TWI760611B - Burn-in testing machine having monitoring device and monitoring method thereof - Google Patents

Abstract

A burn-in testing machine having monitoring device, comprising: a connector, a testing signal generating module, a receiving and analyzing module, a control module, a monitoring circuit and a comparing module. The connector can be connected with a device under test (DUT) in a detachable manner. The testing signal generating module generates a power supply signal transmitted to the DUT via the connector. The receiving and analyzing module receives and analyzes an output signal coming from the DUT in order to determine whether the DUT is qualified or not. The monitoring circuit is located between the testing signal generating module and the connector for monitoring a supply condition of the power supply signal generated by testing signal generating module. The comparing module acquires and analyzing the supply condition in such a manner that, when the comparing module analyzes and determines the supply condition to be abnormal, the control module generates an alert signal to indicate that the burn-in testing machine itself is abnormal. In addition, the comparing module controls the testing signal generating module to stop generating the power supply signal, so as to prevent the DUT from being damaged by the abnormal power supply signal generated by the burn-in testing machine which is under abnormal condition.

Description

Burn-in test machine with monitoring device and monitoring method thereof

The present invention relates to a burn-in test machine with a monitoring device and a monitoring method thereof, in particular to a burn-in test machine that can instantly monitor the state of the burn-in test machine itself when the object to be tested is tested for burn-in durability, and when the machine is found A burn-in test machine with a monitoring device and a monitoring method thereof are used to automatically stop the test when there is an abnormality in order to avoid damage to the object to be tested.

Commercially available electronic products, whether they are electronic parts such as laser diodes (LD), electronic components such as motherboards, or electronic products such as notebook computers, etc., mostly need to be burned before leaving the factory. The machine test machine is used to test the burn-in or aging (Burn-In or Aging) of the product to ensure the reliability and service life of the product when it leaves the factory.

Please refer to FIG. 1 and FIG. 2 , which are a schematic diagram of the basic structure of the applicant's existing burn-in test machine and a test flow chart, respectively. As shown in FIG. 1 , the basic structure of the burn-in test machine 10 includes: a test signal generating module 11 , a receiving and analyzing module 13 , a control module 14 , and a connector 19 . The connector 19 can be used for a device under test 1 (Device Under Test; DUT for short) to be coupled to the connector 19 in a pluggable manner. The connector 19 can be in the form of a socket, a connector or a connector for plugging into the object under test 1. Besides, the connector 19 can also be in the form of a carrier board on which a plurality of sockets are arranged As well as related circuit components, each socket can be respectively inserted into a DUT 1, which can realize the process of batch testing.

The test signal generating module 11 is electrically coupled to the connector 19 , and can at least generate a power supply signal 181 to transmit to the DUT 1 through the connector 19 . In this embodiment, the test signal generating module 11 includes a current source module 111 and a control signal module 112; the current source module 111 is used to generate the power supply signal 181, and the control signal module 112 is a for generating an input signal 182 is transmitted to the DUT 1 via the connector 19 . The power supply signal 181 is used to drive the power required for the operation of the DUT 1 , and the input signal 182 includes a clock signal or other control signals that can be used to control the DUT 1 to perform specific operations. A predetermined burn-in test process is performed on the DUT 1 in a predetermined test environment 100 by the power supply signal 181 and the input signal 182 .

The receiving and analyzing module 13 is electrically coupled to the connector 19, and can receive an output signal 183 from the DUT 1 through the connector 19, analyze whether the output signal 183 is abnormal, and generate a first signal accordingly. a control command. The control module 14 is electrically coupled to the test signal generating module 11 and the receiving and analyzing module 13 . The control module 14 can control the test signal generation module 11 to generate the power supply signal 181 , receive the first control command from the reception and analysis module 13 and control the test signal generation module 11 accordingly. When the receiving and analyzing module 13 analyzes the output signal 183 and finds that there is an abnormality, the control module 14 generates a first alarm signal to warn the outside world that the DUT 1 is abnormal, and the control module 14 controls the The test signal generating module 11 stops generating the power supply signal 181 .

