一層為物料或間隔紙;Further, a sensing device is provided above the feeding container, the sensing device is electrically connected to the input end of the main control module, and the sensing device is configured to identify the uppermost layer in the feeding container For material or spacer paper;

步驟S1進一步包括:若所述傳感裝置的識別結果為上料容器中最上一層為間隔紙,則所述第一抓取組件抓取該間隔紙並將其運輸至間隔紙收集區域;若所述傳感裝置的識別結果為上料容器中最上一層為物料,則所述第一抓取組件抓取該物料並將其運輸至第一載臺。Step S1 further includes: if the identification result of the sensing device is that the uppermost layer in the feeding container is spacer paper, then the first grabbing component grabs the spacer paper and transports it to the spacer paper collection area; if the If the recognition result of the sensing device is that the uppermost layer in the feeding container is material, the first grabbing component grabs the material and transports it to the first carrier.

進一步地,所述第一光學檢測裝置的光學鏡頭的光學放大倍率大於與第二光學檢測裝置的光學鏡頭的光學放大倍率,所述第一光學檢測裝置的單次掃描檢測面積小於第二光學檢測裝置的單次掃描檢測面積;所述第二工作臺的數量為一個,所述第一工作臺的數量為兩個且相鄰設置;Further, the optical magnification of the optical lens of the first optical detection device is greater than the optical magnification of the optical lens of the second optical detection device, and the detection area of a single scan of the first optical detection device is smaller than that of the second optical detection device. The single-scan detection area of the device; the number of the second workbench is one, and the number of the first workbench is two and arranged adjacently;

步驟S1中所述第一抓取組件輪流給兩個第一工作臺的第一載臺運輸物料;The first grabbing assembly described in step S1 transports materials to the first carrier of the two first workbenches in turn;

步驟S4中所述第一抓取組件輪流從兩個第一載臺抓取物料並將其運輸到可翻轉平臺。In step S4, the first grabbing assembly grabs materials from the two first carriers in turn and transports them to the reversible platform.

本發明提供的技術方案帶來的有益效果如下:The beneficial effects brought by the technical solution provided by the invention are as follows:

a.設備主體的平臺採用1X2Z+2Y創新樣式,實現高度集成化和高度集中化的結構排布;a. The platform of the main body of the equipment adopts the 1X2Z+2Y innovative style to achieve a highly integrated and highly centralized structural arrangement;

b.流水式完成兩條Y向工作臺上物料的正面及反面的檢測,提高雙面檢測的自動化程度以及各自配置光學檢測精度的靈活性。b. The detection of the front and back of the material on the two Y-direction worktables is completed in a flow-through manner, which improves the automation of double-sided detection and the flexibility of configuring optical detection accuracy.

為了使本技術領域的人員更好地理解本發明方案,下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例僅僅是本發明一部分的實施例,而不是全部的實施例。基於本發明中的實施例,本領域普通技術人員在沒有做出創造性勞動前提下所獲得的所有其他實施例,都應當屬於本發明保護的範圍。In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

需要說明的是,本發明的說明書和申請專利範圍及上述附圖中的術語“第一”、“第二”等是用於區別類似的物件,而不必用於描述特定的順序或先後次序。應該理解這樣使用的資料在適當情況下可以互換,以便這裡描述的本發明的實施例能夠以除了在這裡圖示或描述的那些以外的順序實施。此外,術語“包括”和“具有”以及他們的任何變形,意圖在於覆蓋不排他的包含,例如,包含了一系列步驟或單元的過程、方法、裝置、產品或設備不必限於清楚地列出的那些步驟或單元,而是可包括沒有清楚地列出的或對於這些過程、方法、產品或設備固有的其他步驟或單元。It should be noted that the terms "first" and "second" in the specification and scope of claims of the present invention and the above drawings are used to distinguish similar items, but not necessarily used to describe a specific order or sequence. It is to be understood that the materials so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein can be practiced in sequences other than those illustrated or described herein. Furthermore, the terms "comprising" and "having", as well as any variations thereof, are intended to cover a non-exclusive inclusion, for example, a process, method, means, product or equipment comprising a series of steps or elements need not be limited to the expressly listed instead, may include other steps or elements not explicitly listed or inherent to the process, method, product or apparatus.

在本發明的一個實施例中,提供了一種光學外觀檢測設備,設備主體集成有自動化智慧控制模組,可實現上料、翻轉、下料、分類等智慧化流水式操作,作為設備高效率的必備條件,參見圖1-圖7,其中,圖1所示的光學外觀檢測設備可以分解為圖3所示的設備和圖5所示的設備。In one embodiment of the present invention, an optical appearance inspection device is provided. The main body of the device is integrated with an automatic intelligent control module, which can realize intelligent flow-type operations such as loading, turning, unloading, and classification. For prerequisites, see Figures 1-7, wherein the optical appearance inspection equipment shown in Figure 1 can be decomposed into the equipment shown in Figure 3 and the equipment shown in Figure 5.

具體地,所示光學外觀檢測設備包括:如圖3和圖4所示,左右並排且間隔設置的第一工作臺1和第二工作臺2,所述第一工作臺1包括第一載臺101、沿著前後方向設置的第一滑軌102、被配置為驅動第一載臺101沿著第一滑軌102移動的第一驅動裝置(未圖示),所述第二工作臺2包括第二載臺201、沿著前後方向設置的第二滑軌202、被配置為驅動第二載臺201沿著第二滑軌202移動的第二驅動裝置(未圖示);其中,第一工作臺1還配置有用於走線的第一拖鏈103,當第一驅動裝置驅動第一載臺101滑動時,第一拖鏈103隨著第一載臺101移動;同理,第二工作臺2還配置有用於走線的第二拖鏈203,當第二驅動裝置驅動第二載臺201滑動時,第二拖鏈203隨著第二載臺201移動。Specifically, the shown optical appearance inspection equipment includes: as shown in FIG. 3 and FIG. 4 , a first workbench 1 and a second workbench 2 arranged side by side and spaced apart, the first workbench 1 includes a first carrier 101. The first slide rail 102 arranged along the front-to-back direction, the first driving device (not shown) configured to drive the first stage 101 to move along the first slide rail 102, the second worktable 2 includes The second stage 201, the second slide rail 202 arranged along the front-rear direction, and the second driving device (not shown) configured to drive the second stage 201 to move along the second slide rail 202; wherein, the first The workbench 1 is also equipped with a first drag chain 103 for wiring. When the first driving device drives the first carrier 101 to slide, the first drag chain 103 moves with the first carrier 101; similarly, the second work The platform 2 is also equipped with a second drag chain 203 for wiring. When the second driving device drives the second carrier 201 to slide, the second drag chain 203 moves with the second carrier 201 .

橋架3,其沿左右方向架設在所述第一滑軌102和第二滑軌202的上方,如圖3所示,所述橋架3上設有可移動的第一光學檢測裝置301和第二光學檢測裝置302,所述第一光學檢測裝置301被配置為在第一滑軌102的後部上方左右往復移動,所述第二光學檢測裝置302被配置為在第二滑軌202的後部上方左右往復移動,第一光學檢測裝置301和第二光學檢測裝置302還需要上下移動以調節與待檢測的電路板之間的距離;相應地,橋架3還配置有用於走線的第一X向拖鏈311、第二X向拖鏈312、第一Z向拖鏈321和第二Z向拖鏈322,當第一光學檢測裝置301左右移動時,第一X向拖鏈311隨著第一光學檢測裝置301移動,當第二光學檢測裝置302左右移動時,第二X向拖鏈312隨著第二光學檢測裝置302移動,當第一光學檢測裝置301上下移動時,第一Z向拖鏈321隨著第一光學檢測裝置301移動,當第二光學檢測裝置302上下移動時,第二Z向拖鏈322隨著第二光學檢測裝置302移動。顯然,第一光學檢測裝置301、第二光學檢測裝置302左右移動的行程範圍均應當覆蓋待測電路板在X軸方向上的長度,當待檢測的電路板被放置在第一載臺101上時,其沿Y軸方向進入到第一光學檢測裝置301的行程範圍內,由第一光學檢測裝置301完成檢測掃描後,再退回到初始的上料位置;當待檢測的電路板被放置在第二載臺201上時,其沿Y軸方向進入到第二光學檢測裝置302的行程範圍內,由第二光學檢測裝置302完成檢測掃描後,再退回到初始的上料位置。Bridge 3, which is erected above the first slide rail 102 and the second slide rail 202 along the left and right direction, as shown in Figure 3, the bridge 3 is provided with a movable first optical detection device 301 and a second Optical detection device 302, the first optical detection device 301 is configured to reciprocate left and right above the rear portion of the first slide rail 102, and the second optical detection device 302 is configured to move left and right above the rear portion of the second slide rail 202 Moving back and forth, the first optical detection device 301 and the second optical detection device 302 also need to move up and down to adjust the distance between the circuit board to be detected; chain 311, the second X-direction drag chain 312, the first Z-direction drag chain 321 and the second Z-direction drag chain 322, when the first optical detection device 301 moves left and right, the first X-direction drag chain 311 follows the first optical The detection device 301 moves. When the second optical detection device 302 moves left and right, the second X-direction drag chain 312 moves with the second optical detection device 302. When the first optical detection device 301 moves up and down, the first Z-direction drag chain 321 moves with the first optical detection device 301 , and when the second optical detection device 302 moves up and down, the second Z-direction drag chain 322 moves with the second optical detection device 302 . Obviously, the travel ranges of the first optical detection device 301 and the second optical detection device 302 moving left and right should cover the length of the circuit board to be tested in the X-axis direction. When the circuit board to be tested is placed on the first stage 101 , it enters the stroke range of the first optical detection device 301 along the Y axis direction, and after the first optical detection device 301 completes the detection scan, it returns to the initial loading position; when the circuit board to be detected is placed on When the second stage 201 is on, it enters the travel range of the second optical detection device 302 along the Y-axis direction, and returns to the initial loading position after the second optical detection device 302 completes the detection scan.

