TWI772188B - Perforation forming method of a multilayer circuit board, manufacturing method of a multilayer circuit board, multilayer circuit board and multilayer circuit board manufacturing system - Google Patents

Perforation forming method of a multilayer circuit board, manufacturing method of a multilayer circuit board, multilayer circuit board and multilayer circuit board manufacturing system Download PDF

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TWI772188B
TWI772188B TW110135486A TW110135486A TWI772188B TW I772188 B TWI772188 B TW I772188B TW 110135486 A TW110135486 A TW 110135486A TW 110135486 A TW110135486 A TW 110135486A TW I772188 B TWI772188 B TW I772188B
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core
circuit board
board
marking units
multilayer circuit
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TW202315487A (en
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呂政明
桂華榮
徐國彰
孫奇
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健鼎科技股份有限公司
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Abstract

The invention discloses a perforation forming method of a multilayer circuit board, a manufacturing method of a multilayer circuit board, a multilayer circuit board and a multilayer circuit board manufacturing system. The perforation forming method of a multilayer circuit board includes: preparation step: preparing a core board set, which includes a plurality of core boards, each core board has a marking unit, and each marking unit does not overlap each other in the longitudinal direction; scanning step: scanning the core board set to obtain the coordinates of each marking unit; calculation step: use the coordinates to calculate the deformation amount of each core board; forming step: form at least one through hole in the core board set according to each deformation amount and the perforation position information of the circuit board , so that the core board set is composed of a multi-layer circuit board.

Description

多層電路板的穿孔成形方法、多層電路板製造方法、多層電路板及多層電路板製造系統Multilayer circuit board perforation forming method, multilayer circuit board manufacturing method, multilayer circuit board and multilayer circuit board manufacturing system

本發明涉及一種電路板的穿孔成形方法、電路板製造方法、電路板及電路板製造系統,特別是一種多層電路板的穿孔成形方法、多層電路板製造方法、多層電路板及多層電路板製造系統。The invention relates to a perforation forming method for a circuit board, a circuit board manufacturing method, a circuit board and a circuit board manufacturing system, in particular to a perforation forming method for a multi-layer circuit board, a multi-layer circuit board manufacturing method, a multi-layer circuit board and a multi-layer circuit board manufacturing system .

現有常見的多層電路板,是由多片芯板相互壓合而成,各個芯板之間會有彼此電性連通的相關線路,且多層電路板通常會有至少一個電鍍通孔(Plated Through Hole, PTH)或是俗稱的導通孔(via)。電鍍通孔或是俗稱的導通孔的成形方式是:先於多層電路板形成貫穿孔,再於貫穿孔中電鍍導電層。The existing common multi-layer circuit boards are formed by pressing multiple chips to each other, and there are related circuits that are electrically connected to each other between the core boards, and the multi-layer circuit boards usually have at least one plated through hole (Plated Through Hole). , PTH) or commonly known as vias. The forming method of the plated through hole or the commonly known via hole is as follows: forming a through hole in the multilayer circuit board, and then electroplating a conductive layer in the through hole.

如圖1所示,隨著各個芯板上的線路的線徑變小,貫穿孔的孔徑也隨之縮小,為此,利用現有的多層電路板P的相關製造流程,容易發生貫穿孔H超出芯板預定設置有貫穿孔的容許誤差範圍R的問題(業界俗稱偏破),此問題可能會導致芯板中的線路被破壞等,從而導致多層電路板的製造良率下降的問題。As shown in FIG. 1 , as the wire diameters of the lines on each core board become smaller, the diameters of the through-holes also decrease. Therefore, using the related manufacturing process of the existing multilayer circuit board P, it is easy to cause the through-holes H to exceed the The core board is pre-configured with the allowable error range R of the through-holes (commonly known as deflection in the industry), which may lead to the damage of the lines in the core board, etc., thereby leading to the problem of lowering the manufacturing yield of the multilayer circuit board.

本發明公開一種多層電路板的穿孔成形方法、多層電路板製造方法、多層電路板及多層電路板製造系統,主要用以改善習知的多層電路板製造方法,容易出現貫穿孔超出芯板原本預設位置的問題,從而導致多層電路板的製造良率下降的問題。The invention discloses a perforation forming method for a multi-layer circuit board, a method for manufacturing the multi-layer circuit board, a multi-layer circuit board and a multi-layer circuit board manufacturing system, which are mainly used to improve the conventional multi-layer circuit board manufacturing method. The problem of setting position, which leads to the problem of lowering the manufacturing yield of the multilayer circuit board.

本發明的其中一實施例公開一種多層電路板的穿孔成形方法,其包含:一準備步驟:準備一多層芯板組,多層芯板組由相互疊合設置的多個芯板構成,位於多層芯板組彼此相反的兩側的兩個芯板定義為第一芯板,其餘芯板定義為第二芯板,至少一個第二芯板具有至少三個標記單元,任一個標記單元於一縱向方向不與任一個標記單元完全重疊,縱向方向與第一芯板的一表面的一法線相互平行;一掃描步驟:利用一掃描裝置對多層芯板組進行掃描,以取得各個標記單元的一座標;一計算步驟:利用一處理裝置依據各個標記單元所對應的座標及一預設電路板尺寸資訊,計算出具有標記單元的第二芯板的一變形量;一成形步驟:控制一穿孔成形設備,依據各個第一芯板的一變形量、具有標記單元的各個第二芯板的變形量及一電路板穿孔位置資訊,於多層芯板組形成至少一貫穿孔,貫穿孔貫穿各個第一芯板及各個第二芯板,據以使多層芯板組成為一多層電路板。One embodiment of the present invention discloses a perforation forming method for a multi-layer circuit board, which includes: a preparation step: preparing a multi-layer core board group. The two core boards on the opposite sides of the core board group are defined as the first core board, the remaining core boards are defined as the second core board, at least one second core board has at least three marking units, and any marking unit is in a longitudinal direction. The direction does not completely overlap with any marking unit, and the longitudinal direction is parallel to a normal line of a surface of the first core board; a scanning step: use a scanning device to scan the multi-layer core board group to obtain a mark of each marking unit. Coordinates; a calculation step: using a processing device to calculate a deformation amount of the second core board with the marking unit according to the coordinates corresponding to each marking unit and a preset circuit board size information; a forming step: controlling a perforation forming The equipment forms at least one through hole in the multilayer core board group according to a deformation amount of each first core board, a deformation amount of each second core board with marking unit and a circuit board perforation position information, and the through hole penetrates through each first core board board and each second core board, so that the multi-layer core board is composed into a multi-layer circuit board.

