TWI792059B - Method of manufacturing igbt module with heat-dissipation structure - Google Patents
Method of manufacturing igbt module with heat-dissipation structure Download PDFInfo
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本發明涉及IGBT模組,具體來說是涉及IGBT模組散熱結構及其形成方法。 The invention relates to an IGBT module, in particular to a heat dissipation structure of the IGBT module and a forming method thereof.
目前電動汽車/混合動力汽車,所使用的大功率逆變器(Inverter),多採用IGBT(Insulated Gate Bipolar Transistor:絕緣閘極雙極性電晶體)晶片。因此,大功率逆變器工作時所產生的熱量,將導致IGBT晶片溫度升高,如果沒有適當的散熱措施,就可能使IGBT晶片的溫度超過所允許的溫度,從而導致性能惡化以致損壞。因此,IGBT散熱技術成為相關技術人員急於解決的問題。 At present, the high-power inverter (Inverter) used in electric vehicles/hybrid vehicles mostly uses IGBT (Insulated Gate Bipolar Transistor: Insulated Gate Bipolar Transistor) chips. Therefore, the heat generated during the operation of the high-power inverter will cause the temperature of the IGBT chip to rise. If there is no proper heat dissipation measure, the temperature of the IGBT chip may exceed the allowable temperature, resulting in performance deterioration and even damage. Therefore, the IGBT heat dissipation technology has become a problem that relevant technicians are eager to solve.
目前DBC(Direct Bonding Copper:陶瓷-金屬複合板結構)板已成為IGBT模組散熱結構的首選材料。請參考圖1及圖2所示,為一種現有的IGBT模組散熱結構,其主要包括有IGBT晶片層11A、上銲接層12A、DBC板13A、下銲接層14A、及散熱層15A。其中,DBC板13A由上到下依次為上薄銅層131A、陶瓷層132A和下薄銅層133A。然而,DBC板13A為多層結構且導熱能力有限,當IGBT晶片層11A的IGBT晶片111A產生熱量時,不能及時通過DBC板13A傳遞到散熱層15A,並且DBC板13A與散熱層15A之間必需透過下銲接層14A才能夠形成連接,而一整片的下銲接層14A會極易出現空銲現象,且會增加介面阻抗,從而影響到導熱性能。
At present, the DBC (Direct Bonding Copper: ceramic-metal composite board structure) board has become the material of choice for the heat dissipation structure of the IGBT module. Please refer to FIG. 1 and FIG. 2 , which is an existing IGBT module heat dissipation structure, which mainly includes an
有鑑於此,本發明人本於多年從事相關產品之開發與設計,有感上述缺失之可改善,乃特潛心研究並配合學理之運用,終於提出一種設計合理且有效改善上述缺失之本發明。 In view of this, the inventor has been engaged in the development and design of related products for many years, and felt that the above-mentioned defects can be improved, so he devoted himself to research and combined with the application of theories, and finally proposed an invention with a reasonable design and effective improvement of the above-mentioned defects.
本發明所要解決的技術問題在於,針對現有技術的不足提供一種IGBT模組散熱結構及其形成方法。 The technical problem to be solved by the present invention is to provide an IGBT module heat dissipation structure and a forming method thereof in view of the deficiencies of the prior art.
為了解決上述的技術問題,本發明提供一種IGBT模組散熱結構,包括:IGBT晶片層、接合層、厚銅層、絕緣導熱層、以及散熱層;所述絕緣導熱層形成在所述散熱層之上;其中,所述絕緣導熱層部分由高分子複合材料所構成,且所述絕緣導熱層其它部分由陶瓷材料所構成;所述厚銅層熱壓形成在所述絕緣導熱層之上;其中,所述厚銅層底部形成有圓弧導角,且所述厚銅層底部嵌入於所述絕緣導熱層中;所述接合層形成在所述厚銅層之上;所述IGBT晶片層形成在所述接合層之上。 In order to solve the above-mentioned technical problems, the present invention provides a heat dissipation structure of an IGBT module, comprising: an IGBT chip layer, a bonding layer, a thick copper layer, an insulating heat conducting layer, and a heat dissipation layer; the insulating heat conducting layer is formed on the heat dissipation layer above; wherein, the insulating and heat-conducting layer part is made of polymer composite material, and the other part of the insulating and heat-conducting layer is made of ceramic material; the thick copper layer is hot-pressed and formed on the insulating and heat-conducting layer; wherein , the bottom of the thick copper layer is formed with an arc chamfer, and the bottom of the thick copper layer is embedded in the insulating and heat-conducting layer; the bonding layer is formed on the thick copper layer; the IGBT chip layer is formed over the bonding layer.
