TWI785920B - 測試裝置 - Google Patents

測試裝置 Download PDF

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Publication number
TWI785920B
TWI785920B TW110145712A TW110145712A TWI785920B TW I785920 B TWI785920 B TW I785920B TW 110145712 A TW110145712 A TW 110145712A TW 110145712 A TW110145712 A TW 110145712A TW I785920 B TWI785920 B TW I785920B
Authority
TW
Taiwan
Prior art keywords
pusher
pair
test
test device
tested
Prior art date
Application number
TW110145712A
Other languages
English (en)
Chinese (zh)
Other versions
TW202229891A (zh
Inventor
嚴熙一
Original Assignee
南韓商李諾工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商李諾工業股份有限公司 filed Critical 南韓商李諾工業股份有限公司
Publication of TW202229891A publication Critical patent/TW202229891A/zh
Application granted granted Critical
Publication of TWI785920B publication Critical patent/TWI785920B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Undergarments, Swaddling Clothes, Handkerchiefs Or Underwear Materials (AREA)
  • Glass Compositions (AREA)
TW110145712A 2020-12-29 2021-12-07 測試裝置 TWI785920B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020200185994A KR102433590B1 (ko) 2020-12-29 2020-12-29 검사장치
KR10-2020-0185994 2020-12-29

Publications (2)

Publication Number Publication Date
TW202229891A TW202229891A (zh) 2022-08-01
TWI785920B true TWI785920B (zh) 2022-12-01

Family

ID=82259800

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110145712A TWI785920B (zh) 2020-12-29 2021-12-07 測試裝置

Country Status (5)

Country Link
JP (1) JP2024500523A (ko)
KR (1) KR102433590B1 (ko)
CN (1) CN116670518A (ko)
TW (1) TWI785920B (ko)
WO (1) WO2022145934A1 (ko)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202141744U (zh) * 2011-06-30 2012-02-08 上海韬盛电子科技有限公司 一种半导体测试座压盖
TW201632887A (zh) * 2015-02-05 2016-09-16 李諾工業股份有限公司 測試裝置
CN208432692U (zh) * 2018-06-20 2019-01-25 法特迪精密科技（苏州）有限公司 一种大电流特殊管脚芯片测试插座
US20190207351A1 (en) * 2016-05-13 2019-07-04 Enplas Corporation Socket for electrical component
TW202014719A (zh) * 2018-10-10 2020-04-16 黃東源 用於測試ic的插座裝置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM350875U (en) * 2008-07-14 2009-02-11 Hon Hai Prec Ind Co Ltd Electrical connector
KR20150112425A (ko) * 2014-03-28 2015-10-07 한국전자통신연구원 반도체 소자 테스트 소켓
KR101599049B1 (ko) * 2014-11-28 2016-03-04 주식회사 세미코어 반도체 칩 검사장치

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202141744U (zh) * 2011-06-30 2012-02-08 上海韬盛电子科技有限公司 一种半导体测试座压盖
TW201632887A (zh) * 2015-02-05 2016-09-16 李諾工業股份有限公司 測試裝置
US20190207351A1 (en) * 2016-05-13 2019-07-04 Enplas Corporation Socket for electrical component
CN208432692U (zh) * 2018-06-20 2019-01-25 法特迪精密科技（苏州）有限公司 一种大电流特殊管脚芯片测试插座
TW202014719A (zh) * 2018-10-10 2020-04-16 黃東源 用於測試ic的插座裝置

Also Published As

Publication number Publication date
CN116670518A (zh) 2023-08-29
WO2022145934A1 (en) 2022-07-07
KR102433590B1 (ko) 2022-08-19
KR20220094605A (ko) 2022-07-06
JP2024500523A (ja) 2024-01-09
TW202229891A (zh) 2022-08-01

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