翻轉機構,其設置在第一工作臺1與第二工作臺2之間,如圖3和圖4所示,所述翻轉機構包括基準平臺401、可翻轉平臺402及第三驅動裝置(未圖示),所述基準平臺401與可翻轉平臺402鉸接,所述第三驅動裝置被配置為驅動所述可翻轉平臺402相對於基準平臺401發生翻轉,在本實施例中,可翻轉平臺402上還設有抽真空氣孔,當電路板放置在可翻轉平臺402上後,抽吸真空以使電路板在接下來翻轉的過程中始終貼合可翻轉平臺402而不會掉落,待電路板翻轉接近或等於180°之後,停止抽吸真空,電路板即脫離可翻轉平臺402而到達基準平臺401;當然,也可以採用輔助壓板將電路板壓合在可翻轉平臺上來替換抽真空吸合的方式;關於翻轉機構,可通過引用的方式,將專利公告號為CN213209951U的實用新型全文併入本發明實施例。以放置在第一載臺101上的電路板為正面朝上為例,顯然,經過翻轉機構的翻轉,再放置在上述第二載臺201上的電路板為背面朝上。Turning mechanism, it is arranged between the first workbench 1 and the second workbench 2, as shown in Figure 3 and Figure 4, described turning mechanism comprises reference platform 401, reversible platform 402 and the 3rd driving device (not shown shown), the reference platform 401 is hinged to the reversible platform 402, and the third driving device is configured to drive the reversible platform 402 to flip relative to the reference platform 401. In this embodiment, the reversible platform 402 There is also a vacuum hole. When the circuit board is placed on the reversible platform 402, the vacuum is sucked so that the circuit board will always stick to the reversible platform 402 during the next overturning process without falling. After close to or equal to 180°, stop vacuuming, and the circuit board will break away from the reversible platform 402 and reach the reference platform 401; of course, the auxiliary pressure plate can also be used to press the circuit board on the reversible platform to replace the vacuum suction method ; Regarding the overturning mechanism, the utility model whose patent announcement number is CN213209951U can be incorporated into the embodiments of the present invention in its entirety by way of reference. Taking the circuit board placed on the first carrier 101 as an example with its front facing up, it is obvious that the circuit board placed on the second carrier 201 after being turned over by the turning mechanism is its back facing up.

上料容器501和下料容器502,參見圖1和圖2,所述上料容器501設置在所述第一工作臺1的外側,所述下料容器502設置在所述第二工作臺2的外側,所述上料容器501被配置為放置待檢測的電路板,所述下料容器502被配置為放置完成檢測的電路板;The loading container 501 and the unloading container 502, referring to Fig. 1 and Fig. 2, the described loading container 501 is arranged on the outside of the first workbench 1, and the described unloading container 502 is arranged on the second workbench 2 outside, the loading container 501 is configured to place the circuit board to be tested, and the unloading container 502 is configured to place the circuit board that has been tested;

傳送機構,被配置為對所述電路板進行傳送,參見圖5-圖7,傳送機構包括橫跨於主體設備基體前端、並與橋架3形成平行結構的橫樑,本實施例中傳送機構包括左右對接的第一橫樑61和第二橫樑62、設置在第一橫樑61上的第一傳送組件611和第一抓取元件612、設置在第二橫樑62上的第二傳送元件621和第二抓取元件622;其中,第一橫樑61和第二橫樑62的內端可以與豎立在兩者之間的中間支柱63固定連接,所述第一橫樑61架設在第一工作臺1和上料容器501的上方,所述第二橫樑62架設在第二工作臺2和下料容器502的上方;所述第一傳送元件611被配置為帶動第一抓取元件612沿著第一橫樑61移動,所述第二傳送元件621被配置為帶動第二抓取元件622沿著第二橫樑62移動,且所述第一抓取元件612和第二抓取元件622均被配置為抓取電路板。由於橫樑分段式的設計,使得第一橫樑61上的第一傳送元件611和第一抓取元件612與第二橫樑62上的第二傳送元件621和第二抓取元件622互不幹擾,以提高第一抓取元件612和第二抓取元件622的移動精度和抓取電路板的可靠性,尤其是可以避免自動化傳送運動時對光學元件精度的幹擾。The conveying mechanism is configured to convey the circuit board. Referring to FIGS. 5-7 , the conveying mechanism includes a crossbeam that spans the front end of the base of the main equipment and forms a parallel structure with the bridge frame 3. In this embodiment, the conveying mechanism includes left and right The butted first crossbeam 61 and the second crossbeam 62, the first conveying component 611 and the first grasping element 612 arranged on the first crossbeam 61, the second conveying element 621 and the second grasping element arranged on the second crossbeam 62 Take the element 622; wherein, the inner ends of the first crossbeam 61 and the second crossbeam 62 can be fixedly connected with the middle pillar 63 standing between the two, and the first crossbeam 61 is erected on the first workbench 1 and the feeding container 501, the second crossbeam 62 is erected above the second workbench 2 and the unloading container 502; the first conveying element 611 is configured to drive the first grabbing element 612 to move along the first crossbeam 61, The second conveying element 621 is configured to drive the second grabbing element 622 to move along the second beam 62 , and both the first grabbing element 612 and the second grabbing element 622 are configured to grab a circuit board. Due to the segmented design of the crossbeam, the first conveying element 611 and the first grasping element 612 on the first crossbeam 61 do not interfere with the second conveying element 621 and the second grasping element 622 on the second crossbeam 62, In order to improve the movement accuracy of the first grasping element 612 and the second grasping element 622 and the reliability of grasping the circuit board, in particular, the interference to the precision of the optical element during the automatic conveying movement can be avoided.

本發明的光學外觀檢測設備的平臺採用1X2Z+2Y的創新伺服驅動平臺樣式,即以橋架3的延伸方向為X軸,並懸掛了兩個驅動載體並各自配備了高精光學相機鏡頭元件(即第一光學檢測裝置和第二光學檢測裝置),以第一工作臺1和第二工作臺2的延伸方向為Y軸,在X軸向的橋架3上,橋架的底部有兩個與Y軸並行的工作臺,可分別流水式完成兩條Y向工作臺上物料的正面及反面的光學外觀檢測。The platform of the optical appearance testing equipment of the present invention adopts an innovative servo-driven platform style of 1X2Z+2Y, that is, the extension direction of the bridge 3 is the X axis, and two driving carriers are suspended and each is equipped with a high-precision optical camera lens element (ie The first optical detection device and the second optical detection device), with the extension direction of the first workbench 1 and the second workbench 2 as the Y axis, on the bridge 3 in the X axis, there are two bridges at the bottom of the bridge with the Y axis The parallel workbenches can complete the optical appearance inspection of the front and back of the materials on the two Y-direction workbenches in a flow-by-flow manner.

參見圖4,所述第一工作臺1上至少前部(前部加中部)外側相對於其後部呈收窄結構,所述第二工作臺2上至少前部外側相對於其後部呈收窄結構,使得收窄後的外側可以與其他部件緊密排布,前窄後寬的工作臺設計中,後寬滿足了大跨度X軸向的橋架3的所需,X軸橋架主體結構同樣採用鑄鐵件打造,本發明實施例採用長行程X橋架設計,目的在於使橋架3上可懸掛兩組獨立的光學元件,前窄則為位於設備主體前部的自動化模組以及上料容器501和下料容器502提供了所需的位置。具體如圖1所示,所述上料容器501靠近所述第一工作臺1的前部外側,所述下料容器502靠近所述第二工作臺2的前部外側,且所述第一橫樑61的外端架設在所述方形基臺上靠近上料容器501的區域,所述第二橫樑62的外端架設在所述方形基臺上靠近下料容器502的區域。參見圖2,基於第一工作臺1和第二工作臺2的前部收窄結構、後部未收窄結構,所述橋架3的兩個橋樁分別設置在第一工作臺1的後部以及第二工作臺2的後部,所述第一工作臺1、第二工作臺2、翻轉機構、上料容器501和下料容器502、傳送機構的佈局接近矩形或方形,且橋架3不會額外增加占地面積,結構緊湊,高度集成化的結構排布是本設備的優勢之一,其可設置在方形基臺上,所述方形基臺、第一工作臺1、第二工作臺2、橋架3均可以採用鑄鐵件打造而成;X、Y軸向的驅動採用線性馬達配合高精直線導軌作為驅動主體,從而在運動精度上、速度上都優於市場上的常見的伺服馬達配合絲杆性型的XY運動平臺,滿足了平臺運動高精度的要求與也是平臺穩定性的保證,同樣地,穩定又可靠的運動平臺主體也為高度精密化的光學元件提供了基礎保障。Referring to Fig. 4, at least the outside of the front part (the front plus the middle part) on the first workbench 1 is narrowed relative to its rear part, and at least the outside of the front part on the second workbench 2 is narrowed relative to its rear part The structure allows the narrowed outside to be closely arranged with other components. In the design of the workbench with narrow front and wide rear, the rear width meets the requirements of the large-span X-axis bridge frame 3. The main structure of the X-axis bridge frame is also made of cast iron. The embodiment of the present invention adopts a long-stroke X bridge design, the purpose is to allow two sets of independent optical elements to be suspended on the bridge 3, and the front narrow is the automatic module located at the front of the main body of the equipment, as well as the loading container 501 and the unloading Container 502 provides the required location. Specifically as shown in Figure 1, the loading container 501 is close to the front outside of the first workbench 1, the unloading container 502 is close to the front outside of the second workbench 2, and the first The outer end of the beam 61 is erected on the square base platform near the loading container 501 , and the outer end of the second beam 62 is erected on the square base platform near the unloading container 502 . Referring to Fig. 2, based on the front narrowing structure of the first workbench 1 and the second workbench 2, and the rear unnarrowed structure, the two bridge piles of the bridge frame 3 are respectively arranged at the rear of the first workbench 1 and the second workbench. The rear part of the second workbench 2, the layout of the first workbench 1, the second workbench 2, the turning mechanism, the feeding container 501 and the unloading container 502, and the conveying mechanism is close to a rectangle or a square, and the bridge frame 3 will not be additionally increased. Covering an area, compact structure, and highly integrated structural arrangement are one of the advantages of this equipment, which can be set on a square abutment, the square abutment, the first workbench 1, the second workbench 2, the bridge 3 can be made of cast iron; the X and Y axial drives use linear motors with high-precision linear guides as the main drive, so that they are superior to common servo motors in the market in terms of motion accuracy and speed. The unique XY motion platform meets the high-precision requirements of the platform movement and guarantees the stability of the platform. Similarly, the stable and reliable main body of the motion platform also provides a basic guarantee for highly sophisticated optical components.