在一優選實施例中,所述絕緣導熱層的陶瓷材料占所述絕緣導熱層重量的50~95%。 In a preferred embodiment, the ceramic material of the insulating and heat-conducting layer accounts for 50-95% of the weight of the insulating and heat-conducting layer.
在一優選實施例中,所述厚銅層底部形成的圓弧導角的半徑為R0.3~R5mm。 In a preferred embodiment, the radius of the arc chamfer formed at the bottom of the thick copper layer is R0.3-R5mm.
在一優選實施例中,所述厚銅層的厚度為1000~10000μm。 In a preferred embodiment, the thick copper layer has a thickness of 1000-10000 μm.
為了解決上述的技術問題,本發明另提供一種形成IGBT模組散熱結構的方法,包括:(a)提供一壓合模具;(b)將至少一厚銅板放入所述壓合模具中,且使所述至少一厚銅板齊平於所述壓合模具,且所述至少一厚銅板底部形成有圓弧導角;(c)將所述壓合模具連同所述至少一厚銅板熱壓合至一形成有絕緣導熱層的散熱層之上,使所述至少一厚銅板底部嵌入於所述絕緣導熱層中,從而使所述至少一厚銅板形成為一厚銅層而形 成於所述絕緣導熱層之上;(d)將所述壓合模具移除;(e)形成一接合層於所述厚銅層之上;(f)形成一IGBT晶片層於所述接合層之上。 In order to solve the above-mentioned technical problems, the present invention further provides a method for forming a heat dissipation structure of an IGBT module, comprising: (a) providing a pressing mold; (b) putting at least one thick copper plate into the pressing mold, and Make the at least one thick copper plate flush with the pressing mold, and the bottom of the at least one thick copper plate is formed with an arc chamfer; (c) hot pressing the pressing mold together with the at least one thick copper plate On a heat dissipation layer formed with an insulating and heat-conducting layer, the bottom of the at least one thick copper plate is embedded in the insulating and heat-conducting layer, so that the at least one thick copper plate is formed as a thick copper layer (d) remove the pressing mold; (e) form a bonding layer on the thick copper layer; (f) form an IGBT chip layer on the bonding layer above.
在一優選實施例中,所述壓合模具是一防沾黏壓合模具。 In a preferred embodiment, the pressing mold is an anti-sticking pressing mold.
在一優選實施例中,所述壓合模具形成有至少一鏤空區域供放置所述至少一厚銅板。 In a preferred embodiment, the pressing mold is formed with at least one hollow area for placing the at least one thick copper plate.
在一優選實施例中,所述壓合模具的面積與所述散熱層的面積一致。 In a preferred embodiment, the area of the pressing mold is consistent with the area of the heat dissipation layer.