As shown in FIG. 2 , when the burn-in test is performed, first, as shown in step 21 , the test signal generation module provides the test signal (ie, the input signal) and the power supply is transmitted to the device under test (DUT) through the connector. Next, as in step 22, the receiving and analyzing module receives the output signal from the DUT through the connector and analyzes it to check whether the output signal is abnormal (step 23)? If "Yes", it means that the object to be tested is defective or abnormal, the burn-in test machine will issue a warning and stop, and notify the operator to perform further testing or processing on this (or this batch) of objects to be tested. If "No", it means that the burn-in test result is normal, and the DUT has passed the test and is a qualified product, so the burn-in test process of the next (or next batch) DUT can be carried out.

It can be seen from FIG. 1 and FIG. 2 that during the burn-in test of the object to be tested in the existing burn-in test machine 10, many components of the machine itself, such as but not limited to: connectors (or carrier boards), Signal transmission lines, current source modules, etc., will also be exposed to the same test environment 100 as DUT 1 to withstand the same test conditions as DUT 1, such as but not limited to: test temperature, test humidity , test voltage changes, test current changes and so on. The components of the burn-in test machine 10 are easily aged or damaged when exposed to these test environments for a long time. In the slightest cases, the test accuracy may be reduced, and in severe cases, the DUT may be subjected to excessively high loads during the burn-in test. Or the voltage or current with too much variation is damaged. However, the structure of the existing burn-in testing machine 10 and its testing process can only issue an alarm when an abnormality in the output signal from the DUT 1 has been detected. The operation state of the burn-in test machine 10 itself cannot be monitored in real time due to reports and shutdowns. In other words, when an abnormality is found, the DUT 1 is actually damaged. If the operator fails to immediately find out that the crux of the problem lies in the burn-in test machine 10, and another originally good DUT 1 is put up for testing, the other DUT 1 will be damaged as a result. It can be seen from this that the existing burn-in test machine 10 often causes unnecessary damage to the object to be tested 1, reduces the yield, and cannot perform the verification of the predetermined procedure due to the lack of relevant supporting monitoring and failure protection designs, which wastes time. , people and money. In addition, the existing burn-in test machine 10 has no relevant monitoring mechanism, and cannot set a correct maintenance schedule for the machine, the carrier board and the test fixture, which often leads to inefficient maintenance work. Therefore, how to monitor the aging or damage of the components of the burn-in test machine 10 in real time, so as to prevent the aging or damaged machine from further harming the DUT 1 during the burn-in test, is the purpose of the present invention. focus on improvement.

Therefore, the main purpose of the present invention is to provide a burn-in test machine with a monitoring device and a monitoring method thereof, which can monitor the state of the burn-in test machine itself in real time when the object to be tested is subjected to the burn-in endurance test, and can monitor the state of the burn-in test machine itself during the burn-in endurance test of the object to be tested. When the machine is found to be abnormal, it will automatically stop the burn-in test process to avoid damage to the object to be tested.

In order to achieve the above object, the present invention provides a burn-in test machine with a monitoring device, which includes: a connector for connecting a device under test (DUT) to the connection in a pluggable manner a test signal generating module, electrically coupled to the connector, capable of generating at least a power supply signal to be transmitted to the DUT through the connector; a receiving and analysis module, electrically coupled to the connector, capable of receiving an output signal from the object to be tested through the connector, analyzing whether the output signal is abnormal, and generating a first control command accordingly; and a control module electrically coupled to the test signal generating module and the receiving and analyzing module; the control module can control the test signal generating module to generate the power supply signal, and receive the first control command from the receiving and analyzing module and control the test signal generating module accordingly The set is characterized in that: the burn-in test machine further comprises: a monitoring circuit, disposed between the test signal generating module and the connector, for monitoring a power supply state of the power supply signal; and a comparison module , which is electrically coupled to the monitoring circuit, the test signal generating module and the control module; the comparison module receives the power supply state from the monitoring circuit, and analyzes and compares whether the power supply state is abnormal; the comparison module is based on The result of the analysis and comparison generates a second control command and transmits it to the test signal generating module, so as to control the test signal generating module to generate or stop the power supply signal.

