TWI693684B - Igbt module with improved heat dissipation structure - Google Patents
Igbt module with improved heat dissipation structure Download PDFInfo
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本發明涉及IGBT模組,具體來說是涉及IGBT模組散熱結構改良。 The invention relates to an IGBT module, in particular to an improvement of the heat dissipation structure of the IGBT module.
目前電動汽車/混合動力汽車所使用的大功率整流器(Inverter)多採用IGBT(Insulated Gate Bipolar Transistor:絕緣閘極雙極性電晶體)晶片。因此,大功率整流器工作時所產生的熱量,將導致IGBT晶片溫度升高,如果沒有適當的散熱措施,就可能使IGBT晶片的溫度超過所允許的溫度,從而導致性能惡化以致損壞。因此,IGBT散熱技術成為相關技術人員急於解決的問題。 At present, high-power rectifiers (Inverters) used in electric vehicles/hybrid vehicles mostly use IGBT (Insulated Gate Bipolar Transistor: Insulated Gate Bipolar Transistor) chips. Therefore, the heat generated during the operation of the high-power rectifier will cause the temperature of the IGBT wafer to rise. Without proper heat dissipation measures, the temperature of the IGBT wafer may exceed the allowable temperature, resulting in deterioration of performance and damage. Therefore, IGBT heat dissipation technology has become a problem that relevant technicians are eager to solve.
目前DBC(Direct Bonding Copper:陶瓷-金屬複合板結構)板已成為IGBT模組散熱結構的首選材料。請參考圖1及圖2所示,為一種現有的IGBT模組散熱結構,其主要包括有IGBT晶片層11A、上焊接層12A、DBC板13A、下焊接層14A、及散熱層15A。其中,DBC板13A由上到下依次為上薄銅層131A、陶瓷層132A和下薄銅層133A。然而,DBC板13A為多層結構且導熱能力有限,當IGBT晶片層11A的IGBT晶片111A產生熱量時,不能及時通過DBC板13A傳遞到散熱層15A,並且DBC板13A與散熱層15A之間必需透過下焊接層14A才能夠形成連接,而一整片的下焊接層14A會極易出現空焊現象,且會增加介面阻抗,從而影
響到導熱性能。
At present, DBC (Direct Bonding Copper: ceramic-metal composite board structure) board has become the first choice for the heat dissipation structure of IGBT modules. Please refer to FIG. 1 and FIG. 2, which is a conventional IGBT module heat dissipation structure, which mainly includes an
於是本發明人有感於上述缺失之可改善,乃特潛心研究並配合學理之運用,終於提出一種設計合理且有效改善上述缺失之本發明。 Therefore, the inventor feels that the above-mentioned deficiency can be improved, and is dedicated to study and cooperate with the application of the theory, and finally proposes a reasonable design and effectively improves the above-mentioned deficiency of the present invention.
本發明之主要目的在於提供一種IGBT模組散熱結構改良,以解決上述問題。 The main purpose of the present invention is to provide an improved IGBT module heat dissipation structure to solve the above problems.
本發明實施例在於提供一種IGBT模組散熱結構改良,包括:IGBT晶片層、接合層、厚銅層、導熱絕緣層、及散熱層,所述導熱絕緣層設置在所述散熱層之上,所述厚銅層設置在所述導熱絕緣層之上,所述接合層之設置在所述厚銅層之上,所述IGBT晶片層設置在所述接合層之上。 An embodiment of the present invention is to provide an improved IGBT module heat dissipation structure, including: an IGBT chip layer, a bonding layer, a thick copper layer, a thermally conductive insulating layer, and a heat dissipating layer. The thermally conductive insulating layer is disposed on the heat dissipating layer. The thick copper layer is disposed on the thermally conductive insulating layer, the bonding layer is disposed on the thick copper layer, and the IGBT wafer layer is disposed on the bonding layer.