本發明的其中一實施例公開一種多層電路板製造方法,其包含:一芯板標記步驟:於多個芯板的至少一寬側面形成至少三個標記單元;一組合步驟:將多個芯板相互固定,以組成一多層芯板組,多層芯板組的任一個標記單元於一縱向方向不與任一個標記單元完全重疊,縱向方向與芯板的一表面的一法線相互平行;一掃描步驟:利用一掃描裝置對多層芯板組進行掃描,以取得各個標記單元的一座標;一計算步驟:利用一處理裝置依據各個芯板的各個標記單元所對應的座標及一預設電路板尺寸資訊,計算出各個芯板的一變形量;一成形步驟:控制一穿孔成形設備,依據變形量及一電路板穿孔位置資訊,於多層芯板組形成至少一貫穿孔,貫穿孔貫穿各個芯板;一導電層形成步驟:於至少一個貫穿孔中形成一導電層,據以使多層芯板組成為一多層電路板。One embodiment of the present invention discloses a method for manufacturing a multilayer circuit board, which includes: a core board marking step: forming at least three marking units on at least one wide side of a plurality of core boards; a combining step: placing a plurality of core boards They are fixed to each other to form a multi-layer core board group, and any marking unit of the multi-layer core board group does not completely overlap with any marking unit in a longitudinal direction, and the longitudinal direction is parallel to a normal line of a surface of the core board; a Scanning step: using a scanning device to scan the multi-layer core board group to obtain the coordinates of each marking unit; a calculating step: using a processing device according to the coordinates corresponding to each marking unit of each core board and a preset circuit board Dimension information to calculate a deformation amount of each core board; a forming step: control a perforation forming equipment, according to the deformation amount and a circuit board perforation position information, form at least one consistent perforation in the multi-layer core board group, and the through hole penetrates each core board ; A conductive layer forming step: forming a conductive layer in at least one through hole, so that the multi-layer core board is formed into a multi-layer circuit board.

本發明的其中一實施例公開一種多層電路板,其是利用本發明的多層電路板製造方法製成。One of the embodiments of the present invention discloses a multilayer circuit board, which is manufactured by the method for manufacturing a multilayer circuit board of the present invention.

本發明的其中一實施例公開一種多層電路板製造系統,其包含一處理裝置、一掃描裝置及一穿孔成形設備,處理裝置能執行本發明的多層電路板製造方法。One embodiment of the present invention discloses a multi-layer circuit board manufacturing system, which includes a processing device, a scanning device, and a perforation forming apparatus, and the processing device can execute the multi-layer circuit board manufacturing method of the present invention.

綜上所述,本發明的多層電路板的穿孔成形方法、多層電路板製造方法、多層電路板及多層電路板製造系統,通過標記單元等設計,可以大幅地降低貫穿孔超出芯板原本預設位置的問題的發生機率,而可有效地提升多層電路板的製造良率。To sum up, the perforation forming method of the multilayer circuit board, the method for manufacturing the multilayer circuit board, the multilayer circuit board and the manufacturing system for the multilayer circuit board of the present invention can be greatly reduced by the design of the marking unit, etc. The probability of occurrence of position problems can be effectively improved, and the manufacturing yield of multilayer circuit boards can be effectively improved.

為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。In order to further understand the features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than make any claims to the protection scope of the present invention. limit.

於以下說明中,如有指出請參閱特定圖式或是如特定圖式所示,其僅是用以強調於後續說明中,所述及的相關內容大部份出現於該特定圖式中,但不限制該後續說明中僅可參考所述特定圖式。In the following description, if it is indicated to refer to a specific figure or as shown in a specific figure, it is only used for emphasis in the subsequent description, and most of the related content mentioned appears in the specific figure, However, it is not limited that only the specific drawings may be referred to in this subsequent description.

請一併參閱圖2至圖5,圖2為本發明的多層電路板的穿孔成形方法的流程示意圖,圖3為本發明的多層電路板的穿孔成形方法的多層電路板的示意圖,圖4為本發明的多層電路板的穿孔成形方法的多層電路板的分解示意圖,圖5為掃描裝置掃描本發明的多層電路板後得到的影像。Please refer to FIG. 2 to FIG. 5 together. FIG. 2 is a schematic flow chart of a method for punching a multilayer circuit board according to the present invention. FIG. 3 is a schematic diagram of a multilayer circuit board according to the method for punching a multilayer circuit board according to the present invention. An exploded schematic view of the multilayer circuit board of the perforation forming method of the multilayer circuit board of the present invention, and FIG. 5 is an image obtained after the scanning device scans the multilayer circuit board of the present invention.

本發明的多層電路板的穿孔成形方法包含以下步驟:The perforation forming method of the multilayer circuit board of the present invention comprises the following steps:

一準備步驟S11:準備一多層芯板組,多層芯板組由相互疊合設置的多個芯板構成,位於多層芯板組彼此相反的兩側的兩個芯板定義為第一芯板,其餘芯板定義為第二芯板,至少一部分的第二芯板具有至少三個標記單元,任一個標記單元於一縱向方向(例如是圖3中的Z軸方向)不與任一個標記單元完全重疊,縱向方向與第一芯板的一表面(例如是第一芯板11的寬側面11A)的一法線相互平行;A preparation step S11: prepare a multi-layer core board group, the multi-layer core board group is composed of a plurality of core boards arranged on top of each other, and the two core boards located on the opposite sides of the multi-layer core board group are defined as the first core board , the rest of the core boards are defined as the second core board, and at least a part of the second core board has at least three marking units, and any marking unit in a longitudinal direction (for example, the Z-axis direction in FIG. 3 ) is not associated with any marking unit Completely overlapping, the longitudinal direction is parallel to a normal line of a surface of the first core board (for example, the wide side 11A of the first core board 11 );

一掃描步驟S12:利用一掃描裝置(例如是X光掃描設備)對多層芯板組進行掃描,以取得各個標記單元的一座標;A scanning step S12: use a scanning device (such as an X-ray scanning device) to scan the multi-layer core board group to obtain the coordinates of each marking unit;

一計算步驟S13:利用一處理裝置依據各個標記單元所對應的座標及一預設電路板尺寸資訊,計算出具有標記單元的第二芯板的一變形量;以及A calculation step S13: using a processing device to calculate a deformation amount of the second core board with the marking units according to the coordinates corresponding to the marking units and a predetermined circuit board size information; and

一成形步驟S14:控制一穿孔成形設備(例如是雷射穿孔設備),依據一第一芯板的變形量、第二芯板的變形量及一電路板穿孔位置資訊,於多層芯板組形成至少一貫穿孔。其中,所述貫穿孔貫穿各個第一芯板及各個第二芯板設置。A forming step S14 : controlling a perforation forming equipment (such as a laser perforating equipment), according to the deformation amount of a first core board, the deformation amount of the second core board and a circuit board perforation position information, to form a multi-layer core board group Perforated at least consistently. Wherein, the through holes are arranged through each of the first core boards and each of the second core boards.