佈局上,兩組自動化抓取模組架設於設備本體之上,與X軸向橋架平行,分別垂直架設於兩條Y軸的工作臺之上,兩組智慧化物料上料容器與三組物料下料容器分別分佈在兩條Y軸向工作臺的左右兩側,並與Y軸平行,自動翻轉平臺位於兩條Y軸工作臺中間,同樣平行於兩條Y軸,從而達到最合理化佈局設計,具體即:第一抓取組件612從上料容器501取料至Y軸的第一工作臺1上,並由Z軸的第一光學檢測裝置301掃描完成後再抓取至可翻轉平臺402以進行換面(翻轉後背面朝上),再由第二抓取元件622從翻轉機構的基準平臺401上取至Y軸的第二工作臺2上並由Z軸的第二光學檢測裝置302進行反面掃描,完成後由第二抓取元件622取走並放至下料容器,以此完成單片料(電路板,可以具體為IC載板)的正反雙面外觀檢測的流程。自動化智慧模組的高度集成是外觀檢測設備實現穩定的必要條件。In terms of layout, two sets of automatic grabbing modules are set up on the equipment body, parallel to the X-axis bridge, and vertically set up on the two Y-axis workbenches respectively. Two sets of intelligent material feeding containers and three sets of material The unloading containers are respectively distributed on the left and right sides of the two Y-axis worktables, parallel to the Y-axis, and the automatic turning platform is located in the middle of the two Y-axis worktables, which are also parallel to the two Y-axis, so as to achieve the most rational layout design , specifically: the first grabbing assembly 612 picks up material from the loading container 501 to the first workbench 1 on the Y axis, and after scanning by the first optical detection device 301 on the Z axis, grabs to the reversible platform 402 In order to change the side (the back side is up after turning over), the second grabbing element 622 is taken from the reference platform 401 of the turning mechanism to the second workbench 2 of the Y-axis, and the second optical detection device 302 of the Z-axis Carry out reverse side scanning, and after completion, take it away by the second grasping element 622 and put it into the unloading container, so as to complete the process of front and back double-sided appearance inspection of a single piece of material (circuit board, which can be specifically an IC carrier board). The high integration of automated intelligent modules is a necessary condition for the stability of appearance inspection equipment.

在本發明的一個實施例中,第一抓取元件612被配置為在所述上料容器與第一載臺101之間移動,以抓取上料容器501中待檢測的電路板並將其放置到第一載臺101;後在第一載臺101與可翻轉平臺402之間移動,以抓取第一載臺101上完成檢測的電路板並將其放置到可翻轉平臺402上;In one embodiment of the present invention, the first grasping element 612 is configured to move between the loading container and the first stage 101, so as to grab the circuit board to be detected in the loading container 501 and remove it. Placed on the first carrier 101; then move between the first carrier 101 and the reversible platform 402 to grab the circuit boards that have been detected on the first carrier 101 and place them on the reversible platform 402;

第二抓取元件622被配置為在所述基準平臺401與第二載臺201之間移動,以抓取基準平臺401上背面朝上的電路板並將其放置到第二載臺201;後在所述第二載臺201與下料容器502之間移動,以抓取第二載臺201上完成檢測的電路板並將其放置到下料容器502。具體參見圖5和圖6:The second grabbing element 622 is configured to move between the reference platform 401 and the second carrier 201, so as to grab the circuit board with the back side facing up on the reference platform 401 and place it on the second carrier 201; Move between the second carrier 201 and the unloading container 502 to grab the circuit boards that have been tested on the second carrier 201 and place them into the unloading container 502 . See Figure 5 and Figure 6 for details:

每組抓取元件具有2個抓取部,可在流程中被合理的分配使用,從而做到不間斷迴圈作業,具體到實際操控流程可以根據不同的客戶要求、不同的物料尺寸、不同的使用場景等變化出最合理化的流水式作業迴圈步驟。具體地,所述第一抓取元件612包括第一抓取部6121和第二抓取部6122,所述第一抓取部6121被配置為在所述上料容器501與第一載臺101之間移動,所述第二抓取部6122被配置為在所述第一載臺101與可翻轉平臺402之間移動;所述第二抓取元件622包括第三抓取部6221和第四抓取部6222,所述第三抓取部6221被配置為在所述基準平臺401與第二載臺201之間移動,所述第四抓取部6222被配置為在所述第二載臺201與下料容器502之間移動;Each group of grabbing components has 2 grabbing parts, which can be reasonably allocated and used in the process, so as to achieve uninterrupted loop operation. The actual control process can be based on different customer requirements, different material sizes, different The most rational flow-through operation cycle steps are obtained by changing the usage scenarios. Specifically, the first grabbing element 612 includes a first grabbing part 6121 and a second grabbing part 6122, and the first grabbing part 6121 is configured to connect between the loading container 501 and the first stage 101 The second gripping part 6122 is configured to move between the first stage 101 and the reversible platform 402; the second gripping element 622 includes a third gripping part 6221 and a fourth gripping part 6221 Grabbing part 6222, the third gripping part 6221 is configured to move between the reference platform 401 and the second carrier 201, and the fourth grabbing part 6222 is configured to move between the second carrier 201 and the blanking container 502 to move;

第一抓取部6121和第二抓取部6122、第三抓取部6221和第四抓取部6222還能夠向下移動以抓取電路板,在本實施例中,抓取部的抓手上設有吸盤6001,參見圖6和圖1,利用吸盤6001可以吸取電路板7,本實施例中,單個抓取部包括兩個平行的直線軸及多個可滑動套設在直線軸上的吸盤6001,但是本發明不限於吸盤抓取電路板的抓取方式,其他方式比如夾取方式同樣落入本發明要求保護的範圍。本實施例中,所述吸盤6001在所述抓取部的抓手上的左右位置和/或前後位置可調,以滿足用戶端不同產品的尺寸需求。The first grabbing part 6121 and the second grabbing part 6122, the third grabbing part 6221 and the fourth grabbing part 6222 can also move downwards to grab the circuit board. In this embodiment, the gripper of the grabbing part There is a suction cup 6001 on it, see Figure 6 and Figure 1, the circuit board 7 can be picked up by the suction cup 6001, in this embodiment, a single grasping part includes two parallel linear shafts and a plurality of slidably sleeved on the linear shafts Suction cup 6001, but the present invention is not limited to the grasping method of the suction cup grabbing the circuit board, and other methods such as clamping methods also fall within the protection scope of the present invention. In this embodiment, the left and right positions and/or front and rear positions of the suction cup 6001 on the gripper of the gripping part can be adjusted to meet the size requirements of different products at the user end.