In one embodiment, the test signal generating module includes a current source module and a control signal module; the current source module is used to generate the power supply signal, and the control signal module is used to generate an input signal is transmitted to the object under test through the connector; the monitoring circuit is electrically coupled between the current source module and the connector; wherein, the power supply signal is a power source for driving the object to be tested, and the The input signal includes a clock signal.

In one embodiment, when the receiving and analyzing module analyzes the output signal and finds that there is an abnormality, the control module generates a first alarm signal to warn the outside world that the DUT is likely to be abnormal, and the control module generates a first alarm signal. The group controls the test signal generating module to stop generating the power supply signal; when the comparison module analyzes the power supply state and finds that there is an abnormality, the control module generates a second alarm signal to warn the outside world that the burn-in test machine itself has In addition, the comparison module controls the test signal generation module to stop generating the power supply signal.

In one embodiment, the current source module includes a positive power line and a negative power line; the monitoring circuit includes: a first contact group, and a second contact group; the first contact group and The second contact group includes two contacts respectively disposed on the positive power line and the negative power line; the comparison module includes a comparator circuit and a discharge circuit; the comparator circuit is connected to the first The contact group is thus connected in parallel to the positive power supply line and the negative power supply line; the bleeder circuit is connected to the second contact group and thus connected in parallel to the positive power supply line and the negative power supply line line; the comparator circuit is electrically coupled to the current source module, the control module and the bleeder circuit; and, when the comparison module analyzes the power supply state and finds that there is an abnormality, the comparison module activates the bleeder circuit A discharge circuit is used to discharge the current on the positive power line and the negative power line, so as to prevent the abnormal power supply signal from damaging the object to be tested.

In one embodiment, after the comparison module receives the power supply state, it performs the following analysis and comparison operations: Does a supply current in the power supply state exceed a preset accuracy setting value? If "Yes", the second control command includes a message that an abnormality is found, and includes an accuracy deviation warning message in the second warning signal; if "No", the second warning signal is not generated; the Does a voltage instantaneous variation in the power supply state exceed a preset voltage variation setting value? If "Yes", the second control command includes a message that an abnormality is found, and the second alarm signal includes an open circuit or open circuit alarm message; if "No", the second alarm signal is not generated; the Does a current instantaneous variation in the power supply state exceed a preset current variation setting value? If "Yes", the second control command includes a message that an abnormality is found, and includes a current transient alarm message in the second alarm signal; if "No", the second alarm signal is not generated.

In order to achieve the above object, the present invention provides a monitoring method for a burn-in test machine, including: providing a burn-in test machine, the burn-in test machine comprising: a connector for a device under test (Device Under Test) ; DUT for short) is combined with the connector in a pluggable manner; a test signal generating module is electrically coupled to the connector; a receiving and analysis module is electrically coupled to the connector; a control module , electrically coupled to the test signal generating module and the receiving and analyzing module; a monitoring circuit disposed between the test signal generating module and the connector; and a comparison module electrically coupled to the monitoring circuit, the test signal generating module and the control module; a power supply signal is generated by the test signal generation module and sent to the object to be tested through the connector; a power supply state of the power supply signal is monitored by the monitoring circuit, and the comparison module receives the signal from the Monitoring the power supply state of the circuit, and analyzing and comparing whether the power supply state is abnormal; when the comparison module analyzes the power supply state and finds that there is an abnormality, the control module generates a second alarm signal to alert the outside world to the burn-in tester The platform itself is likely to be abnormal, and the comparison module controls the test signal generation module to stop generating the power supply signal; when the comparison module analyzes the power supply state and finds that there is no abnormality, the next step is performed; the receiving and The analysis module receives an output signal from the object to be tested through the connector, analyzes whether the output signal is abnormal, and generates a first control command accordingly; when the receiving and analysis module analyzes the output signal and finds that there is an abnormality At the time, the control module generates a first alarm signal to warn the outside world that the object to be tested may be abnormal, and the control module controls the test signal generation module to stop generating the power supply signal.