本發明的有益效果至少在於,本發明絕緣導熱層部分是由高分子複合材料所構成,而能達到絕緣以及接合的目的。再者,本發明絕緣導熱層其它部分是由陶瓷材料所構成,而能提高導熱效果。並且,本發明厚銅層底部形成有圓弧導角,使得厚銅層底部嵌入於絕緣導熱層時,絕緣導熱層不易受壓而破裂。並且,本發明透過厚銅層及絕緣導熱層,以將IGBT晶片產生的熱量迅速且均勻的導到整個散熱層的散熱鰭片上,相較於現有的IGBT模組結構的DBC板,本發明可同時具備有厚銅層散熱均勻性和絕緣導熱層的絕緣性及導熱性,並且無需透過銲接層而是直接在散熱層表面上形成絕緣導熱層,不會因銲接層造成有空銲問題及介面阻抗問題而影響到導熱性能,也不會因DBC板的多層結構而影響到導熱性能,使本發明散熱層能發揮最大的吸熱及散熱效能。 The beneficial effects of the present invention at least lie in that the insulation and heat conduction layer of the present invention is partly made of polymer composite materials, so that the purpose of insulation and bonding can be achieved. Furthermore, the other parts of the insulation and heat conduction layer of the present invention are made of ceramic materials, which can improve the heat conduction effect. Moreover, the bottom of the thick copper layer of the present invention is formed with a circular arc leading angle, so that when the bottom of the thick copper layer is embedded in the insulating and heat-conducting layer, the insulating and heat-conducting layer is not easily broken due to pressure. Moreover, the present invention uses the thick copper layer and the insulating and heat-conducting layer to quickly and evenly guide the heat generated by the IGBT chip to the heat dissipation fins of the entire heat dissipation layer. Compared with the DBC board of the existing IGBT module structure, the present invention can At the same time, it has the heat dissipation uniformity of the thick copper layer and the insulation and thermal conductivity of the insulating and heat-conducting layer, and does not need to pass through the solder layer but directly forms the insulating and heat-conducting layer on the surface of the heat-dissipating layer, which will not cause the problem of empty soldering and interface due to the soldering layer The thermal conductivity is affected by the impedance problem, and the thermal conductivity will not be affected by the multi-layer structure of the DBC board, so that the heat dissipation layer of the present invention can exert the maximum heat absorption and heat dissipation performance.
為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本發明加以限制。 In order to further understand the features and technical content of the present invention, please refer to the following detailed description and drawings related to the present invention. However, the provided drawings are only for reference and description, and are not intended to limit the present invention.
11A:IGBT晶片層 11A: IGBT chip layer
12A:上銲接層 12A: Upper welding layer
13A:DBC板 13A: DBC board
131A:上薄銅層 131A: upper thin copper layer
132A:陶瓷層 132A: ceramic layer
133A:下薄銅層 133A: lower thin copper layer
14A:下銲接層 14A: Lower soldering layer
15A:散熱層 15A: heat dissipation layer
11:IGBT晶片層 11: IGBT chip layer
111:IGBT晶片 111:IGBT chip
12:接合層 12: Bonding layer
13:厚銅層 13: thick copper layer
130:厚銅板 130: thick copper plate
131:圓弧導角 131: arc lead angle
14:絕緣導熱層 14: Insulation and heat conduction layer
15:散熱層 15: heat dissipation layer
900:壓合模具 900: Pressing mold
901:鏤空區域 901: hollow area
圖1為現有技術的IGBT模組散熱結構側視分解示意圖。 FIG. 1 is an exploded schematic diagram of a side view of a heat dissipation structure of an IGBT module in the prior art.
圖2為現有技術的IGBT模組散熱結構側視示意圖。 FIG. 2 is a schematic side view of the heat dissipation structure of the IGBT module in the prior art.
圖3為本發明的IGBT模組散熱結構分解側視示意圖。 Fig. 3 is a schematic exploded side view of the heat dissipation structure of the IGBT module of the present invention.
圖4為本發明的IGBT模組散熱結構側視示意圖。 Fig. 4 is a schematic side view of the heat dissipation structure of the IGBT module of the present invention.
圖5至圖9為本發明的IGBT模組散熱結構的形成過程示意圖。 5 to 9 are schematic diagrams of the forming process of the heat dissipation structure of the IGBT module of the present invention.
以下是通過特定的具體實施例來說明本發明所公開有關的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不背離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。 The following are specific examples to illustrate the implementation methods disclosed in the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only for simple illustration, and are not drawn according to the actual size, which is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention. In addition, the term "or" used herein may include any one or a combination of more of the associated listed items depending on the actual situation.