如圖3及圖4所示,其顯示為所述準備步驟S11中所述的多層芯板組100。多層芯板組100例如可以是包含4個芯板,其中兩個芯板定義為兩個第一芯板11、12,另外兩個芯板則定義為兩個第二芯板13、14,兩個第二芯板13、14位於兩個第一芯板11、12之間,各個芯板的尺寸是大致相同。需說明的是,於此僅是為利說明,而以多層芯板組100僅包含4個芯板為例,在實際應用中,多層芯板組100例如可以是包含10層以上的芯板,亦即,多層芯板組100所包含的第二芯板的數量,可以是大於2層以上。關於多層芯板組100所包含的多個芯板彼此間相互固定的方式,於此不加以限制。As shown in FIG. 3 and FIG. 4 , it is shown as the multi-layer core board group 100 described in the preparation step S11 . For example, the multi-layer core board group 100 may include four core boards, two of which are defined as two first core boards 11 and 12 , and the other two core boards are defined as two second core boards 13 and 14 . The two second core boards 13 and 14 are located between the two first core boards 11 and 12 , and the dimensions of the respective core boards are approximately the same. It should be noted that, this is only for illustrative purposes, and the multi-layer core board group 100 includes only 4 core boards as an example. That is, the number of the second core plates included in the multi-layer core plate group 100 may be more than two layers. The manner in which the plurality of core boards included in the multi-layer core board group 100 are fixed to each other is not limited here.

各個第一芯板11、12的其中一個寬側面11A、12A可以是具有一線路區A1及一非線路區A2,所述線路區A1上可以是形成有至少一線路,所述線路區A1中的線路即為俗稱的PCB layout。各個第二芯板13、14的其中一個寬側面13A、14A可以是具有一線路區A1及一非線路區A2,所述線路區A1上形成有至少一線路,所述線路即為俗稱的PCB layout。One of the wide side surfaces 11A and 12A of each of the first core boards 11 and 12 may have a circuit area A1 and a non-circuit area A2. At least one circuit may be formed on the circuit area A1. The circuit is commonly known as PCB layout. One of the wide sides 13A and 14A of each of the second core boards 13 and 14 may have a circuit area A1 and a non-circuit area A2, and at least one circuit is formed on the circuit area A1, and the circuit is commonly known as a PCB. layout.

在其中一個具體實施例中,其中一個第二芯板13於非線路區A2可以是設置有四個標記單元131、132、133、134,且四個標記單元131、132、133、134可以是大致設置於一虛擬矩形B1的四個邊角,另一個第二芯板14於非線路區A2可以是設置有四個標記單元141、142、143、144,且四個標記單元141、142、143、144可以是大致設置於一虛擬矩形B2的四個邊角。在實際應用中,所述虛擬矩形B1的外型是第二芯板13的外型的等比例縮小,所述虛擬矩形B2的外型是第二芯板14的外型的等比例縮小。In one specific embodiment, one of the second core boards 13 may be provided with four marking units 131, 132, 133, 134 in the non-circuit area A2, and the four marking units 131, 132, 133, 134 may be Roughly arranged at the four corners of a virtual rectangle B1, the other second core board 14 may be provided with four marking units 141, 142, 143, 144 in the non-circuit area A2, and the four marking units 141, 142, 143 and 144 may be approximately disposed at four corners of a virtual rectangle B2. In practical applications, the shape of the virtual rectangle B1 is a proportional reduction of the shape of the second core board 13 , and the shape of the virtual rectangle B2 is a proportional reduction of the shape of the second core board 14 .

各個標記單元131、132、133、134可以是形成於第二芯板13的表面的結構,而各個標記單元131、132、133、134是不貫穿第二芯板13的結構。各個標記單元141、142、143、144可以是形成於第二芯板14的表面的結構,而各個標記單元141、142、143、144是不貫穿第二芯板14的結構。當然,在特殊的應用中,各個標記單元也可以是貫穿第二芯板的穿孔。另外,各個第二芯板也可以是包含有三個或是五個以上的標記單元。關於標記單元的具體外型及尺寸,皆可依據需求變化,圖中所示僅為其中一示範態樣。The marking units 131 , 132 , 133 , and 134 may be structures formed on the surface of the second core board 13 , and the marking units 131 , 132 , 133 , and 134 may be structures that do not penetrate the second core board 13 . The marking units 141 , 142 , 143 , and 144 may be structures formed on the surface of the second core board 14 , and the marking units 141 , 142 , 143 , and 144 may be structures that do not penetrate the second core board 14 . Of course, in special applications, each marking unit may also be a perforation penetrating through the second core board. In addition, each second core board may include three or five or more marking units. The specific shape and size of the marking unit can be changed according to requirements, and the figure shown in the figure is only an exemplary aspect.

值得一提的是,於圖4中是以其中一個第二芯板13的四個標記單元131、132、133、134設置於第二芯板13面對第一芯板11的寬側面13A,而另一個第二芯板14的四個標記單元141、142、143、144是設置於面對另一個第二芯板13的寬側面14A為例,但各個第二芯板13、14包含的四個標記單元131、132、133、134、141、142、143、144,也可以是設置於不同的寬側面。It is worth mentioning that in FIG. 4 , four marking units 131 , 132 , 133 , 134 of one of the second core boards 13 are arranged on the wide side 13A of the second core board 13 facing the first core board 11 . The four marking units 141 , 142 , 143 and 144 of the other second core board 14 are arranged on the wide side 14A facing the other second core board 13 as an example, but each of the second core boards 13 and 14 includes The four marking units 131 , 132 , 133 , 134 , 141 , 142 , 143 and 144 may also be arranged on different broad sides.

如圖4所示,兩個虛擬矩形B1、B2的外型是由第二芯板13、14的外型以不同比例縮小而成,而兩個虛擬矩形B1、B2的尺寸不相同,如此,如圖5所示,在掃描裝置掃描多層芯板組100後得到的影像中,分屬於不同第二芯板13、14的各個標記單元131、132、133、134、141、142、143、144彼此間是不相互重疊地設置,也就是說,在掃描裝置掃描多層芯板組100後得到的影像,各個標記單元是彼此錯位地設置。As shown in FIG. 4 , the shapes of the two virtual rectangles B1 and B2 are reduced by the shapes of the second core boards 13 and 14 in different proportions, and the sizes of the two virtual rectangles B1 and B2 are different. In this way, As shown in FIG. 5 , in the image obtained after the scanning device scans the multilayer core board group 100 , the marking units 131 , 132 , 133 , 134 , 141 , 142 , 143 , and 144 belong to different second core boards 13 and 14 respectively They are arranged without overlapping each other, that is, in the image obtained after the scanning device scans the multi-layer core board group 100 , the marking units are arranged in a staggered manner from each other.