1‧‧‧Object to be tested

10. 30‧‧‧burn-in test machine

100, 300‧‧‧Test environment

11. 31‧‧‧Test signal generation module

111、311‧‧‧Current source module

112, 312‧‧‧Control signal module

13. 33‧‧‧Receiver and Analysis Module

14. 34‧‧‧Control Module

35‧‧‧User Interface

36‧‧‧Monitoring circuit

361, 362‧‧‧contact group

37‧‧‧Compare Modules

371‧‧‧Comparator Circuits

372‧‧‧Bleeding circuit

181, 381‧‧‧Power supply signal

182, 382‧‧‧input signal

183, 383‧‧‧output signal

19, 39‧‧‧Connector

21-24, 41-45, 421-428‧‧‧ steps

Figure 1 is a schematic diagram of the basic structure of the applicant's existing burn-in test machine.

Figure 2 is a test flow chart of the applicant's existing burn-in test machine.

FIG. 3 is a schematic diagram of the basic structure of an embodiment of the burn-in test machine of the present invention.

FIG. 4 is a schematic structural diagram of a preferred embodiment of the comparison module and the monitoring circuit of the burn-in test machine of the present invention.

FIG. 5 is a flowchart of an embodiment of a monitoring method for a burn-in test machine according to the present invention.

FIG. 6 is a flowchart of the detailed analysis steps included in the step 42 shown in FIG. 5 .

In order to describe the burn-in test machine and method with a monitoring device provided by the present invention more clearly, the following will be described in detail with reference to the drawings.

Please refer to FIG. 3, which is a basic frame of an embodiment of the burn-in test machine 30 of the present invention Schematic diagram. In the present invention, the basic structure of the burn-in test machine 30 includes: a test signal generating module 31, a receiving and analyzing module 33, a control module 34, a user interface 35, and a connector 39. The connector 39 allows a device under test 1 (Device Under Test; DUT for short) to be coupled to the connector in a pluggable manner. The connector 39 can be in the form of a socket, a connector or a connector for plugging the object under test. Besides, the connector 39 can also be in the form of a carrier board on which a plurality of sockets and For related circuit components, each socket can be respectively connected to a DUT 1, which can realize the process of batch testing. It is worth mentioning that, in addition to the above components, the burn-in test machine 30 of the present invention has many other components or devices not shown in the figures, such as but not limited to: power supply, temperature control module, memory Mods, UI, etc. Since these components may be the same as those in the prior art and are not the main technical features of the present invention, they will not be described in detail here.

In the present invention, the test signal generating module 31 is electrically coupled to the connector 39 , and can at least generate a power supply signal 381 to transmit to the DUT 1 through the connector 39 . In this embodiment, the test signal generating module 31 includes a current source module 311 and a control signal module 312; the current source module 311 is used to generate the power supply signal 381, and the control signal module 312 is It is used to generate an input signal 382 and transmit it to the DUT 1 through the connector 39 . The power supply signal 381 is used to drive the power required for the operation of the DUT 1 , and the input signal 382 includes a clock signal or other control signals that can be used to control the DUT 1 to perform specific operations. A predetermined burn-in test process is performed on the DUT 1 in a predetermined test environment 300 by the power supply signal 381 and the input signal 382 .