對應上述實施例中的光學外觀檢測設備,其具有主控模組,用於控制各個驅動機構,具體工作過程如下:Corresponding to the optical appearance inspection equipment in the above embodiments, it has a main control module for controlling each driving mechanism, and the specific working process is as follows:

S1、在光學外觀檢測設備的第一傳送元件611的傳送作用下,第一抓取元件612抓取上料容器501中的電路板,並將該電路板運輸至第一工作臺1的第一載臺101上;S1. Under the action of the first conveying element 611 of the optical appearance inspection equipment, the first grabbing element 612 grabs the circuit board in the feeding container 501, and transports the circuit board to the first stage of the first workbench 1. On the stage 101;

S2、在第一驅動裝置的驅動作用下,所述第一載臺101沿著第一滑軌102向後移動,以使第一光學檢測裝置301對第一載臺101上的電路板進行掃描檢測;S2. Under the driving action of the first driving device, the first stage 101 moves backward along the first sliding rail 102, so that the first optical detection device 301 scans and detects the circuit board on the first stage 101 ;

S3、待完成掃描檢測後,所述第一載臺101沿著第一滑軌102向前移動;S3. After the scanning detection is completed, the first stage 101 moves forward along the first slide rail 102;

S4、所述第一抓取元件612抓取第一載臺101上的電路板,並將其運輸到翻轉機構的可翻轉平臺402;S4. The first grabbing element 612 grabs the circuit board on the first carrier 101, and transports it to the reversible platform 402 of the reversing mechanism;

S5、在第三驅動裝置的驅動作用下,所述可翻轉平臺402帶動該電路板向基準平臺401翻轉,以使電路板背面朝上地放置在所述基準平臺401上;S5. Under the driving action of the third driving device, the reversible platform 402 drives the circuit board to turn over to the reference platform 401, so that the circuit board is placed on the reference platform 401 with its back facing upward;

S6、在第二傳送元件621的傳送作用下,第二抓取元件622抓取所述基準平臺401上的電路板,並將其運輸至第二工作臺2的第二載臺201上;S6. Under the action of the second conveying element 621, the second grabbing element 622 grabs the circuit board on the reference platform 401, and transports it to the second carrier 201 of the second workbench 2;

S7、在第二驅動裝置的驅動作用下,所述第二載臺201沿著第二滑軌202向後移動,以使第二光學檢測裝置302對第二載臺201上的電路板進行掃描檢測;S7. Under the driving action of the second driving device, the second stage 201 moves backward along the second slide rail 202, so that the second optical detection device 302 scans and detects the circuit board on the second stage 201 ;

S8、待完成掃描檢測後,所述第二載臺201沿著第二滑軌202向前移動;S8. After the scanning detection is completed, the second stage 201 moves forward along the second sliding rail 202;

S9、所述第二抓取元件622抓取第二載臺201上的電路板,並將其運輸到下料容器502。S9. The second grabbing element 622 grabs the circuit board on the second carrier 201 and transports it to the unloading container 502 .

以上為單片電路板從收容於上料容器501,至其完成正反面外觀檢測、直至被收集到下料容器的流程。The above is the flow of the single-chip circuit board from being stored in the loading container 501 to completing the front and back appearance inspection, and finally being collected into the unloading container.

由於左右分別設置兩套工作臺、光學檢測裝置、傳送元件和抓取元件,因此,其可以提高外觀檢測效率,體現在:Since two sets of workbenches, optical detection devices, conveying components and grabbing components are respectively set up on the left and right, it can improve the efficiency of appearance detection, which is reflected in:

在執行步驟S5之後,在執行S6-S9的同時,所述第一傳送元件611、第一抓取元件612、第一驅動裝置、第一光學檢測裝置301、第三驅動裝置重複執行步驟S1-S5;After executing step S5, while executing S6-S9, the first conveying element 611, the first gripping element 612, the first driving device, the first optical detection device 301, and the third driving device repeatedly execute steps S1- S5;

在執行步驟S9之後,所述第二傳送元件621、第二抓取元件622、第二驅動裝置、第二光學檢測裝置302重複執行步驟S6-S9。After step S9 is executed, the second conveying element 621 , the second grabbing element 622 , the second driving device, and the second optical detection device 302 repeatedly execute steps S6-S9.

更進一步地,第一抓取元件612在將電路板運輸至可翻轉平臺之後,一方面,翻轉機構執行步驟S5,另一方面,第一抓取組件612返回執行S1-S4。而第二抓取元件則重複將電路板依次由基準平臺運輸至第二載臺201、下料容器502。Furthermore, after the first grabbing component 612 transports the circuit board to the reversible platform, on the one hand, the turning mechanism executes step S5, and on the other hand, the first grabbing component 612 returns to execute S1-S4. The second grabbing element repeatedly transports the circuit board from the reference platform to the second carrier 201 and the unloading container 502 in sequence.

具體地,第一抓取元件612包括第一抓取部6121和第二抓取部6122,所述第二抓取元件622包括第三抓取部6221和第四抓取部6222;Specifically, the first grasping element 612 includes a first grasping portion 6121 and a second grasping portion 6122, and the second grasping element 622 includes a third grasping portion 6221 and a fourth grasping portion 6222;

步驟S1中由第一抓取部6121抓取電路板,步驟S4中由第二抓取部6122抓取電路板;步驟S6中由第三抓取部6221抓取電路板,步驟S9中由第四抓取部6222抓取電路板。In step S1, the circuit board is grasped by the first grasping part 6121, in step S4, the circuit board is grasped by the second grasping part 6122; in step S6, the circuit board is grasped by the third grasping part 6221, and in step S9, the circuit board is grasped by the second grasping part 6122. The four grasping parts 6222 grasp the circuit board.

在一個實施例中,第一抓取部6121和第二抓取部6122為左右聯動,即在第一傳送組件611的傳送作用下,第一抓取部6121和第二抓取部6122共同向右移動或共同向左移動,第三抓取部6221和第四抓取部6222同樣左右聯動。每個抓取元件設置兩個抓取部是為了提高外觀檢測效率,具體如下:In one embodiment, the first grasping part 6121 and the second grasping part 6122 are left-right linkage, that is, under the transmission action of the first transmission component 611, the first grasping part 6121 and the second grasping part 6122 Moving to the right or jointly moving to the left, the third grasping part 6221 and the fourth grasping part 6222 are also linked left and right. The purpose of setting up two grasping parts for each grasping element is to improve the efficiency of appearance inspection, as follows:

在執行步驟S1之後,即在第一載臺101將電路板的一面送檢的過程中,第一抓取部6121可以返回上料容器501取下一片電路板;待S4中,第二抓取部6122抓取電路板之後,第一抓取部6121將抓取的下一片電路板放置在第一載臺101上;尤其是,設置上料容器501與第一載臺101之間的X軸向距離與第一載臺101與可翻轉平臺402之間的X軸向距離大致相同的情況下,第一抓取部6121將抓取的下一片電路板放置在第一載臺101上的同時,第二抓取部6122抓取的電路板可以在相同時間放置在可翻轉平臺上。After step S1 is executed, that is, in the process of sending one side of the circuit board to the first stage 101 for inspection, the first grasping part 6121 can return to the loading container 501 to remove a piece of circuit board; in S4, the second grasping After the part 6122 grabs the circuit board, the first grabbing part 6121 places the next piece of circuit board grabbed on the first stage 101; especially, the X-axis between the feeding container 501 and the first stage 101 is set In the case where the distance in the X direction is approximately the same as the X-axis distance between the first stage 101 and the reversible platform 402, the first grasping part 6121 places the next piece of circuit board grasped on the first stage 101 at the same time , the circuit boards grabbed by the second grabbing part 6122 can be placed on the reversible platform at the same time.

在執行步驟S4之後,所述第一抓取部6121和第二抓取部6122一起返回至上料容器501,重複執行上述步驟;After step S4 is executed, the first grasping part 6121 and the second grasping part 6122 return to the feeding container 501 together, and the above steps are repeated;

在執行步驟S6之後,即在第二載臺201將電路板的另一面送檢的過程中,所述第三抓取部6221返回基準平臺抓取下一片被翻轉的電路板;待S9中,第四抓取部6222抓取電路板後,第三抓取部6221將抓取的下一片被翻轉的電路板放置在第二載臺201上;尤其是,設置基準平臺401與第二載臺201之間的X軸向距離與第二載臺201與下料容器502之間的X軸向距離大致相同的情況下,第三抓取部6221將抓取的下一片被翻轉的電路板放置在第二載臺201上的同時,第四抓取部6222抓取的電路板可以在相同時間放置在下料容器502。After step S6 is executed, that is, during the second stage 201 sending the other side of the circuit board for inspection, the third grabbing part 6221 returns to the reference platform to grab the next flipped circuit board; in S9, After the fourth grabbing part 6222 grabs the circuit board, the third grabbing part 6221 places the next flipped circuit board grabbed on the second stage 201; especially, the reference platform 401 and the second stage are set When the X-axis distance between 201 and the X-axis distance between the second stage 201 and the blanking container 502 is approximately the same, the third grasping part 6221 places the next flipped circuit board grasped While on the second carrier 201 , the circuit boards grabbed by the fourth grabbing part 6222 can be placed in the unloading container 502 at the same time.

總之,正是每個抓取元件設置了兩個抓取部,可以使得第一載臺101、第二載臺201能夠連續不間斷地運輸電路板至對應的光學檢測裝置進行外觀檢測,前提是,第一載臺101送檢時間小於或等於從第二抓取部6122抓取電路板至可翻轉平臺402至返回至上料容器501處,第一抓取部6121抓取再下一片電路板至第一載臺101處的時間;第二載臺201送檢時間小於或等於從第四抓取部6222抓取電路板至下料容器502至返回至基準平臺401處,第三抓取部6221抓取再下一片電路板至第二載臺201處的時間。In short, each grabbing element is provided with two grabbing parts, which can enable the first carrier 101 and the second carrier 201 to continuously and uninterruptedly transport the circuit board to the corresponding optical inspection device for appearance inspection, provided that , the inspection time of the first stage 101 is less than or equal to that from the second grasping part 6122 to grab the circuit board to the reversible platform 402 and return to the loading container 501, and the first grasping part 6121 grabs the next circuit board to The time at the first stage 101; the inspection time of the second stage 201 is less than or equal to grabbing the circuit board from the fourth grasping part 6222 to the blanking container 502 to returning to the reference platform 401, the third grasping part 6221 The time for grabbing the next circuit board to the second carrier 201 .