請參考圖3及圖4,本發明實施例提供一種IGBT模組散熱結構。如圖所示,根據本發明所提供的IGBT模組散熱結構,從上到下依序為IGBT晶片層11、接合層12、厚銅層13、絕緣導熱層14、以及散熱層15。
Please refer to FIG. 3 and FIG. 4 , an embodiment of the present invention provides a heat dissipation structure for an IGBT module. As shown in the figure, the heat dissipation structure of the IGBT module provided by the present invention includes the
所述絕緣導熱層14形成在所述散熱層15之上。其中,所述散熱層15可以是鋁製散熱器(heat sink)、水冷散熱器,也可是具有散熱作用的金屬板,然並不侷限於此。並且,所述絕緣導熱層14部分是由高分子複合材料(polymer composite)所構成,而能達到絕緣以及接合的目的。再者,所述絕緣導熱層14其它部分是由陶瓷材料所構成,從而能提高導熱效果。
The insulation and
進一步來說,所述絕緣導熱層14所包含的高分子複合材料可
以是環氧樹脂複合材料,以用來形成絕緣。另外,所述絕緣導熱層14所包含的陶瓷材料較佳是占所述絕緣導熱層14重量的50~95%,以達到最佳的導熱效果。
Further, the polymer composite material contained in the insulating and heat-conducting
在一實施例中,所述絕緣導熱層14可以是環氧樹脂複合材料加入陶瓷粉末混合而形成,然並不侷限於此。
In one embodiment, the insulating and heat-conducting
所述厚銅層13形成在所述絕緣導熱層14之上,使所述厚銅層13與所述散熱層15之間能透過所述絕緣導熱層14形成絕緣,且使所述厚銅層13能透過所述絕緣導熱層14將熱傳導至所述散熱層15。
The
進一步來說,所述厚銅層13是以熱壓合方式接合於包含有陶瓷材料的所述絕緣導熱層14,且所述厚銅層13可以是由至少一厚銅板130所構成。並且,為了避免所述厚銅板130熱壓合至所述絕緣導熱層14形成所述厚銅層13時,所述絕緣導熱層14容易受到所述厚銅板130尖角壓力而破裂。因此,本實施例的厚銅板130,也可以說是厚銅層13,其底部形成有圓弧導角131,使得所述厚銅層13底部嵌入於所述絕緣導熱層14時,所述絕緣導熱層14不易受壓而破裂。
Further, the
較佳來說,本實施例的所述厚銅層13底部形成的圓弧導角131的半徑為R0.3~R5mm,使得所述厚銅層13底部嵌入於所述絕緣導熱層14時,所述絕緣導熱層14不會受壓而破裂。
Preferably, the radius of the
在本實施例中,由於所述厚銅層13是以熱壓合方式嵌入於所述絕緣導熱層14,使得所述厚銅層13的厚度至少可以大於1000μm,甚至可以到達10000μm。因此,相較於現有的IGBT模組結構的DBC板的薄銅層約為300μm,本發明的IGBT模組散熱結構透過所述厚銅層13的厚度為1000~10000μm,而能夠有效增加散熱均勻性與整體熱傳導效率。
In this embodiment, since the
所述接合層12形成在所述厚銅層13之上,所述IGBT晶片層
11形成在所述接合層12之上。所述接合層12可以是錫接合層,但也可以是銀燒結層。所述IGBT晶片層11可以是由至少一IGBT晶片111所構成。並且,所述IGBT晶片層11是透過所述接合層12與所述厚銅層13形成連接。當所述IGBT晶片111發熱時,可藉由所述厚銅層13和所述絕緣導熱層14將熱量傳導至所述散熱層15,以向外散熱。
The
請參考圖5至圖9,本發明實施例提供一種形成IGBT模組散熱結構的方法,主要包括以下步驟: Please refer to FIG. 5 to FIG. 9. The embodiment of the present invention provides a method for forming a heat dissipation structure of an IGBT module, which mainly includes the following steps:
(a)提供一壓合模具900。其中,所述壓合模具900可以是以金屬、橡膠、或塑膠所製成,但實際上各種可避免沾黏的材質均可使用,而不以上述為限。也就是說,本實施例的壓合模具900可以是一防沾黏壓合模具。
(a) A
(b)將至少一厚銅板130放入所述壓合模具900中,所述至少一厚銅板130可以是齊平於所述壓合模具900,以便於進行熱壓合。其中,所述壓合模具900形成有至少一鏤空區域901可放置至少一厚銅板130。本實施例的壓合模具900形成有三個鏤空區域901可放置三個厚銅板130,且所述厚銅板130底部形成有圓弧導角131。並且,本實施例的壓合模具900的面積可以與散熱器(也就是散熱層15)的面積一致,以便於定位。
(b) Put at least one
(c)將所述壓合模具900連同所述至少一厚銅板130一起進行熱壓合至一形成有絕緣導熱層14的散熱層15上,使所述至少一厚銅板130底部嵌入於所述絕緣導熱層14中,從而使所述至少一厚銅板130形成為一厚銅層13而形成於所述絕緣導熱層14之上。由於本實施例的厚銅板130底部形成有圓弧導角131,使得所述厚銅板130底部嵌入於所述絕緣導熱層14時,所述絕緣導熱層14不易受壓而破裂。在其它實施例中,多個厚銅板130可以預先形成預定圖形,以將需要的預定圖形利用轉印的方式來形成在絕