The receiving and analyzing module 33 is electrically coupled to the connector 39, and can receive an output signal 383 from the DUT 1 through the connector 39, analyze whether the output signal 383 is abnormal, and generate a first signal accordingly. a control command. The control module 34 is electrically coupled to the test signal generating module 31 and the receiving and analyzing module 33 . The control module 34 can control the test signal generation module 31 to generate the power supply signal 381 and the input signal 382, and to receive the first control command from the reception and analysis module 33 and control the test signal generation module accordingly. Group 31. When the receiving and analyzing module 33 analyzes the output signal 383 and finds that there is an abnormality, the control module 34 generates a first alarm signal to warn the outside world that the DUT 1 is abnormal, and the control module 34 controls the The test signal generating module 31 stops generating the power supply signal 381 and the input signal 382 .

The innovation of the burn-in test machine 30 with the monitoring device of the present invention is that the burn-in Additional equipment on the testing machine 30 includes: a monitoring circuit 36 and a comparison module 37 . The monitoring circuit 36 is disposed between the test signal generating module 11 and the connector 39 for monitoring a power supply state of the power supply signal 381 . In this embodiment, the monitoring circuit 36 is electrically coupled between the current source module 311 and the connector 39 . The comparison module 37 is electrically coupled to the monitoring circuit 36 , the test signal generating module 31 and the control module 34 . The comparison module 37 receives the power supply state from the monitoring circuit 36, and analyzes and compares whether the power supply state is abnormal. The comparison module 37 generates a second control command according to the analysis and comparison result and sends it to the test signal generation module 31 to control the test signal generation module 31 to generate or stop the power supply signal 381 and the input signal 382 accordingly . Specifically, when the comparison module 37 analyzes the power supply state and finds that there is an abnormality, the control module 37 generates a second alarm signal to warn the outside world that the burn-in test machine 30 itself may be abnormal, so that the operator can The process of repairing and maintaining the machine as soon as possible; at the same time, the comparison module 37 controls the test signal generating module 31 to stop generating the power supply signal 381 to avoid the abnormal or damaged state of the burn-in test machine 30 itself. The abnormal power supply signal 381 caused damage to the object 1 under test.

In addition, compared with the conventional burn-in test machine, which is powered continuously for a long time, the power consumption is amazing; the burn-in test machine 30 of the present invention adopts a pulsed power supply mode, and can set different strokes and different time intervals and Operating with different current sizes can achieve more efficient operation, reduce power consumption and reduce production costs.

Please refer to FIG. 4 , which is a schematic structural diagram of a preferred embodiment of the comparison module 37 and the monitoring circuit 36 of the burn-in test machine of the present invention. In this embodiment, the current source module 311 includes a positive power line and a negative power line. The monitoring circuit 36 includes: a first contact group 361 and a second contact group 362 . Each of the first contact group 361 and the second contact group 362 includes two contacts respectively disposed on the positive power line and the negative power line. The comparison module 37 includes a comparator circuit 371 and a bleeder circuit 372 . The comparator circuit 371 is connected to the first contact group 361 and thus connected in parallel to the positive power line and the negative power line. The bleeder circuit 372 is connected to the second contact group 362 and thus connected in parallel to the positive power line and the negative power line. The comparator circuit 371 is electrically coupled to the current source module 311 , the control module 34 and the discharge circuit 372 . And, when the comparison module 37 analyzes the power supply state and finds that there is an abnormality, the comparison module 37 activates the discharge circuit 372 to discharge the current on the positive power line and the negative power line (that is, the current on the power supply loop). charge) to prevent the abnormal power supply signal from damaging the DUT 1. in this example The comparison module 371 includes a voltage or current comparator (Comparator), a digital to analog converter (DAC for short), an analog to digital converter (ADC for short), and a voltage Or components and circuits related to current variation slope detection, which can be used to detect whether the supply current in the power supply signal exceeds a predetermined accuracy setting value, and whether a voltage instantaneous variation in the power supply state exceeds a predetermined voltage variation The setting value, and whether a current instantaneous variation in the power supply state exceeds a predetermined current variation setting value. The bleeder circuit 372 (Bleed-off circuit, or Bleeder circuit) includes components and circuits such as transistors and resistors, and can be used to bleed the electric charge in the power supply signal loop to zero.