在另一個實施例中,所述第一抓取部6121與第二抓取部6122獨立動作,所述第三抓取部6221與第四抓取部6222獨立動作,比如將第一傳送元件611分為兩個子元件,第一個子元件驅動第一抓取部6121,另一個子元件驅動第二抓取部6122;同樣地,第二傳送元件621的第一個子元件驅動第三抓取部6221,另一個子組件驅動第四抓取部6222,這樣四個抓取部獨立動作的方式互不幹擾,可以進一步提高外觀檢測效率,具體體現在:In another embodiment, the first grasping part 6121 and the second grasping part 6122 act independently, and the third grasping part 6221 and the fourth grasping part 6222 act independently, for example, the first conveying element 611 Divided into two sub-elements, the first sub-element drives the first gripper 6121, and the other sub-element drives the second gripper 6122; similarly, the first sub-element of the second conveying element 621 drives the third gripper The grabbing part 6221, another sub-assembly drives the fourth grabbing part 6222, so that the independent actions of the four grabbing parts do not interfere with each other, which can further improve the efficiency of appearance inspection, specifically reflected in:

在執行步驟S1之後,在執行S2-S4的同時,所述第一抓取部6121重複執行步驟S1;After performing step S1, while performing steps S2-S4, the first grabbing unit 6121 repeatedly performs step S1;

在執行步驟S4之後,在執行S5-S6的同時,所述第二抓取部6122重複執行步驟S4;After performing step S4, while performing steps S5-S6, the second grabbing unit 6122 repeatedly performs step S4;

在執行步驟S6之後,在執行S7-S9的同時,所述第三抓取部6221重複執行步驟S6;After performing step S6, while performing steps S7-S9, the third grabbing unit 6221 repeatedly performs step S6;

在執行步驟S9之後,所述第四抓取部6222重複執行步驟S7-S9。After step S9 is executed, the fourth grasping unit 6222 repeatedly executes steps S7-S9.

也就是說,第一抓取部6121無需等待電路板的正面檢測完後將其運輸至可翻轉平臺再返回上料容器,而是每次在將電路板運輸至第一載臺101後,即可立即返回至上料容器501;That is to say, the first grasping part 6121 does not need to wait for the front side of the circuit board to be detected and then transport it to the reversible platform and then return to the loading container, but each time after transporting the circuit board to the first carrier 101, immediately Can return to feeding container 501 immediately;

同理,第二抓取部6122每次在將電路板運輸至可翻轉平臺402後,即可立即返回至第一載臺101;第三抓取部6221每次在將電路板運輸至第二載臺201後,即可立即返回至基準平臺401;第四抓取部6222每次在將電路板運輸至下料容器502後,即可立即返回至第二載臺201。Similarly, the second grasping part 6122 can immediately return to the first stage 101 after transporting the circuit board to the reversible platform 402 each time; the third grasping part 6221 transports the circuit board to the second After loading the stage 201 , it can return to the reference platform 401 immediately; after the fourth gripping part 6222 transports the circuit board to the unloading container 502 every time, it can immediately return to the second loading platform 201 .

以上無論是聯動或者獨立動作的實施例中,均可以分別調節第一驅動機構、第二驅動機構、第一傳送元件和第二傳送元件的動力輸出大小,使得各個抓取部抓取電路板並運輸的時間與載臺送檢電路板的時間相適配。In the above embodiments, no matter whether it is linkage or independent action, the power output of the first drive mechanism, the second drive mechanism, the first transmission element and the second transmission element can be adjusted respectively, so that each grasping part grasps the circuit board and The time of transportation matches the time when the stage sends the circuit board for inspection.

對於一些特別高精密IC載板,來料時板子與板子之間會墊放隔紙作為保護,當檢測完成後每兩片板子之間也需要放置隔紙以此做到對電路板的保護。在本發明的一個實施例中,所述上料容器501的上方還設有傳感裝置(比如說可以採用顏色感測器或者圖像感測器),所述傳感裝置與所述主控模組的輸入端電連接,所述傳感裝置被配置為識別上料容器501中最上一層為電路板或間隔紙;For some special high-precision IC carrier boards, a spacer is placed between the boards for protection when the incoming materials are received, and a spacer is also required between every two boards after the inspection is completed to protect the circuit board. In an embodiment of the present invention, a sensing device (for example, a color sensor or an image sensor can be used) is provided above the feeding container 501, and the sensing device is connected with the main control The input end of the module is electrically connected, and the sensing device is configured to identify that the uppermost layer in the feeding container 501 is a circuit board or spacer paper;

步驟S1進一步包括:若所述傳感裝置的識別結果為上料容器501中最上一層為間隔紙,則所述第一抓取組件612抓取該間隔紙並將其運輸至隔紙回收料盒;若所述傳感裝置的識別結果為上料容器501中最上一層為電路板,則所述第一抓取元件612抓取該電路板並將其運輸至第一載臺101。作為一種可實施的方式,上料容器501的數量為兩個且相互並排設置,其中一個用於放置電路板,另一個作為所述間隔紙收集區域。Step S1 further includes: if the recognition result of the sensing device is that the uppermost layer in the feeding container 501 is spacer paper, the first grabbing component 612 grabs the spacer paper and transports it to the spacer paper recovery box ; if the recognition result of the sensing device is that the uppermost layer in the loading container 501 is a circuit board, then the first grabbing element 612 grabs the circuit board and transports it to the first carrier 101 . As an implementable manner, there are two feeding containers 501 arranged side by side with each other, one of which is used to place circuit boards, and the other is used as the spacer paper collection area.

設置多個並排的上料容器501還可以用以不間斷地提供上料,所述上料容器501被配置為能夠沿著抽屜軌道向前移出,至少兩個上料容器501中放置有待檢測的電路板,當其中一個上料容器501中的電路板被取空,可以取另一個上料容器501中的電路板,而將空的上料容器501向前抽出以對其補充電路板,由於向前抽出的上料容器501與第一抓取組件612抓取未向前抽出的上料容器501中的電路板的運動軌跡相錯開,因此向向前抽出的上料容器501內補充電路板的動作並不會與第一抓取元件612從另一上料容器501抓取電路板的動作發生碰撞或衝突,以此迴圈,從而實現不停機、不間斷地供料,以此保證設備高效率檢測載板的外觀。關於上料容器抽屜機構的設計部分通過引用的方式,將公告號為CN209023756U的中國專利的全文併入本實施例中。A plurality of side-by-side feeding containers 501 can also be used to provide uninterrupted feeding. The feeding containers 501 are configured to be able to move forward along the drawer track, and at least two feeding containers 501 are placed to be detected. Circuit board, when the circuit board in one of them feeding container 501 is taken empty, can get the circuit board in another feeding container 501, and empty feeding container 501 is extracted forward to supplement circuit board to it, because The forwardly drawn loading container 501 is staggered with the movement track of the first grasping assembly 612 grabbing the circuit boards in the forwardly drawn loading container 501 , so the circuit boards are replenished in the forwardly drawn forward loading container 501 The action will not collide or conflict with the action of the first grabbing element 612 grabbing the circuit board from another feeding container 501, so as to make a circle, so as to realize non-stop and uninterrupted feeding, so as to ensure that the equipment Efficiently inspect the appearance of the carrier board. Regarding the design of the drawer mechanism of the feeding container, the full text of the Chinese patent with the publication number CN209023756U is incorporated into this embodiment by reference.

綜上,設計安裝帶有兩組上料容器501的目的如上所描述的,第一可實現不間斷供料,第二當使用場景為兩片電路板之間設有物料間隔紙時,其中一個上料容器501便可被設置為隔紙回收料盒,具體實施為當抓取部去另一上料容器501抓取物料前,需獲得裝在上料容器501後上方的顏色感測器的判定信號,如判定上料容器501中浮在最上面的物料是電路板(IC載板),則抓取部會將IC載板運輸至Y軸第一工作臺1的第一載臺101上進行檢測,反之,如判定為間隔紙,則由抓取部將間隔紙傳送至作為隔紙回收料盒的上料容器501,此設計很好地體現了設備操控的智能化。In summary, the purpose of designing and installing two sets of feeding containers 501 is as described above. First, it can realize uninterrupted feeding. Second, when the usage scenario is that there is a material spacer between two circuit boards, one of them The feeding container 501 can be set as a paper-separated recycling box. The specific implementation is that before the grabbing part goes to another feeding container 501 to grab the material, it needs to obtain the color sensor installed on the rear and upper side of the feeding container 501. Judgment signal, if it is determined that the material floating on the top in the feeding container 501 is a circuit board (IC carrier board), the grabbing part will transport the IC carrier board to the first stage 101 of the first workbench 1 on the Y axis On the contrary, if it is judged to be spacer paper, the gripping part will transfer the spacer paper to the feeding container 501 as the spacer paper recovery box. This design well reflects the intelligence of equipment control.