依上所述,如圖5所示,在掃描裝置掃描多層芯板組100後得到的影像中,第二芯板13的其中兩個標記單元131、132,與第二芯板14的其中兩個標記單元141、142可以是位於同一虛擬軸線C1上,第二芯板13的另外兩個標記單元133、134,與第二芯板14的另外兩個標記單元143、143則可以是位於另一虛擬軸線C2上,而標記單元131、132、141、142在虛擬軸線C1上是彼此不相互重疊,且標記單元133、134、143、144在虛擬軸線C2上是彼此不相互重疊。According to the above, as shown in FIG. 5 , in the image obtained after the scanning device scans the multilayer core board 100 , the two marking units 131 and 132 of the second core board 13 and the two marking units 132 of the second core board 14 are The two marking units 141, 142 may be located on the same virtual axis C1, and the other two marking units 133, 134 of the second core board 13 and the other two marking units 143, 143 of the second core board 14 may be located on different On a virtual axis C2, the marking units 131, 132, 141, 142 do not overlap each other on the virtual axis C1, and the marking units 133, 134, 143, 144 do not overlap each other on the virtual axis C2.

所述掃描裝置不以X光掃描裝置為限,任何具有穿透光的掃描裝置,都屬於在此所指的掃描裝置可以應用的範圍,或者,任何可以用來掃描多層芯板組100,以取的各個標記單元的座標的掃描裝置,也都屬於本發明所指的掃描裝置可應用的範圍。The scanning device is not limited to the X-ray scanning device, any scanning device with penetrating light belongs to the applicable scope of the scanning device mentioned herein, or any scanning device that can be used to scan the multi-layer core board assembly 100 to The scanning device for taking the coordinates of each marking unit also belongs to the applicable scope of the scanning device referred to in the present invention.

如圖5所示,通過於各個第二芯板13、14的多個標記單元131、132、133、134、141、142、143、144的設置,於所述掃描步驟S12後,掃描裝置將可以取得對應於各個標記單元131、132、133、134、141、142、143、144的座標,而於所述計算步驟S13中,處理裝置則能利用設置於同一個第二芯板13(14)的四個標記單元131、132、133、134(141、142、143、144)計算出第二芯板13(14)的一當下尺寸,而後,處理裝置即可利用所述當下尺寸與一預設電路板尺寸資訊中所包含的各個第二芯板13(14)的一預設尺寸,進行比對及計算,藉此,處理裝置即可計算出各個第二芯板13(14)的變形量(例如是漲縮量)。As shown in FIG. 5 , after the scanning step S12, the scanning device will The coordinates corresponding to each of the marking units 131, 132, 133, 134, 141, 142, 143, and 144 can be obtained, and in the calculation step S13, the processing device can utilize the same second core board 13 (14 ) of the four marking units 131, 132, 133, 134 (141, 142, 143, 144) to calculate the current size of the second core board 13 (14), and then the processing device can use the current size and a current size A preset size of each second core board 13 (14) included in the preset circuit board size information is compared and calculated, whereby the processing device can calculate the size of each second core board 13 (14). The amount of deformation (for example, the amount of expansion and contraction).

於所述成形步驟S14,所述的各個第一芯板的變形量(即漲縮值),可以是利用各種方式取得,舉例來說,處理裝置可以是先控制影像擷取裝置(例如各式相機),分別擷取兩個第一芯板的影像,以得到兩張擷取影像,接著,在利用兩張擷取影像與預存的標準第一芯板的影像(或是第一芯板的預定尺寸資料)進行比對,藉此,處理裝置即可計算出各個第一芯板的變形量。In the forming step S14, the deformation amount (ie, the expansion and contraction value) of each first core plate can be obtained in various ways. camera), respectively capture the images of the two first core boards to obtain two captured images, and then use the two captured images and the pre-stored images of the standard first core board (or the images of the first core board). The predetermined size data) are compared, whereby the processing device can calculate the deformation amount of each first core board.

在其中一個具體實施例中,於所述準備步驟S11中,其中一個第一芯板11的其中一寬側面11A可以是具有四個輔助標記單元111、112、113、114,四個輔助標記單元111、112、113、114是設置於一虛擬矩形B3的四個邊角;另一個第一芯板12的其中一寬側面12A可以是具有四個輔助標記單元121、122、123、124,四個輔助標記單元121、122、123、124是設置於一虛擬矩形B4的四個邊角;而任一個輔助標記單元111、112、113、114、121、122、123、124於所述縱向方向(如圖3所示的Z軸方向),是不與任一個輔助標記單元或是標記單元完全重疊。其中,虛擬矩形B3的外型是由第一芯板11的外型等比例縮小而成,虛擬矩形B4的外型是由第一芯板12的外型等比例縮小而成,且虛擬矩形B3及虛擬矩形B4的尺寸不相同。In one specific embodiment, in the preparation step S11, one of the wide side surfaces 11A of one of the first core boards 11 may have four auxiliary marking units 111, 112, 113, 114, and four auxiliary marking units 111, 112, 113, 114 are arranged at the four corners of a virtual rectangle B3; one of the wide side surfaces 12A of the other first core board 12 may have four auxiliary marking units 121, 122, 123, 124, four Auxiliary marking units 121, 122, 123, 124 are arranged at four corners of a virtual rectangle B4; (Z-axis direction as shown in FIG. 3), does not completely overlap with any auxiliary marking unit or marking unit. The shape of the virtual rectangle B3 is proportionally reduced from the shape of the first core board 11 , the shape of the virtual rectangle B4 is proportionally reduced from the shape of the first core board 12 , and the virtual rectangle B3 and the size of the virtual rectangle B4 are different.

如圖5所示,在掃描裝置掃描多層芯板組100後得到的影像中,輔助標記單元111、112、121、122及標記單元131、132、141、142可以是位於同一軸線C1上,而輔助標記單元113、114、123、124及標記單元133、134、143、144可以是位於同一軸線C2上。As shown in FIG. 5 , in the image obtained after the scanning device scans the multilayer core assembly 100 , the auxiliary marking units 111 , 112 , 121 , 122 and the marking units 131 , 132 , 141 , 142 may be located on the same axis C1 , and The auxiliary marking units 113, 114, 123, 124 and the marking units 133, 134, 143, 144 may be located on the same axis C2.