優選地,所述導熱絕緣層包含有第一高分子複合層及第二高分子複合層,所述第一高分子複合層網印於所述散熱層之上,所述第二高分子複合層網印於所述第一高分子複合層之上,且所述厚銅層熱壓接合於所述第二高分子複合層之上。 Preferably, the thermally conductive insulating layer includes a first polymer composite layer and a second polymer composite layer, the first polymer composite layer is screen printed on the heat dissipation layer, and the second polymer composite layer The screen is printed on the first polymer composite layer, and the thick copper layer is thermocompression bonded on the second polymer composite layer.
優選地,所述第一高分子複合層為環氧樹脂層、聚醯亞胺層、聚丙烯層的其中之一。 Preferably, the first polymer composite layer is one of an epoxy resin layer, a polyimide layer, and a polypropylene layer.
優選地,所述第一高分子複合層包含有填料,所述填料選自氧化鋁、氮化鋁、氮化矽、碳化矽、氮化硼的至少其一。 Preferably, the first polymer composite layer includes a filler, and the filler is at least one selected from alumina, aluminum nitride, silicon nitride, silicon carbide, and boron nitride.
優選地,所述第二高分子複合層為環氧樹脂層、聚醯亞胺層、聚丙烯層的其中之一。 Preferably, the second polymer composite layer is one of an epoxy resin layer, a polyimide layer, and a polypropylene layer.
優選地,所述第二高分子複合層包含有填料,所述填料選自氧化鋁、氮化鋁、氮化矽、碳化矽、氮化硼的至少其一。 Preferably, the second polymer composite layer includes a filler, and the filler is selected from at least one of aluminum oxide, aluminum nitride, silicon nitride, silicon carbide, and boron nitride.
優選地,所述第一高分子複合層的厚度為20~200μm,所述第二高分子複合層的厚度為20~200μm。 Preferably, the thickness of the first polymer composite layer is 20-200 μm, and the thickness of the second polymer composite layer is 20-200 μm.
優選地,所述厚銅層的厚度大於等於1000μm。 Preferably, the thickness of the thick copper layer is greater than or equal to 1000 μm.
優選地,所述導熱絕緣層包含有第一高分子複合層、第二高分子複合層、第三高分子複合層、及第四高分子複合層,所述第一高分子複合層網印於所述散熱層之上、所述第二高分子複合層網印於所述第一高分子複合層之上、所述第三高分子複合層網印於所述第二高分子複合層之上、所述第四高分子複合層網印於所述第三高分子複合層之上、所述厚銅層熱壓接合於所述第四高分子複合層之上。 Preferably, the thermally conductive insulating layer includes a first polymer composite layer, a second polymer composite layer, a third polymer composite layer, and a fourth polymer composite layer, and the first polymer composite layer is screen printed on The heat dissipation layer, the second polymer composite layer is screen printed on the first polymer composite layer, and the third polymer composite layer is screen printed on the second polymer composite layer The fourth polymer composite layer is screen printed on the third polymer composite layer, and the thick copper layer is thermocompression bonded on the fourth polymer composite layer.
優選地,所述第一高分子複合層、所述第二高分子複合層、所述第三高分子複合層、及所述第四高分子複合層的厚度分別為20~200μm。 Preferably, the thicknesses of the first polymer composite layer, the second polymer composite layer, the third polymer composite layer, and the fourth polymer composite layer are 20-200 μm, respectively.
是以,本發明透過厚銅層與散熱層之間設置有導熱絕緣層,以將IGBT晶片的熱量迅速且均勻的經由厚銅層與導熱絕緣層而導到整個散熱層的散熱鰭片上,相較於現有的IGBT模組散熱結構的DBC板,本發明可同時具備有厚銅層散熱均勻性和導熱絕緣層的絕緣性及導熱性,並且無需透過焊接層而是直接在散熱層表面上形成導熱絕緣層,不會因焊接層造成有空焊問題及介面阻抗問題而影響到導熱性能,也不會因DBC板的多層結構而影響到導熱性能,使本發明散熱層能發揮最大的吸熱及散熱效能。 Therefore, in the present invention, a heat conductive insulating layer is provided between the thick copper layer and the heat dissipation layer, so that the heat of the IGBT chip is quickly and uniformly conducted to the heat dissipation fins of the entire heat dissipation layer through the thick copper layer and the heat dissipation layer. Compared with the existing DBC board of the IGBT module heat dissipation structure, the present invention can have both the heat dissipation uniformity of the thick copper layer and the insulation and thermal conductivity of the thermally conductive insulation layer, and it is directly formed on the surface of the heat dissipation layer without passing through the welding layer The thermally conductive insulating layer will not affect the thermal conductivity due to the voiding problem and the interface impedance problem caused by the solder layer, nor will it affect the thermal conductivity due to the multilayer structure of the DBC board, so that the heat dissipation layer of the present invention can maximize heat absorption and Cooling efficiency.