針對位於設備左側即第二工作臺2外側的三組下料容器502,其功能主要是可方便於對完成檢測的物料進行歸類,行業內通常設置為三類即:良品、需再次確認品、報廢品,設計帶有三組下料歸類盒可很好地滿足此要求。For the three sets of blanking containers 502 located on the left side of the equipment, that is, outside the second workbench 2, their function is mainly to facilitate the classification of the materials that have been tested. In the industry, they are usually set into three categories: good products, products that need to be reconfirmed , Scrap products, designed with three sets of material sorting boxes can well meet this requirement.

在本發明的一個實施例中,第一光學檢測裝置301與第二光學檢測裝置302各自搭配的光學鏡頭相同;In one embodiment of the present invention, the optical lenses of the first optical detection device 301 and the second optical detection device 302 are the same;

在另一個實施例中,所述第一光學檢測裝置301與第二光學檢測裝置302被配置為各自搭配不同的光學鏡頭。此目的在於可根椐產品的不同特性給出不同的光學解析度,比如當客戶的產品正面比較精密而需要高解析度檢測時,用於檢測正面的光學鏡頭便可根椐需求給出相應的光學放大距,反之如果產品反面不需高精密檢測,則對應檢測反面的光學鏡頭便可自動調整到相應的放大距,不同的光學放大距也代表著單次可掃描檢測的面積不同,光學放大距越大,則單次可掃描檢測的面積則越小。比如,上料容器501中放置的電路板為正面向上,通常對電路板正面的檢測精度要高於對電路板反面的檢測精度,在這樣的需求下,所述第一光學檢測裝置301的光學鏡頭的光學放大倍率大於與第二光學檢測裝置302的光學鏡頭的光學放大倍率,所述第一光學檢測裝置301的單次掃描檢測面積小於第二光學檢測裝置302的單次掃描檢測面積。In another embodiment, the first optical detection device 301 and the second optical detection device 302 are configured to be equipped with different optical lenses. The purpose of this is to provide different optical resolutions according to different characteristics of the product. For example, when the customer’s product is more precise and requires high-resolution detection, the optical lens used to detect the front can be provided according to the demand. Optical magnification distance. On the contrary, if the reverse side of the product does not require high-precision detection, the optical lens corresponding to the detection reverse side can be automatically adjusted to the corresponding magnification distance. Different optical magnification distances also represent different areas that can be scanned and detected in a single time. The larger the distance, the smaller the area that can be detected by a single scan. For example, the circuit board placed in the feeding container 501 is facing up, and the detection accuracy of the front side of the circuit board is usually higher than that of the reverse side of the circuit board. Under such requirements, the optical detection device of the first optical detection device 301 The optical magnification of the lens is greater than that of the optical lens of the second optical detection device 302 , and the single-scan detection area of the first optical detection device 301 is smaller than the single-scan detection area of the second optical detection device 302 .

對應地,本實施例提出了一種改進的結構,使設備達到高檢測效率:第二工作臺2的數量為一個,第一工作臺1的數量為兩個且相鄰設置,即可以視為在圖3所示的第一工作臺1與翻轉機構之間多增加一個第一工作臺1,增加的該第一工作臺1上同樣設有第一載臺101、第一滑軌102、第一驅動裝置,但是新增的第一工作臺1可以為接近矩形狀,而無需設置為前窄後寬的結構。Correspondingly, this embodiment proposes an improved structure to enable the device to achieve high detection efficiency: the number of the second workbench 2 is one, and the number of the first workbench 1 is two and arranged adjacently, that is, it can be regarded as One more first workbench 1 is added between the first workbench 1 shown in Figure 3 and the turning mechanism, and the first workbench 1 is also provided with a first carrier 101, a first slide rail 102, a first The driving device, but the newly added first workbench 1 can be approximately rectangular, without being set as a structure with a narrow front and a wide rear.

操作步驟S1和S4相應調整如下:Operation steps S1 and S4 are correspondingly adjusted as follows:

步驟S1中所述第一抓取組件612輪流給兩個第一工作臺1的第一載臺101運輸電路板;In step S1, the first grabbing assembly 612 transports the circuit boards to the first carrier 101 of the two first workbenches 1 in turn;

步驟S4中所述第一抓取組件612輪流從兩個第一載臺101抓取電路板並將其運輸到可翻轉平臺402。In step S4 , the first grabbing assembly 612 grabs the circuit boards from the two first carriers 101 in turn and transports them to the reversible platform 402 .

多設置一個第一載臺101、第一滑軌102和第一驅動裝置,可以既確保對電路板其中一面更精密地檢測需求,又可以不會因為單次掃描檢測面積減小而降低外觀檢測效率,且電路板的運送程式簡單明瞭,不需要作出大的改變。Setting up one more first stage 101, first slide rail 102 and first driving device can not only ensure more precise inspection requirements on one side of the circuit board, but also not reduce the appearance inspection due to the reduction of the inspection area of a single scan Efficiency, and the delivery procedure of the circuit board is simple and clear, and no major changes are required.

本發明的光學外觀檢測設備採用在X軸橋架上懸掛兩個Z向的高精光學相機鏡頭組件,橋架下方設置兩條沿Y軸並行的工作臺,並在兩個工作臺之間設置翻轉機構、在兩個工作臺的外側分別設置上料容器和下料容器,以及設置兩組X軸傳送組件並使其抓取元件垂直懸掛於工作臺、翻轉機構、上料容器和下料容器的上方,結構排布高度集成化和集中化;流水化地完成兩個Y軸工作臺上物料分別正面及反面的檢測,緊密佈局的設備主體在X軸、Y軸向驅動採用線性馬達配合高精直線導軌作為驅動主體,滿足了設備主體的運動高精度要求,也是平臺穩定性的保證,因此為高度精密化的光學元件提供了基礎保障。The optical appearance inspection equipment of the present invention adopts two Z-direction high-precision optical camera lens assemblies suspended on the X-axis bridge, and two parallel workbenches along the Y-axis are arranged under the bridge, and a turning mechanism is arranged between the two workbenches 1. Set the loading container and the unloading container on the outside of the two workbenches respectively, and set up two sets of X-axis transmission components and make the grabbing components hang vertically above the workbench, the turning mechanism, the feeding container and the unloading container , the structural arrangement is highly integrated and centralized; the detection of the front and back sides of the materials on the two Y-axis workbenches is completed in a streamlined manner, and the compact layout of the main body of the equipment is driven by a linear motor in the X-axis and Y-axis with a high-precision linear As the driving body, the guide rail meets the high-precision movement requirements of the main body of the equipment and also guarantees the stability of the platform, thus providing a basic guarantee for highly sophisticated optical components.

需要說明的是,在本文中,諸如第一和第二等之類的關係術語僅僅用來將一個實體或者操作與另一個實體或操作區分開來,而不一定要求或者暗示這些實體或操作之間存在任何這種實際的關係或者順序。而且,術語“包括”、“包含”或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者設備不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者設備所固有的要素。在沒有更多限制的情況下,由語句“包括一個……”限定的要素,並不排除在包括所述要素的過程、方法、物品或者設備中還存在另外的相同要素。It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is a relationship between these entities or operations. There is no such actual relationship or order between them. Furthermore, the term "comprises", "comprises" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus comprising a set of elements includes not only those elements, but also includes elements not expressly listed. other elements of or also include elements inherent in such a process, method, article, or device. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.

以上所述僅是本申請的具體實施方式,應當指出,對於本技術領域的普通技術人員來說,在不脫離本申請原理的前提下,還可以做出若干改進和潤飾,這些改進和潤飾也應視為本申請的保護範圍。The above description is only the specific implementation of the present application. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present application, some improvements and modifications can also be made. It should be regarded as the protection scope of this application.

1:第一工作臺 101:第一載臺 102:第一滑軌 103:第一拖鏈 2:第二工作臺 201:第二載臺 202:第二滑軌 203:第二拖鏈 3:橋架 301:第一光學檢測裝置 302:第二光學檢測裝置 311:第一X向拖鏈 312:第二X向拖鏈 321:第一Z向拖鏈 322:第二Z向拖鏈 401:基準平臺 402:可翻轉平臺 501:上料容器 502:下料容器 61:第一橫樑 611:第一傳送組件 612;第一抓取組件 6121:第一抓取部 6122:第二抓取部 62:第二橫樑 621:第二傳送元件 622:第二抓取元件 6221:第三抓取部 6222:第四抓取部 6001:吸盤 63:中間支柱 7:電路板 1: The first workbench 101: The first platform 102: The first slide rail 103: The first drag chain 2: The second workbench 201:Second platform 202: Second slide rail 203: Second drag chain 3: Bridge 301: the first optical detection device 302: the second optical detection device 311: The first X-direction drag chain 312: The second X-direction drag chain 321: The first Z-direction drag chain 322: The second Z-direction drag chain 401: Benchmark Platform 402: Reversible platform 501: Feeding container 502: Feed container 61: First beam 611: The first transmission component 612;First grab component 6121: The first grasping department 6122: The second grasping department 62: Second beam 621: Second transmission element 622: Second grabbing element 6221: The third grasping department 6222: The fourth grasping department 6001: suction cup 63: middle pillar 7: Circuit board