在各個第一芯板11、12都設置有輔助標記單元的情況下,於所述掃描步驟S12中,掃描裝置將可以取得各個輔助標記單元的座標,而於計算步驟中,處理裝置還可以依據各個輔助標記單元所對應的座標,計算出各個第一芯板11、12的當下尺寸,而處理裝置可以利用各個第一芯板的當下尺寸及預設電路板尺寸資訊中所包含的各個第一芯板11、12的一預設尺寸,進行比對及計算,藉此,處理裝置即可計算出各個第一芯板11、12的變形量(例如是漲縮量)。In the case where each of the first core boards 11 and 12 is provided with auxiliary marking units, in the scanning step S12, the scanning device can obtain the coordinates of each auxiliary marking unit, and in the calculation step, the processing device can also be based on The coordinates corresponding to each auxiliary marking unit are used to calculate the current size of each first core board 11 and 12, and the processing device can use the current size of each first core board and each first core board contained in the preset circuit board size information. A preset size of the core plates 11 and 12 is compared and calculated, whereby the processing device can calculate the deformation amount (for example, the expansion and contraction amount) of each of the first core plates 11 and 12 .

依上所述,通過於各個第二芯板設置四個標記單元的設計,處理裝置將能於計算步驟S13中,計算出各個第二芯板的漲縮值,如此,處理裝置執行成形步驟S14時,即可依據各個第一芯板的變形量及各個第二芯板的變形量(即漲縮值),決定是否修改電路板穿孔位置資訊中所包含的至少一個預定穿孔位置座標,藉此,將可以確保於多層芯板組100上形成的貫穿孔,不會超出第一芯板或任一個第二芯板的容許誤差範圍。According to the above, through the design of arranging four marking units on each second core board, the processing device will be able to calculate the expansion and shrinkage value of each second core board in the calculation step S13, and thus, the processing device executes the forming step S14 At this time, according to the deformation amount of each first core board and the deformation amount of each second core board (that is, the expansion and contraction value), it can be determined whether to modify at least one predetermined perforation position coordinate included in the perforation position information of the circuit board. , it will be ensured that the through holes formed on the multi-layer core board group 100 will not exceed the allowable error range of the first core board or any second core board.

綜上所述,本發明的多層電路板的穿孔成形方法可以有效地改善,習知的多層電路板的製造方法容易發生貫穿孔偏離其中至少一個芯板的容許誤差範圍的問題。To sum up, the perforation forming method of the multilayer circuit board of the present invention can be effectively improved, and the conventional manufacturing method of the multilayer circuit board is prone to the problem that the through hole deviates from the tolerance range of at least one of the core boards.

需說明的是,在實際應用中,相關人員可以是依據各芯板的特性不同,僅在容易出現變形的芯板上形成標記單元或輔助標記單元,亦即,多層電路板也可以是不是每一個芯板都設置有標記單元或輔助標記單元,而多層電路板可以是僅有部分的第二芯板設置有標記單元,其餘的芯板則沒有設置標記單元或是輔助標記單元。It should be noted that, in practical applications, the relevant personnel may only form marking units or auxiliary marking units on the core boards that are prone to deformation according to the characteristics of each core board. One of the core boards is provided with marking units or auxiliary marking units, and the multilayer circuit board may be that only part of the second core board is provided with marking units, and the remaining core boards are not provided with marking units or auxiliary marking units.

另外,於本實施例中,是以各個芯板的單一個寬側面設置有標記單元或輔助標記單元為例,但在不同的實施例中,各個芯板也可以是兩個寬側面都分別設置有標記單元或輔助標記單元,如此,處理裝置可以是利用同一個芯板上的所有標記單元,計算出該芯板的兩個寬側面彼此間的變形量(即業界俗稱的層偏)。In addition, in this embodiment, it is taken as an example that a single wide side face of each core board is provided with a marking unit or an auxiliary marking unit, but in different embodiments, each core board may also be provided with two wide sides respectively. There is a marking unit or an auxiliary marking unit, so that the processing device can use all the marking units on the same core board to calculate the mutual deformation of the two wide sides of the core board (ie the layer deviation commonly known in the industry).

請一併參閱圖6及圖7,圖6顯示為本發明的多層電路板製造方法的流程示意圖,圖7為利用本發明的多層電路板製造方法製造出的多層電路板。本發明的多層電路板製造方法包含以下步驟:Please refer to FIG. 6 and FIG. 7 together. FIG. 6 is a schematic flowchart of the method for manufacturing a multilayer circuit board of the present invention, and FIG. 7 is a multilayer circuit board manufactured by the method for manufacturing a multilayer circuit board of the present invention. The multi-layer circuit board manufacturing method of the present invention comprises the following steps:

一芯板標記步驟S21:於多個芯板(即前述的各個第一芯板及各個第二芯板)的至少一寬側面形成至少三個標記單元;A core board marking step S21 : forming at least three marking units on at least one wide side of a plurality of core boards (ie each of the aforementioned first core boards and each of the second core boards);

一組合步驟S22:將多個芯板相互固定,以組成一多層芯板組100(如圖3所示),多層芯板組的任一個標記單元(即前述的標記單元及輔助標記單元)於一縱向方向(例如是圖3所示的Z軸方向)不與任一個標記單元完全重疊,縱向方向與多層芯板組的一表面(例如是第一芯板11的寬側面11A)的一法線相互平行;A combining step S22: fixing a plurality of core boards to each other to form a multi-layer core board group 100 (as shown in FIG. 3), any marking unit of the multi-layer core board group (ie the aforementioned marking unit and auxiliary marking unit) In a longitudinal direction (eg, the Z-axis direction shown in FIG. 3 ), it does not completely overlap with any marking unit, and the longitudinal direction corresponds to a surface of the multilayer core board group (eg, the wide side 11A of the first core board 11). normals are parallel to each other;

一掃描步驟S23:利用一掃描裝置對多層芯板組進行掃描,以取得各個標記單元的一座標;A scanning step S23: using a scanning device to scan the multi-layer core board group to obtain the coordinates of each marking unit;

一計算步驟S24:利用一處理裝置依據各個芯板的各個標記單元所對應的座標及一預設電路板尺寸資訊,計算出各個芯板的一變形量;以及A calculation step S24: using a processing device to calculate a deformation amount of each core board according to the coordinates corresponding to each marking unit of each core board and a predetermined circuit board size information; and

一成形步驟S25:控制一穿孔成形設備,依據變形量及一電路板穿孔位置資訊,於多層芯板組形成至少一貫穿孔,貫穿孔貫穿各個芯板;A forming step S25 : controlling a perforation forming device, according to the deformation amount and a circuit board perforation position information, to form at least one through hole in the multi-layer core board group, and the through hole penetrates each core board;

一導電層形成步驟S26:於至少一個所述貫穿孔中形成一導電層,據以使多層芯板組成為一多層電路板200。A conductive layer forming step S26 : forming a conductive layer in at least one of the through holes, so that the multi-layer core board is formed into a multi-layer circuit board 200 .