緣導熱層14之上。
(c) Thermally press-bond the
(d)將所述壓合模具900移除。由於所述壓合模具900是防沾黏壓合模具,使得熱壓合結束後能輕易地拆除所述壓合模具900。
(d) removing the
(e)形成一接合層12於所述厚銅層13之上。
(e) Forming a
(f)形成一IGBT晶片層11於所述接合層12之上。
(f) forming an
綜合以上所述,本發明的所述絕緣導熱層14部分是由高分子複合材料所構成,而能達到絕緣以及接合的目的。再者,本發明的所述絕緣導熱層14其它部分是由陶瓷材料所構成,而能提高導熱效果。並且,本發明的所述厚銅層13底部形成有圓弧導角,使得所述厚銅層13底部嵌入於所述絕緣導熱層14時,所述絕緣導熱層14不易受壓而破裂。並且,本發明透過所述厚銅層13及所述絕緣導熱層14,以將IGBT晶片產生的熱量迅速且均勻的導到整個所述散熱層15的散熱鰭片上,相較於現有的IGBT模組結構的DBC板,本發明可同時具備有厚銅層13散熱均勻性和絕緣導熱層14的絕緣性及導熱性,並且無需透過銲接層而是直接在散熱層表面上形成絕緣導熱層,不會因銲接層造成有空銲問題及介面阻抗問題而影響到導熱性能,也不會因DBC板的多層結構而影響到導熱性能,使本發明散熱層能發揮最大的吸熱及散熱效能。
Based on the above, the insulating and heat-conducting
以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的申請專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的申請專利範圍內。 The content disclosed above is only a preferred feasible embodiment of the present invention, and does not therefore limit the scope of the patent application of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the application of the present invention. within the scope of the patent.
11:IGBT晶片層 11: IGBT chip layer
111:IGBT晶片 111:IGBT chip
12:接合層 12: Bonding layer
13:厚銅層 13: thick copper layer
130:厚銅板 130: thick copper plate
131:圓弧導角 131: arc lead angle
14:絕緣導熱層 14: Insulation and heat conduction layer
15:散熱層 15: heat dissipation layer
Claims (8)
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Citations (3)
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TWM244580U (en) * | 2002-12-30 | 2004-09-21 | Via Tech Inc | Stack structure of chip package |
TW201017692A (en) * | 2008-10-23 | 2010-05-01 | Wern-Shiarng Jou | A material with high electrical insulation and thermal conductivity and a method to make the material |
TW202021069A (en) * | 2018-11-26 | 2020-06-01 | 艾姆勒車電股份有限公司 | Igbt module with improved heat dissipation structure |
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Publication number | Priority date | Publication date | Assignee | Title |
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TWM244580U (en) * | 2002-12-30 | 2004-09-21 | Via Tech Inc | Stack structure of chip package |
TW201017692A (en) * | 2008-10-23 | 2010-05-01 | Wern-Shiarng Jou | A material with high electrical insulation and thermal conductivity and a method to make the material |
TW202021069A (en) * | 2018-11-26 | 2020-06-01 | 艾姆勒車電股份有限公司 | Igbt module with improved heat dissipation structure |
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