為了更清楚地說明本申請實施例或現有技術中的技術方案,下面將對實施例或現有技術描述中所需要使用的附圖作簡單地介紹,顯而易見地,下面描述中的附圖僅僅是本申請中記載的一些實施例,對於本領域普通技術人員來講,在不付出創造性勞動的前提下,還可以根據這些附圖獲得其他的附圖。 圖1為本公開的一個示例性實施例提供的光學外觀檢測設備的立體示意圖; 圖2為圖1所示的光學外觀檢測設備俯視示意圖; 圖3為本公開的一個示例性實施例提供的光學外觀檢測設備的工作臺及橋架的組裝結構示意圖; 圖4為圖3所示的組裝結構的俯視示意圖; 圖5為將圖3所示的組裝結構從圖1所示的光學外觀檢測設備中分離出去後的結構示意圖; 圖6為圖5所示的結構中位元元於右半部分的放大示意圖; 圖7為圖5所示的結構的俯視示意圖。 In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings that need to be used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the accompanying drawings in the following description are only the present invention For some embodiments described in the application, those skilled in the art can also obtain other drawings based on these drawings without creative work. FIG. 1 is a schematic perspective view of an optical appearance inspection device provided by an exemplary embodiment of the present disclosure; Fig. 2 is a schematic top view of the optical appearance inspection device shown in Fig. 1; Fig. 3 is a schematic diagram of the assembly structure of the workbench and the bridge frame of the optical appearance inspection equipment provided by an exemplary embodiment of the present disclosure; Fig. 4 is a schematic top view of the assembled structure shown in Fig. 3; Fig. 5 is a structural schematic diagram after separating the assembly structure shown in Fig. 3 from the optical appearance inspection device shown in Fig. 1; FIG. 6 is an enlarged schematic diagram of a bit in the right half of the structure shown in FIG. 5; FIG. 7 is a schematic top view of the structure shown in FIG. 5 .

1:第一工作臺 1: The first workbench

102:第一滑軌 102: The first slide rail

2:第二工作臺 2: The second workbench

202:第二滑軌 202: Second slide rail

3:橋架 3: Bridge

301:第一光學檢測裝置 301: the first optical detection device

302:第二光學檢測裝置 302: the second optical detection device

401:基準平臺 401: Benchmark Platform

402:可翻轉平臺 402: Reversible platform

501:上料容器 501: Feeding container

502:下料容器 502: Feed container

61:第一橫樑 61: First beam

611:第一傳送組件 611: The first transmission component

62:第二橫樑 62: Second beam

621:第二傳送元件 621: Second transmission element

7:電路板 7: Circuit board

Claims (16)