Please refer to FIG. 5 , which is a flowchart of an embodiment of a monitoring method for a burn-in test machine of the present invention. The internal components and functions of the burn-in test machine of the present invention have been introduced in Figures 3 and 4 and their related descriptions, so they will not be repeated. As shown in Figure 5, the monitoring method of the burn-in test machine includes the following steps:

Step 41: The test signal generating module generates a power supply signal and transmits it to the DUT through the connector;

Step 42: The monitoring circuit monitors a power supply state of the power supply signal, and the comparison module receives the power supply state from the monitoring circuit, and analyzes and compares whether the power supply state is abnormal. When the comparison module analyzes the power supply state and finds that there is an abnormality, the control module generates a second alarm signal to warn the outside world that the burn-in test machine itself is in danger of being abnormal, so that the operator can perform the test on the machine as soon as possible. maintenance procedure; at the same time, the comparison module controls the test signal generation module to stop generating the power supply signal (step 43), so as to avoid the abnormal power supply signal generated by the abnormal or damaged state of the burn-in test machine itself. cause damage. When the comparison module analyzes the power supply state and finds that there is no abnormality, the next step 44 is executed.

Step 44: The receiving and analyzing module receives an output signal from the DUT through the connector, analyzes whether the output signal is abnormal, and generates a first control command accordingly (step 45). In step 45, when the receiving and analyzing module analyzes the output signal and finds that there is an abnormality, the control module generates a first alarm signal to warn the outside world that the object to be tested is likely to be abnormal (step 43), and, The control module controls the test signal generating module to stop generating the power supply signal. At this time, it means that the object to be tested is defective, and the burn-in test machine will issue a warning and stop, and notify the operator to perform further testing or processing on this (or this batch) of objects to be tested. Conversely, when the receiving and analyzing module analyzes the output signal and finds that there is no abnormality, it indicates the burn-in test result Normally, the object to be tested has passed the test and belongs to a qualified commodity, so the burn-in test process of the next (or next batch) of the object to be tested can be performed, that is, returning to step 41 .

Please refer to FIG. 6 , which is a flowchart of the detailed analysis steps included in step 42 shown in FIG. 5 . In step 42 shown in FIG. 5, after the comparison module receives the power supply state, the following analysis and comparison operations are performed:

Step 421 : The comparison module obtains the power supply loop voltage/current (ie, the power supply status) of the power supply signal generated by the current source module and transmitted to the DUT through the monitoring circuit.

Step 422: The comparison module checks whether a supply current in the power supply state exceeds a predetermined accuracy setting value (Second level)? If "Yes", the second control command includes a message that an abnormality is found, and includes an accuracy deviation warning message in the second alarm signal (step 423), and then executes step 424; if "No" then do not generate the second alarm signal and go back to step 422 to continue to periodically check;

Step 425: Does the instantaneous voltage variation in the power supply state exceed a predetermined voltage variation setting value, that is, the variation slope is too fast (mS-uS level)? If "Yes", the second control instruction includes a message that an abnormality is found, and the second alarm signal includes an open circuit or open circuit alarm message (step 426), and then go to step 424; if "No" then do not generate the second alarm signal and go back to step 425 to continue to periodically check;

Step 427: Does a current instantaneous variation in the power supply state exceed a preset current variation setting value, that is, the variation slope is too fast (mS-uS level)? If "Yes", the second control command includes a message that an abnormality is found, and includes a current transient (Transient) alarm message in the second alarm signal (step 428), and then go to step 424; if " "No", do not generate the second alarm signal and return to step 427 to continue to periodically check;

Step 424, send the second alarm signal to the user interface integrated log file, turn off the current source module to stop generating the power supply signal, and use the discharge circuit to discharge the charge in the loop to zero .

Only the above-mentioned embodiments should not be used to limit the applicable scope of the present invention, and the protection scope of the present invention should be based on the scope of the technical spirit defined by the content of the patent application scope of the present invention and the scope included in its equivalent changes. That is, all equivalent changes and modifications made according to the scope of the patent application of the present invention will still not lose the essence of the present invention, nor depart from the spirit and scope of the present invention, so it should be regarded as a further implementation of the present invention.