11A‧‧‧IGBT晶片層 11A‧‧‧IGBT chip layer
12A‧‧‧上焊接層 12A‧‧‧Upper welding layer
13A‧‧‧DBC板 13A‧‧‧DBC board
131A‧‧‧上薄銅層 131A‧‧‧upper thin copper layer
132A‧‧‧陶瓷層 132A‧‧‧Ceramic layer
133A‧‧‧下薄銅層 133A‧‧‧Lower copper layer
14A‧‧‧下焊接層 14A‧‧‧Lower welding layer
15A‧‧‧散熱層 15A‧‧‧radiation layer
11‧‧‧IGBT晶片層 11‧‧‧IGBT layer
111‧‧‧IGBT晶片 111‧‧‧IGBT chip
12‧‧‧接合層 12‧‧‧Joint layer
13‧‧‧厚銅層 13‧‧‧ thick copper layer
14‧‧‧導熱絕緣層 14‧‧‧ thermal insulation layer
141‧‧‧第一高分子複合層 141‧‧‧The first polymer composite layer
142‧‧‧第二高分子複合層 142‧‧‧The second polymer composite layer
143‧‧‧第三高分子複合層 143‧‧‧The third polymer composite layer
144‧‧‧第四高分子複合層 144‧‧‧The fourth polymer composite layer
15‧‧‧散熱層 15‧‧‧radiation layer
圖1為現有技術的IGBT模組散熱結構側視分解示意圖。 FIG. 1 is an exploded schematic side view of a heat dissipation structure of an IGBT module in the prior art.
圖2為現有技術的IGBT模組散熱結構側視示意圖。 2 is a schematic side view of a heat dissipation structure of an IGBT module in the prior art.
圖3為本發明的IGBT模組散熱結構改良分解側視示意圖。 FIG. 3 is a schematic exploded side view of the improved IGBT module heat dissipation structure of the present invention.
圖4為本發明的IGBT模組散熱結構改良側視示意圖。 4 is a schematic side view of the improved IGBT module heat dissipation structure of the present invention.
圖5為圖4的V部分的放大示意圖。 FIG. 5 is an enlarged schematic view of part V of FIG. 4.
圖6為本發明的另一IGBT模組散熱結構改良側視示意圖。 6 is a schematic side view of another improved IGBT module heat dissipation structure of the present invention.
圖7為圖6的VII部分的放大示意圖。 7 is an enlarged schematic view of part VII of FIG. 6.
以下是通過特定的具體實施例來說明本發明所公開有關“IGBT模組散熱結構改良”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的精神下進行各種修飾與變更。另外,本發明的附圖僅為示意說明,並非依實際尺寸的描繪,予以聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的技術範圍。 The following is a specific specific example to illustrate the implementation of the "IGBT module heat dissipation structure improvement" disclosed by the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments. Various details in this specification can also be based on different viewpoints and applications, and various modifications and changes can be made without departing from the spirit of the present invention. In addition, the drawings of the present invention are for illustrative purposes only, and are not depicted according to actual dimensions. The following embodiments will further describe the related technical content of the present invention in detail, but the disclosed content is not intended to limit the technical scope of the present invention.