一種光學外觀檢測設備,其中,包括: 左右並排且間隔設置的第一工作臺和第二工作臺,所述第一工作臺包括第一載臺、沿著前後方向設置的第一滑軌、被配置為驅動第一載臺沿著第一滑軌移動的第一驅動裝置,所述第二工作臺包括第二載臺、沿著前後方向設置的第二滑軌、被配置為驅動第二載臺沿著第二滑軌移動的第二驅動裝置; 橋架,其沿左右方向架設在所述第一滑軌和第二滑軌的上方,所述橋架上設有可移動的第一光學檢測裝置和第二光學檢測裝置,所述第一光學檢測裝置被配置為在第一滑軌的後部上方左右往復移動,所述第二光學檢測裝置被配置為在第二滑軌的後部上方左右往復移動; 翻轉機構,其設置在第一工作臺與第二工作臺之間,所述翻轉機構包括基準平臺、可翻轉平臺及第三驅動裝置,所述基準平臺與可翻轉平臺鉸接,所述第三驅動裝置被配置為驅動所述可翻轉平臺相對於基準平臺發生翻轉; 上料容器和下料容器,其中,所述上料容器設置在所述第一工作臺的外側,所述下料容器設置在所述第二工作臺的外側,所述上料容器被配置為放置待檢測的物料,所述下料容器被配置為放置完成檢測的物料; 傳送機構,被配置為對所述物料進行傳送,其包括沿左右方向設置的橫樑、設置在橫樑上的第一傳送元件和第一抓取元件、第二傳送元件和第二抓取元件;其中,所述第一傳送元件被配置為帶動第一抓取組件沿著橫樑在第一工作臺和上料容器的上方左右移動,所述第二傳送元件被配置為帶動第二抓取元件沿著橫樑在第二工作臺和下料容器的上方左右移動,且所述第一抓取元件和第二抓取元件均被配置為抓取物料。 An optical appearance inspection device, including: A first workbench and a second workbench arranged side by side and at intervals, the first workbench includes a first carrier, a first slide rail arranged along the front-to-back direction, and is configured to drive the first carrier along the first A first driving device for sliding rail movement, the second worktable includes a second carrier, a second sliding rail arranged along the front-to-back direction, and a first driving device configured to drive the second carrier to move along the second sliding rail Two driving devices; A bridge, which is erected above the first slide rail and the second slide rail along the left and right direction, the bridge is provided with a movable first optical detection device and a second optical detection device, and the first optical detection device configured to reciprocate left and right above the rear of the first slide rail, and the second optical detection device is configured to reciprocate left and right above the rear of the second slide rail; An overturning mechanism, which is arranged between the first workbench and the second workbench, the overturning mechanism includes a reference platform, a reversible platform and a third drive device, the reference platform is hinged to the reversible platform, and the third drive The device is configured to drive the invertible platform to invert relative to the reference platform; A feeding container and a feeding container, wherein the feeding container is arranged outside the first workbench, the unloading container is arranged outside the second workbench, and the feeding container is configured as placing the material to be tested, and the unloading container is configured to place the tested material; The conveying mechanism is configured to convey the material, which includes a beam arranged along the left and right directions, a first conveying element and a first grasping element arranged on the crossbeam, a second conveying element and a second grasping element; wherein , the first conveying element is configured to drive the first grabbing assembly to move left and right along the beam above the first workbench and the feeding container, and the second conveying element is configured to drive the second grabbing element along the The beam moves left and right above the second workbench and the unloading container, and the first grabbing element and the second grabbing element are both configured to grab materials. 如請求項1所述的光學外觀檢測設備,其中,所述第一工作臺上至少前部外側相對於其後部呈收窄結構,所述第二工作臺上至少前部外側相對於其後部呈收窄結構,所述上料容器靠近所述第一工作臺的前部外側,所述下料容器靠近所述第二工作臺的前部外側。The optical appearance inspection equipment according to claim 1, wherein, at least the outer side of the front part of the first workbench has a narrowed structure relative to the rear part thereof, and at least the outer side of the front part of the second workbench has a narrowed structure relative to the rear part thereof. In a narrow structure, the loading container is close to the front outside of the first workbench, and the unloading container is close to the front outside of the second workbench. 如請求項2所述的光學外觀檢測設備,其中,所述第一工作臺、第二工作臺、翻轉機構、上料容器和下料容器設置在方形基臺上,所述方形基臺採用鑄鐵件打造而成; 所述橋架具有兩個橋樁以及架在兩個橋樁上的水準橋杆,所述水準橋杆左端的橋樁設置在所述第一工作臺的後部,所述水準橋杆右端的橋樁設置在所述第二工作臺的後部; 所述傳送機構的橫樑的一外端架設在所述方形基臺上靠近上料容器的區域,另一外端架設在所述方形基臺上靠近下料容器的區域。 The optical appearance inspection equipment according to claim 2, wherein, the first workbench, the second workbench, the turning mechanism, the loading container and the unloading container are arranged on a square base, and the square base is made of cast iron made of pieces; The bridge frame has two bridge piles and a horizontal bridge rod mounted on the two bridge piles. The bridge pile at the left end of the horizontal bridge rod is arranged at the rear of the first workbench, and the bridge pile at the right end of the horizontal bridge rod is arranged at the rear of the second workbench; One outer end of the beam of the conveying mechanism is erected on the square base platform near the loading container, and the other outer end is erected on the square base platform near the unloading container area. 如請求項1所述的光學外觀檢測設備,其中,所述第一光學檢測裝置與第二光學檢測裝置被配置為各自搭配不同的光學鏡頭。The optical appearance inspection device according to claim 1, wherein the first optical inspection device and the second optical inspection device are configured to be equipped with different optical lenses. 根據請求項4所述的光學外觀檢測設備,其中,所述第一光學檢測裝置的光學鏡頭的光學放大倍率大於與第二光學檢測裝置的光學鏡頭的光學放大倍率,所述第一光學檢測裝置的單次掃描檢測面積小於第二光學檢測裝置的單次掃描檢測面積; 所述第二工作臺的數量為一個,所述第一工作臺的數量為兩個且相鄰設置。 The optical appearance inspection device according to claim 4, wherein the optical magnification of the optical lens of the first optical detection device is greater than the optical magnification of the optical lens of the second optical detection device, and the first optical detection device The single-scan detection area of the second optical detection device is smaller than the single-scan detection area; The number of the second workbench is one, and the number of the first workbench is two and arranged adjacently. 如請求項1所述的光學外觀檢測設備,其中,所述第一抓取元件包括第一抓取部和第二抓取部,所述第一抓取部被配置為在所述上料容器與第一載臺之間移動,所述第二抓取部被配置為在所述第一載臺與可翻轉平臺之間移動; 所述第二抓取元件包括第三抓取部和第四抓取部,所述第三抓取部被配置為在所述基準平臺與第二載臺之間移動,所述第四抓取部被配置為在所述第二載臺與下料容器之間移動。 The optical appearance inspection device according to claim 1, wherein the first grasping element includes a first grasping part and a second grasping part, and the first grasping part is configured to moving between the first carrier, the second gripper is configured to move between the first carrier and the reversible platform; The second grasping element includes a third grasping part and a fourth grasping part, the third grasping part is configured to move between the reference platform and the second stage, and the fourth grasping part The part is configured to move between the second carrier and the unloading container. 如請求項1所述的光學外觀檢測設備,其中,所述第一抓取元件的抓手上設有吸盤,所述吸盤在所述抓手上的左右位置和/或前後位置可調。The optical appearance inspection device according to claim 1, wherein a suction cup is provided on the handle of the first grasping element, and the left-right position and/or front-rear position of the suction cup on the handle is adjustable. 根據請求項1所述的光學外觀檢測設備,其中,還包括傳感裝置,其設置在所述上料容器的上方,其被配置為識別上料容器中最上一層為物料或間隔紙;和/或,所述上料容器的數量為兩個且相互並排設置。The optical appearance inspection device according to claim 1, further comprising a sensing device disposed above the feeding container, which is configured to identify that the uppermost layer in the feeding container is material or spacer paper; and/ Or, the number of the feeding containers is two and arranged side by side. 如請求項8所述的光學外觀檢測設備,其中,所述上料容器被配置為能夠沿著抽屜軌道向前移出,所述下料容器的數量為多個。The optical appearance inspection device according to claim 8, wherein, the feeding container is configured to be able to move forward along the drawer rail, and the number of the feeding container is multiple. 如請求項1至9中任一項所述的光學外觀檢測設備,其中,所述第一驅動裝置、第二驅動裝置、第一傳送元件和第二傳送元件均採用配合開放式編碼器光柵尺的線性馬達; 所述第一工作臺、第二工作臺和橋架均採用鑄鐵件打造而成。 The optical appearance inspection equipment according to any one of claims 1 to 9, wherein, the first driving device, the second driving device, the first transmission element and the second transmission element all adopt an open encoder grating scale the linear motor; The first workbench, the second workbench and the bridge frame are all made of cast iron. 一種基於請求項1至10中任一項所述的光學外觀檢測設備的外觀檢測方法,其中,在所述光學外觀檢測設備的主控模組的控制下,所述光學外觀檢測設備執行以下步驟: S1、在光學外觀檢測設備的第一傳送元件的傳送作用下,第一抓取組件抓取上料容器中的物料,並將該物料運輸至第一工作臺的第一載臺上; S2、在第一驅動裝置的驅動作用下,所述第一載臺沿著第一滑軌向後移動,以使第一光學檢測裝置對第一載臺上的物料進行掃描檢測; S3、待完成掃描檢測後,所述第一載臺沿著第一滑軌向前移動; S4、所述第一抓取組件抓取第一載臺上的物料,並將其運輸到翻轉機構的可翻轉平臺; S5、在第三驅動裝置的驅動作用下,所述可翻轉平臺帶動該物料向基準平臺翻轉,以使物料背面朝上地放置在所述基準平臺上; S6、在第二傳送元件的傳送作用下,第二抓取元件抓取所述基準平臺上的物料,並將其運輸至第二工作臺的第二載臺上; S7、在第二驅動裝置的驅動作用下,所述第二載臺沿著第二滑軌向後移動,以使第二光學檢測裝置對第二載臺上的物料進行掃描檢測; S8、待完成掃描檢測後,所述第二載臺沿著第二滑軌向前移動; S9、所述第二抓取元件抓取第二載臺上的物料,並將其運輸到下料容器。 An appearance inspection method based on the optical appearance inspection device described in any one of claims 1 to 10, wherein, under the control of the main control module of the optical appearance inspection device, the optical appearance inspection device performs the following steps : S1. Under the transmission action of the first transmission element of the optical appearance inspection device, the first grabbing component grabs the material in the feeding container, and transports the material to the first carrier of the first workbench; S2. Under the driving action of the first driving device, the first stage moves backward along the first slide rail, so that the first optical detection device scans and detects the materials on the first stage; S3. After the scanning detection is completed, the first carrier moves forward along the first slide rail; S4. The first grabbing component grabs the material on the first carrier, and transports it to the reversible platform of the reversing mechanism; S5. Under the driving action of the third driving device, the reversible platform drives the material to turn over to the reference platform, so that the material is placed on the reference platform with its back facing upward; S6. Under the transmission action of the second transmission element, the second grabbing element grabs the material on the reference platform and transports it to the second carrier of the second workbench; S7. Under the driving action of the second driving device, the second stage moves backward along the second slide rail, so that the second optical detection device scans and detects the materials on the second stage; S8. After the scanning detection is completed, the second stage moves forward along the second slide rail; S9. The second grabbing element grabs the material on the second carrier and transports it to the unloading container. 如請求項11所述的外觀檢測方法,其中,在執行步驟S5之後,在執行S6-S9的同時,所述第一傳送元件、第一抓取元件、第一驅動裝置、第一光學檢測裝置、第三驅動裝置重複執行步驟S1-S5; 在執行步驟S9之後,所述第二傳送元件、第二抓取元件、第二驅動裝置、第二光學檢測裝置重複執行步驟S6-S9。 The appearance inspection method according to claim 11, wherein, after step S5 is executed, while S6-S9 is executed, the first conveying element, the first grasping element, the first driving device, and the first optical detection device , The third driving device repeatedly executes steps S1-S5; After step S9 is executed, the second conveying element, the second grasping element, the second driving device, and the second optical detection device repeatedly execute steps S6-S9. 如請求項11所述的外觀檢測方法,其中,所述第一抓取元件包括第一抓取部和第二抓取部,所述第二抓取元件包括第三抓取部和第四抓取部; 步驟S1中由第一抓取部抓取物料,步驟S4中由第二抓取部抓取物料;步驟S6中由第三抓取部抓取物料,步驟S9中由第四抓取部抓取物料。 The appearance inspection method according to claim 11, wherein the first grasping element includes a first grasping part and a second grasping part, and the second grasping element includes a third grasping part and a fourth grasping part Take part; In step S1, the material is grasped by the first grasping part, in step S4, the material is grasped by the second grasping part; in step S6, the material is grasped by the third grasping part, and in step S9, the material is grasped by the fourth grasping part materials. 如請求項13所述的外觀檢測方法,其中,所述第一抓取部與第二抓取部獨立動作,所述第三抓取部與第四抓取部獨立動作; 在執行步驟S1之後,在執行S2-S4的同時,所述第一抓取部重複執行步驟S1; 在執行步驟S4之後,在執行S5-S6的同時,所述第二抓取部重複執行步驟S4; 在執行步驟S6之後,在執行S7-S9的同時,所述第三抓取部重複執行步驟S6; 在執行步驟S9之後,所述第四抓取部重複執行步驟S7-S9。 The appearance inspection method according to claim 13, wherein the first grasping part and the second grasping part operate independently, and the third grasping part and the fourth grasping part operate independently; After performing step S1, while performing S2-S4, the first grasping part repeatedly performs step S1; After performing step S4, while performing steps S5-S6, the second grasping part repeatedly performs step S4; After performing step S6, while performing steps S7-S9, the third grasping part repeatedly performs step S6; After step S9 is executed, the fourth grasping part repeatedly executes steps S7-S9. 如請求項11所述的外觀檢測方法,其中,所述上料容器的上方還設有傳感裝置,所述傳感裝置與所述主控模組的輸入端電連接,所述傳感裝置被配置為識別上料容器中最上一層為物料或間隔紙; 步驟S1進一步包括:若所述傳感裝置的識別結果為上料容器中最上一層為間隔紙,則所述第一抓取組件抓取該間隔紙並將其運輸至間隔紙收集區域;若所述傳感裝置的識別結果為上料容器中最上一層為物料,則所述第一抓取組件抓取該物料並將其運輸至第一載臺。 The appearance inspection method according to claim 11, wherein a sensing device is further provided above the feeding container, and the sensing device is electrically connected to the input end of the main control module, and the sensing device configured to identify the uppermost layer in the feeding container as material or spacer paper; Step S1 further includes: if the identification result of the sensing device is that the uppermost layer in the feeding container is spacer paper, then the first grabbing component grabs the spacer paper and transports it to the spacer paper collection area; if the If the recognition result of the sensing device is that the uppermost layer in the feeding container is material, the first grabbing component grabs the material and transports it to the first carrier. 如請求項11所述的外觀檢測方法,其中,所述第一光學檢測裝置的光學鏡頭的光學放大倍率大於與第二光學檢測裝置的光學鏡頭的光學放大倍率,所述第一光學檢測裝置的單次掃描檢測面積小於第二光學檢測裝置的單次掃描檢測面積;所述第二工作臺的數量為一個,所述第一工作臺的數量為兩個且相鄰設置; 步驟S1中所述第一抓取組件輪流給兩個第一工作臺的第一載臺運輸物料; 步驟S4中所述第一抓取組件輪流從兩個第一載臺抓取物料並將其運輸到可翻轉平臺。 The appearance inspection method according to claim 11, wherein the optical magnification of the optical lens of the first optical detection device is greater than the optical magnification of the optical lens of the second optical detection device, and the optical magnification of the optical lens of the first optical detection device is The single-scan detection area is smaller than the single-scan detection area of the second optical detection device; the number of the second workbench is one, and the number of the first workbench is two and arranged adjacently; The first grabbing assembly described in step S1 transports materials to the first carrier of the two first workbenches in turn; In step S4, the first grabbing assembly grabs materials from the two first carriers in turn and transports them to the reversible platform.
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