1‧‧‧Object to be tested

30‧‧‧burn-in test machine

300‧‧‧Test environment

31‧‧‧Test signal generation module

311‧‧‧Current Source Module

312‧‧‧Control Signal Module

33‧‧‧Receive and Analysis Module

34‧‧‧Control Module

35‧‧‧User Interface

36‧‧‧Monitoring circuit

37‧‧‧Compare Modules

381‧‧‧Power Signal

382‧‧‧Input signal

383‧‧‧Output signal

39‧‧‧Connector

Claims (8)

A burn-in test machine with a monitoring device, comprising: a connector for a device under test (DUT) to be combined with the connector in a pluggable manner; a test signal generating module , which is electrically coupled to the connector, and can at least generate a power supply signal and transmit it to the DUT through the connector; a receiving and analysis module, which is electrically coupled to the connector, can receive signals from the DUT through the connector. an output signal of the test object, and after analyzing whether the output signal is abnormal, a first control command is generated accordingly; and a control module electrically coupled to the test signal generating module and the receiving and analyzing module; the The control module can control the test signal generating module to generate the power supply signal, and receive the first control command from the receiving and analyzing module and control the test signal generating module accordingly; it is characterized in that: the burn-in test The machine further includes: a monitoring circuit arranged between the test signal generating module and the connector for monitoring a power supply state of the power supply signal; and a comparison module electrically coupled to the monitoring circuit, the connector a test signal generating module and the control module; the comparison module receives the power supply state from the monitoring circuit, and analyzes and compares whether the power supply state is abnormal; the comparison module generates a second power supply state according to the analysis and comparison result The control command is sent to the test signal generation module, so as to control the test signal generation module to generate or stop the power supply signal; wherein: the test signal generation module includes a current source module for generating the power supply signal; when When the receiving and analyzing module analyzes the output signal and finds that there is an abnormality, the control module generates a first alarm signal to warn the outside world that the DUT is likely to be abnormal, and the control module controls the test signal generating module The group stops generating the power supply signal; when the comparison module analyzes the power supply state and finds that there is an abnormality, the control module generates a second alarm signal to warn the outside world that the burn-in test machine itself may be abnormal, and the The comparison module controls the test signal generating module to stop generating the power supply signal. The burn-in test machine with monitoring device as described in claim 1, wherein the test signal generating module further comprises a control signal module; the control signal module is used for generating an input signal through the The connector is transmitted to the object to be tested; the monitoring circuit is electrically coupled between the current source module and the connector; wherein the power supply signal is a power source for driving the object to be tested, and the input signal Including a clock signal. The burn-in test machine with monitoring device as described in claim 1, wherein: the current source module comprises a positive power supply line and a negative power supply line; the monitoring circuit comprises: a first contact group , and a second contact group; each of the first contact group and the second contact group includes two contacts respectively arranged on the positive power supply line and the negative power supply line; the comparison module includes a comparator circuit and a bleeder circuit; the comparator circuit is connected to the first contact group and is therefore connected in parallel to the positive power supply line and the negative power supply line; the drain circuit is connected to the second contact group and thus connected in parallel to the positive power line and the negative power line; the comparator circuit is electrically coupled to the current source module, the control module and the discharge circuit; and when the comparison module analyzes the power supply state and finds an abnormality , the comparison module activates the discharge circuit to discharge the current on the positive power line and the negative power line, so as to prevent the abnormal power supply signal from damaging the object to be tested. The burn-in test machine with monitoring device as described in claim 1, wherein, after the comparison module receives the power supply state, it performs the following analysis and comparison operations: a supply current in the power supply state Is a preset accuracy setting value exceeded? If "Yes", the second control command includes a message that an abnormality is found, and includes an accuracy deviation warning message in the second warning signal; if "No", the second warning signal is not generated; the Does a voltage instantaneous variation in the power supply state exceed a preset voltage variation setting value? If "Yes", the second control command includes a message that an abnormality is found, and the second alarm signal includes an open circuit or open circuit alarm message; if "No", the