如圖3所示,於所述芯板標記步驟S21中,即是於第一芯板11、12的寬側面11A、12A分別形成四個輔助標記單元111、112、113、114、121、122、123、124,並於第二芯板13、14的寬側面13A、14A分別形成四個標記單元131、132、133、134、141、142、143、144。As shown in FIG. 3 , in the core board marking step S21 , four auxiliary marking units 111 , 112 , 113 , 114 , 121 , 122 are respectively formed on the wide sides 11A and 12A of the first core boards 11 and 12 . , 123 , 124 , and four marking units 131 , 132 , 133 , 134 , 141 , 142 , 143 , and 144 are formed on the wide side surfaces 13A and 14A of the second core boards 13 and 14 , respectively.

於所述組合步驟S22中,可以是依據需求利用黏合等方式,使多個芯板相互固定。關於組合步驟S22中所述的縱向方向等內容,與前述實施例的說明相同,於此不再贅述。本實施例的掃描步驟S23、計算步驟S24及成形步驟S25,與前述實施例的掃描步驟S12、計算步驟S13及成形步驟S14相同,於此不再贅述。In the combining step S22, a plurality of core boards may be fixed to each other by means of bonding or the like according to requirements. Contents such as the longitudinal direction described in the combining step S22 are the same as those described in the foregoing embodiments, and are not repeated here. The scanning step S23 , the calculating step S24 and the forming step S25 in this embodiment are the same as the scanning step S12 , the calculating step S13 and the forming step S14 in the previous embodiment, and will not be repeated here.

所述導電層形成步驟S26,例如可以是利用電鍍的技術,於貫穿孔中形成導電層202,藉此,使至少一個貫穿孔201變成電鍍通孔(Plated Through Hole, PTH)或是俗稱的導通孔(via),所述導電層202的材質例如可以是銅,但不以此為限,而於導電層形成步驟S26後,未形成有導電層202的貫穿孔201,則成為非電鍍通孔(Non Plating Through Hole, NPTH)。The conductive layer forming step S26 may be, for example, by using electroplating technology to form the conductive layer 202 in the through holes, thereby making at least one through hole 201 a Plated Through Hole (PTH) or commonly known as conduction Vias, the material of the conductive layer 202 can be, for example, copper, but not limited thereto, and after the conductive layer forming step S26, the through-holes 201 without the conductive layer 202 are formed into electroless through-holes (Non Plating Through Hole, NPTH).

上述本發明的本發明的多層電路板製造方法,僅是針對本發明與習知的多層電路板製造方法最大不同之處進行說明,本發明的多層電路板製造方法在實際應用中,還可以是依據需求增加其他不同的流程步驟,舉例來說,於導電層形成步驟S26後,還可以是加入一自動光學檢查(Automated Optical Inspection, AOI)步驟,以利用自動光學檢查設備,對多層電路板進行檢查;於組合步驟S22及掃描步驟S23之間還可以是加入黑化步驟或是棕化步驟,以利用黑化設備或是棕化設備,清除電路板表面的雜質,於導電層形成步驟S26後,還可以是加入曝光步驟,以利用曝光設備,於多層電路板的表面形成盲孔,於曝光步驟後還可以加入自動光學檢查步驟。The above-mentioned method for manufacturing a multilayer circuit board of the present invention is only described with respect to the biggest difference between the present invention and the conventional method for manufacturing a multilayer circuit board. In practical applications, the method for manufacturing a multilayer circuit board of the present invention may also be: Other different process steps can be added according to requirements. For example, after the conductive layer forming step S26, an automatic optical inspection (AOI) step can also be added, so that automatic optical inspection equipment can be used to perform inspection on the multilayer circuit board. Inspection; between the combining step S22 and the scanning step S23, a blackening step or a browning step can also be added, so as to use a blackening device or a browning device to remove impurities on the surface of the circuit board, after the conductive layer forming step S26 , an exposure step can also be added to form blind holes on the surface of the multilayer circuit board by using exposure equipment, and an automatic optical inspection step can also be added after the exposure step.

請參閱圖8,其顯示為本發明的多層電路板製造系統的方塊示意圖。本發明的多層電路板製造系統300包含一處理裝置301、一掃描裝置302及一穿孔成形設備303。處理裝置301電性連接掃描裝置302及穿孔成形設備303,處理裝置301能執行前述本發明的多層電路板製造方法,以製造出多層電路板200(如圖7所示)。關於掃描裝置302及穿孔成形設備303的詳細說明,請參閱前述說明,於此不再贅述。在實際應用中,多層電路板製造系統300還可以依據需求包含有黑化/棕化設備、曝光設備及自動光學檢查設備等。Please refer to FIG. 8 , which is a schematic block diagram of the multilayer circuit board manufacturing system of the present invention. The multi-layer circuit board manufacturing system 300 of the present invention includes a processing device 301 , a scanning device 302 and a through-hole forming device 303 . The processing device 301 is electrically connected to the scanning device 302 and the perforation forming equipment 303 , and the processing device 301 can execute the above-mentioned method for manufacturing a multilayer circuit board of the present invention to manufacture the multilayer circuit board 200 (as shown in FIG. 7 ). For the detailed description of the scanning device 302 and the perforation forming apparatus 303, please refer to the foregoing description, and details are not repeated here. In practical applications, the multi-layer circuit board manufacturing system 300 may also include blackening/browning equipment, exposure equipment, automatic optical inspection equipment, and the like according to requirements.

綜上所述,本發明的多層電路板的穿孔成形方法、多層電路板製造方法、多層電路板製造系統及多層電路板,通過多個標記單元等設計,可以讓形成於多層電路板的貫穿孔,不容易發生貫穿孔不位在芯板原本預定設置有貫穿孔的位置的容許誤差範圍中(即俗稱偏破的問題),從而可以提高多層電路板的生產良率。To sum up, the perforation forming method for a multilayer circuit board, the method for manufacturing a multilayer circuit board, the manufacturing system for a multilayer circuit board, and the multilayer circuit board of the present invention can make the through holes formed in the multilayer circuit board through the design of a plurality of marking units and the like. , it is not easy to occur that the through hole is not located within the allowable error range of the position where the through hole is originally intended to be provided in the core board (ie, the problem of commonly known as deflection), so that the production yield of the multilayer circuit board can be improved.

另外,所述標記單元或所述輔助標記單元都可以相關設備於芯板上形成線路時一同形成,因此,不會增加多層電路板的製造複雜度。In addition, the marking unit or the auxiliary marking unit can be formed together with the related equipment when the circuit is formed on the core board, therefore, the manufacturing complexity of the multi-layer circuit board will not be increased.