請參考圖3、圖4、及圖5,為本發明所提供的一種IGBT模組散熱結構改良。如圖3、4所示,根據本發明所提供的IGBT模組散熱結構改良,從上到下依序為IGBT晶片層11、接合層12、厚銅層13、導熱絕緣層14、及散熱層15。
Please refer to FIG. 3, FIG. 4, and FIG. 5 for an improved IGBT module heat dissipation structure provided by the present invention. As shown in FIGS. 3 and 4, according to the improvement of the heat dissipation structure of the IGBT module provided by the present invention, from top to bottom, the
導熱絕緣層14(thermally-conductive and electrically-insulating layer)設置在所述散熱層15上。散熱層15可以是鋁製散熱器(heat sink),也可是具散熱作用的金屬板。並且,導熱絕緣層14是由高分子複合材(polymer composite)所構成,而能達到絕緣、導熱、以及接合的目的。因此,相較於現有的IGBT模組散熱結構的DBC板與散熱層之間必需透過焊接層才能夠形成連接,本發明無需透過焊接層而是直接在散熱層15表面上形成導熱絕緣層14,不會因焊接層造成有空焊問題及介面阻抗問題而影響到導熱性能,也不會因DBC板的多層結構而影響到導熱性能。
A thermally-conductive and electrically-insulating
詳細來說,本實施例的導熱絕緣層14如圖5所示,包含有第一高分子複合層141及第二高分子複合層142。第一高分子複合層141接合於散熱層15之上,第二高分子複合層142接合於第一高
分子複合層141之上。更細部來說,第一高分子複合層141能以網印或熱壓方式接合於散熱層15之上,第二高分子複合層142能以網印或熱壓方式接合於第一高分子複合層141之上。
In detail, as shown in FIG. 5, the thermally conductive insulating
第一高分子複合層141可以是環氧樹脂層(epoxy-based composite),用來形成絕緣和導熱。並且,第一高分子複合層141可包含有填料(filler),如氧化鋁、氮化鋁、氮化矽、碳化矽、氮化硼的至少其一。第二高分子複合層142也可以是環氧樹脂層,用來接合於厚銅層13。第二高分子複合層141也可包含有填料。
The first
在其它實施例中,第一高分子複合層141可以是聚醯亞胺層(polyimide-based composite)、或是聚丙烯層(PP-based composite)。並且,第二高分子複合層142也可以是聚醯亞胺層、或是聚丙烯層。因此,第一高分子複合層141與第二高分子複合層142的構成可以是相同或不相同。
In other embodiments, the first
在本實施例中,第一高分子複合層141的厚度為20~200μm(微米),較佳為100μm,能達到較佳的絕緣和導熱作用。第二高分子複合層142的厚度為20~200μm(微米),較佳為100μm。
In this embodiment, the thickness of the first
厚銅層13設置在導熱絕緣層14之上,使厚銅層13與散熱層15之間透過導熱絕緣層14形成絕緣,且使厚銅層13透過導熱絕緣層14將熱傳導至散熱層15。
The
詳細來說,厚銅層13是以熱壓合方式接合於導熱絕緣層14的第二高分子複合層142。並且,由於厚銅層13是以熱壓合方式接合於導熱絕緣層14的第二高分子複合層142,因此僅有第二高分子複合層142可能因熱壓形變,而第一高分子複合層141則可以維持原來預定的厚度,而不會影響到絕緣和導熱作用。
In detail, the
再者,由於厚銅層13是以熱壓合方式接合於導熱絕緣層14的第二高分子複合層142,使厚銅層13可以達到較厚的厚度。在
本實施例中,厚銅層13的厚度至少可以大於1000μm。因此,相較於現有的IGBT模組散熱結構的DBC板的薄銅層約為300μm,本發明的IGBT模組散熱結構透過厚銅層13而能增加散熱均勻性與整體熱傳導效率。另外,本實施例的厚銅層13可以是由厚銅板所構成。
Furthermore, since the
接合層12設置在厚銅層13之上,IGBT晶片層11設置在接合層12之上。接合層12可以是錫接合層,但也可以是銀燒結層。IGBT晶片層11可以是由至少一IGBT晶片111所構成。並且,IGBT晶片層11是透過接合層12與厚銅層13形成連接。當IGBT晶片111發熱時,可藉由厚銅層13和導熱絕緣層14將熱量傳導至散熱層15,以向外散熱。
The
請參考圖6、及圖7,為本發明所提供的另一種IGBT模組散熱結構改良。如圖6、7所示,根據本發明所提供的IGBT模組散熱結構改良,從上到下依序為IGBT晶片層11、接合層12、厚銅層13、導熱絕緣層14、及散熱層15。