second alarm signal is not generated; the Does a current instantaneous variation in the power supply state exceed a preset current variation setting value? If "Yes", the second control command includes a message that an abnormality is found, and includes a current transient alarm message in the second alarm signal; if "No", the second alarm signal is not generated. A method for monitoring a burn-in test machine, comprising: providing a burn-in test machine, the burn-in test machine comprising: a connector for a device under test (Device UnderTest; DUT for short) to be pluggable A test signal generating module is electrically coupled to the connector; the test signal generating module includes a current source module for generating a power supply signal; a receiving and analysis module, an electrical a control module electrically coupled to the test signal generating module and the receiving and analyzing module; a monitoring circuit disposed between the test signal generating module and the connector; and a comparison module electrically coupled to the monitoring circuit, the test signal generation module and the control module; the power supply signal is generated by the current source module of the test signal generation module and transmitted to the to-be-to-be-connected measuring object; a power supply state of the power supply signal is monitored by the monitoring circuit, and the comparison module receives the power supply state from the monitoring circuit, and analyzes and compares whether the power supply state is abnormal; when the comparison module analyzes the power supply When the state is found to be abnormal, the control module generates a second alarm signal to warn the outside world that the burn-in test machine itself may be abnormal, and the comparison module controls the test signal generation module to stop generating the power supply signal ; When the comparison module analyzes the power supply state and finds that there is no abnormality, the next step is performed; the receiving and analyzing module receives an output signal from the DUT through the connector, and analyzes whether the output signal has After the abnormality, a first control command is generated accordingly; when the receiving and analyzing module analyzes the output signal and finds that there is an abnormality, the control module generates a first alarm signal to warn the outside world that the object to be tested may be abnormal. And, the control module controls the test signal generating module to stop generating the power supply signal. The monitoring method for a burn-in test machine as described in claim 5, wherein the test signal generating module further comprises a control signal module; the control signal module is used for generating an input signal through the connection The monitoring circuit is electrically coupled between the current source module and the connector; wherein, the power supply signal is a power source for driving the object to be tested, and the input signal includes A clock signal. The monitoring method for a burn-in test machine as described in item 6 of the scope of the patent application, wherein: The current source module includes a positive power line and a negative power line; the monitoring circuit includes: a first contact group and a second contact group; the first contact group and the second contact group Each includes two contacts respectively set on the positive power supply line and the negative power supply line; the comparison module includes a comparator circuit and a bleeder circuit; the comparator circuit is connected to the first contact group and thus connected in parallel on the positive power line and the negative power line; the bleeder circuit is connected to the second contact group and is therefore connected in parallel to the positive power line and the negative power line; the comparator circuit is electrically coupled to the current source module, the control module and the discharge circuit; and, when the comparison module analyzes the power supply state and finds that there is an abnormality, the comparison module activates the discharge circuit to discharge the positive power line and the negative power line current to prevent the abnormal power supply signal from damaging the DUT. The burn-in test machine with monitoring device as described in item 5 of the scope of the application, wherein, after the comparison module receives the power supply state, it performs the following analysis and comparison operations: a supply current in the power supply state Is a preset accuracy setting value exceeded? If "Yes", the second control command includes a message that an abnormality is found, and includes an accuracy deviation warning message in the second warning signal; if "No", the second warning signal is not generated; the Does a voltage instantaneous variation in the power supply state exceed a preset voltage variation setting value? If "Yes", the second control command includes a message that an abnormality is found, and the second alarm signal includes an open circuit or open circuit alarm message; if "No", the second alarm signal is not generated; the Does a current instantaneous variation in the power supply state exceed a preset current variation setting value? If "Yes", the second control command includes a message that an abnormality is found, and includes a current transient alarm message in the second alarm signal; if "No", the second alarm signal is not generated.

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