以上所述僅為本發明的較佳可行實施例,非因此侷限本發明的專利範圍,故舉凡運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的保護範圍內。The above descriptions are only preferred feasible embodiments of the present invention, which do not limit the scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the protection scope of the present invention. .

100:多層芯板組 11:第一芯板 111:輔助標記單元 112:輔助標記單元 113:輔助標記單元 114:輔助標記單元 11A:寬側面 12:第一芯板 121:輔助標記單元 122:輔助標記單元 123:輔助標記單元 124:輔助標記單元 12A:寬側面 13:第二芯板 131:標記單元 132:標記單元 133:標記單元 134:標記單元 13A:寬側面 14:第二芯板 141:標記單元 142:標記單元 143:標記單元 144:標記單元 14A:寬側面 200:多層電路板 201:貫穿孔 202:導電層 300:多層電路板製造系統 301:處理裝置 302:掃描裝置 303:穿孔成形設備 A1:線路區 A2:非線路區 B1:虛擬矩形 B2:虛擬矩形 B3:虛擬矩形 B4:虛擬矩形 C1:虛擬軸線 C2:虛擬軸線 P:多層電路板 H:貫穿孔 R:容許誤差範圍 S11~S14:流程步驟 S21~S26:流程步驟100: Multilayer core board group 11: The first core board 111: Auxiliary marking unit 112: Auxiliary marking unit 113: Auxiliary marking unit 114: Auxiliary marking unit 11A: Wide side 12: The first core board 121: Auxiliary marking unit 122: Auxiliary marking unit 123: Auxiliary marking unit 124: Auxiliary marking unit 12A: Wide side 13: Second core board 131: marker unit 132: marker unit 133: Tag Unit 134: marker unit 13A: Wide side 14: Second core board 141: Tag Unit 142: marker unit 143: Tag Unit 144: marker unit 14A: Wide side 200: Multilayer circuit board 201: Through hole 202: Conductive layer 300: Multilayer Circuit Board Manufacturing Systems 301: Processing device 302: Scanning Device 303: Perforation forming equipment A1: Line area A2: Non-Line Area B1: virtual rectangle B2: virtual rectangle B3: virtual rectangle B4: virtual rectangle C1: virtual axis C2: Virtual axis P: Multilayer circuit board H: through hole R: allowable error range S11~S14: Process steps S21~S26: Process steps

圖1為習知的多層電路板的局部示意圖。FIG. 1 is a partial schematic diagram of a conventional multilayer circuit board.

圖2為本發明的多層電路板的穿孔成形方法的流程示意圖。FIG. 2 is a schematic flow chart of a method for forming a perforation of a multilayer circuit board according to the present invention.

圖3為本發明的多層電路板的穿孔成形方法的多層芯板組的示意圖。3 is a schematic diagram of a multi-layer core board group of the perforation forming method of the multi-layer circuit board of the present invention.

圖4為本發明的多層電路板的穿孔成形方法的多層芯板組的分解示意圖。FIG. 4 is an exploded schematic view of the multi-layer core board group of the perforation forming method of the multi-layer circuit board of the present invention.

圖5為掃描裝置掃描本發明的多層芯板組後得到的影像。FIG. 5 is an image obtained after the scanning device scans the multi-layer core board group of the present invention.

圖6為本發明的多層電路板製造方法的流程示意圖。FIG. 6 is a schematic flowchart of the method for manufacturing a multilayer circuit board of the present invention.

圖7為本發明的多層電路板的示意圖。FIG. 7 is a schematic diagram of the multilayer circuit board of the present invention.

圖8為本發明的多層電路板製造系統的方塊示意圖。8 is a schematic block diagram of the multilayer circuit board manufacturing system of the present invention.

S11~S14:流程步驟 S11~S14: Process steps

Claims (10)