Please refer to FIG. 6 and FIG. 7 for another IGBT module heat dissipation structure improvement provided by the present invention. As shown in FIGS. 6 and 7, the heat dissipation structure of the IGBT module provided by the present invention is improved. The
詳細來說,本實施例的導熱絕緣層14如圖7所示,包含有第一高分子複合層141、第二高分子複合層142、第三高分子複合層143、及第四高分子複合層144。也可以說,第一高分子複合層141為基底,第二高分子複合層142為多層結構。更細部來說,第一高分子複合層141網印於散熱層15之上、第二高分子複合層142網印於第一高分子複合層141之上、第三高分子複合層143網印於第二高分子複合層142之上、第四高分子複合層143網印於第三高分子複合層143之上、厚銅層13熱壓接合於第四高分子複合層144之上。因此,透過本實施例的導熱絕緣層14具有至少兩層以上的高分子複合層,且每一高分子複合層的厚度皆為20~200μm(微米),使厚銅層13能更好的以熱壓合方式接合於導熱絕緣層
14,且使導熱絕緣層14能更好的達到絕緣和導熱作用。
In detail, as shown in FIG. 7, the thermally conductive insulating
綜合以上所述,本發明透過厚銅層13與散熱層15之間設置有導熱絕緣層14,以將IGBT晶片111的熱量迅速且均勻的經由厚銅層13與導熱絕緣層14而導到整個散熱層15的散熱鰭片上,相較於現有的IGBT模組散熱結構的DBC板,本發明可同時具備有厚銅層13散熱均勻性和導熱絕緣層14的絕緣性及導熱性,並且無需透過焊接層而是直接在散熱層15表面上形成導熱絕緣層14,不會因焊接層造成有空焊問題及介面阻抗問題而影響到導熱性能,也不會因DBC板的多層結構而影響到導熱性能,使本發明散熱層15能發揮最大的吸熱及散熱效能。
In summary, according to the present invention, the heat conductive insulating
以上所述僅為本發明之較佳實施例,其並非用以侷限本發明之專利範圍,故舉凡運用本發明說明書及圖式內容所為的等效變化,均同理皆包含於本發明的權利保護範圍內,合予陳明。 The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Therefore, any equivalent changes in the description and drawings of the present invention are included in the rights of the present invention. Within the scope of protection, Chen Ming.
11‧‧‧IGBT晶片層 11‧‧‧IGBT layer
111‧‧‧IGBT晶片 111‧‧‧IGBT chip
12‧‧‧接合層 12‧‧‧Joint layer
13‧‧‧厚銅層 13‧‧‧ thick copper layer
14‧‧‧導熱絕緣層 14‧‧‧ thermal insulation layer
15‧‧‧散熱層 15‧‧‧radiation layer
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Citations (3)
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TW201444962A (en) * | 2013-03-07 | 2014-12-01 | Sumitomo Bakelite Co | Device, composition for adhesive agent, and adhesive sheet |
CN105047624A (en) * | 2015-07-01 | 2015-11-11 | 四川广义微电子股份有限公司 | IGBT chip heat conduction module and preparation method thereof |
TWM566403U (en) * | 2018-05-28 | 2018-09-01 | 艾姆勒車電股份有限公司 | Heat dissipation structure of IGBT module |
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TW201444962A (en) * | 2013-03-07 | 2014-12-01 | Sumitomo Bakelite Co | Device, composition for adhesive agent, and adhesive sheet |
CN105047624A (en) * | 2015-07-01 | 2015-11-11 | 四川广义微电子股份有限公司 | IGBT chip heat conduction module and preparation method thereof |
TWM566403U (en) * | 2018-05-28 | 2018-09-01 | 艾姆勒車電股份有限公司 | Heat dissipation structure of IGBT module |
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