一種多層電路板的穿孔成形方法,其包含: 一準備步驟:準備一多層芯板組,所述多層芯板組由相互疊合設置的多個芯板構成,位於所述多層芯板組彼此相反的兩側的兩個所述芯板定義為第一芯板,其餘所述芯板定義為第二芯板,至少一個所述第二芯板具有至少三個標記單元,任一個所述標記單元於一縱向方向不與任一個所述標記單元完全重疊,所述縱向方向與所述第一芯板的一表面的一法線相互平行; 一掃描步驟:利用一掃描裝置對所述多層芯板組進行掃描,以取得各個所述標記單元的一座標; 一計算步驟:利用一處理裝置依據各個所述標記單元所對應的所述座標及一預設電路板尺寸資訊,計算出具有所述標記單元的所述第二芯板的一變形量;以及 一成形步驟:控制一穿孔成形設備,依據各個所述第一芯板的一變形量、具有所述標記單元的各個所述第二芯板的所述變形量及一電路板穿孔位置資訊,於所述多層芯板組形成至少一貫穿孔,所述貫穿孔貫穿各個所述第一芯板及各個所述第二芯板,以使所述多層芯板組成為一多層電路板。 A perforation forming method for a multilayer circuit board, comprising: A preparation step: prepare a multi-layer core board group, the multi-layer core board group is composed of a plurality of core boards arranged on top of each other, and the two core boards located on the opposite sides of the multi-layer core board group define It is the first core board, the other core boards are defined as the second core board, at least one of the second core boards has at least three marking units, and any one of the marking units is not associated with any one of the marking units in a longitudinal direction. The cells are completely overlapped, and the longitudinal direction is parallel to a normal to a surface of the first core board; A scanning step: using a scanning device to scan the multi-layer core board group to obtain the coordinates of each of the marking units; a calculation step: using a processing device to calculate a deformation amount of the second core board with the marking unit according to the coordinates corresponding to each of the marking units and a predetermined circuit board size information; and A forming step: controlling a perforation forming device, according to a deformation amount of each of the first core boards, the deformation amount of each of the second core boards with the marking unit, and a circuit board perforation position information, in At least one through hole is formed in the multi-layer core board group, and the through hole penetrates through each of the first core boards and each of the second core boards, so that the multi-layer core board composition is a multi-layer circuit board. 如請求項1所述的多層電路板的穿孔成形方法,其中,於所述準備步驟中,各個所述第二芯板具有四個所述標記單元,各個所述第二芯板包含一線路區域及一非線路區域,所述線路區域內形成有至少一線路,各個所述第二芯板所包含的各個所述標記單元設置於所述非線路區域。The perforation forming method for a multilayer circuit board according to claim 1, wherein, in the preparation step, each of the second core boards has four of the marking units, and each of the second core boards includes a circuit area and a non-circuit area, wherein at least one circuit is formed in the circuit area, and each of the marking units included in each of the second core boards is disposed in the non-circuit area. 如請求項1所述的多層電路板的穿孔成形方法,其中,於所述準備步驟中,至少一個所述第一芯板具有至少三個輔助標記單元,任一個所述輔助標記單元於所述縱向方向不與任一個所述輔助標記單元或任一個所述標記單元完全重疊;於所述掃描步驟中,所述掃描裝置還取得各個所述輔助標記單元的一座標,而於所述計算步驟中,所述處理裝置還依據各個所述輔助標記單元所對應的所述座標及所述預設電路板尺寸資訊,計算出具有輔助標記單元的所述第一芯板的所述變形量。The perforation forming method for a multilayer circuit board according to claim 1, wherein, in the preparation step, at least one of the first core boards has at least three auxiliary marking units, and any one of the auxiliary marking units is located in the The longitudinal direction does not completely overlap with any one of the auxiliary marking units or any of the marking units; in the scanning step, the scanning device also obtains the coordinates of each of the auxiliary marking units, and in the calculation step wherein, the processing device further calculates the deformation amount of the first core board with the auxiliary marking units according to the coordinates corresponding to each of the auxiliary marking units and the predetermined circuit board size information. 如請求項3所述的多層電路板的穿孔成形方法,其中,各個所述第一芯板設置有四個所述輔助標記單元,四個所述輔助標記單元位於一虛擬矩形的四個邊角,所述虛擬矩形的外型是所述第一芯板的外型的等比例縮小,且不同的所述虛擬矩形的外型是所述第一芯板的外型以不同的比例縮小而成;各個所述第二芯板設置有四個所述標記單元,四個所述標記單元位於一虛擬矩形的四個邊角,四個所述標記單元所位在的所述虛擬矩形的外型是所述第二芯板的外型的等比例縮小,且不同的四個標記單元所位在的所述虛擬矩形的外型是所述第二芯板的外型以不同的比例縮小而成。The perforation forming method for a multilayer circuit board according to claim 3, wherein each of the first core boards is provided with four auxiliary marking units, and the four auxiliary marking units are located at four corners of a virtual rectangle , the shape of the virtual rectangle is a proportional reduction of the shape of the first core board, and the shape of the different virtual rectangles is the shape of the first core board reduced in different proportions. Each described second core board is provided with four described marking units, four described marking units are located at the four corners of a virtual rectangle, and the appearance of the described virtual rectangle where the four described marking units are located It is a proportional reduction of the shape of the second core board, and the shape of the virtual rectangle where the four different marking units are located is the shape of the second core board reduced in different proportions. . 一種多層電路板製造方法,其包含: 一芯板標記步驟:於多個芯板的至少一寬側面形成至少三個標記單元; 一組合步驟:將多個所述芯板相互固定,以組成一多層芯板組,所述多層芯板組的任一個所述標記單元於一縱向方向不與任一個所述標記單元完全重疊,所述縱向方向與所述芯板的一表面的一法線相互平行; 一掃描步驟:利用一掃描裝置對所述多層芯板組進行掃描,以取得各個所述標記單元的一座標; 一計算步驟:利用一處理裝置依據各個所述芯板的各個所述標記單元所對應的所述座標及一預設電路板尺寸資訊,計算出所述各個所述芯板的一變形量;以及 一成形步驟:控制一穿孔成形設備,依據各個所述變形量及一電路板穿孔位置資訊,於所述多層芯板組形成至少一貫穿孔,所述貫穿孔貫穿各個所述芯板; 一導電層形成步驟:於至少一個所述貫穿孔中形成一導電層,以使所述多層芯板組成為一多層電路板。 A method for manufacturing a multilayer circuit board, comprising: A core board marking step: forming at least three marking units on at least one wide side of a plurality of core boards; A combining step: fixing a plurality of the core boards to each other to form a multi-layer core board group, and any one of the marking units in the multi-layer core board group does not completely overlap with any one of the marking units in a longitudinal direction , the longitudinal direction is parallel to a normal line of a surface of the core board; A scanning step: using a scanning device to scan the multi-layer core board group to obtain the coordinates of each of the marking units; a calculation step: using a processing device to calculate a deformation of each of the core boards according to the coordinates corresponding to each of the marking units of each of the core boards and a predetermined circuit board size information; and a forming step: controlling a perforation forming device to form at least one through hole in the multi-layer core board group according to each of the deformation amounts and a position information of a circuit board perforation, and the through hole penetrates each of the core boards; A conductive layer forming step: forming a conductive layer in at least one of the through holes, so that the multi-layer core board is composed of a multi-layer circuit board. 如請求項5所述的多層電路板製造方法,其中,於所述芯板標記步驟中,是於各個所述芯板的一線路區域內形成至少一線路,並於各個所述芯板的一非線路區域形成四個所述標記單元。The method for manufacturing a multilayer circuit board according to claim 5, wherein, in the core board marking step, at least one circuit is formed in a circuit area of each of the core boards, and at least one circuit is formed in a circuit area of each of the core boards The non-line areas form four of the marked cells. 如請求項5所述的多層電路板製造方法,其中,各個所述芯板設置有四個所述標記單元,四個所述標記單元位於一虛擬矩形的四個邊角,所述虛擬矩形的外型是所述芯板的外型的等比例縮小,且不同的所述虛擬矩形的外型是所述芯板的外型以不同的比例縮小而成。The method for manufacturing a multilayer circuit board according to claim 5, wherein each of the core boards is provided with four marking units, and the four marking units are located at four corners of a virtual rectangle, and the The outer shape is a proportional reduction of the outer shape of the core board, and the different virtual rectangle shapes are formed by reducing the outer shape of the core board in different proportions. 如請求項5所述的多層電路板製造方法,其中,各個所述標記單元未貫穿所述芯板。The method for manufacturing a multilayer circuit board according to claim 5, wherein each of the marking units does not penetrate the core board. 一種多層電路板,其是利用如請求項5至8中任一項所述的多層電路板製造方法製成。A multilayer circuit board, which is produced by the method for manufacturing a multilayer circuit board according to any one of claims 5 to 8. 一種多層電路板製造系統,其包含一處理裝置、一掃描裝置及一穿孔成形設備,所述處理裝置能執行如請求項5至8中任一項所述的多層電路板製造方法。A multilayer circuit board manufacturing system comprising a processing device, a scanning device and a perforation forming apparatus, the processing device can execute the multilayer circuit board manufacturing method according to any one of claims 5 to 8.
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TW200415976A (en) * 2002-10-16 2004-08-16 Muraki Kk Reference hole boring machine, and method for estimating guide mark coordinates for multilayer printed circuit board
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TW200415976A (en) * 2002-10-16 2004-08-16 Muraki Kk Reference hole boring machine, and method for estimating guide mark coordinates for multilayer printed circuit board
CN101083875A (en) * 2006-05-30 2007-12-05 精工精密有限公司 Perforating device for printed circuit wiring board and reference perforating method
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